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Ferroelectric Thin F ilms X
www.cambridge.org© in this web service Cambridge University Press
Cambridge University Press978-1-107-41211-8 - Materials Research Society Symposium Proceedings: Volume 688:Ferroelectric Thin Films XEditors: Stephen R. Gilbert, Susan Trolier-McKinstry, Yoichi Miyasaka, Stephen K. Streifferand Dirk J. WoutersFrontmatterMore information
www.cambridge.org© in this web service Cambridge University Press
Cambridge University Press978-1-107-41211-8 - Materials Research Society Symposium Proceedings: Volume 688:Ferroelectric Thin Films XEditors: Stephen R. Gilbert, Susan Trolier-McKinstry, Yoichi Miyasaka, Stephen K. Streifferand Dirk J. WoutersFrontmatterMore information
MATERIALS RESEARCH SOCIETYSYMPOSIUM PROCEEDINGS VOLUME 688
Ferroelectric Thin Films X
Symposium held November 25-29, 2001, Boston, Massachusetts, U.S.A.
EDITORS:
Stephen R. GilbertAgilent Technologies
Palo Alto, California, U.S.A.
Susan Trolier-McKinstryPennsylvania State University
University Park, Pennsylvania, U.S.A.
Yoichi MiyasakaNEC CorporationSagamihara, Japan
Stephen K. StreifferArgonne National Laboratory
Argonne, Illinois, U.S.A.
Dirk J. WoutersIMEC
Leuven, Belgium
IMIRIS1Materials Research Society
Warrendale, Pennsylvania
www.cambridge.org© in this web service Cambridge University Press
Cambridge University Press978-1-107-41211-8 - Materials Research Society Symposium Proceedings: Volume 688:Ferroelectric Thin Films XEditors: Stephen R. Gilbert, Susan Trolier-McKinstry, Yoichi Miyasaka, Stephen K. Streifferand Dirk J. WoutersFrontmatterMore information
cambridge university press Cambridge, New York, Melbourne, Madrid, Cape Town, Singapore, São Paulo, Delhi, Mexico City
Cambridge University Press32 Avenue of the Americas, New York ny 10013-2473, USA
Published in the United States of America by Cambridge University Press, New York
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www.cambridge.org© in this web service Cambridge University Press
Cambridge University Press978-1-107-41211-8 - Materials Research Society Symposium Proceedings: Volume 688:Ferroelectric Thin Films XEditors: Stephen R. Gilbert, Susan Trolier-McKinstry, Yoichi Miyasaka, Stephen K. Streifferand Dirk J. WoutersFrontmatterMore information
CONTENTS
Preface xiii
Acknowledgments xv
Materials Research Society Symposium Proceedings xvi
PROCESSING OF Pb-BASEDFERROELECTRICS
* Low Temperature Preparation of High-Quality Pb(Zr,Ti)O3
Films by Metal Organic Chemical Vapor Deposition WithHigh Reproducibility 3
Hiroshi Funakubo, Kuniharu Nagashima, Masanori Aratani,Kouji Tokita, Takahiro Oikawa, Tomohiko Ozeki,Gouji Asano, and Keisuke Saito
Role of Fluorite Formation in Orientation Selection in Sol-GelDerived Pb(Zr,Ti)O3 Films on Pt Electrode Layers 15
G.J. Norga, L. Fe, F. Vasiliu, D.J. Wouters, andO. Van der Biest
Precise Control of Nucleation and Growth in Lead ZirconateTitanate Thin Films by Scanning Rapid Thermal Annealing 21
Jang-Sik Lee and Seung-Ki Joo
Low-Temperature Crystallization of Pb(Zr0.4,Tio.6)03 ThinFilms by Chemical Solution Deposition 27
Kazunari Maki, Nobuyuki Soyama, Kaoru Nagamine,Satoru Mori, and Katsumi Ogi
PROCESSING OFBi-BASEDFERROELECTRICS
Heteroepitaxial Growth of (1, 0, m+1) One Axis-OrientedBismuth Layered Structured Ferroelectrics Thin FilmsDirectly Crystallized by MOCVD 35
Norimasa Nukaga, Takayuki Watanabe, Tomohiro Sakai,Toshimasa Suzuki, Yuji Nishi, Masayuki Fujimoto, andHiroshi Funakubo
*Invited Paper
