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Wafer bonding for integrated optics

7 Photonic Integration-part 2 Bonding

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Photonic integration

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  • Wafer bonding for integrated optics

  • Physics of wafer bonding

  • Glass frit bondingGlass frit a slurry of fine glass particles in an appropriate carrierliquid Full sheet deposition or applied by screen printing Slurry heated to melt the glass particles Bonding upon solidification

  • Anodic bonding

  • Metallic bonding

  • Molecular wafer bonding

  • Molecular wafer bonding

  • Molecular wafer bonding

  • Molecular wafer bonding

  • Molecular wafer bonding

  • Molecular wafer bonding

  • Molecular wafer bonding

  • Molecular wafer bonding

  • Surface cleaning

  • Surface cleaning

    How to get rid of these particles?

  • Surface cleaning

  • Molecular wafer bonding

  • Surface activation

  • Surface activation

    Deposited SiO2 allows to bond anything to anything

  • Surface activation

  • Molecular wafer bonding

  • Room temperature attachment

  • Molecular wafer bonding

  • Annealing

  • Annealing

  • Adhesive wafer bonding

  • Adhesive wafer bonding

  • Adhesive wafer bonding

  • Adhesive wafer bonding

  • Adhesive wafer bonding

  • Adhesive wafer bonding

  • Adhesive wafer bonding

  • Adhesive wafer bonding

  • Adhesive wafer bonding

  • Adhesive bonding

    Why adhesive die to wafer bonding? Less stringent requirements on surface quality

    Micro-roughness Particle contamination Other types of contamination

    Low temperature bonding process Planarization of SOI topography by spin coating

  • DVS-BCB adhesive bonding

    Why DVS-BCB as a bonding agent? Low temperature bonding process (Tbond=250C) Very good planarization properties High glass transition temperature (Tg> 350C) High resistance against chemicals Known material in IC industry (packaging)

  • DVS-BCB adhesive bondingChemical formula

    Commercially formulated by DOW as a B-staged oligomersolution (35% pre-polymerized)

    By spin-coating: layer thicknesses of 1m to 25m available For our application: much thinner bonding layers are required

    Dilution of the commercially available DVS-BCB using mesitylene

    Stable spin coating of layer thicknesses down to 30nm

    Si

    CH3

    CH3

    Si

    CH3

    CH3

    O

    1,3-divinyl-1,1,3,3-tetramethyldisiloxane-bisbenzocyclobutene

  • DVS-BCB adhesive bondingOverview of the bonding process

    Si-substrate

    SiO2Si

    BCB BCB BCB

    BCB coatingWafer cleaning

    Solvent evap + prepolymerization

    Die attachment

    BCB

    BCB curing (pressurized)

  • DVS-BCB adhesive bondingCleaning of the SOI wafer surface using Piranha clean Standard Clean - 1 solution Standard Clean 2 solution

    Particle free hydrophilic surface

    Cleaning of the InP/InGaAsP die surface by Sacrifical removal of an InP epitaxial layer using 3HCl:H2O Sacrificial removal of an InGaAs layer using H3PO4:3H2O2:H2O

    Particle free hydrophilic surface

  • DVS-BCB adhesive bondingPlanarization properties

    Double spin coating has higher DOP than single coating with the same aggregate thicknessCuring profile and density of topography important for DOP

  • DVS-BCB adhesive bondingDie attachment process

    Aligned attachment of dies and structured SOI wafer to carrier wafers

  • DVS-BCB adhesive bondingDie attachment process

    Mounting of the carrier wafers in bonding chamber (carrier wafers are mechanically aligned)

  • DVS-BCB adhesive bondingDie attachment process

    Evacuation of bonding chamber and attachment of dies (150C)

  • DVS-BCB adhesive bondingDie attachment process

    Purging of the bonding chamber evaporation or release of temporary adhesive

  • DVS-BCB adhesive bonding

  • Equipment

  • Bonding equipment

  • Bonding equipment

  • Characterization equipment

  • Characterization Equipment

  • Characterization Equipment

  • Substrate removal

  • Bonding equipment

  • Unprocessed opto-electronic layer structure

    Processed SOI waveguide wafer

    Die to wafer bonding Substrate removal

    Processing (definition of the component)

    CMOS wafer

    Photonic layer

    Bonding of InP/InGaAsP dies and device processing

    Bonding unprocessed dies using pick and place lowers needed alignment accuracy increases throughput

    After die to wafer bonding all processing steps are wafer scale processes

  • Fabrication of bonded devices Photodetectors

    Surface illuminated photodetector

  • Fabrication of bonded devicesPhotodetectors

    Evanescently coupled MSM photodetectors

  • Fabrication of bonded devicesPhotodetectors and laser diodes

    Inverted adiabatic taper approach Processing of both laser diodes and photodetectors identical

  • InP Microdisk Laser on Silicon

  • Multi-wavelength Laser on Si

  • III-V Photodetectors on Silicon

  • III-V Photodetectors on Silicon

  • Nonlinear ring resonators

  • Conclusions

    Wafer bonding and die-to-wafer bondingtechnology is a very versatile technology with awide range of applicationsMolecular and adhesive (die-to-) wafer bondingare enabling technologies to realize complexphotonic integrated circuitsFuture research: to scale up the integration density todemonstrate the feasibility of complexactive/passive photonic integrated circuits