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Introduction
Thank you for your interest in JEOL products and services
JEOL designs and manufactures scientific instruments for high-level research and
development activities Our customers include scientists and engineers working in
leading-edge academic and industrial laboratories around the world JEOL
products and services enable them to pursue a variety of RampD applications that
require high resolution imaging and analytical capabilities such as basic observashy
tion and analysis environmental science information technology semiconductor
production biotechnology nanotechnology and a broad range of industrial
endeavors
Experts involved in the studies of medicine biology biochemistry agriculture
materials science metallurgy ceramics chemistry petroleum pharmacy semiconshy
ductors and electronic materials have been using JEOL products for 60 years Our
new products are easier-to-use than ever before and contribute to a high level of
quality assurance and quality control during the production process
This Product Guide presents the most current high performance solutions from JEOL
to meet your RampD requirements for electron optics analytical semiconductor indusshy
trial and medical instruments and equipment For more details or information
about any of our products please contact your nearest JEOL office
JEOL Ltd
oSome instrument photographs include optional attachments
oSpecificotions subject to chonge without notice
oThis catolog includes products not affered to some territories
oWindows is a registered trademark of Microsoft Corp in the US and other countries Macintosh is trademark of Apple Computer Inc registered in the US and other countries UNIX is a registered trademark of XOpen Corp of the USA NetWore is a registered trademark of Novell Inc in the US and other countries NetWare Lite is a trademark of Novell Inc in the US and other countries Pentium is a registered trademark of Intel Corp of the USA
oOther trademarks referenced in this catalog and marked with are the property of our allied companies
02 I Produc t G uide
Product Guide
Name JEOL Ltd [I-JIHON DEI-JSHI KABUSHIKI KAISHA)
President Gon-emon Kurihara
Establishment May 301949
Capital 6740 million yen
Employees Consolidated 2709
Electron Microscopes Transmission Electron Microscopes (TEM] middotmiddotmiddotmiddot middot middotmiddot middot middotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddot middot middotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddot4
Energy Filter Electron Microscopes
Scanning Electron Microscopes Scanning Electron Microscopes (SEM] 6
Analytical Scanning Electron Microscopes
Focused Ion Beam System
Cross Section Polisher
Ion Slicer
Photoelectron Spectrometers (XPS)
Auger Microprobes
X-ray Fluorescence Spectrometers Energy-Dispersive X-roy Fluorescence Spectrometersmiddot middotmiddotmiddotmiddot12
Electron Beam Lithogrophy Systems (a spot beam lithogrophy system]
Gas Chromatograph Mass Spectrometer
Liquid Chromatograph Mass Spectrometers
Application Equipment High-Power Electron Beam Source
Built-in Plasma Source
Clinical Chemistry Analyzers Clinical Chemistry Analyzers middotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddot19
Ion Beam Application Equipment MultiBeam System 8
Peripherol Equipment bull bullbull bullbull bull bullbull 10
Surface Analysis Instruments Electron Probe Microanolyzers 11
Semiconductor Equipment Electron Beam Lithogrophy Systems (0 varioble-shoped electron beom) 13
NMR Spectrometers NMR Spectrometersmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddot middot middotmiddotmiddotmiddotmiddotmiddotmiddot 14
Mass Spectrometers Time-oF-Flight Moss Spectrometers (TOFMS) 16
ESR Spectrometers ESR Spectrometersmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddot 17
Electron Beam and plasma Electran Beam Evaparation Source 18
Producl Guide I 03
Electron Microscopes
IJEM- RM1300 Ultra High Voltage Electron Microscope
Using a high voltage electron beam giving
high transmission this microscope permits
the direct observation of the 3-D structure
of thick specimens Ihe direct observation
of beam damage and the observation of
sensitive biological specimens with little
damage It features great operational ease
and st ab il it y The JEM-ARM 1300 is
essential for atomic level structural imaging
and 3-D observations
p 010 nm (with top entry slage)
012 nm (with side entry stage)
400 to 1300 kV
x200 to 1500000
I JEM-3200FS Fi eld Emission Electron Microscope (Equipped with In -Column En ergy Filter)
A field emission electron microscope that
gives full play to not only high-resolution
imag ing but also nanoarea analys is
Equi pp ed with a 300 kV FEG and an
in-column energy filter Incorporation of a
new rotation-free image-forming optical
system facilitates acquisition of TEM images
and diffraction patterns as well as provides
stable spectra The combination of the 300
kV FEG and the energy filter oHers new
many solutions for a wide range of research
fields
~ _ n Q17nm
Ai - ~III J VCl Max 300 kV gtL(Jrll lallic I X 100 to 1500000
I JEM-2200FS Field Emission El ectron Microscope (Equ ipped with In -Column Energy Filter)
A field emission electron microscope
equipped with a 200 kV field emission gun
and a new in-column energy filter which is
optimally configured for analytical functions
such as element analysis analysis and stage
analysis The use of a new rotation-free
image-forming optical system makes it easy
to compare TEM images and diffract ion
patterns Since the microscope allows
observation of wide- field energy- filtered
images combination with the op tional
tomography function enables acquisi tion of
three-dimensional information with a wide
field and a high contrast
-3 OOF Fi eld Emission Electron Microscope
Modern electron microscopes can integrate
various imaging devices and analyzers for
nano-area analysis of morphology structures
and chem ical states This advantage is
drawi ng increasing expectation s from
researchers The JEM-31 OOF achieves highshy
reso lution im ag ing and nano-probe
formation Also the JEM-3100F has usershy
hiendly operation tools for smooth operation
of the TEM with various devices and a new
control system for system expandability This
advanced analytical TEM allows highshy
accuracy eHicient acquisition of valuable
infonmation from nano-materials
017 nm
R 100200300 kV
X60 to 1500000
I JEM-ARM200F Atomic Reso lution Analytical Electron Microscope
The JEM-ARM200F incorporating a STEM
Cs COrTector and a microscope column with
dramatically improved mechanical and
electrical stability achieves the worlds
highest STEM (HAADF) reso lution of 008
nm as a commerci a l TEM Th e
Cs-co rrected extremely small elec tron
probe achieves a remarkably increased
current density one order magnitude larger
than conventional TEMs Thus the JEMshy
ARM200F provides ultimate atomic -level
analysis and also higher throughput with
dramatically shortened measurement time
Pc t I 008 nm (STEM)
0 19 nm (rEM)
011 nm (With TEM Cs corrector)
I VCi JG 80 kV 200 kV
x50 to 2 000000
JE -2100F Fie ld Emission Electron Microscope
The field emission electron gun (FEG) which
provides an elec tron beam w ith high
brightness and high coherence is essential
for high-resolution observation and nano
area analysis The JEM-2100F featuring
advanced digital operation is an integrated
TEM th at g ives full play to its various
functions
P lr 11 1 O 19nm ~cC68Tltllfn m tage 160 kV 200 kV
v1a tCBt I x50 to 1500000
04 I Produ CI Guide
I
11 L bull bull 1 ~
EM-~800 Multi-Purpose Analytical Electron Microscope
The JEM-2800 is a new TEM that achieves
nano-area analysis through Automation and
Convenience while being Easy- to-use so
that expert results can be achieved by
operators of any skill level Its advanced
electron optical system makes IT possible to
periorm high-resolution TEM and STEM
imaging EDS EELS tomography and
in-situ observation on the same sample
wilhout sacrificing any of Ihese capabil ities
02 nm (STEM) 01 nm (rEM)
1 100 kV 200 kV x 100 to 200000000
EM 2100 Electron Microscope
-r__bull
I JED-2300T
The JEM-2100 is a new-generation 200 kV
analytical electron microscope The JEMshy
2100 which incorporates an integrated PC
system for various functions WITh excellenl
cost performance supports research and
development in wide scienlific fields ranging
from biotechnology to materials science
Pont liJtI 019 nm ~=I nlng vrl qe 80 10 200 kV
Ilagnl 11 X50 to 1500000
JEM-1400Plus Electron Microscope
The JEM-1400Plus is a versatile
transmission electron microscope (rEM) for
a wide range of applications including
biology polymers nano technology and
advanced materials
The JEM-1400Plus uses a single camera for
imaging for view area seach (x10) to data
aquisition
New operation panels with the organic EL
buttons give you simple and intut ive
operation
p~ f -11)(1 02 nm
r- u 40 10120 kV x l0tol2ooOOO
Energy Dispersive X-ray Spectrometer
The JED-2300T installed on a TEM can
easily perform qualitativequantitative
analysis and linea rea analysis of
microareas WITh high energy resolution This bull EDS employs a JEOLs unique ultra-thin
window detector with gate valve protection
mechanism making it possible to obtain
high-sensitivity analysis data particularly
from light elements
Ivl I (d _ -II(I~
QualitativequantITative analysiS linearea analysis AI Iflltgtie elements Be to U B to U or Na to U
Prod uc l G u ide I 05
- -
I I lilllll
II 1111 111111 11111111
~ - - shy
- -- ~-
- shy
Scanning Electron Microscopes
JSM 7800F Field Emission Scanning Electron Microscope
I JSM-7600F Field Emission Scanning Electron Microscope
The JSM-7600F is a state-of-the-art thermal
FE-SEM th at successfu ll y combines
ultrahigh-resolution imaging with optimized
analytical functionality such as high-speed
high-accuracy analyses
10 nm (15 kV) 15 nm (1 kV) 01 to 30 kV
x 25 to 1000000
JSM-7 OOF Field Emi ss ion Scanning Electron Microscope
l 8
I II
The JSM-7800F equipped with a newly developed super hybrid objective lens is a
cutting-edge thermal FE-SEM that successfully combines ultrahigh-resolution
imaging with fast and high-accuracy elemental analysis Magnetic specimens can
be observed and analyzed at high magnification The JSM-7800F also enables
researchers various analyses such as EDS WDS EBSD and CL
bull08 nm (15 kV) 12 nm (1 kV)
001 to 30 kV
x25 to 1000000
JSM 7500F Field Emission Scanning Electron Microscope
The JSM-7500F developed for
nanostructure characterization is equipped
with the Gentle Beam function which
enables researchers observation atI(~ x 100000 magnification even with 100 V low electron energy ~ ~tn~ ~=--
- - - 10 nm (15 kV) 14nm (1 kV)Jllshyf -diy Ollaqb 0 1 to 30 kVoG -- ~ Wll X25 to 1000000- rr
-
The JSM-7100F is a versatile high performance analytical FE SEM The electron
optics produces the maximum 200 nA probe current with the patented in-lens
thermal FEG and a small probe diameter even at large probe currents with the
patented aperture angle optimizing lens
The objective lens is the field free type This lens is suitable for high precision EBSD
analysis and characterization of a magnetic specimen
The vacuum system employing a TMP combined and a specimen exchange airlock
chamber A life of emitter is prolonged by the high quality vacuum in the gun
chamber
gt= - 12nm (30 kV) 30nm (1 kV) 02 to 30 kV
x 10 to 1000000
06 I Producl Guide
---------
I )SM-66 0 Scanning Electron Microscope
The JSM-6610 is a high-performance SEM
that is equipped with a superb electron
optical system and a general-purpose largeshy
specimen chamber to accommodate a
specimen up to 200 mm diameter The _JSM-6610 incorporates newly designed
__
_- ~I software for easier SEM operations in a
variety of applications
I J5M-ALA series Analytical Scanning Electron Microscopes
The JED-2300 EDS developed by JEOL is
embedded in the compact SEMs The
footprint is same as that of the basic SEM
The SEM and EDS are operated as one
seamless system to provide comfortable
and efficient operation A SDD type EDS
detector does not require liquid nitrogen
EDS analysis is ready whenever you need it
Resolution HV 30 nm
LV 40nm 40nm
Magnification
Accelerating voltage 05 shy 30 kV
x5 shy 300000
03 shy 30 kV
I JASM-6200 C airScor etrade Atmospheric Scanning Electron Microscope
I SM-6510 Scanning Electron Microscope
The JSM-6510 is a high-performance SEM
that is equipped with a superb electron
optical system same as the JSM-6610 and
a general-purpose specimen chamber to
accommodate a specimen up to 150 mm
diameter The JSM-651 0 incorporates
newly designed software for easier SEM
operations in a variety of applications
II 1 30 nm ltr-- rr TJ 01 qamp 05 to 30 kV M~1fIIC3IKlr x5 to 300000
J5 -LV series Low Vacuum SEMs
The low vacuum SEM consists of a
conventional high vacuum mode and a low
vacuum (LV) mode One can select the
vacuum mode with a click on the menu
The LV mode enables one to observe and
analyze non-conductive specimens The
specimen chamber is kept at low vacuum
so that highly out-gassing specimens can
be easily observed
1-lhlIt
Resolution HV 30 nm
LV 40 nm
Low vacuum range 10-270 Pa
The JASM-6200 allows high-resolution light microscopeSEM observation at
atmospheric pressure A specimen is held at normal atmospheric pressure Dynamic
observation of physical or chemical reactions can be made in liquid or gas In addition
for biological applications difficult dehydration and drying processes are not needed
dramatically reducing specimen pre-treatment time
Bnm Imiddot 102030 kV
II
Product Guide I 07
JSM-60l0 AILV InTouchScope
)shy -
JSM-6010LA
I JCM 6000 NeoScopeTM
The InTouchScope incorporates a highly intuitive SEM interface with multi-touch
technology The user can expand application windows and orchestrate aJl functions
just by touching the screen
40 nm (20 kV) 50 nm (20 kV)
05 1020 kV x810 300000
JCM-6000 NeoScopen~ let you observe a specimen at much higher magnification
than a light microscope with the same simple operation of a light microscope The
observation image appears automatically when a specimen is inserted and you can
go up to the maximum magnification of x60OOO quickly with the automated
operations
JCM-6000 NeoScopem is equipped with a TMP for quick start
The installation is easy The wall outlet (100V AC) is the only utility needed Cooling
water is not necessary
FX X10 10 60000
SI - Max 70mm dia
Ion Beam Application Equipment
pIB-09010 Cross Section Polisher (CP)
The IB-090 10CP Cross Section Polisher
makes a cross sect ion by irradiating a
spec imen with argon ion beam along an
edge of a shield plate placed on a
specimen This is an innovative specimen
preparation device for specimens studied in
SEM and EPMA
IIB-09020C Cross Section Polisher (C PIT)
The IB-09020CP Cross Section Polisher
(CPIT) creates a cross section in a manner
similar to the IB-09010CP Its built-in CCO
camera al lows real-time monitoring of a
cross-section during polishing
08 I Product Guide
I J18-4601 MuIti Beam System
I J -4501 MultiBeam System
EM-091001S Ion Slicer
The JIB-4501 MultiBeam System achieves
surfaceinternal 3D imaging and analysis
with simple operation This system also
has optimum geometry for all functions
from FIB SEM observation to EDSEBSD
analyses
R~ Iul N 5 nm (FIB) 25 nm (SEM) A I tlrx] I J 03 kV to 30 kV
(5 kV steps) Magl1lhcnli X30 10 300000
(observation milling)
The Ion Slicer can easily prepare thin-film
specimens for TEM without special skill Prior
treatment required for the Ion Slicer is only to
mechanically polish a specimen to 01 mm
thick The optimally set Ar ion beam provides
high-quality thin films In addition this
innovative tool suppresses specimen damage
and contamination such as lattice distortion
induced by mechanical polishing and
oxidation on specimen suriaces by chemical
treatment The Ion Slicer is an echo-friendly
efficient specimen-preparation tool
The JIB-4601 F MultiBeam System unites the unique imaging and analytical capabilities
of the High Power Optics employed in the TFE SEM and a high-performance FIB
column in a highly efficient and powerful system The JIB-4601 F offers an easy-to-use
tool for highly automated sample preparation combined with high-resolution imaging
and sub-micron analysis of the specimen cross-section
5 nm (FIB) 12 nm (SEM) 02 kV to 30 kV (5 kV sleps)
x30 to 1000000 (observation milling)
I J18-4000 Focused Ion Beam System
Top of the line high-throughput
processing
Compact size for flexible layout shy
Installation space reduced by 20
(compared to JEOL conventional
models)
Superb performance at low accelerating
voltage
Stage Navigation System for fast
determination of observation position
R-_ lit I f1 5 nm ICIIH~ltn lJIO ltJi 1 to 30 kV
M~Q I I x60 (for searching field) X200 to 300000
IIB09060CIS Cryo Ion Slicer
The IB-09060CIS Cryo Ion Slicer
incorporates a specimen cooling
mechanism in the EM-091001S Ion Slicer
for easy preparation of thin filmscross bull I J sections even for specimens susceptible
to thermal damage
J
~
Producl Guide I 09
- ---- shy
_bullbull- _ bullbull 1
- - -~
[Peripheral Equipment ]
IJIC 410 HDT400 JEE-420 series Ion Cleaner Hydrophilic Treatment Device Vacuum Evaporators
The JIC-41 0 Ion Cleaner removes hydrocarbon
contamination on TEM specimens by exposing
specimens in glow discharge
The treated specimens do not build up contamination
during observation in a TEM
JEC560 Auto Carbon Coater
The HDT-400 applies hydrophilic treatment on TEM
grids and SEM specimen mounting blocks The entire
operation is automated
IJFC-1600 Auto Fine Coater
O ~ - --=shy
The JEE-420 vacuum evaporator applies coating on
SEM or TEM specimens with a variety of materials
including gold platinum carbon chromium The JEEshy
420 applies shadowing on TEM specimens
- - C- Ooshy o --nu _ __ a 0 0 0 0
The JEC-560 rapidly applies carbon coating on non-conductive specimens for The JFC series sputter coater applies metal coating on SEM specimens quickly Gold
element analysis with a scanning electron microscope or an electron probe micro gold-palladium and platinum can be applied
analyzers
JED23002300F Energy Dispersive X-ray Spectrometers
Dry SO Detector
The JED-23002300F is installed on a SEM or an EPMA and performs elemental This unique box type Dry SD detector is designed for JSM-651 0 and JSM-601 0 series
analysis on micro areas The Dry SD detector an SDD type detector is cooled SEM The detector is positioned at the optimum position
electrically It does not need liquid nitrogen cooling so that maintenance is not
required Analysis Station the unique EDS analysis software is versatile with simple
operation
All y A~Ilrn System that links observed images with analysis data
inlIytl(oIIUI1Chi1$ Qualitativequantitative analysis linearea analysis
10 I Producl Guide
------
f
Instruments for Microarea and Surface Analysis
IjXA-8530F Field Emission Electron Probe Microanalyzer
The JXA-8530F features an improved hardware that is used in the JXA-8500F (the first
FE-EPMA in the world) as well as newly designed user-friendly PC-GUI windows for
efficient analysis and data operation The FE gun of the JXA-8530F provides not only a
spatial (analysis) resolution of the order of 01 IJm but also high-sensitivity X-ray
detection at low accelerating voltages and large probe currents
IjPS-9200 Photoelectron Spectrometer (XPS)
The JPS-9200 is an XPS that provides microarea analysis A newly developed microshy
tens enables high-sensitivity analysis from macro to microareas Its stage accepts both
standard-size samples (10X 10X2 mm) and large samples (up to gO mm in diameter)
The stage-scan mapping method allows the acquisition of photoelectron images
ranging from low magnification (50 x 18 mm) to high magnification (spatial resolution
30lJm)
I jAMP-9500F Field Emission Auger Microprobe
fl
X 8230 Electron Probe Microanalyzer
D
~) ~ j ) ~ =~=
The JXA-8230 is a newly developed EPMA which succeeds a proven JEOL EPMA
hardware and features newly designed user-friendly PC-GUI windows for efficient
analysis and data operation Sophisticated analysis menus are designed so that the
user can easily access target material analyses offering stress-free operations
I jPS-901 0 series Photoelectron Spectrometers (XPS)
XPS with high-sensitivity and high-resolution is compactly designed on the basis of
JEOLs many years of basic and application technologies on electrostatic lenses
analyzers etc The low-acceleration and large-current ion guns dedicated to permit
XPS analysis of thin films with different thicknesses from surface atomic layers to
micron order thick specimen layers The specimen chamber and etching chamber are
separated from each other in terms of vacuum thus completely preventing the
contamination due to sputtering and facilitating the maintenance of ultrahigh vacuum
A field-emission Auger Microprobe featuring the worlds highest spatial resolution with
the minimum probe diameter of 3 nm (for secondary-electron image) and 8 nm (for
Auger analysis) The new hemispherical electrostatic energy analyzer (HSA) with a
multi-channel detector optimized for Auger analysis is suitable for chemical-state
analysis The neutralizing ion gun allows Auger analysis of insulating materials Its
specimen stage accommodates a large sample of up to 95 mm in diameter Also it is
expandabfe for an UHV-SEM
ProduCI Guide I 11
X-ray Fluorescence Spectrometers
I ISX 400Rll Element Analyzer
An energy-dispersive X-ray fluorescence spectrometer for environmental analysis
which helps you comply with environmental regulations for hazardous substances
such as the RoHS and ELV directives in the EU and soil pollution in Japan You can
easily analyze minute traces of Cd Pb Hg Cr etc This analyzer is also suitable for
general analySiS including element analysis and thickness measurement using the FP
(fundamental parameter) method
I JSX-31 OORll Element Analyzer
An energy-dispersive X-ray fiuorescence spectrometer for environlnlntal analysis which helps you
comply with environmental regulations for hazardous substances such as the RoHS and ELV
directives in the EU and soil pollution in Japan This analyzer inoorporates a JEOL-made electrically
cooled Si(u] detector making liquid nrtrogen unnecessary as well as providing high sensitivity for
heavy-element analysis such as Cd Pb and Hg This analyzer is also surtable for general analysis
including eement analysis and thickness measurement using the FP (fundamental parameter)
method
12 I Product Guide
Semiconductor Eq Ipm nt
2 Electron Beam Lithography System
-5
Electron Beam Lithography System
r
Electron Beam Lithography System
-~=-~--I--~ I
~ ~ ~-
Th e JBX-3200MV is an e lec lro n bea m lithography system developed for the production of next generation ultrahigh-precision masks and reticles This system employs a variableshyshaped electron beam o f 50kV and a step amp repeat specimen stage
High thro ug hp ut enabled by a new PEG (Proximity Effect Correction) system High-speed da la- transfer sys tem for a large quanti ty data High-precision design for masklrelicle production
Th e JBX-9 500FS is a spot beam
lithography system developed to meet a
wi de range of applications with high
throughput and high precision periormance
This sys tem covers fields from the nanoshy
technology research to the production of
leading edge devices
f 100kV _ ZrONV Schotlky emitter
maximum 300 mm wafer
Th e JBX-6300 FS is a s p o t b ea m
lithography system developed to meet a
w ide range o f applica tions with high
resolution and high precision periormance
This system covers fields from the nanoshy
technology research to the development of
next generation devices
25 kVl50 kVl1 00 kV ZrONV Schottky emittelt
maximum 200 mm wafelt
Prod ucl Gu ide I 13
-
---------
-_ -~
- --= - - - =-shy -
NMR Spectrometers
I JNM-ECAECX series FT NMR System
920 MHz magnet Photo courtesy Nationallnstrtute of Natural Sciences Institute for
Molecular Science
The JNM-ECA920 FT NMR System is a 920 MHz high-resolution NMR
spectrometer developed by JEOL This spectrometer uses the superconducting
magnet co-developed by National Institute for Materials Science and Kobe Steel
Ltd which generates the high magnetic field Created by combining Japans stateshy
of-the-art technologies this FT NMR System marks an important milestone in next
generation biology and nanotechnology which call for high-magnetic-field highshy
resclution NMR analysis
JEOL RESONANCE Inc
~ ~ ~
~t~-
~ 100
HNCACB spectrum of 13C(15N labeled Solid 23Na-MQMAS spectrum of ubiqurtin N3)P207
The JNM-ECNECX series are versatile high-performance FT NMR spectrometer
system that utilize the latest digital and high-frequency technology The ECA
spectrometer is applicable up to 1GHz and can be used for a wide range of
applications including liquidsolid NMR protein analysis and diffusion coefficient
measurement
INM-EC cd
JOO ~QO 0(1 ~uo 1)0
Spectrometer I Oscillator receiver power amplifier
Magnet IISCM Field strength 705T I 939T 11 74T 1401T 1643T
Bore diameter (mm) 54 I 54 54 54 54
Probe 5 mm Ttl tunable
11110
188T
54
JEOL RESONANCE Inc
INMmiddot fO rie ---shy
)Ol~ ~1111 011 Oll
Spectrometer Oscillator receiver power amplifier
Magnet I ISCM Field strength 705T 939T I 1174T 1401T
Bore diameter (mm) I 54 54 54 54
Probe I 5 mm TH tunable
JEOL RESONANCE Inc
14 I Produc t Guide
bull bull bull
IJNM-ECS 00 FT NMR System
bull I ASC Series
Auto Sample Changer
ASC8 (8 samples) ASC24 (24 samples)
middotmiddot iT ~ --shy
~ I -~Au
ASC16 (16 samples) ASC64 (64 samples)
bullIJNM-ECAECX series Solid NMR
=- ~
I
l l
bull
0 5ilJl
0
MAS conlroller Solid NMR sampling kit
NMR Systems For Modern NMR Spectroscopy The JNM-ECS400 i s a compact two-channel
spectrometer that retains the advanced capabilities of the
JNM-ECAlECX series (required installation space is oneshy
half compared to conventional NMRs) Programmable
timing sequencers built into each RF and PFG channel
can independently control either synchronous or
asynchronous operations of each channel Its standard
tunable broadband gradient probe which integrates all
JEOLs newest technologies is the high sesitivity roomshy
tempperature probe
Ccmpact spectrometer chassis Innovaten in JEOL NMR digrtal architecture High-stability and high-accuracy digital spectrometer High-sensrtivity new tunable probe Full automalk NMR with advanced software
JEOL RESONANCE Inc
An automatic sample changer makes it
possible to measure many samples
sequentially by exchanging multiple samples
automatically one by one Five changer
models are available for 8 samples 16
samples 24 samples 64 samples and 100
samples
JEOL RESONANCE Inc
ASC100 (100 samples)
1 --0 1(10 C ppm I
Sdid 13C-CPMAS spectrum of cholk acid
Solid-NMR is a technique that measures solid samples (powder or film-like samples) This technique is also effective for measurement of samples not soluble in solvents (inorganic
samples etc) and of crystalline polymorph that is meaningful to measure at the solid state
JEOL RESONANCE Inc
Produci Guide I 15
Mass Spectrometers
I JMS-800D UltraFOCUS I JMS-700 (2) MStation Mass Spectrometer Dedicated to Dioxin Anal ys is High resolution M ass Spectrometer
JMS-800D UltraFOCUS is the optimal cho ice for ultra lowlevel race detection
applications suc h as moni torin g for dioxins and related co mpoun ds eg
Polychlorinated Biphenyls (PCBs) Polybrominated Diphenyl Ethers (PBDEs) or drugs
of abuse by high resolution-selected ion monitoring (HRSIM) gas chromatographyl
mass spectrometry(GCMS)
R-- gtn 80000 (10 valley) Sent Ily 2 3 7 8-TCDD 100fg SNgt2oo
(6 channels 100 msecch Resolution 10000)
N_ Jut J _lllgEI up to 10 kV
JMS-S3000 Matri x Assisted Laser DesorptionIonization TOFMS
The JMS-S3000 is a MALOI-TOFMS incorporating an innovative SpirarrOF ion optical
system With superior capabilities than conventional MALDI-TOFMS the JMS-S3000
provides sate-of-the-art anaiylical solutions for a wide range of research areas such as
functional synthetic polymers materials science and biomolecules
Malrix Assisled Laser Desorpllonlonization Timemiddotof-Flighl Mass Spectrometer
I JMS-T1 OOLP+DART TLC-TOFMS
Pet c 60000 (10 valley) err 02 ng of methyl stearate
SIN 400
(CVEI combination ion source) I~ ~ aJe up to 10kV
I JMS-T1 OOLP LC-TOFMS
I JMS-Tl OOGCV GC-TOFMS
middotl shyThe JMS-T100LP+DART achieves simple and fast TLCMS analysis Accurate mass The JMS-Tl00GCV is a fully automatic Gas Chromatograph - Time-ot-Flight Mass
measurement capabilit y of TOFMS also enables you to determine element Spectrometer (GC-TOFMS) This versatile MS system covers wide range of
compositions of the analytes applications in GC-MS analysis
16 I Pr oduc i Gu ide
- -
---
1----- 1- - - I - =---shy= bull --tJ~ 1- _ ~ __ ~-=--_~
I JMS-Ql 050GC UltraQuad GClMS
cJEOL
-
S-trapHS Headspace Autosampler
ESR Spectrometers
I JES-X3 series ESR Spectrometers
Recently it has been widely
accepted that even retatively few
unpaired electrons in a sample can
affect the function of the material so
lower detection limits (high er
sens itivity) is required of ESR
measurements JES-X3 Series has
achieved higher sensiti v i ty by
developing a lOIN-noise Gunn
oscillator for its new spectrometer
JES-X320 JEOL RESONANCE Inc
i III III )
Maximum Magnetic Field I a6ST 13T 14T
SweepW idth I --00-- 250mT plusmn001 - 500m__T_ __--l
Pole Gap _ _ 6cmm__ ___-= ___~ ____cmm__ _ I 0 = 60mcm 75 _l
Frequency Range(GHz) 8750 - 9650 _ _ _ ___-1
Field Resolution (mT) _L_ 235 Correction by Marker _1_--- Standard
I Operating System Windows 7
The JMS-01050GC is an innovative quadrupole mass spectrometer (OMS) that
achieves the highest-level sensitivity in OMS It has a high ability of evacuation due
to the use of a split flow turbo-molecular pump system (400 Lis) th at
simultaneously evacuates the ion source and the detector The use of a highshy
accuracy hyperbolic quadrupole mass analyzer provides high resolution
The S-trap is a next-generation headspace autosampler providing ultra-low
concentration measurement which was not achieved with a heads pace (HS) method
using conventional sample loop In addition the HS-GCMS system combined lith a
JMS-01050GC Mkll quaorupole MS guarantees detection of mold odor in water
down to 1 ppt
I ES-CT470 Liquid Helium Variable Temperature Controller
The ES-CT470 varies the sample temperature in the temperature range between 25 K
and 470 K Temperature setting is performed by d igital display and the set
temperature is kept constant by automatic control circui ts Combined use with a UV Irradiation device is possible A GaAs etement is used as a temperature sensor
enabling high-accuracy temperature setling
- 25 K to 470 K
plusmn001 K for 25 K to 42 K
plusmn1 orO5 K for 42 K to 470 K
_ 20 min 10 25 min (rom room temperature 08 to 2 Uh
50Hz60Hz 5mm JEOL RESONANCE Inc
Produ c t Guide I 17
Industrial Equipm nt for thin-filnl formation and nlatel ial processing
I bull
Electron Beam Source High-power Electron Beam Source
BS-60060EBS EBG-102UB6S
Electron beam sources for vacuum evaporation of metal and metal-oxide thin-films
We offer a wide variety of electron beam sources and crucibles They have features of
excellent beam spot and energy density and high-speed sweeping
1 PGBS 80020CPPS Plasma Source
BS-80011 BPG (6kW) BS-8002OCPPS (3kW)
Plasma Sources are installed in a vacuum chamber and generate high-density plasma
Used as Ion Plating (Plasma Assisted Deposition) and it is possible to improve film
properties for optilcal thin films protective films and function films Because highshy
density plasma can be generated in a mass space high-rate deposition to a large area
is possible
I RF Induction Plasma System
JEBG-3000UB(300kW) JEBG-1 OOOUB(1 OOkW)
High-power electron beam sources for vacuum evaporation of metal and metal-oxide
for wide plastic films or large glass plates that are continuously fed And they can also
be used for vacuum melting of high-melting point metals
raes
RF Generator
t shy - - - --- - - --- -
0-~ 0 bull bullbull - -
RF-12030 (3kW) RF-56000 (Controller)
13 56MHz radio-frequency power supplies for plasma generation and used for
sputtering CVD etching and ion-plating We offer 750W to 6kW generators and
matching networks
DR Powder Feeder
Thermal plasma around 10000degC (15000deg F) by RF inductive coupling This thermal Fine powder feeder that can feed 01 to 100 11m size fine powder continuously with
plasma is used for nano powder synthesis fine powder spheroidization thick film carrier gas We offer optional feeding rate controller and large capacity hopper
deposition multi composite membrane synthesis CVD and harmful gas
decomposition
18 I Produci Guide
---
Biochemical Analyzers
I JCA-BM series Clinical Chemistry Analyzer BioMajesty Series
JEOLs micro volume technology and unique sample pre-dilution mechanism realizes
high throughput chemistry analysis with reduced sample and reagent volume
More than 4000 systems have been placed in clinical laboratories allover the world
JCA-BM6050
I JCA-BMBOOO series Ultra High Throughput Clinical Chemistry Analyzer
4 4
JCA-BMB060 egt
JCA-BMSOOO series offer ultra high throughput chemistry analysis up to 9000 testsl
hour
The pre-dilution unit one of the BioMajesty family features also continues the strong
tradition in these series with interconnected multiple analysis modules the key factors
that accomplish brilliant high throughput as well as downtime reduction with back-up
capability
I JCA-BM6070 High Throughput High Performance Clinical Chemistry An alyzer
I I I
A Clinical chemistry analyzer with incomparable speed and accuracy which achieves
high throughput of 2400 testslhour (includ ing ISE) The incorporated compact
workstation and user-friendly Interface with excellent operability leads the new trend of
the laboratory testing
BioMajesty Series lCA-BM 6010 lCA-BM 6050
lCA-8M 6070 leA-BM 91 30
lCA-BM 8000 Series
bull This product is distributed outside Japan by Siemens Heatthcare Diagnostics under the ADVtAreg brand name
I JCA-BM601 OC Compact amp High Performance Clinical Chemistry Analyzer
-~-I -
1lIIIIIIilllllllllJllnlIlII Ii I JCA-BM6010C is a compact but efficient automatic analyzer that maintains the basic
concept of BioMajesty series while achieving the excellent capability of microanalysis
with sample volume as small as 1 J1L
BM6010C also offers fully automated HbA1 c analysis with on-board hemolysis
(optional) Simultaneous measurement of Glucose and HbA1c improves laboratory
workflow
Product Guid e I 19
S~~MCEAII Certain products in this brochure are controlled under the Foreign 0J 0014007 -v- ~ Exchange and Foreign Trade Law of Japan in compliance with $ ~~~ international security export control JEOL Ltd must provide the~2 m) IIlt Japanese Government with End-users Statement of Assurancel A MGMT SYS
AvA ~ m and End-use Certificate in order to obtain the export license - tiJ needed for export from Japan If the product to be exported is in this category the end user will be asked to fill in these certificate formsdEOLIS09001 amp150 14001CenrfiCltlled
httpwwwjeolcomdEOL JEOL Ltd 1-2 Musashino 3-chome Akishima Tokyo 196-8558 Japan Sales Division Telephone+81-42-528-3381 Facsimile+81-42-528-3386
ARGENTINA COASIN SAClyF Virrey del Pino 4071 1430 Buenos Aires Argentina Telephone 54-11-4552-3185 Facsimile 54-11-4555-3321
AUSTRALIA amp NEW ZEALAND JEOL(AUSTRALASJA) PtyUd Suite 1 L2 18 Aquatic Drive - Frenchs Foresl NSW 2086 Australia Telephone 61-2-9451-3855 Facsimile 61-2-9451-3822
AUSTRIA JEOL (GERMANY) GmbH Oskar-Von-Miller-Strasse 1 a 85386 Eching Gennany Telephone 49-8165-77346 Facsimile 49-8165-77512
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BELGIUM JEOL (EUROPE) BV Planet ll Gebouw B Leuvensesteenweg 542 B-1930 Zaventem Belgium Telephone 32-2-720-0560 Facsimile 32-2-720-6134
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CANADA JEOL CANADA INC 3275 Premier Rue 8 SI-Hubert Quebec J3Y 8Y6 Canada Telephone 1-450-676-8776 Facsimile 1-450-676-6694
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Arturo Pmt 828Santiago Chile Telephone 56-2-634-6266 Facsimile 56-2-634-4633
CHINA JEOL(BEIJING) CO LTD Room Bl0l0l110 Wantong New Wond Plaza No2 Fuchengmenwai Street XIcheng District Beijing 100037 PRChina Telephone 86-10-6804-6321 Facsimile 86-10-6804-6324
JEOL (BEIJING) CO LTD SHANGHAI BRANCH
Room 15051506 Nol300Xi Kang Road Jing an Dis Shanghai 200040 China Telephone 86-21-6248-4868448745374404 Facsimile 86-21-6248-4075
JEOL (BEIJING) CO LTD GUANG ZHOU BRANCH
N1601 World Trade Center Building 371-375 Huan Shi Road East Guang Zhou Guangdong Prov 510095 PRChina Telephone 86-20-8778-7848 Facsimile 86-20-8778-4268
JEOL (BEIJING) CO LTD WUHAN BRANCH
Room A2117 Zhongshang Plaza Office Bldg NO7 Zhongnan Road Wuhan Hubei 430071 PRChina Telephone 86-27-8713-2567 Facsimile 86-27-8713-2567
JEOL LTD (BEIJING) CO LTD CHENGDU BRANCH 1807A Zonglu Building NO 35 Zhongfu Road Chengdu Sichuan 610016 PR China Telephone 86-28-86622554 Facsimile 86-28-86622564
EGYPT JEOL SERIVCE BUREAU
3rd Fl Nile Center Bldg Nawal Slree Dokkl (Cairo) Egypt Telephone 20-2-3335-7220 Facsimile 20-2-3338-4186
FRANCE JEOL (EUROPE) SAS Espace Claude Monet 1 Allee de Giverny 78290 Crolssy-sur-Seine France Telephone 33-13015-3737 Facsimile 33-13015-3747
GERMANY JEOL (GERMANY) GmbH Oskar-Von-Miller-Strasse 1 a 85386 Eching Gennany Telephone 49-8165-77346 Facsimile 49-8165-77512
GREAT BRITAIN amp IRELAND JEOL (UK) LTD JEOL House Silver Court Watchmeaci Welwyn Garden City Herts AL71LT UK Telephone 44-1707 -377117 FaCSimile 44-1707-373254
GREECE N ASTERIADIS SA
56-58S Trikoupl Str PO Box 26140 GR-10022 Athens Greece Telephone 30-1-823-5383 Facsimile 30-1-823-9567
HONG KONG FARMING LTD
Unit No1 009 1 OF Prosperity Milennia Plaza 663 Kings Road North Point Hong Kong Telephone 852-2815-7299 Facsimile 852-2581-4635
INDIA JEQL INDIA Pvt Ltd
Elegance Tower Level 2 2128 Old Mathura Road Jasola Business District Centre Near Apollo Hospital Jasola New Delhi 110025 India Telephone 91-11-6472-2578 Facsimile 91-11-4060-1235
BLUE STAR LTD (HQ Mumbaij
Analyticallnstrments Department Sahas 41412 Veer Savarkar Marg Prabhadery Mumbai 400 025 India Telephone 91-22-6666-4000 Facsimile 91-22-6666-4001
BLUE STAR LTD (DelhQ Analytical Instruments Department E-4412 Okhla Industrial Area Phase-II New Delhi 110 020 India Telephone 91-11-4149-4000 Facsimile 91-11-4149-4005
BLUE STAR LTD (Calcutta)
Analylicallnstruments Department 7 Hare Street Calcutta 700 001 India Telephone 91-33-2213-4133 Facsimile 91 -33-2213-4102
BLUE STAR LTD (ChennaO Analytical Instruments Department No 46 Garuda Building Cathedral Road Chennai 600 086 India Telephone 91-44-4244-4000 Facsimile 91-44-4244-4190
INDONESIA PT TEKNOLABindo Penta Perkasa Komplek Gading Bukillndah Blok lIll JI Bukfl Gading Raya Kelapa Gading Pennai Jakarta 14240 Indonesia Telephone 62-21-458470575859 Facsimile 62-21-45842729
ITALY JEOL 0TALIA) SpA Centro Direzionale Green Office Via dei Tulipani 1 20090 Pieve Emanuele (MI) Italy Telephone 39-02-9041431 Facsimila 39-02-90414343
KOREA JEOL KOREA LTD
Dongwoo Bldg 7F 1443 Yangjae Daero Gangdong-Gu Seoul 134-010 Korea Telephone 82-2-511-5501 Facsimile 82-2-511-2635
KUWAIT Ashraf amp CO Ltd WLL PO Box 3555 Safat 13036 Kuwait Telephone 965-1805151 Facsimile 965-24335373
MALAYSIA JEOL(MALAYSIA) SDNBHD(3S9011-M)
205 Block A Mezzanine Floor Kelana Business Center 97 Jalan SS 72 Kelana Jaya 47301 Petaling Jaya Selangor Malaysia Telephone 60-3-7492-7722 Facsimile 60-3-7492-7723
MEXICO JEOL DE MEXICO SA DE CV
Arkansas 11 Piso 2 Colonia Napoles Delegacion Benito Juarez CP 03810 Mexico DF Mexico Telephone 52-5-55-211-4511 Facsimile 52-5-55-211-0720
PAKISTAN (KarachI) ANALYTICAL MEASURING SYSTEM (pvn LTD(AMS LTD)
14-C Main Sehar Commercia) Avenue Lane 4 Khayaban-e-Sehar DHA-VII Karachimiddot75500 Pakinstan Telephone 92-21-353455813534074735346057-8 Facsimile 92-21-35345582
PANAMA PROMED SA Parque Industrial Costa del Este Urbanizacion Costa del Este Apartado 0816-01755 Panama Panama Telephone 507-303-3100 FaCSimile 507-303-3115
PHILIPPINES PHILAB INDUSTRIES INC
7487 Bagtikan Street SAY Makati 1203 Metro Manila Phillip pines Telephone 63-2-896-7218 Facsimile 63-2-897-7732
PORTUGAL Izasa Portugal Lda A do Proletariado 1 2790-138 CARNAXIDE Portugal Telephone 351-21-424-73-00 Facsimile 351-21-418-60-20
RUSSIA JEOL (RUS) LLC Krasnoproletarskaya Street 16 Bid 2 127473 Moscow Russian Federation Telephone 7-495-748-7791rr792 Facsimile 7-495-748-7793
SAUDI ARABIA ABDULREHMAN ALGOSAIBI GTC (Riyadh)
King Abdulaziz Avenue PO Box 215 Riyadh 11411 Saudi Arabia Telephone 966-1-479-3000 Facsimile 966-1-477-1374
SCANDINAVIA SWEDEN JEOL (Skandinaviska)AB
Hammarbacken 6A Box 716191 27 Sollentuna Sweden Telephone 46-8-28-2800 Facsimile 46-8-29-1647
SERVICE amp INFORMATION OFFICE NORWAY JEQL (Skandinaviska)AB
Lorenvangen 23 0580 Oslo NORWAY Telephone 47-2-2-64-7930 Facsimile 47-2-2-65-0619
FINLAND JEOL (Skandlnaviska)AB
Ylakaupinkuja 2 FIN-02360 Espoo Finland Telephone 358-9-8129-0350 Facsimile 358-9-8129-0351
SINGAPORE JEOLASIA PTE LTD
2 Corporation Road 1t01-12 Corporation Place Singapore 618494 Telephone 65-6565-9989 Facsimile 65-6565-7552
SOUTH AFRICA ADI Scientific (Pty) Ltd
370 Angus Crescent Northlands Business Park 29 Newmarket Road
~~=~g~~~2~~1nt~~2_~~~bIlC of South Africa
Facsimile 27-11 -462-1466
SPAIN IZASA SA
Argoneses 13 28100 Alcobendas (poligono IndustriaQ Madrid Spain Te~phone 34-91-663-0500 Facsimile 34-91-663-0545
SWITZERLAND JEOL (GERMANY) GmbH Oskar-Von-Miller Strasse 1 85386 Eching Germany Telephone 49-8165-77346 Facsimile 49-8165-77512
TAIWAN For EO ProQucts JIE DONG CO LTD 7F 112 Chung Hsiao East Road Section 1 Taipei Taiwan 10023 Republic of China Telephone 886-2-2395-2978 Facsimile 886-2~2322-4655
For Mass Spectrometer Products Mass Solutions Technology Co Ltd
5F No79 Sec 1 Xintai 5th Rd Xlzhi Dis New Taipei City 221 Taiwan Republic of China Telephone 886-2-2698-9511 Facsimile 886-2-2698-9512
For Semiconductor Products JEOL TAIWAN SEMICONDUCTORS LTD
11 F-l No 346 Pei-Da Road Hsin-Chu City 300 Taiwan Republic of China Telephone 886-3-523-8490 Facsimile 886-3-523-8503
THAILAND BECTHAI BANGKOK EQUIPMENT amp CHEMICAL CO Ltd
300 Phaholyothin Rd Phayathai Bangkok 10400 Thailand Telephone 66-2-615-2929 Facsimile 66-2-615-23502351
THE NETHERLANDS JEOL (EUROPE) Bv Ureweg 4 NL-2153 PH Nieuw-Vennep The Nelherlands Telephone 31-252-623500 Facsimile 31-252-623501
TURKEY TEKSERAS Kayisdagi )nonu MahKartal Cad No553 34755 Atasehir Istanbul Turkey Telephone 90-216-5736470 Facsimile 90-216-5736475
UAE MRS Group Dubai POBox 171612 Rashid Abdulla AI Noami Building Suite No 306 Damascus Street AI Qusais-3 Dubai UAE Telephone 971-4-2581141 Facsimile 971-4-2581151
JEOLGulf
POBox 171612 bull Rashid Abdulla AI Noami Building Suite No 306 Damascus Street AI Qusais-3 Dubai UAE Telephone 971-553964219(mobile)
USA JEOL USA INC 11 Dearborn Road Peabody MA 01960 USA Telephone 1-978-535-5900 Facsimile 1-978-536-22052206
JEOL USA INC WEST OFFICE
~~s~~~~~rigAe9~5t~~1 1 0 Telephone 1-925-737-1740 Facsimile 1-925-737-1749
VENEZUELA GOMSA Service and Supply CA
Urbanizacion Montalban JlI - Resldenclas Don Andres - Piso 7 - Apartomento 74 Avenida 3 entre calles 7 y 6 Montalban Caracas Venezuela Telephone 58-212-443-4342 Facsimile 58-212-443-4342
VTETNAM TECHNICAL MATERIALS AND RESOURCES IMPORT-EXPORT JOINT STOCK COMPANY(REXCO) Hanoi Branch
No 13-Lot 12 Trung Yen Trung Hoa Street Cau Giay Dist HanOi Vietnam Telephone 84-4-562-051617562-0535 Facsimile 84-4-853-2511
No 0205B389C Printed in Japan Kp
Product Guide
Name JEOL Ltd [I-JIHON DEI-JSHI KABUSHIKI KAISHA)
President Gon-emon Kurihara
Establishment May 301949
Capital 6740 million yen
Employees Consolidated 2709
Electron Microscopes Transmission Electron Microscopes (TEM] middotmiddotmiddotmiddot middot middotmiddot middot middotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddot middot middotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddot4
Energy Filter Electron Microscopes
Scanning Electron Microscopes Scanning Electron Microscopes (SEM] 6
Analytical Scanning Electron Microscopes
Focused Ion Beam System
Cross Section Polisher
Ion Slicer
Photoelectron Spectrometers (XPS)
Auger Microprobes
X-ray Fluorescence Spectrometers Energy-Dispersive X-roy Fluorescence Spectrometersmiddot middotmiddotmiddotmiddot12
Electron Beam Lithogrophy Systems (a spot beam lithogrophy system]
Gas Chromatograph Mass Spectrometer
Liquid Chromatograph Mass Spectrometers
Application Equipment High-Power Electron Beam Source
Built-in Plasma Source
Clinical Chemistry Analyzers Clinical Chemistry Analyzers middotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddot19
Ion Beam Application Equipment MultiBeam System 8
Peripherol Equipment bull bullbull bullbull bull bullbull 10
Surface Analysis Instruments Electron Probe Microanolyzers 11
Semiconductor Equipment Electron Beam Lithogrophy Systems (0 varioble-shoped electron beom) 13
NMR Spectrometers NMR Spectrometersmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddot middot middotmiddotmiddotmiddotmiddotmiddotmiddot 14
Mass Spectrometers Time-oF-Flight Moss Spectrometers (TOFMS) 16
ESR Spectrometers ESR Spectrometersmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddot 17
Electron Beam and plasma Electran Beam Evaparation Source 18
Producl Guide I 03
Electron Microscopes
IJEM- RM1300 Ultra High Voltage Electron Microscope
Using a high voltage electron beam giving
high transmission this microscope permits
the direct observation of the 3-D structure
of thick specimens Ihe direct observation
of beam damage and the observation of
sensitive biological specimens with little
damage It features great operational ease
and st ab il it y The JEM-ARM 1300 is
essential for atomic level structural imaging
and 3-D observations
p 010 nm (with top entry slage)
012 nm (with side entry stage)
400 to 1300 kV
x200 to 1500000
I JEM-3200FS Fi eld Emission Electron Microscope (Equipped with In -Column En ergy Filter)
A field emission electron microscope that
gives full play to not only high-resolution
imag ing but also nanoarea analys is
Equi pp ed with a 300 kV FEG and an
in-column energy filter Incorporation of a
new rotation-free image-forming optical
system facilitates acquisition of TEM images
and diffraction patterns as well as provides
stable spectra The combination of the 300
kV FEG and the energy filter oHers new
many solutions for a wide range of research
fields
~ _ n Q17nm
Ai - ~III J VCl Max 300 kV gtL(Jrll lallic I X 100 to 1500000
I JEM-2200FS Field Emission El ectron Microscope (Equ ipped with In -Column Energy Filter)
A field emission electron microscope
equipped with a 200 kV field emission gun
and a new in-column energy filter which is
optimally configured for analytical functions
such as element analysis analysis and stage
analysis The use of a new rotation-free
image-forming optical system makes it easy
to compare TEM images and diffract ion
patterns Since the microscope allows
observation of wide- field energy- filtered
images combination with the op tional
tomography function enables acquisi tion of
three-dimensional information with a wide
field and a high contrast
-3 OOF Fi eld Emission Electron Microscope
Modern electron microscopes can integrate
various imaging devices and analyzers for
nano-area analysis of morphology structures
and chem ical states This advantage is
drawi ng increasing expectation s from
researchers The JEM-31 OOF achieves highshy
reso lution im ag ing and nano-probe
formation Also the JEM-3100F has usershy
hiendly operation tools for smooth operation
of the TEM with various devices and a new
control system for system expandability This
advanced analytical TEM allows highshy
accuracy eHicient acquisition of valuable
infonmation from nano-materials
017 nm
R 100200300 kV
X60 to 1500000
I JEM-ARM200F Atomic Reso lution Analytical Electron Microscope
The JEM-ARM200F incorporating a STEM
Cs COrTector and a microscope column with
dramatically improved mechanical and
electrical stability achieves the worlds
highest STEM (HAADF) reso lution of 008
nm as a commerci a l TEM Th e
Cs-co rrected extremely small elec tron
probe achieves a remarkably increased
current density one order magnitude larger
than conventional TEMs Thus the JEMshy
ARM200F provides ultimate atomic -level
analysis and also higher throughput with
dramatically shortened measurement time
Pc t I 008 nm (STEM)
0 19 nm (rEM)
011 nm (With TEM Cs corrector)
I VCi JG 80 kV 200 kV
x50 to 2 000000
JE -2100F Fie ld Emission Electron Microscope
The field emission electron gun (FEG) which
provides an elec tron beam w ith high
brightness and high coherence is essential
for high-resolution observation and nano
area analysis The JEM-2100F featuring
advanced digital operation is an integrated
TEM th at g ives full play to its various
functions
P lr 11 1 O 19nm ~cC68Tltllfn m tage 160 kV 200 kV
v1a tCBt I x50 to 1500000
04 I Produ CI Guide
I
11 L bull bull 1 ~
EM-~800 Multi-Purpose Analytical Electron Microscope
The JEM-2800 is a new TEM that achieves
nano-area analysis through Automation and
Convenience while being Easy- to-use so
that expert results can be achieved by
operators of any skill level Its advanced
electron optical system makes IT possible to
periorm high-resolution TEM and STEM
imaging EDS EELS tomography and
in-situ observation on the same sample
wilhout sacrificing any of Ihese capabil ities
02 nm (STEM) 01 nm (rEM)
1 100 kV 200 kV x 100 to 200000000
EM 2100 Electron Microscope
-r__bull
I JED-2300T
The JEM-2100 is a new-generation 200 kV
analytical electron microscope The JEMshy
2100 which incorporates an integrated PC
system for various functions WITh excellenl
cost performance supports research and
development in wide scienlific fields ranging
from biotechnology to materials science
Pont liJtI 019 nm ~=I nlng vrl qe 80 10 200 kV
Ilagnl 11 X50 to 1500000
JEM-1400Plus Electron Microscope
The JEM-1400Plus is a versatile
transmission electron microscope (rEM) for
a wide range of applications including
biology polymers nano technology and
advanced materials
The JEM-1400Plus uses a single camera for
imaging for view area seach (x10) to data
aquisition
New operation panels with the organic EL
buttons give you simple and intut ive
operation
p~ f -11)(1 02 nm
r- u 40 10120 kV x l0tol2ooOOO
Energy Dispersive X-ray Spectrometer
The JED-2300T installed on a TEM can
easily perform qualitativequantitative
analysis and linea rea analysis of
microareas WITh high energy resolution This bull EDS employs a JEOLs unique ultra-thin
window detector with gate valve protection
mechanism making it possible to obtain
high-sensitivity analysis data particularly
from light elements
Ivl I (d _ -II(I~
QualitativequantITative analysiS linearea analysis AI Iflltgtie elements Be to U B to U or Na to U
Prod uc l G u ide I 05
- -
I I lilllll
II 1111 111111 11111111
~ - - shy
- -- ~-
- shy
Scanning Electron Microscopes
JSM 7800F Field Emission Scanning Electron Microscope
I JSM-7600F Field Emission Scanning Electron Microscope
The JSM-7600F is a state-of-the-art thermal
FE-SEM th at successfu ll y combines
ultrahigh-resolution imaging with optimized
analytical functionality such as high-speed
high-accuracy analyses
10 nm (15 kV) 15 nm (1 kV) 01 to 30 kV
x 25 to 1000000
JSM-7 OOF Field Emi ss ion Scanning Electron Microscope
l 8
I II
The JSM-7800F equipped with a newly developed super hybrid objective lens is a
cutting-edge thermal FE-SEM that successfully combines ultrahigh-resolution
imaging with fast and high-accuracy elemental analysis Magnetic specimens can
be observed and analyzed at high magnification The JSM-7800F also enables
researchers various analyses such as EDS WDS EBSD and CL
bull08 nm (15 kV) 12 nm (1 kV)
001 to 30 kV
x25 to 1000000
JSM 7500F Field Emission Scanning Electron Microscope
The JSM-7500F developed for
nanostructure characterization is equipped
with the Gentle Beam function which
enables researchers observation atI(~ x 100000 magnification even with 100 V low electron energy ~ ~tn~ ~=--
- - - 10 nm (15 kV) 14nm (1 kV)Jllshyf -diy Ollaqb 0 1 to 30 kVoG -- ~ Wll X25 to 1000000- rr
-
The JSM-7100F is a versatile high performance analytical FE SEM The electron
optics produces the maximum 200 nA probe current with the patented in-lens
thermal FEG and a small probe diameter even at large probe currents with the
patented aperture angle optimizing lens
The objective lens is the field free type This lens is suitable for high precision EBSD
analysis and characterization of a magnetic specimen
The vacuum system employing a TMP combined and a specimen exchange airlock
chamber A life of emitter is prolonged by the high quality vacuum in the gun
chamber
gt= - 12nm (30 kV) 30nm (1 kV) 02 to 30 kV
x 10 to 1000000
06 I Producl Guide
---------
I )SM-66 0 Scanning Electron Microscope
The JSM-6610 is a high-performance SEM
that is equipped with a superb electron
optical system and a general-purpose largeshy
specimen chamber to accommodate a
specimen up to 200 mm diameter The _JSM-6610 incorporates newly designed
__
_- ~I software for easier SEM operations in a
variety of applications
I J5M-ALA series Analytical Scanning Electron Microscopes
The JED-2300 EDS developed by JEOL is
embedded in the compact SEMs The
footprint is same as that of the basic SEM
The SEM and EDS are operated as one
seamless system to provide comfortable
and efficient operation A SDD type EDS
detector does not require liquid nitrogen
EDS analysis is ready whenever you need it
Resolution HV 30 nm
LV 40nm 40nm
Magnification
Accelerating voltage 05 shy 30 kV
x5 shy 300000
03 shy 30 kV
I JASM-6200 C airScor etrade Atmospheric Scanning Electron Microscope
I SM-6510 Scanning Electron Microscope
The JSM-6510 is a high-performance SEM
that is equipped with a superb electron
optical system same as the JSM-6610 and
a general-purpose specimen chamber to
accommodate a specimen up to 150 mm
diameter The JSM-651 0 incorporates
newly designed software for easier SEM
operations in a variety of applications
II 1 30 nm ltr-- rr TJ 01 qamp 05 to 30 kV M~1fIIC3IKlr x5 to 300000
J5 -LV series Low Vacuum SEMs
The low vacuum SEM consists of a
conventional high vacuum mode and a low
vacuum (LV) mode One can select the
vacuum mode with a click on the menu
The LV mode enables one to observe and
analyze non-conductive specimens The
specimen chamber is kept at low vacuum
so that highly out-gassing specimens can
be easily observed
1-lhlIt
Resolution HV 30 nm
LV 40 nm
Low vacuum range 10-270 Pa
The JASM-6200 allows high-resolution light microscopeSEM observation at
atmospheric pressure A specimen is held at normal atmospheric pressure Dynamic
observation of physical or chemical reactions can be made in liquid or gas In addition
for biological applications difficult dehydration and drying processes are not needed
dramatically reducing specimen pre-treatment time
Bnm Imiddot 102030 kV
II
Product Guide I 07
JSM-60l0 AILV InTouchScope
)shy -
JSM-6010LA
I JCM 6000 NeoScopeTM
The InTouchScope incorporates a highly intuitive SEM interface with multi-touch
technology The user can expand application windows and orchestrate aJl functions
just by touching the screen
40 nm (20 kV) 50 nm (20 kV)
05 1020 kV x810 300000
JCM-6000 NeoScopen~ let you observe a specimen at much higher magnification
than a light microscope with the same simple operation of a light microscope The
observation image appears automatically when a specimen is inserted and you can
go up to the maximum magnification of x60OOO quickly with the automated
operations
JCM-6000 NeoScopem is equipped with a TMP for quick start
The installation is easy The wall outlet (100V AC) is the only utility needed Cooling
water is not necessary
FX X10 10 60000
SI - Max 70mm dia
Ion Beam Application Equipment
pIB-09010 Cross Section Polisher (CP)
The IB-090 10CP Cross Section Polisher
makes a cross sect ion by irradiating a
spec imen with argon ion beam along an
edge of a shield plate placed on a