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Cambridge University Press978-1-107-41211-8 - Materials Research Society Symposium Proceedings: Volume 688:Ferroelectric Thin Films XEditors: Stephen R. Gilbert, Susan Trolier-McKinstry, Yoichi Miyasaka, Stephen K. Streifferand Dirk J. WoutersFrontmatterMore information
Fabrication of V-Substituted (Bi,M)4Ti3Oi2 [M = Lanthanoids]Thin Films by Chemical Solution Deposition Method 41
H. Uchida, H. Yoshikawa, I. Okada, H. Matsuda, T. Iijima,T. Watanabe, and H. Funakubo
FERROELECTRIC NONVOLA TILE MEMORIES-TECHNOLOGY, FUNDAMENTALS, AND INTEGRATION
* Imprint in Ferroelectric Thin Films Caused by Screening of anElectric Field in a Thin Surface Layer 49
Michael Grossmann, Oliver Lohse, Dierk Bolten, Ulrich Boettger,and Rainer Waser
Iridium Based Electrodes for Ferroelectric CapacitorFabrication ~ 59
J.A. Johnson, J.G. Lisoni, and D.J. Wouters
POSTER SESSION
Ferroelectric-Gate Structures and Field-Effect TransistorsUsing (Bi,La)4Ti3O12 Films 67
Eisuke Tokumitsu, Takuya Suzuki, and Naoki Sugita
Crystallization Behavior and Ferroelectric Properties ofYMnO3 Thin Films on Si (100) Substrates 73
Dong Chul Yoo, Jeong Yong Lee, Ik Soo Kim, andYong Tae Kim
Characteristics of Memory Window and Retention Propertiesof One Transistor Memory Devices 79
Tingkai Li, Sheng Teng Hsu, Bruce Ulrich, and Dave Evans
Structural Inhomogeneity of SrBi2Ta2O9Thin Films Preparedby Layer-by-Layer Technique 85
J.B. Xu, G.D. Hu, and S. P. Wong
Crystallization Kinetics of Seeded SBTPowders From Sol-Gel Derived Precursors 89
Gopinathan M.A. Kumar, Woo-Chul Kwak, Se-Yon Jung,Seung-Joon Hwang, and Yun-Mo Sung
* Invited Paper
VI
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Cambridge University Press978-1-107-41211-8 - Materials Research Society Symposium Proceedings: Volume 688:Ferroelectric Thin Films XEditors: Stephen R. Gilbert, Susan Trolier-McKinstry, Yoichi Miyasaka, Stephen K. Streifferand Dirk J. WoutersFrontmatterMore information
Origin of Lowered Crystallization Temperature in SBT-BTTFerroelectric Thin Films 95
Woo-Chul Kwak, Gopinathan M.A. Kumar, Se-Yon Jung,Seung-Joon Hwang, and Yun-Mo Sung
Effect of Bottom Electrodes on Structural and ElectricalProperties of Laser Ablated SiBi2Ta2O9 Thin Films 101
Rasmi R. Das, W. Perez, P. Bhattacharya, and Ram S. Katiyar
Synthesis and Ferroelectric Properties of Sr- and Nb-codopedBi4.xSrxTi3.xNbxO12 Thin Films by Sol-Gel Method 107
Hirofumi Matsuda, Takashi Iijima, Hiroshi Uchida, andIsao Okada
Effect of Capacitor Configuration on Oxygen-DependentElectrical Properties of Ferroelectric Pb(Zr,Ti)O3 Thin Films 113
M.A. McCormick, E.B. Slamovich, P. Metcalf, andM. McElfresh
Improvement of Surface Crystalline Quality of an Epitaxial(100)ZrN Film as a Bottom Electrode Diffusion Barrier forFerroelectric Capacitors 119
Susumu Horita, Sadayoshi Horii, and Takeo Toda
Characterization of (Ba,Sr)RuO3 Films Deposited byMetal-Organic Chemical Vapor Deposition 125
Duck-Kyun Choi, Joong-Seo Kang, Young-Bae Kim,Duck-Hwa Hong, Hyun-Chul Kim, Sung-Tae Kim, andCha- Young Yoo
INTEGRATION AND ELECTRODES
Investigation of the Role of Carbonylchemistry to PatternPlatinum Electrodes 133
St. Schneider, H. Kohlstedt, and R. Waser
Thermal Stability and Electrical Properties of RhO2 Thin Films 139Yoshio Abe, Kiyohiko Kato, Midori Kawamura, andKatsutaka Sasaki
Fabrication and Characterization of a PZT Thin FilmActuator for a Micro Electromechanical Switch Application 145
Marcus Hoffmann, Timm Leuerer, Clemens Kruger,Ulrich Bottger, Wilfried Mokwa, and Rainer Waser
vn
