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Always Thinking. Better.™
70
1/18
Copyright © 2009 FSI International All Rights Reserved
SRC/SEMATECH ERC for EBSM Teleseminar - July 9, 2009
Steam-Injected SPM Process for All-Wet Stripping of Implanted Photoresist
Jeffery W. Butterbaugh
FSI International, 3455 Lyman Blvd., Chaska, MN 55318 [email protected]
Always Thinking. Better.™Copyright © 2009 FSI International All Rights Reserved
2/18
SRC/SEMATECH ERC for EBSM Teleseminar - July 9, 2009
Outline
• Motivation• Implanted PR – All-Wet Stripping Challenge• SPM (Sulfuric acid – hydrogen Peroxide Mixture)
– Making it More Reactive• Results• Summary
Always Thinking. Better.™Copyright © 2009 FSI International All Rights Reserved
3/18
SRC/SEMATECH ERC for EBSM Teleseminar - July 9, 2009
Low Material Loss – An “All-Wet” Driver
Lower material loss requirements during cleaning driven byultra-shallow junction (USJ) source-drain extension (SDE) or lightly-doped drain (LDD)
low materia
l loss
ultra-shallow jct
Always Thinking. Better.™Copyright © 2009 FSI International All Rights Reserved
4/18
SRC/SEMATECH ERC for EBSM Teleseminar - July 9, 2009
Stripping Implanted Photoresist
Ion implantation process – affects stripping- Species: B, P, As, Si, Ge, BF2- Energy: < 1keV to > 1000keV- Dosage: 1x1011 to >1x1016 ions/cm2
- Normal incidence or angled
gate gate
dehydrogenated,amorphous
carbon layer
photo source: P. Gillespie et al, Semiconductor International, October, 1999
Most challenging where carbonized PR fused to wafer surface
especially at wafer edge, near EBR region
Always Thinking. Better.™Copyright © 2009 FSI International All Rights Reserved
5/18
SRC/SEMATECH ERC for EBSM Teleseminar - July 9, 2009
High Activation Energy to Remove Crust
Robert Doering and Yoshio Nishi, Handbook of Semiconductor Manufacturing Technology (CRC Press, 2007).
Always Thinking. Better.™Copyright © 2009 FSI International All Rights Reserved
6/18
SRC/SEMATECH ERC for EBSM Teleseminar - July 9, 2009
SPM – Making it More Reactive
H2 SO5 + H2 O
Higher temperature
Half Cell Oxidation Reactions
HSO5- + 2H+ + 2e- HSO4
- + H2 O 1.44V
HO• + H+ + e- H2 O 2.80V
HSO4 • + H+ + e- H2 SO4 2.60V
H2 O2 + 2H+ + 2e- H2 O 1.78V
Mor
e ox
idiz
ing
pow
er
HSO4 • + HO•2HO•
H2 O added with 31% H2 O2will force this equilibrium backto the leftH2 SO4 + H2 O2
Always Thinking. Better.™Copyright © 2009 FSI International All Rights Reserved
7/18
SRC/SEMATECH ERC for EBSM Teleseminar - July 9, 2009
SPM Mixing is Exothermic
0
20
40
60
80
100
120
140
0 30 60 90 120 150H2O2 Added (cc)
Fina
l Tem
pera
ture
(Deg
. C)
4:3 98°2:1 91°
1:1 86°4:1 68°
10:1 38° rise
4:5 82°
Resulting temperature when 20°
C 31% H2 O2 is mixed with 100 cc of 20°
C 96% H2 SO4 .
4:3 ratio gives highest temperature rise, but higher concentration is desired(H2 O2 includes 69% water, which dilutes and lowers reactivity)
highest POU mixing temperature (66%H2 SO4 ; 10%H2 O2 ; 24% H2 O)
higher concentration(90%H2 SO4; 2%H2 O2 ; 8% H2 O)
Always Thinking. Better.™Copyright © 2009 FSI International All Rights Reserved
8/18
SRC/SEMATECH ERC for EBSM Teleseminar - July 9, 2009
How to Achieve High Temperature Without Dilution?
