34
2016 Microchip Technology Inc. DS20005531A-page 1 MIC4609 Features Gate Drive Supply Voltage up to 20V Overcurrent Protection with Programmable Restart Delay 1A Gate Drivers Dual (HI/LI) Inputs per Phase Fault Signal Asserts on Overcurrent and V DD UVLO TTL Input Thresholds 300 ns Typical Input Filtering Time Shoot-Through Protection Low-Power Consumption Supply Undervoltage Protection -40°C to +125°C Junction Temperature Range Typical Applications 3-Phase Motor Drive Field-Oriented Control (FOC) White Goods Appliances Brushless DC Fans General Description The MIC4609 is a 600V 3-phase MOSFET/IGBT driver. The MIC4609 features a 300 ns typical input filtering time to prevent unwanted pulses and a 550 ns of propagation delay. The MIC4609 has TTL input thresholds. The robust operation of the MIC4609 ensures that the outputs are not affected by supply glitches, High Side (HS) ringing below ground, or HS slewing with high-speed voltage transitions. Undervoltage protection is provided on both the low-side and high-side drivers. The MIC4609 is available in a 28-pin wide SOIC package. The MIC4609 has an operating junction temperature range of -40°C to +125°C. Package Type MIC4609 28-Pin SOICW V DD AHI ALI BHI BLI CHI FAULT CLI EN ISNS COM RCIN V SS CLO AHB AHO BHB AHS BHO NC NC BHS CHO CHB ALO CHS 15 NC BLO 16 17 18 19 20 21 22 23 24 25 26 27 28 14 13 12 11 10 9 8 7 6 5 4 3 2 1 600V 3-Phase MOSFET/IGBT Driver

MIC4609 Data Sheet - Microchip Technologyww1.microchip.com/downloads/en/DeviceDoc/20005531A.pdf · MIC4609 DS20005531A-page 2 2016 Microchip Technology Inc. Functional Block Diagram

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Page 1: MIC4609 Data Sheet - Microchip Technologyww1.microchip.com/downloads/en/DeviceDoc/20005531A.pdf · MIC4609 DS20005531A-page 2 2016 Microchip Technology Inc. Functional Block Diagram

2016 Microchip Technology Inc. DS20005531A-page 1

MIC4609

Features• Gate Drive Supply Voltage up to 20V• Overcurrent Protection with Programmable

Restart Delay• 1A Gate Drivers• Dual (HI/LI) Inputs per Phase• Fault Signal Asserts on Overcurrent and

VDD UVLO• TTL Input Thresholds • 300 ns Typical Input Filtering Time • Shoot-Through Protection• Low-Power Consumption• Supply Undervoltage Protection• -40°C to +125°C Junction Temperature Range

Typical Applications• 3-Phase Motor Drive • Field-Oriented Control (FOC)• White Goods Appliances• Brushless DC Fans

General DescriptionThe MIC4609 is a 600V 3-phase MOSFET/IGBT driver.The MIC4609 features a 300 ns typical input filteringtime to prevent unwanted pulses and a 550 ns ofpropagation delay. The MIC4609 has TTL inputthresholds.

The robust operation of the MIC4609 ensures that theoutputs are not affected by supply glitches, High Side(HS) ringing below ground, or HS slewing withhigh-speed voltage transitions. Undervoltageprotection is provided on both the low-side andhigh-side drivers.

The MIC4609 is available in a 28-pin wide SOICpackage. The MIC4609 has an operating junctiontemperature range of -40°C to +125°C.

Package TypeMIC4609

28-Pin SOICW

VDD

AHI

ALI

BHI

BLI

CHI

FAULTCLI

ENISNS

COM

RCINVSS

CLO

AHBAHO

BHB

AHS

BHO

NC

NCBHS

CHOCHB

ALO

CHS

15

NC

BLO16

17

18

19

20

21

22

23

24

25

26

27

28

14

13

12

11

10

9

8

7

6

5

4

3

2

1

600V 3-Phase MOSFET/IGBT Driver

Page 2: MIC4609 Data Sheet - Microchip Technologyww1.microchip.com/downloads/en/DeviceDoc/20005531A.pdf · MIC4609 DS20005531A-page 2 2016 Microchip Technology Inc. Functional Block Diagram

MIC4609

DS20005531A-page 2 2016 Microchip Technology Inc.

Functional Block Diagram MIC4609 – Top Level Circuit

UVLO

Phase A Drive Circuit

AHB

AHS

AHO

ALO

COMCOM

COM

VDD

UVLO

VDD

EN

AHI

ALI

AHI

ALIInput Filter &

Anti-Shoot-Through

VDD

UVLO

Phase B Drive Circuit

BHB

BHS

BHO

BLO

UVLO

VDD

EN

BHI

BLIInput Filter &

Anti-Shoot-Through

Phase C Drive Circuit

CHB

CHS

CHO

CLO

UVLO

VDD

EN

CHI

CLIInput Filter &

Anti-Shoot-Through

COM

COM

ISNS

VISNS

Input Blanking

RCIN

VSS

IRCIN

VRCIN+

+-

+-

UVLO

FAULT

EN

VSS

InputFilterEN

LatchS

R

Q

_Q

VSS

VSS

VSS

VSS

VSS

VSS

VSS

VSS

CHI

CLI

BHI

BLI

Page 3: MIC4609 Data Sheet - Microchip Technologyww1.microchip.com/downloads/en/DeviceDoc/20005531A.pdf · MIC4609 DS20005531A-page 2 2016 Microchip Technology Inc. Functional Block Diagram

2016 Microchip Technology Inc. DS20005531A-page 3

MIC4609Functional Block Diagram MIC4609 – Phase x Drive Circuit

Note: The x in the suffix of a pin name designates any of the three phases, e.g., xHS refers to either AHS,BHS or CHS.

xHB

xHS

xHO

xLO

xHI

xLI

COM

DRIVER

DRIVERUVLO

LEVELSHIFT

VDD

UVLO

EN

R

QS

Q

Page 4: MIC4609 Data Sheet - Microchip Technologyww1.microchip.com/downloads/en/DeviceDoc/20005531A.pdf · MIC4609 DS20005531A-page 2 2016 Microchip Technology Inc. Functional Block Diagram

MIC

4609

DS

20005531A-page 4

2016 M

icrochip Technology Inc.