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Cambridge University Press978-1-107-41211-8 - Materials Research Society Symposium Proceedings: Volume 688:Ferroelectric Thin Films XEditors: Stephen R. Gilbert, Susan Trolier-McKinstry, Yoichi Miyasaka, Stephen K. Streifferand Dirk J. WoutersFrontmatterMore information
EPITAXIAL FERROELECTRIC FILMS
Preparation and Characterization of a- and b-Axis-OrientedEpitaxially Grown Bi4Ti3Oi2-Based Thin Films onRutile-Type Oxides 155
Takayuki Watanabe, Keisuke Saito, Minoru Osada, andHiroshi Funakubo
* Size Effects on Polarization in Epitaxial Ferroelectric Filmsand the Concept of Ferroelectric Tunnel Junctions IncludingFirst Results 161
H. Kohlstedt, N.A. Pertsev, and R. Waser
Functional Behavior of Thin Film Dielectric Superlattices 173J.M. Gregg, M.H. Corbett, D. O'Neill, G. Catalan, andR.M. Bowman
POSTER SESSION
PZT and PMN-PT Thin Film Cantilevers: ComparisonBetween Monomorph and Bimorph Structures 181
Marcus Hoffmann, Carsten Kiigeler, Ulrich Bottger, andRainer Waser
High-Temperature Dielectric Properties of Sol-Gel DerivedThick PZT Thin Films With Different Zr/Ti Atom Ratios 187
Jinrong Cheng, Wenyi Zhu, Nan Li, and L. Eric Cross
Interdigital Ag(Ta,Nb)O3 Thin Film Capacitors on Sapphire 193Jung-Hyuk Koh, Alex Grishin, Akira Shibuya, andMasanori Okuyama
RF-Magnetron Sputtered Au/(Na,K)NbO3/SiO2/SiMFIS-Diode Structures 199
Akira Shibuya, Jung-Hyuk Koh, Alex Grishin, Veronika Kugler,Denis Music, Ulf Helmersson, and Masanori Okuyama
Process Induced Modification of the High Frequency DielectricBehavior of (100) Textured BaxSr!_xTiO3 (x = 0.5 and 0.6) Thin Films 205
S.B. Majumder, M. Jain, A. Martinez, R.S. Katiyar,E.R. Fachini, F.W. Van Keuls, F.A. Miranda, P.K. Sahoo,and V.N. Kulkarni
* Invited Paper
vm
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Cambridge University Press978-1-107-41211-8 - Materials Research Society Symposium Proceedings: Volume 688:Ferroelectric Thin Films XEditors: Stephen R. Gilbert, Susan Trolier-McKinstry, Yoichi Miyasaka, Stephen K. Streifferand Dirk J. WoutersFrontmatterMore information
Reactive Coevaporation of SrTiO3 Thin Films for TunableMicrowave Devices 211
Luke S.-J. Peng, Nina F. Heinig, and Brian H. Moeckly
Microwave Properties of Strontium Barium NiobateThin Films Grown by Pulsed Laser Deposition 217
Victor Rodriguez-Santiago, Yelitza Gonzalez, Felix E. Fernandez,Carl H. Mueller, Fred W. Van Keuls, and Felix A. Miranda
Pyroelectric Properties of Alanine Doped TGS SingleCrystalline Thick Films Under Constant Electric Stress 223
Lucian Pintilie, Ion Matei, Ioana Pintilie,Horia V. Alexandru, and Ciceron Berbecaru
Infrared Spectroscopy of Epitaxial Antimony Sulpho IodideThin Films 229
S. Kotru, S. Surthi, R.K. Pandey, and D. Donnelly
Direct Nanoscale Observation of Size Effect on PolarizationInstability in Pb(Zr,Ti)O3 Film Capacitors 235
Igor Stolichnov, Enrico Colla, Alexander Tagantsev,Seungbum Hong, Nava Setter, Jeffrey S. Cross, andMineharu Tsukada
Analysis of Alternating Current Conduction and ImpedanceSpectroscopy Study of BaBi2Nb2O9 Thin Films 241
Apurba Laha, S. Saha, and S.B. Krupanidhi
Simulation of the Variability in Next-GenerationMicroelectronic Capacitors With Polycrystalline Dielectrics 247
Jesse L. Cousins and David E. Kotecki
Crystallization of BaTiO3 Thin Films Prepared byMetalorganic Decomposition With Hydrothermal Treatmentatl40°C 253
Zhiqiang Wei, Minoru Noda, and Masanori Okuyama
Impact of Template Layers on Dielectric and ElectricalProperties of Pulsed-Laser Ablated Pb(Mgi/3Nb2/3)O3-PbTiO3
Thin Films 259Apurba Laha, S. Saha, and S.B. Krupanidhi
Microstructural and Dielectrical Properties for Ceramics andThin Films of the xPbTiO3-(l-x)SrTiO3 Solid Solution 265
