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SAR
2.5V VREF
SerialInterface
SDA
ComparatorS/H Amp
REF /REFIN OUT
SCL
CH0
CH1
CH2
CH3
CH4
CH5
CH6
CH7
COMA0
A1
CDAC
8-ChannelMUX
Buffer
ADS7830
www.ti.com SBAS302C DECEMBER 2003REVISED OCTOBER 2012
8-Bit, 8-Channel SamplingANALOG-TO-DIGITAL CONVERTER
with I2C InterfaceCheck for Samples: ADS7830
1FEATURES APPLICATIONS23 70kHz SAMPLING RATE VOLTAGE-SUPPLY MONITORING 0.5LSB INL/DNL ISOLATED DATA ACQUISITION 8 BITS NO MISSING CODES TRANSDUCER INTERFACE 4 DIFFERENTIAL/8 SINGLE-ENDED INPUTS BATTERY-OPERATED SYSTEMS 2.7V TO 5V OPERATION REMOTE DATA ACQUISITION BUILT-IN 2.5V REFERENCE/BUFFER
DESCRIPTION SUPPORTS ALL THREE I2C MODES:The ADS7830 is a single-supply, low-power, 8-bitStandard, Fast, and High-Speeddata acquisition device that features a serial I2C
LOW POWER: interface and an 8-channel multiplexer. The Analog-180W (Standard Mode) to-Digital (A/D) converter features a sample-and-hold300W (Fast Mode) amplifier and internal, asynchronous clock. The675W (High-Speed Mode) combination of an I2C serial, 2-wire interface and
micropower consumption makes the ADS7830 ideal DIRECT PIN COMPATIBLE WITH ADS7828for applications requiring the A/D converter to be TSSOP-16 PACKAGE close to the input source in remote locations and forapplications requiring isolation. The ADS7830 isavailable in a TSSOP-16 package.
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications ofTexas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
2I2C is a trademark of NXP Semiconductors.3All other trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date. Copyright 20032012, Texas Instruments IncorporatedProducts conform to specifications per the terms of the TexasInstruments standard warranty. Production processing does notnecessarily include testing of all parameters.
http://www.ti.com/product/ads7830?qgpn=ads7830http://www.ti.comhttp://www.ti.com/product/ads7830#samples
1
2
3
4
5
6
7
8
CH0
CH1
CH2
CH3
CH4
CH5
CH6
CH7
+VDD
SDA
SCL
A1
A0
COM
REF / REFIN OUT
GND
16
15
14
13
12
11
10
9
ADS7830
SBAS302C DECEMBER 2003REVISED OCTOBER 2012 www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled withappropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be moresusceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
ORDERING INFORMATION (1)
MAXIMUMINTEGRAL SPECIFIED
LINEARITY ERROR PACKAGE TEMPERATURE ORDERING TRANSPORTPRODUCT (LSB) PACKAGE-LEAD DESIGNATOR RANGE NUMBER MEDIA, QUANTITY
ADS7830IPWT Tape and Reel, 250ADS7830I 0.5 TSSOP-16 PW 40C to +125C
ADS7830IPWR Tape and Reel, 2500
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or visit thedevice product folder at www.ti.com.
ABSOLUTE MAXIMUM RATINGS (1)
VALUE UNIT
+VDD to GND 0.3 to +6 V
Digital Input Voltage to GND 0.3 to +VDD + 0.3 V
Operating Temperature Range 40 to +125 C
Storage Temperature Range 65 to +150 C
Junction Temperature (TJ max) +150 C
TSSOP Package
Power Dissipation (TJ max TA)/JAJA Thermal Impedance 240 C/W
(1) Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. Exposure to absolutemaximum conditions for extended periods may affect device reliability.
PIN DESCRIPTIONSPIN CONFIGURATIONPIN NAME DESCRIPTION
1 CH0 Analog Input Channel 0PW PACKAGE2 CH1 Analog Input Channel 1TSSOP-16
(Top View) 3 CH2 Analog Input Channel 2
4 CH3 Analog Input Channel 3
5 CH4 Analog Input Channel 4
6 CH5 Analog Input Channel 5
7 CH6 Analog Input Channel 6
8 CH7 Analog Input Channel 7
9 GND Analog Ground
REFIN /10 Internal +2.5V Reference, External Reference InputREFOUT
11 COM Common to Analog Input Channel
12 A0 Slave Address Bit 0
13 A1 Slave Address Bit 1
14 SCL Serial Clock
15 SDA Serial Data
16 +VDD Power Supply, 3.3V Nominal
2 Submit Documentation Feedback Copyright 20032012, Texas Instruments Incorporated
Product Folder Links: ADS7830
http://www.ti.com/product/ads7830?qgpn=ads7830http://www.ti.comhttp://www.ti.comhttp://www.go-dsp.com/forms/techdoc/doc_feedback.htm?litnum=SBAS302C&partnum=ADS7830http://www.ti.com/product/ads7830?qgpn=ads7830
ADS7830
www.ti.com SBAS302C DECEMBER 2003REVISED OCTOBER 2012
ELECTRICAL CHARACTERISTICS: +2.7VAt TA = 40C to +125C, +VDD = +2.7V, VREF = +2.5V, and SCL Clock Frequency = 3.4MHz (High-Speed Mode), unlessotherwise noted.