Typical Application Circuit MIC4609 – 300V, 3-Phase Motor Driver

VDD

BHBBHO

BHS

BLO

VSS

ALI

AHI

Controller

EN

CHBCHOCHS

CLO

BLI

BHI

300V SUPPLY

AHBAHOAHS

ALO

CLI

CHI

FAULT

MIC4609

C1

CDLY

C3

D2R2

D1R1

D3R3

Q1

Q2

Q3

Q4

Q5

Q6

RS

COM

ISNSRCIN

VCC

VDD

C2

Page 5: MIC4609 Data Sheet - Microchip Technologyww1.microchip.com/downloads/en/DeviceDoc/20005531A.pdf · MIC4609 DS20005531A-page 2 2016 Microchip Technology Inc. Functional Block Diagram

2016 Microchip Technology Inc. DS20005531A-page 5

MIC4609

1.0 ELECTRICAL CHARACTERISTICS

Absolute Maximum Ratings †Supply Voltage (VDD, VXHB - VXHS) .................. -0.3V to +25VInput Voltages (VXLI, VXHI, VEN) .......................... -0.3V to VDDVoltage on LO (VXLO) .......................................... -0.3V to VDDVoltage on HO (VXHO) .................................VHS - 0.3V to VHBVoltage on HS .................................................... -5V to +630VVoltage on HB ...............................................................+655VStorage Temperature ...................................-60°C to +150°CESD Rating

HBM ..........................................................................2kVCDM......................................................................1.5 kV

† Notice: Stresses above those listed under “MaximumRatings” may cause permanent damage to the device.This is a stress rating only and functional operation ofthe device at those or any other conditions above thoseindicated in the operational listings of this specificationis not implied. Exposure to maximum rating conditionsfor extended periods may affect device reliability.

Operating Ratings (1)

Supply Voltage (VDD) ....................................... +10V to +20VVoltage on xHS (continuous) ............................. -1V to +600VVoltage on xHS (repetitive transient) ................. -5V to +600VHS Slew Rate .............................................................. 50V/nsVoltage on xHB .............................VXHS + 10V to VXHS + 20V

and/or ........................................VDD - 1V to VDD + 600V Junction Temperature (TJ) ........................... -40°C to +125°CJunction Thermal Resistance (JA).............. -40°C to +125°C

SOIC Wide 28LD ................................................ 53°C/W

Note 1: The device is not guaranteed to functionoutside its operating rating.

AC/DC ELECTRICAL CHARACTERISTICS (Note 1, 2)Electrical Specifications: Unless otherwise indicated, VDD = VxHB = 20V, VEN = 5V, VSS = VxHS = 0V; No load on xLO or xHO, TA = +25°C. Bold values indicate -40°C TJ +125°C.

Parameter Sym. Min. Typ. Max. Unit Conditions

Supply CurrentVDD Quiescent Current IDD — 150 250 µA xLI = xHI = 0V

VDD Shutdown Current IDDSH — 0.1 10 µA EN = 0V with HS = floating or ground

VDD Operating Current IDDO — 240 350 µA f = 20 kHz

Total xHB Quiescent Current IxHB — 81 180 µA xLI = xHI = 0V or xLI = 0V and xHI = 5V

Total xHB Operating Current IxHBO — 600 1500 µA f = 20 kHz

High-Side Leakage Current ILxHB — 1 10 µA VxHB = VxHS = 600V

Input (TTL: xLI, xHI, EN)Low-Level Input Voltage VIL — — 0.8 V

High-Level Input Voltage VIH 2.2 — — V

Input Voltage Hysteresis VHYS — 0.2 — V

Input Pull-Down Resistance RI 100 370 500 k For xLI and xHI only (Note 3)Undervoltage ProtectionVDD Falling Threshold VDDR 7 8 9 V

VDD Threshold Hysteresis VDDH — 0.5 — V

xHB Falling Threshold VxHBR 7 8 9 V

xHB Threshold Hysteresis VxHBH — 0.5 — V

Note 1: Specification for packaged product only.2: The x in the suffix of a pin name designates any of the three phases, e.g., xHS refers to either AHS, BHS

or CHS.3: Enable resistance is typical only and is not production tested.

Page 6: MIC4609 Data Sheet - Microchip Technologyww1.microchip.com/downloads/en/DeviceDoc/20005531A.pdf · MIC4609 DS20005531A-page 2 2016 Microchip Technology Inc. Functional Block Diagram

MIC4609

DS20005531A-page 6 2016 Microchip Technology Inc.

