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Page 1: Spectrum Research - faenl.msi.comfaenl.msi.com/ftp/CE Documents/Notebook/Archive/MS-1047(L720)/IT report.pdf · Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong
Page 2: Spectrum Research - faenl.msi.comfaenl.msi.com/ftp/CE Documents/Notebook/Archive/MS-1047(L720)/IT report.pdf · Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong

Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong Li, Chung-Li City, Taoyuan, Taiwan, R.O.C.

TEST REPORT Reference No.:C05111709 Report No.:EMCC05111709 Page:2 of 68 Date:Dec. 14, 2005

Table of Contents 1. DOCUMENT POLICY AND TEST STATEMENT.................................................5 1.1 DOCUMENT POLICY......................................................................................... 5 1.2 TEST STATEMENT ............................................................................................ 5 1.3 EUT MODIFICATION.......................................................................................... 5 2. DESCRIPTION OF EUT AND TEST MODE .......................................................6 2.1 GENERAL DESCRIPTION OF EUT ................................................................... 6 2.2 DESCRIPTION OF EUT INTERNAL DEVICE .................................................... 6 2.3 DESCRIPTION OF TEST MODE ....................................................................... 6 3. DESCRIPTION OF APPLIED STANDARDS.......................................................7 4. EMISSION TEST ................................................................................................8 4.1 CONDUCTED EMISSION TEST FOR MAIN PORT........................................... 8 4.1.1 CONDUCTED EMISSION LIMIT........................................................................ 8 4.1.2 TEST EQUIPMENT............................................................................................ 8 4.1.3 TEST SETUP ..................................................................................................... 9 4.1.4 TEST PROCEDURE .......................................................................................... 9 4.1.5 DESCRIPTION OF SUPPORT UNIT ............................................................... 10 4.1.6 EUT OPERATING CONDITION ....................................................................... 10 4.1.7 TEST RESULT ................................................................................................. 11 4.2 RADIATED EMISSION TEST ........................................................................... 14 4.2.1 RADIATED EMISSION LIMIT........................................................................... 14 4.2.2 TEST EQUIPMENT.......................................................................................... 14 4.2.3 TEST SET-UP .................................................................................................. 15 4.2.4 TEST PROCEDURE ........................................................................................ 15 4.2.5 DESCRIPTION OF SUPPORT UNIT ............................................................... 16 4.2.6 EUT OPERATING CONDITION ....................................................................... 16 4.2.7 TEST RESULT ................................................................................................. 17 4.3 CURRENT HARMONICS TEST ....................................................................... 21 4.3.1 LIMIT FOR CLASS A EQUIPMENT.................................................................. 21 4.3.2 TEST EQUIPMENT.......................................................................................... 22 4.3.3 TEST SETUP ................................................................................................... 22 4.3.4 TEST PROCEDURE ........................................................................................ 22 4.3.5 DESCRIPTION OF SUPPORT UNIT ............................................................... 22 4.3.6 EUT OPERATING CONDITION ....................................................................... 22 4.3.7 TEST RESULT ................................................................................................. 23 4.4 VOLTAGE FLUCTUATIONS ........................................................................... 24 4.4.1 LIMIT ............................................................................................................. 24 4.4.2 TEST EQUIPMENT.......................................................................................... 24 4.4.3 TEST PROCEDURE ........................................................................................ 24 4.4.4 TEST SETUP ................................................................................................... 25 4.4.5 DESCRIPTION OF SUPPORT UNIT ............................................................... 25 4.4.6 EUT OPERATING CONDITION ....................................................................... 25 4.4.7 TEST RESULT ................................................................................................. 26 5. ELECTROSTATIC DISCHARGE IMMUNITY TEST............................................27 5.1 TEST EQUIPMENT .......................................................................................... 27

Page 3: Spectrum Research - faenl.msi.comfaenl.msi.com/ftp/CE Documents/Notebook/Archive/MS-1047(L720)/IT report.pdf · Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong

Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong Li, Chung-Li City, Taoyuan, Taiwan, R.O.C.

TEST REPORT Reference No.:C05111709 Report No.:EMCC05111709 Page:3 of 68 Date:Dec. 14, 2005

5.2 TEST PROCEDURE......................................................................................... 27 5.3 TEST SET-UP................................................................................................... 28 5.4 DESCRIPTION OF SUPPORT UNIT................................................................ 29 5.5 EUT OPERATING CONDITION........................................................................ 29 5.6 TEST CONDITION AND PERFORMANCE CRITERION.................................. 29 5.7 SUMMARY OF TEST RESULT......................................................................... 30 6. RADIATED IMMUNITY TEST .............................................................................31 6.1 TEST EQUIPMENT .......................................................................................... 31 6.2 TEST PROCEDURE......................................................................................... 31 6.3 TEST SETUP.................................................................................................... 32 6.4 DESCRIPTION OF SUPPORT UNIT................................................................ 33 6.5 EUT OPERATING CONDITION........................................................................ 33 6.6 TEST CONDITION / PERFORMANCE CRITERIA ........................................... 33 6.7 TEST RESULT.................................................................................................. 34 7. ELECTRICAL FAST TRANSIENT / BURST IMMUNITY TEST ...........................35 7.1 TEST EQUIPMENT .......................................................................................... 35 7.2 TEST PROCEDURE......................................................................................... 35 7.3 TEST SET-UP................................................................................................... 36 7.4 DESCRIPTION OF SUPPORT UNIT................................................................ 36 7.5 EUT OPERATING CONDITION........................................................................ 36 7.6 TEST CONDITION / PERFORMANCE CRITERIA ........................................... 37 7.7 SUMMARY OF TEST RESULT......................................................................... 37 8. SURGE TEST (POWER LINE) ...........................................................................38 8.1 TEST EQUIPMENT .......................................................................................... 38 8.2 TEST PROCEDURE......................................................................................... 38 8.3 TEST SET-UP................................................................................................... 38 8.4 DESCRIPTION OF SUPPORT UNIT................................................................ 38 8.5 EUT OPERATING CONDITION........................................................................ 38 8.6 TEST CONDITION / PERFORMANCE CRITERIA ........................................... 39 8.7 SUMMARY OF TEST RESULT......................................................................... 39 9. INDUCED RF FIELDS (CONDUCTED SUSCEPTIBILITY) TEST......................40 9.1 TEST EQUIPMENT .......................................................................................... 40 9.2 TEST PROCEDURE......................................................................................... 40 9.3 TEST SET-UP................................................................................................... 41 9.4 DESCRIPTION OF SUPPORT UNIT................................................................ 41 9.5 EUT OPERATING CONDITION........................................................................ 41 9.6 TEST CONDITION / PERFORMANCE CRITERIA ........................................... 42 9.7 SUMMARY OF TEST RESULT......................................................................... 42 10. POWER FREQUENCY MAGNETIC-FIELD TEST ...........................................43 10.1 TEST EQUIPMENT ........................................................................................ 43 10.2 TEST PROCEDURE....................................................................................... 43 10.3 TEST SET-UP................................................................................................. 43 10.4 DESCRIPTION OF SUPPORT UNIT.............................................................. 43 10.5 EUT OPERATING CONDITION...................................................................... 44

Page 4: Spectrum Research - faenl.msi.comfaenl.msi.com/ftp/CE Documents/Notebook/Archive/MS-1047(L720)/IT report.pdf · Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong

Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong Li, Chung-Li City, Taoyuan, Taiwan, R.O.C.

TEST REPORT Reference No.:C05111709 Report No.:EMCC05111709 Page:4 of 68 Date:Dec. 14, 2005

10.6 TEST CONDITION / PERFORMANCE CRITERIA ......................................... 44 10.7 SUMMARY OF TEST RESULT....................................................................... 44 11. VOLTAGE DIPS, INTERRUPTS, VARIATIONS TEST ......................................45 11.1 TEST EQUIPMENT......................................................................................... 45 11.2 TEST PROCEDURE....................................................................................... 45 11.3 TEST SET-UP................................................................................................. 45 11.4 DESCRIPTION OF SUPPORT UNIT .............................................................. 45 11.5 EUT OPERATING CONDITION...................................................................... 45 11.6 TEST CONDITION / PERFORMANCE CRITERIA ......................................... 46 11.7 SUMMARY OF TEST RESULT....................................................................... 46 12. PHOTOS OF TESTING ....................................................................................47 13. TERMS OF ABRIVATION .................................................................................68

Page 5: Spectrum Research - faenl.msi.comfaenl.msi.com/ftp/CE Documents/Notebook/Archive/MS-1047(L720)/IT report.pdf · Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong

Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong Li, Chung-Li City, Taoyuan, Taiwan, R.O.C.

TEST REPORT Reference No.:C05111709 Report No.:EMCC05111709 Page:5 of 68 Date:Dec. 14, 2005

1. DOCUMENT POLICY AND TEST STATEMENT

1.1 DOCUMENT POLICY

- The report shall not be reproduced except in full, without the written approval of SRT Lab, Inc.

- The report must not be used by the applicant to claim that the product is endorsed by NVLAP, TÜV, NEMKO and SRT.

- The NVLAP logo applies only to the applicable standards specified in this report.

1.2 TEST STATEMENT - The test results in the report apply only to the unit tested by SRT Lab.

- There was no deviation from the requirements of test standards during the test.

- AC power source, 230 VAC/50 Hz, was used during the test.

- The EN 61000-3-2 edition 2:2000 (Harmonic test) and EN 61000-3-3:1995 +A1:2001(Flicker test) are not included in the scope of NVLAP logo usage.

- The EN 61000-3-2 edition 2:2000 (Harmonic test) and EN 61000-3-3:1995 +A1:2001(Flicker test) are included in the scope of TÜV, NEMKO and SRT logo usage.

1.3 EUT MODIFICATION - No modification in SRT Lab.

Page 6: Spectrum Research - faenl.msi.comfaenl.msi.com/ftp/CE Documents/Notebook/Archive/MS-1047(L720)/IT report.pdf · Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong

Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong Li, Chung-Li City, Taoyuan, Taiwan, R.O.C.

TEST REPORT Reference No.:C05111709 Report No.:EMCC05111709 Page:6 of 68 Date:Dec. 14, 2005

2. DESCRIPTION OF EUT AND TEST MODE 2.1 GENERAL DESCRIPTION OF EUT

PRODUCT MEGA BOOK

MODEL NO. L720, MS-1035, L725, N1006, SIM 2050, MS-1047, N980, SIM 2040, MD95559, MD95597

POWER SUPPLY

DC from an external power adapter Brand:FSP GROUP INC Model No.: FSP090-1ADC21 Input: :100-240V, 1.6A, 50-60Hz Output : 19.0V—4.74A Unshielded power cable 1.8m

CABLE N/A TYPE Prototype

NOTE :

For more detailed information, please refer to the EUT’s specification or user’s manual provided by manufacturer. 2.2 DESCRIPTION OF EUT INTERNAL DEVICE

DEVICE BRAND / MAKER MODEL # REMARK

NOTE : 1. The highest clock is 27MHz. 2. Frequency range to be measured.