E. Martinez, A. Fundora, O. Blanco, S. Garcia, E. Heredia,and J.M. Siqueiros
ix
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Compositional Disorder Induced Relaxor Behavior of(PbLa)TiO3 Thin Films 271
S. Bhaskar, S.B. Majumder, and R.S. Katiyar
EPITAXIAL FERROELECTRIC FILMS
Ferroelectic BaTiO3 Thin Film Optical Waveguide Modulators 279A. Petraru, M. Siegert, M. Schmid, J. Schubert, andCh. Buchal
Initial Growth Stages of Epitaxial BaTiO3 Films on VicinalSrTiO3:Nb (001) Substrates 285
A. Visinoiu, M. Alexe, H.N. Lee, D.N. Zakharov,A. Pignolet, D. Hesse, and U. Gosele
Structure and Morphology of Epitaxially Intergrown (100)-and (116)-Oriented SrBi2Ta2O9 Ferroelectric Thin Films onSrLaGaO4(l 10) Substrates 291
H.N. Lee, D.N. Zakharov, P. Reiche, R. Uecker, andD. Hesse
Fabrication and Properties of Epitaxial Lithium Niobate ThinFilms by Combustion Chemical Vapor Deposition (CCVD) 297
Yong Dong Jiang, Jake McGee, Todd A. Polley,Robert E. Schwerzel, and Andrew T. Hunt
Structural and Ferroelectric Properties of EpitaxialPbZro.52Tio.4803 and BaTiO3 Thin Films Prepared onSrRu63/SrTiO3(100) Substrates 303
J. Rodriguez Contreras, J. Schubert, U. Poppe,O. Trithaveesak, K. Szot, Ch. Buchal, H. Kohlstedt, andR. Waser
Growth and Electrical Properties of Fe doped (Ba,Sr)TiO3
Thin Films Deposited by Pulsed Laser Deposition 309Yoshiyuki Yonezawa, Megumi Kato, Yoshinori Konishi,Shizuyasu Yoshida, Nobuhiro Okuda, Takahiko Maeda,Ryohei Tanuma, Michio Ohsawa, Hideaki Matsuyama,Shinji Ogino, Naoto Fujishima, Akinori Matsuda,Noboru Furusyo, Toyohiro Chikyow, Masashi Kawasaki, andHideomi Koinuma
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Cambridge University Press978-1-107-41211-8 - Materials Research Society Symposium Proceedings: Volume 688:Ferroelectric Thin Films XEditors: Stephen R. Gilbert, Susan Trolier-McKinstry, Yoichi Miyasaka, Stephen K. Streifferand Dirk J. WoutersFrontmatterMore information
DOMAINS AND NANOSTRUCTURES
* Local Polarization, Charge Compensation, and ChemicalInteractions on Ferroelectric Surfaces: A Route Toward NewNanostructures ~..317
Dawn A. Bonnell and Sergei V. Kalinin
Higher Order Nonlinear Dielectric Microscopy 329Yasuo Cho and Koya Ohara
PIEZOELECTRICS ANDPYROELECTRICS
Dielectric and Electromechanical Behavior of Relaxor[(l-x)Pb(Mg1/3Nb2/3)O3-xPbTiO3] Thin Films 337
NJ. Donnelly, G. Catalan, C. Morros, R.M. Bowman, andJ.M. Gregg
* Ferroelectric and Displacement Properties of Lead ZirconateTitanate Thick Films Prepared by Chemical SolutionDeposition Process 343
Takashi Iijima, Yoshinori Hayashi, and Jun Onagawa
Compositional Effects on the Piezoelectric and FerroelectricProperties of Chemical Solution Deposited PZT Thin Films 351
Dong-Joo Kim, Jon-Paul Maria, and Angus I. Kingon
Micro-Machined Pyroelectric Infrared Detector Based on Sol-GelDerived Pb(Zr0jTio.7)03/PbTi03 Multilayer Thin Films 357
Ling Ling Sun, Wei Guo Liu, Ooi Kiang Tan, andWei Guang Zhu
FERROELECTRIC GATES
Epitaxial Growth of LaVO3/(Ba,Sr)TiO3/(Pb J,a)(Zr Ji)03/(La,Sr)Co03
Semiconductor/Ferroelectric/Conductor Heterostructures 365Woong Choi and Tim Sands
Integration Processes and Properties of Pt/Pb5Ge3Oii/(Zr,Hf)O2/SiOne Transistor Memory Devices 371
Tingkai Li, Sheng Teng Hsu, Bruce Ulrich, and Lisa Stecker
* Invited Paper
XI
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Cambridge University Press978-1-107-41211-8 - Materials Research Society Symposium Proceedings: Volume 688:Ferroelectric Thin Films XEditors: Stephen R. Gilbert, Susan Trolier-McKinstry, Yoichi Miyasaka, Stephen K. Streifferand Dirk J. WoutersFrontmatterMore information
