Apply innovation Slide 1 Renishaw scanning technology Renishaws innovative approach to scanning system design compared with conventional solutions technology

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Slide 1

Renishaw scanning technology

Renishaw scanning technology

Renishaw’s innovative approach to scanning system design compared with conventional solutions

technologyIssue 2

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Slide 2

Questions to ask your metrology system supplier

• Do my measurement applications require a scanning solution?

– how many need to be scanned?

– how many need discrete point measurement?

• If I need to scan, what is the performance of the system?

– scanning accuracy at high speeds

– total measurement cycle time, including stylus changes

• If I also need to measure discrete points, how fast can I do this?

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Slide 3

Questions to ask your metrology system supplier

• Will I benefit from the flexibility of an articulating head

– access to the component

– sensor and stylus changing

• What are the lifetime costs?

– purchase price

– what are the likely failure modes and what protection is provided?

– repair / replacement costs and speed of service

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Slide 4

Probing applications - factors

Manufacturers need a range of measurement solutions.

Why?

machining processes have different levels of stability:

stable form :

therefore control size and position

discrete point measurement

form variation significant :

therefore form must be measured and controlled

scanning

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Slide 5

Probing applications - factors

Manufacturers need a range of measurement solutions.

Why?

Features have different functions:

for clearance or location

form is not important

Discrete point measurement

for functional fits

form is critical and must be controlled

ScanningMeasured values

Best fit circle

Maximum inscribed (functional fit) circle

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Slide 6

Scanning

Typical scanning routines to measure form

Scanning provides much more information about the form of a feature than discrete point measurement

Spiral scanning of a cylinder bore gathers data about feature size, position, orientation and form

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Slide 7

Renishaw scanning - our objectives

• speed and accuracy– design sensors with high dynamic response to provide

high accuracy data at high speed

– accurate through use of sophisticated probe calibration

– match styli materials to applications for best results

• flexibility– probe changing

– stylus changing

– articulation

• cost effectiveness– innovative hardware and scanning techniques reduce

complexity

– robust designs and responsive service for lower lifetime costs

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Slide 8

Renishaw scanning systems

Articulating heads

Probe and stylus changing

Renishaw scanning sensor design

Active and passive scanning probe design

Performance styli for scanning

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Slide 9

Active or passive sensors?

Passive sensors Active sensors

• Design

– active sensors are large, heavy and complex

– passive sensors are small and relatively simple

Complexity• 3 force generators• 3 dampers• LVDTs mounted on stacked axes

Simplicity• no motor drives

• no locking mechanism

• no tare system

• no electromagnets

• no electronic damping

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Slide 10

Passive sensors

Simple, compact mechanism

– no motor drives

– no locking mechanism

– no tare system

– no electromagnets

– no electronic damping

• springs generate contact force

– force varies with deflection

Deflection

Typical scanning deflection

Force

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Slide 11

Active sensors

Complex, larger mechanism

• force generators in each axis

• force is modulated in probe

– not constant at stylus tip*

• deflection varies as necessary

– longer axis travels

Axis drive force

generator

Displacement sensor

Deflection

ForceControlled force range

* see next slide

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Slide 12

Active sensors

Errors in force modulation at stylus tip

• force is modulated at each stacked axis

• mechanism & stylus mass, plus stylus stiffness connect force generator to stylus tip

• errors that lead to uncontrolled stylus force:

– inertial acceleration of stylus mass

– error in estimating probe acceleration (d2xp/dt2)

– error in estimating probe velocity (dxp/dt)

– error in estimating quill acceleration (d2xq/dt2)

– force feedback error (eFp)

Force Fp controlled here

What matters is force Fs hereProbe

mechanism

mass

Stylus

mass

Fp

Fskp

cp

ks

xp xsxq

Quill

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Slide 13

Method of control


• effectively a miniature CMM

• ‘force generators’ control the deflection to modulate the force on the stylus

• 6 axes under servo control

– conceived in 1970s to accommodate poor machine motion control

• simple device senses deflection

• no powered motion

• measurements taken using machine to control stylus deflection

• 3 axes under servo control

– new devices take advantage of modern CMM motion control

Compact passive sensor

Complex active sensor

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Slide 14

Sensor design and calibration


• large probe travel needed to keep the contact force steady during scanning

• direction-dependent stylus bending variations minimised by controlling the contact force

