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    Understanding theFundamental Principlesof Vector Network Analysis

    Applica t ion Note 1287-1Table of Contents

    Page

    Introduction 2Measurements in

    Communications Systems 2Im porta nce of Vector

    Measurements 4The Ba sis of Incident a nd

    Reflected Power 5The Smith C hart 5P ower Tra nsfer Conditions 6Netw ork Ana lysis Termin ology 9Measuring Group Delay 11Network Cha racterizat ion 12

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    Measurements inCommunicationsSystems

    2

    Introduction Network an aly sis is the process by wh ich designers and ma nufa cturersmeasure t he electrical performa nce of th e components a nd circuits used in

    more complex systems. When t hese systems a re conveying signa ls w ith

    informat ion content, we a re most concerned wit h getting th e signal from

    one point t o another wit h ma ximum efficiency a nd minimum distortion.

    Vector netw ork ana lysis is a meth od of accurat ely cha ra cterizing such

    components by measur ing their effect on th e amplitude a nd pha se of

    swept-frequency an d sw ept-power test signa ls.

    In t his application note, the fundam enta l principles of vector netw ork

    an aly sis will be reviewed. The discussion includes the common para meters

    tha t can be measur ed, including the concept of scat tering para meters

    (S-parameters). RF fundamentals such as transmission lines and the

    Smit h chart will also be reviewed.

    Hew lett-P ackar d Company offers a wide range of both scala r an d vector

    netw ork ana lyzers for chara cterizing components from DC to 110 GH z.

    These instru ments a re ava ilable with a wide ra nge of options to simplifytesting in both labora tory a nd production environments.

    Linear behavior:input and output frequencies

    are the same (no additionalfrequencies created)

    output frequency onlyundergoes magnitude andphase change

    Time

    A

    to

    Frequencyf1

    Time

    Sin 360 * f * t

    Frequency

    Aphase shift =to* 360 * f

    1f

    DUT

    A * Sin 360 * f ( t t )

    Input Output

    Time

    Frequency

    Nonlinear behavior:output frequency may undergofrequency shift (e.g. with mixers)

    additional frequencies created(harmonics, intermodulation)

    f1

    Figure 1.Linear versusNonlinearBehavior

    In a ny communications system, t he effect of signa l distortion must be

    considered. While we generally think of the distortion caused by nonlinear

    effects (for example, when intermodulation products are produced from

    desired carrier signa ls), purely linear systems can also introduce signa l

    distortion. Linear sy stems can change the time wa veform of signa ls

    passing thr ough them by altering the a mplitude or phase relationships

    of the spectra l components tha t ma ke up the signa l.

    Lets examine t he difference between linear an d nonlinear beha vior

    more closely.

    Linear devices impose magnit ude and pha se cha nges on input signa ls

    (Figure 1). Any sinusoid appearing a t th e input will also appear a t th e

    output, and a t th e same frequency. No new signa ls are creat ed. Both active

    an d passive nonlinear devices can shift a n input signa l in frequency or

    add oth er frequency components, such as h ar monic and spurious signals.

    La rge input signa ls can dr ive normally linea r devices into compression or

    saturation, causing nonlinear operation.

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    3

    Frequency FrequencyFrequency

    Mag

    nitude

    Time

    LinearNetwork

    Time

    F(t) = sin wt + 1/3 sin 3wt + 1/5 sin 5wt

    For linear distortion-free tra nsmission, the a mplitude response of the

    device under test (DU T) must be flat a nd t he phase response must be

    linear over the desired ban dwidt h. As an example, consider a squa re-wa ve

    signal rich in high-frequency components passing th rough a ba ndpass filtertha t passes selected frequencies w ith li t t le a t tenuat ion w hile a t tenuat ing

    frequencies outside of the passba nd by var ying a mounts.

    Even if t he filter ha s linear pha se performan ce, the out-of-band

    components of the squar e wave will be at tenua ted, leaving a n output

    signal t ha t, in th is example, is more sinusoidal in n at ure (Figure 2).

    I f the sa me square-wa ve input s ignal is passed through a f i lter tha t only

    inverts the pha se of the third ha rmonic, but leaves the ha rmonic

    am plitudes the sam e, the output w ill be more impulse-like in na ture

    (Figure 3). While this is true for the example filter, in general, the output

    waveform will appear with arbitrary distortion, depending on the

    amplitude and phase nonlinearities.

