Retardation, Birefringence and Stress measurement …...WPA-Series For resin molding, optical film, and much more. Switching between fast/slow axis available (all models). Fast axis

WPA/PA SeriesRetardation, Birefringence and Stress measurement

Photonic Lattice, Inc.

WPA-SeriesFor resin molding, optical film, and much more.

▮ Switching between fast/slow axis available (all models).

Fast axis Slow axis

WPA-200-XLWide Range

Extra-Large Type

WPA-200-LWide RangeLarge Type

WPA-200Wide Range

Standard Type

WPA-100-SWide RangeSmall Type

WPA-microWide Range

Microscopy Type

Output Retardation (nm) [stress equivalent (Mpa)※], axis orientation

Repeatability σ < 1 nm

Wavelength 523, 543, 575nm

Range 0 ～ 3500 nm※

Resolution Approx. 11M pixels

Field of View

■ Standard lens◆ Optional lens

■ 218×290mm ～360×480mm

■ 33×44mm ～240×320mm

◆ 3.6×4.8mm ～12.9×17.2mm

■ 24×32mm ～99×132mm

◆ 3.6×4.8mm ～12.9×17.2mm

■ 4.0×5.4mm ～11.6×15.8mm

■ 80×110μm ～2.0×2.7mm

(×2, ×5, ×10, ×20, ×50)

◆ 40×53 μm(×100)

SizeWeigth

650×650×1910mm47 kg

430×487×977mm23 kg

270×337×631mm13 kg

200×275×310mm9 kg

270×485×639mm22 kg

ContentsMain body (WPA-micro: microscope included),

control PC, dedicated software (WPA-View), operation manual

Optio

ns

Ultra-high retardation Optional Optional Optional Not available Not available

Real-time analysis Optional Optional Optional Optional Optional

Remote control Optional Optional Optional Optional Optional

Zoom lens Optional Optional Optional Standard Not available

Lens analysis Optional Optional Optional Standard Optional

Data processing Optional Optional Optional Standard Optional

※PC stand not included.

※Option

※When tested on a pure quartz plate

※Sample stage can be made even larger through customization on customer’s demand.

▮ Field of view size

Standard type

Small type

Extra-large type

A3

Large type

A4

PA-200-XLExtra-Large Type

PA-200-LLarge type

PA-200Standard type

PA-110-SSmall type

PA-microMicro type

PI-microCamera type

Retardation (nm) [stress equivalent (Mpa)※], axis orientation

σ < 1 nm Out of warranty

520 nm

0 ～ 130 nm Out of warranty

Approx. 97M pixels

■ 218×290mm ～360×480mm

■ 36×48mm ～240×320mm

◆ 3.6×4.8mm ～12.9×17.2mm

■ 27×36mm ～99×132mm

◆ 3.6×4.8mm ～12.9×17.2mm

■ 36×48mm

◆ 4.0×5.4 mm～11.6×15.8mm

■ 100×130μm ～1.0×1.3mm

(×4, ×10, ×20, ×40)Depends on the type of microscope the system

is attached to

650×650×1910mm46 kg

430×487×977mm22 kg

270×337×631mm12 kg

160×220×313mm4.5 kg

211×261×540mm10 kg

33×45.7×58.6mm100 g

Main body (PA-micro: microscope included, PI-micro: microscope not included),control PC, dedicated software (PA-View), operation manual

Not available Not available Not available . Not available Not available Not available

Optional Optional Optional Not available Optional Optional

Optional Optional Optional Not available Optional Optional

Optional Optional Optional Standard Optional Optional



▮ CSV data output

Built-in software CSV data output Spreadsheet software

PA-SeriesFor low retardation samples, glass, and much more.

Graph data can be saved into csv format file, so further analysis can be performed with external software.

※PC stand not included.

※Option

PA/WPA Features

▮ Easy operation/High-speed measurement

Click on “Measurement”

▮ Data analysis tools

Profile data plotted along an arbitrary line Histogram of the data picked up in an arbitrary areaData example

▮ High-range measurement (WPA only)

After the sample has been set on the glass stage, data is acquired within a few second with one click.

Thanks to our original polarization sensor, full distribution retardation measurement is now simple.

Plenty of analysis functions helps our customers evaluating their samples (retardation and axis orientation) in an intuitive manner.

Low range data takenat single-wavelength

λ:523nm

λ:543nm

λ:575nm

High-range triple wavelength data Example of ～4500nm quartz sample

Using data acquired at 3 wavelength, WPA allows measuring high-range retardation up to 1000s of nm.

Sample setting Result displayedwithin ～10sec.

High-speed 2-D measurement of transparent objects

Retardation, Birefringence, Internal stress.

The interpretation of the intensity patterns observed is difficult and requires high-level knowledge and craftmanship.