Overcurrent ProtectionRising Overcurrent Threshold VISNS+ 420 520 650 mV

ISNS Pin Blanking Time tISNS_BLK 270 370 470 ns

ISNS-to-Gate Propagation Delay tISNS_PROP 400 650 900 ns

Fault CircuitFault Pin Output Low Voltage VOLF — — 0.8 V VISNS = 1V, IFAULT = 1 mA

Rising VCIN Pin Threshold VRCIN+ — 5 — V

VCIN Hysteresis VRCIN_HYS — 0.6 — V

RCIN Pin Current Source IRCIN 3 5 7 µA VRCIN = 0V

Fault Clear Time tFCL 0.5 1 2 ms CRCIN = 1nF

LO Gate DriverLow-Level Output Voltage VxOLL — 0.5 0.9 V IxLO = 50 mA

High-Level Output Voltage VxOHL — 0.6 0.9 V IxLO = -50 mAVxOHL = VDD - VxLO

Peak Sink Current IxOHL — 1 — A VxLO = 0V

Peak Source Current IxOLL — 1 — A VxLO = 20V

HO Gate DriverLow-Level Output Voltage VxOLH — 0.5 0.9 V IxHO = 50 mA

High-Level Output Voltage VxOHH — 0.6 0.9 V IxHO = -50 mAVxOHH = VxHB - VxHO

Peak Sink Current IxOHH — 1 — A VxHO = 0V

Peak Source Current IxOLH — 1 — A VxHO = 20V

Switching SpecificationsTurn-On Propagation Delay tON 300 600 700 ns CL = 1 nF

Turn-Off Propagation Delay tOFF 300 550 700 ns CL = 1 nF

Turn-On Rise Time tR — 20 60 ns CL = 1 nF

Turn-Off Fall Time tF — 20 60 ns CL = 1 nF

Input Filtering Time tFLTR 200 300 480 ns xLI, xHI, EN

Dead Time tD 200 300 450 ns CL = 1 nF

Delay Matching tDLYM — 50 — ns CL = 1 nF

EN-to-Gate Shutdown Delay tEN_OFF 450 650 750 ns CL = 1 nF

Output Pulse Width Matching tPWN — 50 — ns tPW > 1 µsCL = 1 nF

AC/DC ELECTRICAL CHARACTERISTICS (CONTINUED) (Note 1, 2)Electrical Specifications: Unless otherwise indicated, VDD = VxHB = 20V, VEN = 5V, VSS = VxHS = 0V; No load on xLO or xHO, TA = +25°C. Bold values indicate -40°C TJ +125°C.

Parameter Sym. Min. Typ. Max. Unit Conditions

Note 1: Specification for packaged product only.2: The x in the suffix of a pin name designates any of the three phases, e.g., xHS refers to either AHS, BHS

or CHS.3: Enable resistance is typical only and is not production tested.

Page 7: MIC4609 Data Sheet - Microchip Technologyww1.microchip.com/downloads/en/DeviceDoc/20005531A.pdf · MIC4609 DS20005531A-page 2 2016 Microchip Technology Inc. Functional Block Diagram

2016 Microchip Technology Inc. DS20005531A-page 7

MIC4609

TEMPERATURE CHARACTERISTICSElectrical Specifications: Unless otherwise indicated, all parameters apply with 10V VDD 20V.

Parameters Sym. Min. Typ. Max. Units ConditionsTemperature RangesSpecified Temperature Range (Note 1) TA -40 — +125 °C

Operating Temperature Range TA -40 — +125 °C

Storage Temperature Range TS -60 — +150 °C

Thermal Package ResistancesThermal Resistance, 28LD SOICW JA — 53 — °C/W

Note 1: Operation in this range must not cause TJ to exceed Maximum Junction Temperature (+125°C).

Page 8: MIC4609 Data Sheet - Microchip Technologyww1.microchip.com/downloads/en/DeviceDoc/20005531A.pdf · MIC4609 DS20005531A-page 2 2016 Microchip Technology Inc. Functional Block Diagram

MIC4609

DS20005531A-page 8 2016 Microchip Technology Inc.

2.0 TYPICAL PERFORMANCE CURVES

Note: Unless otherwise indicated, TA = +25°C with 10V VDD 20V.

FIGURE 2-1: VDD Quiescent Current vs. VDD Voltage.

FIGURE 2-2: VDD Quiescent Current vs. Temperature.

FIGURE 2-3: VHB Quiescent Current vs. VHB Voltage.

FIGURE 2-4: VHB Quiescent Current vs. Temperature.

FIGURE 2-5: VDD+HB Shutdown Current vs. Voltage.

FIGURE 2-6: VDD+HB Shutdown Current vs. Temperature.

Note: The graphs and tables provided following this note are a statistical summary based on a limited number ofsamples and are provided for informational purposes only. The performance characteristics listed hereinare not tested or guaranteed. In some graphs or tables, the data presented may be outside the specifiedoperating range (e.g., outside specified power supply range) and therefore outside the warranted range.

0

20

40

60

80

100

120

140

10 11 12 13 14 15 16 17 18 19 20

V DD

Qui

esce

nt C

urre

nt (μ

A)

VDD (V)

-40°C25°C

125°CVHS = GNDEN = VDD

0

20

40

60

80

100

120

140

-50 -25 0 25 50 75 100 125

V DD

Qui

esce

nt C

urre

nt (μ

A)

Temperature (°C)

VDD = 20V

VDD = 10VVDD = 15V

VHS = GNDEN = VDD

0

10

20

30

40

50

10 12 14 16 18 20

V HB

Qui

esce

nt C

urre

nt (μ

A)

VHB (V)

-40°C

25°C

125°C

VHS = GND EN = VDD

0

10

20

30

40

50

-50 -25 0 25 50 75 100 125

V HB

Qui

esce

nt C

urre

nt (μ

A)

Temperature (°C)