specimen This is an innovative specimen
preparation device for specimens studied in
SEM and EPMA
IIB-09020C Cross Section Polisher (C PIT)
The IB-09020CP Cross Section Polisher
(CPIT) creates a cross section in a manner
similar to the IB-09010CP Its built-in CCO
camera al lows real-time monitoring of a
cross-section during polishing
08 I Product Guide
I J18-4601 MuIti Beam System
I J -4501 MultiBeam System
EM-091001S Ion Slicer
The JIB-4501 MultiBeam System achieves
surfaceinternal 3D imaging and analysis
with simple operation This system also
has optimum geometry for all functions
from FIB SEM observation to EDSEBSD
analyses
R~ Iul N 5 nm (FIB) 25 nm (SEM) A I tlrx] I J 03 kV to 30 kV
(5 kV steps) Magl1lhcnli X30 10 300000
(observation milling)
The Ion Slicer can easily prepare thin-film
specimens for TEM without special skill Prior
treatment required for the Ion Slicer is only to
mechanically polish a specimen to 01 mm
thick The optimally set Ar ion beam provides
high-quality thin films In addition this
innovative tool suppresses specimen damage
and contamination such as lattice distortion
induced by mechanical polishing and
oxidation on specimen suriaces by chemical
treatment The Ion Slicer is an echo-friendly
efficient specimen-preparation tool
The JIB-4601 F MultiBeam System unites the unique imaging and analytical capabilities
of the High Power Optics employed in the TFE SEM and a high-performance FIB
column in a highly efficient and powerful system The JIB-4601 F offers an easy-to-use
tool for highly automated sample preparation combined with high-resolution imaging
and sub-micron analysis of the specimen cross-section
5 nm (FIB) 12 nm (SEM) 02 kV to 30 kV (5 kV sleps)
x30 to 1000000 (observation milling)
I J18-4000 Focused Ion Beam System
Top of the line high-throughput
processing
Compact size for flexible layout shy
Installation space reduced by 20
(compared to JEOL conventional
models)
Superb performance at low accelerating
voltage
Stage Navigation System for fast
determination of observation position
R-_ lit I f1 5 nm ICIIH~ltn lJIO ltJi 1 to 30 kV
M~Q I I x60 (for searching field) X200 to 300000
IIB09060CIS Cryo Ion Slicer
The IB-09060CIS Cryo Ion Slicer
incorporates a specimen cooling
mechanism in the EM-091001S Ion Slicer
for easy preparation of thin filmscross bull I J sections even for specimens susceptible
to thermal damage
J
~
Producl Guide I 09
- ---- shy
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- - -~
[Peripheral Equipment ]
IJIC 410 HDT400 JEE-420 series Ion Cleaner Hydrophilic Treatment Device Vacuum Evaporators
The JIC-41 0 Ion Cleaner removes hydrocarbon
contamination on TEM specimens by exposing
specimens in glow discharge
The treated specimens do not build up contamination
during observation in a TEM
JEC560 Auto Carbon Coater
The HDT-400 applies hydrophilic treatment on TEM
grids and SEM specimen mounting blocks The entire
operation is automated
IJFC-1600 Auto Fine Coater
O ~ - --=shy
The JEE-420 vacuum evaporator applies coating on
SEM or TEM specimens with a variety of materials
including gold platinum carbon chromium The JEEshy
420 applies shadowing on TEM specimens
- - C- Ooshy o --nu _ __ a 0 0 0 0
The JEC-560 rapidly applies carbon coating on non-conductive specimens for The JFC series sputter coater applies metal coating on SEM specimens quickly Gold
element analysis with a scanning electron microscope or an electron probe micro gold-palladium and platinum can be applied
analyzers
JED23002300F Energy Dispersive X-ray Spectrometers
Dry SO Detector
The JED-23002300F is installed on a SEM or an EPMA and performs elemental This unique box type Dry SD detector is designed for JSM-651 0 and JSM-601 0 series
analysis on micro areas The Dry SD detector an SDD type detector is cooled SEM The detector is positioned at the optimum position
electrically It does not need liquid nitrogen cooling so that maintenance is not
required Analysis Station the unique EDS analysis software is versatile with simple
operation
All y A~Ilrn System that links observed images with analysis data
inlIytl(oIIUI1Chi1$ Qualitativequantitative analysis linearea analysis
10 I Producl Guide
------
f
Instruments for Microarea and Surface Analysis
IjXA-8530F Field Emission Electron Probe Microanalyzer
The JXA-8530F features an improved hardware that is used in the JXA-8500F (the first
FE-EPMA in the world) as well as newly designed user-friendly PC-GUI windows for
efficient analysis and data operation The FE gun of the JXA-8530F provides not only a
spatial (analysis) resolution of the order of 01 IJm but also high-sensitivity X-ray
detection at low accelerating voltages and large probe currents
IjPS-9200 Photoelectron Spectrometer (XPS)
The JPS-9200 is an XPS that provides microarea analysis A newly developed microshy
tens enables high-sensitivity analysis from macro to microareas Its stage accepts both
standard-size samples (10X 10X2 mm) and large samples (up to gO mm in diameter)
The stage-scan mapping method allows the acquisition of photoelectron images
ranging from low magnification (50 x 18 mm) to high magnification (spatial resolution
30lJm)
I jAMP-9500F Field Emission Auger Microprobe
fl
X 8230 Electron Probe Microanalyzer
D
~) ~ j ) ~ =~=
The JXA-8230 is a newly developed EPMA which succeeds a proven JEOL EPMA
hardware and features newly designed user-friendly PC-GUI windows for efficient
analysis and data operation Sophisticated analysis menus are designed so that the
user can easily access target material analyses offering stress-free operations
I jPS-901 0 series Photoelectron Spectrometers (XPS)
XPS with high-sensitivity and high-resolution is compactly designed on the basis of
JEOLs many years of basic and application technologies on electrostatic lenses
analyzers etc The low-acceleration and large-current ion guns dedicated to permit
XPS analysis of thin films with different thicknesses from surface atomic layers to
micron order thick specimen layers The specimen chamber and etching chamber are
separated from each other in terms of vacuum thus completely preventing the
contamination due to sputtering and facilitating the maintenance of ultrahigh vacuum
A field-emission Auger Microprobe featuring the worlds highest spatial resolution with
the minimum probe diameter of 3 nm (for secondary-electron image) and 8 nm (for
Auger analysis) The new hemispherical electrostatic energy analyzer (HSA) with a
multi-channel detector optimized for Auger analysis is suitable for chemical-state
analysis The neutralizing ion gun allows Auger analysis of insulating materials Its
specimen stage accommodates a large sample of up to 95 mm in diameter Also it is
expandabfe for an UHV-SEM
ProduCI Guide I 11
X-ray Fluorescence Spectrometers
I ISX 400Rll Element Analyzer
An energy-dispersive X-ray fluorescence spectrometer for environmental analysis
which helps you comply with environmental regulations for hazardous substances
such as the RoHS and ELV directives in the EU and soil pollution in Japan You can
easily analyze minute traces of Cd Pb Hg Cr etc This analyzer is also suitable for
general analySiS including element analysis and thickness measurement using the FP
(fundamental parameter) method
I JSX-31 OORll Element Analyzer
An energy-dispersive X-ray fiuorescence spectrometer for environlnlntal analysis which helps you
comply with environmental regulations for hazardous substances such as the RoHS and ELV
directives in the EU and soil pollution in Japan This analyzer inoorporates a JEOL-made electrically
cooled Si(u] detector making liquid nrtrogen unnecessary as well as providing high sensitivity for
heavy-element analysis such as Cd Pb and Hg This analyzer is also surtable for general analysis
including eement analysis and thickness measurement using the FP (fundamental parameter)
method
12 I Product Guide
Semiconductor Eq Ipm nt
2 Electron Beam Lithography System
-5
Electron Beam Lithography System
r
Electron Beam Lithography System
-~=-~--I--~ I
~ ~ ~-
Th e JBX-3200MV is an e lec lro n bea m lithography system developed for the production of next generation ultrahigh-precision masks and reticles This system employs a variableshyshaped electron beam o f 50kV and a step amp repeat specimen stage
High thro ug hp ut enabled by a new PEG (Proximity Effect Correction) system High-speed da la- transfer sys tem for a large quanti ty data High-precision design for masklrelicle production
Th e JBX-9 500FS is a spot beam
lithography system developed to meet a
wi de range of applications with high
throughput and high precision periormance
This sys tem covers fields from the nanoshy
technology research to the production of
leading edge devices
f 100kV _ ZrONV Schotlky emitter
maximum 300 mm wafer
Th e JBX-6300 FS is a s p o t b ea m
lithography system developed to meet a
w ide range o f applica tions with high
resolution and high precision periormance
This system covers fields from the nanoshy
technology research to the development of
next generation devices
25 kVl50 kVl1 00 kV ZrONV Schottky emittelt
maximum 200 mm wafelt
Prod ucl Gu ide I 13
-
---------
-_ -~
- --= - - - =-shy -
NMR Spectrometers
I JNM-ECAECX series FT NMR System
920 MHz magnet Photo courtesy Nationallnstrtute of Natural Sciences Institute for
Molecular Science
The JNM-ECA920 FT NMR System is a 920 MHz high-resolution NMR
spectrometer developed by JEOL This spectrometer uses the superconducting
magnet co-developed by National Institute for Materials Science and Kobe Steel
Ltd which generates the high magnetic field Created by combining Japans stateshy
of-the-art technologies this FT NMR System marks an important milestone in next
generation biology and nanotechnology which call for high-magnetic-field highshy
resclution NMR analysis
JEOL RESONANCE Inc
~ ~ ~
~t~-
~ 100
HNCACB spectrum of 13C(15N labeled Solid 23Na-MQMAS spectrum of ubiqurtin N3)P207
The JNM-ECNECX series are versatile high-performance FT NMR spectrometer
system that utilize the latest digital and high-frequency technology The ECA
spectrometer is applicable up to 1GHz and can be used for a wide range of
applications including liquidsolid NMR protein analysis and diffusion coefficient
measurement
INM-EC cd
JOO ~QO 0(1 ~uo 1)0
Spectrometer I Oscillator receiver power amplifier
Magnet IISCM Field strength 705T I 939T 11 74T 1401T 1643T
Bore diameter (mm) 54 I 54 54 54 54
Probe 5 mm Ttl tunable
11110
188T
54
JEOL RESONANCE Inc
INMmiddot fO rie ---shy
)Ol~ ~1111 011 Oll
Spectrometer Oscillator receiver power amplifier
Magnet I ISCM Field strength 705T 939T I 1174T 1401T
Bore diameter (mm) I 54 54 54 54
Probe I 5 mm TH tunable
JEOL RESONANCE Inc
14 I Produc t Guide
bull bull bull
IJNM-ECS 00 FT NMR System
bull I ASC Series
Auto Sample Changer
ASC8 (8 samples) ASC24 (24 samples)
middotmiddot iT ~ --shy
~ I -~Au
ASC16 (16 samples) ASC64 (64 samples)
bullIJNM-ECAECX series Solid NMR
=- ~
I
l l
bull
0 5ilJl
0
MAS conlroller Solid NMR sampling kit
NMR Systems For Modern NMR Spectroscopy The JNM-ECS400 i s a compact two-channel
spectrometer that retains the advanced capabilities of the
JNM-ECAlECX series (required installation space is oneshy
half compared to conventional NMRs) Programmable
timing sequencers built into each RF and PFG channel
can independently control either synchronous or
asynchronous operations of each channel Its standard
tunable broadband gradient probe which integrates all
JEOLs newest technologies is the high sesitivity roomshy
tempperature probe
Ccmpact spectrometer chassis Innovaten in JEOL NMR digrtal architecture High-stability and high-accuracy digital spectrometer High-sensrtivity new tunable probe Full automalk NMR with advanced software
JEOL RESONANCE Inc
An automatic sample changer makes it
possible to measure many samples
sequentially by exchanging multiple samples
automatically one by one Five changer
models are available for 8 samples 16
samples 24 samples 64 samples and 100
samples
JEOL RESONANCE Inc
ASC100 (100 samples)
1 --0 1(10 C ppm I
Sdid 13C-CPMAS spectrum of cholk acid
Solid-NMR is a technique that measures solid samples (powder or film-like samples) This technique is also effective for measurement of samples not soluble in solvents (inorganic
samples etc) and of crystalline polymorph that is meaningful to measure at the solid state
JEOL RESONANCE Inc
Produci Guide I 15
Mass Spectrometers
I JMS-800D UltraFOCUS I JMS-700 (2) MStation Mass Spectrometer Dedicated to Dioxin Anal ys is High resolution M ass Spectrometer
JMS-800D UltraFOCUS is the optimal cho ice for ultra lowlevel race detection
applications suc h as moni torin g for dioxins and related co mpoun ds eg
Polychlorinated Biphenyls (PCBs) Polybrominated Diphenyl Ethers (PBDEs) or drugs
of abuse by high resolution-selected ion monitoring (HRSIM) gas chromatographyl
mass spectrometry(GCMS)
R-- gtn 80000 (10 valley) Sent Ily 2 3 7 8-TCDD 100fg SNgt2oo
(6 channels 100 msecch Resolution 10000)
N_ Jut J _lllgEI up to 10 kV
JMS-S3000 Matri x Assisted Laser DesorptionIonization TOFMS
The JMS-S3000 is a MALOI-TOFMS incorporating an innovative SpirarrOF ion optical
system With superior capabilities than conventional MALDI-TOFMS the JMS-S3000
provides sate-of-the-art anaiylical solutions for a wide range of research areas such as
functional synthetic polymers materials science and biomolecules
Malrix Assisled Laser Desorpllonlonization Timemiddotof-Flighl Mass Spectrometer
I JMS-T1 OOLP+DART TLC-TOFMS
Pet c 60000 (10 valley) err 02 ng of methyl stearate
SIN 400
(CVEI combination ion source) I~ ~ aJe up to 10kV
I JMS-T1 OOLP LC-TOFMS
I JMS-Tl OOGCV GC-TOFMS
middotl shyThe JMS-T100LP+DART achieves simple and fast TLCMS analysis Accurate mass The JMS-Tl00GCV is a fully automatic Gas Chromatograph - Time-ot-Flight Mass
measurement capabilit y of TOFMS also enables you to determine element Spectrometer (GC-TOFMS) This versatile MS system covers wide range of
compositions of the analytes applications in GC-MS analysis
16 I Pr oduc i Gu ide
- -
---
1----- 1- - - I - =---shy= bull --tJ~ 1- _ ~ __ ~-=--_~
I JMS-Ql 050GC UltraQuad GClMS
cJEOL
-
S-trapHS Headspace Autosampler
ESR Spectrometers
I JES-X3 series ESR Spectrometers
Recently it has been widely
accepted that even retatively few
unpaired electrons in a sample can
affect the function of the material so
lower detection limits (high er
sens itivity) is required of ESR
measurements JES-X3 Series has
achieved higher sensiti v i ty by
developing a lOIN-noise Gunn
oscillator for its new spectrometer
JES-X320 JEOL RESONANCE Inc
i III III )
Maximum Magnetic Field I a6ST 13T 14T
SweepW idth I --00-- 250mT plusmn001 - 500m__T_ __--l
Pole Gap _ _ 6cmm__ ___-= ___~ ____cmm__ _ I 0 = 60mcm 75 _l
Frequency Range(GHz) 8750 - 9650 _ _ _ ___-1
Field Resolution (mT) _L_ 235 Correction by Marker _1_--- Standard
I Operating System Windows 7
The JMS-01050GC is an innovative quadrupole mass spectrometer (OMS) that
achieves the highest-level sensitivity in OMS It has a high ability of evacuation due
to the use of a split flow turbo-molecular pump system (400 Lis) th at
simultaneously evacuates the ion source and the detector The use of a highshy
accuracy hyperbolic quadrupole mass analyzer provides high resolution
The S-trap is a next-generation headspace autosampler providing ultra-low
concentration measurement which was not achieved with a heads pace (HS) method
using conventional sample loop In addition the HS-GCMS system combined lith a
JMS-01050GC Mkll quaorupole MS guarantees detection of mold odor in water
down to 1 ppt
I ES-CT470 Liquid Helium Variable Temperature Controller
The ES-CT470 varies the sample temperature in the temperature range between 25 K
and 470 K Temperature setting is performed by d igital display and the set
temperature is kept constant by automatic control circui ts Combined use with a UV Irradiation device is possible A GaAs etement is used as a temperature sensor
enabling high-accuracy temperature setling
- 25 K to 470 K
plusmn001 K for 25 K to 42 K
plusmn1 orO5 K for 42 K to 470 K
_ 20 min 10 25 min (rom room temperature 08 to 2 Uh
50Hz60Hz 5mm JEOL RESONANCE Inc
Produ c t Guide I 17
Industrial Equipm nt for thin-filnl formation and nlatel ial processing
I bull
Electron Beam Source High-power Electron Beam Source
BS-60060EBS EBG-102UB6S
Electron beam sources for vacuum evaporation of metal and metal-oxide thin-films
We offer a wide variety of electron beam sources and crucibles They have features of
excellent beam spot and energy density and high-speed sweeping
1 PGBS 80020CPPS Plasma Source
BS-80011 BPG (6kW) BS-8002OCPPS (3kW)
Plasma Sources are installed in a vacuum chamber and generate high-density plasma
Used as Ion Plating (Plasma Assisted Deposition) and it is possible to improve film
properties for optilcal thin films protective films and function films Because highshy
density plasma can be generated in a mass space high-rate deposition to a large area
is possible
I RF Induction Plasma System
JEBG-3000UB(300kW) JEBG-1 OOOUB(1 OOkW)
High-power electron beam sources for vacuum evaporation of metal and metal-oxide
for wide plastic films or large glass plates that are continuously fed And they can also
be used for vacuum melting of high-melting point metals
raes
RF Generator
t shy - - - --- - - --- -
0-~ 0 bull bullbull - -
RF-12030 (3kW) RF-56000 (Controller)
13 56MHz radio-frequency power supplies for plasma generation and used for
sputtering CVD etching and ion-plating We offer 750W to 6kW generators and
matching networks
DR Powder Feeder
Thermal plasma around 10000degC (15000deg F) by RF inductive coupling This thermal Fine powder feeder that can feed 01 to 100 11m size fine powder continuously with
plasma is used for nano powder synthesis fine powder spheroidization thick film carrier gas We offer optional feeding rate controller and large capacity hopper
deposition multi composite membrane synthesis CVD and harmful gas
decomposition
18 I Produci Guide
---
Biochemical Analyzers
I JCA-BM series Clinical Chemistry Analyzer BioMajesty Series
JEOLs micro volume technology and unique sample pre-dilution mechanism realizes
high throughput chemistry analysis with reduced sample and reagent volume
More than 4000 systems have been placed in clinical laboratories allover the world
JCA-BM6050
I JCA-BMBOOO series Ultra High Throughput Clinical Chemistry Analyzer
4 4
JCA-BMB060 egt
JCA-BMSOOO series offer ultra high throughput chemistry analysis up to 9000 testsl
hour
The pre-dilution unit one of the BioMajesty family features also continues the strong
tradition in these series with interconnected multiple analysis modules the key factors
that accomplish brilliant high throughput as well as downtime reduction with back-up
capability
I JCA-BM6070 High Throughput High Performance Clinical Chemistry An alyzer
I I I
A Clinical chemistry analyzer with incomparable speed and accuracy which achieves
high throughput of 2400 testslhour (includ ing ISE) The incorporated compact
workstation and user-friendly Interface with excellent operability leads the new trend of
the laboratory testing
BioMajesty Series lCA-BM 6010 lCA-BM 6050
lCA-8M 6070 leA-BM 91 30
lCA-BM 8000 Series
bull This product is distributed outside Japan by Siemens Heatthcare Diagnostics under the ADVtAreg brand name
I JCA-BM601 OC Compact amp High Performance Clinical Chemistry Analyzer
-~-I -
1lIIIIIIilllllllllJllnlIlII Ii I JCA-BM6010C is a compact but efficient automatic analyzer that maintains the basic
concept of BioMajesty series while achieving the excellent capability of microanalysis
with sample volume as small as 1 J1L
BM6010C also offers fully automated HbA1 c analysis with on-board hemolysis
(optional) Simultaneous measurement of Glucose and HbA1c improves laboratory
workflow
Product Guid e I 19
S~~MCEAII Certain products in this brochure are controlled under the Foreign 0J 0014007 -v- ~ Exchange and Foreign Trade Law of Japan in compliance with $ ~~~ international security export control JEOL Ltd must provide the~2 m) IIlt Japanese Government with End-users Statement of Assurancel A MGMT SYS
AvA ~ m and End-use Certificate in order to obtain the export license - tiJ needed for export from Japan If the product to be exported is in this category the end user will be asked to fill in these certificate formsdEOLIS09001 amp150 14001CenrfiCltlled
httpwwwjeolcomdEOL JEOL Ltd 1-2 Musashino 3-chome Akishima Tokyo 196-8558 Japan Sales Division Telephone+81-42-528-3381 Facsimile+81-42-528-3386
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Room A2117 Zhongshang Plaza Office Bldg NO7 Zhongnan Road Wuhan Hubei 430071 PRChina Telephone 86-27-8713-2567 Facsimile 86-27-8713-2567
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EGYPT JEOL SERIVCE BUREAU
3rd Fl Nile Center Bldg Nawal Slree Dokkl (Cairo) Egypt Telephone 20-2-3335-7220 Facsimile 20-2-3338-4186
FRANCE JEOL (EUROPE) SAS Espace Claude Monet 1 Allee de Giverny 78290 Crolssy-sur-Seine France Telephone 33-13015-3737 Facsimile 33-13015-3747
GERMANY JEOL (GERMANY) GmbH Oskar-Von-Miller-Strasse 1 a 85386 Eching Gennany Telephone 49-8165-77346 Facsimile 49-8165-77512
GREAT BRITAIN amp IRELAND JEOL (UK) LTD JEOL House Silver Court Watchmeaci Welwyn Garden City Herts AL71LT UK Telephone 44-1707 -377117 FaCSimile 44-1707-373254
GREECE N ASTERIADIS SA
56-58S Trikoupl Str PO Box 26140 GR-10022 Athens Greece Telephone 30-1-823-5383 Facsimile 30-1-823-9567
HONG KONG FARMING LTD
Unit No1 009 1 OF Prosperity Milennia Plaza 663 Kings Road North Point Hong Kong Telephone 852-2815-7299 Facsimile 852-2581-4635
INDIA JEQL INDIA Pvt Ltd
Elegance Tower Level 2 2128 Old Mathura Road Jasola Business District Centre Near Apollo Hospital Jasola New Delhi 110025 India Telephone 91-11-6472-2578 Facsimile 91-11-4060-1235
BLUE STAR LTD (HQ Mumbaij
Analyticallnstrments Department Sahas 41412 Veer Savarkar Marg Prabhadery Mumbai 400 025 India Telephone 91-22-6666-4000 Facsimile 91-22-6666-4001
BLUE STAR LTD (DelhQ Analytical Instruments Department E-4412 Okhla Industrial Area Phase-II New Delhi 110 020 India Telephone 91-11-4149-4000 Facsimile 91-11-4149-4005
BLUE STAR LTD (Calcutta)
Analylicallnstruments Department 7 Hare Street Calcutta 700 001 India Telephone 91-33-2213-4133 Facsimile 91 -33-2213-4102
BLUE STAR LTD (ChennaO Analytical Instruments Department No 46 Garuda Building Cathedral Road Chennai 600 086 India Telephone 91-44-4244-4000 Facsimile 91-44-4244-4190
INDONESIA PT TEKNOLABindo Penta Perkasa Komplek Gading Bukillndah Blok lIll JI Bukfl Gading Raya Kelapa Gading Pennai Jakarta 14240 Indonesia Telephone 62-21-458470575859 Facsimile 62-21-45842729
ITALY JEOL 0TALIA) SpA Centro Direzionale Green Office Via dei Tulipani 1 20090 Pieve Emanuele (MI) Italy Telephone 39-02-9041431 Facsimila 39-02-90414343
KOREA JEOL KOREA LTD
Dongwoo Bldg 7F 1443 Yangjae Daero Gangdong-Gu Seoul 134-010 Korea Telephone 82-2-511-5501 Facsimile 82-2-511-2635
KUWAIT Ashraf amp CO Ltd WLL PO Box 3555 Safat 13036 Kuwait Telephone 965-1805151 Facsimile 965-24335373
MALAYSIA JEOL(MALAYSIA) SDNBHD(3S9011-M)
205 Block A Mezzanine Floor Kelana Business Center 97 Jalan SS 72 Kelana Jaya 47301 Petaling Jaya Selangor Malaysia Telephone 60-3-7492-7722 Facsimile 60-3-7492-7723
MEXICO JEOL DE MEXICO SA DE CV
Arkansas 11 Piso 2 Colonia Napoles Delegacion Benito Juarez CP 03810 Mexico DF Mexico Telephone 52-5-55-211-4511 Facsimile 52-5-55-211-0720
PAKISTAN (KarachI) ANALYTICAL MEASURING SYSTEM (pvn LTD(AMS LTD)
14-C Main Sehar Commercia) Avenue Lane 4 Khayaban-e-Sehar DHA-VII Karachimiddot75500 Pakinstan Telephone 92-21-353455813534074735346057-8 Facsimile 92-21-35345582
PANAMA PROMED SA Parque Industrial Costa del Este Urbanizacion Costa del Este Apartado 0816-01755 Panama Panama Telephone 507-303-3100 FaCSimile 507-303-3115
PHILIPPINES PHILAB INDUSTRIES INC
7487 Bagtikan Street SAY Makati 1203 Metro Manila Phillip pines Telephone 63-2-896-7218 Facsimile 63-2-897-7732
PORTUGAL Izasa Portugal Lda A do Proletariado 1 2790-138 CARNAXIDE Portugal Telephone 351-21-424-73-00 Facsimile 351-21-418-60-20
RUSSIA JEOL (RUS) LLC Krasnoproletarskaya Street 16 Bid 2 127473 Moscow Russian Federation Telephone 7-495-748-7791rr792 Facsimile 7-495-748-7793
SAUDI ARABIA ABDULREHMAN ALGOSAIBI GTC (Riyadh)
King Abdulaziz Avenue PO Box 215 Riyadh 11411 Saudi Arabia Telephone 966-1-479-3000 Facsimile 966-1-477-1374
SCANDINAVIA SWEDEN JEOL (Skandinaviska)AB
Hammarbacken 6A Box 716191 27 Sollentuna Sweden Telephone 46-8-28-2800 Facsimile 46-8-29-1647
SERVICE amp INFORMATION OFFICE NORWAY JEQL (Skandinaviska)AB
Lorenvangen 23 0580 Oslo NORWAY Telephone 47-2-2-64-7930 Facsimile 47-2-2-65-0619
FINLAND JEOL (Skandlnaviska)AB
Ylakaupinkuja 2 FIN-02360 Espoo Finland Telephone 358-9-8129-0350 Facsimile 358-9-8129-0351
SINGAPORE JEOLASIA PTE LTD
2 Corporation Road 1t01-12 Corporation Place Singapore 618494 Telephone 65-6565-9989 Facsimile 65-6565-7552
SOUTH AFRICA ADI Scientific (Pty) Ltd
370 Angus Crescent Northlands Business Park 29 Newmarket Road
~~=~g~~~2~~1nt~~2_~~~bIlC of South Africa
Facsimile 27-11 -462-1466
SPAIN IZASA SA
Argoneses 13 28100 Alcobendas (poligono IndustriaQ Madrid Spain Te~phone 34-91-663-0500 Facsimile 34-91-663-0545
SWITZERLAND JEOL (GERMANY) GmbH Oskar-Von-Miller Strasse 1 85386 Eching Germany Telephone 49-8165-77346 Facsimile 49-8165-77512
TAIWAN For EO ProQucts JIE DONG CO LTD 7F 112 Chung Hsiao East Road Section 1 Taipei Taiwan 10023 Republic of China Telephone 886-2-2395-2978 Facsimile 886-2~2322-4655
For Mass Spectrometer Products Mass Solutions Technology Co Ltd
5F No79 Sec 1 Xintai 5th Rd Xlzhi Dis New Taipei City 221 Taiwan Republic of China Telephone 886-2-2698-9511 Facsimile 886-2-2698-9512
For Semiconductor Products JEOL TAIWAN SEMICONDUCTORS LTD
11 F-l No 346 Pei-Da Road Hsin-Chu City 300 Taiwan Republic of China Telephone 886-3-523-8490 Facsimile 886-3-523-8503
THAILAND BECTHAI BANGKOK EQUIPMENT amp CHEMICAL CO Ltd
300 Phaholyothin Rd Phayathai Bangkok 10400 Thailand Telephone 66-2-615-2929 Facsimile 66-2-615-23502351
THE NETHERLANDS JEOL (EUROPE) Bv Ureweg 4 NL-2153 PH Nieuw-Vennep The Nelherlands Telephone 31-252-623500 Facsimile 31-252-623501
TURKEY TEKSERAS Kayisdagi )nonu MahKartal Cad No553 34755 Atasehir Istanbul Turkey Telephone 90-216-5736470 Facsimile 90-216-5736475
UAE MRS Group Dubai POBox 171612 Rashid Abdulla AI Noami Building Suite No 306 Damascus Street AI Qusais-3 Dubai UAE Telephone 971-4-2581141 Facsimile 971-4-2581151
JEOLGulf
POBox 171612 bull Rashid Abdulla AI Noami Building Suite No 306 Damascus Street AI Qusais-3 Dubai UAE Telephone 971-553964219(mobile)
USA JEOL USA INC 11 Dearborn Road Peabody MA 01960 USA Telephone 1-978-535-5900 Facsimile 1-978-536-22052206
JEOL USA INC WEST OFFICE
~~s~~~~~rigAe9~5t~~1 1 0 Telephone 1-925-737-1740 Facsimile 1-925-737-1749
VENEZUELA GOMSA Service and Supply CA
Urbanizacion Montalban JlI - Resldenclas Don Andres - Piso 7 - Apartomento 74 Avenida 3 entre calles 7 y 6 Montalban Caracas Venezuela Telephone 58-212-443-4342 Facsimile 58-212-443-4342
VTETNAM TECHNICAL MATERIALS AND RESOURCES IMPORT-EXPORT JOINT STOCK COMPANY(REXCO) Hanoi Branch
No 13-Lot 12 Trung Yen Trung Hoa Street Cau Giay Dist HanOi Vietnam Telephone 84-4-562-051617562-0535 Facsimile 84-4-853-2511
No 0205B389C Printed in Japan Kp
Electron Microscopes
IJEM- RM1300 Ultra High Voltage Electron Microscope
Using a high voltage electron beam giving
high transmission this microscope permits
the direct observation of the 3-D structure
of thick specimens Ihe direct observation
of beam damage and the observation of
sensitive biological specimens with little
damage It features great operational ease
and st ab il it y The JEM-ARM 1300 is
essential for atomic level structural imaging
and 3-D observations
p 010 nm (with top entry slage)
012 nm (with side entry stage)
400 to 1300 kV
x200 to 1500000
I JEM-3200FS Fi eld Emission Electron Microscope (Equipped with In -Column En ergy Filter)
A field emission electron microscope that
gives full play to not only high-resolution
imag ing but also nanoarea analys is
Equi pp ed with a 300 kV FEG and an
in-column energy filter Incorporation of a
new rotation-free image-forming optical
system facilitates acquisition of TEM images
and diffraction patterns as well as provides
stable spectra The combination of the 300
kV FEG and the energy filter oHers new
many solutions for a wide range of research
fields
~ _ n Q17nm
Ai - ~III J VCl Max 300 kV gtL(Jrll lallic I X 100 to 1500000
I JEM-2200FS Field Emission El ectron Microscope (Equ ipped with In -Column Energy Filter)
A field emission electron microscope
equipped with a 200 kV field emission gun
and a new in-column energy filter which is
optimally configured for analytical functions
such as element analysis analysis and stage
analysis The use of a new rotation-free
image-forming optical system makes it easy
to compare TEM images and diffract ion
patterns Since the microscope allows
observation of wide- field energy- filtered
images combination with the op tional
tomography function enables acquisi tion of
three-dimensional information with a wide
field and a high contrast
-3 OOF Fi eld Emission Electron Microscope
Modern electron microscopes can integrate
various imaging devices and analyzers for
nano-area analysis of morphology structures
and chem ical states This advantage is
drawi ng increasing expectation s from
researchers The JEM-31 OOF achieves highshy
reso lution im ag ing and nano-probe
formation Also the JEM-3100F has usershy
hiendly operation tools for smooth operation
of the TEM with various devices and a new
control system for system expandability This
advanced analytical TEM allows highshy
accuracy eHicient acquisition of valuable
infonmation from nano-materials
017 nm
R 100200300 kV
X60 to 1500000
I JEM-ARM200F Atomic Reso lution Analytical Electron Microscope
The JEM-ARM200F incorporating a STEM
Cs COrTector and a microscope column with
dramatically improved mechanical and
electrical stability achieves the worlds
highest STEM (HAADF) reso lution of 008
nm as a commerci a l TEM Th e
Cs-co rrected extremely small elec tron
probe achieves a remarkably increased
current density one order magnitude larger
than conventional TEMs Thus the JEMshy
ARM200F provides ultimate atomic -level
analysis and also higher throughput with
dramatically shortened measurement time
Pc t I 008 nm (STEM)
0 19 nm (rEM)
011 nm (With TEM Cs corrector)
I VCi JG 80 kV 200 kV
x50 to 2 000000
JE -2100F Fie ld Emission Electron Microscope
The field emission electron gun (FEG) which
provides an elec tron beam w ith high
brightness and high coherence is essential
for high-resolution observation and nano
area analysis The JEM-2100F featuring
advanced digital operation is an integrated
TEM th at g ives full play to its various
functions
P lr 11 1 O 19nm ~cC68Tltllfn m tage 160 kV 200 kV
v1a tCBt I x50 to 1500000
04 I Produ CI Guide
I
11 L bull bull 1 ~
EM-~800 Multi-Purpose Analytical Electron Microscope
The JEM-2800 is a new TEM that achieves
nano-area analysis through Automation and
Convenience while being Easy- to-use so
that expert results can be achieved by
operators of any skill level Its advanced
electron optical system makes IT possible to
periorm high-resolution TEM and STEM
imaging EDS EELS tomography and
in-situ observation on the same sample
wilhout sacrificing any of Ihese capabil ities
02 nm (STEM) 01 nm (rEM)
1 100 kV 200 kV x 100 to 200000000
EM 2100 Electron Microscope
-r__bull
I JED-2300T
The JEM-2100 is a new-generation 200 kV
analytical electron microscope The JEMshy
2100 which incorporates an integrated PC
system for various functions WITh excellenl
cost performance supports research and
development in wide scienlific fields ranging
from biotechnology to materials science
Pont liJtI 019 nm ~=I nlng vrl qe 80 10 200 kV
Ilagnl 11 X50 to 1500000
JEM-1400Plus Electron Microscope
The JEM-1400Plus is a versatile
transmission electron microscope (rEM) for
a wide range of applications including
biology polymers nano technology and
advanced materials
The JEM-1400Plus uses a single camera for
imaging for view area seach (x10) to data
aquisition
New operation panels with the organic EL
buttons give you simple and intut ive
operation
p~ f -11)(1 02 nm
r- u 40 10120 kV x l0tol2ooOOO
Energy Dispersive X-ray Spectrometer
The JED-2300T installed on a TEM can
easily perform qualitativequantitative
analysis and linea rea analysis of
microareas WITh high energy resolution This bull EDS employs a JEOLs unique ultra-thin
window detector with gate valve protection
mechanism making it possible to obtain
high-sensitivity analysis data particularly
from light elements
Ivl I (d _ -II(I~
QualitativequantITative analysiS linearea analysis AI Iflltgtie elements Be to U B to U or Na to U
Prod uc l G u ide I 05
- -
I I lilllll
II 1111 111111 11111111
~ - - shy
- -- ~-
- shy
Scanning Electron Microscopes
JSM 7800F Field Emission Scanning Electron Microscope
I JSM-7600F Field Emission Scanning Electron Microscope
The JSM-7600F is a state-of-the-art thermal
FE-SEM th at successfu ll y combines
ultrahigh-resolution imaging with optimized
analytical functionality such as high-speed
high-accuracy analyses
10 nm (15 kV) 15 nm (1 kV) 01 to 30 kV
x 25 to 1000000
JSM-7 OOF Field Emi ss ion Scanning Electron Microscope
l 8
I II
The JSM-7800F equipped with a newly developed super hybrid objective lens is a
cutting-edge thermal FE-SEM that successfully combines ultrahigh-resolution
imaging with fast and high-accuracy elemental analysis Magnetic specimens can
be observed and analyzed at high magnification The JSM-7800F also enables
researchers various analyses such as EDS WDS EBSD and CL
bull08 nm (15 kV) 12 nm (1 kV)
001 to 30 kV
x25 to 1000000
JSM 7500F Field Emission Scanning Electron Microscope
The JSM-7500F developed for
nanostructure characterization is equipped
with the Gentle Beam function which
enables researchers observation atI(~ x 100000 magnification even with 100 V low electron energy ~ ~tn~ ~=--
- - - 10 nm (15 kV) 14nm (1 kV)Jllshyf -diy Ollaqb 0 1 to 30 kVoG -- ~ Wll X25 to 1000000- rr
-
The JSM-7100F is a versatile high performance analytical FE SEM The electron
optics produces the maximum 200 nA probe current with the patented in-lens
thermal FEG and a small probe diameter even at large probe currents with the
patented aperture angle optimizing lens
The objective lens is the field free type This lens is suitable for high precision EBSD
analysis and characterization of a magnetic specimen
The vacuum system employing a TMP combined and a specimen exchange airlock
chamber A life of emitter is prolonged by the high quality vacuum in the gun
chamber
gt= - 12nm (30 kV) 30nm (1 kV) 02 to 30 kV
x 10 to 1000000
06 I Producl Guide
---------
I )SM-66 0 Scanning Electron Microscope
The JSM-6610 is a high-performance SEM
that is equipped with a superb electron
optical system and a general-purpose largeshy
specimen chamber to accommodate a
specimen up to 200 mm diameter The _JSM-6610 incorporates newly designed
__
_- ~I software for easier SEM operations in a
variety of applications
I J5M-ALA series Analytical Scanning Electron Microscopes
The JED-2300 EDS developed by JEOL is
embedded in the compact SEMs The
footprint is same as that of the basic SEM
The SEM and EDS are operated as one
seamless system to provide comfortable
and efficient operation A SDD type EDS
detector does not require liquid nitrogen
EDS analysis is ready whenever you need it
Resolution HV 30 nm
LV 40nm 40nm
Magnification
Accelerating voltage 05 shy 30 kV
x5 shy 300000
03 shy 30 kV
I JASM-6200 C airScor etrade Atmospheric Scanning Electron Microscope
I SM-6510 Scanning Electron Microscope
The JSM-6510 is a high-performance SEM
that is equipped with a superb electron
optical system same as the JSM-6610 and
a general-purpose specimen chamber to
accommodate a specimen up to 150 mm
diameter The JSM-651 0 incorporates
newly designed software for easier SEM
operations in a variety of applications
II 1 30 nm ltr-- rr TJ 01 qamp 05 to 30 kV M~1fIIC3IKlr x5 to 300000
J5 -LV series Low Vacuum SEMs
The low vacuum SEM consists of a
conventional high vacuum mode and a low
vacuum (LV) mode One can select the
vacuum mode with a click on the menu
The LV mode enables one to observe and
analyze non-conductive specimens The
specimen chamber is kept at low vacuum
so that highly out-gassing specimens can
be easily observed
1-lhlIt
Resolution HV 30 nm
LV 40 nm
Low vacuum range 10-270 Pa
The JASM-6200 allows high-resolution light microscopeSEM observation at
atmospheric pressure A specimen is held at normal atmospheric pressure Dynamic
observation of physical or chemical reactions can be made in liquid or gas In addition
for biological applications difficult dehydration and drying processes are not needed
dramatically reducing specimen pre-treatment time
Bnm Imiddot 102030 kV
II
Product Guide I 07
JSM-60l0 AILV InTouchScope
)shy -
JSM-6010LA
I JCM 6000 NeoScopeTM
The InTouchScope incorporates a highly intuitive SEM interface with multi-touch
technology The user can expand application windows and orchestrate aJl functions
just by touching the screen
40 nm (20 kV) 50 nm (20 kV)
05 1020 kV x810 300000
JCM-6000 NeoScopen~ let you observe a specimen at much higher magnification
than a light microscope with the same simple operation of a light microscope The
observation image appears automatically when a specimen is inserted and you can
go up to the maximum magnification of x60OOO quickly with the automated
operations
JCM-6000 NeoScopem is equipped with a TMP for quick start
The installation is easy The wall outlet (100V AC) is the only utility needed Cooling
water is not necessary
FX X10 10 60000
SI - Max 70mm dia
Ion Beam Application Equipment
pIB-09010 Cross Section Polisher (CP)
The IB-090 10CP Cross Section Polisher
makes a cross sect ion by irradiating a
spec imen with argon ion beam along an
edge of a shield plate placed on a
specimen This is an innovative specimen
preparation device for specimens studied in
SEM and EPMA
IIB-09020C Cross Section Polisher (C PIT)
The IB-09020CP Cross Section Polisher
(CPIT) creates a cross section in a manner
similar to the IB-09010CP Its built-in CCO
camera al lows real-time monitoring of a
cross-section during polishing
08 I Product Guide
I J18-4601 MuIti Beam System
I J -4501 MultiBeam System
EM-091001S Ion Slicer
The JIB-4501 MultiBeam System achieves
surfaceinternal 3D imaging and analysis
with simple operation This system also
has optimum geometry for all functions
from FIB SEM observation to EDSEBSD
analyses
R~ Iul N 5 nm (FIB) 25 nm (SEM) A I tlrx] I J 03 kV to 30 kV
(5 kV steps) Magl1lhcnli X30 10 300000
(observation milling)
The Ion Slicer can easily prepare thin-film
specimens for TEM without special skill Prior
treatment required for the Ion Slicer is only to
mechanically polish a specimen to 01 mm
thick The optimally set Ar ion beam provides
high-quality thin films In addition this
innovative tool suppresses specimen damage
and contamination such as lattice distortion
induced by mechanical polishing and
oxidation on specimen suriaces by chemical
treatment The Ion Slicer is an echo-friendly
efficient specimen-preparation tool
The JIB-4601 F MultiBeam System unites the unique imaging and analytical capabilities
of the High Power Optics employed in the TFE SEM and a high-performance FIB
column in a highly efficient and powerful system The JIB-4601 F offers an easy-to-use
tool for highly automated sample preparation combined with high-resolution imaging
and sub-micron analysis of the specimen cross-section
5 nm (FIB) 12 nm (SEM) 02 kV to 30 kV (5 kV sleps)
x30 to 1000000 (observation milling)
I J18-4000 Focused Ion Beam System
Top of the line high-throughput
processing
Compact size for flexible layout shy
Installation space reduced by 20
(compared to JEOL conventional
models)
Superb performance at low accelerating
voltage
Stage Navigation System for fast
determination of observation position
R-_ lit I f1 5 nm ICIIH~ltn lJIO ltJi 1 to 30 kV
M~Q I I x60 (for searching field) X200 to 300000
IIB09060CIS Cryo Ion Slicer
The IB-09060CIS Cryo Ion Slicer
incorporates a specimen cooling
mechanism in the EM-091001S Ion Slicer
for easy preparation of thin filmscross bull I J sections even for specimens susceptible
to thermal damage
J
~
Producl Guide I 09
- ---- shy
_bullbull- _ bullbull 1
- - -~
[Peripheral Equipment ]
IJIC 410 HDT400 JEE-420 series Ion Cleaner Hydrophilic Treatment Device Vacuum Evaporators
The JIC-41 0 Ion Cleaner removes hydrocarbon
contamination on TEM specimens by exposing
specimens in glow discharge
The treated specimens do not build up contamination
during observation in a TEM
JEC560 Auto Carbon Coater
The HDT-400 applies hydrophilic treatment on TEM
grids and SEM specimen mounting blocks The entire
operation is automated
IJFC-1600 Auto Fine Coater
O ~ - --=shy
The JEE-420 vacuum evaporator applies coating on
SEM or TEM specimens with a variety of materials
including gold platinum carbon chromium The JEEshy
420 applies shadowing on TEM specimens
- - C- Ooshy o --nu _ __ a 0 0 0 0
The JEC-560 rapidly applies carbon coating on non-conductive specimens for The JFC series sputter coater applies metal coating on SEM specimens quickly Gold
element analysis with a scanning electron microscope or an electron probe micro gold-palladium and platinum can be applied
analyzers
JED23002300F Energy Dispersive X-ray Spectrometers
Dry SO Detector
The JED-23002300F is installed on a SEM or an EPMA and performs elemental This unique box type Dry SD detector is designed for JSM-651 0 and JSM-601 0 series
analysis on micro areas The Dry SD detector an SDD type detector is cooled SEM The detector is positioned at the optimum position
electrically It does not need liquid nitrogen cooling so that maintenance is not
required Analysis Station the unique EDS analysis software is versatile with simple
operation
All y A~Ilrn System that links observed images with analysis data
inlIytl(oIIUI1Chi1$ Qualitativequantitative analysis linearea analysis
10 I Producl Guide
------
f
Instruments for Microarea and Surface Analysis
IjXA-8530F Field Emission Electron Probe Microanalyzer
The JXA-8530F features an improved hardware that is used in the JXA-8500F (the first
FE-EPMA in the world) as well as newly designed user-friendly PC-GUI windows for
efficient analysis and data operation The FE gun of the JXA-8530F provides not only a
spatial (analysis) resolution of the order of 01 IJm but also high-sensitivity X-ray
detection at low accelerating voltages and large probe currents
IjPS-9200 Photoelectron Spectrometer (XPS)
The JPS-9200 is an XPS that provides microarea analysis A newly developed microshy
tens enables high-sensitivity analysis from macro to microareas Its stage accepts both
standard-size samples (10X 10X2 mm) and large samples (up to gO mm in diameter)
The stage-scan mapping method allows the acquisition of photoelectron images
ranging from low magnification (50 x 18 mm) to high magnification (spatial resolution
30lJm)
I jAMP-9500F Field Emission Auger Microprobe
fl
X 8230 Electron Probe Microanalyzer
D
~) ~ j ) ~ =~=
The JXA-8230 is a newly developed EPMA which succeeds a proven JEOL EPMA
hardware and features newly designed user-friendly PC-GUI windows for efficient
analysis and data operation Sophisticated analysis menus are designed so that the
user can easily access target material analyses offering stress-free operations
I jPS-901 0 series Photoelectron Spectrometers (XPS)
XPS with high-sensitivity and high-resolution is compactly designed on the basis of
JEOLs many years of basic and application technologies on electrostatic lenses
analyzers etc The low-acceleration and large-current ion guns dedicated to permit
XPS analysis of thin films with different thicknesses from surface atomic layers to
micron order thick specimen layers The specimen chamber and etching chamber are
separated from each other in terms of vacuum thus completely preventing the
contamination due to sputtering and facilitating the maintenance of ultrahigh vacuum
A field-emission Auger Microprobe featuring the worlds highest spatial resolution with
the minimum probe diameter of 3 nm (for secondary-electron image) and 8 nm (for
Auger analysis) The new hemispherical electrostatic energy analyzer (HSA) with a
multi-channel detector optimized for Auger analysis is suitable for chemical-state
analysis The neutralizing ion gun allows Auger analysis of insulating materials Its
specimen stage accommodates a large sample of up to 95 mm in diameter Also it is
expandabfe for an UHV-SEM
ProduCI Guide I 11
X-ray Fluorescence Spectrometers
I ISX 400Rll Element Analyzer
An energy-dispersive X-ray fluorescence spectrometer for environmental analysis
which helps you comply with environmental regulations for hazardous substances
such as the RoHS and ELV directives in the EU and soil pollution in Japan You can
easily analyze minute traces of Cd Pb Hg Cr etc This analyzer is also suitable for
general analySiS including element analysis and thickness measurement using the FP
(fundamental parameter) method
I JSX-31 OORll Element Analyzer
An energy-dispersive X-ray fiuorescence spectrometer for environlnlntal analysis which helps you
comply with environmental regulations for hazardous substances such as the RoHS and ELV
directives in the EU and soil pollution in Japan This analyzer inoorporates a JEOL-made electrically
cooled Si(u] detector making liquid nrtrogen unnecessary as well as providing high sensitivity for
heavy-element analysis such as Cd Pb and Hg This analyzer is also surtable for general analysis
including eement analysis and thickness measurement using the FP (fundamental parameter)
method
12 I Product Guide
Semiconductor Eq Ipm nt
2 Electron Beam Lithography System
-5
Electron Beam Lithography System
r
Electron Beam Lithography System
-~=-~--I--~ I
~ ~ ~-
Th e JBX-3200MV is an e lec lro n bea m lithography system developed for the production of next generation ultrahigh-precision masks and reticles This system employs a variableshyshaped electron beam o f 50kV and a step amp repeat specimen stage
High thro ug hp ut enabled by a new PEG (Proximity Effect Correction) system High-speed da la- transfer sys tem for a large quanti ty data High-precision design for masklrelicle production
Th e JBX-9 500FS is a spot beam
lithography system developed to meet a
wi de range of applications with high
throughput and high precision periormance
This sys tem covers fields from the nanoshy
technology research to the production of
leading edge devices
f 100kV _ ZrONV Schotlky emitter
maximum 300 mm wafer
Th e JBX-6300 FS is a s p o t b ea m
lithography system developed to meet a
w ide range o f applica tions with high
resolution and high precision periormance
This system covers fields from the nanoshy
technology research to the development of
next generation devices
25 kVl50 kVl1 00 kV ZrONV Schottky emittelt
maximum 200 mm wafelt
Prod ucl Gu ide I 13
-
---------
-_ -~
- --= - - - =-shy -
NMR Spectrometers
I JNM-ECAECX series FT NMR System
920 MHz magnet Photo courtesy Nationallnstrtute of Natural Sciences Institute for
Molecular Science
The JNM-ECA920 FT NMR System is a 920 MHz high-resolution NMR
spectrometer developed by JEOL This spectrometer uses the superconducting
magnet co-developed by National Institute for Materials Science and Kobe Steel
Ltd which generates the high magnetic field Created by combining Japans stateshy
of-the-art technologies this FT NMR System marks an important milestone in next
generation biology and nanotechnology which call for high-magnetic-field highshy
resclution NMR analysis
JEOL RESONANCE Inc
~ ~ ~
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~ 100
HNCACB spectrum of 13C(15N labeled Solid 23Na-MQMAS spectrum of ubiqurtin N3)P207
The JNM-ECNECX series are versatile high-performance FT NMR spectrometer
system that utilize the latest digital and high-frequency technology The ECA
spectrometer is applicable up to 1GHz and can be used for a wide range of
applications including liquidsolid NMR protein analysis and diffusion coefficient
measurement
INM-EC cd
JOO ~QO 0(1 ~uo 1)0
Spectrometer I Oscillator receiver power amplifier
Magnet IISCM Field strength 705T I 939T 11 74T 1401T 1643T
Bore diameter (mm) 54 I 54 54 54 54
Probe 5 mm Ttl tunable
11110
188T
54
JEOL RESONANCE Inc
INMmiddot fO rie ---shy
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Spectrometer Oscillator receiver power amplifier
Magnet I ISCM Field strength 705T 939T I 1174T 1401T
Bore diameter (mm) I 54 54 54 54
Probe I 5 mm TH tunable
JEOL RESONANCE Inc
14 I Produc t Guide
bull bull bull
IJNM-ECS 00 FT NMR System
bull I ASC Series
Auto Sample Changer
ASC8 (8 samples) ASC24 (24 samples)
middotmiddot iT ~ --shy
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ASC16 (16 samples) ASC64 (64 samples)
bullIJNM-ECAECX series Solid NMR
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MAS conlroller Solid NMR sampling kit
NMR Systems For Modern NMR Spectroscopy The JNM-ECS400 i s a compact two-channel
spectrometer that retains the advanced capabilities of the
JNM-ECAlECX series (required installation space is oneshy
half compared to conventional NMRs) Programmable
timing sequencers built into each RF and PFG channel
can independently control either synchronous or
asynchronous operations of each channel Its standard
tunable broadband gradient probe which integrates all
JEOLs newest technologies is the high sesitivity roomshy
tempperature probe
Ccmpact spectrometer chassis Innovaten in JEOL NMR digrtal architecture High-stability and high-accuracy digital spectrometer High-sensrtivity new tunable probe Full automalk NMR with advanced software
JEOL RESONANCE Inc
An automatic sample changer makes it
possible to measure many samples
sequentially by exchanging multiple samples
automatically one by one Five changer
models are available for 8 samples 16
samples 24 samples 64 samples and 100
samples
JEOL RESONANCE Inc
ASC100 (100 samples)
1 --0 1(10 C ppm I
Sdid 13C-CPMAS spectrum of cholk acid
Solid-NMR is a technique that measures solid samples (powder or film-like samples) This technique is also effective for measurement of samples not soluble in solvents (inorganic
samples etc) and of crystalline polymorph that is meaningful to measure at the solid state
JEOL RESONANCE Inc
Produci Guide I 15
Mass Spectrometers
I JMS-800D UltraFOCUS I JMS-700 (2) MStation Mass Spectrometer Dedicated to Dioxin Anal ys is High resolution M ass Spectrometer
JMS-800D UltraFOCUS is the optimal cho ice for ultra lowlevel race detection
applications suc h as moni torin g for dioxins and related co mpoun ds eg
Polychlorinated Biphenyls (PCBs) Polybrominated Diphenyl Ethers (PBDEs) or drugs
of abuse by high resolution-selected ion monitoring (HRSIM) gas chromatographyl
mass spectrometry(GCMS)
R-- gtn 80000 (10 valley) Sent Ily 2 3 7 8-TCDD 100fg SNgt2oo
(6 channels 100 msecch Resolution 10000)
N_ Jut J _lllgEI up to 10 kV
JMS-S3000 Matri x Assisted Laser DesorptionIonization TOFMS
The JMS-S3000 is a MALOI-TOFMS incorporating an innovative SpirarrOF ion optical
system With superior capabilities than conventional MALDI-TOFMS the JMS-S3000
provides sate-of-the-art anaiylical solutions for a wide range of research areas such as
functional synthetic polymers materials science and biomolecules
Malrix Assisled Laser Desorpllonlonization Timemiddotof-Flighl Mass Spectrometer
I JMS-T1 OOLP+DART TLC-TOFMS
Pet c 60000 (10 valley) err 02 ng of methyl stearate
SIN 400
(CVEI combination ion source) I~ ~ aJe up to 10kV
I JMS-T1 OOLP LC-TOFMS
I JMS-Tl OOGCV GC-TOFMS
middotl shyThe JMS-T100LP+DART achieves simple and fast TLCMS analysis Accurate mass The JMS-Tl00GCV is a fully automatic Gas Chromatograph - Time-ot-Flight Mass
measurement capabilit y of TOFMS also enables you to determine element Spectrometer (GC-TOFMS) This versatile MS system covers wide range of
compositions of the analytes applications in GC-MS analysis
16 I Pr oduc i Gu ide
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I JMS-Ql 050GC UltraQuad GClMS
cJEOL
-
S-trapHS Headspace Autosampler
ESR Spectrometers
I JES-X3 series ESR Spectrometers
Recently it has been widely
accepted that even retatively few
unpaired electrons in a sample can
affect the function of the material so
lower detection limits (high er
sens itivity) is required of ESR
measurements JES-X3 Series has
achieved higher sensiti v i ty by
developing a lOIN-noise Gunn
oscillator for its new spectrometer
JES-X320 JEOL RESONANCE Inc
i III III )
Maximum Magnetic Field I a6ST 13T 14T
SweepW idth I --00-- 250mT plusmn001 - 500m__T_ __--l
Pole Gap _ _ 6cmm__ ___-= ___~ ____cmm__ _ I 0 = 60mcm 75 _l
Frequency Range(GHz) 8750 - 9650 _ _ _ ___-1
Field Resolution (mT) _L_ 235 Correction by Marker _1_--- Standard
I Operating System Windows 7
The JMS-01050GC is an innovative quadrupole mass spectrometer (OMS) that
achieves the highest-level sensitivity in OMS It has a high ability of evacuation due
to the use of a split flow turbo-molecular pump system (400 Lis) th at
simultaneously evacuates the ion source and the detector The use of a highshy
accuracy hyperbolic quadrupole mass analyzer provides high resolution
The S-trap is a next-generation headspace autosampler providing ultra-low
concentration measurement which was not achieved with a heads pace (HS) method
using conventional sample loop In addition the HS-GCMS system combined lith a
JMS-01050GC Mkll quaorupole MS guarantees detection of mold odor in water
down to 1 ppt
I ES-CT470 Liquid Helium Variable Temperature Controller
The ES-CT470 varies the sample temperature in the temperature range between 25 K
and 470 K Temperature setting is performed by d igital display and the set
temperature is kept constant by automatic control circui ts Combined use with a UV Irradiation device is possible A GaAs etement is used as a temperature sensor
enabling high-accuracy temperature setling
- 25 K to 470 K
plusmn001 K for 25 K to 42 K
plusmn1 orO5 K for 42 K to 470 K
_ 20 min 10 25 min (rom room temperature 08 to 2 Uh
50Hz60Hz 5mm JEOL RESONANCE Inc
Produ c t Guide I 17
Industrial Equipm nt for thin-filnl formation and nlatel ial processing
I bull
Electron Beam Source High-power Electron Beam Source
BS-60060EBS EBG-102UB6S
Electron beam sources for vacuum evaporation of metal and metal-oxide thin-films
We offer a wide variety of electron beam sources and crucibles They have features of
excellent beam spot and energy density and high-speed sweeping
1 PGBS 80020CPPS Plasma Source
BS-80011 BPG (6kW) BS-8002OCPPS (3kW)
Plasma Sources are installed in a vacuum chamber and generate high-density plasma
Used as Ion Plating (Plasma Assisted Deposition) and it is possible to improve film
properties for optilcal thin films protective films and function films Because highshy
density plasma can be generated in a mass space high-rate deposition to a large area
is possible
I RF Induction Plasma System
JEBG-3000UB(300kW) JEBG-1 OOOUB(1 OOkW)
High-power electron beam sources for vacuum evaporation of metal and metal-oxide
for wide plastic films or large glass plates that are continuously fed And they can also
be used for vacuum melting of high-melting point metals
raes
RF Generator
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RF-12030 (3kW) RF-56000 (Controller)
13 56MHz radio-frequency power supplies for plasma generation and used for
sputtering CVD etching and ion-plating We offer 750W to 6kW generators and
matching networks
DR Powder Feeder
Thermal plasma around 10000degC (15000deg F) by RF inductive coupling This thermal Fine powder feeder that can feed 01 to 100 11m size fine powder continuously with
plasma is used for nano powder synthesis fine powder spheroidization thick film carrier gas We offer optional feeding rate controller and large capacity hopper
