Tessolve NI Days 2015

16 October 2015 | Singapore

2 | ni.com/nidays

Table of Contents

Conference Highlights

Top 5 Reasons to Attend 3

Event Agenda 4

Keynote Sessions 5

NI Engineering Impact Award 7

Conference Content

Measurements Session 8

Automated Test and RF Session 9

Embedded Control and Monitoring Sessions 10

Exhibition

Exhibitors 11

Exhibition Floor Map 16

General Information 17

Sponsors

ni.com/nidays | 3

Join us at NIDays 2015

National Instruments is delighted to invite you to NIDays 2015 in Singapore, our annual

Graphical System Design Conference and largest regional technology and innovation event

in Singapore that brings together 100’s of leading engineers and scientists.

This complimentary, full-day, multi-track event features keynote presentations, interactive

session taught by NI and industry experts, guest industry case studies, networking

opportunities, and an exhibition showcasing the latest technologies, best practices, and

application trends or software-defined systems in test, measurement, and embedded

systems.

Top 5 Reasons to Attend

1. Inspirational Guest Keynote Speakers including Charles Schroeder, Vice President of Product Marketing, RF and

Wireless Communications, Chandran Nair, Vice President – Asia Pacific, Matej Krajnc, Regional Director ASEAN and

ANZ. Learn how together, you and NI are using a platform-based approach to overcome escalating complexity and

create the Internet of Things, and hear from our speakers about NIs vision of empowering engineers and scientists to

make this trend a reality.

2. Over 15 hours of technical content across 18 sessions and 3 application specific tracks; Embedded Systems,

Automated Test and RF, and Measurements, allowing you to maximise your learning experience.

3. The opportunity to network and connect with hundreds of peers and domain experts from industry and research

institutions; build your network, discuss your application interests, share your ideas and learn from fellow innovators.

4. Hear and learn from influential guest presenters from industry and academia; with 5 guest case study presentations

from companies including ST Kinetics, Honeywell, Accusys, Tessolve Semiconductor, and Ken Engineering and

Consulting, on topics including Hyper-Domain Data Analytics, Semiconductor Test, Machine Condition Monitoring and

Data Acquisition.

5. Explore exhibits from technology partners, system integrators and 11 interactive application demonstrations featuring

the latest NI technologies for applications including 5G Research, Wireless Production Test, PA system design and

prototyping, smart wearable devices with NI SOM, advanced control, data acquisition, the IoT and many more

Thanks to all our sponsors, exhibitors and delegates for participating in NIDays 2015. I encourage you to take advantage

of this ultimate learning environment to advance your skills, explore the possibilities of graphical system design and

inspire innovation in your own work.

We look forward to welcoming you there,

Best regards,

Matej Kranjc

Regional Director - ASEAN and ANZ

National Instruments

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Agenda

8:45-9:15 Registration & Light Breakfast

9:15-10:30Keynote: Using a Platform-Based Approach to Create the Internet of Things

Matej Kranjc, Regional Director of ASEAN and ANZ, National Instruments Charles Schroeder, Vice President of Product Marketing, RF and Wireless, National Instruments

10:30-11:00 Morning Tea Break

11:00-11:45Enabling Innovation and Inspiring Customer Success

Goh Yih-Hsiung (YH), Regional Sales Manager of ASEAN, National Instruments and Guests

11:45-12:00NI Engineering Impact Awards

Chandran Nair, Vice President of APAC, National Instruments

12:00-13:00 Lunch

Automated Test TrackEmbedded Control

and Monitoring TrackMeasurements Track

13:00-13:45

Create Without Limits: 4 Ways to Customize Your

Software-Designed Instrument

Yousi Ng, Area Sales Manager, National Instruments

Introducing New Technologies to Enable the Industrial Internet of

Things Wong Teck Chin (Jeffrey),

Field Sales Engineer, National Instruments

A Discussion About the Future of LabVIEW

Swathi Madhavan, Technical Marketing Engineer,


13:45-14:15

NI STS-T2 for MEMS Test Development

M. Banukumar, Senior Manager, Tessolve Semiconductors

Software-based approach to Asset Monitoring and Machine

Condition MonitoringKen Ng, Managing Director,

Ken Engineering and Consulting

Upgrading a High Channel Count Data Acquisition System

John Tan, Manager, Honeywell Aerospace Singapore

14:15-15:00

Exploring the Architecture and Key Features of NI

Semiconductor Test System Software

Gobinath Tamil Vanan, Technical Marketing Engineer,


Data Communication Methods for Embedded Systems

Guo Min, District Sales Manager, National Instruments

New Hardware Technologies for DAQ Applications

Froinand Fajardo, District Sales Manager,


15:00-15:30 Afternoon Break

15:30-16:00

Hyper-Domain Data Analytics Solutions Turning Big Analogue Data into Actionable Insights