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
ANALOG INPUT
Full-Scale Input Scan Positive Input Negative Input 0 VREF V
Positive Input 0.2 +VDD + 0.2 VAbsolute Input Range
Negative Input 0.2 +0.2 V
Capacitance 25 pF
Leakage Current 1 A
SYSTEM PERFORMANCE
No Missing Codes 8 Bits
Integral Linearity Error 0.1 0.5 LSB (1)
Differential Linearity Error 0.1 0.5 LSB
Offset Error +0.5 +1 LSB
Offset Error Match 0.05 0.25 LSB
Gain Error 0.1 0.5 LSB
Gain Error Match 0.05 0.25 LSB
Noise 100 VRMS
Power-Supply Rejection 72 dB
SAMPLING DYNAMICS
High-Speed Mode: SCL = 3.4MHz 70 kSPS (2)
Throughput Frequency Fast Mode: SCL = 400kHz 10 kSPS
Standard Mode, SCL = 100kHz 2.5 kSPS
Conversion Time 5 s
AC ACCURACY
Total Harmonic Distortion VIN = 2.5VPP at 1kHz 72 dB(3)
Signal-to-Ratio VIN = 2.5VPP at 1kHz 50 dB
Signal-to-(Noise+Distortion) Ratio VIN = 2.5VPP at 1kHz 49 dB
Spurious-Free Dynamic Range VIN = 2.5VPP at 1kHz 68 dB
Isolation Channel-to-Channel 90 dB
VOLTAGE REFERENCE OUTPUT
TA = 40C to +85C 2.48 2.52 VRange
TA = 40C to +125C 2.47 2.53 V
TA = 40C to +85C 15 ppm/CInternal Reference Drift
TA = 40C to +125C 40 ppm/C
Internal Reference ON 110 Output Impedance
Internal Reference OFF 1 GInternal Reference ON,Quiescent Current 850 ASCL and SDA pulled HIGH
VOLTAGE REFERENCE INPUT
Range 0.05 VDD V
Resistance 1 GCurrent Drain High-Speed Mode: SCL= 3.4MHz 20 A
(1) LSB means least significant bit. When VREF = 2.5V, 1LSB is 9.8mV.(2) kSPS means kilo samples-per-second.(3) THD measured out to the 9th-harmonic.
Copyright 20032012, Texas Instruments Incorporated Submit Documentation Feedback 3
Product Folder Links: ADS7830
http://www.ti.com/product/ads7830?qgpn=ads7830http://www.ti.comhttp://www.go-dsp.com/forms/techdoc/doc_feedback.htm?litnum=SBAS302C&partnum=ADS7830http://www.ti.com/product/ads7830?qgpn=ads7830
ADS7830
SBAS302C DECEMBER 2003REVISED OCTOBER 2012 www.ti.com
ELECTRICAL CHARACTERISTICS: +2.7V (continued)At TA = 40C to +125C, +VDD = +2.7V, VREF = +2.5V, and SCL Clock Frequency = 3.4MHz (High-Speed Mode), unlessotherwise noted.
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
DIGITAL INPUT/OUTPUT
Logic Family CMOS
VIH +VDD 0.7 +VDD + 0.5 V
Logic Levels VIL 0.3 +VDD 0.3 V
VOL Minimum 3mA Sink Current 0.4 V
IIH VIH = +VDD + 0.5V 10 AInput Leakage
IIL VIL = 0.3V 10 A
Data Format Straight Binary
ADS7830 HARDWARE ADDRESS (10010 Binary)
Power-Supply Requirements
Power-Supply Voltage, +VDD Specified Performance 2.7 3.6 V
High-Speed Mode: SCL = 3.4MHz 225 320 A
Quiescent Current Fast Mode: SCL = 400kHz 100 A
Standard Mode, SCL = 100kHz 60 A
High-Speed Mode: SCL = 3.4MHz 675 1000 W
Power Dissipation Fast Mode: SCL = 400kHz 300 W
Standard Mode, SCL = 100kHz 180 W
Power-Down Mode High-Speed Mode: SCL = 3.4MHz 70 A
Fast Mode: SCL = 400kHz 25 APower-Down Mode with Wrong Address Selected
Standard Mode, SCL = 100kHz 6 A
Full Power-Down SCL Pulled HIGH, SDA Pulled HIGH 400 3000 nA
TEMPERATURE RANGE
Specified Performance 40 +125 C
4 Submit Documentation Feedback Copyright 20032012, Texas Instruments Incorporated
Product Folder Links: ADS7830
http://www.ti.com/product/ads7830?qgpn=ads7830http://www.ti.comhttp://www.go-dsp.com/forms/techdoc/doc_feedback.htm?litnum=SBAS302C&partnum=ADS7830http://www.ti.com/product/ads7830?qgpn=ads7830
ADS7830
www.ti.com SBAS302C DECEMBER 2003REVISED OCTOBER 2012
ELECTRICAL CHARACTERISTICS: +5VAt TA = 40C to +125C, +VDD = +5.0V, VREF = External +5.0V, and SCL Clock Frequency = 3.4MHz (High-Speed Mode),unless otherwise noted.
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
ANALOG INPUT
Full-Scale Input Scan Positive Input Negative Input 0 VREF V
Positive Input 0.2 +VDD + 0.2 VAbsolute Input Range
Negative Input 0.2 +0.2 V
Capacitance 25 pF
Leakage Current 1 A
SYSTEM PERFORMANCE
No Missing Codes 8 Bits
Integral Linearity Error 0.1 0.5 LSB (1)
Differential Linearity Error 0.1 0.5 LSB
Offset Error +0.5 +1 LSB
Offset Error Match 0.05 0.25 LSB
Gain Error 0.1 0.5 LSB
Gain Error Match 0.05 0.25 LSB
Noise 100 VRMS
Power-Supply Rejection 72 dB