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Calculating the Surface Topography of Integrated Circuit Wafers from SEM Images Timothy P Ellison and Christopher J Taylor Wolfson Image Analysis Unit Department of Medical BioPhysics University of Manchester Manchester M19 3PT The ability to make three-dimensional measurements of surface topography is important to the control of quality in the fabrication ofIC wafers. We describe a technique usingshape from shadingto produce a dense depth map from ICs imaged in the scanning electron microscope. The method minimises error terms to ensure the resultant surface is everywhere continuous and accurately explains the observed image intensities. We describe how this method is extended when stereo images are available and how the extra information in stereo could be used to derive properties of the reflectance Junction. A great deal of effort is expended by the manufacturers of integrated circuits (ICs) in judging the quality and acceptability of device interconnect metallization on integrated circuit wafers or dice. Typically they are interested in measuring parameters such as the height of tracks, passivation steps, contact windows and cross-overs of metallization layers relative to the substrate, the depth of pits in the substrate and the thickness of the glassivation layer. Due to the size of the structures involved, components are normally tested non-destructively using a scanning electron microscope (SEM). It is possible to extract some of the required quantitative information relatively easily from SEM images but heights relative to the substrate are difficult to measure. We are attempting to produce accurate measurements of three-dimensional topography from stereo images taken by SEM. An important characteristic of the problem is the variability in material properties and in imaging conditions and the consequent difficulty in modelling the imaging process. The SEM produces images that are highly magnified representations of the sample, with surface shading similar to that observed in scenes illuminated by directional light (Figure 1). As a method of extracting three-dimensional information from such images, shape from shading [ 1 , 2 ] offers the derivation of a dense depth map, which is particularly useful when trying to make volumetric measurements. Other methods commonly adopted for the extraction of three-dimensional information rely on being able to match features in a stereo pair of images (the correspondence problem). Although it is possible to obtain stereo pairs of SEM images, either by tilting the microscope stage or by deflecting the electron beam, the surfaces of interest in this application are sufficiently featureless to make the approach unattractive. Figure 1. SEM image of an integrated circuit This paper describes our approach to recovering height information from SEM images of ICs. Our first objective has been to exploit fully the information present in a single image. This involves making assumptions about the relationship between surface orientation and observed intensity, though it is possible to obtain an approximation to this reflectance function by making use of calibration objects. The iterative scheme we have adopted converges rapidly to to a reasonable estimate of the height map which it then adjusts directly, to achieve a least-square explanation of the observed image intensities. In order to achieve this we have developed a simple four-pass method of generating a height map from possibly inconsistent maps of surface gradient. Our second objective has been to exploit the additional information available from a stereo pair of images, using binocular shape from shading. The scheme developed for the monocular case has been extended to deal with stereo by casting the left and right image observations into a Cyclopean co-ordinate frame in which a single height map is constructed. This process requires an initial estimate of the height map, which we obtain using the monocular method. The additional information available in the binocular case can potentially provide more accurate estimates of surface orientation 187 BMVC 1990 doi:10.5244/C.4.34

Calculating the Surface Topography of Integrated Circuit Wafers … · 2013. 2. 28. · Calculating the Surface Topography of Integrated Circuit Wafers from SEM Images Timothy P Ellison

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  • Calculating the Surface Topography ofIntegrated Circuit Wafers from SEM Images

    Timothy P Ellison and Christopher J Taylor

    Wolfson Image Analysis UnitDepartment of Medical BioPhysics

    University of ManchesterManchester M19 3PT

    The ability to make three-dimensional measurements ofsurface topography is important to the control of quality in thefabrication ofIC wafers. We describe a technique usingshapefrom shadingto produce a dense depth map from ICs imaged inthe scanning electron microscope. The method minimises errorterms to ensure the resultant surface is everywhere continuousand accurately explains the observed image intensities. Wedescribe how this method is extended when stereo images areavailable and how the extra information in stereo could be usedto derive properties of the reflectance Junction.

