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DLP Talks Distinguished Lecture Program

Ricardo Reis

Trends on Micro and Nanoelectronics Ricardo Reis

Part

1

Everything ends

in a Chip

Part

2

65 45 28 22 ... 6

nm

Minimal channel sizeof a transistor

~ 7000 smaller

Hair~ 14 nm

~ 100 µ

Ricardo Reis

10 quintillions em 2009

2009

Embedded Systems

What is “design of an embedded system”?We consider the design of a dedicated system from specification till implementation.

Optimization, specially power optimization should be done in all levels of abstraction.

Optimization means dedicated solutions“Application Specific Embedded Systems”

A grain of rice has the price of more than a100 thousand transistorsSource: The Economist, September 6, 2010

A transistor is cheapBUT

Energy is expensive

Power Consumption drives MOS evolution

NMOS CMOS

S

Vcc

Terra

A

B

S

Vcc

Terra

A

B

Design Levels of Abstraction

+

Vcc

SiOSiO22

poço Npoço N

substrato Psubstrato P

NN++ NN++ PP++ PP++

Modules

System

Electrical Circuit

Logic Gates

Devices

Challenge:Power Optimization must be done in all levels of abstraction

Power Estimation Tools for each level of abstraction

Power consumption bigger than power dissipation capability

POWER WALL

HardwareAccelerators

FromDavidBrooks,Harvard,2014

APPLE82 Billions of transistors

TSMC 20 nm 89 mm2

DARK SILICON

ENERGY HARVESTING

Ultra Low Power

Medical Applications

Internal and External Noise

Aging

Variability

Radiation Effects

Some Reliability Issues

2 Main Problems in NanoCMOS

VARIABILITY

POWER (mainly Static Power)

VARIABILITY

VARIABILITY

VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY

VARIABILITYVARIABILITYVARIABILITYVARIABILITYVARIABILITYVARIABILITYVARIABILITYVARIABILITYVARIABILITYVARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY

VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY

VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY

VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY

VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY

VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY

VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY

VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY

VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY

VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY

VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY

VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY

VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY

VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY

VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY

VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY

VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY

VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY VARIABILITY

VARIABILITY VARIABILITY VARIABILITY VARIABILITY

VARIABILITY 60 VARIABILITY 56

VARIABILITY 12 VARIABILITY 8

4 points

4 points

TrendsCMOS Technologies: Chanel: 5 nanometers (0.005 µm)in 2028

From Roadmap 2013 SIA - Semiconductor Industry Associationhttp://www.itrs.net/

17 metal Layers

Trends

Structured ASICs

Roadmap 1997Trends

Power ReductionIleakage is become more and more

important in nano circuits

It is function of the number of transistors

1 2 3 4 5

1 1 2 3 4 5

2 2 7 18 42 90

3 3 18 87 396 1677

4 4 42 396 3503 28435

5 5 90 1677 28435 125803

NUMBER OF STACKED PMOS TRANSISTORS

NUMBER OF STACKED NMOS TRANSISTORS

Automatic Layout Synthesis Using Complex Gates (SCCG)

E. Detjens et al., Technology Mapping in MIS, ICCAD 1987

Using Static CMOS Complex Gates (SCCG)

with cell generation on-the-fly

Freedom to Logic Designers !!!!