Jack Wong, Assistant Manager, ST Kinetics

Your NI Machine Vision Solution within 30 Minutes

Winston Hoo, Technical Manager, Accusys

Practical Advice for Ensuring Accurate Electrical MeasurementNeo Wei Ren, Field Sales Engineer,


16:00-16:45

Prototyping with Software Defined Radio for Industry,

Academic, and Defense Applications

Malay Duggar, RF Specialist, National Instruments

Choosing a Software Architecture for Your Next

Embedded ApplicationLeon Tan,

Field Applications Engineer, National Instruments

Top Software Tips for Deployed or Distributed DAQ Systems

Wu Rong, Marketing Engineering Manager,


16:45-17:00 Q&A, Lucky Draw

ni.com/nidays | 5

Join us at NIDays 2015

NIDays keynote presentations give attendees a first glimpse at new

cutting-edge innovations from NI as well as an opportunity to learn about

customers and real-world solutions using NI tools.

Keynote: Using a Platform-Based Approach to Create the Internet of Things

9:15-10:30 | Grand Salon

Together, you and NI are using a platform-based approach to overcome escalating complexity and create the Internet of

Things.

Join the NI executives as they explore the latest advances in the NI platform and how you are using them to speed up

test, reach measurement decisions faster and enable smarter machines in the IoT. The keynote will feature live

demonstrations of application examples and the technology powering real-world IoT systems such as wireless test, data

management, condition monitoring, and communications system design.

Among the keynote speakers are:

Matej Kranjc, Managing Director of ASEAN and ANZ, National Instruments

With 30 years of engineering industry experience, Matej Krajnc is an internationally-known speaker, trend analyst and

applied engineering consultant. His expertise covers various fields, including automated test, control, and design for the

military, aerospace, automotive, and paper industries. As managing director for the ASEAN and ANZ divisions of

National Instruments, Krajnc is responsible for the growth of NI presence, visibility, sales, and application engineering

throughout Australia, New Zealand, and Southeast Asia. His experience has helped him establish NI as a powerful

solutions provider throughout his region. He and his team have developed an excellent reputation as a resource for

solving numerous industrial engineering challenges.

Charles Schroeder, Vice President of Product Marketing, RF and Wireless, National Instruments

As Vice President of Product Marketing for RF and Wireless Communications, Charles Schroeder leads the global team

responsible for product management, product marketing, and application segments of NI’s RF and wireless

communications business. Since joining NI in 1995, Schroeder has held various leadership roles across the IMAQ, DAQ,

modular instruments, and RF product lines and is recognized for his excellent communication and presentation skills as

witnessed by his regular presence on the NIWeek stage. Schroeder holds a bachelor’s and master’s degree in electrical

engineering from Texas A&M University.

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Keynote: Enabling Innovation and Inspiring Customer Success


Around the world, NI platforms are enabling local innovators to take on engineering challenges and engineer a better

world for us all, across application areas ranging from the Internet of Things and wireless research, to high-performance

automated test for the semiconductor industry and machine condition monitoring systems to increase efficiency in

renewable energy systems.

Join YH Goh, Regional Sales Manager for South East Asia, as he is joined during this keynote presentation by local

customers and partners to discuss their application demands and the innovative solutions they have developed using NI

platforms.

Goh Yih-Hsiung (YH), Regional Sales Manager of ASEAN, National Instruments

YH has been with National Instruments since 2002 and is currently the Regional Sales Manager overseeing the sales

operations for Southeast Asia.

Prior to this, he was the Area Sales Manager responsible for the sales operations for Singapore and Indonesia. YH has

worked with engineers and scientist from the academia and various industry sectors such as Electronics, Industrial

Monitoring, Automotive, Semiconductor, Aerospace and MCM applications for more than 10 years.

