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Page 1: Introduction - Главное управление науки БГУresearch.bsu.by/wp-content/uploads/2015/06/JEOL_Product...Scanning Electron Microscope The JSM-6610 is a high-performance

Introduction

Thank you for your interest in JEOL products and services

JEOL designs and manufactures scientific instruments for high-level research and

development activities Our customers include scientists and engineers working in

leading-edge academic and industrial laboratories around the world JEOL

products and services enable them to pursue a variety of RampD applications that

require high resolution imaging and analytical capabilities such as basic observashy

tion and analysis environmental science information technology semiconductor

production biotechnology nanotechnology and a broad range of industrial

endeavors

Experts involved in the studies of medicine biology biochemistry agriculture

materials science metallurgy ceramics chemistry petroleum pharmacy semiconshy

ductors and electronic materials have been using JEOL products for 60 years Our

new products are easier-to-use than ever before and contribute to a high level of

quality assurance and quality control during the production process

This Product Guide presents the most current high performance solutions from JEOL

to meet your RampD requirements for electron optics analytical semiconductor indusshy

trial and medical instruments and equipment For more details or information

about any of our products please contact your nearest JEOL office

JEOL Ltd

oSome instrument photographs include optional attachments

oSpecificotions subject to chonge without notice

oThis catolog includes products not affered to some territories

oWindows is a registered trademark of Microsoft Corp in the US and other countries Macintosh is trademark of Apple Computer Inc registered in the US and other countries UNIX is a registered trademark of XOpen Corp of the USA NetWore is a registered trademark of Novell Inc in the US and other countries NetWare Lite is a trademark of Novell Inc in the US and other countries Pentium is a registered trademark of Intel Corp of the USA

oOther trademarks referenced in this catalog and marked with are the property of our allied companies

02 I Produc t G uide

Product Guide

Name JEOL Ltd [I-JIHON DEI-JSHI KABUSHIKI KAISHA)

President Gon-emon Kurihara

Establishment May 301949

Capital 6740 million yen

Employees Consolidated 2709

Electron Microscopes Transmission Electron Microscopes (TEM] middotmiddotmiddotmiddot middot middotmiddot middot middotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddot middot middotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddot4

Energy Filter Electron Microscopes

Scanning Electron Microscopes Scanning Electron Microscopes (SEM] 6

Analytical Scanning Electron Microscopes

Focused Ion Beam System

Cross Section Polisher

Ion Slicer

Photoelectron Spectrometers (XPS)

Auger Microprobes

X-ray Fluorescence Spectrometers Energy-Dispersive X-roy Fluorescence Spectrometersmiddot middotmiddotmiddotmiddot12

Electron Beam Lithogrophy Systems (a spot beam lithogrophy system]

Gas Chromatograph Mass Spectrometer

Liquid Chromatograph Mass Spectrometers

Application Equipment High-Power Electron Beam Source

Built-in Plasma Source

Clinical Chemistry Analyzers Clinical Chemistry Analyzers middotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddot19

Ion Beam Application Equipment MultiBeam System 8

Peripherol Equipment bull bullbull bullbull bull bullbull 10

Surface Analysis Instruments Electron Probe Microanolyzers 11

Semiconductor Equipment Electron Beam Lithogrophy Systems (0 varioble-shoped electron beom) 13

NMR Spectrometers NMR Spectrometersmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddot middot middotmiddotmiddotmiddotmiddotmiddotmiddot 14

Mass Spectrometers Time-oF-Flight Moss Spectrometers (TOFMS) 16

ESR Spectrometers ESR Spectrometersmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddot 17

Electron Beam and plasma Electran Beam Evaparation Source 18

Producl Guide I 03

Electron Microscopes

IJEM- RM1300 Ultra High Voltage Electron Microscope

Using a high voltage electron beam giving

high transmission this microscope permits

the direct observation of the 3-D structure

of thick specimens Ihe direct observation

of beam damage and the observation of

sensitive biological specimens with little

damage It features great operational ease

and st ab il it y The JEM-ARM 1300 is

essential for atomic level structural imaging

and 3-D observations

p 010 nm (with top entry slage)

012 nm (with side entry stage)

400 to 1300 kV

x200 to 1500000

I JEM-3200FS Fi eld Emission Electron Microscope (Equipped with In -Column En ergy Filter)

A field emission electron microscope that

gives full play to not only high-resolution

imag ing but also nanoarea analys is

Equi pp ed with a 300 kV FEG and an

in-column energy filter Incorporation of a

new rotation-free image-forming optical

system facilitates acquisition of TEM images

and diffraction patterns as well as provides

stable spectra The combination of the 300

kV FEG and the energy filter oHers new

many solutions for a wide range of research

fields

~ _ n Q17nm

Ai - ~III J VCl Max 300 kV gtL(Jrll lallic I X 100 to 1500000

I JEM-2200FS Field Emission El ectron Microscope (Equ ipped with In -Column Energy Filter)

A field emission electron microscope

equipped with a 200 kV field emission gun

and a new in-column energy filter which is

optimally configured for analytical functions

such as element analysis analysis and stage

analysis The use of a new rotation-free

image-forming optical system makes it easy

to compare TEM images and diffract ion

patterns Since the microscope allows

observation of wide- field energy- filtered

images combination with the op tional

tomography function enables acquisi tion of

three-dimensional information with a wide

field and a high contrast

-3 OOF Fi eld Emission Electron Microscope

Modern electron microscopes can integrate

various imaging devices and analyzers for

nano-area analysis of morphology structures

and chem ical states This advantage is

drawi ng increasing expectation s from

researchers The JEM-31 OOF achieves highshy

reso lution im ag ing and nano-probe

formation Also the JEM-3100F has usershy

hiendly operation tools for smooth operation

of the TEM with various devices and a new

control system for system expandability This

advanced analytical TEM allows highshy

accuracy eHicient acquisition of valuable

infonmation from nano-materials

017 nm

R 100200300 kV

X60 to 1500000

I JEM-ARM200F Atomic Reso lution Analytical Electron Microscope

The JEM-ARM200F incorporating a STEM

Cs COrTector and a microscope column with

dramatically improved mechanical and

electrical stability achieves the worlds

highest STEM (HAADF) reso lution of 008

nm as a commerci a l TEM Th e

Cs-co rrected extremely small elec tron

probe achieves a remarkably increased

current density one order magnitude larger

than conventional TEMs Thus the JEMshy

ARM200F provides ultimate atomic -level

analysis and also higher throughput with

dramatically shortened measurement time

Pc t I 008 nm (STEM)

0 19 nm (rEM)

011 nm (With TEM Cs corrector)

I VCi JG 80 kV 200 kV

x50 to 2 000000

JE -2100F Fie ld Emission Electron Microscope

The field emission electron gun (FEG) which

provides an elec tron beam w ith high

brightness and high coherence is essential

for high-resolution observation and nano

area analysis The JEM-2100F featuring

advanced digital operation is an integrated

TEM th at g ives full play to its various

functions

P lr 11 1 O 19nm ~cC68Tltllfn m tage 160 kV 200 kV

v1a tCBt I x50 to 1500000

04 I Produ CI Guide

I

11 L bull bull 1 ~

EM-~800 Multi-Purpose Analytical Electron Microscope

The JEM-2800 is a new TEM that achieves

nano-area analysis through Automation and

Convenience while being Easy- to-use so

that expert results can be achieved by

operators of any skill level Its advanced

electron optical system makes IT possible to

periorm high-resolution TEM and STEM

imaging EDS EELS tomography and

in-situ observation on the same sample

wilhout sacrificing any of Ihese capabil ities

02 nm (STEM) 01 nm (rEM)

1 100 kV 200 kV x 100 to 200000000

EM 2100 Electron Microscope

-r__bull

I JED-2300T

The JEM-2100 is a new-generation 200 kV

analytical electron microscope The JEMshy

2100 which incorporates an integrated PC

system for various functions WITh excellenl

cost performance supports research and

development in wide scienlific fields ranging

from biotechnology to materials science

Pont liJtI 019 nm ~=I nlng vrl qe 80 10 200 kV

Ilagnl 11 X50 to 1500000

JEM-1400Plus Electron Microscope

The JEM-1400Plus is a versatile

transmission electron microscope (rEM) for

a wide range of applications including

biology polymers nano technology and

advanced materials

The JEM-1400Plus uses a single camera for

imaging for view area seach (x10) to data

aquisition

New operation panels with the organic EL

buttons give you simple and intut ive

operation

p~ f -11)(1 02 nm

r- u 40 10120 kV x l0tol2ooOOO

Energy Dispersive X-ray Spectrometer

The JED-2300T installed on a TEM can

easily perform qualitativequantitative

analysis and linea rea analysis of

microareas WITh high energy resolution This bull EDS employs a JEOLs unique ultra-thin

window detector with gate valve protection

mechanism making it possible to obtain

high-sensitivity analysis data particularly

from light elements

Ivl I (d _ -II(I~

QualitativequantITative analysiS linearea analysis AI Iflltgtie elements Be to U B to U or Na to U

Prod uc l G u ide I 05

- -

I I lilllll

II 1111 111111 11111111

~ - - shy

- -- ~-

- shy

Scanning Electron Microscopes

JSM 7800F Field Emission Scanning Electron Microscope

I JSM-7600F Field Emission Scanning Electron Microscope

The JSM-7600F is a state-of-the-art thermal

FE-SEM th at successfu ll y combines

ultrahigh-resolution imaging with optimized

analytical functionality such as high-speed

high-accuracy analyses

10 nm (15 kV) 15 nm (1 kV) 01 to 30 kV

x 25 to 1000000

JSM-7 OOF Field Emi ss ion Scanning Electron Microscope

l 8

I II

The JSM-7800F equipped with a newly developed super hybrid objective lens is a

cutting-edge thermal FE-SEM that successfully combines ultrahigh-resolution

imaging with fast and high-accuracy elemental analysis Magnetic specimens can

be observed and analyzed at high magnification The JSM-7800F also enables

researchers various analyses such as EDS WDS EBSD and CL

bull08 nm (15 kV) 12 nm (1 kV)

001 to 30 kV

x25 to 1000000

JSM 7500F Field Emission Scanning Electron Microscope

The JSM-7500F developed for

nanostructure characterization is equipped

with the Gentle Beam function which

enables researchers observation atI(~ x 100000 magnification even with 100 V low electron energy ~ ~tn~ ~=--

- - - 10 nm (15 kV) 14nm (1 kV)Jllshyf -diy Ollaqb 0 1 to 30 kVoG -- ~ Wll X25 to 1000000- rr

-

The JSM-7100F is a versatile high performance analytical FE SEM The electron

optics produces the maximum 200 nA probe current with the patented in-lens

thermal FEG and a small probe diameter even at large probe currents with the

patented aperture angle optimizing lens

The objective lens is the field free type This lens is suitable for high precision EBSD

analysis and characterization of a magnetic specimen

The vacuum system employing a TMP combined and a specimen exchange airlock

chamber A life of emitter is prolonged by the high quality vacuum in the gun

chamber

gt= - 12nm (30 kV) 30nm (1 kV) 02 to 30 kV

x 10 to 1000000

06 I Producl Guide

---------

I )SM-66 0 Scanning Electron Microscope

The JSM-6610 is a high-performance SEM

that is equipped with a superb electron

optical system and a general-purpose largeshy

specimen chamber to accommodate a

specimen up to 200 mm diameter The _JSM-6610 incorporates newly designed

__

_- ~I software for easier SEM operations in a

variety of applications

I J5M-ALA series Analytical Scanning Electron Microscopes

The JED-2300 EDS developed by JEOL is

embedded in the compact SEMs The

footprint is same as that of the basic SEM

The SEM and EDS are operated as one

seamless system to provide comfortable

and efficient operation A SDD type EDS

detector does not require liquid nitrogen

EDS analysis is ready whenever you need it

Resolution HV 30 nm

LV 40nm 40nm

Magnification

Accelerating voltage 05 shy 30 kV

x5 shy 300000

03 shy 30 kV

I JASM-6200 C airScor etrade Atmospheric Scanning Electron Microscope

I SM-6510 Scanning Electron Microscope

The JSM-6510 is a high-performance SEM

that is equipped with a superb electron

optical system same as the JSM-6610 and

a general-purpose specimen chamber to

accommodate a specimen up to 150 mm

diameter The JSM-651 0 incorporates

newly designed software for easier SEM

operations in a variety of applications

II 1 30 nm ltr-- rr TJ 01 qamp 05 to 30 kV M~1fIIC3IKlr x5 to 300000

J5 -LV series Low Vacuum SEMs

The low vacuum SEM consists of a

conventional high vacuum mode and a low

vacuum (LV) mode One can select the

vacuum mode with a click on the menu

The LV mode enables one to observe and

analyze non-conductive specimens The

specimen chamber is kept at low vacuum

so that highly out-gassing specimens can

be easily observed

1-lhlIt

Resolution HV 30 nm

LV 40 nm

Low vacuum range 10-270 Pa

The JASM-6200 allows high-resolution light microscopeSEM observation at

atmospheric pressure A specimen is held at normal atmospheric pressure Dynamic

observation of physical or chemical reactions can be made in liquid or gas In addition

for biological applications difficult dehydration and drying processes are not needed

dramatically reducing specimen pre-treatment time

Bnm Imiddot 102030 kV

II

Product Guide I 07

JSM-60l0 AILV InTouchScope

)shy -

JSM-6010LA

I JCM 6000 NeoScopeTM

The InTouchScope incorporates a highly intuitive SEM interface with multi-touch

technology The user can expand application windows and orchestrate aJl functions

just by touching the screen

40 nm (20 kV) 50 nm (20 kV)

05 1020 kV x810 300000

JCM-6000 NeoScopen~ let you observe a specimen at much higher magnification

than a light microscope with the same simple operation of a light microscope The

observation image appears automatically when a specimen is inserted and you can

go up to the maximum magnification of x60OOO quickly with the automated

operations

JCM-6000 NeoScopem is equipped with a TMP for quick start

The installation is easy The wall outlet (100V AC) is the only utility needed Cooling

water is not necessary

FX X10 10 60000

SI - Max 70mm dia

Ion Beam Application Equipment

pIB-09010 Cross Section Polisher (CP)

The IB-090 10CP Cross Section Polisher

makes a cross sect ion by irradiating a

spec imen with argon ion beam along an

edge of a shield plate placed on a

specimen This is an innovative specimen

preparation device for specimens studied in

SEM and EPMA

IIB-09020C Cross Section Polisher (C PIT)

The IB-09020CP Cross Section Polisher

(CPIT) creates a cross section in a manner

similar to the IB-09010CP Its built-in CCO

camera al lows real-time monitoring of a

cross-section during polishing

08 I Product Guide

I J18-4601 MuIti Beam System

I J -4501 MultiBeam System

EM-091001S Ion Slicer

The JIB-4501 MultiBeam System achieves

surfaceinternal 3D imaging and analysis

with simple operation This system also

has optimum geometry for all functions

from FIB SEM observation to EDSEBSD

analyses

R~ Iul N 5 nm (FIB) 25 nm (SEM) A I tlrx] I J 03 kV to 30 kV

(5 kV steps) Magl1lhcnli X30 10 300000

(observation milling)

The Ion Slicer can easily prepare thin-film

specimens for TEM without special skill Prior

treatment required for the Ion Slicer is only to

mechanically polish a specimen to 01 mm

thick The optimally set Ar ion beam provides

high-quality thin films In addition this

innovative tool suppresses specimen damage

and contamination such as lattice distortion

induced by mechanical polishing and

oxidation on specimen suriaces by chemical

treatment The Ion Slicer is an echo-friendly

efficient specimen-preparation tool

The JIB-4601 F MultiBeam System unites the unique imaging and analytical capabilities

of the High Power Optics employed in the TFE SEM and a high-performance FIB

column in a highly efficient and powerful system The JIB-4601 F offers an easy-to-use

tool for highly automated sample preparation combined with high-resolution imaging

and sub-micron analysis of the specimen cross-section

5 nm (FIB) 12 nm (SEM) 02 kV to 30 kV (5 kV sleps)

x30 to 1000000 (observation milling)

I J18-4000 Focused Ion Beam System

Top of the line high-throughput

processing

Compact size for flexible layout shy

Installation space reduced by 20

(compared to JEOL conventional

models)

Superb performance at low accelerating

voltage

Stage Navigation System for fast

determination of observation position

R-_ lit I f1 5 nm ICIIH~ltn lJIO ltJi 1 to 30 kV

M~Q I I x60 (for searching field) X200 to 300000

IIB09060CIS Cryo Ion Slicer

The IB-09060CIS Cryo Ion Slicer

incorporates a specimen cooling

mechanism in the EM-091001S Ion Slicer

for easy preparation of thin filmscross bull I J sections even for specimens susceptible

to thermal damage

J

~

Producl Guide I 09

- ---- shy

_bullbull- _ bullbull 1

- - -~

[Peripheral Equipment ]

IJIC 410 HDT400 JEE-420 series Ion Cleaner Hydrophilic Treatment Device Vacuum Evaporators

The JIC-41 0 Ion Cleaner removes hydrocarbon

contamination on TEM specimens by exposing

specimens in glow discharge

The treated specimens do not build up contamination

during observation in a TEM

JEC560 Auto Carbon Coater

The HDT-400 applies hydrophilic treatment on TEM

grids and SEM specimen mounting blocks The entire

operation is automated

IJFC-1600 Auto Fine Coater

O ~ - --=shy

The JEE-420 vacuum evaporator applies coating on

SEM or TEM specimens with a variety of materials

including gold platinum carbon chromium The JEEshy

420 applies shadowing on TEM specimens

- - C- Ooshy o --nu _ __ a 0 0 0 0

The JEC-560 rapidly applies carbon coating on non-conductive specimens for The JFC series sputter coater applies metal coating on SEM specimens quickly Gold

element analysis with a scanning electron microscope or an electron probe micro gold-palladium and platinum can be applied

analyzers

JED23002300F Energy Dispersive X-ray Spectrometers

Dry SO Detector

The JED-23002300F is installed on a SEM or an EPMA and performs elemental This unique box type Dry SD detector is designed for JSM-651 0 and JSM-601 0 series

analysis on micro areas The Dry SD detector an SDD type detector is cooled SEM The detector is positioned at the optimum position

electrically It does not need liquid nitrogen cooling so that maintenance is not

required Analysis Station the unique EDS analysis software is versatile with simple

operation

All y A~Ilrn System that links observed images with analysis data

inlIytl(oIIUI1Chi1$ Qualitativequantitative analysis linearea analysis

10 I Producl Guide

------

f

Instruments for Microarea and Surface Analysis

IjXA-8530F Field Emission Electron Probe Microanalyzer

The JXA-8530F features an improved hardware that is used in the JXA-8500F (the first

FE-EPMA in the world) as well as newly designed user-friendly PC-GUI windows for

efficient analysis and data operation The FE gun of the JXA-8530F provides not only a

spatial (analysis) resolution of the order of 01 IJm but also high-sensitivity X-ray

detection at low accelerating voltages and large probe currents

IjPS-9200 Photoelectron Spectrometer (XPS)

The JPS-9200 is an XPS that provides microarea analysis A newly developed microshy

tens enables high-sensitivity analysis from macro to microareas Its stage accepts both

standard-size samples (10X 10X2 mm) and large samples (up to gO mm in diameter)

The stage-scan mapping method allows the acquisition of photoelectron images

ranging from low magnification (50 x 18 mm) to high magnification (spatial resolution

30lJm)

I jAMP-9500F Field Emission Auger Microprobe

fl

X 8230 Electron Probe Microanalyzer

D

~) ~ j ) ~ =~=

The JXA-8230 is a newly developed EPMA which succeeds a proven JEOL EPMA

hardware and features newly designed user-friendly PC-GUI windows for efficient

analysis and data operation Sophisticated analysis menus are designed so that the

user can easily access target material analyses offering stress-free operations

I jPS-901 0 series Photoelectron Spectrometers (XPS)

XPS with high-sensitivity and high-resolution is compactly designed on the basis of

JEOLs many years of basic and application technologies on electrostatic lenses

analyzers etc The low-acceleration and large-current ion guns dedicated to permit

XPS analysis of thin films with different thicknesses from surface atomic layers to

micron order thick specimen layers The specimen chamber and etching chamber are

separated from each other in terms of vacuum thus completely preventing the

contamination due to sputtering and facilitating the maintenance of ultrahigh vacuum

A field-emission Auger Microprobe featuring the worlds highest spatial resolution with

the minimum probe diameter of 3 nm (for secondary-electron image) and 8 nm (for

Auger analysis) The new hemispherical electrostatic energy analyzer (HSA) with a

multi-channel detector optimized for Auger analysis is suitable for chemical-state

analysis The neutralizing ion gun allows Auger analysis of insulating materials Its

specimen stage accommodates a large sample of up to 95 mm in diameter Also it is

expandabfe for an UHV-SEM

ProduCI Guide I 11

X-ray Fluorescence Spectrometers

I ISX 400Rll Element Analyzer

An energy-dispersive X-ray fluorescence spectrometer for environmental analysis

which helps you comply with environmental regulations for hazardous substances

such as the RoHS and ELV directives in the EU and soil pollution in Japan You can

easily analyze minute traces of Cd Pb Hg Cr etc This analyzer is also suitable for

general analySiS including element analysis and thickness measurement using the FP

(fundamental parameter) method

I JSX-31 OORll Element Analyzer

An energy-dispersive X-ray fiuorescence spectrometer for environlnlntal analysis which helps you

comply with environmental regulations for hazardous substances such as the RoHS and ELV

directives in the EU and soil pollution in Japan This analyzer inoorporates a JEOL-made electrically

cooled Si(u] detector making liquid nrtrogen unnecessary as well as providing high sensitivity for

heavy-element analysis such as Cd Pb and Hg This analyzer is also surtable for general analysis

including eement analysis and thickness measurement using the FP (fundamental parameter)

method

12 I Product Guide

Semiconductor Eq Ipm nt

2 Electron Beam Lithography System

-5

Electron Beam Lithography System

r

Electron Beam Lithography System

-~=-~--I--~ I

~ ~ ~-

Th e JBX-3200MV is an e lec lro n bea m lithography system developed for the production of next generation ultrahigh-precision masks and reticles This system employs a variableshyshaped electron beam o f 50kV and a step amp repeat specimen stage

High thro ug hp ut enabled by a new PEG (Proximity Effect Correction) system High-speed da la- transfer sys tem for a large quanti ty data High-precision design for masklrelicle production

Th e JBX-9 500FS is a spot beam

lithography system developed to meet a

wi de range of applications with high

throughput and high precision periormance

This sys tem covers fields from the nanoshy

technology research to the production of

leading edge devices

f 100kV _ ZrONV Schotlky emitter

maximum 300 mm wafer

Th e JBX-6300 FS is a s p o t b ea m

lithography system developed to meet a

w ide range o f applica tions with high

resolution and high precision periormance

This system covers fields from the nanoshy

technology research to the development of

next generation devices

25 kVl50 kVl1 00 kV ZrONV Schottky emittelt

maximum 200 mm wafelt

Prod ucl Gu ide I 13

-

---------

-_ -~

- --= - - - =-shy -

NMR Spectrometers

I JNM-ECAECX series FT NMR System

920 MHz magnet Photo courtesy Nationallnstrtute of Natural Sciences Institute for

Molecular Science

The JNM-ECA920 FT NMR System is a 920 MHz high-resolution NMR

spectrometer developed by JEOL This spectrometer uses the superconducting

magnet co-developed by National Institute for Materials Science and Kobe Steel

Ltd which generates the high magnetic field Created by combining Japans stateshy

of-the-art technologies this FT NMR System marks an important milestone in next

generation biology and nanotechnology which call for high-magnetic-field highshy

resclution NMR analysis

JEOL RESONANCE Inc

~ ~ ~

~t~-

~ 100

HNCACB spectrum of 13C(15N labeled Solid 23Na-MQMAS spectrum of ubiqurtin N3)P207

The JNM-ECNECX series are versatile high-performance FT NMR spectrometer

system that utilize the latest digital and high-frequency technology The ECA

spectrometer is applicable up to 1GHz and can be used for a wide range of

applications including liquidsolid NMR protein analysis and diffusion coefficient

measurement

INM-EC cd

JOO ~QO 0(1 ~uo 1)0

Spectrometer I Oscillator receiver power amplifier

Magnet IISCM Field strength 705T I 939T 11 74T 1401T 1643T

Bore diameter (mm) 54 I 54 54 54 54

Probe 5 mm Ttl tunable

11110

188T

54

JEOL RESONANCE Inc

INMmiddot fO rie ---shy

)Ol~ ~1111 011 Oll

Spectrometer Oscillator receiver power amplifier

Magnet I ISCM Field strength 705T 939T I 1174T 1401T

Bore diameter (mm) I 54 54 54 54

Probe I 5 mm TH tunable

JEOL RESONANCE Inc

14 I Produc t Guide

bull bull bull

IJNM-ECS 00 FT NMR System

bull I ASC Series

Auto Sample Changer

ASC8 (8 samples) ASC24 (24 samples)

middotmiddot iT ~ --shy

~ I -~Au

ASC16 (16 samples) ASC64 (64 samples)

bullIJNM-ECAECX series Solid NMR

=- ~

I

l l

bull

0 5ilJl

0

MAS conlroller Solid NMR sampling kit

NMR Systems For Modern NMR Spectroscopy The JNM-ECS400 i s a compact two-channel

spectrometer that retains the advanced capabilities of the

JNM-ECAlECX series (required installation space is oneshy

half compared to conventional NMRs) Programmable

timing sequencers built into each RF and PFG channel

can independently control either synchronous or

asynchronous operations of each channel Its standard

tunable broadband gradient probe which integrates all

JEOLs newest technologies is the high sesitivity roomshy

tempperature probe

Ccmpact spectrometer chassis Innovaten in JEOL NMR digrtal architecture High-stability and high-accuracy digital spectrometer High-sensrtivity new tunable probe Full automalk NMR with advanced software

JEOL RESONANCE Inc

An automatic sample changer makes it

possible to measure many samples

sequentially by exchanging multiple samples

automatically one by one Five changer

models are available for 8 samples 16

samples 24 samples 64 samples and 100

samples

JEOL RESONANCE Inc

ASC100 (100 samples)

1 --0 1(10 C ppm I

Sdid 13C-CPMAS spectrum of cholk acid

Solid-NMR is a technique that measures solid samples (powder or film-like samples) This technique is also effective for measurement of samples not soluble in solvents (inorganic

samples etc) and of crystalline polymorph that is meaningful to measure at the solid state

JEOL RESONANCE Inc

Produci Guide I 15

Mass Spectrometers

I JMS-800D UltraFOCUS I JMS-700 (2) MStation Mass Spectrometer Dedicated to Dioxin Anal ys is High resolution M ass Spectrometer

JMS-800D UltraFOCUS is the optimal cho ice for ultra lowlevel race detection

applications suc h as moni torin g for dioxins and related co mpoun ds eg

Polychlorinated Biphenyls (PCBs) Polybrominated Diphenyl Ethers (PBDEs) or drugs

of abuse by high resolution-selected ion monitoring (HRSIM) gas chromatographyl

mass spectrometry(GCMS)

R-- gtn 80000 (10 valley) Sent Ily 2 3 7 8-TCDD 100fg SNgt2oo

(6 channels 100 msecch Resolution 10000)

N_ Jut J _lllgEI up to 10 kV

JMS-S3000 Matri x Assisted Laser DesorptionIonization TOFMS

The JMS-S3000 is a MALOI-TOFMS incorporating an innovative SpirarrOF ion optical

system With superior capabilities than conventional MALDI-TOFMS the JMS-S3000

provides sate-of-the-art anaiylical solutions for a wide range of research areas such as

functional synthetic polymers materials science and biomolecules

Malrix Assisled Laser Desorpllonlonization Timemiddotof-Flighl Mass Spectrometer

I JMS-T1 OOLP+DART TLC-TOFMS

Pet c 60000 (10 valley) err 02 ng of methyl stearate

SIN 400

(CVEI combination ion source) I~ ~ aJe up to 10kV

I JMS-T1 OOLP LC-TOFMS

I JMS-Tl OOGCV GC-TOFMS

middotl shyThe JMS-T100LP+DART achieves simple and fast TLCMS analysis Accurate mass The JMS-Tl00GCV is a fully automatic Gas Chromatograph - Time-ot-Flight Mass

measurement capabilit y of TOFMS also enables you to determine element Spectrometer (GC-TOFMS) This versatile MS system covers wide range of

compositions of the analytes applications in GC-MS analysis

16 I Pr oduc i Gu ide

- -

---

1----- 1- - - I - =---shy= bull --tJ~ 1- _ ~ __ ~-=--_~

I JMS-Ql 050GC UltraQuad GClMS

cJEOL

-

S-trapHS Headspace Autosampler

ESR Spectrometers

I JES-X3 series ESR Spectrometers

Recently it has been widely

accepted that even retatively few

unpaired electrons in a sample can

affect the function of the material so

lower detection limits (high er

sens itivity) is required of ESR

measurements JES-X3 Series has

achieved higher sensiti v i ty by

developing a lOIN-noise Gunn

oscillator for its new spectrometer

JES-X320 JEOL RESONANCE Inc

i III III )

Maximum Magnetic Field I a6ST 13T 14T

SweepW idth I --00-- 250mT plusmn001 - 500m__T_ __--l

Pole Gap _ _ 6cmm__ ___-= ___~ ____cmm__ _ I 0 = 60mcm 75 _l

Frequency Range(GHz) 8750 - 9650 _ _ _ ___-1

Field Resolution (mT) _L_ 235 Correction by Marker _1_--- Standard

I Operating System Windows 7

The JMS-01050GC is an innovative quadrupole mass spectrometer (OMS) that

achieves the highest-level sensitivity in OMS It has a high ability of evacuation due

to the use of a split flow turbo-molecular pump system (400 Lis) th at

simultaneously evacuates the ion source and the detector The use of a highshy

accuracy hyperbolic quadrupole mass analyzer provides high resolution

The S-trap is a next-generation headspace autosampler providing ultra-low

concentration measurement which was not achieved with a heads pace (HS) method

using conventional sample loop In addition the HS-GCMS system combined lith a

JMS-01050GC Mkll quaorupole MS guarantees detection of mold odor in water

down to 1 ppt

I ES-CT470 Liquid Helium Variable Temperature Controller

The ES-CT470 varies the sample temperature in the temperature range between 25 K

and 470 K Temperature setting is performed by d igital display and the set

temperature is kept constant by automatic control circui ts Combined use with a UV Irradiation device is possible A GaAs etement is used as a temperature sensor

enabling high-accuracy temperature setling

- 25 K to 470 K

plusmn001 K for 25 K to 42 K

plusmn1 orO5 K for 42 K to 470 K

_ 20 min 10 25 min (rom room temperature 08 to 2 Uh

50Hz60Hz 5mm JEOL RESONANCE Inc

Produ c t Guide I 17

Industrial Equipm nt for thin-filnl formation and nlatel ial processing

I bull

Electron Beam Source High-power Electron Beam Source

BS-60060EBS EBG-102UB6S

Electron beam sources for vacuum evaporation of metal and metal-oxide thin-films

We offer a wide variety of electron beam sources and crucibles They have features of

excellent beam spot and energy density and high-speed sweeping

1 PGBS 80020CPPS Plasma Source

BS-80011 BPG (6kW) BS-8002OCPPS (3kW)

Plasma Sources are installed in a vacuum chamber and generate high-density plasma

Used as Ion Plating (Plasma Assisted Deposition) and it is possible to improve film

properties for optilcal thin films protective films and function films Because highshy

density plasma can be generated in a mass space high-rate deposition to a large area

is possible

I RF Induction Plasma System

JEBG-3000UB(300kW) JEBG-1 OOOUB(1 OOkW)

High-power electron beam sources for vacuum evaporation of metal and metal-oxide

for wide plastic films or large glass plates that are continuously fed And they can also

be used for vacuum melting of high-melting point metals

raes

RF Generator

t shy - - - --- - - --- -

0-~ 0 bull bullbull - -

RF-12030 (3kW) RF-56000 (Controller)

13 56MHz radio-frequency power supplies for plasma generation and used for

sputtering CVD etching and ion-plating We offer 750W to 6kW generators and

matching networks

DR Powder Feeder

Thermal plasma around 10000degC (15000deg F) by RF inductive coupling This thermal Fine powder feeder that can feed 01 to 100 11m size fine powder continuously with

plasma is used for nano powder synthesis fine powder spheroidization thick film carrier gas We offer optional feeding rate controller and large capacity hopper

deposition multi composite membrane synthesis CVD and harmful gas

decomposition

18 I Produci Guide

---

Biochemical Analyzers

I JCA-BM series Clinical Chemistry Analyzer BioMajesty Series

JEOLs micro volume technology and unique sample pre-dilution mechanism realizes

high throughput chemistry analysis with reduced sample and reagent volume

More than 4000 systems have been placed in clinical laboratories allover the world

JCA-BM6050

I JCA-BMBOOO series Ultra High Throughput Clinical Chemistry Analyzer

4 4

JCA-BMB060 egt

JCA-BMSOOO series offer ultra high throughput chemistry analysis up to 9000 testsl

hour

The pre-dilution unit one of the BioMajesty family features also continues the strong

tradition in these series with interconnected multiple analysis modules the key factors

that accomplish brilliant high throughput as well as downtime reduction with back-up

capability

I JCA-BM6070 High Throughput High Performance Clinical Chemistry An alyzer

I I I

A Clinical chemistry analyzer with incomparable speed and accuracy which achieves

high throughput of 2400 testslhour (includ ing ISE) The incorporated compact

workstation and user-friendly Interface with excellent operability leads the new trend of

the laboratory testing

BioMajesty Series lCA-BM 6010 lCA-BM 6050

lCA-8M 6070 leA-BM 91 30

lCA-BM 8000 Series

bull This product is distributed outside Japan by Siemens Heatthcare Diagnostics under the ADVtAreg brand name

I JCA-BM601 OC Compact amp High Performance Clinical Chemistry Analyzer

-~-I -

1lIIIIIIilllllllllJllnlIlII Ii I JCA-BM6010C is a compact but efficient automatic analyzer that maintains the basic

concept of BioMajesty series while achieving the excellent capability of microanalysis

with sample volume as small as 1 J1L

BM6010C also offers fully automated HbA1 c analysis with on-board hemolysis

(optional) Simultaneous measurement of Glucose and HbA1c improves laboratory

workflow

Product Guid e I 19

S~~MCEAII Certain products in this brochure are controlled under the Foreign 0J 0014007 -v- ~ Exchange and Foreign Trade Law of Japan in compliance with $ ~~~ international security export control JEOL Ltd must provide the~2 m) IIlt Japanese Government with End-users Statement of Assurancel A MGMT SYS

AvA ~ m and End-use Certificate in order to obtain the export license - tiJ needed for export from Japan If the product to be exported is in this category the end user will be asked to fill in these certificate formsdEOLIS09001 amp150 14001CenrfiCltlled

httpwwwjeolcomdEOL JEOL Ltd 1-2 Musashino 3-chome Akishima Tokyo 196-8558 Japan Sales Division Telephone+81-42-528-3381 Facsimile+81-42-528-3386

ARGENTINA COASIN SAClyF Virrey del Pino 4071 1430 Buenos Aires Argentina Telephone 54-11-4552-3185 Facsimile 54-11-4555-3321

AUSTRALIA amp NEW ZEALAND JEOL(AUSTRALASJA) PtyUd Suite 1 L2 18 Aquatic Drive - Frenchs Foresl NSW 2086 Australia Telephone 61-2-9451-3855 Facsimile 61-2-9451-3822

AUSTRIA JEOL (GERMANY) GmbH Oskar-Von-Miller-Strasse 1 a 85386 Eching Gennany Telephone 49-8165-77346 Facsimile 49-8165-77512

BANGLADESH AQ CHOWDHURY SCIENCE amp SYNERGY PVT LTD House No1 2 Road No 5A Sector No 11 Uttara Dhaka - 1230 Bangladesh Telephone 880-2-9980790 8953450 8953501 Facsimile 880-2-8854428

BELGIUM JEOL (EUROPE) BV Planet ll Gebouw B Leuvensesteenweg 542 B-1930 Zaventem Belgium Telephone 32-2-720-0560 Facsimile 32-2-720-6134

BRAZIL JEOL Brasillnstrument09 Cienlilicos Llda

Av Jabaquara 2958-50 andar-cj 52 04046-500 Sao Paulo SP Brazil Telephone 55-11-5070 4000 Facsimile 55-11-5070 4010

CANADA JEOL CANADA INC 3275 Premier Rue 8 SI-Hubert Quebec J3Y 8Y6 Canada Telephone 1-450-676-8776 Facsimile 1-450-676-6694

CHILE ARQUIMED INNOVAnON

Arturo Pmt 828Santiago Chile Telephone 56-2-634-6266 Facsimile 56-2-634-4633

CHINA JEOL(BEIJING) CO LTD Room Bl0l0l110 Wantong New Wond Plaza No2 Fuchengmenwai Street XIcheng District Beijing 100037 PRChina Telephone 86-10-6804-6321 Facsimile 86-10-6804-6324

JEOL (BEIJING) CO LTD SHANGHAI BRANCH

Room 15051506 Nol300Xi Kang Road Jing an Dis Shanghai 200040 China Telephone 86-21-6248-4868448745374404 Facsimile 86-21-6248-4075

JEOL (BEIJING) CO LTD GUANG ZHOU BRANCH

N1601 World Trade Center Building 371-375 Huan Shi Road East Guang Zhou Guangdong Prov 510095 PRChina Telephone 86-20-8778-7848 Facsimile 86-20-8778-4268

JEOL (BEIJING) CO LTD WUHAN BRANCH

Room A2117 Zhongshang Plaza Office Bldg NO7 Zhongnan Road Wuhan Hubei 430071 PRChina Telephone 86-27-8713-2567 Facsimile 86-27-8713-2567

JEOL LTD (BEIJING) CO LTD CHENGDU BRANCH 1807A Zonglu Building NO 35 Zhongfu Road Chengdu Sichuan 610016 PR China Telephone 86-28-86622554 Facsimile 86-28-86622564

EGYPT JEOL SERIVCE BUREAU

3rd Fl Nile Center Bldg Nawal Slree Dokkl (Cairo) Egypt Telephone 20-2-3335-7220 Facsimile 20-2-3338-4186

FRANCE JEOL (EUROPE) SAS Espace Claude Monet 1 Allee de Giverny 78290 Crolssy-sur-Seine France Telephone 33-13015-3737 Facsimile 33-13015-3747

GERMANY JEOL (GERMANY) GmbH Oskar-Von-Miller-Strasse 1 a 85386 Eching Gennany Telephone 49-8165-77346 Facsimile 49-8165-77512

GREAT BRITAIN amp IRELAND JEOL (UK) LTD JEOL House Silver Court Watchmeaci Welwyn Garden City Herts AL71LT UK Telephone 44-1707 -377117 FaCSimile 44-1707-373254

GREECE N ASTERIADIS SA

56-58S Trikoupl Str PO Box 26140 GR-10022 Athens Greece Telephone 30-1-823-5383 Facsimile 30-1-823-9567

HONG KONG FARMING LTD

Unit No1 009 1 OF Prosperity Milennia Plaza 663 Kings Road North Point Hong Kong Telephone 852-2815-7299 Facsimile 852-2581-4635

INDIA JEQL INDIA Pvt Ltd

Elegance Tower Level 2 2128 Old Mathura Road Jasola Business District Centre Near Apollo Hospital Jasola New Delhi 110025 India Telephone 91-11-6472-2578 Facsimile 91-11-4060-1235

BLUE STAR LTD (HQ Mumbaij

Analyticallnstrments Department Sahas 41412 Veer Savarkar Marg Prabhadery Mumbai 400 025 India Telephone 91-22-6666-4000 Facsimile 91-22-6666-4001

BLUE STAR LTD (DelhQ Analytical Instruments Department E-4412 Okhla Industrial Area Phase-II New Delhi 110 020 India Telephone 91-11-4149-4000 Facsimile 91-11-4149-4005

BLUE STAR LTD (Calcutta)

Analylicallnstruments Department 7 Hare Street Calcutta 700 001 India Telephone 91-33-2213-4133 Facsimile 91 -33-2213-4102

BLUE STAR LTD (ChennaO Analytical Instruments Department No 46 Garuda Building Cathedral Road Chennai 600 086 India Telephone 91-44-4244-4000 Facsimile 91-44-4244-4190

INDONESIA PT TEKNOLABindo Penta Perkasa Komplek Gading Bukillndah Blok lIll JI Bukfl Gading Raya Kelapa Gading Pennai Jakarta 14240 Indonesia Telephone 62-21-458470575859 Facsimile 62-21-45842729

ITALY JEOL 0TALIA) SpA Centro Direzionale Green Office Via dei Tulipani 1 20090 Pieve Emanuele (MI) Italy Telephone 39-02-9041431 Facsimila 39-02-90414343

KOREA JEOL KOREA LTD

Dongwoo Bldg 7F 1443 Yangjae Daero Gangdong-Gu Seoul 134-010 Korea Telephone 82-2-511-5501 Facsimile 82-2-511-2635

KUWAIT Ashraf amp CO Ltd WLL PO Box 3555 Safat 13036 Kuwait Telephone 965-1805151 Facsimile 965-24335373

MALAYSIA JEOL(MALAYSIA) SDNBHD(3S9011-M)

205 Block A Mezzanine Floor Kelana Business Center 97 Jalan SS 72 Kelana Jaya 47301 Petaling Jaya Selangor Malaysia Telephone 60-3-7492-7722 Facsimile 60-3-7492-7723

MEXICO JEOL DE MEXICO SA DE CV

Arkansas 11 Piso 2 Colonia Napoles Delegacion Benito Juarez CP 03810 Mexico DF Mexico Telephone 52-5-55-211-4511 Facsimile 52-5-55-211-0720

PAKISTAN (KarachI) ANALYTICAL MEASURING SYSTEM (pvn LTD(AMS LTD)

14-C Main Sehar Commercia) Avenue Lane 4 Khayaban-e-Sehar DHA-VII Karachimiddot75500 Pakinstan Telephone 92-21-353455813534074735346057-8 Facsimile 92-21-35345582

PANAMA PROMED SA Parque Industrial Costa del Este Urbanizacion Costa del Este Apartado 0816-01755 Panama Panama Telephone 507-303-3100 FaCSimile 507-303-3115

PHILIPPINES PHILAB INDUSTRIES INC

7487 Bagtikan Street SAY Makati 1203 Metro Manila Phillip pines Telephone 63-2-896-7218 Facsimile 63-2-897-7732

PORTUGAL Izasa Portugal Lda A do Proletariado 1 2790-138 CARNAXIDE Portugal Telephone 351-21-424-73-00 Facsimile 351-21-418-60-20

RUSSIA JEOL (RUS) LLC Krasnoproletarskaya Street 16 Bid 2 127473 Moscow Russian Federation Telephone 7-495-748-7791rr792 Facsimile 7-495-748-7793

SAUDI ARABIA ABDULREHMAN ALGOSAIBI GTC (Riyadh)

King Abdulaziz Avenue PO Box 215 Riyadh 11411 Saudi Arabia Telephone 966-1-479-3000 Facsimile 966-1-477-1374

SCANDINAVIA SWEDEN JEOL (Skandinaviska)AB

Hammarbacken 6A Box 716191 27 Sollentuna Sweden Telephone 46-8-28-2800 Facsimile 46-8-29-1647

SERVICE amp INFORMATION OFFICE NORWAY JEQL (Skandinaviska)AB

Lorenvangen 23 0580 Oslo NORWAY Telephone 47-2-2-64-7930 Facsimile 47-2-2-65-0619

FINLAND JEOL (Skandlnaviska)AB

Ylakaupinkuja 2 FIN-02360 Espoo Finland Telephone 358-9-8129-0350 Facsimile 358-9-8129-0351

SINGAPORE JEOLASIA PTE LTD

2 Corporation Road 1t01-12 Corporation Place Singapore 618494 Telephone 65-6565-9989 Facsimile 65-6565-7552

SOUTH AFRICA ADI Scientific (Pty) Ltd

370 Angus Crescent Northlands Business Park 29 Newmarket Road

~~=~g~~~2~~1nt~~2_~~~bIlC of South Africa

Facsimile 27-11 -462-1466

SPAIN IZASA SA

Argoneses 13 28100 Alcobendas (poligono IndustriaQ Madrid Spain Te~phone 34-91-663-0500 Facsimile 34-91-663-0545

SWITZERLAND JEOL (GERMANY) GmbH Oskar-Von-Miller Strasse 1 85386 Eching Germany Telephone 49-8165-77346 Facsimile 49-8165-77512

TAIWAN For EO ProQucts JIE DONG CO LTD 7F 112 Chung Hsiao East Road Section 1 Taipei Taiwan 10023 Republic of China Telephone 886-2-2395-2978 Facsimile 886-2~2322-4655

For Mass Spectrometer Products Mass Solutions Technology Co Ltd

5F No79 Sec 1 Xintai 5th Rd Xlzhi Dis New Taipei City 221 Taiwan Republic of China Telephone 886-2-2698-9511 Facsimile 886-2-2698-9512

For Semiconductor Products JEOL TAIWAN SEMICONDUCTORS LTD

11 F-l No 346 Pei-Da Road Hsin-Chu City 300 Taiwan Republic of China Telephone 886-3-523-8490 Facsimile 886-3-523-8503

THAILAND BECTHAI BANGKOK EQUIPMENT amp CHEMICAL CO Ltd

300 Phaholyothin Rd Phayathai Bangkok 10400 Thailand Telephone 66-2-615-2929 Facsimile 66-2-615-23502351

THE NETHERLANDS JEOL (EUROPE) Bv Ureweg 4 NL-2153 PH Nieuw-Vennep The Nelherlands Telephone 31-252-623500 Facsimile 31-252-623501

TURKEY TEKSERAS Kayisdagi )nonu MahKartal Cad No553 34755 Atasehir Istanbul Turkey Telephone 90-216-5736470 Facsimile 90-216-5736475

UAE MRS Group Dubai POBox 171612 Rashid Abdulla AI Noami Building Suite No 306 Damascus Street AI Qusais-3 Dubai UAE Telephone 971-4-2581141 Facsimile 971-4-2581151

JEOLGulf

POBox 171612 bull Rashid Abdulla AI Noami Building Suite No 306 Damascus Street AI Qusais-3 Dubai UAE Telephone 971-553964219(mobile)

USA JEOL USA INC 11 Dearborn Road Peabody MA 01960 USA Telephone 1-978-535-5900 Facsimile 1-978-536-22052206

JEOL USA INC WEST OFFICE

~~s~~~~~rigAe9~5t~~1 1 0 Telephone 1-925-737-1740 Facsimile 1-925-737-1749

VENEZUELA GOMSA Service and Supply CA

Urbanizacion Montalban JlI - Resldenclas Don Andres - Piso 7 - Apartomento 74 Avenida 3 entre calles 7 y 6 Montalban Caracas Venezuela Telephone 58-212-443-4342 Facsimile 58-212-443-4342

VTETNAM TECHNICAL MATERIALS AND RESOURCES IMPORT-EXPORT JOINT STOCK COMPANY(REXCO) Hanoi Branch

No 13-Lot 12 Trung Yen Trung Hoa Street Cau Giay Dist HanOi Vietnam Telephone 84-4-562-051617562-0535 Facsimile 84-4-853-2511

No 0205B389C Printed in Japan Kp

Page 2: Introduction - Главное управление науки БГУresearch.bsu.by/wp-content/uploads/2015/06/JEOL_Product...Scanning Electron Microscope The JSM-6610 is a high-performance

Product Guide

Name JEOL Ltd [I-JIHON DEI-JSHI KABUSHIKI KAISHA)

President Gon-emon Kurihara

Establishment May 301949

Capital 6740 million yen

Employees Consolidated 2709

Electron Microscopes Transmission Electron Microscopes (TEM] middotmiddotmiddotmiddot middot middotmiddot middot middotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddot middot middotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddot4

Energy Filter Electron Microscopes

Scanning Electron Microscopes Scanning Electron Microscopes (SEM] 6

Analytical Scanning Electron Microscopes

Focused Ion Beam System

Cross Section Polisher

Ion Slicer

Photoelectron Spectrometers (XPS)

Auger Microprobes

X-ray Fluorescence Spectrometers Energy-Dispersive X-roy Fluorescence Spectrometersmiddot middotmiddotmiddotmiddot12

Electron Beam Lithogrophy Systems (a spot beam lithogrophy system]

Gas Chromatograph Mass Spectrometer

Liquid Chromatograph Mass Spectrometers

Application Equipment High-Power Electron Beam Source

Built-in Plasma Source

Clinical Chemistry Analyzers Clinical Chemistry Analyzers middotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddot19

Ion Beam Application Equipment MultiBeam System 8

Peripherol Equipment bull bullbull bullbull bull bullbull 10

Surface Analysis Instruments Electron Probe Microanolyzers 11

Semiconductor Equipment Electron Beam Lithogrophy Systems (0 varioble-shoped electron beom) 13

NMR Spectrometers NMR Spectrometersmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddot middot middotmiddotmiddotmiddotmiddotmiddotmiddot 14

Mass Spectrometers Time-oF-Flight Moss Spectrometers (TOFMS) 16

ESR Spectrometers ESR Spectrometersmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddotmiddot 17

Electron Beam and plasma Electran Beam Evaparation Source 18

Producl Guide I 03

Electron Microscopes

IJEM- RM1300 Ultra High Voltage Electron Microscope

Using a high voltage electron beam giving

high transmission this microscope permits

the direct observation of the 3-D structure

of thick specimens Ihe direct observation

of beam damage and the observation of

sensitive biological specimens with little

damage It features great operational ease

and st ab il it y The JEM-ARM 1300 is

essential for atomic level structural imaging

and 3-D observations

p 010 nm (with top entry slage)

012 nm (with side entry stage)

400 to 1300 kV

x200 to 1500000

I JEM-3200FS Fi eld Emission Electron Microscope (Equipped with In -Column En ergy Filter)

A field emission electron microscope that

gives full play to not only high-resolution

imag ing but also nanoarea analys is

Equi pp ed with a 300 kV FEG and an

in-column energy filter Incorporation of a

new rotation-free image-forming optical

system facilitates acquisition of TEM images

and diffraction patterns as well as provides

stable spectra The combination of the 300

kV FEG and the energy filter oHers new

many solutions for a wide range of research

fields

~ _ n Q17nm

Ai - ~III J VCl Max 300 kV gtL(Jrll lallic I X 100 to 1500000

I JEM-2200FS Field Emission El ectron Microscope (Equ ipped with In -Column Energy Filter)

A field emission electron microscope

equipped with a 200 kV field emission gun

and a new in-column energy filter which is

optimally configured for analytical functions

such as element analysis analysis and stage

analysis The use of a new rotation-free

image-forming optical system makes it easy

to compare TEM images and diffract ion

patterns Since the microscope allows

observation of wide- field energy- filtered

images combination with the op tional

tomography function enables acquisi tion of

three-dimensional information with a wide

field and a high contrast

-3 OOF Fi eld Emission Electron Microscope

Modern electron microscopes can integrate

various imaging devices and analyzers for

nano-area analysis of morphology structures

and chem ical states This advantage is

drawi ng increasing expectation s from

researchers The JEM-31 OOF achieves highshy

reso lution im ag ing and nano-probe

formation Also the JEM-3100F has usershy

hiendly operation tools for smooth operation

of the TEM with various devices and a new

control system for system expandability This

advanced analytical TEM allows highshy

accuracy eHicient acquisition of valuable

infonmation from nano-materials

017 nm

R 100200300 kV

X60 to 1500000

I JEM-ARM200F Atomic Reso lution Analytical Electron Microscope

The JEM-ARM200F incorporating a STEM

Cs COrTector and a microscope column with

dramatically improved mechanical and

electrical stability achieves the worlds

highest STEM (HAADF) reso lution of 008

nm as a commerci a l TEM Th e

Cs-co rrected extremely small elec tron

probe achieves a remarkably increased

current density one order magnitude larger

than conventional TEMs Thus the JEMshy

ARM200F provides ultimate atomic -level

analysis and also higher throughput with

dramatically shortened measurement time

Pc t I 008 nm (STEM)

0 19 nm (rEM)

011 nm (With TEM Cs corrector)

I VCi JG 80 kV 200 kV

x50 to 2 000000

JE -2100F Fie ld Emission Electron Microscope

The field emission electron gun (FEG) which

provides an elec tron beam w ith high

brightness and high coherence is essential

for high-resolution observation and nano

area analysis The JEM-2100F featuring

advanced digital operation is an integrated

TEM th at g ives full play to its various

functions

P lr 11 1 O 19nm ~cC68Tltllfn m tage 160 kV 200 kV

v1a tCBt I x50 to 1500000

04 I Produ CI Guide

I

11 L bull bull 1 ~

EM-~800 Multi-Purpose Analytical Electron Microscope

The JEM-2800 is a new TEM that achieves

nano-area analysis through Automation and

Convenience while being Easy- to-use so

that expert results can be achieved by

operators of any skill level Its advanced

electron optical system makes IT possible to

periorm high-resolution TEM and STEM

imaging EDS EELS tomography and

in-situ observation on the same sample

wilhout sacrificing any of Ihese capabil ities

02 nm (STEM) 01 nm (rEM)

1 100 kV 200 kV x 100 to 200000000

EM 2100 Electron Microscope

-r__bull

I JED-2300T

The JEM-2100 is a new-generation 200 kV

analytical electron microscope The JEMshy

2100 which incorporates an integrated PC

system for various functions WITh excellenl

cost performance supports research and

development in wide scienlific fields ranging

from biotechnology to materials science

Pont liJtI 019 nm ~=I nlng vrl qe 80 10 200 kV

Ilagnl 11 X50 to 1500000

JEM-1400Plus Electron Microscope

The JEM-1400Plus is a versatile

transmission electron microscope (rEM) for

a wide range of applications including

biology polymers nano technology and

advanced materials

The JEM-1400Plus uses a single camera for

imaging for view area seach (x10) to data

aquisition

New operation panels with the organic EL

buttons give you simple and intut ive

operation

p~ f -11)(1 02 nm

r- u 40 10120 kV x l0tol2ooOOO

Energy Dispersive X-ray Spectrometer

The JED-2300T installed on a TEM can

easily perform qualitativequantitative

analysis and linea rea analysis of

microareas WITh high energy resolution This bull EDS employs a JEOLs unique ultra-thin

window detector with gate valve protection

mechanism making it possible to obtain

high-sensitivity analysis data particularly

from light elements

Ivl I (d _ -II(I~

QualitativequantITative analysiS linearea analysis AI Iflltgtie elements Be to U B to U or Na to U

Prod uc l G u ide I 05

- -

I I lilllll

II 1111 111111 11111111

~ - - shy

- -- ~-

- shy

Scanning Electron Microscopes

JSM 7800F Field Emission Scanning Electron Microscope

I JSM-7600F Field Emission Scanning Electron Microscope

The JSM-7600F is a state-of-the-art thermal

FE-SEM th at successfu ll y combines

ultrahigh-resolution imaging with optimized

analytical functionality such as high-speed

high-accuracy analyses

10 nm (15 kV) 15 nm (1 kV) 01 to 30 kV

x 25 to 1000000

JSM-7 OOF Field Emi ss ion Scanning Electron Microscope

l 8

I II

The JSM-7800F equipped with a newly developed super hybrid objective lens is a

cutting-edge thermal FE-SEM that successfully combines ultrahigh-resolution

imaging with fast and high-accuracy elemental analysis Magnetic specimens can

be observed and analyzed at high magnification The JSM-7800F also enables

researchers various analyses such as EDS WDS EBSD and CL

bull08 nm (15 kV) 12 nm (1 kV)

001 to 30 kV

x25 to 1000000

JSM 7500F Field Emission Scanning Electron Microscope

The JSM-7500F developed for

nanostructure characterization is equipped

with the Gentle Beam function which

enables researchers observation atI(~ x 100000 magnification even with 100 V low electron energy ~ ~tn~ ~=--

- - - 10 nm (15 kV) 14nm (1 kV)Jllshyf -diy Ollaqb 0 1 to 30 kVoG -- ~ Wll X25 to 1000000- rr

-

The JSM-7100F is a versatile high performance analytical FE SEM The electron

optics produces the maximum 200 nA probe current with the patented in-lens

thermal FEG and a small probe diameter even at large probe currents with the

patented aperture angle optimizing lens

The objective lens is the field free type This lens is suitable for high precision EBSD

analysis and characterization of a magnetic specimen

The vacuum system employing a TMP combined and a specimen exchange airlock

chamber A life of emitter is prolonged by the high quality vacuum in the gun

chamber

gt= - 12nm (30 kV) 30nm (1 kV) 02 to 30 kV

x 10 to 1000000

06 I Producl Guide

---------

I )SM-66 0 Scanning Electron Microscope

The JSM-6610 is a high-performance SEM

that is equipped with a superb electron

optical system and a general-purpose largeshy

specimen chamber to accommodate a

specimen up to 200 mm diameter The _JSM-6610 incorporates newly designed

__

_- ~I software for easier SEM operations in a

variety of applications

I J5M-ALA series Analytical Scanning Electron Microscopes

The JED-2300 EDS developed by JEOL is

embedded in the compact SEMs The

footprint is same as that of the basic SEM

The SEM and EDS are operated as one

seamless system to provide comfortable

and efficient operation A SDD type EDS

detector does not require liquid nitrogen

EDS analysis is ready whenever you need it

Resolution HV 30 nm

LV 40nm 40nm

Magnification

Accelerating voltage 05 shy 30 kV

x5 shy 300000

03 shy 30 kV

I JASM-6200 C airScor etrade Atmospheric Scanning Electron Microscope

I SM-6510 Scanning Electron Microscope

The JSM-6510 is a high-performance SEM

that is equipped with a superb electron

optical system same as the JSM-6610 and

a general-purpose specimen chamber to

accommodate a specimen up to 150 mm

diameter The JSM-651 0 incorporates

newly designed software for easier SEM

operations in a variety of applications

II 1 30 nm ltr-- rr TJ 01 qamp 05 to 30 kV M~1fIIC3IKlr x5 to 300000

J5 -LV series Low Vacuum SEMs

The low vacuum SEM consists of a

conventional high vacuum mode and a low

vacuum (LV) mode One can select the

vacuum mode with a click on the menu

The LV mode enables one to observe and

analyze non-conductive specimens The

specimen chamber is kept at low vacuum

so that highly out-gassing specimens can

be easily observed

1-lhlIt

Resolution HV 30 nm

LV 40 nm

Low vacuum range 10-270 Pa

The JASM-6200 allows high-resolution light microscopeSEM observation at

atmospheric pressure A specimen is held at normal atmospheric pressure Dynamic

observation of physical or chemical reactions can be made in liquid or gas In addition

for biological applications difficult dehydration and drying processes are not needed

dramatically reducing specimen pre-treatment time

Bnm Imiddot 102030 kV

II

Product Guide I 07

JSM-60l0 AILV InTouchScope

)shy -

JSM-6010LA

I JCM 6000 NeoScopeTM

The InTouchScope incorporates a highly intuitive SEM interface with multi-touch

technology The user can expand application windows and orchestrate aJl functions

just by touching the screen

40 nm (20 kV) 50 nm (20 kV)

05 1020 kV x810 300000

JCM-6000 NeoScopen~ let you observe a specimen at much higher magnification

than a light microscope with the same simple operation of a light microscope The

observation image appears automatically when a specimen is inserted and you can

go up to the maximum magnification of x60OOO quickly with the automated

operations

JCM-6000 NeoScopem is equipped with a TMP for quick start

The installation is easy The wall outlet (100V AC) is the only utility needed Cooling

water is not necessary

FX X10 10 60000

SI - Max 70mm dia

Ion Beam Application Equipment

pIB-09010 Cross Section Polisher (CP)

The IB-090 10CP Cross Section Polisher

makes a cross sect ion by irradiating a

spec imen with argon ion beam along an

edge of a shield plate placed on a

specimen This is an innovative specimen

preparation device for specimens studied in

SEM and EPMA

IIB-09020C Cross Section Polisher (C PIT)

The IB-09020CP Cross Section Polisher

(CPIT) creates a cross section in a manner

similar to the IB-09010CP Its built-in CCO

camera al lows real-time monitoring of a

cross-section during polishing

08 I Product Guide

I J18-4601 MuIti Beam System

I J -4501 MultiBeam System

EM-091001S Ion Slicer

The JIB-4501 MultiBeam System achieves

surfaceinternal 3D imaging and analysis

with simple operation This system also

has optimum geometry for all functions

from FIB SEM observation to EDSEBSD

analyses

R~ Iul N 5 nm (FIB) 25 nm (SEM) A I tlrx] I J 03 kV to 30 kV

(5 kV steps) Magl1lhcnli X30 10 300000

(observation milling)

The Ion Slicer can easily prepare thin-film

specimens for TEM without special skill Prior

treatment required for the Ion Slicer is only to

mechanically polish a specimen to 01 mm

thick The optimally set Ar ion beam provides

high-quality thin films In addition this

innovative tool suppresses specimen damage

and contamination such as lattice distortion

induced by mechanical polishing and

oxidation on specimen suriaces by chemical

treatment The Ion Slicer is an echo-friendly

efficient specimen-preparation tool

The JIB-4601 F MultiBeam System unites the unique imaging and analytical capabilities

of the High Power Optics employed in the TFE SEM and a high-performance FIB

column in a highly efficient and powerful system The JIB-4601 F offers an easy-to-use

tool for highly automated sample preparation combined with high-resolution imaging

and sub-micron analysis of the specimen cross-section

5 nm (FIB) 12 nm (SEM) 02 kV to 30 kV (5 kV sleps)

x30 to 1000000 (observation milling)

I J18-4000 Focused Ion Beam System

Top of the line high-throughput

processing

Compact size for flexible layout shy

Installation space reduced by 20

(compared to JEOL conventional

models)

Superb performance at low accelerating

voltage

Stage Navigation System for fast

determination of observation position

R-_ lit I f1 5 nm ICIIH~ltn lJIO ltJi 1 to 30 kV

M~Q I I x60 (for searching field) X200 to 300000

IIB09060CIS Cryo Ion Slicer

The IB-09060CIS Cryo Ion Slicer

incorporates a specimen cooling

mechanism in the EM-091001S Ion Slicer

for easy preparation of thin filmscross bull I J sections even for specimens susceptible

to thermal damage

J

~

Producl Guide I 09

- ---- shy

_bullbull- _ bullbull 1

- - -~

[Peripheral Equipment ]

