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Survey on Software Defect Prediction - PhD Qualifying Examination - July 3, 2014 Jaechang Nam Department of Computer Science and Engineering HKUST

Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

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Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

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Page 1: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Survey on Software Defect Prediction

- PhD Qualifying Examination -

July 3, 2014 Jaechang Nam

Department of Computer Science and Engineering HKUST

Page 2: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Outline

•  Background •  Software Defect Prediction Approaches

–  Simple metric and defect estimation models –  Complexity metrics and Fitting models –  Prediction models –  Just-In-Time Prediction Models –  Practical Prediction Models and Applications –  History Metrics from Software Repositories –  Cross-Project Defect Prediction and Feasibility

•  Summary and Challenging Issues

2

Page 3: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Motivation •  General question of software defect prediction

–  Can we identify defect-prone entities (source code file, binary, module, change,...) in advance? •  # of defects •  buggy or clean

•  Why? –  Quality assurance for large software

(Akiyama@IFIP ’71) –  Effective resource allocation

•  Testing (Menzies@TSE`07) •  Code review (Rahman@FSE’11)

3

Page 4: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Ground Assumption

•  The more complex, the more defect-prone

4

Page 5: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Two Focuses on Defect Prediction

•  How much complex are software and its process? –  Metrics

•  How can we predict whether software has defects? –  Models based on the metrics

5

Page 6: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Prediction Performance Goal

•  Recall vs. Precision

•  Strong predictor criteria –  70% recall and 25% false positive rate (Menzies@TSE`07) –  Precision, recall, accuracy ≥ 75% (Zimmermann@FSE`09)

6

Page 7: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Outline

•  Background •  Software Defect Prediction Approaches

–  Simple metric and defect estimation models –  Complexity metrics and Fitting models –  Prediction models –  Just-In-Time Prediction Models –  Practical Prediction Models and Applications –  History Metrics from Software Repositories –  Cross-Project Defect Prediction and Feasibility

•  Summary and Challenging Issues

7

Page 8: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Defect Prediction Approaches

1970s 1980s 1990s 2000s 2010s LOC

Simple Model

Met

rics

M

odel

s O

ther

s

Page 9: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Identifying Defect-prone Entities

•  Akiyama’s equation (Ajiyama@IFIP`71)

–  # of defects = 4.86 + 0.018 * LOC (=Lines Of Code)

•  23 defects in 1 KLOC •  Derived from actual systems

•  Limitation –  Only LOC is not enough to capture software

complexity

9

Page 10: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Defect Prediction Approaches

1970s 1980s 1990s 2000s 2010s LOC

Simple Model

Fitting Model

Cyclomatic Metric

Halstead Metrics

Met

rics

M

odel

s O

ther

s

Page 11: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Complexity Metrics and Fitting Models

•  Cyclomatic complexity metrics (McCabe`76) –  “Logical complexity” of a program represented in

control flow graph –  V(G) = #edge – #node + 2

•  Halstead complexity metrics (Halsted`77)

–  Metrics based on # of operators and operands –  Volume = N * log2n –  # of defects = Volume / 3000

11

Page 12: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Complexity Metrics and Fitting Models

•  Limitation –  Do not capture complexity (amount) of change. –  Just fitting models but not prediction models in most of

studies conducted in 1970s and early 1980s •  Correlation analysis between metrics and # of defects

–  By linear regression models

•  Models were not validated for new entities (modules).

12

Page 13: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Defect Prediction Approaches

1970s 1980s 1990s 2000s 2010s LOC

Simple Model

Fitting Model Prediction Model (Regression)

Cyclomatic Metric

Halstead Metrics

Process Metrics

Met

rics

M

odel

s O

ther

s

Prediction Model (Classification)

Page 14: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Regression Model •  Shen et al.’s empirical study (Shen@TSE`85)