YH graduated from Nanyang Technological University majoring in Electrical Electronics. He started his career as an

Applications Engineer before moving to Sales. He was also instrumental in growing the presence of National

Instruments in the Philippines, Indonesia, Vietnam and Southern Malaysia.

ni.com/nidays | 7

NI Engineering Impact Awards showcase the most innovative projects

based on NI software and hardware. During NIDays 2015 and immediately

following the second Keynote presentation, Chandran Nair, Vice President

for Asia Pacific, and Mark Phillips, Marketing Manager for ASEAN and

ANZ, will recognize and celebrate local winners of the 2015 Awards.

Visit the contest poster display, to learn about the winners’ applications for

academic and industry categories, as well as the several featured awards

including the Advanced Manufacturing and Control, Advanced Research,

RF and Communications, Energy and Editor’s Choice.

NI Engineering Impact Awards

Industry Winner

New NI PXI-Based Power Supply Sequencing Tester:

Making a Big Difference

Junifer B. Frenila, Bien Verlito A. Javier, Meriam C. Yuson and Jessy P. Cantor, Analog Devices Inc. Philippines, Philippines

Industry Honorary Mention

EDA Memory Characterization Tester (EDA MCT):

Characterizing the Next Generation of Semiconductors

Using NI PXI

Sanka Hettiarachchi and Nikolaus Utomo, Providev, Singapore and EDA Industries (Asia Pacific), Singapore

Academic Winner & RF and Communications Award

Infrastructure-light and Infrastructure-less Real Time

Localization System (RTLS)

Assoc Prof Tan Soon Yim and Dr. Seow Chee Kiat,

Nanyang Technological University, Singapore

Academic Honorary Mention, Advanced Research Award & Editor’s Choice

Solution to an Autonomous Vehicle Platform Integrated

with Remote Human Intervention and Supervision

Du Xinxin, Kyaw Ko Ko Htet and Prof. Tan Kok Kiong, National University of Singapore, Singapore

Advanced Manufacturing Control Award

Increasing Reliability and Safety of Industrial Stamping

Machines with NI CompactRIO and NI LabVIEW

Ken Ng, Ken Engineering and Consulting Pte Ltd, Singapore

Energy Award

Thermal Effects of Electrical Energy Harvested from a

Laminated Piezoelectric Device

Pornrawee Thonapalin and Asst. Prof. Sontipee Aimmanee, King Mongkut’s University of Technology Thonburi (KMUTT), Thailand

Best Video Award

A Bus Flagging Prototype System for the Visually Impaired

Utilizing a Reconfigurable NI myRIO

Alex See Kok Bin, Ph.D, Chin Siet Choo, Yuen Mun Leong, Zhu TaiXiu, Ph.D, Muhammad Anas Bin Ariffin and Chan Jian Long, Ngee Ann Polytechnic, Singapore

Explore the Winner’s applications in detail and download the 2015 NI ASEAN Engineering Impact Awards full case study

booklet at singapore.ni.com/impactawards

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Measurements Sessions

A Discussion About the Future of LabVIEW


Swathi Madhavan, Technical Marketing Engineer, National Instruments

LabVIEW has helped engineers across almost every

region, market, and industry make a marked improvement

to their everyday productivity as it relates to automating

measurements. At this session, learn about the

improvements in the latest version of LabVIEW, LabVIEW

2015, and explore where NI continues to invest in our

software platform.

Upgrading a High Channel Count Data Acquisition System


John Tan, Manager, Honeywell Aerospace Singapore

Honeywell offers complete test facilities for all of its OE

products including Fan, Turboprop, APU and vehicle

propulsion engines. During this presentation, John Tan

will explore the recent upgrade to a high channel count

data acquisition system with over 300 channels of

measurement required. He will discuss the application

requirements, and why Honeywell chose an NI PXI-

based solution and the LabVIEW graphical development

environment as well as the efficiencies that have been

realized with the new solution.

New Hardware Technologies for DAQ Applications


Froinand Fajardo, District Sales Manager,


Whether your application involves taking a few voltage

measurements, a few dozen sensor measurements or

even a few hundred synchronized measurements, NI is

constantly developing new technology and releasing new

products that improve your ability to meet application

requirements. This session will introduce the major DAQ

product lines for engineers less familiar with the NI

platform, before looking in detail at new hardware

releases, their enabling technology and their application

use cases. Finally it will glimpse into the future of what

the NI DAQ platform has to offer.

