Upload
harsha
View
223
Download
0
Embed Size (px)
Citation preview
8/14/2019 Thermal Analysis of Devices Using Hot Spot
http://slidepdf.com/reader/full/thermal-analysis-of-devices-using-hot-spot 1/22
Thermal Analysis of Devices Using Hot Spot
Measurements
Dimitri Kakovitch
8/14/2019 Thermal Analysis of Devices Using Hot Spot
http://slidepdf.com/reader/full/thermal-analysis-of-devices-using-hot-spot 2/22
Outline
• Terms
• Liquid crystals & Nematic liquidcrystal method
• WHY? & HOW?
• Examples
8/14/2019 Thermal Analysis of Devices Using Hot Spot
http://slidepdf.com/reader/full/thermal-analysis-of-devices-using-hot-spot 3/22
Terms
• The crystal structure is said to be isotropic if the spacing of the atoms
is the same along each axis.
• If the spacing or arrangement of atoms along one axis is different
from that of another axis, then the crystal is said to be anisotropic. • If the atoms or molecules of a solid are not arranged in a regular
periodic structure, then the solid is said to be amorphous.
• Crystals that are anisotropic are also optically anisotropic. (An
optically isotropic medium is the same in all directions).
8/14/2019 Thermal Analysis of Devices Using Hot Spot
http://slidepdf.com/reader/full/thermal-analysis-of-devices-using-hot-spot 4/22
Polarizer
A polarizer is a device that transmits thecomponent of the electric field in thedirection of its transmission axis andblocks the orthogonal component.
8/14/2019 Thermal Analysis of Devices Using Hot Spot
http://slidepdf.com/reader/full/thermal-analysis-of-devices-using-hot-spot 5/22
WHY?
• As temperature rises on adevice, its performance isdegraded.
• Typical, heat sources arise fromelectronic components withlarger power consumption thantheir surroundings.
• Exact temperature and locationmeasurements of heat sources isa valuable tool in improvingdesign to prevent device failure.
8/14/2019 Thermal Analysis of Devices Using Hot Spot
http://slidepdf.com/reader/full/thermal-analysis-of-devices-using-hot-spot 6/22
Techniques to measure the temperature on the
device surface.
• Infrared thermal imaging: a quick and
easy method for measuring temperature and
temperature gradients. – Limitation: the resolution of the image, so this
technique is not adequate for a micron-scale
device.• Nematic liquid crystal method
8/14/2019 Thermal Analysis of Devices Using Hot Spot
http://slidepdf.com/reader/full/thermal-analysis-of-devices-using-hot-spot 7/22
Nematic liquid crystal method
• Advantages:
– non-destructive
– easy to apply
– high resolution that is limited only by the
resolution of the microscope used to
observe it.
8/14/2019 Thermal Analysis of Devices Using Hot Spot
http://slidepdf.com/reader/full/thermal-analysis-of-devices-using-hot-spot 8/22
Liquid Crystal
8/14/2019 Thermal Analysis of Devices Using Hot Spot
http://slidepdf.com/reader/full/thermal-analysis-of-devices-using-hot-spot 9/22
8/14/2019 Thermal Analysis of Devices Using Hot Spot
http://slidepdf.com/reader/full/thermal-analysis-of-devices-using-hot-spot 10/22
8/14/2019 Thermal Analysis of Devices Using Hot Spot
http://slidepdf.com/reader/full/thermal-analysis-of-devices-using-hot-spot 11/22
Typical Setup
8/14/2019 Thermal Analysis of Devices Using Hot Spot
http://slidepdf.com/reader/full/thermal-analysis-of-devices-using-hot-spot 12/22
HOW?• The nematic liquid crystal is an optically anistropic medium
which can be used as a polarization rotator under certainconditions.
– Note: A polarization rotator rotates the plane of polarization
of linearly polarized light by a fixed angle, maintaining its
linearly polarized nature.
• A thin layer of liquid crystal is polished on the device.
• The nematic liquid crystal is placed between two linear
polarizers, which are on the microscope.
• The transmitted intensity of light can be modulated depending
on the rotation angle of the liquid crystal molecules. Themolecular orientation can be changed thermally or by an applied
electric field.
8/14/2019 Thermal Analysis of Devices Using Hot Spot
http://slidepdf.com/reader/full/thermal-analysis-of-devices-using-hot-spot 13/22
HOW? (cont.)
• The liquid crystal becomes an isotropic medium at the
transition temperature. In other words, a thin layer of
liquid crystal below transition temperature actually twists
or rotates the light as it passes through.
• Above the transition temperature, the orientation of
molecules becomes random and the liquid crystal becomes
an optically isotropic medium.
• Linearly polarized light is required to examine the
transition temperature (or clearing point) boundary of the
liquid crystal through a cross polarizer.
8/14/2019 Thermal Analysis of Devices Using Hot Spot
http://slidepdf.com/reader/full/thermal-analysis-of-devices-using-hot-spot 14/22
8/14/2019 Thermal Analysis of Devices Using Hot Spot
http://slidepdf.com/reader/full/thermal-analysis-of-devices-using-hot-spot 15/22
8/14/2019 Thermal Analysis of Devices Using Hot Spot
http://slidepdf.com/reader/full/thermal-analysis-of-devices-using-hot-spot 16/22
Nematic under optical microscope
8/14/2019 Thermal Analysis of Devices Using Hot Spot
http://slidepdf.com/reader/full/thermal-analysis-of-devices-using-hot-spot 17/22
Propagation of light in a twisted
nematic liquid crystal.
8/14/2019 Thermal Analysis of Devices Using Hot Spot
http://slidepdf.com/reader/full/thermal-analysis-of-devices-using-hot-spot 18/22
In other words:
• If a spot of liquid crystal is locally heated due to device
failure or power consumption above the clearing point
temperature, such spot will appear as dark gray or black.
• For example, if we use a liquid crystal with a clearing
point temperature of 29°C, then the device surface will
look dark gray if the surface temperature of the device is
higher than the clearing point temperature.
8/14/2019 Thermal Analysis of Devices Using Hot Spot
http://slidepdf.com/reader/full/thermal-analysis-of-devices-using-hot-spot 19/22
Example
• GaN-based electronic devices (i.e. AlGaN/GaN HFETs)
– Suffers from serious heating issues due to their poor
thermal conductivity
– Thermal analysis for these devices has been
increasingly sought after since their heat dissipation can
sufficiently degrade the DC and the RF performances
of the device; in particular during the high power
operation. It locates the heat source associated with
anomalous leakage or power associated with a device
failure.
8/14/2019 Thermal Analysis of Devices Using Hot Spot
http://slidepdf.com/reader/full/thermal-analysis-of-devices-using-hot-spot 20/22
Another Example• Increased system temperature
arising from dense circuitrycan lead to degradation of theimage quality as the sensor
heats itself up.• The A/D converter is a major
power consumer and itmanifests itself as a heatsource. An increase in the
driving power of the A/Dconverter generates hightemperature and the heatspreads out on the surface.
Y Media's new 3.17 C3D™
megapixel image sensor
8/14/2019 Thermal Analysis of Devices Using Hot Spot
http://slidepdf.com/reader/full/thermal-analysis-of-devices-using-hot-spot 21/22
Hot Spot
8/14/2019 Thermal Analysis of Devices Using Hot Spot
http://slidepdf.com/reader/full/thermal-analysis-of-devices-using-hot-spot 22/22