4
I, JOURNAL OF RESEARCH of the Notiona l Bureau of Standards - C. Engineering and Instrumentation Vol. 70C, No.3, July- Septembe r 1966 Precise Reflection Coefficient Measurements With an Untuned Reflectometer W. E. Little* and D. A. Ellerbruch* Institute for Basic Standards, National Bureau of Standa rds, Boulder, Colo. (Mar ch 9, 1966) The prec ision tun ed. t ec hniqu e of re fl ec ti on coe ffi c ie nl me as urement is, at prese nt , t.he .most a cc urat e t ec hnIqu e avadabl e. Utd ,za t, on of the t ec hnique requi res the IJ se of tun ers and s hdlng te rnllnat lon s to e hmlllat e or re du ce the inhere nt e rrors of a dir ec ti onal co upler. Th, s pap er d esc l'lb es a reA ec tlOn coe ffi cIent meas ur ement tec hniqu e Ihat ap proac hes Ih e acc ur acy of th e tun ed reHec tomete r. In stead of tun ers, the tec hniqu e u ses an id ea l on e- quarler wavelength wav egUId e sec tIOn to e hmlllat e the meas ur ement error Introdu ce d by finite dir ec ti onal co up le r dir ec- tI vIt y and to redu ce to seco nd order the e rror Introdu ce d by an equivalent generator mi smatch. A co mp a ri son of the quart er-wave t ec hniqu e with the luned reA ec tometer t ec hniqu e thr ough I he of the reA ec tlOn coe ffi CIe nt of thr ee 9/ 16 inch co axial waveguid e te rmina l io ns is also lncluded. . Key Words: Microwave, impedance, meas ur eme nt s, reA ec tometer. 1. Introduction Th e re fl ec tom eter t ec hniqu e for micr owave re fl ec - tion coe ffi cie nt meas ur eme nt s is now widely use d [1].1 Th e meas ur eme nt a cc uracy of a ba sic re fl ec tom- eter (a simple dir ec ti o nal c oupler coupled to th e r e- fle cted wave) de pend s on th e dir ec tivity of th e dire ctional co upl er and the e quival e nt gene rator mi s- match. Th e be st kn own me thod of improving th e measurement ac cura cy of the ba sic re fl ec tometer re quir es th e us e of tun ers, tuning pro ce dur es, and auxiliary equipment [2 , 3]_ The result of this tuning is an increa se in th e effec tive dire ctivity of the c oupl er and a mat ched e quival e nt gene rat or. At pr ese nt , the most a cc urat e meas ur eme nt s ar e achieved with this tun ed re fl ec tometer. The purpos e of thi s paper is to prese nt another method of improving the measurement accuracy of the basic reflectometer technique_ This method utilizes a quarter-wavelength . waveguide secti o n. Proper use of the quarter-wave section during th e measurement procedure will, in theory, eliminat e the error caused by a finite directivity and will redu ce the error caused by a mismatched equivalent generator to second order. No detailed error analysi s is includ ed in this paper ; however, a laboratory meas urem ent c omp a ri son with the tuned reflectometer indic at es that the total meas- urement error is small. Such an e rror analysis may be given at a later date, depending on re sults of further laboratory experiment s with the method_ * Radio Standards Engineering Di vi .. ion. National Bureau of Standards, Boulde r. Colo. 1 Fi gures in brackets indic ate the lite rature re fe rences al the e nd of thi s paper. 2. Theory Th e op eration of a re fl ec tometer is di sc usse d in detail else wh ere [3]_ Th erefor e, o nl y a brief re vi ew will be pr ese nt ed here as a s tartin g point for the di s- cuss ion of the quart er wa velength t ec hniqu e_ Th e s id e-arm o utput , 63, of a dir ec ti onal coupler co nn ec ted to s ampl e th e r (! fl ec ted wave (see fi g_ 1) ca n be ex- pr esse d as 1 -+ r T K 6:) = k6c; 1 r r ' - 2; l' (1) where be is the c ompon e nt of the in c id e nt wave fur- ni shed by the gene rator , r 2j and k ar e both func ti ons of the sc att ering coe ffi cie nt s of the dir ec tional coup le r and re fl ec tion coe ffi cie nt s of the gene rat or and det ec - tor , and r T is the re fl ec ti on coe ffi c ie nt of the te rminat - ing element. Th e s ymbol r 2; re pr ese nt s the e quival e nt s ource re fl ec tion coe ffi cient pr ese nted to the re fl ec tor under s tudy at the reference plan e. Th e symbol K is approximately e qual to the dir ec tivity ratio of the dir ec tional coupler. The desired performance of the directional coupler is realized when r 2 ;=0 and lIK= O. Equation (1) then redu c es to (2) Hence, inspection of (1) shows that the term s involving 11K and r2i introduce first order error s in rT, wh e n r T is determined according to (2) from a meas ur eme nt of 165

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Page 1: Precise reflection coefficient measurements with an

;.I,

JOURNAL OF RESEARCH of the Notiona l Bureau of Standards - C. Engineering and Instrumentation

Vol. 70C, No.3, July- September 1966

Precise Reflection Coefficient Measurements With an Untuned Reflectometer

W. E. Little* and D. A. Ellerbruch*

Institute for Basic Standards, National Bureau of Standards, Boulder, Colo.