Al2O3/Si3N4 Buffer Layer for High Performance MFIS(Metal-Ferroelectric-Insulator-Semiconductor) Transistors 377
Yoshihisa Fujisaki and Hiroshi Ishiwara
A Study of Charge Control and Gate Tunneling in aFerroelectric-Oxide-Silicon Field Effect Transistor 383
Yih-Yin Lin, Yifei Zhang, and Jasprit Singh
THIN FILMS FORRF APPLICATIONS
Raman Studies of the Soft Phonon Modes in BaxSri_xTiO3
Thin Films 391D.A. Tenne, A.M. Clark, A.R. James, A. Soukiassian,K. Chen, and X.X. Xi
HIGH-PERMITTIVITY MATERIALS
Probing the Dead Layer in Barium Strontium TitanateCapacitors Made by Pulsed Laser Deposition 399
LJ. Sinnamon, R.M. Bowman, and J.M. Gregg
Thickness Dependence of Leakage Current Behavior inEpitaxial (Ba,Sr)TiO3 Thin Films 405
Kun Ho Ahn, Sang Sub Kim, and Sunggi Baik
SYMPOSIUM K PAPER
Erbium-Doped Barium Titanate Thin Film Waveguides ForIntegrated Optical Amplifiers 413
Andrew R. Teren, Seong-Soo Kim, Seng-Tiong Ho, andBruce W. Wessels
Author Index .....419
Subject Index 423
xn
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Cambridge University Press978-1-107-41211-8 - Materials Research Society Symposium Proceedings: Volume 688:Ferroelectric Thin Films XEditors: Stephen R. Gilbert, Susan Trolier-McKinstry, Yoichi Miyasaka, Stephen K. Streifferand Dirk J. WoutersFrontmatterMore information
PREFACE
This symposium, "Ferroelectric Thin Films X," held November 25-29 at the 2001 MRSFall Meeting in Boston, Massachusetts, was the tenth in a series of highly successful MRSsymposia on ferroelectric thin films. During this year's symposium, substantial progress inseveral areas of integrated ferroelectric and high-permittivity device technology wasdemonstrated. In particular, the latest developments in high-density FeRAM devices werereviewed, in addition to recent developments in the use of these films in piezoelectric,pyroelectric, tunable RF, integrated capacitor, and optical waveguide applications. Othersessions focused on the thin film processing techniques used to deposit a variety offerroelectric and electrode materials. And finally, several topical sessions focused on recentadvances in the fundamental understanding of ferroelectricity and degradation phenomena inthin films. As evidenced by the awarding of a Poster Award by the Fall Meeting chairs for thesecond year in a row, this symposium continues to receive excellent technical contributions.
Since the first symposium in this series was held at the 1990 MRS Spring Meeting, there hasbeen a steady increase in paper submissions and attendance. Consistent with past years, thesymposium was also characterized by a diverse mix of excellent presentations from NorthAmerica, Europe, and Asia. Approximately 180 abstracts were submitted this year, asignificant increase over last year and consistent with previous ferroelectric thin filmssymposia. In addition, both the oral and poster presentations were very well attended. Oralpresentations were held over four days, and poster sessions were held on two evenings. A jointsession with Symposium O, "Complex Oxide Heteroepitaxy," was also held.
The strong and ever increasing interest in ferroelectric thin films, both domestically andinternationally, continues unabated, and demonstrates the growing technological and scientificimportance of this class of materials. This proceedings volume presents the latest technicalinformation on ferroelectric thin films from academia, government laboratories, and industry.A number of emerging technological trends are highlighted, along with advancements madeover the course of the previous 12 months since the last ferroelectric thin films symposiumwas held at the 2000 MRS Fall Meeting.
