Sample and Hold Circuit Basics

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  • 8/18/2019 Sample and Hold Circuit Basics

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    Ste han Henzler Mixed-Si nal-Electronics 2011/12

    Mixed-Signal-Electronics

    PD Dr.-Ing. Stephan Henzler

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    Ste han Henzler Mixed-Si nal-Electronics 2011/12

    Supply Voltages of Mixed Signal Circuits

    2

    General case: use of bipolar signals

    VDD

    AGND

    VSS

    most positive potential

    analog ground / reference voltage

    (reference point for analog signals)

    most negative potential

    positive signals

    negative signals

    Even more complex supply concepts in use  check for available voltages and definitions before starting with design

    +2V

    -2V

    0V

    4V

    0V

    2V

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    Transistor Description (for hand calculations)

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    MOS Transistor as Switch

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    VDDVSS

       C  o  n   d  u   t  a  n  c  e   G

     

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    Sample and Hold Circuits

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    Chapter 2

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    Sample & Hold Circuit

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    Sample & Hold Circuit (cont)

    1. Finite rise-time / finite bandwidth due to RC constant

    2. Amplifier dynamics

    (finite settling time, overshoot, ringing)

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    Sample & Hold: Clock Feed-Through

    3. Clock feed-through due to capacitive coupling.

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    Sample & Hold: Charge Injection

    4. Charge Injection: mobile carriers are removed

    1:1 distribution is a approximation for fast switching9

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    Sample & Hold Circuit (cont)

    5.

    6. Clock jitter

    7. Droop in hold mode: leakage currents discharge hold cap

    8. Linearity

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    S&H Output Signal

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    Impact of Jitter on S&H Performance

    Consider a sinusoidal signal

    Signal power

    Rate of change

    Jitter = random variation of sampling instance

    Sampling error:

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    Impact of Jitter on S&H Performance

    Noise power resulting from sampling error

    Signal-to-Noise Ratio

    maximum achievable SNR for given jitter

    frequency dependent, i.e. the larger the bandwidth the higher

    the clock requirements13

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    Impact of Offset-Voltage

    Offset voltage of opamp is modeled as voltage source inseries to input terminal

    Offset voltage is directly visible at output terminal

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    Vo

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    S&H with Correlated Double Sampling

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    Noise in Discrete Time Systems

    Noise is a random process  statistical description is required

    time domain: noise signal a(t)

    frequency domain: power spectral density

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    Noise of Sampled Signals

     –  kT/C-Noise  – 

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    Remarks:

    • Sampling makes this a little bit more complicated as noise is a wide band signal so there is aliasing of replica

    spectra. However, the noise power in the baseband is still kT/C

    • This is only a lower bound of noise power, buffers contribute also to overall noise power

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    Closed Loop Track & Hold Circuit 1

    Basic sampling circuit is embedded in feedback loop

     –

    Very high input impedance – Reduction of non-idealities (e.g. buffer offset) by loop gain

     – Loop must be designed stable  speed degradation

     – Feedback is broken during hold mode

    • Input opamp saturates

    • Long slewing time when circuit returns to track mode18

    not critical wrt. offset errorsoffset not canceled

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    Closed Loop Track & Hold Circuit 2

    Hold mode:

    Input opamp is configured as voltage follower

     fast settling when circuit returns to track mode

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    Closed Loop Track & Hold Circuit 3

    Storage capacitor is shifted to feedback loop of output

    amplifier (integrator) Swing across switch is always near to AGND

     Error injection becomes nearly signal independent (pedestal error)

     No appertur jitter

    Input opamp is grounded during hold phase fast settling when switched to track mode

     signal feedthrough is minimized

    Reduced speed due to stability requirements20

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    Closed Loop Track & Hold Circuit 4

     Additional error replica to avoid the pedestal error

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    Summary Sample & Hold Circuits