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Modern VLSI Design 3e: Chapter 2 Copyright 1998, 2002 Prentice Hall PTR Topics Basic fabrication steps Transistor structures Basic transistor behavior Latch up Modern VLSI Design 3e: Chapter 2 Copyright 1998, 2002 Prentice Hall PTR Fabrication services Educational services: U.S.: MOSIS EC: EuroPractice Taiwan: CIC Japan: VDEC Modern VLSI Design 3e: Chapter 2 Copyright 1998, 2002 Prentice Hall PTR Fabrication processes IC built on silicon substrate Some structures diffused into substrate » Diffusion vs. Ion implantation Other structures built on top of substrate Substrate regions are doped with n-type and p- type impurities. (n+ = heavily doped) Wires made of polycrystalline silicon (poly), multiple layers of aluminum (metal) Silicon dioxide (SiO 2 ) is insulator Modern VLSI Design 3e: Chapter 2 Copyright 1998, 2002 Prentice Hall PTR Simple cross section substrate n+ n+ p+ substrate metal1 poly SiO 2 metal2 metal3 transistor via Modern VLSI Design 3e: Chapter 2 Copyright 1998, 2002 Prentice Hall PTR Photolithography Photolithography: selective masking Mask patterns are put on wafer using photo- sensitive material: Modern VLSI Design 3e: Chapter 2 Copyright 1998, 2002 Prentice Hall PTR Photolithography Cycle

Topics Fabrication servicesce.sharif.edu/courses/87-88/2/ce353/resources/root/... · 2015. 4. 6. · Modern VLSI Design 3e: Chapter 2 Copyright 1998, 2002 Prentice Hall PTR Topics

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Page 1: Topics Fabrication servicesce.sharif.edu/courses/87-88/2/ce353/resources/root/... · 2015. 4. 6. · Modern VLSI Design 3e: Chapter 2 Copyright 1998, 2002 Prentice Hall PTR Topics

Modern VLSI Design 3e: Chapter 2 Copyright 1998, 2002 Prentice Hall PTR

Topics

� Basic fabrication steps

� Transistor structures

� Basic transistor behavior

� Latch up

Modern VLSI Design 3e: Chapter 2 Copyright 1998, 2002 Prentice Hall PTR

Fabrication services

� Educational services:– U.S.: MOSIS

– EC: EuroPractice

– Taiwan: CIC

– Japan: VDEC

Modern VLSI Design 3e: Chapter 2 Copyright 1998, 2002 Prentice Hall PTR

Fabrication processes

� IC built on silicon substrate– Some structures diffused into substrate

» Diffusion vs. Ion implantation

– Other structures built on top of substrate

� Substrate regions are doped with n-type and p-type impurities. (n+ = heavily doped)

� Wires made of polycrystalline silicon (poly), multiple layers of aluminum (metal)

� Silicon dioxide (SiO2) is insulator

Modern VLSI Design 3e: Chapter 2 Copyright 1998, 2002 Prentice Hall PTR

Simple cross section

substraten+ n+p+

substrate

metal1

poly

SiO2

metal2

metal3

transistor via

Modern VLSI Design 3e: Chapter 2 Copyright 1998, 2002 Prentice Hall PTR

Photolithography

Photolithography: selective masking

Mask patterns are put on wafer using photo-sensitive material:

Modern VLSI Design 3e: Chapter 2 Copyright 1998, 2002 Prentice Hall PTR

Photolithography Cycle

Page 2: Topics Fabrication servicesce.sharif.edu/courses/87-88/2/ce353/resources/root/... · 2015. 4. 6. · Modern VLSI Design 3e: Chapter 2 Copyright 1998, 2002 Prentice Hall PTR Topics

Modern VLSI Design 3e: Chapter 2 Copyright 1998, 2002 Prentice Hall PTR

Process steps

First place tubs to provide properly-doped substrate for n-type, p-type transistors:

p-tub n-tub

substrate

Modern VLSI Design 3e: Chapter 2 Copyright 1998, 2002 Prentice Hall PTR

Process steps, cont’d.