    Frequency

    Magnitude

    LinearNetwork

    Frequency

    Frequency

    Time

    0

    360

    180

    Time

    F(t) = sin wt + 1/3 sin 3wt + 1/5 sin 5wt

    Figure 2.MagnitudeVariation withFrequency

    Figure 3.Phase Variationwith Frequency

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    4

    Nonlinear Networks

    Frequency Frequency

    TimeTime

    Saturation, crossover, intermodulation, and othernonlinear effects can cause signal distortion

    Nonlinear devices also introduce distortion (Figure 4). For example, if an

    am plifier is overdriven, th e output signa l clips because the a mplifier is

    sat ura ted. The output signal is no longer a pure sinusoid, an d ha rmonics

    ar e present a t mu ltiples of the input frequency. Pa ssive devices ma y a lso

    exhibit n onlinear behavior at high power levels, a good exam ple of wh ich is

    an L -C filter tha t uses inductors with m agn etic cores. Magn etic ma terials

    often exhibit hyst eresis effects tha t a re highly nonlinear.

    Efficient t ra nsfer of power is a nother funda menta l concern in

    commun ications syst ems. In order t o efficiently convey, tra nsmit or

    receive RF power, devices such as t ra nsmissions lines, antenna s a nd

    am plifiers must present the proper impedance ma tch to t he signal source.Impedance mismatches occur when the real and imaginary parts of input

    an d output impedan ces a re not ideal betw een t wo connecting devices.

    Measuring both ma gnitude an d phase of components is importan t for

    severa l reasons. First, both measurements a re required to fully

    chara cterize a linea r netw ork and ensure distortion-free tra nsmission.

    To design efficient ma tchin g netw orks, complex impedan ce must be

    measured. Engineers developing models for computer-aided-engineering

    (CAE) circuit simula tion progra ms require ma gnitude an d phase dat a for

    accurat e models.

    In addition, time-domain characterization requires magnitude and phaseinformat ion in order t o perform an inverse-Fourier tra nsform. Vector

    error correction, w hich improves measur ement a ccura cy by removing the

    effects of inherent measur ement-system errors, requires both ma gnitude

    an d phase dat a t o build an effective error model. P ha se-measur ement

    capability is very importa nt even for scalar m easurements such as retur n

    loss, in order to a chieve a high level of accura cy (see Apply ing Err or

    Correct ion to N etwork Anal yzer M easurements, H ewlet t-Pa ckard

    Applicat ion N ote 1287-3).

    Figure 4.NonlinearInducedDistortion

    Importance ofVector Measurements

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    Power TransferConditions

    A perfectly m at ched condition mu st exist a t a connection betw een two

    devices for ma ximum power tra nsfer into a load, given a source resista nce

    of RS an d a load resista nce of RL. This condition occurs w hen R L = RS ,

    an d is true w hether th e stimulus is a D C volta ge source or a source of

    RF sine waves (Figure 7).

    When t he source impedan ce is not purely resistive, ma ximum power

    tra nsfer occurs wh en the load impedan ce is equa l to the complex conjugate

    of the source impedance. This condition is met by reversing the sign of the

    ima ginar y part of the impedance. For example, if RS = 0.6 + j 0.3, then

    th e complex conjuga te is R S* = 0.6 j 0.3.

    The need for efficient power t ra nsfer is one of the ma in rea sons for t he

    use of tra nsmission lines at higher frequencies. At very low frequ encies

    (wit h much lar ger wa velength s), a simple wire is adequa te for conducting

    power. The resista nce of th e wire is r elatively low a nd ha s litt le effect on

    low-frequency signals. The volta ge and current ar e the sam e no matt er

    wh ere a mea surement is made on the wire.

    6

    90o

    0o

    180o+.2

    .4.6

    .8

    1.0

    90o

    0

    0 +R

    +jX

    jX

    Smith chart mapsrectilinear impedanceplane onto polar plane

    Rectilinear impedanceplane

    Polar plane

    Z = ZoL= 0

    Constant X

    Constant R

    Z =L= 0O1

    Smith chart

    (open)

    LZ = 0

    = 180O1

    (short)

    Figure 6.Smith ChartReview

    Sin ce there is a one-to-one correspondence betw een complex impeda nce

    and reflection coefficient, the positive real half of the complex impedance

    plane can be ma pped onto the polar display. The result is the Smit h char t.

    All values of reactan ce and a ll positive values of resistance from 0 toinfinity fa ll with in th e outer circle of the Smith chart (Figure 6).

