TWI TRAINING & CERTIFICATION
TWI TRAINING & CERTIFICATION
TOFD Course Work No.1
Enter all answers on answer sheet
Chapter 1
1.
Who is generally credited with the introduction of the TOFD
technique?
a. J.A.G. Temple
b. M. Silk
c. J.P. Charlesworth
d. H. Harwell
2.
PISC I, PISC II, and DDT are commonly referenced when discussing
benefits of TOFD. What are these abbreviated items?
a. Round-robin trials
b. Digital processing techniques
c. TOFD electronic systems from the 1970s
d. TOFD severity ratings for flaws
3.
In the NIL/KINT thin plate project, what did TOFD have the
lowest percentage score in?
a. Probability of detection
b. Sizing accuracy
c. False Call
d. Reliability
4.
Beam boundary sizing (e.g. 6dB or 20dB drop) techniques suffer
from ______?
a. Flaw orientation considerations
b. Flaw surface texture considerations
c. Flaw size relative to beam size
d. All of the above
Chapter 2
5.
What does Huygens Principle relate to?
a. Phase interference of wavefronts
b. Diffraction angles
c. Point generators of moving wavefronts
d. Shear mode conversion off compression modes
6.
The basic setup for a TOFD configuration uses how many
probes?
a. 1
b. 2
c. 3
d. 4
7.
What aspect of grey-scale presentations make flaws apparent as
compared to single A-scans on a standard UT instrument?
a. Pattern recognition capability
b. Zero offset ability (bias)
c. Acoustic impedance
d. Signal averaging
8.
What is not an advantage of TOFD?
a. Easy discrimination of defects and geometry
b. Less sensitive to defect orientation
c. Coupling status
d. Near surface resolution
Students Name:
Date:
Question No.Answer
1
2
3
4
5
6
7
8
Question No.Answer
1B
2A
3C
4D
5C
6B
7A
8D
31TWI UT CW 1 Issue 0