A way to reduce the amount of transistors to implement a function

A

B

C

D

A

B C

D

S

S

14 Transistors

Example

S = A + (( B + C)+D)

A

B C D

S

S = A + (( B +C).D)

8 Transistors

A

A

B

B

C

C

D

D

S

Use of SCCG

S = A + (( B + C)+D)

A

B C D

S

8 Transistors

Use of SCCG

A

B C

D

S

14 Transistors

S = A + (( B +C).D) S = A + (( B + C)+D)

LESS TRANSISTORS MEANS

LESS

LEAKAGE POWER

LESS TRANSISTORS ALSO MEANS

LESS

CONNECTIONS

green chips

LESS CONNECTIONS ALSO MEANS

MORE SPACE BETWEEN CONNECTIONS

Reliability Increases

POWER

Reliability

are related

&

Trends

Years 70 : microprocessors “hand made” computer used just as graphical input

End Years 70: Random Logic ROMs, PLAs Z8000 M68000

Years 90: ROMs, PLAs Standard Cell 486, Pentium

Next Step: Standard Cell Random Logic Automatic Layout of

Cells-on-the-fly

Logic Design Evolution

- transistor topologies- management of routing in all layers- VCC and Ground distribution - clock distribution - contacts and vias management- body ties management- transistor sizing and folding

LayoutStrategies

Many layout decisions can contribute to power reduction

physical design as the

design of a network of transistors

43

• ---

ASTRAN Layouts

44

Non-Complementary Logic

LBBDD_0117177F177F7FFF (68 transistors)

Runtime: 36 min

L.S.da Rosa Jr., F.Marques, T.M.G.Cardoso, R.P.Ribas, S.S.Sapatnekar, A.I.Reis, Fast Transistor Networks from BDDs. SBCCI 2006, pp. 137-142.

ASTRAN Layouts

Multiplier Carry-Save 4x471

Standard-cell

Compilador de PO

Figura 6.4: Leiaute de um multiplicador carry-save 4x4

Cadeia de

carry

Usando célula ADD31 (Low-Power) Usando célula ADD32

Figura 6.5: Leiaute de dois somadores Ripple-Carry de 4 bits usando células com difer-entes potências

71

Standard-cell

Compilador de PO

Figura 6.4: Leiaute de um multiplicador carry-save 4x4

Cadeia de

carry

Usando célula ADD31 (Low-Power) Usando célula ADD32

Figura 6.5: Leiaute de dois somadores Ripple-Carry de 4 bits usando células com difer-entes potências

Standard Cell (Vendor Flow)

Generated with our Data Path Compiler

Multiplier Carry-Save 4x4

Standard Cell Cell Compiler Gain(%)

Number of Cells 52 28 46

Number of Transistors 634 376 59.3

Area (µm2) 6716 5070 24.5

Delay (ps) 2174 1896 12.8

Power (mW) 6.45 3.97 61.55

ASTRAN

•65 nm

Regular Layouts Adder

Mux

Register

Trends

H&S Codesign

Embeddedsystems

PowerPC 750

+ CACHEMemory

6.35 Millions de Transistors67 mm2

1997

MultiCPU Intel® Core™ i7 Nehalem200845nm metal gate

732 M Transistors 263 mm2

Intel® Core™ i7 -3920 (third generation)1,4 Billions Transistors in 160mm2

April 2012

22 nm technology4 cores

Intel® Xeon® E7-8800/4800/2800513 mm2 with 2,6 billions transistors. 32 nm. 10 cores

Intel Teraflops Research Chip com 80 cores

MultiCPU

100 million transistors

Trends

SOC Systems on a chip

Trends

NOC Network on a chip

Trends

Reconfigurable Architectures

Trends

Test

3D Circuits

source: www.ziptronix.com

tier 2

Oxide

Stacking of several chips

3D-Vias

tier 1

Slide by Sandro Sawicki

3D Design Methologies

Analog

RF

Memory

Processor

Processor

Memory

Memory

Memory

3D chips

3D Circuits

45nm Technology Stacked on 130nm Interposer and Packaged Courtesy of STMicroelectronics

Source: 3D integration process flow for set-top box application: description of technology and electrical results. S. Cheramy, EMPC 2009

Ricardo Reis

Tendências

CMOS Integrated Silicon Nanophotonics

Optical Connections source: IBM

Trends

Tolerance to

RadiationEffects

Single Event Effect (SEE)The  SEE  genera+on  mechanism

Thiago Assis

65

NanoSatC-BR1

UFRGS UFSM

AgingCell-­‐internal  EM  –  INV_X4  (45nm  NANGATE)

