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Title of Your Manuscript Should be Placed Here
Gil-Dong Honga, Moo-Kee Leeb,c, and Young Sil Changc,*
aDepartment of Major, Hankook University, Seoul 12345, Republic of Korea
bDepartment of Major, Jingong University, Seoul 12345, Republic of Korea
cDepartment of Major, Vacuum University, Seoul 12345, Republic of Korea
Abstract
Applied Science and Convergence Technology (ASCT) is an international peer-reviewed online
journal publishing research articles. It aims to enhance the knowledge of vacuum and related science
& technologies by providing research information with easy access via web. ASCT has six major
fields: vacuum technology, surface and interface science, plasma and display, semiconductors and thin
films, nano and biointerface, and energy technology. It was first issued by the Korean Vacuum Society
in 1992 under the name of Journal of Korean Vacuum Science & Technology (JKVST). ASCT is the
continued on-line journal of the JKVST since 2014. It is listed as a top prestigious journal of Korea
Research Foundation. (The word number in abstract should be 100 – 200)
Keywords: Applied science, Convergence, Technology
*Corresponding author.
Email: [email protected]
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1. Introduction
Applied Science and Convergence Technology (ASCT) is an international peer-reviewed online
journal publishing research articles. It aims to enhance the knowledge of vacuum and related science
& technologies by providing research information with easy access via web [1]. ASCT has six major
fields: vacuum technology, surface and interface science, plasma and display, semiconductors and thin
films, nano and biointerface, and energy technology [2,3].
2. Experimental details
It was first issued by the Korean Vacuum Society in 1992 under the name of Journal of Korean
Vacuum Science & Technology (JKVST) [4–7]. ASCT is the continued on-line journal of the JKVST
since 2014. It is listed as a top prestigious journal of Korea Research Foundation.
3. Results and discussion
3.1. Optical properties
Photoluminescence
Figure 1 shows photoluminescence (PL) spectra at 6 K for as grown samples. An optical
microscopy image of the produced pattern is shown in Fig. 2. Temperature-dependent integrated PL
intensity can be determined using the following Arrhenius equation,
(1)
where I0 is the integrated PL intensity at 0 K, a, b, and c are constants related to the energy density of
states, E is the thermal activation energy of the low-temperature quenching processes, and ELO and m
are phonon energy and the number of phonons, respectively. From Eq. (1), we expect that the mode
shifts depend on irradiation time. From Eqs. (1) and (2), we expect that the mode shifts depend on
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irradiation time. From Eqs. (1)-(3), we expect that the mode shifts depend on irradiation time. These
values are lower than the theoretical values estimated by Kim et al.[1].
Atomic Force Microscope
Figure 3(a) shows the color-coded volumetric strain profile. The PL peak shift for samples
capped with TiO2 and SiO2 after annealing at 850 °C for different times is summarized in Fig. 3(b).
The FWHM of the PL spectra for the SiO2 capped area slightly decreases compared to that of as-
grown samples [Fig. 3(c)].
3.2. Structural properties
Figures 4(a) and 4(b) show AFM images of the uncapped surfaces of CdZnTe/ZnTe
nanostructures with Cd mole fractions of 0.6 and 0.75, respectively. The results for PL spectra
measured at several temperatures for the CdTe and ZnTe structure are shown in Figs. 4(c) and 4(d),
respectively. Figures 5(a)–(c) show schematic diagrams of the process flow for the fabrication of the
pattern. The corresponding electric field intensity distribution profiles are plotted in Figs. 5(e)–(g).
The densities, the heights, and the diameters for CdTe/ZnTe QDs grown on GaAs and Si
substrates are tabulated in Table I. The activation energies of the electrons confined in CdZnTe/ZnTe
nanostructures are summarized in Tables I and II.
4. Conclusions
ASCT accepts research paper, review paper, rapid communications, brief reports and technical
notes. It publishes articles immediately after the review process if manuscript is determined as
acceptance. All articles must be submitted via online manuscript submission system (http://www.e-
asct.org) and peer review is also done electronically. All of submitted manuscripts should be written in
English. The official title of the journal is Applied Science and Convergence Technology and its
abbreviation is ASCT. Submission is open to any researcher who deals the subject in the above-
mentioned six major fields.
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Acknowledgements
This research was supported by the Basic Science Research Program through the National
Research Foundation of Korea (NRF) funded by the Ministry of Science and ICT (NRF-
2018R1A2B6001019).
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References
[1] H. G. Kim, J. G. Lee, A. B. Lee, C. D. Kim, and H. H. Park, Appl. Sci. Converg. Technol. 15, 123
(2018).
[2] H. G. Kim and H. S. Lee, Appl. Sci. Converg. Technol. 15, 123 (2018).
[3] G. H. Kennedy, Vacuum Technology (Prentice-Hall, New York, 2005), pp. 88–105.
[4] H. K. Kim, Proceedings of the 2001 Spring Meeting of the Korean XXX Society, edited by D. H.
Lee (Seoul, Korea, April 23-24, 1999), Vol. 1, pp. 130–152.
[5] H. Kim, Saclay Report No. CEA-R5000, 1999.
[6] M. T. Man, Ph.D. thesis, Harvard University, 1965.
[7] The Korean Vacuum Society http://www.kvs.or.kr (accessed Jul. 1, 2013).
[8] H. G. Kim, U.S. Patent 1,234,567 (2018).
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Tables
Table I. Densities, heights, and diameters for various CdTe film thicknesses.
CdTe film thickness
(monolayer)
Density
(cm-2)
Height
(nm)
Diameter
(nm)
2.4 6 109 4–9 20-60
2.5 4 1010 5–7 20-30
2.7 10 1010 6–9 30-50
3.4 3 108 7–10 50-70
Table II. Activation energies and errors for various CdTe film thicknesses.
CdTe film thickness
(monolayer)
Activation energy
(meV)
2.4 47.06 2.48
2.5 49.06 2.24
2.6 45.06 2.31
2.7 37.06 2.25
3.4 41.06 1.64
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Figure Captions
Figure 1. (Color online) Use these file formats only: EPS, PS, TIFF(.tif), or JPEG(.jpg).
Figure 2. Submit a single file for each figure with figure parts: label each part (a), (b), etc.
Figure 3. (Color online) (a) Line art: 600 dpi resolution and black/white bitmap, not gray scale. (b)
Halftones: 264 dpi resolution and grayscale, not black/white bitmap. (c) Combinations (line art
+ halftone): 600 dpi and grayscale, not black/white bitmap. (d) Color: 300 dpi JPG, TIFF, PS, or
EPS format.Submit a single file for each figure with figure parts: label each part (a), (b), etc.
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FIG. 1.
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FIG. 2
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FIG. 3
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