• Pre-heating SPM above 150°C causes rapid degradation of H2 O2 before contacting the wafer
• POU 4:3 SPM mixing gives temperature boost, but causes dilution
• Preheating H2 SO4 above 150°C requires specialized fluid handling
First, lets review a useful tool for illustrating the advantage of steam injection . . . .
SOLUTION = STEAM INJECTION (ViPR+)
Always Thinking. Better.™Copyright © 2009 FSI International All Rights Reserved
9/18
SRC/SEMATECH ERC for EBSM Teleseminar - July 9, 2009
Sulfuric Acid Enthalpy-Concentration Diagram
0 20 40 60 80 100
0
186
enthalpyof mixtureincluding
vapor(J/g)
weight percentage H2 SO4 in water
0°C
21°C38°C
66°C93°C 121°C
149°C
288°
C26
0°C
232°
C20
4°C
177°
C
104°C
110°C
121°C
149°C
177°C204°C232°C
372
gas
liquid
• Mixing sulfuric acid and water produces interesting energetics
• Enthalpy-Concentration diagram allows easy analysis of mixing temperature effects
• gas-liquid equilibrium
• isotherms
• minor differences between 100% H2 O (B.P.=100°C) and 69%H2 O/31%H2 O2 (B.P.=107°C)
Always Thinking. Better.™Copyright © 2009 FSI International All Rights Reserved
10/18
SRC/SEMATECH ERC for EBSM Teleseminar - July 9, 2009
Mixing Room Temperature 96% Sulfuric Acid with Water
0 20 40 60 80 100
0
186enthalpy
of mixtureincluding
vapor(J/g)
weight percentage H2 SO4 in water
0°C
21°C38°C
66°C93°C 121°C
149°C
288°
C26
0°C
232°
C20
4°C
177°
C
104°C
110°C
121°C
149°C
177°C204°C232°C
372
0
40
80
120
160
0 20 40 60 80 100
weight percentage H2 SO4 in water
adiabatic mixing temperature(°C)
maximum temperature at about 130°C and 4:3 mixing ratio(66%H2 SO4 ; 10%H2 O2 ; 24%H2 O)
Connecting two points produces an adiabatic mixing curve
Always Thinking. Better.™Copyright © 2009 FSI International All Rights Reserved
11/18
SRC/SEMATECH ERC for EBSM Teleseminar - July 9, 2009
Mixing 95°C 96% Sulfuric Acid with Water
0 20 40 60 80 100
0
186enthalpy
of mixtureincluding
vapor(J/g)
weight percentage H2 SO4 in water
0°C
21°C38°C
66°C93°C 121°C
149°C
288°
C26
0°C
232°
C20
4°C
177°
C
104°C
110°C
121°C
149°C
177°C204°C232°C
372
0
4080
120160
200
0 20 40 60 80 100
weight percentage H2 SO4 in water
adiabatic mixing temperature(°C)
boiling point at about 190°C and 2.5:1 mixing ratio(77%H2 SO4 ; 6%H2 O2 ;17%H2 O)
Starting with 95°C H2 SO4 causes intersection with gas-liquid curve
Always Thinking. Better.™Copyright © 2009 FSI International All Rights Reserved
12/18
SRC/SEMATECH ERC for EBSM Teleseminar - July 9, 2009
Mixing 150°C 96% Sulfuric Acid with Water
0 20 40 60 80 100
0
186enthalpy
of mixtureincluding
vapor(J/g)
weight percentage H2 SO4 in water
0°C
21°C38°C
66°C93°C 121°C
149°C
288°
C26
0°C
232°
C20
4°C
177°
C
104°C
110°C
121°C
149°C
177°C204°C232°C
372
04080
120160200240
0 20 40 60 80 100
weight percentage H2 SO4 in water
adiabatic mixing temperature(°C)
boiling point at about 210°C and a 4:1 mixing ratio(83%H2 SO4 ; 4%H2 O2 ;13%H2 O)
Starting with 150°C H2 SO4 allows 4:1 mixing ratio before boiling
Always Thinking. Better.™Copyright © 2009 FSI International All Rights Reserved
13/18