deposition multi composite membrane synthesis CVD and harmful gas
decomposition
18 I Produci Guide
---
Biochemical Analyzers
I JCA-BM series Clinical Chemistry Analyzer BioMajesty Series
JEOLs micro volume technology and unique sample pre-dilution mechanism realizes
high throughput chemistry analysis with reduced sample and reagent volume
More than 4000 systems have been placed in clinical laboratories allover the world
JCA-BM6050
I JCA-BMBOOO series Ultra High Throughput Clinical Chemistry Analyzer
4 4
JCA-BMB060 egt
JCA-BMSOOO series offer ultra high throughput chemistry analysis up to 9000 testsl
hour
The pre-dilution unit one of the BioMajesty family features also continues the strong
tradition in these series with interconnected multiple analysis modules the key factors
that accomplish brilliant high throughput as well as downtime reduction with back-up
capability
I JCA-BM6070 High Throughput High Performance Clinical Chemistry An alyzer
I I I
A Clinical chemistry analyzer with incomparable speed and accuracy which achieves
high throughput of 2400 testslhour (includ ing ISE) The incorporated compact
workstation and user-friendly Interface with excellent operability leads the new trend of
the laboratory testing
BioMajesty Series lCA-BM 6010 lCA-BM 6050
lCA-8M 6070 leA-BM 91 30
lCA-BM 8000 Series
bull This product is distributed outside Japan by Siemens Heatthcare Diagnostics under the ADVtAreg brand name
I JCA-BM601 OC Compact amp High Performance Clinical Chemistry Analyzer
-~-I -
1lIIIIIIilllllllllJllnlIlII Ii I JCA-BM6010C is a compact but efficient automatic analyzer that maintains the basic
concept of BioMajesty series while achieving the excellent capability of microanalysis
with sample volume as small as 1 J1L
BM6010C also offers fully automated HbA1 c analysis with on-board hemolysis
(optional) Simultaneous measurement of Glucose and HbA1c improves laboratory
workflow
Product Guid e I 19
S~~MCEAII Certain products in this brochure are controlled under the Foreign 0J 0014007 -v- ~ Exchange and Foreign Trade Law of Japan in compliance with $ ~~~ international security export control JEOL Ltd must provide the~2 m) IIlt Japanese Government with End-users Statement of Assurancel A MGMT SYS
AvA ~ m and End-use Certificate in order to obtain the export license - tiJ needed for export from Japan If the product to be exported is in this category the end user will be asked to fill in these certificate formsdEOLIS09001 amp150 14001CenrfiCltlled
httpwwwjeolcomdEOL JEOL Ltd 1-2 Musashino 3-chome Akishima Tokyo 196-8558 Japan Sales Division Telephone+81-42-528-3381 Facsimile+81-42-528-3386
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3rd Fl Nile Center Bldg Nawal Slree Dokkl (Cairo) Egypt Telephone 20-2-3335-7220 Facsimile 20-2-3338-4186
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GERMANY JEOL (GERMANY) GmbH Oskar-Von-Miller-Strasse 1 a 85386 Eching Gennany Telephone 49-8165-77346 Facsimile 49-8165-77512
GREAT BRITAIN amp IRELAND JEOL (UK) LTD JEOL House Silver Court Watchmeaci Welwyn Garden City Herts AL71LT UK Telephone 44-1707 -377117 FaCSimile 44-1707-373254
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56-58S Trikoupl Str PO Box 26140 GR-10022 Athens Greece Telephone 30-1-823-5383 Facsimile 30-1-823-9567
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Unit No1 009 1 OF Prosperity Milennia Plaza 663 Kings Road North Point Hong Kong Telephone 852-2815-7299 Facsimile 852-2581-4635
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Elegance Tower Level 2 2128 Old Mathura Road Jasola Business District Centre Near Apollo Hospital Jasola New Delhi 110025 India Telephone 91-11-6472-2578 Facsimile 91-11-4060-1235
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Analyticallnstrments Department Sahas 41412 Veer Savarkar Marg Prabhadery Mumbai 400 025 India Telephone 91-22-6666-4000 Facsimile 91-22-6666-4001
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Analylicallnstruments Department 7 Hare Street Calcutta 700 001 India Telephone 91-33-2213-4133 Facsimile 91 -33-2213-4102
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INDONESIA PT TEKNOLABindo Penta Perkasa Komplek Gading Bukillndah Blok lIll JI Bukfl Gading Raya Kelapa Gading Pennai Jakarta 14240 Indonesia Telephone 62-21-458470575859 Facsimile 62-21-45842729
ITALY JEOL 0TALIA) SpA Centro Direzionale Green Office Via dei Tulipani 1 20090 Pieve Emanuele (MI) Italy Telephone 39-02-9041431 Facsimila 39-02-90414343
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Dongwoo Bldg 7F 1443 Yangjae Daero Gangdong-Gu Seoul 134-010 Korea Telephone 82-2-511-5501 Facsimile 82-2-511-2635
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205 Block A Mezzanine Floor Kelana Business Center 97 Jalan SS 72 Kelana Jaya 47301 Petaling Jaya Selangor Malaysia Telephone 60-3-7492-7722 Facsimile 60-3-7492-7723
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Arkansas 11 Piso 2 Colonia Napoles Delegacion Benito Juarez CP 03810 Mexico DF Mexico Telephone 52-5-55-211-4511 Facsimile 52-5-55-211-0720
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14-C Main Sehar Commercia) Avenue Lane 4 Khayaban-e-Sehar DHA-VII Karachimiddot75500 Pakinstan Telephone 92-21-353455813534074735346057-8 Facsimile 92-21-35345582
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PHILIPPINES PHILAB INDUSTRIES INC
7487 Bagtikan Street SAY Makati 1203 Metro Manila Phillip pines Telephone 63-2-896-7218 Facsimile 63-2-897-7732
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King Abdulaziz Avenue PO Box 215 Riyadh 11411 Saudi Arabia Telephone 966-1-479-3000 Facsimile 966-1-477-1374
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Hammarbacken 6A Box 716191 27 Sollentuna Sweden Telephone 46-8-28-2800 Facsimile 46-8-29-1647
SERVICE amp INFORMATION OFFICE NORWAY JEQL (Skandinaviska)AB
Lorenvangen 23 0580 Oslo NORWAY Telephone 47-2-2-64-7930 Facsimile 47-2-2-65-0619
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Ylakaupinkuja 2 FIN-02360 Espoo Finland Telephone 358-9-8129-0350 Facsimile 358-9-8129-0351
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2 Corporation Road 1t01-12 Corporation Place Singapore 618494 Telephone 65-6565-9989 Facsimile 65-6565-7552
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370 Angus Crescent Northlands Business Park 29 Newmarket Road
~~=~g~~~2~~1nt~~2_~~~bIlC of South Africa
Facsimile 27-11 -462-1466
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Argoneses 13 28100 Alcobendas (poligono IndustriaQ Madrid Spain Te~phone 34-91-663-0500 Facsimile 34-91-663-0545
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For Mass Spectrometer Products Mass Solutions Technology Co Ltd
5F No79 Sec 1 Xintai 5th Rd Xlzhi Dis New Taipei City 221 Taiwan Republic of China Telephone 886-2-2698-9511 Facsimile 886-2-2698-9512
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JEOLGulf
POBox 171612 bull Rashid Abdulla AI Noami Building Suite No 306 Damascus Street AI Qusais-3 Dubai UAE Telephone 971-553964219(mobile)
USA JEOL USA INC 11 Dearborn Road Peabody MA 01960 USA Telephone 1-978-535-5900 Facsimile 1-978-536-22052206
JEOL USA INC WEST OFFICE
~~s~~~~~rigAe9~5t~~1 1 0 Telephone 1-925-737-1740 Facsimile 1-925-737-1749
VENEZUELA GOMSA Service and Supply CA
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No 13-Lot 12 Trung Yen Trung Hoa Street Cau Giay Dist HanOi Vietnam Telephone 84-4-562-051617562-0535 Facsimile 84-4-853-2511
No 0205B389C Printed in Japan Kp
I
11 L bull bull 1 ~
EM-~800 Multi-Purpose Analytical Electron Microscope
The JEM-2800 is a new TEM that achieves
nano-area analysis through Automation and
Convenience while being Easy- to-use so
that expert results can be achieved by
operators of any skill level Its advanced
electron optical system makes IT possible to
periorm high-resolution TEM and STEM
imaging EDS EELS tomography and
in-situ observation on the same sample
wilhout sacrificing any of Ihese capabil ities
02 nm (STEM) 01 nm (rEM)
1 100 kV 200 kV x 100 to 200000000
EM 2100 Electron Microscope
-r__bull
I JED-2300T
The JEM-2100 is a new-generation 200 kV
analytical electron microscope The JEMshy
2100 which incorporates an integrated PC
system for various functions WITh excellenl
cost performance supports research and
development in wide scienlific fields ranging
from biotechnology to materials science
Pont liJtI 019 nm ~=I nlng vrl qe 80 10 200 kV
Ilagnl 11 X50 to 1500000
JEM-1400Plus Electron Microscope
The JEM-1400Plus is a versatile
transmission electron microscope (rEM) for
a wide range of applications including
biology polymers nano technology and
advanced materials
The JEM-1400Plus uses a single camera for
imaging for view area seach (x10) to data
aquisition
New operation panels with the organic EL
buttons give you simple and intut ive
operation
p~ f -11)(1 02 nm
r- u 40 10120 kV x l0tol2ooOOO
Energy Dispersive X-ray Spectrometer
The JED-2300T installed on a TEM can
easily perform qualitativequantitative
analysis and linea rea analysis of
microareas WITh high energy resolution This bull EDS employs a JEOLs unique ultra-thin
window detector with gate valve protection
mechanism making it possible to obtain
high-sensitivity analysis data particularly
from light elements
Ivl I (d _ -II(I~
QualitativequantITative analysiS linearea analysis AI Iflltgtie elements Be to U B to U or Na to U
Prod uc l G u ide I 05
- -
I I lilllll
II 1111 111111 11111111
~ - - shy
- -- ~-
- shy
Scanning Electron Microscopes
JSM 7800F Field Emission Scanning Electron Microscope
I JSM-7600F Field Emission Scanning Electron Microscope
The JSM-7600F is a state-of-the-art thermal
FE-SEM th at successfu ll y combines
ultrahigh-resolution imaging with optimized
analytical functionality such as high-speed
high-accuracy analyses
10 nm (15 kV) 15 nm (1 kV) 01 to 30 kV
x 25 to 1000000
JSM-7 OOF Field Emi ss ion Scanning Electron Microscope
l 8
I II
The JSM-7800F equipped with a newly developed super hybrid objective lens is a
cutting-edge thermal FE-SEM that successfully combines ultrahigh-resolution
imaging with fast and high-accuracy elemental analysis Magnetic specimens can
be observed and analyzed at high magnification The JSM-7800F also enables
researchers various analyses such as EDS WDS EBSD and CL
bull08 nm (15 kV) 12 nm (1 kV)
001 to 30 kV
x25 to 1000000
JSM 7500F Field Emission Scanning Electron Microscope
The JSM-7500F developed for
nanostructure characterization is equipped
with the Gentle Beam function which
enables researchers observation atI(~ x 100000 magnification even with 100 V low electron energy ~ ~tn~ ~=--
- - - 10 nm (15 kV) 14nm (1 kV)Jllshyf -diy Ollaqb 0 1 to 30 kVoG -- ~ Wll X25 to 1000000- rr
-
The JSM-7100F is a versatile high performance analytical FE SEM The electron
optics produces the maximum 200 nA probe current with the patented in-lens
thermal FEG and a small probe diameter even at large probe currents with the
patented aperture angle optimizing lens
The objective lens is the field free type This lens is suitable for high precision EBSD
analysis and characterization of a magnetic specimen
The vacuum system employing a TMP combined and a specimen exchange airlock
chamber A life of emitter is prolonged by the high quality vacuum in the gun
chamber
gt= - 12nm (30 kV) 30nm (1 kV) 02 to 30 kV
x 10 to 1000000
06 I Producl Guide
---------
I )SM-66 0 Scanning Electron Microscope
The JSM-6610 is a high-performance SEM
that is equipped with a superb electron
optical system and a general-purpose largeshy
specimen chamber to accommodate a
specimen up to 200 mm diameter The _JSM-6610 incorporates newly designed
__
_- ~I software for easier SEM operations in a
variety of applications
I J5M-ALA series Analytical Scanning Electron Microscopes
The JED-2300 EDS developed by JEOL is
embedded in the compact SEMs The
footprint is same as that of the basic SEM
The SEM and EDS are operated as one
seamless system to provide comfortable
and efficient operation A SDD type EDS
detector does not require liquid nitrogen
EDS analysis is ready whenever you need it
Resolution HV 30 nm
LV 40nm 40nm
Magnification
Accelerating voltage 05 shy 30 kV
x5 shy 300000
03 shy 30 kV
I JASM-6200 C airScor etrade Atmospheric Scanning Electron Microscope
I SM-6510 Scanning Electron Microscope
The JSM-6510 is a high-performance SEM
that is equipped with a superb electron
optical system same as the JSM-6610 and
a general-purpose specimen chamber to
accommodate a specimen up to 150 mm
diameter The JSM-651 0 incorporates
newly designed software for easier SEM
operations in a variety of applications
II 1 30 nm ltr-- rr TJ 01 qamp 05 to 30 kV M~1fIIC3IKlr x5 to 300000
J5 -LV series Low Vacuum SEMs
The low vacuum SEM consists of a
conventional high vacuum mode and a low
vacuum (LV) mode One can select the
vacuum mode with a click on the menu
The LV mode enables one to observe and
analyze non-conductive specimens The
specimen chamber is kept at low vacuum
so that highly out-gassing specimens can
be easily observed
1-lhlIt
Resolution HV 30 nm
LV 40 nm
Low vacuum range 10-270 Pa
The JASM-6200 allows high-resolution light microscopeSEM observation at
atmospheric pressure A specimen is held at normal atmospheric pressure Dynamic
observation of physical or chemical reactions can be made in liquid or gas In addition
for biological applications difficult dehydration and drying processes are not needed
dramatically reducing specimen pre-treatment time
Bnm Imiddot 102030 kV
II
Product Guide I 07
JSM-60l0 AILV InTouchScope
)shy -
JSM-6010LA
I JCM 6000 NeoScopeTM
The InTouchScope incorporates a highly intuitive SEM interface with multi-touch
technology The user can expand application windows and orchestrate aJl functions
just by touching the screen
40 nm (20 kV) 50 nm (20 kV)
05 1020 kV x810 300000
JCM-6000 NeoScopen~ let you observe a specimen at much higher magnification
than a light microscope with the same simple operation of a light microscope The
observation image appears automatically when a specimen is inserted and you can
go up to the maximum magnification of x60OOO quickly with the automated
operations
JCM-6000 NeoScopem is equipped with a TMP for quick start
The installation is easy The wall outlet (100V AC) is the only utility needed Cooling
water is not necessary
FX X10 10 60000
SI - Max 70mm dia
Ion Beam Application Equipment
pIB-09010 Cross Section Polisher (CP)
The IB-090 10CP Cross Section Polisher
makes a cross sect ion by irradiating a
spec imen with argon ion beam along an
edge of a shield plate placed on a
specimen This is an innovative specimen
preparation device for specimens studied in
SEM and EPMA
IIB-09020C Cross Section Polisher (C PIT)
The IB-09020CP Cross Section Polisher
(CPIT) creates a cross section in a manner
similar to the IB-09010CP Its built-in CCO
camera al lows real-time monitoring of a
cross-section during polishing
08 I Product Guide
I J18-4601 MuIti Beam System
I J -4501 MultiBeam System
EM-091001S Ion Slicer
The JIB-4501 MultiBeam System achieves
surfaceinternal 3D imaging and analysis
with simple operation This system also
has optimum geometry for all functions
from FIB SEM observation to EDSEBSD
analyses
R~ Iul N 5 nm (FIB) 25 nm (SEM) A I tlrx] I J 03 kV to 30 kV
(5 kV steps) Magl1lhcnli X30 10 300000
(observation milling)
The Ion Slicer can easily prepare thin-film
specimens for TEM without special skill Prior
treatment required for the Ion Slicer is only to
mechanically polish a specimen to 01 mm
thick The optimally set Ar ion beam provides
high-quality thin films In addition this
innovative tool suppresses specimen damage
and contamination such as lattice distortion
induced by mechanical polishing and
oxidation on specimen suriaces by chemical
treatment The Ion Slicer is an echo-friendly
efficient specimen-preparation tool
The JIB-4601 F MultiBeam System unites the unique imaging and analytical capabilities
of the High Power Optics employed in the TFE SEM and a high-performance FIB
column in a highly efficient and powerful system The JIB-4601 F offers an easy-to-use
tool for highly automated sample preparation combined with high-resolution imaging
and sub-micron analysis of the specimen cross-section
5 nm (FIB) 12 nm (SEM) 02 kV to 30 kV (5 kV sleps)
x30 to 1000000 (observation milling)
I J18-4000 Focused Ion Beam System
Top of the line high-throughput
processing
Compact size for flexible layout shy
Installation space reduced by 20
(compared to JEOL conventional
models)
Superb performance at low accelerating
voltage
Stage Navigation System for fast
determination of observation position
R-_ lit I f1 5 nm ICIIH~ltn lJIO ltJi 1 to 30 kV
M~Q I I x60 (for searching field) X200 to 300000
IIB09060CIS Cryo Ion Slicer
The IB-09060CIS Cryo Ion Slicer
incorporates a specimen cooling
mechanism in the EM-091001S Ion Slicer
for easy preparation of thin filmscross bull I J sections even for specimens susceptible
to thermal damage
J
~
Producl Guide I 09
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[Peripheral Equipment ]
IJIC 410 HDT400 JEE-420 series Ion Cleaner Hydrophilic Treatment Device Vacuum Evaporators
The JIC-41 0 Ion Cleaner removes hydrocarbon
contamination on TEM specimens by exposing
specimens in glow discharge
The treated specimens do not build up contamination
during observation in a TEM
JEC560 Auto Carbon Coater
The HDT-400 applies hydrophilic treatment on TEM
grids and SEM specimen mounting blocks The entire
operation is automated
IJFC-1600 Auto Fine Coater
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The JEE-420 vacuum evaporator applies coating on
SEM or TEM specimens with a variety of materials
including gold platinum carbon chromium The JEEshy
420 applies shadowing on TEM specimens
- - C- Ooshy o --nu _ __ a 0 0 0 0
The JEC-560 rapidly applies carbon coating on non-conductive specimens for The JFC series sputter coater applies metal coating on SEM specimens quickly Gold
element analysis with a scanning electron microscope or an electron probe micro gold-palladium and platinum can be applied
analyzers
JED23002300F Energy Dispersive X-ray Spectrometers
Dry SO Detector
The JED-23002300F is installed on a SEM or an EPMA and performs elemental This unique box type Dry SD detector is designed for JSM-651 0 and JSM-601 0 series
analysis on micro areas The Dry SD detector an SDD type detector is cooled SEM The detector is positioned at the optimum position
electrically It does not need liquid nitrogen cooling so that maintenance is not
required Analysis Station the unique EDS analysis software is versatile with simple
operation
All y A~Ilrn System that links observed images with analysis data
inlIytl(oIIUI1Chi1$ Qualitativequantitative analysis linearea analysis
10 I Producl Guide
------
f
Instruments for Microarea and Surface Analysis
IjXA-8530F Field Emission Electron Probe Microanalyzer
The JXA-8530F features an improved hardware that is used in the JXA-8500F (the first
FE-EPMA in the world) as well as newly designed user-friendly PC-GUI windows for
efficient analysis and data operation The FE gun of the JXA-8530F provides not only a
spatial (analysis) resolution of the order of 01 IJm but also high-sensitivity X-ray
detection at low accelerating voltages and large probe currents
IjPS-9200 Photoelectron Spectrometer (XPS)
The JPS-9200 is an XPS that provides microarea analysis A newly developed microshy
tens enables high-sensitivity analysis from macro to microareas Its stage accepts both
standard-size samples (10X 10X2 mm) and large samples (up to gO mm in diameter)
The stage-scan mapping method allows the acquisition of photoelectron images
ranging from low magnification (50 x 18 mm) to high magnification (spatial resolution
30lJm)
I jAMP-9500F Field Emission Auger Microprobe
fl
X 8230 Electron Probe Microanalyzer
D
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The JXA-8230 is a newly developed EPMA which succeeds a proven JEOL EPMA
hardware and features newly designed user-friendly PC-GUI windows for efficient
analysis and data operation Sophisticated analysis menus are designed so that the
user can easily access target material analyses offering stress-free operations
I jPS-901 0 series Photoelectron Spectrometers (XPS)
XPS with high-sensitivity and high-resolution is compactly designed on the basis of
JEOLs many years of basic and application technologies on electrostatic lenses
analyzers etc The low-acceleration and large-current ion guns dedicated to permit
XPS analysis of thin films with different thicknesses from surface atomic layers to
micron order thick specimen layers The specimen chamber and etching chamber are
separated from each other in terms of vacuum thus completely preventing the
contamination due to sputtering and facilitating the maintenance of ultrahigh vacuum
A field-emission Auger Microprobe featuring the worlds highest spatial resolution with
the minimum probe diameter of 3 nm (for secondary-electron image) and 8 nm (for
Auger analysis) The new hemispherical electrostatic energy analyzer (HSA) with a
multi-channel detector optimized for Auger analysis is suitable for chemical-state
analysis The neutralizing ion gun allows Auger analysis of insulating materials Its
specimen stage accommodates a large sample of up to 95 mm in diameter Also it is
expandabfe for an UHV-SEM
ProduCI Guide I 11
X-ray Fluorescence Spectrometers
I ISX 400Rll Element Analyzer
An energy-dispersive X-ray fluorescence spectrometer for environmental analysis
which helps you comply with environmental regulations for hazardous substances
such as the RoHS and ELV directives in the EU and soil pollution in Japan You can
easily analyze minute traces of Cd Pb Hg Cr etc This analyzer is also suitable for
general analySiS including element analysis and thickness measurement using the FP
(fundamental parameter) method
I JSX-31 OORll Element Analyzer
An energy-dispersive X-ray fiuorescence spectrometer for environlnlntal analysis which helps you
comply with environmental regulations for hazardous substances such as the RoHS and ELV
directives in the EU and soil pollution in Japan This analyzer inoorporates a JEOL-made electrically
cooled Si(u] detector making liquid nrtrogen unnecessary as well as providing high sensitivity for
heavy-element analysis such as Cd Pb and Hg This analyzer is also surtable for general analysis
including eement analysis and thickness measurement using the FP (fundamental parameter)
method
12 I Product Guide
Semiconductor Eq Ipm nt
2 Electron Beam Lithography System
-5
Electron Beam Lithography System
r
Electron Beam Lithography System
-~=-~--I--~ I
~ ~ ~-
Th e JBX-3200MV is an e lec lro n bea m lithography system developed for the production of next generation ultrahigh-precision masks and reticles This system employs a variableshyshaped electron beam o f 50kV and a step amp repeat specimen stage
High thro ug hp ut enabled by a new PEG (Proximity Effect Correction) system High-speed da la- transfer sys tem for a large quanti ty data High-precision design for masklrelicle production
Th e JBX-9 500FS is a spot beam
lithography system developed to meet a
wi de range of applications with high
throughput and high precision periormance
This sys tem covers fields from the nanoshy
technology research to the production of
leading edge devices
f 100kV _ ZrONV Schotlky emitter
maximum 300 mm wafer
Th e JBX-6300 FS is a s p o t b ea m
lithography system developed to meet a
w ide range o f applica tions with high
resolution and high precision periormance
This system covers fields from the nanoshy
technology research to the development of
next generation devices
25 kVl50 kVl1 00 kV ZrONV Schottky emittelt
maximum 200 mm wafelt
Prod ucl Gu ide I 13
-
---------
-_ -~
- --= - - - =-shy -
NMR Spectrometers
I JNM-ECAECX series FT NMR System
920 MHz magnet Photo courtesy Nationallnstrtute of Natural Sciences Institute for
Molecular Science
The JNM-ECA920 FT NMR System is a 920 MHz high-resolution NMR
spectrometer developed by JEOL This spectrometer uses the superconducting
magnet co-developed by National Institute for Materials Science and Kobe Steel
Ltd which generates the high magnetic field Created by combining Japans stateshy
of-the-art technologies this FT NMR System marks an important milestone in next
generation biology and nanotechnology which call for high-magnetic-field highshy
resclution NMR analysis
JEOL RESONANCE Inc
~ ~ ~
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~ 100
HNCACB spectrum of 13C(15N labeled Solid 23Na-MQMAS spectrum of ubiqurtin N3)P207
The JNM-ECNECX series are versatile high-performance FT NMR spectrometer
system that utilize the latest digital and high-frequency technology The ECA
spectrometer is applicable up to 1GHz and can be used for a wide range of
applications including liquidsolid NMR protein analysis and diffusion coefficient
measurement
INM-EC cd
JOO ~QO 0(1 ~uo 1)0
Spectrometer I Oscillator receiver power amplifier
Magnet IISCM Field strength 705T I 939T 11 74T 1401T 1643T
Bore diameter (mm) 54 I 54 54 54 54
Probe 5 mm Ttl tunable
11110
188T
54
JEOL RESONANCE Inc
INMmiddot fO rie ---shy
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Spectrometer Oscillator receiver power amplifier
Magnet I ISCM Field strength 705T 939T I 1174T 1401T
Bore diameter (mm) I 54 54 54 54
Probe I 5 mm TH tunable
JEOL RESONANCE Inc
14 I Produc t Guide
bull bull bull
IJNM-ECS 00 FT NMR System
bull I ASC Series
Auto Sample Changer
ASC8 (8 samples) ASC24 (24 samples)
middotmiddot iT ~ --shy
~ I -~Au
ASC16 (16 samples) ASC64 (64 samples)
bullIJNM-ECAECX series Solid NMR
=- ~
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MAS conlroller Solid NMR sampling kit
NMR Systems For Modern NMR Spectroscopy The JNM-ECS400 i s a compact two-channel
spectrometer that retains the advanced capabilities of the
JNM-ECAlECX series (required installation space is oneshy
half compared to conventional NMRs) Programmable
timing sequencers built into each RF and PFG channel
can independently control either synchronous or
asynchronous operations of each channel Its standard
tunable broadband gradient probe which integrates all
JEOLs newest technologies is the high sesitivity roomshy
tempperature probe
Ccmpact spectrometer chassis Innovaten in JEOL NMR digrtal architecture High-stability and high-accuracy digital spectrometer High-sensrtivity new tunable probe Full automalk NMR with advanced software
JEOL RESONANCE Inc
An automatic sample changer makes it
possible to measure many samples
sequentially by exchanging multiple samples
automatically one by one Five changer
models are available for 8 samples 16
samples 24 samples 64 samples and 100
samples
JEOL RESONANCE Inc
ASC100 (100 samples)
1 --0 1(10 C ppm I
Sdid 13C-CPMAS spectrum of cholk acid
Solid-NMR is a technique that measures solid samples (powder or film-like samples) This technique is also effective for measurement of samples not soluble in solvents (inorganic
samples etc) and of crystalline polymorph that is meaningful to measure at the solid state
JEOL RESONANCE Inc
Produci Guide I 15
Mass Spectrometers
I JMS-800D UltraFOCUS I JMS-700 (2) MStation Mass Spectrometer Dedicated to Dioxin Anal ys is High resolution M ass Spectrometer
JMS-800D UltraFOCUS is the optimal cho ice for ultra lowlevel race detection
applications suc h as moni torin g for dioxins and related co mpoun ds eg
Polychlorinated Biphenyls (PCBs) Polybrominated Diphenyl Ethers (PBDEs) or drugs
of abuse by high resolution-selected ion monitoring (HRSIM) gas chromatographyl
mass spectrometry(GCMS)
R-- gtn 80000 (10 valley) Sent Ily 2 3 7 8-TCDD 100fg SNgt2oo
(6 channels 100 msecch Resolution 10000)
N_ Jut J _lllgEI up to 10 kV
JMS-S3000 Matri x Assisted Laser DesorptionIonization TOFMS
The JMS-S3000 is a MALOI-TOFMS incorporating an innovative SpirarrOF ion optical
system With superior capabilities than conventional MALDI-TOFMS the JMS-S3000
provides sate-of-the-art anaiylical solutions for a wide range of research areas such as
functional synthetic polymers materials science and biomolecules
Malrix Assisled Laser Desorpllonlonization Timemiddotof-Flighl Mass Spectrometer
I JMS-T1 OOLP+DART TLC-TOFMS
Pet c 60000 (10 valley) err 02 ng of methyl stearate
SIN 400
(CVEI combination ion source) I~ ~ aJe up to 10kV
I JMS-T1 OOLP LC-TOFMS
I JMS-Tl OOGCV GC-TOFMS
middotl shyThe JMS-T100LP+DART achieves simple and fast TLCMS analysis Accurate mass The JMS-Tl00GCV is a fully automatic Gas Chromatograph - Time-ot-Flight Mass
measurement capabilit y of TOFMS also enables you to determine element Spectrometer (GC-TOFMS) This versatile MS system covers wide range of
compositions of the analytes applications in GC-MS analysis
16 I Pr oduc i Gu ide
- -
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I JMS-Ql 050GC UltraQuad GClMS
cJEOL
-
S-trapHS Headspace Autosampler
ESR Spectrometers
I JES-X3 series ESR Spectrometers
Recently it has been widely
accepted that even retatively few
unpaired electrons in a sample can
affect the function of the material so
lower detection limits (high er
sens itivity) is required of ESR
measurements JES-X3 Series has
achieved higher sensiti v i ty by
developing a lOIN-noise Gunn
oscillator for its new spectrometer
JES-X320 JEOL RESONANCE Inc
i III III )
Maximum Magnetic Field I a6ST 13T 14T
SweepW idth I --00-- 250mT plusmn001 - 500m__T_ __--l
Pole Gap _ _ 6cmm__ ___-= ___~ ____cmm__ _ I 0 = 60mcm 75 _l
Frequency Range(GHz) 8750 - 9650 _ _ _ ___-1
Field Resolution (mT) _L_ 235 Correction by Marker _1_--- Standard
I Operating System Windows 7
The JMS-01050GC is an innovative quadrupole mass spectrometer (OMS) that
achieves the highest-level sensitivity in OMS It has a high ability of evacuation due
to the use of a split flow turbo-molecular pump system (400 Lis) th at
simultaneously evacuates the ion source and the detector The use of a highshy
accuracy hyperbolic quadrupole mass analyzer provides high resolution
The S-trap is a next-generation headspace autosampler providing ultra-low
concentration measurement which was not achieved with a heads pace (HS) method
using conventional sample loop In addition the HS-GCMS system combined lith a
JMS-01050GC Mkll quaorupole MS guarantees detection of mold odor in water
down to 1 ppt
I ES-CT470 Liquid Helium Variable Temperature Controller
The ES-CT470 varies the sample temperature in the temperature range between 25 K
and 470 K Temperature setting is performed by d igital display and the set
temperature is kept constant by automatic control circui ts Combined use with a UV Irradiation device is possible A GaAs etement is used as a temperature sensor
enabling high-accuracy temperature setling
- 25 K to 470 K
plusmn001 K for 25 K to 42 K
plusmn1 orO5 K for 42 K to 470 K
_ 20 min 10 25 min (rom room temperature 08 to 2 Uh
50Hz60Hz 5mm JEOL RESONANCE Inc
Produ c t Guide I 17
Industrial Equipm nt for thin-filnl formation and nlatel ial processing
I bull
Electron Beam Source High-power Electron Beam Source
BS-60060EBS EBG-102UB6S
Electron beam sources for vacuum evaporation of metal and metal-oxide thin-films
We offer a wide variety of electron beam sources and crucibles They have features of
excellent beam spot and energy density and high-speed sweeping
1 PGBS 80020CPPS Plasma Source
BS-80011 BPG (6kW) BS-8002OCPPS (3kW)
Plasma Sources are installed in a vacuum chamber and generate high-density plasma
Used as Ion Plating (Plasma Assisted Deposition) and it is possible to improve film
properties for optilcal thin films protective films and function films Because highshy
density plasma can be generated in a mass space high-rate deposition to a large area
is possible
I RF Induction Plasma System
JEBG-3000UB(300kW) JEBG-1 OOOUB(1 OOkW)
High-power electron beam sources for vacuum evaporation of metal and metal-oxide
for wide plastic films or large glass plates that are continuously fed And they can also
be used for vacuum melting of high-melting point metals
raes
RF Generator
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RF-12030 (3kW) RF-56000 (Controller)
13 56MHz radio-frequency power supplies for plasma generation and used for
sputtering CVD etching and ion-plating We offer 750W to 6kW generators and
matching networks
DR Powder Feeder
Thermal plasma around 10000degC (15000deg F) by RF inductive coupling This thermal Fine powder feeder that can feed 01 to 100 11m size fine powder continuously with
plasma is used for nano powder synthesis fine powder spheroidization thick film carrier gas We offer optional feeding rate controller and large capacity hopper
deposition multi composite membrane synthesis CVD and harmful gas
decomposition
18 I Produci Guide
---
Biochemical Analyzers
I JCA-BM series Clinical Chemistry Analyzer BioMajesty Series
JEOLs micro volume technology and unique sample pre-dilution mechanism realizes
high throughput chemistry analysis with reduced sample and reagent volume
More than 4000 systems have been placed in clinical laboratories allover the world
JCA-BM6050
I JCA-BMBOOO series Ultra High Throughput Clinical Chemistry Analyzer
4 4
JCA-BMB060 egt
JCA-BMSOOO series offer ultra high throughput chemistry analysis up to 9000 testsl
hour
The pre-dilution unit one of the BioMajesty family features also continues the strong
tradition in these series with interconnected multiple analysis modules the key factors
that accomplish brilliant high throughput as well as downtime reduction with back-up
capability
I JCA-BM6070 High Throughput High Performance Clinical Chemistry An alyzer
I I I
A Clinical chemistry analyzer with incomparable speed and accuracy which achieves
high throughput of 2400 testslhour (includ ing ISE) The incorporated compact
workstation and user-friendly Interface with excellent operability leads the new trend of
the laboratory testing
BioMajesty Series lCA-BM 6010 lCA-BM 6050
lCA-8M 6070 leA-BM 91 30
lCA-BM 8000 Series
bull This product is distributed outside Japan by Siemens Heatthcare Diagnostics under the ADVtAreg brand name
I JCA-BM601 OC Compact amp High Performance Clinical Chemistry Analyzer
-~-I -
1lIIIIIIilllllllllJllnlIlII Ii I JCA-BM6010C is a compact but efficient automatic analyzer that maintains the basic
concept of BioMajesty series while achieving the excellent capability of microanalysis
with sample volume as small as 1 J1L
BM6010C also offers fully automated HbA1 c analysis with on-board hemolysis
(optional) Simultaneous measurement of Glucose and HbA1c improves laboratory
workflow
Product Guid e I 19
S~~MCEAII Certain products in this brochure are controlled under the Foreign 0J 0014007 -v- ~ Exchange and Foreign Trade Law of Japan in compliance with $ ~~~ international security export control JEOL Ltd must provide the~2 m) IIlt Japanese Government with End-users Statement of Assurancel A MGMT SYS
AvA ~ m and End-use Certificate in order to obtain the export license - tiJ needed for export from Japan If the product to be exported is in this category the end user will be asked to fill in these certificate formsdEOLIS09001 amp150 14001CenrfiCltlled
httpwwwjeolcomdEOL JEOL Ltd 1-2 Musashino 3-chome Akishima Tokyo 196-8558 Japan Sales Division Telephone+81-42-528-3381 Facsimile+81-42-528-3386
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205 Block A Mezzanine Floor Kelana Business Center 97 Jalan SS 72 Kelana Jaya 47301 Petaling Jaya Selangor Malaysia Telephone 60-3-7492-7722 Facsimile 60-3-7492-7723
MEXICO JEOL DE MEXICO SA DE CV
Arkansas 11 Piso 2 Colonia Napoles Delegacion Benito Juarez CP 03810 Mexico DF Mexico Telephone 52-5-55-211-4511 Facsimile 52-5-55-211-0720
PAKISTAN (KarachI) ANALYTICAL MEASURING SYSTEM (pvn LTD(AMS LTD)
14-C Main Sehar Commercia) Avenue Lane 4 Khayaban-e-Sehar DHA-VII Karachimiddot75500 Pakinstan Telephone 92-21-353455813534074735346057-8 Facsimile 92-21-35345582
PANAMA PROMED SA Parque Industrial Costa del Este Urbanizacion Costa del Este Apartado 0816-01755 Panama Panama Telephone 507-303-3100 FaCSimile 507-303-3115
PHILIPPINES PHILAB INDUSTRIES INC
7487 Bagtikan Street SAY Makati 1203 Metro Manila Phillip pines Telephone 63-2-896-7218 Facsimile 63-2-897-7732
PORTUGAL Izasa Portugal Lda A do Proletariado 1 2790-138 CARNAXIDE Portugal Telephone 351-21-424-73-00 Facsimile 351-21-418-60-20
RUSSIA JEOL (RUS) LLC Krasnoproletarskaya Street 16 Bid 2 127473 Moscow Russian Federation Telephone 7-495-748-7791rr792 Facsimile 7-495-748-7793
SAUDI ARABIA ABDULREHMAN ALGOSAIBI GTC (Riyadh)
King Abdulaziz Avenue PO Box 215 Riyadh 11411 Saudi Arabia Telephone 966-1-479-3000 Facsimile 966-1-477-1374
SCANDINAVIA SWEDEN JEOL (Skandinaviska)AB
Hammarbacken 6A Box 716191 27 Sollentuna Sweden Telephone 46-8-28-2800 Facsimile 46-8-29-1647
SERVICE amp INFORMATION OFFICE NORWAY JEQL (Skandinaviska)AB
Lorenvangen 23 0580 Oslo NORWAY Telephone 47-2-2-64-7930 Facsimile 47-2-2-65-0619
FINLAND JEOL (Skandlnaviska)AB
Ylakaupinkuja 2 FIN-02360 Espoo Finland Telephone 358-9-8129-0350 Facsimile 358-9-8129-0351
SINGAPORE JEOLASIA PTE LTD
2 Corporation Road 1t01-12 Corporation Place Singapore 618494 Telephone 65-6565-9989 Facsimile 65-6565-7552
SOUTH AFRICA ADI Scientific (Pty) Ltd
370 Angus Crescent Northlands Business Park 29 Newmarket Road
~~=~g~~~2~~1nt~~2_~~~bIlC of South Africa
Facsimile 27-11 -462-1466
SPAIN IZASA SA
Argoneses 13 28100 Alcobendas (poligono IndustriaQ Madrid Spain Te~phone 34-91-663-0500 Facsimile 34-91-663-0545
SWITZERLAND JEOL (GERMANY) GmbH Oskar-Von-Miller Strasse 1 85386 Eching Germany Telephone 49-8165-77346 Facsimile 49-8165-77512
TAIWAN For EO ProQucts JIE DONG CO LTD 7F 112 Chung Hsiao East Road Section 1 Taipei Taiwan 10023 Republic of China Telephone 886-2-2395-2978 Facsimile 886-2~2322-4655
For Mass Spectrometer Products Mass Solutions Technology Co Ltd
5F No79 Sec 1 Xintai 5th Rd Xlzhi Dis New Taipei City 221 Taiwan Republic of China Telephone 886-2-2698-9511 Facsimile 886-2-2698-9512
For Semiconductor Products JEOL TAIWAN SEMICONDUCTORS LTD
11 F-l No 346 Pei-Da Road Hsin-Chu City 300 Taiwan Republic of China Telephone 886-3-523-8490 Facsimile 886-3-523-8503
THAILAND BECTHAI BANGKOK EQUIPMENT amp CHEMICAL CO Ltd
300 Phaholyothin Rd Phayathai Bangkok 10400 Thailand Telephone 66-2-615-2929 Facsimile 66-2-615-23502351
THE NETHERLANDS JEOL (EUROPE) Bv Ureweg 4 NL-2153 PH Nieuw-Vennep The Nelherlands Telephone 31-252-623500 Facsimile 31-252-623501
TURKEY TEKSERAS Kayisdagi )nonu MahKartal Cad No553 34755 Atasehir Istanbul Turkey Telephone 90-216-5736470 Facsimile 90-216-5736475
UAE MRS Group Dubai POBox 171612 Rashid Abdulla AI Noami Building Suite No 306 Damascus Street AI Qusais-3 Dubai UAE Telephone 971-4-2581141 Facsimile 971-4-2581151
JEOLGulf
POBox 171612 bull Rashid Abdulla AI Noami Building Suite No 306 Damascus Street AI Qusais-3 Dubai UAE Telephone 971-553964219(mobile)
USA JEOL USA INC 11 Dearborn Road Peabody MA 01960 USA Telephone 1-978-535-5900 Facsimile 1-978-536-22052206
JEOL USA INC WEST OFFICE
~~s~~~~~rigAe9~5t~~1 1 0 Telephone 1-925-737-1740 Facsimile 1-925-737-1749
VENEZUELA GOMSA Service and Supply CA
Urbanizacion Montalban JlI - Resldenclas Don Andres - Piso 7 - Apartomento 74 Avenida 3 entre calles 7 y 6 Montalban Caracas Venezuela Telephone 58-212-443-4342 Facsimile 58-212-443-4342
VTETNAM TECHNICAL MATERIALS AND RESOURCES IMPORT-EXPORT JOINT STOCK COMPANY(REXCO) Hanoi Branch
No 13-Lot 12 Trung Yen Trung Hoa Street Cau Giay Dist HanOi Vietnam Telephone 84-4-562-051617562-0535 Facsimile 84-4-853-2511
No 0205B389C Printed in Japan Kp
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Scanning Electron Microscopes
JSM 7800F Field Emission Scanning Electron Microscope
I JSM-7600F Field Emission Scanning Electron Microscope
The JSM-7600F is a state-of-the-art thermal
FE-SEM th at successfu ll y combines
ultrahigh-resolution imaging with optimized
analytical functionality such as high-speed
high-accuracy analyses
10 nm (15 kV) 15 nm (1 kV) 01 to 30 kV
x 25 to 1000000
JSM-7 OOF Field Emi ss ion Scanning Electron Microscope
l 8
I II
The JSM-7800F equipped with a newly developed super hybrid objective lens is a
cutting-edge thermal FE-SEM that successfully combines ultrahigh-resolution
imaging with fast and high-accuracy elemental analysis Magnetic specimens can
be observed and analyzed at high magnification The JSM-7800F also enables
researchers various analyses such as EDS WDS EBSD and CL
bull08 nm (15 kV) 12 nm (1 kV)
001 to 30 kV
x25 to 1000000
JSM 7500F Field Emission Scanning Electron Microscope
The JSM-7500F developed for
nanostructure characterization is equipped
with the Gentle Beam function which
enables researchers observation atI(~ x 100000 magnification even with 100 V low electron energy ~ ~tn~ ~=--
- - - 10 nm (15 kV) 14nm (1 kV)Jllshyf -diy Ollaqb 0 1 to 30 kVoG -- ~ Wll X25 to 1000000- rr
-
The JSM-7100F is a versatile high performance analytical FE SEM The electron
optics produces the maximum 200 nA probe current with the patented in-lens
thermal FEG and a small probe diameter even at large probe currents with the
patented aperture angle optimizing lens
The objective lens is the field free type This lens is suitable for high precision EBSD
analysis and characterization of a magnetic specimen
The vacuum system employing a TMP combined and a specimen exchange airlock
chamber A life of emitter is prolonged by the high quality vacuum in the gun
chamber
gt= - 12nm (30 kV) 30nm (1 kV) 02 to 30 kV
x 10 to 1000000
06 I Producl Guide
---------
I )SM-66 0 Scanning Electron Microscope
The JSM-6610 is a high-performance SEM
that is equipped with a superb electron
optical system and a general-purpose largeshy
specimen chamber to accommodate a
specimen up to 200 mm diameter The _JSM-6610 incorporates newly designed
__
_- ~I software for easier SEM operations in a
variety of applications
I J5M-ALA series Analytical Scanning Electron Microscopes
The JED-2300 EDS developed by JEOL is
embedded in the compact SEMs The
footprint is same as that of the basic SEM
The SEM and EDS are operated as one
seamless system to provide comfortable
and efficient operation A SDD type EDS
detector does not require liquid nitrogen
EDS analysis is ready whenever you need it
Resolution HV 30 nm
LV 40nm 40nm
Magnification
Accelerating voltage 05 shy 30 kV
x5 shy 300000
03 shy 30 kV
I JASM-6200 C airScor etrade Atmospheric Scanning Electron Microscope
I SM-6510 Scanning Electron Microscope
The JSM-6510 is a high-performance SEM
that is equipped with a superb electron
optical system same as the JSM-6610 and
a general-purpose specimen chamber to
accommodate a specimen up to 150 mm
diameter The JSM-651 0 incorporates
newly designed software for easier SEM
operations in a variety of applications
II 1 30 nm ltr-- rr TJ 01 qamp 05 to 30 kV M~1fIIC3IKlr x5 to 300000
J5 -LV series Low Vacuum SEMs
The low vacuum SEM consists of a
conventional high vacuum mode and a low
vacuum (LV) mode One can select the
vacuum mode with a click on the menu
The LV mode enables one to observe and
analyze non-conductive specimens The
specimen chamber is kept at low vacuum
so that highly out-gassing specimens can
be easily observed
1-lhlIt
Resolution HV 30 nm
LV 40 nm
Low vacuum range 10-270 Pa
The JASM-6200 allows high-resolution light microscopeSEM observation at
atmospheric pressure A specimen is held at normal atmospheric pressure Dynamic
observation of physical or chemical reactions can be made in liquid or gas In addition
for biological applications difficult dehydration and drying processes are not needed
dramatically reducing specimen pre-treatment time
Bnm Imiddot 102030 kV
II
Product Guide I 07
JSM-60l0 AILV InTouchScope
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JSM-6010LA
I JCM 6000 NeoScopeTM
The InTouchScope incorporates a highly intuitive SEM interface with multi-touch
technology The user can expand application windows and orchestrate aJl functions
just by touching the screen
40 nm (20 kV) 50 nm (20 kV)
05 1020 kV x810 300000
JCM-6000 NeoScopen~ let you observe a specimen at much higher magnification
than a light microscope with the same simple operation of a light microscope The
observation image appears automatically when a specimen is inserted and you can
go up to the maximum magnification of x60OOO quickly with the automated
operations
JCM-6000 NeoScopem is equipped with a TMP for quick start
The installation is easy The wall outlet (100V AC) is the only utility needed Cooling
water is not necessary
FX X10 10 60000
SI - Max 70mm dia
Ion Beam Application Equipment
pIB-09010 Cross Section Polisher (CP)
The IB-090 10CP Cross Section Polisher
makes a cross sect ion by irradiating a
spec imen with argon ion beam along an
edge of a shield plate placed on a
specimen This is an innovative specimen
preparation device for specimens studied in
SEM and EPMA
IIB-09020C Cross Section Polisher (C PIT)
The IB-09020CP Cross Section Polisher
(CPIT) creates a cross section in a manner
similar to the IB-09010CP Its built-in CCO
camera al lows real-time monitoring of a
cross-section during polishing
08 I Product Guide
I J18-4601 MuIti Beam System
I J -4501 MultiBeam System
EM-091001S Ion Slicer
The JIB-4501 MultiBeam System achieves
surfaceinternal 3D imaging and analysis
with simple operation This system also
has optimum geometry for all functions
from FIB SEM observation to EDSEBSD
analyses
R~ Iul N 5 nm (FIB) 25 nm (SEM) A I tlrx] I J 03 kV to 30 kV
(5 kV steps) Magl1lhcnli X30 10 300000
(observation milling)
The Ion Slicer can easily prepare thin-film
specimens for TEM without special skill Prior
treatment required for the Ion Slicer is only to
mechanically polish a specimen to 01 mm
thick The optimally set Ar ion beam provides
high-quality thin films In addition this
innovative tool suppresses specimen damage
and contamination such as lattice distortion
induced by mechanical polishing and
oxidation on specimen suriaces by chemical
treatment The Ion Slicer is an echo-friendly
efficient specimen-preparation tool
The JIB-4601 F MultiBeam System unites the unique imaging and analytical capabilities
of the High Power Optics employed in the TFE SEM and a high-performance FIB
column in a highly efficient and powerful system The JIB-4601 F offers an easy-to-use
tool for highly automated sample preparation combined with high-resolution imaging
and sub-micron analysis of the specimen cross-section
5 nm (FIB) 12 nm (SEM) 02 kV to 30 kV (5 kV sleps)
x30 to 1000000 (observation milling)
I J18-4000 Focused Ion Beam System
Top of the line high-throughput
processing
Compact size for flexible layout shy
Installation space reduced by 20
(compared to JEOL conventional
models)
Superb performance at low accelerating
voltage
Stage Navigation System for fast
determination of observation position
R-_ lit I f1 5 nm ICIIH~ltn lJIO ltJi 1 to 30 kV
M~Q I I x60 (for searching field) X200 to 300000
IIB09060CIS Cryo Ion Slicer
The IB-09060CIS Cryo Ion Slicer
incorporates a specimen cooling
mechanism in the EM-091001S Ion Slicer
for easy preparation of thin filmscross bull I J sections even for specimens susceptible
to thermal damage
J
~
Producl Guide I 09
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[Peripheral Equipment ]
IJIC 410 HDT400 JEE-420 series Ion Cleaner Hydrophilic Treatment Device Vacuum Evaporators
The JIC-41 0 Ion Cleaner removes hydrocarbon
contamination on TEM specimens by exposing
specimens in glow discharge
The treated specimens do not build up contamination
during observation in a TEM
JEC560 Auto Carbon Coater
The HDT-400 applies hydrophilic treatment on TEM
grids and SEM specimen mounting blocks The entire
operation is automated
IJFC-1600 Auto Fine Coater
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The JEE-420 vacuum evaporator applies coating on
SEM or TEM specimens with a variety of materials
including gold platinum carbon chromium The JEEshy
420 applies shadowing on TEM specimens
- - C- Ooshy o --nu _ __ a 0 0 0 0
The JEC-560 rapidly applies carbon coating on non-conductive specimens for The JFC series sputter coater applies metal coating on SEM specimens quickly Gold
element analysis with a scanning electron microscope or an electron probe micro gold-palladium and platinum can be applied
analyzers
JED23002300F Energy Dispersive X-ray Spectrometers
Dry SO Detector
The JED-23002300F is installed on a SEM or an EPMA and performs elemental This unique box type Dry SD detector is designed for JSM-651 0 and JSM-601 0 series
analysis on micro areas The Dry SD detector an SDD type detector is cooled SEM The detector is positioned at the optimum position
electrically It does not need liquid nitrogen cooling so that maintenance is not
required Analysis Station the unique EDS analysis software is versatile with simple
operation
All y A~Ilrn System that links observed images with analysis data
inlIytl(oIIUI1Chi1$ Qualitativequantitative analysis linearea analysis
10 I Producl Guide
------
f
Instruments for Microarea and Surface Analysis
IjXA-8530F Field Emission Electron Probe Microanalyzer
The JXA-8530F features an improved hardware that is used in the JXA-8500F (the first
FE-EPMA in the world) as well as newly designed user-friendly PC-GUI windows for
efficient analysis and data operation The FE gun of the JXA-8530F provides not only a
spatial (analysis) resolution of the order of 01 IJm but also high-sensitivity X-ray
detection at low accelerating voltages and large probe currents
IjPS-9200 Photoelectron Spectrometer (XPS)
The JPS-9200 is an XPS that provides microarea analysis A newly developed microshy
tens enables high-sensitivity analysis from macro to microareas Its stage accepts both
standard-size samples (10X 10X2 mm) and large samples (up to gO mm in diameter)
The stage-scan mapping method allows the acquisition of photoelectron images
ranging from low magnification (50 x 18 mm) to high magnification (spatial resolution
30lJm)
I jAMP-9500F Field Emission Auger Microprobe
fl
X 8230 Electron Probe Microanalyzer
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The JXA-8230 is a newly developed EPMA which succeeds a proven JEOL EPMA
hardware and features newly designed user-friendly PC-GUI windows for efficient
analysis and data operation Sophisticated analysis menus are designed so that the
user can easily access target material analyses offering stress-free operations
I jPS-901 0 series Photoelectron Spectrometers (XPS)
XPS with high-sensitivity and high-resolution is compactly designed on the basis of
JEOLs many years of basic and application technologies on electrostatic lenses
analyzers etc The low-acceleration and large-current ion guns dedicated to permit
XPS analysis of thin films with different thicknesses from surface atomic layers to
micron order thick specimen layers The specimen chamber and etching chamber are
separated from each other in terms of vacuum thus completely preventing the
contamination due to sputtering and facilitating the maintenance of ultrahigh vacuum
A field-emission Auger Microprobe featuring the worlds highest spatial resolution with
the minimum probe diameter of 3 nm (for secondary-electron image) and 8 nm (for
Auger analysis) The new hemispherical electrostatic energy analyzer (HSA) with a
multi-channel detector optimized for Auger analysis is suitable for chemical-state
analysis The neutralizing ion gun allows Auger analysis of insulating materials Its
specimen stage accommodates a large sample of up to 95 mm in diameter Also it is
expandabfe for an UHV-SEM
ProduCI Guide I 11
X-ray Fluorescence Spectrometers
I ISX 400Rll Element Analyzer
An energy-dispersive X-ray fluorescence spectrometer for environmental analysis
which helps you comply with environmental regulations for hazardous substances
such as the RoHS and ELV directives in the EU and soil pollution in Japan You can
easily analyze minute traces of Cd Pb Hg Cr etc This analyzer is also suitable for
general analySiS including element analysis and thickness measurement using the FP
(fundamental parameter) method
I JSX-31 OORll Element Analyzer
An energy-dispersive X-ray fiuorescence spectrometer for environlnlntal analysis which helps you
comply with environmental regulations for hazardous substances such as the RoHS and ELV
directives in the EU and soil pollution in Japan This analyzer inoorporates a JEOL-made electrically
cooled Si(u] detector making liquid nrtrogen unnecessary as well as providing high sensitivity for
heavy-element analysis such as Cd Pb and Hg This analyzer is also surtable for general analysis
including eement analysis and thickness measurement using the FP (fundamental parameter)
method
12 I Product Guide
Semiconductor Eq Ipm nt
2 Electron Beam Lithography System
-5
Electron Beam Lithography System
r
Electron Beam Lithography System
-~=-~--I--~ I
~ ~ ~-
Th e JBX-3200MV is an e lec lro n bea m lithography system developed for the production of next generation ultrahigh-precision masks and reticles This system employs a variableshyshaped electron beam o f 50kV and a step amp repeat specimen stage
High thro ug hp ut enabled by a new PEG (Proximity Effect Correction) system High-speed da la- transfer sys tem for a large quanti ty data High-precision design for masklrelicle production
Th e JBX-9 500FS is a spot beam
lithography system developed to meet a
wi de range of applications with high
throughput and high precision periormance
This sys tem covers fields from the nanoshy
technology research to the production of
leading edge devices
f 100kV _ ZrONV Schotlky emitter
maximum 300 mm wafer
Th e JBX-6300 FS is a s p o t b ea m
lithography system developed to meet a
w ide range o f applica tions with high
resolution and high precision periormance
This system covers fields from the nanoshy
technology research to the development of
next generation devices
25 kVl50 kVl1 00 kV ZrONV Schottky emittelt
maximum 200 mm wafelt
Prod ucl Gu ide I 13
-
---------
-_ -~
- --= - - - =-shy -
NMR Spectrometers
I JNM-ECAECX series FT NMR System
920 MHz magnet Photo courtesy Nationallnstrtute of Natural Sciences Institute for
Molecular Science
The JNM-ECA920 FT NMR System is a 920 MHz high-resolution NMR
spectrometer developed by JEOL This spectrometer uses the superconducting
magnet co-developed by National Institute for Materials Science and Kobe Steel
Ltd which generates the high magnetic field Created by combining Japans stateshy
of-the-art technologies this FT NMR System marks an important milestone in next
generation biology and nanotechnology which call for high-magnetic-field highshy
resclution NMR analysis
JEOL RESONANCE Inc
~ ~ ~
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~ 100
HNCACB spectrum of 13C(15N labeled Solid 23Na-MQMAS spectrum of ubiqurtin N3)P207
The JNM-ECNECX series are versatile high-performance FT NMR spectrometer
system that utilize the latest digital and high-frequency technology The ECA
spectrometer is applicable up to 1GHz and can be used for a wide range of
applications including liquidsolid NMR protein analysis and diffusion coefficient
measurement
INM-EC cd
JOO ~QO 0(1 ~uo 1)0
Spectrometer I Oscillator receiver power amplifier
Magnet IISCM Field strength 705T I 939T 11 74T 1401T 1643T
Bore diameter (mm) 54 I 54 54 54 54
Probe 5 mm Ttl tunable
11110
188T
54
JEOL RESONANCE Inc
INMmiddot fO rie ---shy
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Spectrometer Oscillator receiver power amplifier
Magnet I ISCM Field strength 705T 939T I 1174T 1401T
Bore diameter (mm) I 54 54 54 54
Probe I 5 mm TH tunable
JEOL RESONANCE Inc
14 I Produc t Guide
bull bull bull
IJNM-ECS 00 FT NMR System
bull I ASC Series
Auto Sample Changer
ASC8 (8 samples) ASC24 (24 samples)
middotmiddot iT ~ --shy
~ I -~Au
ASC16 (16 samples) ASC64 (64 samples)
bullIJNM-ECAECX series Solid NMR
=- ~
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MAS conlroller Solid NMR sampling kit
