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TSV Interposer: The Most Cost-Effective Integrator for 3D IC Integration
John H. LauElectronics & Optoelectronics Research Laboratories
Industrial Technology Research Institute (ITRI)Chutung, Hsinchu, Taiwan 310, R.O.C.
886-3591-3390, [email protected]
ASME InterPACK2011-52189 (Lau)
ObjectivesTo investigate the significant roles of Cu-filled TSV passive interposers for 3D IC integration.
Emphasis is placed on the roles they play as: (1) Substrates(2) Reliability buffers (3) Carriers (4) Thermal management tools
It is shown that the Cu-filled TSV passive interposers are the most cost-effective integrator for 3D IC integration system-in-package (SiP).
ASME InterPACK2011-52189 (Lau)
Contents(1) INTRODUCTION(2) 3D IC INTEGRATION(3) 3D IC MEMORY-CHIPS STACKING(4) 3D IC INTEGRATION: ACTIVE INTERPOSERS(5) 3D IC INTEGRATION: PASSIVE INTERPOSERS
A. Passive Interposers as Substrates/Carriers (2.5D IC Integration)B. Cu-Filled TSV Passive Interposers as Reliability Buffers for Moore’s
Law chipsC. Passive Interposers as the Integrators for Moore’s Law Chips (3D IC
Integration)D. Passive Interposers used as Effective Thermal Management tools and
Low-Cost Integrators for Moore’s Law chips (3D IC Integration)(6) SUMMARY AND RECOMMENDATIONS(7) ACKNOWLEDEGEMENTS
ASME InterPACK2011-52189 (Lau)
Technology
Mat
urity
Basic/Applied R&D
Applied R&D
Mass Production
Commercia-lization
Die Stacking with wire
bondsPackage
on PackageStacking
(PoP)
C2C, C2W, W2W
StackingW2W
Stacking
Full swing production for memories.
Testing and yield challenges give way for package stacking
Active applied R&D is undertaken by Research Institutes. System level challenges are key. In the
phase of industrialization.
Still in upstream research, technological challenges such as yield & device architecture
are key issues.
3D IC Packaging 3D IC Integration 3D Si Integration
3D Integration Technologies
Lau, Lee, Prem, Yu, 3D MEMS Packaging, McGraw-Hill, 2009Lau4
3D IC Integration with microbumps and thin chips
(has been favored since 2000s)
The origin of 3D Integration (1980)3D integration was trigged by the silicon-on-insulator (SOI) technology 30 years
ago, when people thought Moore’s law could be hitting the wall by the 1990s.
3D Si Integration(was favored in 1980s)
Long way to go!
No sight in Volume Production in the
next 10 years
Stacking up wafers with TSVs for electrical feed through. Bumpless!
Need Ecosystem, EDA, Technology
The right way to go and compete with Moore’s law. Hopefully in production (at
least for memory-chips stacking) by 2020!
Memory-chips
Stacking
Active Interposers (Memory/Logic +
CPU/Logic)
Passive Interposers (2.5D & 3D)
Need Ecosystem, EDA, and Business models
Cost issues and Competing technology
Will be used the most in the next
10 years
Because of the disappointment of 3D Si Integration, and using thin chips and microbumps
3D IC Integration (was rejected in 1980s)
Stacking up the chips with TSVs and solder bumps
The invention of TSV (1958)
Shockley's invention was
not meant for 3D integration
A boost (1985) by Richard Feynman
Go 3D instead of all on a surface of a chip!
