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Summary of Introduction MEMS (U.S.) Sometimes Microsystems in Europe. MEMS=MicroElectroMechanical Systems Very broad definition in practice: Mechanical, Electrical, Optical, Thermal, Fluidic, Chemical, Magnetic. Generally systems created using microfabrication that are not integrated circuits. Many (but not all) of the microfabrication techniques were borrowed from the IC industry. Market is smaller than IC market, but more diverse and growing faster.

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Summary of Introduction. MEMS (U.S.) Sometimes Microsystems in Europe. MEMS=MicroElectroMechanical Systems Very broad definition in practice: Mechanical, Electrical, Optical, Thermal, Fluidic, Chemical, Magnetic. - PowerPoint PPT Presentation

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Page 1: Summary of Introduction

Summary of Introduction• MEMS (U.S.) Sometimes Microsystems in Europe.

• MEMS=MicroElectroMechanical Systems

• Very broad definition in practice: Mechanical, Electrical, Optical, Thermal, Fluidic, Chemical, Magnetic.

• Generally systems created using microfabrication that are not integrated circuits. Many (but not all) of the microfabrication techniques were borrowed from the IC industry.

• Market is smaller than IC market, but more diverse and growing faster.

Page 2: Summary of Introduction

Some Examples• Accelerometer

– Electrical/Mechanical

• TAS or Micro Total Analysis System– Purifies, amplifies, and detects DNA, for example.

– Fluids/Biochemistry/Optical/Electrical

• TI DLP– Optical/Mechanical/Electrical/Surface Science

• Microrelay– Mechanical/Electrical/Surface Science

• Microplasma Source– Electrical/Electromagnetic/Plasma

• What do you need to know for MEMS?

• Everything!!!???

• Truly an interdisciplinary field.

Page 3: Summary of Introduction

What are we going to do?• Learn a useful subset of techniques needed for designing MEMS

devices. Not all!!

• We will design MEMS devices.– Project teaming survey is due Monday – see web site.

– Project assignment to be posted on the web site.

• We will discuss examples of MEMS devices and use the techniques we have developed.

• First we will look at microfabrication and process integration.

• Other notes:– First homework is due Thursday. We will try to have all students consolidated to

one section to make the discussion board and the electronic turn-in (for video streaming students) in one place by Thursday.

– Second homework is due Thursday, Sept. 23 (but you will have everything you need to do the work over the weekend). Homework 3 will probably be due on Monday, Sept. 27. The homework load will decrease as the project load increases (generally).

Page 4: Summary of Introduction

Microfabrication: Types of Micromachining for MEMS

• Bulk Micromachining– Etch away large parts of the silicon wafer.

– Traditionally, KOH or other chemical etch.

– Recently DRIE (Deep Reactive Ion Etch), an anisotropic plasma etch.

Page 5: Summary of Introduction

Microfabrication: Types of Micromachining for MEMS

• Surface micromachining– On surface of wafer/substrate

– Sometimes can be a post-process on top of CMOS wafer for process integration with electronics.

– Typically much thinner structures than bulk micromachining, but metal structures can be fairly thick.

Page 6: Summary of Introduction

Microfabrication: Types of Micromachining for MEMS• LIGA

– X-ray lithographie, galvanoformung, abformtechnik (or lithography, electrodeposition, and molding).

– A special type of surface micromachining, not much used in its original form.

– Now sometimes refers to using very thick photoresist to make thick electroplated structures.

Page 7: Summary of Introduction

Packaging• Ideally, part of fabrication process, then just use a cheap plastic

package.

• Often, a surface micromachined device is bonded to a bulk micromachined package (the cavity to contain the device is etched from the wafer using bulk micromachining).

• Sometimes the package is the most expensive part of the device (pressure sensors, microfluidics). Especially true when the device interacts with the outside environment.

Page 8: Summary of Introduction

References: Text (brief), Campbell or other IC fabrication text (generally good, but incomplete for MEMS), Madou (specific to MEMS).