4560nm

Conventional method (Cross-Nicol)

Linear Polarization

IntensityPattern

Structure and Principle of the Polarization Imaging Sensor

Using four neighboring pixels, the state of polarization of the light can be computed at every point, instantly and without any rotating filter.

An array of original photonic crystal is placed in front of a full-fledged CCD image sensor.

PolarizationImaging Sensor

CCD

Integrated Photonic Crystal

Elliptical Polarization

State ofPolarization

0 nm

130 nm

0 nm

700 nm

Applications

▮ FilmsThe system achieved the goal of providing simple & quantitative characterization

of the retardation distribution in transparent films. By adjusting the display range,

very small irregularities can be pointed out and characterized in details. Small

variations in axis orientation can be easily caught as well.

▮ Organic MacromoleculesThe system provides also quantitative evaluation of the

retardation and the distribution of the molecular orientation is

organic macromolecules such as polymer spherulites.

▮ Inorganic MaterialsCombined with a microscope, the system can be used to

characterize quantitatively the local orientation in crystal grains,

for example in metal polycrystals. Using the reflection-type

variation of the system (WPA-micro, PI-micro only), opaque

materials can be evaluated the same way as transparent ones.

▮ Plastic MoldingMonitoring the retardation allows catching variations in the fabrication process of plastic molded products, or characterizing/comparing differentmanufacturing conditions. Given that it provides quantitative feedback from the production chain, it reveals itself as a very handy process control tool.

▮ LensesRetardation in the gate area of molded lens is a

factor of loss in image quality & resolution. The

system is a great help when searching for the best

molding conditions, with as few retardation as

possible in the gate area as a goal.

▮ GlassThe system allows the quantitative evaluation of how the retardation is distributed in, for example, hardened glass or laser-processed glass.It helps putting into light differences in manufacturing conditions or findings out problems in the production chain. That is why it is also a great quality control tool.

Retardation caused by laser processing in glass substrateProcess A Process BDifferences of retardation in glass manufactured by 2 different processes

（obtained with PA-200)（obtained with PA-200-L)

Lens for smartphones Lens for optical disk pickup

（obtained with WPA-100-S)（obtained with WPA-100-S)

（WPA-200-Lで測定)

Amphibole

（obtained with WPA-micro)

Range adjustedCamera image Retardation data

Object lens 5× mag.

Camera image Retardation data

（obtained with WPA-micro)

（obtained with WPA-200-L)


Manufacturing condition A

（obtained with WPA-200)

Manufacturing condition B


▮ Transparent TubesThe system shines also when it comes to characterizing transparent tubes, such as the ones used in the manufacturing or medical equipment industry.



Plastic transparent tube



Plastic transparent tube (after deformation)

For main system with hardware only

Contents

Ultra-high retardation measurement option Measurement of ultra-high retardation samples, up to ~10,000nm※.

Real-time analysis option Real-time retardation data analysis and instant OK/NG result.

Remote control option Coupling with external system (conveyor system, etc.)

Zoom lens Higher magnification imaging lens for small samples.

3-level retardation plate Reference retardation plates (3 levels.)

Retardation plate for microscope Reference retardation plate (microscopy type.)

For main system with hardware and analysis software

Contents

Lens analysis option Automatic circle area extraction and OK/NG evaluation.

Data processing option Software filters (noise reduction, high-pass/low-pass, inclination correction, arithmetic operation filter, stress calculator filter)

Optional function lineup

Reference plate with 3 standard levelsof retardation (low, mid., high).

▮ 3-level retardation plate

Retardation：① 10nm、② 40nm、③ 80nm

① ② ③

20m

m

48.5mm

▮ Retardation plate for microscope

Plate with a microscopy size standardretardation region.

16mm

8m

m

Retardation: 70nmMarkers

※Actual upper limit for quartz crystal sample

Suitable for the evaluation of small samples, such as molded plastic lenses, etc.

▮ Zoom lens

【Standard lens】


1mm

10mm

Retardation dataCamera image

【Zoom lens】

Photonic Lattice, Inc.ICR 6-6-3 Minami-Yoshinari, Aoba-ku, Sendai city, Miyagi, 989-3204 JAPAN

Phone: +81 22 342 8781 Fax: +81 22 342 8782

E-mail: [email protected]

URL: http://www.photonic-lattice.com

2018.8 version

▮ Data processing option (example)

Data below show the example of removing spike-shaped noise from dirt corrupted sample.

AfterBefore

【Comparison graph before/after】

【Noise removal filter】

NEW FILTERSnow available!

Arithmetic filterProcess data according any user-defined arithmetic expression using the basic operators ＋,ー,×,÷ !

Stress calculator filterConvert retardation to its internal stress equivalent (MPa) !

Reta

rdart

ion

(nm

)

BeforeAfter

Documents

Retardation, Birefringence and Stress measurement …...WPA-Series For resin molding, optical film, and much more. Switching between fast/slow axis available (all models). Fast axis