Summer School Summer School Student’s ProjectsStudent’s Projects

Summer School Summer School Student’s ProjectsStudent’s Projects

• Develop an ATE for dynamic testing (FFT analysis) of ADCs according to IEEE std 1241 and DYNAD to compare test methods reported in these two standards. Programming language: LabView

• Develop an ATE for the histogram test of ADCs according to IEEE std 1241 and DYNAD to compare test methods reported in these two standards. Programming language: LabView

• Develop an ATE for the time-domain analysis (sine fitting algorithm) of ADCs according to IEEE std 1241 and DYNAD to compare test methods reported in these two standards. Programming language: LabView

• Develop an ATE for the dual tone test of ADCs according to IEEE std 1241 and DYNAD to compare test methods reported in these two standards. Programming language: LabView

The research project “Methods and draft standards for the DYNamic characterization and testing of Analog to Digital converters” (DYNAD) was proposed and successfully financed within the 4th Framework Programme “Standard, Measurement and Testing SMT” of the European Union. The project aimed at integrating and complementing IEC Standard 60748 for the part concerning dynamic testing, by proposing a list of parameters specifying the dynamic behavior of the converter and indicating in detail the measurement conditions and the data processing algorithms to be adopted.

At level of category standardization, in 2000 the Technical Committee 10 of the IEEE Instrumentation and Measurement Society published the IEEE 1241.It provides both standard terminology for specifying the performance of ADCs and test methods for measuring it

ELECTRONIC VERSIONS OF IEEE STD 1241 AND DYNAD WILL BE ON THE DESKTOP OF THE PC IN THE LAB

• Compare numerical results obtained by using test methods reported in the IEEE Std. 1241 and DYNAD

• Compare the two standards also in terms of

Summer School Summer School Student’s ProjectsStudent’s Projects

how easy is to read how easy is to read and comprehend the and comprehend the

standard ? standard ?

how easy is to carry how easy is to carry out the standard test out the standard test

methods ? methods ?

should something be should something be added or changed or added or changed or

deleted in the standard ? deleted in the standard ?

readability, easiness of use,

completeness and effectiveness

Develop an ATE for dynamic testing (FFT analysis) of ADCs according Develop an ATE for dynamic testing (FFT analysis) of ADCs according to IEEE std 1241 and DYNAD to compare test methods reported in to IEEE std 1241 and DYNAD to compare test methods reported in these two standards. these two standards.

The ATE should be composed by a programmable signal generator connected to a PC via GPIB interface and the DAQ board.

THD, SINAD, SNHR, SFDR and ENOB of the ADC of the PCI6024 DAQ board

IEEE std 1241IEEE std 1241 DynadDynad

coherent and not coherent samplingcoherent sampling

1M

0m

2mavm

2iSavm

2iavm

fEM

1

ffXfXM

1

SINAD

12

,1

222

22

22

12

log10M

Jkk

dB

MYNFlkY

NFlJYSINAD

Agilent 33120AAgilent 33120A

Develop an ATE for the histogram test of ADCs according to IEEE std 1241 and DYNAD to compare test methods reported in these two standards.

The ATE should be composed by a programmable signal generator The ATE should be composed by a programmable signal generator connected to a PC via GPIB interface and the DAQ board.connected to a PC via GPIB interface and the DAQ board.

Gain, offset, INL, DNL of the ADC of the PCI6024 DAQ boardGain, offset, INL, DNL of the ADC of the PCI6024 DAQ board

IEEE std 1241 Dynad

rampsinewave sinewave

Gain and Offset, linearity errors definitions

histogram

Independently and terminal based

Gain and Offset, linearity errors definitions

histogram

least squares fit, end-points and min-max definition

Agilent 33250AAgilent 33250A

Develop an ATE for the time-domain analysis (sine fitting algorithm) of ADCs according to IEEE std 1241 and DYNAD to compare test methods reported in these two standards.

The ATE should be composed by a programmable signal generator The ATE should be composed by a programmable signal generator connected to a PC via GPIB interface and the DAQ board.connected to a PC via GPIB interface and the DAQ board.

SINAD, ENOB of the ADC of the PCI6024 DAQ boardSINAD, ENOB of the ADC of the PCI6024 DAQ board

IEEE std 1241 Dynad

three and four fixed-frequency and four

multiharmonic sine-wave fitting

parameter parameter

Agilent 33220AAgilent 33220A

Develop an ATE for the dual tone test of ADCs according to IEEE std 1241 and DYNAD to compare test methods reported in these two standards.

IMD of the ADC of the PCI6024 DAQ boardIMD of the ADC of the PCI6024 DAQ board

The ATE should be composed by a programmable signal generator The ATE should be composed by a programmable signal generator connected to a PC via GPIB interface and the DAQ board.connected to a PC via GPIB interface and the DAQ board.

IEEE std 1241Dynad

IMD in the frequency domain IMD in the frequency and time domain

coherent and not coherent samplingcoherent sampling

Tektronix AWG420Tektronix AWG420

Guidelines• Each developed ATE must be written in LabViewEach developed ATE must be written in LabView

• A sub VI for each test method must be developedA sub VI for each test method must be developed

• The same notation used in the two standards must be The same notation used in the two standards must be consideredconsidered

• A detailed report of the work done explaining the A detailed report of the work done explaining the considered test methods, highlighting existing considered test methods, highlighting existing differences in the two standardsdifferences in the two standards and and thoroughlythoroughly describing the developed LabView code, has to be describing the developed LabView code, has to be writtenwritten

• Presentation of the results of the Individual Case Presentation of the results of the Individual Case

Studies Studies