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Optical Modulator Development at Partow Technologies LLC
CEO: Payam RabieiPartow Technologies LLC, Vista, CA
Company introduction
• Currently Partow is developing various optical modulators based on its bonded lithium niobate thin film technology.
• We have a phase II SBIR award from DOE and a phase I SBIR award from NASA.
• Our goal is to commercialize thin film based lithium niobatemodulators for data communication, analog photonics, and photonic sensing applications
• Relocated to California in 2016• Have access to state of art nanofabrication facility at UCSD
and UC Irvine
Propitiatory, for government review onlyPartow Technologies LLC
History
• The company started in Oct 2012 by Dr. Payam Rabiei and Prof. Sasan Fathpour at CREOL at University of Central Florida
• Received a first SBIR funding in 2014• Currently employs two full time staff as well as
contractors and part time staff
Partow Technologies LLC Propitiatory, for government review only
Technical Summary
• Room Temperature wafer bonding• Lithium niobate thin film substrates• Optical modulator projects
Propitiatory, for government review onlyPartow Technologies LLC
Room Temperature wafer bonding
• Home designed and made high vacuum room temperature wafer bonding system
• Uses plasma surface activation and wafer press in high vacuum to bond dissimilar materials at room temperature
Propitiatory, for government review onlyPartow Technologies LLC
Very strong bond strength
-1
-0.5
0
0.5
1
1.5
2
2.5
3
3.5
4
4.5
0 2 4 6 8 10 12 14 16 18
Bond
stre
ngth
(J/m
2)
Activation Time (s)
Wafer Type A
Wafer Type B
Wafer Type C
Linear (Wafer Type A)
Linear (Wafer Type B)
Linear (Wafer Type B)Silicon surface energy
Propitiatory, for government review onlyPartow Technologies LLC
Room Temperature wafer bonding
• Applications – Advanced photonic substrates– Advanced MEMS substrates– Wafer level vacuum packaging– Transparent bonding for various optical applications
• Features– Universal wafer to wafer bonding– No thermal stress (can bond dissimilar substrates)– No high force required ( i.e. can be used for bonding
fragile substrates such as III-V semiconductors)
Propitiatory, for government review onlyPartow Technologies LLC
Advanced substrates
i) Ion implantation
LiNbO3 Silicon
SiO2
ii) SiO2 deposition on Si substrate
iii) Wafer bondingiv) Heating
~2000 nm
~600 nm
LiNbO3
Silicon
SiO2
Silicon
SiO2
LiNbO3
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Thin film LN on Si substrates
X-cut LiNbO3 SiPartow Technologies LLC Propitiatory, for government review only
Advanced substrates
• Low loss optical quality thin films using in house bonding capability
• Possibility of bonding on a variety of different substrates.
• Almost universal and can be applied to create waveguide quality thin films on any flat substrate
Propitiatory, for government review onlyPartow Technologies LLC
Thick film substrates
• Used to achieve 5 microns and thicker LN layers by mechanical thinning methods
i) Wafer bonding ii) Thinning
~2000 nm
>6um
LiNbO3
Silicon
SiO2
Silicon
SiO2
Propitiatory, for government review onlyPartow Technologies LLC
Customers for wafer bonding
• Ultrasonic transducer manufacturers• X-ray detector manufacturers• Several federal research institutes in US• Several universities performing research in
MEMS, Optics, and a variety of other fields
Propitiatory, for government review onlyPartow Technologies LLC
Chalcogenide loaded LN device
Si
LiNbO3
SiO2
ChG
Si
LiNbO3
SiO2
Mask (SiO2)
ChG
i) ChG deposition ii) SiO2 mask e-beam lithography
Si
LiNbO3
SiO2
iii) ChG etching Passivation
ChGBCB
• Chalcogenide glass can achieve lower losses• Index is matched to lithium niobate
Partow Technologies LLC Propitiatory, for government review only
Ring resonators based on CHG on LN
• Q is as high as 1.3× 105
• Loss as low as 1.2 dB/cm
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Modulator electrode design LN
• Using high contrast waveguide electrodes can be placed closer
• -> Lower Vp
electrodes
Slab: LiNbO3
Ridge: Ta2O5
Cladding: SiO2
Si
SiO2
SiO2
y-cut LiNbO3E
z
y
VTa2O5
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Results For MZI Modulators
• Vπ.L as low as 4 V-cm is obtained
• Calculation shows Vπ.Las low as 2 V-cm is possible
-0.5 0 0.50
10
20
Pow
er (µ
W)
-0.5 0 0.5-10
0
10
Time (msec)
Vol
tage
(Vol
t)
Ta2O5
SiO2
LiNbO3Si
Au
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High speed testing setup
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High Speed MZI Characterization
• Modulator functioning up to several GHz
• The 8GHz drop in measurement due to detector
• Optical bandwidth >8GHz
• Some issues remain with non flat response to be addressed in phase II
2 4 6 8 10-16
-12
-8
-4
0
4
S 21 (d
B)
Modulation frequency (GHz)
Electrode transmission Optical response
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Grating coupling
• Low Loss couplers are needed to make a complete device
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Coupler measurement
• -6dB /coupler loss measured on LN samples with BCB cladding
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Low loss GC development
• Optimized grating coupler design achieved 3dB loss from the LN high index waveguide to single mode fiber
• An integrated micro-mirror for fiber couplingg
Partow Technologies LLC Propitiatory, for government review only
DC drift problem
• Modulators with above design drift quickly over time• DC drift is eliminated by etching into the LN thin
films.
Propitiatory, for government review onlyPartow Technologies LLC