35
MR (7/7/05) T2K electronics Beam structure ~ 8 (9?) bunches / spill bunch width ~ 60 nsec bunch separation ~ 600 nsec spill duration ~ 5 sec Time between spills ~ 3.5 secs. ~ 3.5 seconds My understanding (some gaps) Detector parameters (scintillator calorimeter) ~ 50,000 channels (50k SiPMs) 1 event / bunch + cosmics (100 Hz) Electronics (physics) requirements event time: resolution ~ ns signal size: resolution? (no. of ADC bits? dynamic range? (few 100 pC I think?) linearity? noise?

MR (7/7/05) T2K electronics Beam structure ~ 8 (9?) bunches / spill bunch width ~ 60 nsec bunch separation ~ 600 nsec spill duration ~ 5 sec Time between

Embed Size (px)

Citation preview

Page 1: MR (7/7/05) T2K electronics Beam structure ~ 8 (9?) bunches / spill bunch width ~ 60 nsec bunch separation ~ 600 nsec spill duration ~ 5  sec Time between

MR (7/7/05)

T2K electronics

Beam structure

~ 8 (9?) bunches / spillbunch width ~ 60 nsecbunch separation ~ 600 nsecspill duration ~ 5 sec

Time between spills ~ 3.5 secs.

~ 3.5 seconds

My understanding (some gaps)

Detector parameters (scintillator calorimeter)~ 50,000 channels (50k SiPMs)1 event / bunch + cosmics (100 Hz)

Electronics (physics) requirementsevent time: resolution ~ nssignal size: resolution? (no. of ADC bits?)dynamic range? (few 100 pC I think?)linearity?noise?

Page 2: MR (7/7/05) T2K electronics Beam structure ~ 8 (9?) bunches / spill bunch width ~ 60 nsec bunch separation ~ 600 nsec spill duration ~ 5  sec Time between

MR (7/7/05)

Trip chip

ref.: McFarland_MINERvA_Electronics.pdf (presentation at Rome T2K meeting, 6/12/04)

discusses possible use of Trip (not Trip-t) ASIC in T2K Trip-t is newer version of Trip (we would be more likely to use Trip-t but this talk still has some interesting info)

- generally positive, and gives estimates for front end costs ~ $440k for 30k channel system + $100k LV distribution + $100k DAQ

Trip ASIC (32 channels – packaged chip) integrate charge over spill (or bucket), variable preamp gain up to 4 pC dynamic range 48 stage pipeline stores analogue samples fast discriminator output -> FPGA -> timing in 5 nsec steps (could possibly do better) FPGA then passes pipeline trigger back to Trip 32 analogue samples muxed out to commercial ADC (12-bit)

Page 3: MR (7/7/05) T2K electronics Beam structure ~ 8 (9?) bunches / spill bunch width ~ 60 nsec bunch separation ~ 600 nsec spill duration ~ 5  sec Time between

MR (7/7/05)

Trip-t chip

ref.: TRIP_t_Apr05.ppt (Bellantoni – D0 AFEII Director’s Review, 13/4/05)

summarises measured performance of Trip-t & spec. improvements for 2nd version (in fab now I think)

Trip-t ASIC (32 channels - packaged)

integrate charge over spill (or bucket), variable preamp gain up to 3 pC dynamic range

48 stage pipeline stores analogue samples –> A pulse (7 bit precision)

noise < 1 fC (not sure whether this gain range dependent)

time between disc. firing (any channel) and end of integration period -> t pulse (~ 2nsec res’n)

t pulse also stored in 48 stage pipeline

disc. outputs read out during reset period -> FPGA -> pipeline trigger to Trip-t

32 A samples and 32 t samples muxed out to commercial ADCs

power < 10 mW/channel

Is above spec. adequate for T2K application?

Page 4: MR (7/7/05) T2K electronics Beam structure ~ 8 (9?) bunches / spill bunch width ~ 60 nsec bunch separation ~ 600 nsec spill duration ~ 5  sec Time between

MR (7/7/05)

McFarland_MINERvA_Electronics.pdf

Page 5: MR (7/7/05) T2K electronics Beam structure ~ 8 (9?) bunches / spill bunch width ~ 60 nsec bunch separation ~ 600 nsec spill duration ~ 5  sec Time between

MR (7/7/05)

Page 6: MR (7/7/05) T2K electronics Beam structure ~ 8 (9?) bunches / spill bunch width ~ 60 nsec bunch separation ~ 600 nsec spill duration ~ 5  sec Time between

MR (7/7/05)

Page 7: MR (7/7/05) T2K electronics Beam structure ~ 8 (9?) bunches / spill bunch width ~ 60 nsec bunch separation ~ 600 nsec spill duration ~ 5  sec Time between