• smaller axis travels required

– at 300 mm/sec, deflections can be held within a 100 µm range*

• stylus bending compensated by sophisticated calibration routine

Compact passive sensor

Complex active sensor

* using adaptive scanning

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Slide 15

Dynamic response


• motorised stylus carrier

– driven on internal servo loop

• light weight

– high natural frequency suspension system

Probe suspension responds whilst scan vector is adjusted

Motors adjust stylus position to modulate contact force

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Slide 16

Scanning probe calibration

Constant force does not equal constant stylus deflection

• although active sensors provide modulated probe force, stylus bending varies, depending on the contact vector

• stylus stiffness is very different in Z direction (compression) to in the XY plane (bending)

• if you are scanning in 3 dimensions (not just in the plane of the stylus), this is important

– e.g. valve seats

– e.g. gears

F

F

Deflection

0 90 180

High deflection when bending

Low deflection in compression

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Slide 17

Scanning probe calibration

modulated force does not result in better accuracy

– passive & active sensors must both cope with non-linear stylus bending

– how the probe is calibrated is important

Passive sensors

• passive probes have contact forces that are predictable at each {x,y,z} position

• scanning probe axis deflections are driven by the contact vector

• sensor mechanism and stylus bending calibrated together

Active sensors

• contact force is controlled, and therefore not related to {x,y,z} position

• calibration must linearise output of readheads, mechanism motion and stylus bending

• longer styli increase bending variation

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Slide 18

Effective calibration for superior 3D scanning

SP80 testing at Renishaw

• sub micron 2D and 3D scanning performance

– 2D: 0.3 m

– 3D: 1.0 m

• ISO 10360-4

• unknown path

• raw data - no data filtering

Test details:CMM spec 0.5 + L/1000

Test time 97 secs

Controller UCC1

Filter None

Stylus length 50 mm

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Slide 19

Measurement performance


• motorised probe mechanism enables high speed scanning

• slow discrete point measurement cycles due to the need to servo and static average probe data

• heat sources: motors and control circuits generate heat that must be measured and compensated

• low inertia probe holds surface at high speeds

• fast discrete point measurement cycles with 'extrapolate to zero' routines

• no heat sources for improved stability

– 500 mW power consumption

– < 1ºC temperature change inside probe

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Slide 20

Minimum inspection cycle times

High speed measurement

High speed scanning on a large component

Scanning a complex surface at high speed

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Slide 21

Minimum inspection cycle times

High speed measurement

Rapid discrete point measurement and scanning combined

Video commentary• scanning probe

taking discrete points at high speed

• ‘extrapolate to zero’ routines

• high speed scanning

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Slide 22

Robustness


• more things to go wrong

– force generators

– locking mechanism

– tare system

– electromagnets

– electronic damping

– control hardware for the above

• limited crash protection if the stylus is deflected beyond its limits

• more complex motion control

• simplicity

– position feedback system is only electro-mechanical element

– no moving wires

• kinematic stylus changing and patented Z over-travel bump stop provide robust crash protection

– probe will survive most accidents

• simpler motion control

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Slide 23

Robustness

Crash protection

Detachable styli allow stylus overtravel without damage to the probe or component

Video commentary• overtravel in XY plane• causes stylus module to

unseat• stop signal generated• stylus reseats as

machine backs off surface

• probe still operational

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Slide 24

Lifetime costs


• higher purchase costs

– complex and high cost sensor

• higher running costs

– complex sensor

– limited crash protection

– vendor technician needed to remove damaged sensor

– more downtime

– high repair charges

• lower purchase costs

– simple and cost-effective to purchase

• lower running costs

– crash protection for greater reliability

– 50,000+ hours operating life

– advance replacement service at discounted price

– customer-replacement on site due to simple fittings

– less downtime

– cost-effective repair

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Slide 25


Articulating heads





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Slide 26


Renishaw design objectives:

