The top documents tagged [intrinsic resolution]

Impact parameter studies with early data from ATLAS Aaron Bundock University of Liverpool
Documents Impact parameter studies with early data from ATLAS Aaron Bundock University of Liverpool

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Impact of detector thickness on imaging characteristics of the Siemens Biograph DUO PET/CT with GATE
Technology Impact of detector thickness on imaging characteristics of the Siemens Biograph DUO PET/CT with GATE

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29_-_Nuclear_Imaging_II.ppt
Technology 29_-_Nuclear_Imaging_II.ppt

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TPC status Marian Ivanov. Outlook TPC performance ExB correction Alignment Nonlinearities and edge effects Drift velocity calibration
Documents TPC status Marian Ivanov. Outlook TPC performance ExB correction Alignment Nonlinearities and edge effects Drift velocity calibration

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August 26, 2003P. Nilsson, SPD Group Meeting1 Paul Nilsson, SPD Group Meeting, August 26, 2003 Test Beam 2002 Analysis Techniques for Estimating Intrinsic
Documents August 26, 2003P. Nilsson, SPD Group Meeting1 Paul Nilsson, SPD Group Meeting, August 26, 2003 Test Beam 2002 Analysis Techniques for Estimating Intrinsic

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Fundamentals of WWW Imaging Fort Collins, CO Copyright © XTR Systems, LLC Fundamentals of Web Imaging Instructor: Joseph DiVerdi, Ph.D., MBA
Documents Fundamentals of WWW Imaging Fort Collins, CO Copyright © XTR Systems, LLC Fundamentals of Web Imaging Instructor: Joseph DiVerdi, Ph.D., MBA

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Prospects of measuring B s ! + - with CMS Frank-Peter Schilling (CERN/PH) For the CMS Collaboration Assisi (Perugia), Italy 20 th -24 th June 2005
Documents Prospects of measuring B s ! + - with CMS Frank-Peter Schilling (CERN/PH) For the CMS Collaboration Assisi (Perugia), Italy 20 th -24 th June 2005

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Could CKOV1 become RICH? 1. Characteristics of Cherenkov light at low momenta (180 < p < 280 MeV/c) 2. Layout and characterization of the neutron beam
Documents Could CKOV1 become RICH? 1. Characteristics of Cherenkov light at low momenta (180 < p < 280 MeV/c) 2. Layout and characterization of the neutron beam

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8/16/06 1 JEOL JBX-9300FS Electron Beam Lithography System Georgia Tech Microelectronics Research Center Enabling Nanotechnology
Documents 8/16/06 1 JEOL JBX-9300FS Electron Beam Lithography System Georgia Tech Microelectronics Research Center Enabling Nanotechnology

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Graham W. Wilson Univ. of Kansas
Documents Graham W. Wilson Univ. of Kansas

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Introduction to Low-Temp. SCM/AFM in High Magnetic Fields
Documents Introduction to Low-Temp. SCM/AFM in High Magnetic Fields

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1. General Consideration 2. Choice of Crystal 3. Structure of EMC 4. Quality control of CsI(Tl) crystals 5. CsI(Tl) counter 6. Readout 7. Counter testing
Documents 1. General Consideration 2. Choice of Crystal 3. Structure of EMC 4. Quality control of CsI(Tl) crystals 5. CsI(Tl) counter 6. Readout 7. Counter testing

218 views