NMR Systems For Modern NMR Spectroscopy The JNM-ECS400 i s a compact two-channel
spectrometer that retains the advanced capabilities of the
JNM-ECAlECX series (required installation space is oneshy
half compared to conventional NMRs) Programmable
timing sequencers built into each RF and PFG channel
can independently control either synchronous or
asynchronous operations of each channel Its standard
tunable broadband gradient probe which integrates all
JEOLs newest technologies is the high sesitivity roomshy
tempperature probe
Ccmpact spectrometer chassis Innovaten in JEOL NMR digrtal architecture High-stability and high-accuracy digital spectrometer High-sensrtivity new tunable probe Full automalk NMR with advanced software
JEOL RESONANCE Inc
An automatic sample changer makes it
possible to measure many samples
sequentially by exchanging multiple samples
automatically one by one Five changer
models are available for 8 samples 16
samples 24 samples 64 samples and 100
samples
JEOL RESONANCE Inc
ASC100 (100 samples)
1 --0 1(10 C ppm I
Sdid 13C-CPMAS spectrum of cholk acid
Solid-NMR is a technique that measures solid samples (powder or film-like samples) This technique is also effective for measurement of samples not soluble in solvents (inorganic
samples etc) and of crystalline polymorph that is meaningful to measure at the solid state
JEOL RESONANCE Inc
Produci Guide I 15
Mass Spectrometers
I JMS-800D UltraFOCUS I JMS-700 (2) MStation Mass Spectrometer Dedicated to Dioxin Anal ys is High resolution M ass Spectrometer
JMS-800D UltraFOCUS is the optimal cho ice for ultra lowlevel race detection
applications suc h as moni torin g for dioxins and related co mpoun ds eg
Polychlorinated Biphenyls (PCBs) Polybrominated Diphenyl Ethers (PBDEs) or drugs
of abuse by high resolution-selected ion monitoring (HRSIM) gas chromatographyl
mass spectrometry(GCMS)
R-- gtn 80000 (10 valley) Sent Ily 2 3 7 8-TCDD 100fg SNgt2oo
(6 channels 100 msecch Resolution 10000)
N_ Jut J _lllgEI up to 10 kV
JMS-S3000 Matri x Assisted Laser DesorptionIonization TOFMS
The JMS-S3000 is a MALOI-TOFMS incorporating an innovative SpirarrOF ion optical
system With superior capabilities than conventional MALDI-TOFMS the JMS-S3000
provides sate-of-the-art anaiylical solutions for a wide range of research areas such as
functional synthetic polymers materials science and biomolecules
Malrix Assisled Laser Desorpllonlonization Timemiddotof-Flighl Mass Spectrometer
I JMS-T1 OOLP+DART TLC-TOFMS
Pet c 60000 (10 valley) err 02 ng of methyl stearate
SIN 400
(CVEI combination ion source) I~ ~ aJe up to 10kV
I JMS-T1 OOLP LC-TOFMS
I JMS-Tl OOGCV GC-TOFMS
middotl shyThe JMS-T100LP+DART achieves simple and fast TLCMS analysis Accurate mass The JMS-Tl00GCV is a fully automatic Gas Chromatograph - Time-ot-Flight Mass
measurement capabilit y of TOFMS also enables you to determine element Spectrometer (GC-TOFMS) This versatile MS system covers wide range of
compositions of the analytes applications in GC-MS analysis
16 I Pr oduc i Gu ide
- -
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I JMS-Ql 050GC UltraQuad GClMS
cJEOL
-
S-trapHS Headspace Autosampler
ESR Spectrometers
I JES-X3 series ESR Spectrometers
Recently it has been widely
accepted that even retatively few
unpaired electrons in a sample can
affect the function of the material so
lower detection limits (high er
sens itivity) is required of ESR
measurements JES-X3 Series has
achieved higher sensiti v i ty by
developing a lOIN-noise Gunn
oscillator for its new spectrometer
JES-X320 JEOL RESONANCE Inc
i III III )
Maximum Magnetic Field I a6ST 13T 14T
SweepW idth I --00-- 250mT plusmn001 - 500m__T_ __--l
Pole Gap _ _ 6cmm__ ___-= ___~ ____cmm__ _ I 0 = 60mcm 75 _l
Frequency Range(GHz) 8750 - 9650 _ _ _ ___-1
Field Resolution (mT) _L_ 235 Correction by Marker _1_--- Standard
I Operating System Windows 7
The JMS-01050GC is an innovative quadrupole mass spectrometer (OMS) that
achieves the highest-level sensitivity in OMS It has a high ability of evacuation due
to the use of a split flow turbo-molecular pump system (400 Lis) th at
simultaneously evacuates the ion source and the detector The use of a highshy
accuracy hyperbolic quadrupole mass analyzer provides high resolution
The S-trap is a next-generation headspace autosampler providing ultra-low
concentration measurement which was not achieved with a heads pace (HS) method
using conventional sample loop In addition the HS-GCMS system combined lith a
JMS-01050GC Mkll quaorupole MS guarantees detection of mold odor in water
down to 1 ppt
I ES-CT470 Liquid Helium Variable Temperature Controller
The ES-CT470 varies the sample temperature in the temperature range between 25 K
and 470 K Temperature setting is performed by d igital display and the set
temperature is kept constant by automatic control circui ts Combined use with a UV Irradiation device is possible A GaAs etement is used as a temperature sensor
enabling high-accuracy temperature setling
- 25 K to 470 K
plusmn001 K for 25 K to 42 K
plusmn1 orO5 K for 42 K to 470 K
_ 20 min 10 25 min (rom room temperature 08 to 2 Uh
50Hz60Hz 5mm JEOL RESONANCE Inc
Produ c t Guide I 17
Industrial Equipm nt for thin-filnl formation and nlatel ial processing
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Electron Beam Source High-power Electron Beam Source
BS-60060EBS EBG-102UB6S
Electron beam sources for vacuum evaporation of metal and metal-oxide thin-films
We offer a wide variety of electron beam sources and crucibles They have features of
excellent beam spot and energy density and high-speed sweeping
1 PGBS 80020CPPS Plasma Source
BS-80011 BPG (6kW) BS-8002OCPPS (3kW)
Plasma Sources are installed in a vacuum chamber and generate high-density plasma
Used as Ion Plating (Plasma Assisted Deposition) and it is possible to improve film
properties for optilcal thin films protective films and function films Because highshy
density plasma can be generated in a mass space high-rate deposition to a large area
is possible
I RF Induction Plasma System
JEBG-3000UB(300kW) JEBG-1 OOOUB(1 OOkW)
High-power electron beam sources for vacuum evaporation of metal and metal-oxide
for wide plastic films or large glass plates that are continuously fed And they can also
be used for vacuum melting of high-melting point metals
raes
RF Generator
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RF-12030 (3kW) RF-56000 (Controller)
13 56MHz radio-frequency power supplies for plasma generation and used for
sputtering CVD etching and ion-plating We offer 750W to 6kW generators and
matching networks
DR Powder Feeder
Thermal plasma around 10000degC (15000deg F) by RF inductive coupling This thermal Fine powder feeder that can feed 01 to 100 11m size fine powder continuously with
plasma is used for nano powder synthesis fine powder spheroidization thick film carrier gas We offer optional feeding rate controller and large capacity hopper
deposition multi composite membrane synthesis CVD and harmful gas
decomposition
18 I Produci Guide
---
Biochemical Analyzers
I JCA-BM series Clinical Chemistry Analyzer BioMajesty Series
JEOLs micro volume technology and unique sample pre-dilution mechanism realizes
high throughput chemistry analysis with reduced sample and reagent volume
More than 4000 systems have been placed in clinical laboratories allover the world
JCA-BM6050
I JCA-BMBOOO series Ultra High Throughput Clinical Chemistry Analyzer
4 4
JCA-BMB060 egt
JCA-BMSOOO series offer ultra high throughput chemistry analysis up to 9000 testsl
hour
The pre-dilution unit one of the BioMajesty family features also continues the strong
tradition in these series with interconnected multiple analysis modules the key factors
that accomplish brilliant high throughput as well as downtime reduction with back-up
capability
I JCA-BM6070 High Throughput High Performance Clinical Chemistry An alyzer
I I I
A Clinical chemistry analyzer with incomparable speed and accuracy which achieves
high throughput of 2400 testslhour (includ ing ISE) The incorporated compact
workstation and user-friendly Interface with excellent operability leads the new trend of
the laboratory testing
BioMajesty Series lCA-BM 6010 lCA-BM 6050
lCA-8M 6070 leA-BM 91 30
lCA-BM 8000 Series
bull This product is distributed outside Japan by Siemens Heatthcare Diagnostics under the ADVtAreg brand name
I JCA-BM601 OC Compact amp High Performance Clinical Chemistry Analyzer
-~-I -
1lIIIIIIilllllllllJllnlIlII Ii I JCA-BM6010C is a compact but efficient automatic analyzer that maintains the basic
concept of BioMajesty series while achieving the excellent capability of microanalysis
with sample volume as small as 1 J1L
BM6010C also offers fully automated HbA1 c analysis with on-board hemolysis
(optional) Simultaneous measurement of Glucose and HbA1c improves laboratory
workflow
Product Guid e I 19
S~~MCEAII Certain products in this brochure are controlled under the Foreign 0J 0014007 -v- ~ Exchange and Foreign Trade Law of Japan in compliance with $ ~~~ international security export control JEOL Ltd must provide the~2 m) IIlt Japanese Government with End-users Statement of Assurancel A MGMT SYS
AvA ~ m and End-use Certificate in order to obtain the export license - tiJ needed for export from Japan If the product to be exported is in this category the end user will be asked to fill in these certificate formsdEOLIS09001 amp150 14001CenrfiCltlled
httpwwwjeolcomdEOL JEOL Ltd 1-2 Musashino 3-chome Akishima Tokyo 196-8558 Japan Sales Division Telephone+81-42-528-3381 Facsimile+81-42-528-3386
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GREAT BRITAIN amp IRELAND JEOL (UK) LTD JEOL House Silver Court Watchmeaci Welwyn Garden City Herts AL71LT UK Telephone 44-1707 -377117 FaCSimile 44-1707-373254
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56-58S Trikoupl Str PO Box 26140 GR-10022 Athens Greece Telephone 30-1-823-5383 Facsimile 30-1-823-9567
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Unit No1 009 1 OF Prosperity Milennia Plaza 663 Kings Road North Point Hong Kong Telephone 852-2815-7299 Facsimile 852-2581-4635
INDIA JEQL INDIA Pvt Ltd
Elegance Tower Level 2 2128 Old Mathura Road Jasola Business District Centre Near Apollo Hospital Jasola New Delhi 110025 India Telephone 91-11-6472-2578 Facsimile 91-11-4060-1235
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Analyticallnstrments Department Sahas 41412 Veer Savarkar Marg Prabhadery Mumbai 400 025 India Telephone 91-22-6666-4000 Facsimile 91-22-6666-4001
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Analylicallnstruments Department 7 Hare Street Calcutta 700 001 India Telephone 91-33-2213-4133 Facsimile 91 -33-2213-4102
BLUE STAR LTD (ChennaO Analytical Instruments Department No 46 Garuda Building Cathedral Road Chennai 600 086 India Telephone 91-44-4244-4000 Facsimile 91-44-4244-4190
INDONESIA PT TEKNOLABindo Penta Perkasa Komplek Gading Bukillndah Blok lIll JI Bukfl Gading Raya Kelapa Gading Pennai Jakarta 14240 Indonesia Telephone 62-21-458470575859 Facsimile 62-21-45842729
ITALY JEOL 0TALIA) SpA Centro Direzionale Green Office Via dei Tulipani 1 20090 Pieve Emanuele (MI) Italy Telephone 39-02-9041431 Facsimila 39-02-90414343
KOREA JEOL KOREA LTD
Dongwoo Bldg 7F 1443 Yangjae Daero Gangdong-Gu Seoul 134-010 Korea Telephone 82-2-511-5501 Facsimile 82-2-511-2635
KUWAIT Ashraf amp CO Ltd WLL PO Box 3555 Safat 13036 Kuwait Telephone 965-1805151 Facsimile 965-24335373
MALAYSIA JEOL(MALAYSIA) SDNBHD(3S9011-M)
205 Block A Mezzanine Floor Kelana Business Center 97 Jalan SS 72 Kelana Jaya 47301 Petaling Jaya Selangor Malaysia Telephone 60-3-7492-7722 Facsimile 60-3-7492-7723
MEXICO JEOL DE MEXICO SA DE CV
Arkansas 11 Piso 2 Colonia Napoles Delegacion Benito Juarez CP 03810 Mexico DF Mexico Telephone 52-5-55-211-4511 Facsimile 52-5-55-211-0720
PAKISTAN (KarachI) ANALYTICAL MEASURING SYSTEM (pvn LTD(AMS LTD)
14-C Main Sehar Commercia) Avenue Lane 4 Khayaban-e-Sehar DHA-VII Karachimiddot75500 Pakinstan Telephone 92-21-353455813534074735346057-8 Facsimile 92-21-35345582
PANAMA PROMED SA Parque Industrial Costa del Este Urbanizacion Costa del Este Apartado 0816-01755 Panama Panama Telephone 507-303-3100 FaCSimile 507-303-3115
PHILIPPINES PHILAB INDUSTRIES INC
7487 Bagtikan Street SAY Makati 1203 Metro Manila Phillip pines Telephone 63-2-896-7218 Facsimile 63-2-897-7732
PORTUGAL Izasa Portugal Lda A do Proletariado 1 2790-138 CARNAXIDE Portugal Telephone 351-21-424-73-00 Facsimile 351-21-418-60-20
RUSSIA JEOL (RUS) LLC Krasnoproletarskaya Street 16 Bid 2 127473 Moscow Russian Federation Telephone 7-495-748-7791rr792 Facsimile 7-495-748-7793
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King Abdulaziz Avenue PO Box 215 Riyadh 11411 Saudi Arabia Telephone 966-1-479-3000 Facsimile 966-1-477-1374
SCANDINAVIA SWEDEN JEOL (Skandinaviska)AB
Hammarbacken 6A Box 716191 27 Sollentuna Sweden Telephone 46-8-28-2800 Facsimile 46-8-29-1647
SERVICE amp INFORMATION OFFICE NORWAY JEQL (Skandinaviska)AB
Lorenvangen 23 0580 Oslo NORWAY Telephone 47-2-2-64-7930 Facsimile 47-2-2-65-0619
FINLAND JEOL (Skandlnaviska)AB
Ylakaupinkuja 2 FIN-02360 Espoo Finland Telephone 358-9-8129-0350 Facsimile 358-9-8129-0351
SINGAPORE JEOLASIA PTE LTD
2 Corporation Road 1t01-12 Corporation Place Singapore 618494 Telephone 65-6565-9989 Facsimile 65-6565-7552
SOUTH AFRICA ADI Scientific (Pty) Ltd
370 Angus Crescent Northlands Business Park 29 Newmarket Road
~~=~g~~~2~~1nt~~2_~~~bIlC of South Africa
Facsimile 27-11 -462-1466
SPAIN IZASA SA
Argoneses 13 28100 Alcobendas (poligono IndustriaQ Madrid Spain Te~phone 34-91-663-0500 Facsimile 34-91-663-0545
SWITZERLAND JEOL (GERMANY) GmbH Oskar-Von-Miller Strasse 1 85386 Eching Germany Telephone 49-8165-77346 Facsimile 49-8165-77512
TAIWAN For EO ProQucts JIE DONG CO LTD 7F 112 Chung Hsiao East Road Section 1 Taipei Taiwan 10023 Republic of China Telephone 886-2-2395-2978 Facsimile 886-2~2322-4655
For Mass Spectrometer Products Mass Solutions Technology Co Ltd
5F No79 Sec 1 Xintai 5th Rd Xlzhi Dis New Taipei City 221 Taiwan Republic of China Telephone 886-2-2698-9511 Facsimile 886-2-2698-9512
For Semiconductor Products JEOL TAIWAN SEMICONDUCTORS LTD
11 F-l No 346 Pei-Da Road Hsin-Chu City 300 Taiwan Republic of China Telephone 886-3-523-8490 Facsimile 886-3-523-8503
THAILAND BECTHAI BANGKOK EQUIPMENT amp CHEMICAL CO Ltd
300 Phaholyothin Rd Phayathai Bangkok 10400 Thailand Telephone 66-2-615-2929 Facsimile 66-2-615-23502351
THE NETHERLANDS JEOL (EUROPE) Bv Ureweg 4 NL-2153 PH Nieuw-Vennep The Nelherlands Telephone 31-252-623500 Facsimile 31-252-623501
TURKEY TEKSERAS Kayisdagi )nonu MahKartal Cad No553 34755 Atasehir Istanbul Turkey Telephone 90-216-5736470 Facsimile 90-216-5736475
UAE MRS Group Dubai POBox 171612 Rashid Abdulla AI Noami Building Suite No 306 Damascus Street AI Qusais-3 Dubai UAE Telephone 971-4-2581141 Facsimile 971-4-2581151
JEOLGulf
POBox 171612 bull Rashid Abdulla AI Noami Building Suite No 306 Damascus Street AI Qusais-3 Dubai UAE Telephone 971-553964219(mobile)
USA JEOL USA INC 11 Dearborn Road Peabody MA 01960 USA Telephone 1-978-535-5900 Facsimile 1-978-536-22052206
JEOL USA INC WEST OFFICE
~~s~~~~~rigAe9~5t~~1 1 0 Telephone 1-925-737-1740 Facsimile 1-925-737-1749
VENEZUELA GOMSA Service and Supply CA
Urbanizacion Montalban JlI - Resldenclas Don Andres - Piso 7 - Apartomento 74 Avenida 3 entre calles 7 y 6 Montalban Caracas Venezuela Telephone 58-212-443-4342 Facsimile 58-212-443-4342
VTETNAM TECHNICAL MATERIALS AND RESOURCES IMPORT-EXPORT JOINT STOCK COMPANY(REXCO) Hanoi Branch
No 13-Lot 12 Trung Yen Trung Hoa Street Cau Giay Dist HanOi Vietnam Telephone 84-4-562-051617562-0535 Facsimile 84-4-853-2511
No 0205B389C Printed in Japan Kp
---------
I )SM-66 0 Scanning Electron Microscope
The JSM-6610 is a high-performance SEM
that is equipped with a superb electron
optical system and a general-purpose largeshy
specimen chamber to accommodate a
specimen up to 200 mm diameter The _JSM-6610 incorporates newly designed
__
_- ~I software for easier SEM operations in a
variety of applications
I J5M-ALA series Analytical Scanning Electron Microscopes
The JED-2300 EDS developed by JEOL is
embedded in the compact SEMs The
footprint is same as that of the basic SEM
The SEM and EDS are operated as one
seamless system to provide comfortable
and efficient operation A SDD type EDS
detector does not require liquid nitrogen
EDS analysis is ready whenever you need it
Resolution HV 30 nm
LV 40nm 40nm
Magnification
Accelerating voltage 05 shy 30 kV
x5 shy 300000
03 shy 30 kV
I JASM-6200 C airScor etrade Atmospheric Scanning Electron Microscope
I SM-6510 Scanning Electron Microscope
The JSM-6510 is a high-performance SEM
that is equipped with a superb electron
optical system same as the JSM-6610 and
a general-purpose specimen chamber to
accommodate a specimen up to 150 mm
diameter The JSM-651 0 incorporates
newly designed software for easier SEM
operations in a variety of applications
II 1 30 nm ltr-- rr TJ 01 qamp 05 to 30 kV M~1fIIC3IKlr x5 to 300000
J5 -LV series Low Vacuum SEMs
The low vacuum SEM consists of a
conventional high vacuum mode and a low
vacuum (LV) mode One can select the
vacuum mode with a click on the menu
The LV mode enables one to observe and
analyze non-conductive specimens The
specimen chamber is kept at low vacuum
so that highly out-gassing specimens can
be easily observed
1-lhlIt
Resolution HV 30 nm
LV 40 nm
Low vacuum range 10-270 Pa
The JASM-6200 allows high-resolution light microscopeSEM observation at
atmospheric pressure A specimen is held at normal atmospheric pressure Dynamic
observation of physical or chemical reactions can be made in liquid or gas In addition
for biological applications difficult dehydration and drying processes are not needed
dramatically reducing specimen pre-treatment time
Bnm Imiddot 102030 kV
II
Product Guide I 07
JSM-60l0 AILV InTouchScope
)shy -
JSM-6010LA
I JCM 6000 NeoScopeTM
The InTouchScope incorporates a highly intuitive SEM interface with multi-touch
technology The user can expand application windows and orchestrate aJl functions
just by touching the screen
40 nm (20 kV) 50 nm (20 kV)
05 1020 kV x810 300000
JCM-6000 NeoScopen~ let you observe a specimen at much higher magnification
than a light microscope with the same simple operation of a light microscope The
observation image appears automatically when a specimen is inserted and you can
go up to the maximum magnification of x60OOO quickly with the automated
operations
JCM-6000 NeoScopem is equipped with a TMP for quick start
The installation is easy The wall outlet (100V AC) is the only utility needed Cooling
water is not necessary
FX X10 10 60000
SI - Max 70mm dia
Ion Beam Application Equipment
pIB-09010 Cross Section Polisher (CP)
The IB-090 10CP Cross Section Polisher
makes a cross sect ion by irradiating a
spec imen with argon ion beam along an
edge of a shield plate placed on a
specimen This is an innovative specimen
preparation device for specimens studied in
SEM and EPMA
IIB-09020C Cross Section Polisher (C PIT)
The IB-09020CP Cross Section Polisher
(CPIT) creates a cross section in a manner
similar to the IB-09010CP Its built-in CCO
camera al lows real-time monitoring of a
cross-section during polishing
08 I Product Guide
I J18-4601 MuIti Beam System
I J -4501 MultiBeam System
EM-091001S Ion Slicer
The JIB-4501 MultiBeam System achieves
surfaceinternal 3D imaging and analysis
with simple operation This system also
has optimum geometry for all functions
from FIB SEM observation to EDSEBSD
analyses
R~ Iul N 5 nm (FIB) 25 nm (SEM) A I tlrx] I J 03 kV to 30 kV
(5 kV steps) Magl1lhcnli X30 10 300000
(observation milling)
The Ion Slicer can easily prepare thin-film
specimens for TEM without special skill Prior
treatment required for the Ion Slicer is only to
mechanically polish a specimen to 01 mm
thick The optimally set Ar ion beam provides
high-quality thin films In addition this
innovative tool suppresses specimen damage
and contamination such as lattice distortion
induced by mechanical polishing and
oxidation on specimen suriaces by chemical
treatment The Ion Slicer is an echo-friendly
efficient specimen-preparation tool
The JIB-4601 F MultiBeam System unites the unique imaging and analytical capabilities
of the High Power Optics employed in the TFE SEM and a high-performance FIB
column in a highly efficient and powerful system The JIB-4601 F offers an easy-to-use
tool for highly automated sample preparation combined with high-resolution imaging
and sub-micron analysis of the specimen cross-section
5 nm (FIB) 12 nm (SEM) 02 kV to 30 kV (5 kV sleps)
x30 to 1000000 (observation milling)
I J18-4000 Focused Ion Beam System
Top of the line high-throughput
processing
Compact size for flexible layout shy
Installation space reduced by 20
(compared to JEOL conventional
models)
Superb performance at low accelerating
voltage
Stage Navigation System for fast
determination of observation position
R-_ lit I f1 5 nm ICIIH~ltn lJIO ltJi 1 to 30 kV
M~Q I I x60 (for searching field) X200 to 300000
IIB09060CIS Cryo Ion Slicer
The IB-09060CIS Cryo Ion Slicer
incorporates a specimen cooling
mechanism in the EM-091001S Ion Slicer
for easy preparation of thin filmscross bull I J sections even for specimens susceptible
to thermal damage
J
~
Producl Guide I 09
- ---- shy
_bullbull- _ bullbull 1
- - -~
[Peripheral Equipment ]
IJIC 410 HDT400 JEE-420 series Ion Cleaner Hydrophilic Treatment Device Vacuum Evaporators
The JIC-41 0 Ion Cleaner removes hydrocarbon
contamination on TEM specimens by exposing
specimens in glow discharge
The treated specimens do not build up contamination
during observation in a TEM
JEC560 Auto Carbon Coater
The HDT-400 applies hydrophilic treatment on TEM
grids and SEM specimen mounting blocks The entire
operation is automated
IJFC-1600 Auto Fine Coater
O ~ - --=shy
The JEE-420 vacuum evaporator applies coating on
SEM or TEM specimens with a variety of materials
including gold platinum carbon chromium The JEEshy
420 applies shadowing on TEM specimens
- - C- Ooshy o --nu _ __ a 0 0 0 0
The JEC-560 rapidly applies carbon coating on non-conductive specimens for The JFC series sputter coater applies metal coating on SEM specimens quickly Gold
element analysis with a scanning electron microscope or an electron probe micro gold-palladium and platinum can be applied
analyzers
JED23002300F Energy Dispersive X-ray Spectrometers
Dry SO Detector
The JED-23002300F is installed on a SEM or an EPMA and performs elemental This unique box type Dry SD detector is designed for JSM-651 0 and JSM-601 0 series
analysis on micro areas The Dry SD detector an SDD type detector is cooled SEM The detector is positioned at the optimum position
electrically It does not need liquid nitrogen cooling so that maintenance is not
required Analysis Station the unique EDS analysis software is versatile with simple
operation
All y A~Ilrn System that links observed images with analysis data
inlIytl(oIIUI1Chi1$ Qualitativequantitative analysis linearea analysis
10 I Producl Guide
------
f
Instruments for Microarea and Surface Analysis
IjXA-8530F Field Emission Electron Probe Microanalyzer
The JXA-8530F features an improved hardware that is used in the JXA-8500F (the first
FE-EPMA in the world) as well as newly designed user-friendly PC-GUI windows for
efficient analysis and data operation The FE gun of the JXA-8530F provides not only a
spatial (analysis) resolution of the order of 01 IJm but also high-sensitivity X-ray
detection at low accelerating voltages and large probe currents
IjPS-9200 Photoelectron Spectrometer (XPS)
The JPS-9200 is an XPS that provides microarea analysis A newly developed microshy
tens enables high-sensitivity analysis from macro to microareas Its stage accepts both
standard-size samples (10X 10X2 mm) and large samples (up to gO mm in diameter)
The stage-scan mapping method allows the acquisition of photoelectron images
ranging from low magnification (50 x 18 mm) to high magnification (spatial resolution
30lJm)
I jAMP-9500F Field Emission Auger Microprobe
fl
X 8230 Electron Probe Microanalyzer
D
~) ~ j ) ~ =~=
The JXA-8230 is a newly developed EPMA which succeeds a proven JEOL EPMA
hardware and features newly designed user-friendly PC-GUI windows for efficient
analysis and data operation Sophisticated analysis menus are designed so that the
user can easily access target material analyses offering stress-free operations
I jPS-901 0 series Photoelectron Spectrometers (XPS)
XPS with high-sensitivity and high-resolution is compactly designed on the basis of
JEOLs many years of basic and application technologies on electrostatic lenses
analyzers etc The low-acceleration and large-current ion guns dedicated to permit
XPS analysis of thin films with different thicknesses from surface atomic layers to
micron order thick specimen layers The specimen chamber and etching chamber are
separated from each other in terms of vacuum thus completely preventing the
contamination due to sputtering and facilitating the maintenance of ultrahigh vacuum
A field-emission Auger Microprobe featuring the worlds highest spatial resolution with
the minimum probe diameter of 3 nm (for secondary-electron image) and 8 nm (for
Auger analysis) The new hemispherical electrostatic energy analyzer (HSA) with a
multi-channel detector optimized for Auger analysis is suitable for chemical-state
analysis The neutralizing ion gun allows Auger analysis of insulating materials Its
specimen stage accommodates a large sample of up to 95 mm in diameter Also it is
expandabfe for an UHV-SEM
ProduCI Guide I 11
X-ray Fluorescence Spectrometers
I ISX 400Rll Element Analyzer
An energy-dispersive X-ray fluorescence spectrometer for environmental analysis
which helps you comply with environmental regulations for hazardous substances
such as the RoHS and ELV directives in the EU and soil pollution in Japan You can
easily analyze minute traces of Cd Pb Hg Cr etc This analyzer is also suitable for
general analySiS including element analysis and thickness measurement using the FP
(fundamental parameter) method
I JSX-31 OORll Element Analyzer
An energy-dispersive X-ray fiuorescence spectrometer for environlnlntal analysis which helps you
comply with environmental regulations for hazardous substances such as the RoHS and ELV
directives in the EU and soil pollution in Japan This analyzer inoorporates a JEOL-made electrically
cooled Si(u] detector making liquid nrtrogen unnecessary as well as providing high sensitivity for
heavy-element analysis such as Cd Pb and Hg This analyzer is also surtable for general analysis
including eement analysis and thickness measurement using the FP (fundamental parameter)
method
12 I Product Guide
Semiconductor Eq Ipm nt
2 Electron Beam Lithography System
-5
Electron Beam Lithography System
r
Electron Beam Lithography System
-~=-~--I--~ I
~ ~ ~-
Th e JBX-3200MV is an e lec lro n bea m lithography system developed for the production of next generation ultrahigh-precision masks and reticles This system employs a variableshyshaped electron beam o f 50kV and a step amp repeat specimen stage
High thro ug hp ut enabled by a new PEG (Proximity Effect Correction) system High-speed da la- transfer sys tem for a large quanti ty data High-precision design for masklrelicle production
Th e JBX-9 500FS is a spot beam
lithography system developed to meet a
wi de range of applications with high
throughput and high precision periormance
This sys tem covers fields from the nanoshy
technology research to the production of
leading edge devices
f 100kV _ ZrONV Schotlky emitter
maximum 300 mm wafer
Th e JBX-6300 FS is a s p o t b ea m
lithography system developed to meet a
w ide range o f applica tions with high
resolution and high precision periormance
This system covers fields from the nanoshy
technology research to the development of
next generation devices
25 kVl50 kVl1 00 kV ZrONV Schottky emittelt
maximum 200 mm wafelt
Prod ucl Gu ide I 13
-
---------
-_ -~
- --= - - - =-shy -
NMR Spectrometers
I JNM-ECAECX series FT NMR System
920 MHz magnet Photo courtesy Nationallnstrtute of Natural Sciences Institute for
Molecular Science
The JNM-ECA920 FT NMR System is a 920 MHz high-resolution NMR
spectrometer developed by JEOL This spectrometer uses the superconducting
magnet co-developed by National Institute for Materials Science and Kobe Steel
Ltd which generates the high magnetic field Created by combining Japans stateshy
of-the-art technologies this FT NMR System marks an important milestone in next
generation biology and nanotechnology which call for high-magnetic-field highshy
resclution NMR analysis
JEOL RESONANCE Inc
~ ~ ~
~t~-
~ 100
HNCACB spectrum of 13C(15N labeled Solid 23Na-MQMAS spectrum of ubiqurtin N3)P207
The JNM-ECNECX series are versatile high-performance FT NMR spectrometer
system that utilize the latest digital and high-frequency technology The ECA
spectrometer is applicable up to 1GHz and can be used for a wide range of
applications including liquidsolid NMR protein analysis and diffusion coefficient
measurement
INM-EC cd
JOO ~QO 0(1 ~uo 1)0
Spectrometer I Oscillator receiver power amplifier
Magnet IISCM Field strength 705T I 939T 11 74T 1401T 1643T
Bore diameter (mm) 54 I 54 54 54 54
Probe 5 mm Ttl tunable
11110
188T
54
JEOL RESONANCE Inc
INMmiddot fO rie ---shy
)Ol~ ~1111 011 Oll
Spectrometer Oscillator receiver power amplifier
Magnet I ISCM Field strength 705T 939T I 1174T 1401T
Bore diameter (mm) I 54 54 54 54
Probe I 5 mm TH tunable
JEOL RESONANCE Inc
14 I Produc t Guide
bull bull bull
IJNM-ECS 00 FT NMR System
bull I ASC Series
Auto Sample Changer
ASC8 (8 samples) ASC24 (24 samples)
middotmiddot iT ~ --shy
~ I -~Au
ASC16 (16 samples) ASC64 (64 samples)
bullIJNM-ECAECX series Solid NMR
=- ~
I
l l
bull
0 5ilJl
0
MAS conlroller Solid NMR sampling kit
NMR Systems For Modern NMR Spectroscopy The JNM-ECS400 i s a compact two-channel
spectrometer that retains the advanced capabilities of the
JNM-ECAlECX series (required installation space is oneshy
half compared to conventional NMRs) Programmable
timing sequencers built into each RF and PFG channel
can independently control either synchronous or
asynchronous operations of each channel Its standard
tunable broadband gradient probe which integrates all
JEOLs newest technologies is the high sesitivity roomshy
tempperature probe
Ccmpact spectrometer chassis Innovaten in JEOL NMR digrtal architecture High-stability and high-accuracy digital spectrometer High-sensrtivity new tunable probe Full automalk NMR with advanced software
JEOL RESONANCE Inc
An automatic sample changer makes it
possible to measure many samples
sequentially by exchanging multiple samples
automatically one by one Five changer
models are available for 8 samples 16
samples 24 samples 64 samples and 100
samples
JEOL RESONANCE Inc
ASC100 (100 samples)
1 --0 1(10 C ppm I
Sdid 13C-CPMAS spectrum of cholk acid
Solid-NMR is a technique that measures solid samples (powder or film-like samples) This technique is also effective for measurement of samples not soluble in solvents (inorganic
samples etc) and of crystalline polymorph that is meaningful to measure at the solid state
JEOL RESONANCE Inc
Produci Guide I 15
Mass Spectrometers
I JMS-800D UltraFOCUS I JMS-700 (2) MStation Mass Spectrometer Dedicated to Dioxin Anal ys is High resolution M ass Spectrometer
JMS-800D UltraFOCUS is the optimal cho ice for ultra lowlevel race detection
applications suc h as moni torin g for dioxins and related co mpoun ds eg
Polychlorinated Biphenyls (PCBs) Polybrominated Diphenyl Ethers (PBDEs) or drugs
of abuse by high resolution-selected ion monitoring (HRSIM) gas chromatographyl
mass spectrometry(GCMS)
R-- gtn 80000 (10 valley) Sent Ily 2 3 7 8-TCDD 100fg SNgt2oo
(6 channels 100 msecch Resolution 10000)
N_ Jut J _lllgEI up to 10 kV
JMS-S3000 Matri x Assisted Laser DesorptionIonization TOFMS
The JMS-S3000 is a MALOI-TOFMS incorporating an innovative SpirarrOF ion optical
system With superior capabilities than conventional MALDI-TOFMS the JMS-S3000
provides sate-of-the-art anaiylical solutions for a wide range of research areas such as
functional synthetic polymers materials science and biomolecules
Malrix Assisled Laser Desorpllonlonization Timemiddotof-Flighl Mass Spectrometer
I JMS-T1 OOLP+DART TLC-TOFMS
Pet c 60000 (10 valley) err 02 ng of methyl stearate
SIN 400
(CVEI combination ion source) I~ ~ aJe up to 10kV
I JMS-T1 OOLP LC-TOFMS
I JMS-Tl OOGCV GC-TOFMS
middotl shyThe JMS-T100LP+DART achieves simple and fast TLCMS analysis Accurate mass The JMS-Tl00GCV is a fully automatic Gas Chromatograph - Time-ot-Flight Mass
measurement capabilit y of TOFMS also enables you to determine element Spectrometer (GC-TOFMS) This versatile MS system covers wide range of
compositions of the analytes applications in GC-MS analysis
16 I Pr oduc i Gu ide
- -
---
1----- 1- - - I - =---shy= bull --tJ~ 1- _ ~ __ ~-=--_~
I JMS-Ql 050GC UltraQuad GClMS
cJEOL
-
S-trapHS Headspace Autosampler
ESR Spectrometers
I JES-X3 series ESR Spectrometers
Recently it has been widely
accepted that even retatively few
unpaired electrons in a sample can
affect the function of the material so
lower detection limits (high er
sens itivity) is required of ESR
measurements JES-X3 Series has
achieved higher sensiti v i ty by
developing a lOIN-noise Gunn
oscillator for its new spectrometer
JES-X320 JEOL RESONANCE Inc
i III III )
Maximum Magnetic Field I a6ST 13T 14T
SweepW idth I --00-- 250mT plusmn001 - 500m__T_ __--l
Pole Gap _ _ 6cmm__ ___-= ___~ ____cmm__ _ I 0 = 60mcm 75 _l
Frequency Range(GHz) 8750 - 9650 _ _ _ ___-1
Field Resolution (mT) _L_ 235 Correction by Marker _1_--- Standard
I Operating System Windows 7
The JMS-01050GC is an innovative quadrupole mass spectrometer (OMS) that
achieves the highest-level sensitivity in OMS It has a high ability of evacuation due
to the use of a split flow turbo-molecular pump system (400 Lis) th at
simultaneously evacuates the ion source and the detector The use of a highshy
accuracy hyperbolic quadrupole mass analyzer provides high resolution
The S-trap is a next-generation headspace autosampler providing ultra-low
concentration measurement which was not achieved with a heads pace (HS) method
using conventional sample loop In addition the HS-GCMS system combined lith a
JMS-01050GC Mkll quaorupole MS guarantees detection of mold odor in water
down to 1 ppt
I ES-CT470 Liquid Helium Variable Temperature Controller
The ES-CT470 varies the sample temperature in the temperature range between 25 K
and 470 K Temperature setting is performed by d igital display and the set
temperature is kept constant by automatic control circui ts Combined use with a UV Irradiation device is possible A GaAs etement is used as a temperature sensor
enabling high-accuracy temperature setling
- 25 K to 470 K
plusmn001 K for 25 K to 42 K
plusmn1 orO5 K for 42 K to 470 K
_ 20 min 10 25 min (rom room temperature 08 to 2 Uh
50Hz60Hz 5mm JEOL RESONANCE Inc
Produ c t Guide I 17
Industrial Equipm nt for thin-filnl formation and nlatel ial processing
I bull
Electron Beam Source High-power Electron Beam Source
BS-60060EBS EBG-102UB6S
Electron beam sources for vacuum evaporation of metal and metal-oxide thin-films
We offer a wide variety of electron beam sources and crucibles They have features of
excellent beam spot and energy density and high-speed sweeping
1 PGBS 80020CPPS Plasma Source
BS-80011 BPG (6kW) BS-8002OCPPS (3kW)
Plasma Sources are installed in a vacuum chamber and generate high-density plasma
Used as Ion Plating (Plasma Assisted Deposition) and it is possible to improve film
properties for optilcal thin films protective films and function films Because highshy
density plasma can be generated in a mass space high-rate deposition to a large area
is possible
I RF Induction Plasma System
JEBG-3000UB(300kW) JEBG-1 OOOUB(1 OOkW)
High-power electron beam sources for vacuum evaporation of metal and metal-oxide
for wide plastic films or large glass plates that are continuously fed And they can also
be used for vacuum melting of high-melting point metals
raes
RF Generator
t shy - - - --- - - --- -
0-~ 0 bull bullbull - -
RF-12030 (3kW) RF-56000 (Controller)
13 56MHz radio-frequency power supplies for plasma generation and used for
sputtering CVD etching and ion-plating We offer 750W to 6kW generators and
matching networks
DR Powder Feeder
Thermal plasma around 10000degC (15000deg F) by RF inductive coupling This thermal Fine powder feeder that can feed 01 to 100 11m size fine powder continuously with
plasma is used for nano powder synthesis fine powder spheroidization thick film carrier gas We offer optional feeding rate controller and large capacity hopper
deposition multi composite membrane synthesis CVD and harmful gas
decomposition
18 I Produci Guide
---
Biochemical Analyzers
I JCA-BM series Clinical Chemistry Analyzer BioMajesty Series
JEOLs micro volume technology and unique sample pre-dilution mechanism realizes
high throughput chemistry analysis with reduced sample and reagent volume
More than 4000 systems have been placed in clinical laboratories allover the world
JCA-BM6050
I JCA-BMBOOO series Ultra High Throughput Clinical Chemistry Analyzer
4 4
JCA-BMB060 egt
JCA-BMSOOO series offer ultra high throughput chemistry analysis up to 9000 testsl
hour
The pre-dilution unit one of the BioMajesty family features also continues the strong
tradition in these series with interconnected multiple analysis modules the key factors
that accomplish brilliant high throughput as well as downtime reduction with back-up
capability
I JCA-BM6070 High Throughput High Performance Clinical Chemistry An alyzer
I I I
A Clinical chemistry analyzer with incomparable speed and accuracy which achieves
high throughput of 2400 testslhour (includ ing ISE) The incorporated compact
workstation and user-friendly Interface with excellent operability leads the new trend of
the laboratory testing
BioMajesty Series lCA-BM 6010 lCA-BM 6050
lCA-8M 6070 leA-BM 91 30
lCA-BM 8000 Series
bull This product is distributed outside Japan by Siemens Heatthcare Diagnostics under the ADVtAreg brand name
I JCA-BM601 OC Compact amp High Performance Clinical Chemistry Analyzer
-~-I -
1lIIIIIIilllllllllJllnlIlII Ii I JCA-BM6010C is a compact but efficient automatic analyzer that maintains the basic
concept of BioMajesty series while achieving the excellent capability of microanalysis
with sample volume as small as 1 J1L
BM6010C also offers fully automated HbA1 c analysis with on-board hemolysis
(optional) Simultaneous measurement of Glucose and HbA1c improves laboratory
workflow
Product Guid e I 19
S~~MCEAII Certain products in this brochure are controlled under the Foreign 0J 0014007 -v- ~ Exchange and Foreign Trade Law of Japan in compliance with $ ~~~ international security export control JEOL Ltd must provide the~2 m) IIlt Japanese Government with End-users Statement of Assurancel A MGMT SYS
AvA ~ m and End-use Certificate in order to obtain the export license - tiJ needed for export from Japan If the product to be exported is in this category the end user will be asked to fill in these certificate formsdEOLIS09001 amp150 14001CenrfiCltlled
httpwwwjeolcomdEOL JEOL Ltd 1-2 Musashino 3-chome Akishima Tokyo 196-8558 Japan Sales Division Telephone+81-42-528-3381 Facsimile+81-42-528-3386
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Unit No1 009 1 OF Prosperity Milennia Plaza 663 Kings Road North Point Hong Kong Telephone 852-2815-7299 Facsimile 852-2581-4635
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Analylicallnstruments Department 7 Hare Street Calcutta 700 001 India Telephone 91-33-2213-4133 Facsimile 91 -33-2213-4102
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Dongwoo Bldg 7F 1443 Yangjae Daero Gangdong-Gu Seoul 134-010 Korea Telephone 82-2-511-5501 Facsimile 82-2-511-2635
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2 Corporation Road 1t01-12 Corporation Place Singapore 618494 Telephone 65-6565-9989 Facsimile 65-6565-7552
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370 Angus Crescent Northlands Business Park 29 Newmarket Road
~~=~g~~~2~~1nt~~2_~~~bIlC of South Africa
Facsimile 27-11 -462-1466
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Argoneses 13 28100 Alcobendas (poligono IndustriaQ Madrid Spain Te~phone 34-91-663-0500 Facsimile 34-91-663-0545
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For Mass Spectrometer Products Mass Solutions Technology Co Ltd
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USA JEOL USA INC 11 Dearborn Road Peabody MA 01960 USA Telephone 1-978-535-5900 Facsimile 1-978-536-22052206
JEOL USA INC WEST OFFICE
~~s~~~~~rigAe9~5t~~1 1 0 Telephone 1-925-737-1740 Facsimile 1-925-737-1749
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No 13-Lot 12 Trung Yen Trung Hoa Street Cau Giay Dist HanOi Vietnam Telephone 84-4-562-051617562-0535 Facsimile 84-4-853-2511
No 0205B389C Printed in Japan Kp
JSM-60l0 AILV InTouchScope
)shy -
JSM-6010LA
I JCM 6000 NeoScopeTM
The InTouchScope incorporates a highly intuitive SEM interface with multi-touch
technology The user can expand application windows and orchestrate aJl functions
just by touching the screen
40 nm (20 kV) 50 nm (20 kV)
05 1020 kV x810 300000
JCM-6000 NeoScopen~ let you observe a specimen at much higher magnification
than a light microscope with the same simple operation of a light microscope The
observation image appears automatically when a specimen is inserted and you can
go up to the maximum magnification of x60OOO quickly with the automated
operations
JCM-6000 NeoScopem is equipped with a TMP for quick start
The installation is easy The wall outlet (100V AC) is the only utility needed Cooling
water is not necessary
FX X10 10 60000
SI - Max 70mm dia
Ion Beam Application Equipment
pIB-09010 Cross Section Polisher (CP)
The IB-090 10CP Cross Section Polisher
makes a cross sect ion by irradiating a
spec imen with argon ion beam along an
edge of a shield plate placed on a
specimen This is an innovative specimen
preparation device for specimens studied in
SEM and EPMA
IIB-09020C Cross Section Polisher (C PIT)
The IB-09020CP Cross Section Polisher
(CPIT) creates a cross section in a manner
similar to the IB-09010CP Its built-in CCO
camera al lows real-time monitoring of a
cross-section during polishing
08 I Product Guide
I J18-4601 MuIti Beam System
I J -4501 MultiBeam System
EM-091001S Ion Slicer
The JIB-4501 MultiBeam System achieves
surfaceinternal 3D imaging and analysis
with simple operation This system also
has optimum geometry for all functions
from FIB SEM observation to EDSEBSD
analyses
R~ Iul N 5 nm (FIB) 25 nm (SEM) A I tlrx] I J 03 kV to 30 kV
(5 kV steps) Magl1lhcnli X30 10 300000
(observation milling)
The Ion Slicer can easily prepare thin-film
specimens for TEM without special skill Prior
treatment required for the Ion Slicer is only to
mechanically polish a specimen to 01 mm
thick The optimally set Ar ion beam provides
high-quality thin films In addition this
innovative tool suppresses specimen damage
and contamination such as lattice distortion
induced by mechanical polishing and
oxidation on specimen suriaces by chemical
treatment The Ion Slicer is an echo-friendly
efficient specimen-preparation tool
The JIB-4601 F MultiBeam System unites the unique imaging and analytical capabilities
of the High Power Optics employed in the TFE SEM and a high-performance FIB
column in a highly efficient and powerful system The JIB-4601 F offers an easy-to-use
tool for highly automated sample preparation combined with high-resolution imaging
and sub-micron analysis of the specimen cross-section
5 nm (FIB) 12 nm (SEM) 02 kV to 30 kV (5 kV sleps)
x30 to 1000000 (observation milling)
I J18-4000 Focused Ion Beam System
Top of the line high-throughput
processing
Compact size for flexible layout shy
Installation space reduced by 20
(compared to JEOL conventional
models)
Superb performance at low accelerating
voltage
Stage Navigation System for fast
determination of observation position
R-_ lit I f1 5 nm ICIIH~ltn lJIO ltJi 1 to 30 kV
M~Q I I x60 (for searching field) X200 to 300000
IIB09060CIS Cryo Ion Slicer
The IB-09060CIS Cryo Ion Slicer
incorporates a specimen cooling
mechanism in the EM-091001S Ion Slicer
for easy preparation of thin filmscross bull I J sections even for specimens susceptible
to thermal damage
J
~
Producl Guide I 09
- ---- shy
_bullbull- _ bullbull 1
- - -~
[Peripheral Equipment ]
IJIC 410 HDT400 JEE-420 series Ion Cleaner Hydrophilic Treatment Device Vacuum Evaporators
The JIC-41 0 Ion Cleaner removes hydrocarbon
contamination on TEM specimens by exposing
specimens in glow discharge
The treated specimens do not build up contamination
during observation in a TEM
JEC560 Auto Carbon Coater
The HDT-400 applies hydrophilic treatment on TEM
grids and SEM specimen mounting blocks The entire
operation is automated
IJFC-1600 Auto Fine Coater
O ~ - --=shy
The JEE-420 vacuum evaporator applies coating on
SEM or TEM specimens with a variety of materials
including gold platinum carbon chromium The JEEshy
420 applies shadowing on TEM specimens
- - C- Ooshy o --nu _ __ a 0 0 0 0
The JEC-560 rapidly applies carbon coating on non-conductive specimens for The JFC series sputter coater applies metal coating on SEM specimens quickly Gold
element analysis with a scanning electron microscope or an electron probe micro gold-palladium and platinum can be applied
analyzers
JED23002300F Energy Dispersive X-ray Spectrometers
Dry SO Detector
The JED-23002300F is installed on a SEM or an EPMA and performs elemental This unique box type Dry SD detector is designed for JSM-651 0 and JSM-601 0 series
analysis on micro areas The Dry SD detector an SDD type detector is cooled SEM The detector is positioned at the optimum position
electrically It does not need liquid nitrogen cooling so that maintenance is not
required Analysis Station the unique EDS analysis software is versatile with simple
operation
All y A~Ilrn System that links observed images with analysis data
inlIytl(oIIUI1Chi1$ Qualitativequantitative analysis linearea analysis
10 I Producl Guide
------
f
Instruments for Microarea and Surface Analysis
IjXA-8530F Field Emission Electron Probe Microanalyzer
The JXA-8530F features an improved hardware that is used in the JXA-8500F (the first
FE-EPMA in the world) as well as newly designed user-friendly PC-GUI windows for
efficient analysis and data operation The FE gun of the JXA-8530F provides not only a
spatial (analysis) resolution of the order of 01 IJm but also high-sensitivity X-ray
detection at low accelerating voltages and large probe currents
IjPS-9200 Photoelectron Spectrometer (XPS)
The JPS-9200 is an XPS that provides microarea analysis A newly developed microshy
tens enables high-sensitivity analysis from macro to microareas Its stage accepts both
standard-size samples (10X 10X2 mm) and large samples (up to gO mm in diameter)
The stage-scan mapping method allows the acquisition of photoelectron images
ranging from low magnification (50 x 18 mm) to high magnification (spatial resolution
30lJm)
I jAMP-9500F Field Emission Auger Microprobe
fl
X 8230 Electron Probe Microanalyzer
D
~) ~ j ) ~ =~=
The JXA-8230 is a newly developed EPMA which succeeds a proven JEOL EPMA
hardware and features newly designed user-friendly PC-GUI windows for efficient
analysis and data operation Sophisticated analysis menus are designed so that the
user can easily access target material analyses offering stress-free operations
I jPS-901 0 series Photoelectron Spectrometers (XPS)
XPS with high-sensitivity and high-resolution is compactly designed on the basis of
JEOLs many years of basic and application technologies on electrostatic lenses
analyzers etc The low-acceleration and large-current ion guns dedicated to permit
XPS analysis of thin films with different thicknesses from surface atomic layers to
micron order thick specimen layers The specimen chamber and etching chamber are
separated from each other in terms of vacuum thus completely preventing the
contamination due to sputtering and facilitating the maintenance of ultrahigh vacuum
A field-emission Auger Microprobe featuring the worlds highest spatial resolution with
the minimum probe diameter of 3 nm (for secondary-electron image) and 8 nm (for
Auger analysis) The new hemispherical electrostatic energy analyzer (HSA) with a
multi-channel detector optimized for Auger analysis is suitable for chemical-state
analysis The neutralizing ion gun allows Auger analysis of insulating materials Its
specimen stage accommodates a large sample of up to 95 mm in diameter Also it is
expandabfe for an UHV-SEM
ProduCI Guide I 11
X-ray Fluorescence Spectrometers
I ISX 400Rll Element Analyzer
An energy-dispersive X-ray fluorescence spectrometer for environmental analysis
which helps you comply with environmental regulations for hazardous substances
such as the RoHS and ELV directives in the EU and soil pollution in Japan You can
easily analyze minute traces of Cd Pb Hg Cr etc This analyzer is also suitable for
general analySiS including element analysis and thickness measurement using the FP
(fundamental parameter) method
I JSX-31 OORll Element Analyzer
An energy-dispersive X-ray fiuorescence spectrometer for environlnlntal analysis which helps you
comply with environmental regulations for hazardous substances such as the RoHS and ELV
directives in the EU and soil pollution in Japan This analyzer inoorporates a JEOL-made electrically
cooled Si(u] detector making liquid nrtrogen unnecessary as well as providing high sensitivity for
heavy-element analysis such as Cd Pb and Hg This analyzer is also surtable for general analysis
including eement analysis and thickness measurement using the FP (fundamental parameter)
method
12 I Product Guide
Semiconductor Eq Ipm nt
2 Electron Beam Lithography System
-5
Electron Beam Lithography System
r
Electron Beam Lithography System
-~=-~--I--~ I
~ ~ ~-
Th e JBX-3200MV is an e lec lro n bea m lithography system developed for the production of next generation ultrahigh-precision masks and reticles This system employs a variableshyshaped electron beam o f 50kV and a step amp repeat specimen stage
High thro ug hp ut enabled by a new PEG (Proximity Effect Correction) system High-speed da la- transfer sys tem for a large quanti ty data High-precision design for masklrelicle production
Th e JBX-9 500FS is a spot beam
lithography system developed to meet a
wi de range of applications with high
throughput and high precision periormance
This sys tem covers fields from the nanoshy
technology research to the production of
leading edge devices
f 100kV _ ZrONV Schotlky emitter
maximum 300 mm wafer
Th e JBX-6300 FS is a s p o t b ea m
lithography system developed to meet a
w ide range o f applica tions with high
resolution and high precision periormance
This system covers fields from the nanoshy
technology research to the development of
next generation devices
25 kVl50 kVl1 00 kV ZrONV Schottky emittelt
maximum 200 mm wafelt
Prod ucl Gu ide I 13
-
---------
-_ -~
- --= - - - =-shy -
NMR Spectrometers
I JNM-ECAECX series FT NMR System
920 MHz magnet Photo courtesy Nationallnstrtute of Natural Sciences Institute for
Molecular Science
The JNM-ECA920 FT NMR System is a 920 MHz high-resolution NMR
spectrometer developed by JEOL This spectrometer uses the superconducting
magnet co-developed by National Institute for Materials Science and Kobe Steel
Ltd which generates the high magnetic field Created by combining Japans stateshy
of-the-art technologies this FT NMR System marks an important milestone in next
generation biology and nanotechnology which call for high-magnetic-field highshy
resclution NMR analysis
JEOL RESONANCE Inc
~ ~ ~
~t~-
~ 100
HNCACB spectrum of 13C(15N labeled Solid 23Na-MQMAS spectrum of ubiqurtin N3)P207
The JNM-ECNECX series are versatile high-performance FT NMR spectrometer
system that utilize the latest digital and high-frequency technology The ECA
spectrometer is applicable up to 1GHz and can be used for a wide range of
applications including liquidsolid NMR protein analysis and diffusion coefficient
measurement
INM-EC cd
JOO ~QO 0(1 ~uo 1)0
Spectrometer I Oscillator receiver power amplifier
Magnet IISCM Field strength 705T I 939T 11 74T 1401T 1643T
Bore diameter (mm) 54 I 54 54 54 54
Probe 5 mm Ttl tunable
11110
188T
54
JEOL RESONANCE Inc
INMmiddot fO rie ---shy
)Ol~ ~1111 011 Oll
Spectrometer Oscillator receiver power amplifier
Magnet I ISCM Field strength 705T 939T I 1174T 1401T
Bore diameter (mm) I 54 54 54 54
Probe I 5 mm TH tunable
JEOL RESONANCE Inc
14 I Produc t Guide
bull bull bull
IJNM-ECS 00 FT NMR System
bull I ASC Series
Auto Sample Changer
ASC8 (8 samples) ASC24 (24 samples)
middotmiddot iT ~ --shy
~ I -~Au
ASC16 (16 samples) ASC64 (64 samples)
bullIJNM-ECAECX series Solid NMR
=- ~
I
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MAS conlroller Solid NMR sampling kit
NMR Systems For Modern NMR Spectroscopy The JNM-ECS400 i s a compact two-channel
spectrometer that retains the advanced capabilities of the
JNM-ECAlECX series (required installation space is oneshy
half compared to conventional NMRs) Programmable
timing sequencers built into each RF and PFG channel
can independently control either synchronous or
asynchronous operations of each channel Its standard
tunable broadband gradient probe which integrates all
JEOLs newest technologies is the high sesitivity roomshy
tempperature probe
Ccmpact spectrometer chassis Innovaten in JEOL NMR digrtal architecture High-stability and high-accuracy digital spectrometer High-sensrtivity new tunable probe Full automalk NMR with advanced software
JEOL RESONANCE Inc
An automatic sample changer makes it
possible to measure many samples
sequentially by exchanging multiple samples
automatically one by one Five changer
models are available for 8 samples 16
samples 24 samples 64 samples and 100
samples
JEOL RESONANCE Inc
ASC100 (100 samples)
1 --0 1(10 C ppm I
Sdid 13C-CPMAS spectrum of cholk acid
Solid-NMR is a technique that measures solid samples (powder or film-like samples) This technique is also effective for measurement of samples not soluble in solvents (inorganic
samples etc) and of crystalline polymorph that is meaningful to measure at the solid state
JEOL RESONANCE Inc
Produci Guide I 15
Mass Spectrometers
I JMS-800D UltraFOCUS I JMS-700 (2) MStation Mass Spectrometer Dedicated to Dioxin Anal ys is High resolution M ass Spectrometer
JMS-800D UltraFOCUS is the optimal cho ice for ultra lowlevel race detection
applications suc h as moni torin g for dioxins and related co mpoun ds eg
Polychlorinated Biphenyls (PCBs) Polybrominated Diphenyl Ethers (PBDEs) or drugs
of abuse by high resolution-selected ion monitoring (HRSIM) gas chromatographyl
mass spectrometry(GCMS)
R-- gtn 80000 (10 valley) Sent Ily 2 3 7 8-TCDD 100fg SNgt2oo
(6 channels 100 msecch Resolution 10000)
N_ Jut J _lllgEI up to 10 kV
JMS-S3000 Matri x Assisted Laser DesorptionIonization TOFMS
The JMS-S3000 is a MALOI-TOFMS incorporating an innovative SpirarrOF ion optical
system With superior capabilities than conventional MALDI-TOFMS the JMS-S3000
provides sate-of-the-art anaiylical solutions for a wide range of research areas such as
functional synthetic polymers materials science and biomolecules
Malrix Assisled Laser Desorpllonlonization Timemiddotof-Flighl Mass Spectrometer
I JMS-T1 OOLP+DART TLC-TOFMS
Pet c 60000 (10 valley) err 02 ng of methyl stearate
SIN 400
(CVEI combination ion source) I~ ~ aJe up to 10kV
I JMS-T1 OOLP LC-TOFMS
I JMS-Tl OOGCV GC-TOFMS
middotl shyThe JMS-T100LP+DART achieves simple and fast TLCMS analysis Accurate mass The JMS-Tl00GCV is a fully automatic Gas Chromatograph - Time-ot-Flight Mass