MR (7/7/05)

Page 8: MR (7/7/05) T2K electronics Beam structure ~ 8 (9?) bunches / spill bunch width ~ 60 nsec bunch separation ~ 600 nsec spill duration ~ 5  sec Time between

MR (7/7/05)

Page 9: MR (7/7/05) T2K electronics Beam structure ~ 8 (9?) bunches / spill bunch width ~ 60 nsec bunch separation ~ 600 nsec spill duration ~ 5  sec Time between

MR (7/7/05)

Page 10: MR (7/7/05) T2K electronics Beam structure ~ 8 (9?) bunches / spill bunch width ~ 60 nsec bunch separation ~ 600 nsec spill duration ~ 5  sec Time between

MR (7/7/05)

Page 11: MR (7/7/05) T2K electronics Beam structure ~ 8 (9?) bunches / spill bunch width ~ 60 nsec bunch separation ~ 600 nsec spill duration ~ 5  sec Time between

MR (7/7/05)

Page 12: MR (7/7/05) T2K electronics Beam structure ~ 8 (9?) bunches / spill bunch width ~ 60 nsec bunch separation ~ 600 nsec spill duration ~ 5  sec Time between

MR (7/7/05)

Page 13: MR (7/7/05) T2K electronics Beam structure ~ 8 (9?) bunches / spill bunch width ~ 60 nsec bunch separation ~ 600 nsec spill duration ~ 5  sec Time between

MR (7/7/05)

Page 14: MR (7/7/05) T2K electronics Beam structure ~ 8 (9?) bunches / spill bunch width ~ 60 nsec bunch separation ~ 600 nsec spill duration ~ 5  sec Time between

MR (7/7/05)

Page 15: MR (7/7/05) T2K electronics Beam structure ~ 8 (9?) bunches / spill bunch width ~ 60 nsec bunch separation ~ 600 nsec spill duration ~ 5  sec Time between

MR (7/7/05)

Page 16: MR (7/7/05) T2K electronics Beam structure ~ 8 (9?) bunches / spill bunch width ~ 60 nsec bunch separation ~ 600 nsec spill duration ~ 5  sec Time between

MR (7/7/05)

Page 17: MR (7/7/05) T2K electronics Beam structure ~ 8 (9?) bunches / spill bunch width ~ 60 nsec bunch separation ~ 600 nsec spill duration ~ 5  sec Time between

MR (7/7/05)

TRIP_t_Apr05.ppt

Page 18: MR (7/7/05) T2K electronics Beam structure ~ 8 (9?) bunches / spill bunch width ~ 60 nsec bunch separation ~ 600 nsec spill duration ~ 5  sec Time between

MR (7/7/05)

Page 19: MR (7/7/05) T2K electronics Beam structure ~ 8 (9?) bunches / spill bunch width ~ 60 nsec bunch separation ~ 600 nsec spill duration ~ 5  sec Time between

MR (7/7/05)

Page 20: MR (7/7/05) T2K electronics Beam structure ~ 8 (9?) bunches / spill bunch width ~ 60 nsec bunch separation ~ 600 nsec spill duration ~ 5  sec Time between

MR (7/7/05)

Page 21: MR (7/7/05) T2K electronics Beam structure ~ 8 (9?) bunches / spill bunch width ~ 60 nsec bunch separation ~ 600 nsec spill duration ~ 5  sec Time between

MR (7/7/05)

Page 22: MR (7/7/05) T2K electronics Beam structure ~ 8 (9?) bunches / spill bunch width ~ 60 nsec bunch separation ~ 600 nsec spill duration ~ 5  sec Time between

MR (7/7/05)

Page 23: MR (7/7/05) T2K electronics Beam structure ~ 8 (9?) bunches / spill bunch width ~ 60 nsec bunch separation ~ 600 nsec spill duration ~ 5  sec Time between

MR (7/7/05)

Page 24: MR (7/7/05) T2K electronics Beam structure ~ 8 (9?) bunches / spill bunch width ~ 60 nsec bunch separation ~ 600 nsec spill duration ~ 5  sec Time between

MR (7/7/05)

Page 25: MR (7/7/05) T2K electronics Beam structure ~ 8 (9?) bunches / spill bunch width ~ 60 nsec bunch separation ~ 600 nsec spill duration ~ 5  sec Time between

MR (7/7/05)

Page 26: MR (7/7/05) T2K electronics Beam structure ~ 8 (9?) bunches / spill bunch width ~ 60 nsec bunch separation ~ 600 nsec spill duration ~ 5  sec Time between