IJIC 410 HDT400 JEE-420 series Ion Cleaner Hydrophilic Treatment Device Vacuum Evaporators

The JIC-41 0 Ion Cleaner removes hydrocarbon

contamination on TEM specimens by exposing

specimens in glow discharge

The treated specimens do not build up contamination

during observation in a TEM

JEC560 Auto Carbon Coater

The HDT-400 applies hydrophilic treatment on TEM

grids and SEM specimen mounting blocks The entire

operation is automated

IJFC-1600 Auto Fine Coater

O ~ - --=shy

The JEE-420 vacuum evaporator applies coating on

SEM or TEM specimens with a variety of materials

including gold platinum carbon chromium The JEEshy

420 applies shadowing on TEM specimens

- - C- Ooshy o --nu _ __ a 0 0 0 0

The JEC-560 rapidly applies carbon coating on non-conductive specimens for The JFC series sputter coater applies metal coating on SEM specimens quickly Gold

element analysis with a scanning electron microscope or an electron probe micro gold-palladium and platinum can be applied

analyzers

JED23002300F Energy Dispersive X-ray Spectrometers

Dry SO Detector

The JED-23002300F is installed on a SEM or an EPMA and performs elemental This unique box type Dry SD detector is designed for JSM-651 0 and JSM-601 0 series

analysis on micro areas The Dry SD detector an SDD type detector is cooled SEM The detector is positioned at the optimum position

electrically It does not need liquid nitrogen cooling so that maintenance is not

required Analysis Station the unique EDS analysis software is versatile with simple

operation

All y A~Ilrn System that links observed images with analysis data

inlIytl(oIIUI1Chi1$ Qualitativequantitative analysis linearea analysis

10 I Producl Guide

------

f

Instruments for Microarea and Surface Analysis

IjXA-8530F Field Emission Electron Probe Microanalyzer

The JXA-8530F features an improved hardware that is used in the JXA-8500F (the first

FE-EPMA in the world) as well as newly designed user-friendly PC-GUI windows for

efficient analysis and data operation The FE gun of the JXA-8530F provides not only a

spatial (analysis) resolution of the order of 01 IJm but also high-sensitivity X-ray

detection at low accelerating voltages and large probe currents

IjPS-9200 Photoelectron Spectrometer (XPS)

The JPS-9200 is an XPS that provides microarea analysis A newly developed microshy

tens enables high-sensitivity analysis from macro to microareas Its stage accepts both

standard-size samples (10X 10X2 mm) and large samples (up to gO mm in diameter)

The stage-scan mapping method allows the acquisition of photoelectron images

ranging from low magnification (50 x 18 mm) to high magnification (spatial resolution

30lJm)

I jAMP-9500F Field Emission Auger Microprobe

fl

X 8230 Electron Probe Microanalyzer

D

~) ~ j ) ~ =~=

The JXA-8230 is a newly developed EPMA which succeeds a proven JEOL EPMA

hardware and features newly designed user-friendly PC-GUI windows for efficient

analysis and data operation Sophisticated analysis menus are designed so that the

user can easily access target material analyses offering stress-free operations

I jPS-901 0 series Photoelectron Spectrometers (XPS)

XPS with high-sensitivity and high-resolution is compactly designed on the basis of

JEOLs many years of basic and application technologies on electrostatic lenses

analyzers etc The low-acceleration and large-current ion guns dedicated to permit

XPS analysis of thin films with different thicknesses from surface atomic layers to

micron order thick specimen layers The specimen chamber and etching chamber are

separated from each other in terms of vacuum thus completely preventing the

contamination due to sputtering and facilitating the maintenance of ultrahigh vacuum

A field-emission Auger Microprobe featuring the worlds highest spatial resolution with

the minimum probe diameter of 3 nm (for secondary-electron image) and 8 nm (for

Auger analysis) The new hemispherical electrostatic energy analyzer (HSA) with a

multi-channel detector optimized for Auger analysis is suitable for chemical-state

analysis The neutralizing ion gun allows Auger analysis of insulating materials Its

specimen stage accommodates a large sample of up to 95 mm in diameter Also it is

expandabfe for an UHV-SEM

ProduCI Guide I 11

X-ray Fluorescence Spectrometers

I ISX 400Rll Element Analyzer

An energy-dispersive X-ray fluorescence spectrometer for environmental analysis

which helps you comply with environmental regulations for hazardous substances

such as the RoHS and ELV directives in the EU and soil pollution in Japan You can

easily analyze minute traces of Cd Pb Hg Cr etc This analyzer is also suitable for

general analySiS including element analysis and thickness measurement using the FP

(fundamental parameter) method

I JSX-31 OORll Element Analyzer

An energy-dispersive X-ray fiuorescence spectrometer for environlnlntal analysis which helps you

comply with environmental regulations for hazardous substances such as the RoHS and ELV

directives in the EU and soil pollution in Japan This analyzer inoorporates a JEOL-made electrically

cooled Si(u] detector making liquid nrtrogen unnecessary as well as providing high sensitivity for

heavy-element analysis such as Cd Pb and Hg This analyzer is also surtable for general analysis

including eement analysis and thickness measurement using the FP (fundamental parameter)

method

12 I Product Guide

Semiconductor Eq Ipm nt

2 Electron Beam Lithography System

-5

Electron Beam Lithography System

r

Electron Beam Lithography System

-~=-~--I--~ I

~ ~ ~-

Th e JBX-3200MV is an e lec lro n bea m lithography system developed for the production of next generation ultrahigh-precision masks and reticles This system employs a variableshyshaped electron beam o f 50kV and a step amp repeat specimen stage

High thro ug hp ut enabled by a new PEG (Proximity Effect Correction) system High-speed da la- transfer sys tem for a large quanti ty data High-precision design for masklrelicle production

Th e JBX-9 500FS is a spot beam

lithography system developed to meet a

wi de range of applications with high

throughput and high precision periormance

This sys tem covers fields from the nanoshy

technology research to the production of

leading edge devices

f 100kV _ ZrONV Schotlky emitter

maximum 300 mm wafer

Th e JBX-6300 FS is a s p o t b ea m

lithography system developed to meet a

w ide range o f applica tions with high

resolution and high precision periormance

This system covers fields from the nanoshy

technology research to the development of

next generation devices

25 kVl50 kVl1 00 kV ZrONV Schottky emittelt

maximum 200 mm wafelt

Prod ucl Gu ide I 13

-

---------

-_ -~

- --= - - - =-shy -

NMR Spectrometers

I JNM-ECAECX series FT NMR System

920 MHz magnet Photo courtesy Nationallnstrtute of Natural Sciences Institute for

Molecular Science

The JNM-ECA920 FT NMR System is a 920 MHz high-resolution NMR

spectrometer developed by JEOL This spectrometer uses the superconducting

magnet co-developed by National Institute for Materials Science and Kobe Steel

Ltd which generates the high magnetic field Created by combining Japans stateshy

of-the-art technologies this FT NMR System marks an important milestone in next

generation biology and nanotechnology which call for high-magnetic-field highshy

resclution NMR analysis

JEOL RESONANCE Inc

~ ~ ~

~t~-

~ 100

HNCACB spectrum of 13C(15N labeled Solid 23Na-MQMAS spectrum of ubiqurtin N3)P207

The JNM-ECNECX series are versatile high-performance FT NMR spectrometer

system that utilize the latest digital and high-frequency technology The ECA

spectrometer is applicable up to 1GHz and can be used for a wide range of

applications including liquidsolid NMR protein analysis and diffusion coefficient

measurement

INM-EC cd

JOO ~QO 0(1 ~uo 1)0

Spectrometer I Oscillator receiver power amplifier

Magnet IISCM Field strength 705T I 939T 11 74T 1401T 1643T

Bore diameter (mm) 54 I 54 54 54 54

Probe 5 mm Ttl tunable

11110

188T

54

JEOL RESONANCE Inc

INMmiddot fO rie ---shy

)Ol~ ~1111 011 Oll

Spectrometer Oscillator receiver power amplifier

Magnet I ISCM Field strength 705T 939T I 1174T 1401T

Bore diameter (mm) I 54 54 54 54

Probe I 5 mm TH tunable

JEOL RESONANCE Inc

14 I Produc t Guide

bull bull bull

IJNM-ECS 00 FT NMR System

bull I ASC Series

Auto Sample Changer

ASC8 (8 samples) ASC24 (24 samples)

middotmiddot iT ~ --shy

~ I -~Au

ASC16 (16 samples) ASC64 (64 samples)

bullIJNM-ECAECX series Solid NMR

=- ~

I

l l

bull

0 5ilJl

0

MAS conlroller Solid NMR sampling kit

NMR Systems For Modern NMR Spectroscopy The JNM-ECS400 i s a compact two-channel

spectrometer that retains the advanced capabilities of the

JNM-ECAlECX series (required installation space is oneshy

half compared to conventional NMRs) Programmable

timing sequencers built into each RF and PFG channel

can independently control either synchronous or

asynchronous operations of each channel Its standard

tunable broadband gradient probe which integrates all

JEOLs newest technologies is the high sesitivity roomshy

tempperature probe

Ccmpact spectrometer chassis Innovaten in JEOL NMR digrtal architecture High-stability and high-accuracy digital spectrometer High-sensrtivity new tunable probe Full automalk NMR with advanced software

JEOL RESONANCE Inc

An automatic sample changer makes it

possible to measure many samples

sequentially by exchanging multiple samples

automatically one by one Five changer

models are available for 8 samples 16

samples 24 samples 64 samples and 100

samples

JEOL RESONANCE Inc

ASC100 (100 samples)

1 --0 1(10 C ppm I

Sdid 13C-CPMAS spectrum of cholk acid

Solid-NMR is a technique that measures solid samples (powder or film-like samples) This technique is also effective for measurement of samples not soluble in solvents (inorganic

samples etc) and of crystalline polymorph that is meaningful to measure at the solid state

JEOL RESONANCE Inc

Produci Guide I 15

Mass Spectrometers

I JMS-800D UltraFOCUS I JMS-700 (2) MStation Mass Spectrometer Dedicated to Dioxin Anal ys is High resolution M ass Spectrometer

JMS-800D UltraFOCUS is the optimal cho ice for ultra lowlevel race detection

applications suc h as moni torin g for dioxins and related co mpoun ds eg

Polychlorinated Biphenyls (PCBs) Polybrominated Diphenyl Ethers (PBDEs) or drugs

of abuse by high resolution-selected ion monitoring (HRSIM) gas chromatographyl

mass spectrometry(GCMS)

R-- gtn 80000 (10 valley) Sent Ily 2 3 7 8-TCDD 100fg SNgt2oo

(6 channels 100 msecch Resolution 10000)

N_ Jut J _lllgEI up to 10 kV

JMS-S3000 Matri x Assisted Laser DesorptionIonization TOFMS

The JMS-S3000 is a MALOI-TOFMS incorporating an innovative SpirarrOF ion optical

system With superior capabilities than conventional MALDI-TOFMS the JMS-S3000

provides sate-of-the-art anaiylical solutions for a wide range of research areas such as

functional synthetic polymers materials science and biomolecules

Malrix Assisled Laser Desorpllonlonization Timemiddotof-Flighl Mass Spectrometer

I JMS-T1 OOLP+DART TLC-TOFMS

Pet c 60000 (10 valley) err 02 ng of methyl stearate

SIN 400

(CVEI combination ion source) I~ ~ aJe up to 10kV

I JMS-T1 OOLP LC-TOFMS

I JMS-Tl OOGCV GC-TOFMS

middotl shyThe JMS-T100LP+DART achieves simple and fast TLCMS analysis Accurate mass The JMS-Tl00GCV is a fully automatic Gas Chromatograph - Time-ot-Flight Mass

measurement capabilit y of TOFMS also enables you to determine element Spectrometer (GC-TOFMS) This versatile MS system covers wide range of

compositions of the analytes applications in GC-MS analysis

16 I Pr oduc i Gu ide

- -

---

1----- 1- - - I - =---shy= bull --tJ~ 1- _ ~ __ ~-=--_~

I JMS-Ql 050GC UltraQuad GClMS

cJEOL

-

S-trapHS Headspace Autosampler

ESR Spectrometers

I JES-X3 series ESR Spectrometers

Recently it has been widely

accepted that even retatively few

unpaired electrons in a sample can

affect the function of the material so

lower detection limits (high er

sens itivity) is required of ESR

measurements JES-X3 Series has

achieved higher sensiti v i ty by

developing a lOIN-noise Gunn

oscillator for its new spectrometer

JES-X320 JEOL RESONANCE Inc

i III III )

Maximum Magnetic Field I a6ST 13T 14T

SweepW idth I --00-- 250mT plusmn001 - 500m__T_ __--l

Pole Gap _ _ 6cmm__ ___-= ___~ ____cmm__ _ I 0 = 60mcm 75 _l

Frequency Range(GHz) 8750 - 9650 _ _ _ ___-1

Field Resolution (mT) _L_ 235 Correction by Marker _1_--- Standard

I Operating System Windows 7

The JMS-01050GC is an innovative quadrupole mass spectrometer (OMS) that

achieves the highest-level sensitivity in OMS It has a high ability of evacuation due

to the use of a split flow turbo-molecular pump system (400 Lis) th at

simultaneously evacuates the ion source and the detector The use of a highshy

accuracy hyperbolic quadrupole mass analyzer provides high resolution

The S-trap is a next-generation headspace autosampler providing ultra-low

concentration measurement which was not achieved with a heads pace (HS) method

using conventional sample loop In addition the HS-GCMS system combined lith a

JMS-01050GC Mkll quaorupole MS guarantees detection of mold odor in water

down to 1 ppt

I ES-CT470 Liquid Helium Variable Temperature Controller

The ES-CT470 varies the sample temperature in the temperature range between 25 K

and 470 K Temperature setting is performed by d igital display and the set

temperature is kept constant by automatic control circui ts Combined use with a UV Irradiation device is possible A GaAs etement is used as a temperature sensor

enabling high-accuracy temperature setling

- 25 K to 470 K

plusmn001 K for 25 K to 42 K

plusmn1 orO5 K for 42 K to 470 K

_ 20 min 10 25 min (rom room temperature 08 to 2 Uh

50Hz60Hz 5mm JEOL RESONANCE Inc

Produ c t Guide I 17

Industrial Equipm nt for thin-filnl formation and nlatel ial processing

I bull

Electron Beam Source High-power Electron Beam Source

BS-60060EBS EBG-102UB6S

Electron beam sources for vacuum evaporation of metal and metal-oxide thin-films

We offer a wide variety of electron beam sources and crucibles They have features of

excellent beam spot and energy density and high-speed sweeping

1 PGBS 80020CPPS Plasma Source

BS-80011 BPG (6kW) BS-8002OCPPS (3kW)

Plasma Sources are installed in a vacuum chamber and generate high-density plasma

Used as Ion Plating (Plasma Assisted Deposition) and it is possible to improve film

properties for optilcal thin films protective films and function films Because highshy

density plasma can be generated in a mass space high-rate deposition to a large area

is possible

I RF Induction Plasma System

JEBG-3000UB(300kW) JEBG-1 OOOUB(1 OOkW)

High-power electron beam sources for vacuum evaporation of metal and metal-oxide

for wide plastic films or large glass plates that are continuously fed And they can also

be used for vacuum melting of high-melting point metals

raes

RF Generator

t shy - - - --- - - --- -

0-~ 0 bull bullbull - -

RF-12030 (3kW) RF-56000 (Controller)

13 56MHz radio-frequency power supplies for plasma generation and used for

sputtering CVD etching and ion-plating We offer 750W to 6kW generators and

matching networks

DR Powder Feeder

Thermal plasma around 10000degC (15000deg F) by RF inductive coupling This thermal Fine powder feeder that can feed 01 to 100 11m size fine powder continuously with

plasma is used for nano powder synthesis fine powder spheroidization thick film carrier gas We offer optional feeding rate controller and large capacity hopper

deposition multi composite membrane synthesis CVD and harmful gas

decomposition

18 I Produci Guide

---

Biochemical Analyzers

I JCA-BM series Clinical Chemistry Analyzer BioMajesty Series

JEOLs micro volume technology and unique sample pre-dilution mechanism realizes

high throughput chemistry analysis with reduced sample and reagent volume

More than 4000 systems have been placed in clinical laboratories allover the world

JCA-BM6050

I JCA-BMBOOO series Ultra High Throughput Clinical Chemistry Analyzer

4 4

JCA-BMB060 egt

JCA-BMSOOO series offer ultra high throughput chemistry analysis up to 9000 testsl

hour

The pre-dilution unit one of the BioMajesty family features also continues the strong

tradition in these series with interconnected multiple analysis modules the key factors

that accomplish brilliant high throughput as well as downtime reduction with back-up

capability

I JCA-BM6070 High Throughput High Performance Clinical Chemistry An alyzer

I I I

A Clinical chemistry analyzer with incomparable speed and accuracy which achieves

high throughput of 2400 testslhour (includ ing ISE) The incorporated compact

workstation and user-friendly Interface with excellent operability leads the new trend of

the laboratory testing

BioMajesty Series lCA-BM 6010 lCA-BM 6050

lCA-8M 6070 leA-BM 91 30

lCA-BM 8000 Series

bull This product is distributed outside Japan by Siemens Heatthcare Diagnostics under the ADVtAreg brand name

I JCA-BM601 OC Compact amp High Performance Clinical Chemistry Analyzer

-~-I -

1lIIIIIIilllllllllJllnlIlII Ii I JCA-BM6010C is a compact but efficient automatic analyzer that maintains the basic

concept of BioMajesty series while achieving the excellent capability of microanalysis

with sample volume as small as 1 J1L

BM6010C also offers fully automated HbA1 c analysis with on-board hemolysis

(optional) Simultaneous measurement of Glucose and HbA1c improves laboratory

workflow

Product Guid e I 19

S~~MCEAII Certain products in this brochure are controlled under the Foreign 0J 0014007 -v- ~ Exchange and Foreign Trade Law of Japan in compliance with $ ~~~ international security export control JEOL Ltd must provide the~2 m) IIlt Japanese Government with End-users Statement of Assurancel A MGMT SYS

AvA ~ m and End-use Certificate in order to obtain the export license - tiJ needed for export from Japan If the product to be exported is in this category the end user will be asked to fill in these certificate formsdEOLIS09001 amp150 14001CenrfiCltlled

httpwwwjeolcomdEOL JEOL Ltd 1-2 Musashino 3-chome Akishima Tokyo 196-8558 Japan Sales Division Telephone+81-42-528-3381 Facsimile+81-42-528-3386

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GERMANY JEOL (GERMANY) GmbH Oskar-Von-Miller-Strasse 1 a 85386 Eching Gennany Telephone 49-8165-77346 Facsimile 49-8165-77512

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Unit No1 009 1 OF Prosperity Milennia Plaza 663 Kings Road North Point Hong Kong Telephone 852-2815-7299 Facsimile 852-2581-4635

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Elegance Tower Level 2 2128 Old Mathura Road Jasola Business District Centre Near Apollo Hospital Jasola New Delhi 110025 India Telephone 91-11-6472-2578 Facsimile 91-11-4060-1235

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Analylicallnstruments Department 7 Hare Street Calcutta 700 001 India Telephone 91-33-2213-4133 Facsimile 91 -33-2213-4102

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No 0205B389C Printed in Japan Kp

Page 3: Introduction - Главное управление науки БГУresearch.bsu.by/wp-content/uploads/2015/06/JEOL_Product...Scanning Electron Microscope The JSM-6610 is a high-performance

Electron Microscopes

IJEM- RM1300 Ultra High Voltage Electron Microscope

Using a high voltage electron beam giving

high transmission this microscope permits

the direct observation of the 3-D structure

of thick specimens Ihe direct observation

of beam damage and the observation of

sensitive biological specimens with little

damage It features great operational ease

and st ab il it y The JEM-ARM 1300 is

essential for atomic level structural imaging

and 3-D observations

p 010 nm (with top entry slage)

012 nm (with side entry stage)

400 to 1300 kV

x200 to 1500000

I JEM-3200FS Fi eld Emission Electron Microscope (Equipped with In -Column En ergy Filter)

A field emission electron microscope that

gives full play to not only high-resolution

imag ing but also nanoarea analys is

Equi pp ed with a 300 kV FEG and an

in-column energy filter Incorporation of a

new rotation-free image-forming optical

system facilitates acquisition of TEM images

and diffraction patterns as well as provides

stable spectra The combination of the 300

kV FEG and the energy filter oHers new

many solutions for a wide range of research

fields

~ _ n Q17nm

Ai - ~III J VCl Max 300 kV gtL(Jrll lallic I X 100 to 1500000

I JEM-2200FS Field Emission El ectron Microscope (Equ ipped with In -Column Energy Filter)

A field emission electron microscope

equipped with a 200 kV field emission gun

and a new in-column energy filter which is

optimally configured for analytical functions

such as element analysis analysis and stage

analysis The use of a new rotation-free

image-forming optical system makes it easy

to compare TEM images and diffract ion

patterns Since the microscope allows

observation of wide- field energy- filtered

images combination with the op tional

tomography function enables acquisi tion of

three-dimensional information with a wide

field and a high contrast

-3 OOF Fi eld Emission Electron Microscope

Modern electron microscopes can integrate

various imaging devices and analyzers for

nano-area analysis of morphology structures

and chem ical states This advantage is

drawi ng increasing expectation s from

researchers The JEM-31 OOF achieves highshy

reso lution im ag ing and nano-probe

formation Also the JEM-3100F has usershy

hiendly operation tools for smooth operation

of the TEM with various devices and a new

control system for system expandability This

advanced analytical TEM allows highshy

accuracy eHicient acquisition of valuable

infonmation from nano-materials

017 nm

R 100200300 kV

X60 to 1500000

I JEM-ARM200F Atomic Reso lution Analytical Electron Microscope

The JEM-ARM200F incorporating a STEM

Cs COrTector and a microscope column with

dramatically improved mechanical and

electrical stability achieves the worlds

highest STEM (HAADF) reso lution of 008

nm as a commerci a l TEM Th e

Cs-co rrected extremely small elec tron

probe achieves a remarkably increased

current density one order magnitude larger

than conventional TEMs Thus the JEMshy

ARM200F provides ultimate atomic -level

analysis and also higher throughput with

dramatically shortened measurement time

Pc t I 008 nm (STEM)

0 19 nm (rEM)

011 nm (With TEM Cs corrector)

I VCi JG 80 kV 200 kV

x50 to 2 000000

JE -2100F Fie ld Emission Electron Microscope

The field emission electron gun (FEG) which

provides an elec tron beam w ith high

brightness and high coherence is essential

for high-resolution observation and nano

area analysis The JEM-2100F featuring

advanced digital operation is an integrated

TEM th at g ives full play to its various

functions

P lr 11 1 O 19nm ~cC68Tltllfn m tage 160 kV 200 kV

v1a tCBt I x50 to 1500000

04 I Produ CI Guide

I

11 L bull bull 1 ~

EM-~800 Multi-Purpose Analytical Electron Microscope

The JEM-2800 is a new TEM that achieves

nano-area analysis through Automation and

Convenience while being Easy- to-use so

that expert results can be achieved by

operators of any skill level Its advanced

electron optical system makes IT possible to

periorm high-resolution TEM and STEM

imaging EDS EELS tomography and

in-situ observation on the same sample

wilhout sacrificing any of Ihese capabil ities

02 nm (STEM) 01 nm (rEM)

1 100 kV 200 kV x 100 to 200000000

EM 2100 Electron Microscope

-r__bull

I JED-2300T

The JEM-2100 is a new-generation 200 kV

analytical electron microscope The JEMshy

2100 which incorporates an integrated PC

system for various functions WITh excellenl

cost performance supports research and

development in wide scienlific fields ranging

from biotechnology to materials science

Pont liJtI 019 nm ~=I nlng vrl qe 80 10 200 kV

Ilagnl 11 X50 to 1500000

JEM-1400Plus Electron Microscope

The JEM-1400Plus is a versatile

transmission electron microscope (rEM) for

a wide range of applications including

biology polymers nano technology and

advanced materials

The JEM-1400Plus uses a single camera for

imaging for view area seach (x10) to data

aquisition

New operation panels with the organic EL

buttons give you simple and intut ive

operation

p~ f -11)(1 02 nm

r- u 40 10120 kV x l0tol2ooOOO

Energy Dispersive X-ray Spectrometer

The JED-2300T installed on a TEM can

easily perform qualitativequantitative

analysis and linea rea analysis of

microareas WITh high energy resolution This bull EDS employs a JEOLs unique ultra-thin

window detector with gate valve protection

mechanism making it possible to obtain

high-sensitivity analysis data particularly

from light elements

Ivl I (d _ -II(I~

QualitativequantITative analysiS linearea analysis AI Iflltgtie elements Be to U B to U or Na to U

Prod uc l G u ide I 05

- -

I I lilllll

II 1111 111111 11111111

~ - - shy

- -- ~-

- shy

Scanning Electron Microscopes

JSM 7800F Field Emission Scanning Electron Microscope

I JSM-7600F Field Emission Scanning Electron Microscope

The JSM-7600F is a state-of-the-art thermal

FE-SEM th at successfu ll y combines

ultrahigh-resolution imaging with optimized

analytical functionality such as high-speed

high-accuracy analyses

10 nm (15 kV) 15 nm (1 kV) 01 to 30 kV

x 25 to 1000000

JSM-7 OOF Field Emi ss ion Scanning Electron Microscope

l 8

I II

The JSM-7800F equipped with a newly developed super hybrid objective lens is a

cutting-edge thermal FE-SEM that successfully combines ultrahigh-resolution

imaging with fast and high-accuracy elemental analysis Magnetic specimens can

be observed and analyzed at high magnification The JSM-7800F also enables

researchers various analyses such as EDS WDS EBSD and CL

bull08 nm (15 kV) 12 nm (1 kV)

001 to 30 kV

x25 to 1000000

JSM 7500F Field Emission Scanning Electron Microscope

The JSM-7500F developed for

nanostructure characterization is equipped

with the Gentle Beam function which

enables researchers observation atI(~ x 100000 magnification even with 100 V low electron energy ~ ~tn~ ~=--

- - - 10 nm (15 kV) 14nm (1 kV)Jllshyf -diy Ollaqb 0 1 to 30 kVoG -- ~ Wll X25 to 1000000- rr

-

The JSM-7100F is a versatile high performance analytical FE SEM The electron

optics produces the maximum 200 nA probe current with the patented in-lens

thermal FEG and a small probe diameter even at large probe currents with the

patented aperture angle optimizing lens

The objective lens is the field free type This lens is suitable for high precision EBSD

analysis and characterization of a magnetic specimen

The vacuum system employing a TMP combined and a specimen exchange airlock

chamber A life of emitter is prolonged by the high quality vacuum in the gun

chamber

gt= - 12nm (30 kV) 30nm (1 kV) 02 to 30 kV

x 10 to 1000000

06 I Producl Guide

---------

I )SM-66 0 Scanning Electron Microscope

The JSM-6610 is a high-performance SEM

that is equipped with a superb electron

optical system and a general-purpose largeshy

specimen chamber to accommodate a

specimen up to 200 mm diameter The _JSM-6610 incorporates newly designed

__

_- ~I software for easier SEM operations in a

variety of applications

I J5M-ALA series Analytical Scanning Electron Microscopes

The JED-2300 EDS developed by JEOL is

embedded in the compact SEMs The

footprint is same as that of the basic SEM

The SEM and EDS are operated as one

seamless system to provide comfortable

and efficient operation A SDD type EDS

detector does not require liquid nitrogen

EDS analysis is ready whenever you need it

Resolution HV 30 nm

LV 40nm 40nm

Magnification

Accelerating voltage 05 shy 30 kV

x5 shy 300000

03 shy 30 kV

I JASM-6200 C airScor etrade Atmospheric Scanning Electron Microscope

I SM-6510 Scanning Electron Microscope

The JSM-6510 is a high-performance SEM

that is equipped with a superb electron

optical system same as the JSM-6610 and

a general-purpose specimen chamber to

accommodate a specimen up to 150 mm

diameter The JSM-651 0 incorporates

newly designed software for easier SEM

operations in a variety of applications

II 1 30 nm ltr-- rr TJ 01 qamp 05 to 30 kV M~1fIIC3IKlr x5 to 300000

J5 -LV series Low Vacuum SEMs

The low vacuum SEM consists of a

conventional high vacuum mode and a low

vacuum (LV) mode One can select the

vacuum mode with a click on the menu

The LV mode enables one to observe and

analyze non-conductive specimens The

specimen chamber is kept at low vacuum

so that highly out-gassing specimens can

be easily observed

1-lhlIt

Resolution HV 30 nm

LV 40 nm

Low vacuum range 10-270 Pa

The JASM-6200 allows high-resolution light microscopeSEM observation at

atmospheric pressure A specimen is held at normal atmospheric pressure Dynamic

observation of physical or chemical reactions can be made in liquid or gas In addition

for biological applications difficult dehydration and drying processes are not needed

dramatically reducing specimen pre-treatment time

Bnm Imiddot 102030 kV

II

Product Guide I 07

JSM-60l0 AILV InTouchScope

)shy -

JSM-6010LA

I JCM 6000 NeoScopeTM

The InTouchScope incorporates a highly intuitive SEM interface with multi-touch

technology The user can expand application windows and orchestrate aJl functions

just by touching the screen

40 nm (20 kV) 50 nm (20 kV)

05 1020 kV x810 300000

JCM-6000 NeoScopen~ let you observe a specimen at much higher magnification

than a light microscope with the same simple operation of a light microscope The

observation image appears automatically when a specimen is inserted and you can

go up to the maximum magnification of x60OOO quickly with the automated

operations

JCM-6000 NeoScopem is equipped with a TMP for quick start

The installation is easy The wall outlet (100V AC) is the only utility needed Cooling

water is not necessary

FX X10 10 60000

SI - Max 70mm dia

Ion Beam Application Equipment

pIB-09010 Cross Section Polisher (CP)

The IB-090 10CP Cross Section Polisher

makes a cross sect ion by irradiating a

spec imen with argon ion beam along an

edge of a shield plate placed on a

specimen This is an innovative specimen

preparation device for specimens studied in

SEM and EPMA

IIB-09020C Cross Section Polisher (C PIT)

The IB-09020CP Cross Section Polisher

(CPIT) creates a cross section in a manner

similar to the IB-09010CP Its built-in CCO

camera al lows real-time monitoring of a

cross-section during polishing

08 I Product Guide

I J18-4601 MuIti Beam System

I J -4501 MultiBeam System

EM-091001S Ion Slicer

The JIB-4501 MultiBeam System achieves

surfaceinternal 3D imaging and analysis

with simple operation This system also

has optimum geometry for all functions

from FIB SEM observation to EDSEBSD

analyses

R~ Iul N 5 nm (FIB) 25 nm (SEM) A I tlrx] I J 03 kV to 30 kV

(5 kV steps) Magl1lhcnli X30 10 300000

(observation milling)

The Ion Slicer can easily prepare thin-film

specimens for TEM without special skill Prior

treatment required for the Ion Slicer is only to

mechanically polish a specimen to 01 mm

thick The optimally set Ar ion beam provides

high-quality thin films In addition this

innovative tool suppresses specimen damage

and contamination such as lattice distortion

induced by mechanical polishing and

oxidation on specimen suriaces by chemical

treatment The Ion Slicer is an echo-friendly

efficient specimen-preparation tool

The JIB-4601 F MultiBeam System unites the unique imaging and analytical capabilities

of the High Power Optics employed in the TFE SEM and a high-performance FIB

column in a highly efficient and powerful system The JIB-4601 F offers an easy-to-use

tool for highly automated sample preparation combined with high-resolution imaging

and sub-micron analysis of the specimen cross-section

5 nm (FIB) 12 nm (SEM) 02 kV to 30 kV (5 kV sleps)

x30 to 1000000 (observation milling)

I J18-4000 Focused Ion Beam System

Top of the line high-throughput

processing

Compact size for flexible layout shy

Installation space reduced by 20

(compared to JEOL conventional

models)

Superb performance at low accelerating

voltage

Stage Navigation System for fast

determination of observation position

R-_ lit I f1 5 nm ICIIH~ltn lJIO ltJi 1 to 30 kV

M~Q I I x60 (for searching field) X200 to 300000

IIB09060CIS Cryo Ion Slicer

The IB-09060CIS Cryo Ion Slicer

incorporates a specimen cooling

mechanism in the EM-091001S Ion Slicer

for easy preparation of thin filmscross bull I J sections even for specimens susceptible

to thermal damage

J

~

Producl Guide I 09

- ---- shy

_bullbull- _ bullbull 1

- - -~

[Peripheral Equipment ]

IJIC 410 HDT400 JEE-420 series Ion Cleaner Hydrophilic Treatment Device Vacuum Evaporators

The JIC-41 0 Ion Cleaner removes hydrocarbon

contamination on TEM specimens by exposing

specimens in glow discharge

The treated specimens do not build up contamination

during observation in a TEM

JEC560 Auto Carbon Coater

The HDT-400 applies hydrophilic treatment on TEM

grids and SEM specimen mounting blocks The entire

operation is automated

IJFC-1600 Auto Fine Coater

O ~ - --=shy

The JEE-420 vacuum evaporator applies coating on

SEM or TEM specimens with a variety of materials

including gold platinum carbon chromium The JEEshy

420 applies shadowing on TEM specimens

- - C- Ooshy o --nu _ __ a 0 0 0 0

The JEC-560 rapidly applies carbon coating on non-conductive specimens for The JFC series sputter coater applies metal coating on SEM specimens quickly Gold

element analysis with a scanning electron microscope or an electron probe micro gold-palladium and platinum can be applied

analyzers

JED23002300F Energy Dispersive X-ray Spectrometers

Dry SO Detector

The JED-23002300F is installed on a SEM or an EPMA and performs elemental This unique box type Dry SD detector is designed for JSM-651 0 and JSM-601 0 series

analysis on micro areas The Dry SD detector an SDD type detector is cooled SEM The detector is positioned at the optimum position

electrically It does not need liquid nitrogen cooling so that maintenance is not

required Analysis Station the unique EDS analysis software is versatile with simple

operation

All y A~Ilrn System that links observed images with analysis data

inlIytl(oIIUI1Chi1$ Qualitativequantitative analysis linearea analysis

10 I Producl Guide

------

f

Instruments for Microarea and Surface Analysis

IjXA-8530F Field Emission Electron Probe Microanalyzer

The JXA-8530F features an improved hardware that is used in the JXA-8500F (the first

FE-EPMA in the world) as well as newly designed user-friendly PC-GUI windows for

efficient analysis and data operation The FE gun of the JXA-8530F provides not only a

spatial (analysis) resolution of the order of 01 IJm but also high-sensitivity X-ray

detection at low accelerating voltages and large probe currents

IjPS-9200 Photoelectron Spectrometer (XPS)

The JPS-9200 is an XPS that provides microarea analysis A newly developed microshy

tens enables high-sensitivity analysis from macro to microareas Its stage accepts both

standard-size samples (10X 10X2 mm) and large samples (up to gO mm in diameter)

The stage-scan mapping method allows the acquisition of photoelectron images

ranging from low magnification (50 x 18 mm) to high magnification (spatial resolution

30lJm)

I jAMP-9500F Field Emission Auger Microprobe

fl

X 8230 Electron Probe Microanalyzer

D

~) ~ j ) ~ =~=

The JXA-8230 is a newly developed EPMA which succeeds a proven JEOL EPMA

hardware and features newly designed user-friendly PC-GUI windows for efficient

analysis and data operation Sophisticated analysis menus are designed so that the

user can easily access target material analyses offering stress-free operations

I jPS-901 0 series Photoelectron Spectrometers (XPS)

XPS with high-sensitivity and high-resolution is compactly designed on the basis of

JEOLs many years of basic and application technologies on electrostatic lenses

analyzers etc The low-acceleration and large-current ion guns dedicated to permit

XPS analysis of thin films with different thicknesses from surface atomic layers to

micron order thick specimen layers The specimen chamber and etching chamber are

separated from each other in terms of vacuum thus completely preventing the

contamination due to sputtering and facilitating the maintenance of ultrahigh vacuum

A field-emission Auger Microprobe featuring the worlds highest spatial resolution with

the minimum probe diameter of 3 nm (for secondary-electron image) and 8 nm (for

Auger analysis) The new hemispherical electrostatic energy analyzer (HSA) with a

multi-channel detector optimized for Auger analysis is suitable for chemical-state

analysis The neutralizing ion gun allows Auger analysis of insulating materials Its

specimen stage accommodates a large sample of up to 95 mm in diameter Also it is

expandabfe for an UHV-SEM

ProduCI Guide I 11

X-ray Fluorescence Spectrometers

I ISX 400Rll Element Analyzer

An energy-dispersive X-ray fluorescence spectrometer for environmental analysis

which helps you comply with environmental regulations for hazardous substances

such as the RoHS and ELV directives in the EU and soil pollution in Japan You can

easily analyze minute traces of Cd Pb Hg Cr etc This analyzer is also suitable for

general analySiS including element analysis and thickness measurement using the FP

(fundamental parameter) method

I JSX-31 OORll Element Analyzer

An energy-dispersive X-ray fiuorescence spectrometer for environlnlntal analysis which helps you

comply with environmental regulations for hazardous substances such as the RoHS and ELV

directives in the EU and soil pollution in Japan This analyzer inoorporates a JEOL-made electrically

cooled Si(u] detector making liquid nrtrogen unnecessary as well as providing high sensitivity for

heavy-element analysis such as Cd Pb and Hg This analyzer is also surtable for general analysis

including eement analysis and thickness measurement using the FP (fundamental parameter)

method

12 I Product Guide

Semiconductor Eq Ipm nt

2 Electron Beam Lithography System

-5

Electron Beam Lithography System

r

Electron Beam Lithography System

-~=-~--I--~ I

~ ~ ~-

Th e JBX-3200MV is an e lec lro n bea m lithography system developed for the production of next generation ultrahigh-precision masks and reticles This system employs a variableshyshaped electron beam o f 50kV and a step amp repeat specimen stage

High thro ug hp ut enabled by a new PEG (Proximity Effect Correction) system High-speed da la- transfer sys tem for a large quanti ty data High-precision design for masklrelicle production

Th e JBX-9 500FS is a spot beam

lithography system developed to meet a

wi de range of applications with high

throughput and high precision periormance

This sys tem covers fields from the nanoshy

technology research to the production of

leading edge devices

f 100kV _ ZrONV Schotlky emitter

maximum 300 mm wafer

Th e JBX-6300 FS is a s p o t b ea m

lithography system developed to meet a

w ide range o f applica tions with high

resolution and high precision periormance

This system covers fields from the nanoshy

technology research to the development of

next generation devices

25 kVl50 kVl1 00 kV ZrONV Schottky emittelt

maximum 200 mm wafelt

Prod ucl Gu ide I 13

-

---------

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- --= - - - =-shy -

NMR Spectrometers

I JNM-ECAECX series FT NMR System

920 MHz magnet Photo courtesy Nationallnstrtute of Natural Sciences Institute for

Molecular Science

The JNM-ECA920 FT NMR System is a 920 MHz high-resolution NMR

spectrometer developed by JEOL This spectrometer uses the superconducting

magnet co-developed by National Institute for Materials Science and Kobe Steel

Ltd which generates the high magnetic field Created by combining Japans stateshy

of-the-art technologies this FT NMR System marks an important milestone in next

generation biology and nanotechnology which call for high-magnetic-field highshy

resclution NMR analysis

JEOL RESONANCE Inc

~ ~ ~

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~ 100

HNCACB spectrum of 13C(15N labeled Solid 23Na-MQMAS spectrum of ubiqurtin N3)P207

The JNM-ECNECX series are versatile high-performance FT NMR spectrometer

system that utilize the latest digital and high-frequency technology The ECA

spectrometer is applicable up to 1GHz and can be used for a wide range of

applications including liquidsolid NMR protein analysis and diffusion coefficient

measurement

INM-EC cd

JOO ~QO 0(1 ~uo 1)0

Spectrometer I Oscillator receiver power amplifier

Magnet IISCM Field strength 705T I 939T 11 74T 1401T 1643T

Bore diameter (mm) 54 I 54 54 54 54

Probe 5 mm Ttl tunable

11110

188T

54

JEOL RESONANCE Inc

INMmiddot fO rie ---shy

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Spectrometer Oscillator receiver power amplifier

Magnet I ISCM Field strength 705T 939T I 1174T 1401T

Bore diameter (mm) I 54 54 54 54

Probe I 5 mm TH tunable

JEOL RESONANCE Inc

14 I Produc t Guide

bull bull bull

IJNM-ECS 00 FT NMR System

bull I ASC Series

Auto Sample Changer

ASC8 (8 samples) ASC24 (24 samples)

middotmiddot iT ~ --shy

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ASC16 (16 samples) ASC64 (64 samples)

bullIJNM-ECAECX series Solid NMR

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MAS conlroller Solid NMR sampling kit

NMR Systems For Modern NMR Spectroscopy The JNM-ECS400 i s a compact two-channel

spectrometer that retains the advanced capabilities of the

JNM-ECAlECX series (required installation space is oneshy

half compared to conventional NMRs) Programmable

timing sequencers built into each RF and PFG channel

can independently control either synchronous or

asynchronous operations of each channel Its standard

tunable broadband gradient probe which integrates all

JEOLs newest technologies is the high sesitivity roomshy

tempperature probe

Ccmpact spectrometer chassis Innovaten in JEOL NMR digrtal architecture High-stability and high-accuracy digital spectrometer High-sensrtivity new tunable probe Full automalk NMR with advanced software

JEOL RESONANCE Inc

An automatic sample changer makes it

possible to measure many samples

sequentially by exchanging multiple samples

automatically one by one Five changer

models are available for 8 samples 16

samples 24 samples 64 samples and 100

samples

JEOL RESONANCE Inc

ASC100 (100 samples)

1 --0 1(10 C ppm I

Sdid 13C-CPMAS spectrum of cholk acid

Solid-NMR is a technique that measures solid samples (powder or film-like samples) This technique is also effective for measurement of samples not soluble in solvents (inorganic

samples etc) and of crystalline polymorph that is meaningful to measure at the solid state

JEOL RESONANCE Inc

Produci Guide I 15

Mass Spectrometers

I JMS-800D UltraFOCUS I JMS-700 (2) MStation Mass Spectrometer Dedicated to Dioxin Anal ys is High resolution M ass Spectrometer

JMS-800D UltraFOCUS is the optimal cho ice for ultra lowlevel race detection

applications suc h as moni torin g for dioxins and related co mpoun ds eg

Polychlorinated Biphenyls (PCBs) Polybrominated Diphenyl Ethers (PBDEs) or drugs

of abuse by high resolution-selected ion monitoring (HRSIM) gas chromatographyl

mass spectrometry(GCMS)

R-- gtn 80000 (10 valley) Sent Ily 2 3 7 8-TCDD 100fg SNgt2oo

(6 channels 100 msecch Resolution 10000)

N_ Jut J _lllgEI up to 10 kV

JMS-S3000 Matri x Assisted Laser DesorptionIonization TOFMS

The JMS-S3000 is a MALOI-TOFMS incorporating an innovative SpirarrOF ion optical

system With superior capabilities than conventional MALDI-TOFMS the JMS-S3000

provides sate-of-the-art anaiylical solutions for a wide range of research areas such as

functional synthetic polymers materials science and biomolecules

Malrix Assisled Laser Desorpllonlonization Timemiddotof-Flighl Mass Spectrometer

I JMS-T1 OOLP+DART TLC-TOFMS

Pet c 60000 (10 valley) err 02 ng of methyl stearate

SIN 400

(CVEI combination ion source) I~ ~ aJe up to 10kV

I JMS-T1 OOLP LC-TOFMS

I JMS-Tl OOGCV GC-TOFMS

middotl shyThe JMS-T100LP+DART achieves simple and fast TLCMS analysis Accurate mass The JMS-Tl00GCV is a fully automatic Gas Chromatograph - Time-ot-Flight Mass

measurement capabilit y of TOFMS also enables you to determine element Spectrometer (GC-TOFMS) This versatile MS system covers wide range of

compositions of the analytes applications in GC-MS analysis

16 I Pr oduc i Gu ide

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I JMS-Ql 050GC UltraQuad GClMS

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-

S-trapHS Headspace Autosampler

ESR Spectrometers

I JES-X3 series ESR Spectrometers

Recently it has been widely

accepted that even retatively few

unpaired electrons in a sample can

affect the function of the material so

lower detection limits (high er

sens itivity) is required of ESR

measurements JES-X3 Series has

achieved higher sensiti v i ty by

developing a lOIN-noise Gunn

oscillator for its new spectrometer

JES-X320 JEOL RESONANCE Inc

i III III )

Maximum Magnetic Field I a6ST 13T 14T

SweepW idth I --00-- 250mT plusmn001 - 500m__T_ __--l

Pole Gap _ _ 6cmm__ ___-= ___~ ____cmm__ _ I 0 = 60mcm 75 _l

Frequency Range(GHz) 8750 - 9650 _ _ _ ___-1

Field Resolution (mT) _L_ 235 Correction by Marker _1_--- Standard

I Operating System Windows 7

The JMS-01050GC is an innovative quadrupole mass spectrometer (OMS) that

achieves the highest-level sensitivity in OMS It has a high ability of evacuation due

to the use of a split flow turbo-molecular pump system (400 Lis) th at

simultaneously evacuates the ion source and the detector The use of a highshy

accuracy hyperbolic quadrupole mass analyzer provides high resolution

The S-trap is a next-generation headspace autosampler providing ultra-low

concentration measurement which was not achieved with a heads pace (HS) method

using conventional sample loop In addition the HS-GCMS system combined lith a

JMS-01050GC Mkll quaorupole MS guarantees detection of mold odor in water

down to 1 ppt

I ES-CT470 Liquid Helium Variable Temperature Controller

The ES-CT470 varies the sample temperature in the temperature range between 25 K

and 470 K Temperature setting is performed by d igital display and the set

temperature is kept constant by automatic control circui ts Combined use with a UV Irradiation device is possible A GaAs etement is used as a temperature sensor

enabling high-accuracy temperature setling

- 25 K to 470 K

plusmn001 K for 25 K to 42 K

plusmn1 orO5 K for 42 K to 470 K

_ 20 min 10 25 min (rom room temperature 08 to 2 Uh

50Hz60Hz 5mm JEOL RESONANCE Inc

Produ c t Guide I 17

Industrial Equipm nt for thin-filnl formation and nlatel ial processing

I bull

Electron Beam Source High-power Electron Beam Source

BS-60060EBS EBG-102UB6S

Electron beam sources for vacuum evaporation of metal and metal-oxide thin-films

We offer a wide variety of electron beam sources and crucibles They have features of

excellent beam spot and energy density and high-speed sweeping

1 PGBS 80020CPPS Plasma Source

BS-80011 BPG (6kW) BS-8002OCPPS (3kW)

Plasma Sources are installed in a vacuum chamber and generate high-density plasma

Used as Ion Plating (Plasma Assisted Deposition) and it is possible to improve film

properties for optilcal thin films protective films and function films Because highshy

density plasma can be generated in a mass space high-rate deposition to a large area

is possible

I RF Induction Plasma System

JEBG-3000UB(300kW) JEBG-1 OOOUB(1 OOkW)

High-power electron beam sources for vacuum evaporation of metal and metal-oxide

for wide plastic films or large glass plates that are continuously fed And they can also

be used for vacuum melting of high-melting point metals

raes

RF Generator

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RF-12030 (3kW) RF-56000 (Controller)

13 56MHz radio-frequency power supplies for plasma generation and used for

sputtering CVD etching and ion-plating We offer 750W to 6kW generators and

matching networks

DR Powder Feeder

Thermal plasma around 10000degC (15000deg F) by RF inductive coupling This thermal Fine powder feeder that can feed 01 to 100 11m size fine powder continuously with

plasma is used for nano powder synthesis fine powder spheroidization thick film carrier gas We offer optional feeding rate controller and large capacity hopper

deposition multi composite membrane synthesis CVD and harmful gas

decomposition

18 I Produci Guide

---

Biochemical Analyzers

I JCA-BM series Clinical Chemistry Analyzer BioMajesty Series

JEOLs micro volume technology and unique sample pre-dilution mechanism realizes

high throughput chemistry analysis with reduced sample and reagent volume

More than 4000 systems have been placed in clinical laboratories allover the world

JCA-BM6050

I JCA-BMBOOO series Ultra High Throughput Clinical Chemistry Analyzer

4 4

JCA-BMB060 egt

JCA-BMSOOO series offer ultra high throughput chemistry analysis up to 9000 testsl

hour

The pre-dilution unit one of the BioMajesty family features also continues the strong

tradition in these series with interconnected multiple analysis modules the key factors

that accomplish brilliant high throughput as well as downtime reduction with back-up

capability

I JCA-BM6070 High Throughput High Performance Clinical Chemistry An alyzer

I I I

A Clinical chemistry analyzer with incomparable speed and accuracy which achieves

high throughput of 2400 testslhour (includ ing ISE) The incorporated compact

workstation and user-friendly Interface with excellent operability leads the new trend of

the laboratory testing

BioMajesty Series lCA-BM 6010 lCA-BM 6050

lCA-8M 6070 leA-BM 91 30

lCA-BM 8000 Series

bull This product is distributed outside Japan by Siemens Heatthcare Diagnostics under the ADVtAreg brand name

I JCA-BM601 OC Compact amp High Performance Clinical Chemistry Analyzer

-~-I -

1lIIIIIIilllllllllJllnlIlII Ii I JCA-BM6010C is a compact but efficient automatic analyzer that maintains the basic

concept of BioMajesty series while achieving the excellent capability of microanalysis

with sample volume as small as 1 J1L

BM6010C also offers fully automated HbA1 c analysis with on-board hemolysis

(optional) Simultaneous measurement of Glucose and HbA1c improves laboratory

workflow

Product Guid e I 19

S~~MCEAII Certain products in this brochure are controlled under the Foreign 0J 0014007 -v- ~ Exchange and Foreign Trade Law of Japan in compliance with $ ~~~ international security export control JEOL Ltd must provide the~2 m) IIlt Japanese Government with End-users Statement of Assurancel A MGMT SYS

AvA ~ m and End-use Certificate in order to obtain the export license - tiJ needed for export from Japan If the product to be exported is in this category the end user will be asked to fill in these certificate formsdEOLIS09001 amp150 14001CenrfiCltlled

httpwwwjeolcomdEOL JEOL Ltd 1-2 Musashino 3-chome Akishima Tokyo 196-8558 Japan Sales Division Telephone+81-42-528-3381 Facsimile+81-42-528-3386

ARGENTINA COASIN SAClyF Virrey del Pino 4071 1430 Buenos Aires Argentina Telephone 54-11-4552-3185 Facsimile 54-11-4555-3321

AUSTRALIA amp NEW ZEALAND JEOL(AUSTRALASJA) PtyUd Suite 1 L2 18 Aquatic Drive - Frenchs Foresl NSW 2086 Australia Telephone 61-2-9451-3855 Facsimile 61-2-9451-3822

AUSTRIA JEOL (GERMANY) GmbH Oskar-Von-Miller-Strasse 1 a 85386 Eching Gennany Telephone 49-8165-77346 Facsimile 49-8165-77512

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BELGIUM JEOL (EUROPE) BV Planet ll Gebouw B Leuvensesteenweg 542 B-1930 Zaventem Belgium Telephone 32-2-720-0560 Facsimile 32-2-720-6134

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CHINA JEOL(BEIJING) CO LTD Room Bl0l0l110 Wantong New Wond Plaza No2 Fuchengmenwai Street XIcheng District Beijing 100037 PRChina Telephone 86-10-6804-6321 Facsimile 86-10-6804-6324

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N1601 World Trade Center Building 371-375 Huan Shi Road East Guang Zhou Guangdong Prov 510095 PRChina Telephone 86-20-8778-7848 Facsimile 86-20-8778-4268

JEOL (BEIJING) CO LTD WUHAN BRANCH

Room A2117 Zhongshang Plaza Office Bldg NO7 Zhongnan Road Wuhan Hubei 430071 PRChina Telephone 86-27-8713-2567 Facsimile 86-27-8713-2567

JEOL LTD (BEIJING) CO LTD CHENGDU BRANCH 1807A Zonglu Building NO 35 Zhongfu Road Chengdu Sichuan 610016 PR China Telephone 86-28-86622554 Facsimile 86-28-86622564

EGYPT JEOL SERIVCE BUREAU

3rd Fl Nile Center Bldg Nawal Slree Dokkl (Cairo) Egypt Telephone 20-2-3335-7220 Facsimile 20-2-3338-4186

FRANCE JEOL (EUROPE) SAS Espace Claude Monet 1 Allee de Giverny 78290 Crolssy-sur-Seine France Telephone 33-13015-3737 Facsimile 33-13015-3747

GERMANY JEOL (GERMANY) GmbH Oskar-Von-Miller-Strasse 1 a 85386 Eching Gennany Telephone 49-8165-77346 Facsimile 49-8165-77512

GREAT BRITAIN amp IRELAND JEOL (UK) LTD JEOL House Silver Court Watchmeaci Welwyn Garden City Herts AL71LT UK Telephone 44-1707 -377117 FaCSimile 44-1707-373254

GREECE N ASTERIADIS SA

56-58S Trikoupl Str PO Box 26140 GR-10022 Athens Greece Telephone 30-1-823-5383 Facsimile 30-1-823-9567

HONG KONG FARMING LTD

Unit No1 009 1 OF Prosperity Milennia Plaza 663 Kings Road North Point Hong Kong Telephone 852-2815-7299 Facsimile 852-2581-4635

INDIA JEQL INDIA Pvt Ltd

Elegance Tower Level 2 2128 Old Mathura Road Jasola Business District Centre Near Apollo Hospital Jasola New Delhi 110025 India Telephone 91-11-6472-2578 Facsimile 91-11-4060-1235

BLUE STAR LTD (HQ Mumbaij

Analyticallnstrments Department Sahas 41412 Veer Savarkar Marg Prabhadery Mumbai 400 025 India Telephone 91-22-6666-4000 Facsimile 91-22-6666-4001

BLUE STAR LTD (DelhQ Analytical Instruments Department E-4412 Okhla Industrial Area Phase-II New Delhi 110 020 India Telephone 91-11-4149-4000 Facsimile 91-11-4149-4005

BLUE STAR LTD (Calcutta)

Analylicallnstruments Department 7 Hare Street Calcutta 700 001 India Telephone 91-33-2213-4133 Facsimile 91 -33-2213-4102

BLUE STAR LTD (ChennaO Analytical Instruments Department No 46 Garuda Building Cathedral Road Chennai 600 086 India Telephone 91-44-4244-4000 Facsimile 91-44-4244-4190

INDONESIA PT TEKNOLABindo Penta Perkasa Komplek Gading Bukillndah Blok lIll JI Bukfl Gading Raya Kelapa Gading Pennai Jakarta 14240 Indonesia Telephone 62-21-458470575859 Facsimile 62-21-45842729

ITALY JEOL 0TALIA) SpA Centro Direzionale Green Office Via dei Tulipani 1 20090 Pieve Emanuele (MI) Italy Telephone 39-02-9041431 Facsimila 39-02-90414343

KOREA JEOL KOREA LTD

Dongwoo Bldg 7F 1443 Yangjae Daero Gangdong-Gu Seoul 134-010 Korea Telephone 82-2-511-5501 Facsimile 82-2-511-2635

KUWAIT Ashraf amp CO Ltd WLL PO Box 3555 Safat 13036 Kuwait Telephone 965-1805151 Facsimile 965-24335373

MALAYSIA JEOL(MALAYSIA) SDNBHD(3S9011-M)

205 Block A Mezzanine Floor Kelana Business Center 97 Jalan SS 72 Kelana Jaya 47301 Petaling Jaya Selangor Malaysia Telephone 60-3-7492-7722 Facsimile 60-3-7492-7723

MEXICO JEOL DE MEXICO SA DE CV

Arkansas 11 Piso 2 Colonia Napoles Delegacion Benito Juarez CP 03810 Mexico DF Mexico Telephone 52-5-55-211-4511 Facsimile 52-5-55-211-0720

PAKISTAN (KarachI) ANALYTICAL MEASURING SYSTEM (pvn LTD(AMS LTD)

14-C Main Sehar Commercia) Avenue Lane 4 Khayaban-e-Sehar DHA-VII Karachimiddot75500 Pakinstan Telephone 92-21-353455813534074735346057-8 Facsimile 92-21-35345582

PANAMA PROMED SA Parque Industrial Costa del Este Urbanizacion Costa del Este Apartado 0816-01755 Panama Panama Telephone 507-303-3100 FaCSimile 507-303-3115

PHILIPPINES PHILAB INDUSTRIES INC

7487 Bagtikan Street SAY Makati 1203 Metro Manila Phillip pines Telephone 63-2-896-7218 Facsimile 63-2-897-7732

PORTUGAL Izasa Portugal Lda A do Proletariado 1 2790-138 CARNAXIDE Portugal Telephone 351-21-424-73-00 Facsimile 351-21-418-60-20

RUSSIA JEOL (RUS) LLC Krasnoproletarskaya Street 16 Bid 2 127473 Moscow Russian Federation Telephone 7-495-748-7791rr792 Facsimile 7-495-748-7793

SAUDI ARABIA ABDULREHMAN ALGOSAIBI GTC (Riyadh)

King Abdulaziz Avenue PO Box 215 Riyadh 11411 Saudi Arabia Telephone 966-1-479-3000 Facsimile 966-1-477-1374

SCANDINAVIA SWEDEN JEOL (Skandinaviska)AB

Hammarbacken 6A Box 716191 27 Sollentuna Sweden Telephone 46-8-28-2800 Facsimile 46-8-29-1647

SERVICE amp INFORMATION OFFICE NORWAY JEQL (Skandinaviska)AB

Lorenvangen 23 0580 Oslo NORWAY Telephone 47-2-2-64-7930 Facsimile 47-2-2-65-0619

FINLAND JEOL (Skandlnaviska)AB

Ylakaupinkuja 2 FIN-02360 Espoo Finland Telephone 358-9-8129-0350 Facsimile 358-9-8129-0351

SINGAPORE JEOLASIA PTE LTD

2 Corporation Road 1t01-12 Corporation Place Singapore 618494 Telephone 65-6565-9989 Facsimile 65-6565-7552

SOUTH AFRICA ADI Scientific (Pty) Ltd

370 Angus Crescent Northlands Business Park 29 Newmarket Road

~~=~g~~~2~~1nt~~2_~~~bIlC of South Africa

Facsimile 27-11 -462-1466

SPAIN IZASA SA

Argoneses 13 28100 Alcobendas (poligono IndustriaQ Madrid Spain Te~phone 34-91-663-0500 Facsimile 34-91-663-0545

SWITZERLAND JEOL (GERMANY) GmbH Oskar-Von-Miller Strasse 1 85386 Eching Germany Telephone 49-8165-77346 Facsimile 49-8165-77512

TAIWAN For EO ProQucts JIE DONG CO LTD 7F 112 Chung Hsiao East Road Section 1 Taipei Taiwan 10023 Republic of China Telephone 886-2-2395-2978 Facsimile 886-2~2322-4655

For Mass Spectrometer Products Mass Solutions Technology Co Ltd

5F No79 Sec 1 Xintai 5th Rd Xlzhi Dis New Taipei City 221 Taiwan Republic of China Telephone 886-2-2698-9511 Facsimile 886-2-2698-9512

For Semiconductor Products JEOL TAIWAN SEMICONDUCTORS LTD

11 F-l No 346 Pei-Da Road Hsin-Chu City 300 Taiwan Republic of China Telephone 886-3-523-8490 Facsimile 886-3-523-8503

THAILAND BECTHAI BANGKOK EQUIPMENT amp CHEMICAL CO Ltd

300 Phaholyothin Rd Phayathai Bangkok 10400 Thailand Telephone 66-2-615-2929 Facsimile 66-2-615-23502351

THE NETHERLANDS JEOL (EUROPE) Bv Ureweg 4 NL-2153 PH Nieuw-Vennep The Nelherlands Telephone 31-252-623500 Facsimile 31-252-623501

TURKEY TEKSERAS Kayisdagi )nonu MahKartal Cad No553 34755 Atasehir Istanbul Turkey Telephone 90-216-5736470 Facsimile 90-216-5736475

UAE MRS Group Dubai POBox 171612 Rashid Abdulla AI Noami Building Suite No 306 Damascus Street AI Qusais-3 Dubai UAE Telephone 971-4-2581141 Facsimile 971-4-2581151

JEOLGulf

POBox 171612 bull Rashid Abdulla AI Noami Building Suite No 306 Damascus Street AI Qusais-3 Dubai UAE Telephone 971-553964219(mobile)

USA JEOL USA INC 11 Dearborn Road Peabody MA 01960 USA Telephone 1-978-535-5900 Facsimile 1-978-536-22052206

JEOL USA INC WEST OFFICE

~~s~~~~~rigAe9~5t~~1 1 0 Telephone 1-925-737-1740 Facsimile 1-925-737-1749

VENEZUELA GOMSA Service and Supply CA

Urbanizacion Montalban JlI - Resldenclas Don Andres - Piso 7 - Apartomento 74 Avenida 3 entre calles 7 y 6 Montalban Caracas Venezuela Telephone 58-212-443-4342 Facsimile 58-212-443-4342

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No 13-Lot 12 Trung Yen Trung Hoa Street Cau Giay Dist HanOi Vietnam Telephone 84-4-562-051617562-0535 Facsimile 84-4-853-2511

No 0205B389C Printed in Japan Kp

Page 4: Introduction - Главное управление науки БГУresearch.bsu.by/wp-content/uploads/2015/06/JEOL_Product...Scanning Electron Microscope The JSM-6610 is a high-performance

I

11 L bull bull 1 ~

EM-~800 Multi-Purpose Analytical Electron Microscope

The JEM-2800 is a new TEM that achieves

nano-area analysis through Automation and

Convenience while being Easy- to-use so

that expert results can be achieved by

operators of any skill level Its advanced

electron optical system makes IT possible to

periorm high-resolution TEM and STEM

imaging EDS EELS tomography and

in-situ observation on the same sample

wilhout sacrificing any of Ihese capabil ities

02 nm (STEM) 01 nm (rEM)

