4
IEEE Instrumentation and Measurement Tcchnology Conference Brussels. Belgium. June 4-6.1996 Uncertainties of Frequency Response Estimates Derived from Responses To Uncertain Step-Like Inputs J. P. Deyst and T. M. Souders National Institute of Standards and Technology. Gaithersburg. MD 20899. USA 1. 1. Blair Lockheed-Martin Nevada Technologies, Inc., Las Vegas, NV 89125, USA Abstract - The frequency response of a linear time-invariant system can be estimated from the measurement of its response to an ideal step input. However, an ideal step is unrealizable, and various other error sources affect the accuracy of such estimates. This paper investigates the effectof using an uncertain (inexactly known), step-like test signaL An approach is developed here for determining the s)'stematic uncertainties of the frequency response estimate of a device under test (DUT), when it is estimated from the response of the DUT to the uncertain, step-like test signal. The timc-domain uncertainties of the test signal, and those of the DUT response, are converted to the frequency domain and processed, resulting in uncertainties for the frequency responseof the DUT. Also,a mathematical proof is provided for the "envelope-modulation" method of calculating the s)'stematic uncertainties of a frequency response estimate of a device,as derived from the uncertain response of the device to an ideal step. I. INTRODUCTION Previous research has shown that the frequency responses of filters,digital oscilloscopes. analog-to-digital converters (ADCs), and linear systems in general can be estimated effectively from discrete-time step response measurements (e.g., [1-5]). Earlier studies have analyzed error sources that can affect the fTequency response estimates, such as noise, jitter, aliasing, and derivative estimation errors. In addition to these error sources. it is important to know the uncertainties of the estimated fTequency content of the step-like test signal. If known or bounded, these uncertainties can be used to determine the resulting uncertainties in frequency response estimates of OUTs that are measured using the step-like test signal. In a recent paper [6], we examined the fIrStpart of this problem, namely. determining the uncertainties of the estimate of the equivalent frequency response of a step-like signal generator. based on the systematic uncertainties of a time- domain measurement of its output (Fig. 1). By "equivalent frequency response," we mean the frequency response of the linear network that would produce the step-like signal in response to an ideal input step. The present work outlines a method for solving the second part of the problem, computing the systematic I I I I ~ uncertainties of the estimated frequency response of a OUT when the Wlcertainstep-like signal is the test input. By "uncertain:' we mean that the signal is not known with complete certainty: the measurement system that is available can only measure or estimate the signal to within some uncertainties. In [6], we developed two methods of determining the systematic uncertainties of the equivalent frequency response of a step-like signal generator. Of these, the so-called "envelope-modulation" method warrants further attention because it was offered without proof, but it produces smaller frequency response uncertainties. A mathematical proof of the envelope-modulation method is provided in this paper. in the Appendix. Because of its smaller uncertainties, that method is preferred, and is used in the present work. The main contribution of this work is outlining the application of the envelope-modulation method to the practical problem of finding the uncertainties of the estimate of the frequency response of a OUT from its response to an uncertain, step-like signal produced by a given signal generator. This application was sketched out at the end of [6]. The step-like-signal generator is modelled as an ideal step generator in series with a network having frequency response G(f). The output of the step-like-signal generator is carefully measured, and the systematic measurement uncertainties are estimated. By differentiation and Discrete Fourier Transform (OFT), and use of the envelope-modulation method, an estimate of G(t) with systematic uncertainties is produced. Then the generator is connected to the input of the OUT whose fTequency response, H(f), we wish to know (Fig. 2a). The OUT might be, for example. a filter, amplifier, attenuator. oscilloscope, or an ADC. The response of the OUT to the step-like input is carefulJy measured, and the systematic measurement uncertainties are again estimated. By differentiation, OFT, and using the envelope- modulation method. an estimate of an equivalent frequency response (G(f).H(f)) with systematic uncertainties is produced. Using that result. and the estimate of G(f), an estimate of H(t) is reconstructed (i.e, deconvolved [7], from the time-domain perspective). The uncertainties are processed appropriately, and the result is an estimate of the OUT ftequency response H(t) with systematic magnitude and phase uncertainties (Fig. 2b). 151 0-7803-3312-8/96/$5.0001996 IEEE