• optimised for high speed measurement

• accurate position sensing without stacked axis errors

• compact and light, with excellent dynamic response

• models for quill mounting and use with articulating heads

• passive design to avoid unnecessary system complexity

SP600M mounted

on a PH10M indexing head

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Slide 27

Renishaw scanning probes - quill mounted

SP600Q• in-quill version of SP600• reduced impact on

working volume• suitable for any quill size

SP80• quill-mounted• digital readheads for ultra-high

accuracy• very long styli

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Slide 28

Renishaw scanning probes - for articulating heads

SP600M• styli up to 300 mm• flexible part access• robust• changeable with other

sensors

SP25M• ultra-compact design (25 mm

diameter)• styli up to 200 mm• interchangeable with touch-

trigger probing

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Slide 29

Renishaw scanning probes - key characteristics

Passive sensor - no force generators

• minimal heat source for greater stability

• no electro-mechanical wear

• reduced vibration during discrete point measurement

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Slide 30


Box spring mechanism - SP600 and SP80

• unique design

• compact mechanism - fits inside Ø50 mm (2 in) probe

• low inertia

• rapid dynamic response

• low spring rates

• single 3D ferrofluid damper

Parallel acting springs

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Slide 31


Pivoting probe mechanism - SP25M

• patented, pivoting mechanism featuring ‘isle of Man’ spring

• ultra-compact mechanism - fits inside a Ø25 mm (1 in) probe

• very low inertia

• very low spring rates (< 60 g/mm)

• high natural frequency (rigid member) when in contact with the component

‘Isle of Man’ spring creates XY pivot point

Second spring allows translation in all direction

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Slide 32


Isolated optical metrology - SP600

• readheads attached to probe housing

• measures deflection of whole mechanism, not just one axis

– eliminates inter-axis errors

– picks up thermal and dynamic effects

• probes with stacked axes cannot measure inter-axis errors directly

Inter-axis error

Readheads attached to probe body

Z pos Y pos

X pos

Illustration shows SP600 mechanism with PSDs

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Slide 33


Isolated optical metrology - SP80

• SP80 features digital readheads with 0.02 m resolution reading precision gratings

• accuracy defined by straightness of lines on each grating and calibrated squareness of gratings, not by probe mechanical design

ISO 10360-4 test data:

ISO Diff: 0.6 m

ISO Tij: 1.0 mCMM spec 0.5 + L / 1000

Test time 61 secs

Controller UCC1

Filter None

Stylus 50 mm, 9 mm, ceramicNote - results quoted are for unknown path scans.

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Slide 34


Isolated optical metrology - SP25M

• IREDs in probe body reflect light off mirrors in stylus module back onto PSDs

• non-linear outputs compensated by sophisticated 3rd order polynomial algorithms

IRED

Kinematic joint between probe body and stylus module (not shown)

2 PSDs detect stylus deflection

MirrorISO 10360-4 test data:

ISO Diff: 1.3 m

ISO Tij: 2.6 mCMM spec 0.5 + L / 1000

Test time 57 secs

Controller UCC1

Filter None

Stylus 50 mm, 5 mm, ceramic

SP25M probe body

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Slide 35


Kinematic stylus changing

optimise stylus and hence repeatability for each feature:

– minimum length• Longer styli degrade repeatability

– maximum stiffness

– minimum joints

– maximum ball size• Maximum effective working length

• repeatable re-location– no need for re-qualification

• passive

– no signal cables

– easy installation

Kinematic stylus changing in around 10 seconds means that you can pick the best stylus for each feature

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Slide 36


Feature access - SP80• SP80 can support very long and

complex styli• 500 mm (19.7 in)• 500 g (17.6 oz)• suitable for measurement of

deep features on large components

• no need for counter-balancing• full measurement range is

maintained irrespective of stylus mass and orientation

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Slide 37


Feature access - SP80

SP80 scanning with a 500 mm (20 in) stylus for access to deep features

Video commentary• 500 mm (20 in) stylus cranked

stylus• no counter-balancing needed• scanning deep features in F1

engine block

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Slide 38

Feature access - SP80• deep bore measurement -

cranked / star styli

Stylus length (mm)

0

0.25

0.5

0.75

1.0

1.25

1.5

1.75

V2 m


100 200 25015050

VDI / VDE test data: CMM spec: 0.5 + L / 1000

Test speed: 5 mm/sec

Controller: UCC1

Filter: 50 Hz

Values: Unknown path

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Slide 39


Feature access - SP600 family

SP600 scanning with a 200 mm (8 in) stylus for access to deep features

Video commentary• 200 mm (8 in) stylus• scanning deep

features in a cylinder block

• compact probe dimensions further extend the reach of the probe

• styli up to 280 mm (11.0 in) can be used with SP600 probes

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Slide 40


Feature access - SP25M• three scanning modules, each

optimised for a range of stylus lengths• same measuring range and accuracy in

all orientations

• stiff carbon fibre stylus extensions provide excellent effective working length with M3 styli