Stephen R. GilbertSusan Trolier-McKinstryYoichi MiyasakaStephen K. StreifferDirk J. Wouters
March 2002
www.cambridge.org© in this web service Cambridge University Press
Cambridge University Press978-1-107-41211-8 - Materials Research Society Symposium Proceedings: Volume 688:Ferroelectric Thin Films XEditors: Stephen R. Gilbert, Susan Trolier-McKinstry, Yoichi Miyasaka, Stephen K. Streifferand Dirk J. WoutersFrontmatterMore information
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Cambridge University Press978-1-107-41211-8 - Materials Research Society Symposium Proceedings: Volume 688:Ferroelectric Thin Films XEditors: Stephen R. Gilbert, Susan Trolier-McKinstry, Yoichi Miyasaka, Stephen K. Streifferand Dirk J. WoutersFrontmatterMore information
ACKNOWLEDGMENTS
The symposium chairs are pleased to acknowledge the contributing and invited authors forthe outstanding quality of their presentations and proceedings manuscripts. The invitedspeakers included:
D.A. Bonnell J.-P. MariaG. Fox P.C. MclntyreH. Funakubo C. RandallM. Grossmann A. SeifertT. Iijima N. SetterH. Kohlstedt S.R. Summerfelt
We are also pleased to acknowledge the following poster presenter who received an MRSPoster Award from the 2001 Fall Meeting chairs:
Ho Nyung Lee et al. (Max-Planck Institute, Halle, Germany)
The symposium chairs are also indebted to the session chairs for their efforts in overseeingthe sessions, guiding subsequent discussions, and for assisting with the review of the proceedingsmanuscripts:
S. Aggarwal P.C. MclntyreH. Funakubo P. MuraltM. Grossmann C. RandallS. Hoffmann-Eifert N. SetterD. Kaufman D.G. SchlomA. Kingon M. ShimizuJ.-P. Maria S.R. Summerfelt
The chairs also wish to express their gratitude to the following organizations for providingfinancial support, enabling us to present the "Ferroelectric Thin Films X" symposium:
Aixtron AGKojundo Chemical Laboratories Co., Ltd.
NEC CorporationULVAC, Ltd.
Finally, we extend special thanks to the Materials Research Society staff, as well as the2001 Fall Meeting chairs, for developing yet another outstanding conference.
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Cambridge University Press978-1-107-41211-8 - Materials Research Society Symposium Proceedings: Volume 688:Ferroelectric Thin Films XEditors: Stephen R. Gilbert, Susan Trolier-McKinstry, Yoichi Miyasaka, Stephen K. Streifferand Dirk J. WoutersFrontmatterMore information
MATERIALS RESEARCH SOCIETY SYMPOSIUM PROCEEDINGS
Volume 664— Amorphous and Heterogeneous Silicon-Based Films—2001, M. Stutzmann, J.B. Boyce,J.D. Cohen, R.W. Collins, J. Hanna, 2001, ISBN: 1-55899-600-1
Volume 665— Electronic, Optical and Optoelectronic Polymers and Oligomers, G.E. Jabbour, B. Meijer,N.S. Sariciftci, T.M. Swager, 2002, ISBN: 1-55899-601-X
Volume 666— Transport and Microstructural Phenomena in Oxide Electronics, D.S. Ginley, M.E. Hawley,D.C. Paine, D.H. Blank, S.K. Streiffer, 2001, ISBN: 1-55899-602-8
Volume 667— Luminescence and Luminescent Materials, K.C. Mishra, J. McKittrick, B. DiBartolo,A. Srivastava, P.C. Schmidt, 2001, ISBN: 1-55899-603-6
Volume 668— II-VI Compound Semiconductor Photovoltaic Materials, R. Noufi, R.W. Birkmire, D. Lincot,H.W. Schock, 2001, ISBN: 1-55899-604-4
Volume 669— Si Front-End Processing—Physics and Technology of Dopant-Defect Interactions III, M.A. Foad,J. Matsuo, P. Stolk, M.D. Giles, K.S. Jones, 2001, ISBN: 1-55899-605-2