TSV
Thin Wafers
W2W (SiO2-SiO2) bonding
TSV/RDL/IPD Passive Interposer
Micro Bump
TSV
8@50μm thick 2Gb Chips (16Gb)
Micro bump
TSV
TSV/RDL/IPD Passive Interposer
3D IC Integration with Passive Interposer
2.5D IC Integration with Passive Interposer
560μ
m
Micro Bump
TSV
CPU/Logic
Memory
TSV
Micro bump
BumplessCuCu
Evolution of TSV 3D integration
ASME InterPACK2011-52189 (Lau)
Xilinx’s 4 FPGAs on a Passive TSV Interposer
ASME InterPACK2011-52189 (Lau)
Xilinx’s FPGA Wide I/O Interface
ASME InterPACK2011-52189 (Lau)
` `
Organic (BT) substrate
Ordinary bumps
IPD
PCBPCB
100μm
50μm
TSV/RDL/IPD Interposer
Thermal
Stress sensor
TSV:15μm
TSV:15μm
Electrical
TSV:10μm
80μm
Mechanical100μm TSV:15μm
I/O:400 ball array, pitch:450μm
I/O:400 ball array, pitch:1mm
350μm
Micro bumps
Solder balls
TSV:10μm
RDL
1.2mm
RDL
1mm
TSV is optional
ITRI Phase-I 3D IC Integration SiP8
Not-to-scale
ASME InterPACK2011-52189 (Lau)
ITRI Phase-I 3D IC Integration Test Vehicle
ITRI’s Phase-I 3D IC integration SiP
4-chip stacked
BT-substrate
Mechanical Chip
Thermal chip TSV interposer
ITRI Phase-I 3D IC Integration Test Vehicle
ASME InterPACK2011-52189 (Lau)
10
Moore’s Law chips
ASME InterPACK2011-52189 (Lau)
Semi-Embedded TSV Interposer with Stress Relief Gap
Moore’s law Chip
Moore’s law Chip
Mirco solder joint
Mirco solder joint
Special Underfill
Special UnderfillCu-filled TSV
interposer TSVOrdinary Underfill
BT-Substrate
PCB
PCB
BT-Substrate
Ordinary solder joint(a)
(b)
TCE = 8-10x10-6/oC
TCE = 15x10-6/oC
TCE = 2.5x10-6/oC
Cu-filled TSV can be a Stress Relief (Reliability) Buffer for the Cu-low-k Pads of a Moore’s law Chip
0
50
100
150
200
250
Category 1 Category 2 Category 3
250MPa
Conventional FCBGA
FCBGA with interposer
FCBGA with interposer and underfill
125MPa
42MPa
•Selcanayagam and Lau, et al., IEEE/ECTC08, Also, IEEE Transactions 2009.•Zhang, Lau, et al., IEEE/ECTC 2009, Also, IEEE Transactions 2010•Lau and Zhang, ASME Paper: InterPACK2011-52205
Lau
IME TSV Interposers (Carriers)
3D IC Integration with microbumps and thin chips
(has been favored since 2000s)
The origin of 3D Integration (1980)3D integration was trigged by the silicon-on-insulator (SOI) technology 30 years
ago, when people thought Moore’s law could be hitting the wall by the 1990s.
3D Si Integration(was favored in 1980s)
Long way to go!
No sight in Volume Production in the
next 10 years
Stacking up wafers with TSVs for electrical feed through. Bumpless!
Need Ecosystem, EDA, Technology
The right way to go and compete with Moore’s law. Hopefully in production (at
least for memory-chips stacking) by 2020!
Memory-chips
Stacking
Active Interposers (Memory/Logic +
CPU/Logic)
Passive Interposers (2.5D & 3D)
Need Ecosystem, EDA, and Business models
Cost issues and Competing technology
Will be used the most in the next
10 years
Because of the disappointment of 3D Si Integration, and using thin chips and microbumps
3D IC Integration (was rejected in 1980s)
Stacking up the chips with TSVs and solder bumps
The invention of TSV (1958)
Shockley's invention was
not meant for 3D integration
A boost (1985) by Richard Feynman
Go 3D instead of all on a surface of a chip!
Evolution of TSV 3D integration
TSV
Thin Wafers
W2W (SiO2-SiO2) bonding
TSV/RDL/IPD Passive Interposer
Micro Bump
TSV
8@50μm thick 2Gb Chips (16Gb)
Micro bump
TSV
TSV/RDL/IPD Passive Interposer
3D IC Integration with Passive Interposer
2.5D IC Integration with Passive Interposer
560μ
m
Micro Bump
TSV
CPU/Logic
Memory
TSV
Micro bump
BumplessCuCu
ASME InterPACK2011-52189 (Lau)
TSV passive interposer supporting high-power chips (e.g., microprocessor and logic) on its top side and low-power chips (e.g., memory) on its bottom side
ASME InterPACK2011-52189 (Lau)
Microprocessor/ ASIC
TSV Interposer with RDL & IPD Simple
organic substrate
Stiffener ring
Adhesive
TIM
Heat Spreader + Sink (if needed)Microbumps
Ordinary solder bumps Solder balls
PCBMemory
Special underfills are needed between the Cu -filled interposer and all the chips. Ordinary underfills are needed between the interposer and the organic substrate.