–  Linear regression model –  Validated on actual new modules –  Metrics

•  Halstead, # of conditional statements •  Process metrics

–  Delta of complexity metrics between two successive system versions

–  Measures •  Between actual and predicted # of defects on new modules

–  MRE (Mean magnitude of relative error) »  average of (D-D’)/D for all modules

•  D:#actual###of#defects#•  D’:#predicted###of#defects##

»  MRE = 0.48

14

Page 15: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Classification Model •  Discriminative analysis by Munson et al. (Munson@TSE`92)

•  Logistic regression •  High risk vs. low risk modules •  Metrics

–  Halstead and Cyclomatic complexity metrics

•  Measure –  Type I error : False positive rate –  Type II error : False negative rate

•  Result –  Accuracy: 92% (6 misclassi f ication out of 78 modules) –  Precision: 85% –  Recal l : 73% –  F-measure: 88%

15

Page 16: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

?"

Defect Prediction Process (Based on Machine Learning)

16

Classification / Regression

Software Archives

B"C"C"

B"

...

2"5"0"

1"

...

Instances with metrics (features)

and labels

B"C"

B"...

2"

0"

1"

...

Training Instances (Preprocessing)

Model

?"

New instances

Generate Instances

Build a model

Page 17: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Defect Prediction (Based on Machine Learning)

•  Limitations –  Limited resources for process metrics

•  Error fix in unit testing phase was conducted informally by an individual developer (no error information available in this phase). (Shen@TSE`85)

–  Existing metrics were not enough to capture complexity of object-oriented (OO) programs.

–  Helpful for quality assurance team but not for individual developers

17

Page 18: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Defect Prediction Approaches

1970s 1980s 1990s 2000s 2010s LOC

Simple Model

Fitting Model Prediction Model (Regression)

Prediction Model (Classification)

Cyclomatic Metric

Halstead Metrics

Process Metrics

Met

rics

M

odel

s O

ther

s

Just-In-Time Prediction Model

Practical Model and Applications

History Metrics

CK Metrics

Page 19: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Defect Prediction Approaches

1970s 1980s 1990s 2000s 2010s LOC

Simple Model

Fitting Model Prediction Model (Regression)

Prediction Model (Classification)

Cyclomatic Metric

Halstead Metrics

Just-In-Time Prediction Model

Practical Model and Applications

Process Metrics

Met

rics

M

odel

s O

ther

s

History Metrics

CK Metrics

Page 20: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Risk Prediction of Software Changes (Mockus@BLTJ`00)

•  Logistic regression •  Change metrics

–  LOC added/deleted/modified –  Diffusion of change –  Developer experience

•  Result –  Both false positive and false negative rate: 20% in the

best case

20

Page 21: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Risk Prediction of Software Changes (Mockus@BLTJ`00)

•  Advantage –  Show the feasible model in practice

•  Limitation –  Conducted 3 times per week

•  Not fully Just-In-Time

–  Validated on one commercial system (5ESS switching system software)

21

Page 22: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

BugCache (Kim@ICSE`07) •  Maintain defect-prone entities in a cache

•  Approach

•  Result –  Top 10% files account for 73-95% of defects on 7 systems

22

Page 23: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

BugCache (Kim@ICSE`07) •  Advantages

–  Cache can be updated quickly with less cost. (c.f. static models based on machine learning)

–  Just-In-Time: always available whenever QA teams want to get the list of defect-prone entities

•  Limitations –  Cache is not reusable for other software projects. –  Designed for QA teams

•  Applicable only in a certain time point after a bunch of changes (e .g., end of a sprint)

•  Stil l l imited for individual developers in development phase

23

Page 24: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Change Classification (Kim@TSE`08)

•  Classification model based on SVM •  About 11,500 features

–  Change metadata such as changed LOC, change count –  Complexity metrics –  Text features from change log messages, source code, and file

names

•  Results –  78% accuracy and 60% recall on average from 12 open-source

projects

24

Page 25: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Change Classification (Kim@TSE`08) •  Limitations

–  Heavy model (11,500 features) –  Not validated on commercial software products.