Radiated emission is 30 MHz to 1 GHz. 2.3 DESCRIPTION OF TEST MODE

Mode 1 LVD+VGA 2 VGA+TV 3 LCD+TV

Page 7: Spectrum Research - faenl.msi.comfaenl.msi.com/ftp/CE Documents/Notebook/Archive/MS-1047(L720)/IT report.pdf · Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong

Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong Li, Chung-Li City, Taoyuan, Taiwan, R.O.C.

TEST REPORT Reference No.:C05111709 Report No.:EMCC05111709 Page:7 of 68 Date:Dec. 14, 2005

3. DESCRIPTION OF APPLIED STANDARDS The EUT is a kind of ITE interface device and according to the specifications provided by the applicant, it must comply with the requirements of the following standards: EN 55022:1998+A1:2000+A2:2003, Class B EN 55024:1998+A1:2001+A2:2003 EN 61000-3-2 edition 2:2000 - IEC 61000-4-2:1995+A1:1998+A2:2001 EN 61000-3-3:1995+A1:2001 - IEC 61000-4-3:2002+A1:2002 - IEC 61000-4-4:1995+A1:2001+A2:2001 - IEC 61000-4-5:1995+A1:2001 - IEC 61000-4-6:2004 - IEC 61000-4-8:1993+A1:2001 - IEC 61000-4-11:1994+A1:2001

All tests have been performed and recorded as the above standards.

Page 8: Spectrum Research - faenl.msi.comfaenl.msi.com/ftp/CE Documents/Notebook/Archive/MS-1047(L720)/IT report.pdf · Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong

Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong Li, Chung-Li City, Taoyuan, Taiwan, R.O.C.

TEST REPORT Reference No.:C05111709 Report No.:EMCC05111709 Page:8 of 68 Date:Dec. 14, 2005

4. EMISSION TEST

4.1 CONDUCTED EMISSION TEST FOR MAIN PORT

4.1.1 CONDUCTED EMISSION LIMIT Class A (dBµV) Class B (dBµV) FREQUENCY (MHz) Quasi-peak Average Quasi-peak Average

0.15 - 0.5 79 66 66 - 56 56 - 46 0.5 - 5.0 73 60 56 46

5.0 - 30.0 73 60 60 50

NOTE: 1. The lower limit shall apply at the transition frequencies. 2. The limit decreases in line with the logarithm of the frequency in the range of 0.15 to 0.50 MHz.

4.1.2 TEST EQUIPMENT The following test equipment was used for the test:

EQUIPMENT/ FACILITIES

SPECIFICATIONS MANUFACTURERMODEL#/ SERIAL#

DUE DATE OF CAL. & CAL. CENTER

EMI TEST RECEIVER

9 kHz TO 30 MHz

ROHDE & SCHWARZ

ESHS30/ 826003/008

AUG. 2006 ETC

LISN (for EUT) 50 µH, 50 ohm FCC FCC-LISN-50-25-2/01017

NOV. 2006 ETC

LISN (for Peripheral)

50µH, 50 ohm FCC FCC-LISN-50-25-2/01018

NOV. 2006 ETC

50 ohm TERMINATOR

50 ohm HP 11593A/ 2

OCT. 2006 ETC

COAXIAL CABLE

3m SUNCITY J400/ 3M

JUL. 2006 SRT

ISOLATION TRANSFORMER

N/A APC AFC-11015/ F102040016

N/A

FILTER 2 LINE, 30A FIL.COIL FC-943/ 771

N/A

GROUND PLANE 2.3M (H) x 2.4M (W)

SRT N/A N/A

GROUND PLANE 2.4M (H) x 2.4M (W)

SRT N/A N/A

NOTE: The calibration interval of the above test equipment is one year and the calibrations are traceable to NML/ROC and NIST/USA.

Page 9: Spectrum Research - faenl.msi.comfaenl.msi.com/ftp/CE Documents/Notebook/Archive/MS-1047(L720)/IT report.pdf · Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong

Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong Li, Chung-Li City, Taoyuan, Taiwan, R.O.C.

TEST REPORT Reference No.:C05111709 Report No.:EMCC05111709 Page:9 of 68 Date:Dec. 14, 2005

4.1.3 TEST SETUP

NOTE: 1. The EUT was put on a wooden table with 0.8m height above ground plane, and 0.4m away from reference ground plane (> 2mx2m). 2. For the actual test configuration, please refer to the photos of testing. 3. The serial no. of the LISN connected to EUT is 951318. 4. The serial no. of the LISN connected to support units is 924839.

4.1.4 TEST PROCEDURE

The EUT was tested according to the requirement of EN 55022:1998+A1:2000 +A2:2003. The frequency spectrum from 0.15 MHz to 30 MHz was investigated. The LISN used was 50Ω/50µH as specified. All readings were quasi-peak and average values with 10 kHz resolution bandwidth of the test receiver. The EUT system was operated in all typical methods by users. Both lines of the power mains of EUT were measured and the cables connected to EUT and support units were moved to find the maximum emission levels for each frequency. First, find the margin or higher points at least 6 points by software, then use manual to find the maximum data. The procedure is referred on the test procedure of SRT LAB.

Isolation Transformer

Filter LISN

LISN

EUT

Support Units

EMI TEST Receiver

To Utility

Power

Coaxial Cable

Page 10: Spectrum Research - faenl.msi.comfaenl.msi.com/ftp/CE Documents/Notebook/Archive/MS-1047(L720)/IT report.pdf · Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong

Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong Li, Chung-Li City, Taoyuan, Taiwan, R.O.C.

TEST REPORT Reference No.:C05111709 Report No.:EMCC05111709 Page:10 of 68 Date:Dec. 14, 2005

4.1.5 DESCRIPTION OF SUPPORT UNIT

The EUT was configured by the requirement of EN 55022:1998+A1:2000+A2:2003. All interface ports were connected to the appropriate support units via specific cables. The support units and cables are listed below. NO DEVICE BRAND MODEL # CABLE

1 PRINTER HP N/A 1.5m unshielded power cord 1.5m shielded data cord

2 USB HD TeraSys F12-UF 1.5m unshielded data cord

3 LCD TV TECO N/A 1.5m shielded power cord

4 VGA SANGSUNG N/A 1.5m unshielded power cord 1.5m shielded data cord

5 Wireless AP PRISM NCP600 1.5m unshielded power cord

6 Mouse COMPAQ 62U4X 1.5m unshielded data cord

NOTE :

1. For the actual test configuration, please refer to the photos of testing.

4.1.6 EUT OPERATING CONDITION

1. Power on and normal work.

Page 11: Spectrum Research - faenl.msi.comfaenl.msi.com/ftp/CE Documents/Notebook/Archive/MS-1047(L720)/IT report.pdf · Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong

Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong Li, Chung-Li City, Taoyuan, Taiwan, R.O.C.

TEST REPORT Reference No.:C05111709 Report No.:EMCC05111709 Page:11 of 68 Date:Dec. 14, 2005

4.1.7 TEST RESULT

Temperature: 25°C Humidity: 62%RH Ferquency Range: 0.15 – 30 MHz Tested Model: LCD+VGA Receiver Detector: Q.P. and AV. Tested By: Nick Hsieh Tested Date: Dec. 02, 2005

Power Line Measured : Line

Reading Value(dBµV)

Emission Level(dBµV)

Limit (dBµV)

Margin (dB)

Freq. (MHz)

Correct.Factor (dB) Q.P. AV. Q.P. AV. Q.P. AV. Q.P. AV.

0.150 0.30 45.08 25.89 45.38 26.19 65.98 55.98 -20.60 -29.790.153 0.30 44.26 30.27 44.56 30.57 65.82 55.82 -21.26 -25.250.946 0.17 35.98 32.42 36.15 32.59 56.00 46.00 -19.85 -13.414.027 0.20 41.32 39.08 41.52 39.28 56.00 46.00 -14.48 -6.724.106 0.20 40.34 37.68 40.54 37.88 56.00 46.00 -15.46 -8.125.000 0.22 40.30 27.78 40.52 28.00 56.00 46.00 -15.48 -18.00

Power Line Measured : Neutral

Reading Value(dBµV)

Emission Level(dBµV)

Limit (dBµV)

Margin (dB)

Freq. (MHz)

Correct.Factor (dB) Q.P. AV. Q.P. AV. Q.P. AV. Q.P. AV.

0.150 0.30 45.52 25.63 45.82 25.93 65.98 55.98 -20.16 -30.050.156 0.30 44.72 32.10 45.02 32.40 65.66 55.66 -20.64 -23.260.869 0.19 33.48 30.13 33.67 30.32 56.00 46.00 -22.33 -15.684.904 0.22 26.64 20.57 26.86 20.79 56.00 46.00 -29.14 -25.214.953 0.22 20.34 10.90 20.56 11.12 56.00 46.00 -35.44 -34.885.142 0.22 24.36 20.45 24.58 20.67 60.00 50.00 -35.42 -29.33

NOTE : 1. Measurement uncertainty is +/-1.32dB 2. Emission level = Reading value + Correction factor 3. Correction Factor = Cable loss + Insertion loss of LISN 4. Margin value = Emission level - Limit 5. The emission of other frequencies were very low against the limit. 6. "-": The Quasi-peak reading value also meets average limit and measurement with the average detector is unnecessary.

Page 12: Spectrum Research - faenl.msi.comfaenl.msi.com/ftp/CE Documents/Notebook/Archive/MS-1047(L720)/IT report.pdf · Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong

Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong Li, Chung-Li City, Taoyuan, Taiwan, R.O.C.

TEST REPORT Reference No.:C05111709 Report No.:EMCC05111709 Page:12 of 68 Date:Dec. 14, 2005

Temperature: 25°C Humidity: 62%RH Ferquency Range: 0.15 – 30 MHz Tested Model: VGA+TV Receiver Detector: Q.P. and AV. Tested By: Nick Hsieh Tested Date: Dec. 02, 2005

Power Line Measured : Line

Reading Value(dBµV)

Emission Level(dBµV)

Limit (dBµV)

Margin (dB)

Freq. (MHz)

Correct.Factor (dB) Q.P. AV. Q.P. AV. Q.P. AV. Q.P. AV.

0.150 0.30 45.00 29.26 45.30 29.56 65.98 55.98 -20.68 -26.420.153 0.30 44.50 33.92 44.80 34.22 65.82 55.82 -21.02 -21.600.932 0.17 33.50 29.94 33.67 30.11 56.00 46.00 -22.33 -15.894.510 0.21 31.90 22.84 32.11 23.05 56.00 46.00 -23.89 -22.954.588 0.21 33.48 22.74 33.69 22.95 56.00 46.00 -22.31 -23.055.000 0.22 38.90 26.38 39.12 26.60 56.00 46.00 -16.88 -19.40

Power Line Measured : Neutral

Reading Value(dBµV)

Emission Level(dBµV)

Limit (dBµV)

Margin (dB)

Freq. (MHz)

Correct.Factor (dB) Q.P. AV. Q.P. AV. Q.P. AV. Q.P. AV.

