U 3900 Brochure

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    Hitachi Spectrophotometer

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    Model

    Dimensions(spectrophotometer main unit)

    1: Baseline flatness in a range of 190 to 850 nm

    Within 0.0003 Abs (U-3900)

    Within 0.0004 Abs (U-3900H)

    2: With 1%T light attenuating plateMicrosoft Excel, Word and Windows XP are trade names of Microsoft Corporation in U.S.A.Microsoft and Windows are registered trademarks of Microsoft Corporation in U.S.A.

    NOTES: 1. Absorption cells are not included in the standard equipment, and thus should be prepared separately.

    2. A PC set is not supplied as standard equipment. It should be prepared separately.

    Monochromator

    Stray light

    Photometric range

    Photometric accuracy(checked with NIST SRM930)

    Photometric repeatability(checked with NIST SRM930)

    Wavelength range

    Spectral bandpass

    Wavelength accuracy

    Wavelength setting repeatabilityPhotometric mode

    Response

    Baseline flatness

    Baseline stability

    Baseline memory

    Wavelength scan speed

    Light source

    Sample compartment

    Light source changeover

    Detector

    Data processing unit

    Operating temperature/humidity

    Weight

    UV Solutions program

    Power consumption

    U-3900

    Specifications Software Functions (common to U-3900/U-3900H)

    U-3900 Wavelength/Time Scan,

    Measurement and Data ProcessingPhotometry

    Q'tyStandard Equipment

    1 set1 set

    1 set

    Spectrophotometer main unitTools

    Instruction manual

    0.015% 0.00025%

    Within 0.0003 Abs (190 to 850 nm) Within 0.0004 Abs (190 to 850 nm)

    Abs : -3.8 to 3.8 Abs(effective range)%T : 0 to 300%T

    Abs : -5.5 to 5.5 Abs(2)

    (effective range)%T : 0 to 300%T

    Diffraction gratingSingle monochromatorSeya-Namioka mount

    Diffraction grating-diffractiongrating Double monochromatorSeya-Namioka mount

    190 to 900 nm(1)

    0.1, 0.5, 1, 2, 4, 5 nm (6 steps)

    0.1 nm (at 656.1 nm after wavelength calibration)

    0.05 nmAbs, %T, %R, E(S), E(R)

    (Nal : 220 nm, NaNO2 : 340 nm)

    3 channels (system : 1 channel, user : 2 channels)

    Within 0.0002 Abs/hr (at 500 nm, 2 hours after power-on)

    Beam spacing: 100 mm120 (W) 300 (D) 140 (H) mm

    Automatic changeover linked with wavelength

    Changeover wavelength : Selectable in a range of 325 to 370 nm)

    Temperature : 15 to 35, Humidity: 25 to 85% (non-condensing)

    High resolution, Standard

    PC: OS Windows XP Professional SP2

    680 (W) 692 (D) 257 (H) mm

    Photomultiplier

    45 kg (spectrophotometer main unit)

    Standard software

    0.002 Abs (0 to 0.5 Abs)0.003 Abs (0.5 to 1.0 Abs)0.006 Abs (1.0 to 2.0 Abs)0.3%T

    1.5, 3, 15, 30, 60, 120, 300, 600, 1200, 1800, 2400 nm/min

    Adjustment-free deuterium lamp D2 lamp): Ultraviolet regionAdjustment-free tungsten iodine lamp (50 W)(WI lamp) : Visible region

    0.001 Abs (0 to 0.5 Abs)0.0015 Abs (0.5 to 1.0 Abs)0.003 Abs (1.0 to 2.0 Abs)0.1%T

    100 V AC50/60 Hz, 300 VA

    (excluding personal computer and printer)

    Spectrophotometer

    control

    Measuringconditions

    Execution ofmeasurement

    Recording/Display

    Dataprocessing

    Miscellaneous

    Waveleng th shift (Go to ) 100%T adjustment (auto zero) Automatic wavelength calibration Detector zero adjustment

    Measuring condition setting Condition loading Condition saving (desired number of files, file overwriting/deletion possible) Automatic start function (measuring conditions automatically set upon startup of software)

    Measurement of spectrum/change with time Repetitive spectrum measurement Setting of sampling interval Measurement with scan speed changed

    in ultraviolet region

    Condition setting for working curve(1st to 3rd order, segmented line)

    Standard data setting(20 standards, average of 20 data values)

    K factor input

    Remeasurement of working curve Interrupt measurement

    Baseline measurement (3 channels) (system baseline : 1 channel, user baseline: 2 channels)

    Sample name Comment input Ruled line printout ON/OFF Measuring condition printout ON/OFF

    Printout and display of spectrum/ change with time Spectrum loading (with preview) Spectrum saving Spectrum printout/display

    File conversion (ASCII/JCAMP) Setting of number of decimal places for display Cell length conversion Data transfer/graph copy to Microsoft Excel Print preview Display of lamp ON time

    Working curve printout/display Data deletion Data loading Data saving Data list printout/display

    Rescaling

    (numerical value input, cursor input) Spectrum trace Smoothing Peak detection Data printout (printout of wavelength/time at fixed intervals) Graph axis conversion Spectral calculation (arithmetic calculation/coefficient calculation) Differentiation (1st to 4th order) Data reset Rate calculation (only in time scan mode) Spectrum selection Spectrum display window

    Working curve trace

    Working curve erasure Data printout Sample data erasure Statistic calculation Calculation of determination coefficient Setting of correction coefficient Setting of number of decimal places for

    concentration Setting of concentration unit

    Notice: For proper operation, follow the instruction manual when using the instrument.

    Specifications in this catalog are subject to change with or without notice, as Hitachi High-Technologies Corporation continues to develop the latesttechnologies and products for our customers.

    For further information, please contactyour nearest sales representative.

    Tokyo, Japanhttp://www.hitachi-hitec.com/global/science/24-14 Nishi-Shimbashi 1-chome, Minato-ku, Tokyo, 105-8717, Japan

    Tel: +81-3-3504-7111 Fax: +81-3-3504-7123