25

Page 26: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Follow-up Studies •  Studies addressing limitations

–  “Reducing Features to Improve Code Change-Based Bug Prediction” (Shiva j i@TSE`13)

•  With less than 10% of all features, buggy F-measure is 21% improved.

–  “Software Change Classification using Hunk Metrics” (Ferzund@ICSM`09) •  27 hunk-level metrics for change classif ication •  81% accuracy, 77% buggy hunk precision, and 67% buggy hunk recall

–  “A large-scale empirical study of just-in-time quality assurance” (Kamei@TSE`13)

•  14 process metrics (mostly from Mockus`00) •  68% accuracy, 64% recall on 11open-source and commercial projects

–  “An Empirical Study of Just-In-Time Defect Prediction Using Cross-Project Models” (Fukushima@MSR`14)

•  Median AUC: 0.72

26

Page 27: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Challenges of JIT model

•  Practical validation is difficult –  Just 10-fold cross validation in current literature –  No validation on real scenario

•  e.g., online machine learning

•  Still difficult to review huge change –  Fine-grained prediction within a change

•  e.g., Line-level prediction

27

Page 28: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Next Steps of Defect Prediction

1980s 1990s 2000s 2010s 2020s

Online Learning JIT Model

Prediction Model (Regression)

Prediction Model (Classification)

Just-In-Time Prediction Model

Process Metrics

Metrics

Models

Others

Fine-grained Prediction

Page 29: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Defect Prediction Approaches

1970s 1980s 1990s 2000s 2010s LOC

Simple Model

Fitting Model Prediction Model (Regression)

Prediction Model (Classification)

Cyclomatic Metric

Halstead Metrics

Just-In-Time Prediction Model

Practical Model and Applications

Process Metrics

Met

rics

M

odel

s O

ther

s

History Metrics

CK Metrics

Page 30: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Defect Prediction in Industry •  “Predicting the location and number of faults in large

software systems” (Ostrand@TSE`05) –  Two industrial systems –  Recall 86% –  20% most fault-prone modules account for 62% faults

30

Page 31: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Case Study for Practical Model •  “Does Bug Prediction Support Human Developers?

Findings From a Google Case Study” (Lewis@ICSE`13)

–  No identifiable change in developer behaviors after using defect prediction model

•  Required characteristics but very challenging –  Actionable messages / obvious reasoning

31

Page 32: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Next Steps of Defect Prediction

1980s 1990s 2000s 2010s 2020s

Actionable Defect

Prediction

Prediction Model (Regression)

Prediction Model (Classification)

Just-In-Time Prediction Model

Practical Model and Applications

Process Metrics

Metrics

Models

Others

Page 33: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Evaluation Measure for Practical Model

•  Measure prediction performance based on code review effort

•  AUCEC (Area Under Cost Effectiveness Curve)

33 Percent of LOC

Perc

ent

of b

ugs

foun

d

0 100%

100%

50% 10%

M1

M2

Rahman@FSE`11, Bugcache for inspections: Hit or miss?

Page 34: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Practical Application

•  What else can we do more with defect prediction models? –  Test case selection on regression testing

(Engstrom@ICST`10) –  Prioritizing warnings from FindBugs (Rahman@ICSE`14)

34

Page 35: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Defect Prediction Approaches

1970s 1980s 1990s 2000s 2010s LOC

Simple Model

Fitting Model Prediction Model (Regression)

Prediction Model (Classification)

Cyclomatic Metric

Halstead Metrics

CK Metrics Process Metrics

Met

rics

M

odel

s O

ther

s

Practical Model and Applications

Just-In-Time Prediction Model

History Metrics

Page 36: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Representative OO Metrics

Metric Description

WMC Weighted Methods per Class (# of methods)

DIT Depth of Inheritance Tree ( # of ancestor classes)

NOC Number of Children

CBO Coupling between Objects (# of coupled classes)

RFC Response for a class: WMC + # of methods called by the class)

LCOM Lack of Cohesion in Methods (# of "connected components”)

36

•  CK metrics (Chidamber&Kemerer@TSE`94)