(NANGATE,  2011)

Electromigration

Cell-­‐internal  EM  –  INV_X4  (45nm  NANGATE)

J   is  2.43X  larger  and  the  lifetime  is  2.78X  smaller  (22nm  technology)  

AgingElectromigration

Trends

Microsystems

Trends

Stretchable Silicon

Wearable Computing

From: Technology Review MIT March/April 2006

Trendsnew transistors

FinFETsFin-­‐type  DG-­‐FET  

The  chanel  is  not  anymore  planar,  but  ver5cal  

FDSoI

Beyond CMOS

With CMOS

Source: ITRS2009, Original Source P.Kim, Columbia University

Carbon-based Nanoelectronics

broadband frequency mixer operating at frequencies up to 10 gigahertz

source: IBM

Graphenethe thinnest electronic material consisting of a single layer of carbon atoms

Quantum Circuits

eight-qubit unit cell

Quantum Circuits

D-Wave's 512-qubit chip, code-named Vesuvius. The white square on the right contains the quantum goodness.

Factory Integration

Foundry IBM

Fonte: Intel

Visualization Tools

More on colors…

Placement using PlaceDL

Placement of the IBM18 circuit using UFRGS tools > 200 thousand logic cells

Placement

Routing Colors IBM1

Routing Colors IBM18

A Tool to Simulate Optical Lithography

in NanoCMOs

Tania Mara Ferla, Guilherme Flach, Ricardo ReisI2MTC2014

A Problem in NanoCMOs

Technology  Scaling

Why optical lithography is an issue? Lost of resolution in nanometric technologies.

…  and  the  technology  node  is  at  14nm  !

Lithography  Systems  Evolution  did  not  followed    the  technology  scaling

Diffraction Problem: Some solutions...

Improvements in optical lithography systemExample: reduction of the wavelength

RET (resolution enhancement techniques):→ DPL / MPL (multiple and double patterning lithography)→ RDR (Restricted Design Rules)→ OPC (Optical Proximity Correction)→ Regular Layout

Li-­‐Da  Huang,  2004

Other  Lithography  Technologies  under  development:     Extreme  Ultra-­‐Violet  Lithography  (EUV)     E-­‐bream  direct-­‐write  (EBDW)     Directed  self-­‐assembly  (DSA)  

Lithux

Mask Intensity Map Printing Pattern

EDA tool for Lithography Simulation

MULTIPLE PATTERNING

source: Mentor Graphics

EDA Tools Running

on FPGAs

Conclusions

IC design qualitydepends on the quality of the tools

more &

more

Conclusions

Application Specific Embedded Systems

more &

more

Conclusions

PowerOptimizationin all abstraction levels

more &

moregreen chips

Low PowerReliability

Health Specs

Conclusions

Dedicated Chips

keyword in Nanoelectronics

OPTIMIZATION

Conclusions

Everything finishes

in aChip

more &

more

Trends on Micro and Nanoelectronics Ricardo Reis

www.inf.ufrgs.br/cassw

This year, for the first time, the workshop includes 2 poster sessions. The program will cover topics on Circuits and Systems, including but not limited to Analog and Digital Circuits, Mixed-Mode Circuits, Biomedical Electronics, Communication/RF Circuits, Wireless Sensor Networks, Nanoelectronics, Electronic Design Automation, VLSI Sys-tems and Applications, FPGA Design and Applications, Circuit Testing, Fault Tolerant Circuits.The authors must submit an A4 pdf with a copy of the proposed poster. The proceed-ings will be published in pdf with the collection of accepted posters. More information about poster guidelines are at the event website.