• styli up to 200 mm (7.9 in)

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Slide 41


Feature access - SP25M• ISO 10360-4 test data• accurate form measurement, even with long styli

50 200Stylus length (mm)

0

0.5

1.0

1.5

2.0

2.5

3.0

3.5

ISO Tijm

10022

ISO 10360-4 test data: CMM spec: 0.5 + L / 1000

Test speed: 5 mm/sec

Controller: UCC1

Filter: None / 60 Hz

Values: Unknown path

Filtered (60 Hz harmonic)

No filter (raw data)

22: 3 mm, SS stem

50: 5 mm, ceramic stem

100: 6 mm, GF stem

200: 6 mm, GF stem

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Slide 42


Feature access - SP25M• probe is small enough to be

inserted into many features• total reach can be extended,

with a probe extension, to nearly 400 mm (15.7 in)• including length of probe body

SP25M inspecting a deep counter-bore

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Slide 43


Feature access - SP25M• probe can be mounted on an

articulating head means that many features can be accessed with fewer styli

• lower stylus costs• shorter cycle times

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Slide 44

Crash protection

• stylus change joint has low release force

– over-travel in XY causes stylus to detach

• Z crash protection

– outer housing provides a ‘bump stop’ to prevent probe mechanism and readhead damage

Stylus deforms in a severe Z crash, whilst probe

mechanism is protected


Note - same principles apply to pivoting probes like SP25M.

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Slide 45

Crash protection

Renishaw scanning probes are robust - even after bending or breaking the stylus, they still work!

Video commentary• steel stylus crushed

against SP600• more severe than any

Z crash since E Stop would prevent continued force

• bump-stop protection system saves probe mechanism

• probe was still functional after test completed


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Slide 46

Compression test data

0

200

400

600

800

1000

1200

1400

1600

1800

0 0.5 1 1.5 2 2.5 3 3.5

Deflection (mm)

Force (N)

Stylus ball shatters

ISO 10360-4CMM spec 3 + L / 250

Test time 70 secs

Controller UCC1

Filter None

Stylus length 50 mm(All data in m)

Circle Before After

A 4.0 3.8

B 3.7 3.2

C 1.7 1.7

D 3.3 2.9

Result 4.0 3.8

Circle A

Circle B

Circle C

Circle D


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Slide 47


Articulating heads





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Slide 48

Styli choice affects performance

• the stylus is a critical element in any scanning system

• affects:

– feature access (stylus length and configuration, effective working length)

– speed (weight affects dynamic response)

– repeatability (stiffness, joints)

– accuracy over time (wear, pick-up on stylus)

• choice of stylus configuration and materials must be driven by the application

Stylus selection for scanning

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Slide 49

Configuration

• keep styli as short and as stiff as possible

– avoid joints

– articulating heads reduce the need for long styli

• where longer styli are essential, choose single-piece styli made from performance materials (e.g. M5 range for SP80):

– graphite fibre stems (light and stiff)

– titanium fittings


Long graphite fibre stylus

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Slide 50

Three phenomena that can affect scanning accuracy

• in touch trigger probing, the stylus ball comes into temporary contact with the measured surface

• scanning results in a different and more aggressive type of surface interaction between the stylus and the workpiece

• testing at Renishaw has revealed three interactive phenomena:

Effects of continuous scanning on stylus balls

1. Debris

2. Adhesive wear

3. Abrasive wear

Sliding interaction between ball and

surface

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Slide 51

Phenomenon 1 - debris

• any contamination present on the scanning path will collect on the stylus ball as it passes over the surface

– metal oxide particles on the surface

– air-born debris such as coolant mist or paper dust


• debris can be removed by wiping the ball with a dry, lint-free cloth

– a periodic cleaning regime for the stylus ball is the only solution to avoid a build up of debris

– debris is practically unavoidable with any contact scanning application and is independent of the stylus ball or scanned surface material

Typical debris collected on a stylus ball after scanning

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Slide 52

Phenomenon 2 - adhesive wear

• adhesive wear (sometimes referred to as pick-up) involves the transfer of material from one surface to another

– local welding (adhesion) at microscopic contact points

– break off during sliding

– minute particles from one surface are transferred to the other surface


• material adhesion is permanent and cannot be removed through normal cleaning techniques

– as the surface material from the workpiece starts to adhere to the ball, it is the attached material which is now in contact with the surface