1 100 kV 200 kV x 100 to 200000000

EM 2100 Electron Microscope

-r__bull

I JED-2300T

The JEM-2100 is a new-generation 200 kV

analytical electron microscope The JEMshy

2100 which incorporates an integrated PC

system for various functions WITh excellenl

cost performance supports research and

development in wide scienlific fields ranging

from biotechnology to materials science

Pont liJtI 019 nm ~=I nlng vrl qe 80 10 200 kV

Ilagnl 11 X50 to 1500000

JEM-1400Plus Electron Microscope

The JEM-1400Plus is a versatile

transmission electron microscope (rEM) for

a wide range of applications including

biology polymers nano technology and

advanced materials

The JEM-1400Plus uses a single camera for

imaging for view area seach (x10) to data

aquisition

New operation panels with the organic EL

buttons give you simple and intut ive

operation

p~ f -11)(1 02 nm

r- u 40 10120 kV x l0tol2ooOOO

Energy Dispersive X-ray Spectrometer

The JED-2300T installed on a TEM can

easily perform qualitativequantitative

analysis and linea rea analysis of

microareas WITh high energy resolution This bull EDS employs a JEOLs unique ultra-thin

window detector with gate valve protection

mechanism making it possible to obtain

high-sensitivity analysis data particularly

from light elements

Ivl I (d _ -II(I~

QualitativequantITative analysiS linearea analysis AI Iflltgtie elements Be to U B to U or Na to U

Prod uc l G u ide I 05

- -

I I lilllll

II 1111 111111 11111111

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Scanning Electron Microscopes

JSM 7800F Field Emission Scanning Electron Microscope

I JSM-7600F Field Emission Scanning Electron Microscope

The JSM-7600F is a state-of-the-art thermal

FE-SEM th at successfu ll y combines

ultrahigh-resolution imaging with optimized

analytical functionality such as high-speed

high-accuracy analyses

10 nm (15 kV) 15 nm (1 kV) 01 to 30 kV

x 25 to 1000000

JSM-7 OOF Field Emi ss ion Scanning Electron Microscope

l 8

I II

The JSM-7800F equipped with a newly developed super hybrid objective lens is a

cutting-edge thermal FE-SEM that successfully combines ultrahigh-resolution

imaging with fast and high-accuracy elemental analysis Magnetic specimens can

be observed and analyzed at high magnification The JSM-7800F also enables

researchers various analyses such as EDS WDS EBSD and CL

bull08 nm (15 kV) 12 nm (1 kV)

001 to 30 kV

x25 to 1000000

JSM 7500F Field Emission Scanning Electron Microscope

The JSM-7500F developed for

nanostructure characterization is equipped

with the Gentle Beam function which

enables researchers observation atI(~ x 100000 magnification even with 100 V low electron energy ~ ~tn~ ~=--

- - - 10 nm (15 kV) 14nm (1 kV)Jllshyf -diy Ollaqb 0 1 to 30 kVoG -- ~ Wll X25 to 1000000- rr

-

The JSM-7100F is a versatile high performance analytical FE SEM The electron

optics produces the maximum 200 nA probe current with the patented in-lens

thermal FEG and a small probe diameter even at large probe currents with the

patented aperture angle optimizing lens

The objective lens is the field free type This lens is suitable for high precision EBSD

analysis and characterization of a magnetic specimen

The vacuum system employing a TMP combined and a specimen exchange airlock

chamber A life of emitter is prolonged by the high quality vacuum in the gun

chamber

gt= - 12nm (30 kV) 30nm (1 kV) 02 to 30 kV

x 10 to 1000000

06 I Producl Guide

---------

I )SM-66 0 Scanning Electron Microscope

The JSM-6610 is a high-performance SEM

that is equipped with a superb electron

optical system and a general-purpose largeshy

specimen chamber to accommodate a

specimen up to 200 mm diameter The _JSM-6610 incorporates newly designed

__

_- ~I software for easier SEM operations in a

variety of applications

I J5M-ALA series Analytical Scanning Electron Microscopes

The JED-2300 EDS developed by JEOL is

embedded in the compact SEMs The

footprint is same as that of the basic SEM

The SEM and EDS are operated as one

seamless system to provide comfortable

and efficient operation A SDD type EDS

detector does not require liquid nitrogen

EDS analysis is ready whenever you need it

Resolution HV 30 nm

LV 40nm 40nm

Magnification

Accelerating voltage 05 shy 30 kV

x5 shy 300000

03 shy 30 kV

I JASM-6200 C airScor etrade Atmospheric Scanning Electron Microscope

I SM-6510 Scanning Electron Microscope

The JSM-6510 is a high-performance SEM

that is equipped with a superb electron

optical system same as the JSM-6610 and

a general-purpose specimen chamber to

accommodate a specimen up to 150 mm

diameter The JSM-651 0 incorporates

newly designed software for easier SEM

operations in a variety of applications

II 1 30 nm ltr-- rr TJ 01 qamp 05 to 30 kV M~1fIIC3IKlr x5 to 300000

J5 -LV series Low Vacuum SEMs

The low vacuum SEM consists of a

conventional high vacuum mode and a low

vacuum (LV) mode One can select the

vacuum mode with a click on the menu

The LV mode enables one to observe and

analyze non-conductive specimens The

specimen chamber is kept at low vacuum

so that highly out-gassing specimens can

be easily observed

1-lhlIt

Resolution HV 30 nm

LV 40 nm

Low vacuum range 10-270 Pa

The JASM-6200 allows high-resolution light microscopeSEM observation at

atmospheric pressure A specimen is held at normal atmospheric pressure Dynamic

observation of physical or chemical reactions can be made in liquid or gas In addition

for biological applications difficult dehydration and drying processes are not needed

dramatically reducing specimen pre-treatment time

Bnm Imiddot 102030 kV

II

Product Guide I 07

JSM-60l0 AILV InTouchScope

)shy -

JSM-6010LA

I JCM 6000 NeoScopeTM

The InTouchScope incorporates a highly intuitive SEM interface with multi-touch

technology The user can expand application windows and orchestrate aJl functions

just by touching the screen

40 nm (20 kV) 50 nm (20 kV)

05 1020 kV x810 300000

JCM-6000 NeoScopen~ let you observe a specimen at much higher magnification

than a light microscope with the same simple operation of a light microscope The

observation image appears automatically when a specimen is inserted and you can

go up to the maximum magnification of x60OOO quickly with the automated

operations

JCM-6000 NeoScopem is equipped with a TMP for quick start

The installation is easy The wall outlet (100V AC) is the only utility needed Cooling

water is not necessary

FX X10 10 60000

SI - Max 70mm dia

Ion Beam Application Equipment

pIB-09010 Cross Section Polisher (CP)

The IB-090 10CP Cross Section Polisher

makes a cross sect ion by irradiating a

spec imen with argon ion beam along an

edge of a shield plate placed on a

specimen This is an innovative specimen

preparation device for specimens studied in

SEM and EPMA

IIB-09020C Cross Section Polisher (C PIT)

The IB-09020CP Cross Section Polisher

(CPIT) creates a cross section in a manner

similar to the IB-09010CP Its built-in CCO

camera al lows real-time monitoring of a

cross-section during polishing

08 I Product Guide

I J18-4601 MuIti Beam System

I J -4501 MultiBeam System

EM-091001S Ion Slicer

The JIB-4501 MultiBeam System achieves

surfaceinternal 3D imaging and analysis

with simple operation This system also

has optimum geometry for all functions

from FIB SEM observation to EDSEBSD

analyses

R~ Iul N 5 nm (FIB) 25 nm (SEM) A I tlrx] I J 03 kV to 30 kV

(5 kV steps) Magl1lhcnli X30 10 300000

(observation milling)

The Ion Slicer can easily prepare thin-film

specimens for TEM without special skill Prior

treatment required for the Ion Slicer is only to

mechanically polish a specimen to 01 mm

thick The optimally set Ar ion beam provides

high-quality thin films In addition this

innovative tool suppresses specimen damage

and contamination such as lattice distortion

induced by mechanical polishing and

oxidation on specimen suriaces by chemical

treatment The Ion Slicer is an echo-friendly

efficient specimen-preparation tool

The JIB-4601 F MultiBeam System unites the unique imaging and analytical capabilities

of the High Power Optics employed in the TFE SEM and a high-performance FIB

column in a highly efficient and powerful system The JIB-4601 F offers an easy-to-use

tool for highly automated sample preparation combined with high-resolution imaging

and sub-micron analysis of the specimen cross-section

5 nm (FIB) 12 nm (SEM) 02 kV to 30 kV (5 kV sleps)

x30 to 1000000 (observation milling)

I J18-4000 Focused Ion Beam System

Top of the line high-throughput

processing

Compact size for flexible layout shy

Installation space reduced by 20

(compared to JEOL conventional

models)

Superb performance at low accelerating

voltage

Stage Navigation System for fast

determination of observation position

R-_ lit I f1 5 nm ICIIH~ltn lJIO ltJi 1 to 30 kV

M~Q I I x60 (for searching field) X200 to 300000

IIB09060CIS Cryo Ion Slicer

The IB-09060CIS Cryo Ion Slicer

incorporates a specimen cooling

mechanism in the EM-091001S Ion Slicer

for easy preparation of thin filmscross bull I J sections even for specimens susceptible

to thermal damage

J

~

Producl Guide I 09

- ---- shy

_bullbull- _ bullbull 1

- - -~

[Peripheral Equipment ]

IJIC 410 HDT400 JEE-420 series Ion Cleaner Hydrophilic Treatment Device Vacuum Evaporators

The JIC-41 0 Ion Cleaner removes hydrocarbon

contamination on TEM specimens by exposing

specimens in glow discharge

The treated specimens do not build up contamination

during observation in a TEM

JEC560 Auto Carbon Coater

The HDT-400 applies hydrophilic treatment on TEM

grids and SEM specimen mounting blocks The entire

operation is automated

IJFC-1600 Auto Fine Coater

O ~ - --=shy

The JEE-420 vacuum evaporator applies coating on

SEM or TEM specimens with a variety of materials

including gold platinum carbon chromium The JEEshy

420 applies shadowing on TEM specimens

- - C- Ooshy o --nu _ __ a 0 0 0 0

The JEC-560 rapidly applies carbon coating on non-conductive specimens for The JFC series sputter coater applies metal coating on SEM specimens quickly Gold

element analysis with a scanning electron microscope or an electron probe micro gold-palladium and platinum can be applied

analyzers

JED23002300F Energy Dispersive X-ray Spectrometers

Dry SO Detector

The JED-23002300F is installed on a SEM or an EPMA and performs elemental This unique box type Dry SD detector is designed for JSM-651 0 and JSM-601 0 series

analysis on micro areas The Dry SD detector an SDD type detector is cooled SEM The detector is positioned at the optimum position

electrically It does not need liquid nitrogen cooling so that maintenance is not

required Analysis Station the unique EDS analysis software is versatile with simple

operation

All y A~Ilrn System that links observed images with analysis data

inlIytl(oIIUI1Chi1$ Qualitativequantitative analysis linearea analysis

10 I Producl Guide

------

f

Instruments for Microarea and Surface Analysis

IjXA-8530F Field Emission Electron Probe Microanalyzer

The JXA-8530F features an improved hardware that is used in the JXA-8500F (the first

FE-EPMA in the world) as well as newly designed user-friendly PC-GUI windows for

efficient analysis and data operation The FE gun of the JXA-8530F provides not only a

spatial (analysis) resolution of the order of 01 IJm but also high-sensitivity X-ray

detection at low accelerating voltages and large probe currents

IjPS-9200 Photoelectron Spectrometer (XPS)

The JPS-9200 is an XPS that provides microarea analysis A newly developed microshy

tens enables high-sensitivity analysis from macro to microareas Its stage accepts both

standard-size samples (10X 10X2 mm) and large samples (up to gO mm in diameter)

The stage-scan mapping method allows the acquisition of photoelectron images

ranging from low magnification (50 x 18 mm) to high magnification (spatial resolution

30lJm)

I jAMP-9500F Field Emission Auger Microprobe

fl

X 8230 Electron Probe Microanalyzer

D

~) ~ j ) ~ =~=

The JXA-8230 is a newly developed EPMA which succeeds a proven JEOL EPMA

hardware and features newly designed user-friendly PC-GUI windows for efficient

analysis and data operation Sophisticated analysis menus are designed so that the

user can easily access target material analyses offering stress-free operations

I jPS-901 0 series Photoelectron Spectrometers (XPS)

XPS with high-sensitivity and high-resolution is compactly designed on the basis of

JEOLs many years of basic and application technologies on electrostatic lenses

analyzers etc The low-acceleration and large-current ion guns dedicated to permit

XPS analysis of thin films with different thicknesses from surface atomic layers to

micron order thick specimen layers The specimen chamber and etching chamber are

separated from each other in terms of vacuum thus completely preventing the

contamination due to sputtering and facilitating the maintenance of ultrahigh vacuum

A field-emission Auger Microprobe featuring the worlds highest spatial resolution with

the minimum probe diameter of 3 nm (for secondary-electron image) and 8 nm (for

Auger analysis) The new hemispherical electrostatic energy analyzer (HSA) with a

multi-channel detector optimized for Auger analysis is suitable for chemical-state

analysis The neutralizing ion gun allows Auger analysis of insulating materials Its

specimen stage accommodates a large sample of up to 95 mm in diameter Also it is

expandabfe for an UHV-SEM

ProduCI Guide I 11

X-ray Fluorescence Spectrometers

I ISX 400Rll Element Analyzer

An energy-dispersive X-ray fluorescence spectrometer for environmental analysis

which helps you comply with environmental regulations for hazardous substances

such as the RoHS and ELV directives in the EU and soil pollution in Japan You can

easily analyze minute traces of Cd Pb Hg Cr etc This analyzer is also suitable for

general analySiS including element analysis and thickness measurement using the FP

(fundamental parameter) method

I JSX-31 OORll Element Analyzer

An energy-dispersive X-ray fiuorescence spectrometer for environlnlntal analysis which helps you

comply with environmental regulations for hazardous substances such as the RoHS and ELV

directives in the EU and soil pollution in Japan This analyzer inoorporates a JEOL-made electrically

cooled Si(u] detector making liquid nrtrogen unnecessary as well as providing high sensitivity for

heavy-element analysis such as Cd Pb and Hg This analyzer is also surtable for general analysis

including eement analysis and thickness measurement using the FP (fundamental parameter)

method

12 I Product Guide

Semiconductor Eq Ipm nt

2 Electron Beam Lithography System

-5

Electron Beam Lithography System

r

Electron Beam Lithography System

-~=-~--I--~ I

~ ~ ~-

Th e JBX-3200MV is an e lec lro n bea m lithography system developed for the production of next generation ultrahigh-precision masks and reticles This system employs a variableshyshaped electron beam o f 50kV and a step amp repeat specimen stage

High thro ug hp ut enabled by a new PEG (Proximity Effect Correction) system High-speed da la- transfer sys tem for a large quanti ty data High-precision design for masklrelicle production

Th e JBX-9 500FS is a spot beam

lithography system developed to meet a

wi de range of applications with high

throughput and high precision periormance

This sys tem covers fields from the nanoshy

technology research to the production of

leading edge devices

f 100kV _ ZrONV Schotlky emitter

maximum 300 mm wafer

Th e JBX-6300 FS is a s p o t b ea m

lithography system developed to meet a

w ide range o f applica tions with high

resolution and high precision periormance

This system covers fields from the nanoshy

technology research to the development of

next generation devices

25 kVl50 kVl1 00 kV ZrONV Schottky emittelt

maximum 200 mm wafelt

Prod ucl Gu ide I 13

-

---------

-_ -~

- --= - - - =-shy -

NMR Spectrometers

I JNM-ECAECX series FT NMR System

920 MHz magnet Photo courtesy Nationallnstrtute of Natural Sciences Institute for

Molecular Science

The JNM-ECA920 FT NMR System is a 920 MHz high-resolution NMR

spectrometer developed by JEOL This spectrometer uses the superconducting

magnet co-developed by National Institute for Materials Science and Kobe Steel

Ltd which generates the high magnetic field Created by combining Japans stateshy

of-the-art technologies this FT NMR System marks an important milestone in next

generation biology and nanotechnology which call for high-magnetic-field highshy

resclution NMR analysis

JEOL RESONANCE Inc

~ ~ ~

~t~-

~ 100

HNCACB spectrum of 13C(15N labeled Solid 23Na-MQMAS spectrum of ubiqurtin N3)P207

The JNM-ECNECX series are versatile high-performance FT NMR spectrometer

system that utilize the latest digital and high-frequency technology The ECA

spectrometer is applicable up to 1GHz and can be used for a wide range of

applications including liquidsolid NMR protein analysis and diffusion coefficient

measurement

INM-EC cd

JOO ~QO 0(1 ~uo 1)0

Spectrometer I Oscillator receiver power amplifier

Magnet IISCM Field strength 705T I 939T 11 74T 1401T 1643T

Bore diameter (mm) 54 I 54 54 54 54

Probe 5 mm Ttl tunable

11110

188T

54

JEOL RESONANCE Inc

INMmiddot fO rie ---shy

)Ol~ ~1111 011 Oll

Spectrometer Oscillator receiver power amplifier

Magnet I ISCM Field strength 705T 939T I 1174T 1401T

Bore diameter (mm) I 54 54 54 54

Probe I 5 mm TH tunable

JEOL RESONANCE Inc

14 I Produc t Guide

bull bull bull

IJNM-ECS 00 FT NMR System

bull I ASC Series

Auto Sample Changer

ASC8 (8 samples) ASC24 (24 samples)

middotmiddot iT ~ --shy

~ I -~Au

ASC16 (16 samples) ASC64 (64 samples)

bullIJNM-ECAECX series Solid NMR

=- ~

I

l l

bull

0 5ilJl

0

MAS conlroller Solid NMR sampling kit

NMR Systems For Modern NMR Spectroscopy The JNM-ECS400 i s a compact two-channel

spectrometer that retains the advanced capabilities of the

JNM-ECAlECX series (required installation space is oneshy

half compared to conventional NMRs) Programmable

timing sequencers built into each RF and PFG channel

can independently control either synchronous or

asynchronous operations of each channel Its standard

tunable broadband gradient probe which integrates all

JEOLs newest technologies is the high sesitivity roomshy

tempperature probe

Ccmpact spectrometer chassis Innovaten in JEOL NMR digrtal architecture High-stability and high-accuracy digital spectrometer High-sensrtivity new tunable probe Full automalk NMR with advanced software

JEOL RESONANCE Inc

An automatic sample changer makes it

possible to measure many samples

sequentially by exchanging multiple samples

automatically one by one Five changer

models are available for 8 samples 16

samples 24 samples 64 samples and 100

samples

JEOL RESONANCE Inc

ASC100 (100 samples)

1 --0 1(10 C ppm I

Sdid 13C-CPMAS spectrum of cholk acid

Solid-NMR is a technique that measures solid samples (powder or film-like samples) This technique is also effective for measurement of samples not soluble in solvents (inorganic

samples etc) and of crystalline polymorph that is meaningful to measure at the solid state

JEOL RESONANCE Inc

Produci Guide I 15

Mass Spectrometers

I JMS-800D UltraFOCUS I JMS-700 (2) MStation Mass Spectrometer Dedicated to Dioxin Anal ys is High resolution M ass Spectrometer

JMS-800D UltraFOCUS is the optimal cho ice for ultra lowlevel race detection

applications suc h as moni torin g for dioxins and related co mpoun ds eg

Polychlorinated Biphenyls (PCBs) Polybrominated Diphenyl Ethers (PBDEs) or drugs

of abuse by high resolution-selected ion monitoring (HRSIM) gas chromatographyl

mass spectrometry(GCMS)

R-- gtn 80000 (10 valley) Sent Ily 2 3 7 8-TCDD 100fg SNgt2oo

(6 channels 100 msecch Resolution 10000)

N_ Jut J _lllgEI up to 10 kV

JMS-S3000 Matri x Assisted Laser DesorptionIonization TOFMS

The JMS-S3000 is a MALOI-TOFMS incorporating an innovative SpirarrOF ion optical

system With superior capabilities than conventional MALDI-TOFMS the JMS-S3000

provides sate-of-the-art anaiylical solutions for a wide range of research areas such as

functional synthetic polymers materials science and biomolecules

Malrix Assisled Laser Desorpllonlonization Timemiddotof-Flighl Mass Spectrometer

I JMS-T1 OOLP+DART TLC-TOFMS

Pet c 60000 (10 valley) err 02 ng of methyl stearate

SIN 400

(CVEI combination ion source) I~ ~ aJe up to 10kV

I JMS-T1 OOLP LC-TOFMS

I JMS-Tl OOGCV GC-TOFMS

middotl shyThe JMS-T100LP+DART achieves simple and fast TLCMS analysis Accurate mass The JMS-Tl00GCV is a fully automatic Gas Chromatograph - Time-ot-Flight Mass

measurement capabilit y of TOFMS also enables you to determine element Spectrometer (GC-TOFMS) This versatile MS system covers wide range of

compositions of the analytes applications in GC-MS analysis

16 I Pr oduc i Gu ide

- -

---

1----- 1- - - I - =---shy= bull --tJ~ 1- _ ~ __ ~-=--_~

I JMS-Ql 050GC UltraQuad GClMS

cJEOL

-

S-trapHS Headspace Autosampler

ESR Spectrometers

I JES-X3 series ESR Spectrometers

Recently it has been widely

accepted that even retatively few

unpaired electrons in a sample can

affect the function of the material so

lower detection limits (high er

sens itivity) is required of ESR

measurements JES-X3 Series has

achieved higher sensiti v i ty by

developing a lOIN-noise Gunn

oscillator for its new spectrometer

JES-X320 JEOL RESONANCE Inc

i III III )

Maximum Magnetic Field I a6ST 13T 14T

SweepW idth I --00-- 250mT plusmn001 - 500m__T_ __--l

Pole Gap _ _ 6cmm__ ___-= ___~ ____cmm__ _ I 0 = 60mcm 75 _l

Frequency Range(GHz) 8750 - 9650 _ _ _ ___-1

Field Resolution (mT) _L_ 235 Correction by Marker _1_--- Standard

I Operating System Windows 7

The JMS-01050GC is an innovative quadrupole mass spectrometer (OMS) that

achieves the highest-level sensitivity in OMS It has a high ability of evacuation due

to the use of a split flow turbo-molecular pump system (400 Lis) th at

simultaneously evacuates the ion source and the detector The use of a highshy

accuracy hyperbolic quadrupole mass analyzer provides high resolution

The S-trap is a next-generation headspace autosampler providing ultra-low

concentration measurement which was not achieved with a heads pace (HS) method

using conventional sample loop In addition the HS-GCMS system combined lith a

JMS-01050GC Mkll quaorupole MS guarantees detection of mold odor in water

down to 1 ppt

I ES-CT470 Liquid Helium Variable Temperature Controller

The ES-CT470 varies the sample temperature in the temperature range between 25 K

and 470 K Temperature setting is performed by d igital display and the set

temperature is kept constant by automatic control circui ts Combined use with a UV Irradiation device is possible A GaAs etement is used as a temperature sensor

enabling high-accuracy temperature setling

- 25 K to 470 K

plusmn001 K for 25 K to 42 K

plusmn1 orO5 K for 42 K to 470 K

_ 20 min 10 25 min (rom room temperature 08 to 2 Uh

50Hz60Hz 5mm JEOL RESONANCE Inc

Produ c t Guide I 17

Industrial Equipm nt for thin-filnl formation and nlatel ial processing

I bull

Electron Beam Source High-power Electron Beam Source

BS-60060EBS EBG-102UB6S

Electron beam sources for vacuum evaporation of metal and metal-oxide thin-films

We offer a wide variety of electron beam sources and crucibles They have features of

excellent beam spot and energy density and high-speed sweeping

1 PGBS 80020CPPS Plasma Source

BS-80011 BPG (6kW) BS-8002OCPPS (3kW)

Plasma Sources are installed in a vacuum chamber and generate high-density plasma

Used as Ion Plating (Plasma Assisted Deposition) and it is possible to improve film

properties for optilcal thin films protective films and function films Because highshy

density plasma can be generated in a mass space high-rate deposition to a large area

is possible

I RF Induction Plasma System

JEBG-3000UB(300kW) JEBG-1 OOOUB(1 OOkW)

High-power electron beam sources for vacuum evaporation of metal and metal-oxide

for wide plastic films or large glass plates that are continuously fed And they can also

be used for vacuum melting of high-melting point metals

raes

RF Generator

t shy - - - --- - - --- -

0-~ 0 bull bullbull - -

RF-12030 (3kW) RF-56000 (Controller)

13 56MHz radio-frequency power supplies for plasma generation and used for

sputtering CVD etching and ion-plating We offer 750W to 6kW generators and

matching networks

DR Powder Feeder

Thermal plasma around 10000degC (15000deg F) by RF inductive coupling This thermal Fine powder feeder that can feed 01 to 100 11m size fine powder continuously with

plasma is used for nano powder synthesis fine powder spheroidization thick film carrier gas We offer optional feeding rate controller and large capacity hopper

deposition multi composite membrane synthesis CVD and harmful gas

decomposition

18 I Produci Guide

---

Biochemical Analyzers

I JCA-BM series Clinical Chemistry Analyzer BioMajesty Series

JEOLs micro volume technology and unique sample pre-dilution mechanism realizes

high throughput chemistry analysis with reduced sample and reagent volume

More than 4000 systems have been placed in clinical laboratories allover the world

JCA-BM6050

I JCA-BMBOOO series Ultra High Throughput Clinical Chemistry Analyzer

4 4

JCA-BMB060 egt

JCA-BMSOOO series offer ultra high throughput chemistry analysis up to 9000 testsl

hour

The pre-dilution unit one of the BioMajesty family features also continues the strong

tradition in these series with interconnected multiple analysis modules the key factors

that accomplish brilliant high throughput as well as downtime reduction with back-up

capability

I JCA-BM6070 High Throughput High Performance Clinical Chemistry An alyzer

I I I

A Clinical chemistry analyzer with incomparable speed and accuracy which achieves

high throughput of 2400 testslhour (includ ing ISE) The incorporated compact

workstation and user-friendly Interface with excellent operability leads the new trend of

the laboratory testing

BioMajesty Series lCA-BM 6010 lCA-BM 6050

lCA-8M 6070 leA-BM 91 30

lCA-BM 8000 Series

bull This product is distributed outside Japan by Siemens Heatthcare Diagnostics under the ADVtAreg brand name

I JCA-BM601 OC Compact amp High Performance Clinical Chemistry Analyzer

-~-I -

1lIIIIIIilllllllllJllnlIlII Ii I JCA-BM6010C is a compact but efficient automatic analyzer that maintains the basic

concept of BioMajesty series while achieving the excellent capability of microanalysis

with sample volume as small as 1 J1L

BM6010C also offers fully automated HbA1 c analysis with on-board hemolysis

(optional) Simultaneous measurement of Glucose and HbA1c improves laboratory

workflow

Product Guid e I 19

S~~MCEAII Certain products in this brochure are controlled under the Foreign 0J 0014007 -v- ~ Exchange and Foreign Trade Law of Japan in compliance with $ ~~~ international security export control JEOL Ltd must provide the~2 m) IIlt Japanese Government with End-users Statement of Assurancel A MGMT SYS

AvA ~ m and End-use Certificate in order to obtain the export license - tiJ needed for export from Japan If the product to be exported is in this category the end user will be asked to fill in these certificate formsdEOLIS09001 amp150 14001CenrfiCltlled

httpwwwjeolcomdEOL JEOL Ltd 1-2 Musashino 3-chome Akishima Tokyo 196-8558 Japan Sales Division Telephone+81-42-528-3381 Facsimile+81-42-528-3386

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Unit No1 009 1 OF Prosperity Milennia Plaza 663 Kings Road North Point Hong Kong Telephone 852-2815-7299 Facsimile 852-2581-4635

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Analyticallnstrments Department Sahas 41412 Veer Savarkar Marg Prabhadery Mumbai 400 025 India Telephone 91-22-6666-4000 Facsimile 91-22-6666-4001

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Analylicallnstruments Department 7 Hare Street Calcutta 700 001 India Telephone 91-33-2213-4133 Facsimile 91 -33-2213-4102

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~~=~g~~~2~~1nt~~2_~~~bIlC of South Africa

Facsimile 27-11 -462-1466

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No 0205B389C Printed in Japan Kp

Page 5: Introduction - Главное управление науки БГУresearch.bsu.by/wp-content/uploads/2015/06/JEOL_Product...Scanning Electron Microscope The JSM-6610 is a high-performance

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Scanning Electron Microscopes

JSM 7800F Field Emission Scanning Electron Microscope

I JSM-7600F Field Emission Scanning Electron Microscope

The JSM-7600F is a state-of-the-art thermal

FE-SEM th at successfu ll y combines

ultrahigh-resolution imaging with optimized

analytical functionality such as high-speed

high-accuracy analyses

10 nm (15 kV) 15 nm (1 kV) 01 to 30 kV

x 25 to 1000000

JSM-7 OOF Field Emi ss ion Scanning Electron Microscope

l 8

I II

The JSM-7800F equipped with a newly developed super hybrid objective lens is a

cutting-edge thermal FE-SEM that successfully combines ultrahigh-resolution

imaging with fast and high-accuracy elemental analysis Magnetic specimens can

be observed and analyzed at high magnification The JSM-7800F also enables

researchers various analyses such as EDS WDS EBSD and CL

bull08 nm (15 kV) 12 nm (1 kV)

001 to 30 kV

x25 to 1000000

JSM 7500F Field Emission Scanning Electron Microscope

The JSM-7500F developed for

nanostructure characterization is equipped

with the Gentle Beam function which

enables researchers observation atI(~ x 100000 magnification even with 100 V low electron energy ~ ~tn~ ~=--

- - - 10 nm (15 kV) 14nm (1 kV)Jllshyf -diy Ollaqb 0 1 to 30 kVoG -- ~ Wll X25 to 1000000- rr

-

The JSM-7100F is a versatile high performance analytical FE SEM The electron

optics produces the maximum 200 nA probe current with the patented in-lens

thermal FEG and a small probe diameter even at large probe currents with the

patented aperture angle optimizing lens

The objective lens is the field free type This lens is suitable for high precision EBSD

analysis and characterization of a magnetic specimen

The vacuum system employing a TMP combined and a specimen exchange airlock

chamber A life of emitter is prolonged by the high quality vacuum in the gun

chamber

gt= - 12nm (30 kV) 30nm (1 kV) 02 to 30 kV

x 10 to 1000000

06 I Producl Guide

---------

I )SM-66 0 Scanning Electron Microscope

The JSM-6610 is a high-performance SEM

that is equipped with a superb electron

optical system and a general-purpose largeshy

specimen chamber to accommodate a

specimen up to 200 mm diameter The _JSM-6610 incorporates newly designed

__

_- ~I software for easier SEM operations in a

variety of applications

I J5M-ALA series Analytical Scanning Electron Microscopes

The JED-2300 EDS developed by JEOL is

embedded in the compact SEMs The

footprint is same as that of the basic SEM

The SEM and EDS are operated as one

seamless system to provide comfortable

and efficient operation A SDD type EDS

detector does not require liquid nitrogen

EDS analysis is ready whenever you need it

Resolution HV 30 nm

LV 40nm 40nm

Magnification

Accelerating voltage 05 shy 30 kV

x5 shy 300000

03 shy 30 kV

I JASM-6200 C airScor etrade Atmospheric Scanning Electron Microscope

I SM-6510 Scanning Electron Microscope

The JSM-6510 is a high-performance SEM

that is equipped with a superb electron

optical system same as the JSM-6610 and

a general-purpose specimen chamber to

accommodate a specimen up to 150 mm

diameter The JSM-651 0 incorporates

newly designed software for easier SEM

operations in a variety of applications

II 1 30 nm ltr-- rr TJ 01 qamp 05 to 30 kV M~1fIIC3IKlr x5 to 300000

J5 -LV series Low Vacuum SEMs

The low vacuum SEM consists of a

conventional high vacuum mode and a low

vacuum (LV) mode One can select the

vacuum mode with a click on the menu

The LV mode enables one to observe and

analyze non-conductive specimens The

specimen chamber is kept at low vacuum

so that highly out-gassing specimens can

be easily observed

1-lhlIt

Resolution HV 30 nm

LV 40 nm

Low vacuum range 10-270 Pa

The JASM-6200 allows high-resolution light microscopeSEM observation at

atmospheric pressure A specimen is held at normal atmospheric pressure Dynamic

observation of physical or chemical reactions can be made in liquid or gas In addition

for biological applications difficult dehydration and drying processes are not needed

dramatically reducing specimen pre-treatment time

Bnm Imiddot 102030 kV

II

Product Guide I 07

JSM-60l0 AILV InTouchScope

)shy -

JSM-6010LA

I JCM 6000 NeoScopeTM

The InTouchScope incorporates a highly intuitive SEM interface with multi-touch

technology The user can expand application windows and orchestrate aJl functions

just by touching the screen

40 nm (20 kV) 50 nm (20 kV)

05 1020 kV x810 300000

JCM-6000 NeoScopen~ let you observe a specimen at much higher magnification

than a light microscope with the same simple operation of a light microscope The

observation image appears automatically when a specimen is inserted and you can

go up to the maximum magnification of x60OOO quickly with the automated

operations

JCM-6000 NeoScopem is equipped with a TMP for quick start

The installation is easy The wall outlet (100V AC) is the only utility needed Cooling

water is not necessary

FX X10 10 60000

SI - Max 70mm dia

Ion Beam Application Equipment

pIB-09010 Cross Section Polisher (CP)

The IB-090 10CP Cross Section Polisher

makes a cross sect ion by irradiating a

spec imen with argon ion beam along an

edge of a shield plate placed on a

specimen This is an innovative specimen

preparation device for specimens studied in

SEM and EPMA

IIB-09020C Cross Section Polisher (C PIT)

The IB-09020CP Cross Section Polisher

(CPIT) creates a cross section in a manner

similar to the IB-09010CP Its built-in CCO

camera al lows real-time monitoring of a

cross-section during polishing

08 I Product Guide

I J18-4601 MuIti Beam System

I J -4501 MultiBeam System

EM-091001S Ion Slicer

The JIB-4501 MultiBeam System achieves

surfaceinternal 3D imaging and analysis

with simple operation This system also

has optimum geometry for all functions

from FIB SEM observation to EDSEBSD

analyses

R~ Iul N 5 nm (FIB) 25 nm (SEM) A I tlrx] I J 03 kV to 30 kV

(5 kV steps) Magl1lhcnli X30 10 300000

(observation milling)

The Ion Slicer can easily prepare thin-film

specimens for TEM without special skill Prior

treatment required for the Ion Slicer is only to

mechanically polish a specimen to 01 mm

thick The optimally set Ar ion beam provides

high-quality thin films In addition this

innovative tool suppresses specimen damage

and contamination such as lattice distortion

induced by mechanical polishing and

oxidation on specimen suriaces by chemical

treatment The Ion Slicer is an echo-friendly

efficient specimen-preparation tool

The JIB-4601 F MultiBeam System unites the unique imaging and analytical capabilities

of the High Power Optics employed in the TFE SEM and a high-performance FIB

column in a highly efficient and powerful system The JIB-4601 F offers an easy-to-use

tool for highly automated sample preparation combined with high-resolution imaging

and sub-micron analysis of the specimen cross-section

5 nm (FIB) 12 nm (SEM) 02 kV to 30 kV (5 kV sleps)

x30 to 1000000 (observation milling)

I J18-4000 Focused Ion Beam System

Top of the line high-throughput

processing

Compact size for flexible layout shy

Installation space reduced by 20

(compared to JEOL conventional

models)

Superb performance at low accelerating

voltage

Stage Navigation System for fast

determination of observation position

R-_ lit I f1 5 nm ICIIH~ltn lJIO ltJi 1 to 30 kV

M~Q I I x60 (for searching field) X200 to 300000

IIB09060CIS Cryo Ion Slicer

The IB-09060CIS Cryo Ion Slicer

incorporates a specimen cooling

mechanism in the EM-091001S Ion Slicer

for easy preparation of thin filmscross bull I J sections even for specimens susceptible

to thermal damage

J

~

Producl Guide I 09

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- - -~

[Peripheral Equipment ]

IJIC 410 HDT400 JEE-420 series Ion Cleaner Hydrophilic Treatment Device Vacuum Evaporators

The JIC-41 0 Ion Cleaner removes hydrocarbon

contamination on TEM specimens by exposing

specimens in glow discharge

The treated specimens do not build up contamination

during observation in a TEM

JEC560 Auto Carbon Coater

The HDT-400 applies hydrophilic treatment on TEM

grids and SEM specimen mounting blocks The entire

operation is automated

IJFC-1600 Auto Fine Coater

O ~ - --=shy

The JEE-420 vacuum evaporator applies coating on

SEM or TEM specimens with a variety of materials

including gold platinum carbon chromium The JEEshy

420 applies shadowing on TEM specimens

- - C- Ooshy o --nu _ __ a 0 0 0 0

The JEC-560 rapidly applies carbon coating on non-conductive specimens for The JFC series sputter coater applies metal coating on SEM specimens quickly Gold

element analysis with a scanning electron microscope or an electron probe micro gold-palladium and platinum can be applied

analyzers

JED23002300F Energy Dispersive X-ray Spectrometers

Dry SO Detector

The JED-23002300F is installed on a SEM or an EPMA and performs elemental This unique box type Dry SD detector is designed for JSM-651 0 and JSM-601 0 series

analysis on micro areas The Dry SD detector an SDD type detector is cooled SEM The detector is positioned at the optimum position

electrically It does not need liquid nitrogen cooling so that maintenance is not

required Analysis Station the unique EDS analysis software is versatile with simple

operation

All y A~Ilrn System that links observed images with analysis data

inlIytl(oIIUI1Chi1$ Qualitativequantitative analysis linearea analysis

10 I Producl Guide

------

f

Instruments for Microarea and Surface Analysis

IjXA-8530F Field Emission Electron Probe Microanalyzer

The JXA-8530F features an improved hardware that is used in the JXA-8500F (the first

FE-EPMA in the world) as well as newly designed user-friendly PC-GUI windows for

efficient analysis and data operation The FE gun of the JXA-8530F provides not only a

spatial (analysis) resolution of the order of 01 IJm but also high-sensitivity X-ray

detection at low accelerating voltages and large probe currents

IjPS-9200 Photoelectron Spectrometer (XPS)

The JPS-9200 is an XPS that provides microarea analysis A newly developed microshy

tens enables high-sensitivity analysis from macro to microareas Its stage accepts both

standard-size samples (10X 10X2 mm) and large samples (up to gO mm in diameter)

The stage-scan mapping method allows the acquisition of photoelectron images

ranging from low magnification (50 x 18 mm) to high magnification (spatial resolution

30lJm)

I jAMP-9500F Field Emission Auger Microprobe

fl

X 8230 Electron Probe Microanalyzer

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The JXA-8230 is a newly developed EPMA which succeeds a proven JEOL EPMA

hardware and features newly designed user-friendly PC-GUI windows for efficient

analysis and data operation Sophisticated analysis menus are designed so that the

user can easily access target material analyses offering stress-free operations

I jPS-901 0 series Photoelectron Spectrometers (XPS)

XPS with high-sensitivity and high-resolution is compactly designed on the basis of

JEOLs many years of basic and application technologies on electrostatic lenses

analyzers etc The low-acceleration and large-current ion guns dedicated to permit

XPS analysis of thin films with different thicknesses from surface atomic layers to

micron order thick specimen layers The specimen chamber and etching chamber are

separated from each other in terms of vacuum thus completely preventing the

contamination due to sputtering and facilitating the maintenance of ultrahigh vacuum

A field-emission Auger Microprobe featuring the worlds highest spatial resolution with

the minimum probe diameter of 3 nm (for secondary-electron image) and 8 nm (for

Auger analysis) The new hemispherical electrostatic energy analyzer (HSA) with a

multi-channel detector optimized for Auger analysis is suitable for chemical-state

analysis The neutralizing ion gun allows Auger analysis of insulating materials Its

specimen stage accommodates a large sample of up to 95 mm in diameter Also it is

expandabfe for an UHV-SEM

ProduCI Guide I 11

X-ray Fluorescence Spectrometers

I ISX 400Rll Element Analyzer

An energy-dispersive X-ray fluorescence spectrometer for environmental analysis

which helps you comply with environmental regulations for hazardous substances

such as the RoHS and ELV directives in the EU and soil pollution in Japan You can

easily analyze minute traces of Cd Pb Hg Cr etc This analyzer is also suitable for

general analySiS including element analysis and thickness measurement using the FP

(fundamental parameter) method

I JSX-31 OORll Element Analyzer

An energy-dispersive X-ray fiuorescence spectrometer for environlnlntal analysis which helps you

comply with environmental regulations for hazardous substances such as the RoHS and ELV

directives in the EU and soil pollution in Japan This analyzer inoorporates a JEOL-made electrically

cooled Si(u] detector making liquid nrtrogen unnecessary as well as providing high sensitivity for

heavy-element analysis such as Cd Pb and Hg This analyzer is also surtable for general analysis

including eement analysis and thickness measurement using the FP (fundamental parameter)

method

12 I Product Guide

Semiconductor Eq Ipm nt

2 Electron Beam Lithography System

-5

Electron Beam Lithography System

r

Electron Beam Lithography System

-~=-~--I--~ I

~ ~ ~-

Th e JBX-3200MV is an e lec lro n bea m lithography system developed for the production of next generation ultrahigh-precision masks and reticles This system employs a variableshyshaped electron beam o f 50kV and a step amp repeat specimen stage

High thro ug hp ut enabled by a new PEG (Proximity Effect Correction) system High-speed da la- transfer sys tem for a large quanti ty data High-precision design for masklrelicle production

Th e JBX-9 500FS is a spot beam

lithography system developed to meet a

wi de range of applications with high

throughput and high precision periormance

This sys tem covers fields from the nanoshy

technology research to the production of

leading edge devices

f 100kV _ ZrONV Schotlky emitter

maximum 300 mm wafer

Th e JBX-6300 FS is a s p o t b ea m

lithography system developed to meet a

w ide range o f applica tions with high

resolution and high precision periormance

This system covers fields from the nanoshy

technology research to the development of

next generation devices

25 kVl50 kVl1 00 kV ZrONV Schottky emittelt

maximum 200 mm wafelt

Prod ucl Gu ide I 13

-

---------

-_ -~

- --= - - - =-shy -

NMR Spectrometers

I JNM-ECAECX series FT NMR System

920 MHz magnet Photo courtesy Nationallnstrtute of Natural Sciences Institute for

Molecular Science

The JNM-ECA920 FT NMR System is a 920 MHz high-resolution NMR

spectrometer developed by JEOL This spectrometer uses the superconducting

magnet co-developed by National Institute for Materials Science and Kobe Steel

Ltd which generates the high magnetic field Created by combining Japans stateshy

of-the-art technologies this FT NMR System marks an important milestone in next

generation biology and nanotechnology which call for high-magnetic-field highshy

resclution NMR analysis

JEOL RESONANCE Inc

~ ~ ~

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~ 100

HNCACB spectrum of 13C(15N labeled Solid 23Na-MQMAS spectrum of ubiqurtin N3)P207

The JNM-ECNECX series are versatile high-performance FT NMR spectrometer

system that utilize the latest digital and high-frequency technology The ECA

spectrometer is applicable up to 1GHz and can be used for a wide range of

applications including liquidsolid NMR protein analysis and diffusion coefficient

measurement

INM-EC cd

JOO ~QO 0(1 ~uo 1)0

Spectrometer I Oscillator receiver power amplifier

Magnet IISCM Field strength 705T I 939T 11 74T 1401T 1643T

Bore diameter (mm) 54 I 54 54 54 54

Probe 5 mm Ttl tunable

11110

188T

54

JEOL RESONANCE Inc

INMmiddot fO rie ---shy

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Spectrometer Oscillator receiver power amplifier

Magnet I ISCM Field strength 705T 939T I 1174T 1401T

Bore diameter (mm) I 54 54 54 54

Probe I 5 mm TH tunable

JEOL RESONANCE Inc

14 I Produc t Guide

bull bull bull

IJNM-ECS 00 FT NMR System

bull I ASC Series

Auto Sample Changer

ASC8 (8 samples) ASC24 (24 samples)

middotmiddot iT ~ --shy

~ I -~Au

ASC16 (16 samples) ASC64 (64 samples)

bullIJNM-ECAECX series Solid NMR

=- ~

I

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bull

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0

MAS conlroller Solid NMR sampling kit

NMR Systems For Modern NMR Spectroscopy The JNM-ECS400 i s a compact two-channel

spectrometer that retains the advanced capabilities of the

JNM-ECAlECX series (required installation space is oneshy

half compared to conventional NMRs) Programmable

timing sequencers built into each RF and PFG channel

can independently control either synchronous or

asynchronous operations of each channel Its standard

tunable broadband gradient probe which integrates all

JEOLs newest technologies is the high sesitivity roomshy

tempperature probe

Ccmpact spectrometer chassis Innovaten in JEOL NMR digrtal architecture High-stability and high-accuracy digital spectrometer High-sensrtivity new tunable probe Full automalk NMR with advanced software

JEOL RESONANCE Inc

An automatic sample changer makes it

possible to measure many samples

sequentially by exchanging multiple samples

automatically one by one Five changer

models are available for 8 samples 16

samples 24 samples 64 samples and 100

samples

JEOL RESONANCE Inc

ASC100 (100 samples)

1 --0 1(10 C ppm I

Sdid 13C-CPMAS spectrum of cholk acid

Solid-NMR is a technique that measures solid samples (powder or film-like samples) This technique is also effective for measurement of samples not soluble in solvents (inorganic

samples etc) and of crystalline polymorph that is meaningful to measure at the solid state

JEOL RESONANCE Inc

Produci Guide I 15

Mass Spectrometers

I JMS-800D UltraFOCUS I JMS-700 (2) MStation Mass Spectrometer Dedicated to Dioxin Anal ys is High resolution M ass Spectrometer

JMS-800D UltraFOCUS is the optimal cho ice for ultra lowlevel race detection

applications suc h as moni torin g for dioxins and related co mpoun ds eg

Polychlorinated Biphenyls (PCBs) Polybrominated Diphenyl Ethers (PBDEs) or drugs

of abuse by high resolution-selected ion monitoring (HRSIM) gas chromatographyl

mass spectrometry(GCMS)

R-- gtn 80000 (10 valley) Sent Ily 2 3 7 8-TCDD 100fg SNgt2oo

(6 channels 100 msecch Resolution 10000)

N_ Jut J _lllgEI up to 10 kV

JMS-S3000 Matri x Assisted Laser DesorptionIonization TOFMS

The JMS-S3000 is a MALOI-TOFMS incorporating an innovative SpirarrOF ion optical

system With superior capabilities than conventional MALDI-TOFMS the JMS-S3000

provides sate-of-the-art anaiylical solutions for a wide range of research areas such as

functional synthetic polymers materials science and biomolecules

Malrix Assisled Laser Desorpllonlonization Timemiddotof-Flighl Mass Spectrometer

I JMS-T1 OOLP+DART TLC-TOFMS

Pet c 60000 (10 valley) err 02 ng of methyl stearate

SIN 400

(CVEI combination ion source) I~ ~ aJe up to 10kV

I JMS-T1 OOLP LC-TOFMS

I JMS-Tl OOGCV GC-TOFMS

middotl shyThe JMS-T100LP+DART achieves simple and fast TLCMS analysis Accurate mass The JMS-Tl00GCV is a fully automatic Gas Chromatograph - Time-ot-Flight Mass

measurement capabilit y of TOFMS also enables you to determine element Spectrometer (GC-TOFMS) This versatile MS system covers wide range of

compositions of the analytes applications in GC-MS analysis

16 I Pr oduc i Gu ide

- -

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I JMS-Ql 050GC UltraQuad GClMS

cJEOL

-

S-trapHS Headspace Autosampler

ESR Spectrometers

I JES-X3 series ESR Spectrometers

Recently it has been widely

accepted that even retatively few

unpaired electrons in a sample can

affect the function of the material so

lower detection limits (high er

sens itivity) is required of ESR

measurements JES-X3 Series has

achieved higher sensiti v i ty by

developing a lOIN-noise Gunn

oscillator for its new spectrometer

JES-X320 JEOL RESONANCE Inc

i III III )

Maximum Magnetic Field I a6ST 13T 14T

SweepW idth I --00-- 250mT plusmn001 - 500m__T_ __--l

Pole Gap _ _ 6cmm__ ___-= ___~ ____cmm__ _ I 0 = 60mcm 75 _l

Frequency Range(GHz) 8750 - 9650 _ _ _ ___-1

Field Resolution (mT) _L_ 235 Correction by Marker _1_--- Standard

I Operating System Windows 7

The JMS-01050GC is an innovative quadrupole mass spectrometer (OMS) that

achieves the highest-level sensitivity in OMS It has a high ability of evacuation due

to the use of a split flow turbo-molecular pump system (400 Lis) th at

simultaneously evacuates the ion source and the detector The use of a highshy

accuracy hyperbolic quadrupole mass analyzer provides high resolution

The S-trap is a next-generation headspace autosampler providing ultra-low

concentration measurement which was not achieved with a heads pace (HS) method

using conventional sample loop In addition the HS-GCMS system combined lith a

JMS-01050GC Mkll quaorupole MS guarantees detection of mold odor in water

down to 1 ppt

I ES-CT470 Liquid Helium Variable Temperature Controller

The ES-CT470 varies the sample temperature in the temperature range between 25 K

and 470 K Temperature setting is performed by d igital display and the set

temperature is kept constant by automatic control circui ts Combined use with a UV Irradiation device is possible A GaAs etement is used as a temperature sensor

enabling high-accuracy temperature setling

- 25 K to 470 K

plusmn001 K for 25 K to 42 K

plusmn1 orO5 K for 42 K to 470 K

_ 20 min 10 25 min (rom room temperature 08 to 2 Uh

50Hz60Hz 5mm JEOL RESONANCE Inc

Produ c t Guide I 17

Industrial Equipm nt for thin-filnl formation and nlatel ial processing

I bull

Electron Beam Source High-power Electron Beam Source

BS-60060EBS EBG-102UB6S

Electron beam sources for vacuum evaporation of metal and metal-oxide thin-films

We offer a wide variety of electron beam sources and crucibles They have features of

excellent beam spot and energy density and high-speed sweeping

1 PGBS 80020CPPS Plasma Source

BS-80011 BPG (6kW) BS-8002OCPPS (3kW)

Plasma Sources are installed in a vacuum chamber and generate high-density plasma

Used as Ion Plating (Plasma Assisted Deposition) and it is possible to improve film

properties for optilcal thin films protective films and function films Because highshy

density plasma can be generated in a mass space high-rate deposition to a large area

is possible

I RF Induction Plasma System

JEBG-3000UB(300kW) JEBG-1 OOOUB(1 OOkW)

High-power electron beam sources for vacuum evaporation of metal and metal-oxide

for wide plastic films or large glass plates that are continuously fed And they can also

be used for vacuum melting of high-melting point metals

raes

RF Generator

t shy - - - --- - - --- -

0-~ 0 bull bullbull - -

RF-12030 (3kW) RF-56000 (Controller)

13 56MHz radio-frequency power supplies for plasma generation and used for

sputtering CVD etching and ion-plating We offer 750W to 6kW generators and

matching networks

DR Powder Feeder

Thermal plasma around 10000degC (15000deg F) by RF inductive coupling This thermal Fine powder feeder that can feed 01 to 100 11m size fine powder continuously with

plasma is used for nano powder synthesis fine powder spheroidization thick film carrier gas We offer optional feeding rate controller and large capacity hopper

deposition multi composite membrane synthesis CVD and harmful gas

decomposition

18 I Produci Guide

---

Biochemical Analyzers

I JCA-BM series Clinical Chemistry Analyzer BioMajesty Series

JEOLs micro volume technology and unique sample pre-dilution mechanism realizes

high throughput chemistry analysis with reduced sample and reagent volume

More than 4000 systems have been placed in clinical laboratories allover the world

JCA-BM6050

I JCA-BMBOOO series Ultra High Throughput Clinical Chemistry Analyzer

4 4

JCA-BMB060 egt

JCA-BMSOOO series offer ultra high throughput chemistry analysis up to 9000 testsl

hour

The pre-dilution unit one of the BioMajesty family features also continues the strong

tradition in these series with interconnected multiple analysis modules the key factors

that accomplish brilliant high throughput as well as downtime reduction with back-up

capability

I JCA-BM6070 High Throughput High Performance Clinical Chemistry An alyzer

I I I

A Clinical chemistry analyzer with incomparable speed and accuracy which achieves

high throughput of 2400 testslhour (includ ing ISE) The incorporated compact

workstation and user-friendly Interface with excellent operability leads the new trend of

the laboratory testing

BioMajesty Series lCA-BM 6010 lCA-BM 6050

lCA-8M 6070 leA-BM 91 30

lCA-BM 8000 Series

bull This product is distributed outside Japan by Siemens Heatthcare Diagnostics under the ADVtAreg brand name

I JCA-BM601 OC Compact amp High Performance Clinical Chemistry Analyzer

-~-I -

1lIIIIIIilllllllllJllnlIlII Ii I JCA-BM6010C is a compact but efficient automatic analyzer that maintains the basic

concept of BioMajesty series while achieving the excellent capability of microanalysis

with sample volume as small as 1 J1L

BM6010C also offers fully automated HbA1 c analysis with on-board hemolysis

(optional) Simultaneous measurement of Glucose and HbA1c improves laboratory

workflow

Product Guid e I 19

S~~MCEAII Certain products in this brochure are controlled under the Foreign 0J 0014007 -v- ~ Exchange and Foreign Trade Law of Japan in compliance with $ ~~~ international security export control JEOL Ltd must provide the~2 m) IIlt Japanese Government with End-users Statement of Assurancel A MGMT SYS

AvA ~ m and End-use Certificate in order to obtain the export license - tiJ needed for export from Japan If the product to be exported is in this category the end user will be asked to fill in these certificate formsdEOLIS09001 amp150 14001CenrfiCltlled

httpwwwjeolcomdEOL JEOL Ltd 1-2 Musashino 3-chome Akishima Tokyo 196-8558 Japan Sales Division Telephone+81-42-528-3381 Facsimile+81-42-528-3386

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Unit No1 009 1 OF Prosperity Milennia Plaza 663 Kings Road North Point Hong Kong Telephone 852-2815-7299 Facsimile 852-2581-4635

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Elegance Tower Level 2 2128 Old Mathura Road Jasola Business District Centre Near Apollo Hospital Jasola New Delhi 110025 India Telephone 91-11-6472-2578 Facsimile 91-11-4060-1235

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Analylicallnstruments Department 7 Hare Street Calcutta 700 001 India Telephone 91-33-2213-4133 Facsimile 91 -33-2213-4102

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ITALY JEOL 0TALIA) SpA Centro Direzionale Green Office Via dei Tulipani 1 20090 Pieve Emanuele (MI) Italy Telephone 39-02-9041431 Facsimila 39-02-90414343

KOREA JEOL KOREA LTD

Dongwoo Bldg 7F 1443 Yangjae Daero Gangdong-Gu Seoul 134-010 Korea Telephone 82-2-511-5501 Facsimile 82-2-511-2635

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Arkansas 11 Piso 2 Colonia Napoles Delegacion Benito Juarez CP 03810 Mexico DF Mexico Telephone 52-5-55-211-4511 Facsimile 52-5-55-211-0720

PAKISTAN (KarachI) ANALYTICAL MEASURING SYSTEM (pvn LTD(AMS LTD)

14-C Main Sehar Commercia) Avenue Lane 4 Khayaban-e-Sehar DHA-VII Karachimiddot75500 Pakinstan Telephone 92-21-353455813534074735346057-8 Facsimile 92-21-35345582

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7487 Bagtikan Street SAY Makati 1203 Metro Manila Phillip pines Telephone 63-2-896-7218 Facsimile 63-2-897-7732

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2 Corporation Road 1t01-12 Corporation Place Singapore 618494 Telephone 65-6565-9989 Facsimile 65-6565-7552

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~~=~g~~~2~~1nt~~2_~~~bIlC of South Africa

Facsimile 27-11 -462-1466

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For Mass Spectrometer Products Mass Solutions Technology Co Ltd

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JEOL USA INC WEST OFFICE

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No 0205B389C Printed in Japan Kp

Page 6: Introduction - Главное управление науки БГУresearch.bsu.by/wp-content/uploads/2015/06/JEOL_Product...Scanning Electron Microscope The JSM-6610 is a high-performance

---------

I )SM-66 0 Scanning Electron Microscope

The JSM-6610 is a high-performance SEM

that is equipped with a superb electron

optical system and a general-purpose largeshy

specimen chamber to accommodate a

specimen up to 200 mm diameter The _JSM-6610 incorporates newly designed

__

_- ~I software for easier SEM operations in a

variety of applications

I J5M-ALA series Analytical Scanning Electron Microscopes

The JED-2300 EDS developed by JEOL is

embedded in the compact SEMs The

footprint is same as that of the basic SEM

The SEM and EDS are operated as one

seamless system to provide comfortable

and efficient operation A SDD type EDS

detector does not require liquid nitrogen

EDS analysis is ready whenever you need it

Resolution HV 30 nm

LV 40nm 40nm

Magnification

Accelerating voltage 05 shy 30 kV

x5 shy 300000

03 shy 30 kV

I JASM-6200 C airScor etrade Atmospheric Scanning Electron Microscope

I SM-6510 Scanning Electron Microscope

The JSM-6510 is a high-performance SEM

that is equipped with a superb electron

optical system same as the JSM-6610 and

a general-purpose specimen chamber to

accommodate a specimen up to 150 mm

diameter The JSM-651 0 incorporates

newly designed software for easier SEM

operations in a variety of applications

II 1 30 nm ltr-- rr TJ 01 qamp 05 to 30 kV M~1fIIC3IKlr x5 to 300000

J5 -LV series Low Vacuum SEMs

The low vacuum SEM consists of a

conventional high vacuum mode and a low

vacuum (LV) mode One can select the

vacuum mode with a click on the menu

The LV mode enables one to observe and

analyze non-conductive specimens The

specimen chamber is kept at low vacuum

so that highly out-gassing specimens can

be easily observed

1-lhlIt

Resolution HV 30 nm

LV 40 nm

Low vacuum range 10-270 Pa

The JASM-6200 allows high-resolution light microscopeSEM observation at

atmospheric pressure A specimen is held at normal atmospheric pressure Dynamic

observation of physical or chemical reactions can be made in liquid or gas In addition

for biological applications difficult dehydration and drying processes are not needed

dramatically reducing specimen pre-treatment time

Bnm Imiddot 102030 kV

II

Product Guide I 07

JSM-60l0 AILV InTouchScope

)shy -

JSM-6010LA

I JCM 6000 NeoScopeTM

The InTouchScope incorporates a highly intuitive SEM interface with multi-touch

technology The user can expand application windows and orchestrate aJl functions

just by touching the screen

40 nm (20 kV) 50 nm (20 kV)

05 1020 kV x810 300000

JCM-6000 NeoScopen~ let you observe a specimen at much higher magnification

than a light microscope with the same simple operation of a light microscope The

observation image appears automatically when a specimen is inserted and you can

go up to the maximum magnification of x60OOO quickly with the automated

operations

JCM-6000 NeoScopem is equipped with a TMP for quick start

The installation is easy The wall outlet (100V AC) is the only utility needed Cooling

water is not necessary

FX X10 10 60000

SI - Max 70mm dia

Ion Beam Application Equipment

pIB-09010 Cross Section Polisher (CP)

The IB-090 10CP Cross Section Polisher

makes a cross sect ion by irradiating a

spec imen with argon ion beam along an

edge of a shield plate placed on a

specimen This is an innovative specimen

preparation device for specimens studied in

SEM and EPMA

IIB-09020C Cross Section Polisher (C PIT)

The IB-09020CP Cross Section Polisher

(CPIT) creates a cross section in a manner

similar to the IB-09010CP Its built-in CCO

camera al lows real-time monitoring of a

cross-section during polishing

08 I Product Guide

I J18-4601 MuIti Beam System

I J -4501 MultiBeam System

EM-091001S Ion Slicer

The JIB-4501 MultiBeam System achieves

surfaceinternal 3D imaging and analysis

with simple operation This system also

has optimum geometry for all functions

from FIB SEM observation to EDSEBSD

analyses

R~ Iul N 5 nm (FIB) 25 nm (SEM) A I tlrx] I J 03 kV to 30 kV

(5 kV steps) Magl1lhcnli X30 10 300000

(observation milling)

The Ion Slicer can easily prepare thin-film

specimens for TEM without special skill Prior

treatment required for the Ion Slicer is only to

mechanically polish a specimen to 01 mm

thick The optimally set Ar ion beam provides

high-quality thin films In addition this

innovative tool suppresses specimen damage

and contamination such as lattice distortion

induced by mechanical polishing and

oxidation on specimen suriaces by chemical

treatment The Ion Slicer is an echo-friendly

efficient specimen-preparation tool

The JIB-4601 F MultiBeam System unites the unique imaging and analytical capabilities

of the High Power Optics employed in the TFE SEM and a high-performance FIB

column in a highly efficient and powerful system The JIB-4601 F offers an easy-to-use

tool for highly automated sample preparation combined with high-resolution imaging

and sub-micron analysis of the specimen cross-section

5 nm (FIB) 12 nm (SEM) 02 kV to 30 kV (5 kV sleps)

x30 to 1000000 (observation milling)

I J18-4000 Focused Ion Beam System

Top of the line high-throughput

processing

Compact size for flexible layout shy

Installation space reduced by 20

(compared to JEOL conventional

models)

Superb performance at low accelerating

voltage

Stage Navigation System for fast

determination of observation position

R-_ lit I f1 5 nm ICIIH~ltn lJIO ltJi 1 to 30 kV

M~Q I I x60 (for searching field) X200 to 300000

IIB09060CIS Cryo Ion Slicer

The IB-09060CIS Cryo Ion Slicer

incorporates a specimen cooling

mechanism in the EM-091001S Ion Slicer

for easy preparation of thin filmscross bull I J sections even for specimens susceptible

to thermal damage

J

~

Producl Guide I 09

- ---- shy

_bullbull- _ bullbull 1

- - -~

[Peripheral Equipment ]

IJIC 410 HDT400 JEE-420 series Ion Cleaner Hydrophilic Treatment Device Vacuum Evaporators