measurement capabilit y of TOFMS also enables you to determine element Spectrometer (GC-TOFMS) This versatile MS system covers wide range of
compositions of the analytes applications in GC-MS analysis
16 I Pr oduc i Gu ide
- -
---
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I JMS-Ql 050GC UltraQuad GClMS
cJEOL
-
S-trapHS Headspace Autosampler
ESR Spectrometers
I JES-X3 series ESR Spectrometers
Recently it has been widely
accepted that even retatively few
unpaired electrons in a sample can
affect the function of the material so
lower detection limits (high er
sens itivity) is required of ESR
measurements JES-X3 Series has
achieved higher sensiti v i ty by
developing a lOIN-noise Gunn
oscillator for its new spectrometer
JES-X320 JEOL RESONANCE Inc
i III III )
Maximum Magnetic Field I a6ST 13T 14T
SweepW idth I --00-- 250mT plusmn001 - 500m__T_ __--l
Pole Gap _ _ 6cmm__ ___-= ___~ ____cmm__ _ I 0 = 60mcm 75 _l
Frequency Range(GHz) 8750 - 9650 _ _ _ ___-1
Field Resolution (mT) _L_ 235 Correction by Marker _1_--- Standard
I Operating System Windows 7
The JMS-01050GC is an innovative quadrupole mass spectrometer (OMS) that
achieves the highest-level sensitivity in OMS It has a high ability of evacuation due
to the use of a split flow turbo-molecular pump system (400 Lis) th at
simultaneously evacuates the ion source and the detector The use of a highshy
accuracy hyperbolic quadrupole mass analyzer provides high resolution
The S-trap is a next-generation headspace autosampler providing ultra-low
concentration measurement which was not achieved with a heads pace (HS) method
using conventional sample loop In addition the HS-GCMS system combined lith a
JMS-01050GC Mkll quaorupole MS guarantees detection of mold odor in water
down to 1 ppt
I ES-CT470 Liquid Helium Variable Temperature Controller
The ES-CT470 varies the sample temperature in the temperature range between 25 K
and 470 K Temperature setting is performed by d igital display and the set
temperature is kept constant by automatic control circui ts Combined use with a UV Irradiation device is possible A GaAs etement is used as a temperature sensor
enabling high-accuracy temperature setling
- 25 K to 470 K
plusmn001 K for 25 K to 42 K
plusmn1 orO5 K for 42 K to 470 K
_ 20 min 10 25 min (rom room temperature 08 to 2 Uh
50Hz60Hz 5mm JEOL RESONANCE Inc
Produ c t Guide I 17
Industrial Equipm nt for thin-filnl formation and nlatel ial processing
I bull
Electron Beam Source High-power Electron Beam Source
BS-60060EBS EBG-102UB6S
Electron beam sources for vacuum evaporation of metal and metal-oxide thin-films
We offer a wide variety of electron beam sources and crucibles They have features of
excellent beam spot and energy density and high-speed sweeping
1 PGBS 80020CPPS Plasma Source
BS-80011 BPG (6kW) BS-8002OCPPS (3kW)
Plasma Sources are installed in a vacuum chamber and generate high-density plasma
Used as Ion Plating (Plasma Assisted Deposition) and it is possible to improve film
properties for optilcal thin films protective films and function films Because highshy
density plasma can be generated in a mass space high-rate deposition to a large area
is possible
I RF Induction Plasma System
JEBG-3000UB(300kW) JEBG-1 OOOUB(1 OOkW)
High-power electron beam sources for vacuum evaporation of metal and metal-oxide
for wide plastic films or large glass plates that are continuously fed And they can also
be used for vacuum melting of high-melting point metals
raes
RF Generator
t shy - - - --- - - --- -
0-~ 0 bull bullbull - -
RF-12030 (3kW) RF-56000 (Controller)
13 56MHz radio-frequency power supplies for plasma generation and used for
sputtering CVD etching and ion-plating We offer 750W to 6kW generators and
matching networks
DR Powder Feeder
Thermal plasma around 10000degC (15000deg F) by RF inductive coupling This thermal Fine powder feeder that can feed 01 to 100 11m size fine powder continuously with
plasma is used for nano powder synthesis fine powder spheroidization thick film carrier gas We offer optional feeding rate controller and large capacity hopper
deposition multi composite membrane synthesis CVD and harmful gas
decomposition
18 I Produci Guide
---
Biochemical Analyzers
I JCA-BM series Clinical Chemistry Analyzer BioMajesty Series
JEOLs micro volume technology and unique sample pre-dilution mechanism realizes
high throughput chemistry analysis with reduced sample and reagent volume
More than 4000 systems have been placed in clinical laboratories allover the world
JCA-BM6050
I JCA-BMBOOO series Ultra High Throughput Clinical Chemistry Analyzer
4 4
JCA-BMB060 egt
JCA-BMSOOO series offer ultra high throughput chemistry analysis up to 9000 testsl
hour
The pre-dilution unit one of the BioMajesty family features also continues the strong
tradition in these series with interconnected multiple analysis modules the key factors
that accomplish brilliant high throughput as well as downtime reduction with back-up
capability
I JCA-BM6070 High Throughput High Performance Clinical Chemistry An alyzer
I I I
A Clinical chemistry analyzer with incomparable speed and accuracy which achieves
high throughput of 2400 testslhour (includ ing ISE) The incorporated compact
workstation and user-friendly Interface with excellent operability leads the new trend of
the laboratory testing
BioMajesty Series lCA-BM 6010 lCA-BM 6050
lCA-8M 6070 leA-BM 91 30
lCA-BM 8000 Series
bull This product is distributed outside Japan by Siemens Heatthcare Diagnostics under the ADVtAreg brand name
I JCA-BM601 OC Compact amp High Performance Clinical Chemistry Analyzer
-~-I -
1lIIIIIIilllllllllJllnlIlII Ii I JCA-BM6010C is a compact but efficient automatic analyzer that maintains the basic
concept of BioMajesty series while achieving the excellent capability of microanalysis
with sample volume as small as 1 J1L
BM6010C also offers fully automated HbA1 c analysis with on-board hemolysis
(optional) Simultaneous measurement of Glucose and HbA1c improves laboratory
workflow
Product Guid e I 19
S~~MCEAII Certain products in this brochure are controlled under the Foreign 0J 0014007 -v- ~ Exchange and Foreign Trade Law of Japan in compliance with $ ~~~ international security export control JEOL Ltd must provide the~2 m) IIlt Japanese Government with End-users Statement of Assurancel A MGMT SYS
AvA ~ m and End-use Certificate in order to obtain the export license - tiJ needed for export from Japan If the product to be exported is in this category the end user will be asked to fill in these certificate formsdEOLIS09001 amp150 14001CenrfiCltlled
httpwwwjeolcomdEOL JEOL Ltd 1-2 Musashino 3-chome Akishima Tokyo 196-8558 Japan Sales Division Telephone+81-42-528-3381 Facsimile+81-42-528-3386
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3rd Fl Nile Center Bldg Nawal Slree Dokkl (Cairo) Egypt Telephone 20-2-3335-7220 Facsimile 20-2-3338-4186
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GERMANY JEOL (GERMANY) GmbH Oskar-Von-Miller-Strasse 1 a 85386 Eching Gennany Telephone 49-8165-77346 Facsimile 49-8165-77512
GREAT BRITAIN amp IRELAND JEOL (UK) LTD JEOL House Silver Court Watchmeaci Welwyn Garden City Herts AL71LT UK Telephone 44-1707 -377117 FaCSimile 44-1707-373254
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56-58S Trikoupl Str PO Box 26140 GR-10022 Athens Greece Telephone 30-1-823-5383 Facsimile 30-1-823-9567
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Unit No1 009 1 OF Prosperity Milennia Plaza 663 Kings Road North Point Hong Kong Telephone 852-2815-7299 Facsimile 852-2581-4635
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Elegance Tower Level 2 2128 Old Mathura Road Jasola Business District Centre Near Apollo Hospital Jasola New Delhi 110025 India Telephone 91-11-6472-2578 Facsimile 91-11-4060-1235
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Analyticallnstrments Department Sahas 41412 Veer Savarkar Marg Prabhadery Mumbai 400 025 India Telephone 91-22-6666-4000 Facsimile 91-22-6666-4001
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Analylicallnstruments Department 7 Hare Street Calcutta 700 001 India Telephone 91-33-2213-4133 Facsimile 91 -33-2213-4102
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ITALY JEOL 0TALIA) SpA Centro Direzionale Green Office Via dei Tulipani 1 20090 Pieve Emanuele (MI) Italy Telephone 39-02-9041431 Facsimila 39-02-90414343
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Dongwoo Bldg 7F 1443 Yangjae Daero Gangdong-Gu Seoul 134-010 Korea Telephone 82-2-511-5501 Facsimile 82-2-511-2635
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14-C Main Sehar Commercia) Avenue Lane 4 Khayaban-e-Sehar DHA-VII Karachimiddot75500 Pakinstan Telephone 92-21-353455813534074735346057-8 Facsimile 92-21-35345582
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PHILIPPINES PHILAB INDUSTRIES INC
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Hammarbacken 6A Box 716191 27 Sollentuna Sweden Telephone 46-8-28-2800 Facsimile 46-8-29-1647
SERVICE amp INFORMATION OFFICE NORWAY JEQL (Skandinaviska)AB
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Ylakaupinkuja 2 FIN-02360 Espoo Finland Telephone 358-9-8129-0350 Facsimile 358-9-8129-0351
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2 Corporation Road 1t01-12 Corporation Place Singapore 618494 Telephone 65-6565-9989 Facsimile 65-6565-7552
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370 Angus Crescent Northlands Business Park 29 Newmarket Road
~~=~g~~~2~~1nt~~2_~~~bIlC of South Africa
Facsimile 27-11 -462-1466
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Argoneses 13 28100 Alcobendas (poligono IndustriaQ Madrid Spain Te~phone 34-91-663-0500 Facsimile 34-91-663-0545
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For Mass Spectrometer Products Mass Solutions Technology Co Ltd
5F No79 Sec 1 Xintai 5th Rd Xlzhi Dis New Taipei City 221 Taiwan Republic of China Telephone 886-2-2698-9511 Facsimile 886-2-2698-9512
For Semiconductor Products JEOL TAIWAN SEMICONDUCTORS LTD
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JEOLGulf
POBox 171612 bull Rashid Abdulla AI Noami Building Suite No 306 Damascus Street AI Qusais-3 Dubai UAE Telephone 971-553964219(mobile)
USA JEOL USA INC 11 Dearborn Road Peabody MA 01960 USA Telephone 1-978-535-5900 Facsimile 1-978-536-22052206
JEOL USA INC WEST OFFICE
~~s~~~~~rigAe9~5t~~1 1 0 Telephone 1-925-737-1740 Facsimile 1-925-737-1749
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No 13-Lot 12 Trung Yen Trung Hoa Street Cau Giay Dist HanOi Vietnam Telephone 84-4-562-051617562-0535 Facsimile 84-4-853-2511
No 0205B389C Printed in Japan Kp
I J18-4601 MuIti Beam System
I J -4501 MultiBeam System
EM-091001S Ion Slicer
The JIB-4501 MultiBeam System achieves
surfaceinternal 3D imaging and analysis
with simple operation This system also
has optimum geometry for all functions
from FIB SEM observation to EDSEBSD
analyses
R~ Iul N 5 nm (FIB) 25 nm (SEM) A I tlrx] I J 03 kV to 30 kV
(5 kV steps) Magl1lhcnli X30 10 300000
(observation milling)
The Ion Slicer can easily prepare thin-film
specimens for TEM without special skill Prior
treatment required for the Ion Slicer is only to
mechanically polish a specimen to 01 mm
thick The optimally set Ar ion beam provides
high-quality thin films In addition this
innovative tool suppresses specimen damage
and contamination such as lattice distortion
induced by mechanical polishing and
oxidation on specimen suriaces by chemical
treatment The Ion Slicer is an echo-friendly
efficient specimen-preparation tool
The JIB-4601 F MultiBeam System unites the unique imaging and analytical capabilities
of the High Power Optics employed in the TFE SEM and a high-performance FIB
column in a highly efficient and powerful system The JIB-4601 F offers an easy-to-use
tool for highly automated sample preparation combined with high-resolution imaging
and sub-micron analysis of the specimen cross-section
5 nm (FIB) 12 nm (SEM) 02 kV to 30 kV (5 kV sleps)
x30 to 1000000 (observation milling)
I J18-4000 Focused Ion Beam System
Top of the line high-throughput
processing
Compact size for flexible layout shy
Installation space reduced by 20
(compared to JEOL conventional
models)
Superb performance at low accelerating
voltage
Stage Navigation System for fast
determination of observation position
R-_ lit I f1 5 nm ICIIH~ltn lJIO ltJi 1 to 30 kV
M~Q I I x60 (for searching field) X200 to 300000
IIB09060CIS Cryo Ion Slicer
The IB-09060CIS Cryo Ion Slicer
incorporates a specimen cooling
mechanism in the EM-091001S Ion Slicer
for easy preparation of thin filmscross bull I J sections even for specimens susceptible
to thermal damage
J
~
Producl Guide I 09
- ---- shy
_bullbull- _ bullbull 1
- - -~
[Peripheral Equipment ]
IJIC 410 HDT400 JEE-420 series Ion Cleaner Hydrophilic Treatment Device Vacuum Evaporators
The JIC-41 0 Ion Cleaner removes hydrocarbon
contamination on TEM specimens by exposing
specimens in glow discharge
The treated specimens do not build up contamination
during observation in a TEM
JEC560 Auto Carbon Coater
The HDT-400 applies hydrophilic treatment on TEM
grids and SEM specimen mounting blocks The entire
operation is automated
IJFC-1600 Auto Fine Coater
O ~ - --=shy
The JEE-420 vacuum evaporator applies coating on
SEM or TEM specimens with a variety of materials
including gold platinum carbon chromium The JEEshy
420 applies shadowing on TEM specimens
- - C- Ooshy o --nu _ __ a 0 0 0 0
The JEC-560 rapidly applies carbon coating on non-conductive specimens for The JFC series sputter coater applies metal coating on SEM specimens quickly Gold
element analysis with a scanning electron microscope or an electron probe micro gold-palladium and platinum can be applied
analyzers
JED23002300F Energy Dispersive X-ray Spectrometers
Dry SO Detector
The JED-23002300F is installed on a SEM or an EPMA and performs elemental This unique box type Dry SD detector is designed for JSM-651 0 and JSM-601 0 series
analysis on micro areas The Dry SD detector an SDD type detector is cooled SEM The detector is positioned at the optimum position
electrically It does not need liquid nitrogen cooling so that maintenance is not
required Analysis Station the unique EDS analysis software is versatile with simple
operation
All y A~Ilrn System that links observed images with analysis data
inlIytl(oIIUI1Chi1$ Qualitativequantitative analysis linearea analysis
10 I Producl Guide
------
f
Instruments for Microarea and Surface Analysis
IjXA-8530F Field Emission Electron Probe Microanalyzer
The JXA-8530F features an improved hardware that is used in the JXA-8500F (the first
FE-EPMA in the world) as well as newly designed user-friendly PC-GUI windows for
efficient analysis and data operation The FE gun of the JXA-8530F provides not only a
spatial (analysis) resolution of the order of 01 IJm but also high-sensitivity X-ray
detection at low accelerating voltages and large probe currents
IjPS-9200 Photoelectron Spectrometer (XPS)
The JPS-9200 is an XPS that provides microarea analysis A newly developed microshy
tens enables high-sensitivity analysis from macro to microareas Its stage accepts both
standard-size samples (10X 10X2 mm) and large samples (up to gO mm in diameter)
The stage-scan mapping method allows the acquisition of photoelectron images
ranging from low magnification (50 x 18 mm) to high magnification (spatial resolution
30lJm)
I jAMP-9500F Field Emission Auger Microprobe
fl
X 8230 Electron Probe Microanalyzer
D
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The JXA-8230 is a newly developed EPMA which succeeds a proven JEOL EPMA
hardware and features newly designed user-friendly PC-GUI windows for efficient
analysis and data operation Sophisticated analysis menus are designed so that the
user can easily access target material analyses offering stress-free operations
I jPS-901 0 series Photoelectron Spectrometers (XPS)
XPS with high-sensitivity and high-resolution is compactly designed on the basis of
JEOLs many years of basic and application technologies on electrostatic lenses
analyzers etc The low-acceleration and large-current ion guns dedicated to permit
XPS analysis of thin films with different thicknesses from surface atomic layers to
micron order thick specimen layers The specimen chamber and etching chamber are
separated from each other in terms of vacuum thus completely preventing the
contamination due to sputtering and facilitating the maintenance of ultrahigh vacuum
A field-emission Auger Microprobe featuring the worlds highest spatial resolution with
the minimum probe diameter of 3 nm (for secondary-electron image) and 8 nm (for
Auger analysis) The new hemispherical electrostatic energy analyzer (HSA) with a
multi-channel detector optimized for Auger analysis is suitable for chemical-state
analysis The neutralizing ion gun allows Auger analysis of insulating materials Its
specimen stage accommodates a large sample of up to 95 mm in diameter Also it is
expandabfe for an UHV-SEM
ProduCI Guide I 11
X-ray Fluorescence Spectrometers
I ISX 400Rll Element Analyzer
An energy-dispersive X-ray fluorescence spectrometer for environmental analysis
which helps you comply with environmental regulations for hazardous substances
such as the RoHS and ELV directives in the EU and soil pollution in Japan You can
easily analyze minute traces of Cd Pb Hg Cr etc This analyzer is also suitable for
general analySiS including element analysis and thickness measurement using the FP
(fundamental parameter) method
I JSX-31 OORll Element Analyzer
An energy-dispersive X-ray fiuorescence spectrometer for environlnlntal analysis which helps you
comply with environmental regulations for hazardous substances such as the RoHS and ELV
directives in the EU and soil pollution in Japan This analyzer inoorporates a JEOL-made electrically
cooled Si(u] detector making liquid nrtrogen unnecessary as well as providing high sensitivity for
heavy-element analysis such as Cd Pb and Hg This analyzer is also surtable for general analysis
including eement analysis and thickness measurement using the FP (fundamental parameter)
method
12 I Product Guide
Semiconductor Eq Ipm nt
2 Electron Beam Lithography System
-5
Electron Beam Lithography System
r
Electron Beam Lithography System
-~=-~--I--~ I
~ ~ ~-
Th e JBX-3200MV is an e lec lro n bea m lithography system developed for the production of next generation ultrahigh-precision masks and reticles This system employs a variableshyshaped electron beam o f 50kV and a step amp repeat specimen stage
High thro ug hp ut enabled by a new PEG (Proximity Effect Correction) system High-speed da la- transfer sys tem for a large quanti ty data High-precision design for masklrelicle production
Th e JBX-9 500FS is a spot beam
lithography system developed to meet a
wi de range of applications with high
throughput and high precision periormance
This sys tem covers fields from the nanoshy
technology research to the production of
leading edge devices
f 100kV _ ZrONV Schotlky emitter
maximum 300 mm wafer
Th e JBX-6300 FS is a s p o t b ea m
lithography system developed to meet a
w ide range o f applica tions with high
resolution and high precision periormance
This system covers fields from the nanoshy
technology research to the development of
next generation devices
25 kVl50 kVl1 00 kV ZrONV Schottky emittelt
maximum 200 mm wafelt
Prod ucl Gu ide I 13
-
---------
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- --= - - - =-shy -
NMR Spectrometers
I JNM-ECAECX series FT NMR System
920 MHz magnet Photo courtesy Nationallnstrtute of Natural Sciences Institute for
Molecular Science
The JNM-ECA920 FT NMR System is a 920 MHz high-resolution NMR
spectrometer developed by JEOL This spectrometer uses the superconducting
magnet co-developed by National Institute for Materials Science and Kobe Steel
Ltd which generates the high magnetic field Created by combining Japans stateshy
of-the-art technologies this FT NMR System marks an important milestone in next
generation biology and nanotechnology which call for high-magnetic-field highshy
resclution NMR analysis
JEOL RESONANCE Inc
~ ~ ~
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~ 100
HNCACB spectrum of 13C(15N labeled Solid 23Na-MQMAS spectrum of ubiqurtin N3)P207
The JNM-ECNECX series are versatile high-performance FT NMR spectrometer
system that utilize the latest digital and high-frequency technology The ECA
spectrometer is applicable up to 1GHz and can be used for a wide range of
applications including liquidsolid NMR protein analysis and diffusion coefficient
measurement
INM-EC cd
JOO ~QO 0(1 ~uo 1)0
Spectrometer I Oscillator receiver power amplifier
Magnet IISCM Field strength 705T I 939T 11 74T 1401T 1643T
Bore diameter (mm) 54 I 54 54 54 54
Probe 5 mm Ttl tunable
11110
188T
54
JEOL RESONANCE Inc
INMmiddot fO rie ---shy
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Spectrometer Oscillator receiver power amplifier
Magnet I ISCM Field strength 705T 939T I 1174T 1401T
Bore diameter (mm) I 54 54 54 54
Probe I 5 mm TH tunable
JEOL RESONANCE Inc
14 I Produc t Guide
bull bull bull
IJNM-ECS 00 FT NMR System
bull I ASC Series
Auto Sample Changer
ASC8 (8 samples) ASC24 (24 samples)
middotmiddot iT ~ --shy
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ASC16 (16 samples) ASC64 (64 samples)
bullIJNM-ECAECX series Solid NMR
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MAS conlroller Solid NMR sampling kit
NMR Systems For Modern NMR Spectroscopy The JNM-ECS400 i s a compact two-channel
spectrometer that retains the advanced capabilities of the
JNM-ECAlECX series (required installation space is oneshy
half compared to conventional NMRs) Programmable
timing sequencers built into each RF and PFG channel
can independently control either synchronous or
asynchronous operations of each channel Its standard
tunable broadband gradient probe which integrates all
JEOLs newest technologies is the high sesitivity roomshy
tempperature probe
Ccmpact spectrometer chassis Innovaten in JEOL NMR digrtal architecture High-stability and high-accuracy digital spectrometer High-sensrtivity new tunable probe Full automalk NMR with advanced software
JEOL RESONANCE Inc
An automatic sample changer makes it
possible to measure many samples
sequentially by exchanging multiple samples
automatically one by one Five changer
models are available for 8 samples 16
samples 24 samples 64 samples and 100
samples
JEOL RESONANCE Inc
ASC100 (100 samples)
1 --0 1(10 C ppm I
Sdid 13C-CPMAS spectrum of cholk acid
Solid-NMR is a technique that measures solid samples (powder or film-like samples) This technique is also effective for measurement of samples not soluble in solvents (inorganic
samples etc) and of crystalline polymorph that is meaningful to measure at the solid state
JEOL RESONANCE Inc
Produci Guide I 15
Mass Spectrometers
I JMS-800D UltraFOCUS I JMS-700 (2) MStation Mass Spectrometer Dedicated to Dioxin Anal ys is High resolution M ass Spectrometer
JMS-800D UltraFOCUS is the optimal cho ice for ultra lowlevel race detection
applications suc h as moni torin g for dioxins and related co mpoun ds eg
Polychlorinated Biphenyls (PCBs) Polybrominated Diphenyl Ethers (PBDEs) or drugs
of abuse by high resolution-selected ion monitoring (HRSIM) gas chromatographyl
mass spectrometry(GCMS)
R-- gtn 80000 (10 valley) Sent Ily 2 3 7 8-TCDD 100fg SNgt2oo
(6 channels 100 msecch Resolution 10000)
N_ Jut J _lllgEI up to 10 kV
JMS-S3000 Matri x Assisted Laser DesorptionIonization TOFMS
The JMS-S3000 is a MALOI-TOFMS incorporating an innovative SpirarrOF ion optical
system With superior capabilities than conventional MALDI-TOFMS the JMS-S3000
provides sate-of-the-art anaiylical solutions for a wide range of research areas such as
functional synthetic polymers materials science and biomolecules
Malrix Assisled Laser Desorpllonlonization Timemiddotof-Flighl Mass Spectrometer
I JMS-T1 OOLP+DART TLC-TOFMS
Pet c 60000 (10 valley) err 02 ng of methyl stearate
SIN 400
(CVEI combination ion source) I~ ~ aJe up to 10kV
I JMS-T1 OOLP LC-TOFMS
I JMS-Tl OOGCV GC-TOFMS
middotl shyThe JMS-T100LP+DART achieves simple and fast TLCMS analysis Accurate mass The JMS-Tl00GCV is a fully automatic Gas Chromatograph - Time-ot-Flight Mass
measurement capabilit y of TOFMS also enables you to determine element Spectrometer (GC-TOFMS) This versatile MS system covers wide range of
compositions of the analytes applications in GC-MS analysis
16 I Pr oduc i Gu ide
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I JMS-Ql 050GC UltraQuad GClMS
cJEOL
-
S-trapHS Headspace Autosampler
ESR Spectrometers
I JES-X3 series ESR Spectrometers
Recently it has been widely
accepted that even retatively few
unpaired electrons in a sample can
affect the function of the material so
lower detection limits (high er
sens itivity) is required of ESR
measurements JES-X3 Series has
achieved higher sensiti v i ty by
developing a lOIN-noise Gunn
oscillator for its new spectrometer
JES-X320 JEOL RESONANCE Inc
i III III )
Maximum Magnetic Field I a6ST 13T 14T
SweepW idth I --00-- 250mT plusmn001 - 500m__T_ __--l
Pole Gap _ _ 6cmm__ ___-= ___~ ____cmm__ _ I 0 = 60mcm 75 _l
Frequency Range(GHz) 8750 - 9650 _ _ _ ___-1
Field Resolution (mT) _L_ 235 Correction by Marker _1_--- Standard
I Operating System Windows 7
The JMS-01050GC is an innovative quadrupole mass spectrometer (OMS) that
achieves the highest-level sensitivity in OMS It has a high ability of evacuation due
to the use of a split flow turbo-molecular pump system (400 Lis) th at
simultaneously evacuates the ion source and the detector The use of a highshy
accuracy hyperbolic quadrupole mass analyzer provides high resolution
The S-trap is a next-generation headspace autosampler providing ultra-low
concentration measurement which was not achieved with a heads pace (HS) method
using conventional sample loop In addition the HS-GCMS system combined lith a
JMS-01050GC Mkll quaorupole MS guarantees detection of mold odor in water
down to 1 ppt
I ES-CT470 Liquid Helium Variable Temperature Controller
The ES-CT470 varies the sample temperature in the temperature range between 25 K
and 470 K Temperature setting is performed by d igital display and the set
temperature is kept constant by automatic control circui ts Combined use with a UV Irradiation device is possible A GaAs etement is used as a temperature sensor
enabling high-accuracy temperature setling
- 25 K to 470 K
plusmn001 K for 25 K to 42 K
plusmn1 orO5 K for 42 K to 470 K
_ 20 min 10 25 min (rom room temperature 08 to 2 Uh
50Hz60Hz 5mm JEOL RESONANCE Inc
Produ c t Guide I 17
Industrial Equipm nt for thin-filnl formation and nlatel ial processing
I bull
Electron Beam Source High-power Electron Beam Source
BS-60060EBS EBG-102UB6S
Electron beam sources for vacuum evaporation of metal and metal-oxide thin-films
We offer a wide variety of electron beam sources and crucibles They have features of
excellent beam spot and energy density and high-speed sweeping
1 PGBS 80020CPPS Plasma Source
BS-80011 BPG (6kW) BS-8002OCPPS (3kW)
Plasma Sources are installed in a vacuum chamber and generate high-density plasma
Used as Ion Plating (Plasma Assisted Deposition) and it is possible to improve film
properties for optilcal thin films protective films and function films Because highshy
density plasma can be generated in a mass space high-rate deposition to a large area
is possible
I RF Induction Plasma System
JEBG-3000UB(300kW) JEBG-1 OOOUB(1 OOkW)
High-power electron beam sources for vacuum evaporation of metal and metal-oxide
for wide plastic films or large glass plates that are continuously fed And they can also
be used for vacuum melting of high-melting point metals
raes
RF Generator
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RF-12030 (3kW) RF-56000 (Controller)
13 56MHz radio-frequency power supplies for plasma generation and used for
sputtering CVD etching and ion-plating We offer 750W to 6kW generators and
matching networks
DR Powder Feeder
Thermal plasma around 10000degC (15000deg F) by RF inductive coupling This thermal Fine powder feeder that can feed 01 to 100 11m size fine powder continuously with
plasma is used for nano powder synthesis fine powder spheroidization thick film carrier gas We offer optional feeding rate controller and large capacity hopper
deposition multi composite membrane synthesis CVD and harmful gas
decomposition
18 I Produci Guide
---
Biochemical Analyzers
I JCA-BM series Clinical Chemistry Analyzer BioMajesty Series
JEOLs micro volume technology and unique sample pre-dilution mechanism realizes
high throughput chemistry analysis with reduced sample and reagent volume
More than 4000 systems have been placed in clinical laboratories allover the world
JCA-BM6050
I JCA-BMBOOO series Ultra High Throughput Clinical Chemistry Analyzer
4 4
JCA-BMB060 egt
JCA-BMSOOO series offer ultra high throughput chemistry analysis up to 9000 testsl
hour
The pre-dilution unit one of the BioMajesty family features also continues the strong
tradition in these series with interconnected multiple analysis modules the key factors
that accomplish brilliant high throughput as well as downtime reduction with back-up
capability
I JCA-BM6070 High Throughput High Performance Clinical Chemistry An alyzer
I I I
A Clinical chemistry analyzer with incomparable speed and accuracy which achieves
high throughput of 2400 testslhour (includ ing ISE) The incorporated compact
workstation and user-friendly Interface with excellent operability leads the new trend of
the laboratory testing
BioMajesty Series lCA-BM 6010 lCA-BM 6050
lCA-8M 6070 leA-BM 91 30
lCA-BM 8000 Series
bull This product is distributed outside Japan by Siemens Heatthcare Diagnostics under the ADVtAreg brand name
I JCA-BM601 OC Compact amp High Performance Clinical Chemistry Analyzer
-~-I -
1lIIIIIIilllllllllJllnlIlII Ii I JCA-BM6010C is a compact but efficient automatic analyzer that maintains the basic
concept of BioMajesty series while achieving the excellent capability of microanalysis
with sample volume as small as 1 J1L
BM6010C also offers fully automated HbA1 c analysis with on-board hemolysis
(optional) Simultaneous measurement of Glucose and HbA1c improves laboratory
workflow
Product Guid e I 19
S~~MCEAII Certain products in this brochure are controlled under the Foreign 0J 0014007 -v- ~ Exchange and Foreign Trade Law of Japan in compliance with $ ~~~ international security export control JEOL Ltd must provide the~2 m) IIlt Japanese Government with End-users Statement of Assurancel A MGMT SYS
AvA ~ m and End-use Certificate in order to obtain the export license - tiJ needed for export from Japan If the product to be exported is in this category the end user will be asked to fill in these certificate formsdEOLIS09001 amp150 14001CenrfiCltlled
httpwwwjeolcomdEOL JEOL Ltd 1-2 Musashino 3-chome Akishima Tokyo 196-8558 Japan Sales Division Telephone+81-42-528-3381 Facsimile+81-42-528-3386
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~~=~g~~~2~~1nt~~2_~~~bIlC of South Africa
Facsimile 27-11 -462-1466
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~~s~~~~~rigAe9~5t~~1 1 0 Telephone 1-925-737-1740 Facsimile 1-925-737-1749
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Urbanizacion Montalban JlI - Resldenclas Don Andres - Piso 7 - Apartomento 74 Avenida 3 entre calles 7 y 6 Montalban Caracas Venezuela Telephone 58-212-443-4342 Facsimile 58-212-443-4342
VTETNAM TECHNICAL MATERIALS AND RESOURCES IMPORT-EXPORT JOINT STOCK COMPANY(REXCO) Hanoi Branch
No 13-Lot 12 Trung Yen Trung Hoa Street Cau Giay Dist HanOi Vietnam Telephone 84-4-562-051617562-0535 Facsimile 84-4-853-2511
No 0205B389C Printed in Japan Kp
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[Peripheral Equipment ]
IJIC 410 HDT400 JEE-420 series Ion Cleaner Hydrophilic Treatment Device Vacuum Evaporators
The JIC-41 0 Ion Cleaner removes hydrocarbon
contamination on TEM specimens by exposing
specimens in glow discharge
The treated specimens do not build up contamination
during observation in a TEM
JEC560 Auto Carbon Coater
The HDT-400 applies hydrophilic treatment on TEM
grids and SEM specimen mounting blocks The entire
operation is automated
IJFC-1600 Auto Fine Coater
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The JEE-420 vacuum evaporator applies coating on
SEM or TEM specimens with a variety of materials
including gold platinum carbon chromium The JEEshy
420 applies shadowing on TEM specimens
- - C- Ooshy o --nu _ __ a 0 0 0 0
The JEC-560 rapidly applies carbon coating on non-conductive specimens for The JFC series sputter coater applies metal coating on SEM specimens quickly Gold
element analysis with a scanning electron microscope or an electron probe micro gold-palladium and platinum can be applied
analyzers
JED23002300F Energy Dispersive X-ray Spectrometers
Dry SO Detector
The JED-23002300F is installed on a SEM or an EPMA and performs elemental This unique box type Dry SD detector is designed for JSM-651 0 and JSM-601 0 series
analysis on micro areas The Dry SD detector an SDD type detector is cooled SEM The detector is positioned at the optimum position
electrically It does not need liquid nitrogen cooling so that maintenance is not
required Analysis Station the unique EDS analysis software is versatile with simple
operation
All y A~Ilrn System that links observed images with analysis data
inlIytl(oIIUI1Chi1$ Qualitativequantitative analysis linearea analysis
10 I Producl Guide
------
f
Instruments for Microarea and Surface Analysis
IjXA-8530F Field Emission Electron Probe Microanalyzer
The JXA-8530F features an improved hardware that is used in the JXA-8500F (the first
FE-EPMA in the world) as well as newly designed user-friendly PC-GUI windows for
efficient analysis and data operation The FE gun of the JXA-8530F provides not only a
spatial (analysis) resolution of the order of 01 IJm but also high-sensitivity X-ray
detection at low accelerating voltages and large probe currents
IjPS-9200 Photoelectron Spectrometer (XPS)
The JPS-9200 is an XPS that provides microarea analysis A newly developed microshy
tens enables high-sensitivity analysis from macro to microareas Its stage accepts both
standard-size samples (10X 10X2 mm) and large samples (up to gO mm in diameter)
The stage-scan mapping method allows the acquisition of photoelectron images
ranging from low magnification (50 x 18 mm) to high magnification (spatial resolution
30lJm)
I jAMP-9500F Field Emission Auger Microprobe
fl
X 8230 Electron Probe Microanalyzer
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The JXA-8230 is a newly developed EPMA which succeeds a proven JEOL EPMA
hardware and features newly designed user-friendly PC-GUI windows for efficient
analysis and data operation Sophisticated analysis menus are designed so that the
user can easily access target material analyses offering stress-free operations
I jPS-901 0 series Photoelectron Spectrometers (XPS)
XPS with high-sensitivity and high-resolution is compactly designed on the basis of
JEOLs many years of basic and application technologies on electrostatic lenses
analyzers etc The low-acceleration and large-current ion guns dedicated to permit
XPS analysis of thin films with different thicknesses from surface atomic layers to
micron order thick specimen layers The specimen chamber and etching chamber are
separated from each other in terms of vacuum thus completely preventing the
contamination due to sputtering and facilitating the maintenance of ultrahigh vacuum
A field-emission Auger Microprobe featuring the worlds highest spatial resolution with
the minimum probe diameter of 3 nm (for secondary-electron image) and 8 nm (for
Auger analysis) The new hemispherical electrostatic energy analyzer (HSA) with a
multi-channel detector optimized for Auger analysis is suitable for chemical-state
analysis The neutralizing ion gun allows Auger analysis of insulating materials Its
specimen stage accommodates a large sample of up to 95 mm in diameter Also it is
expandabfe for an UHV-SEM
ProduCI Guide I 11
X-ray Fluorescence Spectrometers
I ISX 400Rll Element Analyzer
An energy-dispersive X-ray fluorescence spectrometer for environmental analysis
which helps you comply with environmental regulations for hazardous substances
such as the RoHS and ELV directives in the EU and soil pollution in Japan You can
easily analyze minute traces of Cd Pb Hg Cr etc This analyzer is also suitable for
general analySiS including element analysis and thickness measurement using the FP
(fundamental parameter) method
I JSX-31 OORll Element Analyzer
An energy-dispersive X-ray fiuorescence spectrometer for environlnlntal analysis which helps you
comply with environmental regulations for hazardous substances such as the RoHS and ELV
directives in the EU and soil pollution in Japan This analyzer inoorporates a JEOL-made electrically
cooled Si(u] detector making liquid nrtrogen unnecessary as well as providing high sensitivity for
heavy-element analysis such as Cd Pb and Hg This analyzer is also surtable for general analysis
including eement analysis and thickness measurement using the FP (fundamental parameter)
method
12 I Product Guide
Semiconductor Eq Ipm nt
2 Electron Beam Lithography System
-5
Electron Beam Lithography System
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Electron Beam Lithography System
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Th e JBX-3200MV is an e lec lro n bea m lithography system developed for the production of next generation ultrahigh-precision masks and reticles This system employs a variableshyshaped electron beam o f 50kV and a step amp repeat specimen stage
High thro ug hp ut enabled by a new PEG (Proximity Effect Correction) system High-speed da la- transfer sys tem for a large quanti ty data High-precision design for masklrelicle production
Th e JBX-9 500FS is a spot beam
lithography system developed to meet a
wi de range of applications with high
throughput and high precision periormance
This sys tem covers fields from the nanoshy
technology research to the production of
leading edge devices
f 100kV _ ZrONV Schotlky emitter
maximum 300 mm wafer
Th e JBX-6300 FS is a s p o t b ea m
lithography system developed to meet a
w ide range o f applica tions with high
resolution and high precision periormance
This system covers fields from the nanoshy
technology research to the development of
next generation devices
25 kVl50 kVl1 00 kV ZrONV Schottky emittelt
maximum 200 mm wafelt
Prod ucl Gu ide I 13
-
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NMR Spectrometers
I JNM-ECAECX series FT NMR System
920 MHz magnet Photo courtesy Nationallnstrtute of Natural Sciences Institute for
Molecular Science
The JNM-ECA920 FT NMR System is a 920 MHz high-resolution NMR
spectrometer developed by JEOL This spectrometer uses the superconducting
magnet co-developed by National Institute for Materials Science and Kobe Steel
Ltd which generates the high magnetic field Created by combining Japans stateshy
of-the-art technologies this FT NMR System marks an important milestone in next
generation biology and nanotechnology which call for high-magnetic-field highshy
resclution NMR analysis
JEOL RESONANCE Inc
~ ~ ~
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HNCACB spectrum of 13C(15N labeled Solid 23Na-MQMAS spectrum of ubiqurtin N3)P207
The JNM-ECNECX series are versatile high-performance FT NMR spectrometer
system that utilize the latest digital and high-frequency technology The ECA
spectrometer is applicable up to 1GHz and can be used for a wide range of
applications including liquidsolid NMR protein analysis and diffusion coefficient
measurement
INM-EC cd
JOO ~QO 0(1 ~uo 1)0
Spectrometer I Oscillator receiver power amplifier
Magnet IISCM Field strength 705T I 939T 11 74T 1401T 1643T
Bore diameter (mm) 54 I 54 54 54 54
Probe 5 mm Ttl tunable
11110
188T
54
JEOL RESONANCE Inc
INMmiddot fO rie ---shy
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Spectrometer Oscillator receiver power amplifier
Magnet I ISCM Field strength 705T 939T I 1174T 1401T
Bore diameter (mm) I 54 54 54 54
Probe I 5 mm TH tunable
JEOL RESONANCE Inc
14 I Produc t Guide
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IJNM-ECS 00 FT NMR System
bull I ASC Series
Auto Sample Changer
ASC8 (8 samples) ASC24 (24 samples)
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ASC16 (16 samples) ASC64 (64 samples)
bullIJNM-ECAECX series Solid NMR
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MAS conlroller Solid NMR sampling kit
NMR Systems For Modern NMR Spectroscopy The JNM-ECS400 i s a compact two-channel
spectrometer that retains the advanced capabilities of the
JNM-ECAlECX series (required installation space is oneshy
half compared to conventional NMRs) Programmable
timing sequencers built into each RF and PFG channel
can independently control either synchronous or
asynchronous operations of each channel Its standard
tunable broadband gradient probe which integrates all
JEOLs newest technologies is the high sesitivity roomshy
tempperature probe
Ccmpact spectrometer chassis Innovaten in JEOL NMR digrtal architecture High-stability and high-accuracy digital spectrometer High-sensrtivity new tunable probe Full automalk NMR with advanced software
JEOL RESONANCE Inc
An automatic sample changer makes it
possible to measure many samples
sequentially by exchanging multiple samples
automatically one by one Five changer
models are available for 8 samples 16
samples 24 samples 64 samples and 100
samples
JEOL RESONANCE Inc
ASC100 (100 samples)
1 --0 1(10 C ppm I
Sdid 13C-CPMAS spectrum of cholk acid
Solid-NMR is a technique that measures solid samples (powder or film-like samples) This technique is also effective for measurement of samples not soluble in solvents (inorganic
samples etc) and of crystalline polymorph that is meaningful to measure at the solid state
JEOL RESONANCE Inc
Produci Guide I 15
Mass Spectrometers
I JMS-800D UltraFOCUS I JMS-700 (2) MStation Mass Spectrometer Dedicated to Dioxin Anal ys is High resolution M ass Spectrometer
JMS-800D UltraFOCUS is the optimal cho ice for ultra lowlevel race detection
applications suc h as moni torin g for dioxins and related co mpoun ds eg
Polychlorinated Biphenyls (PCBs) Polybrominated Diphenyl Ethers (PBDEs) or drugs
of abuse by high resolution-selected ion monitoring (HRSIM) gas chromatographyl
mass spectrometry(GCMS)
R-- gtn 80000 (10 valley) Sent Ily 2 3 7 8-TCDD 100fg SNgt2oo
(6 channels 100 msecch Resolution 10000)
N_ Jut J _lllgEI up to 10 kV
JMS-S3000 Matri x Assisted Laser DesorptionIonization TOFMS
The JMS-S3000 is a MALOI-TOFMS incorporating an innovative SpirarrOF ion optical
system With superior capabilities than conventional MALDI-TOFMS the JMS-S3000
provides sate-of-the-art anaiylical solutions for a wide range of research areas such as
functional synthetic polymers materials science and biomolecules
Malrix Assisled Laser Desorpllonlonization Timemiddotof-Flighl Mass Spectrometer
I JMS-T1 OOLP+DART TLC-TOFMS
Pet c 60000 (10 valley) err 02 ng of methyl stearate
SIN 400
(CVEI combination ion source) I~ ~ aJe up to 10kV
I JMS-T1 OOLP LC-TOFMS
I JMS-Tl OOGCV GC-TOFMS
middotl shyThe JMS-T100LP+DART achieves simple and fast TLCMS analysis Accurate mass The JMS-Tl00GCV is a fully automatic Gas Chromatograph - Time-ot-Flight Mass
measurement capabilit y of TOFMS also enables you to determine element Spectrometer (GC-TOFMS) This versatile MS system covers wide range of
compositions of the analytes applications in GC-MS analysis
16 I Pr oduc i Gu ide
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I JMS-Ql 050GC UltraQuad GClMS
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-
S-trapHS Headspace Autosampler
ESR Spectrometers
I JES-X3 series ESR Spectrometers
Recently it has been widely
accepted that even retatively few
unpaired electrons in a sample can
affect the function of the material so
lower detection limits (high er
sens itivity) is required of ESR
measurements JES-X3 Series has
achieved higher sensiti v i ty by
developing a lOIN-noise Gunn
oscillator for its new spectrometer
JES-X320 JEOL RESONANCE Inc
i III III )
Maximum Magnetic Field I a6ST 13T 14T
SweepW idth I --00-- 250mT plusmn001 - 500m__T_ __--l
Pole Gap _ _ 6cmm__ ___-= ___~ ____cmm__ _ I 0 = 60mcm 75 _l
Frequency Range(GHz) 8750 - 9650 _ _ _ ___-1
Field Resolution (mT) _L_ 235 Correction by Marker _1_--- Standard
I Operating System Windows 7
The JMS-01050GC is an innovative quadrupole mass spectrometer (OMS) that
achieves the highest-level sensitivity in OMS It has a high ability of evacuation due
to the use of a split flow turbo-molecular pump system (400 Lis) th at
simultaneously evacuates the ion source and the detector The use of a highshy
accuracy hyperbolic quadrupole mass analyzer provides high resolution
The S-trap is a next-generation headspace autosampler providing ultra-low
concentration measurement which was not achieved with a heads pace (HS) method
using conventional sample loop In addition the HS-GCMS system combined lith a
JMS-01050GC Mkll quaorupole MS guarantees detection of mold odor in water
down to 1 ppt
I ES-CT470 Liquid Helium Variable Temperature Controller
The ES-CT470 varies the sample temperature in the temperature range between 25 K
and 470 K Temperature setting is performed by d igital display and the set
temperature is kept constant by automatic control circui ts Combined use with a UV Irradiation device is possible A GaAs etement is used as a temperature sensor
enabling high-accuracy temperature setling
- 25 K to 470 K
plusmn001 K for 25 K to 42 K
plusmn1 orO5 K for 42 K to 470 K
_ 20 min 10 25 min (rom room temperature 08 to 2 Uh
50Hz60Hz 5mm JEOL RESONANCE Inc
Produ c t Guide I 17
Industrial Equipm nt for thin-filnl formation and nlatel ial processing
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Electron Beam Source High-power Electron Beam Source
BS-60060EBS EBG-102UB6S
Electron beam sources for vacuum evaporation of metal and metal-oxide thin-films
We offer a wide variety of electron beam sources and crucibles They have features of
excellent beam spot and energy density and high-speed sweeping
1 PGBS 80020CPPS Plasma Source
BS-80011 BPG (6kW) BS-8002OCPPS (3kW)
Plasma Sources are installed in a vacuum chamber and generate high-density plasma
Used as Ion Plating (Plasma Assisted Deposition) and it is possible to improve film
properties for optilcal thin films protective films and function films Because highshy
density plasma can be generated in a mass space high-rate deposition to a large area
is possible
I RF Induction Plasma System
JEBG-3000UB(300kW) JEBG-1 OOOUB(1 OOkW)
High-power electron beam sources for vacuum evaporation of metal and metal-oxide
for wide plastic films or large glass plates that are continuously fed And they can also
be used for vacuum melting of high-melting point metals
raes
RF Generator
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RF-12030 (3kW) RF-56000 (Controller)
13 56MHz radio-frequency power supplies for plasma generation and used for
sputtering CVD etching and ion-plating We offer 750W to 6kW generators and
matching networks
DR Powder Feeder
Thermal plasma around 10000degC (15000deg F) by RF inductive coupling This thermal Fine powder feeder that can feed 01 to 100 11m size fine powder continuously with
plasma is used for nano powder synthesis fine powder spheroidization thick film carrier gas We offer optional feeding rate controller and large capacity hopper
deposition multi composite membrane synthesis CVD and harmful gas
decomposition
18 I Produci Guide
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Biochemical Analyzers
I JCA-BM series Clinical Chemistry Analyzer BioMajesty Series
JEOLs micro volume technology and unique sample pre-dilution mechanism realizes
high throughput chemistry analysis with reduced sample and reagent volume
More than 4000 systems have been placed in clinical laboratories allover the world
JCA-BM6050
I JCA-BMBOOO series Ultra High Throughput Clinical Chemistry Analyzer
4 4
JCA-BMB060 egt
JCA-BMSOOO series offer ultra high throughput chemistry analysis up to 9000 testsl
hour
The pre-dilution unit one of the BioMajesty family features also continues the strong
tradition in these series with interconnected multiple analysis modules the key factors
that accomplish brilliant high throughput as well as downtime reduction with back-up
capability
I JCA-BM6070 High Throughput High Performance Clinical Chemistry An alyzer
I I I
A Clinical chemistry analyzer with incomparable speed and accuracy which achieves
high throughput of 2400 testslhour (includ ing ISE) The incorporated compact
workstation and user-friendly Interface with excellent operability leads the new trend of
the laboratory testing
BioMajesty Series lCA-BM 6010 lCA-BM 6050
lCA-8M 6070 leA-BM 91 30
lCA-BM 8000 Series
bull This product is distributed outside Japan by Siemens Heatthcare Diagnostics under the ADVtAreg brand name
I JCA-BM601 OC Compact amp High Performance Clinical Chemistry Analyzer
-~-I -
1lIIIIIIilllllllllJllnlIlII Ii I JCA-BM6010C is a compact but efficient automatic analyzer that maintains the basic
concept of BioMajesty series while achieving the excellent capability of microanalysis
with sample volume as small as 1 J1L
BM6010C also offers fully automated HbA1 c analysis with on-board hemolysis
(optional) Simultaneous measurement of Glucose and HbA1c improves laboratory
workflow
Product Guid e I 19
S~~MCEAII Certain products in this brochure are controlled under the Foreign 0J 0014007 -v- ~ Exchange and Foreign Trade Law of Japan in compliance with $ ~~~ international security export control JEOL Ltd must provide the~2 m) IIlt Japanese Government with End-users Statement of Assurancel A MGMT SYS
AvA ~ m and End-use Certificate in order to obtain the export license - tiJ needed for export from Japan If the product to be exported is in this category the end user will be asked to fill in these certificate formsdEOLIS09001 amp150 14001CenrfiCltlled
httpwwwjeolcomdEOL JEOL Ltd 1-2 Musashino 3-chome Akishima Tokyo 196-8558 Japan Sales Division Telephone+81-42-528-3381 Facsimile+81-42-528-3386
ARGENTINA COASIN SAClyF Virrey del Pino 4071 1430 Buenos Aires Argentina Telephone 54-11-4552-3185 Facsimile 54-11-4555-3321
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N1601 World Trade Center Building 371-375 Huan Shi Road East Guang Zhou Guangdong Prov 510095 PRChina Telephone 86-20-8778-7848 Facsimile 86-20-8778-4268
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Room A2117 Zhongshang Plaza Office Bldg NO7 Zhongnan Road Wuhan Hubei 430071 PRChina Telephone 86-27-8713-2567 Facsimile 86-27-8713-2567
JEOL LTD (BEIJING) CO LTD CHENGDU BRANCH 1807A Zonglu Building NO 35 Zhongfu Road Chengdu Sichuan 610016 PR China Telephone 86-28-86622554 Facsimile 86-28-86622564
EGYPT JEOL SERIVCE BUREAU
3rd Fl Nile Center Bldg Nawal Slree Dokkl (Cairo) Egypt Telephone 20-2-3335-7220 Facsimile 20-2-3338-4186
FRANCE JEOL (EUROPE) SAS Espace Claude Monet 1 Allee de Giverny 78290 Crolssy-sur-Seine France Telephone 33-13015-3737 Facsimile 33-13015-3747
GERMANY JEOL (GERMANY) GmbH Oskar-Von-Miller-Strasse 1 a 85386 Eching Gennany Telephone 49-8165-77346 Facsimile 49-8165-77512
GREAT BRITAIN amp IRELAND JEOL (UK) LTD JEOL House Silver Court Watchmeaci Welwyn Garden City Herts AL71LT UK Telephone 44-1707 -377117 FaCSimile 44-1707-373254
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56-58S Trikoupl Str PO Box 26140 GR-10022 Athens Greece Telephone 30-1-823-5383 Facsimile 30-1-823-9567
HONG KONG FARMING LTD
Unit No1 009 1 OF Prosperity Milennia Plaza 663 Kings Road North Point Hong Kong Telephone 852-2815-7299 Facsimile 852-2581-4635
INDIA JEQL INDIA Pvt Ltd
Elegance Tower Level 2 2128 Old Mathura Road Jasola Business District Centre Near Apollo Hospital Jasola New Delhi 110025 India Telephone 91-11-6472-2578 Facsimile 91-11-4060-1235
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Analyticallnstrments Department Sahas 41412 Veer Savarkar Marg Prabhadery Mumbai 400 025 India Telephone 91-22-6666-4000 Facsimile 91-22-6666-4001
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Analylicallnstruments Department 7 Hare Street Calcutta 700 001 India Telephone 91-33-2213-4133 Facsimile 91 -33-2213-4102
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INDONESIA PT TEKNOLABindo Penta Perkasa Komplek Gading Bukillndah Blok lIll JI Bukfl Gading Raya Kelapa Gading Pennai Jakarta 14240 Indonesia Telephone 62-21-458470575859 Facsimile 62-21-45842729
ITALY JEOL 0TALIA) SpA Centro Direzionale Green Office Via dei Tulipani 1 20090 Pieve Emanuele (MI) Italy Telephone 39-02-9041431 Facsimila 39-02-90414343
KOREA JEOL KOREA LTD
Dongwoo Bldg 7F 1443 Yangjae Daero Gangdong-Gu Seoul 134-010 Korea Telephone 82-2-511-5501 Facsimile 82-2-511-2635
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205 Block A Mezzanine Floor Kelana Business Center 97 Jalan SS 72 Kelana Jaya 47301 Petaling Jaya Selangor Malaysia Telephone 60-3-7492-7722 Facsimile 60-3-7492-7723
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Arkansas 11 Piso 2 Colonia Napoles Delegacion Benito Juarez CP 03810 Mexico DF Mexico Telephone 52-5-55-211-4511 Facsimile 52-5-55-211-0720
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14-C Main Sehar Commercia) Avenue Lane 4 Khayaban-e-Sehar DHA-VII Karachimiddot75500 Pakinstan Telephone 92-21-353455813534074735346057-8 Facsimile 92-21-35345582
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PHILIPPINES PHILAB INDUSTRIES INC
7487 Bagtikan Street SAY Makati 1203 Metro Manila Phillip pines Telephone 63-2-896-7218 Facsimile 63-2-897-7732
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Hammarbacken 6A Box 716191 27 Sollentuna Sweden Telephone 46-8-28-2800 Facsimile 46-8-29-1647
SERVICE amp INFORMATION OFFICE NORWAY JEQL (Skandinaviska)AB
Lorenvangen 23 0580 Oslo NORWAY Telephone 47-2-2-64-7930 Facsimile 47-2-2-65-0619
FINLAND JEOL (Skandlnaviska)AB
Ylakaupinkuja 2 FIN-02360 Espoo Finland Telephone 358-9-8129-0350 Facsimile 358-9-8129-0351
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2 Corporation Road 1t01-12 Corporation Place Singapore 618494 Telephone 65-6565-9989 Facsimile 65-6565-7552
SOUTH AFRICA ADI Scientific (Pty) Ltd
370 Angus Crescent Northlands Business Park 29 Newmarket Road
~~=~g~~~2~~1nt~~2_~~~bIlC of South Africa
Facsimile 27-11 -462-1466
SPAIN IZASA SA
Argoneses 13 28100 Alcobendas (poligono IndustriaQ Madrid Spain Te~phone 34-91-663-0500 Facsimile 34-91-663-0545
SWITZERLAND JEOL (GERMANY) GmbH Oskar-Von-Miller Strasse 1 85386 Eching Germany Telephone 49-8165-77346 Facsimile 49-8165-77512
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For Mass Spectrometer Products Mass Solutions Technology Co Ltd
5F No79 Sec 1 Xintai 5th Rd Xlzhi Dis New Taipei City 221 Taiwan Republic of China Telephone 886-2-2698-9511 Facsimile 886-2-2698-9512
For Semiconductor Products JEOL TAIWAN SEMICONDUCTORS LTD
11 F-l No 346 Pei-Da Road Hsin-Chu City 300 Taiwan Republic of China Telephone 886-3-523-8490 Facsimile 886-3-523-8503
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300 Phaholyothin Rd Phayathai Bangkok 10400 Thailand Telephone 66-2-615-2929 Facsimile 66-2-615-23502351
THE NETHERLANDS JEOL (EUROPE) Bv Ureweg 4 NL-2153 PH Nieuw-Vennep The Nelherlands Telephone 31-252-623500 Facsimile 31-252-623501
TURKEY TEKSERAS Kayisdagi )nonu MahKartal Cad No553 34755 Atasehir Istanbul Turkey Telephone 90-216-5736470 Facsimile 90-216-5736475
UAE MRS Group Dubai POBox 171612 Rashid Abdulla AI Noami Building Suite No 306 Damascus Street AI Qusais-3 Dubai UAE Telephone 971-4-2581141 Facsimile 971-4-2581151
JEOLGulf
POBox 171612 bull Rashid Abdulla AI Noami Building Suite No 306 Damascus Street AI Qusais-3 Dubai UAE Telephone 971-553964219(mobile)
