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Minimum Dynamic Power CMOS Circuit Design by a Reduced Constraint Set Linear Program Tezaswi Raja Vishwani Agrawal Michael L. Bushnell Rutgers University, Dept. of ECE Piscataway, NJ 08854 Support from National Science Foundation, USA

Minimum Dynamic Power CMOS Circuit Design by a Reduced Constraint Set Linear Program Tezaswi Raja Vishwani Agrawal Michael L. Bushnell Rutgers University,

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Minimum Dynamic Power CMOS Circuit Design by a

Reduced Constraint Set Linear Program

Minimum Dynamic Power CMOS Circuit Design by a

Reduced Constraint Set Linear ProgramTezaswi Raja

Vishwani Agrawal Michael L. Bushnell

Rutgers University, Dept. of ECEPiscataway, NJ 08854

Support from National Science Foundation, USA

January 2003 VLSI Design Conf. 2

Power in a CMOS GatePower in a CMOS GateVDD = 5VVDD = 5V

IDDIDD

GroundGround

January 2003 VLSI Design Conf. 3

Problem StatementProblem Statement•Design a digital circuit for minimum

transient energy consumption by eliminating hazards

January 2003 VLSI Design Conf. 4

Theorem 1Theorem 1•For correct operation with minimum

energy consumption, a Boolean gate must produce no more than one event per transition

Ref: Agrawal, et al., VLSI Design’99

January 2003 VLSI Design Conf. 5

• Given that events occur at the input of a gate (inertial delay = d ) at times t1 < . . . < tn , the number of events at the gate output cannot exceed

Theorem 2Theorem 2

min ( min ( n n , 1 + ), 1 + )ttnn – t – t11

----------------dd

ttnn - t - t11 + d + d

tt11 t t22 t t33 t tnn t tnn + d + d timetime

Ref: Agrawal, et al., VLSI Design’99

January 2003 VLSI Design Conf. 6

Minimum Transient Design

Minimum Transient Design

•Minimum transient energy condition for a Boolean gate:

| t| tii - t - tjj | < d | < d

Where tWhere tii and t and tjj are arrival times of input are arrival times of input

events and d is the inertial delay of gateevents and d is the inertial delay of gate

January 2003 VLSI Design Conf. 7

Linear Program (LP)Linear Program (LP)

•Variables: gate and buffer delays

•Objective: minimize number of buffers

•Subject to: overall circuit delay

•Subject to: minimum transient condition for multi-input gates

•AMPL, MINOS 5.5 (Fourer, Gay and Kernighan)

January 2003 VLSI Design Conf. 8

Limitations of This LPLimitations of This LP

•Constraints are written by path enumeration.

•Since number of paths in a circuit can be exponential in circuit size, the formulation is infeasible for large circuits.

•Example: c880 has 6.96M constraints.

January 2003 VLSI Design Conf. 9

A New LP ModelA New LP Model

•Introduce two new timing window variables per gate output:

• ti Earliest time of signal transition at gate i.

• Ti Latest time of signal transition at gate i.t1, T1

tn, Tn

.

.

.

ti, Ti

Ref: T. Raja, Master’s Thesis, Rutgers Univ., 2002

January 2003 VLSI Design Conf. 10

New Linear ProgramNew Linear Program

•Gate variables d4 . . . d12

•Buffer Variables d15 . . . d29

•Corresponding window variables t4 . . . t29 and T4 . . . T29.

January 2003 VLSI Design Conf. 11

Multiple-Input Gate ConstraintsMultiple-Input Gate Constraints

For Gate 7:T7 > T5 + d7; t7 < t5 + d7; d7 > T7 - t7;

T7 > T6 + d7; t7 < t6 + d7;

January 2003 VLSI Design Conf. 12

Single-Input Gate ConstraintsSingle-Input Gate Constraints

T16 + d19 = T19 ;

t16 + d19 = t19 ;

Buffer 19:

January 2003 VLSI Design Conf. 13

Overall Delay ConstraintsOverall Delay Constraints

T11 < maxdelay

T12 < maxdelay

January 2003 VLSI Design Conf. 14

Why New Model is Superior?Why New Model is Superior?

• Path constraints from old model:2 × 2 × … 2 = 2n paths between I/O pair

• For new model, a single constraint controls I/O delay. Total variables, 24n.

• New constraint set is linear in size of circuit.