The JIC-41 0 Ion Cleaner removes hydrocarbon

contamination on TEM specimens by exposing

specimens in glow discharge

The treated specimens do not build up contamination

during observation in a TEM

JEC560 Auto Carbon Coater

The HDT-400 applies hydrophilic treatment on TEM

grids and SEM specimen mounting blocks The entire

operation is automated

IJFC-1600 Auto Fine Coater

O ~ - --=shy

The JEE-420 vacuum evaporator applies coating on

SEM or TEM specimens with a variety of materials

including gold platinum carbon chromium The JEEshy

420 applies shadowing on TEM specimens

- - C- Ooshy o --nu _ __ a 0 0 0 0

The JEC-560 rapidly applies carbon coating on non-conductive specimens for The JFC series sputter coater applies metal coating on SEM specimens quickly Gold

element analysis with a scanning electron microscope or an electron probe micro gold-palladium and platinum can be applied

analyzers

JED23002300F Energy Dispersive X-ray Spectrometers

Dry SO Detector

The JED-23002300F is installed on a SEM or an EPMA and performs elemental This unique box type Dry SD detector is designed for JSM-651 0 and JSM-601 0 series

analysis on micro areas The Dry SD detector an SDD type detector is cooled SEM The detector is positioned at the optimum position

electrically It does not need liquid nitrogen cooling so that maintenance is not

required Analysis Station the unique EDS analysis software is versatile with simple

operation

All y A~Ilrn System that links observed images with analysis data

inlIytl(oIIUI1Chi1$ Qualitativequantitative analysis linearea analysis

10 I Producl Guide

------

f

Instruments for Microarea and Surface Analysis

IjXA-8530F Field Emission Electron Probe Microanalyzer

The JXA-8530F features an improved hardware that is used in the JXA-8500F (the first

FE-EPMA in the world) as well as newly designed user-friendly PC-GUI windows for

efficient analysis and data operation The FE gun of the JXA-8530F provides not only a

spatial (analysis) resolution of the order of 01 IJm but also high-sensitivity X-ray

detection at low accelerating voltages and large probe currents

IjPS-9200 Photoelectron Spectrometer (XPS)

The JPS-9200 is an XPS that provides microarea analysis A newly developed microshy

tens enables high-sensitivity analysis from macro to microareas Its stage accepts both

standard-size samples (10X 10X2 mm) and large samples (up to gO mm in diameter)

The stage-scan mapping method allows the acquisition of photoelectron images

ranging from low magnification (50 x 18 mm) to high magnification (spatial resolution

30lJm)

I jAMP-9500F Field Emission Auger Microprobe

fl

X 8230 Electron Probe Microanalyzer

D

~) ~ j ) ~ =~=

The JXA-8230 is a newly developed EPMA which succeeds a proven JEOL EPMA

hardware and features newly designed user-friendly PC-GUI windows for efficient

analysis and data operation Sophisticated analysis menus are designed so that the

user can easily access target material analyses offering stress-free operations

I jPS-901 0 series Photoelectron Spectrometers (XPS)

XPS with high-sensitivity and high-resolution is compactly designed on the basis of

JEOLs many years of basic and application technologies on electrostatic lenses

analyzers etc The low-acceleration and large-current ion guns dedicated to permit

XPS analysis of thin films with different thicknesses from surface atomic layers to

micron order thick specimen layers The specimen chamber and etching chamber are

separated from each other in terms of vacuum thus completely preventing the

contamination due to sputtering and facilitating the maintenance of ultrahigh vacuum

A field-emission Auger Microprobe featuring the worlds highest spatial resolution with

the minimum probe diameter of 3 nm (for secondary-electron image) and 8 nm (for

Auger analysis) The new hemispherical electrostatic energy analyzer (HSA) with a

multi-channel detector optimized for Auger analysis is suitable for chemical-state

analysis The neutralizing ion gun allows Auger analysis of insulating materials Its

specimen stage accommodates a large sample of up to 95 mm in diameter Also it is

expandabfe for an UHV-SEM

ProduCI Guide I 11

X-ray Fluorescence Spectrometers

I ISX 400Rll Element Analyzer

An energy-dispersive X-ray fluorescence spectrometer for environmental analysis

which helps you comply with environmental regulations for hazardous substances

such as the RoHS and ELV directives in the EU and soil pollution in Japan You can

easily analyze minute traces of Cd Pb Hg Cr etc This analyzer is also suitable for

general analySiS including element analysis and thickness measurement using the FP

(fundamental parameter) method

I JSX-31 OORll Element Analyzer

An energy-dispersive X-ray fiuorescence spectrometer for environlnlntal analysis which helps you

comply with environmental regulations for hazardous substances such as the RoHS and ELV

directives in the EU and soil pollution in Japan This analyzer inoorporates a JEOL-made electrically

cooled Si(u] detector making liquid nrtrogen unnecessary as well as providing high sensitivity for

heavy-element analysis such as Cd Pb and Hg This analyzer is also surtable for general analysis

including eement analysis and thickness measurement using the FP (fundamental parameter)

method

12 I Product Guide

Semiconductor Eq Ipm nt

2 Electron Beam Lithography System

-5

Electron Beam Lithography System

r

Electron Beam Lithography System

-~=-~--I--~ I

~ ~ ~-

Th e JBX-3200MV is an e lec lro n bea m lithography system developed for the production of next generation ultrahigh-precision masks and reticles This system employs a variableshyshaped electron beam o f 50kV and a step amp repeat specimen stage

High thro ug hp ut enabled by a new PEG (Proximity Effect Correction) system High-speed da la- transfer sys tem for a large quanti ty data High-precision design for masklrelicle production

Th e JBX-9 500FS is a spot beam

lithography system developed to meet a

wi de range of applications with high

throughput and high precision periormance

This sys tem covers fields from the nanoshy

technology research to the production of

leading edge devices

f 100kV _ ZrONV Schotlky emitter

maximum 300 mm wafer

Th e JBX-6300 FS is a s p o t b ea m

lithography system developed to meet a

w ide range o f applica tions with high

resolution and high precision periormance

This system covers fields from the nanoshy

technology research to the development of

next generation devices

25 kVl50 kVl1 00 kV ZrONV Schottky emittelt

maximum 200 mm wafelt

Prod ucl Gu ide I 13

-

---------

-_ -~

- --= - - - =-shy -

NMR Spectrometers

I JNM-ECAECX series FT NMR System

920 MHz magnet Photo courtesy Nationallnstrtute of Natural Sciences Institute for

Molecular Science

The JNM-ECA920 FT NMR System is a 920 MHz high-resolution NMR

spectrometer developed by JEOL This spectrometer uses the superconducting

magnet co-developed by National Institute for Materials Science and Kobe Steel

Ltd which generates the high magnetic field Created by combining Japans stateshy

of-the-art technologies this FT NMR System marks an important milestone in next

generation biology and nanotechnology which call for high-magnetic-field highshy

resclution NMR analysis

JEOL RESONANCE Inc

~ ~ ~

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~ 100

HNCACB spectrum of 13C(15N labeled Solid 23Na-MQMAS spectrum of ubiqurtin N3)P207

The JNM-ECNECX series are versatile high-performance FT NMR spectrometer

system that utilize the latest digital and high-frequency technology The ECA

spectrometer is applicable up to 1GHz and can be used for a wide range of

applications including liquidsolid NMR protein analysis and diffusion coefficient

measurement

INM-EC cd

JOO ~QO 0(1 ~uo 1)0

Spectrometer I Oscillator receiver power amplifier

Magnet IISCM Field strength 705T I 939T 11 74T 1401T 1643T

Bore diameter (mm) 54 I 54 54 54 54

Probe 5 mm Ttl tunable

11110

188T

54

JEOL RESONANCE Inc

INMmiddot fO rie ---shy

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Spectrometer Oscillator receiver power amplifier

Magnet I ISCM Field strength 705T 939T I 1174T 1401T

Bore diameter (mm) I 54 54 54 54

Probe I 5 mm TH tunable

JEOL RESONANCE Inc

14 I Produc t Guide

bull bull bull

IJNM-ECS 00 FT NMR System

bull I ASC Series

Auto Sample Changer

ASC8 (8 samples) ASC24 (24 samples)

middotmiddot iT ~ --shy

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ASC16 (16 samples) ASC64 (64 samples)

bullIJNM-ECAECX series Solid NMR

=- ~

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MAS conlroller Solid NMR sampling kit

NMR Systems For Modern NMR Spectroscopy The JNM-ECS400 i s a compact two-channel

spectrometer that retains the advanced capabilities of the

JNM-ECAlECX series (required installation space is oneshy

half compared to conventional NMRs) Programmable

timing sequencers built into each RF and PFG channel

can independently control either synchronous or

asynchronous operations of each channel Its standard

tunable broadband gradient probe which integrates all

JEOLs newest technologies is the high sesitivity roomshy

tempperature probe

Ccmpact spectrometer chassis Innovaten in JEOL NMR digrtal architecture High-stability and high-accuracy digital spectrometer High-sensrtivity new tunable probe Full automalk NMR with advanced software

JEOL RESONANCE Inc

An automatic sample changer makes it

possible to measure many samples

sequentially by exchanging multiple samples

automatically one by one Five changer

models are available for 8 samples 16

samples 24 samples 64 samples and 100

samples

JEOL RESONANCE Inc

ASC100 (100 samples)

1 --0 1(10 C ppm I

Sdid 13C-CPMAS spectrum of cholk acid

Solid-NMR is a technique that measures solid samples (powder or film-like samples) This technique is also effective for measurement of samples not soluble in solvents (inorganic

samples etc) and of crystalline polymorph that is meaningful to measure at the solid state

JEOL RESONANCE Inc

Produci Guide I 15

Mass Spectrometers

I JMS-800D UltraFOCUS I JMS-700 (2) MStation Mass Spectrometer Dedicated to Dioxin Anal ys is High resolution M ass Spectrometer

JMS-800D UltraFOCUS is the optimal cho ice for ultra lowlevel race detection

applications suc h as moni torin g for dioxins and related co mpoun ds eg

Polychlorinated Biphenyls (PCBs) Polybrominated Diphenyl Ethers (PBDEs) or drugs

of abuse by high resolution-selected ion monitoring (HRSIM) gas chromatographyl

mass spectrometry(GCMS)

R-- gtn 80000 (10 valley) Sent Ily 2 3 7 8-TCDD 100fg SNgt2oo

(6 channels 100 msecch Resolution 10000)

N_ Jut J _lllgEI up to 10 kV

JMS-S3000 Matri x Assisted Laser DesorptionIonization TOFMS

The JMS-S3000 is a MALOI-TOFMS incorporating an innovative SpirarrOF ion optical

system With superior capabilities than conventional MALDI-TOFMS the JMS-S3000

provides sate-of-the-art anaiylical solutions for a wide range of research areas such as

functional synthetic polymers materials science and biomolecules

Malrix Assisled Laser Desorpllonlonization Timemiddotof-Flighl Mass Spectrometer

I JMS-T1 OOLP+DART TLC-TOFMS

Pet c 60000 (10 valley) err 02 ng of methyl stearate

SIN 400

(CVEI combination ion source) I~ ~ aJe up to 10kV

I JMS-T1 OOLP LC-TOFMS

I JMS-Tl OOGCV GC-TOFMS

middotl shyThe JMS-T100LP+DART achieves simple and fast TLCMS analysis Accurate mass The JMS-Tl00GCV is a fully automatic Gas Chromatograph - Time-ot-Flight Mass

measurement capabilit y of TOFMS also enables you to determine element Spectrometer (GC-TOFMS) This versatile MS system covers wide range of

compositions of the analytes applications in GC-MS analysis

16 I Pr oduc i Gu ide

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I JMS-Ql 050GC UltraQuad GClMS

cJEOL

-

S-trapHS Headspace Autosampler

ESR Spectrometers

I JES-X3 series ESR Spectrometers

Recently it has been widely

accepted that even retatively few

unpaired electrons in a sample can

affect the function of the material so

lower detection limits (high er

sens itivity) is required of ESR

measurements JES-X3 Series has

achieved higher sensiti v i ty by

developing a lOIN-noise Gunn

oscillator for its new spectrometer

JES-X320 JEOL RESONANCE Inc

i III III )

Maximum Magnetic Field I a6ST 13T 14T

SweepW idth I --00-- 250mT plusmn001 - 500m__T_ __--l

Pole Gap _ _ 6cmm__ ___-= ___~ ____cmm__ _ I 0 = 60mcm 75 _l

Frequency Range(GHz) 8750 - 9650 _ _ _ ___-1

Field Resolution (mT) _L_ 235 Correction by Marker _1_--- Standard

I Operating System Windows 7

The JMS-01050GC is an innovative quadrupole mass spectrometer (OMS) that

achieves the highest-level sensitivity in OMS It has a high ability of evacuation due

to the use of a split flow turbo-molecular pump system (400 Lis) th at

simultaneously evacuates the ion source and the detector The use of a highshy

accuracy hyperbolic quadrupole mass analyzer provides high resolution

The S-trap is a next-generation headspace autosampler providing ultra-low

concentration measurement which was not achieved with a heads pace (HS) method

using conventional sample loop In addition the HS-GCMS system combined lith a

JMS-01050GC Mkll quaorupole MS guarantees detection of mold odor in water

down to 1 ppt

I ES-CT470 Liquid Helium Variable Temperature Controller

The ES-CT470 varies the sample temperature in the temperature range between 25 K

and 470 K Temperature setting is performed by d igital display and the set

temperature is kept constant by automatic control circui ts Combined use with a UV Irradiation device is possible A GaAs etement is used as a temperature sensor

enabling high-accuracy temperature setling

- 25 K to 470 K

plusmn001 K for 25 K to 42 K

plusmn1 orO5 K for 42 K to 470 K

_ 20 min 10 25 min (rom room temperature 08 to 2 Uh

50Hz60Hz 5mm JEOL RESONANCE Inc

Produ c t Guide I 17

Industrial Equipm nt for thin-filnl formation and nlatel ial processing

I bull

Electron Beam Source High-power Electron Beam Source

BS-60060EBS EBG-102UB6S

Electron beam sources for vacuum evaporation of metal and metal-oxide thin-films

We offer a wide variety of electron beam sources and crucibles They have features of

excellent beam spot and energy density and high-speed sweeping

1 PGBS 80020CPPS Plasma Source

BS-80011 BPG (6kW) BS-8002OCPPS (3kW)

Plasma Sources are installed in a vacuum chamber and generate high-density plasma

Used as Ion Plating (Plasma Assisted Deposition) and it is possible to improve film

properties for optilcal thin films protective films and function films Because highshy

density plasma can be generated in a mass space high-rate deposition to a large area

is possible

I RF Induction Plasma System

JEBG-3000UB(300kW) JEBG-1 OOOUB(1 OOkW)

High-power electron beam sources for vacuum evaporation of metal and metal-oxide

for wide plastic films or large glass plates that are continuously fed And they can also

be used for vacuum melting of high-melting point metals

raes

RF Generator

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RF-12030 (3kW) RF-56000 (Controller)

13 56MHz radio-frequency power supplies for plasma generation and used for

sputtering CVD etching and ion-plating We offer 750W to 6kW generators and

matching networks

DR Powder Feeder

Thermal plasma around 10000degC (15000deg F) by RF inductive coupling This thermal Fine powder feeder that can feed 01 to 100 11m size fine powder continuously with

plasma is used for nano powder synthesis fine powder spheroidization thick film carrier gas We offer optional feeding rate controller and large capacity hopper

deposition multi composite membrane synthesis CVD and harmful gas

decomposition

18 I Produci Guide

---

Biochemical Analyzers

I JCA-BM series Clinical Chemistry Analyzer BioMajesty Series

JEOLs micro volume technology and unique sample pre-dilution mechanism realizes

high throughput chemistry analysis with reduced sample and reagent volume

More than 4000 systems have been placed in clinical laboratories allover the world

JCA-BM6050

I JCA-BMBOOO series Ultra High Throughput Clinical Chemistry Analyzer

4 4

JCA-BMB060 egt

JCA-BMSOOO series offer ultra high throughput chemistry analysis up to 9000 testsl

hour

The pre-dilution unit one of the BioMajesty family features also continues the strong

tradition in these series with interconnected multiple analysis modules the key factors

that accomplish brilliant high throughput as well as downtime reduction with back-up

capability

I JCA-BM6070 High Throughput High Performance Clinical Chemistry An alyzer

I I I

A Clinical chemistry analyzer with incomparable speed and accuracy which achieves

high throughput of 2400 testslhour (includ ing ISE) The incorporated compact

workstation and user-friendly Interface with excellent operability leads the new trend of

the laboratory testing

BioMajesty Series lCA-BM 6010 lCA-BM 6050

lCA-8M 6070 leA-BM 91 30

lCA-BM 8000 Series

bull This product is distributed outside Japan by Siemens Heatthcare Diagnostics under the ADVtAreg brand name

I JCA-BM601 OC Compact amp High Performance Clinical Chemistry Analyzer

-~-I -

1lIIIIIIilllllllllJllnlIlII Ii I JCA-BM6010C is a compact but efficient automatic analyzer that maintains the basic

concept of BioMajesty series while achieving the excellent capability of microanalysis

with sample volume as small as 1 J1L

BM6010C also offers fully automated HbA1 c analysis with on-board hemolysis

(optional) Simultaneous measurement of Glucose and HbA1c improves laboratory

workflow

Product Guid e I 19

S~~MCEAII Certain products in this brochure are controlled under the Foreign 0J 0014007 -v- ~ Exchange and Foreign Trade Law of Japan in compliance with $ ~~~ international security export control JEOL Ltd must provide the~2 m) IIlt Japanese Government with End-users Statement of Assurancel A MGMT SYS

AvA ~ m and End-use Certificate in order to obtain the export license - tiJ needed for export from Japan If the product to be exported is in this category the end user will be asked to fill in these certificate formsdEOLIS09001 amp150 14001CenrfiCltlled

httpwwwjeolcomdEOL JEOL Ltd 1-2 Musashino 3-chome Akishima Tokyo 196-8558 Japan Sales Division Telephone+81-42-528-3381 Facsimile+81-42-528-3386

ARGENTINA COASIN SAClyF Virrey del Pino 4071 1430 Buenos Aires Argentina Telephone 54-11-4552-3185 Facsimile 54-11-4555-3321

AUSTRALIA amp NEW ZEALAND JEOL(AUSTRALASJA) PtyUd Suite 1 L2 18 Aquatic Drive - Frenchs Foresl NSW 2086 Australia Telephone 61-2-9451-3855 Facsimile 61-2-9451-3822

AUSTRIA JEOL (GERMANY) GmbH Oskar-Von-Miller-Strasse 1 a 85386 Eching Gennany Telephone 49-8165-77346 Facsimile 49-8165-77512

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BELGIUM JEOL (EUROPE) BV Planet ll Gebouw B Leuvensesteenweg 542 B-1930 Zaventem Belgium Telephone 32-2-720-0560 Facsimile 32-2-720-6134

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N1601 World Trade Center Building 371-375 Huan Shi Road East Guang Zhou Guangdong Prov 510095 PRChina Telephone 86-20-8778-7848 Facsimile 86-20-8778-4268

JEOL (BEIJING) CO LTD WUHAN BRANCH

Room A2117 Zhongshang Plaza Office Bldg NO7 Zhongnan Road Wuhan Hubei 430071 PRChina Telephone 86-27-8713-2567 Facsimile 86-27-8713-2567

JEOL LTD (BEIJING) CO LTD CHENGDU BRANCH 1807A Zonglu Building NO 35 Zhongfu Road Chengdu Sichuan 610016 PR China Telephone 86-28-86622554 Facsimile 86-28-86622564

EGYPT JEOL SERIVCE BUREAU

3rd Fl Nile Center Bldg Nawal Slree Dokkl (Cairo) Egypt Telephone 20-2-3335-7220 Facsimile 20-2-3338-4186

FRANCE JEOL (EUROPE) SAS Espace Claude Monet 1 Allee de Giverny 78290 Crolssy-sur-Seine France Telephone 33-13015-3737 Facsimile 33-13015-3747

GERMANY JEOL (GERMANY) GmbH Oskar-Von-Miller-Strasse 1 a 85386 Eching Gennany Telephone 49-8165-77346 Facsimile 49-8165-77512

GREAT BRITAIN amp IRELAND JEOL (UK) LTD JEOL House Silver Court Watchmeaci Welwyn Garden City Herts AL71LT UK Telephone 44-1707 -377117 FaCSimile 44-1707-373254

GREECE N ASTERIADIS SA

56-58S Trikoupl Str PO Box 26140 GR-10022 Athens Greece Telephone 30-1-823-5383 Facsimile 30-1-823-9567

HONG KONG FARMING LTD

Unit No1 009 1 OF Prosperity Milennia Plaza 663 Kings Road North Point Hong Kong Telephone 852-2815-7299 Facsimile 852-2581-4635

INDIA JEQL INDIA Pvt Ltd

Elegance Tower Level 2 2128 Old Mathura Road Jasola Business District Centre Near Apollo Hospital Jasola New Delhi 110025 India Telephone 91-11-6472-2578 Facsimile 91-11-4060-1235

BLUE STAR LTD (HQ Mumbaij

Analyticallnstrments Department Sahas 41412 Veer Savarkar Marg Prabhadery Mumbai 400 025 India Telephone 91-22-6666-4000 Facsimile 91-22-6666-4001

BLUE STAR LTD (DelhQ Analytical Instruments Department E-4412 Okhla Industrial Area Phase-II New Delhi 110 020 India Telephone 91-11-4149-4000 Facsimile 91-11-4149-4005

BLUE STAR LTD (Calcutta)

Analylicallnstruments Department 7 Hare Street Calcutta 700 001 India Telephone 91-33-2213-4133 Facsimile 91 -33-2213-4102

BLUE STAR LTD (ChennaO Analytical Instruments Department No 46 Garuda Building Cathedral Road Chennai 600 086 India Telephone 91-44-4244-4000 Facsimile 91-44-4244-4190

INDONESIA PT TEKNOLABindo Penta Perkasa Komplek Gading Bukillndah Blok lIll JI Bukfl Gading Raya Kelapa Gading Pennai Jakarta 14240 Indonesia Telephone 62-21-458470575859 Facsimile 62-21-45842729

ITALY JEOL 0TALIA) SpA Centro Direzionale Green Office Via dei Tulipani 1 20090 Pieve Emanuele (MI) Italy Telephone 39-02-9041431 Facsimila 39-02-90414343

KOREA JEOL KOREA LTD

Dongwoo Bldg 7F 1443 Yangjae Daero Gangdong-Gu Seoul 134-010 Korea Telephone 82-2-511-5501 Facsimile 82-2-511-2635

KUWAIT Ashraf amp CO Ltd WLL PO Box 3555 Safat 13036 Kuwait Telephone 965-1805151 Facsimile 965-24335373

MALAYSIA JEOL(MALAYSIA) SDNBHD(3S9011-M)

205 Block A Mezzanine Floor Kelana Business Center 97 Jalan SS 72 Kelana Jaya 47301 Petaling Jaya Selangor Malaysia Telephone 60-3-7492-7722 Facsimile 60-3-7492-7723

MEXICO JEOL DE MEXICO SA DE CV

Arkansas 11 Piso 2 Colonia Napoles Delegacion Benito Juarez CP 03810 Mexico DF Mexico Telephone 52-5-55-211-4511 Facsimile 52-5-55-211-0720

PAKISTAN (KarachI) ANALYTICAL MEASURING SYSTEM (pvn LTD(AMS LTD)

14-C Main Sehar Commercia) Avenue Lane 4 Khayaban-e-Sehar DHA-VII Karachimiddot75500 Pakinstan Telephone 92-21-353455813534074735346057-8 Facsimile 92-21-35345582

PANAMA PROMED SA Parque Industrial Costa del Este Urbanizacion Costa del Este Apartado 0816-01755 Panama Panama Telephone 507-303-3100 FaCSimile 507-303-3115

PHILIPPINES PHILAB INDUSTRIES INC

7487 Bagtikan Street SAY Makati 1203 Metro Manila Phillip pines Telephone 63-2-896-7218 Facsimile 63-2-897-7732

PORTUGAL Izasa Portugal Lda A do Proletariado 1 2790-138 CARNAXIDE Portugal Telephone 351-21-424-73-00 Facsimile 351-21-418-60-20

RUSSIA JEOL (RUS) LLC Krasnoproletarskaya Street 16 Bid 2 127473 Moscow Russian Federation Telephone 7-495-748-7791rr792 Facsimile 7-495-748-7793

SAUDI ARABIA ABDULREHMAN ALGOSAIBI GTC (Riyadh)

King Abdulaziz Avenue PO Box 215 Riyadh 11411 Saudi Arabia Telephone 966-1-479-3000 Facsimile 966-1-477-1374

SCANDINAVIA SWEDEN JEOL (Skandinaviska)AB

Hammarbacken 6A Box 716191 27 Sollentuna Sweden Telephone 46-8-28-2800 Facsimile 46-8-29-1647

SERVICE amp INFORMATION OFFICE NORWAY JEQL (Skandinaviska)AB

Lorenvangen 23 0580 Oslo NORWAY Telephone 47-2-2-64-7930 Facsimile 47-2-2-65-0619

FINLAND JEOL (Skandlnaviska)AB

Ylakaupinkuja 2 FIN-02360 Espoo Finland Telephone 358-9-8129-0350 Facsimile 358-9-8129-0351

SINGAPORE JEOLASIA PTE LTD

2 Corporation Road 1t01-12 Corporation Place Singapore 618494 Telephone 65-6565-9989 Facsimile 65-6565-7552

SOUTH AFRICA ADI Scientific (Pty) Ltd

370 Angus Crescent Northlands Business Park 29 Newmarket Road

~~=~g~~~2~~1nt~~2_~~~bIlC of South Africa

Facsimile 27-11 -462-1466

SPAIN IZASA SA

Argoneses 13 28100 Alcobendas (poligono IndustriaQ Madrid Spain Te~phone 34-91-663-0500 Facsimile 34-91-663-0545

SWITZERLAND JEOL (GERMANY) GmbH Oskar-Von-Miller Strasse 1 85386 Eching Germany Telephone 49-8165-77346 Facsimile 49-8165-77512

TAIWAN For EO ProQucts JIE DONG CO LTD 7F 112 Chung Hsiao East Road Section 1 Taipei Taiwan 10023 Republic of China Telephone 886-2-2395-2978 Facsimile 886-2~2322-4655

For Mass Spectrometer Products Mass Solutions Technology Co Ltd

5F No79 Sec 1 Xintai 5th Rd Xlzhi Dis New Taipei City 221 Taiwan Republic of China Telephone 886-2-2698-9511 Facsimile 886-2-2698-9512

For Semiconductor Products JEOL TAIWAN SEMICONDUCTORS LTD

11 F-l No 346 Pei-Da Road Hsin-Chu City 300 Taiwan Republic of China Telephone 886-3-523-8490 Facsimile 886-3-523-8503

THAILAND BECTHAI BANGKOK EQUIPMENT amp CHEMICAL CO Ltd

300 Phaholyothin Rd Phayathai Bangkok 10400 Thailand Telephone 66-2-615-2929 Facsimile 66-2-615-23502351

THE NETHERLANDS JEOL (EUROPE) Bv Ureweg 4 NL-2153 PH Nieuw-Vennep The Nelherlands Telephone 31-252-623500 Facsimile 31-252-623501

TURKEY TEKSERAS Kayisdagi )nonu MahKartal Cad No553 34755 Atasehir Istanbul Turkey Telephone 90-216-5736470 Facsimile 90-216-5736475

UAE MRS Group Dubai POBox 171612 Rashid Abdulla AI Noami Building Suite No 306 Damascus Street AI Qusais-3 Dubai UAE Telephone 971-4-2581141 Facsimile 971-4-2581151

JEOLGulf

POBox 171612 bull Rashid Abdulla AI Noami Building Suite No 306 Damascus Street AI Qusais-3 Dubai UAE Telephone 971-553964219(mobile)

USA JEOL USA INC 11 Dearborn Road Peabody MA 01960 USA Telephone 1-978-535-5900 Facsimile 1-978-536-22052206

JEOL USA INC WEST OFFICE

~~s~~~~~rigAe9~5t~~1 1 0 Telephone 1-925-737-1740 Facsimile 1-925-737-1749

VENEZUELA GOMSA Service and Supply CA

Urbanizacion Montalban JlI - Resldenclas Don Andres - Piso 7 - Apartomento 74 Avenida 3 entre calles 7 y 6 Montalban Caracas Venezuela Telephone 58-212-443-4342 Facsimile 58-212-443-4342

VTETNAM TECHNICAL MATERIALS AND RESOURCES IMPORT-EXPORT JOINT STOCK COMPANY(REXCO) Hanoi Branch

No 13-Lot 12 Trung Yen Trung Hoa Street Cau Giay Dist HanOi Vietnam Telephone 84-4-562-051617562-0535 Facsimile 84-4-853-2511

No 0205B389C Printed in Japan Kp

Page 7: Introduction - Главное управление науки БГУresearch.bsu.by/wp-content/uploads/2015/06/JEOL_Product...Scanning Electron Microscope The JSM-6610 is a high-performance

JSM-60l0 AILV InTouchScope

)shy -

JSM-6010LA

I JCM 6000 NeoScopeTM

The InTouchScope incorporates a highly intuitive SEM interface with multi-touch

technology The user can expand application windows and orchestrate aJl functions

just by touching the screen

40 nm (20 kV) 50 nm (20 kV)

05 1020 kV x810 300000

JCM-6000 NeoScopen~ let you observe a specimen at much higher magnification

than a light microscope with the same simple operation of a light microscope The

observation image appears automatically when a specimen is inserted and you can

go up to the maximum magnification of x60OOO quickly with the automated

operations

JCM-6000 NeoScopem is equipped with a TMP for quick start

The installation is easy The wall outlet (100V AC) is the only utility needed Cooling

water is not necessary

FX X10 10 60000

SI - Max 70mm dia

Ion Beam Application Equipment

pIB-09010 Cross Section Polisher (CP)

The IB-090 10CP Cross Section Polisher

makes a cross sect ion by irradiating a

spec imen with argon ion beam along an

edge of a shield plate placed on a

specimen This is an innovative specimen

preparation device for specimens studied in

SEM and EPMA

IIB-09020C Cross Section Polisher (C PIT)

The IB-09020CP Cross Section Polisher

(CPIT) creates a cross section in a manner

similar to the IB-09010CP Its built-in CCO

camera al lows real-time monitoring of a

cross-section during polishing

08 I Product Guide

I J18-4601 MuIti Beam System

I J -4501 MultiBeam System

EM-091001S Ion Slicer

The JIB-4501 MultiBeam System achieves

surfaceinternal 3D imaging and analysis

with simple operation This system also

has optimum geometry for all functions

from FIB SEM observation to EDSEBSD

analyses

R~ Iul N 5 nm (FIB) 25 nm (SEM) A I tlrx] I J 03 kV to 30 kV

(5 kV steps) Magl1lhcnli X30 10 300000

(observation milling)

The Ion Slicer can easily prepare thin-film

specimens for TEM without special skill Prior

treatment required for the Ion Slicer is only to

mechanically polish a specimen to 01 mm

thick The optimally set Ar ion beam provides

high-quality thin films In addition this

innovative tool suppresses specimen damage

and contamination such as lattice distortion

induced by mechanical polishing and

oxidation on specimen suriaces by chemical

treatment The Ion Slicer is an echo-friendly

efficient specimen-preparation tool

The JIB-4601 F MultiBeam System unites the unique imaging and analytical capabilities

of the High Power Optics employed in the TFE SEM and a high-performance FIB

column in a highly efficient and powerful system The JIB-4601 F offers an easy-to-use

tool for highly automated sample preparation combined with high-resolution imaging

and sub-micron analysis of the specimen cross-section

5 nm (FIB) 12 nm (SEM) 02 kV to 30 kV (5 kV sleps)

x30 to 1000000 (observation milling)

I J18-4000 Focused Ion Beam System

Top of the line high-throughput

processing

Compact size for flexible layout shy

Installation space reduced by 20

(compared to JEOL conventional

models)

Superb performance at low accelerating

voltage

Stage Navigation System for fast

determination of observation position

R-_ lit I f1 5 nm ICIIH~ltn lJIO ltJi 1 to 30 kV

M~Q I I x60 (for searching field) X200 to 300000

IIB09060CIS Cryo Ion Slicer

The IB-09060CIS Cryo Ion Slicer

incorporates a specimen cooling

mechanism in the EM-091001S Ion Slicer

for easy preparation of thin filmscross bull I J sections even for specimens susceptible

to thermal damage

J

~

Producl Guide I 09

- ---- shy

_bullbull- _ bullbull 1

- - -~

[Peripheral Equipment ]

IJIC 410 HDT400 JEE-420 series Ion Cleaner Hydrophilic Treatment Device Vacuum Evaporators

The JIC-41 0 Ion Cleaner removes hydrocarbon

contamination on TEM specimens by exposing

specimens in glow discharge

The treated specimens do not build up contamination

during observation in a TEM

JEC560 Auto Carbon Coater

The HDT-400 applies hydrophilic treatment on TEM

grids and SEM specimen mounting blocks The entire

operation is automated

IJFC-1600 Auto Fine Coater

O ~ - --=shy

The JEE-420 vacuum evaporator applies coating on

SEM or TEM specimens with a variety of materials

including gold platinum carbon chromium The JEEshy

420 applies shadowing on TEM specimens

- - C- Ooshy o --nu _ __ a 0 0 0 0

The JEC-560 rapidly applies carbon coating on non-conductive specimens for The JFC series sputter coater applies metal coating on SEM specimens quickly Gold

element analysis with a scanning electron microscope or an electron probe micro gold-palladium and platinum can be applied

analyzers

JED23002300F Energy Dispersive X-ray Spectrometers

Dry SO Detector

The JED-23002300F is installed on a SEM or an EPMA and performs elemental This unique box type Dry SD detector is designed for JSM-651 0 and JSM-601 0 series

analysis on micro areas The Dry SD detector an SDD type detector is cooled SEM The detector is positioned at the optimum position

electrically It does not need liquid nitrogen cooling so that maintenance is not

required Analysis Station the unique EDS analysis software is versatile with simple

operation

All y A~Ilrn System that links observed images with analysis data

inlIytl(oIIUI1Chi1$ Qualitativequantitative analysis linearea analysis

10 I Producl Guide

------

f

Instruments for Microarea and Surface Analysis

IjXA-8530F Field Emission Electron Probe Microanalyzer

The JXA-8530F features an improved hardware that is used in the JXA-8500F (the first

FE-EPMA in the world) as well as newly designed user-friendly PC-GUI windows for

efficient analysis and data operation The FE gun of the JXA-8530F provides not only a

spatial (analysis) resolution of the order of 01 IJm but also high-sensitivity X-ray

detection at low accelerating voltages and large probe currents

IjPS-9200 Photoelectron Spectrometer (XPS)

The JPS-9200 is an XPS that provides microarea analysis A newly developed microshy

tens enables high-sensitivity analysis from macro to microareas Its stage accepts both

standard-size samples (10X 10X2 mm) and large samples (up to gO mm in diameter)

The stage-scan mapping method allows the acquisition of photoelectron images

ranging from low magnification (50 x 18 mm) to high magnification (spatial resolution

30lJm)

I jAMP-9500F Field Emission Auger Microprobe

fl

X 8230 Electron Probe Microanalyzer

D

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The JXA-8230 is a newly developed EPMA which succeeds a proven JEOL EPMA

hardware and features newly designed user-friendly PC-GUI windows for efficient

analysis and data operation Sophisticated analysis menus are designed so that the

user can easily access target material analyses offering stress-free operations

I jPS-901 0 series Photoelectron Spectrometers (XPS)

XPS with high-sensitivity and high-resolution is compactly designed on the basis of

JEOLs many years of basic and application technologies on electrostatic lenses

analyzers etc The low-acceleration and large-current ion guns dedicated to permit

XPS analysis of thin films with different thicknesses from surface atomic layers to

micron order thick specimen layers The specimen chamber and etching chamber are

separated from each other in terms of vacuum thus completely preventing the

contamination due to sputtering and facilitating the maintenance of ultrahigh vacuum

A field-emission Auger Microprobe featuring the worlds highest spatial resolution with

the minimum probe diameter of 3 nm (for secondary-electron image) and 8 nm (for

Auger analysis) The new hemispherical electrostatic energy analyzer (HSA) with a

multi-channel detector optimized for Auger analysis is suitable for chemical-state

analysis The neutralizing ion gun allows Auger analysis of insulating materials Its

specimen stage accommodates a large sample of up to 95 mm in diameter Also it is

expandabfe for an UHV-SEM

ProduCI Guide I 11

X-ray Fluorescence Spectrometers

I ISX 400Rll Element Analyzer

An energy-dispersive X-ray fluorescence spectrometer for environmental analysis

which helps you comply with environmental regulations for hazardous substances

such as the RoHS and ELV directives in the EU and soil pollution in Japan You can

easily analyze minute traces of Cd Pb Hg Cr etc This analyzer is also suitable for

general analySiS including element analysis and thickness measurement using the FP

(fundamental parameter) method

I JSX-31 OORll Element Analyzer

An energy-dispersive X-ray fiuorescence spectrometer for environlnlntal analysis which helps you

comply with environmental regulations for hazardous substances such as the RoHS and ELV

directives in the EU and soil pollution in Japan This analyzer inoorporates a JEOL-made electrically

cooled Si(u] detector making liquid nrtrogen unnecessary as well as providing high sensitivity for

heavy-element analysis such as Cd Pb and Hg This analyzer is also surtable for general analysis

including eement analysis and thickness measurement using the FP (fundamental parameter)

method

12 I Product Guide

Semiconductor Eq Ipm nt

2 Electron Beam Lithography System

-5

Electron Beam Lithography System

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Electron Beam Lithography System

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Th e JBX-3200MV is an e lec lro n bea m lithography system developed for the production of next generation ultrahigh-precision masks and reticles This system employs a variableshyshaped electron beam o f 50kV and a step amp repeat specimen stage

High thro ug hp ut enabled by a new PEG (Proximity Effect Correction) system High-speed da la- transfer sys tem for a large quanti ty data High-precision design for masklrelicle production

Th e JBX-9 500FS is a spot beam

lithography system developed to meet a

wi de range of applications with high

throughput and high precision periormance

This sys tem covers fields from the nanoshy

technology research to the production of

leading edge devices

f 100kV _ ZrONV Schotlky emitter

maximum 300 mm wafer

Th e JBX-6300 FS is a s p o t b ea m

lithography system developed to meet a

w ide range o f applica tions with high

resolution and high precision periormance

This system covers fields from the nanoshy

technology research to the development of

next generation devices

25 kVl50 kVl1 00 kV ZrONV Schottky emittelt

maximum 200 mm wafelt

Prod ucl Gu ide I 13

-

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NMR Spectrometers

I JNM-ECAECX series FT NMR System

920 MHz magnet Photo courtesy Nationallnstrtute of Natural Sciences Institute for

Molecular Science

The JNM-ECA920 FT NMR System is a 920 MHz high-resolution NMR

spectrometer developed by JEOL This spectrometer uses the superconducting

magnet co-developed by National Institute for Materials Science and Kobe Steel

Ltd which generates the high magnetic field Created by combining Japans stateshy

of-the-art technologies this FT NMR System marks an important milestone in next

generation biology and nanotechnology which call for high-magnetic-field highshy

resclution NMR analysis

JEOL RESONANCE Inc

~ ~ ~

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~ 100

HNCACB spectrum of 13C(15N labeled Solid 23Na-MQMAS spectrum of ubiqurtin N3)P207

The JNM-ECNECX series are versatile high-performance FT NMR spectrometer

system that utilize the latest digital and high-frequency technology The ECA

spectrometer is applicable up to 1GHz and can be used for a wide range of

applications including liquidsolid NMR protein analysis and diffusion coefficient

measurement

INM-EC cd

JOO ~QO 0(1 ~uo 1)0

Spectrometer I Oscillator receiver power amplifier

Magnet IISCM Field strength 705T I 939T 11 74T 1401T 1643T

Bore diameter (mm) 54 I 54 54 54 54

Probe 5 mm Ttl tunable

11110

188T

54

JEOL RESONANCE Inc

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Spectrometer Oscillator receiver power amplifier

Magnet I ISCM Field strength 705T 939T I 1174T 1401T

Bore diameter (mm) I 54 54 54 54

Probe I 5 mm TH tunable

JEOL RESONANCE Inc

14 I Produc t Guide

bull bull bull

IJNM-ECS 00 FT NMR System

bull I ASC Series

Auto Sample Changer

ASC8 (8 samples) ASC24 (24 samples)

middotmiddot iT ~ --shy

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ASC16 (16 samples) ASC64 (64 samples)

bullIJNM-ECAECX series Solid NMR

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MAS conlroller Solid NMR sampling kit

NMR Systems For Modern NMR Spectroscopy The JNM-ECS400 i s a compact two-channel

spectrometer that retains the advanced capabilities of the

JNM-ECAlECX series (required installation space is oneshy

half compared to conventional NMRs) Programmable

timing sequencers built into each RF and PFG channel

can independently control either synchronous or

asynchronous operations of each channel Its standard

tunable broadband gradient probe which integrates all

JEOLs newest technologies is the high sesitivity roomshy

tempperature probe

Ccmpact spectrometer chassis Innovaten in JEOL NMR digrtal architecture High-stability and high-accuracy digital spectrometer High-sensrtivity new tunable probe Full automalk NMR with advanced software

JEOL RESONANCE Inc

An automatic sample changer makes it

possible to measure many samples

sequentially by exchanging multiple samples

automatically one by one Five changer

models are available for 8 samples 16

samples 24 samples 64 samples and 100

samples

JEOL RESONANCE Inc

ASC100 (100 samples)

1 --0 1(10 C ppm I

Sdid 13C-CPMAS spectrum of cholk acid

Solid-NMR is a technique that measures solid samples (powder or film-like samples) This technique is also effective for measurement of samples not soluble in solvents (inorganic

samples etc) and of crystalline polymorph that is meaningful to measure at the solid state

JEOL RESONANCE Inc

Produci Guide I 15

Mass Spectrometers

I JMS-800D UltraFOCUS I JMS-700 (2) MStation Mass Spectrometer Dedicated to Dioxin Anal ys is High resolution M ass Spectrometer

JMS-800D UltraFOCUS is the optimal cho ice for ultra lowlevel race detection

applications suc h as moni torin g for dioxins and related co mpoun ds eg

Polychlorinated Biphenyls (PCBs) Polybrominated Diphenyl Ethers (PBDEs) or drugs

of abuse by high resolution-selected ion monitoring (HRSIM) gas chromatographyl

mass spectrometry(GCMS)

R-- gtn 80000 (10 valley) Sent Ily 2 3 7 8-TCDD 100fg SNgt2oo

(6 channels 100 msecch Resolution 10000)

N_ Jut J _lllgEI up to 10 kV

JMS-S3000 Matri x Assisted Laser DesorptionIonization TOFMS

The JMS-S3000 is a MALOI-TOFMS incorporating an innovative SpirarrOF ion optical

system With superior capabilities than conventional MALDI-TOFMS the JMS-S3000

provides sate-of-the-art anaiylical solutions for a wide range of research areas such as

functional synthetic polymers materials science and biomolecules

Malrix Assisled Laser Desorpllonlonization Timemiddotof-Flighl Mass Spectrometer

I JMS-T1 OOLP+DART TLC-TOFMS

Pet c 60000 (10 valley) err 02 ng of methyl stearate

SIN 400

(CVEI combination ion source) I~ ~ aJe up to 10kV

I JMS-T1 OOLP LC-TOFMS

I JMS-Tl OOGCV GC-TOFMS

middotl shyThe JMS-T100LP+DART achieves simple and fast TLCMS analysis Accurate mass The JMS-Tl00GCV is a fully automatic Gas Chromatograph - Time-ot-Flight Mass

measurement capabilit y of TOFMS also enables you to determine element Spectrometer (GC-TOFMS) This versatile MS system covers wide range of

compositions of the analytes applications in GC-MS analysis

16 I Pr oduc i Gu ide

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I JMS-Ql 050GC UltraQuad GClMS

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S-trapHS Headspace Autosampler

ESR Spectrometers

I JES-X3 series ESR Spectrometers

Recently it has been widely

accepted that even retatively few

unpaired electrons in a sample can

affect the function of the material so

lower detection limits (high er

sens itivity) is required of ESR

measurements JES-X3 Series has

achieved higher sensiti v i ty by

developing a lOIN-noise Gunn

oscillator for its new spectrometer

JES-X320 JEOL RESONANCE Inc

i III III )

Maximum Magnetic Field I a6ST 13T 14T

SweepW idth I --00-- 250mT plusmn001 - 500m__T_ __--l

Pole Gap _ _ 6cmm__ ___-= ___~ ____cmm__ _ I 0 = 60mcm 75 _l

Frequency Range(GHz) 8750 - 9650 _ _ _ ___-1

Field Resolution (mT) _L_ 235 Correction by Marker _1_--- Standard

I Operating System Windows 7

The JMS-01050GC is an innovative quadrupole mass spectrometer (OMS) that

achieves the highest-level sensitivity in OMS It has a high ability of evacuation due

to the use of a split flow turbo-molecular pump system (400 Lis) th at

simultaneously evacuates the ion source and the detector The use of a highshy

accuracy hyperbolic quadrupole mass analyzer provides high resolution

The S-trap is a next-generation headspace autosampler providing ultra-low

concentration measurement which was not achieved with a heads pace (HS) method

using conventional sample loop In addition the HS-GCMS system combined lith a

JMS-01050GC Mkll quaorupole MS guarantees detection of mold odor in water

down to 1 ppt

I ES-CT470 Liquid Helium Variable Temperature Controller

The ES-CT470 varies the sample temperature in the temperature range between 25 K

and 470 K Temperature setting is performed by d igital display and the set

temperature is kept constant by automatic control circui ts Combined use with a UV Irradiation device is possible A GaAs etement is used as a temperature sensor

enabling high-accuracy temperature setling

- 25 K to 470 K

plusmn001 K for 25 K to 42 K

plusmn1 orO5 K for 42 K to 470 K

_ 20 min 10 25 min (rom room temperature 08 to 2 Uh

50Hz60Hz 5mm JEOL RESONANCE Inc

Produ c t Guide I 17

Industrial Equipm nt for thin-filnl formation and nlatel ial processing

I bull

Electron Beam Source High-power Electron Beam Source

BS-60060EBS EBG-102UB6S

Electron beam sources for vacuum evaporation of metal and metal-oxide thin-films

We offer a wide variety of electron beam sources and crucibles They have features of

excellent beam spot and energy density and high-speed sweeping

1 PGBS 80020CPPS Plasma Source

BS-80011 BPG (6kW) BS-8002OCPPS (3kW)

Plasma Sources are installed in a vacuum chamber and generate high-density plasma

Used as Ion Plating (Plasma Assisted Deposition) and it is possible to improve film

properties for optilcal thin films protective films and function films Because highshy

density plasma can be generated in a mass space high-rate deposition to a large area

is possible

I RF Induction Plasma System

JEBG-3000UB(300kW) JEBG-1 OOOUB(1 OOkW)

High-power electron beam sources for vacuum evaporation of metal and metal-oxide

for wide plastic films or large glass plates that are continuously fed And they can also

be used for vacuum melting of high-melting point metals

raes

RF Generator

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RF-12030 (3kW) RF-56000 (Controller)

13 56MHz radio-frequency power supplies for plasma generation and used for

sputtering CVD etching and ion-plating We offer 750W to 6kW generators and

matching networks

DR Powder Feeder

Thermal plasma around 10000degC (15000deg F) by RF inductive coupling This thermal Fine powder feeder that can feed 01 to 100 11m size fine powder continuously with

plasma is used for nano powder synthesis fine powder spheroidization thick film carrier gas We offer optional feeding rate controller and large capacity hopper

deposition multi composite membrane synthesis CVD and harmful gas

decomposition

18 I Produci Guide

---

Biochemical Analyzers

I JCA-BM series Clinical Chemistry Analyzer BioMajesty Series

JEOLs micro volume technology and unique sample pre-dilution mechanism realizes

high throughput chemistry analysis with reduced sample and reagent volume

More than 4000 systems have been placed in clinical laboratories allover the world

JCA-BM6050

I JCA-BMBOOO series Ultra High Throughput Clinical Chemistry Analyzer

4 4

JCA-BMB060 egt

JCA-BMSOOO series offer ultra high throughput chemistry analysis up to 9000 testsl

hour

The pre-dilution unit one of the BioMajesty family features also continues the strong

tradition in these series with interconnected multiple analysis modules the key factors

that accomplish brilliant high throughput as well as downtime reduction with back-up

capability

I JCA-BM6070 High Throughput High Performance Clinical Chemistry An alyzer

I I I

A Clinical chemistry analyzer with incomparable speed and accuracy which achieves

high throughput of 2400 testslhour (includ ing ISE) The incorporated compact

workstation and user-friendly Interface with excellent operability leads the new trend of

the laboratory testing

BioMajesty Series lCA-BM 6010 lCA-BM 6050

lCA-8M 6070 leA-BM 91 30

lCA-BM 8000 Series

bull This product is distributed outside Japan by Siemens Heatthcare Diagnostics under the ADVtAreg brand name

I JCA-BM601 OC Compact amp High Performance Clinical Chemistry Analyzer

-~-I -

1lIIIIIIilllllllllJllnlIlII Ii I JCA-BM6010C is a compact but efficient automatic analyzer that maintains the basic

concept of BioMajesty series while achieving the excellent capability of microanalysis

with sample volume as small as 1 J1L

BM6010C also offers fully automated HbA1 c analysis with on-board hemolysis

(optional) Simultaneous measurement of Glucose and HbA1c improves laboratory

workflow

Product Guid e I 19

S~~MCEAII Certain products in this brochure are controlled under the Foreign 0J 0014007 -v- ~ Exchange and Foreign Trade Law of Japan in compliance with $ ~~~ international security export control JEOL Ltd must provide the~2 m) IIlt Japanese Government with End-users Statement of Assurancel A MGMT SYS

AvA ~ m and End-use Certificate in order to obtain the export license - tiJ needed for export from Japan If the product to be exported is in this category the end user will be asked to fill in these certificate formsdEOLIS09001 amp150 14001CenrfiCltlled

httpwwwjeolcomdEOL JEOL Ltd 1-2 Musashino 3-chome Akishima Tokyo 196-8558 Japan Sales Division Telephone+81-42-528-3381 Facsimile+81-42-528-3386

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3rd Fl Nile Center Bldg Nawal Slree Dokkl (Cairo) Egypt Telephone 20-2-3335-7220 Facsimile 20-2-3338-4186

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GERMANY JEOL (GERMANY) GmbH Oskar-Von-Miller-Strasse 1 a 85386 Eching Gennany Telephone 49-8165-77346 Facsimile 49-8165-77512

GREAT BRITAIN amp IRELAND JEOL (UK) LTD JEOL House Silver Court Watchmeaci Welwyn Garden City Herts AL71LT UK Telephone 44-1707 -377117 FaCSimile 44-1707-373254

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56-58S Trikoupl Str PO Box 26140 GR-10022 Athens Greece Telephone 30-1-823-5383 Facsimile 30-1-823-9567

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Unit No1 009 1 OF Prosperity Milennia Plaza 663 Kings Road North Point Hong Kong Telephone 852-2815-7299 Facsimile 852-2581-4635

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Elegance Tower Level 2 2128 Old Mathura Road Jasola Business District Centre Near Apollo Hospital Jasola New Delhi 110025 India Telephone 91-11-6472-2578 Facsimile 91-11-4060-1235

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Analyticallnstrments Department Sahas 41412 Veer Savarkar Marg Prabhadery Mumbai 400 025 India Telephone 91-22-6666-4000 Facsimile 91-22-6666-4001

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Analylicallnstruments Department 7 Hare Street Calcutta 700 001 India Telephone 91-33-2213-4133 Facsimile 91 -33-2213-4102

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INDONESIA PT TEKNOLABindo Penta Perkasa Komplek Gading Bukillndah Blok lIll JI Bukfl Gading Raya Kelapa Gading Pennai Jakarta 14240 Indonesia Telephone 62-21-458470575859 Facsimile 62-21-45842729

ITALY JEOL 0TALIA) SpA Centro Direzionale Green Office Via dei Tulipani 1 20090 Pieve Emanuele (MI) Italy Telephone 39-02-9041431 Facsimila 39-02-90414343

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Dongwoo Bldg 7F 1443 Yangjae Daero Gangdong-Gu Seoul 134-010 Korea Telephone 82-2-511-5501 Facsimile 82-2-511-2635

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14-C Main Sehar Commercia) Avenue Lane 4 Khayaban-e-Sehar DHA-VII Karachimiddot75500 Pakinstan Telephone 92-21-353455813534074735346057-8 Facsimile 92-21-35345582

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Ylakaupinkuja 2 FIN-02360 Espoo Finland Telephone 358-9-8129-0350 Facsimile 358-9-8129-0351

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2 Corporation Road 1t01-12 Corporation Place Singapore 618494 Telephone 65-6565-9989 Facsimile 65-6565-7552

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370 Angus Crescent Northlands Business Park 29 Newmarket Road

~~=~g~~~2~~1nt~~2_~~~bIlC of South Africa

Facsimile 27-11 -462-1466

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Argoneses 13 28100 Alcobendas (poligono IndustriaQ Madrid Spain Te~phone 34-91-663-0500 Facsimile 34-91-663-0545

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For Mass Spectrometer Products Mass Solutions Technology Co Ltd

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JEOLGulf

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USA JEOL USA INC 11 Dearborn Road Peabody MA 01960 USA Telephone 1-978-535-5900 Facsimile 1-978-536-22052206

JEOL USA INC WEST OFFICE

~~s~~~~~rigAe9~5t~~1 1 0 Telephone 1-925-737-1740 Facsimile 1-925-737-1749

VENEZUELA GOMSA Service and Supply CA

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No 0205B389C Printed in Japan Kp

Page 8: Introduction - Главное управление науки БГУresearch.bsu.by/wp-content/uploads/2015/06/JEOL_Product...Scanning Electron Microscope The JSM-6610 is a high-performance

I J18-4601 MuIti Beam System

I J -4501 MultiBeam System

EM-091001S Ion Slicer

The JIB-4501 MultiBeam System achieves

surfaceinternal 3D imaging and analysis

with simple operation This system also

has optimum geometry for all functions

from FIB SEM observation to EDSEBSD

analyses

R~ Iul N 5 nm (FIB) 25 nm (SEM) A I tlrx] I J 03 kV to 30 kV

(5 kV steps) Magl1lhcnli X30 10 300000

(observation milling)

The Ion Slicer can easily prepare thin-film

specimens for TEM without special skill Prior

treatment required for the Ion Slicer is only to

mechanically polish a specimen to 01 mm

thick The optimally set Ar ion beam provides

high-quality thin films In addition this

innovative tool suppresses specimen damage

and contamination such as lattice distortion

induced by mechanical polishing and

oxidation on specimen suriaces by chemical

treatment The Ion Slicer is an echo-friendly

efficient specimen-preparation tool

The JIB-4601 F MultiBeam System unites the unique imaging and analytical capabilities

of the High Power Optics employed in the TFE SEM and a high-performance FIB

column in a highly efficient and powerful system The JIB-4601 F offers an easy-to-use

tool for highly automated sample preparation combined with high-resolution imaging

and sub-micron analysis of the specimen cross-section

5 nm (FIB) 12 nm (SEM) 02 kV to 30 kV (5 kV sleps)

x30 to 1000000 (observation milling)

I J18-4000 Focused Ion Beam System

Top of the line high-throughput

processing

Compact size for flexible layout shy

Installation space reduced by 20

(compared to JEOL conventional

models)

Superb performance at low accelerating

voltage

Stage Navigation System for fast

determination of observation position

R-_ lit I f1 5 nm ICIIH~ltn lJIO ltJi 1 to 30 kV

M~Q I I x60 (for searching field) X200 to 300000

IIB09060CIS Cryo Ion Slicer

The IB-09060CIS Cryo Ion Slicer

incorporates a specimen cooling

mechanism in the EM-091001S Ion Slicer

for easy preparation of thin filmscross bull I J sections even for specimens susceptible

to thermal damage

J

~

Producl Guide I 09

- ---- shy

_bullbull- _ bullbull 1

- - -~

[Peripheral Equipment ]

IJIC 410 HDT400 JEE-420 series Ion Cleaner Hydrophilic Treatment Device Vacuum Evaporators

The JIC-41 0 Ion Cleaner removes hydrocarbon

contamination on TEM specimens by exposing

specimens in glow discharge

The treated specimens do not build up contamination

during observation in a TEM

JEC560 Auto Carbon Coater

The HDT-400 applies hydrophilic treatment on TEM

grids and SEM specimen mounting blocks The entire

operation is automated

IJFC-1600 Auto Fine Coater

O ~ - --=shy

The JEE-420 vacuum evaporator applies coating on

SEM or TEM specimens with a variety of materials

including gold platinum carbon chromium The JEEshy

420 applies shadowing on TEM specimens

- - C- Ooshy o --nu _ __ a 0 0 0 0

The JEC-560 rapidly applies carbon coating on non-conductive specimens for The JFC series sputter coater applies metal coating on SEM specimens quickly Gold

element analysis with a scanning electron microscope or an electron probe micro gold-palladium and platinum can be applied

analyzers

JED23002300F Energy Dispersive X-ray Spectrometers

Dry SO Detector

The JED-23002300F is installed on a SEM or an EPMA and performs elemental This unique box type Dry SD detector is designed for JSM-651 0 and JSM-601 0 series

analysis on micro areas The Dry SD detector an SDD type detector is cooled SEM The detector is positioned at the optimum position

electrically It does not need liquid nitrogen cooling so that maintenance is not

required Analysis Station the unique EDS analysis software is versatile with simple

operation

All y A~Ilrn System that links observed images with analysis data

inlIytl(oIIUI1Chi1$ Qualitativequantitative analysis linearea analysis

10 I Producl Guide

------

f

Instruments for Microarea and Surface Analysis

IjXA-8530F Field Emission Electron Probe Microanalyzer

The JXA-8530F features an improved hardware that is used in the JXA-8500F (the first

FE-EPMA in the world) as well as newly designed user-friendly PC-GUI windows for

efficient analysis and data operation The FE gun of the JXA-8530F provides not only a

spatial (analysis) resolution of the order of 01 IJm but also high-sensitivity X-ray

detection at low accelerating voltages and large probe currents

IjPS-9200 Photoelectron Spectrometer (XPS)

The JPS-9200 is an XPS that provides microarea analysis A newly developed microshy

tens enables high-sensitivity analysis from macro to microareas Its stage accepts both

standard-size samples (10X 10X2 mm) and large samples (up to gO mm in diameter)

The stage-scan mapping method allows the acquisition of photoelectron images

ranging from low magnification (50 x 18 mm) to high magnification (spatial resolution

30lJm)

I jAMP-9500F Field Emission Auger Microprobe

fl

X 8230 Electron Probe Microanalyzer

D

~) ~ j ) ~ =~=

The JXA-8230 is a newly developed EPMA which succeeds a proven JEOL EPMA

hardware and features newly designed user-friendly PC-GUI windows for efficient

analysis and data operation Sophisticated analysis menus are designed so that the

user can easily access target material analyses offering stress-free operations

I jPS-901 0 series Photoelectron Spectrometers (XPS)

XPS with high-sensitivity and high-resolution is compactly designed on the basis of

JEOLs many years of basic and application technologies on electrostatic lenses

analyzers etc The low-acceleration and large-current ion guns dedicated to permit

XPS analysis of thin films with different thicknesses from surface atomic layers to

micron order thick specimen layers The specimen chamber and etching chamber are

separated from each other in terms of vacuum thus completely preventing the

contamination due to sputtering and facilitating the maintenance of ultrahigh vacuum

A field-emission Auger Microprobe featuring the worlds highest spatial resolution with

the minimum probe diameter of 3 nm (for secondary-electron image) and 8 nm (for

Auger analysis) The new hemispherical electrostatic energy analyzer (HSA) with a

multi-channel detector optimized for Auger analysis is suitable for chemical-state

analysis The neutralizing ion gun allows Auger analysis of insulating materials Its

specimen stage accommodates a large sample of up to 95 mm in diameter Also it is

expandabfe for an UHV-SEM

ProduCI Guide I 11

X-ray Fluorescence Spectrometers

I ISX 400Rll Element Analyzer

An energy-dispersive X-ray fluorescence spectrometer for environmental analysis

which helps you comply with environmental regulations for hazardous substances

such as the RoHS and ELV directives in the EU and soil pollution in Japan You can

easily analyze minute traces of Cd Pb Hg Cr etc This analyzer is also suitable for

general analySiS including element analysis and thickness measurement using the FP

(fundamental parameter) method

I JSX-31 OORll Element Analyzer

An energy-dispersive X-ray fiuorescence spectrometer for environlnlntal analysis which helps you

comply with environmental regulations for hazardous substances such as the RoHS and ELV

directives in the EU and soil pollution in Japan This analyzer inoorporates a JEOL-made electrically

cooled Si(u] detector making liquid nrtrogen unnecessary as well as providing high sensitivity for

heavy-element analysis such as Cd Pb and Hg This analyzer is also surtable for general analysis

including eement analysis and thickness measurement using the FP (fundamental parameter)

method

12 I Product Guide

Semiconductor Eq Ipm nt

2 Electron Beam Lithography System

-5

Electron Beam Lithography System

r

Electron Beam Lithography System

-~=-~--I--~ I

~ ~ ~-

Th e JBX-3200MV is an e lec lro n bea m lithography system developed for the production of next generation ultrahigh-precision masks and reticles This system employs a variableshyshaped electron beam o f 50kV and a step amp repeat specimen stage

High thro ug hp ut enabled by a new PEG (Proximity Effect Correction) system High-speed da la- transfer sys tem for a large quanti ty data High-precision design for masklrelicle production

Th e JBX-9 500FS is a spot beam

lithography system developed to meet a

wi de range of applications with high

throughput and high precision periormance

This sys tem covers fields from the nanoshy

technology research to the production of

leading edge devices

f 100kV _ ZrONV Schotlky emitter

maximum 300 mm wafer

Th e JBX-6300 FS is a s p o t b ea m

lithography system developed to meet a

w ide range o f applica tions with high

resolution and high precision periormance

This system covers fields from the nanoshy

technology research to the development of

next generation devices

25 kVl50 kVl1 00 kV ZrONV Schottky emittelt

maximum 200 mm wafelt

Prod ucl Gu ide I 13

-

---------

-_ -~

- --= - - - =-shy -

NMR Spectrometers

I JNM-ECAECX series FT NMR System

920 MHz magnet Photo courtesy Nationallnstrtute of Natural Sciences Institute for

Molecular Science

The JNM-ECA920 FT NMR System is a 920 MHz high-resolution NMR

spectrometer developed by JEOL This spectrometer uses the superconducting

magnet co-developed by National Institute for Materials Science and Kobe Steel

Ltd which generates the high magnetic field Created by combining Japans stateshy

of-the-art technologies this FT NMR System marks an important milestone in next

generation biology and nanotechnology which call for high-magnetic-field highshy

resclution NMR analysis

JEOL RESONANCE Inc

~ ~ ~

~t~-

~ 100

HNCACB spectrum of 13C(15N labeled Solid 23Na-MQMAS spectrum of ubiqurtin N3)P207

