EMC Test Report - Huawei · EMC Test Report Product Name: Power System Product Model: TP48200E Product Type: TP48200E-D09A1 TP48200E-H09A1 Report Number: SYBH (E) 00689838EA

EMC Test Report

Product Name: Power System Product Model: TP48200E Product Type: TP48200E-D09A1

TP48200E-H09A1 Report Number: SYBH (E) 00689838EA

Reliability Laboratory of Huawei Technologies Co., Ltd.

Administration Building, Headquarters of Huawei Technologies Co., Ltd., Bantian, Longgang

District, Shenzhen, 518129, P.R.C Tel: +86 755 28780808 Fax: +86 755 89652518

EMC Test Report of TP48200E Security Level: Internal use only

Report No.: SYBH (E) 00689838EA Huawei Proprietary and Confidential Copyright © Huawei Technologies Co., Ltd

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Notice

1. The laboratory has passed the accreditation by China National Accreditation Service for

Conformity Assessment (CNAS). The accreditation number is L0310.

2. The laboratory has passed the accreditation by The American Association for Laboratory

Accreditation (A2LA). The accreditation number is 2174.01.

3. The laboratory has been listed by the US Federal Communications Commission to perform

electromagnetic emission measurements. The site recognition number is 97456.

4. The laboratory has been listed by Industry Canada to perform electromagnetic emission

measurements. The recognition numbers of test site are 6369A-1 and 6369A-3.

5. The laboratory has been listed by the VCCI to perform EMC measurements. The accreditation

numbers of test site No.1 are R-2364, G-415, C-2583, and T-256, and the accreditation numbers of

test site No.2 are R-3760, G-485, C-4210 and T-1237.

6. The test report is invalid if not marked with the signatures of the persons responsible for preparing

and approving the test report.

7. The test report is invalid if there is any evidence of erasure and/or falsification.

8. The test report is only valid for the test samples.

9. Content of the test report, in part or in full, cannot be used for publicity and/or promotional

purposes without prior written approval from the laboratory.



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Applicant: Huawei Technologies Co., Ltd.

Address: Administration Building, Headquarters of Huawei Technologies Co.,

Ltd., Bantian, Longgang District, Shenzhen, 518129, P.R.C

Product Name: Power System

Product Model: TP48200E

Product Type: TP48200E-D09A1

TP48200E-H09A1

Date of Receipt Sample: 2012-06-01

Start Date of Test: 2012-06-10

End Date of Test: 2012-06-27

Test Result: Pass

Approved by Senior

Engineer:

2012-08-08 Zhang Xinghai

Date Name Signature

Prepared by: 2012-08-01 Huang He

Date Name Signature



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Modification Record

No. Last Report No. Modification Description

1 N/A First report



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Content

1 General Information ................................................................................................................. 6 1.1 Applied Standard ..................................................................................................................... 6 1.2 Test Location ........................................................................................................................... 6 1.3 Test Environment Condition .................................................................................................... 6

2 Summary of Test Results ........................................................................................................ 7

3 Equipment Specification .......................................................................................................... 8 3.1 General Description ................................................................................................................. 8 3.2 Specification ............................................................................................................................. 8 3.3 Boards and Subassemblies ................................................................................................... 10

4 System Configuration during EMC Test ................................................................................ 11 4.1 Ports and Cables ................................................................................................................... 11 4.2 Auxiliary Equipment ............................................................................................................... 11 4.3 Test Configurations ................................................................................................................ 11 4.4 Test Conditions and Connections .......................................................................................... 13

5 Immunity Performance Criteria .............................................................................................. 14 5.1 Performance Criterion A ........................................................................................................ 14 5.2 Performance Criterion B ........................................................................................................ 14 5.3 Performance Criterion C ........................................................................................................ 14

6 Electromagnetic Interference (EMI) ....................................................................................... 15 6.1 Radiated Emission 30 MHz to 1 GHz .................................................................................... 15 6.2 Conducted Emission 0.15 MHz to 30 MHz ............................................................................ 16 6.3 Current Harmonics Emissions ............................................................................................... 19 6.4 Voltage Fluctuations and Flicker............................................................................................. 19

7 Electromagnetic Susceptibility (EMS).................................................................................... 20 7.1 Electrostatic Discharge .......................................................................................................... 20 7.2 Immunity to Radiated Electric Fields 80 MHz to 2700 MHz .................................................... 21 7.3 Immunity to Electrical Fast Transient Bursts ......................................................................... 22 7.4 Immunity to Surges ................................................................................................................ 24 7.5 Immunity to Continuous Conducted Interference 0.15 MHz to 80 MHz ................................ 26 7.6 Immunity to Voltage Dips and Short Interruption of AC Power Port ..................................... 28

8 Main Test Instruments ........................................................................................................... 29

9 System Measurement Uncertainty ........................................................................................ 31

10 Graph and Data of Emission Test ......................................................................................... 32 10.1 Radiated Disturbance ............................................................................................................ 32 10.2 Conducted Disturbance ......................................................................................................... 33 10.3 Current Harmonics ................................................................................................................. 36 10.4 Voltage Fluctuation and Flicker ............................................................................................. 40

11 Photographs of Test Set-up ................................................................................................... 42 11.1 Emission ................................................................................................................................ 42 11.2 Immunity ................................................................................................................................ 44

Appendix: Abbreviation ........................................................................................................................ 51



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1 General Information

1.1 Applied Standard

Applied Product Standard: EN 55022:2010

CISPR 22:2008

EN 55024:1998+A1:2001+A2:2003

CISPR 24:1997+A1:2001+A2:2002

ETSI EN 300 386 V1.5.1:2010

AS/NZS CISPR 22:2009

IEC 61000-3-11:2000/EN 61000-3-11:2000

IEC 61000-3-12:2004/EN 61000-3-12:2005

IEC 61000-6-1:2005/EN 61000-6-1:2007

IEC 61000-6-3:2006+A1:2010/EN 61000-6-3:2007+A1:2011

Test Method: IEC 61000-4-2:2008

IEC 61000-4-3:2010

IEC 61000-4-4:2004+A1:2010

IEC 61000-4-5:2005

IEC 61000-4-6:2008

IEC 61000-4-11:2004

Note: The stdandards IEC/EN 61000-3-11 and IEC/EN 61000-3-12 have not accredited by CNAS

and A2LA.

1.2 Test Location

Test Location 1: Reliability Laboratory of Huawei Technologies Co., Ltd.

