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RRP & PIT Deformation & RRR Comparison: M. Brown, C. Tarantini, W. Starch, W. Oates, P.J. Lee, D.C. Larbalestier ASC – NHMFL – FSU M2OrA – 05 06/30/15

RRP & PIT Deformation & RRR Comparison: M. Brown, C. Tarantini, W. Starch, W. Oates, P.J. Lee, D.C. Larbalestier ASC – NHMFL – FSU M2OrA – 05 06/30/15

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Page 1: RRP & PIT Deformation & RRR Comparison: M. Brown, C. Tarantini, W. Starch, W. Oates, P.J. Lee, D.C. Larbalestier ASC – NHMFL – FSU M2OrA – 05 06/30/15

RRP & PIT Deformation & RRR Comparison:

M. Brown, C. Tarantini, W. Starch, W. Oates, P.J. Lee, D.C. Larbalestier

ASC – NHMFL – FSU

M2OrA – 0506/30/15

Page 2: RRP & PIT Deformation & RRR Comparison: M. Brown, C. Tarantini, W. Starch, W. Oates, P.J. Lee, D.C. Larbalestier ASC – NHMFL – FSU M2OrA – 05 06/30/15

Acknowledgements

This research was funded by the Department of Energy; Office of High Energy Physics under Grant #: DE-SC0012083

RRP® strand provided under the DOE Conductor Development Program that is managed by D. Dietderich of the Lawrence Berkeley Laboratory.

PIT strand was supplied to us by the US LHC Accelerator Research Program (LARP), which is a BNL, FNAL, LBNL, and SLAC collaboration with CERN for the High Luminosity LHC program: http://www.uslarp.org/

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Page 3: RRP & PIT Deformation & RRR Comparison: M. Brown, C. Tarantini, W. Starch, W. Oates, P.J. Lee, D.C. Larbalestier ASC – NHMFL – FSU M2OrA – 05 06/30/15

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ExperimentWhat have we done? A quantitative study of the shape and position of filaments (sub-elements) after rolling

lengths of unreacted PIT & RRP® round wires to simulate cabling deformation. RRR values taken in varying stages of deformation. Diffusion Barrier leakages quantified and compared to filament distortion.

Why? To benchmark the deformation to determine a limit past which unacceptable damage has

occurred, and for discussion on how to best limit this damage

So What? We find that a critical distortion occurs for thickness reductions between 10 and 20%. In this range, the filament shapes transition from higher aspect ratio in outer filament rings

to much larger aspect ratios in inner filament rings, especially in the vicinity of the strong 45˚ shear bands imposed by the rolling

Comparison with RRR gives direct performance comparison of deformed strands.10% TR

0% TR

20% TR30% TR

Page 4: RRP & PIT Deformation & RRR Comparison: M. Brown, C. Tarantini, W. Starch, W. Oates, P.J. Lee, D.C. Larbalestier ASC – NHMFL – FSU M2OrA – 05 06/30/15

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Previous WorkRolling Experiments to simulate Rutherford cabling:

• Turrioni D, Barzi E, Bossert M, Kashikhin V V, Kikuchi A, Yamada R, and Zlobin A V 2007 Study of Effects of Deformation in Nb3Sn Multifilamentary Strands IEEE Transactions on Applied Superconductivity 17 2710–3

“A procedure that makes use of both microscopic analysis and macroscopic measurements was established to study effects of deformation in brittle superconducting strands.”

• Ghosh A K, Cooley L D, Dietderich D R, and Sun L 2008 Transport and Magnetization Properties of Rolled RRP Nb3Sn Strands IEEE Transactions on Applied Superconductivity, vol. 18, no. 2, pp. 993–996

Carried out transport, magnetization, and RRR measurements on rolled RRP strands. Showed that RRR is the most greatly affected.

• Barzi E, Turrioni D, and Zlobin A V 2014 Progress in RRP Strand Studies and Rutherford Cable Development at FNAL IEEE Transactions on Applied Superconductivity 24 1–8

Used flat rolling to test electrical performance of conductors after varying degrees of deformation.