Page 9: Summary of Introduction
Page 10: Summary of Introduction

Silicon wafer fabrication• Taken from www.egg.or.jp/MSIL/english/index-e.html

Page 11: Summary of Introduction

Silicon wafer fabrication – slicing and polishing

• Taken from www.egg.or.jp/MSIL/english/index-e.html

Page 12: Summary of Introduction

Wee

k 1

Wee

k 2

N -type Si wafer <100>

Pre-diffusion cleanPad oxidation

Deposit LPCVD nitride

Spin photoresist

PR

Si N3 4

SiO 2

O 2

SiH ClNH

2 2

3

ECE 1233 PMOS Fabrication Sequence

Page 13: Summary of Introduction

We

ek 2

Wee

k 3

Expose PR with active area maskand develop

Reactive ion etch nitride layerStrip PR

Pre-diffusion cleanField oxidation

Strip nitride and pad oxideSacrific ial oxidation

OH O

2

2

O 2

CHFO

3

2

Page 14: Summary of Introduction
Page 15: Summary of Introduction

Wee

k 3

Wee

k 4

Strip sac ox

Gate oxidation

Deposit LPCVD polysilicon

Poly

PR/etch gate m askStrip PR

O 2

SiH 4

SFO

6

2

Page 16: Summary of Introduction

LPCVD SystemsTaken from http://www-bsac.EECS.Berkeley.EDU/~pister/245/

Page 17: Summary of Introduction

Wee

k 5

Wee

k 6

Ion im plant BF 2

+

Pre-diffusion cleanDrive-in/oxidation

PR/etch contact m askStrip PR

CleanSputter deposit A l/1% Si

Al/Si

P doped areas

OH O

2

2

Ar

Page 18: Summary of Introduction
Page 19: Summary of Introduction

Wee

k 6

PR /etch metal m askStrip PRAnneal

Source

DrainGate (contact not shown)

Page 20: Summary of Introduction
Page 21: Summary of Introduction
Page 22: Summary of Introduction
Page 23: Summary of Introduction

Wee

k 1

Wee

k 2

N -type Si wafer <100>

Pre-diffusion cleanPad oxidation

Deposit LPCVD nitride

Spin photoresist

PR

Si N3 4

SiO 2

O 2

SiH ClNH

2 2

3

ECE 1233 PMOS Fabrication Sequence

Page 24: Summary of Introduction
Page 25: Summary of Introduction
Page 26: Summary of Introduction

Wee

k 1

Wee

k 2

N -type Si wafer <100>

Pre-diffusion cleanPad oxidation

Deposit LPCVD nitride

Spin photoresist

PR

Si N3 4

SiO 2

O 2

SiH ClNH

2 2

3

ECE 1233 PMOS Fabrication Sequence

Page 27: Summary of Introduction
Page 28: Summary of Introduction

We

ek 2

Wee

k 3

Expose PR with active area maskand develop

Reactive ion etch nitride layerStrip PR

Pre-diffusion cleanField oxidation

Strip nitride and pad oxideSacrific ial oxidation

OH O

2

2

O 2

CHFO

3

2

Page 29: Summary of Introduction
Page 30: Summary of Introduction
Page 31: Summary of Introduction
Page 32: Summary of Introduction

Wee

k 3

Wee

k 4

Strip sac ox

Gate oxidation

Deposit LPCVD polysilicon

Poly

PR/etch gate m askStrip PR

O 2

SiH 4

SFO

6

2

Page 33: Summary of Introduction

Wee

k 5

Wee

k 6

Ion im plant BF 2

+

Pre-diffusion cleanDrive-in/oxidation

PR/etch contact m askStrip PR

CleanSputter deposit A l/1% Si

Al/Si

P doped areas

OH O

2

2

Ar

Page 34: Summary of Introduction
Page 35: Summary of Introduction

Wee

k 5

Wee

k 6

Ion im plant BF 2

+

Pre-diffusion cleanDrive-in/oxidation

PR/etch contact m askStrip PR

CleanSputter deposit A l/1% Si

Al/Si

P doped areas

OH O

2

2

Ar

Page 36: Summary of Introduction
Page 37: Summary of Introduction

Wee

k 6

PR /etch metal m askStrip PRAnneal

Source

DrainGate (contact not shown)

Page 38: Summary of Introduction

Electrodeposition/Electroplating

SEM of NEU microswitch

Drain Source

Gate

Beam

Drain Gate Source

Beam

Drain

Gate

Source

Surface MicromachinedPost-Process Integration with CMOS20-100 V Electrostatic Actuation~100 Micron Size

Page 39: Summary of Introduction

IBM 7-Level Cu Metallization (Electroplated)

Page 40: Summary of Introduction
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Page 42: Summary of Introduction

Packaging• Ideally, part of fabrication process, then just use a cheap plastic

package.

• Often, a surface micromachined device is bonded to a bulk micromachined package (the cavity to contain the device is etched from the wafer using bulk micromachining).

• Sometimes the package is the most expensive part of the device (pressure sensors, microfluidics). Especially true when the device interacts with the outside environment.

Page 43: Summary of Introduction
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•Adhesives•Organics•Glass (Glass Frit)•Metals (~Solders, Metal/Semiconductor Eutectics)•Thermal Compression Bonding

•Au-Au/Clean/300 C•Why?

Page 46: Summary of Introduction

so urc e

so urc e

so urc e

g a te

g a te

g a te

d ra in

d ra in

d ra in

NUMEM Microrelay Process

Page 47: Summary of Introduction

so urc e

so urc e

g a te

g a te

d ra in

d ra in

NUMEM Microrelay Process

Page 48: Summary of Introduction

Residual stress gradients

More tensile on top

More compressive on top

Just right! The bottom line: anneal poly between oxides with similar phosphorous content. ~1000C for ~60 seconds is enough.

