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    Agenda

    Introduction to Alteras designs and challenges

    Alteras approach to LVS debugging

    Powerful IC Validator LVS capabilities

    Summary

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    Introduction to Altera Designs

    Intro to what sort of designs Alteramakes

    28nm and 20nm process technologies

    Billion transistors

    leading design DSP, Transceiver, signalintegrity

    Design for communication chips,

    network signal processing

    Advanced FPGA Design

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    Agenda

    Introduction to Alteras designs and challenges

    Alteras approach to LVS debugging

    Powerful IC Validator LVS capabilities

    Summary

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    Alteras Approach to LVS Debugging

    Using IC Validator

    1. Review extraction errors FIRST!

    2. Check.LAYOUT_ERRORSfor:

    a. Device extraction errors

    Shorts crossing the Source / Drain of

    a transistor

    Runset issues

    b. Text shorts & opens

    c. Soft_check violations

    d. ERC checks

    Picture to explain

    Soft_check violations?

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    Agenda

    Introduction to Alteras designs and challenges

    Alteras approach to LVS debugging

    Powerful IC Validator LVS capabilities

    Summary

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    Suggested Fix for Connection Error

    explain problem

    explain suggested

    fix

    When error occurs, it provides side by side comparison of theconnection between netlist and layout. It groups up all devices that

    belong to the same connection issue. It also provides the suggested

    right connection that in certain way enable the pin point of the real

    issue. Example:

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    Suggested Fix for Connection Error

    explain problem

    explain suggested

    fix

    Example:

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    This runtime status provides a contrast of what was provided vs what was

    really used. This enable users to identify early symptoms of possible causes tothe LVS problem, where frequently the LVS error was not cause by incorrect

    construction, but by incorrect info supplied,

    Example:

    Helpful Display of LVS Status

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    Account Files

    This provides the final extracted device count for each

    hierarchy, and its cumulative count from subcells.

    It provides another level of debugging especially when

    device appear in other hierarchy level.

    Example:

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    Customizable COMPARE Settings

    ICV allows us to changethe severity level of an

    issue: WARNING or

    ERROR

    This allows a behavioral

    matching between the

    tools to the design style,

    and let user make the

    judgment on what really

    is important to look at,and still getting a clear

    digital result.

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    Netlist Partition for Each Cell

    ICV creates netlists for individual cells These are used in comparison to ease debugging.

    Example:

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    Easy LVS Compare

    Netlist comparison Performs a bottom-up comparison of quick cell pairings

    Makes it easy to pin-point which block is causing an LVS mismatch

    by isolating and focusing only on data that is really need to looked

    at.

    Result files and debug

    Net and instance cross references

    Results files in

    Topcell.LVS_Error

    Run_details/topcell_lvs.log

    Run_details/compare/

    layout_equiv_cell

    sum.*

    xref.*

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    Other Helpful LVS Options

    in IC Validator

    Options to Delete Data in Hierarchy Removes Chip/Logo graffiti cells

    Reduces extraction time

    Options to Delete Data in Compare

    Can delete physical cells Extraction errors will be reported

    Isolate cells that are clean from other levels

    during debugging.

    Black Box option

    Use when a sub-block is not ready for LVS

    Only check port connectivity

    Saves time since lower cells are not

    processed

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    IC Validator Graphical DebuggingVUE Short Finder

    Enables the user to isolate the shorts Hierarchical as well as top level shorts

    Investigate multiple shorts in single run

    Flexible highlighting options

    Net annotation for path polygons

    Path reductionmodifying and filtering

    Net changes log

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    Display Full Path Highlight the entire shorted path

    Includes entire hierarchy

    Net annotation

    Highlight individualpolygons

    VCCEH

    VCCER

    IC Validator Graphical DebuggingVUE Short Finder

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    Short Finder enables the user to walk through each polygons in the shorted

    path

    path is processed polygon-by-polygon.

    Ultimately, the user finds the offending polygon(s).

    IC Validator Graphical DebuggingVUE Short Finder

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    Agenda

    Introduction to Alteras designs and challenges

    Alteras approach to LVS debugging

    Powerful IC Validator LVS capabilities

    Summary

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    Summary

    Numerous designs have been use in ICV- 28nm, 20nm, and 14nm process node

    Designs in the range of billion transistors

    ICV LVS big benefits

    Break down the design debug hierarchy

    Runtime improvement

    Easy to alter the layout/schematic netlist for debugging

    VUE Short Finder

    Quick and easy to find shorted path

    ICV LVS currently using in all active process node

    IC Validator LVS Used Successfully at Altera

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    Thank You