•  Prediction Performance of CK vs. code (Basili@TSE`96) – F-measure: 70% vs. 60%

Page 37: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Defect Prediction Approaches

1970s 1980s 1990s 2000s 2010s LOC

Simple Model

Fitting Model Prediction Model (Regression)

Prediction Model (Classification)

Cyclomatic Metric

Halstead Metrics

CK Metrics Process Metrics

Met

rics

M

odel

s O

ther

s

Practical Model and Applications

Just-In-Time Prediction Model

History Metrics

Page 38: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Representative History Metrics

38

Name # of metrics

Metric source Citation

Relative code change churn 8 SW Repo.* Nagappan@ICSE`05

Change 17 SW Repo. Moser@ICSE`08

Change Entropy 1 SW Repo. Hassan@ICSE`09

Code metric churn Code Entropy 2 SW Repo. D’Ambros@MSR`10

Popularity 5 Email archive Bacchelli@FASE`10

Ownership 4 SW Repo. Bird@FSE`11

Micro Interaction Metrics (MIM) 56 Mylyn Lee@FSE`11

* SW Repo. = version control system + issue tracking system

Page 39: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Representative History Metrics •  Advantage

–  Better prediction performance than code metrics

39

0.0%#

10.0%#

20.0%#

30.0%#

40.0%#

50.0%#

60.0%#

Moser`08# Hassan`09# D'Ambros`10# Bachille`10# Bird`11# Lee`11#

Performance Improvement (all metrics vs. code complexity metrics)

(F-measure) (F-measure) (Absolute prediction

error)

(Spearman correlation)

(Spearman correlation)

(Spearman correlation*)

(*Bird`10’s results are from two metrics vs. code metrics, No comparison data in Nagappan`05)

Performance Improvement

(%)

Page 40: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

History Metrics

•  Limitations –  History metrics do not extract par ticular program characteristics

such as developer social network, component network, and anti-pattern.

–  Not applicable for new projects and projects lacking in historical data

40

Page 41: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Defect Prediction Approaches

1970s 1980s 1990s 2000s 2010s LOC

Simple Model

Fitting Model Prediction Model (Regression)

Prediction Model (Classification)

Cyclomatic Metric

Halstead Metrics

CK Metrics

Just-In-Time Prediction Model

Cross-Project Prediction

Practical Model and Applications

Universal Model

Process Metrics

Cross-Project Feasibility

Met

rics

M

odel

s O

ther

s

History Metrics

Other Metrics

Page 42: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Defect Prediction Approaches

1970s 1980s 1990s 2000s 2010s LOC

Simple Model

Fitting Model Prediction Model (Regression)

Prediction Model (Classification)

Cyclomatic Metric

Halstead Metrics

CK Metrics

Just-In-Time Prediction Model

Cross-Project Prediction

Practical Model and Applications

Universal Model

Process Metrics

Cross-Project Feasibility

Met

rics

M

odel

s O

ther

s

History Metrics

Other Metrics

Page 43: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Other Metrics

43

Name # of metrics

Metric source Citation

Component network 28 Binaries

(Windows Server 2003)

Zimmermann@ICSE`08

Developer-Module network 9 SW Repo. + Binaries

Pinzger@FSE`08

Developer social network 4 SW Repo. Meenely@FSE`08

Anti-pattern 4 SW Repo. +

Design-pattern

Taba@ICSM`13

* SW Repo. = version control system + issue tracking system

Page 44: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Defect Prediction Approaches

1970s 1980s 1990s 2000s 2010s LOC

Simple Model

Fitting Model Prediction Model (Regression)

Prediction Model (Classification)

Cyclomatic Metric

Halstead Metrics

CK Metrics

Just-In-Time Prediction Model

Cross-Project Prediction

Practical Model and Applications

Universal Model

Process Metrics

Cross-Project Feasibility

Met

rics

M

odel

s O

ther

s

History Metrics

Other Metrics

Page 45: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Defect Prediction for New Software Projects

•  Universal Defect Prediction Model

•  Cross-Project Defect Prediction

45

Page 46: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Universal Defect Prediction Model (Zhang@MSR`14)

•  Context-aware rank transformation –  Transform metric values ranged from 1 to 10 across all

projects.