    A great deal of effort is expended by the manufacturers ofintegrated circuits (ICs) in judging the quality andacceptability of device interconnect metallization onintegrated circuit wafers or dice. Typically they areinterested in measuring parameters such as the height oftracks, passivation steps, contact windows and cross-oversof metallization layers relative to the substrate, the depthof pits in the substrate and the thickness of the glassivationlayer. Due to the size of the structures involved,components are normally tested non-destructively using ascanning electron microscope (SEM). It is possible toextract some of the required quantitative informationrelatively easily from SEM images but heights relative tothe substrate are difficult to measure. We are attemptingto produce accurate measurements of three-dimensionaltopography from stereo images taken by SEM. Animportant characteristic of the problem is the variability inmaterial properties and in imaging conditions and theconsequent difficulty in modelling the imaging process.

    The SEM produces images that are highly magnifiedrepresentations of the sample, with surface shading similarto that observed in scenes illuminated by directional light(Figure 1). As a method of extracting three-dimensionalinformation from such images, shape from shading [1 ,2]offers the derivation of a dense depth map, which isparticularly useful when trying to make volumetricmeasurements. Other methods commonly adopted for theextraction of three-dimensional information rely on beingable to match features in a stereo pair of images (thecorrespondence problem). Although it is possible toobtain stereo pairs of SEM images, either by tilting themicroscope stage or by deflecting the electron beam, thesurfaces of interest in this application are sufficientlyfeatureless to make the approach unattractive.

    Figure 1. SEM image of an integrated circuit

    This paper describes our approach to recovering heightinformation from SEM images of ICs. Our first objectivehas been to exploit fully the information present in a singleimage. This involves making assumptions about therelationship between surface orientation and observedintensity, though it is possible to obtain an approximationto this reflectance function by making use of calibrationobjects. The iterative scheme we have adopted convergesrapidly to to a reasonable estimate of the height map whichit then adjusts directly, to achieve a least-squareexplanation of the observed image intensities. In order toachieve this we have developed a simple four-pass methodof generating a height map from possibly inconsistent mapsof surface gradient. Our second objective has been toexploit the additional information available from a stereopair of images, using binocular shape from shading. Thescheme developed for the monocular case has beenextended to deal with stereo by casting the left and rightimage observations into a Cyclopean co-ordinate frame inwhich a single height map is constructed. This processrequires an initial estimate of the height map, which weobtain using the monocular method. The additionalinformation available in the binocular case can potentiallyprovide more accurate estimates of surface orientation

    187

    BMVC 1990 doi:10.5244/C.4.34

  • and can resolve ambiguities present in the monocular case.We believe there is also the potential to recoverinformation about the reflectance function though thiscannot yet be demonstrated.

    PREVIOUS WORKIn general, existing algorithms for extracting the shape ofan object using shape from shading rely on knowing thereflectance properties of the object a priori (but see [ 3 ])expressed as a reflectance function or map. Such a functionmakes explicit the relationship between surfaceorientation and brightness, encoding information aboutthe surface reflectance properties and light-sourcedistribution. Most existing methods tend to make thesimplifying assumption that the object exhibits Lambertianproperties. This does not hold for SEM images.

    The problem of obtaining the shape of an object from itsshading pattern is fundamentally difficult because thereare two degrees of freedom in surface orientation at eachpicture point but only one brightness measurement, thuswe have one equation in two unknowns at each point in theimage. The problem becomes tractable if a number ofsimplifying assumptions are made concerning the objectbeing reconstructed and the lighting and viewingconditions under which the images were taken. Typicalassumptions include the image being acquired underorthographic projection and that the underlying surface iseverywhere continuous. Some methods have tended toimpose unrealistic constraints on the resulting surfaceassuming, for example, that it is smooth [ 4 ], locallyspherical [ 5 ] or hyperbolic [ 6 ]; these lead to inaccuratereconstructions of the surface. In particular shape fromshading methods that solely penalise departure fromsmoothness will cause any non-planar surface to incur apenalty and thus tend to produce results that are flatterthan the actual surface. More recently the notion of theresultant surface being integrable* has become acceptedas a sufficient condition [ 8 ]. Most methods work directlywith surface gradients, then recover height in a separatestep [ 4 ] though methods that recover height directly havebeen reported recently [9 ,2] .

