Smart Distributed System IFPAC 2002 John Mosher Honeywell Industrial Process Control Machine Automation & Safety

Smart Distributed System

IFPAC 2002IFPAC 2002

John Mosher

Honeywell Industrial Process Control

Machine Automation & Safety


Smart Distributed System is:• Open

• CAN-based

• Event-driven

• Highly reliable

• “Smart” device-level network

For real-time communication of Process, Configuration, and Diagnostic information

Smart Distributed System DescriptionSmart Distributed System Description


Smart Distributed System HistorySmart Distributed System History

1988 1988 Initial investigationsInitial investigations

1990 1990 Protocol Stack work startedProtocol Stack work started

1991 1991 Initial Specification finishedInitial Specification finished

1992 / 1993 1992 / 1993 Beta System testBeta System test

January 94 January 94 Official LaunchOfficial Launch

19951995 PC based ControlPC based Control

19951995 Protocol enhancements (SDS ALP 2.0)Protocol enhancements (SDS ALP 2.0)

19961996 Distributed Control / Auto-configuration Distributed Control / Auto-configuration

19971997 Product portfolio development finishedProduct portfolio development finished

19971997 SEMI Int’l Std E54.5-0997 (Sensor/Actuator Network)SEMI Int’l Std E54.5-0997 (Sensor/Actuator Network)

19981998 Smart Solution Provider GroupSmart Solution Provider Group

20002000 IEC / CENELEC Standard 62026-5IEC / CENELEC Standard 62026-5


Smart Distributed System Development Smart Distributed System Development

• CAN technology provides a robust architecture and high volume production to drive component costs down.

• The SDS Application Layer Protocol was developed by Honeywell to define and optimize event-driven CAN for industrial control applications in a Microsoft Windows-based control environment.

• The SDS Application Layer Protocol is optimized for “Smart Sensors and Actuators”, where Configuration, Diagnostic, and Process information can be embedded cost-effectively in a very small footprint.SDS was Developed to Improve I/O System Reliability

and Deliver More (and Better) Process Information.

SDS was Developed to Improve I/O System Reliability

and Deliver More (and Better) Process Information.


Smart Distributed System Network ArchitectureSmart Distributed System Network Architecture

12mm Prox

977 PROX

HDLS

HDMP Photoelectric

PRESSURE

AnnunciatorsNematronExorQ-TermHoljeron

CONTACTORS

PROXIMITY

ActivatorHoneywellTermiflex

DIRECT PLC INTERFACE

Other PLCs

MULTIPORTACTUATOR

ITS-SENSORPROXIMITY

MULTIPORT-SENSOR

MOTOR STARTERS GE ED&C Square D

MINI BASEProx or Photo

DRIVESGE FanucMagnatekPacific ScientificInfranor

VALVES and VALVE MANIFOLDSSMC MAC Festo BurkertParker-Hannifan Numatics

OPERATOR INTERFACESGE ED&C EXORQ-Term HoljeronAdvantech Xycom

ITS-ACTUATOR

Mini High PerformanceFiber Optic Photos

Industrial I/OWestern ReserveOpto-22

Color Sensors

Barcode/RFIDMicroscanAccusort

PLCs Micro Switch (VME)Honeywell IACYamatakeSiemensGE FanucModiconPLC Direct

Auxilary Devices & CompnoentsDaniel WoodheadMolexMotorolaPhillipsBrand RexBeldon

PC Interface Honeywell SoftingHoljeron I+ME GmbHDIP Inc MicroSmithSynergetic MicrosystemsAdvantech

ANALOG I/O Opto-22 SNAPHoljeron AQUA SeriesPLC Direct

Software OS Think & Do QNXSteeplechase UNIXWonderware NTIntellution DOSNemasoft C Code & Others

HONEYWELL Products unless noted

Protocol ConvertersSDS<>LonworksSDS<>RS-232/485SDS<>Profibus


HONEYWELL PROPRIETARY

Smart Distributed System Network ArchitectureSmart Distributed System Network Architecture

• Communication rates of 125, 250, 500, and 1,000 kBaud

• 1500 ft maximum distance at 125 kBaud (longer with Bridge)

• 64 maximum electrical loads (Nodes) per network. 126 with repeater

• 12-24VDC, 2 power wires + 2 communication wires + shield

• Multiple physical layers topologies

• 126 logical addresses - not related to physical location on the network

• Proven event driven architecture for maximum throughput (<1ms)

• Event-Driven, Master-Slave, Multicast and Peer to Peer Services

• Network heartbeat to insure device health every 2.5 seconds

•Robust Network Management capabilities (Microsoft architecture)