•  Model built by 1398 projects collected from SourceForge and Google code

46

Page 47: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Defect Prediction Approaches

1970s 1980s 1990s 2000s 2010s LOC

Simple Model

Fitting Model Prediction Model (Regression)

Prediction Model (Classification)

Cyclomatic Metric

Halstead Metrics

CK Metrics

Just-In-Time Prediction Model

Cross-Project Prediction

Practical Model and Applications

Universal Model

Process Metrics

Cross-Project Feasibility

Met

rics

M

odel

s O

ther

s

History Metrics

Other Metrics

Page 48: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Cross-Project Defect Prediction (CPDP)

•  For a new project or a project lacking in the historical data

48

?"

?"

?"

Training

Test

Model

Project A Project B

Only 2% out of 622 prediction combinations worked. (Zimmermann@FSE`09)

Page 49: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Transfer Learning (TL)

27

Traditional Machine Learning (ML)

Learning System

Learning System

Transfer Learning

Learning System

Learning System

Knowledge Transfer

Pan et al.@TNN`10, Domain Adaptation via Transfer Component Analysis

Page 50: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

CPDP

50

•  Adopting transfer learning

Transfer learning Metric Compensation NN Filter TNB TCA+

Preprocessing N/A Feature selection, Log-filter Log-filter Normalization

Machine learner C4.5 Naive Bayes TNB Logistic Regression

# of Subjects 2 10 10 8

# of predictions 2 10 10 26

Avg. f-measure 0.67 (W:0.79, C:0.58)

0.35 (W:0.37, C:0.26)

0.39 (NN: 0.35, C:0.33)

0.46 (W:0.46, C:0.36)

Citation Watanabe@PROMISE`08 Turhan@ESEJ`09 Ma@IST`12 Nam@ICSE`13

* NN = Nearest neighbor, W = Within, C = Cross

Page 51: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Metric Compensation (Watanabe@PROMISE`08)

•  Key idea •  New target metric value =

target metric value * average source metric value

average target metric value

51

s

Source Target New Target

Let me transform like source!

Page 52: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Metric Compensation (cont.) (Watanabe@PROMISE`08)

52

Transfer learning Metric Compensation NN Filter TNB TCA+

Preprocessing N/A Feature selection, Log-filter Log-filter Normalization

Machine learner C4.5 Naive Bayes TNB Logistic Regression

# of Subjects 2 10 10 8

# of predictions 2 10 10 26

Avg. f-measure 0.67 (W:0.79, C:0.58)

0.35 (W:0.37, C:0.26)

0.39 (NN: 0.35, C:0.33)

0.46 (W:0.46, C:0.36)

Citation Watanabe@PROMISE`08 Turhan@ESEJ`09 Ma@IST`12 Nam@ICSE`13

* NN = Nearest neighbor, W = Within, C = Cross

Page 53: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

NN filter (Turhan@ESEJ`09)

•  Key idea

•  Nearest neighbor filter – Select 10 nearest source instances of each

target instance

53

New Source Target

Hey, you look like me! Could you be my model?

Source

Page 54: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

NN filter (cont.) (Turhan@ESEJ`09)

54

Transfer learning Metric Compensation NN Filter TNB TCA+

Preprocessing N/A Feature selection, Log-filter Log-filter Normalization

Machine learner C4.5 Naive Bayes TNB Logistic Regression

# of Subjects 2 10 10 8

# of predictions 2 10 10 26

Avg. f-measure 0.67 (W:0.79, C:0.58)

0.35 (W:0.37, C:0.26)

0.39 (NN: 0.35, C:0.33)

0.46 (W:0.46, C:0.36)

Citation Watanabe@PROMISE`08 Turhan@ESEJ`09 Ma@IST`12 Nam@ICSE`13

* NN = Nearest neighbor, W = Within, C = Cross

Page 55: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Transfer Naive Bayes (Ma@IST`12)

•  Key idea

55

Target

Hey, you look like me! You will get more chance to be my best model!