    On th e Smith chart , loci of consta nt r esistance appear a s circles, wh ile loci

    of consta nt reacta nce appear a s arcs . Impedances on the S mith chart are

    alw ay s norma lized to the cha ra cteristic impedance of the component or

    system of interest, usually 50 ohms for RF a nd microwa ve systems and

    75 ohms for broadcast an d cable-television systems. A perfect termina tion

    appears in th e center of the Smith cha rt.

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    7

    0 1 2 3 4 5 6 7 8 9 100

    0.2

    0.4

    0.6

    0.8

    1

    1.2

    LoadPower(normalized)

    RL/ RS

    RS

    RL

    Maximum power is transferredwhen RL= RS

    For complex impedances,maximum power transfer occurswhen ZL= ZS*(conjugate match)

    Zs= R + jX

    ZL= Zs*= R jX

    Figure 7.Power Transfer

    At higher frequencies, wa velengths a re compar able to or sma ller than

    the length of the conductors in a high-frequency circuit, a nd power

    tra nsmission can be thought of in terms of tra veling waves. When the

    tra nsmission line is termina ted in its cha ra cteristic impedance, ma ximumpower is tra nsferred to the load. When the termin at ion is not equa l to the

    chara cteristic impedance, tha t par t of the signal th at is not absorbed by

    the load is reflected back to the source.

    If a tr an smission line is termina ted in its cha ra cteristic impedance, no

    reflected signal occurs since all of the tr an smitt ed power is a bsorbed by th e

    load (Figure 8). Looking a t t he envelope of th e RF signa l versus dista nce

    along the tra nsmission line shows no standing w aves becau se without

    reflections, energy flows in only one direction.

    For reflection, a transmission line terminated in Zobehaves like an infinitely long transmission line

    Zs= Zo

    Zo

    Vrefl= 0 (all the incidentpower is absorbed in the load)

    Vinc

    Zo= characteristic impedanceof transmission line

    Figure 8.TransmissionLine Terminatedwith Zo

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    When the tr an smission line is termina ted in a short circuit (wh ich can

    susta in no voltage a nd t herefore dissipates zero power), a reflected w ave is

    launched back along the line toward the source (Figure 9). The reflected

    volta ge wave must be equal in ma gnitude to the incident volta ge wave an dbe 180 degrees out of phase with it at the plane of the load. The reflected

    an d incident wa ves are equa l in magnit ude but tra veling in the opposite

    directions.

    If th e tra nsmission line is termina ted in a n open-circuit condition (which

    can sust ain no current), the r eflected current w ave w ill be 180 degrees out

    of phase w ith th e incident current w ave, while the reflected volta ge wave

    will be in pha se with t he incident voltage wa ve at t he plane of the load.

    This gua ra ntees tha t t he current a t t he open will be zero. The reflected and

    incident current w aves are equa l in ma gnitude, but t ra veling in the

    opposite directions. For both t he short a nd open cases, a st an ding wa ve

    pat tern is set u p on the tra nsmission line. The voltage va lleys w ill be zero

    an d th e volta ge peaks will be tw ice the incident voltage level.

    If the tra nsmission line is termina ted wit h sa y a 25-ohm resistor, resulting

    in a condition between full absorption an d full reflection, par t of the

    incident power is absorbed an d pa rt is reflected. The a mplitude of the

    reflected volta ge wa ve will be one-third t ha t of the incident w ave, a nd th e

    tw o wa ves will be 180 degrees out of pha se at the plan e of the load. The

    valleys of the sta nding-wa ve patt ern will no longer be zero, and the peaks

    will be less tha n t hose of the short an d open cases. The ra tio of the peaks to

    valleys will be 2:1.

    The tra ditional w ay of determining RF impedance was t o measure VSWR

    using a n RF probe/detector, a length of slotted t ra nsmission line, and a

    VSWR meter. As th e probe wa s moved along the t ra nsmission line, the

    relative position an d values of the peaks and valleys w ere noted on the

    meter. From these measurements, impedance could be derived. Theprocedure wa s repeated a t different frequencies. Modern netw ork

    an aly zers measure the incident a nd reflected wa ves directly during a

    frequency sweep, an d impedance results can be display ed in any number of

    forma ts (including VSWR).