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IEEE Instrumentation and Measurement

Tcchnology ConferenceBrussels. Belgium. June 4-6.1996

Uncertainties of Frequency Response EstimatesDerived from Responses To Uncertain Step-Like Inputs

J. P. Deyst and T. M. SoudersNational Institute of Standards and Technology. Gaithersburg. MD 20899. USA

1. 1.BlairLockheed-Martin Nevada Technologies, Inc., Las Vegas, NV 89125, USA

Abstract -The frequency response of a linear time-invariantsystem can be estimated from the measurement of itsresponse to an ideal step input. However, an ideal step isunrealizable, and various other error sources affect theaccuracy of such estimates. This paper investigates theeffectof using an uncertain (inexactly known), step-like testsignaL An approach is developed here for determining thes)'stematic uncertainties of the frequency response estimateof a device under test (DUT), when it is estimated from theresponse of the DUT to the uncertain, step-like test signal.The timc-domain uncertainties of the test signal, and those ofthe DUT response, are converted to the frequency domainand processed, resulting in uncertainties for the frequencyresponseof the DUT. Also,a mathematical proof is providedfor the "envelope-modulation" method of calculating thes)'stematic uncertainties of a frequency response estimate ofa device,as derived from the uncertain response of the deviceto an ideal step.

I. INTRODUCTION

Previous research has shown that the frequency responses of

filters,digital oscilloscopes. analog-to-digital converters (ADCs),and linear systems in general can be estimated effectively fromdiscrete-time step response measurements (e.g., [1-5]). Earlierstudies have analyzed error sources that can affect the fTequencyresponse estimates, such as noise, jitter, aliasing, and derivativeestimation errors. In addition to these error sources. it is

important to know the uncertainties of the estimated fTequencycontent of the step-like test signal. If known or bounded, theseuncertainties can be used to determine the resulting uncertaintiesin frequency response estimates of OUTs that are measured usingthe step-like test signal. In a recent paper [6], we examined thefIrStpart of this problem, namely. determining the uncertainties ofthe estimate of the equivalent frequency response of a step-likesignal generator. based on the systematic uncertainties of a time-domain measurement of its output (Fig. 1). By "equivalentfrequency response," we mean the frequency response of thelinearnetwork that would produce the step-like signal in responseto an ideal input step. The present work outlines a method forsolving the second part of the problem, computing the systematic

II

I

I

~

uncertainties of the estimated frequency response of a OUT whenthe Wlcertainstep-like signal is the test input. By "uncertain:' wemean that the signal is not known with complete certainty: themeasurement system that is available can only measure orestimate the signal to within some uncertainties.

In [6], we developed two methods of determining the systematicuncertainties of the equivalent frequency response of a step-likesignal generator. Of these, the so-called "envelope-modulation"method warrants further attention because it was offered without

proof, but it produces smaller frequency response uncertainties.A mathematical proof of the envelope-modulation method isprovided in this paper. in the Appendix. Because of its smalleruncertainties, that method is preferred, and is used in the presentwork.

The main contribution of this work is outlining the applicationof the envelope-modulation method to the practical problem offinding the uncertainties of the estimate of the frequencyresponse of a OUT from its response to an uncertain, step-likesignal produced by a given signal generator. This application wassketched out at the end of [6]. The step-like-signal generator ismodelled as an ideal step generator in series with a networkhaving frequency response G(f). The output of thestep-like-signal generator is carefully measured, and thesystematic measurement uncertainties are estimated. Bydifferentiation and Discrete Fourier Transform (OFT), and use of

the envelope-modulation method, an estimate of G(t) withsystematic uncertainties is produced. Then the generator isconnected to the input of the OUT whose fTequency response,H(f), we wish to know (Fig. 2a). The OUT might be, forexample. a filter, amplifier, attenuator. oscilloscope, or an ADC.The response of the OUT to the step-like input is carefulJymeasured, and the systematic measurement uncertainties are againestimated. By differentiation, OFT, and using the envelope-modulation method. an estimate of an equivalent frequencyresponse (G(f).H(f)) with systematic uncertainties is produced.Using that result. and the estimate of G(f), an estimate of H(t) isreconstructed (i.e, deconvolved [7], from the time-domainperspective). The uncertainties are processed appropriately, andthe result is an estimate of the OUT ftequency response H(t) withsystematic magnitude and phase uncertainties (Fig. 2b).