Volume 670— Gate Stack and Silicide Issues in Silicon Processing II, S.A. Campbell, C.C. Hobbs, L. Clevenger,P. Griffin, 2002, ISBN: 1-55899-606-0
Volume 671— Chemical-Mechanical Polishing 2001—Advances and Future Challenges, S.V. Babu, K.C. Cadien,J.G. Ryan, H. Yano, 2001, ISBN: 1-55899-607-9
Volume 672— Mechanisms of Surface and Microstrucure Evolution in Deposited Films and Film Structures,J. Sanchez, Jr., J.G. Amar, R. Murty, G. Gilmer, 2001, ISBN: 1-55899-608-7
Volume 673— Dislocations and Deformation Mechanisms in Thin Films and Small Structures, O. Kraft,K. Schwarz, S.P. Baker, B. Freund, R. Hull, 2001, ISBN: 1-55899-609-5
Volume 674— Applications of Ferromagnetic and Optical Materials, Storage and Magnetoelectronics, W.C. Black,H.J. Borg, K. Bussmann, L. Hesselink, S.A. Majetich, E.S. Murdock, B.J.H. Stadler, M. Vazquez,M. Wuttig, J.Q. Xiao, 2001, ISBN: 1-55899-610-9
Volume 675— Nanotubes, Fullerenes, Nanostructured and Disordered Carbon, J. Robertson, T.A. Friedmann,D.B. Geohegan, D.E. Luzzi, R.S. Ruoff, 2001, ISBN: 1-55899-611-7
Volume 676— Synthesis, Functional Properties and Applications of Nanostructures, H.W. Hahn, D.L. Feldheim,C.P. Kubiak, R. Tannenbaum, R.W. Siegel, 2002, ISBN: 1-55899-612-5
Volume 677— Advances in Materials Theory and Modeling—Bridging Over Multiple-Length and Time Scales,L. Colombo, V. Bulatov, F. Cleri, L. Lewis, N. Mousseau, 2001, ISBN: 1-55899-613-3
Volume 678— Applications of Synchrotron Radiation Techniques to Materials Science VI, P.G. Allen, S.M. Mini,D.L. Perry, S.R. Stock, 2001, ISBN: 1-55899-614-1
Volume 679E—Molecular and Biomolecular Electronics, A. Christou, E.A. Chandross, W.M. Tolles, S. Tolbert,2001, ISBN: 1-55899-615-X
Volume 680E—Wide-Bandgap Electronics, T.E. Kazior, P. Parikh, C. Nguyen, E.T. Yu, 2001,ISBN: 1-55899-616-8
Volume 68IE—Wafer Bonding and Thinning Techniques for Materials Integration, T.E. Haynes, U.M. Gosele,M. Nastasi, T. Yonehara, 2001, ISBN: 1-55899-617-6
Volume 682E—Microelectronics and Microsystems Packaging, J.C. Boudreaux, R.H. Dauskardt, H.R. Last,F.P. McCluskey, 2001, ISBN: 1-55899-618-4
Volume 683E—Material Instabilities and Patterning in Metals, H.M. Zbib, G.H. Campbell, M. Victoria,D.A. Hughes, L.E. Levine, 2001, ISBN: 1-55899-619-2
Volume 684E—Impacting Society Through Materials Science and Engineering Education, L. Broadbelt,K. Constant, S. Gleixner, 2001, ISBN: 1-55899-620-6
Volume 685E—Advanced Materials and Devices for Large-Area Electronics, J.S. Im, J.H. Werner, S. Uchikoga,T.E. Felter, T.T. Voutsas, H.J. Kim, 2001, ISBN: 1-55899-621-4
Volume 686— Materials Issues in Novel Si-Based Technology, W. En, E.C. Jones, J.C. Sturm, S. Tiwari,M. Hirose, M. Chan, 2002, ISBN: 1-55899-622-2
Volume 687— Materials Science of Microelectromechanical Systems (MEMS) Devices IV, A.A. Ayon,S.M. Spearing, T. Buchheit, H. Kahn, 2002, ISBN: 1-55899-623-0
Volume 688— Ferroelectric Thin Films X, S.R. Gilbert, Y. Miyasaka, D. Wouters, S. Trolier-McKinstry,S.K. Streiffer, 2002, ISBN: 1-55899-624-9
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Cambridge University Press978-1-107-41211-8 - Materials Research Society Symposium Proceedings: Volume 688:Ferroelectric Thin Films XEditors: Stephen R. Gilbert, Susan Trolier-McKinstry, Yoichi Miyasaka, Stephen K. Streifferand Dirk J. WoutersFrontmatterMore information
MATERIALS RESEARCH SOCIETY SYMPOSIUM PROCEEDINGS
Volume 689— Materials for High-Temperature Superconductor Technologies, M.P. Paranthaman, M.W. Rupich,K. Salama, J. Mannhart, T. Hasegawa, 2002, ISBN: 1-55899-625-7
