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7/31/2019 Cmos Basic
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IA E
CMOS Basics
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MOS Transistor Behavior
Saturation Region: an imperfect switch
IDS(sat) =( n/2)(VGS-Vtn)2
n-Channel saturation current
IDS(sat) =-( p/2)(VGS-Vtp)2
p-Channel saturation current
n andp = n and p channel transistor gain
VGS = gate-to-source voltageVtn and Vtp = n- and p-channel transistor threshold
n-channel transistor turns on with positive gate voltagep-channel transistor turns on with negative gate voltage
n-channel transistor passes strong 0 but weak 1
p-channel transistor passes strong 1 but weak 0
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Basic CMOS Inverter
VSS = 0V
Let:
VDD = logic 10V = logic 0
A F
1 0
10
VDD
AF = A
Mp
Mn
SwitchModel
VDDVDD
F = 1
VSS
A=0 A=1 F = 0
VSS
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CMOS Inverter Layout
F=A
VSS
N well
p+
Gate
MetalA F
n+
VDD
VSS
Metal
Metal
Gate
Polysilicon
IA E
Institute of Advanced Microelectronics
University of New Mexico
VDD
A
Contacts
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Static CMOS NAND Gate
A
B
AB
F=(A and B)
VDD
Output is 0 only when both
N-transistors are on,i.e., when A=B=1
FA
B
FA B
0 10
10 111 0
1 1 0
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NAND Gate: Symbolic Layout
VSS
A
B
A
B
AB
F
VDD
F
ContactMetal
VDD
p-diffusion
poly-Si
F
n-diffusion
A
MetalB
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Static CMOS 2-input NOR Gate
A B F
0 0
0
0
0
1
1
0
01
1 1
Output is 0 when either of the
N-transistors is on.
VDD
A
BF=(A or B)
BA
A FB
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NOR Gate: Symbolic Layout
A
B
B
F
VDD
A
VDD
VSS
A
B
F
A
BF
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Characteristics of Static CMOS Logic
Restoring logic: can cascade gates indefinitely without lossof signal level.Facilitates composition; construct complex systems from simple
components
Key to logic synthesis and silicon compilation
Static power dissipation essentially zero.Power consumed only when switching.
As a load, looks like a capacitor.High fan-out.
Fan-in limited by series transistors in NAND and NOR tree.
A safe logic family, but not the fastest or most dense.
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MOS Transistor Scalable CMOS
L = channel lengthW = channel width
p+ or n+ diffusion
Poly-Si Gate
Metal
Metal
W
VDDSaturation drain current:
VSS
L ( )22'
THGSD VVLWkI
=
ID=drain current
VGS=drain-to-source voltageVTH=threshold voltage
k=process dependent parameter
WandL are key performance parameters
Scalable design rules
= 2 x minimum feature size (critical dimension)
Layout features scale proportionally1970: = 100 m 1990: = 1 m 2000: = 0.18 m
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Layout Design RulesMinimum widths & spacing for layout elements.
Ensures device can be fabricated and will work as intended.
Specific to process. Obtain from process vendor.
2
2 2 2
2
2
Poly
N+ or P+2
2
23
Units =
1
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Why do we need Layout Design Rules?
1. Ensure adequate separation and electrical isolation between
structures on the chip.
2. Ensure adequate overlap to achieve correct alignment.
Lithographic fabrication processes have limits:
Optical limits of resolution
Limits of alignment precision
Diffusion profiles, continued diffusion
Errors in coverage, edge failure, e.g. metal plugs in vias
Design rules act as a contractbetween designer andfabrication house:
If the design rules are obeyed, the fab guarantees the chip will
function correctly on the test signals provided.
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Some Factors Affecting Inverter Performance
VDD
Contact resistanceChannelR & C
Gate
Resistance
InLoad
Capacitance
Gate Capacitance
Contact resistanceChannelR & C
VSS
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Inverter Switching Characteristics
In
VDD VDD
Intime0
Out
Temporal:Channel resistance
and parasitic
capacitance produceRC delay
VDD
0Out
Propagation
Delay
VDD
VDD/2
Input/Output characteristic:Balance n- and p-channel gains to
switch states at VDD/2
Vin
VoutVDD
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Cell Layout Performance Issues
Resistance of a conductor (metal, poly) is proportional toaspect ratio (L/W: ohms/square).
Capacitance of a conductor is proportional to area.
To increase speed and drive power of a transistor, increasethe channel width. Also increases power consumption.
Use plenty of contacts to VDD and VSS to reduce power
supply and ground bounce (noise).
Transistor sizing
p-channel resistance > n-channel resistance
Hole mobility < electron mobility For symmetric switching, make p-channel wider than n-channel.
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Circuit Performance Estimation
Actual performance measures must consider layout.
Pre-Layout, Post-SynthesisSimple circuit models, ignore interconnects
e.g. use fan-in and fan-out to estimate delays
Post-Layout
Use SPICE to accurately model performance
Use Spice Parameter Extraction to get parasitic parameters from:
1. Layout files
2. Process description
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Simple Memory Circuit: D Latch
0
1
S
Clock
QD
Critical Parameters
to Guarantee Valid
Data is Latched
tSU = Setup Time
Time before clockwhen input must be
stable
tH = Hold Time
Time after clock when
input must be stable
Clock
tSU tH
D
Q
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Positive Edge Triggered D Flop-Flop
Input and output separated in time.
0
1
S
Clock
D0
1
S
Clock
Slave
QMQ
D Q
Master
Clock
QM
Q
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Synchronous Sequential Logic
State
Register
Next
State
Logic
Output
Logic
Inputs
State
OutputsControl
Signals
Clock Next state = f(current state, inputs)
Controls signals stabilize on low clock periodNew state latched in falling clock edge
D Q
Clock
State n+1 State n+2State n State n+3State Vector
Next-State
Logic
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Standard Logic CellsHand layout of a complex chip is tedious and expensive.
Optimal performance requires careful consideration of topology, fan in and fan out.
Transistors must be sized for each case.
Instead, divide design into standard set of logic cells.
Custom design, layout and optimize each cell.Design cells so they can be tiled to produce complex designs.
May be parameterized by drive strength (fanout)
Physically designed to same height, so they can be abutted.
Some typical standard logic cells
0
1
S
D Q
AND-OR-Invert BufferMux
Flip-Flop
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CMOS Summary
Silicon CMOS is the preferred logic family today.
Complementary property gives balanced switching, low power.
Excellent noise immunity. Restoring logic allows gates to be cascaded indefinitely.
Increasingly, digital CMOS is available as standard cells.
CMOS Standard cells enable automatic circuit synthesis and
semi-custom design.
Full custom designers optimize the cells at layout level.