0.153 0.30 44.56 30.06 44.86 30.36 65.82 55.82 -20.96 -25.460.471 0.25 39.00 33.59 39.25 33.84 56.48 46.48 -17.23 -12.640.706 0.20 33.78 31.32 33.98 31.52 56.00 46.00 -22.02 -14.484.628 0.21 32.40 22.21 32.61 22.42 56.00 46.00 -23.39 -23.584.707 0.21 33.96 23.28 34.17 23.49 56.00 46.00 -21.83 -22.515.000 0.22 38.94 26.38 39.16 26.60 56.00 46.00 -16.84 -19.40

NOTE : 1. Measurement uncertainty is +/-1.32dB 2. Emission level = Reading value + Correction factor 3. Correction Factor = Cable loss + Insertion loss of LISN 4. Margin value = Emission level - Limit 5. The emission of other frequencies were very low against the limit. 6. "-": The Quasi-peak reading value also meets average limit and measurement with the average detector is unnecessary.

Page 13: Spectrum Research - faenl.msi.comfaenl.msi.com/ftp/CE Documents/Notebook/Archive/MS-1047(L720)/IT report.pdf · Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong

Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong Li, Chung-Li City, Taoyuan, Taiwan, R.O.C.

TEST REPORT Reference No.:C05111709 Report No.:EMCC05111709 Page:13 of 68 Date:Dec. 14, 2005

Temperature: 25°C Humidity: 62%RH Ferquency Range: 0.15 – 30 MHz Tested Model: LCD+TV Receiver Detector: Q.P. and AV. Tested By: Nick Hsieh Tested Date: Dec. 02, 2005

Power Line Measured : Line

Reading Value(dBµV)

Emission Level(dBµV)

Limit (dBµV)

Margin (dB)

Freq. (MHz)

Correct.Factor (dB) Q.P. AV. Q.P. AV. Q.P. AV. Q.P. AV.

0.150 0.30 44.88 25.38 45.18 25.68 65.98 55.98 -20.80 -30.300.156 0.30 43.64 33.65 43.94 33.95 65.66 55.66 -21.72 -21.710.951 0.17 35.48 32.00 35.65 32.17 56.00 46.00 -20.35 -13.833.968 0.20 41.94 38.93 42.14 39.13 56.00 46.00 -13.86 -6.874.125 0.20 37.46 34.48 37.66 34.68 56.00 46.00 -18.34 -11.3212.470 0.24 28.14 23.41 28.38 23.65 60.00 50.00 -31.62 -26.35

Power Line Measured : Neutral

Reading Value(dBµV)

Emission Level(dBµV)

Limit (dBµV)

Margin (dB)

Freq. (MHz)

Correct.Factor (dB) Q.P. AV. Q.P. AV. Q.P. AV. Q.P. AV.

0.150 0.30 44.68 25.04 44.98 25.34 65.98 55.98 -21.00 -30.640.159 0.30 43.52 31.84 43.82 32.14 65.50 55.50 -21.68 -23.360.960 0.17 32.66 31.51 32.83 31.68 56.00 46.00 -23.17 -14.323.594 0.19 41.50 40.91 41.69 41.10 56.00 46.00 -14.31 -4.903.672 0.19 41.24 40.58 41.43 40.77 56.00 46.00 -14.57 -5.2312.054 0.24 27.20 22.22 27.44 22.46 60.00 50.00 -32.56 -27.54

NOTE : 1. Measurement uncertainty is +/-1.32dB 2. Emission level = Reading value + Correction factor 3. Correction Factor = Cable loss + Insertion loss of LISN 4. Margin value = Emission level - Limit 5. The emission of other frequencies were very low against the limit. 6. "-": The Quasi-peak reading value also meets average limit and measurement with the average detector is unnecessary.

Page 14: Spectrum Research - faenl.msi.comfaenl.msi.com/ftp/CE Documents/Notebook/Archive/MS-1047(L720)/IT report.pdf · Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong

Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong Li, Chung-Li City, Taoyuan, Taiwan, R.O.C.

TEST REPORT Reference No.:C05111709 Report No.:EMCC05111709 Page:14 of 68 Date:Dec. 14, 2005

4.2 RADIATED EMISSION TEST

4.2.1 RADIATED EMISSION LIMIT

EN 55022:1998+A1:2000+A2:2003 limits of radiated emission measurement for frequency below 1000 MHz

Class A (at 10m) Class B (at 10m) FREQUENCY (MHz)

dBµV/m dBµV/m 30 – 230 40 30

230 - 1000 47 37

NOTE:

1. The lower limit shall apply at the transition frequencies. 2. Emission level (dBµV/m) = 20 log Emission level (µV/m).

4.2.2 TEST EQUIPMENT

The following test equipment was used during the radiated emission test:

EQUIPMENT/ FACILITIES

SPECIFICATIONS MANUFACTURERMODEL#/ SERIAL#

DUE DATE OF CAL. & CAL. CENTER

EMI TEST RECEIVER

9 kHz TO 2.75 GHz

ROHDE & SCHWARZ

ESCS30/ 830245/012

OCT. 2006 ETC

BI-LOG ANTENNA

25 MHz TO 2 GHz

EMCO 3143/ 9509-1141

SEP. 2006 SRT

DIPOLE ANTENNA

30 MHz TO 1 GHz

EMCO 3121C/ 9611-1239

APR. 2006 ETC

OATS 3 – 10 M MEASUREMENT

SRT SRT-1 DEC. 2006 SRT

COAXIAL CABLE

25M SUNCITY J400/ 25M

AUG. 2006 SRT

FILTER 2 LINE, 30A FIL.COIL FC-943/ 869

N/A

FREQUENCY CONVERTER

N/A APC AFC-2KBB/ F100030031

AUG. 2006 SRT

NOTE: 1. The calibration interval of the above test equipment is one year and the calibrations are traceable to NML/ROC and NIST/USA. 2. The Open Area Test Site (SRT-1) is registered by FCC with No. 90957 and VCCI with No. R-1081. 3. The Open Area Test Site (SRT-2) is registered by FCC with No. 98458 and VCCI with No. R-1168.

Page 15: Spectrum Research - faenl.msi.comfaenl.msi.com/ftp/CE Documents/Notebook/Archive/MS-1047(L720)/IT report.pdf · Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong

Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong Li, Chung-Li City, Taoyuan, Taiwan, R.O.C.

TEST REPORT Reference No.:C05111709 Report No.:EMCC05111709 Page:15 of 68 Date:Dec. 14, 2005

4.2.3 TEST SET-UP

NOTE: 1. The EUT system was put on a wooden table with 0.8m heights above a ground plane. 2. For the actual test configuration, please refer to the photos of testing.

4.2.4 TEST PROCEDURE

The EUT was tested according to the requirement of EN 55022:1998+A1:2000 +A2:2003. The measurements were made at an open area test site with 10 meter measurement distance. The frequency spectrum measured from 30 MHz to 1 GHz. All readings were quasi-peak values with 120 kHz resolution bandwidth of the test receiver. The EUT system was operated in all typical methods by users. The cables connected to EUT and support units were moved to find the maximum emission levels for each frequency. First, find the margin or higher points at least 6 points by software, then use manual to find the maximum data. The procedure is referred on the test procedure of SRT LAB.

EMI Receiver

Filter To Utility

Power

EUT

Ground Plane

3/10m

0.8 m

Coaxial

Cable

Turn Table

1m – 4m

Power Cable

Page 16: Spectrum Research - faenl.msi.comfaenl.msi.com/ftp/CE Documents/Notebook/Archive/MS-1047(L720)/IT report.pdf · Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong

Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong Li, Chung-Li City, Taoyuan, Taiwan, R.O.C.

TEST REPORT Reference No.:C05111709 Report No.:EMCC05111709 Page:16 of 68 Date:Dec. 14, 2005

4.2.5 DESCRIPTION OF SUPPORT UNIT

Same as section 4.1.5 of this report.

4.2.6 EUT OPERATING CONDITION

Same as section 4.1.6 of this report.

Page 17: Spectrum Research - faenl.msi.comfaenl.msi.com/ftp/CE Documents/Notebook/Archive/MS-1047(L720)/IT report.pdf · Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong

Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong Li, Chung-Li City, Taoyuan, Taiwan, R.O.C.

TEST REPORT Reference No.:C05111709 Report No.:EMCC05111709 Page:17 of 68 Date:Dec. 14, 2005

4.2.7 TEST RESULT Temperature: 26°C Humidity: 62%RH Ferquency Range: 30 – 1000 MHz Measured Distance: 10m Receiver Detector: Q.P. Tested Model: LCD+VGA Tested By: Nick Hsieh Tested Date: Dec. 02, 2005 Antenna Polarization:Horizontal

Frequency (MHz)

Cable Loss (dB)

Antenna Factor (dB)

Reading Data

(dBµV)

EmissionLevel

(dBµV/m)

Limit (dBµV/m)

Margin (dB)

AZ(°) EL(m)

223.6250 2.18 10.37 7.0 19.5 30.0 -10.5 105.0 4.00405.0000 3.10 16.27 11.1 30.5 37.0 -6.5 42.9 2.29459.0000 3.05 16.97 5.1 25.1 37.0 -11.9 39.7 2.80432.0236 3.01 16.62 7.2 26.8 37.0 -10.2 193.5 2.64447.5010 2.96 16.81 8.1 27.9 37.0 -9.1 277.2 2.16749.5020 4.20 21.30 4.4 29.9 37.0 -7.1 325.6 1.25

Antenna Polarization:Vertical

Frequency (MHz)

Cable Loss (dB)

Antenna Factor (dB)

Reading Data

(dBµV)

EmissionLevel

(dBµV/m)

Limit (dBµV/m)

Margin (dB)

AZ(°) EL(m)

48.0075 0.97 6.46 14.0 21.4 30.0 -8.6 19.3 1.0073.7275 1.19 6.48 17.2 24.9 30.0 -5.1 351.6 1.00152.3800 1.49 9.84 10.0 21.3 30.0 -8.7 286.1 1.00219.0470 2.19 10.20 11.8 24.2 30.0 -5.8 168.2 1.00540.0000 3.64 18.18 5.0 26.8 37.0 -10.2 216.8 1.00540.8600 3.64 18.18 6.6 28.4 37.0 -8.6 302.7 1.00

NOTE : 1. Measurement uncertainty is +/-2dB. 2. "*": Measurement does not apply for this frequency. 3. Emissiom Level = Reading Value + Ant. Factor + Cable Loss. 4. The field strength of other emission frequencies were very low against the limit.