SDS Network StackSDS Network Stack

Application Layer

Presentation Layer

Session Layer

Transport Layer

Network Layer

Data Link Layer

Physical Layer

CANCAN

SDS

ISO OSI 7 Layer Model Process Data ServicesDiagnostic Data Services

Configuration Data Services

Event drivenPolled

CyclicalSingle MasterMulti MasterPeer to Peer

Multicast


SDS Object Model / Address MechanismSDS Object Model / Address Mechanism

255 Attributes

255 Actions

255 Events

32 Objects

Logical deviceData Variables

Function Calls

Event Reports

Up to 126 LogicalDevices


SDS System Architecture - SDS System Architecture - Object ModelsObject Models

SDS MinimumBehavior

I/ODevices

1

Digital IN

1.1

AnalogIN

1.2

Digital OUT

1.1

AnalogOUT

1.2

SerialString

1.3


SDS System Architecture - SDS System Architecture - Application Layer ProtocolApplication Layer Protocol

• SDS Supports Master/Slave, Multicast, and Peer-to-Peer Architectures.• Allows for a wide variety of control implementations

• SDS supports Event-Driven, Polled, and Cyclical Reporting Structures.• Multiple structures can be used on the same network. For example, sensors may report ‘Change Of State’ in the Event-Driven mode while analog values are reported every 50 ms. in the Cyclical Reporting mode

• SDS has 2 Special APDU (Application Layer Protocol Data Unit) Forms:• Short Form APDU - Shortens the CAN message for single-bit commands such as

COS, Write, and Acknowledgement. This allows for greater throughput and improved system response time.

• Fragmented APDU - Allows for data messages longer than the standard 6 data byte format. Up to 256 bytes of data may be sent. This allows

complex data such as ASCII strings to be sent across the network.

SDS Application Layer meets Industrial NeedsSDS Application Layer meets Industrial Needs


SDS System Architecture - SDS System Architecture - Embedded FunctionsEmbedded Functions

• Network Health Diagnostics: Examples: Power, CRC Error, Message Overrun, Missing Device, ISA Board and/or Channel Failure

• Device Diagnostics: Examples: Misaligned/dirty photo, prox target too close/far, mechanical switch operation limit, valve return too slow, motor overload tripped, disconnect opened, barcode good/bad read, VFD faults, and overtemp, pressure range alarm,analog calibration error, etc.

• Device Embedded Control Functions: Examples: NO/NC, light/dark operate, on delay, off delay, one shot, batch count, motion detection, jam detection, barcode format, temperature setpoint, analog high/low alarm, etc.

• Devices can be changed/installed with power on: - Only the address must be set - Automatic readdressing is available - Other functionality is optional and can be auto-configured

• Universal Data Communication: Any digital, analog, or serial data may be embedded in a device or connected via a wide selection of remote I/O nodes.

SDS Embedded Diagnostics and Network Management featuresSDS Embedded Diagnostics and Network Management features


SDS Network Advantages - SDS Network Advantages - for Developersfor Developers

• Well-defined, stable, open, and free Application Layer ProtocolDownload all necessary specifications for free

• Solid acceptance in many marketsSemiconductor, Electronics Assembly, Automotive, Food & Beverage,Machine Tool, Parcel & Package Distribution, etc

• Quick and cost-effective implementationLow cost, small footprint integrated microprocessors (6805X4, PIC - <<$10)No approval process is required

• Wide variety of developer tools, devices, and services are available.Preloaded chipsets, C - code libraries, NT .dll, UNIX and QNX softwaretoolkits, device conformance tester software, high-end bus analyzersoftware, developer support, etc.

• Well-developed infrastructure• Smart Solution Providers Network comprised of mutually supportive

vendors dedicated to providing the ‘whole product’ solution.• UL Testing to insure interoperability and conformance

SDS Offers Significant Advantages to DevelopersSDS Offers Significant Advantages to Developers


SDS Automatic Config/Replace DeviceSDS Automatic Config/Replace Device

SDS Configuration File Checks for Device Health and Verifies/CorrectsSDS Configuration File Checks for Device Health and Verifies/CorrectsAttributes at Startup. Replacement of Bad Devices can be Automatic. Attributes at Startup. Replacement of Bad Devices can be Automatic.