Practical Advice for Ensuring Accurate Electrical Measurement


Neo Wei Ren, Field Sales Engineer, National Instruments

Every physical system component increases signal error,

noise, and uncertainty. Thankfully, you have many

established techniques for minimizing your DAQ system’s

exposure to these predigitization errors. At this session,

hear best practices for shielding, gain, noise reduction,

grounding, and connectivity that help increase the

accuracy of your measurement.

Top Software Tips for Deployed or Distributed DAQ

Systems


Wu Rong, Marketing Engineering Manager,


When you deploy systems into the field for distributed or

in-vehicle applications, errors and inaccuracies can grow

into expensive and sometimes safety-critical failures. At

this session, hear from experienced engineers as they

offer their top tips for the reliable acquisition, analysis,

storage, and management of measurement data for

deployed applications.

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Automated Test and RF Sessions

Create Without Limits: 4 Ways to Customize Your Software-Designed Instrument

13:00-13:45 | Salon 1 & 2

Yousi Ng, Area Sales Manager, National Instruments

Engineers are using software-designed instruments to

reduce test time, increase test throughput, overcome

obsolescence challenges, and perform innovative tests.

In this session, focus on four key software approaches for

developing code on software-designed instruments: (1)

using standard instrument drivers, (2) enhancing

instrument driver functionality with FPGA extensions, (3)

leveraging NI-installed sample projects, and (4) reusing

application-specific IP from the NI Community. Buckle up

for details and demonstrations of the approaches,

including FPGA code modification on NI reconfigurable

oscilloscopes and high-speed serial instruments.

NI STS-T2 for MEMS Test Development

13:45-14:15 | Salon 1 & 2

M. Banukumar, Senior Manager, Tessolve Semiconductor India

Tessolve works with a wide range of ATEs to meet

semiconductor test requirements for different customer

needs. One of the test solutions recently developed by

Tessolve in close working with National Instruments is

the MEMS test solution. This presentation would give

you an overview of the MEMS test requirements and the

methodology applied by Tessolve to configure the NI

STS tester for this application. It would also give a brief

introduction about the NI-STS-T2 including some of the

benefits such as its wide range of hardware modules

catering to different test needs, suitability for low cost

solutions, user flexibility to customize hardware and

software requirements. Multi-site testing using LabVIEW

and TSM software are also highlighted. MEMS dynamic

tests using Shakers / Rate tables, low cost solutions,

along with the proof of concept on motion tests would

also be discussed.

Exploring the Architecture and Key Features of NI Semiconductor Test System Software

14:15-15:00 | Salon 1 & 2

Gobinath Tamil Vanan, Technical Marketing Engineer, National Instruments

This session provides a brief overview of key software

features for NI Semiconductor Test System (STS) including

overall software architecture, support for code modules

developed in multiple languages, device-centric

programming with pin and channel mapping, native

multi-site support and more.

Hyper-Domain Data Analytics Solutions Turning Big Analogue Data into Actionable Insights

15:30-16:00 | Salon 1 & 2

Jack Wong, Assistant Manager, ST Kinetics

ST Kinetics has successfully delivered numerous

Intelligence Analytics Solutions, including Radio

Communications Management Solutions (RCMS),

Large-Scale Distributed Management Solutions (LSDMS),

Industrial Automation (IA) and Data Analytics Solutions

(DAS) used for both commercial and homeland security

purpose, with use of NI virtual instrumentation platform.

In this presentation, we will talk about the Hyper-Domain

Data Analytics Solutions which turn big analogue data into

actionable insights in variety of applications.

Prototyping with Software Defined Radio for Industry, Academic, and Defence Applications

16:00-16:45 | Salon 1 & 2

Malay Duggar, RF Specialist, National Instruments

Advancements in Software Defined Radio technology is

making wireless more accessible than ever before

benefiting industry, academia, and defense applications.

In this session, we share how you can leverage a

common software defined radio platform and choose the

right software tool flow to design, prototype, and deploy

SDR based systems. Topics include designing new

waveforms, prototyping high channel count systems,

deployed spectrum monitoring, educational teaching

solutions, and 5G research.