VHB = 20V

VHB = 10V

VHB = 14V

VHS = GND EN = VDD

0.001

0.01

0.1

1

10

10 11 12 13 14 15 16 17 18 19 20

V DD

+HB

Shut

dow

n C

urre

nt (μ

A)

VDD+HB (V)

-40°C

25°C

125°C

HI = LI = 0VVHS = FloatingEN = 0VVDD = VHB

0.0001

0.001

0.01

0.1

1

10

-50 -25 0 25 50 75 100 125

V DD

+HB

Shut

dow

n C

urre

nt (μ

A)

Temperature (°C)

VDD = 15V

VDD = 10V

VDD = 20V

HI = LI = 0VVHS = FloatingEN = 0VVDD = VHB

Page 9: MIC4609 Data Sheet - Microchip Technologyww1.microchip.com/downloads/en/DeviceDoc/20005531A.pdf · MIC4609 DS20005531A-page 2 2016 Microchip Technology Inc. Functional Block Diagram

2016 Microchip Technology Inc. DS20005531A-page 9

MIC4609Note: Unless otherwise indicated, TA = +25°C with 10V VDD 20V.

FIGURE 2-7: VDD+HB Shutdown Current vs. Voltage.

FIGURE 2-8: VDD+HB Shutdown Current vs. Temperature.

FIGURE 2-9: VDD Operating Current vs. Frequency.

FIGURE 2-10: VHB Operating Current vs. Frequency – One Phase.

FIGURE 2-11: HO Output Sink ON-Resistance vs. VDD.

FIGURE 2-12: HO Output Sink ON-Resistance vs. Temperature.

0

20

40

60

80

100

120

10 11 12 13 14 15 16 17 18 19 20

V DD

+HB

Shut

dow

n C

urre

nt (μ

A)

VDD+HB (V)

HI = LI = 0VVHS= GNDEN = 0VVDD= VHB

-40ºC

25ºC125ºC

0

20

40

60

80

100

120

-50 -25 0 25 50 75 100 125

V DD

+HB

Shut

dow

n C

urre

nt (μ

A)

Temperature (°C)

VDD = 15V

VDD = 10V

VDD = 20V

HI = LI = 0VVHS = GNDEN = 0VVDD = VHB

020406080

100120140160180200

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20

V DD

Ope

ratin

g C

urre

nt (μ

A)

Frequency (kHz)

-40ºC

25ºC125ºC

VHB = VDDVHS = 0V CL = 0 nF

020406080

100120140160180200

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20

V HB

Ope

ratin

g C

urre

nt (μ

A)

Frequency (kHz)

-40ºC

25ºC

125ºC

VHB = VDDVHS = 0V CL = 0 nF

5

10

15

20

25

10 11 12 13 14 15 16 17 18 19 20

RO

NSi

nk (

Ω)

VDD (V)

-40ºC

25ºC125ºC

IHO = 50 mA VHS = GND EN = VHB = VDD

5

10

15

20

25

-50 -25 0 25 50 75 100 125

RO

NSi

nk (Ω

)

Temperature (°C)

VDD = 20V

VDD = 15V

VDD = 10V

IHO = 50 mA VHS = GND EN = VHB = VDD

Page 10: MIC4609 Data Sheet - Microchip Technologyww1.microchip.com/downloads/en/DeviceDoc/20005531A.pdf · MIC4609 DS20005531A-page 2 2016 Microchip Technology Inc. Functional Block Diagram

MIC4609

DS20005531A-page 10 2016 Microchip Technology Inc.

Note: Unless otherwise indicated, TA = +25°C with 10V VDD 20V.

FIGURE 2-13: LO Output Sink ON-Resistance vs. VDD.

FIGURE 2-14: LO Output Sink ON-Resistance vs. Temperature.

FIGURE 2-15: HO Output Source ON-Resistance vs. VDD.

FIGURE 2-16: HO Output Source ON-Resistance vs. Temperature.

FIGURE 2-17: LO Output Source ON-Resistance vs. VDD.

FIGURE 2-18: LO Output Source ON-Resistance vs. Temperature.

5

10

15

20

25

10 11 12 13 14 15 16 17 18 19 20

RO

NSi

nk (

Ω)

VDD (V)

-40ºC

25ºC

125ºC

ILO = 50 mA VHS = GND EN = VHB = VDD

0

5

10

15

20

25

-50 -25 0 25 50 75 100 125

RO

NSi

nk (Ω

)

Temperature (°C)

VDD = 20V

VDD = 15V

VDD = 10V

ILO = 50 mA VHS = GND EN = VHB = VDD

5

10

15

20

25

10 11 12 13 14 15 16 17 18 19 20

RO

NSo

urce

(Ω)

VDD (V)

-40ºC

25ºC

125ºC

IHO = -50 mA VHS = GND EN = VHB = VDD

0

5

10

15

20

-50 -25 0 25 50 75 100 125

RO

NSo

urce

(Ω)

Temperature (°C)

VDD = 20V

VDD = 15V

VDD = 10V

IHO = -50 mA VHS = GND EN = VHB = VDD

5

10

15

20

25

10 11 12 13 14 15 16 17 18 19 20

RO

NSo

urce

(Ω)

VDD (V)

-40ºC

25ºC

125ºC

ILO = -50 mA VHS = GND EN = VHB = VDD

0

5

10

15

20

25

-50 -25 0 25 50 75 100 125

RO

NSo

urce

(Ω)

Temperature (°C)

VDD = 20V

VDD = 15V

VDD = 10VILO = -50 mA VHS = GND EN = VHB = VDD

Page 11: MIC4609 Data Sheet - Microchip Technologyww1.microchip.com/downloads/en/DeviceDoc/20005531A.pdf · MIC4609 DS20005531A-page 2 2016 Microchip Technology Inc. Functional Block Diagram

2016 Microchip Technology Inc. DS20005531A-page 11

MIC4609Note: Unless otherwise indicated, TA = +25°C with 10V VDD 20V.