The JNM-ECNECX series are versatile high-performance FT NMR spectrometer

system that utilize the latest digital and high-frequency technology The ECA

spectrometer is applicable up to 1GHz and can be used for a wide range of

applications including liquidsolid NMR protein analysis and diffusion coefficient

measurement

INM-EC cd

JOO ~QO 0(1 ~uo 1)0

Spectrometer I Oscillator receiver power amplifier

Magnet IISCM Field strength 705T I 939T 11 74T 1401T 1643T

Bore diameter (mm) 54 I 54 54 54 54

Probe 5 mm Ttl tunable

11110

188T

54

JEOL RESONANCE Inc

INMmiddot fO rie ---shy

)Ol~ ~1111 011 Oll

Spectrometer Oscillator receiver power amplifier

Magnet I ISCM Field strength 705T 939T I 1174T 1401T

Bore diameter (mm) I 54 54 54 54

Probe I 5 mm TH tunable

JEOL RESONANCE Inc

14 I Produc t Guide

bull bull bull

IJNM-ECS 00 FT NMR System

bull I ASC Series

Auto Sample Changer

ASC8 (8 samples) ASC24 (24 samples)

middotmiddot iT ~ --shy

~ I -~Au

ASC16 (16 samples) ASC64 (64 samples)

bullIJNM-ECAECX series Solid NMR

=- ~

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MAS conlroller Solid NMR sampling kit

NMR Systems For Modern NMR Spectroscopy The JNM-ECS400 i s a compact two-channel

spectrometer that retains the advanced capabilities of the

JNM-ECAlECX series (required installation space is oneshy

half compared to conventional NMRs) Programmable

timing sequencers built into each RF and PFG channel

can independently control either synchronous or

asynchronous operations of each channel Its standard

tunable broadband gradient probe which integrates all

JEOLs newest technologies is the high sesitivity roomshy

tempperature probe

Ccmpact spectrometer chassis Innovaten in JEOL NMR digrtal architecture High-stability and high-accuracy digital spectrometer High-sensrtivity new tunable probe Full automalk NMR with advanced software

JEOL RESONANCE Inc

An automatic sample changer makes it

possible to measure many samples

sequentially by exchanging multiple samples

automatically one by one Five changer

models are available for 8 samples 16

samples 24 samples 64 samples and 100

samples

JEOL RESONANCE Inc

ASC100 (100 samples)

1 --0 1(10 C ppm I

Sdid 13C-CPMAS spectrum of cholk acid

Solid-NMR is a technique that measures solid samples (powder or film-like samples) This technique is also effective for measurement of samples not soluble in solvents (inorganic

samples etc) and of crystalline polymorph that is meaningful to measure at the solid state

JEOL RESONANCE Inc

Produci Guide I 15

Mass Spectrometers

I JMS-800D UltraFOCUS I JMS-700 (2) MStation Mass Spectrometer Dedicated to Dioxin Anal ys is High resolution M ass Spectrometer

JMS-800D UltraFOCUS is the optimal cho ice for ultra lowlevel race detection

applications suc h as moni torin g for dioxins and related co mpoun ds eg

Polychlorinated Biphenyls (PCBs) Polybrominated Diphenyl Ethers (PBDEs) or drugs

of abuse by high resolution-selected ion monitoring (HRSIM) gas chromatographyl

mass spectrometry(GCMS)

R-- gtn 80000 (10 valley) Sent Ily 2 3 7 8-TCDD 100fg SNgt2oo

(6 channels 100 msecch Resolution 10000)

N_ Jut J _lllgEI up to 10 kV

JMS-S3000 Matri x Assisted Laser DesorptionIonization TOFMS

The JMS-S3000 is a MALOI-TOFMS incorporating an innovative SpirarrOF ion optical

system With superior capabilities than conventional MALDI-TOFMS the JMS-S3000

provides sate-of-the-art anaiylical solutions for a wide range of research areas such as

functional synthetic polymers materials science and biomolecules

Malrix Assisled Laser Desorpllonlonization Timemiddotof-Flighl Mass Spectrometer

I JMS-T1 OOLP+DART TLC-TOFMS

Pet c 60000 (10 valley) err 02 ng of methyl stearate

SIN 400

(CVEI combination ion source) I~ ~ aJe up to 10kV

I JMS-T1 OOLP LC-TOFMS

I JMS-Tl OOGCV GC-TOFMS

middotl shyThe JMS-T100LP+DART achieves simple and fast TLCMS analysis Accurate mass The JMS-Tl00GCV is a fully automatic Gas Chromatograph - Time-ot-Flight Mass

measurement capabilit y of TOFMS also enables you to determine element Spectrometer (GC-TOFMS) This versatile MS system covers wide range of

compositions of the analytes applications in GC-MS analysis

16 I Pr oduc i Gu ide

- -

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I JMS-Ql 050GC UltraQuad GClMS

cJEOL

-

S-trapHS Headspace Autosampler

ESR Spectrometers

I JES-X3 series ESR Spectrometers

Recently it has been widely

accepted that even retatively few

unpaired electrons in a sample can

affect the function of the material so

lower detection limits (high er

sens itivity) is required of ESR

measurements JES-X3 Series has

achieved higher sensiti v i ty by

developing a lOIN-noise Gunn

oscillator for its new spectrometer

JES-X320 JEOL RESONANCE Inc

i III III )

Maximum Magnetic Field I a6ST 13T 14T

SweepW idth I --00-- 250mT plusmn001 - 500m__T_ __--l

Pole Gap _ _ 6cmm__ ___-= ___~ ____cmm__ _ I 0 = 60mcm 75 _l

Frequency Range(GHz) 8750 - 9650 _ _ _ ___-1

Field Resolution (mT) _L_ 235 Correction by Marker _1_--- Standard

I Operating System Windows 7

The JMS-01050GC is an innovative quadrupole mass spectrometer (OMS) that

achieves the highest-level sensitivity in OMS It has a high ability of evacuation due

to the use of a split flow turbo-molecular pump system (400 Lis) th at

simultaneously evacuates the ion source and the detector The use of a highshy

accuracy hyperbolic quadrupole mass analyzer provides high resolution

The S-trap is a next-generation headspace autosampler providing ultra-low

concentration measurement which was not achieved with a heads pace (HS) method

using conventional sample loop In addition the HS-GCMS system combined lith a

JMS-01050GC Mkll quaorupole MS guarantees detection of mold odor in water

down to 1 ppt

I ES-CT470 Liquid Helium Variable Temperature Controller

The ES-CT470 varies the sample temperature in the temperature range between 25 K

and 470 K Temperature setting is performed by d igital display and the set

temperature is kept constant by automatic control circui ts Combined use with a UV Irradiation device is possible A GaAs etement is used as a temperature sensor

enabling high-accuracy temperature setling

- 25 K to 470 K

plusmn001 K for 25 K to 42 K

plusmn1 orO5 K for 42 K to 470 K

_ 20 min 10 25 min (rom room temperature 08 to 2 Uh

50Hz60Hz 5mm JEOL RESONANCE Inc

Produ c t Guide I 17

Industrial Equipm nt for thin-filnl formation and nlatel ial processing

I bull

Electron Beam Source High-power Electron Beam Source

BS-60060EBS EBG-102UB6S

Electron beam sources for vacuum evaporation of metal and metal-oxide thin-films

We offer a wide variety of electron beam sources and crucibles They have features of

excellent beam spot and energy density and high-speed sweeping

1 PGBS 80020CPPS Plasma Source

BS-80011 BPG (6kW) BS-8002OCPPS (3kW)

Plasma Sources are installed in a vacuum chamber and generate high-density plasma

Used as Ion Plating (Plasma Assisted Deposition) and it is possible to improve film

properties for optilcal thin films protective films and function films Because highshy

density plasma can be generated in a mass space high-rate deposition to a large area

is possible

I RF Induction Plasma System

JEBG-3000UB(300kW) JEBG-1 OOOUB(1 OOkW)

High-power electron beam sources for vacuum evaporation of metal and metal-oxide

for wide plastic films or large glass plates that are continuously fed And they can also

be used for vacuum melting of high-melting point metals

raes

RF Generator

t shy - - - --- - - --- -

0-~ 0 bull bullbull - -

RF-12030 (3kW) RF-56000 (Controller)

13 56MHz radio-frequency power supplies for plasma generation and used for

sputtering CVD etching and ion-plating We offer 750W to 6kW generators and

matching networks

DR Powder Feeder

Thermal plasma around 10000degC (15000deg F) by RF inductive coupling This thermal Fine powder feeder that can feed 01 to 100 11m size fine powder continuously with

plasma is used for nano powder synthesis fine powder spheroidization thick film carrier gas We offer optional feeding rate controller and large capacity hopper

deposition multi composite membrane synthesis CVD and harmful gas

decomposition

18 I Produci Guide

---

Biochemical Analyzers

I JCA-BM series Clinical Chemistry Analyzer BioMajesty Series

JEOLs micro volume technology and unique sample pre-dilution mechanism realizes

high throughput chemistry analysis with reduced sample and reagent volume

More than 4000 systems have been placed in clinical laboratories allover the world

JCA-BM6050

I JCA-BMBOOO series Ultra High Throughput Clinical Chemistry Analyzer

4 4

JCA-BMB060 egt

JCA-BMSOOO series offer ultra high throughput chemistry analysis up to 9000 testsl

hour

The pre-dilution unit one of the BioMajesty family features also continues the strong

tradition in these series with interconnected multiple analysis modules the key factors

that accomplish brilliant high throughput as well as downtime reduction with back-up

capability

I JCA-BM6070 High Throughput High Performance Clinical Chemistry An alyzer

I I I

A Clinical chemistry analyzer with incomparable speed and accuracy which achieves

high throughput of 2400 testslhour (includ ing ISE) The incorporated compact

workstation and user-friendly Interface with excellent operability leads the new trend of

the laboratory testing

BioMajesty Series lCA-BM 6010 lCA-BM 6050

lCA-8M 6070 leA-BM 91 30

lCA-BM 8000 Series

bull This product is distributed outside Japan by Siemens Heatthcare Diagnostics under the ADVtAreg brand name

I JCA-BM601 OC Compact amp High Performance Clinical Chemistry Analyzer

-~-I -

1lIIIIIIilllllllllJllnlIlII Ii I JCA-BM6010C is a compact but efficient automatic analyzer that maintains the basic

concept of BioMajesty series while achieving the excellent capability of microanalysis

with sample volume as small as 1 J1L

BM6010C also offers fully automated HbA1 c analysis with on-board hemolysis

(optional) Simultaneous measurement of Glucose and HbA1c improves laboratory

workflow

Product Guid e I 19

S~~MCEAII Certain products in this brochure are controlled under the Foreign 0J 0014007 -v- ~ Exchange and Foreign Trade Law of Japan in compliance with $ ~~~ international security export control JEOL Ltd must provide the~2 m) IIlt Japanese Government with End-users Statement of Assurancel A MGMT SYS

AvA ~ m and End-use Certificate in order to obtain the export license - tiJ needed for export from Japan If the product to be exported is in this category the end user will be asked to fill in these certificate formsdEOLIS09001 amp150 14001CenrfiCltlled

httpwwwjeolcomdEOL JEOL Ltd 1-2 Musashino 3-chome Akishima Tokyo 196-8558 Japan Sales Division Telephone+81-42-528-3381 Facsimile+81-42-528-3386

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~~=~g~~~2~~1nt~~2_~~~bIlC of South Africa

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Argoneses 13 28100 Alcobendas (poligono IndustriaQ Madrid Spain Te~phone 34-91-663-0500 Facsimile 34-91-663-0545

SWITZERLAND JEOL (GERMANY) GmbH Oskar-Von-Miller Strasse 1 85386 Eching Germany Telephone 49-8165-77346 Facsimile 49-8165-77512

TAIWAN For EO ProQucts JIE DONG CO LTD 7F 112 Chung Hsiao East Road Section 1 Taipei Taiwan 10023 Republic of China Telephone 886-2-2395-2978 Facsimile 886-2~2322-4655

For Mass Spectrometer Products Mass Solutions Technology Co Ltd

5F No79 Sec 1 Xintai 5th Rd Xlzhi Dis New Taipei City 221 Taiwan Republic of China Telephone 886-2-2698-9511 Facsimile 886-2-2698-9512

For Semiconductor Products JEOL TAIWAN SEMICONDUCTORS LTD

11 F-l No 346 Pei-Da Road Hsin-Chu City 300 Taiwan Republic of China Telephone 886-3-523-8490 Facsimile 886-3-523-8503

THAILAND BECTHAI BANGKOK EQUIPMENT amp CHEMICAL CO Ltd

300 Phaholyothin Rd Phayathai Bangkok 10400 Thailand Telephone 66-2-615-2929 Facsimile 66-2-615-23502351

THE NETHERLANDS JEOL (EUROPE) Bv Ureweg 4 NL-2153 PH Nieuw-Vennep The Nelherlands Telephone 31-252-623500 Facsimile 31-252-623501

TURKEY TEKSERAS Kayisdagi )nonu MahKartal Cad No553 34755 Atasehir Istanbul Turkey Telephone 90-216-5736470 Facsimile 90-216-5736475

UAE MRS Group Dubai POBox 171612 Rashid Abdulla AI Noami Building Suite No 306 Damascus Street AI Qusais-3 Dubai UAE Telephone 971-4-2581141 Facsimile 971-4-2581151

JEOLGulf

POBox 171612 bull Rashid Abdulla AI Noami Building Suite No 306 Damascus Street AI Qusais-3 Dubai UAE Telephone 971-553964219(mobile)

USA JEOL USA INC 11 Dearborn Road Peabody MA 01960 USA Telephone 1-978-535-5900 Facsimile 1-978-536-22052206

JEOL USA INC WEST OFFICE

~~s~~~~~rigAe9~5t~~1 1 0 Telephone 1-925-737-1740 Facsimile 1-925-737-1749

VENEZUELA GOMSA Service and Supply CA

Urbanizacion Montalban JlI - Resldenclas Don Andres - Piso 7 - Apartomento 74 Avenida 3 entre calles 7 y 6 Montalban Caracas Venezuela Telephone 58-212-443-4342 Facsimile 58-212-443-4342

VTETNAM TECHNICAL MATERIALS AND RESOURCES IMPORT-EXPORT JOINT STOCK COMPANY(REXCO) Hanoi Branch

No 13-Lot 12 Trung Yen Trung Hoa Street Cau Giay Dist HanOi Vietnam Telephone 84-4-562-051617562-0535 Facsimile 84-4-853-2511

No 0205B389C Printed in Japan Kp

Page 9: Introduction - Главное управление науки БГУresearch.bsu.by/wp-content/uploads/2015/06/JEOL_Product...Scanning Electron Microscope The JSM-6610 is a high-performance

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[Peripheral Equipment ]

IJIC 410 HDT400 JEE-420 series Ion Cleaner Hydrophilic Treatment Device Vacuum Evaporators

The JIC-41 0 Ion Cleaner removes hydrocarbon

contamination on TEM specimens by exposing

specimens in glow discharge

The treated specimens do not build up contamination

during observation in a TEM

JEC560 Auto Carbon Coater

The HDT-400 applies hydrophilic treatment on TEM

grids and SEM specimen mounting blocks The entire

operation is automated

IJFC-1600 Auto Fine Coater

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The JEE-420 vacuum evaporator applies coating on

SEM or TEM specimens with a variety of materials

including gold platinum carbon chromium The JEEshy

420 applies shadowing on TEM specimens

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The JEC-560 rapidly applies carbon coating on non-conductive specimens for The JFC series sputter coater applies metal coating on SEM specimens quickly Gold

element analysis with a scanning electron microscope or an electron probe micro gold-palladium and platinum can be applied

analyzers

JED23002300F Energy Dispersive X-ray Spectrometers

Dry SO Detector

The JED-23002300F is installed on a SEM or an EPMA and performs elemental This unique box type Dry SD detector is designed for JSM-651 0 and JSM-601 0 series

analysis on micro areas The Dry SD detector an SDD type detector is cooled SEM The detector is positioned at the optimum position

electrically It does not need liquid nitrogen cooling so that maintenance is not

required Analysis Station the unique EDS analysis software is versatile with simple

operation

All y A~Ilrn System that links observed images with analysis data

inlIytl(oIIUI1Chi1$ Qualitativequantitative analysis linearea analysis

10 I Producl Guide

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Instruments for Microarea and Surface Analysis

IjXA-8530F Field Emission Electron Probe Microanalyzer

The JXA-8530F features an improved hardware that is used in the JXA-8500F (the first

FE-EPMA in the world) as well as newly designed user-friendly PC-GUI windows for

efficient analysis and data operation The FE gun of the JXA-8530F provides not only a

spatial (analysis) resolution of the order of 01 IJm but also high-sensitivity X-ray

detection at low accelerating voltages and large probe currents

IjPS-9200 Photoelectron Spectrometer (XPS)

The JPS-9200 is an XPS that provides microarea analysis A newly developed microshy

tens enables high-sensitivity analysis from macro to microareas Its stage accepts both

standard-size samples (10X 10X2 mm) and large samples (up to gO mm in diameter)

The stage-scan mapping method allows the acquisition of photoelectron images

ranging from low magnification (50 x 18 mm) to high magnification (spatial resolution

30lJm)

I jAMP-9500F Field Emission Auger Microprobe

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X 8230 Electron Probe Microanalyzer

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The JXA-8230 is a newly developed EPMA which succeeds a proven JEOL EPMA

hardware and features newly designed user-friendly PC-GUI windows for efficient

analysis and data operation Sophisticated analysis menus are designed so that the

user can easily access target material analyses offering stress-free operations

I jPS-901 0 series Photoelectron Spectrometers (XPS)

XPS with high-sensitivity and high-resolution is compactly designed on the basis of

JEOLs many years of basic and application technologies on electrostatic lenses

analyzers etc The low-acceleration and large-current ion guns dedicated to permit

XPS analysis of thin films with different thicknesses from surface atomic layers to

micron order thick specimen layers The specimen chamber and etching chamber are

separated from each other in terms of vacuum thus completely preventing the

contamination due to sputtering and facilitating the maintenance of ultrahigh vacuum

A field-emission Auger Microprobe featuring the worlds highest spatial resolution with

the minimum probe diameter of 3 nm (for secondary-electron image) and 8 nm (for

Auger analysis) The new hemispherical electrostatic energy analyzer (HSA) with a

multi-channel detector optimized for Auger analysis is suitable for chemical-state

analysis The neutralizing ion gun allows Auger analysis of insulating materials Its

specimen stage accommodates a large sample of up to 95 mm in diameter Also it is

expandabfe for an UHV-SEM

ProduCI Guide I 11

X-ray Fluorescence Spectrometers

I ISX 400Rll Element Analyzer

An energy-dispersive X-ray fluorescence spectrometer for environmental analysis

which helps you comply with environmental regulations for hazardous substances

such as the RoHS and ELV directives in the EU and soil pollution in Japan You can

easily analyze minute traces of Cd Pb Hg Cr etc This analyzer is also suitable for

general analySiS including element analysis and thickness measurement using the FP

(fundamental parameter) method

I JSX-31 OORll Element Analyzer

An energy-dispersive X-ray fiuorescence spectrometer for environlnlntal analysis which helps you

comply with environmental regulations for hazardous substances such as the RoHS and ELV

directives in the EU and soil pollution in Japan This analyzer inoorporates a JEOL-made electrically

cooled Si(u] detector making liquid nrtrogen unnecessary as well as providing high sensitivity for

heavy-element analysis such as Cd Pb and Hg This analyzer is also surtable for general analysis

including eement analysis and thickness measurement using the FP (fundamental parameter)

method

12 I Product Guide

Semiconductor Eq Ipm nt

2 Electron Beam Lithography System

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Electron Beam Lithography System

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Electron Beam Lithography System

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Th e JBX-3200MV is an e lec lro n bea m lithography system developed for the production of next generation ultrahigh-precision masks and reticles This system employs a variableshyshaped electron beam o f 50kV and a step amp repeat specimen stage

High thro ug hp ut enabled by a new PEG (Proximity Effect Correction) system High-speed da la- transfer sys tem for a large quanti ty data High-precision design for masklrelicle production

Th e JBX-9 500FS is a spot beam

lithography system developed to meet a

wi de range of applications with high

throughput and high precision periormance

This sys tem covers fields from the nanoshy

technology research to the production of

leading edge devices

f 100kV _ ZrONV Schotlky emitter

maximum 300 mm wafer

Th e JBX-6300 FS is a s p o t b ea m

lithography system developed to meet a

w ide range o f applica tions with high

resolution and high precision periormance

This system covers fields from the nanoshy

technology research to the development of

next generation devices

25 kVl50 kVl1 00 kV ZrONV Schottky emittelt

maximum 200 mm wafelt

Prod ucl Gu ide I 13

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NMR Spectrometers

I JNM-ECAECX series FT NMR System

920 MHz magnet Photo courtesy Nationallnstrtute of Natural Sciences Institute for

Molecular Science

The JNM-ECA920 FT NMR System is a 920 MHz high-resolution NMR

spectrometer developed by JEOL This spectrometer uses the superconducting

magnet co-developed by National Institute for Materials Science and Kobe Steel

Ltd which generates the high magnetic field Created by combining Japans stateshy

of-the-art technologies this FT NMR System marks an important milestone in next

generation biology and nanotechnology which call for high-magnetic-field highshy

resclution NMR analysis

JEOL RESONANCE Inc

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HNCACB spectrum of 13C(15N labeled Solid 23Na-MQMAS spectrum of ubiqurtin N3)P207

The JNM-ECNECX series are versatile high-performance FT NMR spectrometer

system that utilize the latest digital and high-frequency technology The ECA

spectrometer is applicable up to 1GHz and can be used for a wide range of

applications including liquidsolid NMR protein analysis and diffusion coefficient

measurement

INM-EC cd

JOO ~QO 0(1 ~uo 1)0

Spectrometer I Oscillator receiver power amplifier

Magnet IISCM Field strength 705T I 939T 11 74T 1401T 1643T

Bore diameter (mm) 54 I 54 54 54 54

Probe 5 mm Ttl tunable

11110

188T

54

JEOL RESONANCE Inc

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Spectrometer Oscillator receiver power amplifier

Magnet I ISCM Field strength 705T 939T I 1174T 1401T

Bore diameter (mm) I 54 54 54 54

Probe I 5 mm TH tunable

JEOL RESONANCE Inc

14 I Produc t Guide

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IJNM-ECS 00 FT NMR System

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Auto Sample Changer

ASC8 (8 samples) ASC24 (24 samples)

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ASC16 (16 samples) ASC64 (64 samples)

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MAS conlroller Solid NMR sampling kit

NMR Systems For Modern NMR Spectroscopy The JNM-ECS400 i s a compact two-channel

spectrometer that retains the advanced capabilities of the

JNM-ECAlECX series (required installation space is oneshy

half compared to conventional NMRs) Programmable

timing sequencers built into each RF and PFG channel

can independently control either synchronous or

asynchronous operations of each channel Its standard

tunable broadband gradient probe which integrates all

JEOLs newest technologies is the high sesitivity roomshy

tempperature probe

Ccmpact spectrometer chassis Innovaten in JEOL NMR digrtal architecture High-stability and high-accuracy digital spectrometer High-sensrtivity new tunable probe Full automalk NMR with advanced software

JEOL RESONANCE Inc

An automatic sample changer makes it

possible to measure many samples

sequentially by exchanging multiple samples

automatically one by one Five changer

models are available for 8 samples 16

samples 24 samples 64 samples and 100

samples

JEOL RESONANCE Inc

ASC100 (100 samples)

1 --0 1(10 C ppm I

Sdid 13C-CPMAS spectrum of cholk acid

Solid-NMR is a technique that measures solid samples (powder or film-like samples) This technique is also effective for measurement of samples not soluble in solvents (inorganic

samples etc) and of crystalline polymorph that is meaningful to measure at the solid state

JEOL RESONANCE Inc

Produci Guide I 15

Mass Spectrometers

I JMS-800D UltraFOCUS I JMS-700 (2) MStation Mass Spectrometer Dedicated to Dioxin Anal ys is High resolution M ass Spectrometer

JMS-800D UltraFOCUS is the optimal cho ice for ultra lowlevel race detection

applications suc h as moni torin g for dioxins and related co mpoun ds eg

Polychlorinated Biphenyls (PCBs) Polybrominated Diphenyl Ethers (PBDEs) or drugs

of abuse by high resolution-selected ion monitoring (HRSIM) gas chromatographyl

mass spectrometry(GCMS)

R-- gtn 80000 (10 valley) Sent Ily 2 3 7 8-TCDD 100fg SNgt2oo

(6 channels 100 msecch Resolution 10000)

N_ Jut J _lllgEI up to 10 kV

JMS-S3000 Matri x Assisted Laser DesorptionIonization TOFMS

The JMS-S3000 is a MALOI-TOFMS incorporating an innovative SpirarrOF ion optical

system With superior capabilities than conventional MALDI-TOFMS the JMS-S3000

provides sate-of-the-art anaiylical solutions for a wide range of research areas such as

functional synthetic polymers materials science and biomolecules

Malrix Assisled Laser Desorpllonlonization Timemiddotof-Flighl Mass Spectrometer

I JMS-T1 OOLP+DART TLC-TOFMS

Pet c 60000 (10 valley) err 02 ng of methyl stearate

SIN 400

(CVEI combination ion source) I~ ~ aJe up to 10kV

I JMS-T1 OOLP LC-TOFMS

I JMS-Tl OOGCV GC-TOFMS

middotl shyThe JMS-T100LP+DART achieves simple and fast TLCMS analysis Accurate mass The JMS-Tl00GCV is a fully automatic Gas Chromatograph - Time-ot-Flight Mass

measurement capabilit y of TOFMS also enables you to determine element Spectrometer (GC-TOFMS) This versatile MS system covers wide range of

compositions of the analytes applications in GC-MS analysis

16 I Pr oduc i Gu ide

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I JMS-Ql 050GC UltraQuad GClMS

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S-trapHS Headspace Autosampler

ESR Spectrometers

I JES-X3 series ESR Spectrometers

Recently it has been widely

accepted that even retatively few

unpaired electrons in a sample can

affect the function of the material so

lower detection limits (high er

sens itivity) is required of ESR

measurements JES-X3 Series has

achieved higher sensiti v i ty by

developing a lOIN-noise Gunn

oscillator for its new spectrometer

JES-X320 JEOL RESONANCE Inc

i III III )

Maximum Magnetic Field I a6ST 13T 14T

SweepW idth I --00-- 250mT plusmn001 - 500m__T_ __--l

Pole Gap _ _ 6cmm__ ___-= ___~ ____cmm__ _ I 0 = 60mcm 75 _l

Frequency Range(GHz) 8750 - 9650 _ _ _ ___-1

Field Resolution (mT) _L_ 235 Correction by Marker _1_--- Standard

I Operating System Windows 7

The JMS-01050GC is an innovative quadrupole mass spectrometer (OMS) that

achieves the highest-level sensitivity in OMS It has a high ability of evacuation due

to the use of a split flow turbo-molecular pump system (400 Lis) th at

simultaneously evacuates the ion source and the detector The use of a highshy

accuracy hyperbolic quadrupole mass analyzer provides high resolution

The S-trap is a next-generation headspace autosampler providing ultra-low

concentration measurement which was not achieved with a heads pace (HS) method

using conventional sample loop In addition the HS-GCMS system combined lith a

JMS-01050GC Mkll quaorupole MS guarantees detection of mold odor in water

down to 1 ppt

I ES-CT470 Liquid Helium Variable Temperature Controller

The ES-CT470 varies the sample temperature in the temperature range between 25 K

and 470 K Temperature setting is performed by d igital display and the set

temperature is kept constant by automatic control circui ts Combined use with a UV Irradiation device is possible A GaAs etement is used as a temperature sensor

enabling high-accuracy temperature setling

- 25 K to 470 K

plusmn001 K for 25 K to 42 K

plusmn1 orO5 K for 42 K to 470 K

_ 20 min 10 25 min (rom room temperature 08 to 2 Uh

50Hz60Hz 5mm JEOL RESONANCE Inc

Produ c t Guide I 17

Industrial Equipm nt for thin-filnl formation and nlatel ial processing

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Electron Beam Source High-power Electron Beam Source

BS-60060EBS EBG-102UB6S

Electron beam sources for vacuum evaporation of metal and metal-oxide thin-films

We offer a wide variety of electron beam sources and crucibles They have features of

excellent beam spot and energy density and high-speed sweeping

1 PGBS 80020CPPS Plasma Source

BS-80011 BPG (6kW) BS-8002OCPPS (3kW)

Plasma Sources are installed in a vacuum chamber and generate high-density plasma

Used as Ion Plating (Plasma Assisted Deposition) and it is possible to improve film

properties for optilcal thin films protective films and function films Because highshy

density plasma can be generated in a mass space high-rate deposition to a large area

is possible

I RF Induction Plasma System

JEBG-3000UB(300kW) JEBG-1 OOOUB(1 OOkW)

High-power electron beam sources for vacuum evaporation of metal and metal-oxide

for wide plastic films or large glass plates that are continuously fed And they can also

be used for vacuum melting of high-melting point metals

raes

RF Generator

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RF-12030 (3kW) RF-56000 (Controller)

13 56MHz radio-frequency power supplies for plasma generation and used for

sputtering CVD etching and ion-plating We offer 750W to 6kW generators and

matching networks

DR Powder Feeder

Thermal plasma around 10000degC (15000deg F) by RF inductive coupling This thermal Fine powder feeder that can feed 01 to 100 11m size fine powder continuously with

plasma is used for nano powder synthesis fine powder spheroidization thick film carrier gas We offer optional feeding rate controller and large capacity hopper

deposition multi composite membrane synthesis CVD and harmful gas

decomposition

18 I Produci Guide

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Biochemical Analyzers

I JCA-BM series Clinical Chemistry Analyzer BioMajesty Series

JEOLs micro volume technology and unique sample pre-dilution mechanism realizes

high throughput chemistry analysis with reduced sample and reagent volume

More than 4000 systems have been placed in clinical laboratories allover the world

JCA-BM6050

I JCA-BMBOOO series Ultra High Throughput Clinical Chemistry Analyzer

4 4

JCA-BMB060 egt

JCA-BMSOOO series offer ultra high throughput chemistry analysis up to 9000 testsl

hour

The pre-dilution unit one of the BioMajesty family features also continues the strong

tradition in these series with interconnected multiple analysis modules the key factors

that accomplish brilliant high throughput as well as downtime reduction with back-up

capability

I JCA-BM6070 High Throughput High Performance Clinical Chemistry An alyzer

I I I

A Clinical chemistry analyzer with incomparable speed and accuracy which achieves

high throughput of 2400 testslhour (includ ing ISE) The incorporated compact

workstation and user-friendly Interface with excellent operability leads the new trend of

the laboratory testing

BioMajesty Series lCA-BM 6010 lCA-BM 6050

lCA-8M 6070 leA-BM 91 30

lCA-BM 8000 Series

bull This product is distributed outside Japan by Siemens Heatthcare Diagnostics under the ADVtAreg brand name

I JCA-BM601 OC Compact amp High Performance Clinical Chemistry Analyzer

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1lIIIIIIilllllllllJllnlIlII Ii I JCA-BM6010C is a compact but efficient automatic analyzer that maintains the basic

concept of BioMajesty series while achieving the excellent capability of microanalysis

with sample volume as small as 1 J1L

BM6010C also offers fully automated HbA1 c analysis with on-board hemolysis

(optional) Simultaneous measurement of Glucose and HbA1c improves laboratory

workflow

Product Guid e I 19

S~~MCEAII Certain products in this brochure are controlled under the Foreign 0J 0014007 -v- ~ Exchange and Foreign Trade Law of Japan in compliance with $ ~~~ international security export control JEOL Ltd must provide the~2 m) IIlt Japanese Government with End-users Statement of Assurancel A MGMT SYS

AvA ~ m and End-use Certificate in order to obtain the export license - tiJ needed for export from Japan If the product to be exported is in this category the end user will be asked to fill in these certificate formsdEOLIS09001 amp150 14001CenrfiCltlled

httpwwwjeolcomdEOL JEOL Ltd 1-2 Musashino 3-chome Akishima Tokyo 196-8558 Japan Sales Division Telephone+81-42-528-3381 Facsimile+81-42-528-3386

ARGENTINA COASIN SAClyF Virrey del Pino 4071 1430 Buenos Aires Argentina Telephone 54-11-4552-3185 Facsimile 54-11-4555-3321

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AUSTRIA JEOL (GERMANY) GmbH Oskar-Von-Miller-Strasse 1 a 85386 Eching Gennany Telephone 49-8165-77346 Facsimile 49-8165-77512

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3rd Fl Nile Center Bldg Nawal Slree Dokkl (Cairo) Egypt Telephone 20-2-3335-7220 Facsimile 20-2-3338-4186

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GERMANY JEOL (GERMANY) GmbH Oskar-Von-Miller-Strasse 1 a 85386 Eching Gennany Telephone 49-8165-77346 Facsimile 49-8165-77512

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Unit No1 009 1 OF Prosperity Milennia Plaza 663 Kings Road North Point Hong Kong Telephone 852-2815-7299 Facsimile 852-2581-4635

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Elegance Tower Level 2 2128 Old Mathura Road Jasola Business District Centre Near Apollo Hospital Jasola New Delhi 110025 India Telephone 91-11-6472-2578 Facsimile 91-11-4060-1235

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Analyticallnstrments Department Sahas 41412 Veer Savarkar Marg Prabhadery Mumbai 400 025 India Telephone 91-22-6666-4000 Facsimile 91-22-6666-4001

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Analylicallnstruments Department 7 Hare Street Calcutta 700 001 India Telephone 91-33-2213-4133 Facsimile 91 -33-2213-4102

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Dongwoo Bldg 7F 1443 Yangjae Daero Gangdong-Gu Seoul 134-010 Korea Telephone 82-2-511-5501 Facsimile 82-2-511-2635

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14-C Main Sehar Commercia) Avenue Lane 4 Khayaban-e-Sehar DHA-VII Karachimiddot75500 Pakinstan Telephone 92-21-353455813534074735346057-8 Facsimile 92-21-35345582

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7487 Bagtikan Street SAY Makati 1203 Metro Manila Phillip pines Telephone 63-2-896-7218 Facsimile 63-2-897-7732

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SAUDI ARABIA ABDULREHMAN ALGOSAIBI GTC (Riyadh)

King Abdulaziz Avenue PO Box 215 Riyadh 11411 Saudi Arabia Telephone 966-1-479-3000 Facsimile 966-1-477-1374

SCANDINAVIA SWEDEN JEOL (Skandinaviska)AB

Hammarbacken 6A Box 716191 27 Sollentuna Sweden Telephone 46-8-28-2800 Facsimile 46-8-29-1647

SERVICE amp INFORMATION OFFICE NORWAY JEQL (Skandinaviska)AB

Lorenvangen 23 0580 Oslo NORWAY Telephone 47-2-2-64-7930 Facsimile 47-2-2-65-0619

FINLAND JEOL (Skandlnaviska)AB

Ylakaupinkuja 2 FIN-02360 Espoo Finland Telephone 358-9-8129-0350 Facsimile 358-9-8129-0351

SINGAPORE JEOLASIA PTE LTD

2 Corporation Road 1t01-12 Corporation Place Singapore 618494 Telephone 65-6565-9989 Facsimile 65-6565-7552

SOUTH AFRICA ADI Scientific (Pty) Ltd

370 Angus Crescent Northlands Business Park 29 Newmarket Road

~~=~g~~~2~~1nt~~2_~~~bIlC of South Africa

Facsimile 27-11 -462-1466

SPAIN IZASA SA

Argoneses 13 28100 Alcobendas (poligono IndustriaQ Madrid Spain Te~phone 34-91-663-0500 Facsimile 34-91-663-0545

SWITZERLAND JEOL (GERMANY) GmbH Oskar-Von-Miller Strasse 1 85386 Eching Germany Telephone 49-8165-77346 Facsimile 49-8165-77512

TAIWAN For EO ProQucts JIE DONG CO LTD 7F 112 Chung Hsiao East Road Section 1 Taipei Taiwan 10023 Republic of China Telephone 886-2-2395-2978 Facsimile 886-2~2322-4655

For Mass Spectrometer Products Mass Solutions Technology Co Ltd

5F No79 Sec 1 Xintai 5th Rd Xlzhi Dis New Taipei City 221 Taiwan Republic of China Telephone 886-2-2698-9511 Facsimile 886-2-2698-9512

For Semiconductor Products JEOL TAIWAN SEMICONDUCTORS LTD

11 F-l No 346 Pei-Da Road Hsin-Chu City 300 Taiwan Republic of China Telephone 886-3-523-8490 Facsimile 886-3-523-8503

THAILAND BECTHAI BANGKOK EQUIPMENT amp CHEMICAL CO Ltd

300 Phaholyothin Rd Phayathai Bangkok 10400 Thailand Telephone 66-2-615-2929 Facsimile 66-2-615-23502351

THE NETHERLANDS JEOL (EUROPE) Bv Ureweg 4 NL-2153 PH Nieuw-Vennep The Nelherlands Telephone 31-252-623500 Facsimile 31-252-623501

TURKEY TEKSERAS Kayisdagi )nonu MahKartal Cad No553 34755 Atasehir Istanbul Turkey Telephone 90-216-5736470 Facsimile 90-216-5736475

UAE MRS Group Dubai POBox 171612 Rashid Abdulla AI Noami Building Suite No 306 Damascus Street AI Qusais-3 Dubai UAE Telephone 971-4-2581141 Facsimile 971-4-2581151

JEOLGulf

POBox 171612 bull Rashid Abdulla AI Noami Building Suite No 306 Damascus Street AI Qusais-3 Dubai UAE Telephone 971-553964219(mobile)

USA JEOL USA INC 11 Dearborn Road Peabody MA 01960 USA Telephone 1-978-535-5900 Facsimile 1-978-536-22052206

JEOL USA INC WEST OFFICE

~~s~~~~~rigAe9~5t~~1 1 0 Telephone 1-925-737-1740 Facsimile 1-925-737-1749

VENEZUELA GOMSA Service and Supply CA

Urbanizacion Montalban JlI - Resldenclas Don Andres - Piso 7 - Apartomento 74 Avenida 3 entre calles 7 y 6 Montalban Caracas Venezuela Telephone 58-212-443-4342 Facsimile 58-212-443-4342

VTETNAM TECHNICAL MATERIALS AND RESOURCES IMPORT-EXPORT JOINT STOCK COMPANY(REXCO) Hanoi Branch

No 13-Lot 12 Trung Yen Trung Hoa Street Cau Giay Dist HanOi Vietnam Telephone 84-4-562-051617562-0535 Facsimile 84-4-853-2511

No 0205B389C Printed in Japan Kp

Page 10: Introduction - Главное управление науки БГУresearch.bsu.by/wp-content/uploads/2015/06/JEOL_Product...Scanning Electron Microscope The JSM-6610 is a high-performance

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Instruments for Microarea and Surface Analysis

IjXA-8530F Field Emission Electron Probe Microanalyzer

The JXA-8530F features an improved hardware that is used in the JXA-8500F (the first

FE-EPMA in the world) as well as newly designed user-friendly PC-GUI windows for

efficient analysis and data operation The FE gun of the JXA-8530F provides not only a

spatial (analysis) resolution of the order of 01 IJm but also high-sensitivity X-ray

detection at low accelerating voltages and large probe currents

IjPS-9200 Photoelectron Spectrometer (XPS)

The JPS-9200 is an XPS that provides microarea analysis A newly developed microshy

tens enables high-sensitivity analysis from macro to microareas Its stage accepts both

standard-size samples (10X 10X2 mm) and large samples (up to gO mm in diameter)

The stage-scan mapping method allows the acquisition of photoelectron images

ranging from low magnification (50 x 18 mm) to high magnification (spatial resolution

30lJm)

I jAMP-9500F Field Emission Auger Microprobe

fl

X 8230 Electron Probe Microanalyzer

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The JXA-8230 is a newly developed EPMA which succeeds a proven JEOL EPMA

hardware and features newly designed user-friendly PC-GUI windows for efficient

analysis and data operation Sophisticated analysis menus are designed so that the

user can easily access target material analyses offering stress-free operations

I jPS-901 0 series Photoelectron Spectrometers (XPS)

XPS with high-sensitivity and high-resolution is compactly designed on the basis of

JEOLs many years of basic and application technologies on electrostatic lenses

analyzers etc The low-acceleration and large-current ion guns dedicated to permit

XPS analysis of thin films with different thicknesses from surface atomic layers to

micron order thick specimen layers The specimen chamber and etching chamber are

separated from each other in terms of vacuum thus completely preventing the

contamination due to sputtering and facilitating the maintenance of ultrahigh vacuum

A field-emission Auger Microprobe featuring the worlds highest spatial resolution with

the minimum probe diameter of 3 nm (for secondary-electron image) and 8 nm (for

Auger analysis) The new hemispherical electrostatic energy analyzer (HSA) with a

multi-channel detector optimized for Auger analysis is suitable for chemical-state

analysis The neutralizing ion gun allows Auger analysis of insulating materials Its

specimen stage accommodates a large sample of up to 95 mm in diameter Also it is

expandabfe for an UHV-SEM

ProduCI Guide I 11

X-ray Fluorescence Spectrometers

I ISX 400Rll Element Analyzer

An energy-dispersive X-ray fluorescence spectrometer for environmental analysis

which helps you comply with environmental regulations for hazardous substances

such as the RoHS and ELV directives in the EU and soil pollution in Japan You can

easily analyze minute traces of Cd Pb Hg Cr etc This analyzer is also suitable for

general analySiS including element analysis and thickness measurement using the FP

(fundamental parameter) method

I JSX-31 OORll Element Analyzer

An energy-dispersive X-ray fiuorescence spectrometer for environlnlntal analysis which helps you

comply with environmental regulations for hazardous substances such as the RoHS and ELV

directives in the EU and soil pollution in Japan This analyzer inoorporates a JEOL-made electrically

cooled Si(u] detector making liquid nrtrogen unnecessary as well as providing high sensitivity for

heavy-element analysis such as Cd Pb and Hg This analyzer is also surtable for general analysis

including eement analysis and thickness measurement using the FP (fundamental parameter)

method

12 I Product Guide

Semiconductor Eq Ipm nt

2 Electron Beam Lithography System

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Electron Beam Lithography System

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Electron Beam Lithography System

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Th e JBX-3200MV is an e lec lro n bea m lithography system developed for the production of next generation ultrahigh-precision masks and reticles This system employs a variableshyshaped electron beam o f 50kV and a step amp repeat specimen stage

High thro ug hp ut enabled by a new PEG (Proximity Effect Correction) system High-speed da la- transfer sys tem for a large quanti ty data High-precision design for masklrelicle production

Th e JBX-9 500FS is a spot beam

lithography system developed to meet a

wi de range of applications with high

throughput and high precision periormance

This sys tem covers fields from the nanoshy

technology research to the production of

leading edge devices

f 100kV _ ZrONV Schotlky emitter

maximum 300 mm wafer

Th e JBX-6300 FS is a s p o t b ea m

lithography system developed to meet a

w ide range o f applica tions with high

resolution and high precision periormance

This system covers fields from the nanoshy

technology research to the development of

next generation devices

25 kVl50 kVl1 00 kV ZrONV Schottky emittelt

maximum 200 mm wafelt

Prod ucl Gu ide I 13

-

---------

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NMR Spectrometers

I JNM-ECAECX series FT NMR System

920 MHz magnet Photo courtesy Nationallnstrtute of Natural Sciences Institute for

Molecular Science

The JNM-ECA920 FT NMR System is a 920 MHz high-resolution NMR

spectrometer developed by JEOL This spectrometer uses the superconducting

magnet co-developed by National Institute for Materials Science and Kobe Steel

Ltd which generates the high magnetic field Created by combining Japans stateshy

of-the-art technologies this FT NMR System marks an important milestone in next

generation biology and nanotechnology which call for high-magnetic-field highshy

resclution NMR analysis

JEOL RESONANCE Inc

~ ~ ~

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HNCACB spectrum of 13C(15N labeled Solid 23Na-MQMAS spectrum of ubiqurtin N3)P207

The JNM-ECNECX series are versatile high-performance FT NMR spectrometer

system that utilize the latest digital and high-frequency technology The ECA

spectrometer is applicable up to 1GHz and can be used for a wide range of

applications including liquidsolid NMR protein analysis and diffusion coefficient

measurement

INM-EC cd

JOO ~QO 0(1 ~uo 1)0

Spectrometer I Oscillator receiver power amplifier

Magnet IISCM Field strength 705T I 939T 11 74T 1401T 1643T

Bore diameter (mm) 54 I 54 54 54 54

Probe 5 mm Ttl tunable

11110

188T

54

JEOL RESONANCE Inc

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Spectrometer Oscillator receiver power amplifier

Magnet I ISCM Field strength 705T 939T I 1174T 1401T

Bore diameter (mm) I 54 54 54 54

Probe I 5 mm TH tunable

JEOL RESONANCE Inc

14 I Produc t Guide

bull bull bull

IJNM-ECS 00 FT NMR System

bull I ASC Series

Auto Sample Changer

ASC8 (8 samples) ASC24 (24 samples)

middotmiddot iT ~ --shy

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ASC16 (16 samples) ASC64 (64 samples)

bullIJNM-ECAECX series Solid NMR

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MAS conlroller Solid NMR sampling kit

NMR Systems For Modern NMR Spectroscopy The JNM-ECS400 i s a compact two-channel

spectrometer that retains the advanced capabilities of the

JNM-ECAlECX series (required installation space is oneshy

half compared to conventional NMRs) Programmable

timing sequencers built into each RF and PFG channel

can independently control either synchronous or

asynchronous operations of each channel Its standard

tunable broadband gradient probe which integrates all

JEOLs newest technologies is the high sesitivity roomshy

tempperature probe

Ccmpact spectrometer chassis Innovaten in JEOL NMR digrtal architecture High-stability and high-accuracy digital spectrometer High-sensrtivity new tunable probe Full automalk NMR with advanced software

JEOL RESONANCE Inc

An automatic sample changer makes it

possible to measure many samples

sequentially by exchanging multiple samples

automatically one by one Five changer

models are available for 8 samples 16

samples 24 samples 64 samples and 100

samples

JEOL RESONANCE Inc

ASC100 (100 samples)

1 --0 1(10 C ppm I

Sdid 13C-CPMAS spectrum of cholk acid

Solid-NMR is a technique that measures solid samples (powder or film-like samples) This technique is also effective for measurement of samples not soluble in solvents (inorganic

samples etc) and of crystalline polymorph that is meaningful to measure at the solid state

JEOL RESONANCE Inc

Produci Guide I 15

Mass Spectrometers

I JMS-800D UltraFOCUS I JMS-700 (2) MStation Mass Spectrometer Dedicated to Dioxin Anal ys is High resolution M ass Spectrometer

JMS-800D UltraFOCUS is the optimal cho ice for ultra lowlevel race detection

applications suc h as moni torin g for dioxins and related co mpoun ds eg

Polychlorinated Biphenyls (PCBs) Polybrominated Diphenyl Ethers (PBDEs) or drugs

of abuse by high resolution-selected ion monitoring (HRSIM) gas chromatographyl

mass spectrometry(GCMS)

R-- gtn 80000 (10 valley) Sent Ily 2 3 7 8-TCDD 100fg SNgt2oo

(6 channels 100 msecch Resolution 10000)

N_ Jut J _lllgEI up to 10 kV

JMS-S3000 Matri x Assisted Laser DesorptionIonization TOFMS

The JMS-S3000 is a MALOI-TOFMS incorporating an innovative SpirarrOF ion optical

system With superior capabilities than conventional MALDI-TOFMS the JMS-S3000

provides sate-of-the-art anaiylical solutions for a wide range of research areas such as

functional synthetic polymers materials science and biomolecules

Malrix Assisled Laser Desorpllonlonization Timemiddotof-Flighl Mass Spectrometer

I JMS-T1 OOLP+DART TLC-TOFMS

Pet c 60000 (10 valley) err 02 ng of methyl stearate

SIN 400

(CVEI combination ion source) I~ ~ aJe up to 10kV

I JMS-T1 OOLP LC-TOFMS

I JMS-Tl OOGCV GC-TOFMS

middotl shyThe JMS-T100LP+DART achieves simple and fast TLCMS analysis Accurate mass The JMS-Tl00GCV is a fully automatic Gas Chromatograph - Time-ot-Flight Mass

measurement capabilit y of TOFMS also enables you to determine element Spectrometer (GC-TOFMS) This versatile MS system covers wide range of

compositions of the analytes applications in GC-MS analysis

16 I Pr oduc i Gu ide

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I JMS-Ql 050GC UltraQuad GClMS

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S-trapHS Headspace Autosampler

ESR Spectrometers

I JES-X3 series ESR Spectrometers

Recently it has been widely

accepted that even retatively few

unpaired electrons in a sample can

affect the function of the material so

lower detection limits (high er

sens itivity) is required of ESR

measurements JES-X3 Series has

achieved higher sensiti v i ty by

developing a lOIN-noise Gunn

oscillator for its new spectrometer

JES-X320 JEOL RESONANCE Inc

i III III )

Maximum Magnetic Field I a6ST 13T 14T

SweepW idth I --00-- 250mT plusmn001 - 500m__T_ __--l

Pole Gap _ _ 6cmm__ ___-= ___~ ____cmm__ _ I 0 = 60mcm 75 _l

Frequency Range(GHz) 8750 - 9650 _ _ _ ___-1

Field Resolution (mT) _L_ 235 Correction by Marker _1_--- Standard

I Operating System Windows 7

The JMS-01050GC is an innovative quadrupole mass spectrometer (OMS) that

achieves the highest-level sensitivity in OMS It has a high ability of evacuation due

to the use of a split flow turbo-molecular pump system (400 Lis) th at

simultaneously evacuates the ion source and the detector The use of a highshy

accuracy hyperbolic quadrupole mass analyzer provides high resolution

The S-trap is a next-generation headspace autosampler providing ultra-low

concentration measurement which was not achieved with a heads pace (HS) method

using conventional sample loop In addition the HS-GCMS system combined lith a

JMS-01050GC Mkll quaorupole MS guarantees detection of mold odor in water

down to 1 ppt

I ES-CT470 Liquid Helium Variable Temperature Controller

The ES-CT470 varies the sample temperature in the temperature range between 25 K

and 470 K Temperature setting is performed by d igital display and the set

temperature is kept constant by automatic control circui ts Combined use with a UV Irradiation device is possible A GaAs etement is used as a temperature sensor

enabling high-accuracy temperature setling

- 25 K to 470 K

plusmn001 K for 25 K to 42 K

plusmn1 orO5 K for 42 K to 470 K

_ 20 min 10 25 min (rom room temperature 08 to 2 Uh

50Hz60Hz 5mm JEOL RESONANCE Inc

Produ c t Guide I 17

Industrial Equipm nt for thin-filnl formation and nlatel ial processing

I bull

Electron Beam Source High-power Electron Beam Source

BS-60060EBS EBG-102UB6S

Electron beam sources for vacuum evaporation of metal and metal-oxide thin-films

We offer a wide variety of electron beam sources and crucibles They have features of

excellent beam spot and energy density and high-speed sweeping

1 PGBS 80020CPPS Plasma Source

BS-80011 BPG (6kW) BS-8002OCPPS (3kW)

Plasma Sources are installed in a vacuum chamber and generate high-density plasma

Used as Ion Plating (Plasma Assisted Deposition) and it is possible to improve film

properties for optilcal thin films protective films and function films Because highshy

density plasma can be generated in a mass space high-rate deposition to a large area

is possible

I RF Induction Plasma System

JEBG-3000UB(300kW) JEBG-1 OOOUB(1 OOkW)

High-power electron beam sources for vacuum evaporation of metal and metal-oxide

for wide plastic films or large glass plates that are continuously fed And they can also

be used for vacuum melting of high-melting point metals

raes

RF Generator

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RF-12030 (3kW) RF-56000 (Controller)

13 56MHz radio-frequency power supplies for plasma generation and used for

sputtering CVD etching and ion-plating We offer 750W to 6kW generators and

matching networks

DR Powder Feeder

Thermal plasma around 10000degC (15000deg F) by RF inductive coupling This thermal Fine powder feeder that can feed 01 to 100 11m size fine powder continuously with

plasma is used for nano powder synthesis fine powder spheroidization thick film carrier gas We offer optional feeding rate controller and large capacity hopper

deposition multi composite membrane synthesis CVD and harmful gas

decomposition

18 I Produci Guide

---

Biochemical Analyzers

I JCA-BM series Clinical Chemistry Analyzer BioMajesty Series

JEOLs micro volume technology and unique sample pre-dilution mechanism realizes

high throughput chemistry analysis with reduced sample and reagent volume

More than 4000 systems have been placed in clinical laboratories allover the world

JCA-BM6050

I JCA-BMBOOO series Ultra High Throughput Clinical Chemistry Analyzer

4 4

JCA-BMB060 egt

JCA-BMSOOO series offer ultra high throughput chemistry analysis up to 9000 testsl

hour

The pre-dilution unit one of the BioMajesty family features also continues the strong

tradition in these series with interconnected multiple analysis modules the key factors

that accomplish brilliant high throughput as well as downtime reduction with back-up

capability

I JCA-BM6070 High Throughput High Performance Clinical Chemistry An alyzer

I I I

A Clinical chemistry analyzer with incomparable speed and accuracy which achieves

high throughput of 2400 testslhour (includ ing ISE) The incorporated compact

workstation and user-friendly Interface with excellent operability leads the new trend of

the laboratory testing

BioMajesty Series lCA-BM 6010 lCA-BM 6050

lCA-8M 6070 leA-BM 91 30

lCA-BM 8000 Series

bull This product is distributed outside Japan by Siemens Heatthcare Diagnostics under the ADVtAreg brand name

I JCA-BM601 OC Compact amp High Performance Clinical Chemistry Analyzer

-~-I -

1lIIIIIIilllllllllJllnlIlII Ii I JCA-BM6010C is a compact but efficient automatic analyzer that maintains the basic

concept of BioMajesty series while achieving the excellent capability of microanalysis

with sample volume as small as 1 J1L

BM6010C also offers fully automated HbA1 c analysis with on-board hemolysis

(optional) Simultaneous measurement of Glucose and HbA1c improves laboratory

workflow

Product Guid e I 19

S~~MCEAII Certain products in this brochure are controlled under the Foreign 0J 0014007 -v- ~ Exchange and Foreign Trade Law of Japan in compliance with $ ~~~ international security export control JEOL Ltd must provide the~2 m) IIlt Japanese Government with End-users Statement of Assurancel A MGMT SYS

AvA ~ m and End-use Certificate in order to obtain the export license - tiJ needed for export from Japan If the product to be exported is in this category the end user will be asked to fill in these certificate formsdEOLIS09001 amp150 14001CenrfiCltlled

httpwwwjeolcomdEOL JEOL Ltd 1-2 Musashino 3-chome Akishima Tokyo 196-8558 Japan Sales Division Telephone+81-42-528-3381 Facsimile+81-42-528-3386

ARGENTINA COASIN SAClyF Virrey del Pino 4071 1430 Buenos Aires Argentina Telephone 54-11-4552-3185 Facsimile 54-11-4555-3321

AUSTRALIA amp NEW ZEALAND JEOL(AUSTRALASJA) PtyUd Suite 1 L2 18 Aquatic Drive - Frenchs Foresl NSW 2086 Australia Telephone 61-2-9451-3855 Facsimile 61-2-9451-3822

AUSTRIA JEOL (GERMANY) GmbH Oskar-Von-Miller-Strasse 1 a 85386 Eching Gennany Telephone 49-8165-77346 Facsimile 49-8165-77512

BANGLADESH AQ CHOWDHURY SCIENCE amp SYNERGY PVT LTD House No1 2 Road No 5A Sector No 11 Uttara Dhaka - 1230 Bangladesh Telephone 880-2-9980790 8953450 8953501 Facsimile 880-2-8854428

BELGIUM JEOL (EUROPE) BV Planet ll Gebouw B Leuvensesteenweg 542 B-1930 Zaventem Belgium Telephone 32-2-720-0560 Facsimile 32-2-720-6134

BRAZIL JEOL Brasillnstrument09 Cienlilicos Llda

Av Jabaquara 2958-50 andar-cj 52 04046-500 Sao Paulo SP Brazil Telephone 55-11-5070 4000 Facsimile 55-11-5070 4010

CANADA JEOL CANADA INC 3275 Premier Rue 8 SI-Hubert Quebec J3Y 8Y6 Canada Telephone 1-450-676-8776 Facsimile 1-450-676-6694

CHILE ARQUIMED INNOVAnON

Arturo Pmt 828Santiago Chile Telephone 56-2-634-6266 Facsimile 56-2-634-4633

CHINA JEOL(BEIJING) CO LTD Room Bl0l0l110 Wantong New Wond Plaza No2 Fuchengmenwai Street XIcheng District Beijing 100037 PRChina Telephone 86-10-6804-6321 Facsimile 86-10-6804-6324

JEOL (BEIJING) CO LTD SHANGHAI BRANCH

Room 15051506 Nol300Xi Kang Road Jing an Dis Shanghai 200040 China Telephone 86-21-6248-4868448745374404 Facsimile 86-21-6248-4075

JEOL (BEIJING) CO LTD GUANG ZHOU BRANCH

N1601 World Trade Center Building 371-375 Huan Shi Road East Guang Zhou Guangdong Prov 510095 PRChina Telephone 86-20-8778-7848 Facsimile 86-20-8778-4268

JEOL (BEIJING) CO LTD WUHAN BRANCH

Room A2117 Zhongshang Plaza Office Bldg NO7 Zhongnan Road Wuhan Hubei 430071 PRChina Telephone 86-27-8713-2567 Facsimile 86-27-8713-2567

JEOL LTD (BEIJING) CO LTD CHENGDU BRANCH 1807A Zonglu Building NO 35 Zhongfu Road Chengdu Sichuan 610016 PR China Telephone 86-28-86622554 Facsimile 86-28-86622564

EGYPT JEOL SERIVCE BUREAU

3rd Fl Nile Center Bldg Nawal Slree Dokkl (Cairo) Egypt Telephone 20-2-3335-7220 Facsimile 20-2-3338-4186

FRANCE JEOL (EUROPE) SAS Espace Claude Monet 1 Allee de Giverny 78290 Crolssy-sur-Seine France Telephone 33-13015-3737 Facsimile 33-13015-3747

GERMANY JEOL (GERMANY) GmbH Oskar-Von-Miller-Strasse 1 a 85386 Eching Gennany Telephone 49-8165-77346 Facsimile 49-8165-77512

GREAT BRITAIN amp IRELAND JEOL (UK) LTD JEOL House Silver Court Watchmeaci Welwyn Garden City Herts AL71LT UK Telephone 44-1707 -377117 FaCSimile 44-1707-373254

GREECE N ASTERIADIS SA

56-58S Trikoupl Str PO Box 26140 GR-10022 Athens Greece Telephone 30-1-823-5383 Facsimile 30-1-823-9567

HONG KONG FARMING LTD

Unit No1 009 1 OF Prosperity Milennia Plaza 663 Kings Road North Point Hong Kong Telephone 852-2815-7299 Facsimile 852-2581-4635

INDIA JEQL INDIA Pvt Ltd

Elegance Tower Level 2 2128 Old Mathura Road Jasola Business District Centre Near Apollo Hospital Jasola New Delhi 110025 India Telephone 91-11-6472-2578 Facsimile 91-11-4060-1235

BLUE STAR LTD (HQ Mumbaij

Analyticallnstrments Department Sahas 41412 Veer Savarkar Marg Prabhadery Mumbai 400 025 India Telephone 91-22-6666-4000 Facsimile 91-22-6666-4001

BLUE STAR LTD (DelhQ Analytical Instruments Department E-4412 Okhla Industrial Area Phase-II New Delhi 110 020 India Telephone 91-11-4149-4000 Facsimile 91-11-4149-4005

BLUE STAR LTD (Calcutta)

Analylicallnstruments Department 7 Hare Street Calcutta 700 001 India Telephone 91-33-2213-4133 Facsimile 91 -33-2213-4102

BLUE STAR LTD (ChennaO Analytical Instruments Department No 46 Garuda Building Cathedral Road Chennai 600 086 India Telephone 91-44-4244-4000 Facsimile 91-44-4244-4190

INDONESIA PT TEKNOLABindo Penta Perkasa Komplek Gading Bukillndah Blok lIll JI Bukfl Gading Raya Kelapa Gading Pennai Jakarta 14240 Indonesia Telephone 62-21-458470575859 Facsimile 62-21-45842729

ITALY JEOL 0TALIA) SpA Centro Direzionale Green Office Via dei Tulipani 1 20090 Pieve Emanuele (MI) Italy Telephone 39-02-9041431 Facsimila 39-02-90414343

KOREA JEOL KOREA LTD

Dongwoo Bldg 7F 1443 Yangjae Daero Gangdong-Gu Seoul 134-010 Korea Telephone 82-2-511-5501 Facsimile 82-2-511-2635

KUWAIT Ashraf amp CO Ltd WLL PO Box 3555 Safat 13036 Kuwait Telephone 965-1805151 Facsimile 965-24335373

MALAYSIA JEOL(MALAYSIA) SDNBHD(3S9011-M)

205 Block A Mezzanine Floor Kelana Business Center 97 Jalan SS 72 Kelana Jaya 47301 Petaling Jaya Selangor Malaysia Telephone 60-3-7492-7722 Facsimile 60-3-7492-7723

MEXICO JEOL DE MEXICO SA DE CV

Arkansas 11 Piso 2 Colonia Napoles Delegacion Benito Juarez CP 03810 Mexico DF Mexico Telephone 52-5-55-211-4511 Facsimile 52-5-55-211-0720

PAKISTAN (KarachI) ANALYTICAL MEASURING SYSTEM (pvn LTD(AMS LTD)

14-C Main Sehar Commercia) Avenue Lane 4 Khayaban-e-Sehar DHA-VII Karachimiddot75500 Pakinstan Telephone 92-21-353455813534074735346057-8 Facsimile 92-21-35345582

PANAMA PROMED SA Parque Industrial Costa del Este Urbanizacion Costa del Este Apartado 0816-01755 Panama Panama Telephone 507-303-3100 FaCSimile 507-303-3115

PHILIPPINES PHILAB INDUSTRIES INC

7487 Bagtikan Street SAY Makati 1203 Metro Manila Phillip pines Telephone 63-2-896-7218 Facsimile 63-2-897-7732

PORTUGAL Izasa Portugal Lda A do Proletariado 1 2790-138 CARNAXIDE Portugal Telephone 351-21-424-73-00 Facsimile 351-21-418-60-20