Page 18: Spectrum Research - faenl.msi.comfaenl.msi.com/ftp/CE Documents/Notebook/Archive/MS-1047(L720)/IT report.pdf · Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong

Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong Li, Chung-Li City, Taoyuan, Taiwan, R.O.C.

TEST REPORT Reference No.:C05111709 Report No.:EMCC05111709 Page:18 of 68 Date:Dec. 14, 2005

Temperature: 26°C Humidity: 62%RH Ferquency Range: 30 – 1000 MHz Measured Distance: 10m Receiver Detector: Q.P. Tested Model: VGA+TV Tested By: Nick Hsieh Tested Date: Dec. 02, 2005 Antenna Polarization:Horizontal

Frequency (MHz)

Cable Loss (dB)

Antenna Factor (dB)

Reading Data

(dBµV)

EmissionLevel

(dBµV/m)

Limit (dBµV/m)

Margin (dB)

AZ(°) EL(m)

124.0900 1.92 7.04 11.2 20.2 40.0 -19.8 238.1 1.7 138.6400 2.07 9.28 12.1 23.4 40.0 -16.6 129.8 1.2 219.1500 2.61 10.36 12.4 25.4 40.0 -14.6 348.4 1.3 499.4520 4.12 16.10 7.8 28.0 47.0 -19.0 126.7 1.3 847.6380 5.57 22.18 7.3 35.0 47.0 -12.0 144.2 2.1 935.0100 5.86 22.89 8.2 36.9 47.0 -10.1 234.9 1.7

Antenna Polarization:Vertical

Frequency (MHz)

Cable Loss (dB)

Antenna Factor (dB)

Reading Data

(dBµV)

EmissionLevel

(dBµV/m)

Limit (dBµV/m)

Margin (dB)

AZ(°) EL(m)

138.6400 2.07 9.28 13.8 25.1 40.0 -14.9 156.8 1.3 179.3800 2.34 12.13 14.3 28.8 40.0 -11.2 87.9 1.4 498.5100 4.11 16.10 18.9 39.1 47.0 -7.9 246.9 1.3 541.1900 4.33 16.63 11.3 32.3 47.0 -14.7 95.4 1.1 639.1600 4.72 18.80 8.6 32.1 47.0 -14.9 338.7 1.2 719.6700 5.09 21.17 7.3 33.6 47.0 -13.4 135.1 1.1

NOTE : 1. Measurement uncertainty is +/-2dB. 2. "*": Measurement does not apply for this frequency. 3. Emissiom Level = Reading Value + Ant. Factor + Cable Loss. 4. The field strength of other emission frequencies were very low against the limit.

Page 19: Spectrum Research - faenl.msi.comfaenl.msi.com/ftp/CE Documents/Notebook/Archive/MS-1047(L720)/IT report.pdf · Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong

Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong Li, Chung-Li City, Taoyuan, Taiwan, R.O.C.

TEST REPORT Reference No.:C05111709 Report No.:EMCC05111709 Page:19 of 68 Date:Dec. 14, 2005

Temperature: 26°C Humidity: 62%RH Ferquency Range: 30 – 1000 MHz Measured Distance: 10m Receiver Detector: Q.P. Tested Model: LCD+TV Tested By: Nick Hsieh Tested Date: Dec. 02, 2005 Antenna Polarization:Horizontal

Frequency (MHz)

Cable Loss (dB)

Antenna Factor (dB)

Reading Data

(dBµV)

EmissionLevel

(dBµV/m)

Limit (dBµV/m)

Margin (dB)

AZ(°) EL(m)

92.0800 1.77 7.46 10.5 19.7 40.0 -20.3 188.5 1.5 111.4800 1.84 7.48 10.3 19.6 40.0 -20.4 87.5 1.3 198.7800 2.47 9.88 14.1 26.5 40.0 -13.5 296.3 1.4 540.2200 4.32 16.62 10.3 31.2 47.0 -15.8 133.9 1.2 666.3200 4.85 19.78 9.6 34.2 47.0 -12.8 86.7 1.8 935.1000 5.86 22.89 9.3 38.0 47.0 -9.0 278 1.5

Antenna Polarization:Vertical

Frequency (MHz)

Cable Loss (dB)

Antenna Factor (dB)

Reading Data

(dBµV)

EmissionLevel

(dBµV/m)

Limit (dBµV/m)

Margin (dB)

AZ(°) EL(m)

71.7100 1.58 6.68 13.8 22.1 40.0 -17.9 123.7 1.4 95.9800 1.79 8.00 10.7 20.5 40.0 -19.5 87.5 1.3 197.8100 2.47 10.02 12.0 24.5 40.0 -15.5 188.4 1.4 499.4800 4.12 16.10 9.7 29.9 47.0 -17.1 67.9 1.5 839.9500 5.53 22.13 8.4 36.1 47.0 -10.9 233.6 1.3 960.2300 5.92 23.16 8.9 38.0 47.0 -9.0 56.8 1.2

NOTE : 1. Measurement uncertainty is +/-2dB. 2. "*": Measurement does not apply for this frequency. 3. Emissiom Level = Reading Value + Ant. Factor + Cable Loss. 4. The field strength of other emission frequencies were very low against the limit.

Page 20: Spectrum Research - faenl.msi.comfaenl.msi.com/ftp/CE Documents/Notebook/Archive/MS-1047(L720)/IT report.pdf · Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong

Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong Li, Chung-Li City, Taoyuan, Taiwan, R.O.C.

TEST REPORT Reference No.:C05111709 Report No.:EMCC05111709 Page:20 of 68 Date:Dec. 14, 2005

Temperature: 21°C Humidity: 63%RH Ferquency Range: Above 1GHz Measured Distance: 10m Receiver Detector: Q.P. Tested Model: LCD+VGA Tested By: Nick Hsieh Tested Date: Dec. 02, 2005

Antenna Polarization:Horizontal Reading (dBµV)

Emission(dBµV/m)

Limit Line(dBµV/m)

Over Limit (dBµV/m) Frequency

(MHz)

Cable Loss (dB)

Antenna Factor (dB) PK AV PK AV PK AV PK AV

AZ(°) EL(m)

1022.36 -34.80 24.25 58.7 43.6 48.2 33.1 74.0 54.0 -25.8 -20.9 135 1.581136.27 -34.63 24.50 50.2 30.2 40.1 20.1 74.0 54.0 -33.9 -33.9 167 1.511205.67 -33.86 24.65 52.4 36.7 43.2 27.5 74.0 54.0 -30.8 -26.5 124 1.691602.49 -32.92 25.69 53.9 36.9 46.7 29.7 74.0 54.0 -27.3 -24.3 135 1.721717.74 -32.96 26.12 51.8 33.1 45.0 26.3 74.0 54.0 -29.0 -27.7 74 1.262000.46 -32.98 27.20 49.6 31.5 43.8 25.7 74.0 54.0 -30.2 -28.3 90 1.59

NOTE :

Antenna Polarization:Vertical Reading (dBµV)

Emission(dBµV/m)

Limit Line(dBµV/m)

Over Limit (dBµV/m) Frequency

(MHz)

Cable Loss (dB)

Antenna Factor (dB) PK AV PK AV PK AV PK AV

AZ(°) EL(m)

1022.36 -34.80 24.25 58.7 43.6 48.2 33.1 74.0 54.0 -25.8 -20.9 135 1.581136.27 -34.63 24.50 50.2 30.2 40.1 20.1 74.0 54.0 -33.9 -33.9 167 1.511205.67 -33.86 24.65 52.4 36.7 43.2 27.5 74.0 54.0 -30.8 -26.5 124 1.691602.49 -32.92 25.69 53.9 36.9 46.7 29.7 74.0 54.0 -27.3 -24.3 135 1.72

1717.74 -32.96 26.12 51.8 33.1 45.0 26.3 74.0 54.0 -29.0 -27.7 74 1.262000.46 -32.98 27.20 49.6 31.5 43.8 25.7 74.0 54.0 -30.2 -28.3 90 1.59

NOTE : 1. Measurement uncertainty is +/-2dB. 2. "*": Measurement does not apply for this frequency. 3. Emissiom Level = Reading Value + Ant. Factor + Cable Loss. 4. The field strength of other emission frequencies were very low against the limit.

Page 21: Spectrum Research - faenl.msi.comfaenl.msi.com/ftp/CE Documents/Notebook/Archive/MS-1047(L720)/IT report.pdf · Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong

Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong Li, Chung-Li City, Taoyuan, Taiwan, R.O.C.

TEST REPORT Reference No.:C05111709 Report No.:EMCC05111709 Page:21 of 68 Date:Dec. 14, 2005

4.3 CURRENT HARMONICS TEST 4.3.1 LIMIT For Class A Equipment

EVEN HARMONICS ODD HARMONICS HARMONICS

ORDER LIMIT (Amp.) HARMONICS ORDER LIMIT (Amp.)

2 1.08 3 2.30 4 0.43 5 1.14 6 0.30 7 0.77

8 < n < 40 0.23 x 8 / n 9 0.40 11 0.33 13 0.21 15 < n < 39 0.15 x 8 / n

For Class D Equipment

Harmonics Order n

Max. permissible harmonics current per watt (mA/W)

Max. permissible harmonics current (A)

Odd Harmonics only 3 3.4 2.30 5 1.9 1.14 7 1.0 0.77 9 0.5 0.40 11 0.35 0.33 13 0.30 0.21

15 ≤ n ≤ 39 3.85 / n 0.15 x 15 / n

NOTE:

1. Class A and Class D are judged by test equipment automatically as per Section 5 of

EN 61000-3-2 edition 2:2000.

2. The above limits for Class D equipment are for all applications having an active input power > 75 W. No limits apply for equipment with an active input power up to and including 75 W.

Page 22: Spectrum Research - faenl.msi.comfaenl.msi.com/ftp/CE Documents/Notebook/Archive/MS-1047(L720)/IT report.pdf · Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong

Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong Li, Chung-Li City, Taoyuan, Taiwan, R.O.C.

TEST REPORT Reference No.:C05111709 Report No.:EMCC05111709 Page:22 of 68 Date:Dec. 14, 2005

4.3.2 TEST EQUIPMENT

EQUIPMENT / FACILITIES

MANUFACTURER MODEL # /

DUE DATE OF CAL.

& CAL. CENTER

MAIN UNIT HP 6842A/ 3734A00212

MAR. 2006 ETC

NOTE: The calibration interval of the above test equipment is one year and the calibrations are traceable to NML/ROC and NIST/USA.

4.3.3 TEST SETUP

NOTE :

1. The EUT system was put on a wooden table with 0.8m high.

2. For the actual test configuration, please refer to the photos of testing.

4.3.4 TEST PROCEDURE

According to EN61000-3-2 edition 2:2000

4.3.5 DESCRIPTION OF SUPPORT UNIT

Same as section 4.1.5 of this report.

4.3.6 EUT OPERATING CONDITION

Same as section 4.1.6 of this report.