Taken from http://www-bsac.EECS.Berkeley.EDU/~pister/245/

Page 49: Summary of Introduction

Residual stress gradients

A bad day at MCNC (1996).

Taken from http://www-bsac.EECS.Berkeley.EDU/~pister/245/

Page 50: Summary of Introduction

DRIE structures

• Increased capacitance for actuation and sensing

• Low-stress structures– single-crystal Si only

structural material

• Highly stiff in vertical direction– isolation of motion to

wafer plane– flat, robust structures

2DoF Electrostatic actuator

Thermal Actuator

Comb-drive Actuator

Taken from http://www-bsac.EECS.Berkeley.EDU/~pister/245/

Page 51: Summary of Introduction
Page 52: Summary of Introduction

1 µm

Scalloping and Footing issues of DRIE

Scalloped sid

ewall

Top wafer surface

cathode Top wafer surface

anode

Tip precursors

Scalloped sid

ewall

Top wafer surface

cathode Top wafer surface

anode

Tip precursors

<100 nm silicon nanowire over >10 micron gap

microgridFooting at the bottom of

device layerMilanovic et al, IEEE TED, Jan. 2001.

Page 53: Summary of Introduction

Taken from: http://www.imm-mainz.de/english/sk_a_tec/basic_te/liga.html

Page 54: Summary of Introduction

Sub-Micron Stereo Lithography

Micro Electro Mechanical SystemsJan., 1998 Heidelberg, Germany

New Micro Stereo Lithography for Freely Movable 3D Micro Structure-Super IH Process with Submicron Resolution-

Koji Ikuta, Shoji Maruo, and Syunsuke KojimaDepartment of Micro System Engineering, school of Engineering, Nagoya University

Furocho, Chikusa-ku, Nagonya 464-01, JapanTel: +81 52 789 5024, Fax: +81 52 789 5027 E-mail: [email protected]

Fig. 1 Schematic diagram of IH Process

Fig. 5 Process to make movable gear and shaft (a) conventional micro stereo lithography needs base layer (b) new super IH process needs no base

Fig. 6 Schematic diagram of the super IH process

Page 55: Summary of Introduction

Sub-Micron Stereo Lithography

Micro Electro Mechanical SystemsJan., 1998 Heidelberg, Germany

New Micro Stereo Lithography for Freely Movable 3D Micro Structure-Super IH Process with Submicron Resolution-

Koji Ikuta, Shoji Maruo, and Syunsuke KojimaDepartment of Micro System Engineering, school of Engineering, Nagoya University

Furocho, Chikusa-ku, Nagonya 464-01, JapanTel: +81 52 789 5024, Fax: +81 52 789 5027 E-mail: [email protected]

Fig. 10 Micro gear and shaft make of solidified polymer(b) side view of the gear of four teeth(d) side view of the gear of eight teeth

Page 56: Summary of Introduction

Simple Carbon Nanotube Switch

Diameter: 1.2 nmElastic Modulus: 1 TPaElectrostatic Gap: 2 nmBinding Energy to Substrate: 8.7x10-20 J/nm

Length at which adhesion = restoring force: 16 nmActuation Voltage at 16 nm = 2 VResonant frequency at 16 nm = 25 GHzElectric Field = 109 V/m or 107 V/cm + Geom.

(F-N tunneling at > 107 V/cm)

Stored Mechanical Energy (1/2 k x2 ) = 4 x 10-19 J = 2.5 eV

Page 57: Summary of Introduction
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Extras

Page 60: Summary of Introduction

Micromachining Ink Jet Nozzles

Microtechnology group, TU Berlin

Page 61: Summary of Introduction

Bulk micromachined cavities

• Anisotropic KOH etch (Upperleft)

• Isotropic plasma etch (upper right)

• Isotropic BrF3 etch with compressive oxide still showing (lower right)

Taken from http://www-bsac.EECS.Berkeley.EDU/~pister/245/

Page 62: Summary of Introduction

Surface Micromachining

Deposit sacrificial layer Pattern contacts

Deposit/pattern structural layer Etch sacrificial layer

Taken from http://www-bsac.EECS.Berkeley.EDU/~pister/245/

Page 63: Summary of Introduction

Packaged Plasma SourceTop View

Side View

Die in Hybrid Package

Page 64: Summary of Introduction

Fabrication

PR

Glass WaferCr/Au/TiW

Expose/Dev.TiW etch

ElectroplateGold

PR stripTiW/Au/Cr etch

Bond to 10 mm diam.glass chamberspiral coil

interdigitated capacitor

to vacuum system

SEM of Interdigitated Capacitor Structure