(March 9, 1966)

The precis ion tuned . re flecto~ e t e r tec hnique of re fl ec tion coe ffi c ienl meas ure me nt is , a t present , t.he .mos t accurate technIqu e avadable. Utd ,za t,on of the tec hniqu e requi res the IJ se o f tune rs and s hdlng te rnllnat lon s to ehmlllate or reduce the inhe rent e rrors of a direc tional coupl er.

Th,s paper desc l'lbes a reAec tlOn coe ffi c Ie nt mea surement technique Ihat ap proac hes Ih e acc uracy of the tuned reHectomete r. Ins tead of tune rs, the tec hnique uses a n idea l one-qu arl e r wavele ngth wavegUId e sec tIOn to ehmlllate the measure me nt e rror Int rodu ced by finite direc ti onal coup le r direc­tI vIty and to reduce to second orde r the e rror Introdu ced by an equiva le nt gene ra tor mis matc h.

A co mpari so n of the quarte r-wave techniqu e with the lun ed re Aectome ter technique through I he ~eas ure m e nt of the reAec tlOn coeffi CIe nt of three 9/16 inch coaxia l waveguid e te rmina l io ns is a lso lnc lude d. .

Key Words: Microwave, impeda nce, measure me nts, reAectome te r.

1. Introduction

The re flectometer technique for microwave re flec­tion coeffic ie nt measure me nts is now widely used [1].1 The measurement accuracy of a basic re fl ec tom­e ter (a simple directio nal coupler coupled to the re­flec ted wave) de pends on the direc tivity of the direc tional coupler and the equivalent ge nerator mi s­match. The best known me thod of improving the measurement accuracy of the basic re fl ec tom ete r requires the use of tuners , tuning procedures, and auxiliary equipment [2 , 3]_ The result of this tuning is an increase in the effec tive directivity of the coupler and a matched equivalent generator. At prese nt, the most accurate me asure ments are ac hieved with this tuned re fl ec tome ter.

The purpose of this paper is to prese nt another method of improving the measurement accuracy of the basic reflectometer technique_ This method utilizes a quarter-wavelength . waveguide section. Proper use of the quarter-wave section during the measurement procedure will, in theory, eliminate the error caused by a finite directivity and will reduce the error caused by a mismatched equivalent generator to second order.

No detailed error analysi s is included in thi s paper; however, a laboratory measureme nt compari son with the tuned reflectometer indicates that the total meas­urement error is small. Suc h an error analysis may be given at a later date, depending on results of further laboratory experiments with the method_

* Radio Standards Engineering Di vi .. ion . National Bureau of S tandards , Boulde r. Colo.

1 Figures in bracke ts indic ate the literature re fe rences al the e nd of thi s paper.

2. Theory

The operation of a re fl ec tome ter is di scussed in de tail else wh ere [3]_ The refore, onl y a brief review will be presented here as a s tarting point for th e di s­c ussion of the quarter wave le ngth techniqu e_ Th e side-arm output , 63 , of a direc ti onal coupler conn ec ted to sample th e r (! fl ected wave (see fi g_ 1) can be ex­pressed as

1 -+ r T K 6:) = k6c; 1 r r '

- 2; l' (1)

wh ere be is the compon e nt of th e in c ide nt wave fur­ni shed by the ge nerator , r2j and k are both fun c tions of th e scattering coe ffi cie nts of the direc tional coup ler a nd re fl ection coe fficients of th e generator and de tec­tor , and r T is the re fl ec tion coe ffi c ie nt of the terminat­ing ele me nt. The s ymbol r 2 ; re prese nts the equivale nt source re fl ec tion coe ffi cie nt prese nted to the re fl ec tor under study at the refere nce plane . The symbol K is approximately equal to the directivity ratio of the direc tional coupler.