    8

    Zs= Zo

    Vrefl

    Vinc

    For reflection, a transmission line terminated ina short or open reflects all power back to source

    In phase (0 ) for open

    Out of phase (180 ) for shorto

    o

    Figure 9.TransmissionLine Terminatedwith Short, Open

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    9

    TRANSMISSION

    Gain / Loss

    S-ParametersS21,S12

    GroupDelay

    TransmissionCoefficient

    InsertionPhase

    REFLECTION

    SWR

    S-ParametersS11,S22 Reflection

    Coefficient

    Impedance,Admittance

    R+jX,G+jB

    ReturnLoss

    , ,

    Incident

    Reflected

    TransmittedR B

    A

    ReflectedIncident

    AR

    =Transmitted

    Incident

    BR

    =

    Network AnalysisTerminology

    Now tha t w e understand the fundamentals of e lectromagnetic waves, we

    must lear n the common terms used for measurin g them. Network ana lyzer

    terminology generally denotes measurements of the incident wa ve with

    the R or r eference cha nnel. The reflected wa ve is measured w ith t heA channel, and t he transmit t ed wave is measured with the B channel

    (Figure 10). With t he am plitude and phase informa tion in t hese wa ves,

    it is possible to qua ntify t he reflection and t ra nsmission cha ra cteristics

    of a DU T. The reflection a nd t ra nsmission char acteristics can be expressed

    as vector (magnit ude an d pha se), scala r (magnit ude only), or phase-only

    qua ntit ies. For exam ple, return loss is a scalar m easurement of

    reflection, w hile impedance is a vector reflection mea surement.

    Ra tioed measur ements allow us to make reflection an d tra nsmission

    measurement s tha t a re independent of both a bsolute power a nd

    variations in source power versus frequency. Ratioed reflection is often

    shown a s A/R a nd ra tioed tran smission as B /R, relat ing to th e

    measurement channels in the instrument .

    Figure 10.CommonTerms forHigh-FrequencyDeviceCharacterization

    The most general term for ratioed reflection is the complex reflection

    coefficient, or gamma (Figure 11). The magnitude portion of is called

    or rho. The reflection coefficient is the ratio of the reflected signal voltage

    level to the incident signa l voltage level. For example, a t ra nsmission line

    termina ted in its cha ra cteristic impedance Zo, will ha ve all energy

    tra nsferred to the load so Vrefl = 0 a n d = 0. When th e impedan ce of the

    load, ZL is not equa l to the cha ra cteristic impedan ce, energy is reflected

    and is greater t ha n zero. When the load impedan ce is equal t o a short oropen circuit, all energy is reflected a nd = 1. As a result, th e range of

    possible values for is 0 to 1.

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    10

    VTransmittedVIncident

    Transmission Coefficient = =VTransmitted

    VIncident=

    DUT

    Gain (dB) = 20 LogV

    Trans

    VInc= 20 log

    Insertion Loss (dB) = 20 LogV

    Trans

    VInc= 20 log

    Figure 12.TransmissionParameters

    Return loss is a wa y t o express the reflection coefficient in logarit hmic

    terms (decibels). Return loss is the number of decibels that the reflected

    signal is below t he incident signa l. Return loss is alwa ys expressed as a

    positive number and var ies between infinity for a load a t the chara cteristic

    impedance and 0 dB for an open or short circuit . Another common t erm

    used to express reflection is voltage st an ding w ave r at io (VSWR), wh ich is

    defined as t he ma ximum va lue of the RF envelope over the minimum value

    of the RF envelope. It is relat ed to as (1 + )/(1 ). VSWR ra nges from

    1 (no reflection) to infin ity (full r eflection).

    The tra nsmission coefficient is defined as the t ra nsmitt ed volta ge divided

    by th e incident volta ge (Figure 12). If th e absolute value of the tra nsmitt edvoltage is greater t ha n th e absolute value of the incident volta ge, a DU T or

    system is said to have gain. If the absolute value of the tra nsmitt ed volta ge

    is less than the a bsolute va lue of the incident volta ge, the DU T or system

    is said t o have a ttenua tion or insertion loss. The phase portion of the

    tra nsmission coefficient is called insertion pha se.