Source

! Provide more weight to similar source instances to build a Naive Bayes Model Build a model

Please, consider me more important than other instances

Page 56: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Transfer Naive Bayes (cont.) (Ma@IST`12)

•  Transfer Naive Bayes

– New prior probability

– New conditional probability

56

Page 57: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Transfer Naive Bayes (cont.) (Ma@IST`12)

•  How to find similar source instances for target –  A similarity score

–  A weight value

57

F1 F2 F3 F4 Score (si)

Max of target 7 3 2 5 -

src. inst 1 5 4 2 2 3

src. inst 2 0 2 5 9 1

Min of target 1 2 0 1 -

k=# of features, si=score of instance i

Page 58: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Transfer Naive Bayes (cont.) (Ma@IST`12)

58

Transfer learning Metric Compensation NN Filter TNB TCA+

Preprocessing N/A Feature selection, Log-filter Log-filter Normalization

Machine learner C4.5 Naive Bayes TNB Logistic Regression

# of Subjects 2 10 10 8

# of predictions 2 10 10 26

Avg. f-measure 0.67 (W:0.79, C:0.58)

0.35 (W:0.37, C:0.26)

0.39 (NN: 0.35, C:0.33)

0.46 (W:0.46, C:0.36)

Citation Watanabe@PROMISE`08 Turhan@ESEJ`09 Ma@IST`12 Nam@ICSE`13

* NN = Nearest neighbor, W = Within, C = Cross

Page 59: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

TCA+ (Nam@ICSE`13)

•  Key idea – TCA (Transfer Component Analysis)

59

Source Target

Oops, we are different! Let’s meet in another world!

New Source New Target

Page 60: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Transfer Component Analysis (cont.)

•  Feature extraction approach – Dimensionality reduction – Projection •  Map original data

in a lower-dimensional feature space

60

Page 61: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Transfer Component Analysis (cont.)

•  Feature extraction approach – Dimensionality reduction – Projection •  Map original data

in a lower-dimensional feature space

61

1-dimensional feature space

2-dimensional feature space

Page 62: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Transfer Component Analysis (cont.)

•  Feature extraction approach – Dimensionality reduction – Projection •  Map original data

in a lower-dimensional feature space

62

1-dimensional feature space

2-dimensional feature space

Page 63: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

TCA (cont.)

63 Pan et al.@TNN`10, Domain Adaptation via Transfer Component Analysis

Target domain data Source domain data

Page 64: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

TCA (cont.)

64

TCA

Pan et al.@TNN`10, Domain Adaptation via Transfer Component Analysis

Page 65: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

TCA+ (Nam@ICSE`13)

65

Source Target

Oops, we are different! Let’s meet at another world!

New Source New Target

But, we are still a bit different!

Source Target

Oops, we are different! Let’s meet at another world!

New Source New Target

Normalize US together!

TCA TCA+

Page 66: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Normalization Options

•  NoN: No normalization applied

•  N1: Min-max normalization (max=1, min=0)

•  N2: Z-score normalization (mean=0, std=1)

•  N3: Z-score normalization only using source mean and standard deviation

•  N4: Z-score normalization only using target mean and standard deviation

13

Page 67: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Preliminary Results using TCA

0#

0.1#

0.2#

0.3#

0.4#

0.5#

0.6#

0.7#

0.8#

F*measure"

67 *Baseline:#CrossLproject#defect#predicNon#without#TCA#and#normalizaNon#

Baseline NoN N1 N2 N3 N4 Baseline NoN N1 N2 N3 N4

Project A ! Project B Project B ! Project A

F-m

easu

re

Page 68: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Preliminary Results using TCA

0#

0.1#

0.2#

0.3#

0.4#

0.5#

0.6#

0.7#

0.8#

F*measure"