USA JEOL USA INC 11 Dearborn Road Peabody MA 01960 USA Telephone 1-978-535-5900 Facsimile 1-978-536-22052206
JEOL USA INC WEST OFFICE
~~s~~~~~rigAe9~5t~~1 1 0 Telephone 1-925-737-1740 Facsimile 1-925-737-1749
VENEZUELA GOMSA Service and Supply CA
Urbanizacion Montalban JlI - Resldenclas Don Andres - Piso 7 - Apartomento 74 Avenida 3 entre calles 7 y 6 Montalban Caracas Venezuela Telephone 58-212-443-4342 Facsimile 58-212-443-4342
VTETNAM TECHNICAL MATERIALS AND RESOURCES IMPORT-EXPORT JOINT STOCK COMPANY(REXCO) Hanoi Branch
No 13-Lot 12 Trung Yen Trung Hoa Street Cau Giay Dist HanOi Vietnam Telephone 84-4-562-051617562-0535 Facsimile 84-4-853-2511
No 0205B389C Printed in Japan Kp
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Instruments for Microarea and Surface Analysis
IjXA-8530F Field Emission Electron Probe Microanalyzer
The JXA-8530F features an improved hardware that is used in the JXA-8500F (the first
FE-EPMA in the world) as well as newly designed user-friendly PC-GUI windows for
efficient analysis and data operation The FE gun of the JXA-8530F provides not only a
spatial (analysis) resolution of the order of 01 IJm but also high-sensitivity X-ray
detection at low accelerating voltages and large probe currents
IjPS-9200 Photoelectron Spectrometer (XPS)
The JPS-9200 is an XPS that provides microarea analysis A newly developed microshy
tens enables high-sensitivity analysis from macro to microareas Its stage accepts both
standard-size samples (10X 10X2 mm) and large samples (up to gO mm in diameter)
The stage-scan mapping method allows the acquisition of photoelectron images
ranging from low magnification (50 x 18 mm) to high magnification (spatial resolution
30lJm)
I jAMP-9500F Field Emission Auger Microprobe
fl
X 8230 Electron Probe Microanalyzer
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The JXA-8230 is a newly developed EPMA which succeeds a proven JEOL EPMA
hardware and features newly designed user-friendly PC-GUI windows for efficient
analysis and data operation Sophisticated analysis menus are designed so that the
user can easily access target material analyses offering stress-free operations
I jPS-901 0 series Photoelectron Spectrometers (XPS)
XPS with high-sensitivity and high-resolution is compactly designed on the basis of
JEOLs many years of basic and application technologies on electrostatic lenses
analyzers etc The low-acceleration and large-current ion guns dedicated to permit
XPS analysis of thin films with different thicknesses from surface atomic layers to
micron order thick specimen layers The specimen chamber and etching chamber are
separated from each other in terms of vacuum thus completely preventing the
contamination due to sputtering and facilitating the maintenance of ultrahigh vacuum
A field-emission Auger Microprobe featuring the worlds highest spatial resolution with
the minimum probe diameter of 3 nm (for secondary-electron image) and 8 nm (for
Auger analysis) The new hemispherical electrostatic energy analyzer (HSA) with a
multi-channel detector optimized for Auger analysis is suitable for chemical-state
analysis The neutralizing ion gun allows Auger analysis of insulating materials Its
specimen stage accommodates a large sample of up to 95 mm in diameter Also it is
expandabfe for an UHV-SEM
ProduCI Guide I 11
X-ray Fluorescence Spectrometers
I ISX 400Rll Element Analyzer
An energy-dispersive X-ray fluorescence spectrometer for environmental analysis
which helps you comply with environmental regulations for hazardous substances
such as the RoHS and ELV directives in the EU and soil pollution in Japan You can
easily analyze minute traces of Cd Pb Hg Cr etc This analyzer is also suitable for
general analySiS including element analysis and thickness measurement using the FP
(fundamental parameter) method
I JSX-31 OORll Element Analyzer
An energy-dispersive X-ray fiuorescence spectrometer for environlnlntal analysis which helps you
comply with environmental regulations for hazardous substances such as the RoHS and ELV
directives in the EU and soil pollution in Japan This analyzer inoorporates a JEOL-made electrically
cooled Si(u] detector making liquid nrtrogen unnecessary as well as providing high sensitivity for
heavy-element analysis such as Cd Pb and Hg This analyzer is also surtable for general analysis
including eement analysis and thickness measurement using the FP (fundamental parameter)
method
12 I Product Guide
Semiconductor Eq Ipm nt
2 Electron Beam Lithography System
-5
Electron Beam Lithography System
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Electron Beam Lithography System
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Th e JBX-3200MV is an e lec lro n bea m lithography system developed for the production of next generation ultrahigh-precision masks and reticles This system employs a variableshyshaped electron beam o f 50kV and a step amp repeat specimen stage
High thro ug hp ut enabled by a new PEG (Proximity Effect Correction) system High-speed da la- transfer sys tem for a large quanti ty data High-precision design for masklrelicle production
Th e JBX-9 500FS is a spot beam
lithography system developed to meet a
wi de range of applications with high
throughput and high precision periormance
This sys tem covers fields from the nanoshy
technology research to the production of
leading edge devices
f 100kV _ ZrONV Schotlky emitter
maximum 300 mm wafer
Th e JBX-6300 FS is a s p o t b ea m
lithography system developed to meet a
w ide range o f applica tions with high
resolution and high precision periormance
This system covers fields from the nanoshy
technology research to the development of
next generation devices
25 kVl50 kVl1 00 kV ZrONV Schottky emittelt
maximum 200 mm wafelt
Prod ucl Gu ide I 13
-
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NMR Spectrometers
I JNM-ECAECX series FT NMR System
920 MHz magnet Photo courtesy Nationallnstrtute of Natural Sciences Institute for
Molecular Science
The JNM-ECA920 FT NMR System is a 920 MHz high-resolution NMR
spectrometer developed by JEOL This spectrometer uses the superconducting
magnet co-developed by National Institute for Materials Science and Kobe Steel
Ltd which generates the high magnetic field Created by combining Japans stateshy
of-the-art technologies this FT NMR System marks an important milestone in next
generation biology and nanotechnology which call for high-magnetic-field highshy
resclution NMR analysis
JEOL RESONANCE Inc
~ ~ ~
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HNCACB spectrum of 13C(15N labeled Solid 23Na-MQMAS spectrum of ubiqurtin N3)P207
The JNM-ECNECX series are versatile high-performance FT NMR spectrometer
system that utilize the latest digital and high-frequency technology The ECA
spectrometer is applicable up to 1GHz and can be used for a wide range of
applications including liquidsolid NMR protein analysis and diffusion coefficient
measurement
INM-EC cd
JOO ~QO 0(1 ~uo 1)0
Spectrometer I Oscillator receiver power amplifier
Magnet IISCM Field strength 705T I 939T 11 74T 1401T 1643T
Bore diameter (mm) 54 I 54 54 54 54
Probe 5 mm Ttl tunable
11110
188T
54
JEOL RESONANCE Inc
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Spectrometer Oscillator receiver power amplifier
Magnet I ISCM Field strength 705T 939T I 1174T 1401T
Bore diameter (mm) I 54 54 54 54
Probe I 5 mm TH tunable
JEOL RESONANCE Inc
14 I Produc t Guide
bull bull bull
IJNM-ECS 00 FT NMR System
bull I ASC Series
Auto Sample Changer
ASC8 (8 samples) ASC24 (24 samples)
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ASC16 (16 samples) ASC64 (64 samples)
bullIJNM-ECAECX series Solid NMR
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MAS conlroller Solid NMR sampling kit
NMR Systems For Modern NMR Spectroscopy The JNM-ECS400 i s a compact two-channel
spectrometer that retains the advanced capabilities of the
JNM-ECAlECX series (required installation space is oneshy
half compared to conventional NMRs) Programmable
timing sequencers built into each RF and PFG channel
can independently control either synchronous or
asynchronous operations of each channel Its standard
tunable broadband gradient probe which integrates all
JEOLs newest technologies is the high sesitivity roomshy
tempperature probe
Ccmpact spectrometer chassis Innovaten in JEOL NMR digrtal architecture High-stability and high-accuracy digital spectrometer High-sensrtivity new tunable probe Full automalk NMR with advanced software
JEOL RESONANCE Inc
An automatic sample changer makes it
possible to measure many samples
sequentially by exchanging multiple samples
automatically one by one Five changer
models are available for 8 samples 16
samples 24 samples 64 samples and 100
samples
JEOL RESONANCE Inc
ASC100 (100 samples)
1 --0 1(10 C ppm I
Sdid 13C-CPMAS spectrum of cholk acid
Solid-NMR is a technique that measures solid samples (powder or film-like samples) This technique is also effective for measurement of samples not soluble in solvents (inorganic
samples etc) and of crystalline polymorph that is meaningful to measure at the solid state
JEOL RESONANCE Inc
Produci Guide I 15
Mass Spectrometers
I JMS-800D UltraFOCUS I JMS-700 (2) MStation Mass Spectrometer Dedicated to Dioxin Anal ys is High resolution M ass Spectrometer
JMS-800D UltraFOCUS is the optimal cho ice for ultra lowlevel race detection
applications suc h as moni torin g for dioxins and related co mpoun ds eg
Polychlorinated Biphenyls (PCBs) Polybrominated Diphenyl Ethers (PBDEs) or drugs
of abuse by high resolution-selected ion monitoring (HRSIM) gas chromatographyl
mass spectrometry(GCMS)
R-- gtn 80000 (10 valley) Sent Ily 2 3 7 8-TCDD 100fg SNgt2oo
(6 channels 100 msecch Resolution 10000)
N_ Jut J _lllgEI up to 10 kV
JMS-S3000 Matri x Assisted Laser DesorptionIonization TOFMS
The JMS-S3000 is a MALOI-TOFMS incorporating an innovative SpirarrOF ion optical
system With superior capabilities than conventional MALDI-TOFMS the JMS-S3000
provides sate-of-the-art anaiylical solutions for a wide range of research areas such as
functional synthetic polymers materials science and biomolecules
Malrix Assisled Laser Desorpllonlonization Timemiddotof-Flighl Mass Spectrometer
I JMS-T1 OOLP+DART TLC-TOFMS
Pet c 60000 (10 valley) err 02 ng of methyl stearate
SIN 400
(CVEI combination ion source) I~ ~ aJe up to 10kV
I JMS-T1 OOLP LC-TOFMS
I JMS-Tl OOGCV GC-TOFMS
middotl shyThe JMS-T100LP+DART achieves simple and fast TLCMS analysis Accurate mass The JMS-Tl00GCV is a fully automatic Gas Chromatograph - Time-ot-Flight Mass
measurement capabilit y of TOFMS also enables you to determine element Spectrometer (GC-TOFMS) This versatile MS system covers wide range of
compositions of the analytes applications in GC-MS analysis
16 I Pr oduc i Gu ide
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I JMS-Ql 050GC UltraQuad GClMS
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S-trapHS Headspace Autosampler
ESR Spectrometers
I JES-X3 series ESR Spectrometers
Recently it has been widely
accepted that even retatively few
unpaired electrons in a sample can
affect the function of the material so
lower detection limits (high er
sens itivity) is required of ESR
measurements JES-X3 Series has
achieved higher sensiti v i ty by
developing a lOIN-noise Gunn
oscillator for its new spectrometer
JES-X320 JEOL RESONANCE Inc
i III III )
Maximum Magnetic Field I a6ST 13T 14T
SweepW idth I --00-- 250mT plusmn001 - 500m__T_ __--l
Pole Gap _ _ 6cmm__ ___-= ___~ ____cmm__ _ I 0 = 60mcm 75 _l
Frequency Range(GHz) 8750 - 9650 _ _ _ ___-1
Field Resolution (mT) _L_ 235 Correction by Marker _1_--- Standard
I Operating System Windows 7
The JMS-01050GC is an innovative quadrupole mass spectrometer (OMS) that
achieves the highest-level sensitivity in OMS It has a high ability of evacuation due
to the use of a split flow turbo-molecular pump system (400 Lis) th at
simultaneously evacuates the ion source and the detector The use of a highshy
accuracy hyperbolic quadrupole mass analyzer provides high resolution
The S-trap is a next-generation headspace autosampler providing ultra-low
concentration measurement which was not achieved with a heads pace (HS) method
using conventional sample loop In addition the HS-GCMS system combined lith a
JMS-01050GC Mkll quaorupole MS guarantees detection of mold odor in water
down to 1 ppt
I ES-CT470 Liquid Helium Variable Temperature Controller
The ES-CT470 varies the sample temperature in the temperature range between 25 K
and 470 K Temperature setting is performed by d igital display and the set
temperature is kept constant by automatic control circui ts Combined use with a UV Irradiation device is possible A GaAs etement is used as a temperature sensor
enabling high-accuracy temperature setling
- 25 K to 470 K
plusmn001 K for 25 K to 42 K
plusmn1 orO5 K for 42 K to 470 K
_ 20 min 10 25 min (rom room temperature 08 to 2 Uh
50Hz60Hz 5mm JEOL RESONANCE Inc
Produ c t Guide I 17
Industrial Equipm nt for thin-filnl formation and nlatel ial processing
I bull
Electron Beam Source High-power Electron Beam Source
BS-60060EBS EBG-102UB6S
Electron beam sources for vacuum evaporation of metal and metal-oxide thin-films
We offer a wide variety of electron beam sources and crucibles They have features of
excellent beam spot and energy density and high-speed sweeping
1 PGBS 80020CPPS Plasma Source
BS-80011 BPG (6kW) BS-8002OCPPS (3kW)
Plasma Sources are installed in a vacuum chamber and generate high-density plasma
Used as Ion Plating (Plasma Assisted Deposition) and it is possible to improve film
properties for optilcal thin films protective films and function films Because highshy
density plasma can be generated in a mass space high-rate deposition to a large area
is possible
I RF Induction Plasma System
JEBG-3000UB(300kW) JEBG-1 OOOUB(1 OOkW)
High-power electron beam sources for vacuum evaporation of metal and metal-oxide
for wide plastic films or large glass plates that are continuously fed And they can also
be used for vacuum melting of high-melting point metals
raes
RF Generator
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RF-12030 (3kW) RF-56000 (Controller)
13 56MHz radio-frequency power supplies for plasma generation and used for
sputtering CVD etching and ion-plating We offer 750W to 6kW generators and
matching networks
DR Powder Feeder
Thermal plasma around 10000degC (15000deg F) by RF inductive coupling This thermal Fine powder feeder that can feed 01 to 100 11m size fine powder continuously with
plasma is used for nano powder synthesis fine powder spheroidization thick film carrier gas We offer optional feeding rate controller and large capacity hopper
deposition multi composite membrane synthesis CVD and harmful gas
decomposition
18 I Produci Guide
---
Biochemical Analyzers
I JCA-BM series Clinical Chemistry Analyzer BioMajesty Series
JEOLs micro volume technology and unique sample pre-dilution mechanism realizes
high throughput chemistry analysis with reduced sample and reagent volume
More than 4000 systems have been placed in clinical laboratories allover the world
JCA-BM6050
I JCA-BMBOOO series Ultra High Throughput Clinical Chemistry Analyzer
4 4
JCA-BMB060 egt
JCA-BMSOOO series offer ultra high throughput chemistry analysis up to 9000 testsl
hour
The pre-dilution unit one of the BioMajesty family features also continues the strong
tradition in these series with interconnected multiple analysis modules the key factors
that accomplish brilliant high throughput as well as downtime reduction with back-up
capability
I JCA-BM6070 High Throughput High Performance Clinical Chemistry An alyzer
I I I
A Clinical chemistry analyzer with incomparable speed and accuracy which achieves
high throughput of 2400 testslhour (includ ing ISE) The incorporated compact
workstation and user-friendly Interface with excellent operability leads the new trend of
the laboratory testing
BioMajesty Series lCA-BM 6010 lCA-BM 6050
lCA-8M 6070 leA-BM 91 30
lCA-BM 8000 Series
bull This product is distributed outside Japan by Siemens Heatthcare Diagnostics under the ADVtAreg brand name
I JCA-BM601 OC Compact amp High Performance Clinical Chemistry Analyzer
-~-I -
1lIIIIIIilllllllllJllnlIlII Ii I JCA-BM6010C is a compact but efficient automatic analyzer that maintains the basic
concept of BioMajesty series while achieving the excellent capability of microanalysis
with sample volume as small as 1 J1L
BM6010C also offers fully automated HbA1 c analysis with on-board hemolysis
(optional) Simultaneous measurement of Glucose and HbA1c improves laboratory
workflow
Product Guid e I 19
S~~MCEAII Certain products in this brochure are controlled under the Foreign 0J 0014007 -v- ~ Exchange and Foreign Trade Law of Japan in compliance with $ ~~~ international security export control JEOL Ltd must provide the~2 m) IIlt Japanese Government with End-users Statement of Assurancel A MGMT SYS
AvA ~ m and End-use Certificate in order to obtain the export license - tiJ needed for export from Japan If the product to be exported is in this category the end user will be asked to fill in these certificate formsdEOLIS09001 amp150 14001CenrfiCltlled
httpwwwjeolcomdEOL JEOL Ltd 1-2 Musashino 3-chome Akishima Tokyo 196-8558 Japan Sales Division Telephone+81-42-528-3381 Facsimile+81-42-528-3386
ARGENTINA COASIN SAClyF Virrey del Pino 4071 1430 Buenos Aires Argentina Telephone 54-11-4552-3185 Facsimile 54-11-4555-3321
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N1601 World Trade Center Building 371-375 Huan Shi Road East Guang Zhou Guangdong Prov 510095 PRChina Telephone 86-20-8778-7848 Facsimile 86-20-8778-4268
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Room A2117 Zhongshang Plaza Office Bldg NO7 Zhongnan Road Wuhan Hubei 430071 PRChina Telephone 86-27-8713-2567 Facsimile 86-27-8713-2567
JEOL LTD (BEIJING) CO LTD CHENGDU BRANCH 1807A Zonglu Building NO 35 Zhongfu Road Chengdu Sichuan 610016 PR China Telephone 86-28-86622554 Facsimile 86-28-86622564
EGYPT JEOL SERIVCE BUREAU
3rd Fl Nile Center Bldg Nawal Slree Dokkl (Cairo) Egypt Telephone 20-2-3335-7220 Facsimile 20-2-3338-4186
FRANCE JEOL (EUROPE) SAS Espace Claude Monet 1 Allee de Giverny 78290 Crolssy-sur-Seine France Telephone 33-13015-3737 Facsimile 33-13015-3747
GERMANY JEOL (GERMANY) GmbH Oskar-Von-Miller-Strasse 1 a 85386 Eching Gennany Telephone 49-8165-77346 Facsimile 49-8165-77512
GREAT BRITAIN amp IRELAND JEOL (UK) LTD JEOL House Silver Court Watchmeaci Welwyn Garden City Herts AL71LT UK Telephone 44-1707 -377117 FaCSimile 44-1707-373254
GREECE N ASTERIADIS SA
56-58S Trikoupl Str PO Box 26140 GR-10022 Athens Greece Telephone 30-1-823-5383 Facsimile 30-1-823-9567
HONG KONG FARMING LTD
Unit No1 009 1 OF Prosperity Milennia Plaza 663 Kings Road North Point Hong Kong Telephone 852-2815-7299 Facsimile 852-2581-4635
INDIA JEQL INDIA Pvt Ltd
Elegance Tower Level 2 2128 Old Mathura Road Jasola Business District Centre Near Apollo Hospital Jasola New Delhi 110025 India Telephone 91-11-6472-2578 Facsimile 91-11-4060-1235
BLUE STAR LTD (HQ Mumbaij
Analyticallnstrments Department Sahas 41412 Veer Savarkar Marg Prabhadery Mumbai 400 025 India Telephone 91-22-6666-4000 Facsimile 91-22-6666-4001
BLUE STAR LTD (DelhQ Analytical Instruments Department E-4412 Okhla Industrial Area Phase-II New Delhi 110 020 India Telephone 91-11-4149-4000 Facsimile 91-11-4149-4005
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Analylicallnstruments Department 7 Hare Street Calcutta 700 001 India Telephone 91-33-2213-4133 Facsimile 91 -33-2213-4102
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INDONESIA PT TEKNOLABindo Penta Perkasa Komplek Gading Bukillndah Blok lIll JI Bukfl Gading Raya Kelapa Gading Pennai Jakarta 14240 Indonesia Telephone 62-21-458470575859 Facsimile 62-21-45842729
ITALY JEOL 0TALIA) SpA Centro Direzionale Green Office Via dei Tulipani 1 20090 Pieve Emanuele (MI) Italy Telephone 39-02-9041431 Facsimila 39-02-90414343
KOREA JEOL KOREA LTD
Dongwoo Bldg 7F 1443 Yangjae Daero Gangdong-Gu Seoul 134-010 Korea Telephone 82-2-511-5501 Facsimile 82-2-511-2635
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205 Block A Mezzanine Floor Kelana Business Center 97 Jalan SS 72 Kelana Jaya 47301 Petaling Jaya Selangor Malaysia Telephone 60-3-7492-7722 Facsimile 60-3-7492-7723
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14-C Main Sehar Commercia) Avenue Lane 4 Khayaban-e-Sehar DHA-VII Karachimiddot75500 Pakinstan Telephone 92-21-353455813534074735346057-8 Facsimile 92-21-35345582
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PHILIPPINES PHILAB INDUSTRIES INC
7487 Bagtikan Street SAY Makati 1203 Metro Manila Phillip pines Telephone 63-2-896-7218 Facsimile 63-2-897-7732
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Hammarbacken 6A Box 716191 27 Sollentuna Sweden Telephone 46-8-28-2800 Facsimile 46-8-29-1647
SERVICE amp INFORMATION OFFICE NORWAY JEQL (Skandinaviska)AB
Lorenvangen 23 0580 Oslo NORWAY Telephone 47-2-2-64-7930 Facsimile 47-2-2-65-0619
FINLAND JEOL (Skandlnaviska)AB
Ylakaupinkuja 2 FIN-02360 Espoo Finland Telephone 358-9-8129-0350 Facsimile 358-9-8129-0351
SINGAPORE JEOLASIA PTE LTD
2 Corporation Road 1t01-12 Corporation Place Singapore 618494 Telephone 65-6565-9989 Facsimile 65-6565-7552
SOUTH AFRICA ADI Scientific (Pty) Ltd
370 Angus Crescent Northlands Business Park 29 Newmarket Road
~~=~g~~~2~~1nt~~2_~~~bIlC of South Africa
Facsimile 27-11 -462-1466
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Argoneses 13 28100 Alcobendas (poligono IndustriaQ Madrid Spain Te~phone 34-91-663-0500 Facsimile 34-91-663-0545
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For Mass Spectrometer Products Mass Solutions Technology Co Ltd
5F No79 Sec 1 Xintai 5th Rd Xlzhi Dis New Taipei City 221 Taiwan Republic of China Telephone 886-2-2698-9511 Facsimile 886-2-2698-9512
For Semiconductor Products JEOL TAIWAN SEMICONDUCTORS LTD
11 F-l No 346 Pei-Da Road Hsin-Chu City 300 Taiwan Republic of China Telephone 886-3-523-8490 Facsimile 886-3-523-8503
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300 Phaholyothin Rd Phayathai Bangkok 10400 Thailand Telephone 66-2-615-2929 Facsimile 66-2-615-23502351
THE NETHERLANDS JEOL (EUROPE) Bv Ureweg 4 NL-2153 PH Nieuw-Vennep The Nelherlands Telephone 31-252-623500 Facsimile 31-252-623501
TURKEY TEKSERAS Kayisdagi )nonu MahKartal Cad No553 34755 Atasehir Istanbul Turkey Telephone 90-216-5736470 Facsimile 90-216-5736475
UAE MRS Group Dubai POBox 171612 Rashid Abdulla AI Noami Building Suite No 306 Damascus Street AI Qusais-3 Dubai UAE Telephone 971-4-2581141 Facsimile 971-4-2581151
JEOLGulf
POBox 171612 bull Rashid Abdulla AI Noami Building Suite No 306 Damascus Street AI Qusais-3 Dubai UAE Telephone 971-553964219(mobile)
USA JEOL USA INC 11 Dearborn Road Peabody MA 01960 USA Telephone 1-978-535-5900 Facsimile 1-978-536-22052206
JEOL USA INC WEST OFFICE
~~s~~~~~rigAe9~5t~~1 1 0 Telephone 1-925-737-1740 Facsimile 1-925-737-1749
VENEZUELA GOMSA Service and Supply CA
Urbanizacion Montalban JlI - Resldenclas Don Andres - Piso 7 - Apartomento 74 Avenida 3 entre calles 7 y 6 Montalban Caracas Venezuela Telephone 58-212-443-4342 Facsimile 58-212-443-4342
VTETNAM TECHNICAL MATERIALS AND RESOURCES IMPORT-EXPORT JOINT STOCK COMPANY(REXCO) Hanoi Branch
No 13-Lot 12 Trung Yen Trung Hoa Street Cau Giay Dist HanOi Vietnam Telephone 84-4-562-051617562-0535 Facsimile 84-4-853-2511
No 0205B389C Printed in Japan Kp
X-ray Fluorescence Spectrometers
I ISX 400Rll Element Analyzer
An energy-dispersive X-ray fluorescence spectrometer for environmental analysis
which helps you comply with environmental regulations for hazardous substances
such as the RoHS and ELV directives in the EU and soil pollution in Japan You can
easily analyze minute traces of Cd Pb Hg Cr etc This analyzer is also suitable for
general analySiS including element analysis and thickness measurement using the FP
(fundamental parameter) method
I JSX-31 OORll Element Analyzer
An energy-dispersive X-ray fiuorescence spectrometer for environlnlntal analysis which helps you
comply with environmental regulations for hazardous substances such as the RoHS and ELV
directives in the EU and soil pollution in Japan This analyzer inoorporates a JEOL-made electrically
cooled Si(u] detector making liquid nrtrogen unnecessary as well as providing high sensitivity for
heavy-element analysis such as Cd Pb and Hg This analyzer is also surtable for general analysis
including eement analysis and thickness measurement using the FP (fundamental parameter)
method
12 I Product Guide
Semiconductor Eq Ipm nt
2 Electron Beam Lithography System
-5
Electron Beam Lithography System
r
Electron Beam Lithography System
-~=-~--I--~ I
~ ~ ~-
Th e JBX-3200MV is an e lec lro n bea m lithography system developed for the production of next generation ultrahigh-precision masks and reticles This system employs a variableshyshaped electron beam o f 50kV and a step amp repeat specimen stage
High thro ug hp ut enabled by a new PEG (Proximity Effect Correction) system High-speed da la- transfer sys tem for a large quanti ty data High-precision design for masklrelicle production
Th e JBX-9 500FS is a spot beam
lithography system developed to meet a
wi de range of applications with high
throughput and high precision periormance
This sys tem covers fields from the nanoshy
technology research to the production of
leading edge devices
f 100kV _ ZrONV Schotlky emitter
maximum 300 mm wafer
Th e JBX-6300 FS is a s p o t b ea m
lithography system developed to meet a
w ide range o f applica tions with high
resolution and high precision periormance
This system covers fields from the nanoshy
technology research to the development of
next generation devices
25 kVl50 kVl1 00 kV ZrONV Schottky emittelt
maximum 200 mm wafelt
Prod ucl Gu ide I 13
-
---------
-_ -~
- --= - - - =-shy -
NMR Spectrometers
I JNM-ECAECX series FT NMR System
920 MHz magnet Photo courtesy Nationallnstrtute of Natural Sciences Institute for
Molecular Science
The JNM-ECA920 FT NMR System is a 920 MHz high-resolution NMR
spectrometer developed by JEOL This spectrometer uses the superconducting
magnet co-developed by National Institute for Materials Science and Kobe Steel
Ltd which generates the high magnetic field Created by combining Japans stateshy
of-the-art technologies this FT NMR System marks an important milestone in next
generation biology and nanotechnology which call for high-magnetic-field highshy
resclution NMR analysis
JEOL RESONANCE Inc
~ ~ ~
~t~-
~ 100
HNCACB spectrum of 13C(15N labeled Solid 23Na-MQMAS spectrum of ubiqurtin N3)P207
The JNM-ECNECX series are versatile high-performance FT NMR spectrometer
system that utilize the latest digital and high-frequency technology The ECA
spectrometer is applicable up to 1GHz and can be used for a wide range of
applications including liquidsolid NMR protein analysis and diffusion coefficient
measurement
INM-EC cd
JOO ~QO 0(1 ~uo 1)0
Spectrometer I Oscillator receiver power amplifier
Magnet IISCM Field strength 705T I 939T 11 74T 1401T 1643T
Bore diameter (mm) 54 I 54 54 54 54
Probe 5 mm Ttl tunable
11110
188T
54
JEOL RESONANCE Inc
INMmiddot fO rie ---shy
)Ol~ ~1111 011 Oll
Spectrometer Oscillator receiver power amplifier
Magnet I ISCM Field strength 705T 939T I 1174T 1401T
Bore diameter (mm) I 54 54 54 54
Probe I 5 mm TH tunable
JEOL RESONANCE Inc
14 I Produc t Guide
bull bull bull
IJNM-ECS 00 FT NMR System
bull I ASC Series
Auto Sample Changer
ASC8 (8 samples) ASC24 (24 samples)
middotmiddot iT ~ --shy
~ I -~Au
ASC16 (16 samples) ASC64 (64 samples)
bullIJNM-ECAECX series Solid NMR
=- ~
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bull
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MAS conlroller Solid NMR sampling kit
NMR Systems For Modern NMR Spectroscopy The JNM-ECS400 i s a compact two-channel
spectrometer that retains the advanced capabilities of the
JNM-ECAlECX series (required installation space is oneshy
half compared to conventional NMRs) Programmable
timing sequencers built into each RF and PFG channel
can independently control either synchronous or
asynchronous operations of each channel Its standard
tunable broadband gradient probe which integrates all
JEOLs newest technologies is the high sesitivity roomshy
tempperature probe
Ccmpact spectrometer chassis Innovaten in JEOL NMR digrtal architecture High-stability and high-accuracy digital spectrometer High-sensrtivity new tunable probe Full automalk NMR with advanced software
JEOL RESONANCE Inc
An automatic sample changer makes it
possible to measure many samples
sequentially by exchanging multiple samples
automatically one by one Five changer
models are available for 8 samples 16
samples 24 samples 64 samples and 100
samples
JEOL RESONANCE Inc
ASC100 (100 samples)
1 --0 1(10 C ppm I
Sdid 13C-CPMAS spectrum of cholk acid
Solid-NMR is a technique that measures solid samples (powder or film-like samples) This technique is also effective for measurement of samples not soluble in solvents (inorganic
samples etc) and of crystalline polymorph that is meaningful to measure at the solid state
JEOL RESONANCE Inc
Produci Guide I 15
Mass Spectrometers
I JMS-800D UltraFOCUS I JMS-700 (2) MStation Mass Spectrometer Dedicated to Dioxin Anal ys is High resolution M ass Spectrometer
JMS-800D UltraFOCUS is the optimal cho ice for ultra lowlevel race detection
applications suc h as moni torin g for dioxins and related co mpoun ds eg
Polychlorinated Biphenyls (PCBs) Polybrominated Diphenyl Ethers (PBDEs) or drugs
of abuse by high resolution-selected ion monitoring (HRSIM) gas chromatographyl
mass spectrometry(GCMS)
R-- gtn 80000 (10 valley) Sent Ily 2 3 7 8-TCDD 100fg SNgt2oo
(6 channels 100 msecch Resolution 10000)
N_ Jut J _lllgEI up to 10 kV
JMS-S3000 Matri x Assisted Laser DesorptionIonization TOFMS
The JMS-S3000 is a MALOI-TOFMS incorporating an innovative SpirarrOF ion optical
system With superior capabilities than conventional MALDI-TOFMS the JMS-S3000
provides sate-of-the-art anaiylical solutions for a wide range of research areas such as
functional synthetic polymers materials science and biomolecules
Malrix Assisled Laser Desorpllonlonization Timemiddotof-Flighl Mass Spectrometer
I JMS-T1 OOLP+DART TLC-TOFMS
Pet c 60000 (10 valley) err 02 ng of methyl stearate
SIN 400
(CVEI combination ion source) I~ ~ aJe up to 10kV
I JMS-T1 OOLP LC-TOFMS
I JMS-Tl OOGCV GC-TOFMS
middotl shyThe JMS-T100LP+DART achieves simple and fast TLCMS analysis Accurate mass The JMS-Tl00GCV is a fully automatic Gas Chromatograph - Time-ot-Flight Mass
measurement capabilit y of TOFMS also enables you to determine element Spectrometer (GC-TOFMS) This versatile MS system covers wide range of
compositions of the analytes applications in GC-MS analysis
16 I Pr oduc i Gu ide
- -
---
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I JMS-Ql 050GC UltraQuad GClMS
cJEOL
-
S-trapHS Headspace Autosampler
ESR Spectrometers
I JES-X3 series ESR Spectrometers
Recently it has been widely
accepted that even retatively few
unpaired electrons in a sample can
affect the function of the material so
lower detection limits (high er
sens itivity) is required of ESR
measurements JES-X3 Series has
achieved higher sensiti v i ty by
developing a lOIN-noise Gunn
oscillator for its new spectrometer
JES-X320 JEOL RESONANCE Inc
i III III )
Maximum Magnetic Field I a6ST 13T 14T
SweepW idth I --00-- 250mT plusmn001 - 500m__T_ __--l
Pole Gap _ _ 6cmm__ ___-= ___~ ____cmm__ _ I 0 = 60mcm 75 _l
Frequency Range(GHz) 8750 - 9650 _ _ _ ___-1
Field Resolution (mT) _L_ 235 Correction by Marker _1_--- Standard
I Operating System Windows 7
The JMS-01050GC is an innovative quadrupole mass spectrometer (OMS) that
achieves the highest-level sensitivity in OMS It has a high ability of evacuation due
to the use of a split flow turbo-molecular pump system (400 Lis) th at
simultaneously evacuates the ion source and the detector The use of a highshy
accuracy hyperbolic quadrupole mass analyzer provides high resolution
The S-trap is a next-generation headspace autosampler providing ultra-low
concentration measurement which was not achieved with a heads pace (HS) method
using conventional sample loop In addition the HS-GCMS system combined lith a
JMS-01050GC Mkll quaorupole MS guarantees detection of mold odor in water
down to 1 ppt
I ES-CT470 Liquid Helium Variable Temperature Controller
The ES-CT470 varies the sample temperature in the temperature range between 25 K
and 470 K Temperature setting is performed by d igital display and the set
temperature is kept constant by automatic control circui ts Combined use with a UV Irradiation device is possible A GaAs etement is used as a temperature sensor
enabling high-accuracy temperature setling
- 25 K to 470 K
plusmn001 K for 25 K to 42 K
plusmn1 orO5 K for 42 K to 470 K
_ 20 min 10 25 min (rom room temperature 08 to 2 Uh
50Hz60Hz 5mm JEOL RESONANCE Inc
Produ c t Guide I 17
Industrial Equipm nt for thin-filnl formation and nlatel ial processing
I bull
Electron Beam Source High-power Electron Beam Source
BS-60060EBS EBG-102UB6S
Electron beam sources for vacuum evaporation of metal and metal-oxide thin-films
We offer a wide variety of electron beam sources and crucibles They have features of
excellent beam spot and energy density and high-speed sweeping
1 PGBS 80020CPPS Plasma Source
BS-80011 BPG (6kW) BS-8002OCPPS (3kW)
Plasma Sources are installed in a vacuum chamber and generate high-density plasma
Used as Ion Plating (Plasma Assisted Deposition) and it is possible to improve film
properties for optilcal thin films protective films and function films Because highshy
density plasma can be generated in a mass space high-rate deposition to a large area
is possible
I RF Induction Plasma System
JEBG-3000UB(300kW) JEBG-1 OOOUB(1 OOkW)
High-power electron beam sources for vacuum evaporation of metal and metal-oxide
for wide plastic films or large glass plates that are continuously fed And they can also
be used for vacuum melting of high-melting point metals
raes
RF Generator
t shy - - - --- - - --- -
0-~ 0 bull bullbull - -
RF-12030 (3kW) RF-56000 (Controller)
13 56MHz radio-frequency power supplies for plasma generation and used for
sputtering CVD etching and ion-plating We offer 750W to 6kW generators and
matching networks
DR Powder Feeder
Thermal plasma around 10000degC (15000deg F) by RF inductive coupling This thermal Fine powder feeder that can feed 01 to 100 11m size fine powder continuously with
plasma is used for nano powder synthesis fine powder spheroidization thick film carrier gas We offer optional feeding rate controller and large capacity hopper
deposition multi composite membrane synthesis CVD and harmful gas
decomposition
18 I Produci Guide
---
Biochemical Analyzers
I JCA-BM series Clinical Chemistry Analyzer BioMajesty Series
JEOLs micro volume technology and unique sample pre-dilution mechanism realizes
high throughput chemistry analysis with reduced sample and reagent volume
More than 4000 systems have been placed in clinical laboratories allover the world
JCA-BM6050
I JCA-BMBOOO series Ultra High Throughput Clinical Chemistry Analyzer
4 4
JCA-BMB060 egt
JCA-BMSOOO series offer ultra high throughput chemistry analysis up to 9000 testsl
hour
The pre-dilution unit one of the BioMajesty family features also continues the strong
tradition in these series with interconnected multiple analysis modules the key factors
that accomplish brilliant high throughput as well as downtime reduction with back-up
capability
I JCA-BM6070 High Throughput High Performance Clinical Chemistry An alyzer
I I I
A Clinical chemistry analyzer with incomparable speed and accuracy which achieves
high throughput of 2400 testslhour (includ ing ISE) The incorporated compact
workstation and user-friendly Interface with excellent operability leads the new trend of
the laboratory testing
BioMajesty Series lCA-BM 6010 lCA-BM 6050
lCA-8M 6070 leA-BM 91 30
lCA-BM 8000 Series
bull This product is distributed outside Japan by Siemens Heatthcare Diagnostics under the ADVtAreg brand name
I JCA-BM601 OC Compact amp High Performance Clinical Chemistry Analyzer
-~-I -
1lIIIIIIilllllllllJllnlIlII Ii I JCA-BM6010C is a compact but efficient automatic analyzer that maintains the basic
concept of BioMajesty series while achieving the excellent capability of microanalysis
with sample volume as small as 1 J1L
BM6010C also offers fully automated HbA1 c analysis with on-board hemolysis
(optional) Simultaneous measurement of Glucose and HbA1c improves laboratory
workflow
Product Guid e I 19
S~~MCEAII Certain products in this brochure are controlled under the Foreign 0J 0014007 -v- ~ Exchange and Foreign Trade Law of Japan in compliance with $ ~~~ international security export control JEOL Ltd must provide the~2 m) IIlt Japanese Government with End-users Statement of Assurancel A MGMT SYS
AvA ~ m and End-use Certificate in order to obtain the export license - tiJ needed for export from Japan If the product to be exported is in this category the end user will be asked to fill in these certificate formsdEOLIS09001 amp150 14001CenrfiCltlled
httpwwwjeolcomdEOL JEOL Ltd 1-2 Musashino 3-chome Akishima Tokyo 196-8558 Japan Sales Division Telephone+81-42-528-3381 Facsimile+81-42-528-3386
ARGENTINA COASIN SAClyF Virrey del Pino 4071 1430 Buenos Aires Argentina Telephone 54-11-4552-3185 Facsimile 54-11-4555-3321
AUSTRALIA amp NEW ZEALAND JEOL(AUSTRALASJA) PtyUd Suite 1 L2 18 Aquatic Drive - Frenchs Foresl NSW 2086 Australia Telephone 61-2-9451-3855 Facsimile 61-2-9451-3822
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Arturo Pmt 828Santiago Chile Telephone 56-2-634-6266 Facsimile 56-2-634-4633
CHINA JEOL(BEIJING) CO LTD Room Bl0l0l110 Wantong New Wond Plaza No2 Fuchengmenwai Street XIcheng District Beijing 100037 PRChina Telephone 86-10-6804-6321 Facsimile 86-10-6804-6324
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Room 15051506 Nol300Xi Kang Road Jing an Dis Shanghai 200040 China Telephone 86-21-6248-4868448745374404 Facsimile 86-21-6248-4075
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N1601 World Trade Center Building 371-375 Huan Shi Road East Guang Zhou Guangdong Prov 510095 PRChina Telephone 86-20-8778-7848 Facsimile 86-20-8778-4268
JEOL (BEIJING) CO LTD WUHAN BRANCH
Room A2117 Zhongshang Plaza Office Bldg NO7 Zhongnan Road Wuhan Hubei 430071 PRChina Telephone 86-27-8713-2567 Facsimile 86-27-8713-2567
JEOL LTD (BEIJING) CO LTD CHENGDU BRANCH 1807A Zonglu Building NO 35 Zhongfu Road Chengdu Sichuan 610016 PR China Telephone 86-28-86622554 Facsimile 86-28-86622564
EGYPT JEOL SERIVCE BUREAU
3rd Fl Nile Center Bldg Nawal Slree Dokkl (Cairo) Egypt Telephone 20-2-3335-7220 Facsimile 20-2-3338-4186
FRANCE JEOL (EUROPE) SAS Espace Claude Monet 1 Allee de Giverny 78290 Crolssy-sur-Seine France Telephone 33-13015-3737 Facsimile 33-13015-3747
GERMANY JEOL (GERMANY) GmbH Oskar-Von-Miller-Strasse 1 a 85386 Eching Gennany Telephone 49-8165-77346 Facsimile 49-8165-77512
GREAT BRITAIN amp IRELAND JEOL (UK) LTD JEOL House Silver Court Watchmeaci Welwyn Garden City Herts AL71LT UK Telephone 44-1707 -377117 FaCSimile 44-1707-373254
GREECE N ASTERIADIS SA
56-58S Trikoupl Str PO Box 26140 GR-10022 Athens Greece Telephone 30-1-823-5383 Facsimile 30-1-823-9567
HONG KONG FARMING LTD
Unit No1 009 1 OF Prosperity Milennia Plaza 663 Kings Road North Point Hong Kong Telephone 852-2815-7299 Facsimile 852-2581-4635
INDIA JEQL INDIA Pvt Ltd
Elegance Tower Level 2 2128 Old Mathura Road Jasola Business District Centre Near Apollo Hospital Jasola New Delhi 110025 India Telephone 91-11-6472-2578 Facsimile 91-11-4060-1235
BLUE STAR LTD (HQ Mumbaij
Analyticallnstrments Department Sahas 41412 Veer Savarkar Marg Prabhadery Mumbai 400 025 India Telephone 91-22-6666-4000 Facsimile 91-22-6666-4001
BLUE STAR LTD (DelhQ Analytical Instruments Department E-4412 Okhla Industrial Area Phase-II New Delhi 110 020 India Telephone 91-11-4149-4000 Facsimile 91-11-4149-4005
BLUE STAR LTD (Calcutta)
Analylicallnstruments Department 7 Hare Street Calcutta 700 001 India Telephone 91-33-2213-4133 Facsimile 91 -33-2213-4102
BLUE STAR LTD (ChennaO Analytical Instruments Department No 46 Garuda Building Cathedral Road Chennai 600 086 India Telephone 91-44-4244-4000 Facsimile 91-44-4244-4190
INDONESIA PT TEKNOLABindo Penta Perkasa Komplek Gading Bukillndah Blok lIll JI Bukfl Gading Raya Kelapa Gading Pennai Jakarta 14240 Indonesia Telephone 62-21-458470575859 Facsimile 62-21-45842729
ITALY JEOL 0TALIA) SpA Centro Direzionale Green Office Via dei Tulipani 1 20090 Pieve Emanuele (MI) Italy Telephone 39-02-9041431 Facsimila 39-02-90414343
KOREA JEOL KOREA LTD
Dongwoo Bldg 7F 1443 Yangjae Daero Gangdong-Gu Seoul 134-010 Korea Telephone 82-2-511-5501 Facsimile 82-2-511-2635
KUWAIT Ashraf amp CO Ltd WLL PO Box 3555 Safat 13036 Kuwait Telephone 965-1805151 Facsimile 965-24335373
MALAYSIA JEOL(MALAYSIA) SDNBHD(3S9011-M)
205 Block A Mezzanine Floor Kelana Business Center 97 Jalan SS 72 Kelana Jaya 47301 Petaling Jaya Selangor Malaysia Telephone 60-3-7492-7722 Facsimile 60-3-7492-7723
MEXICO JEOL DE MEXICO SA DE CV
Arkansas 11 Piso 2 Colonia Napoles Delegacion Benito Juarez CP 03810 Mexico DF Mexico Telephone 52-5-55-211-4511 Facsimile 52-5-55-211-0720
PAKISTAN (KarachI) ANALYTICAL MEASURING SYSTEM (pvn LTD(AMS LTD)
14-C Main Sehar Commercia) Avenue Lane 4 Khayaban-e-Sehar DHA-VII Karachimiddot75500 Pakinstan Telephone 92-21-353455813534074735346057-8 Facsimile 92-21-35345582
PANAMA PROMED SA Parque Industrial Costa del Este Urbanizacion Costa del Este Apartado 0816-01755 Panama Panama Telephone 507-303-3100 FaCSimile 507-303-3115
PHILIPPINES PHILAB INDUSTRIES INC
7487 Bagtikan Street SAY Makati 1203 Metro Manila Phillip pines Telephone 63-2-896-7218 Facsimile 63-2-897-7732
PORTUGAL Izasa Portugal Lda A do Proletariado 1 2790-138 CARNAXIDE Portugal Telephone 351-21-424-73-00 Facsimile 351-21-418-60-20
RUSSIA JEOL (RUS) LLC Krasnoproletarskaya Street 16 Bid 2 127473 Moscow Russian Federation Telephone 7-495-748-7791rr792 Facsimile 7-495-748-7793
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King Abdulaziz Avenue PO Box 215 Riyadh 11411 Saudi Arabia Telephone 966-1-479-3000 Facsimile 966-1-477-1374
SCANDINAVIA SWEDEN JEOL (Skandinaviska)AB
Hammarbacken 6A Box 716191 27 Sollentuna Sweden Telephone 46-8-28-2800 Facsimile 46-8-29-1647
SERVICE amp INFORMATION OFFICE NORWAY JEQL (Skandinaviska)AB
Lorenvangen 23 0580 Oslo NORWAY Telephone 47-2-2-64-7930 Facsimile 47-2-2-65-0619
FINLAND JEOL (Skandlnaviska)AB
Ylakaupinkuja 2 FIN-02360 Espoo Finland Telephone 358-9-8129-0350 Facsimile 358-9-8129-0351
SINGAPORE JEOLASIA PTE LTD
2 Corporation Road 1t01-12 Corporation Place Singapore 618494 Telephone 65-6565-9989 Facsimile 65-6565-7552
SOUTH AFRICA ADI Scientific (Pty) Ltd
370 Angus Crescent Northlands Business Park 29 Newmarket Road
~~=~g~~~2~~1nt~~2_~~~bIlC of South Africa
Facsimile 27-11 -462-1466
SPAIN IZASA SA
Argoneses 13 28100 Alcobendas (poligono IndustriaQ Madrid Spain Te~phone 34-91-663-0500 Facsimile 34-91-663-0545
SWITZERLAND JEOL (GERMANY) GmbH Oskar-Von-Miller Strasse 1 85386 Eching Germany Telephone 49-8165-77346 Facsimile 49-8165-77512
TAIWAN For EO ProQucts JIE DONG CO LTD 7F 112 Chung Hsiao East Road Section 1 Taipei Taiwan 10023 Republic of China Telephone 886-2-2395-2978 Facsimile 886-2~2322-4655
For Mass Spectrometer Products Mass Solutions Technology Co Ltd
5F No79 Sec 1 Xintai 5th Rd Xlzhi Dis New Taipei City 221 Taiwan Republic of China Telephone 886-2-2698-9511 Facsimile 886-2-2698-9512
For Semiconductor Products JEOL TAIWAN SEMICONDUCTORS LTD
11 F-l No 346 Pei-Da Road Hsin-Chu City 300 Taiwan Republic of China Telephone 886-3-523-8490 Facsimile 886-3-523-8503
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300 Phaholyothin Rd Phayathai Bangkok 10400 Thailand Telephone 66-2-615-2929 Facsimile 66-2-615-23502351
THE NETHERLANDS JEOL (EUROPE) Bv Ureweg 4 NL-2153 PH Nieuw-Vennep The Nelherlands Telephone 31-252-623500 Facsimile 31-252-623501
TURKEY TEKSERAS Kayisdagi )nonu MahKartal Cad No553 34755 Atasehir Istanbul Turkey Telephone 90-216-5736470 Facsimile 90-216-5736475
UAE MRS Group Dubai POBox 171612 Rashid Abdulla AI Noami Building Suite No 306 Damascus Street AI Qusais-3 Dubai UAE Telephone 971-4-2581141 Facsimile 971-4-2581151
JEOLGulf
POBox 171612 bull Rashid Abdulla AI Noami Building Suite No 306 Damascus Street AI Qusais-3 Dubai UAE Telephone 971-553964219(mobile)
USA JEOL USA INC 11 Dearborn Road Peabody MA 01960 USA Telephone 1-978-535-5900 Facsimile 1-978-536-22052206
JEOL USA INC WEST OFFICE
~~s~~~~~rigAe9~5t~~1 1 0 Telephone 1-925-737-1740 Facsimile 1-925-737-1749
VENEZUELA GOMSA Service and Supply CA
Urbanizacion Montalban JlI - Resldenclas Don Andres - Piso 7 - Apartomento 74 Avenida 3 entre calles 7 y 6 Montalban Caracas Venezuela Telephone 58-212-443-4342 Facsimile 58-212-443-4342
VTETNAM TECHNICAL MATERIALS AND RESOURCES IMPORT-EXPORT JOINT STOCK COMPANY(REXCO) Hanoi Branch
No 13-Lot 12 Trung Yen Trung Hoa Street Cau Giay Dist HanOi Vietnam Telephone 84-4-562-051617562-0535 Facsimile 84-4-853-2511
No 0205B389C Printed in Japan Kp
Semiconductor Eq Ipm nt
2 Electron Beam Lithography System
-5
Electron Beam Lithography System
r
Electron Beam Lithography System
-~=-~--I--~ I
~ ~ ~-
Th e JBX-3200MV is an e lec lro n bea m lithography system developed for the production of next generation ultrahigh-precision masks and reticles This system employs a variableshyshaped electron beam o f 50kV and a step amp repeat specimen stage
High thro ug hp ut enabled by a new PEG (Proximity Effect Correction) system High-speed da la- transfer sys tem for a large quanti ty data High-precision design for masklrelicle production
Th e JBX-9 500FS is a spot beam
lithography system developed to meet a
wi de range of applications with high
throughput and high precision periormance
This sys tem covers fields from the nanoshy
technology research to the production of
leading edge devices
f 100kV _ ZrONV Schotlky emitter
maximum 300 mm wafer
Th e JBX-6300 FS is a s p o t b ea m
lithography system developed to meet a
w ide range o f applica tions with high
resolution and high precision periormance
This system covers fields from the nanoshy
technology research to the development of
next generation devices
25 kVl50 kVl1 00 kV ZrONV Schottky emittelt
maximum 200 mm wafelt
Prod ucl Gu ide I 13
-
---------
-_ -~
- --= - - - =-shy -
NMR Spectrometers
I JNM-ECAECX series FT NMR System
920 MHz magnet Photo courtesy Nationallnstrtute of Natural Sciences Institute for
Molecular Science
The JNM-ECA920 FT NMR System is a 920 MHz high-resolution NMR
spectrometer developed by JEOL This spectrometer uses the superconducting
magnet co-developed by National Institute for Materials Science and Kobe Steel
Ltd which generates the high magnetic field Created by combining Japans stateshy
of-the-art technologies this FT NMR System marks an important milestone in next
generation biology and nanotechnology which call for high-magnetic-field highshy
resclution NMR analysis
JEOL RESONANCE Inc
~ ~ ~
~t~-
~ 100
HNCACB spectrum of 13C(15N labeled Solid 23Na-MQMAS spectrum of ubiqurtin N3)P207
The JNM-ECNECX series are versatile high-performance FT NMR spectrometer
system that utilize the latest digital and high-frequency technology The ECA
spectrometer is applicable up to 1GHz and can be used for a wide range of
applications including liquidsolid NMR protein analysis and diffusion coefficient
measurement
INM-EC cd
JOO ~QO 0(1 ~uo 1)0
Spectrometer I Oscillator receiver power amplifier
Magnet IISCM Field strength 705T I 939T 11 74T 1401T 1643T
Bore diameter (mm) 54 I 54 54 54 54
Probe 5 mm Ttl tunable
11110
188T
54
JEOL RESONANCE Inc
INMmiddot fO rie ---shy
)Ol~ ~1111 011 Oll
Spectrometer Oscillator receiver power amplifier
Magnet I ISCM Field strength 705T 939T I 1174T 1401T
Bore diameter (mm) I 54 54 54 54
Probe I 5 mm TH tunable
JEOL RESONANCE Inc
14 I Produc t Guide
bull bull bull
IJNM-ECS 00 FT NMR System
bull I ASC Series
Auto Sample Changer
ASC8 (8 samples) ASC24 (24 samples)
middotmiddot iT ~ --shy
~ I -~Au
ASC16 (16 samples) ASC64 (64 samples)
bullIJNM-ECAECX series Solid NMR
=- ~
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l l
bull
0 5ilJl
0
MAS conlroller Solid NMR sampling kit
NMR Systems For Modern NMR Spectroscopy The JNM-ECS400 i s a compact two-channel
spectrometer that retains the advanced capabilities of the
JNM-ECAlECX series (required installation space is oneshy
half compared to conventional NMRs) Programmable
timing sequencers built into each RF and PFG channel
can independently control either synchronous or
asynchronous operations of each channel Its standard
tunable broadband gradient probe which integrates all
JEOLs newest technologies is the high sesitivity roomshy
tempperature probe
Ccmpact spectrometer chassis Innovaten in JEOL NMR digrtal architecture High-stability and high-accuracy digital spectrometer High-sensrtivity new tunable probe Full automalk NMR with advanced software
JEOL RESONANCE Inc
An automatic sample changer makes it
possible to measure many samples
sequentially by exchanging multiple samples
automatically one by one Five changer
models are available for 8 samples 16
samples 24 samples 64 samples and 100
samples
JEOL RESONANCE Inc
ASC100 (100 samples)
1 --0 1(10 C ppm I
Sdid 13C-CPMAS spectrum of cholk acid
Solid-NMR is a technique that measures solid samples (powder or film-like samples) This technique is also effective for measurement of samples not soluble in solvents (inorganic
samples etc) and of crystalline polymorph that is meaningful to measure at the solid state
JEOL RESONANCE Inc
Produci Guide I 15
Mass Spectrometers
I JMS-800D UltraFOCUS I JMS-700 (2) MStation Mass Spectrometer Dedicated to Dioxin Anal ys is High resolution M ass Spectrometer
JMS-800D UltraFOCUS is the optimal cho ice for ultra lowlevel race detection
applications suc h as moni torin g for dioxins and related co mpoun ds eg
Polychlorinated Biphenyls (PCBs) Polybrominated Diphenyl Ethers (PBDEs) or drugs
of abuse by high resolution-selected ion monitoring (HRSIM) gas chromatographyl
mass spectrometry(GCMS)
R-- gtn 80000 (10 valley) Sent Ily 2 3 7 8-TCDD 100fg SNgt2oo
(6 channels 100 msecch Resolution 10000)
N_ Jut J _lllgEI up to 10 kV
JMS-S3000 Matri x Assisted Laser DesorptionIonization TOFMS
The JMS-S3000 is a MALOI-TOFMS incorporating an innovative SpirarrOF ion optical
system With superior capabilities than conventional MALDI-TOFMS the JMS-S3000
provides sate-of-the-art anaiylical solutions for a wide range of research areas such as
functional synthetic polymers materials science and biomolecules
Malrix Assisled Laser Desorpllonlonization Timemiddotof-Flighl Mass Spectrometer
I JMS-T1 OOLP+DART TLC-TOFMS
Pet c 60000 (10 valley) err 02 ng of methyl stearate
SIN 400
(CVEI combination ion source) I~ ~ aJe up to 10kV
I JMS-T1 OOLP LC-TOFMS
I JMS-Tl OOGCV GC-TOFMS
middotl shyThe JMS-T100LP+DART achieves simple and fast TLCMS analysis Accurate mass The JMS-Tl00GCV is a fully automatic Gas Chromatograph - Time-ot-Flight Mass
measurement capabilit y of TOFMS also enables you to determine element Spectrometer (GC-TOFMS) This versatile MS system covers wide range of
compositions of the analytes applications in GC-MS analysis
16 I Pr oduc i Gu ide
- -
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1----- 1- - - I - =---shy= bull --tJ~ 1- _ ~ __ ~-=--_~
I JMS-Ql 050GC UltraQuad GClMS
cJEOL
-
S-trapHS Headspace Autosampler
ESR Spectrometers
I JES-X3 series ESR Spectrometers
Recently it has been widely
accepted that even retatively few
unpaired electrons in a sample can
affect the function of the material so
lower detection limits (high er
sens itivity) is required of ESR
measurements JES-X3 Series has
achieved higher sensiti v i ty by
developing a lOIN-noise Gunn
oscillator for its new spectrometer
JES-X320 JEOL RESONANCE Inc
i III III )
Maximum Magnetic Field I a6ST 13T 14T
SweepW idth I --00-- 250mT plusmn001 - 500m__T_ __--l
Pole Gap _ _ 6cmm__ ___-= ___~ ____cmm__ _ I 0 = 60mcm 75 _l
Frequency Range(GHz) 8750 - 9650 _ _ _ ___-1
Field Resolution (mT) _L_ 235 Correction by Marker _1_--- Standard
I Operating System Windows 7
The JMS-01050GC is an innovative quadrupole mass spectrometer (OMS) that
achieves the highest-level sensitivity in OMS It has a high ability of evacuation due
to the use of a split flow turbo-molecular pump system (400 Lis) th at
simultaneously evacuates the ion source and the detector The use of a highshy
accuracy hyperbolic quadrupole mass analyzer provides high resolution
The S-trap is a next-generation headspace autosampler providing ultra-low
concentration measurement which was not achieved with a heads pace (HS) method
using conventional sample loop In addition the HS-GCMS system combined lith a
JMS-01050GC Mkll quaorupole MS guarantees detection of mold odor in water
down to 1 ppt
I ES-CT470 Liquid Helium Variable Temperature Controller
The ES-CT470 varies the sample temperature in the temperature range between 25 K
and 470 K Temperature setting is performed by d igital display and the set
temperature is kept constant by automatic control circui ts Combined use with a UV Irradiation device is possible A GaAs etement is used as a temperature sensor
enabling high-accuracy temperature setling
- 25 K to 470 K
plusmn001 K for 25 K to 42 K
plusmn1 orO5 K for 42 K to 470 K
_ 20 min 10 25 min (rom room temperature 08 to 2 Uh
50Hz60Hz 5mm JEOL RESONANCE Inc
Produ c t Guide I 17
Industrial Equipm nt for thin-filnl formation and nlatel ial processing
I bull
Electron Beam Source High-power Electron Beam Source
BS-60060EBS EBG-102UB6S
Electron beam sources for vacuum evaporation of metal and metal-oxide thin-films
We offer a wide variety of electron beam sources and crucibles They have features of
excellent beam spot and energy density and high-speed sweeping
1 PGBS 80020CPPS Plasma Source
BS-80011 BPG (6kW) BS-8002OCPPS (3kW)
Plasma Sources are installed in a vacuum chamber and generate high-density plasma
Used as Ion Plating (Plasma Assisted Deposition) and it is possible to improve film
properties for optilcal thin films protective films and function films Because highshy
density plasma can be generated in a mass space high-rate deposition to a large area
is possible
I RF Induction Plasma System
JEBG-3000UB(300kW) JEBG-1 OOOUB(1 OOkW)
High-power electron beam sources for vacuum evaporation of metal and metal-oxide
for wide plastic films or large glass plates that are continuously fed And they can also
be used for vacuum melting of high-melting point metals
raes
RF Generator
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0-~ 0 bull bullbull - -
RF-12030 (3kW) RF-56000 (Controller)
13 56MHz radio-frequency power supplies for plasma generation and used for
sputtering CVD etching and ion-plating We offer 750W to 6kW generators and
matching networks
DR Powder Feeder
Thermal plasma around 10000degC (15000deg F) by RF inductive coupling This thermal Fine powder feeder that can feed 01 to 100 11m size fine powder continuously with
plasma is used for nano powder synthesis fine powder spheroidization thick film carrier gas We offer optional feeding rate controller and large capacity hopper
deposition multi composite membrane synthesis CVD and harmful gas
decomposition
18 I Produci Guide
---
Biochemical Analyzers
I JCA-BM series Clinical Chemistry Analyzer BioMajesty Series
JEOLs micro volume technology and unique sample pre-dilution mechanism realizes
high throughput chemistry analysis with reduced sample and reagent volume
More than 4000 systems have been placed in clinical laboratories allover the world
JCA-BM6050
I JCA-BMBOOO series Ultra High Throughput Clinical Chemistry Analyzer