************************************** CFG FILE **************************************

* Date: 03/19/01 Time: 17:20:29Board PCI 1Channel 1Baud: 125

Address: 1 Input: 1 Replacement_Address = 126 Hierarchy = 1.1.1.1.1 Attr 6 (Byte) = 1 Attr 10 (Byte) = 0 Attr 60 (Byte) = 0 Attr 61 (Byte) = 3 Attr 62 (Word) = 0 Attr 63 (Word) = 0 Attr 64 (Word) = 0 Attr 65 (Byte) = 0 Attr 73 (Byte) = 0

Address: 2 Input: 1 Replacement_Address = 126 Hierarchy = 1.1.1.1.1 Attr 6 (Byte) = 1 Attr 10 (Byte) = 0 Attr 57 (Long) = 0 Attr 58 (Byte) = 0 Attr 60 (Byte) = 0 Attr 61 (Byte) = 3 Attr 62 (Word) = 0 Attr 63 (Word) = 0 Attr 64 (Word) = 0 Attr 65 (Byte) = 0

Easily editable text file saves all device settingsEasily editable text file saves all device settingsand lets maintenance personnel replace devicesand lets maintenance personnel replace deviceswithout powerdown or configuration tools.without powerdown or configuration tools.


SDS Automatic Error LogSDS Automatic Error Log

SDS automatically creates a time and date stamped error log file in an easily SDS automatically creates a time and date stamped error log file in an easily manipulated text file:manipulated text file:

Feb/21/2001 06:55:04 SDS Diagnostic Log Initialized ---> Feb/21/2001 06:55:12 Device Diagnostic Bit Values Have Changed for Bus: 2 Address: 10 : RomCkSm 0, WtchDog 0, BusOff 0, FatalErr 0, MissingNode 0, DuplNode 0, EEProm 0, WriteError 0, DevErrCode 0, Mismatch 0 Device Diagnostic Bytes 0-3 (in Hex) : 00, 02, 00, 00, Bus Diagnostics : 00, 10 ---> Feb/21/2001 06:56:22 Device Diagnostic Bit Values Have Changed for Bus: 3 Address: 31 : RomCkSm 0, WtchDog 0, BusOff 0, FatalErr 0, MissingNode 0, DuplNode 0, EEProm 0, WriteError 0, DevErrCode 0, Mismatch 0 Device Diagnostic Bytes 0-3 (in Hex) : 00, 40, 00, 00, Bus Diagnostics : 00, 10 ---> Feb/21/2001 06:56:53 Device Diagnostic Bit Values Have Changed for Bus: 2 Address: 10 : RomCkSm 0, WtchDog 0, BusOff 0, FatalErr 0, MissingNode 0, DuplNode 0, EEProm 0, WriteError 0, DevErrCode 0, Mismatch 0 Device Diagnostic Bytes 0-3 (in Hex) : 00, 06, 00, 00, Bus Diagnostics : 00, 10 ---> Feb/21/2001 07:47:47 Device Diagnostic Bit Values Have Changed for Bus: 3 Address: 10 : RomCkSm 0, WtchDog 0, BusOff 0, FatalErr 0, MissingNode 0, DuplNode 0, EEProm 0, WriteError 0, DevErrCode 0, Mismatch 0 Device Diagnostic Bytes 0-3 (in Hex) : 00, C0, 00, 00, Bus Diagnostics : 00, 10 ---> Feb/21/2001 07:50:33 Device Diagnostic Bit Values Have Changed for Bus: 2 Address: 17 : RomCkSm 0, WtchDog 0, BusOff 0, FatalErr 0, MissingNode 0, DuplNode 0, EEProm 0, WriteError 0, DevErrCode 0, Mismatch 0 Device Diagnostic Bytes 0-3 (in Hex) : 00, 08, 00, 00, Bus Diagnostics : 00, 10 ---> Feb/21/2001 07:52:01 Device Diagnostic Bit Values Have Changed for Bus: 3 Address: 8 : RomCkSm 0, WtchDog 0, BusOff 0, FatalErr 0, MissingNode 0, DuplNode 0, EEProm 0, WriteError 0, DevErrCode 0, Mismatch 0 Device Diagnostic Bytes 0-3 (in Hex) : 00, 21, 00, 00, Bus Diagnostics : 00, 10


ATTRIBUTE 9, DIAGNOSTIC REGISTER FLAGSByte One

Flag Description of Error

bit 0 ROM checksum error

bit 1 Reserved

bit 2 Off bus communication error

bit 3 Device error, set if byte 3 bits 1 or 7 are set

bit 4 Reserved

bit 5 Reserved

bit 6 Reserved

bit 7 EEPROM error detected

Byte Three

Flag Description of Error

bit 0 Reserved

bit 1 Analog input error

bit 2 Reserved

bit 3 EEPROM error (analog calibration area)

bit 4 EEPROM error (parameter area)

bit 5 ROM error

bit 6 RAM error

bit 7 CPU I/F error

ATTRIBUTE 19 Input Filter Variable

Byte One

Flag range filter for transmission interval

bit 0 inner range filter set




bit 4 outer range filter set




msb lsb 50Hz(60Hz)0000: 160 (133.33)ms default0001: 5120(4266.7)ms0010: 2560(2133.3)ms0011: 1280(1066.7)ms0100: 640(533.5)ms0101: 320(266.7)ms0110: 160(133.3)ms0111: 80(66.6)ms1000: 40(33.3)ms1001: 20(16.7)ms1010: 2.5(2.1)ms AVOID this selection = high bustraffic