RUSSIA JEOL (RUS) LLC Krasnoproletarskaya Street 16 Bid 2 127473 Moscow Russian Federation Telephone 7-495-748-7791rr792 Facsimile 7-495-748-7793

SAUDI ARABIA ABDULREHMAN ALGOSAIBI GTC (Riyadh)

King Abdulaziz Avenue PO Box 215 Riyadh 11411 Saudi Arabia Telephone 966-1-479-3000 Facsimile 966-1-477-1374

SCANDINAVIA SWEDEN JEOL (Skandinaviska)AB

Hammarbacken 6A Box 716191 27 Sollentuna Sweden Telephone 46-8-28-2800 Facsimile 46-8-29-1647

SERVICE amp INFORMATION OFFICE NORWAY JEQL (Skandinaviska)AB

Lorenvangen 23 0580 Oslo NORWAY Telephone 47-2-2-64-7930 Facsimile 47-2-2-65-0619

FINLAND JEOL (Skandlnaviska)AB

Ylakaupinkuja 2 FIN-02360 Espoo Finland Telephone 358-9-8129-0350 Facsimile 358-9-8129-0351

SINGAPORE JEOLASIA PTE LTD

2 Corporation Road 1t01-12 Corporation Place Singapore 618494 Telephone 65-6565-9989 Facsimile 65-6565-7552

SOUTH AFRICA ADI Scientific (Pty) Ltd

370 Angus Crescent Northlands Business Park 29 Newmarket Road

~~=~g~~~2~~1nt~~2_~~~bIlC of South Africa

Facsimile 27-11 -462-1466

SPAIN IZASA SA

Argoneses 13 28100 Alcobendas (poligono IndustriaQ Madrid Spain Te~phone 34-91-663-0500 Facsimile 34-91-663-0545

SWITZERLAND JEOL (GERMANY) GmbH Oskar-Von-Miller Strasse 1 85386 Eching Germany Telephone 49-8165-77346 Facsimile 49-8165-77512

TAIWAN For EO ProQucts JIE DONG CO LTD 7F 112 Chung Hsiao East Road Section 1 Taipei Taiwan 10023 Republic of China Telephone 886-2-2395-2978 Facsimile 886-2~2322-4655

For Mass Spectrometer Products Mass Solutions Technology Co Ltd

5F No79 Sec 1 Xintai 5th Rd Xlzhi Dis New Taipei City 221 Taiwan Republic of China Telephone 886-2-2698-9511 Facsimile 886-2-2698-9512

For Semiconductor Products JEOL TAIWAN SEMICONDUCTORS LTD

11 F-l No 346 Pei-Da Road Hsin-Chu City 300 Taiwan Republic of China Telephone 886-3-523-8490 Facsimile 886-3-523-8503

THAILAND BECTHAI BANGKOK EQUIPMENT amp CHEMICAL CO Ltd

300 Phaholyothin Rd Phayathai Bangkok 10400 Thailand Telephone 66-2-615-2929 Facsimile 66-2-615-23502351

THE NETHERLANDS JEOL (EUROPE) Bv Ureweg 4 NL-2153 PH Nieuw-Vennep The Nelherlands Telephone 31-252-623500 Facsimile 31-252-623501

TURKEY TEKSERAS Kayisdagi )nonu MahKartal Cad No553 34755 Atasehir Istanbul Turkey Telephone 90-216-5736470 Facsimile 90-216-5736475

UAE MRS Group Dubai POBox 171612 Rashid Abdulla AI Noami Building Suite No 306 Damascus Street AI Qusais-3 Dubai UAE Telephone 971-4-2581141 Facsimile 971-4-2581151

JEOLGulf

POBox 171612 bull Rashid Abdulla AI Noami Building Suite No 306 Damascus Street AI Qusais-3 Dubai UAE Telephone 971-553964219(mobile)

USA JEOL USA INC 11 Dearborn Road Peabody MA 01960 USA Telephone 1-978-535-5900 Facsimile 1-978-536-22052206

JEOL USA INC WEST OFFICE

~~s~~~~~rigAe9~5t~~1 1 0 Telephone 1-925-737-1740 Facsimile 1-925-737-1749

VENEZUELA GOMSA Service and Supply CA

Urbanizacion Montalban JlI - Resldenclas Don Andres - Piso 7 - Apartomento 74 Avenida 3 entre calles 7 y 6 Montalban Caracas Venezuela Telephone 58-212-443-4342 Facsimile 58-212-443-4342

VTETNAM TECHNICAL MATERIALS AND RESOURCES IMPORT-EXPORT JOINT STOCK COMPANY(REXCO) Hanoi Branch

No 13-Lot 12 Trung Yen Trung Hoa Street Cau Giay Dist HanOi Vietnam Telephone 84-4-562-051617562-0535 Facsimile 84-4-853-2511

No 0205B389C Printed in Japan Kp

Page 11: Introduction - Главное управление науки БГУresearch.bsu.by/wp-content/uploads/2015/06/JEOL_Product...Scanning Electron Microscope The JSM-6610 is a high-performance

X-ray Fluorescence Spectrometers

I ISX 400Rll Element Analyzer

An energy-dispersive X-ray fluorescence spectrometer for environmental analysis

which helps you comply with environmental regulations for hazardous substances

such as the RoHS and ELV directives in the EU and soil pollution in Japan You can

easily analyze minute traces of Cd Pb Hg Cr etc This analyzer is also suitable for

general analySiS including element analysis and thickness measurement using the FP

(fundamental parameter) method

I JSX-31 OORll Element Analyzer

An energy-dispersive X-ray fiuorescence spectrometer for environlnlntal analysis which helps you

comply with environmental regulations for hazardous substances such as the RoHS and ELV

directives in the EU and soil pollution in Japan This analyzer inoorporates a JEOL-made electrically

cooled Si(u] detector making liquid nrtrogen unnecessary as well as providing high sensitivity for

heavy-element analysis such as Cd Pb and Hg This analyzer is also surtable for general analysis

including eement analysis and thickness measurement using the FP (fundamental parameter)

method

12 I Product Guide

Semiconductor Eq Ipm nt

2 Electron Beam Lithography System

-5

Electron Beam Lithography System

r

Electron Beam Lithography System

-~=-~--I--~ I

~ ~ ~-

Th e JBX-3200MV is an e lec lro n bea m lithography system developed for the production of next generation ultrahigh-precision masks and reticles This system employs a variableshyshaped electron beam o f 50kV and a step amp repeat specimen stage

High thro ug hp ut enabled by a new PEG (Proximity Effect Correction) system High-speed da la- transfer sys tem for a large quanti ty data High-precision design for masklrelicle production

Th e JBX-9 500FS is a spot beam

lithography system developed to meet a

wi de range of applications with high

throughput and high precision periormance

This sys tem covers fields from the nanoshy

technology research to the production of

leading edge devices

f 100kV _ ZrONV Schotlky emitter

maximum 300 mm wafer

Th e JBX-6300 FS is a s p o t b ea m

lithography system developed to meet a

w ide range o f applica tions with high

resolution and high precision periormance

This system covers fields from the nanoshy

technology research to the development of

next generation devices

25 kVl50 kVl1 00 kV ZrONV Schottky emittelt

maximum 200 mm wafelt

Prod ucl Gu ide I 13

-

---------

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- --= - - - =-shy -

NMR Spectrometers

I JNM-ECAECX series FT NMR System

920 MHz magnet Photo courtesy Nationallnstrtute of Natural Sciences Institute for

Molecular Science

The JNM-ECA920 FT NMR System is a 920 MHz high-resolution NMR

spectrometer developed by JEOL This spectrometer uses the superconducting

magnet co-developed by National Institute for Materials Science and Kobe Steel

Ltd which generates the high magnetic field Created by combining Japans stateshy

of-the-art technologies this FT NMR System marks an important milestone in next

generation biology and nanotechnology which call for high-magnetic-field highshy

resclution NMR analysis

JEOL RESONANCE Inc

~ ~ ~

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~ 100

HNCACB spectrum of 13C(15N labeled Solid 23Na-MQMAS spectrum of ubiqurtin N3)P207

The JNM-ECNECX series are versatile high-performance FT NMR spectrometer

system that utilize the latest digital and high-frequency technology The ECA

spectrometer is applicable up to 1GHz and can be used for a wide range of

applications including liquidsolid NMR protein analysis and diffusion coefficient

measurement

INM-EC cd

JOO ~QO 0(1 ~uo 1)0

Spectrometer I Oscillator receiver power amplifier

Magnet IISCM Field strength 705T I 939T 11 74T 1401T 1643T

Bore diameter (mm) 54 I 54 54 54 54

Probe 5 mm Ttl tunable

11110

188T

54

JEOL RESONANCE Inc

INMmiddot fO rie ---shy

)Ol~ ~1111 011 Oll

Spectrometer Oscillator receiver power amplifier

Magnet I ISCM Field strength 705T 939T I 1174T 1401T

Bore diameter (mm) I 54 54 54 54

Probe I 5 mm TH tunable

JEOL RESONANCE Inc

14 I Produc t Guide

bull bull bull

IJNM-ECS 00 FT NMR System

bull I ASC Series

Auto Sample Changer

ASC8 (8 samples) ASC24 (24 samples)

middotmiddot iT ~ --shy

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ASC16 (16 samples) ASC64 (64 samples)

bullIJNM-ECAECX series Solid NMR

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MAS conlroller Solid NMR sampling kit

NMR Systems For Modern NMR Spectroscopy The JNM-ECS400 i s a compact two-channel

spectrometer that retains the advanced capabilities of the

JNM-ECAlECX series (required installation space is oneshy

half compared to conventional NMRs) Programmable

timing sequencers built into each RF and PFG channel

can independently control either synchronous or

asynchronous operations of each channel Its standard

tunable broadband gradient probe which integrates all

JEOLs newest technologies is the high sesitivity roomshy

tempperature probe

Ccmpact spectrometer chassis Innovaten in JEOL NMR digrtal architecture High-stability and high-accuracy digital spectrometer High-sensrtivity new tunable probe Full automalk NMR with advanced software

JEOL RESONANCE Inc

An automatic sample changer makes it

possible to measure many samples

sequentially by exchanging multiple samples

automatically one by one Five changer

models are available for 8 samples 16

samples 24 samples 64 samples and 100

samples

JEOL RESONANCE Inc

ASC100 (100 samples)

1 --0 1(10 C ppm I

Sdid 13C-CPMAS spectrum of cholk acid

Solid-NMR is a technique that measures solid samples (powder or film-like samples) This technique is also effective for measurement of samples not soluble in solvents (inorganic

samples etc) and of crystalline polymorph that is meaningful to measure at the solid state

JEOL RESONANCE Inc

Produci Guide I 15

Mass Spectrometers

I JMS-800D UltraFOCUS I JMS-700 (2) MStation Mass Spectrometer Dedicated to Dioxin Anal ys is High resolution M ass Spectrometer

JMS-800D UltraFOCUS is the optimal cho ice for ultra lowlevel race detection

applications suc h as moni torin g for dioxins and related co mpoun ds eg

Polychlorinated Biphenyls (PCBs) Polybrominated Diphenyl Ethers (PBDEs) or drugs

of abuse by high resolution-selected ion monitoring (HRSIM) gas chromatographyl

mass spectrometry(GCMS)

R-- gtn 80000 (10 valley) Sent Ily 2 3 7 8-TCDD 100fg SNgt2oo

(6 channels 100 msecch Resolution 10000)

N_ Jut J _lllgEI up to 10 kV

JMS-S3000 Matri x Assisted Laser DesorptionIonization TOFMS

The JMS-S3000 is a MALOI-TOFMS incorporating an innovative SpirarrOF ion optical

system With superior capabilities than conventional MALDI-TOFMS the JMS-S3000

provides sate-of-the-art anaiylical solutions for a wide range of research areas such as

functional synthetic polymers materials science and biomolecules

Malrix Assisled Laser Desorpllonlonization Timemiddotof-Flighl Mass Spectrometer

I JMS-T1 OOLP+DART TLC-TOFMS

Pet c 60000 (10 valley) err 02 ng of methyl stearate

SIN 400

(CVEI combination ion source) I~ ~ aJe up to 10kV

I JMS-T1 OOLP LC-TOFMS

I JMS-Tl OOGCV GC-TOFMS

middotl shyThe JMS-T100LP+DART achieves simple and fast TLCMS analysis Accurate mass The JMS-Tl00GCV is a fully automatic Gas Chromatograph - Time-ot-Flight Mass

measurement capabilit y of TOFMS also enables you to determine element Spectrometer (GC-TOFMS) This versatile MS system covers wide range of

compositions of the analytes applications in GC-MS analysis

16 I Pr oduc i Gu ide

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I JMS-Ql 050GC UltraQuad GClMS

cJEOL

-

S-trapHS Headspace Autosampler

ESR Spectrometers

I JES-X3 series ESR Spectrometers

Recently it has been widely

accepted that even retatively few

unpaired electrons in a sample can

affect the function of the material so

lower detection limits (high er

sens itivity) is required of ESR

measurements JES-X3 Series has

achieved higher sensiti v i ty by

developing a lOIN-noise Gunn

oscillator for its new spectrometer

JES-X320 JEOL RESONANCE Inc

i III III )

Maximum Magnetic Field I a6ST 13T 14T

SweepW idth I --00-- 250mT plusmn001 - 500m__T_ __--l

Pole Gap _ _ 6cmm__ ___-= ___~ ____cmm__ _ I 0 = 60mcm 75 _l

Frequency Range(GHz) 8750 - 9650 _ _ _ ___-1

Field Resolution (mT) _L_ 235 Correction by Marker _1_--- Standard

I Operating System Windows 7

The JMS-01050GC is an innovative quadrupole mass spectrometer (OMS) that

achieves the highest-level sensitivity in OMS It has a high ability of evacuation due

to the use of a split flow turbo-molecular pump system (400 Lis) th at

simultaneously evacuates the ion source and the detector The use of a highshy

accuracy hyperbolic quadrupole mass analyzer provides high resolution

The S-trap is a next-generation headspace autosampler providing ultra-low

concentration measurement which was not achieved with a heads pace (HS) method

using conventional sample loop In addition the HS-GCMS system combined lith a

JMS-01050GC Mkll quaorupole MS guarantees detection of mold odor in water

down to 1 ppt

I ES-CT470 Liquid Helium Variable Temperature Controller

The ES-CT470 varies the sample temperature in the temperature range between 25 K

and 470 K Temperature setting is performed by d igital display and the set

temperature is kept constant by automatic control circui ts Combined use with a UV Irradiation device is possible A GaAs etement is used as a temperature sensor

enabling high-accuracy temperature setling

- 25 K to 470 K

plusmn001 K for 25 K to 42 K

plusmn1 orO5 K for 42 K to 470 K

_ 20 min 10 25 min (rom room temperature 08 to 2 Uh

50Hz60Hz 5mm JEOL RESONANCE Inc

Produ c t Guide I 17

Industrial Equipm nt for thin-filnl formation and nlatel ial processing

I bull

Electron Beam Source High-power Electron Beam Source

BS-60060EBS EBG-102UB6S

Electron beam sources for vacuum evaporation of metal and metal-oxide thin-films

We offer a wide variety of electron beam sources and crucibles They have features of

excellent beam spot and energy density and high-speed sweeping

1 PGBS 80020CPPS Plasma Source

BS-80011 BPG (6kW) BS-8002OCPPS (3kW)

Plasma Sources are installed in a vacuum chamber and generate high-density plasma

Used as Ion Plating (Plasma Assisted Deposition) and it is possible to improve film

properties for optilcal thin films protective films and function films Because highshy

density plasma can be generated in a mass space high-rate deposition to a large area

is possible

I RF Induction Plasma System

JEBG-3000UB(300kW) JEBG-1 OOOUB(1 OOkW)

High-power electron beam sources for vacuum evaporation of metal and metal-oxide

for wide plastic films or large glass plates that are continuously fed And they can also

be used for vacuum melting of high-melting point metals

raes

RF Generator

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0-~ 0 bull bullbull - -

RF-12030 (3kW) RF-56000 (Controller)

13 56MHz radio-frequency power supplies for plasma generation and used for

sputtering CVD etching and ion-plating We offer 750W to 6kW generators and

matching networks

DR Powder Feeder

Thermal plasma around 10000degC (15000deg F) by RF inductive coupling This thermal Fine powder feeder that can feed 01 to 100 11m size fine powder continuously with

plasma is used for nano powder synthesis fine powder spheroidization thick film carrier gas We offer optional feeding rate controller and large capacity hopper

deposition multi composite membrane synthesis CVD and harmful gas

decomposition

18 I Produci Guide

---

Biochemical Analyzers

I JCA-BM series Clinical Chemistry Analyzer BioMajesty Series

JEOLs micro volume technology and unique sample pre-dilution mechanism realizes

high throughput chemistry analysis with reduced sample and reagent volume

More than 4000 systems have been placed in clinical laboratories allover the world

JCA-BM6050

I JCA-BMBOOO series Ultra High Throughput Clinical Chemistry Analyzer

4 4

JCA-BMB060 egt

JCA-BMSOOO series offer ultra high throughput chemistry analysis up to 9000 testsl

hour

The pre-dilution unit one of the BioMajesty family features also continues the strong

tradition in these series with interconnected multiple analysis modules the key factors

that accomplish brilliant high throughput as well as downtime reduction with back-up

capability

I JCA-BM6070 High Throughput High Performance Clinical Chemistry An alyzer

I I I

A Clinical chemistry analyzer with incomparable speed and accuracy which achieves

high throughput of 2400 testslhour (includ ing ISE) The incorporated compact

workstation and user-friendly Interface with excellent operability leads the new trend of

the laboratory testing

BioMajesty Series lCA-BM 6010 lCA-BM 6050

lCA-8M 6070 leA-BM 91 30

lCA-BM 8000 Series

bull This product is distributed outside Japan by Siemens Heatthcare Diagnostics under the ADVtAreg brand name

I JCA-BM601 OC Compact amp High Performance Clinical Chemistry Analyzer

-~-I -

1lIIIIIIilllllllllJllnlIlII Ii I JCA-BM6010C is a compact but efficient automatic analyzer that maintains the basic

concept of BioMajesty series while achieving the excellent capability of microanalysis

with sample volume as small as 1 J1L

BM6010C also offers fully automated HbA1 c analysis with on-board hemolysis

(optional) Simultaneous measurement of Glucose and HbA1c improves laboratory

workflow

Product Guid e I 19

S~~MCEAII Certain products in this brochure are controlled under the Foreign 0J 0014007 -v- ~ Exchange and Foreign Trade Law of Japan in compliance with $ ~~~ international security export control JEOL Ltd must provide the~2 m) IIlt Japanese Government with End-users Statement of Assurancel A MGMT SYS

AvA ~ m and End-use Certificate in order to obtain the export license - tiJ needed for export from Japan If the product to be exported is in this category the end user will be asked to fill in these certificate formsdEOLIS09001 amp150 14001CenrfiCltlled

httpwwwjeolcomdEOL JEOL Ltd 1-2 Musashino 3-chome Akishima Tokyo 196-8558 Japan Sales Division Telephone+81-42-528-3381 Facsimile+81-42-528-3386

ARGENTINA COASIN SAClyF Virrey del Pino 4071 1430 Buenos Aires Argentina Telephone 54-11-4552-3185 Facsimile 54-11-4555-3321

AUSTRALIA amp NEW ZEALAND JEOL(AUSTRALASJA) PtyUd Suite 1 L2 18 Aquatic Drive - Frenchs Foresl NSW 2086 Australia Telephone 61-2-9451-3855 Facsimile 61-2-9451-3822

AUSTRIA JEOL (GERMANY) GmbH Oskar-Von-Miller-Strasse 1 a 85386 Eching Gennany Telephone 49-8165-77346 Facsimile 49-8165-77512

BANGLADESH AQ CHOWDHURY SCIENCE amp SYNERGY PVT LTD House No1 2 Road No 5A Sector No 11 Uttara Dhaka - 1230 Bangladesh Telephone 880-2-9980790 8953450 8953501 Facsimile 880-2-8854428

BELGIUM JEOL (EUROPE) BV Planet ll Gebouw B Leuvensesteenweg 542 B-1930 Zaventem Belgium Telephone 32-2-720-0560 Facsimile 32-2-720-6134

BRAZIL JEOL Brasillnstrument09 Cienlilicos Llda

Av Jabaquara 2958-50 andar-cj 52 04046-500 Sao Paulo SP Brazil Telephone 55-11-5070 4000 Facsimile 55-11-5070 4010

CANADA JEOL CANADA INC 3275 Premier Rue 8 SI-Hubert Quebec J3Y 8Y6 Canada Telephone 1-450-676-8776 Facsimile 1-450-676-6694

CHILE ARQUIMED INNOVAnON

Arturo Pmt 828Santiago Chile Telephone 56-2-634-6266 Facsimile 56-2-634-4633

CHINA JEOL(BEIJING) CO LTD Room Bl0l0l110 Wantong New Wond Plaza No2 Fuchengmenwai Street XIcheng District Beijing 100037 PRChina Telephone 86-10-6804-6321 Facsimile 86-10-6804-6324

JEOL (BEIJING) CO LTD SHANGHAI BRANCH

Room 15051506 Nol300Xi Kang Road Jing an Dis Shanghai 200040 China Telephone 86-21-6248-4868448745374404 Facsimile 86-21-6248-4075

JEOL (BEIJING) CO LTD GUANG ZHOU BRANCH

N1601 World Trade Center Building 371-375 Huan Shi Road East Guang Zhou Guangdong Prov 510095 PRChina Telephone 86-20-8778-7848 Facsimile 86-20-8778-4268

JEOL (BEIJING) CO LTD WUHAN BRANCH

Room A2117 Zhongshang Plaza Office Bldg NO7 Zhongnan Road Wuhan Hubei 430071 PRChina Telephone 86-27-8713-2567 Facsimile 86-27-8713-2567

JEOL LTD (BEIJING) CO LTD CHENGDU BRANCH 1807A Zonglu Building NO 35 Zhongfu Road Chengdu Sichuan 610016 PR China Telephone 86-28-86622554 Facsimile 86-28-86622564

EGYPT JEOL SERIVCE BUREAU

3rd Fl Nile Center Bldg Nawal Slree Dokkl (Cairo) Egypt Telephone 20-2-3335-7220 Facsimile 20-2-3338-4186

FRANCE JEOL (EUROPE) SAS Espace Claude Monet 1 Allee de Giverny 78290 Crolssy-sur-Seine France Telephone 33-13015-3737 Facsimile 33-13015-3747

GERMANY JEOL (GERMANY) GmbH Oskar-Von-Miller-Strasse 1 a 85386 Eching Gennany Telephone 49-8165-77346 Facsimile 49-8165-77512

GREAT BRITAIN amp IRELAND JEOL (UK) LTD JEOL House Silver Court Watchmeaci Welwyn Garden City Herts AL71LT UK Telephone 44-1707 -377117 FaCSimile 44-1707-373254

GREECE N ASTERIADIS SA

56-58S Trikoupl Str PO Box 26140 GR-10022 Athens Greece Telephone 30-1-823-5383 Facsimile 30-1-823-9567

HONG KONG FARMING LTD

Unit No1 009 1 OF Prosperity Milennia Plaza 663 Kings Road North Point Hong Kong Telephone 852-2815-7299 Facsimile 852-2581-4635

INDIA JEQL INDIA Pvt Ltd

Elegance Tower Level 2 2128 Old Mathura Road Jasola Business District Centre Near Apollo Hospital Jasola New Delhi 110025 India Telephone 91-11-6472-2578 Facsimile 91-11-4060-1235

BLUE STAR LTD (HQ Mumbaij

Analyticallnstrments Department Sahas 41412 Veer Savarkar Marg Prabhadery Mumbai 400 025 India Telephone 91-22-6666-4000 Facsimile 91-22-6666-4001

BLUE STAR LTD (DelhQ Analytical Instruments Department E-4412 Okhla Industrial Area Phase-II New Delhi 110 020 India Telephone 91-11-4149-4000 Facsimile 91-11-4149-4005

BLUE STAR LTD (Calcutta)

Analylicallnstruments Department 7 Hare Street Calcutta 700 001 India Telephone 91-33-2213-4133 Facsimile 91 -33-2213-4102

BLUE STAR LTD (ChennaO Analytical Instruments Department No 46 Garuda Building Cathedral Road Chennai 600 086 India Telephone 91-44-4244-4000 Facsimile 91-44-4244-4190

INDONESIA PT TEKNOLABindo Penta Perkasa Komplek Gading Bukillndah Blok lIll JI Bukfl Gading Raya Kelapa Gading Pennai Jakarta 14240 Indonesia Telephone 62-21-458470575859 Facsimile 62-21-45842729

ITALY JEOL 0TALIA) SpA Centro Direzionale Green Office Via dei Tulipani 1 20090 Pieve Emanuele (MI) Italy Telephone 39-02-9041431 Facsimila 39-02-90414343

KOREA JEOL KOREA LTD

Dongwoo Bldg 7F 1443 Yangjae Daero Gangdong-Gu Seoul 134-010 Korea Telephone 82-2-511-5501 Facsimile 82-2-511-2635

KUWAIT Ashraf amp CO Ltd WLL PO Box 3555 Safat 13036 Kuwait Telephone 965-1805151 Facsimile 965-24335373

MALAYSIA JEOL(MALAYSIA) SDNBHD(3S9011-M)

205 Block A Mezzanine Floor Kelana Business Center 97 Jalan SS 72 Kelana Jaya 47301 Petaling Jaya Selangor Malaysia Telephone 60-3-7492-7722 Facsimile 60-3-7492-7723

MEXICO JEOL DE MEXICO SA DE CV

Arkansas 11 Piso 2 Colonia Napoles Delegacion Benito Juarez CP 03810 Mexico DF Mexico Telephone 52-5-55-211-4511 Facsimile 52-5-55-211-0720

PAKISTAN (KarachI) ANALYTICAL MEASURING SYSTEM (pvn LTD(AMS LTD)

14-C Main Sehar Commercia) Avenue Lane 4 Khayaban-e-Sehar DHA-VII Karachimiddot75500 Pakinstan Telephone 92-21-353455813534074735346057-8 Facsimile 92-21-35345582

PANAMA PROMED SA Parque Industrial Costa del Este Urbanizacion Costa del Este Apartado 0816-01755 Panama Panama Telephone 507-303-3100 FaCSimile 507-303-3115

PHILIPPINES PHILAB INDUSTRIES INC

7487 Bagtikan Street SAY Makati 1203 Metro Manila Phillip pines Telephone 63-2-896-7218 Facsimile 63-2-897-7732

PORTUGAL Izasa Portugal Lda A do Proletariado 1 2790-138 CARNAXIDE Portugal Telephone 351-21-424-73-00 Facsimile 351-21-418-60-20

RUSSIA JEOL (RUS) LLC Krasnoproletarskaya Street 16 Bid 2 127473 Moscow Russian Federation Telephone 7-495-748-7791rr792 Facsimile 7-495-748-7793

SAUDI ARABIA ABDULREHMAN ALGOSAIBI GTC (Riyadh)

King Abdulaziz Avenue PO Box 215 Riyadh 11411 Saudi Arabia Telephone 966-1-479-3000 Facsimile 966-1-477-1374

SCANDINAVIA SWEDEN JEOL (Skandinaviska)AB

Hammarbacken 6A Box 716191 27 Sollentuna Sweden Telephone 46-8-28-2800 Facsimile 46-8-29-1647

SERVICE amp INFORMATION OFFICE NORWAY JEQL (Skandinaviska)AB

Lorenvangen 23 0580 Oslo NORWAY Telephone 47-2-2-64-7930 Facsimile 47-2-2-65-0619

FINLAND JEOL (Skandlnaviska)AB

Ylakaupinkuja 2 FIN-02360 Espoo Finland Telephone 358-9-8129-0350 Facsimile 358-9-8129-0351

SINGAPORE JEOLASIA PTE LTD

2 Corporation Road 1t01-12 Corporation Place Singapore 618494 Telephone 65-6565-9989 Facsimile 65-6565-7552

SOUTH AFRICA ADI Scientific (Pty) Ltd

370 Angus Crescent Northlands Business Park 29 Newmarket Road

~~=~g~~~2~~1nt~~2_~~~bIlC of South Africa

Facsimile 27-11 -462-1466

SPAIN IZASA SA

Argoneses 13 28100 Alcobendas (poligono IndustriaQ Madrid Spain Te~phone 34-91-663-0500 Facsimile 34-91-663-0545

SWITZERLAND JEOL (GERMANY) GmbH Oskar-Von-Miller Strasse 1 85386 Eching Germany Telephone 49-8165-77346 Facsimile 49-8165-77512

TAIWAN For EO ProQucts JIE DONG CO LTD 7F 112 Chung Hsiao East Road Section 1 Taipei Taiwan 10023 Republic of China Telephone 886-2-2395-2978 Facsimile 886-2~2322-4655

For Mass Spectrometer Products Mass Solutions Technology Co Ltd

5F No79 Sec 1 Xintai 5th Rd Xlzhi Dis New Taipei City 221 Taiwan Republic of China Telephone 886-2-2698-9511 Facsimile 886-2-2698-9512

For Semiconductor Products JEOL TAIWAN SEMICONDUCTORS LTD

11 F-l No 346 Pei-Da Road Hsin-Chu City 300 Taiwan Republic of China Telephone 886-3-523-8490 Facsimile 886-3-523-8503

THAILAND BECTHAI BANGKOK EQUIPMENT amp CHEMICAL CO Ltd

300 Phaholyothin Rd Phayathai Bangkok 10400 Thailand Telephone 66-2-615-2929 Facsimile 66-2-615-23502351

THE NETHERLANDS JEOL (EUROPE) Bv Ureweg 4 NL-2153 PH Nieuw-Vennep The Nelherlands Telephone 31-252-623500 Facsimile 31-252-623501

TURKEY TEKSERAS Kayisdagi )nonu MahKartal Cad No553 34755 Atasehir Istanbul Turkey Telephone 90-216-5736470 Facsimile 90-216-5736475

UAE MRS Group Dubai POBox 171612 Rashid Abdulla AI Noami Building Suite No 306 Damascus Street AI Qusais-3 Dubai UAE Telephone 971-4-2581141 Facsimile 971-4-2581151

JEOLGulf

POBox 171612 bull Rashid Abdulla AI Noami Building Suite No 306 Damascus Street AI Qusais-3 Dubai UAE Telephone 971-553964219(mobile)

USA JEOL USA INC 11 Dearborn Road Peabody MA 01960 USA Telephone 1-978-535-5900 Facsimile 1-978-536-22052206

JEOL USA INC WEST OFFICE

~~s~~~~~rigAe9~5t~~1 1 0 Telephone 1-925-737-1740 Facsimile 1-925-737-1749

VENEZUELA GOMSA Service and Supply CA

Urbanizacion Montalban JlI - Resldenclas Don Andres - Piso 7 - Apartomento 74 Avenida 3 entre calles 7 y 6 Montalban Caracas Venezuela Telephone 58-212-443-4342 Facsimile 58-212-443-4342

VTETNAM TECHNICAL MATERIALS AND RESOURCES IMPORT-EXPORT JOINT STOCK COMPANY(REXCO) Hanoi Branch

No 13-Lot 12 Trung Yen Trung Hoa Street Cau Giay Dist HanOi Vietnam Telephone 84-4-562-051617562-0535 Facsimile 84-4-853-2511

No 0205B389C Printed in Japan Kp

Page 12: Introduction - Главное управление науки БГУresearch.bsu.by/wp-content/uploads/2015/06/JEOL_Product...Scanning Electron Microscope The JSM-6610 is a high-performance

Semiconductor Eq Ipm nt

2 Electron Beam Lithography System

-5

Electron Beam Lithography System

r

Electron Beam Lithography System

-~=-~--I--~ I

~ ~ ~-

Th e JBX-3200MV is an e lec lro n bea m lithography system developed for the production of next generation ultrahigh-precision masks and reticles This system employs a variableshyshaped electron beam o f 50kV and a step amp repeat specimen stage

High thro ug hp ut enabled by a new PEG (Proximity Effect Correction) system High-speed da la- transfer sys tem for a large quanti ty data High-precision design for masklrelicle production

Th e JBX-9 500FS is a spot beam

lithography system developed to meet a

wi de range of applications with high

throughput and high precision periormance

This sys tem covers fields from the nanoshy

technology research to the production of

leading edge devices

f 100kV _ ZrONV Schotlky emitter

maximum 300 mm wafer

Th e JBX-6300 FS is a s p o t b ea m

lithography system developed to meet a

w ide range o f applica tions with high

resolution and high precision periormance

This system covers fields from the nanoshy

technology research to the development of

next generation devices

25 kVl50 kVl1 00 kV ZrONV Schottky emittelt

maximum 200 mm wafelt

Prod ucl Gu ide I 13

-

---------

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NMR Spectrometers

I JNM-ECAECX series FT NMR System

920 MHz magnet Photo courtesy Nationallnstrtute of Natural Sciences Institute for

Molecular Science

The JNM-ECA920 FT NMR System is a 920 MHz high-resolution NMR

spectrometer developed by JEOL This spectrometer uses the superconducting

magnet co-developed by National Institute for Materials Science and Kobe Steel

Ltd which generates the high magnetic field Created by combining Japans stateshy

of-the-art technologies this FT NMR System marks an important milestone in next

generation biology and nanotechnology which call for high-magnetic-field highshy

resclution NMR analysis

JEOL RESONANCE Inc

~ ~ ~

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~ 100

HNCACB spectrum of 13C(15N labeled Solid 23Na-MQMAS spectrum of ubiqurtin N3)P207

The JNM-ECNECX series are versatile high-performance FT NMR spectrometer

system that utilize the latest digital and high-frequency technology The ECA

spectrometer is applicable up to 1GHz and can be used for a wide range of

applications including liquidsolid NMR protein analysis and diffusion coefficient

measurement

INM-EC cd

JOO ~QO 0(1 ~uo 1)0

Spectrometer I Oscillator receiver power amplifier

Magnet IISCM Field strength 705T I 939T 11 74T 1401T 1643T

Bore diameter (mm) 54 I 54 54 54 54

Probe 5 mm Ttl tunable

11110

188T

54

JEOL RESONANCE Inc

INMmiddot fO rie ---shy

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Spectrometer Oscillator receiver power amplifier

Magnet I ISCM Field strength 705T 939T I 1174T 1401T

Bore diameter (mm) I 54 54 54 54

Probe I 5 mm TH tunable

JEOL RESONANCE Inc

14 I Produc t Guide

bull bull bull

IJNM-ECS 00 FT NMR System

bull I ASC Series

Auto Sample Changer

ASC8 (8 samples) ASC24 (24 samples)

middotmiddot iT ~ --shy

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ASC16 (16 samples) ASC64 (64 samples)

bullIJNM-ECAECX series Solid NMR

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MAS conlroller Solid NMR sampling kit

NMR Systems For Modern NMR Spectroscopy The JNM-ECS400 i s a compact two-channel

spectrometer that retains the advanced capabilities of the

JNM-ECAlECX series (required installation space is oneshy

half compared to conventional NMRs) Programmable

timing sequencers built into each RF and PFG channel

can independently control either synchronous or

asynchronous operations of each channel Its standard

tunable broadband gradient probe which integrates all

JEOLs newest technologies is the high sesitivity roomshy

tempperature probe

Ccmpact spectrometer chassis Innovaten in JEOL NMR digrtal architecture High-stability and high-accuracy digital spectrometer High-sensrtivity new tunable probe Full automalk NMR with advanced software

JEOL RESONANCE Inc

An automatic sample changer makes it

possible to measure many samples

sequentially by exchanging multiple samples

automatically one by one Five changer

models are available for 8 samples 16

samples 24 samples 64 samples and 100

samples

JEOL RESONANCE Inc

ASC100 (100 samples)

1 --0 1(10 C ppm I

Sdid 13C-CPMAS spectrum of cholk acid

Solid-NMR is a technique that measures solid samples (powder or film-like samples) This technique is also effective for measurement of samples not soluble in solvents (inorganic

samples etc) and of crystalline polymorph that is meaningful to measure at the solid state

JEOL RESONANCE Inc

Produci Guide I 15

Mass Spectrometers

I JMS-800D UltraFOCUS I JMS-700 (2) MStation Mass Spectrometer Dedicated to Dioxin Anal ys is High resolution M ass Spectrometer

JMS-800D UltraFOCUS is the optimal cho ice for ultra lowlevel race detection

applications suc h as moni torin g for dioxins and related co mpoun ds eg

Polychlorinated Biphenyls (PCBs) Polybrominated Diphenyl Ethers (PBDEs) or drugs

of abuse by high resolution-selected ion monitoring (HRSIM) gas chromatographyl

mass spectrometry(GCMS)

R-- gtn 80000 (10 valley) Sent Ily 2 3 7 8-TCDD 100fg SNgt2oo

(6 channels 100 msecch Resolution 10000)

N_ Jut J _lllgEI up to 10 kV

JMS-S3000 Matri x Assisted Laser DesorptionIonization TOFMS

The JMS-S3000 is a MALOI-TOFMS incorporating an innovative SpirarrOF ion optical

system With superior capabilities than conventional MALDI-TOFMS the JMS-S3000

provides sate-of-the-art anaiylical solutions for a wide range of research areas such as

functional synthetic polymers materials science and biomolecules

Malrix Assisled Laser Desorpllonlonization Timemiddotof-Flighl Mass Spectrometer

I JMS-T1 OOLP+DART TLC-TOFMS

Pet c 60000 (10 valley) err 02 ng of methyl stearate

SIN 400

(CVEI combination ion source) I~ ~ aJe up to 10kV

I JMS-T1 OOLP LC-TOFMS

I JMS-Tl OOGCV GC-TOFMS

middotl shyThe JMS-T100LP+DART achieves simple and fast TLCMS analysis Accurate mass The JMS-Tl00GCV is a fully automatic Gas Chromatograph - Time-ot-Flight Mass

measurement capabilit y of TOFMS also enables you to determine element Spectrometer (GC-TOFMS) This versatile MS system covers wide range of

compositions of the analytes applications in GC-MS analysis

16 I Pr oduc i Gu ide

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I JMS-Ql 050GC UltraQuad GClMS

cJEOL

-

S-trapHS Headspace Autosampler

ESR Spectrometers

I JES-X3 series ESR Spectrometers

Recently it has been widely

accepted that even retatively few

unpaired electrons in a sample can

affect the function of the material so

lower detection limits (high er

sens itivity) is required of ESR

measurements JES-X3 Series has

achieved higher sensiti v i ty by

developing a lOIN-noise Gunn

oscillator for its new spectrometer

JES-X320 JEOL RESONANCE Inc

i III III )

Maximum Magnetic Field I a6ST 13T 14T

SweepW idth I --00-- 250mT plusmn001 - 500m__T_ __--l

Pole Gap _ _ 6cmm__ ___-= ___~ ____cmm__ _ I 0 = 60mcm 75 _l

Frequency Range(GHz) 8750 - 9650 _ _ _ ___-1

Field Resolution (mT) _L_ 235 Correction by Marker _1_--- Standard

I Operating System Windows 7

The JMS-01050GC is an innovative quadrupole mass spectrometer (OMS) that

achieves the highest-level sensitivity in OMS It has a high ability of evacuation due

to the use of a split flow turbo-molecular pump system (400 Lis) th at

simultaneously evacuates the ion source and the detector The use of a highshy

accuracy hyperbolic quadrupole mass analyzer provides high resolution

The S-trap is a next-generation headspace autosampler providing ultra-low

concentration measurement which was not achieved with a heads pace (HS) method

using conventional sample loop In addition the HS-GCMS system combined lith a

JMS-01050GC Mkll quaorupole MS guarantees detection of mold odor in water

down to 1 ppt

I ES-CT470 Liquid Helium Variable Temperature Controller

The ES-CT470 varies the sample temperature in the temperature range between 25 K

and 470 K Temperature setting is performed by d igital display and the set

temperature is kept constant by automatic control circui ts Combined use with a UV Irradiation device is possible A GaAs etement is used as a temperature sensor

enabling high-accuracy temperature setling

- 25 K to 470 K

plusmn001 K for 25 K to 42 K

plusmn1 orO5 K for 42 K to 470 K

_ 20 min 10 25 min (rom room temperature 08 to 2 Uh

50Hz60Hz 5mm JEOL RESONANCE Inc

Produ c t Guide I 17

Industrial Equipm nt for thin-filnl formation and nlatel ial processing

I bull

Electron Beam Source High-power Electron Beam Source

BS-60060EBS EBG-102UB6S

Electron beam sources for vacuum evaporation of metal and metal-oxide thin-films

We offer a wide variety of electron beam sources and crucibles They have features of

excellent beam spot and energy density and high-speed sweeping

1 PGBS 80020CPPS Plasma Source

BS-80011 BPG (6kW) BS-8002OCPPS (3kW)

Plasma Sources are installed in a vacuum chamber and generate high-density plasma

Used as Ion Plating (Plasma Assisted Deposition) and it is possible to improve film

properties for optilcal thin films protective films and function films Because highshy

density plasma can be generated in a mass space high-rate deposition to a large area

is possible

I RF Induction Plasma System

JEBG-3000UB(300kW) JEBG-1 OOOUB(1 OOkW)

High-power electron beam sources for vacuum evaporation of metal and metal-oxide

for wide plastic films or large glass plates that are continuously fed And they can also

be used for vacuum melting of high-melting point metals

raes

RF Generator

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RF-12030 (3kW) RF-56000 (Controller)

13 56MHz radio-frequency power supplies for plasma generation and used for

sputtering CVD etching and ion-plating We offer 750W to 6kW generators and

matching networks

DR Powder Feeder

Thermal plasma around 10000degC (15000deg F) by RF inductive coupling This thermal Fine powder feeder that can feed 01 to 100 11m size fine powder continuously with

plasma is used for nano powder synthesis fine powder spheroidization thick film carrier gas We offer optional feeding rate controller and large capacity hopper

deposition multi composite membrane synthesis CVD and harmful gas

decomposition

18 I Produci Guide

---

Biochemical Analyzers

I JCA-BM series Clinical Chemistry Analyzer BioMajesty Series

JEOLs micro volume technology and unique sample pre-dilution mechanism realizes

high throughput chemistry analysis with reduced sample and reagent volume

More than 4000 systems have been placed in clinical laboratories allover the world

JCA-BM6050

I JCA-BMBOOO series Ultra High Throughput Clinical Chemistry Analyzer

4 4

JCA-BMB060 egt

JCA-BMSOOO series offer ultra high throughput chemistry analysis up to 9000 testsl

hour

The pre-dilution unit one of the BioMajesty family features also continues the strong

tradition in these series with interconnected multiple analysis modules the key factors

that accomplish brilliant high throughput as well as downtime reduction with back-up

capability

I JCA-BM6070 High Throughput High Performance Clinical Chemistry An alyzer

I I I

A Clinical chemistry analyzer with incomparable speed and accuracy which achieves

high throughput of 2400 testslhour (includ ing ISE) The incorporated compact

workstation and user-friendly Interface with excellent operability leads the new trend of

the laboratory testing

BioMajesty Series lCA-BM 6010 lCA-BM 6050

lCA-8M 6070 leA-BM 91 30

lCA-BM 8000 Series

bull This product is distributed outside Japan by Siemens Heatthcare Diagnostics under the ADVtAreg brand name

I JCA-BM601 OC Compact amp High Performance Clinical Chemistry Analyzer

-~-I -

1lIIIIIIilllllllllJllnlIlII Ii I JCA-BM6010C is a compact but efficient automatic analyzer that maintains the basic

concept of BioMajesty series while achieving the excellent capability of microanalysis

with sample volume as small as 1 J1L

BM6010C also offers fully automated HbA1 c analysis with on-board hemolysis

(optional) Simultaneous measurement of Glucose and HbA1c improves laboratory

workflow

Product Guid e I 19

S~~MCEAII Certain products in this brochure are controlled under the Foreign 0J 0014007 -v- ~ Exchange and Foreign Trade Law of Japan in compliance with $ ~~~ international security export control JEOL Ltd must provide the~2 m) IIlt Japanese Government with End-users Statement of Assurancel A MGMT SYS

AvA ~ m and End-use Certificate in order to obtain the export license - tiJ needed for export from Japan If the product to be exported is in this category the end user will be asked to fill in these certificate formsdEOLIS09001 amp150 14001CenrfiCltlled

httpwwwjeolcomdEOL JEOL Ltd 1-2 Musashino 3-chome Akishima Tokyo 196-8558 Japan Sales Division Telephone+81-42-528-3381 Facsimile+81-42-528-3386

ARGENTINA COASIN SAClyF Virrey del Pino 4071 1430 Buenos Aires Argentina Telephone 54-11-4552-3185 Facsimile 54-11-4555-3321

AUSTRALIA amp NEW ZEALAND JEOL(AUSTRALASJA) PtyUd Suite 1 L2 18 Aquatic Drive - Frenchs Foresl NSW 2086 Australia Telephone 61-2-9451-3855 Facsimile 61-2-9451-3822

AUSTRIA JEOL (GERMANY) GmbH Oskar-Von-Miller-Strasse 1 a 85386 Eching Gennany Telephone 49-8165-77346 Facsimile 49-8165-77512

BANGLADESH AQ CHOWDHURY SCIENCE amp SYNERGY PVT LTD House No1 2 Road No 5A Sector No 11 Uttara Dhaka - 1230 Bangladesh Telephone 880-2-9980790 8953450 8953501 Facsimile 880-2-8854428

BELGIUM JEOL (EUROPE) BV Planet ll Gebouw B Leuvensesteenweg 542 B-1930 Zaventem Belgium Telephone 32-2-720-0560 Facsimile 32-2-720-6134

BRAZIL JEOL Brasillnstrument09 Cienlilicos Llda

Av Jabaquara 2958-50 andar-cj 52 04046-500 Sao Paulo SP Brazil Telephone 55-11-5070 4000 Facsimile 55-11-5070 4010

CANADA JEOL CANADA INC 3275 Premier Rue 8 SI-Hubert Quebec J3Y 8Y6 Canada Telephone 1-450-676-8776 Facsimile 1-450-676-6694

CHILE ARQUIMED INNOVAnON

Arturo Pmt 828Santiago Chile Telephone 56-2-634-6266 Facsimile 56-2-634-4633

CHINA JEOL(BEIJING) CO LTD Room Bl0l0l110 Wantong New Wond Plaza No2 Fuchengmenwai Street XIcheng District Beijing 100037 PRChina Telephone 86-10-6804-6321 Facsimile 86-10-6804-6324

JEOL (BEIJING) CO LTD SHANGHAI BRANCH

Room 15051506 Nol300Xi Kang Road Jing an Dis Shanghai 200040 China Telephone 86-21-6248-4868448745374404 Facsimile 86-21-6248-4075

JEOL (BEIJING) CO LTD GUANG ZHOU BRANCH

N1601 World Trade Center Building 371-375 Huan Shi Road East Guang Zhou Guangdong Prov 510095 PRChina Telephone 86-20-8778-7848 Facsimile 86-20-8778-4268

JEOL (BEIJING) CO LTD WUHAN BRANCH

Room A2117 Zhongshang Plaza Office Bldg NO7 Zhongnan Road Wuhan Hubei 430071 PRChina Telephone 86-27-8713-2567 Facsimile 86-27-8713-2567

JEOL LTD (BEIJING) CO LTD CHENGDU BRANCH 1807A Zonglu Building NO 35 Zhongfu Road Chengdu Sichuan 610016 PR China Telephone 86-28-86622554 Facsimile 86-28-86622564

EGYPT JEOL SERIVCE BUREAU

3rd Fl Nile Center Bldg Nawal Slree Dokkl (Cairo) Egypt Telephone 20-2-3335-7220 Facsimile 20-2-3338-4186

FRANCE JEOL (EUROPE) SAS Espace Claude Monet 1 Allee de Giverny 78290 Crolssy-sur-Seine France Telephone 33-13015-3737 Facsimile 33-13015-3747

GERMANY JEOL (GERMANY) GmbH Oskar-Von-Miller-Strasse 1 a 85386 Eching Gennany Telephone 49-8165-77346 Facsimile 49-8165-77512

GREAT BRITAIN amp IRELAND JEOL (UK) LTD JEOL House Silver Court Watchmeaci Welwyn Garden City Herts AL71LT UK Telephone 44-1707 -377117 FaCSimile 44-1707-373254

GREECE N ASTERIADIS SA

56-58S Trikoupl Str PO Box 26140 GR-10022 Athens Greece Telephone 30-1-823-5383 Facsimile 30-1-823-9567

HONG KONG FARMING LTD

Unit No1 009 1 OF Prosperity Milennia Plaza 663 Kings Road North Point Hong Kong Telephone 852-2815-7299 Facsimile 852-2581-4635

INDIA JEQL INDIA Pvt Ltd

Elegance Tower Level 2 2128 Old Mathura Road Jasola Business District Centre Near Apollo Hospital Jasola New Delhi 110025 India Telephone 91-11-6472-2578 Facsimile 91-11-4060-1235

BLUE STAR LTD (HQ Mumbaij

Analyticallnstrments Department Sahas 41412 Veer Savarkar Marg Prabhadery Mumbai 400 025 India Telephone 91-22-6666-4000 Facsimile 91-22-6666-4001

BLUE STAR LTD (DelhQ Analytical Instruments Department E-4412 Okhla Industrial Area Phase-II New Delhi 110 020 India Telephone 91-11-4149-4000 Facsimile 91-11-4149-4005

BLUE STAR LTD (Calcutta)

Analylicallnstruments Department 7 Hare Street Calcutta 700 001 India Telephone 91-33-2213-4133 Facsimile 91 -33-2213-4102

BLUE STAR LTD (ChennaO Analytical Instruments Department No 46 Garuda Building Cathedral Road Chennai 600 086 India Telephone 91-44-4244-4000 Facsimile 91-44-4244-4190

INDONESIA PT TEKNOLABindo Penta Perkasa Komplek Gading Bukillndah Blok lIll JI Bukfl Gading Raya Kelapa Gading Pennai Jakarta 14240 Indonesia Telephone 62-21-458470575859 Facsimile 62-21-45842729

ITALY JEOL 0TALIA) SpA Centro Direzionale Green Office Via dei Tulipani 1 20090 Pieve Emanuele (MI) Italy Telephone 39-02-9041431 Facsimila 39-02-90414343

KOREA JEOL KOREA LTD

Dongwoo Bldg 7F 1443 Yangjae Daero Gangdong-Gu Seoul 134-010 Korea Telephone 82-2-511-5501 Facsimile 82-2-511-2635

KUWAIT Ashraf amp CO Ltd WLL PO Box 3555 Safat 13036 Kuwait Telephone 965-1805151 Facsimile 965-24335373

MALAYSIA JEOL(MALAYSIA) SDNBHD(3S9011-M)

205 Block A Mezzanine Floor Kelana Business Center 97 Jalan SS 72 Kelana Jaya 47301 Petaling Jaya Selangor Malaysia Telephone 60-3-7492-7722 Facsimile 60-3-7492-7723

MEXICO JEOL DE MEXICO SA DE CV

Arkansas 11 Piso 2 Colonia Napoles Delegacion Benito Juarez CP 03810 Mexico DF Mexico Telephone 52-5-55-211-4511 Facsimile 52-5-55-211-0720

PAKISTAN (KarachI) ANALYTICAL MEASURING SYSTEM (pvn LTD(AMS LTD)

14-C Main Sehar Commercia) Avenue Lane 4 Khayaban-e-Sehar DHA-VII Karachimiddot75500 Pakinstan Telephone 92-21-353455813534074735346057-8 Facsimile 92-21-35345582

PANAMA PROMED SA Parque Industrial Costa del Este Urbanizacion Costa del Este Apartado 0816-01755 Panama Panama Telephone 507-303-3100 FaCSimile 507-303-3115

PHILIPPINES PHILAB INDUSTRIES INC

7487 Bagtikan Street SAY Makati 1203 Metro Manila Phillip pines Telephone 63-2-896-7218 Facsimile 63-2-897-7732

PORTUGAL Izasa Portugal Lda A do Proletariado 1 2790-138 CARNAXIDE Portugal Telephone 351-21-424-73-00 Facsimile 351-21-418-60-20

RUSSIA JEOL (RUS) LLC Krasnoproletarskaya Street 16 Bid 2 127473 Moscow Russian Federation Telephone 7-495-748-7791rr792 Facsimile 7-495-748-7793

SAUDI ARABIA ABDULREHMAN ALGOSAIBI GTC (Riyadh)

King Abdulaziz Avenue PO Box 215 Riyadh 11411 Saudi Arabia Telephone 966-1-479-3000 Facsimile 966-1-477-1374

SCANDINAVIA SWEDEN JEOL (Skandinaviska)AB

Hammarbacken 6A Box 716191 27 Sollentuna Sweden Telephone 46-8-28-2800 Facsimile 46-8-29-1647

SERVICE amp INFORMATION OFFICE NORWAY JEQL (Skandinaviska)AB

Lorenvangen 23 0580 Oslo NORWAY Telephone 47-2-2-64-7930 Facsimile 47-2-2-65-0619

FINLAND JEOL (Skandlnaviska)AB

Ylakaupinkuja 2 FIN-02360 Espoo Finland Telephone 358-9-8129-0350 Facsimile 358-9-8129-0351

SINGAPORE JEOLASIA PTE LTD

2 Corporation Road 1t01-12 Corporation Place Singapore 618494 Telephone 65-6565-9989 Facsimile 65-6565-7552

SOUTH AFRICA ADI Scientific (Pty) Ltd

370 Angus Crescent Northlands Business Park 29 Newmarket Road

~~=~g~~~2~~1nt~~2_~~~bIlC of South Africa

Facsimile 27-11 -462-1466

SPAIN IZASA SA

Argoneses 13 28100 Alcobendas (poligono IndustriaQ Madrid Spain Te~phone 34-91-663-0500 Facsimile 34-91-663-0545

SWITZERLAND JEOL (GERMANY) GmbH Oskar-Von-Miller Strasse 1 85386 Eching Germany Telephone 49-8165-77346 Facsimile 49-8165-77512

TAIWAN For EO ProQucts JIE DONG CO LTD 7F 112 Chung Hsiao East Road Section 1 Taipei Taiwan 10023 Republic of China Telephone 886-2-2395-2978 Facsimile 886-2~2322-4655

For Mass Spectrometer Products Mass Solutions Technology Co Ltd

5F No79 Sec 1 Xintai 5th Rd Xlzhi Dis New Taipei City 221 Taiwan Republic of China Telephone 886-2-2698-9511 Facsimile 886-2-2698-9512

For Semiconductor Products JEOL TAIWAN SEMICONDUCTORS LTD

11 F-l No 346 Pei-Da Road Hsin-Chu City 300 Taiwan Republic of China Telephone 886-3-523-8490 Facsimile 886-3-523-8503

THAILAND BECTHAI BANGKOK EQUIPMENT amp CHEMICAL CO Ltd

300 Phaholyothin Rd Phayathai Bangkok 10400 Thailand Telephone 66-2-615-2929 Facsimile 66-2-615-23502351

THE NETHERLANDS JEOL (EUROPE) Bv Ureweg 4 NL-2153 PH Nieuw-Vennep The Nelherlands Telephone 31-252-623500 Facsimile 31-252-623501

TURKEY TEKSERAS Kayisdagi )nonu MahKartal Cad No553 34755 Atasehir Istanbul Turkey Telephone 90-216-5736470 Facsimile 90-216-5736475

UAE MRS Group Dubai POBox 171612 Rashid Abdulla AI Noami Building Suite No 306 Damascus Street AI Qusais-3 Dubai UAE Telephone 971-4-2581141 Facsimile 971-4-2581151

JEOLGulf

POBox 171612 bull Rashid Abdulla AI Noami Building Suite No 306 Damascus Street AI Qusais-3 Dubai UAE Telephone 971-553964219(mobile)

USA JEOL USA INC 11 Dearborn Road Peabody MA 01960 USA Telephone 1-978-535-5900 Facsimile 1-978-536-22052206

JEOL USA INC WEST OFFICE

~~s~~~~~rigAe9~5t~~1 1 0 Telephone 1-925-737-1740 Facsimile 1-925-737-1749

VENEZUELA GOMSA Service and Supply CA

Urbanizacion Montalban JlI - Resldenclas Don Andres - Piso 7 - Apartomento 74 Avenida 3 entre calles 7 y 6 Montalban Caracas Venezuela Telephone 58-212-443-4342 Facsimile 58-212-443-4342

VTETNAM TECHNICAL MATERIALS AND RESOURCES IMPORT-EXPORT JOINT STOCK COMPANY(REXCO) Hanoi Branch

No 13-Lot 12 Trung Yen Trung Hoa Street Cau Giay Dist HanOi Vietnam Telephone 84-4-562-051617562-0535 Facsimile 84-4-853-2511

No 0205B389C Printed in Japan Kp

Page 13: Introduction - Главное управление науки БГУresearch.bsu.by/wp-content/uploads/2015/06/JEOL_Product...Scanning Electron Microscope The JSM-6610 is a high-performance

---------

-_ -~

- --= - - - =-shy -

NMR Spectrometers

I JNM-ECAECX series FT NMR System

920 MHz magnet Photo courtesy Nationallnstrtute of Natural Sciences Institute for

Molecular Science

The JNM-ECA920 FT NMR System is a 920 MHz high-resolution NMR

spectrometer developed by JEOL This spectrometer uses the superconducting

magnet co-developed by National Institute for Materials Science and Kobe Steel

Ltd which generates the high magnetic field Created by combining Japans stateshy

of-the-art technologies this FT NMR System marks an important milestone in next

generation biology and nanotechnology which call for high-magnetic-field highshy

resclution NMR analysis

JEOL RESONANCE Inc

~ ~ ~

~t~-

~ 100

HNCACB spectrum of 13C(15N labeled Solid 23Na-MQMAS spectrum of ubiqurtin N3)P207

The JNM-ECNECX series are versatile high-performance FT NMR spectrometer

system that utilize the latest digital and high-frequency technology The ECA

spectrometer is applicable up to 1GHz and can be used for a wide range of

applications including liquidsolid NMR protein analysis and diffusion coefficient

measurement

INM-EC cd

JOO ~QO 0(1 ~uo 1)0

Spectrometer I Oscillator receiver power amplifier

Magnet IISCM Field strength 705T I 939T 11 74T 1401T 1643T

Bore diameter (mm) 54 I 54 54 54 54

Probe 5 mm Ttl tunable

11110

188T

54

JEOL RESONANCE Inc

INMmiddot fO rie ---shy

)Ol~ ~1111 011 Oll

Spectrometer Oscillator receiver power amplifier

Magnet I ISCM Field strength 705T 939T I 1174T 1401T

Bore diameter (mm) I 54 54 54 54

Probe I 5 mm TH tunable

JEOL RESONANCE Inc

14 I Produc t Guide

bull bull bull

IJNM-ECS 00 FT NMR System

bull I ASC Series

Auto Sample Changer

ASC8 (8 samples) ASC24 (24 samples)

middotmiddot iT ~ --shy

~ I -~Au

ASC16 (16 samples) ASC64 (64 samples)

bullIJNM-ECAECX series Solid NMR

=- ~

I

l l

bull

0 5ilJl

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MAS conlroller Solid NMR sampling kit

NMR Systems For Modern NMR Spectroscopy The JNM-ECS400 i s a compact two-channel

spectrometer that retains the advanced capabilities of the

JNM-ECAlECX series (required installation space is oneshy

half compared to conventional NMRs) Programmable

timing sequencers built into each RF and PFG channel

can independently control either synchronous or

asynchronous operations of each channel Its standard

tunable broadband gradient probe which integrates all

JEOLs newest technologies is the high sesitivity roomshy

tempperature probe

Ccmpact spectrometer chassis Innovaten in JEOL NMR digrtal architecture High-stability and high-accuracy digital spectrometer High-sensrtivity new tunable probe Full automalk NMR with advanced software

JEOL RESONANCE Inc

An automatic sample changer makes it

possible to measure many samples

sequentially by exchanging multiple samples

automatically one by one Five changer

models are available for 8 samples 16

samples 24 samples 64 samples and 100

samples

JEOL RESONANCE Inc

ASC100 (100 samples)

1 --0 1(10 C ppm I

Sdid 13C-CPMAS spectrum of cholk acid

Solid-NMR is a technique that measures solid samples (powder or film-like samples) This technique is also effective for measurement of samples not soluble in solvents (inorganic

samples etc) and of crystalline polymorph that is meaningful to measure at the solid state

JEOL RESONANCE Inc

Produci Guide I 15

Mass Spectrometers

I JMS-800D UltraFOCUS I JMS-700 (2) MStation Mass Spectrometer Dedicated to Dioxin Anal ys is High resolution M ass Spectrometer

JMS-800D UltraFOCUS is the optimal cho ice for ultra lowlevel race detection

applications suc h as moni torin g for dioxins and related co mpoun ds eg

Polychlorinated Biphenyls (PCBs) Polybrominated Diphenyl Ethers (PBDEs) or drugs

of abuse by high resolution-selected ion monitoring (HRSIM) gas chromatographyl

mass spectrometry(GCMS)

R-- gtn 80000 (10 valley) Sent Ily 2 3 7 8-TCDD 100fg SNgt2oo

(6 channels 100 msecch Resolution 10000)

N_ Jut J _lllgEI up to 10 kV

JMS-S3000 Matri x Assisted Laser DesorptionIonization TOFMS

The JMS-S3000 is a MALOI-TOFMS incorporating an innovative SpirarrOF ion optical

system With superior capabilities than conventional MALDI-TOFMS the JMS-S3000

provides sate-of-the-art anaiylical solutions for a wide range of research areas such as

functional synthetic polymers materials science and biomolecules

Malrix Assisled Laser Desorpllonlonization Timemiddotof-Flighl Mass Spectrometer

I JMS-T1 OOLP+DART TLC-TOFMS

Pet c 60000 (10 valley) err 02 ng of methyl stearate

SIN 400

(CVEI combination ion source) I~ ~ aJe up to 10kV

I JMS-T1 OOLP LC-TOFMS

I JMS-Tl OOGCV GC-TOFMS

middotl shyThe JMS-T100LP+DART achieves simple and fast TLCMS analysis Accurate mass The JMS-Tl00GCV is a fully automatic Gas Chromatograph - Time-ot-Flight Mass

measurement capabilit y of TOFMS also enables you to determine element Spectrometer (GC-TOFMS) This versatile MS system covers wide range of

compositions of the analytes applications in GC-MS analysis

16 I Pr oduc i Gu ide

- -

---

1----- 1- - - I - =---shy= bull --tJ~ 1- _ ~ __ ~-=--_~

I JMS-Ql 050GC UltraQuad GClMS

cJEOL

-

S-trapHS Headspace Autosampler

ESR Spectrometers

I JES-X3 series ESR Spectrometers

Recently it has been widely

accepted that even retatively few

unpaired electrons in a sample can

affect the function of the material so

lower detection limits (high er

sens itivity) is required of ESR

measurements JES-X3 Series has

achieved higher sensiti v i ty by

developing a lOIN-noise Gunn

oscillator for its new spectrometer

JES-X320 JEOL RESONANCE Inc

i III III )