Auxiliary

Equipment EUT

Harmonics/

Flicker tester

To utility power

Page 23: Spectrum Research - faenl.msi.comfaenl.msi.com/ftp/CE Documents/Notebook/Archive/MS-1047(L720)/IT report.pdf · Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong

Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong Li, Chung-Li City, Taoyuan, Taiwan, R.O.C.

TEST REPORT Reference No.:C05111709 Report No.:EMCC05111709 Page:23 of 68 Date:Dec. 14, 2005

4.3.7 TEST RESULT

Temperature: 25°C Humidity: 62% RH 0.266A Fundamental Current:

Voltage: 225.6Vrms

Max. Power Consumption:

57.5W

Power Factor: 0.938 Tested Mode: LCD+VGA

Tested By: Nick Hsieh Tested Date: Nov 22, 2006 Maximum Reading Data:

Odd Harm. Order Reading Data (A) Limit (A) Test Result

15 0.0040 0.1500 PASS

Temperature: 25°C Humidity: 62% RH

0.224A Fundamental Current: Voltage: 225.6Vrms

Max. Power Consumption:

47.7W

Power Factor: 0.921 Tested Mode: VGA+TV

Tested By: Nick Hsieh Tested Date: Nov. 22, 2005 Maximum Reading Data:

Odd Harm. Order Reading Data (A) Limit (A) Test Result

15 0.0039 0.1500 PASS

Temperature: 25°C Humidity: 62% RH

0.253A Fundamental Current: Voltage: 225.6Vrms

Max. Power Consumption:

54.6W

Power Factor: 0.934 Tested Mode: LCD+TV

Tested By: Nick Hsieh Tested Date: Nov. 22, 2005 Maximum Reading Data:

Odd Harm. Order Reading Data (A) Limit (A) Test Result

15 0.0040 0.1500 PASS

Page 24: Spectrum Research - faenl.msi.comfaenl.msi.com/ftp/CE Documents/Notebook/Archive/MS-1047(L720)/IT report.pdf · Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong

Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong Li, Chung-Li City, Taoyuan, Taiwan, R.O.C.

TEST REPORT Reference No.:C05111709 Report No.:EMCC05111709 Page:24 of 68 Date:Dec. 14, 2005

4.4 VOLTAGE FLUCTUATIONS 4.4.1 LIMIT Short-term flicker (Pst) : 1.0 Long-term flicker (Plt) : 0.65 Relative steady-state voltage change (Dc) : ≤ 3% Relative voltage change characteristic (D (t) ) > 3% ; (TD(t)) : ≤ 200 ms Maximum relative voltage change (Dmax) : ≤ 4%

TEST ITEM LIMIT NOTE Pst 1.0 Pst means short-term flicker indicator. Plt 0.65 Plt means long-term flicker indicator.

TD(t) (ms) 200 TD(t) means maximum time that D (t) exceeds 3 %.Dmax (%) 4% Dmax means maximum relative voltage change. Dc (%) 3% Dc means relative steady-state voltage change

4.4.2 TEST EQUIPMENT

EQUIPMENT / FACILITIES MANUFACTURER MODEL # /

DUE DATE OF CAL.

& CAL. CENTER

MAIN UNIT HP 6842A/ 3734A00212

MAR. 2006 ETC

NOTE: The calibration interval of the above test equipment is one year and the calibrations are traceable to NML/ROC and NIST/USA. 4.4.3 TEST PROCEDURE

According to EN 61000-3-3:1995+A1:2001

Page 25: Spectrum Research - faenl.msi.comfaenl.msi.com/ftp/CE Documents/Notebook/Archive/MS-1047(L720)/IT report.pdf · Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong

Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong Li, Chung-Li City, Taoyuan, Taiwan, R.O.C.

TEST REPORT Reference No.:C05111709 Report No.:EMCC05111709 Page:25 of 68 Date:Dec. 14, 2005

4.4.4 TEST SETUP

NOTE : 1. The EUT system was put on a wooden table with 0.8m high.

2. For the actual test configuration, please refer to the photos of testing.

4.4.5 DESCRIPTION OF SUPPORT UNIT

Same as section 4.1.5 of this report. 4.4.6 EUT OPERATING CONDITION

Same as section 4.1.6 of this report.

Auxiliary

Equipment EUT

Harmonics/

Flicker tester

To utility power

Page 26: Spectrum Research - faenl.msi.comfaenl.msi.com/ftp/CE Documents/Notebook/Archive/MS-1047(L720)/IT report.pdf · Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong

Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong Li, Chung-Li City, Taoyuan, Taiwan, R.O.C.

TEST REPORT Reference No.:C05111709 Report No.:EMCC05111709 Page:26 of 68 Date:Dec. 14, 2005

4.4.7 TEST RESULT

Temperature: 25°C Humidity: 62% RH 225.6Vrms Input Voltage:

Ampere: 0.3Arms Observation Period:

1Hr

Power Factor: 0.931 Tested Mode: LCD+VGA

Tested By: Nick Hsieh Tested Date: Nov. 22, 2005 Temperature: 25°C Humidity: 62% RH

225.6Vrms Input Voltage: Ampere: 0.2Arms

Observation Period:

1Hr

Power Factor: 0.911 Tested Mode: VGA+TV

Tested By: Nick Hsieh Tested Date: Nov. 22, 2005 Temperature: 25°C Humidity: 62% RH

225.6Vrms Input Voltage: Ampere: 0.2Arms

Observation Period:

1Hr

Power Factor: 0.929 Tested Mode: LCD+TV

Tested By: Nick Hsieh Tested Date: Nov. 22, 2005 Tested Result:

TEST PARAMETER MEASUREMENT VALUE LIMIT TEST RESULT

Pst 0.07 1.0 PASS Plt 0.07 0.65 PASS

TD(t) (ms) 0 200 PASS Dmax (%) 0% 4% PASS Dc (%) 0% 3% PASS

NOTE: 1. Pst means short-term flicker indicator. 2. Plt means long-term flicker indicator. 3. TD(t) means maximum time that D(t) exceeds 3 %. 4. Dmax means maximum relative voltage change. 5. Dc means relative steady-state voltage change. 6. N/A: Not applicable.

Page 27: Spectrum Research - faenl.msi.comfaenl.msi.com/ftp/CE Documents/Notebook/Archive/MS-1047(L720)/IT report.pdf · Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong

Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong Li, Chung-Li City, Taoyuan, Taiwan, R.O.C.

TEST REPORT Reference No.:C05111709 Report No.:EMCC05111709 Page:27 of 68 Date:Dec. 14, 2005

5. ELECTROSTATIC DISCHARGE IMMUNITY TEST

5.1 TEST EQUIPMENT

EQUIPMENT / FACILITIES

MANUFACTURERMODEL # / SERIAL #

DUE DATE OF CAL. & CAL. CENTER

ESD SIMULATOR NOISEKEN ESS-100L(A)/TC-815P/ 8099C02238/7099C02

OCT. 2006 ETC

HCP (1.6M x 0.8M) SRT WITH TWO 470k OHM CABLE

N/A

VCP (0.5M x 0.5M) SRT WITH TWO 470k OHM CABLE

N/A

GROUND PLANE (3.4M x 2.4M)

SRT N/A N/A

NOTE: The calibration interval of the above test equipment is one year and the calibrations are traceable to NML/ROC and NIST/USA.

5.2 TEST PROCEDURE

According to IEC/EN 61000-4-2:1995+A1:1998+A2:2001

Page 28: Spectrum Research - faenl.msi.comfaenl.msi.com/ftp/CE Documents/Notebook/Archive/MS-1047(L720)/IT report.pdf · Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong

Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong Li, Chung-Li City, Taoyuan, Taiwan, R.O.C.

TEST REPORT Reference No.:C05111709 Report No.:EMCC05111709 Page:28 of 68 Date:Dec. 14, 2005

5.3 TEST SET-UP

NOTE : 1. The wooden table should be 0.8m high for table top EUT and 0.1m for floor-standing EUT. 2. For the actual test configuration, please refer to the photos of testing. 3. A distance of 1m minimum was provided between EUT and walls / other metallic structure.

Insulating Support

ESD Gun

Return

Cable

EUT System

Vertical Coupling Plane

Ground Reference Plane

Horizontal Coupling

Plane

Wooden Table

470kΩ

470kΩ

10 cm

Page 29: Spectrum Research - faenl.msi.comfaenl.msi.com/ftp/CE Documents/Notebook/Archive/MS-1047(L720)/IT report.pdf · Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong

Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong Li, Chung-Li City, Taoyuan, Taiwan, R.O.C.

TEST REPORT Reference No.:C05111709 Report No.:EMCC05111709 Page:29 of 68 Date:Dec. 14, 2005

5.4 DESCRIPTION OF SUPPORT UNIT

Same as section 4.1.5 of this report.

5.5 EUT OPERATING CONDITION

Same as section 4.1.6 of this report.

5.6 TEST CONDITION AND PERFORMANCE CRITERION

1. Test condition (1) R-C Network :330 Ω, 150 pF (2) Test level: Air Discharge :±2kV, ±4kV, ±8kV

Contact discharge :±2kV, ±4kV HCP discharge : ±2kV, ±4kV VCP discharge : ±2kV, ±4kV

(3) Discharge mode : Single discharge (4) Discharge period : at least 1 s (5) Discharge polarity : Positive and Negative (6) Number of discharge : Minimum 50 times at each test point of contact

discharge and at least 200 times of discharge to EUT in total. Minium 10 times at each test area of air discharge selected.

2. Standard requirement : Criterion B 3. Performance criterion

(1) Criterion A : Normal performance during test (2) Criterion B : Temporary degradation or loss of function or

performance which is self-recoverable (3) Criterion C : Temporary degradation or loss of function or

performance which requires operator intervention system reset

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Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong Li, Chung-Li City, Taoyuan, Taiwan, R.O.C.

TEST REPORT Reference No.:C05111709 Report No.:EMCC05111709 Page:30 of 68 Date:Dec. 14, 2005

5.7 SUMMARY OF TEST RESULT

Temperature: 25 °C Humidity: 55% RH Tested Mode: ALL Tested By: Nick Hsieh Atmospheric Air Pressure: 101.2 kPa Tested Date: Nov. 21, 2005

Test Result: Criterion A pass COUPLING MODE & TEST OBSERVATION SEVERITY

LEVEL AIR DISCHARGE

CONTACT DISCHARGE HCP VCP

±2kV A A A A

±4kV A A A A

±8kV A NR NR NR NOTE: Description of test observation: A: There was no change compared with initial operation during the test. NR: No requirement Description of test points:

1. HCP 2. VCP 3. Seams of Left 4. Seams of Right 5. Seams of Front 6. Seams of Rear 7. Seams of LED 8. USB Ports 9. PCMCIA 10. VGA Ports 11. S Video Ports 12. Seams of Power Switch

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Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong Li, Chung-Li City, Taoyuan, Taiwan, R.O.C.

