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CCL Works hop on comb technology, March 2003 B undes amt für E ich - und Vermes s ungs wes en E xperiences with a commercial comb generator at the B E V Michael Matus B undes amt für E ich und Vermes s ungs wes en, Arltgas s e 35, A-1160 Wien, Aus tria m.matus @ metrologie.at

Michael Matus Bundesamt für Eich und Vermessungswesen, · 2013. 10. 15. · Michael Matus Bundesamt für Eich und Vermessungswesen, Arltgasse 35, A-1160 Wien, Austria [email protected]

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  • CCL Workshop on comb technology, March 2003

    Bundesamt für E ich- und Vermessungswesen

    Experiences with a commercial comb generator at the BEV

    Michael MatusBundesamt für E ich und Vermessungswesen,Arltgasse 35, A-1160 Wien, Austriam.matus@ metrologie.at

  • CCL Workshop on comb technology, March 2003 2

    Outline

    1. Motivations for ins talling a comb generator atthe BEV

    Primary standard for length metrology. T ype of instrument chosen

    2. S pecial problems (and solutions) in lengthmetrology

    low-power and frequency modulated lasers (mise en pratique)

    3. Laser-frequency measurements as a s tandardservice to the public?

    current s tatus and outlook

  • CCL Workshop on comb technology, March 2003 3

    Motivation

    T raditional laser intercomparisons campaigns:• mostly limited to 633 nm (2 I2-s tabilized lasers as primary

    standards at the BEV)• rather time consuming

    • will come to an end in the near future anyway

    Optical femtosecond comb generator:• direct realisation of the definition of the meter

    • wavelength range extended• no need for specialized laser sources; working standards can be

    calibrated directly (gauge block interferometer)• service for the “public”, i.e for other NMI´s

    • other goodies (e.g. Cs-controlled ECDL)

  • CCL Workshop on comb technology, March 2003 4

    S etup

    magic magic fiberfiber

    NL -NL -interferometerinterferometer

    pump-laserpump-laser

    AOMAOM

    T iT i:S -L aser:S -L aser

    experimentexperiment

    ins talled: Jan. 2002price: ~ 300 k

    S er.Nr.: 001

    Offspring company of MPQ

  • CCL Workshop on comb technology, March 2003 5

    S pecial problems in length metrology (1)

    ProblemsFeatures of some CCL lasers :• Low output power• S trong frequency modulation

    Features of the comb:• Low output power per comb

    mode (~10 nW)• High background (~1000 comb

    modes reach the APD togetherwith the laser)

    • S pectral “holes” in the fibrestretched light (near 633 nm)

    • Wavefront dis tortion due to NL-interferometer for l > 600 nm

    S olutionsF irs t s teps for 633nm• Powerful backup lasers• T esting of different fibres (trial

    and error)

  • CCL Workshop on comb technology, March 2003 6

    HeNe - 633 nm via 2-mode laser

    Due to experimentalboundary conditions

    only component “c” canbe measured without

    us ing an additionalmixer and local

    oscillator.

  • CCL Workshop on comb technology, March 2003 7

    HeNe - 633 nm via ECDL

    T he frequency of the ECDL is locked to a particular comb modeand can be tuned over some nm (“amplified comb mode”).

    In practice it is difficult for a s ingle operator to lock the ECDL to themode des ired. Also the high output power is partially wasted

    because of the rather poor beam geometry.

  • CCL Workshop on comb technology, March 2003 8

    S pecial problems in length metrology (2)

    ProblemsFeatures of some CCL lasers :• Low output power• S trong frequency modulation

    Features of the comb:• Low output power per comb

    mode (~10 nW)• High background (~1000 comb

    modes reach the APD togetherwith the laser)

    • S pectral “holes” in the fibrestretched light (near 633 nm)

    • Wavefront dis tortion due to NL-interferometer

    S olutionsF irs t s teps for 633nm• Powerful backup lasers• T esting of different fibres (trial

    and error)

    Current system (minor modificationsto original system)

    • Optical separation of spectralregion of interest from the NL-interferometer

    • Mode matching of combradiation and laser beam

    • T echnique for checking thevalidity of the beat frequencyreadings

  • CCL Workshop on comb technology, March 2003 9

    Present setup

    Laser to becalibrated

    ReplacedmirrorDichroic mirror, hightransmittance at 45°from 600 - 900 nm

  • CCL Workshop on comb technology, March 2003 10

    Minimal laser power

    Laser power atAPD even lowerby approx. 40 %

    S ens itivity sufficient for most lasers !

  • CCL Workshop on comb technology, March 2003 11

    F ilter band width

    Narrow band RF-filter not necessary!

    Us ing narrow bandfilters together with

    frequency modulateds ignals can cause big

    errors .

    Passband ~25 MHz

  • CCL Workshop on comb technology, March 2003 12

    Cycle s lip detection

    S imple method toensure validity of

    beat-frequencyreadings

    drawback:laser power must be

    s lightly higher

  • CCL Workshop on comb technology, March 2003 13

    Results obtained during EUROMET #647

    532 nm CMI YAG1 [32-0 R(56) a10] (~500 µW)563 260 223 514.3 kHz ± 0.4 kHz

    543 nm PLG1 [28-0 R(106) b10] (~15 µW)551 580 162 396.6 kHz ± 0.6 kHz

    633 nm BEV2 [11-5 R(127) f ] (~90 µW)473 612 353 604.36 kHz ± 0.14 kHz

  • CCL Workshop on comb technology, March 2003 14

    F requency s tability

    T wo samples variance as measured with the comb for sample times>10 s as good as one can expect from the standard!

  • CCL Workshop on comb technology, March 2003 15

    Present s tatus

    • Instrument is working fine and reliable. Eventhe fibre survived all experiments so far.

    • Calibrations on 543nm and 633nm lasers arenow performed as a regular service.

    • Already applied for entry in the cmc tables(520 nm – 1150 nm, U rel=10-9)

    • Comb generator now included (as the nationals tandard) in the hierarchy scheme for lengthmeasurements .

  • CCL Workshop on comb technology, March 2003 16

    hierarchy scheme for dimens ional measurements

    Overview of traceability for dimens ionalcalibrations (and verifications) covered by

    BEV‘s quality sys tem.

  • CCL Workshop on comb technology, March 2003 17

    T op-level services

    T he optical femtosecondcomb generator is now the

    primary (national)s tandard for all length

    measurements traceableto the BEV.

    T he I2-s tabilized lasers BEV1and BEV2 can still be

    used as primary s tandardsbut it makes more sense

    to employ them as transferand travelling s tandards

  • CCL Workshop on comb technology, March 2003 18

    Conclus ion

    • For ins titutes with the need for more than as ingle wavelength, the femtosecond combgenerator as a length s tandard is an option!(as opposed to build and maintain a variety ofCCL lasers).

    • Calibration of secondary s tandards (2-modestabilized etc.) is now not more elaborate thanthe traditional way. For this lasers even thebeat frequency measurement us ing aspectrum analyser might be adequate.

    • We are confident in the reliability of thistechnique to offer it as a service to the public.