TSV interposer supporting high-power chips on its top side and low-power chips on its
bottom side with a cavity.
ASME InterPACK2011-52189 (Lau)
Microprocessor/ ASIC
Stiffener ring
Adhesive
TIM
Heat Spreader + Sink (if needed)Microbumps
TSV /RDL/IPD interposer
with a cavity Simple organic
substrate
Ordinary solder bumps Solder balls
PCBSpecial underfills are needed between the Cu-filled interposer and all the chips. Ordinary underfills are needed between the interposer and the organic substrate.
Passive TSV interposer with RDL and IPD supporting high-power chips on its top-side and low-power chips at its
bottom-side. The organic substrate is with a cavity
ASME InterPACK2011-52189 (Lau)
35mm
35mm
10mm
10mm
TSV Interposer
High power chip
The 4 high power chips are the same and uniformly distributed over the TSV interposer.
150µm………
………
……
…
……
…
There are 66 bumps on each side. Totally 260 bumps.
High Power Chip
Top View
60µm Solder Bump
35mm
35mm
5mmTSV Interposer
Low power chip
The 16 low power chips are the same and uniformly distributed over the TSV interposer.
5mm
400µm
There are 11 bumps on each side. Totally 40 bumps.
Low power chip
Bottom View
60µm Solder bump
200µmTSV Interposer
High Power Chip
Low Power Chip 200µm
200µm
60mm Solder bump
TSV Interposer
20µm200µm
Cu TSV
850µm
There are 1600 TSVs in the interposer. So there are 400 TSVs in the quarter model.
Side View
Dimensions of the passive TSV interposer with 4 high-power flip chips on its top and 16 low-power flip chips at
its bottom (the gist of the 3D IC integration SiP.)
ASME Paper no. IMECE2010-40975Lau
Micro Bumps
PCB
Solder BallsOrdinary Solder Bumps
Organic Substrate
TSV Interposer with RDL & IPD
Heat Sink
High-power Chip High-power Chip
Heat SpreaderThermal Interface Material
Stiffener Adhesive
Special underful between the TSV interposer and the high- and low-power flip chips. Ordinary underful between the TSV interposer and the organic substrate.
Thermal Management System of 3D IC Integration Supported by a TSV Interposer
Heat SlugPCB
Low-power Chip
ASME InterPACK2011-52189 (Lau)
Low-Cost TSH (Through-Si Holes) Interposer for 3D IC Integration
1. Underfills are optional between the Moore’s law chips and the interpose when they are subjected to thermal loading! However, for shock and vibration loads, and depending on chip size, underfills may be needed!