Maximum Magnetic Field I a6ST 13T 14T

SweepW idth I --00-- 250mT plusmn001 - 500m__T_ __--l

Pole Gap _ _ 6cmm__ ___-= ___~ ____cmm__ _ I 0 = 60mcm 75 _l

Frequency Range(GHz) 8750 - 9650 _ _ _ ___-1

Field Resolution (mT) _L_ 235 Correction by Marker _1_--- Standard

I Operating System Windows 7

The JMS-01050GC is an innovative quadrupole mass spectrometer (OMS) that

achieves the highest-level sensitivity in OMS It has a high ability of evacuation due

to the use of a split flow turbo-molecular pump system (400 Lis) th at

simultaneously evacuates the ion source and the detector The use of a highshy

accuracy hyperbolic quadrupole mass analyzer provides high resolution

The S-trap is a next-generation headspace autosampler providing ultra-low

concentration measurement which was not achieved with a heads pace (HS) method

using conventional sample loop In addition the HS-GCMS system combined lith a

JMS-01050GC Mkll quaorupole MS guarantees detection of mold odor in water

down to 1 ppt

I ES-CT470 Liquid Helium Variable Temperature Controller

The ES-CT470 varies the sample temperature in the temperature range between 25 K

and 470 K Temperature setting is performed by d igital display and the set

temperature is kept constant by automatic control circui ts Combined use with a UV Irradiation device is possible A GaAs etement is used as a temperature sensor

enabling high-accuracy temperature setling

- 25 K to 470 K

plusmn001 K for 25 K to 42 K

plusmn1 orO5 K for 42 K to 470 K

_ 20 min 10 25 min (rom room temperature 08 to 2 Uh

50Hz60Hz 5mm JEOL RESONANCE Inc

Produ c t Guide I 17

Industrial Equipm nt for thin-filnl formation and nlatel ial processing

I bull

Electron Beam Source High-power Electron Beam Source

BS-60060EBS EBG-102UB6S

Electron beam sources for vacuum evaporation of metal and metal-oxide thin-films

We offer a wide variety of electron beam sources and crucibles They have features of

excellent beam spot and energy density and high-speed sweeping

1 PGBS 80020CPPS Plasma Source

BS-80011 BPG (6kW) BS-8002OCPPS (3kW)

Plasma Sources are installed in a vacuum chamber and generate high-density plasma

Used as Ion Plating (Plasma Assisted Deposition) and it is possible to improve film

properties for optilcal thin films protective films and function films Because highshy

density plasma can be generated in a mass space high-rate deposition to a large area

is possible

I RF Induction Plasma System

JEBG-3000UB(300kW) JEBG-1 OOOUB(1 OOkW)

High-power electron beam sources for vacuum evaporation of metal and metal-oxide

for wide plastic films or large glass plates that are continuously fed And they can also

be used for vacuum melting of high-melting point metals

raes

RF Generator

t shy - - - --- - - --- -

0-~ 0 bull bullbull - -

RF-12030 (3kW) RF-56000 (Controller)

13 56MHz radio-frequency power supplies for plasma generation and used for

sputtering CVD etching and ion-plating We offer 750W to 6kW generators and

matching networks

DR Powder Feeder

Thermal plasma around 10000degC (15000deg F) by RF inductive coupling This thermal Fine powder feeder that can feed 01 to 100 11m size fine powder continuously with

plasma is used for nano powder synthesis fine powder spheroidization thick film carrier gas We offer optional feeding rate controller and large capacity hopper

deposition multi composite membrane synthesis CVD and harmful gas

decomposition

18 I Produci Guide

---

Biochemical Analyzers

I JCA-BM series Clinical Chemistry Analyzer BioMajesty Series

JEOLs micro volume technology and unique sample pre-dilution mechanism realizes

high throughput chemistry analysis with reduced sample and reagent volume

More than 4000 systems have been placed in clinical laboratories allover the world

JCA-BM6050

I JCA-BMBOOO series Ultra High Throughput Clinical Chemistry Analyzer

4 4

JCA-BMB060 egt

JCA-BMSOOO series offer ultra high throughput chemistry analysis up to 9000 testsl

hour

The pre-dilution unit one of the BioMajesty family features also continues the strong

tradition in these series with interconnected multiple analysis modules the key factors

that accomplish brilliant high throughput as well as downtime reduction with back-up

capability

I JCA-BM6070 High Throughput High Performance Clinical Chemistry An alyzer

I I I

A Clinical chemistry analyzer with incomparable speed and accuracy which achieves

high throughput of 2400 testslhour (includ ing ISE) The incorporated compact

workstation and user-friendly Interface with excellent operability leads the new trend of

the laboratory testing

BioMajesty Series lCA-BM 6010 lCA-BM 6050

lCA-8M 6070 leA-BM 91 30

lCA-BM 8000 Series

bull This product is distributed outside Japan by Siemens Heatthcare Diagnostics under the ADVtAreg brand name

I JCA-BM601 OC Compact amp High Performance Clinical Chemistry Analyzer

-~-I -

1lIIIIIIilllllllllJllnlIlII Ii I JCA-BM6010C is a compact but efficient automatic analyzer that maintains the basic

concept of BioMajesty series while achieving the excellent capability of microanalysis

with sample volume as small as 1 J1L

BM6010C also offers fully automated HbA1 c analysis with on-board hemolysis

(optional) Simultaneous measurement of Glucose and HbA1c improves laboratory

workflow

Product Guid e I 19

S~~MCEAII Certain products in this brochure are controlled under the Foreign 0J 0014007 -v- ~ Exchange and Foreign Trade Law of Japan in compliance with $ ~~~ international security export control JEOL Ltd must provide the~2 m) IIlt Japanese Government with End-users Statement of Assurancel A MGMT SYS

AvA ~ m and End-use Certificate in order to obtain the export license - tiJ needed for export from Japan If the product to be exported is in this category the end user will be asked to fill in these certificate formsdEOLIS09001 amp150 14001CenrfiCltlled

httpwwwjeolcomdEOL JEOL Ltd 1-2 Musashino 3-chome Akishima Tokyo 196-8558 Japan Sales Division Telephone+81-42-528-3381 Facsimile+81-42-528-3386

ARGENTINA COASIN SAClyF Virrey del Pino 4071 1430 Buenos Aires Argentina Telephone 54-11-4552-3185 Facsimile 54-11-4555-3321

AUSTRALIA amp NEW ZEALAND JEOL(AUSTRALASJA) PtyUd Suite 1 L2 18 Aquatic Drive - Frenchs Foresl NSW 2086 Australia Telephone 61-2-9451-3855 Facsimile 61-2-9451-3822

AUSTRIA JEOL (GERMANY) GmbH Oskar-Von-Miller-Strasse 1 a 85386 Eching Gennany Telephone 49-8165-77346 Facsimile 49-8165-77512

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Room A2117 Zhongshang Plaza Office Bldg NO7 Zhongnan Road Wuhan Hubei 430071 PRChina Telephone 86-27-8713-2567 Facsimile 86-27-8713-2567

JEOL LTD (BEIJING) CO LTD CHENGDU BRANCH 1807A Zonglu Building NO 35 Zhongfu Road Chengdu Sichuan 610016 PR China Telephone 86-28-86622554 Facsimile 86-28-86622564

EGYPT JEOL SERIVCE BUREAU

3rd Fl Nile Center Bldg Nawal Slree Dokkl (Cairo) Egypt Telephone 20-2-3335-7220 Facsimile 20-2-3338-4186

FRANCE JEOL (EUROPE) SAS Espace Claude Monet 1 Allee de Giverny 78290 Crolssy-sur-Seine France Telephone 33-13015-3737 Facsimile 33-13015-3747

GERMANY JEOL (GERMANY) GmbH Oskar-Von-Miller-Strasse 1 a 85386 Eching Gennany Telephone 49-8165-77346 Facsimile 49-8165-77512

GREAT BRITAIN amp IRELAND JEOL (UK) LTD JEOL House Silver Court Watchmeaci Welwyn Garden City Herts AL71LT UK Telephone 44-1707 -377117 FaCSimile 44-1707-373254

GREECE N ASTERIADIS SA

56-58S Trikoupl Str PO Box 26140 GR-10022 Athens Greece Telephone 30-1-823-5383 Facsimile 30-1-823-9567

HONG KONG FARMING LTD

Unit No1 009 1 OF Prosperity Milennia Plaza 663 Kings Road North Point Hong Kong Telephone 852-2815-7299 Facsimile 852-2581-4635

INDIA JEQL INDIA Pvt Ltd

Elegance Tower Level 2 2128 Old Mathura Road Jasola Business District Centre Near Apollo Hospital Jasola New Delhi 110025 India Telephone 91-11-6472-2578 Facsimile 91-11-4060-1235

BLUE STAR LTD (HQ Mumbaij

Analyticallnstrments Department Sahas 41412 Veer Savarkar Marg Prabhadery Mumbai 400 025 India Telephone 91-22-6666-4000 Facsimile 91-22-6666-4001

BLUE STAR LTD (DelhQ Analytical Instruments Department E-4412 Okhla Industrial Area Phase-II New Delhi 110 020 India Telephone 91-11-4149-4000 Facsimile 91-11-4149-4005

BLUE STAR LTD (Calcutta)

Analylicallnstruments Department 7 Hare Street Calcutta 700 001 India Telephone 91-33-2213-4133 Facsimile 91 -33-2213-4102

BLUE STAR LTD (ChennaO Analytical Instruments Department No 46 Garuda Building Cathedral Road Chennai 600 086 India Telephone 91-44-4244-4000 Facsimile 91-44-4244-4190

INDONESIA PT TEKNOLABindo Penta Perkasa Komplek Gading Bukillndah Blok lIll JI Bukfl Gading Raya Kelapa Gading Pennai Jakarta 14240 Indonesia Telephone 62-21-458470575859 Facsimile 62-21-45842729

ITALY JEOL 0TALIA) SpA Centro Direzionale Green Office Via dei Tulipani 1 20090 Pieve Emanuele (MI) Italy Telephone 39-02-9041431 Facsimila 39-02-90414343

KOREA JEOL KOREA LTD

Dongwoo Bldg 7F 1443 Yangjae Daero Gangdong-Gu Seoul 134-010 Korea Telephone 82-2-511-5501 Facsimile 82-2-511-2635

KUWAIT Ashraf amp CO Ltd WLL PO Box 3555 Safat 13036 Kuwait Telephone 965-1805151 Facsimile 965-24335373

MALAYSIA JEOL(MALAYSIA) SDNBHD(3S9011-M)

205 Block A Mezzanine Floor Kelana Business Center 97 Jalan SS 72 Kelana Jaya 47301 Petaling Jaya Selangor Malaysia Telephone 60-3-7492-7722 Facsimile 60-3-7492-7723

MEXICO JEOL DE MEXICO SA DE CV

Arkansas 11 Piso 2 Colonia Napoles Delegacion Benito Juarez CP 03810 Mexico DF Mexico Telephone 52-5-55-211-4511 Facsimile 52-5-55-211-0720

PAKISTAN (KarachI) ANALYTICAL MEASURING SYSTEM (pvn LTD(AMS LTD)

14-C Main Sehar Commercia) Avenue Lane 4 Khayaban-e-Sehar DHA-VII Karachimiddot75500 Pakinstan Telephone 92-21-353455813534074735346057-8 Facsimile 92-21-35345582

PANAMA PROMED SA Parque Industrial Costa del Este Urbanizacion Costa del Este Apartado 0816-01755 Panama Panama Telephone 507-303-3100 FaCSimile 507-303-3115

PHILIPPINES PHILAB INDUSTRIES INC

7487 Bagtikan Street SAY Makati 1203 Metro Manila Phillip pines Telephone 63-2-896-7218 Facsimile 63-2-897-7732

PORTUGAL Izasa Portugal Lda A do Proletariado 1 2790-138 CARNAXIDE Portugal Telephone 351-21-424-73-00 Facsimile 351-21-418-60-20

RUSSIA JEOL (RUS) LLC Krasnoproletarskaya Street 16 Bid 2 127473 Moscow Russian Federation Telephone 7-495-748-7791rr792 Facsimile 7-495-748-7793

SAUDI ARABIA ABDULREHMAN ALGOSAIBI GTC (Riyadh)

King Abdulaziz Avenue PO Box 215 Riyadh 11411 Saudi Arabia Telephone 966-1-479-3000 Facsimile 966-1-477-1374

SCANDINAVIA SWEDEN JEOL (Skandinaviska)AB

Hammarbacken 6A Box 716191 27 Sollentuna Sweden Telephone 46-8-28-2800 Facsimile 46-8-29-1647

SERVICE amp INFORMATION OFFICE NORWAY JEQL (Skandinaviska)AB

Lorenvangen 23 0580 Oslo NORWAY Telephone 47-2-2-64-7930 Facsimile 47-2-2-65-0619

FINLAND JEOL (Skandlnaviska)AB

Ylakaupinkuja 2 FIN-02360 Espoo Finland Telephone 358-9-8129-0350 Facsimile 358-9-8129-0351

SINGAPORE JEOLASIA PTE LTD

2 Corporation Road 1t01-12 Corporation Place Singapore 618494 Telephone 65-6565-9989 Facsimile 65-6565-7552

SOUTH AFRICA ADI Scientific (Pty) Ltd

370 Angus Crescent Northlands Business Park 29 Newmarket Road

~~=~g~~~2~~1nt~~2_~~~bIlC of South Africa

Facsimile 27-11 -462-1466

SPAIN IZASA SA

Argoneses 13 28100 Alcobendas (poligono IndustriaQ Madrid Spain Te~phone 34-91-663-0500 Facsimile 34-91-663-0545

SWITZERLAND JEOL (GERMANY) GmbH Oskar-Von-Miller Strasse 1 85386 Eching Germany Telephone 49-8165-77346 Facsimile 49-8165-77512

TAIWAN For EO ProQucts JIE DONG CO LTD 7F 112 Chung Hsiao East Road Section 1 Taipei Taiwan 10023 Republic of China Telephone 886-2-2395-2978 Facsimile 886-2~2322-4655

For Mass Spectrometer Products Mass Solutions Technology Co Ltd

5F No79 Sec 1 Xintai 5th Rd Xlzhi Dis New Taipei City 221 Taiwan Republic of China Telephone 886-2-2698-9511 Facsimile 886-2-2698-9512

For Semiconductor Products JEOL TAIWAN SEMICONDUCTORS LTD

11 F-l No 346 Pei-Da Road Hsin-Chu City 300 Taiwan Republic of China Telephone 886-3-523-8490 Facsimile 886-3-523-8503

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300 Phaholyothin Rd Phayathai Bangkok 10400 Thailand Telephone 66-2-615-2929 Facsimile 66-2-615-23502351

THE NETHERLANDS JEOL (EUROPE) Bv Ureweg 4 NL-2153 PH Nieuw-Vennep The Nelherlands Telephone 31-252-623500 Facsimile 31-252-623501

TURKEY TEKSERAS Kayisdagi )nonu MahKartal Cad No553 34755 Atasehir Istanbul Turkey Telephone 90-216-5736470 Facsimile 90-216-5736475

UAE MRS Group Dubai POBox 171612 Rashid Abdulla AI Noami Building Suite No 306 Damascus Street AI Qusais-3 Dubai UAE Telephone 971-4-2581141 Facsimile 971-4-2581151

JEOLGulf

POBox 171612 bull Rashid Abdulla AI Noami Building Suite No 306 Damascus Street AI Qusais-3 Dubai UAE Telephone 971-553964219(mobile)

USA JEOL USA INC 11 Dearborn Road Peabody MA 01960 USA Telephone 1-978-535-5900 Facsimile 1-978-536-22052206

JEOL USA INC WEST OFFICE

~~s~~~~~rigAe9~5t~~1 1 0 Telephone 1-925-737-1740 Facsimile 1-925-737-1749

VENEZUELA GOMSA Service and Supply CA

Urbanizacion Montalban JlI - Resldenclas Don Andres - Piso 7 - Apartomento 74 Avenida 3 entre calles 7 y 6 Montalban Caracas Venezuela Telephone 58-212-443-4342 Facsimile 58-212-443-4342

VTETNAM TECHNICAL MATERIALS AND RESOURCES IMPORT-EXPORT JOINT STOCK COMPANY(REXCO) Hanoi Branch

No 13-Lot 12 Trung Yen Trung Hoa Street Cau Giay Dist HanOi Vietnam Telephone 84-4-562-051617562-0535 Facsimile 84-4-853-2511

No 0205B389C Printed in Japan Kp

Page 14: Introduction - Главное управление науки БГУresearch.bsu.by/wp-content/uploads/2015/06/JEOL_Product...Scanning Electron Microscope The JSM-6610 is a high-performance

bull bull bull

IJNM-ECS 00 FT NMR System

bull I ASC Series

Auto Sample Changer

ASC8 (8 samples) ASC24 (24 samples)

middotmiddot iT ~ --shy

~ I -~Au

ASC16 (16 samples) ASC64 (64 samples)

bullIJNM-ECAECX series Solid NMR

=- ~

I

l l

bull

0 5ilJl

0

MAS conlroller Solid NMR sampling kit

NMR Systems For Modern NMR Spectroscopy The JNM-ECS400 i s a compact two-channel

spectrometer that retains the advanced capabilities of the

JNM-ECAlECX series (required installation space is oneshy

half compared to conventional NMRs) Programmable

timing sequencers built into each RF and PFG channel

can independently control either synchronous or

asynchronous operations of each channel Its standard

tunable broadband gradient probe which integrates all

JEOLs newest technologies is the high sesitivity roomshy

tempperature probe

Ccmpact spectrometer chassis Innovaten in JEOL NMR digrtal architecture High-stability and high-accuracy digital spectrometer High-sensrtivity new tunable probe Full automalk NMR with advanced software

JEOL RESONANCE Inc

An automatic sample changer makes it

possible to measure many samples

sequentially by exchanging multiple samples

automatically one by one Five changer

models are available for 8 samples 16

samples 24 samples 64 samples and 100

samples

JEOL RESONANCE Inc

ASC100 (100 samples)

1 --0 1(10 C ppm I

Sdid 13C-CPMAS spectrum of cholk acid

Solid-NMR is a technique that measures solid samples (powder or film-like samples) This technique is also effective for measurement of samples not soluble in solvents (inorganic

samples etc) and of crystalline polymorph that is meaningful to measure at the solid state

JEOL RESONANCE Inc

Produci Guide I 15

Mass Spectrometers

I JMS-800D UltraFOCUS I JMS-700 (2) MStation Mass Spectrometer Dedicated to Dioxin Anal ys is High resolution M ass Spectrometer

JMS-800D UltraFOCUS is the optimal cho ice for ultra lowlevel race detection

applications suc h as moni torin g for dioxins and related co mpoun ds eg

Polychlorinated Biphenyls (PCBs) Polybrominated Diphenyl Ethers (PBDEs) or drugs

of abuse by high resolution-selected ion monitoring (HRSIM) gas chromatographyl

mass spectrometry(GCMS)

R-- gtn 80000 (10 valley) Sent Ily 2 3 7 8-TCDD 100fg SNgt2oo

(6 channels 100 msecch Resolution 10000)

N_ Jut J _lllgEI up to 10 kV

JMS-S3000 Matri x Assisted Laser DesorptionIonization TOFMS

The JMS-S3000 is a MALOI-TOFMS incorporating an innovative SpirarrOF ion optical

system With superior capabilities than conventional MALDI-TOFMS the JMS-S3000

provides sate-of-the-art anaiylical solutions for a wide range of research areas such as

functional synthetic polymers materials science and biomolecules

Malrix Assisled Laser Desorpllonlonization Timemiddotof-Flighl Mass Spectrometer

I JMS-T1 OOLP+DART TLC-TOFMS

Pet c 60000 (10 valley) err 02 ng of methyl stearate

SIN 400

(CVEI combination ion source) I~ ~ aJe up to 10kV

I JMS-T1 OOLP LC-TOFMS

I JMS-Tl OOGCV GC-TOFMS

middotl shyThe JMS-T100LP+DART achieves simple and fast TLCMS analysis Accurate mass The JMS-Tl00GCV is a fully automatic Gas Chromatograph - Time-ot-Flight Mass

measurement capabilit y of TOFMS also enables you to determine element Spectrometer (GC-TOFMS) This versatile MS system covers wide range of

compositions of the analytes applications in GC-MS analysis

16 I Pr oduc i Gu ide

- -

---

1----- 1- - - I - =---shy= bull --tJ~ 1- _ ~ __ ~-=--_~

I JMS-Ql 050GC UltraQuad GClMS

cJEOL

-

S-trapHS Headspace Autosampler

ESR Spectrometers

I JES-X3 series ESR Spectrometers

Recently it has been widely

accepted that even retatively few

unpaired electrons in a sample can

affect the function of the material so

lower detection limits (high er

sens itivity) is required of ESR

measurements JES-X3 Series has

achieved higher sensiti v i ty by

developing a lOIN-noise Gunn

oscillator for its new spectrometer

JES-X320 JEOL RESONANCE Inc

i III III )

Maximum Magnetic Field I a6ST 13T 14T

SweepW idth I --00-- 250mT plusmn001 - 500m__T_ __--l

Pole Gap _ _ 6cmm__ ___-= ___~ ____cmm__ _ I 0 = 60mcm 75 _l

Frequency Range(GHz) 8750 - 9650 _ _ _ ___-1

Field Resolution (mT) _L_ 235 Correction by Marker _1_--- Standard

I Operating System Windows 7

The JMS-01050GC is an innovative quadrupole mass spectrometer (OMS) that

achieves the highest-level sensitivity in OMS It has a high ability of evacuation due

to the use of a split flow turbo-molecular pump system (400 Lis) th at

simultaneously evacuates the ion source and the detector The use of a highshy

accuracy hyperbolic quadrupole mass analyzer provides high resolution

The S-trap is a next-generation headspace autosampler providing ultra-low

concentration measurement which was not achieved with a heads pace (HS) method

using conventional sample loop In addition the HS-GCMS system combined lith a

JMS-01050GC Mkll quaorupole MS guarantees detection of mold odor in water

down to 1 ppt

I ES-CT470 Liquid Helium Variable Temperature Controller

The ES-CT470 varies the sample temperature in the temperature range between 25 K

and 470 K Temperature setting is performed by d igital display and the set

temperature is kept constant by automatic control circui ts Combined use with a UV Irradiation device is possible A GaAs etement is used as a temperature sensor

enabling high-accuracy temperature setling

- 25 K to 470 K

plusmn001 K for 25 K to 42 K

plusmn1 orO5 K for 42 K to 470 K

_ 20 min 10 25 min (rom room temperature 08 to 2 Uh

50Hz60Hz 5mm JEOL RESONANCE Inc

Produ c t Guide I 17

Industrial Equipm nt for thin-filnl formation and nlatel ial processing

I bull

Electron Beam Source High-power Electron Beam Source

BS-60060EBS EBG-102UB6S

Electron beam sources for vacuum evaporation of metal and metal-oxide thin-films

We offer a wide variety of electron beam sources and crucibles They have features of

excellent beam spot and energy density and high-speed sweeping

1 PGBS 80020CPPS Plasma Source

BS-80011 BPG (6kW) BS-8002OCPPS (3kW)

Plasma Sources are installed in a vacuum chamber and generate high-density plasma

Used as Ion Plating (Plasma Assisted Deposition) and it is possible to improve film

properties for optilcal thin films protective films and function films Because highshy

density plasma can be generated in a mass space high-rate deposition to a large area

is possible

I RF Induction Plasma System

JEBG-3000UB(300kW) JEBG-1 OOOUB(1 OOkW)

High-power electron beam sources for vacuum evaporation of metal and metal-oxide

for wide plastic films or large glass plates that are continuously fed And they can also

be used for vacuum melting of high-melting point metals

raes

RF Generator

t shy - - - --- - - --- -

0-~ 0 bull bullbull - -

RF-12030 (3kW) RF-56000 (Controller)

13 56MHz radio-frequency power supplies for plasma generation and used for

sputtering CVD etching and ion-plating We offer 750W to 6kW generators and

matching networks

DR Powder Feeder

Thermal plasma around 10000degC (15000deg F) by RF inductive coupling This thermal Fine powder feeder that can feed 01 to 100 11m size fine powder continuously with

plasma is used for nano powder synthesis fine powder spheroidization thick film carrier gas We offer optional feeding rate controller and large capacity hopper

deposition multi composite membrane synthesis CVD and harmful gas

decomposition

18 I Produci Guide

---

Biochemical Analyzers

I JCA-BM series Clinical Chemistry Analyzer BioMajesty Series

JEOLs micro volume technology and unique sample pre-dilution mechanism realizes

high throughput chemistry analysis with reduced sample and reagent volume

More than 4000 systems have been placed in clinical laboratories allover the world

JCA-BM6050

I JCA-BMBOOO series Ultra High Throughput Clinical Chemistry Analyzer

4 4

JCA-BMB060 egt

JCA-BMSOOO series offer ultra high throughput chemistry analysis up to 9000 testsl

hour

The pre-dilution unit one of the BioMajesty family features also continues the strong

tradition in these series with interconnected multiple analysis modules the key factors

that accomplish brilliant high throughput as well as downtime reduction with back-up

capability

I JCA-BM6070 High Throughput High Performance Clinical Chemistry An alyzer

I I I

A Clinical chemistry analyzer with incomparable speed and accuracy which achieves

high throughput of 2400 testslhour (includ ing ISE) The incorporated compact

workstation and user-friendly Interface with excellent operability leads the new trend of

the laboratory testing

BioMajesty Series lCA-BM 6010 lCA-BM 6050

lCA-8M 6070 leA-BM 91 30

lCA-BM 8000 Series

bull This product is distributed outside Japan by Siemens Heatthcare Diagnostics under the ADVtAreg brand name

I JCA-BM601 OC Compact amp High Performance Clinical Chemistry Analyzer

-~-I -

1lIIIIIIilllllllllJllnlIlII Ii I JCA-BM6010C is a compact but efficient automatic analyzer that maintains the basic

concept of BioMajesty series while achieving the excellent capability of microanalysis

with sample volume as small as 1 J1L

BM6010C also offers fully automated HbA1 c analysis with on-board hemolysis

(optional) Simultaneous measurement of Glucose and HbA1c improves laboratory

workflow

Product Guid e I 19

S~~MCEAII Certain products in this brochure are controlled under the Foreign 0J 0014007 -v- ~ Exchange and Foreign Trade Law of Japan in compliance with $ ~~~ international security export control JEOL Ltd must provide the~2 m) IIlt Japanese Government with End-users Statement of Assurancel A MGMT SYS

AvA ~ m and End-use Certificate in order to obtain the export license - tiJ needed for export from Japan If the product to be exported is in this category the end user will be asked to fill in these certificate formsdEOLIS09001 amp150 14001CenrfiCltlled

httpwwwjeolcomdEOL JEOL Ltd 1-2 Musashino 3-chome Akishima Tokyo 196-8558 Japan Sales Division Telephone+81-42-528-3381 Facsimile+81-42-528-3386

ARGENTINA COASIN SAClyF Virrey del Pino 4071 1430 Buenos Aires Argentina Telephone 54-11-4552-3185 Facsimile 54-11-4555-3321

AUSTRALIA amp NEW ZEALAND JEOL(AUSTRALASJA) PtyUd Suite 1 L2 18 Aquatic Drive - Frenchs Foresl NSW 2086 Australia Telephone 61-2-9451-3855 Facsimile 61-2-9451-3822

AUSTRIA JEOL (GERMANY) GmbH Oskar-Von-Miller-Strasse 1 a 85386 Eching Gennany Telephone 49-8165-77346 Facsimile 49-8165-77512

BANGLADESH AQ CHOWDHURY SCIENCE amp SYNERGY PVT LTD House No1 2 Road No 5A Sector No 11 Uttara Dhaka - 1230 Bangladesh Telephone 880-2-9980790 8953450 8953501 Facsimile 880-2-8854428

BELGIUM JEOL (EUROPE) BV Planet ll Gebouw B Leuvensesteenweg 542 B-1930 Zaventem Belgium Telephone 32-2-720-0560 Facsimile 32-2-720-6134

BRAZIL JEOL Brasillnstrument09 Cienlilicos Llda

Av Jabaquara 2958-50 andar-cj 52 04046-500 Sao Paulo SP Brazil Telephone 55-11-5070 4000 Facsimile 55-11-5070 4010

CANADA JEOL CANADA INC 3275 Premier Rue 8 SI-Hubert Quebec J3Y 8Y6 Canada Telephone 1-450-676-8776 Facsimile 1-450-676-6694

CHILE ARQUIMED INNOVAnON

Arturo Pmt 828Santiago Chile Telephone 56-2-634-6266 Facsimile 56-2-634-4633

CHINA JEOL(BEIJING) CO LTD Room Bl0l0l110 Wantong New Wond Plaza No2 Fuchengmenwai Street XIcheng District Beijing 100037 PRChina Telephone 86-10-6804-6321 Facsimile 86-10-6804-6324

JEOL (BEIJING) CO LTD SHANGHAI BRANCH

Room 15051506 Nol300Xi Kang Road Jing an Dis Shanghai 200040 China Telephone 86-21-6248-4868448745374404 Facsimile 86-21-6248-4075

JEOL (BEIJING) CO LTD GUANG ZHOU BRANCH

N1601 World Trade Center Building 371-375 Huan Shi Road East Guang Zhou Guangdong Prov 510095 PRChina Telephone 86-20-8778-7848 Facsimile 86-20-8778-4268

JEOL (BEIJING) CO LTD WUHAN BRANCH

Room A2117 Zhongshang Plaza Office Bldg NO7 Zhongnan Road Wuhan Hubei 430071 PRChina Telephone 86-27-8713-2567 Facsimile 86-27-8713-2567

JEOL LTD (BEIJING) CO LTD CHENGDU BRANCH 1807A Zonglu Building NO 35 Zhongfu Road Chengdu Sichuan 610016 PR China Telephone 86-28-86622554 Facsimile 86-28-86622564

EGYPT JEOL SERIVCE BUREAU

3rd Fl Nile Center Bldg Nawal Slree Dokkl (Cairo) Egypt Telephone 20-2-3335-7220 Facsimile 20-2-3338-4186

FRANCE JEOL (EUROPE) SAS Espace Claude Monet 1 Allee de Giverny 78290 Crolssy-sur-Seine France Telephone 33-13015-3737 Facsimile 33-13015-3747

GERMANY JEOL (GERMANY) GmbH Oskar-Von-Miller-Strasse 1 a 85386 Eching Gennany Telephone 49-8165-77346 Facsimile 49-8165-77512

GREAT BRITAIN amp IRELAND JEOL (UK) LTD JEOL House Silver Court Watchmeaci Welwyn Garden City Herts AL71LT UK Telephone 44-1707 -377117 FaCSimile 44-1707-373254

GREECE N ASTERIADIS SA

56-58S Trikoupl Str PO Box 26140 GR-10022 Athens Greece Telephone 30-1-823-5383 Facsimile 30-1-823-9567

HONG KONG FARMING LTD

Unit No1 009 1 OF Prosperity Milennia Plaza 663 Kings Road North Point Hong Kong Telephone 852-2815-7299 Facsimile 852-2581-4635

INDIA JEQL INDIA Pvt Ltd

Elegance Tower Level 2 2128 Old Mathura Road Jasola Business District Centre Near Apollo Hospital Jasola New Delhi 110025 India Telephone 91-11-6472-2578 Facsimile 91-11-4060-1235

BLUE STAR LTD (HQ Mumbaij

Analyticallnstrments Department Sahas 41412 Veer Savarkar Marg Prabhadery Mumbai 400 025 India Telephone 91-22-6666-4000 Facsimile 91-22-6666-4001

BLUE STAR LTD (DelhQ Analytical Instruments Department E-4412 Okhla Industrial Area Phase-II New Delhi 110 020 India Telephone 91-11-4149-4000 Facsimile 91-11-4149-4005

BLUE STAR LTD (Calcutta)

Analylicallnstruments Department 7 Hare Street Calcutta 700 001 India Telephone 91-33-2213-4133 Facsimile 91 -33-2213-4102

BLUE STAR LTD (ChennaO Analytical Instruments Department No 46 Garuda Building Cathedral Road Chennai 600 086 India Telephone 91-44-4244-4000 Facsimile 91-44-4244-4190

INDONESIA PT TEKNOLABindo Penta Perkasa Komplek Gading Bukillndah Blok lIll JI Bukfl Gading Raya Kelapa Gading Pennai Jakarta 14240 Indonesia Telephone 62-21-458470575859 Facsimile 62-21-45842729

ITALY JEOL 0TALIA) SpA Centro Direzionale Green Office Via dei Tulipani 1 20090 Pieve Emanuele (MI) Italy Telephone 39-02-9041431 Facsimila 39-02-90414343

KOREA JEOL KOREA LTD

Dongwoo Bldg 7F 1443 Yangjae Daero Gangdong-Gu Seoul 134-010 Korea Telephone 82-2-511-5501 Facsimile 82-2-511-2635

KUWAIT Ashraf amp CO Ltd WLL PO Box 3555 Safat 13036 Kuwait Telephone 965-1805151 Facsimile 965-24335373

MALAYSIA JEOL(MALAYSIA) SDNBHD(3S9011-M)

205 Block A Mezzanine Floor Kelana Business Center 97 Jalan SS 72 Kelana Jaya 47301 Petaling Jaya Selangor Malaysia Telephone 60-3-7492-7722 Facsimile 60-3-7492-7723

MEXICO JEOL DE MEXICO SA DE CV

Arkansas 11 Piso 2 Colonia Napoles Delegacion Benito Juarez CP 03810 Mexico DF Mexico Telephone 52-5-55-211-4511 Facsimile 52-5-55-211-0720

PAKISTAN (KarachI) ANALYTICAL MEASURING SYSTEM (pvn LTD(AMS LTD)

14-C Main Sehar Commercia) Avenue Lane 4 Khayaban-e-Sehar DHA-VII Karachimiddot75500 Pakinstan Telephone 92-21-353455813534074735346057-8 Facsimile 92-21-35345582

PANAMA PROMED SA Parque Industrial Costa del Este Urbanizacion Costa del Este Apartado 0816-01755 Panama Panama Telephone 507-303-3100 FaCSimile 507-303-3115

PHILIPPINES PHILAB INDUSTRIES INC

7487 Bagtikan Street SAY Makati 1203 Metro Manila Phillip pines Telephone 63-2-896-7218 Facsimile 63-2-897-7732

PORTUGAL Izasa Portugal Lda A do Proletariado 1 2790-138 CARNAXIDE Portugal Telephone 351-21-424-73-00 Facsimile 351-21-418-60-20

RUSSIA JEOL (RUS) LLC Krasnoproletarskaya Street 16 Bid 2 127473 Moscow Russian Federation Telephone 7-495-748-7791rr792 Facsimile 7-495-748-7793

SAUDI ARABIA ABDULREHMAN ALGOSAIBI GTC (Riyadh)

King Abdulaziz Avenue PO Box 215 Riyadh 11411 Saudi Arabia Telephone 966-1-479-3000 Facsimile 966-1-477-1374

SCANDINAVIA SWEDEN JEOL (Skandinaviska)AB

Hammarbacken 6A Box 716191 27 Sollentuna Sweden Telephone 46-8-28-2800 Facsimile 46-8-29-1647

SERVICE amp INFORMATION OFFICE NORWAY JEQL (Skandinaviska)AB

Lorenvangen 23 0580 Oslo NORWAY Telephone 47-2-2-64-7930 Facsimile 47-2-2-65-0619

FINLAND JEOL (Skandlnaviska)AB

Ylakaupinkuja 2 FIN-02360 Espoo Finland Telephone 358-9-8129-0350 Facsimile 358-9-8129-0351

SINGAPORE JEOLASIA PTE LTD

2 Corporation Road 1t01-12 Corporation Place Singapore 618494 Telephone 65-6565-9989 Facsimile 65-6565-7552

SOUTH AFRICA ADI Scientific (Pty) Ltd

370 Angus Crescent Northlands Business Park 29 Newmarket Road

~~=~g~~~2~~1nt~~2_~~~bIlC of South Africa

Facsimile 27-11 -462-1466

SPAIN IZASA SA

Argoneses 13 28100 Alcobendas (poligono IndustriaQ Madrid Spain Te~phone 34-91-663-0500 Facsimile 34-91-663-0545

SWITZERLAND JEOL (GERMANY) GmbH Oskar-Von-Miller Strasse 1 85386 Eching Germany Telephone 49-8165-77346 Facsimile 49-8165-77512

TAIWAN For EO ProQucts JIE DONG CO LTD 7F 112 Chung Hsiao East Road Section 1 Taipei Taiwan 10023 Republic of China Telephone 886-2-2395-2978 Facsimile 886-2~2322-4655

For Mass Spectrometer Products Mass Solutions Technology Co Ltd

5F No79 Sec 1 Xintai 5th Rd Xlzhi Dis New Taipei City 221 Taiwan Republic of China Telephone 886-2-2698-9511 Facsimile 886-2-2698-9512

For Semiconductor Products JEOL TAIWAN SEMICONDUCTORS LTD

11 F-l No 346 Pei-Da Road Hsin-Chu City 300 Taiwan Republic of China Telephone 886-3-523-8490 Facsimile 886-3-523-8503

THAILAND BECTHAI BANGKOK EQUIPMENT amp CHEMICAL CO Ltd

300 Phaholyothin Rd Phayathai Bangkok 10400 Thailand Telephone 66-2-615-2929 Facsimile 66-2-615-23502351

THE NETHERLANDS JEOL (EUROPE) Bv Ureweg 4 NL-2153 PH Nieuw-Vennep The Nelherlands Telephone 31-252-623500 Facsimile 31-252-623501

TURKEY TEKSERAS Kayisdagi )nonu MahKartal Cad No553 34755 Atasehir Istanbul Turkey Telephone 90-216-5736470 Facsimile 90-216-5736475

UAE MRS Group Dubai POBox 171612 Rashid Abdulla AI Noami Building Suite No 306 Damascus Street AI Qusais-3 Dubai UAE Telephone 971-4-2581141 Facsimile 971-4-2581151

JEOLGulf

POBox 171612 bull Rashid Abdulla AI Noami Building Suite No 306 Damascus Street AI Qusais-3 Dubai UAE Telephone 971-553964219(mobile)

USA JEOL USA INC 11 Dearborn Road Peabody MA 01960 USA Telephone 1-978-535-5900 Facsimile 1-978-536-22052206

JEOL USA INC WEST OFFICE

~~s~~~~~rigAe9~5t~~1 1 0 Telephone 1-925-737-1740 Facsimile 1-925-737-1749

VENEZUELA GOMSA Service and Supply CA

Urbanizacion Montalban JlI - Resldenclas Don Andres - Piso 7 - Apartomento 74 Avenida 3 entre calles 7 y 6 Montalban Caracas Venezuela Telephone 58-212-443-4342 Facsimile 58-212-443-4342

VTETNAM TECHNICAL MATERIALS AND RESOURCES IMPORT-EXPORT JOINT STOCK COMPANY(REXCO) Hanoi Branch

No 13-Lot 12 Trung Yen Trung Hoa Street Cau Giay Dist HanOi Vietnam Telephone 84-4-562-051617562-0535 Facsimile 84-4-853-2511

No 0205B389C Printed in Japan Kp

Page 15: Introduction - Главное управление науки БГУresearch.bsu.by/wp-content/uploads/2015/06/JEOL_Product...Scanning Electron Microscope The JSM-6610 is a high-performance

Mass Spectrometers

I JMS-800D UltraFOCUS I JMS-700 (2) MStation Mass Spectrometer Dedicated to Dioxin Anal ys is High resolution M ass Spectrometer

JMS-800D UltraFOCUS is the optimal cho ice for ultra lowlevel race detection

applications suc h as moni torin g for dioxins and related co mpoun ds eg

Polychlorinated Biphenyls (PCBs) Polybrominated Diphenyl Ethers (PBDEs) or drugs

of abuse by high resolution-selected ion monitoring (HRSIM) gas chromatographyl

mass spectrometry(GCMS)

R-- gtn 80000 (10 valley) Sent Ily 2 3 7 8-TCDD 100fg SNgt2oo

(6 channels 100 msecch Resolution 10000)

N_ Jut J _lllgEI up to 10 kV

JMS-S3000 Matri x Assisted Laser DesorptionIonization TOFMS

The JMS-S3000 is a MALOI-TOFMS incorporating an innovative SpirarrOF ion optical

system With superior capabilities than conventional MALDI-TOFMS the JMS-S3000

provides sate-of-the-art anaiylical solutions for a wide range of research areas such as

functional synthetic polymers materials science and biomolecules

Malrix Assisled Laser Desorpllonlonization Timemiddotof-Flighl Mass Spectrometer

I JMS-T1 OOLP+DART TLC-TOFMS

Pet c 60000 (10 valley) err 02 ng of methyl stearate

SIN 400

(CVEI combination ion source) I~ ~ aJe up to 10kV

I JMS-T1 OOLP LC-TOFMS

I JMS-Tl OOGCV GC-TOFMS

middotl shyThe JMS-T100LP+DART achieves simple and fast TLCMS analysis Accurate mass The JMS-Tl00GCV is a fully automatic Gas Chromatograph - Time-ot-Flight Mass

measurement capabilit y of TOFMS also enables you to determine element Spectrometer (GC-TOFMS) This versatile MS system covers wide range of

compositions of the analytes applications in GC-MS analysis

16 I Pr oduc i Gu ide

- -

---

1----- 1- - - I - =---shy= bull --tJ~ 1- _ ~ __ ~-=--_~

I JMS-Ql 050GC UltraQuad GClMS

cJEOL

-

S-trapHS Headspace Autosampler

ESR Spectrometers

I JES-X3 series ESR Spectrometers

Recently it has been widely

accepted that even retatively few

unpaired electrons in a sample can

affect the function of the material so

lower detection limits (high er

sens itivity) is required of ESR

measurements JES-X3 Series has

achieved higher sensiti v i ty by

developing a lOIN-noise Gunn

oscillator for its new spectrometer

JES-X320 JEOL RESONANCE Inc

i III III )

Maximum Magnetic Field I a6ST 13T 14T

SweepW idth I --00-- 250mT plusmn001 - 500m__T_ __--l

Pole Gap _ _ 6cmm__ ___-= ___~ ____cmm__ _ I 0 = 60mcm 75 _l

Frequency Range(GHz) 8750 - 9650 _ _ _ ___-1

Field Resolution (mT) _L_ 235 Correction by Marker _1_--- Standard

I Operating System Windows 7

The JMS-01050GC is an innovative quadrupole mass spectrometer (OMS) that

achieves the highest-level sensitivity in OMS It has a high ability of evacuation due

to the use of a split flow turbo-molecular pump system (400 Lis) th at

simultaneously evacuates the ion source and the detector The use of a highshy

accuracy hyperbolic quadrupole mass analyzer provides high resolution

The S-trap is a next-generation headspace autosampler providing ultra-low

concentration measurement which was not achieved with a heads pace (HS) method

using conventional sample loop In addition the HS-GCMS system combined lith a

JMS-01050GC Mkll quaorupole MS guarantees detection of mold odor in water

down to 1 ppt

I ES-CT470 Liquid Helium Variable Temperature Controller

The ES-CT470 varies the sample temperature in the temperature range between 25 K

and 470 K Temperature setting is performed by d igital display and the set

temperature is kept constant by automatic control circui ts Combined use with a UV Irradiation device is possible A GaAs etement is used as a temperature sensor

enabling high-accuracy temperature setling

- 25 K to 470 K

plusmn001 K for 25 K to 42 K

plusmn1 orO5 K for 42 K to 470 K

_ 20 min 10 25 min (rom room temperature 08 to 2 Uh

50Hz60Hz 5mm JEOL RESONANCE Inc

Produ c t Guide I 17

Industrial Equipm nt for thin-filnl formation and nlatel ial processing

I bull

Electron Beam Source High-power Electron Beam Source

BS-60060EBS EBG-102UB6S

Electron beam sources for vacuum evaporation of metal and metal-oxide thin-films

We offer a wide variety of electron beam sources and crucibles They have features of

excellent beam spot and energy density and high-speed sweeping

1 PGBS 80020CPPS Plasma Source

BS-80011 BPG (6kW) BS-8002OCPPS (3kW)

Plasma Sources are installed in a vacuum chamber and generate high-density plasma

Used as Ion Plating (Plasma Assisted Deposition) and it is possible to improve film

properties for optilcal thin films protective films and function films Because highshy

density plasma can be generated in a mass space high-rate deposition to a large area

is possible

I RF Induction Plasma System

JEBG-3000UB(300kW) JEBG-1 OOOUB(1 OOkW)

High-power electron beam sources for vacuum evaporation of metal and metal-oxide

for wide plastic films or large glass plates that are continuously fed And they can also

be used for vacuum melting of high-melting point metals

raes

RF Generator

t shy - - - --- - - --- -

0-~ 0 bull bullbull - -

RF-12030 (3kW) RF-56000 (Controller)

13 56MHz radio-frequency power supplies for plasma generation and used for

sputtering CVD etching and ion-plating We offer 750W to 6kW generators and

matching networks

DR Powder Feeder

Thermal plasma around 10000degC (15000deg F) by RF inductive coupling This thermal Fine powder feeder that can feed 01 to 100 11m size fine powder continuously with

plasma is used for nano powder synthesis fine powder spheroidization thick film carrier gas We offer optional feeding rate controller and large capacity hopper

deposition multi composite membrane synthesis CVD and harmful gas

decomposition

18 I Produci Guide

---

Biochemical Analyzers

I JCA-BM series Clinical Chemistry Analyzer BioMajesty Series

JEOLs micro volume technology and unique sample pre-dilution mechanism realizes

high throughput chemistry analysis with reduced sample and reagent volume

More than 4000 systems have been placed in clinical laboratories allover the world

JCA-BM6050

I JCA-BMBOOO series Ultra High Throughput Clinical Chemistry Analyzer

4 4

JCA-BMB060 egt

JCA-BMSOOO series offer ultra high throughput chemistry analysis up to 9000 testsl

hour

The pre-dilution unit one of the BioMajesty family features also continues the strong

tradition in these series with interconnected multiple analysis modules the key factors

that accomplish brilliant high throughput as well as downtime reduction with back-up

capability

I JCA-BM6070 High Throughput High Performance Clinical Chemistry An alyzer

I I I

A Clinical chemistry analyzer with incomparable speed and accuracy which achieves

high throughput of 2400 testslhour (includ ing ISE) The incorporated compact

workstation and user-friendly Interface with excellent operability leads the new trend of

the laboratory testing

BioMajesty Series lCA-BM 6010 lCA-BM 6050

lCA-8M 6070 leA-BM 91 30

lCA-BM 8000 Series

bull This product is distributed outside Japan by Siemens Heatthcare Diagnostics under the ADVtAreg brand name

I JCA-BM601 OC Compact amp High Performance Clinical Chemistry Analyzer

-~-I -

1lIIIIIIilllllllllJllnlIlII Ii I JCA-BM6010C is a compact but efficient automatic analyzer that maintains the basic

concept of BioMajesty series while achieving the excellent capability of microanalysis

with sample volume as small as 1 J1L

BM6010C also offers fully automated HbA1 c analysis with on-board hemolysis

(optional) Simultaneous measurement of Glucose and HbA1c improves laboratory

workflow

Product Guid e I 19

S~~MCEAII Certain products in this brochure are controlled under the Foreign 0J 0014007 -v- ~ Exchange and Foreign Trade Law of Japan in compliance with $ ~~~ international security export control JEOL Ltd must provide the~2 m) IIlt Japanese Government with End-users Statement of Assurancel A MGMT SYS

AvA ~ m and End-use Certificate in order to obtain the export license - tiJ needed for export from Japan If the product to be exported is in this category the end user will be asked to fill in these certificate formsdEOLIS09001 amp150 14001CenrfiCltlled

httpwwwjeolcomdEOL JEOL Ltd 1-2 Musashino 3-chome Akishima Tokyo 196-8558 Japan Sales Division Telephone+81-42-528-3381 Facsimile+81-42-528-3386

ARGENTINA COASIN SAClyF Virrey del Pino 4071 1430 Buenos Aires Argentina Telephone 54-11-4552-3185 Facsimile 54-11-4555-3321

AUSTRALIA amp NEW ZEALAND JEOL(AUSTRALASJA) PtyUd Suite 1 L2 18 Aquatic Drive - Frenchs Foresl NSW 2086 Australia Telephone 61-2-9451-3855 Facsimile 61-2-9451-3822

AUSTRIA JEOL (GERMANY) GmbH Oskar-Von-Miller-Strasse 1 a 85386 Eching Gennany Telephone 49-8165-77346 Facsimile 49-8165-77512

BANGLADESH AQ CHOWDHURY SCIENCE amp SYNERGY PVT LTD House No1 2 Road No 5A Sector No 11 Uttara Dhaka - 1230 Bangladesh Telephone 880-2-9980790 8953450 8953501 Facsimile 880-2-8854428

BELGIUM JEOL (EUROPE) BV Planet ll Gebouw B Leuvensesteenweg 542 B-1930 Zaventem Belgium Telephone 32-2-720-0560 Facsimile 32-2-720-6134

BRAZIL JEOL Brasillnstrument09 Cienlilicos Llda

Av Jabaquara 2958-50 andar-cj 52 04046-500 Sao Paulo SP Brazil Telephone 55-11-5070 4000 Facsimile 55-11-5070 4010

CANADA JEOL CANADA INC 3275 Premier Rue 8 SI-Hubert Quebec J3Y 8Y6 Canada Telephone 1-450-676-8776 Facsimile 1-450-676-6694

CHILE ARQUIMED INNOVAnON

Arturo Pmt 828Santiago Chile Telephone 56-2-634-6266 Facsimile 56-2-634-4633

CHINA JEOL(BEIJING) CO LTD Room Bl0l0l110 Wantong New Wond Plaza No2 Fuchengmenwai Street XIcheng District Beijing 100037 PRChina Telephone 86-10-6804-6321 Facsimile 86-10-6804-6324

JEOL (BEIJING) CO LTD SHANGHAI BRANCH

Room 15051506 Nol300Xi Kang Road Jing an Dis Shanghai 200040 China Telephone 86-21-6248-4868448745374404 Facsimile 86-21-6248-4075

JEOL (BEIJING) CO LTD GUANG ZHOU BRANCH

N1601 World Trade Center Building 371-375 Huan Shi Road East Guang Zhou Guangdong Prov 510095 PRChina Telephone 86-20-8778-7848 Facsimile 86-20-8778-4268

JEOL (BEIJING) CO LTD WUHAN BRANCH

Room A2117 Zhongshang Plaza Office Bldg NO7 Zhongnan Road Wuhan Hubei 430071 PRChina Telephone 86-27-8713-2567 Facsimile 86-27-8713-2567

JEOL LTD (BEIJING) CO LTD CHENGDU BRANCH 1807A Zonglu Building NO 35 Zhongfu Road Chengdu Sichuan 610016 PR China Telephone 86-28-86622554 Facsimile 86-28-86622564

EGYPT JEOL SERIVCE BUREAU

3rd Fl Nile Center Bldg Nawal Slree Dokkl (Cairo) Egypt Telephone 20-2-3335-7220 Facsimile 20-2-3338-4186

FRANCE JEOL (EUROPE) SAS Espace Claude Monet 1 Allee de Giverny 78290 Crolssy-sur-Seine France Telephone 33-13015-3737 Facsimile 33-13015-3747

GERMANY JEOL (GERMANY) GmbH Oskar-Von-Miller-Strasse 1 a 85386 Eching Gennany Telephone 49-8165-77346 Facsimile 49-8165-77512

GREAT BRITAIN amp IRELAND JEOL (UK) LTD JEOL House Silver Court Watchmeaci Welwyn Garden City Herts AL71LT UK Telephone 44-1707 -377117 FaCSimile 44-1707-373254

GREECE N ASTERIADIS SA

56-58S Trikoupl Str PO Box 26140 GR-10022 Athens Greece Telephone 30-1-823-5383 Facsimile 30-1-823-9567

HONG KONG FARMING LTD

Unit No1 009 1 OF Prosperity Milennia Plaza 663 Kings Road North Point Hong Kong Telephone 852-2815-7299 Facsimile 852-2581-4635

INDIA JEQL INDIA Pvt Ltd

Elegance Tower Level 2 2128 Old Mathura Road Jasola Business District Centre Near Apollo Hospital Jasola New Delhi 110025 India Telephone 91-11-6472-2578 Facsimile 91-11-4060-1235

BLUE STAR LTD (HQ Mumbaij

Analyticallnstrments Department Sahas 41412 Veer Savarkar Marg Prabhadery Mumbai 400 025 India Telephone 91-22-6666-4000 Facsimile 91-22-6666-4001

BLUE STAR LTD (DelhQ Analytical Instruments Department E-4412 Okhla Industrial Area Phase-II New Delhi 110 020 India Telephone 91-11-4149-4000 Facsimile 91-11-4149-4005

BLUE STAR LTD (Calcutta)

Analylicallnstruments Department 7 Hare Street Calcutta 700 001 India Telephone 91-33-2213-4133 Facsimile 91 -33-2213-4102

BLUE STAR LTD (ChennaO Analytical Instruments Department No 46 Garuda Building Cathedral Road Chennai 600 086 India Telephone 91-44-4244-4000 Facsimile 91-44-4244-4190

INDONESIA PT TEKNOLABindo Penta Perkasa Komplek Gading Bukillndah Blok lIll JI Bukfl Gading Raya Kelapa Gading Pennai Jakarta 14240 Indonesia Telephone 62-21-458470575859 Facsimile 62-21-45842729

ITALY JEOL 0TALIA) SpA Centro Direzionale Green Office Via dei Tulipani 1 20090 Pieve Emanuele (MI) Italy Telephone 39-02-9041431 Facsimila 39-02-90414343

KOREA JEOL KOREA LTD

Dongwoo Bldg 7F 1443 Yangjae Daero Gangdong-Gu Seoul 134-010 Korea Telephone 82-2-511-5501 Facsimile 82-2-511-2635

KUWAIT Ashraf amp CO Ltd WLL PO Box 3555 Safat 13036 Kuwait Telephone 965-1805151 Facsimile 965-24335373

MALAYSIA JEOL(MALAYSIA) SDNBHD(3S9011-M)

205 Block A Mezzanine Floor Kelana Business Center 97 Jalan SS 72 Kelana Jaya 47301 Petaling Jaya Selangor Malaysia Telephone 60-3-7492-7722 Facsimile 60-3-7492-7723

MEXICO JEOL DE MEXICO SA DE CV

Arkansas 11 Piso 2 Colonia Napoles Delegacion Benito Juarez CP 03810 Mexico DF Mexico Telephone 52-5-55-211-4511 Facsimile 52-5-55-211-0720

PAKISTAN (KarachI) ANALYTICAL MEASURING SYSTEM (pvn LTD(AMS LTD)

14-C Main Sehar Commercia) Avenue Lane 4 Khayaban-e-Sehar DHA-VII Karachimiddot75500 Pakinstan Telephone 92-21-353455813534074735346057-8 Facsimile 92-21-35345582

PANAMA PROMED SA Parque Industrial Costa del Este Urbanizacion Costa del Este Apartado 0816-01755 Panama Panama Telephone 507-303-3100 FaCSimile 507-303-3115

PHILIPPINES PHILAB INDUSTRIES INC

7487 Bagtikan Street SAY Makati 1203 Metro Manila Phillip pines Telephone 63-2-896-7218 Facsimile 63-2-897-7732

PORTUGAL Izasa Portugal Lda A do Proletariado 1 2790-138 CARNAXIDE Portugal Telephone 351-21-424-73-00 Facsimile 351-21-418-60-20

RUSSIA JEOL (RUS) LLC Krasnoproletarskaya Street 16 Bid 2 127473 Moscow Russian Federation Telephone 7-495-748-7791rr792 Facsimile 7-495-748-7793

SAUDI ARABIA ABDULREHMAN ALGOSAIBI GTC (Riyadh)

King Abdulaziz Avenue PO Box 215 Riyadh 11411 Saudi Arabia Telephone 966-1-479-3000 Facsimile 966-1-477-1374

SCANDINAVIA SWEDEN JEOL (Skandinaviska)AB

Hammarbacken 6A Box 716191 27 Sollentuna Sweden Telephone 46-8-28-2800 Facsimile 46-8-29-1647

SERVICE amp INFORMATION OFFICE NORWAY JEQL (Skandinaviska)AB

Lorenvangen 23 0580 Oslo NORWAY Telephone 47-2-2-64-7930 Facsimile 47-2-2-65-0619

FINLAND JEOL (Skandlnaviska)AB

Ylakaupinkuja 2 FIN-02360 Espoo Finland Telephone 358-9-8129-0350 Facsimile 358-9-8129-0351

SINGAPORE JEOLASIA PTE LTD

2 Corporation Road 1t01-12 Corporation Place Singapore 618494 Telephone 65-6565-9989 Facsimile 65-6565-7552

SOUTH AFRICA ADI Scientific (Pty) Ltd

370 Angus Crescent Northlands Business Park 29 Newmarket Road

~~=~g~~~2~~1nt~~2_~~~bIlC of South Africa

Facsimile 27-11 -462-1466

SPAIN IZASA SA

Argoneses 13 28100 Alcobendas (poligono IndustriaQ Madrid Spain Te~phone 34-91-663-0500 Facsimile 34-91-663-0545

SWITZERLAND JEOL (GERMANY) GmbH Oskar-Von-Miller Strasse 1 85386 Eching Germany Telephone 49-8165-77346 Facsimile 49-8165-77512

TAIWAN For EO ProQucts JIE DONG CO LTD 7F 112 Chung Hsiao East Road Section 1 Taipei Taiwan 10023 Republic of China Telephone 886-2-2395-2978 Facsimile 886-2~2322-4655

For Mass Spectrometer Products Mass Solutions Technology Co Ltd

5F No79 Sec 1 Xintai 5th Rd Xlzhi Dis New Taipei City 221 Taiwan Republic of China Telephone 886-2-2698-9511 Facsimile 886-2-2698-9512

For Semiconductor Products JEOL TAIWAN SEMICONDUCTORS LTD

11 F-l No 346 Pei-Da Road Hsin-Chu City 300 Taiwan Republic of China Telephone 886-3-523-8490 Facsimile 886-3-523-8503

THAILAND BECTHAI BANGKOK EQUIPMENT amp CHEMICAL CO Ltd

300 Phaholyothin Rd Phayathai Bangkok 10400 Thailand Telephone 66-2-615-2929 Facsimile 66-2-615-23502351

THE NETHERLANDS JEOL (EUROPE) Bv Ureweg 4 NL-2153 PH Nieuw-Vennep The Nelherlands Telephone 31-252-623500 Facsimile 31-252-623501

TURKEY TEKSERAS Kayisdagi )nonu MahKartal Cad No553 34755 Atasehir Istanbul Turkey Telephone 90-216-5736470 Facsimile 90-216-5736475

UAE MRS Group Dubai POBox 171612 Rashid Abdulla AI Noami Building Suite No 306 Damascus Street AI Qusais-3 Dubai UAE Telephone 971-4-2581141 Facsimile 971-4-2581151

JEOLGulf

POBox 171612 bull Rashid Abdulla AI Noami Building Suite No 306 Damascus Street AI Qusais-3 Dubai UAE Telephone 971-553964219(mobile)

USA JEOL USA INC 11 Dearborn Road Peabody MA 01960 USA Telephone 1-978-535-5900 Facsimile 1-978-536-22052206

JEOL USA INC WEST OFFICE

~~s~~~~~rigAe9~5t~~1 1 0 Telephone 1-925-737-1740 Facsimile 1-925-737-1749

VENEZUELA GOMSA Service and Supply CA

Urbanizacion Montalban JlI - Resldenclas Don Andres - Piso 7 - Apartomento 74 Avenida 3 entre calles 7 y 6 Montalban Caracas Venezuela Telephone 58-212-443-4342 Facsimile 58-212-443-4342

VTETNAM TECHNICAL MATERIALS AND RESOURCES IMPORT-EXPORT JOINT STOCK COMPANY(REXCO) Hanoi Branch

No 13-Lot 12 Trung Yen Trung Hoa Street Cau Giay Dist HanOi Vietnam Telephone 84-4-562-051617562-0535 Facsimile 84-4-853-2511

No 0205B389C Printed in Japan Kp

Page 16: Introduction - Главное управление науки БГУresearch.bsu.by/wp-content/uploads/2015/06/JEOL_Product...Scanning Electron Microscope The JSM-6610 is a high-performance

- -

---

1----- 1- - - I - =---shy= bull --tJ~ 1- _ ~ __ ~-=--_~

I JMS-Ql 050GC UltraQuad GClMS

cJEOL

-

S-trapHS Headspace Autosampler

ESR Spectrometers

I JES-X3 series ESR Spectrometers

Recently it has been widely

accepted that even retatively few

unpaired electrons in a sample can

affect the function of the material so

lower detection limits (high er

sens itivity) is required of ESR

measurements JES-X3 Series has

achieved higher sensiti v i ty by

developing a lOIN-noise Gunn

oscillator for its new spectrometer

JES-X320 JEOL RESONANCE Inc

i III III )