FIGURE 2-19: VDD/VHB ULVO vs. Temperature.

FIGURE 2-20: Propagation Delay vs. VDD Voltage.

FIGURE 2-21: Propagation Delay vs. Temperature.

FIGURE 2-22: HO Rise Time vs. VDD Voltage.

FIGURE 2-23: HO Fall Time vs. VDD Voltage.

FIGURE 2-24: LO Rise Time vs. VDD Voltage.

7.4

7.6

7.8

8

8.2

8.4

8.6

8.8

9

-50 -25 0 25 50 75 100 125

UVL

O T

hres

hold

(V)

Temperature (°C)

VxHS = 0V

VHB rising

VHB falling

VDD rising

VDD falling

500520540560580600620640660680700

10 11 12 13 14 15 16 17 18 19 20

Del

ay (n

s)

VDD (V)

HI to HO falling

HI to HO rising

LI to LO rising

LI to LO falling

TA = 25°C VHS = 0V CL = 1 nF

500

550

600

650

700

750

800

-50 -25 0 25 50 75 100 125

Del

ay (n

s)

Temperature (°C)

HI to HO falling HI to HO rising

LI to LO rising

LI to LO falling

VDD = 10V VHS = 0VCL = 1 nF

10152025303540455055606570

10 11 12 13 14 15 16 17 18 19 20

t R(n

s)

VDD (V)

25°C

-40°C

125°C

VHS = 0VCL = 1 nF

10152025303540455055606570

10 11 12 13 14 15 16 17 18 19 20

t F(n

s)

VDD (V)

25°C

-40°C

125°C

VHS = 0VCL = 1 nF

10152025303540455055606570

10 11 12 13 14 15 16 17 18 19 20

t R(n

s)

VDD (V)

25°C

-40°C

125°C

VHS = 0VCL = 1 nF

Page 12: MIC4609 Data Sheet - Microchip Technologyww1.microchip.com/downloads/en/DeviceDoc/20005531A.pdf · MIC4609 DS20005531A-page 2 2016 Microchip Technology Inc. Functional Block Diagram

MIC4609

DS20005531A-page 12 2016 Microchip Technology Inc.

Note: Unless otherwise indicated, TA = +25°C with 10V VDD 20V.

FIGURE 2-25: LO Fall Time vs. VDD Voltage.

FIGURE 2-26: Rise/Fall Time vs. Temperature (VDD = 10V).

FIGURE 2-27: Rise/Fall Time vs. Temperature (VDD = 20V).

FIGURE 2-28: Dead Time vs. VDD Voltage.

FIGURE 2-29: Dead Time vs. Temperature (VDD = 10V).

FIGURE 2-30: Dead Time vs. Temperature (VDD = 20V).

10152025303540455055606570

10 11 12 13 14 15 16 17 18 19 20

t F(n

s)

VDD (V)

25°C

-40°C

125°C

VHS = 0VCL = 1 nF

10152025303540455055606570

-50 -25 0 25 50 75 100 125

t R/t F

(ns)

Temperature (°C)

HO rise

LO rise

HO fall

LO fall

VDD = 10V VHS = 0VCL = 1 nF

10152025303540455055606570

-50 -25 0 25 50 75 100 125

t R/t F

(ns)

Temperature (°C)

HO rise

LO rise

HO fall

LO fall

VDD = 20V VHS = 0VCL = 1 nF

200

250

300

350

400

450

500

10 11 12 13 14 15 16 17 18 19 20

Dea

d Ti

me

(ns)

VDD (V)

LO fall to HO rise

HO fall to LO rise

TA = 25°C VHS = 0V CL = 1 nF

200

250

300

350

400

450

500

-50 -25 0 25 50 75 100 125

Dea

d Ti

me

(ns)

Temperature (°C)

LO fall to HO rise

HO fall to LO rise

VDD = 10V VHS = 0VCL = 1 nF

200

250

300

350

400

450

500

-50 -25 0 25 50 75 100 125

Dea

d Ti

me

(ns)

Temperature (°C)

LO fall to HO rise

HO fall to LO rise

VDD = 20V VHS = 0VCL = 1 nF

Page 13: MIC4609 Data Sheet - Microchip Technologyww1.microchip.com/downloads/en/DeviceDoc/20005531A.pdf · MIC4609 DS20005531A-page 2 2016 Microchip Technology Inc. Functional Block Diagram

2016 Microchip Technology Inc. DS20005531A-page 13

MIC4609Note: Unless otherwise indicated, TA = +25°C with 10V VDD 20V.

FIGURE 2-31: Overcurrent Threshold vs. VDD Voltage.

FIGURE 2-32: Overcurrent Threshold vs. Temperature.

FIGURE 2-33: Overcurrent Propagation Delay vs. VDD Voltage.

FIGURE 2-34: Overcurrent Propagation Delay vs. Temperature.

