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The top documents tagged [test application time]
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Sying-Jyan Wang Dept. Computer Science and Engineering National Chung-Hsing University
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1 A Random Access Scan Architecture to Reduce Hardware Overhead Anand S. Mudlapur Vishwani D. Agrawal Adit D. Singh Department of Electrical and Computer
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On Diagnosis of Multiple Faults Using Compacted Responses Jing Ye 1,2, Yu Hu 1, and Xiaowei Li 1 1 Key Laboratory of Computer System and Architecture Institute
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EE141 System-on-Chip Test Architectures Ch. 2 – Digital Test Architectures - P. 1 Chapter 2 Digital Test Architectures
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SoC TAM Design to Minimize Test Application Time Advisor Dr. Vishwani D. Agrawal Committee Members Dr. Victor P. Nelson, Dr. Adit D. Singh Apr 9, 2015
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A Random Access Scan Architecture to Reduce Hardware Overhead
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Robust Low Power VLSI ECE 7502 S2015 Analog and Mixed Signal Test ECE 7502 Class Discussion Christopher Lukas 5 th March 2015
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SoC TAM Design to Minimize Test Application Time Huiting Zhang Vishwani D. Agrawal May 12, 2015 2015 North Atlantic Test Workshop
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On Diagnosis of Multiple Faults Using Compacted Responses
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An Efficient Scan Tree Design for Test Time
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