Address: Administration Building, Headquarters of Huawei Technologies

Co., Ltd., Bantian, Longgang District, Shenzhen, 518129, P.R.C

1.3 Test Environment Condition

Ambient Temperature: 22-27°C

Relative Humidity: 45-55%

Atmospheric Pressure: 101kPa



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2 Summary of Test Results

Table 1 Test summary

EUT Classification:

Other than Telecommunication Centre Equipment

Test Items Test

Configuration Limit or Performance

Criteria Test

Result Location

Radiated Emissions

Enclosure Port TC1,TC2 Class B Pass Location1

Conducted Emissions

AC Input Power Port DC Output Power Port Telecommunication Ports

TC1,TC2 Refer to section 6.2 Pass Location1

Current Harmonics Emissions

AC Power Port TC1,TC2 Refer to section 10.3 Pass Location1

Voltage Fluctuations and Flickers

AC Power Port TC1,TC2 Refer to section 10.4 Pass Location1

Electrostatic Discharge

Enclosure Port TC1,TC2 B Pass Location1

Immunity to Radiated Electromagnetic Fields

Enclosure Port TC1,TC2 A Pass Location1

Immunity to Electrical Fast Transient Bursts Outdoor Signal Port Indoor Signal Port AC Input Power Port DC Output Power Port

TC1,TC2 B Pass Location1

Immunity to Surges Outdoor Signal Port Indoor Signal Port AC Input Power Port DC Output Power Port

TC1,TC2 B Pass Location1

Immunity to Continuous Conducted Interference Outdoor Signal Port Indoor Signal Port AC Input Power Port

DC Output Power Port

TC1,TC2 A Pass Location1

Immunity to Power Frequency Magnetic Field

Enclosure Port TC1,TC2 A NT* Location1

Immunity to Voltage Dips and Short Interruption AC Power Port

TC1,TC2 B/C With battery Without battery

Pass Location1

Note:

1. Measurement taken is within the uncertainty of measurement system.

2. TC is short for test configuration

3. NT is short for not tested. The equipment under test (EUT) has been exempted from immunity tests for power frequency of magnetic fields because the device does not contain any components that are susceptible to magnetic fields.

4. The item has been tested; The item has not been tested.



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3 Equipment Specification

3.1 General Description

The The TP48200E is outdoor power supply for communications. It converts AC power into stable -48V DC power, and implements monitoring and provides backup power. With the compact design, intelligent monitoring, flexible backup of power, and smooth expansion of capacity, it is applicable to various scenarios and power for outdoor microwave equipment. 3.2 Specification

Table 2 Main equipment specification

Rated Input Voltage ~200-240 V; W+N+PE; 50/60 Hz ~200-240V/346-415V, 3W+N+PE;50/60Hz

Rated Power (W) 10700 W

Dimensions (W x D x H) 650 mm (W) x 650 mm (D) x 900 mm (H)

Weight (kg) 70 kg

Frequency of the Internal Source (MHz)

100~250 kHz; 16 MHz; 20 MHz; 24 MHz; 25 MHz

Figure 1. EUT appearance（TP48200E-D09A1）



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Figure 2. EUT appearance（TP48200E-H09A1）



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3.3 Boards and Subassemblies

Table 3 Board list

Board

Board Name Hardware

Version Description

WD22DLPC VER.C DC power lightning protection board

PW31PCBB VER.D Power system backboard

EN21DETA01 VER.E User Interface board

EN21AFBA01 VER.F Two level of shutting down electricity in system detect black board

GM51DFIU VER.D Fan Interface board

Table 4 Subassembly list

Subassembly

Subassembly

Name Model Manufacturer Description

Power Supply

Unit R4850N1 HUAWEI Rectifier

Site Monitor Unit SMU02B HUAWEI Power monitor unit

Heater HAU03A-01

ZYT /

Zhuhai Jiayi

Electronic

Technology

Co.,Ltd

Heater

Cabinet TP48200E HUAWEI Cabinet



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4 System Configuration during EMC Test

The Equipment under Test (EUT) functions correctly during all tests. The EUT was installed within the test site and was configured to simulate a typical configuration. 4.1 Ports and Cables

Table 5 Ports and cables

Port Quantity Length (m) Connector Cable Type

AC Input Power Port

1 3 N/A Unshielded

DC Output Power Port

1 3 N/A Unshielded

FE 1 3 RJ45 Unshielded

Earth 1 3 N/A Unshielded

4.2 Auxiliary Equipment

Table 6 Auxiliary equipment

Equipment Model Manufacturer S/N Calibration Date

Calibration Interval (Month)

Digital Phosphor Oscilloscope

TDS5104B Tektronix B044178 2011-12-13 12

Resistance BP-300 Huawei N/A N/A N/A

Personal Computer PIII1G/128M/

30G/15" LEGEND N/A N/A N/A

4.3 Test Configurations

The EUT was connected to auxiliary equipment in order to simulate normal operating conditions (with reference to the guidance given in the standard for this type of equipment). There were two test configurations. TC1 and TC2 were shown in the following tables and figures:

Table 7 Test configuration

Configuration No. Configuration Description

TC1 TP48200E-D09A1: AC+DC distribution, R4850N1 rectifiers, monitor board and direct cooling module.

TC2 TP48200E-H09A1: AC+DC distribution, R4850N1 rectifiers, monitor board and heat exchanger module.



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AC + DC

distribution frame

PSU PSU PSU PSU

Space for customer

equipments

Direct

Cooling

SMU02B

Figure 3. : Test configuration1 (TC1)

AC + DC

distribution frame

PSU PSU PSU PSU

Space for customer

equipments

Heater

Exchanger

SMU02B

Figure 4. : Test configuration2 (TC2)



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4.4 Test Conditions and Connections

The TP48200E convert the AC input voltage into -48V DC output voltage; then supply the DC loads.

