STAR Pixel DetectorLatch-up in Phase-1, SUZE and
Mimosa22
Tests and analysis by Michal Szelezniak
LBNL-IPHC 06/2009 - LG 2
Talk Outline
• LU & SEU testing goals.• SEU facility at BNL and test setup.• LU cross-section for sensors measured.• SEU.• Observations and comments
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Testing goals
LBNL-IPHC 06/2009 - LG
• Measure Latch-up cross-section in Phase-1 and SUZE.
• Measure Single Event Upsets in Phase-1• (Optional) Measure Latch-up and possible
Single Event Upsets in Mimosa-22
We scheduled testing time at the BNL Tandem SEU test facility to do latch-up testing on May 14-15, 2009
44
Facility at BNL and Test setup
LBNL-IPHC 06/2009 - LG
http://tvdg10.phy.bnl.gov/seutest.html
55
Facility at BNL and Test setup
LBNL-IPHC 06/2009 - LG
•LU test program is a VI in Labview running on the PC
•The VI uses the NI digital IO interface to count latch-up events and reset the power to the DUT.
•The RDO board provides a firmware based JTAG refresh looking for SEU errors.
Power SupplyLU detection
Power SupplyLU detection
DeviceUnderTest
NationalInstrumentsdigital I/O
RDO Board
PC
USB
USB
JTAG
DigitalPower
AnalogPower
LU detect / reset
LU detect / reset
66
Facility at BNL and Test setup
LBNL-IPHC 06/2009 - LG
Hardware used for the latch-up and SEU testing is the existing current RDO system
Mass termination board with 4 LU protected power supply daughter-cards. These cards will detect latch-up and remove supply power both in this latch-up test run and in the real Pixel detector system.
77
Latch-up measurements
Initial raw data sent to IPHC
LBNL-IPHC 06/2009 - LG
0-16 F-19Si-28
Cl-35
Ni-58Br-81
I-127Au-197
88
Latch-up measurements
Final (corrected)
LBNL-IPHC 06/2009 - LG
1.00E-10
1.00E-09
1.00E-08
1.00E-07
1.00E-06
1.00E-05
1.00E-04
1.00E-03
1.00E-02
1 10 100
LET (Si) (M eV cm2/mg)
Cro
ss
-se
cti
on
(c
m2
)
SUZE
Mimosa22
Phase1
MimoSTAR2(2006)
99
Latch-up measurements
Mimosa-22
LBNL-IPHC 06/2009 - LG
Mimosa22:
1.00E-10
1.00E-09
1.00E-08
1.00E-07
1.00E-06
1.00E-05
0 5 10 15 20
LET (Si) (MeV cm2/mg)
Lat
ch u
p c
ross
-sec
tio
n (
cm2)
upsets VDD
upsets VDA
total
1010
Latch-up measurements
Phase-1
LBNL-IPHC 06/2009 - LG
1E-10
1E-09
1E-08
1E-07
1E-06
1E-05
0.0001
0.001
0.01
0 5 10 15 20 25 30 35 40
LET (Si) (MeV cm2/mg)
latc
h u
p c
ross
-sec
tio
n (
cm2)
(corrected) VDD(corrected) VDAtotal
1111
Latch-up comments
• All latch-up detected in SUZE occurred on the VDD-FIFO supply line.
• The lowest cross-section values for Phase-1, SUZE, and M22 are calculated with a single registered latch up occurrence.
• The corrected LU cross-section plots have removed data that had latch-ups occurring at the reset frequency of the testing system.
LBNL-IPHC 06/2009 - LG
1212LBNL-IPHC 06/2009 - LG
SEU analysis (first look)Mimosa22
1.00E-10
1.00E-09
1.00E-08
1.00E-07
1.00E-06
1.00E-05
1.00E-04
0 2 4 6 8 10 12 14 16 18
LET (Si) (MeV cm2/mg)cr
oss
-sec
tio
n (
cm2)
soft errors
latch up
PRELIMINARY
First look at Phase-1 data shows similar results (single corrupted bits may be possible at LET values slightly lower than for the first latch up events)
Goals of SEU analysis
• Measure onset of errors (first look at the collected data shows that it is in the LET range for latch up events)
• Check for the likelihood of corruptions 01 and 10
• Check if bit corruptions are equally likely in different registers and at different positions in registers
No errors and no latch up
More result to come…
1313
Observations and comments
All 3 prototypes are more susceptible to latch up than Mimostar-2. SUZE is more susceptible to latch up by a factor of ~5. In general, we are not expecting to see these levels of LET during normal running conditions at STAR. Possible exceptions would be unusual events such as beam dumps and during beam injection.
We will complete the SEU analysis and report.
LBNL-IPHC 06/2009 - LG
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end
LBNL-IPHC 06/2009 - LG