151 0-7803-3312-8/96/$5.0001996 IEEE

II. BACKGROUND

A step-like-signal generator can be modeled as an ideal stepgenerator in series with a linear network, as shown in Fig. Ia. Thenetwork has frequency response G(t). The network represents thephysical realization of the generator, and is a useful model only forcertain purposes: while its output can always be represented as theresult of such a combination, it is unlikely that the signalgenerator is in fact a linear system.

The output of the step-like-signal generator, s.(t), is carefullymeasured using measurement system A to be sam[n]= \n (nT),where T is the sampling period and there are M points in the datarecord (Fig. I a). T and M are set according to the allowablealiasing error[I,4], the required resolution of the trequencyresponse estimate (6f=11MT), and the requirement that the step-like signal be virtually completely settled at the beginning and endof the recorded time epoch, to avoid spectral leakage errors [5]~this is discussed further in Section III.

The systematic uncertainties of sam[n].\l,p.[n] and u.am.[n],areassumed to be determined correctly (Fig. Ib), such that theyenclose the measurement error, e.[n], with acceptable confidencebut are not too large

Sgn,[n]+usgmJn] ~ sin1) s:Sgm[n] +usgmJn],

esg[n] = Sgn,[n]- s/n1),

usgmJn] ~ -esg[n] s: usgmJn],

where ulI[PITI-[n]s; 0 and u88JD+[n]~ O. Note the negative sign in front

of e.[n] in (3) due to the way it is defined in (2). Determiningu_gm.[n]and l\gm.[n]properly is a significant problem (e.g., [8])that we do not venture to solve here. To minimize the

tmcertainties,it is assumedthat sam[n] has been corrected as muchas possible for any known linear. nonlinear, impedance, ortimebascerrors (e.g.. [7.9-11]) of measurement systemA. ThesecOlTections are important, because small time-domainuncertainties can produce significant frequency-domainuncertainty. as shown in [6]. The uncertainties uegm.[n]andu.am.[n] then enclose any remaining systematic errors of themeasurement system, resulting for example trom imperfectcorrectionforits impulse response. or uncorrectible nonlinearity.Uncertaintiesdue to aliasing,derivative estimation, and randometTorsourcesshouldbe handledseparately,by stochasticor othermeans [1,4,6].

The signal sam[n]is differentiated in discrete time[I,4,12].yieLdinggm[n). The OFT of ~[n], normalized by T, is theestimateof O(t):

O','1(

}..{-I

G",(h> =TE gm[n] .exp( -j21tknIA1),n-ofor k =O,f:I,f:2,...,f:(M/2).

(4)

Note that Gm(fk)is only available at discrete frequencies f1;:

k

It= Mr.(5)

(I)

The systematic magnitude and phase uncertainties of 0m(f.J.UIJGm(fk) andUcj>Gm(fk), respectively, are produced from u'am.[n]and uegm.[n]by the envelope-modulation method. Note thatU11Gm(fk)andU~(fk) are both synunetric uncertainties: thenegative uncertainty for each is simply the negative of thecorresponding positive uncertainty. 'In the next section, we extend these ideas. which were presented

in [6], in order to estimate the frequency response of a OUT.

using the non-ideal but available step-like signal s,(1) as the testinput. Note that in order to produce a valid estimate of the OUTfrequency response, the step-like-signal generator should havesignificantly higher performance (i.e., at least four times higherbandwidth, shorter risetime. and shorter settling time) than that ofthe OUT.