TP48200E

~ AC SUPPLY

PE

ResistanceDC

OUTPUT

PC

FE

Figure 5. Test connection



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5 Immunity Performance Criteria

During immunity test, the EUT is monitored for compliance against the performance criteria. The "pass / fail" performance criterion to be used during testing is detailed below: 5.1 Performance Criterion A

The apparatus shall continue to operate as intended. No degradation of performance or loss of function is allowed below a performance level specified by the manufacturer when the apparatus is used as intended. In some cases the performance level may be replaced by a permissible loss of performance. If the minimum performance level or the permissible performance loss is not specified by the manufacturer, then either of these may be deduced from the product description and documentation and what the user may reasonably expect from the apparatus if used as intended. 5.2 Performance Criterion B

The apparatus shall continue to operate as intended after the test. No degradation of performance or loss of function is allowed below a performance level specified by the manufacturer, when the apparatus is used as intended. In some cases the performance level may be replaced by a permissible loss of performance. During the exposure to an electromagnetic phenomenon, degradation of performance is, however, allowed. No change of actual operating state or stored data is allowed. If the minimum performance level or the permissible performance loss is not specified by the manufacturer, then either of these may be deduced from the product description and documentation and what the user may reasonably expect from the apparatus if used as intended. 5.3 Performance Criterion C

Temporary loss of function is allowed, provided the function is self-recoverable or can be restored by the operation of the controls, or, in the case of switching equipment, by normal subsequent use.



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6 Electromagnetic Interference (EMI)

6.1 Radiated Emission 30 MHz to 1 GHz

6.1.1 Test Procedure

The test site semi-anechoic chamber has met the requirement of NSA tolerance 4 dB in accordance with the standard CISPR 16-1-4:2010. The test distance was 10 m for 30 MHz to 1 GHz. The set-up and test methods were in accordance with EN 55022/CISPR 22 standards A preliminary scan and a final scan of the emissions were made from 30 MHz to by using test software script; the emissions were measured using Quasi-Peak Detector (30 MHz to 1 GHz). The maximal emission value was acquired by adjusting the antenna height, polarisation and turntable azimuth in accordance with the software set-up. Normally, the antenna height ranged from 1 m to 4 m, and the turntable azimuth ranged from 0°to 360°, The receive antenna has two polarizations: Vertical and Horizontal. The set-up and test methods were in accordance with EN 55022/CISPR 22 standards. The test set-up diagram is shown as below:

AE

Ferrite Clamp

Semi-Anechoic Chamber

Antenna

Preamplifier

Receiver

EUT

MA

X:4

m

MIN

:1 m

signal cable

H=0.1m GRP

Figure 6. Test set-up of radiated disturbance (30MHz-1GHz) 6.1.2 Test Results

The EUT has met the requirements for radiated emission of the enclosure port. For the test data, see section 10.1.

Table 8 Test limits of 30 MHz to 1 GHz

Frequency range 30 MHz to 1 GHz

Measuring distance 10 m

Classification Class B

Limits(Class B) 30 MHz to 230 MHz 30 dBµV/m 230 MHz to 1 GHz 37 dBµV/m

Note: The highest frequency of the internal sources of the EUT is 25 MHz, the measurement was made up to 1GHz.



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6.2 Conducted Emission 0.15 MHz to 30 MHz


The EUT was configured as described in section 4. The mains cable of the EUT must be connected to LISN. The LISN shall be placed 0.8 m from the boundary of EUT and bonded to a ground reference plane for LISN mounted on top of the ground reference plane. This distance is between the closest points of the LISN and the EUT. All other units of the EUT and associated equipment shall be at least 0.8 m from the LISN. All telecommunication and signal ports must be correctly terminated using either appropriate associated equipment or a representative termination during the measurement of the conducted disturbances at the mains. Ground connections, where required for safety purposes, shall be connected to the reference ground point of the LISN and, where not otherwise provided or specified by the manufacturer, shall be of same length as the mains cable and run parallel to the mains connection at a separation distance of not more than 0.1 m. The set-up of conducted disturbance for telecommunication port and power ports were in accordance with EN 55022/CISPR 22 standards. The test set-up diagram is shown as below:

h≤15cmh≤15cm

ISN

EUT

AE

Shielding room

GRP

ReceiverLISN

80cm

Figure 7. Test set-up of conducted disturbance for telecommunication port (unshielded cable)



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EUT

LISN

AC Input P

ower

Power input

GRP

Receiver

Shielding room

Grouding cable:

Reistance

DC Output Power

Cable

h≤15cm

10 CM

0.8m

Figure 8. Test set-up of conducted disturbance for AC input power port

EUT

LISN

Power Input

Cable

Power

GRP

Resistance

Shielding Room

LISN

Power Output

Cable

ReceiverGrounding

Cable

h≤15cm

10 CM

0.8 cm

Figure 9. Test set-up of conducted disturbance for DC output power port

6.2.2 Test Results

The EUT has met requirements for conducted disturbance. For the test data, see section 10.2.

Table 9 Limits of telecommunication ports

Frequency Range 150 kHz to 30 MHz

Port FE


Limits (Class B) Voltage limits (dBµV) Current limits (dBμA)

QP AV QP AV

0.15 to 0.5 MHz 84 to 74 74 to 64 40 to 30 30 to 20

0.5 to 30 MHz 74 64 30 20



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Table 10 Limits of AC input power port



Limit (Class B) Voltage limits (dBµV)

QP AV

0.15 MHz to 0.5 MHz 66 to 56 56 to 46

0.5 MHz to 5 MHz 56 46

5 to MHz 30 MHz 60 50

Table 11 Limits of DC output power port


Classification Class A

Limits (Class A) (Frequency)

Voltage limits (dBµV)

QP AV

0.15 MHz to 0.5 MHz 79 66

0.5 MHz to 30 MHz 73 60



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6.3 Current Harmonics Emissions


The EUT is to be powered from a clean (low distortion) 400V 50Hz AC Input Power Port source. The EUT was configured as described in section 4 for this test. The set-up and test methods were in accordance with the standards EN 61000-3-12/IEC 61000-3-12.

EUTAE

GRP

AC InputTest

Instrument

Figure 10. Test set-up of current harmonics emission test

6.3.2 Test Results

The EUT has met the requirements (Current emission limits for equipment other than balanced three-phase equipment) of EN 61000-3-12/IEC 61000-3-12 for harmonics of AC Input Power Port.

The test data see section 10.3 of this report. 6.4 Voltage Fluctuations and Flicker


The EUT is to be powered from a clean (low distortion) 400V 50Hz AC power source. The EUT was configured as described in section 4 for this test. The formal test ran 10mins and over a 2 hour period. The values of Plt, Pst, d (t), dmax and dc is measured. The set-up and test methods were in accordance with the standards EN 61000-3-11/IEC 61000-3-11.

EUTAE

GRP

AC InputTest

Instrument

Figure 11. Test set-up of voltage fluctuations test

6.4.2 Test Results

The EUT has met the requirements of EN 61000-3-11/IEC 61000-3-11 for voltage fluctuations of AC input power port. For the test data, see section 10.4 in this report.