Maximum Magnetic Field I a6ST 13T 14T

SweepW idth I --00-- 250mT plusmn001 - 500m__T_ __--l

Pole Gap _ _ 6cmm__ ___-= ___~ ____cmm__ _ I 0 = 60mcm 75 _l

Frequency Range(GHz) 8750 - 9650 _ _ _ ___-1

Field Resolution (mT) _L_ 235 Correction by Marker _1_--- Standard

I Operating System Windows 7

The JMS-01050GC is an innovative quadrupole mass spectrometer (OMS) that

achieves the highest-level sensitivity in OMS It has a high ability of evacuation due

to the use of a split flow turbo-molecular pump system (400 Lis) th at

simultaneously evacuates the ion source and the detector The use of a highshy

accuracy hyperbolic quadrupole mass analyzer provides high resolution

The S-trap is a next-generation headspace autosampler providing ultra-low

concentration measurement which was not achieved with a heads pace (HS) method

using conventional sample loop In addition the HS-GCMS system combined lith a

JMS-01050GC Mkll quaorupole MS guarantees detection of mold odor in water

down to 1 ppt

I ES-CT470 Liquid Helium Variable Temperature Controller

The ES-CT470 varies the sample temperature in the temperature range between 25 K

and 470 K Temperature setting is performed by d igital display and the set

temperature is kept constant by automatic control circui ts Combined use with a UV Irradiation device is possible A GaAs etement is used as a temperature sensor

enabling high-accuracy temperature setling

- 25 K to 470 K

plusmn001 K for 25 K to 42 K

plusmn1 orO5 K for 42 K to 470 K

_ 20 min 10 25 min (rom room temperature 08 to 2 Uh

50Hz60Hz 5mm JEOL RESONANCE Inc

Produ c t Guide I 17

Industrial Equipm nt for thin-filnl formation and nlatel ial processing

I bull

Electron Beam Source High-power Electron Beam Source

BS-60060EBS EBG-102UB6S

Electron beam sources for vacuum evaporation of metal and metal-oxide thin-films

We offer a wide variety of electron beam sources and crucibles They have features of

excellent beam spot and energy density and high-speed sweeping

1 PGBS 80020CPPS Plasma Source

BS-80011 BPG (6kW) BS-8002OCPPS (3kW)

Plasma Sources are installed in a vacuum chamber and generate high-density plasma

Used as Ion Plating (Plasma Assisted Deposition) and it is possible to improve film

properties for optilcal thin films protective films and function films Because highshy

density plasma can be generated in a mass space high-rate deposition to a large area

is possible

I RF Induction Plasma System

JEBG-3000UB(300kW) JEBG-1 OOOUB(1 OOkW)

High-power electron beam sources for vacuum evaporation of metal and metal-oxide

for wide plastic films or large glass plates that are continuously fed And they can also

be used for vacuum melting of high-melting point metals

raes

RF Generator

t shy - - - --- - - --- -

0-~ 0 bull bullbull - -

RF-12030 (3kW) RF-56000 (Controller)

13 56MHz radio-frequency power supplies for plasma generation and used for

sputtering CVD etching and ion-plating We offer 750W to 6kW generators and

matching networks

DR Powder Feeder

Thermal plasma around 10000degC (15000deg F) by RF inductive coupling This thermal Fine powder feeder that can feed 01 to 100 11m size fine powder continuously with

plasma is used for nano powder synthesis fine powder spheroidization thick film carrier gas We offer optional feeding rate controller and large capacity hopper

deposition multi composite membrane synthesis CVD and harmful gas

decomposition

18 I Produci Guide

---

Biochemical Analyzers

I JCA-BM series Clinical Chemistry Analyzer BioMajesty Series

JEOLs micro volume technology and unique sample pre-dilution mechanism realizes

high throughput chemistry analysis with reduced sample and reagent volume

More than 4000 systems have been placed in clinical laboratories allover the world

JCA-BM6050

I JCA-BMBOOO series Ultra High Throughput Clinical Chemistry Analyzer

4 4

JCA-BMB060 egt

JCA-BMSOOO series offer ultra high throughput chemistry analysis up to 9000 testsl

hour

The pre-dilution unit one of the BioMajesty family features also continues the strong

tradition in these series with interconnected multiple analysis modules the key factors

that accomplish brilliant high throughput as well as downtime reduction with back-up

capability

I JCA-BM6070 High Throughput High Performance Clinical Chemistry An alyzer

I I I

A Clinical chemistry analyzer with incomparable speed and accuracy which achieves

high throughput of 2400 testslhour (includ ing ISE) The incorporated compact

workstation and user-friendly Interface with excellent operability leads the new trend of

the laboratory testing

BioMajesty Series lCA-BM 6010 lCA-BM 6050

lCA-8M 6070 leA-BM 91 30

lCA-BM 8000 Series

bull This product is distributed outside Japan by Siemens Heatthcare Diagnostics under the ADVtAreg brand name

I JCA-BM601 OC Compact amp High Performance Clinical Chemistry Analyzer

-~-I -

1lIIIIIIilllllllllJllnlIlII Ii I JCA-BM6010C is a compact but efficient automatic analyzer that maintains the basic

concept of BioMajesty series while achieving the excellent capability of microanalysis

with sample volume as small as 1 J1L

BM6010C also offers fully automated HbA1 c analysis with on-board hemolysis

(optional) Simultaneous measurement of Glucose and HbA1c improves laboratory

workflow

Product Guid e I 19

S~~MCEAII Certain products in this brochure are controlled under the Foreign 0J 0014007 -v- ~ Exchange and Foreign Trade Law of Japan in compliance with $ ~~~ international security export control JEOL Ltd must provide the~2 m) IIlt Japanese Government with End-users Statement of Assurancel A MGMT SYS

AvA ~ m and End-use Certificate in order to obtain the export license - tiJ needed for export from Japan If the product to be exported is in this category the end user will be asked to fill in these certificate formsdEOLIS09001 amp150 14001CenrfiCltlled

httpwwwjeolcomdEOL JEOL Ltd 1-2 Musashino 3-chome Akishima Tokyo 196-8558 Japan Sales Division Telephone+81-42-528-3381 Facsimile+81-42-528-3386

ARGENTINA COASIN SAClyF Virrey del Pino 4071 1430 Buenos Aires Argentina Telephone 54-11-4552-3185 Facsimile 54-11-4555-3321

AUSTRALIA amp NEW ZEALAND JEOL(AUSTRALASJA) PtyUd Suite 1 L2 18 Aquatic Drive - Frenchs Foresl NSW 2086 Australia Telephone 61-2-9451-3855 Facsimile 61-2-9451-3822

AUSTRIA JEOL (GERMANY) GmbH Oskar-Von-Miller-Strasse 1 a 85386 Eching Gennany Telephone 49-8165-77346 Facsimile 49-8165-77512

BANGLADESH AQ CHOWDHURY SCIENCE amp SYNERGY PVT LTD House No1 2 Road No 5A Sector No 11 Uttara Dhaka - 1230 Bangladesh Telephone 880-2-9980790 8953450 8953501 Facsimile 880-2-8854428

BELGIUM JEOL (EUROPE) BV Planet ll Gebouw B Leuvensesteenweg 542 B-1930 Zaventem Belgium Telephone 32-2-720-0560 Facsimile 32-2-720-6134

BRAZIL JEOL Brasillnstrument09 Cienlilicos Llda

Av Jabaquara 2958-50 andar-cj 52 04046-500 Sao Paulo SP Brazil Telephone 55-11-5070 4000 Facsimile 55-11-5070 4010

CANADA JEOL CANADA INC 3275 Premier Rue 8 SI-Hubert Quebec J3Y 8Y6 Canada Telephone 1-450-676-8776 Facsimile 1-450-676-6694

CHILE ARQUIMED INNOVAnON

Arturo Pmt 828Santiago Chile Telephone 56-2-634-6266 Facsimile 56-2-634-4633

CHINA JEOL(BEIJING) CO LTD Room Bl0l0l110 Wantong New Wond Plaza No2 Fuchengmenwai Street XIcheng District Beijing 100037 PRChina Telephone 86-10-6804-6321 Facsimile 86-10-6804-6324

JEOL (BEIJING) CO LTD SHANGHAI BRANCH

Room 15051506 Nol300Xi Kang Road Jing an Dis Shanghai 200040 China Telephone 86-21-6248-4868448745374404 Facsimile 86-21-6248-4075

JEOL (BEIJING) CO LTD GUANG ZHOU BRANCH

N1601 World Trade Center Building 371-375 Huan Shi Road East Guang Zhou Guangdong Prov 510095 PRChina Telephone 86-20-8778-7848 Facsimile 86-20-8778-4268

JEOL (BEIJING) CO LTD WUHAN BRANCH

Room A2117 Zhongshang Plaza Office Bldg NO7 Zhongnan Road Wuhan Hubei 430071 PRChina Telephone 86-27-8713-2567 Facsimile 86-27-8713-2567

JEOL LTD (BEIJING) CO LTD CHENGDU BRANCH 1807A Zonglu Building NO 35 Zhongfu Road Chengdu Sichuan 610016 PR China Telephone 86-28-86622554 Facsimile 86-28-86622564

EGYPT JEOL SERIVCE BUREAU

3rd Fl Nile Center Bldg Nawal Slree Dokkl (Cairo) Egypt Telephone 20-2-3335-7220 Facsimile 20-2-3338-4186

FRANCE JEOL (EUROPE) SAS Espace Claude Monet 1 Allee de Giverny 78290 Crolssy-sur-Seine France Telephone 33-13015-3737 Facsimile 33-13015-3747

GERMANY JEOL (GERMANY) GmbH Oskar-Von-Miller-Strasse 1 a 85386 Eching Gennany Telephone 49-8165-77346 Facsimile 49-8165-77512

GREAT BRITAIN amp IRELAND JEOL (UK) LTD JEOL House Silver Court Watchmeaci Welwyn Garden City Herts AL71LT UK Telephone 44-1707 -377117 FaCSimile 44-1707-373254

GREECE N ASTERIADIS SA

56-58S Trikoupl Str PO Box 26140 GR-10022 Athens Greece Telephone 30-1-823-5383 Facsimile 30-1-823-9567

HONG KONG FARMING LTD

Unit No1 009 1 OF Prosperity Milennia Plaza 663 Kings Road North Point Hong Kong Telephone 852-2815-7299 Facsimile 852-2581-4635

INDIA JEQL INDIA Pvt Ltd

Elegance Tower Level 2 2128 Old Mathura Road Jasola Business District Centre Near Apollo Hospital Jasola New Delhi 110025 India Telephone 91-11-6472-2578 Facsimile 91-11-4060-1235

BLUE STAR LTD (HQ Mumbaij

Analyticallnstrments Department Sahas 41412 Veer Savarkar Marg Prabhadery Mumbai 400 025 India Telephone 91-22-6666-4000 Facsimile 91-22-6666-4001

BLUE STAR LTD (DelhQ Analytical Instruments Department E-4412 Okhla Industrial Area Phase-II New Delhi 110 020 India Telephone 91-11-4149-4000 Facsimile 91-11-4149-4005

BLUE STAR LTD (Calcutta)

Analylicallnstruments Department 7 Hare Street Calcutta 700 001 India Telephone 91-33-2213-4133 Facsimile 91 -33-2213-4102

BLUE STAR LTD (ChennaO Analytical Instruments Department No 46 Garuda Building Cathedral Road Chennai 600 086 India Telephone 91-44-4244-4000 Facsimile 91-44-4244-4190

INDONESIA PT TEKNOLABindo Penta Perkasa Komplek Gading Bukillndah Blok lIll JI Bukfl Gading Raya Kelapa Gading Pennai Jakarta 14240 Indonesia Telephone 62-21-458470575859 Facsimile 62-21-45842729

ITALY JEOL 0TALIA) SpA Centro Direzionale Green Office Via dei Tulipani 1 20090 Pieve Emanuele (MI) Italy Telephone 39-02-9041431 Facsimila 39-02-90414343

KOREA JEOL KOREA LTD

Dongwoo Bldg 7F 1443 Yangjae Daero Gangdong-Gu Seoul 134-010 Korea Telephone 82-2-511-5501 Facsimile 82-2-511-2635

KUWAIT Ashraf amp CO Ltd WLL PO Box 3555 Safat 13036 Kuwait Telephone 965-1805151 Facsimile 965-24335373

MALAYSIA JEOL(MALAYSIA) SDNBHD(3S9011-M)

205 Block A Mezzanine Floor Kelana Business Center 97 Jalan SS 72 Kelana Jaya 47301 Petaling Jaya Selangor Malaysia Telephone 60-3-7492-7722 Facsimile 60-3-7492-7723

MEXICO JEOL DE MEXICO SA DE CV

Arkansas 11 Piso 2 Colonia Napoles Delegacion Benito Juarez CP 03810 Mexico DF Mexico Telephone 52-5-55-211-4511 Facsimile 52-5-55-211-0720

PAKISTAN (KarachI) ANALYTICAL MEASURING SYSTEM (pvn LTD(AMS LTD)

14-C Main Sehar Commercia) Avenue Lane 4 Khayaban-e-Sehar DHA-VII Karachimiddot75500 Pakinstan Telephone 92-21-353455813534074735346057-8 Facsimile 92-21-35345582

PANAMA PROMED SA Parque Industrial Costa del Este Urbanizacion Costa del Este Apartado 0816-01755 Panama Panama Telephone 507-303-3100 FaCSimile 507-303-3115

PHILIPPINES PHILAB INDUSTRIES INC

7487 Bagtikan Street SAY Makati 1203 Metro Manila Phillip pines Telephone 63-2-896-7218 Facsimile 63-2-897-7732

PORTUGAL Izasa Portugal Lda A do Proletariado 1 2790-138 CARNAXIDE Portugal Telephone 351-21-424-73-00 Facsimile 351-21-418-60-20

RUSSIA JEOL (RUS) LLC Krasnoproletarskaya Street 16 Bid 2 127473 Moscow Russian Federation Telephone 7-495-748-7791rr792 Facsimile 7-495-748-7793

SAUDI ARABIA ABDULREHMAN ALGOSAIBI GTC (Riyadh)

King Abdulaziz Avenue PO Box 215 Riyadh 11411 Saudi Arabia Telephone 966-1-479-3000 Facsimile 966-1-477-1374

SCANDINAVIA SWEDEN JEOL (Skandinaviska)AB

Hammarbacken 6A Box 716191 27 Sollentuna Sweden Telephone 46-8-28-2800 Facsimile 46-8-29-1647

SERVICE amp INFORMATION OFFICE NORWAY JEQL (Skandinaviska)AB

Lorenvangen 23 0580 Oslo NORWAY Telephone 47-2-2-64-7930 Facsimile 47-2-2-65-0619

FINLAND JEOL (Skandlnaviska)AB

Ylakaupinkuja 2 FIN-02360 Espoo Finland Telephone 358-9-8129-0350 Facsimile 358-9-8129-0351

SINGAPORE JEOLASIA PTE LTD

2 Corporation Road 1t01-12 Corporation Place Singapore 618494 Telephone 65-6565-9989 Facsimile 65-6565-7552

SOUTH AFRICA ADI Scientific (Pty) Ltd

370 Angus Crescent Northlands Business Park 29 Newmarket Road

~~=~g~~~2~~1nt~~2_~~~bIlC of South Africa

Facsimile 27-11 -462-1466

SPAIN IZASA SA

Argoneses 13 28100 Alcobendas (poligono IndustriaQ Madrid Spain Te~phone 34-91-663-0500 Facsimile 34-91-663-0545

SWITZERLAND JEOL (GERMANY) GmbH Oskar-Von-Miller Strasse 1 85386 Eching Germany Telephone 49-8165-77346 Facsimile 49-8165-77512

TAIWAN For EO ProQucts JIE DONG CO LTD 7F 112 Chung Hsiao East Road Section 1 Taipei Taiwan 10023 Republic of China Telephone 886-2-2395-2978 Facsimile 886-2~2322-4655

For Mass Spectrometer Products Mass Solutions Technology Co Ltd

5F No79 Sec 1 Xintai 5th Rd Xlzhi Dis New Taipei City 221 Taiwan Republic of China Telephone 886-2-2698-9511 Facsimile 886-2-2698-9512

For Semiconductor Products JEOL TAIWAN SEMICONDUCTORS LTD

11 F-l No 346 Pei-Da Road Hsin-Chu City 300 Taiwan Republic of China Telephone 886-3-523-8490 Facsimile 886-3-523-8503

THAILAND BECTHAI BANGKOK EQUIPMENT amp CHEMICAL CO Ltd

300 Phaholyothin Rd Phayathai Bangkok 10400 Thailand Telephone 66-2-615-2929 Facsimile 66-2-615-23502351

THE NETHERLANDS JEOL (EUROPE) Bv Ureweg 4 NL-2153 PH Nieuw-Vennep The Nelherlands Telephone 31-252-623500 Facsimile 31-252-623501

TURKEY TEKSERAS Kayisdagi )nonu MahKartal Cad No553 34755 Atasehir Istanbul Turkey Telephone 90-216-5736470 Facsimile 90-216-5736475

UAE MRS Group Dubai POBox 171612 Rashid Abdulla AI Noami Building Suite No 306 Damascus Street AI Qusais-3 Dubai UAE Telephone 971-4-2581141 Facsimile 971-4-2581151

JEOLGulf

POBox 171612 bull Rashid Abdulla AI Noami Building Suite No 306 Damascus Street AI Qusais-3 Dubai UAE Telephone 971-553964219(mobile)

USA JEOL USA INC 11 Dearborn Road Peabody MA 01960 USA Telephone 1-978-535-5900 Facsimile 1-978-536-22052206

JEOL USA INC WEST OFFICE

~~s~~~~~rigAe9~5t~~1 1 0 Telephone 1-925-737-1740 Facsimile 1-925-737-1749

VENEZUELA GOMSA Service and Supply CA

Urbanizacion Montalban JlI - Resldenclas Don Andres - Piso 7 - Apartomento 74 Avenida 3 entre calles 7 y 6 Montalban Caracas Venezuela Telephone 58-212-443-4342 Facsimile 58-212-443-4342

VTETNAM TECHNICAL MATERIALS AND RESOURCES IMPORT-EXPORT JOINT STOCK COMPANY(REXCO) Hanoi Branch

No 13-Lot 12 Trung Yen Trung Hoa Street Cau Giay Dist HanOi Vietnam Telephone 84-4-562-051617562-0535 Facsimile 84-4-853-2511

No 0205B389C Printed in Japan Kp

Page 17: Introduction - Главное управление науки БГУresearch.bsu.by/wp-content/uploads/2015/06/JEOL_Product...Scanning Electron Microscope The JSM-6610 is a high-performance

Industrial Equipm nt for thin-filnl formation and nlatel ial processing

I bull

Electron Beam Source High-power Electron Beam Source

BS-60060EBS EBG-102UB6S

Electron beam sources for vacuum evaporation of metal and metal-oxide thin-films

We offer a wide variety of electron beam sources and crucibles They have features of

excellent beam spot and energy density and high-speed sweeping

1 PGBS 80020CPPS Plasma Source

BS-80011 BPG (6kW) BS-8002OCPPS (3kW)

Plasma Sources are installed in a vacuum chamber and generate high-density plasma

Used as Ion Plating (Plasma Assisted Deposition) and it is possible to improve film

properties for optilcal thin films protective films and function films Because highshy

density plasma can be generated in a mass space high-rate deposition to a large area

is possible

I RF Induction Plasma System

JEBG-3000UB(300kW) JEBG-1 OOOUB(1 OOkW)

High-power electron beam sources for vacuum evaporation of metal and metal-oxide

for wide plastic films or large glass plates that are continuously fed And they can also

be used for vacuum melting of high-melting point metals

raes

RF Generator

t shy - - - --- - - --- -

0-~ 0 bull bullbull - -

RF-12030 (3kW) RF-56000 (Controller)

13 56MHz radio-frequency power supplies for plasma generation and used for

sputtering CVD etching and ion-plating We offer 750W to 6kW generators and

matching networks

DR Powder Feeder

Thermal plasma around 10000degC (15000deg F) by RF inductive coupling This thermal Fine powder feeder that can feed 01 to 100 11m size fine powder continuously with

plasma is used for nano powder synthesis fine powder spheroidization thick film carrier gas We offer optional feeding rate controller and large capacity hopper

deposition multi composite membrane synthesis CVD and harmful gas

decomposition

18 I Produci Guide

---

Biochemical Analyzers

I JCA-BM series Clinical Chemistry Analyzer BioMajesty Series

JEOLs micro volume technology and unique sample pre-dilution mechanism realizes

high throughput chemistry analysis with reduced sample and reagent volume

More than 4000 systems have been placed in clinical laboratories allover the world

JCA-BM6050

I JCA-BMBOOO series Ultra High Throughput Clinical Chemistry Analyzer

4 4

JCA-BMB060 egt

JCA-BMSOOO series offer ultra high throughput chemistry analysis up to 9000 testsl

hour

The pre-dilution unit one of the BioMajesty family features also continues the strong

tradition in these series with interconnected multiple analysis modules the key factors

that accomplish brilliant high throughput as well as downtime reduction with back-up

capability

I JCA-BM6070 High Throughput High Performance Clinical Chemistry An alyzer

I I I

A Clinical chemistry analyzer with incomparable speed and accuracy which achieves

high throughput of 2400 testslhour (includ ing ISE) The incorporated compact

workstation and user-friendly Interface with excellent operability leads the new trend of

the laboratory testing

BioMajesty Series lCA-BM 6010 lCA-BM 6050

lCA-8M 6070 leA-BM 91 30

lCA-BM 8000 Series

bull This product is distributed outside Japan by Siemens Heatthcare Diagnostics under the ADVtAreg brand name

I JCA-BM601 OC Compact amp High Performance Clinical Chemistry Analyzer

-~-I -

1lIIIIIIilllllllllJllnlIlII Ii I JCA-BM6010C is a compact but efficient automatic analyzer that maintains the basic

concept of BioMajesty series while achieving the excellent capability of microanalysis

with sample volume as small as 1 J1L

BM6010C also offers fully automated HbA1 c analysis with on-board hemolysis

(optional) Simultaneous measurement of Glucose and HbA1c improves laboratory

workflow

Product Guid e I 19

S~~MCEAII Certain products in this brochure are controlled under the Foreign 0J 0014007 -v- ~ Exchange and Foreign Trade Law of Japan in compliance with $ ~~~ international security export control JEOL Ltd must provide the~2 m) IIlt Japanese Government with End-users Statement of Assurancel A MGMT SYS

AvA ~ m and End-use Certificate in order to obtain the export license - tiJ needed for export from Japan If the product to be exported is in this category the end user will be asked to fill in these certificate formsdEOLIS09001 amp150 14001CenrfiCltlled

httpwwwjeolcomdEOL JEOL Ltd 1-2 Musashino 3-chome Akishima Tokyo 196-8558 Japan Sales Division Telephone+81-42-528-3381 Facsimile+81-42-528-3386

ARGENTINA COASIN SAClyF Virrey del Pino 4071 1430 Buenos Aires Argentina Telephone 54-11-4552-3185 Facsimile 54-11-4555-3321

AUSTRALIA amp NEW ZEALAND JEOL(AUSTRALASJA) PtyUd Suite 1 L2 18 Aquatic Drive - Frenchs Foresl NSW 2086 Australia Telephone 61-2-9451-3855 Facsimile 61-2-9451-3822

AUSTRIA JEOL (GERMANY) GmbH Oskar-Von-Miller-Strasse 1 a 85386 Eching Gennany Telephone 49-8165-77346 Facsimile 49-8165-77512

BANGLADESH AQ CHOWDHURY SCIENCE amp SYNERGY PVT LTD House No1 2 Road No 5A Sector No 11 Uttara Dhaka - 1230 Bangladesh Telephone 880-2-9980790 8953450 8953501 Facsimile 880-2-8854428

BELGIUM JEOL (EUROPE) BV Planet ll Gebouw B Leuvensesteenweg 542 B-1930 Zaventem Belgium Telephone 32-2-720-0560 Facsimile 32-2-720-6134

BRAZIL JEOL Brasillnstrument09 Cienlilicos Llda

Av Jabaquara 2958-50 andar-cj 52 04046-500 Sao Paulo SP Brazil Telephone 55-11-5070 4000 Facsimile 55-11-5070 4010

CANADA JEOL CANADA INC 3275 Premier Rue 8 SI-Hubert Quebec J3Y 8Y6 Canada Telephone 1-450-676-8776 Facsimile 1-450-676-6694

CHILE ARQUIMED INNOVAnON

Arturo Pmt 828Santiago Chile Telephone 56-2-634-6266 Facsimile 56-2-634-4633

CHINA JEOL(BEIJING) CO LTD Room Bl0l0l110 Wantong New Wond Plaza No2 Fuchengmenwai Street XIcheng District Beijing 100037 PRChina Telephone 86-10-6804-6321 Facsimile 86-10-6804-6324

JEOL (BEIJING) CO LTD SHANGHAI BRANCH

Room 15051506 Nol300Xi Kang Road Jing an Dis Shanghai 200040 China Telephone 86-21-6248-4868448745374404 Facsimile 86-21-6248-4075

JEOL (BEIJING) CO LTD GUANG ZHOU BRANCH

N1601 World Trade Center Building 371-375 Huan Shi Road East Guang Zhou Guangdong Prov 510095 PRChina Telephone 86-20-8778-7848 Facsimile 86-20-8778-4268

JEOL (BEIJING) CO LTD WUHAN BRANCH

Room A2117 Zhongshang Plaza Office Bldg NO7 Zhongnan Road Wuhan Hubei 430071 PRChina Telephone 86-27-8713-2567 Facsimile 86-27-8713-2567

JEOL LTD (BEIJING) CO LTD CHENGDU BRANCH 1807A Zonglu Building NO 35 Zhongfu Road Chengdu Sichuan 610016 PR China Telephone 86-28-86622554 Facsimile 86-28-86622564

EGYPT JEOL SERIVCE BUREAU

3rd Fl Nile Center Bldg Nawal Slree Dokkl (Cairo) Egypt Telephone 20-2-3335-7220 Facsimile 20-2-3338-4186

FRANCE JEOL (EUROPE) SAS Espace Claude Monet 1 Allee de Giverny 78290 Crolssy-sur-Seine France Telephone 33-13015-3737 Facsimile 33-13015-3747

GERMANY JEOL (GERMANY) GmbH Oskar-Von-Miller-Strasse 1 a 85386 Eching Gennany Telephone 49-8165-77346 Facsimile 49-8165-77512

GREAT BRITAIN amp IRELAND JEOL (UK) LTD JEOL House Silver Court Watchmeaci Welwyn Garden City Herts AL71LT UK Telephone 44-1707 -377117 FaCSimile 44-1707-373254

GREECE N ASTERIADIS SA

56-58S Trikoupl Str PO Box 26140 GR-10022 Athens Greece Telephone 30-1-823-5383 Facsimile 30-1-823-9567

HONG KONG FARMING LTD

Unit No1 009 1 OF Prosperity Milennia Plaza 663 Kings Road North Point Hong Kong Telephone 852-2815-7299 Facsimile 852-2581-4635

INDIA JEQL INDIA Pvt Ltd

Elegance Tower Level 2 2128 Old Mathura Road Jasola Business District Centre Near Apollo Hospital Jasola New Delhi 110025 India Telephone 91-11-6472-2578 Facsimile 91-11-4060-1235

BLUE STAR LTD (HQ Mumbaij

Analyticallnstrments Department Sahas 41412 Veer Savarkar Marg Prabhadery Mumbai 400 025 India Telephone 91-22-6666-4000 Facsimile 91-22-6666-4001

BLUE STAR LTD (DelhQ Analytical Instruments Department E-4412 Okhla Industrial Area Phase-II New Delhi 110 020 India Telephone 91-11-4149-4000 Facsimile 91-11-4149-4005

BLUE STAR LTD (Calcutta)

Analylicallnstruments Department 7 Hare Street Calcutta 700 001 India Telephone 91-33-2213-4133 Facsimile 91 -33-2213-4102

BLUE STAR LTD (ChennaO Analytical Instruments Department No 46 Garuda Building Cathedral Road Chennai 600 086 India Telephone 91-44-4244-4000 Facsimile 91-44-4244-4190

INDONESIA PT TEKNOLABindo Penta Perkasa Komplek Gading Bukillndah Blok lIll JI Bukfl Gading Raya Kelapa Gading Pennai Jakarta 14240 Indonesia Telephone 62-21-458470575859 Facsimile 62-21-45842729

ITALY JEOL 0TALIA) SpA Centro Direzionale Green Office Via dei Tulipani 1 20090 Pieve Emanuele (MI) Italy Telephone 39-02-9041431 Facsimila 39-02-90414343

KOREA JEOL KOREA LTD

Dongwoo Bldg 7F 1443 Yangjae Daero Gangdong-Gu Seoul 134-010 Korea Telephone 82-2-511-5501 Facsimile 82-2-511-2635

KUWAIT Ashraf amp CO Ltd WLL PO Box 3555 Safat 13036 Kuwait Telephone 965-1805151 Facsimile 965-24335373

MALAYSIA JEOL(MALAYSIA) SDNBHD(3S9011-M)

205 Block A Mezzanine Floor Kelana Business Center 97 Jalan SS 72 Kelana Jaya 47301 Petaling Jaya Selangor Malaysia Telephone 60-3-7492-7722 Facsimile 60-3-7492-7723

MEXICO JEOL DE MEXICO SA DE CV

Arkansas 11 Piso 2 Colonia Napoles Delegacion Benito Juarez CP 03810 Mexico DF Mexico Telephone 52-5-55-211-4511 Facsimile 52-5-55-211-0720

PAKISTAN (KarachI) ANALYTICAL MEASURING SYSTEM (pvn LTD(AMS LTD)

14-C Main Sehar Commercia) Avenue Lane 4 Khayaban-e-Sehar DHA-VII Karachimiddot75500 Pakinstan Telephone 92-21-353455813534074735346057-8 Facsimile 92-21-35345582

PANAMA PROMED SA Parque Industrial Costa del Este Urbanizacion Costa del Este Apartado 0816-01755 Panama Panama Telephone 507-303-3100 FaCSimile 507-303-3115

PHILIPPINES PHILAB INDUSTRIES INC

7487 Bagtikan Street SAY Makati 1203 Metro Manila Phillip pines Telephone 63-2-896-7218 Facsimile 63-2-897-7732

PORTUGAL Izasa Portugal Lda A do Proletariado 1 2790-138 CARNAXIDE Portugal Telephone 351-21-424-73-00 Facsimile 351-21-418-60-20

RUSSIA JEOL (RUS) LLC Krasnoproletarskaya Street 16 Bid 2 127473 Moscow Russian Federation Telephone 7-495-748-7791rr792 Facsimile 7-495-748-7793

SAUDI ARABIA ABDULREHMAN ALGOSAIBI GTC (Riyadh)

King Abdulaziz Avenue PO Box 215 Riyadh 11411 Saudi Arabia Telephone 966-1-479-3000 Facsimile 966-1-477-1374

SCANDINAVIA SWEDEN JEOL (Skandinaviska)AB

Hammarbacken 6A Box 716191 27 Sollentuna Sweden Telephone 46-8-28-2800 Facsimile 46-8-29-1647

SERVICE amp INFORMATION OFFICE NORWAY JEQL (Skandinaviska)AB

Lorenvangen 23 0580 Oslo NORWAY Telephone 47-2-2-64-7930 Facsimile 47-2-2-65-0619

FINLAND JEOL (Skandlnaviska)AB

Ylakaupinkuja 2 FIN-02360 Espoo Finland Telephone 358-9-8129-0350 Facsimile 358-9-8129-0351

SINGAPORE JEOLASIA PTE LTD

2 Corporation Road 1t01-12 Corporation Place Singapore 618494 Telephone 65-6565-9989 Facsimile 65-6565-7552

SOUTH AFRICA ADI Scientific (Pty) Ltd

370 Angus Crescent Northlands Business Park 29 Newmarket Road

~~=~g~~~2~~1nt~~2_~~~bIlC of South Africa

Facsimile 27-11 -462-1466

SPAIN IZASA SA

Argoneses 13 28100 Alcobendas (poligono IndustriaQ Madrid Spain Te~phone 34-91-663-0500 Facsimile 34-91-663-0545

SWITZERLAND JEOL (GERMANY) GmbH Oskar-Von-Miller Strasse 1 85386 Eching Germany Telephone 49-8165-77346 Facsimile 49-8165-77512

TAIWAN For EO ProQucts JIE DONG CO LTD 7F 112 Chung Hsiao East Road Section 1 Taipei Taiwan 10023 Republic of China Telephone 886-2-2395-2978 Facsimile 886-2~2322-4655

For Mass Spectrometer Products Mass Solutions Technology Co Ltd

5F No79 Sec 1 Xintai 5th Rd Xlzhi Dis New Taipei City 221 Taiwan Republic of China Telephone 886-2-2698-9511 Facsimile 886-2-2698-9512

For Semiconductor Products JEOL TAIWAN SEMICONDUCTORS LTD

11 F-l No 346 Pei-Da Road Hsin-Chu City 300 Taiwan Republic of China Telephone 886-3-523-8490 Facsimile 886-3-523-8503

THAILAND BECTHAI BANGKOK EQUIPMENT amp CHEMICAL CO Ltd

300 Phaholyothin Rd Phayathai Bangkok 10400 Thailand Telephone 66-2-615-2929 Facsimile 66-2-615-23502351

THE NETHERLANDS JEOL (EUROPE) Bv Ureweg 4 NL-2153 PH Nieuw-Vennep The Nelherlands Telephone 31-252-623500 Facsimile 31-252-623501

TURKEY TEKSERAS Kayisdagi )nonu MahKartal Cad No553 34755 Atasehir Istanbul Turkey Telephone 90-216-5736470 Facsimile 90-216-5736475

UAE MRS Group Dubai POBox 171612 Rashid Abdulla AI Noami Building Suite No 306 Damascus Street AI Qusais-3 Dubai UAE Telephone 971-4-2581141 Facsimile 971-4-2581151

JEOLGulf

POBox 171612 bull Rashid Abdulla AI Noami Building Suite No 306 Damascus Street AI Qusais-3 Dubai UAE Telephone 971-553964219(mobile)

USA JEOL USA INC 11 Dearborn Road Peabody MA 01960 USA Telephone 1-978-535-5900 Facsimile 1-978-536-22052206

JEOL USA INC WEST OFFICE

~~s~~~~~rigAe9~5t~~1 1 0 Telephone 1-925-737-1740 Facsimile 1-925-737-1749

VENEZUELA GOMSA Service and Supply CA

Urbanizacion Montalban JlI - Resldenclas Don Andres - Piso 7 - Apartomento 74 Avenida 3 entre calles 7 y 6 Montalban Caracas Venezuela Telephone 58-212-443-4342 Facsimile 58-212-443-4342

VTETNAM TECHNICAL MATERIALS AND RESOURCES IMPORT-EXPORT JOINT STOCK COMPANY(REXCO) Hanoi Branch

No 13-Lot 12 Trung Yen Trung Hoa Street Cau Giay Dist HanOi Vietnam Telephone 84-4-562-051617562-0535 Facsimile 84-4-853-2511

No 0205B389C Printed in Japan Kp

Page 18: Introduction - Главное управление науки БГУresearch.bsu.by/wp-content/uploads/2015/06/JEOL_Product...Scanning Electron Microscope The JSM-6610 is a high-performance

---

Biochemical Analyzers

I JCA-BM series Clinical Chemistry Analyzer BioMajesty Series

JEOLs micro volume technology and unique sample pre-dilution mechanism realizes

high throughput chemistry analysis with reduced sample and reagent volume

More than 4000 systems have been placed in clinical laboratories allover the world

JCA-BM6050

I JCA-BMBOOO series Ultra High Throughput Clinical Chemistry Analyzer

4 4

JCA-BMB060 egt

JCA-BMSOOO series offer ultra high throughput chemistry analysis up to 9000 testsl

hour

The pre-dilution unit one of the BioMajesty family features also continues the strong

tradition in these series with interconnected multiple analysis modules the key factors

that accomplish brilliant high throughput as well as downtime reduction with back-up

capability

I JCA-BM6070 High Throughput High Performance Clinical Chemistry An alyzer

I I I

A Clinical chemistry analyzer with incomparable speed and accuracy which achieves

high throughput of 2400 testslhour (includ ing ISE) The incorporated compact

workstation and user-friendly Interface with excellent operability leads the new trend of

the laboratory testing

BioMajesty Series lCA-BM 6010 lCA-BM 6050

lCA-8M 6070 leA-BM 91 30

lCA-BM 8000 Series

bull This product is distributed outside Japan by Siemens Heatthcare Diagnostics under the ADVtAreg brand name

I JCA-BM601 OC Compact amp High Performance Clinical Chemistry Analyzer

-~-I -

1lIIIIIIilllllllllJllnlIlII Ii I JCA-BM6010C is a compact but efficient automatic analyzer that maintains the basic

concept of BioMajesty series while achieving the excellent capability of microanalysis

with sample volume as small as 1 J1L

BM6010C also offers fully automated HbA1 c analysis with on-board hemolysis

(optional) Simultaneous measurement of Glucose and HbA1c improves laboratory

workflow

Product Guid e I 19

S~~MCEAII Certain products in this brochure are controlled under the Foreign 0J 0014007 -v- ~ Exchange and Foreign Trade Law of Japan in compliance with $ ~~~ international security export control JEOL Ltd must provide the~2 m) IIlt Japanese Government with End-users Statement of Assurancel A MGMT SYS

AvA ~ m and End-use Certificate in order to obtain the export license - tiJ needed for export from Japan If the product to be exported is in this category the end user will be asked to fill in these certificate formsdEOLIS09001 amp150 14001CenrfiCltlled

httpwwwjeolcomdEOL JEOL Ltd 1-2 Musashino 3-chome Akishima Tokyo 196-8558 Japan Sales Division Telephone+81-42-528-3381 Facsimile+81-42-528-3386

ARGENTINA COASIN SAClyF Virrey del Pino 4071 1430 Buenos Aires Argentina Telephone 54-11-4552-3185 Facsimile 54-11-4555-3321

AUSTRALIA amp NEW ZEALAND JEOL(AUSTRALASJA) PtyUd Suite 1 L2 18 Aquatic Drive - Frenchs Foresl NSW 2086 Australia Telephone 61-2-9451-3855 Facsimile 61-2-9451-3822

AUSTRIA JEOL (GERMANY) GmbH Oskar-Von-Miller-Strasse 1 a 85386 Eching Gennany Telephone 49-8165-77346 Facsimile 49-8165-77512

BANGLADESH AQ CHOWDHURY SCIENCE amp SYNERGY PVT LTD House No1 2 Road No 5A Sector No 11 Uttara Dhaka - 1230 Bangladesh Telephone 880-2-9980790 8953450 8953501 Facsimile 880-2-8854428

BELGIUM JEOL (EUROPE) BV Planet ll Gebouw B Leuvensesteenweg 542 B-1930 Zaventem Belgium Telephone 32-2-720-0560 Facsimile 32-2-720-6134

BRAZIL JEOL Brasillnstrument09 Cienlilicos Llda

Av Jabaquara 2958-50 andar-cj 52 04046-500 Sao Paulo SP Brazil Telephone 55-11-5070 4000 Facsimile 55-11-5070 4010

CANADA JEOL CANADA INC 3275 Premier Rue 8 SI-Hubert Quebec J3Y 8Y6 Canada Telephone 1-450-676-8776 Facsimile 1-450-676-6694

CHILE ARQUIMED INNOVAnON

Arturo Pmt 828Santiago Chile Telephone 56-2-634-6266 Facsimile 56-2-634-4633

CHINA JEOL(BEIJING) CO LTD Room Bl0l0l110 Wantong New Wond Plaza No2 Fuchengmenwai Street XIcheng District Beijing 100037 PRChina Telephone 86-10-6804-6321 Facsimile 86-10-6804-6324

JEOL (BEIJING) CO LTD SHANGHAI BRANCH

Room 15051506 Nol300Xi Kang Road Jing an Dis Shanghai 200040 China Telephone 86-21-6248-4868448745374404 Facsimile 86-21-6248-4075

JEOL (BEIJING) CO LTD GUANG ZHOU BRANCH

N1601 World Trade Center Building 371-375 Huan Shi Road East Guang Zhou Guangdong Prov 510095 PRChina Telephone 86-20-8778-7848 Facsimile 86-20-8778-4268

JEOL (BEIJING) CO LTD WUHAN BRANCH

Room A2117 Zhongshang Plaza Office Bldg NO7 Zhongnan Road Wuhan Hubei 430071 PRChina Telephone 86-27-8713-2567 Facsimile 86-27-8713-2567

JEOL LTD (BEIJING) CO LTD CHENGDU BRANCH 1807A Zonglu Building NO 35 Zhongfu Road Chengdu Sichuan 610016 PR China Telephone 86-28-86622554 Facsimile 86-28-86622564

EGYPT JEOL SERIVCE BUREAU

3rd Fl Nile Center Bldg Nawal Slree Dokkl (Cairo) Egypt Telephone 20-2-3335-7220 Facsimile 20-2-3338-4186

FRANCE JEOL (EUROPE) SAS Espace Claude Monet 1 Allee de Giverny 78290 Crolssy-sur-Seine France Telephone 33-13015-3737 Facsimile 33-13015-3747

GERMANY JEOL (GERMANY) GmbH Oskar-Von-Miller-Strasse 1 a 85386 Eching Gennany Telephone 49-8165-77346 Facsimile 49-8165-77512

GREAT BRITAIN amp IRELAND JEOL (UK) LTD JEOL House Silver Court Watchmeaci Welwyn Garden City Herts AL71LT UK Telephone 44-1707 -377117 FaCSimile 44-1707-373254

GREECE N ASTERIADIS SA

56-58S Trikoupl Str PO Box 26140 GR-10022 Athens Greece Telephone 30-1-823-5383 Facsimile 30-1-823-9567

HONG KONG FARMING LTD

Unit No1 009 1 OF Prosperity Milennia Plaza 663 Kings Road North Point Hong Kong Telephone 852-2815-7299 Facsimile 852-2581-4635

INDIA JEQL INDIA Pvt Ltd

Elegance Tower Level 2 2128 Old Mathura Road Jasola Business District Centre Near Apollo Hospital Jasola New Delhi 110025 India Telephone 91-11-6472-2578 Facsimile 91-11-4060-1235

BLUE STAR LTD (HQ Mumbaij

Analyticallnstrments Department Sahas 41412 Veer Savarkar Marg Prabhadery Mumbai 400 025 India Telephone 91-22-6666-4000 Facsimile 91-22-6666-4001

BLUE STAR LTD (DelhQ Analytical Instruments Department E-4412 Okhla Industrial Area Phase-II New Delhi 110 020 India Telephone 91-11-4149-4000 Facsimile 91-11-4149-4005

BLUE STAR LTD (Calcutta)

Analylicallnstruments Department 7 Hare Street Calcutta 700 001 India Telephone 91-33-2213-4133 Facsimile 91 -33-2213-4102

BLUE STAR LTD (ChennaO Analytical Instruments Department No 46 Garuda Building Cathedral Road Chennai 600 086 India Telephone 91-44-4244-4000 Facsimile 91-44-4244-4190

INDONESIA PT TEKNOLABindo Penta Perkasa Komplek Gading Bukillndah Blok lIll JI Bukfl Gading Raya Kelapa Gading Pennai Jakarta 14240 Indonesia Telephone 62-21-458470575859 Facsimile 62-21-45842729

ITALY JEOL 0TALIA) SpA Centro Direzionale Green Office Via dei Tulipani 1 20090 Pieve Emanuele (MI) Italy Telephone 39-02-9041431 Facsimila 39-02-90414343

KOREA JEOL KOREA LTD

Dongwoo Bldg 7F 1443 Yangjae Daero Gangdong-Gu Seoul 134-010 Korea Telephone 82-2-511-5501 Facsimile 82-2-511-2635

KUWAIT Ashraf amp CO Ltd WLL PO Box 3555 Safat 13036 Kuwait Telephone 965-1805151 Facsimile 965-24335373

MALAYSIA JEOL(MALAYSIA) SDNBHD(3S9011-M)

205 Block A Mezzanine Floor Kelana Business Center 97 Jalan SS 72 Kelana Jaya 47301 Petaling Jaya Selangor Malaysia Telephone 60-3-7492-7722 Facsimile 60-3-7492-7723

MEXICO JEOL DE MEXICO SA DE CV

Arkansas 11 Piso 2 Colonia Napoles Delegacion Benito Juarez CP 03810 Mexico DF Mexico Telephone 52-5-55-211-4511 Facsimile 52-5-55-211-0720

PAKISTAN (KarachI) ANALYTICAL MEASURING SYSTEM (pvn LTD(AMS LTD)

14-C Main Sehar Commercia) Avenue Lane 4 Khayaban-e-Sehar DHA-VII Karachimiddot75500 Pakinstan Telephone 92-21-353455813534074735346057-8 Facsimile 92-21-35345582

PANAMA PROMED SA Parque Industrial Costa del Este Urbanizacion Costa del Este Apartado 0816-01755 Panama Panama Telephone 507-303-3100 FaCSimile 507-303-3115

PHILIPPINES PHILAB INDUSTRIES INC

7487 Bagtikan Street SAY Makati 1203 Metro Manila Phillip pines Telephone 63-2-896-7218 Facsimile 63-2-897-7732

PORTUGAL Izasa Portugal Lda A do Proletariado 1 2790-138 CARNAXIDE Portugal Telephone 351-21-424-73-00 Facsimile 351-21-418-60-20

RUSSIA JEOL (RUS) LLC Krasnoproletarskaya Street 16 Bid 2 127473 Moscow Russian Federation Telephone 7-495-748-7791rr792 Facsimile 7-495-748-7793

SAUDI ARABIA ABDULREHMAN ALGOSAIBI GTC (Riyadh)

King Abdulaziz Avenue PO Box 215 Riyadh 11411 Saudi Arabia Telephone 966-1-479-3000 Facsimile 966-1-477-1374

SCANDINAVIA SWEDEN JEOL (Skandinaviska)AB

Hammarbacken 6A Box 716191 27 Sollentuna Sweden Telephone 46-8-28-2800 Facsimile 46-8-29-1647

SERVICE amp INFORMATION OFFICE NORWAY JEQL (Skandinaviska)AB

Lorenvangen 23 0580 Oslo NORWAY Telephone 47-2-2-64-7930 Facsimile 47-2-2-65-0619

FINLAND JEOL (Skandlnaviska)AB

Ylakaupinkuja 2 FIN-02360 Espoo Finland Telephone 358-9-8129-0350 Facsimile 358-9-8129-0351

SINGAPORE JEOLASIA PTE LTD

2 Corporation Road 1t01-12 Corporation Place Singapore 618494 Telephone 65-6565-9989 Facsimile 65-6565-7552

SOUTH AFRICA ADI Scientific (Pty) Ltd

370 Angus Crescent Northlands Business Park 29 Newmarket Road

~~=~g~~~2~~1nt~~2_~~~bIlC of South Africa

Facsimile 27-11 -462-1466

SPAIN IZASA SA

Argoneses 13 28100 Alcobendas (poligono IndustriaQ Madrid Spain Te~phone 34-91-663-0500 Facsimile 34-91-663-0545

SWITZERLAND JEOL (GERMANY) GmbH Oskar-Von-Miller Strasse 1 85386 Eching Germany Telephone 49-8165-77346 Facsimile 49-8165-77512

TAIWAN For EO ProQucts JIE DONG CO LTD 7F 112 Chung Hsiao East Road Section 1 Taipei Taiwan 10023 Republic of China Telephone 886-2-2395-2978 Facsimile 886-2~2322-4655

For Mass Spectrometer Products Mass Solutions Technology Co Ltd

5F No79 Sec 1 Xintai 5th Rd Xlzhi Dis New Taipei City 221 Taiwan Republic of China Telephone 886-2-2698-9511 Facsimile 886-2-2698-9512

For Semiconductor Products JEOL TAIWAN SEMICONDUCTORS LTD

11 F-l No 346 Pei-Da Road Hsin-Chu City 300 Taiwan Republic of China Telephone 886-3-523-8490 Facsimile 886-3-523-8503

THAILAND BECTHAI BANGKOK EQUIPMENT amp CHEMICAL CO Ltd

300 Phaholyothin Rd Phayathai Bangkok 10400 Thailand Telephone 66-2-615-2929 Facsimile 66-2-615-23502351

THE NETHERLANDS JEOL (EUROPE) Bv Ureweg 4 NL-2153 PH Nieuw-Vennep The Nelherlands Telephone 31-252-623500 Facsimile 31-252-623501

TURKEY TEKSERAS Kayisdagi )nonu MahKartal Cad No553 34755 Atasehir Istanbul Turkey Telephone 90-216-5736470 Facsimile 90-216-5736475

UAE MRS Group Dubai POBox 171612 Rashid Abdulla AI Noami Building Suite No 306 Damascus Street AI Qusais-3 Dubai UAE Telephone 971-4-2581141 Facsimile 971-4-2581151

JEOLGulf

POBox 171612 bull Rashid Abdulla AI Noami Building Suite No 306 Damascus Street AI Qusais-3 Dubai UAE Telephone 971-553964219(mobile)

USA JEOL USA INC 11 Dearborn Road Peabody MA 01960 USA Telephone 1-978-535-5900 Facsimile 1-978-536-22052206

JEOL USA INC WEST OFFICE

~~s~~~~~rigAe9~5t~~1 1 0 Telephone 1-925-737-1740 Facsimile 1-925-737-1749

VENEZUELA GOMSA Service and Supply CA

Urbanizacion Montalban JlI - Resldenclas Don Andres - Piso 7 - Apartomento 74 Avenida 3 entre calles 7 y 6 Montalban Caracas Venezuela Telephone 58-212-443-4342 Facsimile 58-212-443-4342

VTETNAM TECHNICAL MATERIALS AND RESOURCES IMPORT-EXPORT JOINT STOCK COMPANY(REXCO) Hanoi Branch

No 13-Lot 12 Trung Yen Trung Hoa Street Cau Giay Dist HanOi Vietnam Telephone 84-4-562-051617562-0535 Facsimile 84-4-853-2511

No 0205B389C Printed in Japan Kp

Page 19: Introduction - Главное управление науки БГУresearch.bsu.by/wp-content/uploads/2015/06/JEOL_Product...Scanning Electron Microscope The JSM-6610 is a high-performance

S~~MCEAII Certain products in this brochure are controlled under the Foreign 0J 0014007 -v- ~ Exchange and Foreign Trade Law of Japan in compliance with $ ~~~ international security export control JEOL Ltd must provide the~2 m) IIlt Japanese Government with End-users Statement of Assurancel A MGMT SYS

AvA ~ m and End-use Certificate in order to obtain the export license - tiJ needed for export from Japan If the product to be exported is in this category the end user will be asked to fill in these certificate formsdEOLIS09001 amp150 14001CenrfiCltlled

httpwwwjeolcomdEOL JEOL Ltd 1-2 Musashino 3-chome Akishima Tokyo 196-8558 Japan Sales Division Telephone+81-42-528-3381 Facsimile+81-42-528-3386

ARGENTINA COASIN SAClyF Virrey del Pino 4071 1430 Buenos Aires Argentina Telephone 54-11-4552-3185 Facsimile 54-11-4555-3321

AUSTRALIA amp NEW ZEALAND JEOL(AUSTRALASJA) PtyUd Suite 1 L2 18 Aquatic Drive - Frenchs Foresl NSW 2086 Australia Telephone 61-2-9451-3855 Facsimile 61-2-9451-3822

AUSTRIA JEOL (GERMANY) GmbH Oskar-Von-Miller-Strasse 1 a 85386 Eching Gennany Telephone 49-8165-77346 Facsimile 49-8165-77512

BANGLADESH AQ CHOWDHURY SCIENCE amp SYNERGY PVT LTD House No1 2 Road No 5A Sector No 11 Uttara Dhaka - 1230 Bangladesh Telephone 880-2-9980790 8953450 8953501 Facsimile 880-2-8854428

BELGIUM JEOL (EUROPE) BV Planet ll Gebouw B Leuvensesteenweg 542 B-1930 Zaventem Belgium Telephone 32-2-720-0560 Facsimile 32-2-720-6134

BRAZIL JEOL Brasillnstrument09 Cienlilicos Llda

Av Jabaquara 2958-50 andar-cj 52 04046-500 Sao Paulo SP Brazil Telephone 55-11-5070 4000 Facsimile 55-11-5070 4010

CANADA JEOL CANADA INC 3275 Premier Rue 8 SI-Hubert Quebec J3Y 8Y6 Canada Telephone 1-450-676-8776 Facsimile 1-450-676-6694

CHILE ARQUIMED INNOVAnON

Arturo Pmt 828Santiago Chile Telephone 56-2-634-6266 Facsimile 56-2-634-4633

CHINA JEOL(BEIJING) CO LTD Room Bl0l0l110 Wantong New Wond Plaza No2 Fuchengmenwai Street XIcheng District Beijing 100037 PRChina Telephone 86-10-6804-6321 Facsimile 86-10-6804-6324

JEOL (BEIJING) CO LTD SHANGHAI BRANCH

Room 15051506 Nol300Xi Kang Road Jing an Dis Shanghai 200040 China Telephone 86-21-6248-4868448745374404 Facsimile 86-21-6248-4075

JEOL (BEIJING) CO LTD GUANG ZHOU BRANCH

N1601 World Trade Center Building 371-375 Huan Shi Road East Guang Zhou Guangdong Prov 510095 PRChina Telephone 86-20-8778-7848 Facsimile 86-20-8778-4268

JEOL (BEIJING) CO LTD WUHAN BRANCH

Room A2117 Zhongshang Plaza Office Bldg NO7 Zhongnan Road Wuhan Hubei 430071 PRChina Telephone 86-27-8713-2567 Facsimile 86-27-8713-2567

JEOL LTD (BEIJING) CO LTD CHENGDU BRANCH 1807A Zonglu Building NO 35 Zhongfu Road Chengdu Sichuan 610016 PR China Telephone 86-28-86622554 Facsimile 86-28-86622564

EGYPT JEOL SERIVCE BUREAU

3rd Fl Nile Center Bldg Nawal Slree Dokkl (Cairo) Egypt Telephone 20-2-3335-7220 Facsimile 20-2-3338-4186

FRANCE JEOL (EUROPE) SAS Espace Claude Monet 1 Allee de Giverny 78290 Crolssy-sur-Seine France Telephone 33-13015-3737 Facsimile 33-13015-3747

GERMANY JEOL (GERMANY) GmbH Oskar-Von-Miller-Strasse 1 a 85386 Eching Gennany Telephone 49-8165-77346 Facsimile 49-8165-77512

GREAT BRITAIN amp IRELAND JEOL (UK) LTD JEOL House Silver Court Watchmeaci Welwyn Garden City Herts AL71LT UK Telephone 44-1707 -377117 FaCSimile 44-1707-373254

GREECE N ASTERIADIS SA

56-58S Trikoupl Str PO Box 26140 GR-10022 Athens Greece Telephone 30-1-823-5383 Facsimile 30-1-823-9567

HONG KONG FARMING LTD

Unit No1 009 1 OF Prosperity Milennia Plaza 663 Kings Road North Point Hong Kong Telephone 852-2815-7299 Facsimile 852-2581-4635

INDIA JEQL INDIA Pvt Ltd

Elegance Tower Level 2 2128 Old Mathura Road Jasola Business District Centre Near Apollo Hospital Jasola New Delhi 110025 India Telephone 91-11-6472-2578 Facsimile 91-11-4060-1235

BLUE STAR LTD (HQ Mumbaij

Analyticallnstrments Department Sahas 41412 Veer Savarkar Marg Prabhadery Mumbai 400 025 India Telephone 91-22-6666-4000 Facsimile 91-22-6666-4001

BLUE STAR LTD (DelhQ Analytical Instruments Department E-4412 Okhla Industrial Area Phase-II New Delhi 110 020 India Telephone 91-11-4149-4000 Facsimile 91-11-4149-4005

BLUE STAR LTD (Calcutta)

Analylicallnstruments Department 7 Hare Street Calcutta 700 001 India Telephone 91-33-2213-4133 Facsimile 91 -33-2213-4102

BLUE STAR LTD (ChennaO Analytical Instruments Department No 46 Garuda Building Cathedral Road Chennai 600 086 India Telephone 91-44-4244-4000 Facsimile 91-44-4244-4190

INDONESIA PT TEKNOLABindo Penta Perkasa Komplek Gading Bukillndah Blok lIll JI Bukfl Gading Raya Kelapa Gading Pennai Jakarta 14240 Indonesia Telephone 62-21-458470575859 Facsimile 62-21-45842729

ITALY JEOL 0TALIA) SpA Centro Direzionale Green Office Via dei Tulipani 1 20090 Pieve Emanuele (MI) Italy Telephone 39-02-9041431 Facsimila 39-02-90414343

KOREA JEOL KOREA LTD

Dongwoo Bldg 7F 1443 Yangjae Daero Gangdong-Gu Seoul 134-010 Korea Telephone 82-2-511-5501 Facsimile 82-2-511-2635

KUWAIT Ashraf amp CO Ltd WLL PO Box 3555 Safat 13036 Kuwait Telephone 965-1805151 Facsimile 965-24335373

MALAYSIA JEOL(MALAYSIA) SDNBHD(3S9011-M)

205 Block A Mezzanine Floor Kelana Business Center 97 Jalan SS 72 Kelana Jaya 47301 Petaling Jaya Selangor Malaysia Telephone 60-3-7492-7722 Facsimile 60-3-7492-7723

MEXICO JEOL DE MEXICO SA DE CV

Arkansas 11 Piso 2 Colonia Napoles Delegacion Benito Juarez CP 03810 Mexico DF Mexico Telephone 52-5-55-211-4511 Facsimile 52-5-55-211-0720

PAKISTAN (KarachI) ANALYTICAL MEASURING SYSTEM (pvn LTD(AMS LTD)

14-C Main Sehar Commercia) Avenue Lane 4 Khayaban-e-Sehar DHA-VII Karachimiddot75500 Pakinstan Telephone 92-21-353455813534074735346057-8 Facsimile 92-21-35345582

PANAMA PROMED SA Parque Industrial Costa del Este Urbanizacion Costa del Este Apartado 0816-01755 Panama Panama Telephone 507-303-3100 FaCSimile 507-303-3115

PHILIPPINES PHILAB INDUSTRIES INC

7487 Bagtikan Street SAY Makati 1203 Metro Manila Phillip pines Telephone 63-2-896-7218 Facsimile 63-2-897-7732

PORTUGAL Izasa Portugal Lda A do Proletariado 1 2790-138 CARNAXIDE Portugal Telephone 351-21-424-73-00 Facsimile 351-21-418-60-20

RUSSIA JEOL (RUS) LLC Krasnoproletarskaya Street 16 Bid 2 127473 Moscow Russian Federation Telephone 7-495-748-7791rr792 Facsimile 7-495-748-7793

SAUDI ARABIA ABDULREHMAN ALGOSAIBI GTC (Riyadh)

King Abdulaziz Avenue PO Box 215 Riyadh 11411 Saudi Arabia Telephone 966-1-479-3000 Facsimile 966-1-477-1374

SCANDINAVIA SWEDEN JEOL (Skandinaviska)AB

Hammarbacken 6A Box 716191 27 Sollentuna Sweden Telephone 46-8-28-2800 Facsimile 46-8-29-1647

SERVICE amp INFORMATION OFFICE NORWAY JEQL (Skandinaviska)AB

Lorenvangen 23 0580 Oslo NORWAY Telephone 47-2-2-64-7930 Facsimile 47-2-2-65-0619

FINLAND JEOL (Skandlnaviska)AB

Ylakaupinkuja 2 FIN-02360 Espoo Finland Telephone 358-9-8129-0350 Facsimile 358-9-8129-0351

SINGAPORE JEOLASIA PTE LTD

2 Corporation Road 1t01-12 Corporation Place Singapore 618494 Telephone 65-6565-9989 Facsimile 65-6565-7552

SOUTH AFRICA ADI Scientific (Pty) Ltd

370 Angus Crescent Northlands Business Park 29 Newmarket Road

~~=~g~~~2~~1nt~~2_~~~bIlC of South Africa

Facsimile 27-11 -462-1466

SPAIN IZASA SA

Argoneses 13 28100 Alcobendas (poligono IndustriaQ Madrid Spain Te~phone 34-91-663-0500 Facsimile 34-91-663-0545

SWITZERLAND JEOL (GERMANY) GmbH Oskar-Von-Miller Strasse 1 85386 Eching Germany Telephone 49-8165-77346 Facsimile 49-8165-77512

TAIWAN For EO ProQucts JIE DONG CO LTD 7F 112 Chung Hsiao East Road Section 1 Taipei Taiwan 10023 Republic of China Telephone 886-2-2395-2978 Facsimile 886-2~2322-4655

For Mass Spectrometer Products Mass Solutions Technology Co Ltd

5F No79 Sec 1 Xintai 5th Rd Xlzhi Dis New Taipei City 221 Taiwan Republic of China Telephone 886-2-2698-9511 Facsimile 886-2-2698-9512

For Semiconductor Products JEOL TAIWAN SEMICONDUCTORS LTD

11 F-l No 346 Pei-Da Road Hsin-Chu City 300 Taiwan Republic of China Telephone 886-3-523-8490 Facsimile 886-3-523-8503

THAILAND BECTHAI BANGKOK EQUIPMENT amp CHEMICAL CO Ltd

300 Phaholyothin Rd Phayathai Bangkok 10400 Thailand Telephone 66-2-615-2929 Facsimile 66-2-615-23502351

THE NETHERLANDS JEOL (EUROPE) Bv Ureweg 4 NL-2153 PH Nieuw-Vennep The Nelherlands Telephone 31-252-623500 Facsimile 31-252-623501

TURKEY TEKSERAS Kayisdagi )nonu MahKartal Cad No553 34755 Atasehir Istanbul Turkey Telephone 90-216-5736470 Facsimile 90-216-5736475

UAE MRS Group Dubai POBox 171612 Rashid Abdulla AI Noami Building Suite No 306 Damascus Street AI Qusais-3 Dubai UAE Telephone 971-4-2581141 Facsimile 971-4-2581151

JEOLGulf

POBox 171612 bull Rashid Abdulla AI Noami Building Suite No 306 Damascus Street AI Qusais-3 Dubai UAE Telephone 971-553964219(mobile)

USA JEOL USA INC 11 Dearborn Road Peabody MA 01960 USA Telephone 1-978-535-5900 Facsimile 1-978-536-22052206

JEOL USA INC WEST OFFICE

~~s~~~~~rigAe9~5t~~1 1 0 Telephone 1-925-737-1740 Facsimile 1-925-737-1749

VENEZUELA GOMSA Service and Supply CA

Urbanizacion Montalban JlI - Resldenclas Don Andres - Piso 7 - Apartomento 74 Avenida 3 entre calles 7 y 6 Montalban Caracas Venezuela Telephone 58-212-443-4342 Facsimile 58-212-443-4342

VTETNAM TECHNICAL MATERIALS AND RESOURCES IMPORT-EXPORT JOINT STOCK COMPANY(REXCO) Hanoi Branch

No 13-Lot 12 Trung Yen Trung Hoa Street Cau Giay Dist HanOi Vietnam Telephone 84-4-562-051617562-0535 Facsimile 84-4-853-2511

No 0205B389C Printed in Japan Kp