MR (7/7/05)

Page 27: MR (7/7/05) T2K electronics Beam structure ~ 8 (9?) bunches / spill bunch width ~ 60 nsec bunch separation ~ 600 nsec spill duration ~ 5  sec Time between

MR (7/7/05)

Page 28: MR (7/7/05) T2K electronics Beam structure ~ 8 (9?) bunches / spill bunch width ~ 60 nsec bunch separation ~ 600 nsec spill duration ~ 5  sec Time between

MR (7/7/05)

Page 29: MR (7/7/05) T2K electronics Beam structure ~ 8 (9?) bunches / spill bunch width ~ 60 nsec bunch separation ~ 600 nsec spill duration ~ 5  sec Time between

MR (7/7/05)

Page 30: MR (7/7/05) T2K electronics Beam structure ~ 8 (9?) bunches / spill bunch width ~ 60 nsec bunch separation ~ 600 nsec spill duration ~ 5  sec Time between

MR (7/7/05)

Page 31: MR (7/7/05) T2K electronics Beam structure ~ 8 (9?) bunches / spill bunch width ~ 60 nsec bunch separation ~ 600 nsec spill duration ~ 5  sec Time between

MR (7/7/05)

Page 32: MR (7/7/05) T2K electronics Beam structure ~ 8 (9?) bunches / spill bunch width ~ 60 nsec bunch separation ~ 600 nsec spill duration ~ 5  sec Time between

MR (7/7/05)

possible new FE chip architecture

thresh

pk.hold

fast preamp

slow amp

SiPMdisc.

pk.hold

SiPM

pk.hold

SiPM

ADC

HV trim

HV trim

HV trim

control

combinedisc. O/Psand generateaddress ofchannel thatfired

e.g. 16 channels 4 bitadd.

n bits

control

fasttimingsignal

front end chip

~ 20 lines

front end digital (FPGA based)

functionality

fast time stamp (~ns)

control digitization of channel that fired

assemble data packet and transmit (channel address, time stamp, ADC value)

slow control set up HV trim, channel gains, thresholds, …

would expect one FE FPGA to deal withmore than one FE chip (maybe 8?)

nothing “particularly” difficult herefast time stamping performedoff-chip

Page 33: MR (7/7/05) T2K electronics Beam structure ~ 8 (9?) bunches / spill bunch width ~ 60 nsec bunch separation ~ 600 nsec spill duration ~ 5  sec Time between

MR (7/7/05)

Idea to keep very fast functionality off FPGA

good idea from Matt Noy

fast discriminatorO/P from FE chip

deserializer chipe.g. DS90CR486

FE FPGA

133 MHz only

800 MHz PLL

whichever line shows discriminatoroutput first -> timing at 1/6th of133MHz period (1.25 nsec.)

DS90CR486 -> 8 channels of 1:6 deserialization (8:48) => 1 chip for 8 FE chips 900 mW power => 7 mW / FE channel

Page 34: MR (7/7/05) T2K electronics Beam structure ~ 8 (9?) bunches / spill bunch width ~ 60 nsec bunch separation ~ 600 nsec spill duration ~ 5  sec Time between

MR (7/7/05)

Chip count

16 channelFE chip

16 SiPMs

FEFPGA

16 channelFE chip

16 SiPMs

16 channelFE chip

16 SiPMs

16 channelFE chip

16 SiPMs

16 channelFE chip

16 SiPMs

16 channelFE chip

16 SiPMs

16 channelFE chip

16 SiPMs

16 channelFE chip

16 SiPMs

50,000 channels50,000 SiPMs3125 FE chips (assume 16 channels)(maybe 390 deserializers)390 FE FPGAs

FEFPGA

FEFPGA

FEFPGA

FEFPGA

390 readout lines off-detector(or could combine)

Page 35: MR (7/7/05) T2K electronics Beam structure ~ 8 (9?) bunches / spill bunch width ~ 60 nsec bunch separation ~ 600 nsec spill duration ~ 5  sec Time between

MR (7/7/05)

Trip-t chip / new chip – a few pros and cons

Trip-t chip Pros

No FE chip development required no development cost – just buy chips

May be able to utilise other parts of Trip-t readout system? (or at least follow same approach)

Trip-t chip Cons

possible signal size incompatibility few pC, we need few 100 pC unless lower gain on SiPM (maybe could just attenuate?)

no HV trim (may be possible to provide with commercial components)

time resolution performance not good (but should be better for next version)

more complicated functionality than necessary for T2K (e.g. pipeline)

New chip Pros

FE specification and functionality can be tailored to SiPM everything under our control

New chip Cons

development cost risk