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MX Signal Debug

Wang Ze

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Mixed Signal Debug Experience Sharing

Contents

DAC Test

- Overview

- Debug Flow

ADC Test

- Overview

- Debug Steps

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Main Building Blocks of Analog Modules

Sequencer Timinggenerator

Waveformmemory

Sequencer memory

DAC (AWG)or ADC (WD) Filter

Relaymulti-plexer

Attor Amp

Trigger (external signal)

Clock (external signal)

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SmarTest Main Tool BarAnalog Tab -> Signal Analyzer

Signal Analyzer Start Button

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Passing Waveform into Signal Analyzer

In order to debug a waveform captured from the hardware,retrieve the waveform from the hardware and pass it into theSignal Analyzer by using an API such as PUT_DEBUG API or theData Display API.

An example:

ARRAY_D waveform1, waveform2;waveform1 = Analog.DGT("dgt1").getWaveform();waveform2 = Analog.DGT("dgt2").getWaveform();

PUT_DEBUG("dgt1", "first", waveform1);PUT_DEBUG("dgt2", "second", waveform2);

Pinname

labelname

Sourcename

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Testflow Variables

Flag Control

Testsuit Flag

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The Waveform Navigator Tool (WNT) will list eachwaveform as shown in the following screen.

Pinname

labelname

Sourcename

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DAC Test Overview

Digital Pins Digitizer

Waveform Memory

ADC

Vref

DAC

DUT

Trigger/Sync.

Analog WaveformDigitalWaveform

Device Power SupplyDevices Power Supply

Multiplexer

Digital Subsystem Analog Subsystem

Vector Memory

1

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DAC Test Debug

Case 1: No signal captured in SMT;

Case 2: Signal captured, out of limit.

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Case 1:

No signal captured in SMT1. Power check under connected state;

2. Infinite loop of pattern to capture

waveform of DAC at the point of theoutput of LB using oscillograph;(trace, relay)

3. Hardware monitor used to check therelay switch states of analog module;***

4. Trigger captured by Oscillograph tocheck the level change;software trigger can be tried:trigger:AnalogDGT(Ain).trigger();

5. TestMethod problem cause datasource overflow ***

Digital PinsDigitizer

Waveform Memory

ADC

Vref

DAC

DUT

Trigger/Sync.

Analog Waveform

DigitalWaveform

Device Power SupplyDevices Power Supply

Multiplexer

Digital SubsystemAnalog Subsystem

Vector Memory

1

2

*** Step by step debug needed

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Relays Switches Display

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Step by step debug in TestMethod

Step1:set Testsuit FlagStep3:Execute Testitem

Debugger Icons

Variables/

Expression Views Breakpoints/Problems Views

Instant Console

View

Execution Point

Breakpoints

variable=dgtz_waveform type=voidQuick Viewer/Console

/Debug Views

Step4:Debug in TestMethod

Step2 cl ick the debugon

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Case 2:

Signal captured, out of limit1. Power voltage adjustment;

2. Vil and Vih of data input pins;

3. Initial discard of DGT adjustment,wait time added in the pattern;*

4. V-Range and filter of DGTadjustment;

5. Waveform check in signal analyzer;For dynamic test, check the noise floorand harmonics;For Static test, check the integrality of thewaveform.

Digital PinsDigitizer

Waveform Memory

ADC

Vref

DAC

DUT

Trigger/Sync.

Analog Waveform

DigitalWaveform

Device Power SupplyDevices Power Supply

Multiplexer

Digital SubsystemAnalog Subsystem

Vector Memory

1

2

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Analog Setup Tool (Hardware

Settings) Pin/Core selectorsSetup Page selector Global functions

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Signal Spectrum Components

Fundamental

Harmonic

Noise

Spur

Bin Number

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ADC Test Overview

Digital Pins

DUT

AnalogWaveform

DigitalData

Conversion Clock

ADC

Trigger

Digital Capture Pins

Device Power Supplies

Power Supply

ReferenceVoltage

Waveform Generator

Waveform Memory

DAC Multiplexer

Analog Subsystem

Vector Capture Memory

Digital Subsystem

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ADC Test Debug

Case 1: No signal captured in SMT;

Case 2: Signal captured, out of limit.

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Case 1:

No signal captured in SMT1. Power check under connected state;

2. Waveform check in Analog setup;

3. Trigger captured by Oscillograph tocheck the level change;software trigger can be try:trigger:AnalogAWG(Ain).trigger();

4. Infinite repeat of sequence to capturewaveform of ADC at the point of inputof LB using oscillograph; (trace, relay)***

5. Hardware monitor used to check therelay switch states of analog module;***

6. TestMethod problem cause data sourceoverflow *** *** Step by step debug needed

Digital Pins

DUTAnalogWaveform

DigitalData

Conversion Clock

ADC

Trigger

Digital Capture Pins

Device Power Supplies

Power Supply

ReferenceVoltage

Waveform Generator

Waveform Memory

DAC Multiplexer

AnalogSubsystem

Vector Capture Memory

Digital Subsystem

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Viewing the Contents of a Waveform Label

Click here

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Set RPTI/LoopI of the sequence to generate thewaveform for capture by oscillograph

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Case 2:

Signal captured, out of limit

*** Step by step debug needed

Digital Pins

DUTAnalogWaveform

DigitalData

Conversion Clock

ADC

Trigger

Digital Capture Pins

Device Power Supplies

Power Supply

ReferenceVoltage

Waveform Generator

Waveform Memory

DAC Multiplexer

AnalogSubsystem

Vector Capture Memory

Digital Subsystem1. Power voltageadjustment;

2. VOL and VOH adjustment of digital

capture;3. Initial discard of digital capture

adjustment;

4. AWG Voltage parameter adjustment;

5. Waveform check in signal analyzer;For dynamic test, check the noise floorand harmonics;For Static test, check the integrality of thewaveform.

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Hardware Settings for the WGA

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Please collect the data using EventDatalog andthe waveform in the Signal Analyzer for analysis

if Mixed signal issue happens!

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Q&A

Thank you!