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Embedded Control and Monitoring Sessions

Introducing New Technology to Enable the Industrial Internet of Things

13:00-13:45 | Salon 5 & 6

Jeffrey Wong, Field Sales Engineer, National Instruments

In this session, learn about the new NI technology for

embedded control and monitoring applications. Products

include the latest CompactRIO and Single-Board RIO

controllers, the new Controller for FlexRIO, and the latest

C Series I/O modules. These devices incorporate the most

up-to-date technology and provide new I/O points to offer

you innovative and advanced functionality that can

increase your productivity and system performance.

Attend this session to see some of this new technology in

action and learn how it can enable your next application.

Software-based approach to Asset Monitoring and Machine Condition Monitoring

13:45-14:15 | Salon 5 & 6

Ken Ng, Managing Director, Ken Engineering and Consulting

Traditionally, asset monitoring (AM) and machine condition

monitoring (MCM) are technically low-level systems that

monitor a specific machine or asset. In the increasingly

connected environment, where different machines are

connected or related to each other, it becomes paramount

to be able to monitor your assets or machines on a higher

level in real time. This presentation will talk about a case

study on using NI LabVIEW to develop a software-based

approach to AM and MCM in real time; providing real-time

data on the health of various machines as well as able to

do complex high level analysis for system level reporting.

Data Communication Methods for Embedded Systems

14:15-15:00 | Salon 5 & 6

Guo Min, District Sales Manager, National Instruments

Coordinating data between your embedded controller and

other nodes in the system is identified by NI customers as

one of the top challenges in embedded system design

and will be crucial for Internet of Things applications. In

this session we’ll introduce effective distributed

communication architectures between targets running

LabVIEW, focusing on Network Published Shared

Variables and Network Streams.

Your NI Machine Vision Solution within 30 Minutes

15:30-16:00 | Salon 5 & 6

Winston Hoo, Technical Manager, Accusys

Demonstrating on how to create simple machine vision

solution utilizing NI technologies, started from system

design, component selection, program development to

results output.

Choosing a Software Architecture for Your Next Embedded Application

16:00-16:45 | Salon 5 & 6

Leon Tan, Field Applications Engineer, National

Instruments

Developing software for embedded applications can be

challenging. For starters, the business logic for these

systems is rarely simple. However, the real challenge

often lies in processes like connecting that logic to I/O,

integrating the application into an existing system, and

ensuring that the application runs properly for months or

years at a time. These projects also frequently encounter

logistical challenges such as supporting multi developer

teams with tight time-to-market pressures. At this session,

discover how a good architecture can help address these

issues and review your different architecture options.

ni.com/nidays | 11

Keynote Demonstrations

Revolutionizing 5G Research with LabVIEW Communications

Grand Salon

Learn how to rapidly prototype with software that detects,

configures, and manages your hardware while saving time

and focus on innovation with the latest release of the

802.11 and LTE application frameworks. Also find out

ways to take advantage of the all new SDR hardware

support for wide-bandwidth applications enabling your 5G

research at its peak.

Lower Your Cost of Wireless Manufacturing Test

Booth 10

Engage in multistandard testing of the latest cellular and

connectivity devices, from LTE-A to 802.11ac to Bluetooth

Low Energy, with the Wireless Test System (WTS). With

the WTS, you can be sure to reduce test cost by testing

up to 8 DUTs in parallel and perform data analysis on the

latest Intel processors. Along with that, also learn on ways

to rapidly deploy testers with ready-to-run test sequences

and a standard SCPI interface with this insightful

demonstration.

The Future of the Internet of Things

Booth 15

Watch how NI is helping to create a climate of innovation

where tomorrow’s engineers will realize the true potential

of the IoT. Take part and join effort with NI to inspire,

motivate, inform, and build confidence among engineers

on the role of our customers, partners, and NI in shaping

the future of IoT.

High Speed Measurements with the New Controller for FlexRIO

Booth 13

Watch NI Engineers show ways to acquire and process

data on full bandwidth data in real-time to isolate signals

of interest and provide valuable knowledge to users.

Deploy your algorithms to run stand-alone in the field,

running on big Kintex-7 K410T FPGAs and dual-core ARM

processors with NI Linux Real-Time to serve up low

bandwidth data over the network while streaming back up

to 1.25 GB/s of data over fiber or copper cabling.