    Although most papers on shape from shading only addressthe monocular case [ 4,10,2 ] there has been some workpublished on obtaining shape from shading using stereoimages, although they have tended to be concerned withaugmenting the sparse height information available bymatching stereo pairs [ 11,12 ], by using the extrainformation available as shading to "fill in the gaps" offeature based stereo - requiring the correspondenceproblem to be solved.

    MONOCULAR SHAPE FROM SHADINGWe have derived an iterative scheme for solving the shapefrom shading problem whilst enforcing the integrability ofthe recovered surface by working directly with the heightmap. The method requires a good initial estimate of theheight map, which we obtain using a rapidly converging butless accurate technique.

    Iterative Recovery of Height Map

    We use the calculus of variations [ 15 ] to derive Eulerequations that provide the necessary conditions for theminimisation of several cost functions. Given the imageE(x,y) and a reflectance function R(p,q), where p and q arethe surface gradient in x and y respectively. We areinterested in finding the surface z(x,y) which minimises,

    jjjE(x,y)-R(p,q)fdxdy

    the error, integrated over the image, between the observedintensities and those predicted using the reflectance map.We could minimise this integral in p and q but the resultwould not necessarily correspond to a continuous surface.Thus we need to find the best-fit surface z which haspartial derivatives z* and Zy that are closest to matching thecomputed components of the gradient (p and q) byminimising

    \l (zz-pf + (zy-qfdxdyCombining this integrability constraint with the intensityconstraint, we obtain

    (zy-qY)dxdy

    where \l is a Lagrangian multiplier. Finding the minimumof this integral for values of p and q is a simple calculusproblem (not involving the calculus of variations) sincethere are no partial derivatives of p and q in the function.Differentiating with respect top and q and setting equal tozero results in

    -^R(p,q) (1)

    q = zy + j(E(x,y)-R(p,q))-^R(p,q) (2)

    To find the minimum with respect to z we see that z doesnot appear directly in (E(x, y) - R(p, q)), so we just need tominimise

    This expression is a functional of the form

    F(z, Zx, Zy)dx6y, and therefore has a minimum that

    satisfies the corresponding Euler equation,

    where

    hence,

    is a necessary condition for a minimum in the functional.Rearranging we get

    t ie. the surface is twice differentiable everywhere188

    +

    dx dy

  • where

    dx2 dy2

    We can to derive an iterative scheme to solve equation (3),by using finite-difference methods to approximate thederivatives. The discrete approximation to V2 (theLaplacian operator) is

    thus,

    where € is the inter-pixel spacing, and the local average jy

    is given by

    fig = -jtfig+l + fi+lg + fig-l + fi-lg)

    We can thus rewrite equation (3) in its discrete form as

    4 ,_—\zij-zij) = Px + %

    Making zij the subject of the formula results in theiterative scheme,

    where

    and

    ^ - P i - i j ) and v(i/; = -(

  • Which we can rewrite as -m,y) + mp{x-m,y)

    where fu = +

    is the vertical local average of f,j.

    Now, taking equation (7) as the example, rearranging andsubstituting pyy gives,

    and therefore

    Using the discrete approximation,

    We have the iterative scheme,

    where2X

    Pij = -yiPij+l + Pij-l) and

    (9)

    1

    are the vertical average of/? and an estimate of the crossderivative (times €2) of q respectively.

    Equation (8) yields a similar iterative scheme for q.

    This method does not enforce integrability of the resultantsurface, but merely treats it as an error term to beminimised together with the intensity difference. Itsability to start from a poor approximation to the surfaceand its rapid convergence make it suitable for deriving aninitial surface from which to start iterating the exactscheme.

    Full Monocular Method

    We have combined the two methods described above toproduce a shape from shading scheme which convergesrapidly to an accurate estimate of height starting from a setof/?, q and z maps that do not represent a surface near thecorrect answer.