    =Z

    L ZO

    ZL + OZ

    ReflectionCoefficient

    =Vreflected

    Vincident=

    =

    dB

    No reflection(ZL= Zo)

    RL

    VSWR

    0 1

    Full reflection(ZL= open, short)

    0 dB

    1

    Return loss =20 log(),

    VSWR =EmaxEmin

    =1 + 1

    Voltage Standing Wave RatioEmaxEmin

    Figure 11.ReflectionParameters

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    11

    Direct examina tion of insertion phase usua lly does not provide useful

    informat ion. This is becau se the insertion phase ha s a large (negative)

    slope w ith r espect t o frequency due to the electrical lengt h of the DU T. The

    slope is proport iona l to the lengt h of the DU T. Since it is only deviat ionfrom linear phase tha t causes distortion in communicat ions systems, it is

    desirable to remove the linear portion of the pha se response to an alyze

    the rema ining nonlinear portion. This can be done by using the electrical

    delay feat ure of a network ana lyzer to ma thematically cancel the a verage

    electr ical lengt h of the DU T. The result is a high -resolution displa y of

    phase dist ortion or deviation from linear phase (Figure 13).

    Deviation from constant groupdelay indicates distortion

    Average delay indicates transit time

    GroupDelay

    Frequency

    Group Delay

    Average Delay

    to

    tg

    Group Delay (t )g

    =1

    360o

    =

    d d df

    in radians

    in radians/sec

    in degrees

    in Hzf

    2=( )f

    Phase

    *

    Frequency

    Use electrical delay to removelinear portion of phase response

    Linear electricallength added

    + yields

    Frequency

    (Electrical delay function)

    Frequency

    RF filter responseDeviation fromlinear phase

    Phase1

    /Div

    o

    Phase45/D

    iv

    o

    Frequency

    Low resolution High resolution

    Figure 13.Deviation fromLinear Phase

    Figure 14.What Is GroupDelay?

    MeasuringGroup Delay

    Another useful measure of phase distortion is group delay (Figure 14).

    This param eter is a measure of the tra nsit t ime of a s ignal thr ough a DU T

    versus frequency. Gr oup delay can be calculated by differentiat ing the

    DUTs phase response versus frequency. It reduces the linear portion of thephase response to a consta nt va lue, and tra nsforms the deviations from

    linear pha se into deviat ions from constan t group delay, (wh ich causes

    phase distortion in commun ications systems). The a verage delay

    represents th e average signal tra nsit t ime thr ough a DU T.

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    12

    Depending on the device, both deviation from linear phase a nd group delay

    ma y be measured, since both can be importa nt. Specifying a ma ximum

    peak-to-peak pha se ripple in a device ma y not be sufficient to completely

    chara cterize it , since the slope of th e phase ripple depends on the n umberof ripples tha t occur per unit of frequency. G roup delay ta kes this into

    account because it is the differentiat ed phase response. Group delay is

    often a more easily int erpreted indication of pha se distortion (Figure 15).

    Same peak-to-peak phase ripple can result in different group delay

    Phase

    Phase

    Group

    Delay

    Group

    Delay

    dd

    f

    f

    f

    f

    dd

    In order to completely chara cterize an unkn own linear tw o-port device, we

    must m ake measur ements under var ious conditions and compute a set of

    para meters. These para meters can be used to completely describe the

    electr ical beha vior of our device (or netw ork), even under source an d loadconditions other tha n w hen we ma de our mea surements. Low-frequency

    device or netw ork cha ra cterization is usua lly based on measurement of

    H, Y, and Z para meters. To do this, th e total volta ge and current at the

    input or output ports of a device or nodes of a netw ork must be mea sured.

    Furt hermore, measur ements must be ma de with open-circuit a nd

    short-circuit conditions.

    Since it is difficult to measure tota l current or volta ge at higher

    frequencies, S-par am eters ar e generally mea sured instea d (Figure 16).

    These par am eters relate to familia r measur ements such as ga in, loss,

    an d reflection coefficient. They a re relat ively simple to measur e, an d do

    not req uire connection of und esira ble loa ds to th e DU T. The mea sured

    S-para meters of mult iple devices can be cascaded to predict overall syst em

    performa nce. S-para meters ar e readily used in both linear an d nonlinearCAE circuit simula tion tools, and H, Y, and Z para meters can be derived

    from S-para meters w hen necessar y.

    The number of S-para meters for a given device is equa l to the sq uar e of

    the num ber of ports. For example, a t wo-port device has four S-para meters.

    The numbering convention for S-para meters is tha t t he first number

    following the S is the port a t w hich energy emerges, and t he second number

    is the port a t w hich energy enters. So S21 is a measur e of power emerging

    from Port 2 as a result of applying a n RF st imulus to Port 1. When the

    numbers a re the sa me (e.g. S11), a reflection m easurement is indicated.

    Figure 15.Why MeasureGroup Delay?