Exhibition Area

NIDays will feature an extensive exhibition and demonstration area,

featuring interaction application demonstrations from both NI and our

Alliance Partners; specialist system integrators and experts in developing

solutions based on NI Platforms. Take the chance to get a closer, deeper

look at all the latest technologies, including those featured in the Keynote

presentations.

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Automated Test and RF Demonstrations

Wafer Probe Loadboard/PIB (STS T2 MB)

Booth 5

DTS has a full line of standard PIBs for all major tester

platforms. Custom PIB designs can accommodate any

test head, prober and manipulator configuration, including

probe card changers, overhead direct dock setups and

cable interfaces. DTS wafer test loadboards are

compatible with a variety of pogo pin interface towers. All

PIBs are constructed with impedance control, precision

matched line lengths, full power and ground planes and

both analog and digital resources to provide high quality

signal integrity directly to the device.

Dynamic Test Solutions Asia

www.dynamic-test.com

PackageTest Loadboard/ DIB (STS ATE LB)

Booth 5

DTS Package Test (DIB) loadboards are designed to

specific devices and configured for both hand test and

fully automated handler applications. DTS loadboards

incorporate any brand of socket or contactor and can be

configured for multi-site testing. Designs incorporate all

necessary components, connectors, mechanical hardware

and stiffeners to provide a complete plug-n-play solution.

DTS has a vast database of tester and handler information

which allow designs to be started and completed quickly

without burdening the customer to supply excessive

information. DTS designers are experienced in all device

types, including digital, analog, mixed signal and RF

devices

Dynamic Test Solutions Asia

www.dynamic-test.com.

An Integrated HTRB and THB Test Platform for MOSFETs Using PXI and LabVIEW

Booth 6

A fully automatic HTRB and THB process was made

possible by integrating a parametric test subsystem

based around the NI PXI platform, with a climatic

chamber. The whole system was controlled by a custom

software created using the NI LabVIEW platform. The

result has reduced the time for each characterization test

from a few days to a few hours, and guarantees that the

test result is easily obtainable and reliable.

EDA Industries (Asia Pacific)

www.eda-industries.net

Automatic Unknown Emitter Detection (AUED)

Booth 7

To detect the unknown emitters in HF frequency range

(3-30MHz) is challenging where the noise floor is uneven

and the HF band is congested with multiple emitters.

Using FPGA-based wavelet analysis, the system can

automatically detect the emitter in real time.

Singapore Technologies Kinetics Ltd

www.stengg.com

Test Development for MEMS Inertial Sensors on NI STS T2

Booth 8

Observe the power of the NI STS-T2 configuration used

for MEMS Inertial Sensor test while going through the

challenges and constraints faced and how the engineers

solved every single one of them. Also obtain primary

source information on the development methodologies

directly from the exhibitors. Learn more about the

NI-STS’ multi-site testing capabilities and the design

concept of universal mother boards and daughter boards.

Tessolve Engineering Services Pte Ltd

www.tessolve.com

Build your Test Applications with NI PXI and TestStand

Booth 9

Learn how NI helps to you to develop test systems faster

with ready-to-run Test Management Software, the NI

TestStand. With the combination of the NI TestStand and

the NI PXI platform, you can be sure to increase test

development productivity and reduce overall test costs.

The flexibility of the software-defined measurements are

boundless, providing high-speed measurements with

perfect timing controls.

Base Station and Small Cell PA Design

Booth 10

Efficiently develop software prototypes of your Power

Amplifier design for easy simulation. Explore the simple

demonstration to obtain great insights on ways to readily

retarget base station/FEMtoCell designs to evolving

standards

ni.com/nidays | 13

Embedded Control and Monitoring Demonstrations

Increasing Reliability and Safety of Manufacturing Machines with KEC Machine Condition Monitoring (MCM) Solution

Booth 2

Harness the power of CompactRIO and LabVIEW to

monitor, identify and rectify anomalies in real-time during

continuous manufacturing operations. This rugged and

independent CompactRIO system operations dramatically

increase Operator SafetyFEC MCM Solution records and

stores machineSafety. Together with KEC MCM Solution,

machine condition data can be continuously recorded and

stored in Host Server for post analysis.

Ken Engineering and Consulting Pte Ltd www.kec.sg

Environmental Monitoring System

Booth 3

A Temperature and humidity monitoring for laboratory,

production floor, warehouse and building which uses NI’s

compactRIO real-time embedded system for monitoring.