In this work, we build upon previously used methods with a targeted focus on the shape change in the individual filaments (PIT) or sub-elements (RRP®).

10% TR0% TR

20% TR30% TR

Page 5: RRP & PIT Deformation & RRR Comparison: M. Brown, C. Tarantini, W. Starch, W. Oates, P.J. Lee, D.C. Larbalestier ASC – NHMFL – FSU M2OrA – 05 06/30/15

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Experimental ProcedureStrand rolled in ~5% increments • Samples taken at 10% increments: 10, 20, &

30% Thickness Reduction (TR)

• Wires then heat treated: Treatments in table below

• Samples then polished and imaged in SEM using Backscatter detector

RRP 108/127Manufacturer: OSTSupplier: DOE /CDP

WIRE SPECS:

Name PIT RRP-S1 RRP-S2 RRP-R1 RRP-R2

Billet # 31284 14895 14943 14896 14982

d0 (mm) 0.784 0.778 0.778 0.778 0.778

Nb/Sn - 3.4 3.4 3.6 3.6

RRR 80 259 207 317 481

620˚C (100hr) 640˚C (90hr)

H.T.

Standard Sn Reduced Sn

210˚C (72hr) 400˚C (48hr) 663˚C (48hr)

210˚C (72hr) 400˚C (48hr) 663˚C (48hr)

210˚C (72hr) 400˚C (48hr) 640˚C (48hr)

210˚C (72hr) 400˚C (48hr) 640˚C (48hr)

PIT 192/217Manufacturer: BrukerSupplier: DOE /CDP

Page 6: RRP & PIT Deformation & RRR Comparison: M. Brown, C. Tarantini, W. Starch, W. Oates, P.J. Lee, D.C. Larbalestier ASC – NHMFL – FSU M2OrA – 05 06/30/15

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Filament Shape DefinitionSteps:• Isolate DB and Cu interface• Threshold between color

values• Subtract Cu portion to

isolate filament shape• Use image analysis to

compile filament data

AB

Aspect Ratio =

Page 7: RRP & PIT Deformation & RRR Comparison: M. Brown, C. Tarantini, W. Starch, W. Oates, P.J. Lee, D.C. Larbalestier ASC – NHMFL – FSU M2OrA – 05 06/30/15

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Image Analysis Techniques on Full Strand

θ0˚

180˚

90˚

* Every filament isolated* Analysis performed only on top half due to symmetry* Rings labeled 1 through 4 starting on innermost ring* Superimpose radial axis with origin at center of strand* Find each filament’s radial position and the distance from center of the strand

Page 8: RRP & PIT Deformation & RRR Comparison: M. Brown, C. Tarantini, W. Starch, W. Oates, P.J. Lee, D.C. Larbalestier ASC – NHMFL – FSU M2OrA – 05 06/30/15

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PIT – Deformation vs. Angular Position

-5 1801

1.2

1.4

1.6

1.8

2

2.2

2.4

2.6

2.80%TR Filament Aspect Ratio vs. Angular Position,

θ

Angular Position, θ (deg)

Asp

ect R

atio

9045 1350

Undeformed 0%

9045 1350-5 1801

1.2

1.4

1.6

1.8

2

2.2

2.4

2.6

2.810%TR Filament Aspect Ratio vs. Angular Position,

θ

Angular Position, θ (deg)

Asp

ect R

atio

10%

No obvious radial trends Slight increase at 90 deg

Page 9: RRP & PIT Deformation & RRR Comparison: M. Brown, C. Tarantini, W. Starch, W. Oates, P.J. Lee, D.C. Larbalestier ASC – NHMFL – FSU M2OrA – 05 06/30/15

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0 45 90 135 1801

1.21.41.61.8

22.22.42.62.8

20% Filament Aspect Ratio vs. Angular Position, θ

Angular Position, θ (deg)

Asp

ect R

atio

-5 1801

1.21.41.61.8

22.22.42.62.8

30% Filament Aspect Ratio vs. Angular Position, θ

Angular Position, θ (deg)