    We use the method of equation (9) to build/? and q maps inwhich departures from integrability are penalised. Oncethis method has converged we cast the gradient values ontoa coherent physical surface by scanning through thegradient maps from each comer of the reconstructedregion, at each point producing a surface height that bestexplains the local gradients whilst imposing integrability.Using the notation/? and q as before, the height at a point(x,y) is given in terms of the scan direction by,

    ;y-n)\V 8

    zmn(x,y-n) + nq(x,y-8

    z(x, y) = zn(x,y) + z.u(x,y) + z1_,(r,.y) + z_n(x,y)

    where m = ± 1 , n = ± 1 denote the direction of the scan in*and y respectively.Once the initial height map has been constructed wecontinue the method of equation (9), except that now werecalculate the/? and q maps from z at every iteration. Thiswill not converge to the correct solution but ensures thatthe solution maintains convergence during the initialstages of introducing feedback from the height map. Oncestable convergence has been re-established the method ofequations (4), (5) and (6) is applied. In practice, we do notmake this final change instantaneously but rather take aweighted combination of the two methods to achieve agraceful transition.

    BINOCULAR SHAPE FROM SHADINGWe obtain shape from binocular shading from stereoimages by building the height and orientation maps withreference to a global co-ordinate system (GCS) basedupon the Cyclopean view. The monocular shape fromshading algorithm is extended to use the shadinginformation available in both images. The extension of thealgorithm involves transforming image points from theco-ordinate systems of the left and right eye views (LCSand RCS respectively) to the GCS, using information fromthe height map. The nature of the iteration is such that thecorrespondence improves as the height map approachesthe correct solution. The error function is easily extendedto take account of the extra information available.

    If we make the simplifying assumption of obliqueprojection, then the mapping from GCS to LCS and RCSbecomes a simple rotation. Using no subscript to denotethe GCS, the subscript "IT for the LCS and the subscript"R" for the RCS and extending the scheme describedabove,

    A similar equation holds for q; the equation in z remainsunchanged.As with the exact monocular method the scheme requiresa reasonably good starting approximation. We obtain thisby computing an initial monocular solution.

    RESULTS

    Monocular MethodThe monocular method has been applied to bothsynthesised images and real SEM images. In both casesmeasurements made from calibration objects, viewed inthe SEM.were used to estimate the reflectance function.Cylinders and spheres were used as calibration objectssince surface orientation could be inferred very simply

    190

  • Figure 2. Synthesized SEM image of a cylinder Figure 5. Rendered surface reconstructed bybinocular method

    Figure 3. Height profile computed from Figure 2 Figure 4. Height profile computed from Figure 1

    from radial position in the projected image. The effects ofnoise were minimised by fitting polynomial surfacesthrough the measured data. Synthetic images of cylinderswere generated from the reflectance function and used totest the methodology. Figure 2 shows one such test imageof a 64 pixel radius cylinder. Figure 3 shows the calculatedheight profile, at the position indicated in Figure 2, after atotal of 120 iterations (Phase 1 = 60, Phase 2=60), startingfrom a plane surface. The solution was stable. The dashedline shows a least-square circle fitted to the data,indicating a calculated diameter of 65 pixels.

    Figure 4 shows a height profile of the surfacereconstructed from the IC image in Figure 1 using thesame procedure as above; again the solution was stable.No absolute height data is available for comparison but theprofile appears qualitatively correct and quantitativelyplausible.

    191

    Binocular MethodThe binocular method has only been applied to syntheticdata so far but we hope to present results obtained for realSEM images, at BMVC 90. Synthetic images of cylinderswere generated for ± 3° beam tilt. The monocularmethod was used to provide an initial estimate of theheight map as described above. The binocular methodconverged to a stable solution after about 20 iterations. Arendered illustration of the calculated surface is shown inFigure 5.