TEST REPORT Reference No.:C05111709 Report No.:EMCC05111709 Page:31 of 68 Date:Dec. 14, 2005

6. RADIATED IMMUNITY TEST

6.1 TEST EQUIPMENT

EQUIPMENT / FACILITIES MANUFACTURER MODEL # /

SERIAL # DUE DATE OF CAL.

& CAL. CENTER SIGNAL GENERATOR HP 8648D/

3847M00637 MAY. 2006 AGLIENT

ANTENNA SCHAFFNER CHASE

CBL6141A / 4181

SEP. 2006 SRT

FIELD SENSOR AMPLIFIER RESEARCH

FP2000/ 28499

DEC. 2006 ETC

POWER AMPLIFIER

AMPLIFIER RESEARCH

100W1000M1/ 19509

JUN. 2006 ETC

AMPLIFIER A.R. 50S1G4A/ 308703

APR. 2006 A.R.

DUAL DIRECTIONAL COUPLER A.R. DC7420 /

308626 MAR. 2006 A.R.

ISOTROPIC “E” FIELD PROBE A.R. FP4080 KIT MAR. 2006

A.R.

POWER SENSOR BOONTON 51011EMC / 31181 NOV. 2006 ETC

POWER SENSOR BOONTON 51011EMC / 31184 JUN. 2006 ETC

DUAL DIRECTIONAL COUPLER A.R. DC6080 /

25755 NOV. 2006 ETC

ANECHOIC CHAMBER SRT A05/

SRT005 OCT. 2006 SRT

V/M MONITOR A.R. FM2000/ 15970 N/A

MONITOR SHIN SI-609/ 905130 N/A

CCD TOPVIEW N/A/ 95113762 N/A

ABSORBER ETS N/A N/A

COAXIAL CABLE

SUNCITY J400/ 30CM

MAR. 2006 SRT

COAXIAL CABLE

TIME LMR-400/ 4M

AUG. 2006 SRT

NOTE: The calibration interval of the above test equipment is one year and the calibrations are traceable to NML/ROC and NIST/USA.

6.2 TEST PROCEDURE

According to IEC/EN 61000-4-3:1995+A1:1998

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Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong Li, Chung-Li City, Taoyuan, Taiwan, R.O.C.

TEST REPORT Reference No.:C05111709 Report No.:EMCC05111709 Page:32 of 68 Date:Dec. 14, 2005

6.3 TEST SETUP

NOTE : 1. The wooden table should be 0.8m high for table top EUT and 0.1m for floor-standing EUT. 2. For the actual test configuration, please refer to the photos of testing. 1.1m door balun to Absorber/Tile

Ant. 2.75m Absorber Location 1.5m 2.2m 1.85m 0.24m chamber (7m x 3m x 3m)

Absorber

Optical Fiber

Coaxial Cable

Power

Amplifier Signal

Generator

V/M

MonitorMonitor

3 m

Sensor

Wooden

table

EUTCCD

Absorber

1.5m

0.8 m

Page 33: Spectrum Research - faenl.msi.comfaenl.msi.com/ftp/CE Documents/Notebook/Archive/MS-1047(L720)/IT report.pdf · Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong

Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong Li, Chung-Li City, Taoyuan, Taiwan, R.O.C.

TEST REPORT Reference No.:C05111709 Report No.:EMCC05111709 Page:33 of 68 Date:Dec. 14, 2005

6.4 DESCRIPTION OF SUPPORT UNIT

Same as section 4.1.5 of this report.

6.5 EUT OPERATING CONDITION

Same as section 4.1.6 of this report.

6.6 TEST CONDITION / PERFORMANCE CRITERIA

1. Test condition (1) Source voltage and frequency : 230V/50Hz, single phase (2) Sweeping frequency : 80MHz – 1 GHz (3) Test level : 3V/m, the frequncy step is 1% (4) The four sides of EUT are tested : front, rear, left, right (5) Modulation : 80%AM, 1kHz Dwell time for each

frequency is 3 sec. (6) Antenna Polarization : Horizontal and Vertical (7) Standard requirement : Criterion A

2. Performance criterion (1) Criterion A : Normal performance during test (2) Criterion B : Temporary degradation or loss of function or

performance which is self-recoverable. (3) Criterion C : Temporary degradation or loss of function

or performance which requires operator intervention system reset.

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Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong Li, Chung-Li City, Taoyuan, Taiwan, R.O.C.

TEST REPORT Reference No.:C05111709 Report No.:EMCC05111709 Page:34 of 68 Date:Dec. 14, 2005

6.7 TEST RESULT

Temperature: 24 °C Humidity: 58% RH Tested Mode: ALL Tested By: Nick Hsieh Tested Date: Nov. 25, 2005 Test Result : Criterion A pass

FREQUENCY LEVEL MODULATION DIRECTION TEST RESULT(CRITERION)

80MHz – 1GHz 3V/m 80%AM, 1kHz FRONT A

80MHz – 1GHz 3V/m 80%AM, 1kHz REAR A

80MHz – 1GHz 3V/m 80%AM, 1kHz LEFT A

80MHz – 1GHz 3V/m 80%AM, 1kHz RIGHT A

1.4GHz – 2GHz 3V/m 80%AM, 1kHz FRONT A

1.4GHz – 2GHz 3V/m 80%AM, 1kHz REAR A

1.4GHz – 2GHz 3V/m 80%AM, 1kHz LEFT A

1.4GHz – 2GHz 3V/m 80%AM, 1kHz RIGHT A NOTE: Description of test observation: A: There was no change compared with initial operation during the test.

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Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong Li, Chung-Li City, Taoyuan, Taiwan, R.O.C.

TEST REPORT Reference No.:C05111709 Report No.:EMCC05111709 Page:35 of 68 Date:Dec. 14, 2005

7. ELECTRICAL FAST TRANSIENT / BURST IMMUNITY TEST

7.1 TEST EQUIPMENT

EQUIPMENT / FACILITIES

MANUFACTURER MODEL # / SERIAL #

DUE DATE OF CAL &CAL CENTER

EFT GENERATOR HAEFELY PEFT-JUNIOR / 583-333-122

APR. 2006 ETC

CLAMP HAEFELY TRENCH / 080421-12

N/A

GROUND PLANE 2M x 3M

SRT N/A N/A

7.2 TEST PROCEDURE

According to IEC/EN 61000-4-4:1995+A1:2001+A2:2001

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Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong Li, Chung-Li City, Taoyuan, Taiwan, R.O.C.

TEST REPORT Reference No.:C05111709 Report No.:EMCC05111709 Page:36 of 68 Date:Dec. 14, 2005

7.3 TEST SET-UP

NOTE : 1. The EUT system was put on a wooden table with 0.8m height for table top EUT and 0.1m for floor-standing EUT above ground reference plane. 2. For the actual test configuration, please refer to the photos of testing. 3. The minimum distance between the EUT and all other conductive structure was more than 0.5m. 4. The minimum distance between the coupling plates of the coupling clamps (if used) and all over conductive structures, except the ground plane beneath the coupling clamp and beneath the EUT was more than 0.5m. 5. The power cable connecting EUT was controlled under 1m.

7.4 DESCRIPTION OF SUPPORT UNIT

Same as section 4.1.5 of this report.

7.5 EUT OPERATING CONDITION

Same as section 4.1.6 of this report.

Auxiliary

Equipment

Auxiliary

Equipment

Clamp

EUT

Power

EFT Wave

Generator I/O and communication ports

Auxiliary

Equipment

Load EUT EFT Wave

Generator Power Cable

Power supply ports

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Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong Li, Chung-Li City, Taoyuan, Taiwan, R.O.C.

TEST REPORT Reference No.:C05111709 Report No.:EMCC05111709 Page:37 of 68 Date:Dec. 14, 2005

7.6 TEST CONDITION / PERFORMANCE CRITERIA

1. Test condition (1) Source voltage and frequency : 230V/50Hz, single phase (2) Pulse risetime and duration : 5ns / 50ns (3) Pulse repetition : 5kHz (4) Polarity : Positive Polarization and Negative

Polarization (5) Burst duration and period : 15ms / 300ms (6) Test duration : 61sec each line (7) Time between test : 10Sec (8) Severity levels : Power Line ±1kV, ±2kV

Signal/Control Line ±0.5kV, ±1kV (9) Standard requirement : Criterion B

2. Performance criterion (1) Criterion A : Normal performance during test (2) Criterion B : Temporary degradation or loss of function or

performance which is self-recoverable. (3) Criterion C : Temporary degradation or loss of function

or performance which requires operator intervention system reset.

7.7 SUMMARY OF TEST RESULT

Temperature: 24 °C Humidity: 58% RH Tested Mode: ALL Tested By: Nick Hsieh Atmospheric Air Pressure: 101.2 kPa Tested Date: Nov. 23, 2005 Test Result : Criterion A pass

Voltage 0.5kV 1kV Polarity + - + -

L1 A A A A

L2 A A A A

GND N/A N/A N/A N/A Test

Result Signal/Control

Line N/A N/A N/A N/A

NOTE: Description of test observation: A: There was no change compared with initial operation during the test. N/A: Not applicable, as the signal/control line used in typical is less than 3 m.

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Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong Li, Chung-Li City, Taoyuan, Taiwan, R.O.C.

TEST REPORT Reference No.:C05111709 Report No.:EMCC05111709 Page:38 of 68 Date:Dec. 14, 2005

8. SURGE TEST (POWER LINE)

8.1 TEST EQUIPMENT

EQUIPMENT / FACILITIES MANUFACTURER MODEL # /

SERIAL # DUE DATE OF CAL.

& CAL. CENTER SURGE TEST (System Mainframe)

SCHAFFNER NSG 2050 / 199904-057SC

JUL. 2006 SCHAFFNER

SURGE TEST (Impulse Network)

SCHAFFNER PNW 2050 / 256

JUN. 2006 SCHAFFNER

SURGE TEST (Pulse Coupling Network)

SCHAFFNER CDN 131/133 / 520

JUL. 2006 SCHAFFNER

8.2 TEST PROCEDURE

According to IEC/EN 61000-4-5:1995+A1:2001

8.3 TEST SET-UP

NOTE : 1. The EUT system was put on a wooden table with 0.8m height above ground reference plane. 2. For the actual test configuration, please refer to the photos of testing.

8.4 DESCRIPTION OF SUPPORT UNIT

Same as section 4.1.5 of this report.

8.5 EUT OPERATING CONDITION

Same as section 4.1.6 of this report.

Auxiliary

Equipment SURGE

GENERATOR EUT

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Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong Li, Chung-Li City, Taoyuan, Taiwan, R.O.C.

