Keynote Address 1

“Built-In-Self-Test and Digital Self Calibration of RFICs”

Mohammed ISMAIL ELNAGGAR The Analog VLSI Lab, The Ohio State University, USA

Chair: Mourad LOULOU, Tunisia Abstract: To achieve the highest performance/price ratios of handheld wireless devices, the

current trends in wireless chip set development call for multi-standard nanometer CMOS radios

integrated on a single chip. This represents a grand challenge to the "yield" of such chip sets and

typically requires several silicon spins which will increase the NRE development costs and may

result in significant product delays and in missing important market windows. To meet this

challenge, we present design techniques for built-in self-test (BIST) and digital self calibration of

CMOS radio systems and demonstrate the validity of these techniques in the design of

WiMAX/WLAN CMOS radio front ends.

978-1-4244-3477-0/08/$25.00 ©2008 IEEE