The desired performance of the directional coupler is realized when r 2;=0 and l IK = O. Equation (1) then reduces to

(2)

Hence, inspection of (1) shows that the terms involving 11K and r2i introduce first order errors in rT , wh en r T

is determined according to (2) from a meas ure me nt of

165

Page 2: Precise reflection coefficient measurements with an

the side-arm output, b;J, of an untuned (11K and r 2i oF 0) directional coupler. Reference 3 disc usses the mini­mization of these errors by proper use of tuners_

It is possible to eliminate the term 11K and simul­taneously reduce the error arising from a finite r 2i to second order by a measure me nt procedure utilizing an ideal waveguide sec tion that is one-quarter wavelength long. The theoretical basis for the method is as follows:

If the unknown is connected directly to the reference plane of the untuned refiec tometer shown in figure 1, the side-arm output, bll.l.' is

(3)

where r 1.1. is the reflection coefficient of the unknown. Interposing a precision quarter-wavele ngth wave­

guide section be tween the reflectometer and r 1.1. add s a 1800 phase shift to the argument of the impedance appended to the reference plane , causing the reflec­tion coefficient at thi s plane to be - r w With the quarter-wavelength section in serted betwee n the refer­ence plane and the unknown, as shown in figure 2, the side-arm output, b21.1.' is

bG_l...-: __ I~lb~.-.D ----':I~ ~rG rT--1 I jf2i

REFERENCE PLANE

F I GURE 1. A basic rejleclometer.

REFERENCE PLANE

(4)

The difference between bll.l. and b2 1.1. is the n

(5)

If the unknown is now replaced with a quarter­wavelength standard short circuit2 whose reflection I

coefficient is unity and the above measurement procedure repeated, formula (5), upon substitution of f s = 1 for r 1.1. , reduces to

(6) I

where bls is the sidearm output when the standard short circuit is connected directly to the reference plane, and b2s is the sidearm output when the ideal quarter-wavelength section is placed between the (, reference plane and the short circuit.

Dividing (6) by (5) results in

bls - b2s l.. 1- (r2ir 1.1.)2

bll.l. - b2 1.1. rl.l. 1- r 2i 2 (7)

Note that (7) does not contain the 11K factor and that Li occurs only to the second power. 1 r 2i 1 is usually less than 0.05 in a practical situation; hence, 1 r 2i 12

«i 1. Therefore, the limitati ·Jns of the untuned direc­tional coupler (i.e., finite directivity and a mismatched equivalent generator) have been essentially circum­vented, and the correct value of r 1.1. can be determined without tuning the coupler.

To evaluate r 1.1. by means of (7), it appears that four individual (complex) quantities have to be measured. If one is interested only in a magnitude measurement, which is usually the case, a relatively simple measure­ment procedure can be used to determine the ratio 1 bl s - b2s 1 II bll.l. - b21.1.1 directly, in decibels.

3. Measurement Procedures for Determining the Modulus of r JJ.

A measurement system has been constructed and used to substantiate the quarter-wave method experi­mentally. A block diagram of the system is shown in figure 3. The measurement procedure is as follows:

1. One end of the precision quarter-wavelength section of waveguide is connected to the reference plane and terminated with a standard short circuit. The signal from the side arm under these conditions is b2s of formula (7).

FIGURE 2. A basic reflecturneter with a c]uarler.lUove section 2A quart er-wavelength standa rd short c ircuit is a quart e r wavelength of precis ion line Jf, terminated by a shorting metal wall. If a simple shorting plate is used, r~=- 1 is sub-

connected. stitut ed for fit in (5) and one side of (7) would be multiplied by a - I .

166

Page 3: Precise reflection coefficient measurements with an

30 MHz If

RECEIVER

I I I

X I 4'SECTION

L-.J

x, STANDARD 4 ~HORT CIRCUIT

~MINATING ELEMENT WITH REFLECTION COEFFICIENT

r~

I I--REFERENCE I PLANE

FIGURE 3. Block dia.gram oj quarter-wavelength measurement system.

2. The variable phase shifter and attenuator, designated P, and A, in figure 3, are adjusted to

f produce a null at the 30 MHz IF receiver. This adjustment sets the signal from the auxiliary channel, b,A , equal to - bzs .

3. The ideal quarter-wavelength section is removed and the standard short circuit is connected directly to the reference plane. Under these conditions the signal from the side arm is b,s of (7). Because the signal from the auxiliary channel of figure 3 was ad­justed in the preceding step to produce the signal - bzs , the receiver, which responds to the sum of the outputs of the side-arm and auxiliary channel, registers Ibis - bzsl·

4. The standard 30 MHz attenuator in the IF re­ceiver is adjus ted to produce an arbitrary reference level at the indicator.

5. The short circuit is removed from the reference plane, and the quarter-wavelength section is connected and terminated in the unknown reflection coefficient. Under these conditions the signal out of the side­arm is equal to bZIL of (7).

6. The phase shifter and attenuator (P, and A,) are now readju sted to again produce a null at the 30 MHz receiver. This adjustment provides that bAZ = - bzlL , where bA Z is the signal from the auxiliary channel.