TEST REPORT Reference No.:C05111709 Report No.:EMCC05111709 Page:39 of 68 Date:Dec. 14, 2005

8.6 TEST CONDITION / PERFORMANCE CRITERIA

1. Test condition (1) Test level : Common mode : ±0.5kV, ±1kV, ±2kV

Differential mode : ±0.25kV, ±0.5kV, ±1kV (2) Number of Pulse : 5 (3) Phase : 0°, 90°, 180°, 270° (4) Polarity : Positive and Negative polarization (5) Repetition : 60 s (6) Waveform : 1.2/50 µs (open circuit) (7) Standard requirement : Criterion B

2. Performance criterion (1) Criterion A : Normal performance during test (2) Criterion B : Temporary degradation or loss of function

or performance which is self-recoverable (3) Criterion C : Temporary degradation or loss of function

or performance which requires operator intervention system reset

8.7 SUMMARY OF TEST RESULT

Temperature: 24 °C Humidity: 58% RH Test Mode: ALL Tested By: Nick Hsieh Atmospheric Air Pressure: 101.2 kPa Tested Date: Nov. 21, 2005 Test Result : Criterion A pass

Phase Mode Coupling Voltage 0° 90° 180° 270°

+/-0.5kV N/A N/A N/A N/A

+/-1kV N/A N/A N/A N/ACommon L + PE N + PE

+/-2kV N/A N/A N/A N/A+/-0.25kV A A A A

+/-0.5kV A A A A Differential L + N

+/-1kV A A A A NOTE: Description of test observation: A: There was no change compared with initial operation during the test. N/A: Not applicable.

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Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong Li, Chung-Li City, Taoyuan, Taiwan, R.O.C.

TEST REPORT Reference No.:C05111709 Report No.:EMCC05111709 Page:40 of 68 Date:Dec. 14, 2005

9. INDUCED RF FIELDS (CONDUCTED SUSCEPTIBILITY) TEST

9.1 TEST EQUIPMENT

EQUIPMENT / FACILITIES MANUFACTURER MODEL # /

SERIAL # DUE DATE OF CAL.

& CAL. CENTER

FINAL TEST BE

USED EM INJECTION CLAMP FCC F-203I-23mm/

110 MAY 2006 ETC

POWER LINE CDN FCC FCC-801-M5-32A/ 9812

MAY 2006 ETC

POWER LINE CDN FCC FCC-801-M1-32A/ 9820

MAY 2006 ETC

SIGNAL LINE CDN FCC FCC-801-T2/ 9830

MAY 2006 ETC

SIGNAL LINE CDN FCC FCC-801-T4/ 9831

MAY 2006 ETC X

SIGNAL LINE CDN FCC FCC-801-T6/ 9832

MAY 2006 ETC

POWER LINE CDN FCC FCC-801-M2-32A/ 9840

NOV. 2006 ETC

SIGNAL GENERATOR HP 8648A/

3636A02776 JUN. 2006 ETC X

POWER AMPLIFIER A.R. 150A100A/ 19553

OCT. 2006 ETC X

DUAL DIRECTION COULPER A.R. DC2600/

25893 AUG 2006 ETC X

POWER METER BOONTON 4232A/ 105302

NOV 2006 ETC X

SIGNAL LINE CDN FCC FCC-801-S25/ 9845

MAY 2006 ETC

POWER LINE CDN FCC FCC-801-M3-32A/ 9874

MAY 2006 ETC X

T2 EM-TEST ATT6/75/ 1001-40 N/A X

COAXIAL CABLE SUNCITY CABLE14/ #14-1M

AUG. 2006 SRT

X

COAXIAL CABLE SUNCITY CABLE05/ #5-5M

AUG. 2006 SRT

X

COAXIAL CABLE SUNCITY J400/2M AUG. 2006

SRT X

9.2 TEST PROCEDURE

According to IEC/EN 61000-4-6:2004

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Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong Li, Chung-Li City, Taoyuan, Taiwan, R.O.C.

TEST REPORT Reference No.:C05111709 Report No.:EMCC05111709 Page:41 of 68 Date:Dec. 14, 2005

9.3 TEST SET-UP

(1) For CDN injection : (2) For Clamp injection : NOTE : 1. The EUT system was put on a wooden table with 0.1m height above ground. 2. For the actual test configuration, please refer to the photos of testing. 3. The distance between CDN(Clamp) and EUT was controlled between 0.1m and 0.3m. 4. The model no. of the CDN connected to EUT is FCC-801-M3-32A.

9.4 DESCRIPTION OF SUPPORT UNIT

Same as section 4.1.5 of this report.

9.5 EUT OPERATING CONDITION

Same as section 4.1.6 of this report.

Power

Amplifier

CDN T2

EUT

Auxiliary Equipment

SIGNAL

GENERATOR

Coaxial

Cable

SIGNAL

GENERATOR

Power

AmplifierT2 Injection

Clamp

Monitoring Probe

EUT

Auxiliary Equipment

Receiver

Coaxial

Cable

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Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong Li, Chung-Li City, Taoyuan, Taiwan, R.O.C.

TEST REPORT Reference No.:C05111709 Report No.:EMCC05111709 Page:42 of 68 Date:Dec. 14, 2005

9.6 TEST CONDITION / PERFORMANCE CRITERIA

1. Test condition (1) Source voltage and frequency : 230 V/ 50 Hz, single phase (2) Sweeping frequency : 150 kHz – 80 MHz (3) Test level : 3 V, the frequency step is 1% (4) Modulation : AM 80%, 1 kHz (5) Dwell time for each frequency : 3 sec (6) Standard requirement : Criterion A

2. Performance criterion (1) Criterion A : Normal performance during test (2) Criterion B : Temporary degradation or loss of function

or performance which is self-recoverable (3) Criterion C : Temporary degradation or loss of function

or performance which requires operator intervention system reset

9.7 SUMMARY OF TEST RESULT

Temperature: 24°C Humidity: 58% RH Tested Mode: ALL Tested By: Nick Hsieh Tested Result : Criterion A pass Tested Date: Nov. 22, 2005

NOTE: Description of test observation: A: There was no change compared with initial operation during the test.

FREQUENCY LEVEL MODULATION INJECTION METHOD

TEST RESULT (CRITERION)

150kHz - 80MHz 3V 80% AM, 1 kHz M3 A

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Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong Li, Chung-Li City, Taoyuan, Taiwan, R.O.C.

TEST REPORT Reference No.:C05111709 Report No.:EMCC05111709 Page:43 of 68 Date:Dec. 14, 2005

10. POWER FREQUENCY MAGNETIC-FIELD TEST

10.1 TEST EQUIPMENT

EQUIPMENT / FACILITIES

MANUFACTURER MODEL # / SERIAL #

DUE DATE OF CAL. & CAL. CENTER

MAGNETIC FIELD TESTER

HAEFELY MAG 100.1/ 080.015-04

DEC. 2006 SRT

MAGNETIC FIELD COIL

HAEFELY MAG 100.1/ 080.015-04

DEC. 2006 SRT

MAGNETIC FIELD METER F.W.BELL 4080/

19990416 MAR. 2006 ITRI

10.2 TEST PROCEDURE

According to IEC/EN 61000-4-8:1993+A1:2001

10.3 TEST SET-UP

NOTE : 1. The EUT system was put on a wooden table with 0.8m height above ground. 2. For the actual test configuration, please refer to the photos of testing 3. 1A/m = 12.56mG, 3A/m = 37.68mG, 10A/m = 125.6mG,

10.4 DESCRIPTION OF SUPPORT UNIT

Same as section 4.1.5 of this report.

EUT

Frequency Converter

Test Generator

Magnetic Coil

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Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong Li, Chung-Li City, Taoyuan, Taiwan, R.O.C.

TEST REPORT Reference No.:C05111709 Report No.:EMCC05111709 Page:44 of 68 Date:Dec. 14, 2005

10.5 EUT OPERATING CONDITION

Same as section 4.1.6 of this report.

10.6 TEST CONDITION / PERFORMANCE CRITERIA

1. Test condition (1) Test axis : X, Y and Z axes (2) Test time : 5 min / each axis (3) Field strength : 3 A/m (4) Standard requirement : Criterion A

2. Performance criterion (1) Criterion A : Normal performance during test (2) Criterion B : Temporary degradation or loss of function

or performance which is self-recoverable (3) Criterion C : Temporary degradation or loss of function

or performance which requires operator intervention system reset

10.7 SUMMARY OF TEST RESULT

Temperature: 25°C Humidity: 71% RH Tested Mode: ALL Tested By: Nick Hsieh Frequency of Magnetic Field: 50Hz, 60Hz Tested Date: Dec. 06, 2005 Test Result : Criterion A pass

NOTE: Description of test observation: A: There was no change compared with initial operation during the test.

ORIENTATION FIELD STRENGTH

TEST RESULT (CRITERION)

X 3 A/m A

Y 3 A/m A

Z 3 A/m A

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Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong Li, Chung-Li City, Taoyuan, Taiwan, R.O.C.

TEST REPORT Reference No.:C05111709 Report No.:EMCC05111709 Page:45 of 68 Date:Dec. 14, 2005

11. VOLTAGE DIPS, INTERRUPTS, VARIATIONS TEST

11.1 TEST EQUIPMENT

EQUIPMENT / FACILITIES

MANUFACTURER MODEL # / SERIAL #

DUE DATE OF CAL.& CAL. CENTER

INTERFERENCE SIMULATOR

HAEFELY PLINE 1610/ 083-732-05

JAN. 2006 ETC

11.2 TEST PROCEDURE

According to IEC/EN 61000-4-11:1994+A1:2001

11.3 TEST SET-UP

NOTE : 1. The EUT system was put on a wooden table with 0.8m height above ground. 2. For the actual test configuration, please refer to the photos of testing.

11.4 DESCRIPTION OF SUPPORT UNIT

Same as section 4.1.5 of this report.

11.5 EUT OPERATING CONDITION

Same as section 4.1.6 of this report.

Frequency

Converter

Interference

Simulator EUT Auxiliary Equipment

Power cable

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Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong Li, Chung-Li City, Taoyuan, Taiwan, R.O.C.

TEST REPORT Reference No.:C05111709 Report No.:EMCC05111709 Page:46 of 68 Date:Dec. 14, 2005

11.6 TEST CONDITION / PERFORMANCE CRITERIA

1. Test condition (1) Source voltage and frequency : 230V/50Hz, single phase (2) Test level : Dip depth 95%, 0.5 period

30%, 25 period Interrupt 95%, 250 period

(3) Phase : 0°, 180° (4) Test duration : 2min each phase (5) Time between test : 10 sec (6) Standard requirement : Dip 95% : Criterion B;

Dip 30% : Criterion C; Interrupt > 95%: Criterion C

2. Performance criterion

(1) Criterion A : Normal performance during test (2) Criterion B : Temporary degradation or loss of function

or performance which is self-recoverable. (3) Criterion C : Temporary degradation or loss of function

or performance which requires operator intervention system reset.