0.450.455

0.460.465

0.470.475

0.480.485

0.490.495

0.5

10 11 12 13 14 15 16 17 18 19 20

OC

Thr

esho

ld (V

)

VDD (V)

25°C

-40°C

125°C

VHS = 0VCL = 0 nF

0.450.455

0.460.465

0.470.475

0.480.485

0.490.495

0.5

-50 -25 0 25 50 75 100 125

OC

Thr

esho

ld (V

)

Temperature (°C)

VDD = 20V

VDD = 15V

VDD = 10V VHS = 0VCL = 0 nF

560

580

600

620

640

660

680

700

10 11 12 13 14 15 16 17 18 19 20

Prop

agat

ion

Del

ay (n

s)

VDD (V)

25°C

-40°C

125°C

VHS = 0VCL = 0 nF

560

580

600

620

640

660

680

700

-50 -25 0 25 50 75 100 125

Prop

agat

ion

Del

ay (n

s)

Temperature (°C)

VDD = 15V

VDD = 20V

VDD = 10V

VHS = 0VCL = 0 nF

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DS20005531A-page 14 2016 Microchip Technology Inc.

3.0 PIN DESCRIPTIONSThe descriptions of the pins are listed Table 3-1.

TABLE 3-1: PIN FUNCTION TABLE

SOICW-28LD Symbol I/O Description

1 VDD Power Input Supply for Gate DriversDecouple this pin to VSS with a > 2.2 µF capacitor.Connect anode of bootstrap diodes to this pin.

2 AHI IN A-Phase High-Side Drive Input

3 BHI IN B-Phase High-Side Drive Input

4 CHI IN C-Phase High-Side Drive Input

5 ALI IN A-Phase Low-Side Drive Input

6 BLI IN B-Phase Low-Side Drive Input

7 CLI IN C-Phase Low-Side Drive Input

8 FAULT OUT Fault OutputOpen drain asserts low to indicate Overcurrent or VDD Undervoltage condition.

9 ISNS IN Current Sense Input for Overcurrent Shutdown

10 EN IN Enable InputLogic high on the Enable pin results in normal operation.Logic low forces the device to enter Shutdown mode.

11 RCIN OUT Overcurrent Fault Clear Delay PinConnect to an external capacitor to set the fault clear delay.

12 VSS GND Logic Ground Pin

13 COM — Low-Side Driver Return Pin

14 CLO OUT C-Phase Low-Side Drive OutputConnect to the gate of the external low-side power MOSFET or IGBT.

15 BLO OUT B-Phase Low-Side Drive OutputConnect to the gate of the external low-side power MOSFET or IGBT.

16 ALO OUT A-Phase Low-Side Drive OutputConnect to the gate of the external low-side power MOSFET or IGBT.

17, 21, 25 NC — No Connect

18 CHS — C-Phase High-Side Drive Return ConnectionConnect to the emitter or source of the external high-side power device. Connect the bootstrap capacitor between this pin and the CHB pin.

19 CHO OUT C-Phase High-Side Drive OutputConnect to the gate of the external high-side power MOSFET or IGBT.

20 CHB Power C-Phase High-Side Bootstrap SupplyExternal bootstrap capacitor is required.Connect the bootstrap capacitor between this pin and CHS.Connect to the anode of the external bootstrap diode.

22 BHS — B-Phase High-Side Drive Return ConnectionConnect to the emitter or source of the external high-side power device. Connect the bootstrap capacitor between this pin and the BHB pin.

23 BHO OUT B-Phase High-Side Drive OutputConnect to the gate of the external high-side power MOSFET or IGBT.

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MIC4609

24 BHB Power B-Phase High-Side Bootstrap SupplyExternal bootstrap capacitor is required.Connect the bootstrap capacitor between this pin and BHS.Connect to the anode of the external bootstrap diode.

26 AHS — A-Phase High-Side Drive Return ConnectionConnect to the emitter or source of the external high-side power device. Connect the bootstrap capacitor between this pin and the AHB pin.

27 AHO OUT A-Phase High-Side Drive OutputConnect to the gate of the external high-side power MOSFET or IGBT.

28 AHB Power A-Phase High-Side Bootstrap SupplyExternal bootstrap capacitor is required.Connect the bootstrap capacitor between this pin and AHS.Connect to the anode of the external bootstrap diode.

TABLE 3-1: PIN FUNCTION TABLE (CONTINUED)

SOICW-28LD Symbol I/O Description

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MIC4609

DS20005531A-page 16 2016 Microchip Technology Inc.

4.0 FUNCTIONAL DESCRIPTIONThe MIC4609 is a noninverting, 600V three-phaseIGBT/MOSFET driver designed to independently drivesix IGBTs or MOSFETs in a three-phase bridge. TheMIC4609 offers a wide 10V-to-20V VDD operatingsupply range with six independent inputs (TTL or3.3V CMOS compatible).

The driver is comprised of six input buffers withhysteresis, four independent UVLO circuits (threehigh-side monitoring the HB voltage and one low-sidemonitoring the VDD voltage), and six output drivers.The high-side output drivers utilize a high-speedlevel-shifting circuit that is referenced to the HS pin. Anovercurrent protection circuit turns off all outputs duringan overcurrent fault.

4.1 UVLO ProtectionThe UVLO circuits force the driver's outputs low untilthe supply voltage exceeds the UVLO threshold.Hysteresis in the UVLO circuits prevents system noiseand finite circuit impedance from causing chatter duringturn-on.

The UVLO circuits are illustrated in the functional blockdiagrams. The low-side UVLO circuit, Functional BlockDiagram MIC4609 – Phase x Drive Circuit, monitorsthe voltage between the VDD and VSS pins. The circuitkeeps all the drivers off when VDD is less than theUVLO threshold voltage.

The three high-side UVLO circuits, shown in TypicalApplication Circuit MIC4609 – 300V, 3-Phase MotorDriver, monitor the voltage between the xHB and xHSpins. The circuit keeps its respective high-side outputoff when VHB - VHS is less than the UVLO thresholdvoltage.

