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The top documents tagged [nm roughness]
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FP7-ICT-2007-2 HELIOS Large-scale Integrating Project Large-scale integrating project (IP) ICT Call 2 FP7-ICT-2007-2 pHotonics ELectronics functional Integration
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RECX
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RECX Thin film metrology. Phi-scan -In plane orientation GIXRD -Enhance material probed -Phase -Stress -Depth profiling HRXRD / RSM -Texture
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