11.7 SUMMARY OF TEST RESULT

Temperature: 24°C Humidity: 58% RH Test Mode: ALL Tested By: Nick Hsieh Tested Date: Nov. 21, 2005 Tested Result :

NOTE: 1. The power voltage range: 100 V to 240V range 140V is 140% of the lowest voltage or the power

voltage is 230 V. 2. Description of test observation:

A: There was no change compared with initial operation during the test. 3.The frequency of source: 50Hz

AC POWER

DIP DEPTH INTERVAL DIP TIME TEST TIME PHASE

TEST RESULT

(Criterion) 0° A 30% 10 sec 0.5 period 2 min

180° A 0° A 60% 10 sec 5 period 2 min

180° A 0° A

230V/50Hz

95% (interrupt) 10 sec 250 period 2 min

180° A

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Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong Li, Chung-Li City, Taoyuan, Taiwan, R.O.C.

TEST REPORT Reference No.:C05111709 Report No.:EMCC05111709 Page:47 of 68 Date:Dec. 14, 2005

12. PHOTOS OF TESTING Conducted test (LCD+VGA)

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Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong Li, Chung-Li City, Taoyuan, Taiwan, R.O.C.

TEST REPORT Reference No.:C05111709 Report No.:EMCC05111709 Page:48 of 68 Date:Dec. 14, 2005

Conducted test (VGA+TV)

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Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong Li, Chung-Li City, Taoyuan, Taiwan, R.O.C.

TEST REPORT Reference No.:C05111709 Report No.:EMCC05111709 Page:49 of 68 Date:Dec. 14, 2005

Conducted test (LCD+TV)

Page 50: Spectrum Research - faenl.msi.comfaenl.msi.com/ftp/CE Documents/Notebook/Archive/MS-1047(L720)/IT report.pdf · Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong

Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong Li, Chung-Li City, Taoyuan, Taiwan, R.O.C.

TEST REPORT Reference No.:C05111709 Report No.:EMCC05111709 Page:50 of 68 Date:Dec. 14, 2005

- Radiated test (LCD+VGA)

Page 51: Spectrum Research - faenl.msi.comfaenl.msi.com/ftp/CE Documents/Notebook/Archive/MS-1047(L720)/IT report.pdf · Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong

Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong Li, Chung-Li City, Taoyuan, Taiwan, R.O.C.

TEST REPORT Reference No.:C05111709 Report No.:EMCC05111709 Page:51 of 68 Date:Dec. 14, 2005

- Radiated test (VGA+TV)

Page 52: Spectrum Research - faenl.msi.comfaenl.msi.com/ftp/CE Documents/Notebook/Archive/MS-1047(L720)/IT report.pdf · Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong

Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong Li, Chung-Li City, Taoyuan, Taiwan, R.O.C.

TEST REPORT Reference No.:C05111709 Report No.:EMCC05111709 Page:52 of 68 Date:Dec. 14, 2005

- Radiated test (LCD+TV)

Page 53: Spectrum Research - faenl.msi.comfaenl.msi.com/ftp/CE Documents/Notebook/Archive/MS-1047(L720)/IT report.pdf · Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong

Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong Li, Chung-Li City, Taoyuan, Taiwan, R.O.C.

TEST REPORT Reference No.:C05111709 Report No.:EMCC05111709 Page:53 of 68 Date:Dec. 14, 2005

- Harmonics test (LCD+VGA)

- Harmonics test (VGA+TV)

Page 54: Spectrum Research - faenl.msi.comfaenl.msi.com/ftp/CE Documents/Notebook/Archive/MS-1047(L720)/IT report.pdf · Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong

Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong Li, Chung-Li City, Taoyuan, Taiwan, R.O.C.

TEST REPORT Reference No.:C05111709 Report No.:EMCC05111709 Page:54 of 68 Date:Dec. 14, 2005

- Harmonics test (LCD+TV)

- Voltage fluctuations test (LCD+VGA)

Page 55: Spectrum Research - faenl.msi.comfaenl.msi.com/ftp/CE Documents/Notebook/Archive/MS-1047(L720)/IT report.pdf · Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong

Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong Li, Chung-Li City, Taoyuan, Taiwan, R.O.C.

TEST REPORT Reference No.:C05111709 Report No.:EMCC05111709 Page:55 of 68 Date:Dec. 14, 2005

- Voltage fluctuations test (VGA+TV)

- Voltage fluctuations test (LCD+TV)

Page 56: Spectrum Research - faenl.msi.comfaenl.msi.com/ftp/CE Documents/Notebook/Archive/MS-1047(L720)/IT report.pdf · Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong

Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong Li, Chung-Li City, Taoyuan, Taiwan, R.O.C.

TEST REPORT Reference No.:C05111709 Report No.:EMCC05111709 Page:56 of 68 Date:Dec. 14, 2005

- Electrostatic discharge immunity test (LVD+VGA)

- Electrostatic discharge immunity test (VGA+TV)

Page 57: Spectrum Research - faenl.msi.comfaenl.msi.com/ftp/CE Documents/Notebook/Archive/MS-1047(L720)/IT report.pdf · Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong

Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong Li, Chung-Li City, Taoyuan, Taiwan, R.O.C.

TEST REPORT Reference No.:C05111709 Report No.:EMCC05111709 Page:57 of 68 Date:Dec. 14, 2005

- Electrostatic discharge immunity test (LCD+TV)

- Electrical fast transient / burst immunity test (LCD+VGA)

Page 58: Spectrum Research - faenl.msi.comfaenl.msi.com/ftp/CE Documents/Notebook/Archive/MS-1047(L720)/IT report.pdf · Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong

Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong Li, Chung-Li City, Taoyuan, Taiwan, R.O.C.

TEST REPORT Reference No.:C05111709 Report No.:EMCC05111709 Page:58 of 68 Date:Dec. 14, 2005

- Electrical fast transient / burst immunity test (VGA+TV)

- Electrical fast transient / burst immunity test (LCD+TV)

Page 59: Spectrum Research - faenl.msi.comfaenl.msi.com/ftp/CE Documents/Notebook/Archive/MS-1047(L720)/IT report.pdf · Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong

Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong Li, Chung-Li City, Taoyuan, Taiwan, R.O.C.

TEST REPORT Reference No.:C05111709 Report No.:EMCC05111709 Page:59 of 68 Date:Dec. 14, 2005

- Radiated immunity test (LCD+VGA)

Page 60: Spectrum Research - faenl.msi.comfaenl.msi.com/ftp/CE Documents/Notebook/Archive/MS-1047(L720)/IT report.pdf · Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong

Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong Li, Chung-Li City, Taoyuan, Taiwan, R.O.C.

TEST REPORT Reference No.:C05111709 Report No.:EMCC05111709 Page:60 of 68 Date:Dec. 14, 2005

- Radiated immunity test (VGA+TV)

Page 61: Spectrum Research - faenl.msi.comfaenl.msi.com/ftp/CE Documents/Notebook/Archive/MS-1047(L720)/IT report.pdf · Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong

Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong Li, Chung-Li City, Taoyuan, Taiwan, R.O.C.

TEST REPORT Reference No.:C05111709 Report No.:EMCC05111709 Page:61 of 68 Date:Dec. 14, 2005

- Radiated immunity test (LCD+TV)

Page 62: Spectrum Research - faenl.msi.comfaenl.msi.com/ftp/CE Documents/Notebook/Archive/MS-1047(L720)/IT report.pdf · Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong

Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong Li, Chung-Li City, Taoyuan, Taiwan, R.O.C.

TEST REPORT Reference No.:C05111709 Report No.:EMCC05111709 Page:62 of 68 Date:Dec. 14, 2005

-Surge test (LCD+VGA)

-Surge test (VGA+TV)

Page 63: Spectrum Research - faenl.msi.comfaenl.msi.com/ftp/CE Documents/Notebook/Archive/MS-1047(L720)/IT report.pdf · Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong

Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong Li, Chung-Li City, Taoyuan, Taiwan, R.O.C.

TEST REPORT Reference No.:C05111709 Report No.:EMCC05111709 Page:63 of 68 Date:Dec. 14, 2005

-Surge test (LVD+TV)

- Inducted RF fields (conducted susceptibility) test (LVD+VGA)

Page 64: Spectrum Research - faenl.msi.comfaenl.msi.com/ftp/CE Documents/Notebook/Archive/MS-1047(L720)/IT report.pdf · Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong

Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong Li, Chung-Li City, Taoyuan, Taiwan, R.O.C.

TEST REPORT Reference No.:C05111709 Report No.:EMCC05111709 Page:64 of 68 Date:Dec. 14, 2005

- Inducted RF fields (conducted susceptibility) test (VGA+TV)

- Inducted RF fields (conducted susceptibility) test (LCD+TV)

Page 65: Spectrum Research - faenl.msi.comfaenl.msi.com/ftp/CE Documents/Notebook/Archive/MS-1047(L720)/IT report.pdf · Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong

Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong Li, Chung-Li City, Taoyuan, Taiwan, R.O.C.

TEST REPORT Reference No.:C05111709 Report No.:EMCC05111709 Page:65 of 68 Date:Dec. 14, 2005

- Power frequency magnetic-field test (LCD+VGA)

- Power frequency magnetic-field test (VGA+TV)

Page 66: Spectrum Research - faenl.msi.comfaenl.msi.com/ftp/CE Documents/Notebook/Archive/MS-1047(L720)/IT report.pdf · Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong

Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong Li, Chung-Li City, Taoyuan, Taiwan, R.O.C.

TEST REPORT Reference No.:C05111709 Report No.:EMCC05111709 Page:66 of 68 Date:Dec. 14, 2005

- Power frequency magnetic-field test (LCD+TV)

- Voltage dips, interrupts, variations test (LCD+VGA)

Page 67: Spectrum Research - faenl.msi.comfaenl.msi.com/ftp/CE Documents/Notebook/Archive/MS-1047(L720)/IT report.pdf · Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong

Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong Li, Chung-Li City, Taoyuan, Taiwan, R.O.C.

TEST REPORT Reference No.:C05111709 Report No.:EMCC05111709 Page:67 of 68 Date:Dec. 14, 2005

- Voltage dips, interrupts, variations test (VGA+TV)

- Voltage dips, interrupts, variations test (LCD+TV)

Page 68: Spectrum Research - faenl.msi.comfaenl.msi.com/ftp/CE Documents/Notebook/Archive/MS-1047(L720)/IT report.pdf · Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong

Spectrum Research & Testing Lab., Inc. No. 101-10, Ling 8, Shan-Tong Li, Chung-Li City, Taoyuan, Taiwan, R.O.C.

TEST REPORT Reference No.:C05111709 Report No.:EMCC05111709 Page:68 of 68 Date:Dec. 14, 2005

13. TERMS OF ABRIVATION AV. Average detection AZ(°) Turn table azimuth Correct. Correction EL(m) Antenna height (meter) EUT Equipment Under Test Horiz. Horizontal direction LISN Line Impedance Stabilization Network NSA Normalized Site Attenuation Q.P. Quasi-peak detection SRT Lab Spectrum Research & Testing Laboratory, Inc. Vert. Vertical direction