4.2 Startup and UVLOThe startup sequence is illustrated in Figure 4-1. AsVDD rises above an unspecified threshold, VT, theinternal circuitry becomes active, the FAULT pinasserts low and the UVLO circuitry begins to monitorVDD. When the rising VDD reaches the UVLOthreshold, a current source begins charging the RCINpin's external capacitor until it reaches the RCIN delaythreshold. The output drivers are enabled once theRCIN threshold is reached and the EN pin is assertedhigh.

FIGURE 4-1: Startup and Fault Timing Diagram.

VDD

UVLO Rising Level (VDDR)

FAULT

EN

RCIN

UVLO Falling Level

RCIN Delay Threshold

VD

Dris

esab

ove

V TV

DD

rises

abov

e V

DD

R

UV

LO fa

ll st

arts

RC

IN

UVLO(Internal)

RC

IN ri

ses

abov

e th

resh

old

EN fa

ll sh

uts

dow

n al

l ckt

s.

EN ri

se e

nabl

es

anal

og c

kts.

RC

IN ri

ses

abov

e th

resh

old

V DD

falls

bel

ow

UV

LO

thre

shol

d

Normal Operation

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2016 Microchip Technology Inc. DS20005531A-page 17

MIC4609

4.3 Enable InputsThere is one external Enable pin that controls all threephases. A logic high on the enable pin (EN) allows forstartup of all phases and normal operation. Conversely,when a logic low is applied on the Enable pin, allphases turn off and the device enters a low currentShutdown mode. All outputs (xHO and xLO) are pulledlow when EN is low. The EN pin is internally pulleddown. Leaving the pin open disables the part.

TABLE 4-1: OPERATIONAL TRUTH TABLEULVO (1, 2) Outputs (3, 4)

Condition xHI xLI EN HB ULVO VDD ULVO xHO xLO

Disabled X X L X X L LVDD ULVO X X X X L L LVHB ULVO X L or H H L H L L or H

Switching

H H H H L LH H H L LL H H H H L HH L H H H H LL L H H H L L

Note 1: UVLO = H when VDD > UVLO threshold2: UVLO = L when VDD < UVLO threshold3: xHO and xLO remain low if both xHI and xLI are low when the VDD rises above the UVLO threshold or

when the EN pin is asserted high. Normal switching operation begins when one of the inputs changes state from L to H.

4: Anti-shoot-through circuit prevents a high on both outputs simultaneously.

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4.4 Input StageThe xHI and xLI pins are referenced to the COM pinand have a CMOS/TTL compatible input range. Theinput threshold voltage is independent of theVDD supply. The input pin voltage must not exceed theVDD pin voltage. The voltage state of the input signal(s)does not change the quiescent current draw of thedriver. The input stage block diagram is shown inFigure 4-2.

FIGURE 4-2: Input Stage Block Diagram.

An internal pull-down resistor is connected to thexHI and xLI pins. This pulls the driver output pins low ifthe inputs are disconnected or left floating. A smallamount of hysteresis is programmed into the input toprevent false triggering of the output. In addition, eachinput has a minimum pulse-width filter for additionalnoise immunity protection. The input pulse width mustexceed the tFLTR time before the outputs will changestate. Refer to the Electrical Characteristics table andFigure 4-3 for additional information.

FIGURE 4-3: Minimum Pulse-Width Diagram.

xHI/xLIMin PW Filter

tPW1

tFLTR

tPW

tFLTR

tON

tOFF

xLI, xHI

xLO, xHO

tPW1

tFLTR

tFLTRtPW

tON

tOFF

xLI, xHI

xLO, xHO

tPW

Input and output pulse widths (tPW) are equal

tPW

tPW1 < tFLTR

tPW1 < tFLTR

tPW > tFLTR

tPW > tFLTR

tFLTR

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2016 Microchip Technology Inc. DS20005531A-page 19

MIC46094.5 Dead Time and

Anti-Shoot-Through ProtectionShoot-through occurs when both the high and low-sideIGBTs/MOSFETs of a particular phase are ON at thesame time. The inputs of each phase useanti-shoot-through circuitry to prevent this conditionfrom occurring. If both the HI and LI inputs of a phasego high, both outputs (HO and LO) of that phase go low.

In addition to anti-shoot-through circuitry, a fixed"dead-time" delay is added to the input-to-outputpropagation delay. This allows the IGBTs/MOSFETs ina particular phase to fully turn off before the other turnson.

FIGURE 4-4: Dead Time, Propagation Delay, and Rise/Fall-Time Diagram.

xLI

xLO

xHOtD

tD

xHI

tR tF

VIHVIL

50%

10%

90%

tPW

10%

90%

50%

90%

tOFF

tON

10%

10%

90%

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4.6 Low-Side Driver Output StageThe low-side driver, shown in Figure 4-5, is designed todrive an N-channel MOSFET or IGBT. The driver isreferenced to the COM pin, which can be floating withrespect to ground. The COM reference gives the gatedrive currents a return path without having to flowthrough the current sense resistor.

Low driver impedances allow the externalIGBT/MOSFET to be turned on and off quickly. Therail-to-rail drive capability of the output ensures alow VCE or RDSON from the external power device.

When driving the external IGBT on, the driver's internalP-channel MOSFET is turned on and VDD is applied tothe gate of the external IGBT. To turn off the externalIGBT, the driver's N-channel FET is turned on, whichdischarges the external IGBT's gate.

FIGURE 4-5: Low-Side Driver Block Diagram.