68 *Baseline:#CrossLproject#defect#predicNon#without#TCA#and#normalizaNon#

Prediction performance of TCA varies according to different

normalization options! Baseline NoN N1 N2 N3 N4 Baseline NoN N1 N2 N3 N4

Project A ! Project B Project B ! Project A

F-m

easu

re

Page 69: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

TCA+: Decision Rules

•  Find a suitable normalization for TCA •  Steps – #1: Characterize a dataset – #2: Measure similarity

between source and target datasets – #3: Decision rules

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Page 70: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

TCA+: #1. Characterize a Dataset

70

3#

1#

…#

Dataset A Dataset B

2#

4#

5#

8#

9#

6#

11#

d1,2

d1,5

d1,3

d3,11

3#

1#

…#

2#4#

5#

8#

9#

6#11#

d2,6

d1,2

d1,3

d3,11

DIST={dij : i,j, 1 ≤ i < n, 1 < j ≤ n, i < j}

A

Page 71: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

TCA+: #2. Measure Similarity between Source and Target

•  Minimum (min) and maximum (max) values of DIST •  Mean and standard deviation (std) of DIST •  The number of instances

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Page 72: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

TCA+: #3. Decision Rules

•  Rule #1 –  Mean and Std are same ! NoN

•  Rule #2 –  Max and Min are different ! N1 (max=1, min=0)

•  Rule #3,#4 –  Std and # of instances are different ! N3 or N4 (src/tgt mean=0, std=1)

•  Rule #5 –  Default ! N2 (mean=0, std=1)

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Page 73: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

TCA+ (cont.) (Nam@ICSE`13)

73

Transfer learning Metric Compensation NN Filter TNB TCA+

Preprocessing N/A Feature selection, Log-filter Log-filter Normalization

Machine learner C4.5 Naive Bayes TNB Logistic Regression

# of Subjects 2 10 10 8

# of predictions 2 10 10 26

Avg. f-measure 0.67 (W:0.79, C:0.58)

0.35 (W:0.37, C:0.26)

0.39 (NN: 0.35, C:0.33)

0.46 (W:0.46, C:0.36)

Citation Watanabe@PROMISE`08 Turhan@ESEJ`09 Ma@IST`12 Nam@ICSE`13

* NN = Nearest neighbor, W = Within, C = Cross

Page 74: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Current CPDP using TL •  Advantages

–  Comparable prediction performance to within-prediction models

–  Benefit from the state-of-the-art TL approaches

•  Limitation –  Performance of some cross-prediction pairs is still poor.

(Negative Transfer)

74 Source Target

Page 75: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Defect Prediction Approaches

1970s 1980s 1990s 2000s 2010s LOC

Simple Model

Fitting Model Prediction Model (Regression)

Prediction Model (Classification)

Cyclomatic Metric

Halstead Metrics

CK Metrics

Just-In-Time Prediction Model

Cross-Project Prediction

Practical Model and Applications

Universal Model

Process Metrics

Cross-Project Feasibility

Met

rics

M

odel

s O

ther

s

History Metrics

Other Metrics

Page 76: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Feasibility Evaluation for CPDP •  Solution for negative transfer

–  Decision tree using project characteristic metrics (Zimmermann@FSE`09)

•  E.g. programming language , # developers, etc .

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Page 77: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Follow-up Studies •  “An investigation on the feasibility of cross-project

defect prediction.” (He@ASEJ`12)

–  Decision tree using distributional characteristics of a dataset E.g. mean, skewness, peakedness, etc.

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Page 78: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Feasibility for CPDP

•  Challenges on current studies –  Decision trees were not evaluated properly.