(2) III. OUT FREQUENCYRESPONSE ESTIMATION

(3)To estimate the OUT frequency response. H(f). the output of

the step-like signal generator is connected to the input of the OUT(Fig. 2a). The resulting response of the OUT. Sy(t).is measuredby measurement system B. After as much correction as possible.

it is estimated to be sym[n],with systematic unce11ainties usvmJn]and u In). As with s@J1l[n],uncertainties due to aliasing,differcirtiation errors. and noise are to be handled separately. Ifmeasurement system B is a part of the OUT. for instance if the

OUT is a digitizer, then determination of usyrnJn] and usymJn] isproblematic~ a linear OUT response, Sy(t),may not exist, so thatuncertainties of measuring it cannot be defined. In such a case, werecommend setting uf)'lll.[n]= uaym+[n]= O. and to note having donethat with the results.

For mathematical simplicity in later calculations, it is best if Sy(t)is measured using the same number of points M and sampling

period T that are used to measure s,(1), thus assuring that YIII(t)and Gm(t) are known at the same set of discrete frequencies, J" .However, that requires that M and T are set such that S (1)and

Sy(t) are both sampled with acceptably low aliasing[l,4]. fhat therequired resolution of the final frequency response estimate

(,1f= l/MT) is achieved, and that both s.(O and Sy(t)are vil1uallycompletely settled at both the beginning and end of the datarecords. to avoid spectral leakage errors [5]. Therefore. it maybe necessary to sample S (t) and S (t) with different samplingperiods and record lengt~s. and ~hen use interpolation and

decimation to assure that ~(f) and Y m(t) are determined at thesame set of discrete frequencies. fk. For simplicity. we assume

, here that sgm[n] and syt,,[n] have the same values ofM and T.

152

~

The response of the OUT, sym[n],is differentiated. Fourier-transfonned.and normalizedby T, yieldingYm(fk):

M-lYm(h) = T L Ym[n].exp( -j21tknlM).o

where ym[n] is the discrete-time differentiation of ~ [n]. Againusing the envelope-modulation method, the systematic magnitudeand phase uncertainties of Ym(fJ are determined: U11Ym(fk) and

Utym(fk), respectively.G..(fJ can then be extracted from Ym(fk)using deconvolution

methods, to yield the estimate of H(f)

If ",(he) = Ym(he) R(he)Gm(he) ,

where R(fk) is a regularization operator that is determinedaccording to the nature of 0m(fk)and Ym(fk) [7.13]. R(fk) isessentiallyunity within the passband of 0m(fk)' which shouldinclude the frequenciesof interest in detennining H...(fk),if thecriteriain Section II are followedregardingselection of the step-likesignal generator.

IV. FREQUENCYRESPONSE UNCERTAINTIES

The systematicmagnitude and phase uncertainties of ~(fk),which areUIJHm(fk)and U4»Hm(fk).respectively, are determined byprocessingUQGm(fk), Ucf>Gm(fk),UIIYm(fk),and U4»Ym(fk), incorrespondence with the deconvolution calculation in (7).Regarding magnitude uncertainties, if we try to find thelU1certaintyon 1~(fJI by including magnitude uncertainties in (7),we get an expression like

IYm(he) I + UIIYm(h) IR(h)l.IHnr(J~)1+ Ull1fm(h)::: I~ m(he) I- UIIGm(h~

Ifwe constrain our interest to the area well within the passband of

Gm(f.J. where IGm(f,,) I»U1\Gm(fk), we can use a Taylor seriesapproximation for the fractIon in the righthand side of (8).

Combining the uncertainties U11Gm(f,) and UIIYm(fk) viaroot-sum -of-squares yields

[ ( )

2

( )

2

]

(112)

U = H UIIYm<h) + UIIGm<h)

II/fm<h) I m<h)1 IYm<h)I IGm<h)I . (9)

Note that where the asswnption IGm(fk)I»U11Gm(fk) is not valid,detennining ~m(fk) is more complicated.