Byte Two filter and control flags

Flag

bit 0 inhibit refresh

bit 1 reserved

bit 2 trigger for current input

bit 3 trigger for current input

bit 4 digital filter set




Typical Attribute Capabilities for Analog DevicesTypical Attribute Capabilities for Analog Devices

Device-Specific Diagnostics (Below)and Representative Input Scaling of Analog Input Device (Right) showrange of data settings available to user.


SDS Network Advantages - SDS Network Advantages - for Customersfor Customers

• Fast, Reliable, Open, and Proven Device Network

• Internationally-approved industrial network protocol

• Field-proven reliability in system critical applications

• Flexibility to Expand, Reconfigure, adapt to new applications

• Built to handle Process, Configuration, and Diagnostic data

• Optimized for Microsoft Distributed iNternet Architecture (DNA)

• Backed by Global Service and Support from Honeywell

SDS Offers Significant Advantages to UsersSDS Offers Significant Advantages to Users


Scalability - SDS and Windows CE Distributed ControlScalability - SDS and Windows CE Distributed Control

User Computer Or Analyzer Supervising one or more “SAM”

Ethernet

“SAM” - WinCE-based Think & Do with SDS Master and optional Local I/O and Bluetooth

SDS Network - All Device Types Supported

To Next WinCE

Controller

“SAM” Powered By

Available Now!


High precision temperature monitoring and control development continues forward utilizing an internal temperature sensor connected to a third terminal on the header of Honeywell's TS700 high reliability bimetallic thermal switches.

The temperature sensor is thermally mounted to the internal surface of the thermal switch and is contained within the clean, dry, hermetic, He/N2 filled enclosure. This protects the temperature sensor and eliminates the need to provide separate packaging and wiring of sensors, providing the ultimate in savings and reliability for installations requiring thermal regulation, protection and monitoring.

Product Development ExampleProduct Development Example

Temperature Sensor with Overtemp SwitchTemperature Sensor with Overtemp Switch


Temp.

A/D

SDS

Substrate

RJ45

Press.

A/D

SDS

Substrate

RJ45

Substrate

Product Development ExampleProduct Development Example

Typical NeSSI Device would combine state-of-the-art sensor technology with small,SDS Interface in appropriate packaging and use off-the-shelf connections.


SDS Customers - SDS Customers - (partial listing)(partial listing)

Electronics andElectronics andSemiconductor:Semiconductor:• Dell Computer **• Compaq• IBM• Tektronix• Hewlett-Packard• Silicon Graphics/Cray• Motorola• Gateway Computer• Lucent Technologies• Xerox• OKI• Samsung• QSC Audio **• SCI Systems

Other Markets:Other Markets:• General Motors• Ford• Honda• Boeing• Halliburton Energy Services• U.S. Postal Service• Proctor & Gamble• Coca-Cola• Hunt-Wesson• Fastenal Company• Target Stores• Eagle Logistics• UPS• DHL Worldwide• TNT Courier

** Modern Material Handling Manufacturing Site of the Year Award** Modern Material Handling Manufacturing Site of the Year Award


SDS38%

Profibus-DP15%

DeviceNet22%

Optomux14%

Ethernet11%

SDS Market Share - Microsoft-based Control ApplicationsSDS Market Share - Microsoft-based Control Applications


Major SDS Installations - U.S.Major SDS Installations - U.S.


Smart Distributed System - Contact InformationSmart Distributed System - Contact Information

SDS Web Site: (with Links to other manufacturers and developers) http://www.honeywell.com/sensing/prodinfo/sds

- SDS Application Layer Protocol- SDS Physical Layer Specification- Component Modeling Specification- Component Interface Specification- Control Interface Specification- Conformance Test Procedure Specification- Product Information and Developer’s Training

Conformance Testing: Underwriter’s Laboratories (UL) Chuck Goetz 847-272-8800 ext. 43163 or E-Mail: [email protected] and Technical Support: Honeywell Sensing & Control Bob Nickels 815-235-5735 or E-Mail: [email protected] Solutions Providers Organization (formerly Partner’s Program) Contact Paul Jensen at 503-675-1667 or E-Mail: [email protected]

http://www.simpleaswire.comSEMI SAN committee representative for SDS - John Mosher (209)339-4004 or E-mail: [email protected]

Documents

Smart Distributed System IFPAC 2002 John Mosher Honeywell Industrial Process Control Machine Automation & Safety