4 4
JCA-BMB060 egt
JCA-BMSOOO series offer ultra high throughput chemistry analysis up to 9000 testsl
hour
The pre-dilution unit one of the BioMajesty family features also continues the strong
tradition in these series with interconnected multiple analysis modules the key factors
that accomplish brilliant high throughput as well as downtime reduction with back-up
capability
I JCA-BM6070 High Throughput High Performance Clinical Chemistry An alyzer
I I I
A Clinical chemistry analyzer with incomparable speed and accuracy which achieves
high throughput of 2400 testslhour (includ ing ISE) The incorporated compact
workstation and user-friendly Interface with excellent operability leads the new trend of
the laboratory testing
BioMajesty Series lCA-BM 6010 lCA-BM 6050
lCA-8M 6070 leA-BM 91 30
lCA-BM 8000 Series
bull This product is distributed outside Japan by Siemens Heatthcare Diagnostics under the ADVtAreg brand name
I JCA-BM601 OC Compact amp High Performance Clinical Chemistry Analyzer
-~-I -
1lIIIIIIilllllllllJllnlIlII Ii I JCA-BM6010C is a compact but efficient automatic analyzer that maintains the basic
concept of BioMajesty series while achieving the excellent capability of microanalysis
with sample volume as small as 1 J1L
BM6010C also offers fully automated HbA1 c analysis with on-board hemolysis
(optional) Simultaneous measurement of Glucose and HbA1c improves laboratory
workflow
Product Guid e I 19
S~~MCEAII Certain products in this brochure are controlled under the Foreign 0J 0014007 -v- ~ Exchange and Foreign Trade Law of Japan in compliance with $ ~~~ international security export control JEOL Ltd must provide the~2 m) IIlt Japanese Government with End-users Statement of Assurancel A MGMT SYS
AvA ~ m and End-use Certificate in order to obtain the export license - tiJ needed for export from Japan If the product to be exported is in this category the end user will be asked to fill in these certificate formsdEOLIS09001 amp150 14001CenrfiCltlled
httpwwwjeolcomdEOL JEOL Ltd 1-2 Musashino 3-chome Akishima Tokyo 196-8558 Japan Sales Division Telephone+81-42-528-3381 Facsimile+81-42-528-3386
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3rd Fl Nile Center Bldg Nawal Slree Dokkl (Cairo) Egypt Telephone 20-2-3335-7220 Facsimile 20-2-3338-4186
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GERMANY JEOL (GERMANY) GmbH Oskar-Von-Miller-Strasse 1 a 85386 Eching Gennany Telephone 49-8165-77346 Facsimile 49-8165-77512
GREAT BRITAIN amp IRELAND JEOL (UK) LTD JEOL House Silver Court Watchmeaci Welwyn Garden City Herts AL71LT UK Telephone 44-1707 -377117 FaCSimile 44-1707-373254
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56-58S Trikoupl Str PO Box 26140 GR-10022 Athens Greece Telephone 30-1-823-5383 Facsimile 30-1-823-9567
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Unit No1 009 1 OF Prosperity Milennia Plaza 663 Kings Road North Point Hong Kong Telephone 852-2815-7299 Facsimile 852-2581-4635
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Elegance Tower Level 2 2128 Old Mathura Road Jasola Business District Centre Near Apollo Hospital Jasola New Delhi 110025 India Telephone 91-11-6472-2578 Facsimile 91-11-4060-1235
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Analyticallnstrments Department Sahas 41412 Veer Savarkar Marg Prabhadery Mumbai 400 025 India Telephone 91-22-6666-4000 Facsimile 91-22-6666-4001
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Analylicallnstruments Department 7 Hare Street Calcutta 700 001 India Telephone 91-33-2213-4133 Facsimile 91 -33-2213-4102
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INDONESIA PT TEKNOLABindo Penta Perkasa Komplek Gading Bukillndah Blok lIll JI Bukfl Gading Raya Kelapa Gading Pennai Jakarta 14240 Indonesia Telephone 62-21-458470575859 Facsimile 62-21-45842729
ITALY JEOL 0TALIA) SpA Centro Direzionale Green Office Via dei Tulipani 1 20090 Pieve Emanuele (MI) Italy Telephone 39-02-9041431 Facsimila 39-02-90414343
KOREA JEOL KOREA LTD
Dongwoo Bldg 7F 1443 Yangjae Daero Gangdong-Gu Seoul 134-010 Korea Telephone 82-2-511-5501 Facsimile 82-2-511-2635
KUWAIT Ashraf amp CO Ltd WLL PO Box 3555 Safat 13036 Kuwait Telephone 965-1805151 Facsimile 965-24335373
MALAYSIA JEOL(MALAYSIA) SDNBHD(3S9011-M)
205 Block A Mezzanine Floor Kelana Business Center 97 Jalan SS 72 Kelana Jaya 47301 Petaling Jaya Selangor Malaysia Telephone 60-3-7492-7722 Facsimile 60-3-7492-7723
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Arkansas 11 Piso 2 Colonia Napoles Delegacion Benito Juarez CP 03810 Mexico DF Mexico Telephone 52-5-55-211-4511 Facsimile 52-5-55-211-0720
PAKISTAN (KarachI) ANALYTICAL MEASURING SYSTEM (pvn LTD(AMS LTD)
14-C Main Sehar Commercia) Avenue Lane 4 Khayaban-e-Sehar DHA-VII Karachimiddot75500 Pakinstan Telephone 92-21-353455813534074735346057-8 Facsimile 92-21-35345582
PANAMA PROMED SA Parque Industrial Costa del Este Urbanizacion Costa del Este Apartado 0816-01755 Panama Panama Telephone 507-303-3100 FaCSimile 507-303-3115
PHILIPPINES PHILAB INDUSTRIES INC
7487 Bagtikan Street SAY Makati 1203 Metro Manila Phillip pines Telephone 63-2-896-7218 Facsimile 63-2-897-7732
PORTUGAL Izasa Portugal Lda A do Proletariado 1 2790-138 CARNAXIDE Portugal Telephone 351-21-424-73-00 Facsimile 351-21-418-60-20
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King Abdulaziz Avenue PO Box 215 Riyadh 11411 Saudi Arabia Telephone 966-1-479-3000 Facsimile 966-1-477-1374
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Hammarbacken 6A Box 716191 27 Sollentuna Sweden Telephone 46-8-28-2800 Facsimile 46-8-29-1647
SERVICE amp INFORMATION OFFICE NORWAY JEQL (Skandinaviska)AB
Lorenvangen 23 0580 Oslo NORWAY Telephone 47-2-2-64-7930 Facsimile 47-2-2-65-0619
FINLAND JEOL (Skandlnaviska)AB
Ylakaupinkuja 2 FIN-02360 Espoo Finland Telephone 358-9-8129-0350 Facsimile 358-9-8129-0351
SINGAPORE JEOLASIA PTE LTD
2 Corporation Road 1t01-12 Corporation Place Singapore 618494 Telephone 65-6565-9989 Facsimile 65-6565-7552
SOUTH AFRICA ADI Scientific (Pty) Ltd
370 Angus Crescent Northlands Business Park 29 Newmarket Road
~~=~g~~~2~~1nt~~2_~~~bIlC of South Africa
Facsimile 27-11 -462-1466
SPAIN IZASA SA
Argoneses 13 28100 Alcobendas (poligono IndustriaQ Madrid Spain Te~phone 34-91-663-0500 Facsimile 34-91-663-0545
SWITZERLAND JEOL (GERMANY) GmbH Oskar-Von-Miller Strasse 1 85386 Eching Germany Telephone 49-8165-77346 Facsimile 49-8165-77512
TAIWAN For EO ProQucts JIE DONG CO LTD 7F 112 Chung Hsiao East Road Section 1 Taipei Taiwan 10023 Republic of China Telephone 886-2-2395-2978 Facsimile 886-2~2322-4655
For Mass Spectrometer Products Mass Solutions Technology Co Ltd
5F No79 Sec 1 Xintai 5th Rd Xlzhi Dis New Taipei City 221 Taiwan Republic of China Telephone 886-2-2698-9511 Facsimile 886-2-2698-9512
For Semiconductor Products JEOL TAIWAN SEMICONDUCTORS LTD
11 F-l No 346 Pei-Da Road Hsin-Chu City 300 Taiwan Republic of China Telephone 886-3-523-8490 Facsimile 886-3-523-8503
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300 Phaholyothin Rd Phayathai Bangkok 10400 Thailand Telephone 66-2-615-2929 Facsimile 66-2-615-23502351
THE NETHERLANDS JEOL (EUROPE) Bv Ureweg 4 NL-2153 PH Nieuw-Vennep The Nelherlands Telephone 31-252-623500 Facsimile 31-252-623501
TURKEY TEKSERAS Kayisdagi )nonu MahKartal Cad No553 34755 Atasehir Istanbul Turkey Telephone 90-216-5736470 Facsimile 90-216-5736475
UAE MRS Group Dubai POBox 171612 Rashid Abdulla AI Noami Building Suite No 306 Damascus Street AI Qusais-3 Dubai UAE Telephone 971-4-2581141 Facsimile 971-4-2581151
JEOLGulf
POBox 171612 bull Rashid Abdulla AI Noami Building Suite No 306 Damascus Street AI Qusais-3 Dubai UAE Telephone 971-553964219(mobile)
USA JEOL USA INC 11 Dearborn Road Peabody MA 01960 USA Telephone 1-978-535-5900 Facsimile 1-978-536-22052206
JEOL USA INC WEST OFFICE
~~s~~~~~rigAe9~5t~~1 1 0 Telephone 1-925-737-1740 Facsimile 1-925-737-1749
VENEZUELA GOMSA Service and Supply CA
Urbanizacion Montalban JlI - Resldenclas Don Andres - Piso 7 - Apartomento 74 Avenida 3 entre calles 7 y 6 Montalban Caracas Venezuela Telephone 58-212-443-4342 Facsimile 58-212-443-4342
VTETNAM TECHNICAL MATERIALS AND RESOURCES IMPORT-EXPORT JOINT STOCK COMPANY(REXCO) Hanoi Branch
No 13-Lot 12 Trung Yen Trung Hoa Street Cau Giay Dist HanOi Vietnam Telephone 84-4-562-051617562-0535 Facsimile 84-4-853-2511
No 0205B389C Printed in Japan Kp
---------
-_ -~
- --= - - - =-shy -
NMR Spectrometers
I JNM-ECAECX series FT NMR System
920 MHz magnet Photo courtesy Nationallnstrtute of Natural Sciences Institute for
Molecular Science
The JNM-ECA920 FT NMR System is a 920 MHz high-resolution NMR
spectrometer developed by JEOL This spectrometer uses the superconducting
magnet co-developed by National Institute for Materials Science and Kobe Steel
Ltd which generates the high magnetic field Created by combining Japans stateshy
of-the-art technologies this FT NMR System marks an important milestone in next
generation biology and nanotechnology which call for high-magnetic-field highshy
resclution NMR analysis
JEOL RESONANCE Inc
~ ~ ~
~t~-
~ 100
HNCACB spectrum of 13C(15N labeled Solid 23Na-MQMAS spectrum of ubiqurtin N3)P207
The JNM-ECNECX series are versatile high-performance FT NMR spectrometer
system that utilize the latest digital and high-frequency technology The ECA
spectrometer is applicable up to 1GHz and can be used for a wide range of
applications including liquidsolid NMR protein analysis and diffusion coefficient
measurement
INM-EC cd
JOO ~QO 0(1 ~uo 1)0
Spectrometer I Oscillator receiver power amplifier
Magnet IISCM Field strength 705T I 939T 11 74T 1401T 1643T
Bore diameter (mm) 54 I 54 54 54 54
Probe 5 mm Ttl tunable
11110
188T
54
JEOL RESONANCE Inc
INMmiddot fO rie ---shy
)Ol~ ~1111 011 Oll
Spectrometer Oscillator receiver power amplifier
Magnet I ISCM Field strength 705T 939T I 1174T 1401T
Bore diameter (mm) I 54 54 54 54
Probe I 5 mm TH tunable
JEOL RESONANCE Inc
14 I Produc t Guide
bull bull bull
IJNM-ECS 00 FT NMR System
bull I ASC Series
Auto Sample Changer
ASC8 (8 samples) ASC24 (24 samples)
middotmiddot iT ~ --shy
~ I -~Au
ASC16 (16 samples) ASC64 (64 samples)
bullIJNM-ECAECX series Solid NMR
=- ~
I
l l
bull
0 5ilJl
0
MAS conlroller Solid NMR sampling kit
NMR Systems For Modern NMR Spectroscopy The JNM-ECS400 i s a compact two-channel
spectrometer that retains the advanced capabilities of the
JNM-ECAlECX series (required installation space is oneshy
half compared to conventional NMRs) Programmable
timing sequencers built into each RF and PFG channel
can independently control either synchronous or
asynchronous operations of each channel Its standard
tunable broadband gradient probe which integrates all
JEOLs newest technologies is the high sesitivity roomshy
tempperature probe
Ccmpact spectrometer chassis Innovaten in JEOL NMR digrtal architecture High-stability and high-accuracy digital spectrometer High-sensrtivity new tunable probe Full automalk NMR with advanced software
JEOL RESONANCE Inc
An automatic sample changer makes it
possible to measure many samples
sequentially by exchanging multiple samples
automatically one by one Five changer
models are available for 8 samples 16
samples 24 samples 64 samples and 100
samples
JEOL RESONANCE Inc
ASC100 (100 samples)
1 --0 1(10 C ppm I
Sdid 13C-CPMAS spectrum of cholk acid
Solid-NMR is a technique that measures solid samples (powder or film-like samples) This technique is also effective for measurement of samples not soluble in solvents (inorganic
samples etc) and of crystalline polymorph that is meaningful to measure at the solid state
JEOL RESONANCE Inc
Produci Guide I 15
Mass Spectrometers
I JMS-800D UltraFOCUS I JMS-700 (2) MStation Mass Spectrometer Dedicated to Dioxin Anal ys is High resolution M ass Spectrometer
JMS-800D UltraFOCUS is the optimal cho ice for ultra lowlevel race detection
applications suc h as moni torin g for dioxins and related co mpoun ds eg
Polychlorinated Biphenyls (PCBs) Polybrominated Diphenyl Ethers (PBDEs) or drugs
of abuse by high resolution-selected ion monitoring (HRSIM) gas chromatographyl
mass spectrometry(GCMS)
R-- gtn 80000 (10 valley) Sent Ily 2 3 7 8-TCDD 100fg SNgt2oo
(6 channels 100 msecch Resolution 10000)
N_ Jut J _lllgEI up to 10 kV
JMS-S3000 Matri x Assisted Laser DesorptionIonization TOFMS
The JMS-S3000 is a MALOI-TOFMS incorporating an innovative SpirarrOF ion optical
system With superior capabilities than conventional MALDI-TOFMS the JMS-S3000
provides sate-of-the-art anaiylical solutions for a wide range of research areas such as
functional synthetic polymers materials science and biomolecules
Malrix Assisled Laser Desorpllonlonization Timemiddotof-Flighl Mass Spectrometer
I JMS-T1 OOLP+DART TLC-TOFMS
Pet c 60000 (10 valley) err 02 ng of methyl stearate
SIN 400
(CVEI combination ion source) I~ ~ aJe up to 10kV
I JMS-T1 OOLP LC-TOFMS
I JMS-Tl OOGCV GC-TOFMS
middotl shyThe JMS-T100LP+DART achieves simple and fast TLCMS analysis Accurate mass The JMS-Tl00GCV is a fully automatic Gas Chromatograph - Time-ot-Flight Mass
measurement capabilit y of TOFMS also enables you to determine element Spectrometer (GC-TOFMS) This versatile MS system covers wide range of
compositions of the analytes applications in GC-MS analysis
16 I Pr oduc i Gu ide
- -
---
1----- 1- - - I - =---shy= bull --tJ~ 1- _ ~ __ ~-=--_~
I JMS-Ql 050GC UltraQuad GClMS
cJEOL
-
S-trapHS Headspace Autosampler
ESR Spectrometers
I JES-X3 series ESR Spectrometers
Recently it has been widely
accepted that even retatively few
unpaired electrons in a sample can
affect the function of the material so
lower detection limits (high er
sens itivity) is required of ESR
measurements JES-X3 Series has
achieved higher sensiti v i ty by
developing a lOIN-noise Gunn
oscillator for its new spectrometer
JES-X320 JEOL RESONANCE Inc
i III III )
Maximum Magnetic Field I a6ST 13T 14T
SweepW idth I --00-- 250mT plusmn001 - 500m__T_ __--l
Pole Gap _ _ 6cmm__ ___-= ___~ ____cmm__ _ I 0 = 60mcm 75 _l
Frequency Range(GHz) 8750 - 9650 _ _ _ ___-1
Field Resolution (mT) _L_ 235 Correction by Marker _1_--- Standard
I Operating System Windows 7
The JMS-01050GC is an innovative quadrupole mass spectrometer (OMS) that
achieves the highest-level sensitivity in OMS It has a high ability of evacuation due
to the use of a split flow turbo-molecular pump system (400 Lis) th at
simultaneously evacuates the ion source and the detector The use of a highshy
accuracy hyperbolic quadrupole mass analyzer provides high resolution
The S-trap is a next-generation headspace autosampler providing ultra-low
concentration measurement which was not achieved with a heads pace (HS) method
using conventional sample loop In addition the HS-GCMS system combined lith a
JMS-01050GC Mkll quaorupole MS guarantees detection of mold odor in water
down to 1 ppt
I ES-CT470 Liquid Helium Variable Temperature Controller
The ES-CT470 varies the sample temperature in the temperature range between 25 K
and 470 K Temperature setting is performed by d igital display and the set
temperature is kept constant by automatic control circui ts Combined use with a UV Irradiation device is possible A GaAs etement is used as a temperature sensor
enabling high-accuracy temperature setling
- 25 K to 470 K
plusmn001 K for 25 K to 42 K
plusmn1 orO5 K for 42 K to 470 K
_ 20 min 10 25 min (rom room temperature 08 to 2 Uh
50Hz60Hz 5mm JEOL RESONANCE Inc
Produ c t Guide I 17
Industrial Equipm nt for thin-filnl formation and nlatel ial processing
I bull
Electron Beam Source High-power Electron Beam Source
BS-60060EBS EBG-102UB6S
Electron beam sources for vacuum evaporation of metal and metal-oxide thin-films
We offer a wide variety of electron beam sources and crucibles They have features of
excellent beam spot and energy density and high-speed sweeping
1 PGBS 80020CPPS Plasma Source
BS-80011 BPG (6kW) BS-8002OCPPS (3kW)
Plasma Sources are installed in a vacuum chamber and generate high-density plasma
Used as Ion Plating (Plasma Assisted Deposition) and it is possible to improve film
properties for optilcal thin films protective films and function films Because highshy
density plasma can be generated in a mass space high-rate deposition to a large area
is possible
I RF Induction Plasma System
JEBG-3000UB(300kW) JEBG-1 OOOUB(1 OOkW)
High-power electron beam sources for vacuum evaporation of metal and metal-oxide
for wide plastic films or large glass plates that are continuously fed And they can also
be used for vacuum melting of high-melting point metals
raes
RF Generator
t shy - - - --- - - --- -
0-~ 0 bull bullbull - -
RF-12030 (3kW) RF-56000 (Controller)
13 56MHz radio-frequency power supplies for plasma generation and used for
sputtering CVD etching and ion-plating We offer 750W to 6kW generators and
matching networks
DR Powder Feeder
Thermal plasma around 10000degC (15000deg F) by RF inductive coupling This thermal Fine powder feeder that can feed 01 to 100 11m size fine powder continuously with
plasma is used for nano powder synthesis fine powder spheroidization thick film carrier gas We offer optional feeding rate controller and large capacity hopper
deposition multi composite membrane synthesis CVD and harmful gas
decomposition
18 I Produci Guide
---
Biochemical Analyzers
I JCA-BM series Clinical Chemistry Analyzer BioMajesty Series
JEOLs micro volume technology and unique sample pre-dilution mechanism realizes
high throughput chemistry analysis with reduced sample and reagent volume
More than 4000 systems have been placed in clinical laboratories allover the world
JCA-BM6050
I JCA-BMBOOO series Ultra High Throughput Clinical Chemistry Analyzer
4 4
JCA-BMB060 egt
JCA-BMSOOO series offer ultra high throughput chemistry analysis up to 9000 testsl
hour
The pre-dilution unit one of the BioMajesty family features also continues the strong
tradition in these series with interconnected multiple analysis modules the key factors
that accomplish brilliant high throughput as well as downtime reduction with back-up
capability
I JCA-BM6070 High Throughput High Performance Clinical Chemistry An alyzer
I I I
A Clinical chemistry analyzer with incomparable speed and accuracy which achieves
high throughput of 2400 testslhour (includ ing ISE) The incorporated compact
workstation and user-friendly Interface with excellent operability leads the new trend of
the laboratory testing
BioMajesty Series lCA-BM 6010 lCA-BM 6050
lCA-8M 6070 leA-BM 91 30
lCA-BM 8000 Series
bull This product is distributed outside Japan by Siemens Heatthcare Diagnostics under the ADVtAreg brand name
I JCA-BM601 OC Compact amp High Performance Clinical Chemistry Analyzer
-~-I -
1lIIIIIIilllllllllJllnlIlII Ii I JCA-BM6010C is a compact but efficient automatic analyzer that maintains the basic
concept of BioMajesty series while achieving the excellent capability of microanalysis
with sample volume as small as 1 J1L
BM6010C also offers fully automated HbA1 c analysis with on-board hemolysis
(optional) Simultaneous measurement of Glucose and HbA1c improves laboratory
workflow
Product Guid e I 19
S~~MCEAII Certain products in this brochure are controlled under the Foreign 0J 0014007 -v- ~ Exchange and Foreign Trade Law of Japan in compliance with $ ~~~ international security export control JEOL Ltd must provide the~2 m) IIlt Japanese Government with End-users Statement of Assurancel A MGMT SYS
AvA ~ m and End-use Certificate in order to obtain the export license - tiJ needed for export from Japan If the product to be exported is in this category the end user will be asked to fill in these certificate formsdEOLIS09001 amp150 14001CenrfiCltlled
httpwwwjeolcomdEOL JEOL Ltd 1-2 Musashino 3-chome Akishima Tokyo 196-8558 Japan Sales Division Telephone+81-42-528-3381 Facsimile+81-42-528-3386
ARGENTINA COASIN SAClyF Virrey del Pino 4071 1430 Buenos Aires Argentina Telephone 54-11-4552-3185 Facsimile 54-11-4555-3321
AUSTRALIA amp NEW ZEALAND JEOL(AUSTRALASJA) PtyUd Suite 1 L2 18 Aquatic Drive - Frenchs Foresl NSW 2086 Australia Telephone 61-2-9451-3855 Facsimile 61-2-9451-3822
AUSTRIA JEOL (GERMANY) GmbH Oskar-Von-Miller-Strasse 1 a 85386 Eching Gennany Telephone 49-8165-77346 Facsimile 49-8165-77512
BANGLADESH AQ CHOWDHURY SCIENCE amp SYNERGY PVT LTD House No1 2 Road No 5A Sector No 11 Uttara Dhaka - 1230 Bangladesh Telephone 880-2-9980790 8953450 8953501 Facsimile 880-2-8854428
BELGIUM JEOL (EUROPE) BV Planet ll Gebouw B Leuvensesteenweg 542 B-1930 Zaventem Belgium Telephone 32-2-720-0560 Facsimile 32-2-720-6134
BRAZIL JEOL Brasillnstrument09 Cienlilicos Llda
Av Jabaquara 2958-50 andar-cj 52 04046-500 Sao Paulo SP Brazil Telephone 55-11-5070 4000 Facsimile 55-11-5070 4010
CANADA JEOL CANADA INC 3275 Premier Rue 8 SI-Hubert Quebec J3Y 8Y6 Canada Telephone 1-450-676-8776 Facsimile 1-450-676-6694
CHILE ARQUIMED INNOVAnON
Arturo Pmt 828Santiago Chile Telephone 56-2-634-6266 Facsimile 56-2-634-4633
CHINA JEOL(BEIJING) CO LTD Room Bl0l0l110 Wantong New Wond Plaza No2 Fuchengmenwai Street XIcheng District Beijing 100037 PRChina Telephone 86-10-6804-6321 Facsimile 86-10-6804-6324
JEOL (BEIJING) CO LTD SHANGHAI BRANCH
Room 15051506 Nol300Xi Kang Road Jing an Dis Shanghai 200040 China Telephone 86-21-6248-4868448745374404 Facsimile 86-21-6248-4075
JEOL (BEIJING) CO LTD GUANG ZHOU BRANCH
N1601 World Trade Center Building 371-375 Huan Shi Road East Guang Zhou Guangdong Prov 510095 PRChina Telephone 86-20-8778-7848 Facsimile 86-20-8778-4268
JEOL (BEIJING) CO LTD WUHAN BRANCH
Room A2117 Zhongshang Plaza Office Bldg NO7 Zhongnan Road Wuhan Hubei 430071 PRChina Telephone 86-27-8713-2567 Facsimile 86-27-8713-2567
JEOL LTD (BEIJING) CO LTD CHENGDU BRANCH 1807A Zonglu Building NO 35 Zhongfu Road Chengdu Sichuan 610016 PR China Telephone 86-28-86622554 Facsimile 86-28-86622564
EGYPT JEOL SERIVCE BUREAU
3rd Fl Nile Center Bldg Nawal Slree Dokkl (Cairo) Egypt Telephone 20-2-3335-7220 Facsimile 20-2-3338-4186
FRANCE JEOL (EUROPE) SAS Espace Claude Monet 1 Allee de Giverny 78290 Crolssy-sur-Seine France Telephone 33-13015-3737 Facsimile 33-13015-3747
GERMANY JEOL (GERMANY) GmbH Oskar-Von-Miller-Strasse 1 a 85386 Eching Gennany Telephone 49-8165-77346 Facsimile 49-8165-77512
GREAT BRITAIN amp IRELAND JEOL (UK) LTD JEOL House Silver Court Watchmeaci Welwyn Garden City Herts AL71LT UK Telephone 44-1707 -377117 FaCSimile 44-1707-373254
GREECE N ASTERIADIS SA
56-58S Trikoupl Str PO Box 26140 GR-10022 Athens Greece Telephone 30-1-823-5383 Facsimile 30-1-823-9567
HONG KONG FARMING LTD
Unit No1 009 1 OF Prosperity Milennia Plaza 663 Kings Road North Point Hong Kong Telephone 852-2815-7299 Facsimile 852-2581-4635
INDIA JEQL INDIA Pvt Ltd
Elegance Tower Level 2 2128 Old Mathura Road Jasola Business District Centre Near Apollo Hospital Jasola New Delhi 110025 India Telephone 91-11-6472-2578 Facsimile 91-11-4060-1235
BLUE STAR LTD (HQ Mumbaij
Analyticallnstrments Department Sahas 41412 Veer Savarkar Marg Prabhadery Mumbai 400 025 India Telephone 91-22-6666-4000 Facsimile 91-22-6666-4001
BLUE STAR LTD (DelhQ Analytical Instruments Department E-4412 Okhla Industrial Area Phase-II New Delhi 110 020 India Telephone 91-11-4149-4000 Facsimile 91-11-4149-4005
BLUE STAR LTD (Calcutta)
Analylicallnstruments Department 7 Hare Street Calcutta 700 001 India Telephone 91-33-2213-4133 Facsimile 91 -33-2213-4102
BLUE STAR LTD (ChennaO Analytical Instruments Department No 46 Garuda Building Cathedral Road Chennai 600 086 India Telephone 91-44-4244-4000 Facsimile 91-44-4244-4190
INDONESIA PT TEKNOLABindo Penta Perkasa Komplek Gading Bukillndah Blok lIll JI Bukfl Gading Raya Kelapa Gading Pennai Jakarta 14240 Indonesia Telephone 62-21-458470575859 Facsimile 62-21-45842729
ITALY JEOL 0TALIA) SpA Centro Direzionale Green Office Via dei Tulipani 1 20090 Pieve Emanuele (MI) Italy Telephone 39-02-9041431 Facsimila 39-02-90414343
KOREA JEOL KOREA LTD
Dongwoo Bldg 7F 1443 Yangjae Daero Gangdong-Gu Seoul 134-010 Korea Telephone 82-2-511-5501 Facsimile 82-2-511-2635
KUWAIT Ashraf amp CO Ltd WLL PO Box 3555 Safat 13036 Kuwait Telephone 965-1805151 Facsimile 965-24335373
MALAYSIA JEOL(MALAYSIA) SDNBHD(3S9011-M)
205 Block A Mezzanine Floor Kelana Business Center 97 Jalan SS 72 Kelana Jaya 47301 Petaling Jaya Selangor Malaysia Telephone 60-3-7492-7722 Facsimile 60-3-7492-7723
MEXICO JEOL DE MEXICO SA DE CV
Arkansas 11 Piso 2 Colonia Napoles Delegacion Benito Juarez CP 03810 Mexico DF Mexico Telephone 52-5-55-211-4511 Facsimile 52-5-55-211-0720
PAKISTAN (KarachI) ANALYTICAL MEASURING SYSTEM (pvn LTD(AMS LTD)
14-C Main Sehar Commercia) Avenue Lane 4 Khayaban-e-Sehar DHA-VII Karachimiddot75500 Pakinstan Telephone 92-21-353455813534074735346057-8 Facsimile 92-21-35345582
PANAMA PROMED SA Parque Industrial Costa del Este Urbanizacion Costa del Este Apartado 0816-01755 Panama Panama Telephone 507-303-3100 FaCSimile 507-303-3115
PHILIPPINES PHILAB INDUSTRIES INC
7487 Bagtikan Street SAY Makati 1203 Metro Manila Phillip pines Telephone 63-2-896-7218 Facsimile 63-2-897-7732
PORTUGAL Izasa Portugal Lda A do Proletariado 1 2790-138 CARNAXIDE Portugal Telephone 351-21-424-73-00 Facsimile 351-21-418-60-20
RUSSIA JEOL (RUS) LLC Krasnoproletarskaya Street 16 Bid 2 127473 Moscow Russian Federation Telephone 7-495-748-7791rr792 Facsimile 7-495-748-7793
SAUDI ARABIA ABDULREHMAN ALGOSAIBI GTC (Riyadh)
King Abdulaziz Avenue PO Box 215 Riyadh 11411 Saudi Arabia Telephone 966-1-479-3000 Facsimile 966-1-477-1374
SCANDINAVIA SWEDEN JEOL (Skandinaviska)AB
Hammarbacken 6A Box 716191 27 Sollentuna Sweden Telephone 46-8-28-2800 Facsimile 46-8-29-1647
SERVICE amp INFORMATION OFFICE NORWAY JEQL (Skandinaviska)AB
Lorenvangen 23 0580 Oslo NORWAY Telephone 47-2-2-64-7930 Facsimile 47-2-2-65-0619
FINLAND JEOL (Skandlnaviska)AB
Ylakaupinkuja 2 FIN-02360 Espoo Finland Telephone 358-9-8129-0350 Facsimile 358-9-8129-0351
SINGAPORE JEOLASIA PTE LTD
2 Corporation Road 1t01-12 Corporation Place Singapore 618494 Telephone 65-6565-9989 Facsimile 65-6565-7552
SOUTH AFRICA ADI Scientific (Pty) Ltd
370 Angus Crescent Northlands Business Park 29 Newmarket Road
~~=~g~~~2~~1nt~~2_~~~bIlC of South Africa
Facsimile 27-11 -462-1466
SPAIN IZASA SA
Argoneses 13 28100 Alcobendas (poligono IndustriaQ Madrid Spain Te~phone 34-91-663-0500 Facsimile 34-91-663-0545
SWITZERLAND JEOL (GERMANY) GmbH Oskar-Von-Miller Strasse 1 85386 Eching Germany Telephone 49-8165-77346 Facsimile 49-8165-77512
TAIWAN For EO ProQucts JIE DONG CO LTD 7F 112 Chung Hsiao East Road Section 1 Taipei Taiwan 10023 Republic of China Telephone 886-2-2395-2978 Facsimile 886-2~2322-4655
For Mass Spectrometer Products Mass Solutions Technology Co Ltd
5F No79 Sec 1 Xintai 5th Rd Xlzhi Dis New Taipei City 221 Taiwan Republic of China Telephone 886-2-2698-9511 Facsimile 886-2-2698-9512
For Semiconductor Products JEOL TAIWAN SEMICONDUCTORS LTD
11 F-l No 346 Pei-Da Road Hsin-Chu City 300 Taiwan Republic of China Telephone 886-3-523-8490 Facsimile 886-3-523-8503
THAILAND BECTHAI BANGKOK EQUIPMENT amp CHEMICAL CO Ltd
300 Phaholyothin Rd Phayathai Bangkok 10400 Thailand Telephone 66-2-615-2929 Facsimile 66-2-615-23502351
THE NETHERLANDS JEOL (EUROPE) Bv Ureweg 4 NL-2153 PH Nieuw-Vennep The Nelherlands Telephone 31-252-623500 Facsimile 31-252-623501
TURKEY TEKSERAS Kayisdagi )nonu MahKartal Cad No553 34755 Atasehir Istanbul Turkey Telephone 90-216-5736470 Facsimile 90-216-5736475
UAE MRS Group Dubai POBox 171612 Rashid Abdulla AI Noami Building Suite No 306 Damascus Street AI Qusais-3 Dubai UAE Telephone 971-4-2581141 Facsimile 971-4-2581151
JEOLGulf
POBox 171612 bull Rashid Abdulla AI Noami Building Suite No 306 Damascus Street AI Qusais-3 Dubai UAE Telephone 971-553964219(mobile)
USA JEOL USA INC 11 Dearborn Road Peabody MA 01960 USA Telephone 1-978-535-5900 Facsimile 1-978-536-22052206
JEOL USA INC WEST OFFICE
~~s~~~~~rigAe9~5t~~1 1 0 Telephone 1-925-737-1740 Facsimile 1-925-737-1749
VENEZUELA GOMSA Service and Supply CA
Urbanizacion Montalban JlI - Resldenclas Don Andres - Piso 7 - Apartomento 74 Avenida 3 entre calles 7 y 6 Montalban Caracas Venezuela Telephone 58-212-443-4342 Facsimile 58-212-443-4342
VTETNAM TECHNICAL MATERIALS AND RESOURCES IMPORT-EXPORT JOINT STOCK COMPANY(REXCO) Hanoi Branch
No 13-Lot 12 Trung Yen Trung Hoa Street Cau Giay Dist HanOi Vietnam Telephone 84-4-562-051617562-0535 Facsimile 84-4-853-2511
No 0205B389C Printed in Japan Kp
bull bull bull
IJNM-ECS 00 FT NMR System
bull I ASC Series
Auto Sample Changer
ASC8 (8 samples) ASC24 (24 samples)
middotmiddot iT ~ --shy
~ I -~Au
ASC16 (16 samples) ASC64 (64 samples)
bullIJNM-ECAECX series Solid NMR
=- ~
I
l l
bull
0 5ilJl
0
MAS conlroller Solid NMR sampling kit
NMR Systems For Modern NMR Spectroscopy The JNM-ECS400 i s a compact two-channel
spectrometer that retains the advanced capabilities of the
JNM-ECAlECX series (required installation space is oneshy
half compared to conventional NMRs) Programmable
timing sequencers built into each RF and PFG channel
can independently control either synchronous or
asynchronous operations of each channel Its standard
tunable broadband gradient probe which integrates all
JEOLs newest technologies is the high sesitivity roomshy
tempperature probe
Ccmpact spectrometer chassis Innovaten in JEOL NMR digrtal architecture High-stability and high-accuracy digital spectrometer High-sensrtivity new tunable probe Full automalk NMR with advanced software
JEOL RESONANCE Inc
An automatic sample changer makes it
possible to measure many samples
sequentially by exchanging multiple samples
automatically one by one Five changer
models are available for 8 samples 16
samples 24 samples 64 samples and 100
samples
JEOL RESONANCE Inc
ASC100 (100 samples)
1 --0 1(10 C ppm I
Sdid 13C-CPMAS spectrum of cholk acid
Solid-NMR is a technique that measures solid samples (powder or film-like samples) This technique is also effective for measurement of samples not soluble in solvents (inorganic
samples etc) and of crystalline polymorph that is meaningful to measure at the solid state
JEOL RESONANCE Inc
Produci Guide I 15
Mass Spectrometers
I JMS-800D UltraFOCUS I JMS-700 (2) MStation Mass Spectrometer Dedicated to Dioxin Anal ys is High resolution M ass Spectrometer
JMS-800D UltraFOCUS is the optimal cho ice for ultra lowlevel race detection
applications suc h as moni torin g for dioxins and related co mpoun ds eg
Polychlorinated Biphenyls (PCBs) Polybrominated Diphenyl Ethers (PBDEs) or drugs
of abuse by high resolution-selected ion monitoring (HRSIM) gas chromatographyl
mass spectrometry(GCMS)
R-- gtn 80000 (10 valley) Sent Ily 2 3 7 8-TCDD 100fg SNgt2oo
(6 channels 100 msecch Resolution 10000)
N_ Jut J _lllgEI up to 10 kV
JMS-S3000 Matri x Assisted Laser DesorptionIonization TOFMS
The JMS-S3000 is a MALOI-TOFMS incorporating an innovative SpirarrOF ion optical
system With superior capabilities than conventional MALDI-TOFMS the JMS-S3000
provides sate-of-the-art anaiylical solutions for a wide range of research areas such as
functional synthetic polymers materials science and biomolecules
Malrix Assisled Laser Desorpllonlonization Timemiddotof-Flighl Mass Spectrometer
I JMS-T1 OOLP+DART TLC-TOFMS
Pet c 60000 (10 valley) err 02 ng of methyl stearate
SIN 400
(CVEI combination ion source) I~ ~ aJe up to 10kV
I JMS-T1 OOLP LC-TOFMS
I JMS-Tl OOGCV GC-TOFMS
middotl shyThe JMS-T100LP+DART achieves simple and fast TLCMS analysis Accurate mass The JMS-Tl00GCV is a fully automatic Gas Chromatograph - Time-ot-Flight Mass
measurement capabilit y of TOFMS also enables you to determine element Spectrometer (GC-TOFMS) This versatile MS system covers wide range of
compositions of the analytes applications in GC-MS analysis
16 I Pr oduc i Gu ide
- -
---
1----- 1- - - I - =---shy= bull --tJ~ 1- _ ~ __ ~-=--_~
I JMS-Ql 050GC UltraQuad GClMS
cJEOL
-
S-trapHS Headspace Autosampler
ESR Spectrometers
I JES-X3 series ESR Spectrometers
Recently it has been widely
accepted that even retatively few
unpaired electrons in a sample can
affect the function of the material so
lower detection limits (high er
sens itivity) is required of ESR
measurements JES-X3 Series has
achieved higher sensiti v i ty by
developing a lOIN-noise Gunn
oscillator for its new spectrometer
JES-X320 JEOL RESONANCE Inc
i III III )
Maximum Magnetic Field I a6ST 13T 14T
SweepW idth I --00-- 250mT plusmn001 - 500m__T_ __--l
Pole Gap _ _ 6cmm__ ___-= ___~ ____cmm__ _ I 0 = 60mcm 75 _l
Frequency Range(GHz) 8750 - 9650 _ _ _ ___-1
Field Resolution (mT) _L_ 235 Correction by Marker _1_--- Standard
I Operating System Windows 7
The JMS-01050GC is an innovative quadrupole mass spectrometer (OMS) that
achieves the highest-level sensitivity in OMS It has a high ability of evacuation due
to the use of a split flow turbo-molecular pump system (400 Lis) th at
simultaneously evacuates the ion source and the detector The use of a highshy
accuracy hyperbolic quadrupole mass analyzer provides high resolution
The S-trap is a next-generation headspace autosampler providing ultra-low
concentration measurement which was not achieved with a heads pace (HS) method
using conventional sample loop In addition the HS-GCMS system combined lith a
JMS-01050GC Mkll quaorupole MS guarantees detection of mold odor in water
down to 1 ppt
I ES-CT470 Liquid Helium Variable Temperature Controller
The ES-CT470 varies the sample temperature in the temperature range between 25 K
and 470 K Temperature setting is performed by d igital display and the set
temperature is kept constant by automatic control circui ts Combined use with a UV Irradiation device is possible A GaAs etement is used as a temperature sensor
enabling high-accuracy temperature setling
- 25 K to 470 K
plusmn001 K for 25 K to 42 K
plusmn1 orO5 K for 42 K to 470 K
_ 20 min 10 25 min (rom room temperature 08 to 2 Uh
50Hz60Hz 5mm JEOL RESONANCE Inc
Produ c t Guide I 17
Industrial Equipm nt for thin-filnl formation and nlatel ial processing
I bull
Electron Beam Source High-power Electron Beam Source
BS-60060EBS EBG-102UB6S
Electron beam sources for vacuum evaporation of metal and metal-oxide thin-films
We offer a wide variety of electron beam sources and crucibles They have features of
excellent beam spot and energy density and high-speed sweeping
1 PGBS 80020CPPS Plasma Source
BS-80011 BPG (6kW) BS-8002OCPPS (3kW)
Plasma Sources are installed in a vacuum chamber and generate high-density plasma
Used as Ion Plating (Plasma Assisted Deposition) and it is possible to improve film
properties for optilcal thin films protective films and function films Because highshy
density plasma can be generated in a mass space high-rate deposition to a large area
is possible
I RF Induction Plasma System
JEBG-3000UB(300kW) JEBG-1 OOOUB(1 OOkW)
High-power electron beam sources for vacuum evaporation of metal and metal-oxide
for wide plastic films or large glass plates that are continuously fed And they can also
be used for vacuum melting of high-melting point metals
raes
RF Generator
t shy - - - --- - - --- -
0-~ 0 bull bullbull - -
RF-12030 (3kW) RF-56000 (Controller)
13 56MHz radio-frequency power supplies for plasma generation and used for
sputtering CVD etching and ion-plating We offer 750W to 6kW generators and
matching networks
DR Powder Feeder
Thermal plasma around 10000degC (15000deg F) by RF inductive coupling This thermal Fine powder feeder that can feed 01 to 100 11m size fine powder continuously with
plasma is used for nano powder synthesis fine powder spheroidization thick film carrier gas We offer optional feeding rate controller and large capacity hopper
deposition multi composite membrane synthesis CVD and harmful gas
decomposition
18 I Produci Guide
---
Biochemical Analyzers
I JCA-BM series Clinical Chemistry Analyzer BioMajesty Series
JEOLs micro volume technology and unique sample pre-dilution mechanism realizes
high throughput chemistry analysis with reduced sample and reagent volume
More than 4000 systems have been placed in clinical laboratories allover the world
JCA-BM6050
I JCA-BMBOOO series Ultra High Throughput Clinical Chemistry Analyzer
4 4
JCA-BMB060 egt
JCA-BMSOOO series offer ultra high throughput chemistry analysis up to 9000 testsl
hour
The pre-dilution unit one of the BioMajesty family features also continues the strong
tradition in these series with interconnected multiple analysis modules the key factors
that accomplish brilliant high throughput as well as downtime reduction with back-up
capability
I JCA-BM6070 High Throughput High Performance Clinical Chemistry An alyzer
I I I
A Clinical chemistry analyzer with incomparable speed and accuracy which achieves
high throughput of 2400 testslhour (includ ing ISE) The incorporated compact
workstation and user-friendly Interface with excellent operability leads the new trend of
the laboratory testing
BioMajesty Series lCA-BM 6010 lCA-BM 6050
lCA-8M 6070 leA-BM 91 30
lCA-BM 8000 Series
bull This product is distributed outside Japan by Siemens Heatthcare Diagnostics under the ADVtAreg brand name
I JCA-BM601 OC Compact amp High Performance Clinical Chemistry Analyzer
-~-I -
1lIIIIIIilllllllllJllnlIlII Ii I JCA-BM6010C is a compact but efficient automatic analyzer that maintains the basic
concept of BioMajesty series while achieving the excellent capability of microanalysis
with sample volume as small as 1 J1L
BM6010C also offers fully automated HbA1 c analysis with on-board hemolysis
(optional) Simultaneous measurement of Glucose and HbA1c improves laboratory
workflow
Product Guid e I 19
S~~MCEAII Certain products in this brochure are controlled under the Foreign 0J 0014007 -v- ~ Exchange and Foreign Trade Law of Japan in compliance with $ ~~~ international security export control JEOL Ltd must provide the~2 m) IIlt Japanese Government with End-users Statement of Assurancel A MGMT SYS
AvA ~ m and End-use Certificate in order to obtain the export license - tiJ needed for export from Japan If the product to be exported is in this category the end user will be asked to fill in these certificate formsdEOLIS09001 amp150 14001CenrfiCltlled
httpwwwjeolcomdEOL JEOL Ltd 1-2 Musashino 3-chome Akishima Tokyo 196-8558 Japan Sales Division Telephone+81-42-528-3381 Facsimile+81-42-528-3386
ARGENTINA COASIN SAClyF Virrey del Pino 4071 1430 Buenos Aires Argentina Telephone 54-11-4552-3185 Facsimile 54-11-4555-3321
AUSTRALIA amp NEW ZEALAND JEOL(AUSTRALASJA) PtyUd Suite 1 L2 18 Aquatic Drive - Frenchs Foresl NSW 2086 Australia Telephone 61-2-9451-3855 Facsimile 61-2-9451-3822
AUSTRIA JEOL (GERMANY) GmbH Oskar-Von-Miller-Strasse 1 a 85386 Eching Gennany Telephone 49-8165-77346 Facsimile 49-8165-77512
BANGLADESH AQ CHOWDHURY SCIENCE amp SYNERGY PVT LTD House No1 2 Road No 5A Sector No 11 Uttara Dhaka - 1230 Bangladesh Telephone 880-2-9980790 8953450 8953501 Facsimile 880-2-8854428
BELGIUM JEOL (EUROPE) BV Planet ll Gebouw B Leuvensesteenweg 542 B-1930 Zaventem Belgium Telephone 32-2-720-0560 Facsimile 32-2-720-6134
BRAZIL JEOL Brasillnstrument09 Cienlilicos Llda
Av Jabaquara 2958-50 andar-cj 52 04046-500 Sao Paulo SP Brazil Telephone 55-11-5070 4000 Facsimile 55-11-5070 4010
CANADA JEOL CANADA INC 3275 Premier Rue 8 SI-Hubert Quebec J3Y 8Y6 Canada Telephone 1-450-676-8776 Facsimile 1-450-676-6694
CHILE ARQUIMED INNOVAnON
Arturo Pmt 828Santiago Chile Telephone 56-2-634-6266 Facsimile 56-2-634-4633
CHINA JEOL(BEIJING) CO LTD Room Bl0l0l110 Wantong New Wond Plaza No2 Fuchengmenwai Street XIcheng District Beijing 100037 PRChina Telephone 86-10-6804-6321 Facsimile 86-10-6804-6324
JEOL (BEIJING) CO LTD SHANGHAI BRANCH
Room 15051506 Nol300Xi Kang Road Jing an Dis Shanghai 200040 China Telephone 86-21-6248-4868448745374404 Facsimile 86-21-6248-4075
JEOL (BEIJING) CO LTD GUANG ZHOU BRANCH
N1601 World Trade Center Building 371-375 Huan Shi Road East Guang Zhou Guangdong Prov 510095 PRChina Telephone 86-20-8778-7848 Facsimile 86-20-8778-4268
JEOL (BEIJING) CO LTD WUHAN BRANCH
Room A2117 Zhongshang Plaza Office Bldg NO7 Zhongnan Road Wuhan Hubei 430071 PRChina Telephone 86-27-8713-2567 Facsimile 86-27-8713-2567
JEOL LTD (BEIJING) CO LTD CHENGDU BRANCH 1807A Zonglu Building NO 35 Zhongfu Road Chengdu Sichuan 610016 PR China Telephone 86-28-86622554 Facsimile 86-28-86622564
EGYPT JEOL SERIVCE BUREAU
3rd Fl Nile Center Bldg Nawal Slree Dokkl (Cairo) Egypt Telephone 20-2-3335-7220 Facsimile 20-2-3338-4186
FRANCE JEOL (EUROPE) SAS Espace Claude Monet 1 Allee de Giverny 78290 Crolssy-sur-Seine France Telephone 33-13015-3737 Facsimile 33-13015-3747
GERMANY JEOL (GERMANY) GmbH Oskar-Von-Miller-Strasse 1 a 85386 Eching Gennany Telephone 49-8165-77346 Facsimile 49-8165-77512
GREAT BRITAIN amp IRELAND JEOL (UK) LTD JEOL House Silver Court Watchmeaci Welwyn Garden City Herts AL71LT UK Telephone 44-1707 -377117 FaCSimile 44-1707-373254
GREECE N ASTERIADIS SA
56-58S Trikoupl Str PO Box 26140 GR-10022 Athens Greece Telephone 30-1-823-5383 Facsimile 30-1-823-9567
HONG KONG FARMING LTD
Unit No1 009 1 OF Prosperity Milennia Plaza 663 Kings Road North Point Hong Kong Telephone 852-2815-7299 Facsimile 852-2581-4635
INDIA JEQL INDIA Pvt Ltd
Elegance Tower Level 2 2128 Old Mathura Road Jasola Business District Centre Near Apollo Hospital Jasola New Delhi 110025 India Telephone 91-11-6472-2578 Facsimile 91-11-4060-1235
BLUE STAR LTD (HQ Mumbaij
Analyticallnstrments Department Sahas 41412 Veer Savarkar Marg Prabhadery Mumbai 400 025 India Telephone 91-22-6666-4000 Facsimile 91-22-6666-4001
BLUE STAR LTD (DelhQ Analytical Instruments Department E-4412 Okhla Industrial Area Phase-II New Delhi 110 020 India Telephone 91-11-4149-4000 Facsimile 91-11-4149-4005
BLUE STAR LTD (Calcutta)
Analylicallnstruments Department 7 Hare Street Calcutta 700 001 India Telephone 91-33-2213-4133 Facsimile 91 -33-2213-4102
BLUE STAR LTD (ChennaO Analytical Instruments Department No 46 Garuda Building Cathedral Road Chennai 600 086 India Telephone 91-44-4244-4000 Facsimile 91-44-4244-4190
INDONESIA PT TEKNOLABindo Penta Perkasa Komplek Gading Bukillndah Blok lIll JI Bukfl Gading Raya Kelapa Gading Pennai Jakarta 14240 Indonesia Telephone 62-21-458470575859 Facsimile 62-21-45842729
ITALY JEOL 0TALIA) SpA Centro Direzionale Green Office Via dei Tulipani 1 20090 Pieve Emanuele (MI) Italy Telephone 39-02-9041431 Facsimila 39-02-90414343
KOREA JEOL KOREA LTD
Dongwoo Bldg 7F 1443 Yangjae Daero Gangdong-Gu Seoul 134-010 Korea Telephone 82-2-511-5501 Facsimile 82-2-511-2635
KUWAIT Ashraf amp CO Ltd WLL PO Box 3555 Safat 13036 Kuwait Telephone 965-1805151 Facsimile 965-24335373
MALAYSIA JEOL(MALAYSIA) SDNBHD(3S9011-M)
205 Block A Mezzanine Floor Kelana Business Center 97 Jalan SS 72 Kelana Jaya 47301 Petaling Jaya Selangor Malaysia Telephone 60-3-7492-7722 Facsimile 60-3-7492-7723
MEXICO JEOL DE MEXICO SA DE CV
Arkansas 11 Piso 2 Colonia Napoles Delegacion Benito Juarez CP 03810 Mexico DF Mexico Telephone 52-5-55-211-4511 Facsimile 52-5-55-211-0720
PAKISTAN (KarachI) ANALYTICAL MEASURING SYSTEM (pvn LTD(AMS LTD)
14-C Main Sehar Commercia) Avenue Lane 4 Khayaban-e-Sehar DHA-VII Karachimiddot75500 Pakinstan Telephone 92-21-353455813534074735346057-8 Facsimile 92-21-35345582
PANAMA PROMED SA Parque Industrial Costa del Este Urbanizacion Costa del Este Apartado 0816-01755 Panama Panama Telephone 507-303-3100 FaCSimile 507-303-3115
PHILIPPINES PHILAB INDUSTRIES INC
7487 Bagtikan Street SAY Makati 1203 Metro Manila Phillip pines Telephone 63-2-896-7218 Facsimile 63-2-897-7732
PORTUGAL Izasa Portugal Lda A do Proletariado 1 2790-138 CARNAXIDE Portugal Telephone 351-21-424-73-00 Facsimile 351-21-418-60-20
RUSSIA JEOL (RUS) LLC Krasnoproletarskaya Street 16 Bid 2 127473 Moscow Russian Federation Telephone 7-495-748-7791rr792 Facsimile 7-495-748-7793
SAUDI ARABIA ABDULREHMAN ALGOSAIBI GTC (Riyadh)
King Abdulaziz Avenue PO Box 215 Riyadh 11411 Saudi Arabia Telephone 966-1-479-3000 Facsimile 966-1-477-1374
SCANDINAVIA SWEDEN JEOL (Skandinaviska)AB
Hammarbacken 6A Box 716191 27 Sollentuna Sweden Telephone 46-8-28-2800 Facsimile 46-8-29-1647
SERVICE amp INFORMATION OFFICE NORWAY JEQL (Skandinaviska)AB
Lorenvangen 23 0580 Oslo NORWAY Telephone 47-2-2-64-7930 Facsimile 47-2-2-65-0619
FINLAND JEOL (Skandlnaviska)AB
Ylakaupinkuja 2 FIN-02360 Espoo Finland Telephone 358-9-8129-0350 Facsimile 358-9-8129-0351
SINGAPORE JEOLASIA PTE LTD
2 Corporation Road 1t01-12 Corporation Place Singapore 618494 Telephone 65-6565-9989 Facsimile 65-6565-7552
SOUTH AFRICA ADI Scientific (Pty) Ltd
370 Angus Crescent Northlands Business Park 29 Newmarket Road
~~=~g~~~2~~1nt~~2_~~~bIlC of South Africa
Facsimile 27-11 -462-1466
SPAIN IZASA SA
Argoneses 13 28100 Alcobendas (poligono IndustriaQ Madrid Spain Te~phone 34-91-663-0500 Facsimile 34-91-663-0545
SWITZERLAND JEOL (GERMANY) GmbH Oskar-Von-Miller Strasse 1 85386 Eching Germany Telephone 49-8165-77346 Facsimile 49-8165-77512
TAIWAN For EO ProQucts JIE DONG CO LTD 7F 112 Chung Hsiao East Road Section 1 Taipei Taiwan 10023 Republic of China Telephone 886-2-2395-2978 Facsimile 886-2~2322-4655
For Mass Spectrometer Products Mass Solutions Technology Co Ltd
5F No79 Sec 1 Xintai 5th Rd Xlzhi Dis New Taipei City 221 Taiwan Republic of China Telephone 886-2-2698-9511 Facsimile 886-2-2698-9512
For Semiconductor Products JEOL TAIWAN SEMICONDUCTORS LTD
11 F-l No 346 Pei-Da Road Hsin-Chu City 300 Taiwan Republic of China Telephone 886-3-523-8490 Facsimile 886-3-523-8503
THAILAND BECTHAI BANGKOK EQUIPMENT amp CHEMICAL CO Ltd
300 Phaholyothin Rd Phayathai Bangkok 10400 Thailand Telephone 66-2-615-2929 Facsimile 66-2-615-23502351
THE NETHERLANDS JEOL (EUROPE) Bv Ureweg 4 NL-2153 PH Nieuw-Vennep The Nelherlands Telephone 31-252-623500 Facsimile 31-252-623501
TURKEY TEKSERAS Kayisdagi )nonu MahKartal Cad No553 34755 Atasehir Istanbul Turkey Telephone 90-216-5736470 Facsimile 90-216-5736475
UAE MRS Group Dubai POBox 171612 Rashid Abdulla AI Noami Building Suite No 306 Damascus Street AI Qusais-3 Dubai UAE Telephone 971-4-2581141 Facsimile 971-4-2581151
JEOLGulf
POBox 171612 bull Rashid Abdulla AI Noami Building Suite No 306 Damascus Street AI Qusais-3 Dubai UAE Telephone 971-553964219(mobile)
USA JEOL USA INC 11 Dearborn Road Peabody MA 01960 USA Telephone 1-978-535-5900 Facsimile 1-978-536-22052206
JEOL USA INC WEST OFFICE
~~s~~~~~rigAe9~5t~~1 1 0 Telephone 1-925-737-1740 Facsimile 1-925-737-1749
VENEZUELA GOMSA Service and Supply CA
Urbanizacion Montalban JlI - Resldenclas Don Andres - Piso 7 - Apartomento 74 Avenida 3 entre calles 7 y 6 Montalban Caracas Venezuela Telephone 58-212-443-4342 Facsimile 58-212-443-4342
VTETNAM TECHNICAL MATERIALS AND RESOURCES IMPORT-EXPORT JOINT STOCK COMPANY(REXCO) Hanoi Branch
No 13-Lot 12 Trung Yen Trung Hoa Street Cau Giay Dist HanOi Vietnam Telephone 84-4-562-051617562-0535 Facsimile 84-4-853-2511
No 0205B389C Printed in Japan Kp
Mass Spectrometers
I JMS-800D UltraFOCUS I JMS-700 (2) MStation Mass Spectrometer Dedicated to Dioxin Anal ys is High resolution M ass Spectrometer
JMS-800D UltraFOCUS is the optimal cho ice for ultra lowlevel race detection
applications suc h as moni torin g for dioxins and related co mpoun ds eg
Polychlorinated Biphenyls (PCBs) Polybrominated Diphenyl Ethers (PBDEs) or drugs
of abuse by high resolution-selected ion monitoring (HRSIM) gas chromatographyl
mass spectrometry(GCMS)
R-- gtn 80000 (10 valley) Sent Ily 2 3 7 8-TCDD 100fg SNgt2oo
(6 channels 100 msecch Resolution 10000)
N_ Jut J _lllgEI up to 10 kV
JMS-S3000 Matri x Assisted Laser DesorptionIonization TOFMS
The JMS-S3000 is a MALOI-TOFMS incorporating an innovative SpirarrOF ion optical
system With superior capabilities than conventional MALDI-TOFMS the JMS-S3000
provides sate-of-the-art anaiylical solutions for a wide range of research areas such as
functional synthetic polymers materials science and biomolecules
Malrix Assisled Laser Desorpllonlonization Timemiddotof-Flighl Mass Spectrometer
I JMS-T1 OOLP+DART TLC-TOFMS
Pet c 60000 (10 valley) err 02 ng of methyl stearate
SIN 400
(CVEI combination ion source) I~ ~ aJe up to 10kV
I JMS-T1 OOLP LC-TOFMS
I JMS-Tl OOGCV GC-TOFMS
middotl shyThe JMS-T100LP+DART achieves simple and fast TLCMS analysis Accurate mass The JMS-Tl00GCV is a fully automatic Gas Chromatograph - Time-ot-Flight Mass
measurement capabilit y of TOFMS also enables you to determine element Spectrometer (GC-TOFMS) This versatile MS system covers wide range of
compositions of the analytes applications in GC-MS analysis
16 I Pr oduc i Gu ide
- -
---
1----- 1- - - I - =---shy= bull --tJ~ 1- _ ~ __ ~-=--_~
I JMS-Ql 050GC UltraQuad GClMS
cJEOL
-
S-trapHS Headspace Autosampler
ESR Spectrometers
I JES-X3 series ESR Spectrometers
Recently it has been widely
accepted that even retatively few
unpaired electrons in a sample can
affect the function of the material so
lower detection limits (high er
sens itivity) is required of ESR
measurements JES-X3 Series has
achieved higher sensiti v i ty by
developing a lOIN-noise Gunn
oscillator for its new spectrometer
JES-X320 JEOL RESONANCE Inc
i III III )
Maximum Magnetic Field I a6ST 13T 14T
SweepW idth I --00-- 250mT plusmn001 - 500m__T_ __--l
Pole Gap _ _ 6cmm__ ___-= ___~ ____cmm__ _ I 0 = 60mcm 75 _l
Frequency Range(GHz) 8750 - 9650 _ _ _ ___-1
Field Resolution (mT) _L_ 235 Correction by Marker _1_--- Standard
I Operating System Windows 7
The JMS-01050GC is an innovative quadrupole mass spectrometer (OMS) that
achieves the highest-level sensitivity in OMS It has a high ability of evacuation due
to the use of a split flow turbo-molecular pump system (400 Lis) th at
simultaneously evacuates the ion source and the detector The use of a highshy
accuracy hyperbolic quadrupole mass analyzer provides high resolution
The S-trap is a next-generation headspace autosampler providing ultra-low
concentration measurement which was not achieved with a heads pace (HS) method
using conventional sample loop In addition the HS-GCMS system combined lith a
JMS-01050GC Mkll quaorupole MS guarantees detection of mold odor in water
down to 1 ppt
I ES-CT470 Liquid Helium Variable Temperature Controller
The ES-CT470 varies the sample temperature in the temperature range between 25 K
and 470 K Temperature setting is performed by d igital display and the set
temperature is kept constant by automatic control circui ts Combined use with a UV Irradiation device is possible A GaAs etement is used as a temperature sensor
enabling high-accuracy temperature setling
- 25 K to 470 K
plusmn001 K for 25 K to 42 K
plusmn1 orO5 K for 42 K to 470 K
_ 20 min 10 25 min (rom room temperature 08 to 2 Uh
50Hz60Hz 5mm JEOL RESONANCE Inc
Produ c t Guide I 17
Industrial Equipm nt for thin-filnl formation and nlatel ial processing
I bull
Electron Beam Source High-power Electron Beam Source
BS-60060EBS EBG-102UB6S
Electron beam sources for vacuum evaporation of metal and metal-oxide thin-films
We offer a wide variety of electron beam sources and crucibles They have features of
excellent beam spot and energy density and high-speed sweeping
1 PGBS 80020CPPS Plasma Source
BS-80011 BPG (6kW) BS-8002OCPPS (3kW)
Plasma Sources are installed in a vacuum chamber and generate high-density plasma
Used as Ion Plating (Plasma Assisted Deposition) and it is possible to improve film
properties for optilcal thin films protective films and function films Because highshy
density plasma can be generated in a mass space high-rate deposition to a large area
is possible
I RF Induction Plasma System
JEBG-3000UB(300kW) JEBG-1 OOOUB(1 OOkW)
High-power electron beam sources for vacuum evaporation of metal and metal-oxide
for wide plastic films or large glass plates that are continuously fed And they can also
be used for vacuum melting of high-melting point metals
raes
RF Generator
t shy - - - --- - - --- -
0-~ 0 bull bullbull - -
RF-12030 (3kW) RF-56000 (Controller)
13 56MHz radio-frequency power supplies for plasma generation and used for
sputtering CVD etching and ion-plating We offer 750W to 6kW generators and
matching networks
DR Powder Feeder
Thermal plasma around 10000degC (15000deg F) by RF inductive coupling This thermal Fine powder feeder that can feed 01 to 100 11m size fine powder continuously with
plasma is used for nano powder synthesis fine powder spheroidization thick film carrier gas We offer optional feeding rate controller and large capacity hopper
deposition multi composite membrane synthesis CVD and harmful gas
decomposition
18 I Produci Guide
---
Biochemical Analyzers
I JCA-BM series Clinical Chemistry Analyzer BioMajesty Series
JEOLs micro volume technology and unique sample pre-dilution mechanism realizes
high throughput chemistry analysis with reduced sample and reagent volume
More than 4000 systems have been placed in clinical laboratories allover the world
JCA-BM6050
I JCA-BMBOOO series Ultra High Throughput Clinical Chemistry Analyzer
4 4
JCA-BMB060 egt
JCA-BMSOOO series offer ultra high throughput chemistry analysis up to 9000 testsl
hour
The pre-dilution unit one of the BioMajesty family features also continues the strong
tradition in these series with interconnected multiple analysis modules the key factors
that accomplish brilliant high throughput as well as downtime reduction with back-up
capability
I JCA-BM6070 High Throughput High Performance Clinical Chemistry An alyzer
I I I
A Clinical chemistry analyzer with incomparable speed and accuracy which achieves
high throughput of 2400 testslhour (includ ing ISE) The incorporated compact
workstation and user-friendly Interface with excellent operability leads the new trend of
the laboratory testing
BioMajesty Series lCA-BM 6010 lCA-BM 6050
lCA-8M 6070 leA-BM 91 30
lCA-BM 8000 Series
bull This product is distributed outside Japan by Siemens Heatthcare Diagnostics under the ADVtAreg brand name
I JCA-BM601 OC Compact amp High Performance Clinical Chemistry Analyzer
-~-I -
1lIIIIIIilllllllllJllnlIlII Ii I JCA-BM6010C is a compact but efficient automatic analyzer that maintains the basic
concept of BioMajesty series while achieving the excellent capability of microanalysis
with sample volume as small as 1 J1L
BM6010C also offers fully automated HbA1 c analysis with on-board hemolysis
(optional) Simultaneous measurement of Glucose and HbA1c improves laboratory
workflow
Product Guid e I 19
S~~MCEAII Certain products in this brochure are controlled under the Foreign 0J 0014007 -v- ~ Exchange and Foreign Trade Law of Japan in compliance with $ ~~~ international security export control JEOL Ltd must provide the~2 m) IIlt Japanese Government with End-users Statement of Assurancel A MGMT SYS
AvA ~ m and End-use Certificate in order to obtain the export license - tiJ needed for export from Japan If the product to be exported is in this category the end user will be asked to fill in these certificate formsdEOLIS09001 amp150 14001CenrfiCltlled
httpwwwjeolcomdEOL JEOL Ltd 1-2 Musashino 3-chome Akishima Tokyo 196-8558 Japan Sales Division Telephone+81-42-528-3381 Facsimile+81-42-528-3386
ARGENTINA COASIN SAClyF Virrey del Pino 4071 1430 Buenos Aires Argentina Telephone 54-11-4552-3185 Facsimile 54-11-4555-3321
AUSTRALIA amp NEW ZEALAND JEOL(AUSTRALASJA) PtyUd Suite 1 L2 18 Aquatic Drive - Frenchs Foresl NSW 2086 Australia Telephone 61-2-9451-3855 Facsimile 61-2-9451-3822
AUSTRIA JEOL (GERMANY) GmbH Oskar-Von-Miller-Strasse 1 a 85386 Eching Gennany Telephone 49-8165-77346 Facsimile 49-8165-77512
BANGLADESH AQ CHOWDHURY SCIENCE amp SYNERGY PVT LTD House No1 2 Road No 5A Sector No 11 Uttara Dhaka - 1230 Bangladesh Telephone 880-2-9980790 8953450 8953501 Facsimile 880-2-8854428
BELGIUM JEOL (EUROPE) BV Planet ll Gebouw B Leuvensesteenweg 542 B-1930 Zaventem Belgium Telephone 32-2-720-0560 Facsimile 32-2-720-6134
BRAZIL JEOL Brasillnstrument09 Cienlilicos Llda
Av Jabaquara 2958-50 andar-cj 52 04046-500 Sao Paulo SP Brazil Telephone 55-11-5070 4000 Facsimile 55-11-5070 4010
CANADA JEOL CANADA INC 3275 Premier Rue 8 SI-Hubert Quebec J3Y 8Y6 Canada Telephone 1-450-676-8776 Facsimile 1-450-676-6694