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7 Electromagnetic Susceptibility (EMS)

7.1 Electrostatic Discharge


The EUT was configured as described in section 4. The set-up and test methods were in accordance with IEC 61000-4-2 standard. The test environment condition was recorded in the following table.

Table 12 Test environment condition during ESD test

Ambient temperature 25C

Relative humidity 50%

Atmospheric pressure 101kPa

The test set-up diagram is shown as below:

EUT

AE

Insulating support H=10cm

ESD Gun

Decoupling

Device

GRP

ESD

generater

>20cm

Figure 12. Test set-up of electrostatic discharge

7.1.2 Test Results The EUT has met the requirements of Performance Criterion B defined in section 5. All of the discharge points were presented in the table below. Each discharge point was tested 20 times (10 times respectively for positive and negative), and the minimum discharge interval was 1 second.

Table 13 Test results

Test Points

Specification Level

Conclusion ±2 kV,±4 kV, ±6 kV, Contact Discharges

±2 kV,±4 kV, ±8 kV, Air Discharges

Positive Negative Positive Negative

Vertical coupling plane-front √ √ N/A N/A Pass

Vertical coupling plane-rear √ √ N/A N/A Pass

Vertical coupling plane-left √ √ N/A N/A Pass

Vertical coupling plane-right √ √ N/A N/A Pass

Rack/Cabinet enclosure √ √ N/A N/A Pass

Connectors √ √ N/A N/A Pass

Screw of frames √ √ N/A N/A Pass

Board panels √ √ N/A N/A Pass

Board gap N/A N/A √ √ Pass

Radiator hole N/A N/A √ √ Pass

Indication lamp N/A N/A √ √ Pass

Note: "√" The EUT's performance was not impaired at this test point when the electrostatic discharge (ESD) pulse was applied.



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7.2 Immunity to Radiated Electric Fields 80 MHz to 2700 MHz


The EUT was configured as described in section 4. The set-up and test methods were in accordance with IEC 61000-4-3 standard. All sides of the EUT (front, rear, left and right) were tested using an antenna with vertical and horizontal polarization. The test set-up diagram is shown as below:

Chamber

GeneratorAEDecoupling

Device

Uniform field area

Signal

Cable

Anechoic material 1.55m

Antenna

Power

Amplifier

Antenna calibration point

GRP

EUT0

.8m

Figure 13. Test Set-up of Immunity to Radiated Electric Fields

7.2.2 Test Results

The EUT has met the requirements of Performance Criterion A defined in section 5 for Immunity to Radiated Electric Fields of enclosure port.

Table 14 Test results

Test Side of EUT Front, rear, left and right

Frequency Range and Test Level

80 MHz to 1000 MHz test level: 10 V/m (unmodulated, rms) 1000 MHz to 2700 MHz test level: 10 V/m (unmodulated, rms)

Test distance 3m (10m chamber)

Modulation Method 80% amplitude modulation at 1kHz sine wave

Swept-Frequency Dwell Time 1 second

Maximum Step Size 1%

Special Frequency Points 80 MHz, 120 MHz, 160 MHz; 230 MHz; 434 MHz; 450 MHz;460 MHz; 600 MHz; 850 MHz; 863 MHz; 900 MHz; 1800 MHz; 1950MHz; 2100 MHz and 2400 MHz (±1%).

Special Frequencies Dwell Time 60 seconds

Criterion A

Conclusion Pass



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7.3 Immunity to Electrical Fast Transient Bursts


The EUT was configured as described in section 4. A series of fast transient bursts meeting the specification were applied for a period of 120 seconds. The transient bursts were applied for both Positive and Negative Burst Trains to each type of signal port and power port. The set-up and test methods were in accordance with IEC 61000-4-4 standard.

Table 15 Parameter for single pulse and fast transient /burst

Rise Time of Single Pulse (Tr) 5 ns

Duration of Single Pulse (Th) 50 ns

Pulse Repetition Rate 5 kHz

Burst Duration 15 ms

Burst Period 300 ms


Decoupling

network

EUT

Insulation

H=10cm

GRP

L=50±5cm

Resistance

GND

EFT

Generator

Coupling and

Decoupling

Network

AC Input Power

Insulation

H=10cm

DC Output Power

Insulation

H=10cm

Figure 14. Test set-up of electrical fast transient bursts for AC input power port

EUT

Insulation

H=10cm

GRP

L=50±5cm

Resistance

EFT

Generator

Coupling and

Decoupling

Network

AC Input Power

Insulation

H=10cm

DC Output PowerDecoupling

network

Insulation

H=10cm

Figure 15. Test set-up of electrical fast transient bursts for DC Output power port

H=10cm

Capacitive

Coupling Clamp EUT

Insulation

H=10cm

GRP

Auxiliary

Equipment

Injection Cable

EFT

Generator

Insulation H=10cm L=50±5cm

Signal cableDecoupling

network

Signal

cable

Insulation H=10cm

Figure 16. Test set-up of electrical fast transient bursts for signal ports

7.3.2 Test Results

The EUT has met the requirements of Performance Criterion B defined in section 5. Table 16 Test results of signal ports

Port Measuring Condition Description Conclusion

Outdoor signal ports

FE Common mode coupling Level: ±1 kV, Duration: 2 minutes

No failure detected

Pass



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Table 17 Test results of AC input power port

Ports Measuring Condition Couple Mode Description Conclusion

AC input power port

Common mode coupling Level: ±1 kV/2 kV,

Duration: 2 minutes

L N

PE L+N

L+PE N+PE

L+N+PE

No failure detected

Pass

Table 18 Test results of DC output power port

Ports Measuring Condition Couple Mode Description Conclusion

DC output power port

Common mode coupling Level: ±1 kV/2 kV,

Duration: 2 minutes

–48V RTN PE

–48V+RTN RTN+PE –48V+PE

–48V+RTN+PE

No failure detected

Pass

Note: RTN is short for return lead



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7.4 Immunity to Surges


The EUT was configured as described in section 4. The set-up and test methods were in accordance with IEC 61000-4-5 standard. The test set-up diagram is shown as below:

Surge Test InstrumentAC Input Power

L≤2mPGND

EUTPGND

ResistanceDC Output Power

GRP

Figure 17. Test set-up of immunity to surge for AC input power port

AC Power InputSurge Test

Instrument

GRP

EUTDC Power Output

PGND

Resistance

PGND

Figure 18. Test set-up of immunity to surge for DC output power port

Surge Test Instrument

Power cable

Signal cable

PGND

EUT

PGND

AESignal cable

RGP

Figure 19. Test set-up of immunity to surge for signal port

7.4.2 Test Results

The EUT has met the requirements of Performance Criterion B defined in section 5.