Ifphase uncertainties are similarly included in (7), calculationswith phasors yield the systematic phase uncertainty for ~(fk)

r II

U4»Hm(h) ={(V4»Ym(h)f+ (V 4»Qm(h)\2 fll2). (10)

(6)

(7)

As implied earlier, in the case where the OUT is a digitizer or

oscilloscope, the tenns UIIYm(fk)and U4IYm(fk)are neglected inthe equations above.

To determine the total uncertainties of ~(fk), the systematic

uncertaintiesU1[Gm(fk),Ucf>Gm(fL),UIIYm(fk).and U4IYm(fle)can beaugmented, pnor to the calculations (9) and (10), with the othersignificantfi-equency-domain uncertainties of estimating G(t) andYet). These other uncertainties may be due to aliasing. derivativeestimation errors, and noise, and should have been determined

separately as suggested above. The uncertainties can becombined by methods such as in [14].

V. DISCUSSION

We have proposed a method of determining the systematic

magnitude and phase uncertainties, UIIHm(f,,)and U4II-Im(f,,),respectively, of a OUT frequency response estimate, H.n(f\:),thatis calculated from the response of the OUT to an uncertain,step-like input signal. This method may be applied to theestimation of the frequency responses of OUTs such as filters,amplifiers, attenuators, digitizers, oscilloscopes, and ADCs. It isworth reiterating that in the case of the latter three types of OUTs,where measurement system B is a part of the OUT, detelmining

theuncertainties usymJn]and usymJn] maybe problematic, in thatan actual linear response Sy(t) may not exist. In that case, we

recommend setting uS)111Jn]= usymJn] = 0, and noting that withthe test results ( ~(fk), Uill-Im(fie)' and UcjIHm(fk)).A [mal note is that the concepts presented here are extensible toimpulse-like signals [15,16].

(8)APPENDIX

This appendix contains the mathematical proof of the p311of theenvelope-modulation method that was empilically deIived in [6].Assume we have the situation shown in Fig. Ia, with a petfect stepsignal that is the input to the network G(t); the output is bestestimated to be sgm[n]. The negative of the measurement en.or,-e [n], defined in (2), is enclosed by properly detennined

un~rtainties usgmJn]andusgmJn] (Fig. Ib). Thepoint-by-poinluncertainty average, uavfn],and the halved difference, uhAn], are

uav[n] = (usgmJn] + usgmJn])/2,

uhJn] = (usgmJn] - usgmJn])l2.

(A.I)

(A.2)

The unproved, empilieally-derived assumption of theenvelope-modulation method is[6]: the magnitude of the Fouriertransform of esg[n] is always less than or equal to the sumofIUhd[O]I, the magnitude of the DC component of the Fourier

153

----

transfonn ofl1twJ[n],plus the magnitude of the Fdwier transfonn ofuev[n]

IEsg[k] I ~ IUNAO] I + IU QV[k] I-

ACKNOWLEDGEMENTS

(A3) The authors would like to acknowledge Robert Palm of NISTfor creatingthe figuresused in this paper.

This assumptionis proved below.Note that u.v[n] marks the centerline of the uncertainty

envelope, while ~[n] is always nonnegative and is half of thewidth of the envelope at sample n. Let r[n] be the differencebetweenthe negativeof the error, -e.[n], and u.v[n]

r[n] = -esg[n] - u~n].

Using (A.4) in (3), and then (A.I) and (A2), yields

Ir[nJi~ u,Jn].

The magnitude of the DFT of the error is

!

M-l .. J\Esg[k]1 = ~(esg[n))-exp( -j21tknIM1

I

M-l

I= ~(-r[n]-uQV[n))-exp( -j21tknlM).

Using the Triangle Inequality with (A.6), we see that

1E"lkll ~ ~ r1nl'exp(-j21tkn1M)1

I

M-t

I+ ?; uQV[n]-exp( -j21tknlM) .

It C

I

:talSO be shown using th

l

e Triangle Inequality that

~r[n] 'ex1>(-j21t/mIM)M-I M-l

s; L Ir[n]'exp(-j21t/mIM)1 =E Ir[nJIn-o n-o.

and using (A.S) gives

M-I M-t

L Ir[n] I s; L u,Jn] = U"JO].n-o n-o

..:

Combining(A.7), (A.8), and (A.9) proves (A.3)

IESg[k] I s; IU,JO] I + IU QV[kJl.