It features include: (1) Administrative (administrator and

user management with system access and data security),

(2) Alert (alarm trigger of individual monitoring point), (3)

Report management (report generation and report

retention), (3) Centralized monitoring Microwave

Education and Research Through NI and AWR Integrated

Solutions.

T2 Integrated Solutions Pte Ltd

www.t2is.com.sg

Robotics from the Dungeons to Daily Lives

Booth 4

Robots are commonly used in manufacturing sectors are

usually behind closed doors. They are now much more

mature to be used in daily lives such as warehouses,

material handling, healthcare and even hospitality.

HOPE Technik Pte Ltd

www.hopetechnik.com

Dynamic Measurement with Smart Glasses and NI SOM

Booth 12

Learn how NI solves real world problems with this

intelligent human embedded sensing demonstration with

wearable devices such as a safety helmet. Explore

together the abilities of NI SOM to obtain dynamic and

real-time measurement of environmental data together

with extremely efficient processing capabilities.

Rugged and Reconfigurable Control and Monitoring System

Booth 14

Discover how NI CompactRIO combines an open

embedded architecture with small size, extreme

ruggedness, hot-swappable industrial I/O modules, and is

powered by the NI LabVIEW reconfigurable I/O (RIO)

architecture. Using the NI CompactRIO, you can simplify

development, increase productivity, and dramatically

reduce time to market with the help of user-

programmable FPGA, where you can implement custom

hardware for high-speed control, inline data processing, or

complex timing and triggering.

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Academic and Measurements Demonstrations

Pitsco TETRIX PRIME for NI myRIO: Students Create

Robots to Learn Controls and Mechatronics

Booth 1

Introduce students to engineering and robotics with

step-by-step instructions for three robot models while at

the same time helping students implement controls,

mechatronics, and robotics theory learned in the

classroom. Equip students to create their own designs

with graphical programming, sophisticated sensors and

actuators, and industry relevant technology.

Simplify Measurement Systems with NI’s CompactDAQ

Booth 16

Feast your eyes with the portable, rugged DAQ platform

that integrates connectivity and signal conditioning into

modular I/O for directly interfacing to any sensors or

signals with the help of LabVIEW software to customize

how you acquire, analyze, present, and manage your

measurement data. Obtain great insights on the

applications, from in-vehicle data logging, to benchtop

research, the breadth of bus, chassis, controller, and I/O

conditioning options which provide the best solution to

meet the needs of any medium-channel-count application.

VirtualBench: 5 Instruments. 1 Device.

Radically Practical

Booth 17

Broaden your mind with the practical approach to

benchtop instrumentation. Five essential instruments, one

device, and an intuitive software interface. A single

benchtop instrument with Oscilloscope, Function

Generator, Digital I/Os, Power Supply, and Digital

Multimeter, all with the ability to view and interact with

data using intuitive, user-friendly software for Windows

and iPad.

ni.com/nidays | 15

LabVIEW Usergroup Demonstrations

Singapore LabVIEW Usergroup

Singapore LabVIEW Usergroup is a group of LabVIEW enthusiasts that

gathers to improve their LabVIEW skills and knowledge with others. Visit

their booth to learn more from them.

Split Video Screen with LabVIEW ActiveX Control and

Windows Mediaplayer

This demo uses ActiveX Control technology to split

screen for video sources technology that could be useful

for surveillance purposes.

Customizable Imaging Concept for Photonics and

Bio-imaging

We demonstrate a flexible concept for displaying scan

images for photonics and bio-imaging applications. Users

are able to easily customize settings for their imagery

with minimal programming, such as image size,

resolution, signal gain and scaling bar, with the aim of

letting users get their imaging experiments up and

running in a shorter amount of time.

Singapore Live Irradiance Map

The system comprises of 25 meteorological stations

located strategically around the Singapore Island. Full sets

of meteorological parameters are received every one

second at the Central Monitoring System at SERIS. Solar

irradiance readings from all the stations are aggregated

and displayed as interpolated color map overlaid with

Singapore contour map.

The map is updated every 2-3 seconds. It shows rapid

changes of irradiance values in real time, and visualizes

clouds movement over the island. These readings are one

of the components of solar irradiance forecasting system

developed by SERIS. Due to fast increase in the number of

grid connected solar photovoltaic systems, there is a need

to adjust energy generation from conventional power

plants, ahead of significant variations of solar irradiance.