Table 19 Test results of signal ports

Ports Measuring Condition Description Conclusion

outdoor signal ports

FE

Line to ground Level: ±1 kV/2 kV, repeat 5 times each Polarity Tr/Th:1.2/50 μs Interval: 60 seconds

No failure detected

Pass



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AC input power port

Line to line: L-N Level:±1 kV/2 kV, repeat 5 times each polarity Tr/Th:1.2/50 μs Interval: 60 seconds Phase: Sync /0°, 90°,180°,270°

Line to ground: L-PE,N-PE,L+N-PE Level:±1 kV/2 kV/4 kV , repeat 5 times each polarity Tr/Th:1.2/50 μs Interval: 60 seconds Phase: Sync /0°, 90°,180°,270°

No failure detected

Pass



DC output power port

Line to line,-48V-RTN Level: ±1 kV/2 kV, repeat 5 times each polarity Tr/Th:1.2/50 μs Interval: 60 seconds Phase: Asyn

Line to ground, -48V-PE,RTN-PE Level: ±1 kV/2 kV/4 kV, repeat 5 times each Polarity Tr/Th:1.2/50 μs Interval: 60 seconds Phase: Asyn

No failure detected

Pass

Note: RTN is short for return lead



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7.5 Immunity to Continuous Conducted Interference 0.15 MHz to 80 MHz


The EUT was configured as described in section 4. The applied level was amplitude modulated by a 1 kHz sinusoidal signal to a modulation depth of 80%. The set-up and test methods were in accordance with IEC 61000-4-6 standard.

Table 22 Test requirements

Sweep Frequency Range 0.15 MHz to 80 MHz

Field Modulation 80% amplitude modulation at 1kHz sine wave

Maximum Step Size 1%

Swept-Frequency Dwell Time 1 second

Special Frequency points 0.2 MHz; 1.0 MHz; 7.1 MHz; 13.56 MHz; 21.0 MHz; 27.12 MHz;

40.68 MHz; 250 kHz; 16 MHz; 20 MHz; 24 MHz; 25 MHz.

Special Frequency Dwell Time 60 seconds


30mm<h<50mm 30mm<h<50mm

EUT50Ω

GRP

Shielding room

CDN1Test

generatorCDN3

Resistan

ce

0.1m

support

AC input Power

CDN4 CDN2

6dB

Attenuator

30mm<h<50mm

DC Output Power

30mm<h<50mm

0.1m<L<0.3m

PGND

The cable connected to the EUT: red is power cable; green is earthing cable; black is signal cable

Figure 20. Test set-up of immunity to continuous conducted interference for AC input power port

30mm<h<50mm 30mm<h<50mm

EUT50Ω

GRP

Shielding room

CDN1Test

generatorCDN3

Resistan

ce

0.1m

support

AC Input Power

CDN4 CDN2

6dB

Attenuator

30mm<h<50mm

DC Output

Power

30mm<h<50mm

10mm<L<30mm

PGND

The cable connected to the EUT: red is power cable; green is earthing cable; black is signal cable

Figure 21. Test set-up of immunity to continuous conducted interference for DC output power port



Page 27 of 51

50mm>h>30mm50mm>h>30mm

EUT

Shielding room

0.1m support

6dB

Attenuator

Test

generator

AE

EM Clamp CDN1

0.1m<L<0.3m

CDN2

50Ω

50mm>h>30mmGRP

Power

input

The cable connected to the EUT: red is signal cable; green is earth cable; black is power cable

Figure 22. Test set-up of immunity to continuous conducted interference for unshielded cable

7.5.2 Test Results

The EUT has met the requirements of Performance Criterion A for Immunity to Continuous Conducted Interference

Table 23 Test results of signal ports

Port Test Level

(Unmodulated) Coupling Method Description Conclusion

Outdoor signal ports

FE 3 V (rms) EM clamp No failure detected

Pass


Ports Test Level

(Unmodulated) Inject Method Description Conclusion

AC input power port 10 V (rms) CDN-M3 No failure detected

Pass

Earthing 10 V (rms) CDN-M1 No failure detected

Pass


Ports Test Level

(Unmodulated) Inject Method Description Conclusion

DC output power port 10 V (rms) CDN-M2 No failure detected

Pass

Earthing 10 V (rms) CDN-M1 No failure detected

Pass



Page 28 of 51

7.6 Immunity to Voltage Dips and Short Interruption of AC Power Port


The EUT was configured as described in section 4. The set-up and test methods were in accordance with IEC 61000-4-11 standard. The test set-up diagram is shown as below:

EUT

Insulation

GRP

Test

InstrumentAC cable

Insulation

Figure 23. Test set-up of voltage dips and short interruption of AC power port

7.6.2 Test Results

The EUT has met the requirements of performance criterion defined in section 5. Table 26 Test results

Ports Measuring Requirement Performance Criterion Description Conclusion

AC power port

0% residual voltage Duration: 10 ms Interval:10 s Phase: 0º, 45º, 90º, 135º, 180º, 225º, 270º, 315º 3 times each phase

B With battery Without battery

No failure detected

Pass

0% residual voltage Duration 20 ms Interval:10 s Phase: 0º, 45º, 90º, 135º, 180º, 225º, 270º, 315º 3 times each phase


No failure detected

Pass



No failure detected

Pass


C With battery Without battery

No failure detected

Pass



Page 29 of 51

8 Main Test Instruments

Table 27 Main test instruments

Test Item

Test Instrument Model Manufacturer Calibration

Date

Calibration Interval (Month)

Radiated emission (K3 10m chamber)

EMI test receiver ESU26 R&S 2012-05-14 12

Bilog antenna CBL6112D

(30994) TESEQ 2012-01-23 12

Chamber _NSA 10m chamber Albatross 2011-03-05 24

Conducted emission

EMI test receiver ESCI R&S 2012-05-14 12

Artificial mains network

ENV4200 R&S 2012-05-14 12

Artificial mains network

NNLK8121 Schwarzbeck 2012-05-14 12

Impedance stabilization

network ISN T400A Schaffner 2012-05-14 12

Current harmonics

voltage fluctuation

and flicker (K3)

Programmable AC source

MX45-3PI California

Instruments 2012-02-21 12

Power analysis and conditioning System

OMNI3-37MX&3-75

California Instruments

2012-02-21 12

Electrostatic discharge

ESD simulator PESD3010 HAEFELY 2011-08-03 12

Immunity to radiated

electric fields (K3

10m chamber)