Asp

ect R

atio

9045 1350

PIT – Shear Bands of Large Deformation

30%20%

Page 10: RRP & PIT Deformation & RRR Comparison: M. Brown, C. Tarantini, W. Starch, W. Oates, P.J. Lee, D.C. Larbalestier ASC – NHMFL – FSU M2OrA – 05 06/30/15

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RRP – Deformation vs. Angular Position

No obvious radial trends

High AR at Ring 4 hex cornersSlight increase in AR at 90°

0% TR 10% TR

Page 11: RRP & PIT Deformation & RRR Comparison: M. Brown, C. Tarantini, W. Starch, W. Oates, P.J. Lee, D.C. Larbalestier ASC – NHMFL – FSU M2OrA – 05 06/30/15

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30% TR

RRP Aspect Ratio – Shear Bands at higher TR

20% TR

Page 12: RRP & PIT Deformation & RRR Comparison: M. Brown, C. Tarantini, W. Starch, W. Oates, P.J. Lee, D.C. Larbalestier ASC – NHMFL – FSU M2OrA – 05 06/30/15

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PIT – Inner Filament Deformation Upon Rolling

260 270 280 290 300 310 320 3301

1.21.41.61.8

22.22.42.62.8

Filament AR vs. Radial Distance from Center

Distance from Center (μm)

Asp

ect R

atio

Undeformed 0%

① ② ③ ④ ⑤ ⑥ ⑦

10%

220 240 260 280 300 320 340 3601

1.21.41.61.8

22.22.42.62.8

Filament AR vs. Radial Distance from Center

Distance from Center (μm)

Asp

ect R

atio

①② ③④⑤⑥⑦

150 200 250 300 350 4001

1.21.41.61.8

22.22.42.62.8

Filament AR vs. Radial Distance from Center

Distance from Center (μm)

Asp

ect R

atio

20%

① ② ③ ④ ⑤ ⑥⑦

0 50 100 150 200 250 300 350 400 4501

1.21.41.61.8

22.22.42.62.8

Filament AR vs. Radial Distance from Center

Distance from Center (μm)

Asp

ect R

atio

30%①

③④

⑤ ⑥

Page 13: RRP & PIT Deformation & RRR Comparison: M. Brown, C. Tarantini, W. Starch, W. Oates, P.J. Lee, D.C. Larbalestier ASC – NHMFL – FSU M2OrA – 05 06/30/15

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RRP – Inner Filament Deformation Upon Rolling

Page 14: RRP & PIT Deformation & RRR Comparison: M. Brown, C. Tarantini, W. Starch, W. Oates, P.J. Lee, D.C. Larbalestier ASC – NHMFL – FSU M2OrA – 05 06/30/15

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Ring # 0% TR 10% TR 20% TR 30% TR1 0 1 1 32 0 0 1 33 0 0 3 14 0 0 2 25 0 0 0 26 0 3 2 17 0 1 1 0

PIT Damage Trends – DB Leakages

Ring # 0% TR 10% TR 20% TR 30% TR1 0 1 1 32 0 0 1 33 0 0 3 14 0 0 2 25 0 0 0 26 0 3 2 17 0 1 1 0

Total 0 5 10 12

# of DB Breakthroughs in Rings Two general trends are seen in both the table and graph.

Obvious: breakthroughs increase with increasing thickness reduction

Less obvious: Breakthroughs are favored on inner rings as %TR increases

*Note: Breakthroughs counted from entire cross-section (not just top half)

0% 10% 20% 30%0

102030405060708090

PIT RRR- 620C(100hr)/640C(90hr)

Thickness Reduction %

RRR

TR RRR0% 79.90

10% 59.0620% 32.9530% 19.36

Diffusion Barrier Sn leakage in 20% TR sample indicated by Kirkendall void, and A15 formation on outer DB

Page 15: RRP & PIT Deformation & RRR Comparison: M. Brown, C. Tarantini, W. Starch, W. Oates, P.J. Lee, D.C. Larbalestier ASC – NHMFL – FSU M2OrA – 05 06/30/15

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RRP Damage Trends - DB Leakages