2. Underfills between the TSH and the organic substrate/PCB are necessary!
Organic Substrate/PCB
Solderbump
RDLRDL RDL
RDLRDL
Cu/Au Stud, wire, or pillow
Solder joints
RDL
Moore’s Law chipThrough-Si Holes (TSH) Interposer
Non-metallization holes on the TSH interposer
Solderbump
ASME InterPACK2011-52189 (Lau)
Buried via (filled or unfilled) for electrical interconnects
VCSEL = Vertical Cavity Surface Emitted Laser (transparent); PD = Photo Diode Detector (transparent); TIA = Trans-Impedance Amplifier
Optical layer support (film)
Polymer Waveguide
Laminated Substrate/Board
Cu Heat SpreaderTIM
Heat Slug Heat Slug
Special Underfills (e.g., Transparent)
Special Underfills (e.g., Transparent)
Mirror Mirror
VCSEL or PDDriver chip
or TIA
Serializer or deserializer
Heat SlugTIM
TSV
Solder Ball
20ASME InterPACK2011-52189 (Lau)
Embedded 3D IC Integration with Optical Devices
TSV/RDL/IPD Interposer with
embedded fluidic channels to
support multiple Moore’s law
chips without any TSVs
Substrate
PCB
3D IC integration SiP consists of a series of TSV/RDL/IPD interposers with embedded fluidic channels to support multiple Moore’s law chips
without any TSVs
ASME InterPACK2011-52189 (Lau)
MicrobumpsMicro-channelsTSVs
Solder bumps
IPD RDLMoore’s law chips
TSV/RDL/IPD interposer with embedded fluidic channels to support Moore’s law chips with no TSVs
TSV/RDL/IPD interposer with embedded fluidic channels supporting all kinds of chips
on its top and bottom sides
ASME InterPACK2011-52189 (Lau)
Fluidic inlet
Fluidic outlet TSV Fluidic
channel
TSV
Fluidic inlet
Fluidic outlet Top-side Bottom-side
Fluidic Channel
Interposer (carrier) with TSVs for electrical feed through and fluidic microchannels for thermal
management
ASME InterPACK2011-52189 (Lau)
Fabricated TSV and embedded fluidic microchannel carrier (interposer). The TSV, sealing ring for TSVs, sealing ring for micochannels. Au20Sn solder bumps and Ti/Cu/Ni/Au UBMs
ASME InterPACK2011-52189 (Lau)
Interposer and LEDs temperature distribution LEDs temperature distribution
ASICs temperature distribution Flow path in channel
For channel height = 700μm, 100 LED@2W, 4 ASIC@10W, flow rate = 0.54L/min. Top Left (interposer and LEDs temperature distribution); Top Right (LEDs temperature distribution); Bottom Left (ASICs temperature
distribution); Bottom Right (flow path in channel)
ASME InterPACK2011-52189 (Lau)
2010
CIS with TSV (2.5D)
CIS with TSV and DSP
2020201420122008 2016 2018
Volu
me
Prod
uctio
n
MEMS on ASIC with TSV
Memory/Logic + CPU/Logic with TSV
2.5D IC integration (TSV interposer with chips on top-side)
3D IC integration (TSV interposer with chips on both sides)
Multi-LEDs on chip with TSV
Mem
ory
stac
king
Mem
ory/
Logi
c +
CPU
/Log
ic
3D Integration Roadmap 3D IC integration (TSV
interposer with embedded fluidic microchannels)
Wide I/Os DRAM
ASME InterPACK2011-52189 (Lau)
SUMMARY AND RECOMMENDATIONSThe roles played by the Cu-filled TSV passive interposers for 3D IC integration have been investigated in this study. It has been demonstrated that the Cu-filled TSV passive interposers are cost-effective 2.5D IC integration substrates and carriers, as well as 3D IC integrator, thermal management tools, and reliability buffers. Some important results and recommendations are summarized in the following.1. In the next 10 years, the TSVs will be fabricated the most (by the number of
vias) for Cu-filled passive interposers.2. Passive interposer is the most cost-effective 3D IC integrator. It is not only
for substrates, carriers, but also thermal managements. Let the passive interposer be the workhorse of 3D IC integration SiPs!
3. Besides it is the most cost-effective 3D IC integrator, the Cu-filled passive interposer acts like a stress relief (reliability) buffer, which reduces the stress acting on the Cu-low-k pads on Moore’s law chips. This advantage becomes more pronounced when the feature size is getting smaller and so does the allowable stress of the chip pads.
4. A few true cost-effective 3D IC integration SiPs with Cu-filled TSV passive interposers have been proposed.
5. 3D Si integration is the right way to go and compete with Moore’s law. Hopefully, by 2020 at least the memory chips stacking could be manufactured at lower costs and higher throughputs by using the 3D Si integration technology. The industry should stride to make this happens!
Acknowledgements
The author would like to express thanks to the financial support by Ministry of Economic Affairs (MOEA), Taiwan, R.O.C., and the strong support by the VP and Director of Electronics & Optoelectronics Research Lab, Dr. Ian Chan of ITRI.
29
Thank you very much for your attention!
Lau