Signal generator N5183A Agilent 2012-05-14 12

Broadband antenna AT5080 Amplifier Research

N/A N/A

Broadband antenna SLTP 9149 Schwarzbeck N/A N/A

Amplifier 500W1000A Amplifier Research

2012-05-14 12

Amplifier 120S1G4 Amplifier Research

2012-05-14 12

Chamber_FU 2m turntable Albatross 2012-02-15 12

Electrical fast

transient bursts

Coupling clamp CDN126 Schaffner 2012-05-14 12

Fast transient burst simulator

NSG2025 Schaffner 2012-05-14 12

SURGE High energy pulse

generator PSURGE

8000 HAEFELY 2011-12-02 12

Immunity to continuous conducted

interference

Signal generator SMY01 R&S 2012-05-14 12

Amplifier 250A250 Amplifier Research

2012-05-14 12

Coupling decoupling network

CDN-801-M2/M3

LUTHI 2012-05-14 12



Page 30 of 51

Coupling decoupling network

CDN-M1/32 EMTEST 2012-05-14 12

Electromagnetic clamp

EM101 LUTHI 2012-05-14 12

6dB attenuator 75A-FFN-06 Bird 2012-05-14 12

Voltage dips and

short interruptions of AC

power ports

AC DIP simulator UCS500 M6B EMTEST 2012-05-14 12

AC variac MV2616 EMTEST 2012-05-14 12

Software Information

Test Item Software

Name Manufacturer Version

Radiated emission EP5 Toyo V5.3

Conducted emission ES-K1 R&S V1.7.1

Immunity to radiated electric fields

IM5 Toyo V5.2

Immunity to continuous conducted interference

EMS-K1 R&S V1.20SR2

Current harmonics &voltage fluctuations and flickers

(K3)

CTSMXH (Current>16A)

California Instruments

V1.3.0.26



Page 31 of 51

9 System Measurement Uncertainty

For a 95% confidence level, the measurement extended uncertainties for defined systems, in accordance with the recommendations of ISO 17025 were:

Table 28 System measurement uncertainty

Items Extended Uncertainty

Radiated emission (K3 10m chamber)

Field strength (dBµV/m) U=4.8 dB; k=2 (30MHz to 1GHz)

Conducted emission Disturbance voltage

(dBμV) U=3.3dB; k=2

Harmonic current emission I (A) U=5.2%; k=2

Voltage fluctuations and flicker

Pst U=5.8%; k=2

Plt U=5.8%; k=2

dc U=0.6%; k=2

dmax U=5.4%; k=2

dt U=0.6%; k=2

Electrostatic discharge Voltage (V) U=11%; k=2

Immunity to radiated electric fields (K3 10m chamber)

Field strength (V/m) U=30%; k=2

Electrical fast transient bursts Voltage (V) U=14%; k=2

SURGE Voltage (V) U=4.6%; k=2

Immunity to continuous conducted interference

Voltage(V) U=30%; k=2

Voltage dips and short interruptions of AC power ports

U (V) U=5.2%; k=2



Page 32 of 51

10 Graph and Data of Emission Test

10.1 Radiated Disturbance

10.1.1 Radiated Disturbance

Measurement Result: QP Detector

Note: 1. Result=Reading level by receiver + c.f (Antenna factor + cable loss – preamplifier gain). 2. The TC1 and TC2 were tested, the worse result is supplied.



Page 33 of 51

10.2 Conducted Disturbance

10.2.1 FE Port Test Data


Frequency Level Transd Limit Margin Line PE (MHz) (dBµV) (dB) (dBµV) (dB)

0.753000 43.50 10.4 74 30.5 --- ---

4.515000 54.10 10.7 74 19.9 --- ---

23.127000 62.70 11.1 74 11.3 --- ---

Measurement Result: AV Detector


0.501000 43.30 10.4 64 20.7 --- ---

4.020000 47.80 10.7 64 16.2 --- ---

23.127000 59.50 11.1 64 4.5 --- ---

Note: 1. Level= Reading level+ Transd (cable loss + correction factor) The reading level is used to calculate by software which is not shown in the sheet. 2. The TC1 and TC2 were tested, the worse result is supplied.

0

20

40

60

80

100

Level [dBµV]

150k 300k 500k 1M 2M 3M 5M 7M 10M 30M

Frequency [Hz]

+ +

+

x

x

x



Page 34 of 51

10.2.3 AC Input Power Port Test Data



0.150000 33.40 9.9 66 32.6 L1 GND

0.658500 39.00 9.9 56 17.0 L1 GND

1.995000 40.10 10.1 56 15.9 L1 GND

2.544000 45.90 10.1 56 10.1 L1 GND

11.224500 30.50 10.2 60 29.5 N GND

20.809500 28.70 10.6 60 31.3 L3 GND



0.204000 41.50 9.9 53 11.9 N GND

0.690000 33.30 9.9 46 12.7 L1 GND

2.062500 32.60 10.1 46 13.4 L1 GND

2.346000 33.80 10.1 46 12.2 L1 GND

11.224500 28.60 10.2 50 21.4 N GND

16.228500 41.30 10.5 50 8.7 L3 GND


0

10

20

30

40

50

60

70

80

Level [dBµV]

150k 300k 500k 1M 2M 3M 5M 7M 10M 30M

Frequency [Hz]

+

+ + +

+

+

x

x x

x

x x



Page 35 of 51

10.2.4 DC Output Power Port Test Data



0.190500 64.30 9.9 79 14.7 L1 GND

0.397500 59.50 9.9 79 19.5 L1 GND

1.842000 50.30 10.0 73 22.7 L1 GND

4.411500 50.70 10.2 73 22.3 L1 GND

11.089500 48.90 10.2 73 24.1 L1 GND

15.522000 44.20 10.5 73 28.8 L1 GND



0.186000 57.90 9.9 66 8.1 L1 GND

0.375000 53.40 9.9 66 12.6 L1 GND

1.675500 37.80 10.0 60 22.2 L1 GND

4.407000 35.00 10.2 60 25.0 L1 GND

11.071500 37.10 10.2 60 22.9 L1 GND

15.742500 36.20 10.5 60 23.8 L1 GND


0

10

20

30

40

50

60

70

80

Level [dBµV]

150k 300k 500k 1M 2M 3M 5M 7M 10M 30M

Frequency [Hz]