Pattern polysilicon before diffusion regions:

p-tub n-tub

poly polygate oxide

Modern VLSI Design 3e: Chapter 2 Copyright 1998, 2002 Prentice Hall PTR

Process steps, cont’d

Add diffusions, performing self-masking:

p-tub n-tub

poly poly

n+n+ p+ p+

Modern VLSI Design 3e: Chapter 2 Copyright 1998, 2002 Prentice Hall PTR

Process steps, cont’d

Start adding metal layers:

p-tub n-tub

poly poly

n+n+ p+ p+

metal 1 metal 1

vias

Modern VLSI Design 3e: Chapter 2 Copyright 1998, 2002 Prentice Hall PTR

Transistor structure

n-type transistor:

Modern VLSI Design 3e: Chapter 2 Copyright 1998, 2002 Prentice Hall PTR

0.25 micron transistor (Bell Labs)

Poly

Silicide

Source/Drain

Gate oxide(0.25u:20~50nm 45nm: 1.2nm or 5-20 atoms tick)

Page 3: Topics Fabrication servicesce.sharif.edu/courses/87-88/2/ce353/resources/root/... · 2015. 4. 6. · Modern VLSI Design 3e: Chapter 2 Copyright 1998, 2002 Prentice Hall PTR Topics

Modern VLSI Design 3e: Chapter 2 Copyright 1998, 2002 Prentice Hall PTR

Transistor layout

n-type (tubs may vary):

w

L

Modern VLSI Design 3e: Chapter 2 Copyright 1998, 2002 Prentice Hall PTR

Drain current characteristics

Modern VLSI Design 3e: Chapter 2 Copyright 1998, 2002 Prentice Hall PTR

Drain current

� Linear region (Vds < Vgs - Vt):– Id = k’ (W/L)[(V gs - Vt).Vds- 0.5 Vds

2]

� Saturation region (Vds >= Vgs - Vt):– Id = 0.5k’ (W/L)(Vgs - Vt) 2

Modern VLSI Design 3e: Chapter 2 Copyright 1998, 2002 Prentice Hall PTR

0.5 µm transconductances

From a MOSIS process:

� n-type:– kn’ = 73 µA/V2

– Vtn = 0.7 V

� p-type:– kp’ = 21 µA/V2

– Vtp = -0.8 V

Modern VLSI Design 3e: Chapter 2 Copyright 1998, 2002 Prentice Hall PTR

Current through a transistor

Use 0.5 µm parameters. Let W/L = 3/2. Measure at boundary between linear and saturation regions.

� Vgs = 2V:Id = 0.5k’(W/L)(Vgs-Vt)2= 93 µA

� Vgs = 5V:Id = 1 mA

Modern VLSI Design 3e: Chapter 2 Copyright 1998, 2002 Prentice Hall PTR

Basic transistor parasitics

� Gate to substrate, also gate to source/drain.

� Source/drain capacitance, resistance.

Page 4: Topics Fabrication servicesce.sharif.edu/courses/87-88/2/ce353/resources/root/... · 2015. 4. 6. · Modern VLSI Design 3e: Chapter 2 Copyright 1998, 2002 Prentice Hall PTR Topics

Modern VLSI Design 3e: Chapter 2 Copyright 1998, 2002 Prentice Hall PTR

Basic transistor parasitics, cont’d

� Source/drain overlap capacitances Cgs, Cgd. Determined by source/gate and drain/gate overlaps. Independent of transistor L.– Cgs = Col W

� Gate/bulk overlap capacitance.

Modern VLSI Design 3e: Chapter 2 Copyright 1998, 2002 Prentice Hall PTR

Latch-up

� CMOS ICs have parastic silicon-controlled rectifiers (SCRs).

� When powered up, SCRs can turn on, creating low-resistance path from power to ground. Current can destroy chip.

� Early CMOS problem. Can be solved with proper circuit/layout structures.

Modern VLSI Design 3e: Chapter 2 Copyright 1998, 2002 Prentice Hall PTR

Parasitic SCR

circuit I-V behavior

Modern VLSI Design 3e: Chapter 2 Copyright 1998, 2002 Prentice Hall PTR

Parasitic SCR structure

Modern VLSI Design 3e: Chapter 2 Copyright 1998, 2002 Prentice Hall PTR

Solution to latch-up

Use tub ties to connect tub to power rail. Use enough to create low-voltage connection.

Modern VLSI Design 3e: Chapter 2 Copyright 1998, 2002 Prentice Hall PTR

Tub tie layout

metal (VDD)

p-tub

p+