SRC/SEMATECH ERC for EBSM Teleseminar - July 9, 2009
Mixing 150°C 96% Sulfuric Acid with Water and Steam
0 20 40 60 80 100
0
186enthalpy
of mixtureincluding
vapor(J/g)
weight percentage H2 SO4 in water
0°C
21°C38°C
66°C93°C 121°C
149°C
288°
C26
0°C
232°
C20
4°C
177°
C
104°C
110°C
121°C
149°C
177°C204°C232°C
372
Heat of Vaporization = The Steam Advantage
heating water from 21°C to 100°C =331 J/g
converting water from liquid to gas at 100°C =2270 J/g
Always Thinking. Better.™Copyright © 2009 FSI International All Rights Reserved
14/18
SRC/SEMATECH ERC for EBSM Teleseminar - July 9, 2009
Mixing 150°C 96% Sulfuric Acid with Water and Steam
0 20 40 60 80 100
0
186enthalpy
of mixtureincluding
vapor(J/g)
weight percentage H2 SO4 in water
0°C
21°C38°C
66°C93°C 121°C
149°C
288°
C26
0°C
232°
C20
4°C
177°
C
104°C
110°C
121°C
149°C
177°C204°C232°C
372
140
180
220
260
80 100
weight percentage H2 SO4 in water
adiabatic mixing temperature(°C)
boiling point at about 232°C and an equivalent 5.5:1 mixing ratio(86%H2 SO4 ; 3%H2 O2 ;11%H2 O)
add 31% H2 O2 to reach 10:1mixing ratio then add steam
Using steam provides temperature boost with minimal dilution
Always Thinking. Better.™Copyright © 2009 FSI International All Rights Reserved
15/18
SRC/SEMATECH ERC for EBSM Teleseminar - July 9, 2009
Results on Implanted Photoresist
Time to clear blanket 2.5x1014 ions/cm2, 40keV As implanted photoresist dropped from 50 min SPM to 5.5 min SPM
20 min Standard POU SPMResist Still Present
5.5 min Steam-Injected SPMResist Stripped
⇒
2.5x1014 ions/cm2, 40 keV As Implant
batch spray system
Always Thinking. Better.™Copyright © 2009 FSI International All Rights Reserved
16/18
SRC/SEMATECH ERC for EBSM Teleseminar - July 9, 2009
All-Wet PR Strip with Low Material Loss
Dose(ion/cm2)
Energy & species
SPM time (min)
oxideloss(Å)
5x1014 40keV As 4 <0.2
1x1015 2keV As 4 <0.2
3x1016 7keV BF3 (PLAD) 4 <0.2
FSI ZETA® System (Batch Spray) with ViPR™ Technology for Steam-Injected SPM Stripping Implanted Photoresist
LDD implantITRS indicates
<0.3 Å
Always Thinking. Better.™Copyright © 2009 FSI International All Rights Reserved
17/18
SRC/SEMATECH ERC for EBSM Teleseminar - July 9, 2009
Very Fast Single-Wafer Photoresist Stripping
0
25
50
75
100
standard POU SPM
steam-injectedPOU SPM
time
to s
trip
(s) 5E14 / 40keV
1E15 / 2keV
SP
M c
hem
ical
cos
t ($/
waf
er)
0
$0.42
$0.84
$1.25
$1.67
[standard SPM = POU mixing with 150°C sulfuric acid]
80% Reduction in Time and Cost for Single Wafer Stripping of Arsenic-implanted Photoresist
Always Thinking. Better.™Copyright © 2009 FSI International All Rights Reserved
18/18
SRC/SEMATECH ERC for EBSM Teleseminar - July 9, 2009
Summary
• Sulfuric acid – hydrogen peroxide mixture continues to be a common approach to all-wet implanted PR strip
• Trade-off between POU heat of mixing temperature gain and dilution effect
• Patent-pending Steam-Injected SPM process provides increased temperature at the wafer surface with minimal dilution
• Steam-Injected SPM process meets ITRS material loss requirements for LDD implants