Important Dates

Poster submission deadline: 20 September 2015 (firm deadline)

Notification of acceptance: 27 September 2015

Publication-ready final version : 5 October 2015

General Chair Ricardo Reis

Program Chair Marcelo Johann

Poster Session Chair: Raphael Brum

Finance Chair: Gracieli Posser

Publication Chair: Carolina Metzler Web Chair: Tania Ferla

5th IEEE CASS Rio Grande do Sul WorkshopPorto Alegre, BrasilOctober 22-23, 2015

Poster Session

CALL FOR POSTERSThe IEEE Circuits and Systems Workshop will be held for the fith time in Porto Alegre on October 22-23, Thursday and Friday. It is an event intended for academic and industrial exchange between local researchers and foreign researchers. The speak-ers are renowned researchers and from institutions with significant work in the field of microelectronics. The event will last for two days and the programming will consist of a series of invited tutorials and 2 poster sessions.The Workshop Location is the Instituto de Informática of the Universidade Federal do Rio do Grande do Sul.

Some of the invited speakers are: Andrew Kahng - UCSD (USA) Gi-Joon Nam - IBM Yorktown (USA) François Rivet - IMS (France) Onur Mutlu - CMU (USA) Victor Grimblatt - Synopsys (Chile) Ricardo Jacobi - UNB (Brazil)

More details at the event webpage.

LASCAS is the international symposium of the IEEE Circuits and Systems Society in Latin America. Its seventh edition will take place on Ingleses Beach, Florianopolis, Brazil. The city of Florianopolis, a.k.a. the magic island, is located mainly on the island of Santa Catarina. Florianopolis has also a continental part and surrounding small islands. With a population of around 500,000 people, the city is known for having a very high quality of life. The island is a delicious slice of paradise with over 520 km2 (200 sq mi) of green hills, blue lagoons and 42 white sand beaches. The fishing boats, the lace makers, the folklore, the cuisine and the colonial architecture contribute to tourism. The economy of Florianopolis is heavily based on information technology, tourism and services. Florianopolis is home to the Federal University of Santa Catarina (UFSC), one of the largest in Brazil, with over 34,500 students. During the symposium, the temperature is expected to be in the range 22 oC - 31 oC.

The symposium will cover technical novelties and tutorial overviews on circuits and systems topics including but not limited to:

Social Activities: Besides the technical program, a very entertaining social program is planned. Special tours to tourist attractions will be available to the Symposium attendees and their guests.

LASCAS 20167th IEEE Latin American Symposium on Circuits and SystemsFlorianópolis, BrazilFebruary 28-March 2, 2016

ieee-lascas.org/lascas2016/

Andreas Andreou, Johns Hopkins Univ, USA

Camera-ready: December 21, 2015

Call for Papers

The 22nd edition of the Workshop will take place at Ingleses Beach, Florianopolis, Brazil. With a population of around 500,000, the city is known for having a high quality of life. The city is located in a paradisiac island with over 520 km2 (200 sq mi) of green hills, blue lagoons and 42 white sand beaches. During the symposium, the temperature is expected to be in the range of 22 oC - 31 oC. The Iberchip workshop provides an annual forum to academic and industrial researchers from Iberoamerican countries in which to exchange experiences, share knowledge and establish relations to foster the development of activities related to the field of Microelectronics. Special emphasis is put in the improvement of education and training, and in the promotion of joint cooperative projects.

Topics of Interest

Besides the technical program, a very entertaining social program is planned. Special tours to tourist attractions will be available to the Workshop attendees and their guests.

Florianopolis, BrazilFebruary 28-March 2, 2016

UFSC, Brazil Marcio Cherem Schneider, UFSC, Brazil

Jorge Juan-Chico, Univ. Sevilla, Spain

More Information in the conference webpage.