January 2003 VLSI Design Conf. 15

Comparison of ConstraintsComparison of Constraints

Number of gates in circuit

Nu

mb

er

of

con

str

ain

ts

6.96M

3,611

c880

January 2003 VLSI Design Conf. 16

Results: 1-Bit AdderResults: 1-Bit Adder

January 2003 VLSI Design Conf. 17

Estimation of PowerEstimation of Power•Circuit is simulated by an event-driven

simulator for both optimized and un-optimized gate delays.

•All transitions at a gate are counted as Events[gate].

•Power consumed Events[gate] x # of fanouts.

•Ref: “Effects of delay model on peak power estimation of VLSI circuits,” Hsiao, et al. (ICCAD`97).

January 2003 VLSI Design Conf. 18

Original 1-Bit AdderOriginal 1-Bit Adder

Colo

r co

des

for

num

ber

of

transi

tions

January 2003 VLSI Design Conf. 19

Optimized 1-Bit AdderOptimized 1-Bit Adder

Colo

r co

des

for

num

ber

of

transi

tions

January 2003 VLSI Design Conf. 20

Results: 1-Bit AdderSimulated over all possible vector transitions

•Average power = optimized/unit delay = 244 / 308 = 0.792

•Peak power = optimized/unit delay = 6 / 10 = 0.60

Power Savings :

Peak = 40 %

Average = 21 %

January 2003 VLSI Design Conf. 21

Results: 4-Bit ALUResults: 4-Bit ALU

maxdelay Buffers inserted

7 5

10 2

12 1

15 0

Power Savings :

Peak = 33 %, Average = 21 %

January 2003 VLSI Design Conf. 22

Benchmark CircuitsBenchmark CircuitsCircuit

C432

C880

C6288

c7552

Maxdel.(gates)

1734

2448

4794

4386

No. ofBuffers

9566

6234

294120

366111

Average

0.720.62

0.680.68

0.400.36

0.380.36

Peak

0.670.60

0.540.52

0.360.34

0.340.32

Normalized Power

January 2003 VLSI Design Conf. 23

Physical DesignPhysical Design

Gatel/w Gate

l/w

Gatel/w

Gatel/w

Gate delay modeled as a linear function of gate size, total load capacitance, and fanout gate sizes (Berkelaar and Jacobs, 1996).

Layout circuit with some nominal gate sizes.

Enter extracted routing delays in LP as constants and solve for gate delays.

Change gate sizes as determined from a linear system of equations.

Iterate if routing delays change.

January 2003 VLSI Design Conf. 24

Power Dissipation of ALU4Power Dissipation of ALU4

January 2003 VLSI Design Conf. 25

ReferencesReferences• R. Fourer, D. M. Gay and B. W. Kernighan, AMPL: A Modeling

Language for Mathematical Programming, South San Francisco: The Scientific Press, 1993.

• M. Berkelaar and E. Jacobs, “Using Gate Sizing to Reduce Glitch Power,” Proc. ProRISC Workshop, Mierlo, The Netherlands, Nov. 1996, pp. 183-188.

• V. D. Agrawal, “Low Power Design by Hazard Filtering,” Proc. 10th Int’l Conf. VLSI Design, Jan. 1997, pp. 193-197.

• V. D. Agrawal, M. L. Bushnell, G. Parthasarathy and R. Ramadoss, “Digital Circuit Design for Minimum Transient Energy and Linear Programming Method,” Proc. 12th Int’l Conf. VLSI Design, Jan. 1999, pp. 434-439.

• M. Hsiao, E. M. Rudnick and J. H. Patel, “Effects of Delay Model in Peak Power Estimation of VLSI Circuits,” Proc. ICCAD, Nov. 1997, pp. 45-51.

• T. Raja, A Reduced Constraint Set Linear Program for Low Power Design of Digital Circuits, Master’s Thesis, Rutgers Univ., New Jersey, 2002.

January 2003 VLSI Design Conf. 26

ConclusionConclusion• Obtained an LP constraint-set that is linear in the size of

the circuit. LP solution:

• Eliminates glitches at all gate outputs,

• Holds I/O delay within specification, and

• Combines path-balancing and hazard-filtering to

minimize the number of delay buffers.

• New LP produces results exactly identical to old LP

requiring exponential constraint-set.

• Results show peak power savings up to 68% and

average power savings up to 64%.