Live Irradiance map is also available to public at the

National Solar Repository Web page at:

www.solar-repository.sg, with update rate.

16 | ni.com/nidays

Exhibition Floor Map

Exhibition Hours

08:15 a.m. – 09:00 a.m.

10:30 a.m. – 11:00 a.m.

12:00 p.m. – 01:00 p.m.

03:00 p.m. – 03:30 p.m.

Automated Test TrackSalon 1 & 2

Embedded Control and Monitoring Track

Salon 5 & 6

Keynote and Measurement Track

Grand Salon 1 & 2

Entr

ance

R

egis

trat

ion

Media Room

Buffet

Buffet

Buffet

Buffet

B

uffe

t

Automated Test and RF Demonstrations

Embedded Control and Monitoring Demonstrations

Academic and Measurements Demonstrations

C

LV

2

3

4

5

6

7

8

9

10

11

12

13

1

14

15

16

17

C Customer Education

LabVIEW User Group

LV

ni.com/nidays | 17

NI Certification

Validate Your Expertise

• Demonstrate skills and work quality

• Inspire confidence in managers, peers and

customers

Differentiate Yourself

• Set yourself apart from your colleagues

• Be known for your expertise

Network With Peers

• Access private online communities

• Learn from and interact with other certified

professionals at annual certification summits

Standardize Across Your Organization

• Use uniform and secure exams worldwide

• Invest in your employees’ success, gauge their skills, and ensure work quality

• Clearly define and reward technical skill development goals for individuals

• Recognize technical leaders and develop communication channels and communities that promote the use of best practices and quick problem resolution

The Value of NI Certification

Join the nearly 20,000 certified professionals worldwide who demonstrate

their skills with NI products so that anyone, whether managers,

customers, or peers, can be confident in the quality of their work.

Certification Offered

Skill Level

LabVIEW

TestStand

LabWindows™/CVICore Embedded Systems

Developer

Architect Master architecting

and managing

applications

Demonstrate

proficiency in

designing and

deploying embedded

control and

monitoring

applications

Architect and manage

applications

No certification

offered

Developer Create functional,

well-documented

code with minial

development

Completely

understand the core

features and

functional

Completely

understand the core

features and

functional

Associate Developer Understand the core features of and the

ability to interpret existing LabVIEW code

No certification

offered

No certification

offered

Visit the Customer education booth to speak to our Training Specialist or visit singapore.ni.com/training

18 | ni.com/nidays

Conference Information

Venue Information

Grand Hyatt Singapore

10 Scotts Road

Singapore 228211

Free Registration

For more details and to register, please visit

singapore.ni.com/nidays

Email: [email protected]

Call: (65) 6226 5886

Toll free: 1800 226 5886

Map and Directions

Grand Hyatt Singapore is conveniently located on Scotts

Road, at the start of the Orchard Road shopping precinct.

Parking Charges

Car

Monday - Saturday:

- 4:00am - 4:59pm:

- 1st hour – SGD 3, Subsequent half hour – SGD 1

After 5:00pm:

SGD 5.00 per entry

Motorcycle

SGD 5 per entry

ni.com/nidays | 19

Lucky Draw

Prize Draw

All attendees* are eligible to enter a prize draw on the day to win an iPad

mini 4 and IPod Touch, 32gb

*Excludes exhibitors and staff

Sponsored by:

Providev and Ken Engineering and Consulting Pte Ltd.

ni.com/nidays

©2015 National Instruments. All rights reserved. Big Analog Data, CompactRIO, CVI, DIAdem, LabVIEW, Measurement Studio, Multisim, National Instruments, NI, ni.com, NI CompactDAQ, NI-DAQ, NI FlexRIO, NI-IMAQ, NI miniSystems, NI SoftMotion, NI TestStand, NI VeriStand, NIWeek, and USRP are trademarks of National Instruments. The mark LabWindows is used under a license from Microsoft Corporation. Windows is a registered

trademark of Microsoft Corporation in the United States and other countries. LEGO, the LEGO logo, and MINDSTORMS are trademarks of the LEGO Group. Other product and company names listed are trademarks or trade names of their respective companies. A National Instruments Alliance Partner is a business entity independent from National Instruments and has no agency, partnership, or joint-venture relationship with National Instruments.

Documents

Tessolve NI Days 2015