[I)

(A.9)

(A.10)

154

REFERENCES

T. M. Souders and D. R. Flach. "Accurate Frequency ResponseDetenninations trom Discrete Step Response Data." IEEE Trans.Instrum. Meas., v. 36, no. 2, pp. 433-439, Iune 1987.T. M. SoudeG and P. S. Hc:tridc.,"Accurate RF Voltage MeasurementsUsing a Sampling Voltage Tracker," IEEE Trans. Instrum. Meas., v.38, no. 2, pp. 451-456, Apr. 1989.O. B. Laug and T. M. Souders. "A Custom Integrated CircuitComparator for High-Performance Sampling Applications." IEEETrans. Instrum. Meas.. v. 41, no. 6, pp. 850-855, Dec. 1992.I. I. Blair, "Error Estimates For Frequency Responses CalculatedFrom Time-Domain Measurements." submitted for publ. to IEEETrans. Instrum. Meas.G. D. Cormadc and 1. O. Binder. "The Extended Function Fast Fourier

Transform (EF-FFT)." IEEE Trans. Instrum. Meas.. v. 38, no. 3,pp. 730-735, Iun. 1989.I. P. Deyst and T. M. Souders. "Bounds on Frequency Response&1irnaIesDerived From Uncertain Step Response Data." accepted for

publ. in IEEE Trans. InstnIm. Meas., v. 45. no. 2, Apr. 1996.W. L. <lam. "Dynamic Characterization ofWavefonn Recorders andOscilloscopes Using Pulse Standards," IEEE Trans. InstnIm. Meas., v.39,no.6,pp.952-957.Dec.1990.R. A Malewski. T. R. McComb, and M. M. C. Collins. "MeasuringProperties of Fast Digitizers Employed for Recording HV Impulses,"IEEE Trans. Instrum. Meas., v. 32, no. I, pp. 17-22. Mar. 1983.D. M. Hununels, F. H. Irons, R. Cook, and I. Papantonopoulos,"Characterization of ADCs Using a Non-Iterative Procedure." IEEEISCAS '94 Dig. of Papers. v. 2, London, UK, May 1994. pp. 5-8.1. Verspecht, "Accurate Spectral Estimation Based on MeasurementsWith a Distorted- Timebase Digitizer:' IEEE Trans. InstnIm. Mea.....v. 43. no. 2, pp. 210-215, Apr. 1994.J. P. Deyst and T. M. Souders. "Phase Plane Compensation of theNIST Sampling Comparator System," IEEE IMTC/94 Conf. Dig.,Hamamatsu, Japan, pp. 914-916, May 1994.L. R. Rabiner and K. Steiglitz, "The Design of Wide-Band Recursiveand Nonrecursive Digital Differentiators." IEEE Trans. Audio andElectroacoustics, v. 18. no. 2.. pp. 204-209 Iune 1970.N. G. Paulter, Jr., "A Causal Regularizing Deconvolution Filter forOptimal Waveform Reconstnlction," IEEE Trans. Instnlm. Meas., v.43, no. 5, pp. 740-747. Oct. 1994.B. N. Taylor and C. E. Kuyatt, "Guidelines for Evaluating andExpressing the Uncertainty of NIST Measurement Results." Tech.Note 1297, U.S. Nat'1. lost. ofStds. and Tech., Sept. 1994.D. Henderson, A G. Roddie. and A I. A Smith. "Recent

Developments in the Calibration of Fast Sampling Oscilloscopes." lEEProc. A., v. 139. no. 5, pp. 254-260. Sep. 1992.I. J. Pickerd. "Impulse-Response Testing Lets a Single Test Do theWork of Thousands," EDN, pp. 95-103, Apr. 27, 1995.

(A.4 ) (2)

[3]

(A.S)[4]

(5)

(6)

(7)

(A.6)(8)

(9)

[10]

[11]

(A.7)

(12)

[13]

[14]

(A. 8) [15)

[16]