+ +

+ + + +

x x

x x x x



Page 36 of 51

10.3 Current Harmonics

10.3.1 Test Data of Harmonic Current

Voltage/ Frequency 400 V / 50 Hz

Phase A: Rsce=33 I1=23.32A

THD (%) THD Limit (%) PWHD (%) PWHD Limit (%)

3.562 23.000 6.465 23.000

Harm# Harms (avg)

100% Limit

% of Limit Harms (max)

150% Limit

% of Limit Status

2 0.056 1.868 3.0 0.248 2.802 8.87 Pass

3 0.529 5.044 10.5 0.658 7.565 8.70 Pass

4 0.022 0.934 2.4 0.099 1.401 7.05 Pass

5 0.236 2.498 9.4 0.263 3.748 7.01 Pass

6 0.016 0.623 2.6 0.064 0.934 6.83 Pass

7 0.445 1.681 26.5 0.478 2.522 18.94 Pass

8 0.017 0.467 3.7 0.046 0.700 6.61 Pass

9 0.156 0.887 17.6 0.191 1.331 14.36 Pass

10 0.026 0.374 6.9 0.044 0.560 7.78 Pass

11 0.129 0.724 17.9 0.154 1.086 14.14 Pass

12 0.019 0.311 6.2 0.036 0.467 7.70 Pass

13 0.120 0.467 25.8 0.151 0.700 21.56 Pass

14 0.016 N/A N/A 0.028 N/A N/A N/A

15 0.112 N/A N/A 0.148 N/A N/A N/A

16 0.020 N/A N/A 0.030 N/A N/A N/A

17 0.114 N/A N/A 0.134 N/A N/A N/A

18 0.015 N/A N/A 0.026 N/A N/A N/A

19 0.104 N/A N/A 0.131 N/A N/A N/A

20 0.013 N/A N/A 0.023 N/A N/A N/A

21 0.090 N/A N/A 0.112 N/A N/A N/A

22 0.018 N/A N/A 0.025 N/A N/A N/A

23 0.080 N/A N/A 0.100 N/A N/A N/A

24 0.016 N/A N/A 0.022 N/A N/A N/A

25 0.081 N/A N/A 0.093 N/A N/A N/A

26 0.018 N/A N/A 0.026 N/A N/A N/A

27 0.074 N/A N/A 0.085 N/A N/A N/A

28 0.019 N/A N/A 0.024 N/A N/A N/A

29 0.072 N/A N/A 0.085 N/A N/A N/A

30 0.016 N/A N/A 0.022 N/A N/A N/A

31 0.086 N/A N/A 0.100 N/A N/A N/A

32 0.016 N/A N/A 0.022 N/A N/A N/A

33 0.078 N/A N/A 0.092 N/A N/A N/A

34 0.015 N/A N/A 0.021 N/A N/A N/A



Page 37 of 51

35 0.073 N/A N/A 0.094 N/A N/A N/A

36 0.014 N/A N/A 0.020 N/A N/A N/A

37 0.071 N/A N/A 0.091 N/A N/A N/A

38 0.014 N/A N/A 0.020 N/A N/A N/A

39 0.046 N/A N/A 0.067 N/A N/A N/A

40 0.014 N/A N/A 0.020 N/A N/A N/A



Page 38 of 51

Phase B: Rsce=33, I1=11.6A


3.457 23.000 6.866 23.000

Harm# Harms (avg)

100% Limit

% of Limit Harms (max)

150% Limit

%of Limit Status

2 0.022 0.924 2.4 0.202 1.386 14.58 Pass

3 0.238 2.495 9.5 0.341 3.742 9.11 Pass

4 0.012 0.462 2.6 0.055 0.693 7.87 Pass

5 0.093 1.236 7.5 0.112 1.854 6.05 Pass

6 0.008 0.308 2.7 0.033 0.462 7.17 Pass

7 0.221 0.832 26.6 0.230 1.247 18.43 Pass

8 0.008 0.231 3.4 0.029 0.346 8.38 Pass

9 0.086 0.439 19.6 0.113 0.658 17.21 Pass

10 0.013 0.185 7.1 0.033 0.277 11.78 Pass

11 0.068 0.358 18.9 0.076 0.537 14.06 Pass

12 0.012 0.154 7.7 0.024 0.231 10.44 Pass

13 0.065 0.231 27.9 0.088 0.346 25.51 Pass

14 0.010 N/A N/A 0.019 N/A N/A N/A

15 0.062 N/A N/A 0.074 N/A N/A N/A

16 0.012 N/A N/A 0.020 N/A N/A N/A

17 0.062 N/A N/A 0.078 N/A N/A N/A

18 0.009 N/A N/A 0.017 N/A N/A N/A

19 0.061 N/A N/A 0.076 N/A N/A N/A

20 0.008 N/A N/A 0.015 N/A N/A N/A

21 0.051 N/A N/A 0.061 N/A N/A N/A

22 0.009 N/A N/A 0.016 N/A N/A N/A

23 0.045 N/A N/A 0.056 N/A N/A N/A

24 0.008 N/A N/A 0.014 N/A N/A N/A

25 0.047 N/A N/A 0.055 N/A N/A N/A

26 0.007 N/A N/A 0.012 N/A N/A N/A

27 0.040 N/A N/A 0.049 N/A N/A N/A

28 0.007 N/A N/A 0.013 N/A N/A N/A

29 0.032 N/A N/A 0.041 N/A N/A N/A

30 0.008 N/A N/A 0.013 N/A N/A N/A

31 0.042 N/A N/A 0.053 N/A N/A N/A

32 0.009 N/A N/A 0.014 N/A N/A N/A

33 0.040 N/A N/A 0.049 N/A N/A N/A

34 0.009 N/A N/A 0.013 N/A N/A N/A

35 0.028 N/A N/A 0.040 N/A N/A N/A

36 0.010 N/A N/A 0.014 N/A N/A N/A

37 0.033 N/A N/A 0.045 N/A N/A N/A

38 0.011 N/A N/A 0.015 N/A N/A N/A

39 0.026 N/A N/A 0.037 N/A N/A N/A

40 0.010 N/A N/A 0.015 N/A N/A N/A



Page 39 of 51

Phase C: Rsce=33, I1=11.6A


3.425 23.000 6.001 23.000

Harm# Harms (avg)

100% Limit

%of Limit Harms (max)