Call for Papers

Iberchipxxii workshop ieee-lascas.org/lascas2016

IWS’2016

ASYNC2016PORTO ALEGRE BRAZIL

May 1 to 4 2016

CALL FOR PAPERS

22nd IEEE International Symposium on Asynchronous Circuits and Systems

www.asyncsymposium.org

A large number of VLSI chips and digital systems designs contain multiple, interacting timing domains. The resulting asynchrony is both an opportunity and a challenge for design, validation, and test. The International Symposium on Asynchronous Circuits and Systems (ASYNC) is the premier forum for researchers to present their latest findings in the area of asynchronous design.

REGULAR PAPERSAuthors are invited to submit papers on any aspect of asynchronous design topics ranging fromdesign, synthesis, and test, to asynchronous applications in system-level integration and emerging computing technologies. Topics of interest include:– Mixed-timed circuits, GALS systems, Network-on-Chip, and multi-chip interconnects– Elastic and latency-tolerant synchronous design– Asynchronous pipelines, architectures, CPUs, and memories– Asynchronous ultra-low power systems, energy harvesting, and mixed-signal/analogue– Asynchronous logic in power-constrained applications– Asynchronous techniques for 3D integration– Asynchrony in emerging technologies, including bio, neural, nano, and quantum computing– CAD tools for asynchronous design, synthesis, analysis, and optimization– Formal methods for verification and performance/power analysis– Test, security, and fault tolerance– Asynchronous variability-tolerant design and design for manufacturing– Circuit designs, case studies, comparisons, and applicationsSubmissions must report original scientific work, in 6-8 pages IEEE double-column conferenceformat, with author information concealed. Accepted papers will be published in the IEEEdigital library IEEEXplore and symposium proceedings.

INDUSTRIAL PAPERSASYNC 2016 will include a special industrial workshop with papers and tutorials from industry and research on the state-of-the-art application of asynchronous designs to both existing and emerging technologies. The topics are targeted at industry and include:– Synchronizers and clock domain crossing techniques– Techniques for combining asynchronous and clocked designs– CAD tools to integrate asynchronous circuits with clocked designs– Circuit designs, case studies, comparisons, and applicationsWe solicit 1-to-2-page submissions for the workshop, IEEE double-column conference format. These papers will go through a separate light-weight review process. Accepted papers will be published in the IEEE digital library IEEEXplore and symposium proceedings.

“Fresh Ideas” Workshop / Tools & DemosASYNC 2016 will include a special workshop to present “fresh ideas” in asynchronous design, not yet ready for publication. We solicit 1-to-2-page submissions for the workshop, which will go through a separate light-weight review process. Accepted submissions will be assembled and handed out at the workshop. We also solicit tools and demos for presentation at the conference.

Important Dates

Abstract Registration deadline: 24 Nov 2015Full paper submission deadline: 1 Dec 2015Notification of acceptance: 13 Feb 2016Workshop submission deadline: 27 Feb 2016Publication-ready final version : 6 Mar 2016

General ChairNey Calazans, PUCRS, Brazil ney.calazans@pucrs.br

Program ChairsPeter BeerelJulian Pontes

Local Chair:Fernando Moraes

Finance Chair:TBD

Publication Chair:TBD

Publicity Chair:Ricardo Reis

Something Else

ISPD - International Symposium on Physical Design Discrete Gate Sizing Contest 2012

organized by Intel

Second Place in one ranking (result metric)

First Place in the second ranking (that included running time)

Tiago Reimann, Guilherme Flach, Gracieli Posser

Jozeanne Belomo, Marcelo Johann, Ricardo Reis

ISPD - International Symposium on Physical Design Discrete Gate Sizing Contest 2013

organized by Intel

First Place in the Primary Metric Ranking

ICCAD Contest 2014 First Prize

Incremental Timing-Driven Placement

Team:Guilherme Flach, aluno de doutorado, Jucemar Monteiro, aluno de mestrado, Julia Puget, bolsista IC Mateus Fogaça, graduando na FURG,

Advisors:Marcelo JohannRicardo ReisPaulo Butzen (FURG)

Trends on Micro and Nanoelectronics Ricardo Reis