14895Ring 0% 10% 20% 30%

1 0 0 1 62 0 0 2 53 1 0 3 14 1 0 0 2

Total --> 2 0 6 14

Thickness Reduction

14943Ring 0% 10% 20% 30%

1 2 0 1 52 0 0 4 43 0 0 2 44 0 0 1 3

Total --> 2 0 8 16

Thickness Reduction

14982Ring 0% 10% 20% 30%

1 0 0 2 42 0 0 4 73 0 0 2 44 0 0 1 2

Total --> 0 0 9 17

Thickness Reduction

14896Ring 0% 10% 20% 30%

1 0 1 1 52 0 0 1 73 0 0 0 24 0 0 0 1

Total --> 0 1 2 15

Thickness Reduction

Stan

dard

Sn

Redu

ced

Sn

Diffusion Barrier Sn leakage in 10% TR sample indicated by Kirkendall void, and A15 formation on outer DB

Again, two general trends are observed.

Obvious: breakthroughs increase with increasing thickness reduction

Less obvious: Breakthroughs are favored on inner rings as %TR increases

Page 16: RRP & PIT Deformation & RRR Comparison: M. Brown, C. Tarantini, W. Starch, W. Oates, P.J. Lee, D.C. Larbalestier ASC – NHMFL – FSU M2OrA – 05 06/30/15

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Damage Trends – RRR degradation @ 20% TR

14895Ring 0% 10% 20% 30%

1 0 0 1 62 0 0 2 53 1 0 3 14 1 0 0 2

Total --> 2 0 6 14

Thickness Reduction

14943Ring 0% 10% 20% 30%

1 2 0 1 52 0 0 4 43 0 0 2 44 0 0 1 3

Total --> 2 0 8 16

Thickness Reduction

14982Ring 0% 10% 20% 30%

1 0 0 2 42 0 0 4 73 0 0 2 44 0 0 1 2

Total --> 0 0 9 17

Thickness Reduction

14896Ring 0% 10% 20% 30%

1 0 1 1 52 0 0 1 73 0 0 0 24 0 0 0 1

Total --> 0 1 2 15

Thickness Reduction

Stan

dard

Sn

Redu

ced

Sn

Good ≤ 10% Bad ≥ 20%

Reduced Sn has higher values of RRR, however, this value drops significantly between 10 and 20%.

Standard Sn values for RRR are mostly preserved from 0 to 10%.

Page 17: RRP & PIT Deformation & RRR Comparison: M. Brown, C. Tarantini, W. Starch, W. Oates, P.J. Lee, D.C. Larbalestier ASC – NHMFL – FSU M2OrA – 05 06/30/15

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DB Leakage - Corner Filaments are not the problem!14982

Ring 0% 10% 20% 30%1 0 0 2 42 0 0 4 73 0 0 2 44 0 0 1 2

Total --> 0 0 9 17

Thickness Reduction Note that it is not the outer corner filaments that are leaking, but the inner filaments.

If Sn leakage is to be affected significantly, support must be given to the inner filaments.

30% TR

20% TR

Page 18: RRP & PIT Deformation & RRR Comparison: M. Brown, C. Tarantini, W. Starch, W. Oates, P.J. Lee, D.C. Larbalestier ASC – NHMFL – FSU M2OrA – 05 06/30/15

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Concluding Remarks – Hex Corner FilamentsTotal fraction of hex corner filaments leaking 6 per cross section 4 cross sections per sample 4 samples 96 total corner

filaments observed Only 3 leaks from corner filaments only 3.1% total rate of leakage

Inner ring filaments become the most heavily distorted as deformation increases leading to diffusion barrier failure. Rings 1 and 2 make up 23 filaments in each cross section 4 cross sections per

sample 4 samples 368 total filaments observed in Rings 1 and 2 62 leaks from filaments in Rings 1 and 2 16.8 % rate of leakage All but 3 of these leaks happen after 20% TR for inner rings DB leakage rates for

inner two rings go from 0.8% (@ 10%TR) to 4.3% (@20%TR), then to 16.8% (@30% TR)

What does this mean?We should be worried about inner filaments, not hex corners.

Q & A