– as like materials attract, rapid build up can occur

– will eventually degrade the form of the stylus ball

– compromised measuring results

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Slide 53


• factors affecting adhesive wear:

– contact force

– distance scanned– hardness of surfaces (if stylus is much harder than surface being measured)– affinity between ball and surface materials … is it a similar material?– single point contact

• such conditions apply when scanning an aluminium surface with a relatively hard ruby (aluminium oxide) stylus ball

– significant wear only occurs after long periods scanning the same part– in most real applications, the amount of material transfer is negligible on the

form of the stylus ball (< 0.1 m) and cannot be quantified, even with the highest precision measuring equipment


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Slide 54


• significant errors only occur in unrepresentative situations:


Test conditions:• ruby stylus on aluminium• 15 g contact force, single point contact• 350 m scan path over new material

Results:• small patch where adhesion occurs• negligible impact on ball form

Test conditions:• ruby stylus on aluminium• 15 g contact force, single point contact• 350 m scan path over repeated path

Results:• 200 m x 500 m adhesion patch• 2 m impact on ball form

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Slide 55

Phenomenon 3 - abrasive wear

• abrasive wear involves removal of material from both surfaces

– small particles from both surfaces break and adhere to each surface

– harder stylus particles attached to the component surface begin to act as an abrasive

– where there is little atomic attraction between the two materials, wear rather than material build up occurs


Test conditions:• ruby on stainless steel• 15 g contact force, single point contact• 5,600 m scan path over new material• very extreme - unrepresentative of most applications

Results:• flat on ball surface approx. 150 m diameter• form error of 1.5 m

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Slide 56

Ball material - conclusions from testing at Renishaw

• ruby can suffer adhesive wear (pick-up) on aluminium under extreme conditions, but performs well in most applications

• ruby is the best material on stainless steel


Ruby stylus used in touch-trigger mode

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Slide 57


• silicon nitride is a good substitute for ruby in extreme aluminium applications, but suffers from abrasive wear on stainless steel and cast iron


Silicon nitride stylus tip scanning an aluminium component

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Slide 58


• zirconia is the optimum choice for scanning cast iron components

• tungsten carbide also performs well on cast iron


Zirconia is often used where a large diameter tip is required

Zirconia stylus tip and graphite fibre stem

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Slide 59


Articulating heads





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Slide 60

Articulation or fixed sensors?

Articulating heads are a standard feature of most computer-controlled CMMs

– heads are the most cost-effective way to measure complex parts

Fixed probes are best suited to small machines on which simple parts are to be measured

– ideal for flat parts where a single stylus can access all features

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Slide 61

Renishaw articulating heads

Increased flexibility…

easy access to all features on the part

repeatable re-orientation of the probe

reduced need for stylus changing

optimise stylus stiffness for better metrology

Reduced costs…

indexing is faster than stylus changing

less expensive than active scanning systems

reduced stylus costs

simpler programming

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Slide 62

Renishaw articulating heads for scanning

PH10M• indexing head• the industry

standard

PH10MQ• in-quill version of

PH10M• reduced impact on

working volume• needs 80 mm quill

PHS1• servo positioning head• infinite range of

orientations• longer extension bars

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Slide 63

Articulating head applications

Flexible probe orientation

• PH10M offers 7.5° increments in 2 axes - is this enough?

• prismatic parts

– generally few features at irregular angles

– use a custom stylus to suit the angle required

– fixed scanning probes also need customer styli for such features

Knuckle joint needed to

access features at irregular angles

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Slide 64

Articulating head applications

Flexible probe orientation

• PH10M offers 7.5° increments in 2 axes - is this enough?

• sheet metal / contoured parts

– many features at different irregular angles

– stylus must be perfectly aligned with surface in each case

– no indexing head is suitable

– fixed probes also unsuitable due to need for many stylus orientations

– need continuously variable head (PHS1)Sheet metal

Cylindrical stylus must be perfectly aligned with hole

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Slide 65

PH10M indexing head - design characteristics

Head repeatability test results:

• Method:– 50 measurements of calibration sphere at {A45,B45}, then 50 with an index of the PH10M head to {A0,B0} between each reading

• TP200 trigger probe with 10mm stylus

• Results:

• Comment:– indexing head repeatability has a similar effect on measurement accuracy to stylus changing repeatability

Result Span fixed Span index [Span] [Repeatability]