•  Just fitting model

–  Low target prediction coverage •  5 out of 34 target projects were feasible for cross-predictions

(He@ASEJ`12)

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Page 79: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Next Steps of Defect Prediction

1980s 1990s 2000s 2010s 2020s

Cross-Prediction Feasibility Model

Prediction Model (Regression)

Prediction Model (Classification)

CK Metrics

Just-In-Time Prediction Model

Cross-Project Prediction

Practical Model and Applications

Universal Model

Process Metrics

Cross-Project Feasibility

Metrics

Models

Others

History Metrics

Other Metrics

Page 80: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Defect Prediction Approaches

1970s 1980s 1990s 2000s 2010s LOC

Simple Model

Fitting Model Prediction Model (Regression)

Prediction Model (Classification)

Cyclomatic Metric

Halstead Metrics

CK Metrics

History Metrics

Just-In-Time Prediction Model

Cross-Project Prediction

Other Metrics

Practical Model and Applications

Universal Model

Process Metrics

Cross-Project Feasibility

Met

rics

M

odel

s O

ther

s

Page 81: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Cross-prediction Model •  Common challenge

–  Current cross-prediction models are limited to datasets with same number of metrics

–  Not applicable on projects with different feature spaces (different domains) •  NASA Dataset: Halstead, LOC •  Apache Dataset: LOC, Cyclomatic , CK metrics

81

Source Target

Page 82: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Next Steps of Defect Prediction

1980s 1990s 2000s 2010s 2020s

Prediction Model (Regression)

Prediction Model (Classification)

CK Metrics

Just-In-Time Prediction Model

Cross-Project Prediction

Practical Model and Applications

Data Privacy

Personalized Model

Universal Model

Process Metrics

Cross-Project Feasibility

Metrics

Models

Others

Cross-Domain Prediction

History Metrics

Other Metrics

Page 83: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Other Topics

83

Page 84: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Defect Prediction Approaches

1970s 1980s 1990s 2000s 2010s LOC

Simple Model

Fitting Model Prediction Model (Regression)

Prediction Model (Classification)

Cyclomatic Metric

Halstead Metrics

CK Metrics

History Metrics

Just-In-Time Prediction Model

Cross-Project Prediction

Other Metrics

Practical Model and Applications

Data Privacy

Personalized Model

Universal Model

Process Metrics

Cross-Project Feasibility

Met

rics

M

odel

s O

ther

s

Page 85: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Other Topics •  Privacy issue on defect datasets

–  MORPH (Peters@ICSE`12)

•  Mutate defect datasets while keeping prediction accuracy •  Can accelerate cross-project defect prediction with industrial

datasets

•  Personalized defect prediction model (Jiang@ASE`13)

–  “Different developers have different coding styles, commit frequencies, and experience levels, all of which cause different defect patterns.”

–  Results •  Average F-measure: 0.62 (personalized models) vs. 0.59 (non-

personalized models)

85

Page 86: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Outline

•  Background •  Software Defect Prediction Approaches

–  Simple metric and defect estimation models –  Complexity metrics and Fitting models –  Prediction models –  Just-In-Time Prediction Models –  Practical Prediction Models and Applications –  History Metrics from Software Repositories –  Cross-Project Defect Prediction and Feasibility

•  Summary and Challenging Issues

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Page 87: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Defect Prediction Approaches

1970s 1980s 1990s 2000s 2010s LOC

Simple Model

Fitting Model Prediction Model (Regression)

Prediction Model (Classification)

Cyclomatic Metric

Halstead Metrics

CK Metrics

History Metrics

Just-In-Time Prediction Model

Cross-Project Prediction

Other Metrics

Practical Model and Applications

Data Privacy

Personalized Model

Universal Model

Process Metrics

Cross-Project Feasibility

Met

rics

M

odel

s O

ther

s

Page 88: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Next Steps of Defect Prediction

1980s 1990s 2000s 2010s 2020s

Online Learning JIT Model

Actionable Defect

Prediction

Cross-Prediction Feasibility Model

Prediction Model (Regression)

Prediction Model (Classification)

CK Metrics

History Metrics

Just-In-Time Prediction Model

Cross-Project Prediction

Other Metrics

Practical Model and Applications

Data Privacy

Personalized Model

Universal Model

Process Metrics

Cross-Project Feasibility

Metrics

Models

Others

Cross-Domain Prediction

Fine-grained Prediction

Page 89: Survey on Software Defect Prediction (PhD Qualifying Examination Presentation)

Thank you!

89