7. The quarter-wavelength section is removed, and the unknown is connected directly to the reference plane. The signal into the 30 MHz IF receiver is again the sum of the signals from the side-arm and auxiliary c hannel, i.e ., Ib 'lL - b21J A record is made of the change (in decibels) in the setting of the stand­ard 30 MHz attenuator in the receiver required to return the indicator to the reference level chosen in step four. This difference (in decibels) between the final attenuator setting and the se tting at step four is a measure of the ratio IblS- bzslll b'lL - bzlL l. Thus,

Ibls- b"S I dB(measured) = 20 log b -b-1M 21J.

Assumi ng that [ri; I ::s; 1, this equation reduces to approximately

1 dB(measured) = 20 log [rILl'

whence the unknown reflection coefficient magnitude is given by

dB(measured) 20

4. Measurement Results

The reflection coefficient magnitude of three 9/16-inch coaxial terminations were measured at 4 GHz using the quarter-wave technique. These measure­ments were compared with those obtained with a tuned reflectometer and those obtained with an un­tuned reflectometer that did not utilize a quarter· wavelength section. Table 1 summarizes the results.

The first column lists the values obtained for the three terminations when measured with a tuned reflectometer. The tolerances associated with these values include the measurement error as well as the non-repeatability obtained by rotating the termination. In the second column are listed the VSWR's corre­sponding to the reflection coefficients in the first column.

TABLE 1. Ta.bulated measurement results

VALUES OBTAINED WITH TUNED REFLECTQM[T[R VALUES aSTA INED WITH IMPERFECT COUPLER MEASUREMENT VALUES IMPERFECT COUPLER AND 1/4 X SECTION

If I VSWR If I V5WR If I VS WR

0.0217 1.0443 0 .042 1.088 0.0224 1.0458 ±O.OOO6 .:to.OOI2

0.0902 1.1983 0.108 1.242 0.0918 1.2022 ±O.OOIS ±O.OO3

0.3334 2.000 0.351 2.082 0.3353 2.0089 ± 0.0028 ±O,Q06

In the third and fourth columns are listed the re­flection coefficients and VSWR's obtained with an untuned directional coupler but no quarter·wavelength section. These values were obtain'ed as follows: The standard short circuit was connected to the reference plane, and an indicator reference point

167

Page 4: Precise reflection coefficient measurements with an

was obtained. The short circuit was then replaced by the unknown impedance, and the reflection co­efficient was computed from the measured change in the signal level at the indicator. These values are subject to all the errors due to imperfections in the directional coupler. The directional coupler employed in the three systems with which the data of table 1 were obtained (including that of fig. 3), had a direc­tivity of approximately 30 dB (this corresponds to a 1/IKI value of approximately 0.032) and a 1[2il of less than 0.02.

In the fifth and sixth columns of table 1 are listed the reflection coefficient magnitude and VSWR values obtained by using the quarter-wavelength measure­ment technique described in this report.

The values obtained using the quarter-wave tech­nique are in near agreement with the values obtained using the tuned reflectometer. The values obtained with the untuned reflectometer when the quarter· wave section was not used are considerably in error.

5. Conclusions

Precise reflection coefficient measurements are possible with an untuned reflectometer if the quarter­wave measurement technique is used. The theory was verified experimentally by measuring the reflector coefficient magnitudes of several terminations with a tuned reflectometer and then remeasuring them using the quarter-wave technique with an untuned

reflectometer. These same terminations were also measured directly with an untuned reflectometer with­out application of the quarter-wavelength technique, to demonstrate the improvement in accuracy provided by the quarter-wave method.

Relative phase data were neglected during this evaluation_ No serious difficulties are anticipated in modifying the measurement system to obtain phase data so that the quarter-wave technique will then provide the complex reflection coefficient.

Use of the quarter-wave technique instead of a tuning procedure eliminates the need for variable-phase high- and low-reflection loads and shortens the required length of precision line_ The most important potential application of the quarter-wave technique is in the measurement of impedance at frequencies below ap­proximately 1 GHz_ With decreasing frequency the tuned reflectometer becomes increasingly cumber­some .

168

6. References

[lJ Cinzton, E. L. , Mic rowave Measure ment s. p. 300 (McG raw­Hill Book Co. , Inc ., Ne w York , N.Y. , 1957).

[2 1 Engen, G. F., and R. W. Beatt y, Microwave reflectomete r techniqu es , IRE Trans . MTT MTT -7, No. 3. 351- 355 (Jul y 1959).

[3 1 Anson. Wilbur .J., A Guide to the use of the modified re Hec· mete r techniqu e u f VS WR meas urem ent , J. Res . NBS 65C (Engr. and In s t 1'. ) No. 4, 217 (Oct. · Dec. 1961).

(Paper 70C3-227)