150% Limit

%of Limit Status

2 0.023 0.933 2.5 0.172 1.400 12.26 Pass

3 0.249 2.520 9.9 0.323 3.780 8.54 Pass

4 0.016 0.467 3.4 0.053 0.700 7.63 Pass

5 0.092 1.248 7.4 0.110 1.873 5.88 Pass

6 0.010 0.311 3.2 0.035 0.467 7.46 Pass

7 0.218 0.840 26.0 0.232 1.260 18.37 Pass

8 0.009 0.233 4.1 0.027 0.350 7.60 Pass

9 0.085 0.443 19.2 0.109 0.665 16.41 Pass

10 0.015 0.187 8.3 0.027 0.280 9.56 Pass

11 0.074 0.362 20.6 0.081 0.543 14.98 Pass

12 0.016 0.156 10.5 0.031 0.233 13.39 Pass

13 0.065 0.233 27.7 0.085 0.350 24.24 Pass

14 0.011 N/A N/A 0.021 N/A N/A N/A

15 0.063 N/A N/A 0.075 N/A N/A N/A

16 0.014 N/A N/A 0.021 N/A N/A N/A

17 0.063 N/A N/A 0.080 N/A N/A N/A

18 0.011 N/A N/A 0.019 N/A N/A N/A

19 0.055 N/A N/A 0.070 N/A N/A N/A

20 0.009 N/A N/A 0.018 N/A N/A N/A

21 0.047 N/A N/A 0.059 N/A N/A N/A

22 0.011 N/A N/A 0.020 N/A N/A N/A

23 0.043 N/A N/A 0.055 N/A N/A N/A

24 0.010 N/A N/A 0.019 N/A N/A N/A

25 0.040 N/A N/A 0.050 N/A N/A N/A

26 0.009 N/A N/A 0.017 N/A N/A N/A

27 0.033 N/A N/A 0.043 N/A N/A N/A

28 0.009 N/A N/A 0.017 N/A N/A N/A

29 0.029 N/A N/A 0.037 N/A N/A N/A

30 0.009 N/A N/A 0.016 N/A N/A N/A

31 0.031 N/A N/A 0.038 N/A N/A N/A

32 0.008 N/A N/A 0.015 N/A N/A N/A

33 0.029 N/A N/A 0.038 N/A N/A N/A

34 0.009 N/A N/A 0.014 N/A N/A N/A

35 0.022 N/A N/A 0.035 N/A N/A N/A

36 0.009 N/A N/A 0.013 N/A N/A N/A

37 0.023 N/A N/A 0.035 N/A N/A N/A

38 0.010 N/A N/A 0.013 N/A N/A N/A

39 0.019 N/A N/A 0.030 N/A N/A N/A

40 0.008 N/A N/A 0.011 N/A N/A N/A

Note: TC1 and TC2 were tested, the worst result was adopted.



Page 40 of 51

10.4 Voltage Fluctuation and Flicker

10.4.1 Test Data of Voltage Fluctuation and Flicker

Voltage/ Frequency 400 V / 50 Hz

Short time (Pst) 10 min

Observation time 120 min (12 Flicker measurements)

Maximum Flicker results (Phase A)

EUT values Limit Result

Pst 0.064 1.00 Pass

Plt 0.035 0.65 Pass

dc [%] 0.000 3.30 Pass

dmax [%] 0.000 4.00 Pass

dt [s] 0.000 0.50 Pass

The maximum permissible system impedance Zsys: Z-phase A = 9.647 Ohm + j 6.029 Ohm (9.647 Ohm + 19192 H) Z-neutral A = 6.431 Ohm + j 4.020 Ohm (6.431 Ohm + 12795 H)

Maximum Flicker results (Phase B)


Pst 0.064 1.00 Pass

Plt 0.035 0.65 Pass

dc [%] 0.000 3.30 Pass

dmax [%] 0.000 4.00 Pass

dt [s] 0.000 0.50 Pass

The maximum permissible system impedance Zsys: Z-phase B = 9.647 Ohm + j 6.029 Ohm (9.647 Ohm + 19192 H) Z-neutral B = 6.431 Ohm + j 4.020 Ohm (6.431 Ohm + 12795 H)



Page 41 of 51

Maximum Flicker results (Phase C)


Pst 0.064 1.00 Pass

Plt 0.035 0.65 Pass

dc [%] 0.000 3.30 Pass

dmax [%] 0.100 4.00 Pass

dt [s] 0.000 0.50 Pass

The maximum permissible system impedance Zsys: Z-phase C = 9.647 Ohm + j 6.029 Ohm (9.647 Ohm + 19192 H) Z-neutral C = 6.431 Ohm + j 4.020 Ohm (6.431 Ohm + 12795 H)

Note: TC1 and TC2 were tested, the worse result was adopted.



Page 42 of 51

11 Photographs of Test Set-up

11.1 Emission

Radiated emission for 30 MHz to 1 GHz

Conducted emissions of AC input power port



Page 43 of 51

Conducted emissions of DC output power port

Conducted emissions of telecommunication port



Page 44 of 51

Current harmonics and voltage fluctuations (flicker)

11.2 Immunity

Immunity to radiated electric fields



Page 45 of 51

Electrostatic discharge

Immunity to electrical fast transient bursts of AC input power port



Page 46 of 51

Immunity to electrical fast transient bursts of DC output power port

Immunity to electrical fast transient bursts of signal port



Page 47 of 51

Immunity to surges of AC input power port

Immunity to surges of DC output power port



Page 48 of 51

Immunity to surges of signal port

Immunity to continuous conducted interference of AC input power port



Page 49 of 51

Immunity to continuous conducted interference of DC output power port

Immunity to continuous conducted interference of signal port



Page 50 of 51

Immunity to voltage dips, short interruption of AC power port



Page 51 of 51

Appendix: Abbreviation

Table 29 Abbreviation

Abbreviation Full Name

EMC Electromagnetic Compatibility

EMI Electromagnetic Interference

EMS Electromagnetic Susceptibility

ESD Electrostatic Discharge

EUT Equipment Under Test

AE Auxiliary Equipment

AC Alternating Current

DC Direct Current

NSA Normalized Site Attenuation

LISN Line Impedance Stabilization Network

ISN Impedance Stabilization Network

CDN Coupling and Decoupling Network

TC Test configuration

NT Not Test

N/A Not Applicable

RMS Root Mean Square

END

Documents

EMC Test Report - Huawei · EMC Test Report Product Name: Power System Product Model: TP48200E Product Type: TP48200E-D09A1 TP48200E-H09A1 Report Number: SYBH (E) 00689838EA