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Keynote Address 1
“Built-In-Self-Test and Digital Self Calibration of RFICs”
Mohammed ISMAIL ELNAGGAR The Analog VLSI Lab, The Ohio State University, USA
Chair: Mourad LOULOU, Tunisia Abstract: To achieve the highest performance/price ratios of handheld wireless devices, the
current trends in wireless chip set development call for multi-standard nanometer CMOS radios
integrated on a single chip. This represents a grand challenge to the "yield" of such chip sets and
typically requires several silicon spins which will increase the NRE development costs and may
result in significant product delays and in missing important market windows. To meet this
challenge, we present design techniques for built-in self-test (BIST) and digital self calibration of
CMOS radio systems and demonstrate the validity of these techniques in the design of
WiMAX/WLAN CMOS radio front ends.
978-1-4244-3477-0/08/$25.00 ©2008 IEEE