Volume 690— Spintronics, T.J. Klemmer, J.Z. Sun, A. Fert, J. Bass, 2002, ISBN: 1-55899-626-5Volume 691— Thermoelectric Materials 2001—Research and Applications, G.S. Nolas, D.C. Johnson,
D.G. Mandrus, 2002, ISBN: 1-55899-627-3Volume 692— Progress in Semiconductor Materials for Optoelectronic Applications, E.D. Jones, M.O. Manasreh,
K.D. Choquette, D. Friedman, 2002, ISBN: 1-55899-628-1Volume 693— GaN and Related Alloys—2001, J.E. Northrup, J. Neugebauer, S.F. Chichibu, D.C. Look,
H. Riechert, 2002, ISBN: 1-55899-629-XVolume 695— Thin Films: Stresses and Mechanical Properties IX, C.S. Ozkan, R.C. Cammarata, L.B. Freund,
H. Gao, 2002, ISBN: 1-55899-631-1Volume 696— Current Issues in Heteroepitaxial Growth—Stress Relaxation and Self Assembly, E. Stach,
E. Chason, R. Hull, S. Bader, 2002, ISBN: 1-55899-632-XVolume 697— Surface Engineering 2001—Fundamentals and Applications, W.J. Meng, A. Kumar, Y-W. Chung,
G.L. Doll, Y-T. Cheng, S. Veprek, 2002, ISBN: 1-55899-633-8Volume 698— Electroactive Polymers and Rapid Prototyping, Y. Bar-Cohen, D.B. Chrisey, Q.M. Zhang,
S. Bauer, E. Fukada, S.C. Danforth, 2002, ISBN: 1-55899-634-6Volume 699— Electrically Based Microstructural Characterization III, R.A. Gerhardt, A. Washabaugh, M.A. Alim,
G.M. Choi, 2002, ISBN: 1-55899-635-4Volume 700— Combinatorial and Artificial Intelligence Methods in Materials Science, I. Takeuchi, C. Buelens,
H. Koinuma, E.J. Amis, J.M. Newsam, L.T. Wille, 2002, ISBN: 1-55899-636-2Volume 702— Advanced Fibers, Plastics, Laminates and Composites, F.T. Wallenberger, N. Weston, K. Chawla,
R. Ford, R.P. Wool, 2002, ISBN: 1-55899-638-9Volume 703— Nanophase and Nanocomposite Materials IV, S. Komarneni, R.A. Vaia, G.Q. Lu, J-I. Matsushita,
J.C. Parker, 2002, ISBN: 1-55899-639-7Volume 704— Nanoparticle Materials, R.K. Singh, R. Partch, M. Muhammed, M. Senna, H. Hofmann, 2002,
ISBN: 1-55899-640-0Volume 705— Nanopatterning—From Ultralarge-Scale Integration to Biotechnology, L. Merhari, K.E. Gonsalves,
E.A. Dobisz, M. Angelopoulos, D. Herr, 2002, ISBN: 1-55899-641-9Volume 706— Making Functional Materials with Nanotubes, P. Nikolaev, P. Bernier, P. Ajayan, Y. Iwasa, 2002,
ISBN: 1-55899-642-7Volume 707— Self-Assembly Processes in Materials, S. Moss, 2002, ISBN: 1-55899-643-5Volume 708— Organic and Optoelectronic Materials, Processing and Devices, S. Moss, 2002,
ISBN: 1-55899-644-3Volume 709— Advances in Liquid Crystalline Materials and Technologies, P.T. Mather, D.J. Broer, T.J. Bunning,
D.M. Walba, R. Zentel, 2002, ISBN: 1-55899-645-1Volume 710— Polymer Interfaces and Thin Films, C.W. Frank, 2002, ISBN: 1-55899-646-XVolume 711— Advanced Biomaterials—Characterization, Tissue Engineering and Complexity, 2002,
ISBN: 1-55899-647-8Volume 712— Materials Issues in Art and Archaeology VI, P.B. Vandiver, M. Goodway, J.R. Druzik, J.L. Mass,
2002, ISBN: 1-55899-648-6Volume 713— Scientific Basis for Nuclear Waste Management XXV, B.P. McGrail, G.A. Cragnolino, 2002,
ISBN: 1-55899-649-4Volume 714E—Materials, Technology and Reliability for Advanced Interconnects and Low-k Dielectrics II,
S. Lahiri, 2002, ISBN: 1-55899-650-8
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Cambridge University Press978-1-107-41211-8 - Materials Research Society Symposium Proceedings: Volume 688:Ferroelectric Thin Films XEditors: Stephen R. Gilbert, Susan Trolier-McKinstry, Yoichi Miyasaka, Stephen K. Streifferand Dirk J. WoutersFrontmatterMore information