    DISCUSSIONWe have shown that it is possible to reconstruct plausibleheight maps from monocular SEM images of ICs, using amethod that converges in tens of iterations starting from aplanar surface. We have shown, using synthetic data, thatthe method can be successfully extended to deal with

  • binocular images. We are currently undertaking anexperimental determination of the accuracy of bothmethods, using real SEM images of calibration objects; theresults with synthetic images indicate that, given a goodestimate of the reflectance map, it is possible to achieveaccuracies of a few per cent in height measurement. Wehave pointed out that it is not necessarily practical toobtain a prior estimate of the reflectance map and weintend to further investigate the possibility of using theredundancy present in binocular shaded images to recoverthe reflectance map on-line. Once a reasonably stablesolution for the height map has been reached, using aninitial approximation to the reflectance map, we intend tomodify the iterative scheme to allow R(p,q) to be updatedto improve agreement between observed and predictedintensities. Stability will be maintained by applying a verystrong smoothness constraint in the reflectance map.

    Further improvements in speed may be obtainable usingmulti-grid methods though previous attempts to applythese techniques to shape from shading have achieved onlylimited success [ 13 ].

    Although many of the surfaces of interest in thisapplication are smoothly varying there are also localisedtopographical features which could be used forfeature-based stereo and it seems likely that a practicalscheme for extracting height from SEM images would alsoneed to incorporate such methods.

    ACKNOWLEDGEMENTSTim Ellison holds a Total Technology studentship fundedby SERC and Leica Cambridge Ltd.

    REFERENCES

    1 . Horn, B. K. P. Robot Vision MIT Press, 1986

    2 . Horn, B. K. P. and Brooks, M. J. Shape fromShading MIT Press, 1989

    3 . Brooks, M. J. and Horn, B. K. P. "Shape andSource from Shading" Proc. of the Intern. Joint Conf.on Artificial Intelligence, Los Angeles, California,18-23 August 1985, pp. 932-936

    4. Ikeuchi, K. and Horn, B. K. P. "Numerical Shapefrom Shading and Occluding Boundaries" ArtificialIntelligence, Vol. 17, Nos. 1-3, August 1981, pp.141-184

    5 . Pentland, A. P. "Local Shading Analysis" IEEEPAMI, Vol. 6, No. 2, March 1984, pp. 170-187

    6. Ferrie, F. P. and Levine, M. D. "Where and WhyLocal Shading Analysis Works" IEEE PAMI, Vol.11, No. 2, February 1989, pp. 198-206

    7 . Boyde, A. and Howell, P. G. T. "Taking, Presentingand Treating Stereo Data from the SEM. II."Scanning/1977, Part I, Chicago, Illinois, March 1977pp. 571-580

    8. Frankot, R. T. and Chellapa, R. "A Method forEnforcing Integrability in Shape from ShadingAlgorithms" IEEE PAMI, Vol. 10, No. 4, 1988, pp.439-451

    9 . Harris, J. J. "A New Approach to SurfaceReconstruction : The Coupled Depth/Slope Model"ICCV, London, June 8-11,1987, pp. 277-283

    10 . Horn, B. K. P. and Brooks, M. J. "The VariationApproach to Shape from Shading" MIT AI Lab.Memo 813, March 1985

    11. Ikeuchi, K. "Constructing a Depth map fromImages" AI Memo No. 744, MIT AI Lab.,Cambridge, MA, 1983

    12 . Grimson, W. E. L. "Binocular Shading and VisualSurface Reconstruction" Computer Vision, Graphicsand Image Processing, Vol. 28, 1984, pp 19-43

    13 . Ron, G. and Peleg, S. "Multiresolution Shape fromShading", IEEE PAMI, 1989, pp.350-355

    14 . Horn, B. K. P."Height and Gradient from Shading"MIT AI Laboratory Memo AI-M-1105, May 1989

    15 . Courant, R. and Hilbert, D. Methods ofMathematical Physics Volume 1 IntersciencePublishers Ltd., London, 1953

    16 . Lee, D. "A Provably Convergent Algorithm forShape from Shading" Proceedings CVPR, June 1988,Ann Arbour, MI, pp. 478-485, 1988

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