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VarManTM comprises a comprehensive suite of analysis tools that allow the designer to accurately address statistical design variations and to make the right design decision upfront. VarMan relies on advanced machine learning approaches with advanced statistical algorithms and sampling strategies.
VarManVariation-aware Design Solution
Key Benefits• Breakthroughanalysistechniques:Impressivesimulation
time speed-up
• Simulatorandenvironmentindependent:SupportsallgoldenSPICEsimulatorsanddesignenvironments
• Reliableandmaturetechnology:Testedandvalidatedbymajorplayersonmostadvancedtechnologynodes(FinFET,FDSOI)
• Smartsimulationmanager:SimulationresultsmanagementandhighsimulationthroughputthroughLSF/SGE/Slurmcluster
• User-friendlyGUI:Fastandeasy-to-use‘loadandanalyze’use model
Fast Monte Carlo AnalysisTheinnovativeapproachVarManusesforMonteCarloanalysishasbeendesignedtoprovideequivalentresultstoaclassicalMonteCarloanalysis,butwithuptoa30Xspeedup.
Application:
FMC # Runs Runtime (h)
Spice 50,000 1475VarMan 587 21
Speedup 85x 70x
• VCO,28nmBulkCMOS,1,800devices,and1,900parasitics
• RequestedMCequivalentruns:50,000
High-Sigma Performance Limits Given the required sigma (yield), this analysis will find thedesign performance limits that correspond to this yield. The analysisisveryeconomicalinthenumberofsimulationsandrobusttomulti-failurezones.Application:• SRAMbitcell,FinFETprocess
• 5.2sigmaestimation
YieldEstimation
Read Current# Runs Icell (µA) Speedup
Quantile 1/10M 100M 6.855,000xVarMan 20k 6.84
High-Sigma Yield EstimationGiven a design performance limit, this analysis will quicklyverify and estimate the yield to 4-6+ sigma with a very limited numberofsimulations.Itcapturestheprocessconfigurationsthat trigger parametric failures to accurately estimate the yield and to predict extremely rare events.
Application:• RAMbitcell,28nmCMOS
• 5.4sigma–theequivalentof930MMCruns
YieldEstimation
# Runs Detectedfails
Sigma Speedup
Monte Carlo 100M 1 5.4336,000xVarMan 26k 13591 5.42
High-Sigma SpreadHighSigmaSpread(HSS)generatesacompleteviewofacellyield in one operation, exploring sigma from low to high, toensureadesignwithbestpower,performance,andarea.
HSSisrobustfornon-linearityandnon-gaussiandistributions,commonly seen in advanced process technology nodes.
Application:
• Measure:WriteMargin• Corner:-40degC• Yield:-6to+6sigma
SRAMcellbitcell• No.ofequivalentruns:54k• 2Licenses,2CPUs• Analysistime:11min
Variability eXplorer AnalysisExploringdesignperformancecriticalzones,VariabilityeXplorer(VX) will identify marginalities from 3-sigma to high-sigma.Highly cost effective, providing variability induced marginalcorners and most influential parameters.
Application:
• SenseAmplifier,28nmFDS0I
• Target5.2sigmaequivalenttohundredsofmillionsofMCruns
Variation Manager/nσ 4.5σ 5.2σVX TiMe (h) 3.76 3.93# Runs 1k 1k# Fails 8 184usl@ nσ (mV) 35 40
Application:
• 90nmEmbeddedFlash,1,100devices• Targeted3sigmaand4sigmacorners
TrueCorners 3σ 4σ
Spice #RunsTime(h)
142k457
6M19,000
VarMan #RunsTime(h)
4222.9
5594
Time speedup 158x 4700x
VarMan Utilities
Product Analysis Summary
VarManofferdifferentutilitiesformoreefficiency:
• VarManBenchtriggersmultiplerunstoexploredifferenttemperature,sub-circuit,parametersvalues
• VarManDKQualifierforefficientDesignKitsupport• VarManCalculatortovisualizeandunderstandsigmavs
equivalentMCwithconfidenceInterval
HEADQUARTERS 2811 Mission College Blvd., 6th Floor Santa Clara, CA 95054
WWW.SILVACO.COMRev042820_08
JAPAN [email protected] KOREA [email protected] TAIWAN [email protected] SINGAPORE [email protected] CHINA [email protected]
CALIFORNIA [email protected] [email protected] TEXAS [email protected] EUROPE [email protected] FRANCE [email protected]
Features VarMan Analog
VarMan Library
VarMan Memory
VarMan Memory +
XMA Option*Variability eXplorer Analysis • • • •Fast Monte Carlo Analysis • •True Corners Extraction •Local Variability Analysis •High-Sigma Performance Limits • • •High-Sigma Yield Estimation • • •High-Sigma Spread • •XMA MC* •XMA XFail Analysis* •XMA Yield Verification* •
True Corners Extraction VarManTrueCornersExtractioninvestigatesthePVTparametersthat lead to the performance most likely to achieve a given yield. ComparedtothelongverificationtimeofthehugenumberofPVTcornercombinations,thisanalysisdrasticallyreducessimulationruns to only the essential true corners of the design.
* More information on VarMan XMA analyses, can be found in the VarMan XMA option product brief.