X 0.00063 0.00119 0.00056 ± 0.00034

Y 0.00039 0.00161 0.00122 ± 0.00036

Z 0.00045 0.00081 0.00036 ± 0.00014

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Slide 66


Indexing repeatability affects the measured position of features

– Size and form are unaffected

Most features relationships are measured ‘in a plane’

– Feature positions are defined relative to datum features in the same plane (i.e. the same index position)

• Datum feature used to establish a part co-ordinate system

– Therefore indexing typically has no negative impact on measurement results, but many benefits

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Slide 67


Light weight

• 650 g (1.4 lbs)

• lightest indexing head available

• total weight of < 1 kg including scanning probe

Fast indexing

• typical indexing time is 2 to 3 seconds

• indexes can occur during positioning moves

– no impact on measurement cycle time

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Slide 68


Flexible part access

Rapid indexing during CMM positioning moves give flexible access with no impact on cycle times

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Slide 69


Autojoint

• programmable sensor changing with no manual intervention required

• use scanning and touch-trigger probes in the same measurement cycle

Autojoint features kinematic connection for high repeatability

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Slide 70

PHS1 servo head - design characteristics

Servo positioning for total flexibility

• full 360° rotation in two axes for total flexibility of part access

– resolution of 0.2 arc sec

– equivalent to 0.1µm at 100mm radius

• servo control of both axes for infinitely variable positioning and full velocity control

– speeds of up to 150° per second

– 5-axis control required

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Slide 71


High torque for long reach

• extension bars of up to 750 mm (30 in)

– ideal for auto body inspection

– touch-trigger probes only

• Autojoint for use with SP600M

• powerful motors generate 2 Nm torque

– 4 times more than a PH10

– carry probes and extension bars of up to 1 kg (2.2 lbs)

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Slide 72


Infinitely variable positioning

PHS1’s motion can be combined with the CMM motion to generate blended 5 axis moves

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Slide 73


Articulating heads





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Slide 74

ACR3 probe changer for use with PH10M

• 4 or 8 changer ports

– store a range of sensors, extensions and stylus configurations

• Passive mechanism

– CMM motion used to lock and unlock the Autojoint for secure and fully automatic sensor changes

Compact rack with minimal footprint

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Slide 75

New ACR3 probe changer for use with PH10M

Probe changing

Quick and repeatable sensor changing for maximum flexibility

Video commentary• new ACR3 sensor

changer• no motors or

separate control• change is controlled

by motion of the CMM

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Slide 76

ACR2 probe changer for use with PHS1

Probe module changing

• flexible storage of probes and extension bars

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Slide 77

FCR25 module and stylus changing for SP25M

Passive rack enables both module and stylus changing

• modular rack system

• switch between scanning modules to suit application

• switch between scanning and touch-trigger modules

Two sensors in one - switching between scanning and touch-trigger probing modules

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Slide 78

FCR25 module and stylus changing for SP25M

Passive rack enables both module and stylus changing

• change styli to suit measurement task

– scanning styli up to 200 mm

– full range of TP20 modules

• combine with ACR3 for sensor changing

Typical changing routine:• stow TTP stylus• stow TTP module• pick up scan module• pick up scan stylus

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Slide 79

SP600 stylus changing

Passive rack

• simple design

• rapid stylus changes

• storage for up to 4 stylus modules

– any number of racks can be used in a system

• kinematic stylus changing mechanism

– highly repeatable connection between stylus and probe,

– styli can be stored and re-used without the need for qualification

• crash protection from an overtravel mechanism in the base of the rack

Rapid stylus changing with the passive SCR600 stylus change rack

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Slide 80

Renishaw scanning - our offering

• the fastest and most accurate scanning

– passive scanning probes with dynamically superior mechanisms

– sophisticated probe calibration

– performance styli to match your application

• the most flexible and productive solution

– probe changing

– stylus changing

– articulation

• the lowest ownership costs

– innovative hardware and scanning techniques reduce complexity

– robust designs and responsive service for lower lifetime costs

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Slide 81

Responsive service and expert support

Application and product support wherever you are• Renishaw has offices in over 20 countries

• responsive service to keep you running

• optional advance RBE (repair by exchange) service on many products

• we ship a replacement on the day you call

• trouble-shooting and FAQs on www.renishaw.com/support

Service facility at Renishaw

Inc, USA

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Slide 82

Questions?

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Documents

Apply innovation Slide 1 Renishaw scanning technology Renishaws innovative approach to scanning system design compared with conventional solutions technology