    NetworkCharacterization

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    13

    H,Y, and Z parametersHard to measure total voltage and currentat device ports at high frequencies

    Active devices may oscillate or self-destruct with shorts or opens

    S-parametersRelate to familiar measurements (gain, loss, reflection coefficient, etc.)

    Relatively easy to measure

    Can cascade S-parameters of multipledevices to predict system performance

    Analytically convenient

    CAD programs

    Flow-graph analysis

    Can compute H, Y, or Z parameters from S-parameters if desired

    Incident TransmittedS21

    S11Reflected S22

    Reflected

    Transmitted Incident

    b1

    a1 b2

    a2S12

    DUT

    b1 = S11a1+ S12a2b2 = S21 a1+ S22a2

    Port 1 Port 2

    S11 =Reflected

    Incident=

    b1a1

    a2=0

    S21 =Transmitted

    Incident=

    b2a1

    a2=0

    21

    1

    2

    1

    Incident TransmittedS21

    S11Reflectedb1

    a1

    b2

    Z0Load

    a2=0DUT

    Forward

    IncidentTransmitted S12

    S 22Reflected

    b2

    a2

    1b

    a1=0

    DUTZ0Load

    Reverse

    S22=Reflected

    Incident=

    ba

    a =0

    S12=Transmitted

    Incident=

    b

    2aa =0

    Figure 16.Limitations of H,

    Y, and ZParameters

    (Why UseS-parameters?)

    Figure 17.MeasuringS-Parameters

    Forward S-param eters a re determined by measuring the ma gnitude and

    phase of the incident, reflected, an d tra nsmitt ed signals wh en the output

    is termina ted in a load tha t is precisely equa l to the cha ra cteristic

    impedance of the t est system. I n t he case of a simple tw o-port netw ork,

    S 11 is equivalent to the input complex reflection coefficient or impedance of

    th e DU T, wh ile S21 is th e forwar d complex tra nsmission coefficient. B y

    placing the source at th e output port of the DU T an d termina ting th e input

    port in a perfect load, it is possible to measure the other two (reverse)

    S-param eters . Pa rameter S 22 is equivalent to the output complex reflection

    coefficient or output impedance of the DUT while S 12 is the r everse

    complex tr a nsm ission coefficient (Figu re 17).

    Explori ng th e Ar chitectur es of N etwork Anal yzers, Hewlet t-Pa ckard

    Application Note 1287-2.

    Appl ying Er ror Corr ect i on to Network Anal yzer M easur ements,

    Hewlett-Packard Application Note 1287-3.

    Network A nal yzer M easur ements: Fil ter and Ampli f ier Exampl es,

    Hewlett-Packard Application Note 1287-4.

    Suggested Reading

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    For more information aboutHewlett-Packard test and measure-ment products, applications,services, and for a current sales

    office listing, visit our web site,http://www.hp.com/go/tmdir. Youcan also contact one of the followingcenters and ask for a test andmeasurement sales representative.

    United States:Hewlett-Packard Company

    Test an d Measurement Ca ll CenterP.O. B ox 4026Englewood, CO 80155-4026

    1 800 452 4844

    Canada:Hewlet t -Pa ckard Ca nada Lt d .5150 Spectru m WayMississauga , Ontario

    L4W 5G1(905) 206 4725

    Europe:Hewlett-PackardEuropean Marketing CentreP.O. B ox 999

    1180 AZ Amst elveenThe Netherlands(31 20) 547 9900

    J apan:Hewlet t -Pa ckard J apan Ltd .Measurement Assistance Center

    9-1, Taka kura -Ch o, H achioji-Shi,Tokyo 192, J apa nTel: (81-426) 56-7832

    Fa x: (81-426) 56-7840

    Latin America:Hewlett-PackardLa tin American Region Headqua rters5200 Blue La goon Drive, 9th Floor

    Miami, Florida 33126, U.S.A.(305) 267 4245/4220

    Australia/New Zealand:Hewlett-Packard Australia Ltd.31-41 J oseph St reetBlackburn, Victoria 3130, Australia

    1 800 629 485

    Asia Pacific:Hewlett-Pa ckard Asia P acific Ltd.17-21/F Sh ell Tow er, Tim es Sq ua re,1 Matheson Street , Causeway Bay,

    Hong KongTel: (852) 2599 7777Fa x: (852) 2506 9285

    Data Subject to ChangeCopyright 1997Hewlett-Packard CompanyPrinted in U.S.A. 5/975965-7707E