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Preliminary Ladder Testing Results. At IPHC MS, XS, LG. Outline. Ladders Testing Goals Voltage, power and temperature on ladder Baseline comparisons to probe test results Sensor performance in ladder configuration Issues What we have learned? Future testing. Ladders. - PowerPoint PPT Presentation
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MS, LG, XS PXL ladder tests at IPHC, May 1-7, 2012
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Preliminary Ladder Testing Results
At IPHCMS, XS, LG
MS, LG, XS PXL ladder tests at IPHC, May 1-7, 2012
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Outline
Ladders Testing Goals Voltage, power and temperature on ladder Baseline comparisons to probe test results Sensor performance in ladder configuration Issues What we have learned? Future testing
MS, LG, XS PXL ladder tests at IPHC, May 1-7, 2012
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Ladders Thin and thick sensor ladders.
Large bypass caps at either end, no small bypass caps (pads area available for VDDA, VDDD, VCLP).
Hand assembled quickly from probe tested sensors that function but have not been extensively characterized and are not necessarily optimum.
Tested at LBNL for JTAG function, test mode line pattern, normal mode readout was checked for proper header pattern. Ladders were then shipped to IPHC.
Probe system used primarily test modes. Normal RDO mode implemented(mostly) at IPHC.
MS, LG, XS PXL ladder tests at IPHC, May 1-7, 2012
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Testing goals
Validate the cable design– Cable design driven by
mechanical requirementsTest results from Phase-1 sensor laddersExpected large power consumption at startup
– Basic funcitonality (JTAG, Power distribution, etc.)– Characterization of sensor performance
Test modeNormal readout modeAs a function of bypass capacitance
MS, LG, XS PXL ladder tests at IPHC, May 1-7, 2012
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Voltage, power and temperature on ladder
MS, LG, XS PXL ladder tests at IPHC, May 1-7, 2012
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Voltage, power and temperature on ladder
Thin Sensor Cable HIGH threshold settings LOW threshold settings One sensor
@ regulator 3.97 3.97 3.5Driver sectionGND on the cable 67 mV 73 mV 12mVSensor power 3.583 3.546 3.448Driver power 3.471 3.467 3.48Begin low mass sectionGND 153 mV 170 mV 23 mVPower 3.478 3.427 3.435End of ladder power 3.459 3.406 3.433End of ladder GND 172 mV 190 mV 23 mV
Thin Sensor Cable HIGH threshold settings LOW threshold settings
One sensor
Beginning of ladder 3.325 3.257 n.a.End of ladder 3.287 3.216 n.a.
Thick Sensor Cable HIGH threshold settings LOW threshold settings
One sensor
Beginning of ladder 3.256 3.172 n.a.End of ladder 3.213 3.122 n.a.
MS, LG, XS PXL ladder tests at IPHC, May 1-7, 2012
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Voltage, power and temperature on ladder
Cooling liquid @ 22.5 °C
MS, LG, XS PXL ladder tests at IPHC, May 1-7, 2012
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Baseline comparisons to probe test results
No damage during shipping – JTAG and basic functionality
Sensor damage during construction:– 1 sensor on the “thick” ladder (L1)– 2 senosrs on the “thin” ladder (L2)
We suspect VCLP failure – to be tested later
MS, LG, XS PXL ladder tests at IPHC, May 1-7, 2012
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Baseline comparisons to probe test results
00.5
11.5
22.5
33.5
1 3 5 7 9 11 13 15 17 19 21 23 25 27 29 31 33 35 37 39 41 43 45 47 49
sensors 1-10, sub-arrays A,B,C,D
nois
e (m
V)
L2 one sensorL2 probe tests
0
0.2
0.4
0.6
0.8
1
1.2
1 3 5 7 9 11 13 15 17 19 21 23 25 27 29 31 33 35 37 39 41 43 45 47 49
sensors 1-10 sub arrays A,B,C,D
FPN
(mV)
L2 one sensorL2 probe tests
MS, LG, XS PXL ladder tests at IPHC, May 1-7, 2012
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MS, LG, XS PXL ladder tests at IPHC, May 1-7, 2012
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Sensor performance in ladder configuration
0
0.5
1
1.5
2
2.5
3
3.5
4
4.5
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1 3 5 7 9 11 13 15 17 19 21 23 25 27 29 31 33 35 37 39 41 43 45 47 49
sensors 1-10, sub-arrays ABCD
sqrt
( noi
se^2
+FPN
^2 )
(mV)
L2 one sensorL2 HIGH thresholdsL2 LOW thresholds
MS, LG, XS PXL ladder tests at IPHC, May 1-7, 2012
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Issues: threshold shiftd_offset (3.3 - 3.0)
0
5
10
15
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1 3 5 7 9 11 13 15 17 19 21 23 25 27 29 31 33 35 37 39 41 43 45 47 49
sensors 1-10 sub-arrays A,B,C,D
DA
C Vref2 = 105Vref2 = 110
-10
-5
0
5
10
15
20
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1 3 5 7 9 11 13 15 17 19 21 23 25 27 29 31 33 35 37 39 41 43 45 47 49
sensors 1-10, sub-arrays ABCD
DA
C
ONE - HIGH thresholdsONE - LOW thresholdsHIGH - LOW
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Issues: self-induced noise
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5× -1 mV -2 mV
A 60 60 11.5 k
B 95 1.3 k 1.9 M
C 0.5 k 3.7 k 64 k
D 1.5 k 10.0 k 0.2 M
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Issues: missing header/trailer bits
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What we have learned?
We need to work on our probe testing to be sure that we are getting good results.
We need to be more careful of ESD during ladder construction.
The voltage drop on the ladders appears to be manageable. The threshold baseline shifts with applied VDD and noise. Self induced sensor noise is possible. The noise observed without any bypassing capacitors in the
sensor array is significant. Additional testing is needed
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Future testing
Add bypass capacitors Retest existing ladders In parallel, design split-power cable Assemble split-power ladder in Berkeley Continue intensive testing at LBL
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Discussion points
Additional measurments
An onboard regulator may help with the threshold shifts and with noise immunity, but at the cost of power dissipation
…
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Back up slides
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Issues: ladder induced noise