CHILE ARQUIMED INNOVAnON
Arturo Pmt 828Santiago Chile Telephone 56-2-634-6266 Facsimile 56-2-634-4633
CHINA JEOL(BEIJING) CO LTD Room Bl0l0l110 Wantong New Wond Plaza No2 Fuchengmenwai Street XIcheng District Beijing 100037 PRChina Telephone 86-10-6804-6321 Facsimile 86-10-6804-6324
JEOL (BEIJING) CO LTD SHANGHAI BRANCH
Room 15051506 Nol300Xi Kang Road Jing an Dis Shanghai 200040 China Telephone 86-21-6248-4868448745374404 Facsimile 86-21-6248-4075
JEOL (BEIJING) CO LTD GUANG ZHOU BRANCH
N1601 World Trade Center Building 371-375 Huan Shi Road East Guang Zhou Guangdong Prov 510095 PRChina Telephone 86-20-8778-7848 Facsimile 86-20-8778-4268
JEOL (BEIJING) CO LTD WUHAN BRANCH
Room A2117 Zhongshang Plaza Office Bldg NO7 Zhongnan Road Wuhan Hubei 430071 PRChina Telephone 86-27-8713-2567 Facsimile 86-27-8713-2567
JEOL LTD (BEIJING) CO LTD CHENGDU BRANCH 1807A Zonglu Building NO 35 Zhongfu Road Chengdu Sichuan 610016 PR China Telephone 86-28-86622554 Facsimile 86-28-86622564
EGYPT JEOL SERIVCE BUREAU
3rd Fl Nile Center Bldg Nawal Slree Dokkl (Cairo) Egypt Telephone 20-2-3335-7220 Facsimile 20-2-3338-4186
FRANCE JEOL (EUROPE) SAS Espace Claude Monet 1 Allee de Giverny 78290 Crolssy-sur-Seine France Telephone 33-13015-3737 Facsimile 33-13015-3747
GERMANY JEOL (GERMANY) GmbH Oskar-Von-Miller-Strasse 1 a 85386 Eching Gennany Telephone 49-8165-77346 Facsimile 49-8165-77512
GREAT BRITAIN amp IRELAND JEOL (UK) LTD JEOL House Silver Court Watchmeaci Welwyn Garden City Herts AL71LT UK Telephone 44-1707 -377117 FaCSimile 44-1707-373254
GREECE N ASTERIADIS SA
56-58S Trikoupl Str PO Box 26140 GR-10022 Athens Greece Telephone 30-1-823-5383 Facsimile 30-1-823-9567
HONG KONG FARMING LTD
Unit No1 009 1 OF Prosperity Milennia Plaza 663 Kings Road North Point Hong Kong Telephone 852-2815-7299 Facsimile 852-2581-4635
INDIA JEQL INDIA Pvt Ltd
Elegance Tower Level 2 2128 Old Mathura Road Jasola Business District Centre Near Apollo Hospital Jasola New Delhi 110025 India Telephone 91-11-6472-2578 Facsimile 91-11-4060-1235
BLUE STAR LTD (HQ Mumbaij
Analyticallnstrments Department Sahas 41412 Veer Savarkar Marg Prabhadery Mumbai 400 025 India Telephone 91-22-6666-4000 Facsimile 91-22-6666-4001
BLUE STAR LTD (DelhQ Analytical Instruments Department E-4412 Okhla Industrial Area Phase-II New Delhi 110 020 India Telephone 91-11-4149-4000 Facsimile 91-11-4149-4005
BLUE STAR LTD (Calcutta)
Analylicallnstruments Department 7 Hare Street Calcutta 700 001 India Telephone 91-33-2213-4133 Facsimile 91 -33-2213-4102
BLUE STAR LTD (ChennaO Analytical Instruments Department No 46 Garuda Building Cathedral Road Chennai 600 086 India Telephone 91-44-4244-4000 Facsimile 91-44-4244-4190
INDONESIA PT TEKNOLABindo Penta Perkasa Komplek Gading Bukillndah Blok lIll JI Bukfl Gading Raya Kelapa Gading Pennai Jakarta 14240 Indonesia Telephone 62-21-458470575859 Facsimile 62-21-45842729
ITALY JEOL 0TALIA) SpA Centro Direzionale Green Office Via dei Tulipani 1 20090 Pieve Emanuele (MI) Italy Telephone 39-02-9041431 Facsimila 39-02-90414343
KOREA JEOL KOREA LTD
Dongwoo Bldg 7F 1443 Yangjae Daero Gangdong-Gu Seoul 134-010 Korea Telephone 82-2-511-5501 Facsimile 82-2-511-2635
KUWAIT Ashraf amp CO Ltd WLL PO Box 3555 Safat 13036 Kuwait Telephone 965-1805151 Facsimile 965-24335373
MALAYSIA JEOL(MALAYSIA) SDNBHD(3S9011-M)
205 Block A Mezzanine Floor Kelana Business Center 97 Jalan SS 72 Kelana Jaya 47301 Petaling Jaya Selangor Malaysia Telephone 60-3-7492-7722 Facsimile 60-3-7492-7723
MEXICO JEOL DE MEXICO SA DE CV
Arkansas 11 Piso 2 Colonia Napoles Delegacion Benito Juarez CP 03810 Mexico DF Mexico Telephone 52-5-55-211-4511 Facsimile 52-5-55-211-0720
PAKISTAN (KarachI) ANALYTICAL MEASURING SYSTEM (pvn LTD(AMS LTD)
14-C Main Sehar Commercia) Avenue Lane 4 Khayaban-e-Sehar DHA-VII Karachimiddot75500 Pakinstan Telephone 92-21-353455813534074735346057-8 Facsimile 92-21-35345582
PANAMA PROMED SA Parque Industrial Costa del Este Urbanizacion Costa del Este Apartado 0816-01755 Panama Panama Telephone 507-303-3100 FaCSimile 507-303-3115
PHILIPPINES PHILAB INDUSTRIES INC
7487 Bagtikan Street SAY Makati 1203 Metro Manila Phillip pines Telephone 63-2-896-7218 Facsimile 63-2-897-7732
PORTUGAL Izasa Portugal Lda A do Proletariado 1 2790-138 CARNAXIDE Portugal Telephone 351-21-424-73-00 Facsimile 351-21-418-60-20
RUSSIA JEOL (RUS) LLC Krasnoproletarskaya Street 16 Bid 2 127473 Moscow Russian Federation Telephone 7-495-748-7791rr792 Facsimile 7-495-748-7793
SAUDI ARABIA ABDULREHMAN ALGOSAIBI GTC (Riyadh)
King Abdulaziz Avenue PO Box 215 Riyadh 11411 Saudi Arabia Telephone 966-1-479-3000 Facsimile 966-1-477-1374
SCANDINAVIA SWEDEN JEOL (Skandinaviska)AB
Hammarbacken 6A Box 716191 27 Sollentuna Sweden Telephone 46-8-28-2800 Facsimile 46-8-29-1647
SERVICE amp INFORMATION OFFICE NORWAY JEQL (Skandinaviska)AB
Lorenvangen 23 0580 Oslo NORWAY Telephone 47-2-2-64-7930 Facsimile 47-2-2-65-0619
FINLAND JEOL (Skandlnaviska)AB
Ylakaupinkuja 2 FIN-02360 Espoo Finland Telephone 358-9-8129-0350 Facsimile 358-9-8129-0351
SINGAPORE JEOLASIA PTE LTD
2 Corporation Road 1t01-12 Corporation Place Singapore 618494 Telephone 65-6565-9989 Facsimile 65-6565-7552
SOUTH AFRICA ADI Scientific (Pty) Ltd
370 Angus Crescent Northlands Business Park 29 Newmarket Road
~~=~g~~~2~~1nt~~2_~~~bIlC of South Africa
Facsimile 27-11 -462-1466
SPAIN IZASA SA
Argoneses 13 28100 Alcobendas (poligono IndustriaQ Madrid Spain Te~phone 34-91-663-0500 Facsimile 34-91-663-0545
SWITZERLAND JEOL (GERMANY) GmbH Oskar-Von-Miller Strasse 1 85386 Eching Germany Telephone 49-8165-77346 Facsimile 49-8165-77512
TAIWAN For EO ProQucts JIE DONG CO LTD 7F 112 Chung Hsiao East Road Section 1 Taipei Taiwan 10023 Republic of China Telephone 886-2-2395-2978 Facsimile 886-2~2322-4655
For Mass Spectrometer Products Mass Solutions Technology Co Ltd
5F No79 Sec 1 Xintai 5th Rd Xlzhi Dis New Taipei City 221 Taiwan Republic of China Telephone 886-2-2698-9511 Facsimile 886-2-2698-9512
For Semiconductor Products JEOL TAIWAN SEMICONDUCTORS LTD
11 F-l No 346 Pei-Da Road Hsin-Chu City 300 Taiwan Republic of China Telephone 886-3-523-8490 Facsimile 886-3-523-8503
THAILAND BECTHAI BANGKOK EQUIPMENT amp CHEMICAL CO Ltd
300 Phaholyothin Rd Phayathai Bangkok 10400 Thailand Telephone 66-2-615-2929 Facsimile 66-2-615-23502351
THE NETHERLANDS JEOL (EUROPE) Bv Ureweg 4 NL-2153 PH Nieuw-Vennep The Nelherlands Telephone 31-252-623500 Facsimile 31-252-623501
TURKEY TEKSERAS Kayisdagi )nonu MahKartal Cad No553 34755 Atasehir Istanbul Turkey Telephone 90-216-5736470 Facsimile 90-216-5736475
UAE MRS Group Dubai POBox 171612 Rashid Abdulla AI Noami Building Suite No 306 Damascus Street AI Qusais-3 Dubai UAE Telephone 971-4-2581141 Facsimile 971-4-2581151
JEOLGulf
POBox 171612 bull Rashid Abdulla AI Noami Building Suite No 306 Damascus Street AI Qusais-3 Dubai UAE Telephone 971-553964219(mobile)
USA JEOL USA INC 11 Dearborn Road Peabody MA 01960 USA Telephone 1-978-535-5900 Facsimile 1-978-536-22052206
JEOL USA INC WEST OFFICE
~~s~~~~~rigAe9~5t~~1 1 0 Telephone 1-925-737-1740 Facsimile 1-925-737-1749
VENEZUELA GOMSA Service and Supply CA
Urbanizacion Montalban JlI - Resldenclas Don Andres - Piso 7 - Apartomento 74 Avenida 3 entre calles 7 y 6 Montalban Caracas Venezuela Telephone 58-212-443-4342 Facsimile 58-212-443-4342
VTETNAM TECHNICAL MATERIALS AND RESOURCES IMPORT-EXPORT JOINT STOCK COMPANY(REXCO) Hanoi Branch
No 13-Lot 12 Trung Yen Trung Hoa Street Cau Giay Dist HanOi Vietnam Telephone 84-4-562-051617562-0535 Facsimile 84-4-853-2511
No 0205B389C Printed in Japan Kp
- -
---
1----- 1- - - I - =---shy= bull --tJ~ 1- _ ~ __ ~-=--_~
I JMS-Ql 050GC UltraQuad GClMS
cJEOL
-
S-trapHS Headspace Autosampler
ESR Spectrometers
I JES-X3 series ESR Spectrometers
Recently it has been widely
accepted that even retatively few
unpaired electrons in a sample can
affect the function of the material so
lower detection limits (high er
sens itivity) is required of ESR
measurements JES-X3 Series has
achieved higher sensiti v i ty by
developing a lOIN-noise Gunn
oscillator for its new spectrometer
JES-X320 JEOL RESONANCE Inc
i III III )
Maximum Magnetic Field I a6ST 13T 14T
SweepW idth I --00-- 250mT plusmn001 - 500m__T_ __--l
Pole Gap _ _ 6cmm__ ___-= ___~ ____cmm__ _ I 0 = 60mcm 75 _l
Frequency Range(GHz) 8750 - 9650 _ _ _ ___-1
Field Resolution (mT) _L_ 235 Correction by Marker _1_--- Standard
I Operating System Windows 7
The JMS-01050GC is an innovative quadrupole mass spectrometer (OMS) that
achieves the highest-level sensitivity in OMS It has a high ability of evacuation due
to the use of a split flow turbo-molecular pump system (400 Lis) th at
simultaneously evacuates the ion source and the detector The use of a highshy
accuracy hyperbolic quadrupole mass analyzer provides high resolution
The S-trap is a next-generation headspace autosampler providing ultra-low
concentration measurement which was not achieved with a heads pace (HS) method
using conventional sample loop In addition the HS-GCMS system combined lith a
JMS-01050GC Mkll quaorupole MS guarantees detection of mold odor in water
down to 1 ppt
I ES-CT470 Liquid Helium Variable Temperature Controller
The ES-CT470 varies the sample temperature in the temperature range between 25 K
and 470 K Temperature setting is performed by d igital display and the set
temperature is kept constant by automatic control circui ts Combined use with a UV Irradiation device is possible A GaAs etement is used as a temperature sensor
enabling high-accuracy temperature setling
- 25 K to 470 K
plusmn001 K for 25 K to 42 K
plusmn1 orO5 K for 42 K to 470 K
_ 20 min 10 25 min (rom room temperature 08 to 2 Uh
50Hz60Hz 5mm JEOL RESONANCE Inc
Produ c t Guide I 17
Industrial Equipm nt for thin-filnl formation and nlatel ial processing
I bull
Electron Beam Source High-power Electron Beam Source
BS-60060EBS EBG-102UB6S
Electron beam sources for vacuum evaporation of metal and metal-oxide thin-films
We offer a wide variety of electron beam sources and crucibles They have features of
excellent beam spot and energy density and high-speed sweeping
1 PGBS 80020CPPS Plasma Source
BS-80011 BPG (6kW) BS-8002OCPPS (3kW)
Plasma Sources are installed in a vacuum chamber and generate high-density plasma
Used as Ion Plating (Plasma Assisted Deposition) and it is possible to improve film
properties for optilcal thin films protective films and function films Because highshy
density plasma can be generated in a mass space high-rate deposition to a large area
is possible
I RF Induction Plasma System
JEBG-3000UB(300kW) JEBG-1 OOOUB(1 OOkW)
High-power electron beam sources for vacuum evaporation of metal and metal-oxide
for wide plastic films or large glass plates that are continuously fed And they can also
be used for vacuum melting of high-melting point metals
raes
RF Generator
t shy - - - --- - - --- -
0-~ 0 bull bullbull - -
RF-12030 (3kW) RF-56000 (Controller)
13 56MHz radio-frequency power supplies for plasma generation and used for
sputtering CVD etching and ion-plating We offer 750W to 6kW generators and
matching networks
DR Powder Feeder
Thermal plasma around 10000degC (15000deg F) by RF inductive coupling This thermal Fine powder feeder that can feed 01 to 100 11m size fine powder continuously with
plasma is used for nano powder synthesis fine powder spheroidization thick film carrier gas We offer optional feeding rate controller and large capacity hopper
deposition multi composite membrane synthesis CVD and harmful gas
decomposition
18 I Produci Guide
---
Biochemical Analyzers
I JCA-BM series Clinical Chemistry Analyzer BioMajesty Series
JEOLs micro volume technology and unique sample pre-dilution mechanism realizes
high throughput chemistry analysis with reduced sample and reagent volume
More than 4000 systems have been placed in clinical laboratories allover the world
JCA-BM6050
I JCA-BMBOOO series Ultra High Throughput Clinical Chemistry Analyzer
4 4
JCA-BMB060 egt
JCA-BMSOOO series offer ultra high throughput chemistry analysis up to 9000 testsl
hour
The pre-dilution unit one of the BioMajesty family features also continues the strong
tradition in these series with interconnected multiple analysis modules the key factors
that accomplish brilliant high throughput as well as downtime reduction with back-up
capability
I JCA-BM6070 High Throughput High Performance Clinical Chemistry An alyzer
I I I
A Clinical chemistry analyzer with incomparable speed and accuracy which achieves
high throughput of 2400 testslhour (includ ing ISE) The incorporated compact
workstation and user-friendly Interface with excellent operability leads the new trend of
the laboratory testing
BioMajesty Series lCA-BM 6010 lCA-BM 6050
lCA-8M 6070 leA-BM 91 30
lCA-BM 8000 Series
bull This product is distributed outside Japan by Siemens Heatthcare Diagnostics under the ADVtAreg brand name
I JCA-BM601 OC Compact amp High Performance Clinical Chemistry Analyzer
-~-I -
1lIIIIIIilllllllllJllnlIlII Ii I JCA-BM6010C is a compact but efficient automatic analyzer that maintains the basic
concept of BioMajesty series while achieving the excellent capability of microanalysis
with sample volume as small as 1 J1L
BM6010C also offers fully automated HbA1 c analysis with on-board hemolysis
(optional) Simultaneous measurement of Glucose and HbA1c improves laboratory
workflow
Product Guid e I 19
S~~MCEAII Certain products in this brochure are controlled under the Foreign 0J 0014007 -v- ~ Exchange and Foreign Trade Law of Japan in compliance with $ ~~~ international security export control JEOL Ltd must provide the~2 m) IIlt Japanese Government with End-users Statement of Assurancel A MGMT SYS
AvA ~ m and End-use Certificate in order to obtain the export license - tiJ needed for export from Japan If the product to be exported is in this category the end user will be asked to fill in these certificate formsdEOLIS09001 amp150 14001CenrfiCltlled
httpwwwjeolcomdEOL JEOL Ltd 1-2 Musashino 3-chome Akishima Tokyo 196-8558 Japan Sales Division Telephone+81-42-528-3381 Facsimile+81-42-528-3386
ARGENTINA COASIN SAClyF Virrey del Pino 4071 1430 Buenos Aires Argentina Telephone 54-11-4552-3185 Facsimile 54-11-4555-3321
AUSTRALIA amp NEW ZEALAND JEOL(AUSTRALASJA) PtyUd Suite 1 L2 18 Aquatic Drive - Frenchs Foresl NSW 2086 Australia Telephone 61-2-9451-3855 Facsimile 61-2-9451-3822
AUSTRIA JEOL (GERMANY) GmbH Oskar-Von-Miller-Strasse 1 a 85386 Eching Gennany Telephone 49-8165-77346 Facsimile 49-8165-77512
BANGLADESH AQ CHOWDHURY SCIENCE amp SYNERGY PVT LTD House No1 2 Road No 5A Sector No 11 Uttara Dhaka - 1230 Bangladesh Telephone 880-2-9980790 8953450 8953501 Facsimile 880-2-8854428
BELGIUM JEOL (EUROPE) BV Planet ll Gebouw B Leuvensesteenweg 542 B-1930 Zaventem Belgium Telephone 32-2-720-0560 Facsimile 32-2-720-6134
BRAZIL JEOL Brasillnstrument09 Cienlilicos Llda
Av Jabaquara 2958-50 andar-cj 52 04046-500 Sao Paulo SP Brazil Telephone 55-11-5070 4000 Facsimile 55-11-5070 4010
CANADA JEOL CANADA INC 3275 Premier Rue 8 SI-Hubert Quebec J3Y 8Y6 Canada Telephone 1-450-676-8776 Facsimile 1-450-676-6694
CHILE ARQUIMED INNOVAnON
Arturo Pmt 828Santiago Chile Telephone 56-2-634-6266 Facsimile 56-2-634-4633
CHINA JEOL(BEIJING) CO LTD Room Bl0l0l110 Wantong New Wond Plaza No2 Fuchengmenwai Street XIcheng District Beijing 100037 PRChina Telephone 86-10-6804-6321 Facsimile 86-10-6804-6324
JEOL (BEIJING) CO LTD SHANGHAI BRANCH
Room 15051506 Nol300Xi Kang Road Jing an Dis Shanghai 200040 China Telephone 86-21-6248-4868448745374404 Facsimile 86-21-6248-4075
JEOL (BEIJING) CO LTD GUANG ZHOU BRANCH
N1601 World Trade Center Building 371-375 Huan Shi Road East Guang Zhou Guangdong Prov 510095 PRChina Telephone 86-20-8778-7848 Facsimile 86-20-8778-4268
JEOL (BEIJING) CO LTD WUHAN BRANCH
Room A2117 Zhongshang Plaza Office Bldg NO7 Zhongnan Road Wuhan Hubei 430071 PRChina Telephone 86-27-8713-2567 Facsimile 86-27-8713-2567
JEOL LTD (BEIJING) CO LTD CHENGDU BRANCH 1807A Zonglu Building NO 35 Zhongfu Road Chengdu Sichuan 610016 PR China Telephone 86-28-86622554 Facsimile 86-28-86622564
EGYPT JEOL SERIVCE BUREAU
3rd Fl Nile Center Bldg Nawal Slree Dokkl (Cairo) Egypt Telephone 20-2-3335-7220 Facsimile 20-2-3338-4186
FRANCE JEOL (EUROPE) SAS Espace Claude Monet 1 Allee de Giverny 78290 Crolssy-sur-Seine France Telephone 33-13015-3737 Facsimile 33-13015-3747
GERMANY JEOL (GERMANY) GmbH Oskar-Von-Miller-Strasse 1 a 85386 Eching Gennany Telephone 49-8165-77346 Facsimile 49-8165-77512
GREAT BRITAIN amp IRELAND JEOL (UK) LTD JEOL House Silver Court Watchmeaci Welwyn Garden City Herts AL71LT UK Telephone 44-1707 -377117 FaCSimile 44-1707-373254
GREECE N ASTERIADIS SA
56-58S Trikoupl Str PO Box 26140 GR-10022 Athens Greece Telephone 30-1-823-5383 Facsimile 30-1-823-9567
HONG KONG FARMING LTD
Unit No1 009 1 OF Prosperity Milennia Plaza 663 Kings Road North Point Hong Kong Telephone 852-2815-7299 Facsimile 852-2581-4635
INDIA JEQL INDIA Pvt Ltd
Elegance Tower Level 2 2128 Old Mathura Road Jasola Business District Centre Near Apollo Hospital Jasola New Delhi 110025 India Telephone 91-11-6472-2578 Facsimile 91-11-4060-1235
BLUE STAR LTD (HQ Mumbaij
Analyticallnstrments Department Sahas 41412 Veer Savarkar Marg Prabhadery Mumbai 400 025 India Telephone 91-22-6666-4000 Facsimile 91-22-6666-4001
BLUE STAR LTD (DelhQ Analytical Instruments Department E-4412 Okhla Industrial Area Phase-II New Delhi 110 020 India Telephone 91-11-4149-4000 Facsimile 91-11-4149-4005
BLUE STAR LTD (Calcutta)
Analylicallnstruments Department 7 Hare Street Calcutta 700 001 India Telephone 91-33-2213-4133 Facsimile 91 -33-2213-4102
BLUE STAR LTD (ChennaO Analytical Instruments Department No 46 Garuda Building Cathedral Road Chennai 600 086 India Telephone 91-44-4244-4000 Facsimile 91-44-4244-4190
INDONESIA PT TEKNOLABindo Penta Perkasa Komplek Gading Bukillndah Blok lIll JI Bukfl Gading Raya Kelapa Gading Pennai Jakarta 14240 Indonesia Telephone 62-21-458470575859 Facsimile 62-21-45842729
ITALY JEOL 0TALIA) SpA Centro Direzionale Green Office Via dei Tulipani 1 20090 Pieve Emanuele (MI) Italy Telephone 39-02-9041431 Facsimila 39-02-90414343
KOREA JEOL KOREA LTD
Dongwoo Bldg 7F 1443 Yangjae Daero Gangdong-Gu Seoul 134-010 Korea Telephone 82-2-511-5501 Facsimile 82-2-511-2635
KUWAIT Ashraf amp CO Ltd WLL PO Box 3555 Safat 13036 Kuwait Telephone 965-1805151 Facsimile 965-24335373
MALAYSIA JEOL(MALAYSIA) SDNBHD(3S9011-M)
205 Block A Mezzanine Floor Kelana Business Center 97 Jalan SS 72 Kelana Jaya 47301 Petaling Jaya Selangor Malaysia Telephone 60-3-7492-7722 Facsimile 60-3-7492-7723
MEXICO JEOL DE MEXICO SA DE CV
Arkansas 11 Piso 2 Colonia Napoles Delegacion Benito Juarez CP 03810 Mexico DF Mexico Telephone 52-5-55-211-4511 Facsimile 52-5-55-211-0720
PAKISTAN (KarachI) ANALYTICAL MEASURING SYSTEM (pvn LTD(AMS LTD)
14-C Main Sehar Commercia) Avenue Lane 4 Khayaban-e-Sehar DHA-VII Karachimiddot75500 Pakinstan Telephone 92-21-353455813534074735346057-8 Facsimile 92-21-35345582
PANAMA PROMED SA Parque Industrial Costa del Este Urbanizacion Costa del Este Apartado 0816-01755 Panama Panama Telephone 507-303-3100 FaCSimile 507-303-3115
PHILIPPINES PHILAB INDUSTRIES INC
7487 Bagtikan Street SAY Makati 1203 Metro Manila Phillip pines Telephone 63-2-896-7218 Facsimile 63-2-897-7732
PORTUGAL Izasa Portugal Lda A do Proletariado 1 2790-138 CARNAXIDE Portugal Telephone 351-21-424-73-00 Facsimile 351-21-418-60-20
RUSSIA JEOL (RUS) LLC Krasnoproletarskaya Street 16 Bid 2 127473 Moscow Russian Federation Telephone 7-495-748-7791rr792 Facsimile 7-495-748-7793
SAUDI ARABIA ABDULREHMAN ALGOSAIBI GTC (Riyadh)
King Abdulaziz Avenue PO Box 215 Riyadh 11411 Saudi Arabia Telephone 966-1-479-3000 Facsimile 966-1-477-1374
SCANDINAVIA SWEDEN JEOL (Skandinaviska)AB
Hammarbacken 6A Box 716191 27 Sollentuna Sweden Telephone 46-8-28-2800 Facsimile 46-8-29-1647
SERVICE amp INFORMATION OFFICE NORWAY JEQL (Skandinaviska)AB
Lorenvangen 23 0580 Oslo NORWAY Telephone 47-2-2-64-7930 Facsimile 47-2-2-65-0619
FINLAND JEOL (Skandlnaviska)AB
Ylakaupinkuja 2 FIN-02360 Espoo Finland Telephone 358-9-8129-0350 Facsimile 358-9-8129-0351
SINGAPORE JEOLASIA PTE LTD
2 Corporation Road 1t01-12 Corporation Place Singapore 618494 Telephone 65-6565-9989 Facsimile 65-6565-7552
SOUTH AFRICA ADI Scientific (Pty) Ltd
370 Angus Crescent Northlands Business Park 29 Newmarket Road
~~=~g~~~2~~1nt~~2_~~~bIlC of South Africa
Facsimile 27-11 -462-1466
SPAIN IZASA SA
Argoneses 13 28100 Alcobendas (poligono IndustriaQ Madrid Spain Te~phone 34-91-663-0500 Facsimile 34-91-663-0545
SWITZERLAND JEOL (GERMANY) GmbH Oskar-Von-Miller Strasse 1 85386 Eching Germany Telephone 49-8165-77346 Facsimile 49-8165-77512
TAIWAN For EO ProQucts JIE DONG CO LTD 7F 112 Chung Hsiao East Road Section 1 Taipei Taiwan 10023 Republic of China Telephone 886-2-2395-2978 Facsimile 886-2~2322-4655
For Mass Spectrometer Products Mass Solutions Technology Co Ltd
5F No79 Sec 1 Xintai 5th Rd Xlzhi Dis New Taipei City 221 Taiwan Republic of China Telephone 886-2-2698-9511 Facsimile 886-2-2698-9512
For Semiconductor Products JEOL TAIWAN SEMICONDUCTORS LTD
11 F-l No 346 Pei-Da Road Hsin-Chu City 300 Taiwan Republic of China Telephone 886-3-523-8490 Facsimile 886-3-523-8503
THAILAND BECTHAI BANGKOK EQUIPMENT amp CHEMICAL CO Ltd
300 Phaholyothin Rd Phayathai Bangkok 10400 Thailand Telephone 66-2-615-2929 Facsimile 66-2-615-23502351
THE NETHERLANDS JEOL (EUROPE) Bv Ureweg 4 NL-2153 PH Nieuw-Vennep The Nelherlands Telephone 31-252-623500 Facsimile 31-252-623501
TURKEY TEKSERAS Kayisdagi )nonu MahKartal Cad No553 34755 Atasehir Istanbul Turkey Telephone 90-216-5736470 Facsimile 90-216-5736475
UAE MRS Group Dubai POBox 171612 Rashid Abdulla AI Noami Building Suite No 306 Damascus Street AI Qusais-3 Dubai UAE Telephone 971-4-2581141 Facsimile 971-4-2581151
JEOLGulf
POBox 171612 bull Rashid Abdulla AI Noami Building Suite No 306 Damascus Street AI Qusais-3 Dubai UAE Telephone 971-553964219(mobile)
USA JEOL USA INC 11 Dearborn Road Peabody MA 01960 USA Telephone 1-978-535-5900 Facsimile 1-978-536-22052206
JEOL USA INC WEST OFFICE
~~s~~~~~rigAe9~5t~~1 1 0 Telephone 1-925-737-1740 Facsimile 1-925-737-1749
VENEZUELA GOMSA Service and Supply CA
Urbanizacion Montalban JlI - Resldenclas Don Andres - Piso 7 - Apartomento 74 Avenida 3 entre calles 7 y 6 Montalban Caracas Venezuela Telephone 58-212-443-4342 Facsimile 58-212-443-4342
VTETNAM TECHNICAL MATERIALS AND RESOURCES IMPORT-EXPORT JOINT STOCK COMPANY(REXCO) Hanoi Branch
No 13-Lot 12 Trung Yen Trung Hoa Street Cau Giay Dist HanOi Vietnam Telephone 84-4-562-051617562-0535 Facsimile 84-4-853-2511
No 0205B389C Printed in Japan Kp
Industrial Equipm nt for thin-filnl formation and nlatel ial processing
I bull
Electron Beam Source High-power Electron Beam Source
BS-60060EBS EBG-102UB6S
Electron beam sources for vacuum evaporation of metal and metal-oxide thin-films
We offer a wide variety of electron beam sources and crucibles They have features of
excellent beam spot and energy density and high-speed sweeping
1 PGBS 80020CPPS Plasma Source
BS-80011 BPG (6kW) BS-8002OCPPS (3kW)
Plasma Sources are installed in a vacuum chamber and generate high-density plasma
Used as Ion Plating (Plasma Assisted Deposition) and it is possible to improve film
properties for optilcal thin films protective films and function films Because highshy
density plasma can be generated in a mass space high-rate deposition to a large area
is possible
I RF Induction Plasma System
JEBG-3000UB(300kW) JEBG-1 OOOUB(1 OOkW)
High-power electron beam sources for vacuum evaporation of metal and metal-oxide
for wide plastic films or large glass plates that are continuously fed And they can also
be used for vacuum melting of high-melting point metals
raes
RF Generator
t shy - - - --- - - --- -
0-~ 0 bull bullbull - -
RF-12030 (3kW) RF-56000 (Controller)
13 56MHz radio-frequency power supplies for plasma generation and used for
sputtering CVD etching and ion-plating We offer 750W to 6kW generators and
matching networks
DR Powder Feeder
Thermal plasma around 10000degC (15000deg F) by RF inductive coupling This thermal Fine powder feeder that can feed 01 to 100 11m size fine powder continuously with
plasma is used for nano powder synthesis fine powder spheroidization thick film carrier gas We offer optional feeding rate controller and large capacity hopper
deposition multi composite membrane synthesis CVD and harmful gas
decomposition
18 I Produci Guide
---
Biochemical Analyzers
I JCA-BM series Clinical Chemistry Analyzer BioMajesty Series
JEOLs micro volume technology and unique sample pre-dilution mechanism realizes
high throughput chemistry analysis with reduced sample and reagent volume
More than 4000 systems have been placed in clinical laboratories allover the world
JCA-BM6050
I JCA-BMBOOO series Ultra High Throughput Clinical Chemistry Analyzer
4 4
JCA-BMB060 egt
JCA-BMSOOO series offer ultra high throughput chemistry analysis up to 9000 testsl
hour
The pre-dilution unit one of the BioMajesty family features also continues the strong
tradition in these series with interconnected multiple analysis modules the key factors
that accomplish brilliant high throughput as well as downtime reduction with back-up
capability
I JCA-BM6070 High Throughput High Performance Clinical Chemistry An alyzer
I I I
A Clinical chemistry analyzer with incomparable speed and accuracy which achieves
high throughput of 2400 testslhour (includ ing ISE) The incorporated compact
workstation and user-friendly Interface with excellent operability leads the new trend of
the laboratory testing
BioMajesty Series lCA-BM 6010 lCA-BM 6050
lCA-8M 6070 leA-BM 91 30
lCA-BM 8000 Series
bull This product is distributed outside Japan by Siemens Heatthcare Diagnostics under the ADVtAreg brand name
I JCA-BM601 OC Compact amp High Performance Clinical Chemistry Analyzer
-~-I -
1lIIIIIIilllllllllJllnlIlII Ii I JCA-BM6010C is a compact but efficient automatic analyzer that maintains the basic
concept of BioMajesty series while achieving the excellent capability of microanalysis
with sample volume as small as 1 J1L
BM6010C also offers fully automated HbA1 c analysis with on-board hemolysis
(optional) Simultaneous measurement of Glucose and HbA1c improves laboratory
workflow
Product Guid e I 19
S~~MCEAII Certain products in this brochure are controlled under the Foreign 0J 0014007 -v- ~ Exchange and Foreign Trade Law of Japan in compliance with $ ~~~ international security export control JEOL Ltd must provide the~2 m) IIlt Japanese Government with End-users Statement of Assurancel A MGMT SYS
AvA ~ m and End-use Certificate in order to obtain the export license - tiJ needed for export from Japan If the product to be exported is in this category the end user will be asked to fill in these certificate formsdEOLIS09001 amp150 14001CenrfiCltlled
httpwwwjeolcomdEOL JEOL Ltd 1-2 Musashino 3-chome Akishima Tokyo 196-8558 Japan Sales Division Telephone+81-42-528-3381 Facsimile+81-42-528-3386
ARGENTINA COASIN SAClyF Virrey del Pino 4071 1430 Buenos Aires Argentina Telephone 54-11-4552-3185 Facsimile 54-11-4555-3321
AUSTRALIA amp NEW ZEALAND JEOL(AUSTRALASJA) PtyUd Suite 1 L2 18 Aquatic Drive - Frenchs Foresl NSW 2086 Australia Telephone 61-2-9451-3855 Facsimile 61-2-9451-3822
AUSTRIA JEOL (GERMANY) GmbH Oskar-Von-Miller-Strasse 1 a 85386 Eching Gennany Telephone 49-8165-77346 Facsimile 49-8165-77512
BANGLADESH AQ CHOWDHURY SCIENCE amp SYNERGY PVT LTD House No1 2 Road No 5A Sector No 11 Uttara Dhaka - 1230 Bangladesh Telephone 880-2-9980790 8953450 8953501 Facsimile 880-2-8854428
BELGIUM JEOL (EUROPE) BV Planet ll Gebouw B Leuvensesteenweg 542 B-1930 Zaventem Belgium Telephone 32-2-720-0560 Facsimile 32-2-720-6134
BRAZIL JEOL Brasillnstrument09 Cienlilicos Llda
Av Jabaquara 2958-50 andar-cj 52 04046-500 Sao Paulo SP Brazil Telephone 55-11-5070 4000 Facsimile 55-11-5070 4010
CANADA JEOL CANADA INC 3275 Premier Rue 8 SI-Hubert Quebec J3Y 8Y6 Canada Telephone 1-450-676-8776 Facsimile 1-450-676-6694
CHILE ARQUIMED INNOVAnON
Arturo Pmt 828Santiago Chile Telephone 56-2-634-6266 Facsimile 56-2-634-4633
CHINA JEOL(BEIJING) CO LTD Room Bl0l0l110 Wantong New Wond Plaza No2 Fuchengmenwai Street XIcheng District Beijing 100037 PRChina Telephone 86-10-6804-6321 Facsimile 86-10-6804-6324
JEOL (BEIJING) CO LTD SHANGHAI BRANCH
Room 15051506 Nol300Xi Kang Road Jing an Dis Shanghai 200040 China Telephone 86-21-6248-4868448745374404 Facsimile 86-21-6248-4075
JEOL (BEIJING) CO LTD GUANG ZHOU BRANCH
N1601 World Trade Center Building 371-375 Huan Shi Road East Guang Zhou Guangdong Prov 510095 PRChina Telephone 86-20-8778-7848 Facsimile 86-20-8778-4268
JEOL (BEIJING) CO LTD WUHAN BRANCH
Room A2117 Zhongshang Plaza Office Bldg NO7 Zhongnan Road Wuhan Hubei 430071 PRChina Telephone 86-27-8713-2567 Facsimile 86-27-8713-2567
JEOL LTD (BEIJING) CO LTD CHENGDU BRANCH 1807A Zonglu Building NO 35 Zhongfu Road Chengdu Sichuan 610016 PR China Telephone 86-28-86622554 Facsimile 86-28-86622564
EGYPT JEOL SERIVCE BUREAU
3rd Fl Nile Center Bldg Nawal Slree Dokkl (Cairo) Egypt Telephone 20-2-3335-7220 Facsimile 20-2-3338-4186
FRANCE JEOL (EUROPE) SAS Espace Claude Monet 1 Allee de Giverny 78290 Crolssy-sur-Seine France Telephone 33-13015-3737 Facsimile 33-13015-3747
GERMANY JEOL (GERMANY) GmbH Oskar-Von-Miller-Strasse 1 a 85386 Eching Gennany Telephone 49-8165-77346 Facsimile 49-8165-77512
GREAT BRITAIN amp IRELAND JEOL (UK) LTD JEOL House Silver Court Watchmeaci Welwyn Garden City Herts AL71LT UK Telephone 44-1707 -377117 FaCSimile 44-1707-373254
GREECE N ASTERIADIS SA
56-58S Trikoupl Str PO Box 26140 GR-10022 Athens Greece Telephone 30-1-823-5383 Facsimile 30-1-823-9567
HONG KONG FARMING LTD
Unit No1 009 1 OF Prosperity Milennia Plaza 663 Kings Road North Point Hong Kong Telephone 852-2815-7299 Facsimile 852-2581-4635
INDIA JEQL INDIA Pvt Ltd
Elegance Tower Level 2 2128 Old Mathura Road Jasola Business District Centre Near Apollo Hospital Jasola New Delhi 110025 India Telephone 91-11-6472-2578 Facsimile 91-11-4060-1235
BLUE STAR LTD (HQ Mumbaij
Analyticallnstrments Department Sahas 41412 Veer Savarkar Marg Prabhadery Mumbai 400 025 India Telephone 91-22-6666-4000 Facsimile 91-22-6666-4001
BLUE STAR LTD (DelhQ Analytical Instruments Department E-4412 Okhla Industrial Area Phase-II New Delhi 110 020 India Telephone 91-11-4149-4000 Facsimile 91-11-4149-4005
BLUE STAR LTD (Calcutta)
Analylicallnstruments Department 7 Hare Street Calcutta 700 001 India Telephone 91-33-2213-4133 Facsimile 91 -33-2213-4102
BLUE STAR LTD (ChennaO Analytical Instruments Department No 46 Garuda Building Cathedral Road Chennai 600 086 India Telephone 91-44-4244-4000 Facsimile 91-44-4244-4190
INDONESIA PT TEKNOLABindo Penta Perkasa Komplek Gading Bukillndah Blok lIll JI Bukfl Gading Raya Kelapa Gading Pennai Jakarta 14240 Indonesia Telephone 62-21-458470575859 Facsimile 62-21-45842729
ITALY JEOL 0TALIA) SpA Centro Direzionale Green Office Via dei Tulipani 1 20090 Pieve Emanuele (MI) Italy Telephone 39-02-9041431 Facsimila 39-02-90414343
KOREA JEOL KOREA LTD
Dongwoo Bldg 7F 1443 Yangjae Daero Gangdong-Gu Seoul 134-010 Korea Telephone 82-2-511-5501 Facsimile 82-2-511-2635
KUWAIT Ashraf amp CO Ltd WLL PO Box 3555 Safat 13036 Kuwait Telephone 965-1805151 Facsimile 965-24335373
MALAYSIA JEOL(MALAYSIA) SDNBHD(3S9011-M)
205 Block A Mezzanine Floor Kelana Business Center 97 Jalan SS 72 Kelana Jaya 47301 Petaling Jaya Selangor Malaysia Telephone 60-3-7492-7722 Facsimile 60-3-7492-7723
MEXICO JEOL DE MEXICO SA DE CV
Arkansas 11 Piso 2 Colonia Napoles Delegacion Benito Juarez CP 03810 Mexico DF Mexico Telephone 52-5-55-211-4511 Facsimile 52-5-55-211-0720
PAKISTAN (KarachI) ANALYTICAL MEASURING SYSTEM (pvn LTD(AMS LTD)
14-C Main Sehar Commercia) Avenue Lane 4 Khayaban-e-Sehar DHA-VII Karachimiddot75500 Pakinstan Telephone 92-21-353455813534074735346057-8 Facsimile 92-21-35345582
PANAMA PROMED SA Parque Industrial Costa del Este Urbanizacion Costa del Este Apartado 0816-01755 Panama Panama Telephone 507-303-3100 FaCSimile 507-303-3115
PHILIPPINES PHILAB INDUSTRIES INC
7487 Bagtikan Street SAY Makati 1203 Metro Manila Phillip pines Telephone 63-2-896-7218 Facsimile 63-2-897-7732
PORTUGAL Izasa Portugal Lda A do Proletariado 1 2790-138 CARNAXIDE Portugal Telephone 351-21-424-73-00 Facsimile 351-21-418-60-20
RUSSIA JEOL (RUS) LLC Krasnoproletarskaya Street 16 Bid 2 127473 Moscow Russian Federation Telephone 7-495-748-7791rr792 Facsimile 7-495-748-7793
SAUDI ARABIA ABDULREHMAN ALGOSAIBI GTC (Riyadh)
King Abdulaziz Avenue PO Box 215 Riyadh 11411 Saudi Arabia Telephone 966-1-479-3000 Facsimile 966-1-477-1374
SCANDINAVIA SWEDEN JEOL (Skandinaviska)AB
Hammarbacken 6A Box 716191 27 Sollentuna Sweden Telephone 46-8-28-2800 Facsimile 46-8-29-1647
SERVICE amp INFORMATION OFFICE NORWAY JEQL (Skandinaviska)AB
Lorenvangen 23 0580 Oslo NORWAY Telephone 47-2-2-64-7930 Facsimile 47-2-2-65-0619
FINLAND JEOL (Skandlnaviska)AB
Ylakaupinkuja 2 FIN-02360 Espoo Finland Telephone 358-9-8129-0350 Facsimile 358-9-8129-0351
SINGAPORE JEOLASIA PTE LTD
2 Corporation Road 1t01-12 Corporation Place Singapore 618494 Telephone 65-6565-9989 Facsimile 65-6565-7552
SOUTH AFRICA ADI Scientific (Pty) Ltd
370 Angus Crescent Northlands Business Park 29 Newmarket Road
~~=~g~~~2~~1nt~~2_~~~bIlC of South Africa
Facsimile 27-11 -462-1466
SPAIN IZASA SA
Argoneses 13 28100 Alcobendas (poligono IndustriaQ Madrid Spain Te~phone 34-91-663-0500 Facsimile 34-91-663-0545
SWITZERLAND JEOL (GERMANY) GmbH Oskar-Von-Miller Strasse 1 85386 Eching Germany Telephone 49-8165-77346 Facsimile 49-8165-77512
TAIWAN For EO ProQucts JIE DONG CO LTD 7F 112 Chung Hsiao East Road Section 1 Taipei Taiwan 10023 Republic of China Telephone 886-2-2395-2978 Facsimile 886-2~2322-4655
For Mass Spectrometer Products Mass Solutions Technology Co Ltd
5F No79 Sec 1 Xintai 5th Rd Xlzhi Dis New Taipei City 221 Taiwan Republic of China Telephone 886-2-2698-9511 Facsimile 886-2-2698-9512
For Semiconductor Products JEOL TAIWAN SEMICONDUCTORS LTD
11 F-l No 346 Pei-Da Road Hsin-Chu City 300 Taiwan Republic of China Telephone 886-3-523-8490 Facsimile 886-3-523-8503
THAILAND BECTHAI BANGKOK EQUIPMENT amp CHEMICAL CO Ltd
300 Phaholyothin Rd Phayathai Bangkok 10400 Thailand Telephone 66-2-615-2929 Facsimile 66-2-615-23502351
THE NETHERLANDS JEOL (EUROPE) Bv Ureweg 4 NL-2153 PH Nieuw-Vennep The Nelherlands Telephone 31-252-623500 Facsimile 31-252-623501
TURKEY TEKSERAS Kayisdagi )nonu MahKartal Cad No553 34755 Atasehir Istanbul Turkey Telephone 90-216-5736470 Facsimile 90-216-5736475
UAE MRS Group Dubai POBox 171612 Rashid Abdulla AI Noami Building Suite No 306 Damascus Street AI Qusais-3 Dubai UAE Telephone 971-4-2581141 Facsimile 971-4-2581151
JEOLGulf
POBox 171612 bull Rashid Abdulla AI Noami Building Suite No 306 Damascus Street AI Qusais-3 Dubai UAE Telephone 971-553964219(mobile)
USA JEOL USA INC 11 Dearborn Road Peabody MA 01960 USA Telephone 1-978-535-5900 Facsimile 1-978-536-22052206
JEOL USA INC WEST OFFICE
~~s~~~~~rigAe9~5t~~1 1 0 Telephone 1-925-737-1740 Facsimile 1-925-737-1749
VENEZUELA GOMSA Service and Supply CA
Urbanizacion Montalban JlI - Resldenclas Don Andres - Piso 7 - Apartomento 74 Avenida 3 entre calles 7 y 6 Montalban Caracas Venezuela Telephone 58-212-443-4342 Facsimile 58-212-443-4342
VTETNAM TECHNICAL MATERIALS AND RESOURCES IMPORT-EXPORT JOINT STOCK COMPANY(REXCO) Hanoi Branch
No 13-Lot 12 Trung Yen Trung Hoa Street Cau Giay Dist HanOi Vietnam Telephone 84-4-562-051617562-0535 Facsimile 84-4-853-2511
No 0205B389C Printed in Japan Kp
---
Biochemical Analyzers
I JCA-BM series Clinical Chemistry Analyzer BioMajesty Series
JEOLs micro volume technology and unique sample pre-dilution mechanism realizes
high throughput chemistry analysis with reduced sample and reagent volume
More than 4000 systems have been placed in clinical laboratories allover the world
JCA-BM6050
I JCA-BMBOOO series Ultra High Throughput Clinical Chemistry Analyzer
4 4
JCA-BMB060 egt
JCA-BMSOOO series offer ultra high throughput chemistry analysis up to 9000 testsl
hour
The pre-dilution unit one of the BioMajesty family features also continues the strong
tradition in these series with interconnected multiple analysis modules the key factors
that accomplish brilliant high throughput as well as downtime reduction with back-up
capability
I JCA-BM6070 High Throughput High Performance Clinical Chemistry An alyzer
I I I
A Clinical chemistry analyzer with incomparable speed and accuracy which achieves
high throughput of 2400 testslhour (includ ing ISE) The incorporated compact
workstation and user-friendly Interface with excellent operability leads the new trend of
the laboratory testing
BioMajesty Series lCA-BM 6010 lCA-BM 6050
lCA-8M 6070 leA-BM 91 30
lCA-BM 8000 Series
bull This product is distributed outside Japan by Siemens Heatthcare Diagnostics under the ADVtAreg brand name
I JCA-BM601 OC Compact amp High Performance Clinical Chemistry Analyzer
-~-I -
1lIIIIIIilllllllllJllnlIlII Ii I JCA-BM6010C is a compact but efficient automatic analyzer that maintains the basic
concept of BioMajesty series while achieving the excellent capability of microanalysis
with sample volume as small as 1 J1L
BM6010C also offers fully automated HbA1 c analysis with on-board hemolysis
(optional) Simultaneous measurement of Glucose and HbA1c improves laboratory
workflow
Product Guid e I 19
S~~MCEAII Certain products in this brochure are controlled under the Foreign 0J 0014007 -v- ~ Exchange and Foreign Trade Law of Japan in compliance with $ ~~~ international security export control JEOL Ltd must provide the~2 m) IIlt Japanese Government with End-users Statement of Assurancel A MGMT SYS
AvA ~ m and End-use Certificate in order to obtain the export license - tiJ needed for export from Japan If the product to be exported is in this category the end user will be asked to fill in these certificate formsdEOLIS09001 amp150 14001CenrfiCltlled
httpwwwjeolcomdEOL JEOL Ltd 1-2 Musashino 3-chome Akishima Tokyo 196-8558 Japan Sales Division Telephone+81-42-528-3381 Facsimile+81-42-528-3386
ARGENTINA COASIN SAClyF Virrey del Pino 4071 1430 Buenos Aires Argentina Telephone 54-11-4552-3185 Facsimile 54-11-4555-3321
AUSTRALIA amp NEW ZEALAND JEOL(AUSTRALASJA) PtyUd Suite 1 L2 18 Aquatic Drive - Frenchs Foresl NSW 2086 Australia Telephone 61-2-9451-3855 Facsimile 61-2-9451-3822
AUSTRIA JEOL (GERMANY) GmbH Oskar-Von-Miller-Strasse 1 a 85386 Eching Gennany Telephone 49-8165-77346 Facsimile 49-8165-77512
BANGLADESH AQ CHOWDHURY SCIENCE amp SYNERGY PVT LTD House No1 2 Road No 5A Sector No 11 Uttara Dhaka - 1230 Bangladesh Telephone 880-2-9980790 8953450 8953501 Facsimile 880-2-8854428
BELGIUM JEOL (EUROPE) BV Planet ll Gebouw B Leuvensesteenweg 542 B-1930 Zaventem Belgium Telephone 32-2-720-0560 Facsimile 32-2-720-6134
BRAZIL JEOL Brasillnstrument09 Cienlilicos Llda
Av Jabaquara 2958-50 andar-cj 52 04046-500 Sao Paulo SP Brazil Telephone 55-11-5070 4000 Facsimile 55-11-5070 4010
CANADA JEOL CANADA INC 3275 Premier Rue 8 SI-Hubert Quebec J3Y 8Y6 Canada Telephone 1-450-676-8776 Facsimile 1-450-676-6694
CHILE ARQUIMED INNOVAnON
Arturo Pmt 828Santiago Chile Telephone 56-2-634-6266 Facsimile 56-2-634-4633
CHINA JEOL(BEIJING) CO LTD Room Bl0l0l110 Wantong New Wond Plaza No2 Fuchengmenwai Street XIcheng District Beijing 100037 PRChina Telephone 86-10-6804-6321 Facsimile 86-10-6804-6324
JEOL (BEIJING) CO LTD SHANGHAI BRANCH
Room 15051506 Nol300Xi Kang Road Jing an Dis Shanghai 200040 China Telephone 86-21-6248-4868448745374404 Facsimile 86-21-6248-4075
JEOL (BEIJING) CO LTD GUANG ZHOU BRANCH
N1601 World Trade Center Building 371-375 Huan Shi Road East Guang Zhou Guangdong Prov 510095 PRChina Telephone 86-20-8778-7848 Facsimile 86-20-8778-4268
JEOL (BEIJING) CO LTD WUHAN BRANCH
Room A2117 Zhongshang Plaza Office Bldg NO7 Zhongnan Road Wuhan Hubei 430071 PRChina Telephone 86-27-8713-2567 Facsimile 86-27-8713-2567
JEOL LTD (BEIJING) CO LTD CHENGDU BRANCH 1807A Zonglu Building NO 35 Zhongfu Road Chengdu Sichuan 610016 PR China Telephone 86-28-86622554 Facsimile 86-28-86622564
EGYPT JEOL SERIVCE BUREAU
3rd Fl Nile Center Bldg Nawal Slree Dokkl (Cairo) Egypt Telephone 20-2-3335-7220 Facsimile 20-2-3338-4186
FRANCE JEOL (EUROPE) SAS Espace Claude Monet 1 Allee de Giverny 78290 Crolssy-sur-Seine France Telephone 33-13015-3737 Facsimile 33-13015-3747
GERMANY JEOL (GERMANY) GmbH Oskar-Von-Miller-Strasse 1 a 85386 Eching Gennany Telephone 49-8165-77346 Facsimile 49-8165-77512
GREAT BRITAIN amp IRELAND JEOL (UK) LTD JEOL House Silver Court Watchmeaci Welwyn Garden City Herts AL71LT UK Telephone 44-1707 -377117 FaCSimile 44-1707-373254
GREECE N ASTERIADIS SA
56-58S Trikoupl Str PO Box 26140 GR-10022 Athens Greece Telephone 30-1-823-5383 Facsimile 30-1-823-9567
HONG KONG FARMING LTD
Unit No1 009 1 OF Prosperity Milennia Plaza 663 Kings Road North Point Hong Kong Telephone 852-2815-7299 Facsimile 852-2581-4635
INDIA JEQL INDIA Pvt Ltd
Elegance Tower Level 2 2128 Old Mathura Road Jasola Business District Centre Near Apollo Hospital Jasola New Delhi 110025 India Telephone 91-11-6472-2578 Facsimile 91-11-4060-1235
BLUE STAR LTD (HQ Mumbaij
Analyticallnstrments Department Sahas 41412 Veer Savarkar Marg Prabhadery Mumbai 400 025 India Telephone 91-22-6666-4000 Facsimile 91-22-6666-4001
BLUE STAR LTD (DelhQ Analytical Instruments Department E-4412 Okhla Industrial Area Phase-II New Delhi 110 020 India Telephone 91-11-4149-4000 Facsimile 91-11-4149-4005
BLUE STAR LTD (Calcutta)
Analylicallnstruments Department 7 Hare Street Calcutta 700 001 India Telephone 91-33-2213-4133 Facsimile 91 -33-2213-4102
BLUE STAR LTD (ChennaO Analytical Instruments Department No 46 Garuda Building Cathedral Road Chennai 600 086 India Telephone 91-44-4244-4000 Facsimile 91-44-4244-4190
INDONESIA PT TEKNOLABindo Penta Perkasa Komplek Gading Bukillndah Blok lIll JI Bukfl Gading Raya Kelapa Gading Pennai Jakarta 14240 Indonesia Telephone 62-21-458470575859 Facsimile 62-21-45842729
ITALY JEOL 0TALIA) SpA Centro Direzionale Green Office Via dei Tulipani 1 20090 Pieve Emanuele (MI) Italy Telephone 39-02-9041431 Facsimila 39-02-90414343
KOREA JEOL KOREA LTD
Dongwoo Bldg 7F 1443 Yangjae Daero Gangdong-Gu Seoul 134-010 Korea Telephone 82-2-511-5501 Facsimile 82-2-511-2635
KUWAIT Ashraf amp CO Ltd WLL PO Box 3555 Safat 13036 Kuwait Telephone 965-1805151 Facsimile 965-24335373
MALAYSIA JEOL(MALAYSIA) SDNBHD(3S9011-M)
205 Block A Mezzanine Floor Kelana Business Center 97 Jalan SS 72 Kelana Jaya 47301 Petaling Jaya Selangor Malaysia Telephone 60-3-7492-7722 Facsimile 60-3-7492-7723
MEXICO JEOL DE MEXICO SA DE CV
Arkansas 11 Piso 2 Colonia Napoles Delegacion Benito Juarez CP 03810 Mexico DF Mexico Telephone 52-5-55-211-4511 Facsimile 52-5-55-211-0720
PAKISTAN (KarachI) ANALYTICAL MEASURING SYSTEM (pvn LTD(AMS LTD)
14-C Main Sehar Commercia) Avenue Lane 4 Khayaban-e-Sehar DHA-VII Karachimiddot75500 Pakinstan Telephone 92-21-353455813534074735346057-8 Facsimile 92-21-35345582
PANAMA PROMED SA Parque Industrial Costa del Este Urbanizacion Costa del Este Apartado 0816-01755 Panama Panama Telephone 507-303-3100 FaCSimile 507-303-3115
PHILIPPINES PHILAB INDUSTRIES INC
7487 Bagtikan Street SAY Makati 1203 Metro Manila Phillip pines Telephone 63-2-896-7218 Facsimile 63-2-897-7732
PORTUGAL Izasa Portugal Lda A do Proletariado 1 2790-138 CARNAXIDE Portugal Telephone 351-21-424-73-00 Facsimile 351-21-418-60-20
RUSSIA JEOL (RUS) LLC Krasnoproletarskaya Street 16 Bid 2 127473 Moscow Russian Federation Telephone 7-495-748-7791rr792 Facsimile 7-495-748-7793
SAUDI ARABIA ABDULREHMAN ALGOSAIBI GTC (Riyadh)
King Abdulaziz Avenue PO Box 215 Riyadh 11411 Saudi Arabia Telephone 966-1-479-3000 Facsimile 966-1-477-1374
SCANDINAVIA SWEDEN JEOL (Skandinaviska)AB
Hammarbacken 6A Box 716191 27 Sollentuna Sweden Telephone 46-8-28-2800 Facsimile 46-8-29-1647
SERVICE amp INFORMATION OFFICE NORWAY JEQL (Skandinaviska)AB
Lorenvangen 23 0580 Oslo NORWAY Telephone 47-2-2-64-7930 Facsimile 47-2-2-65-0619
FINLAND JEOL (Skandlnaviska)AB
Ylakaupinkuja 2 FIN-02360 Espoo Finland Telephone 358-9-8129-0350 Facsimile 358-9-8129-0351
SINGAPORE JEOLASIA PTE LTD
2 Corporation Road 1t01-12 Corporation Place Singapore 618494 Telephone 65-6565-9989 Facsimile 65-6565-7552
SOUTH AFRICA ADI Scientific (Pty) Ltd
370 Angus Crescent Northlands Business Park 29 Newmarket Road
~~=~g~~~2~~1nt~~2_~~~bIlC of South Africa
Facsimile 27-11 -462-1466
SPAIN IZASA SA
Argoneses 13 28100 Alcobendas (poligono IndustriaQ Madrid Spain Te~phone 34-91-663-0500 Facsimile 34-91-663-0545
SWITZERLAND JEOL (GERMANY) GmbH Oskar-Von-Miller Strasse 1 85386 Eching Germany Telephone 49-8165-77346 Facsimile 49-8165-77512
TAIWAN For EO ProQucts JIE DONG CO LTD 7F 112 Chung Hsiao East Road Section 1 Taipei Taiwan 10023 Republic of China Telephone 886-2-2395-2978 Facsimile 886-2~2322-4655
For Mass Spectrometer Products Mass Solutions Technology Co Ltd
5F No79 Sec 1 Xintai 5th Rd Xlzhi Dis New Taipei City 221 Taiwan Republic of China Telephone 886-2-2698-9511 Facsimile 886-2-2698-9512
For Semiconductor Products JEOL TAIWAN SEMICONDUCTORS LTD
11 F-l No 346 Pei-Da Road Hsin-Chu City 300 Taiwan Republic of China Telephone 886-3-523-8490 Facsimile 886-3-523-8503
THAILAND BECTHAI BANGKOK EQUIPMENT amp CHEMICAL CO Ltd
300 Phaholyothin Rd Phayathai Bangkok 10400 Thailand Telephone 66-2-615-2929 Facsimile 66-2-615-23502351
THE NETHERLANDS JEOL (EUROPE) Bv Ureweg 4 NL-2153 PH Nieuw-Vennep The Nelherlands Telephone 31-252-623500 Facsimile 31-252-623501
TURKEY TEKSERAS Kayisdagi )nonu MahKartal Cad No553 34755 Atasehir Istanbul Turkey Telephone 90-216-5736470 Facsimile 90-216-5736475
UAE MRS Group Dubai POBox 171612 Rashid Abdulla AI Noami Building Suite No 306 Damascus Street AI Qusais-3 Dubai UAE Telephone 971-4-2581141 Facsimile 971-4-2581151
JEOLGulf
POBox 171612 bull Rashid Abdulla AI Noami Building Suite No 306 Damascus Street AI Qusais-3 Dubai UAE Telephone 971-553964219(mobile)
USA JEOL USA INC 11 Dearborn Road Peabody MA 01960 USA Telephone 1-978-535-5900 Facsimile 1-978-536-22052206
JEOL USA INC WEST OFFICE
~~s~~~~~rigAe9~5t~~1 1 0 Telephone 1-925-737-1740 Facsimile 1-925-737-1749
VENEZUELA GOMSA Service and Supply CA
Urbanizacion Montalban JlI - Resldenclas Don Andres - Piso 7 - Apartomento 74 Avenida 3 entre calles 7 y 6 Montalban Caracas Venezuela Telephone 58-212-443-4342 Facsimile 58-212-443-4342
VTETNAM TECHNICAL MATERIALS AND RESOURCES IMPORT-EXPORT JOINT STOCK COMPANY(REXCO) Hanoi Branch
No 13-Lot 12 Trung Yen Trung Hoa Street Cau Giay Dist HanOi Vietnam Telephone 84-4-562-051617562-0535 Facsimile 84-4-853-2511
No 0205B389C Printed in Japan Kp
S~~MCEAII Certain products in this brochure are controlled under the Foreign 0J 0014007 -v- ~ Exchange and Foreign Trade Law of Japan in compliance with $ ~~~ international security export control JEOL Ltd must provide the~2 m) IIlt Japanese Government with End-users Statement of Assurancel A MGMT SYS
AvA ~ m and End-use Certificate in order to obtain the export license - tiJ needed for export from Japan If the product to be exported is in this category the end user will be asked to fill in these certificate formsdEOLIS09001 amp150 14001CenrfiCltlled
httpwwwjeolcomdEOL JEOL Ltd 1-2 Musashino 3-chome Akishima Tokyo 196-8558 Japan Sales Division Telephone+81-42-528-3381 Facsimile+81-42-528-3386
ARGENTINA COASIN SAClyF Virrey del Pino 4071 1430 Buenos Aires Argentina Telephone 54-11-4552-3185 Facsimile 54-11-4555-3321
AUSTRALIA amp NEW ZEALAND JEOL(AUSTRALASJA) PtyUd Suite 1 L2 18 Aquatic Drive - Frenchs Foresl NSW 2086 Australia Telephone 61-2-9451-3855 Facsimile 61-2-9451-3822
AUSTRIA JEOL (GERMANY) GmbH Oskar-Von-Miller-Strasse 1 a 85386 Eching Gennany Telephone 49-8165-77346 Facsimile 49-8165-77512
BANGLADESH AQ CHOWDHURY SCIENCE amp SYNERGY PVT LTD House No1 2 Road No 5A Sector No 11 Uttara Dhaka - 1230 Bangladesh Telephone 880-2-9980790 8953450 8953501 Facsimile 880-2-8854428
BELGIUM JEOL (EUROPE) BV Planet ll Gebouw B Leuvensesteenweg 542 B-1930 Zaventem Belgium Telephone 32-2-720-0560 Facsimile 32-2-720-6134
BRAZIL JEOL Brasillnstrument09 Cienlilicos Llda
Av Jabaquara 2958-50 andar-cj 52 04046-500 Sao Paulo SP Brazil Telephone 55-11-5070 4000 Facsimile 55-11-5070 4010
CANADA JEOL CANADA INC 3275 Premier Rue 8 SI-Hubert Quebec J3Y 8Y6 Canada Telephone 1-450-676-8776 Facsimile 1-450-676-6694
CHILE ARQUIMED INNOVAnON
Arturo Pmt 828Santiago Chile Telephone 56-2-634-6266 Facsimile 56-2-634-4633
CHINA JEOL(BEIJING) CO LTD Room Bl0l0l110 Wantong New Wond Plaza No2 Fuchengmenwai Street XIcheng District Beijing 100037 PRChina Telephone 86-10-6804-6321 Facsimile 86-10-6804-6324
JEOL (BEIJING) CO LTD SHANGHAI BRANCH
Room 15051506 Nol300Xi Kang Road Jing an Dis Shanghai 200040 China Telephone 86-21-6248-4868448745374404 Facsimile 86-21-6248-4075
JEOL (BEIJING) CO LTD GUANG ZHOU BRANCH
N1601 World Trade Center Building 371-375 Huan Shi Road East Guang Zhou Guangdong Prov 510095 PRChina Telephone 86-20-8778-7848 Facsimile 86-20-8778-4268
JEOL (BEIJING) CO LTD WUHAN BRANCH
Room A2117 Zhongshang Plaza Office Bldg NO7 Zhongnan Road Wuhan Hubei 430071 PRChina Telephone 86-27-8713-2567 Facsimile 86-27-8713-2567
JEOL LTD (BEIJING) CO LTD CHENGDU BRANCH 1807A Zonglu Building NO 35 Zhongfu Road Chengdu Sichuan 610016 PR China Telephone 86-28-86622554 Facsimile 86-28-86622564
EGYPT JEOL SERIVCE BUREAU
3rd Fl Nile Center Bldg Nawal Slree Dokkl (Cairo) Egypt Telephone 20-2-3335-7220 Facsimile 20-2-3338-4186
FRANCE JEOL (EUROPE) SAS Espace Claude Monet 1 Allee de Giverny 78290 Crolssy-sur-Seine France Telephone 33-13015-3737 Facsimile 33-13015-3747
GERMANY JEOL (GERMANY) GmbH Oskar-Von-Miller-Strasse 1 a 85386 Eching Gennany Telephone 49-8165-77346 Facsimile 49-8165-77512
GREAT BRITAIN amp IRELAND JEOL (UK) LTD JEOL House Silver Court Watchmeaci Welwyn Garden City Herts AL71LT UK Telephone 44-1707 -377117 FaCSimile 44-1707-373254
GREECE N ASTERIADIS SA
56-58S Trikoupl Str PO Box 26140 GR-10022 Athens Greece Telephone 30-1-823-5383 Facsimile 30-1-823-9567
HONG KONG FARMING LTD
Unit No1 009 1 OF Prosperity Milennia Plaza 663 Kings Road North Point Hong Kong Telephone 852-2815-7299 Facsimile 852-2581-4635
INDIA JEQL INDIA Pvt Ltd
Elegance Tower Level 2 2128 Old Mathura Road Jasola Business District Centre Near Apollo Hospital Jasola New Delhi 110025 India Telephone 91-11-6472-2578 Facsimile 91-11-4060-1235
BLUE STAR LTD (HQ Mumbaij
Analyticallnstrments Department Sahas 41412 Veer Savarkar Marg Prabhadery Mumbai 400 025 India Telephone 91-22-6666-4000 Facsimile 91-22-6666-4001
BLUE STAR LTD (DelhQ Analytical Instruments Department E-4412 Okhla Industrial Area Phase-II New Delhi 110 020 India Telephone 91-11-4149-4000 Facsimile 91-11-4149-4005
BLUE STAR LTD (Calcutta)
Analylicallnstruments Department 7 Hare Street Calcutta 700 001 India Telephone 91-33-2213-4133 Facsimile 91 -33-2213-4102
BLUE STAR LTD (ChennaO Analytical Instruments Department No 46 Garuda Building Cathedral Road Chennai 600 086 India Telephone 91-44-4244-4000 Facsimile 91-44-4244-4190
INDONESIA PT TEKNOLABindo Penta Perkasa Komplek Gading Bukillndah Blok lIll JI Bukfl Gading Raya Kelapa Gading Pennai Jakarta 14240 Indonesia Telephone 62-21-458470575859 Facsimile 62-21-45842729
ITALY JEOL 0TALIA) SpA Centro Direzionale Green Office Via dei Tulipani 1 20090 Pieve Emanuele (MI) Italy Telephone 39-02-9041431 Facsimila 39-02-90414343
KOREA JEOL KOREA LTD
Dongwoo Bldg 7F 1443 Yangjae Daero Gangdong-Gu Seoul 134-010 Korea Telephone 82-2-511-5501 Facsimile 82-2-511-2635
KUWAIT Ashraf amp CO Ltd WLL PO Box 3555 Safat 13036 Kuwait Telephone 965-1805151 Facsimile 965-24335373
MALAYSIA JEOL(MALAYSIA) SDNBHD(3S9011-M)
205 Block A Mezzanine Floor Kelana Business Center 97 Jalan SS 72 Kelana Jaya 47301 Petaling Jaya Selangor Malaysia Telephone 60-3-7492-7722 Facsimile 60-3-7492-7723
MEXICO JEOL DE MEXICO SA DE CV
Arkansas 11 Piso 2 Colonia Napoles Delegacion Benito Juarez CP 03810 Mexico DF Mexico Telephone 52-5-55-211-4511 Facsimile 52-5-55-211-0720
PAKISTAN (KarachI) ANALYTICAL MEASURING SYSTEM (pvn LTD(AMS LTD)
14-C Main Sehar Commercia) Avenue Lane 4 Khayaban-e-Sehar DHA-VII Karachimiddot75500 Pakinstan Telephone 92-21-353455813534074735346057-8 Facsimile 92-21-35345582
PANAMA PROMED SA Parque Industrial Costa del Este Urbanizacion Costa del Este Apartado 0816-01755 Panama Panama Telephone 507-303-3100 FaCSimile 507-303-3115
PHILIPPINES PHILAB INDUSTRIES INC
7487 Bagtikan Street SAY Makati 1203 Metro Manila Phillip pines Telephone 63-2-896-7218 Facsimile 63-2-897-7732
PORTUGAL Izasa Portugal Lda A do Proletariado 1 2790-138 CARNAXIDE Portugal Telephone 351-21-424-73-00 Facsimile 351-21-418-60-20
RUSSIA JEOL (RUS) LLC Krasnoproletarskaya Street 16 Bid 2 127473 Moscow Russian Federation Telephone 7-495-748-7791rr792 Facsimile 7-495-748-7793
SAUDI ARABIA ABDULREHMAN ALGOSAIBI GTC (Riyadh)
King Abdulaziz Avenue PO Box 215 Riyadh 11411 Saudi Arabia Telephone 966-1-479-3000 Facsimile 966-1-477-1374
SCANDINAVIA SWEDEN JEOL (Skandinaviska)AB
Hammarbacken 6A Box 716191 27 Sollentuna Sweden Telephone 46-8-28-2800 Facsimile 46-8-29-1647
SERVICE amp INFORMATION OFFICE NORWAY JEQL (Skandinaviska)AB
Lorenvangen 23 0580 Oslo NORWAY Telephone 47-2-2-64-7930 Facsimile 47-2-2-65-0619
FINLAND JEOL (Skandlnaviska)AB
Ylakaupinkuja 2 FIN-02360 Espoo Finland Telephone 358-9-8129-0350 Facsimile 358-9-8129-0351
SINGAPORE JEOLASIA PTE LTD
2 Corporation Road 1t01-12 Corporation Place Singapore 618494 Telephone 65-6565-9989 Facsimile 65-6565-7552
SOUTH AFRICA ADI Scientific (Pty) Ltd
370 Angus Crescent Northlands Business Park 29 Newmarket Road
~~=~g~~~2~~1nt~~2_~~~bIlC of South Africa
Facsimile 27-11 -462-1466
SPAIN IZASA SA
Argoneses 13 28100 Alcobendas (poligono IndustriaQ Madrid Spain Te~phone 34-91-663-0500 Facsimile 34-91-663-0545
SWITZERLAND JEOL (GERMANY) GmbH Oskar-Von-Miller Strasse 1 85386 Eching Germany Telephone 49-8165-77346 Facsimile 49-8165-77512
TAIWAN For EO ProQucts JIE DONG CO LTD 7F 112 Chung Hsiao East Road Section 1 Taipei Taiwan 10023 Republic of China Telephone 886-2-2395-2978 Facsimile 886-2~2322-4655
For Mass Spectrometer Products Mass Solutions Technology Co Ltd
5F No79 Sec 1 Xintai 5th Rd Xlzhi Dis New Taipei City 221 Taiwan Republic of China Telephone 886-2-2698-9511 Facsimile 886-2-2698-9512
For Semiconductor Products JEOL TAIWAN SEMICONDUCTORS LTD
11 F-l No 346 Pei-Da Road Hsin-Chu City 300 Taiwan Republic of China Telephone 886-3-523-8490 Facsimile 886-3-523-8503
THAILAND BECTHAI BANGKOK EQUIPMENT amp CHEMICAL CO Ltd
300 Phaholyothin Rd Phayathai Bangkok 10400 Thailand Telephone 66-2-615-2929 Facsimile 66-2-615-23502351
THE NETHERLANDS JEOL (EUROPE) Bv Ureweg 4 NL-2153 PH Nieuw-Vennep The Nelherlands Telephone 31-252-623500 Facsimile 31-252-623501
TURKEY TEKSERAS Kayisdagi )nonu MahKartal Cad No553 34755 Atasehir Istanbul Turkey Telephone 90-216-5736470 Facsimile 90-216-5736475
UAE MRS Group Dubai POBox 171612 Rashid Abdulla AI Noami Building Suite No 306 Damascus Street AI Qusais-3 Dubai UAE Telephone 971-4-2581141 Facsimile 971-4-2581151
JEOLGulf
POBox 171612 bull Rashid Abdulla AI Noami Building Suite No 306 Damascus Street AI Qusais-3 Dubai UAE Telephone 971-553964219(mobile)
USA JEOL USA INC 11 Dearborn Road Peabody MA 01960 USA Telephone 1-978-535-5900 Facsimile 1-978-536-22052206
JEOL USA INC WEST OFFICE
~~s~~~~~rigAe9~5t~~1 1 0 Telephone 1-925-737-1740 Facsimile 1-925-737-1749
VENEZUELA GOMSA Service and Supply CA
Urbanizacion Montalban JlI - Resldenclas Don Andres - Piso 7 - Apartomento 74 Avenida 3 entre calles 7 y 6 Montalban Caracas Venezuela Telephone 58-212-443-4342 Facsimile 58-212-443-4342
VTETNAM TECHNICAL MATERIALS AND RESOURCES IMPORT-EXPORT JOINT STOCK COMPANY(REXCO) Hanoi Branch
No 13-Lot 12 Trung Yen Trung Hoa Street Cau Giay Dist HanOi Vietnam Telephone 84-4-562-051617562-0535 Facsimile 84-4-853-2511
No 0205B389C Printed in Japan Kp