4.7 High-Side Driver and Bootstrap Circuit

The High-Side driver is designed to drive a floatingN-channel FET or IGBT, whose source/emitter terminalis referenced to the HS pin. A simplified diagram of thehigh-side driver section is shown in Figure 4-6.

FIGURE 4-6: High-Side Driver and Bootstrap Circuit Block Diagram.A low-power, high-speed, level-shifting circuit isolatesthe low-side (VSS pin) referenced circuitry from thehigh-side (xHS pin) referenced driver. Power to thehigh-side driver and UVLO circuit is supplied by thebootstrap capacitor (CB) while the voltage level of thexHS pin is shifted high.

The bootstrap circuit consists of an external diode,DBST, and an external capacitor, CB. In a typicalapplication, such as the motor driver shown inFigure 4-7 (Phase A illustrated only), the AHS pin is atground potential while the low-side MOSFET is ON.The internal diode charges capacitor CB to VDD - VFduring this time (where VF is the forward voltage dropof the internal diode). After the low-side MOSFET isturned off and the AHO pin turns on, the voltage acrosscapacitor CB is applied to the gate of the high-sideexternal MOSFET. As the high-side MOSFET turns on,voltage on the AHS pin rises with the source of thehigh-side MOSFET until it reaches VDD. As the AHSand AHB pins rise, the internal diode is reverse biased,preventing capacitor CB from discharging. During thistime, the high-side MOSFET is kept ON by the voltageacross capacitor CB.

COM

VDD

xLO

xHS Node

RG

xHS

xHB

xHO

VDDCB

HV

RG

RHSDCLAMP

DBST

Level Shift

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MIC4609

FIGURE 4-7: MIC4609 Motor Driver Typical Application – Phase A.

4.8 Overcurrent Protection CircuitryThe MIC4609 provides overcurrent protection for the3-phase bridge. It consists of:

• a comparator that senses the voltage across a current-sense resistor

• a latch and timer that keep all gate drivers off during a fault

• an open-drain FAULT pin that pulls low during the fault.

Figure 4-8 illustrates the overcurrent protectionsequence. When an overcurrent condition is detected,the FAULT pin is pulled low and a latch disables thegate drive outputs for a time determined by the RCINpin capacitor. After the delay circuit times out, the latchis reset, the FAULT pin is deasserted to a highimpedance state and the gate drive outputs arere-enabled.

AHS

AHB

AHO

VDD

CB

ALO

Levelshift

HI

LI

COM

VIN

CVDD

RG

RG

RHS

DCLAMP

DBST

VSS

Phase B

MPhase A

Phase C

RSNS

VIN

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FIGURE 4-8: Overcurrent Fault Sequence.

4.8.1 ISNSThe ISNS pin may be used to monitor motor windingcurrents. The measurement is referenced to theVSS pin and can sense the voltage across a low-sidecurrent sense resistor or it may be connected to acurrent sense transformer. The current sense resistoris typically connected between the source pins(MOSFET) or emitter pins (IGBT) of all three low-sideswitches and power ground.

If the peak voltage on the ISNS pin exceeds the VISNSthreshold, it will cause all six outputs to latch off. Ablanking circuit on the ISNS comparator outputprevents noise from falsely tripping the overcurrentcircuit. The ISNS pin is internally pulled down to VSSbut may be externally connected to VSS ground forimproved noise immunity if the overcurrent feature isnot used.

4.8.2 RCINA capacitor connected to the RCIN pin determines theamount of time the gate drive outputs are latched offbefore they can be restarted.

During normal operation, the RCIN pin is internallypulled low. Once an overcurrent condition is detected,the RCIN pin capacitor is charged up by an internalcurrent source until the voltage reaches theVRCIN+ threshold and the latch is reset. The outputs arethen enabled.

The delay time can be approximated by applyingEquation 4-1.

EQUATION 4-1:

4.8.3 FAULTThis open-drain output is asserted low for anovercurrent condition or when the VDD voltage is belowthe UVLO threshold. It will de-assert to ahigh-impedance state once the VDD rises above theUVLO threshold or when the RCIN pin voltage hasreached the VRCIN+ threshold. During normaloperation, the internal pull-down MOSFET of the pin ishigh impedance. A pull-up resistor must be connectedto this pin.

FAULT

RCIN Threshold

ISNS Threshold

BlankingTime

ISNS

RCINNormal

OperationNormal

OperationIS

NS

falls

be

low

thre

shol

d

OC Fault

tDLYCRCIN VRCIN+

IRCIN-----------------------------------------=

Where:CRCIN = External capacitance on the RCIN pinIRCIN = RCIN pin current source

(typically 0.44 µA)VRCIN+ = Internal comparator threshold

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MIC4609

5.0 APPLICATION INFORMATION

5.1 Bootstrap CircuitThe high-side gate drive cannot be operatedcontinuously (100% duty cycle). It must be periodicallyturned off to refresh/recharge the bootstrap capacitor,CB. There are two separate requirements to considerwhen choosing the bootstrap capacitor value:

• IGBT or MOSFET gate charge• Duration of the high-side switch on-time

The high-side bootstrap circuit for Phase A is illustratedin Figure 5-1.

FIGURE 5-1: MIC4609 – Bootstrap Circuit.The bootstrap capacitor voltage drops each time itdelivers charge to turn on the IGBT. The voltage dropdepends on the gate charge required by the IGBT. MostIGBT and MOSFET specifications contain gate chargeversus VGE or VGS voltage information or graphs.Based on this information and a recommended VHB of0.1V to 0.5V, the minimum value of bootstrapcapacitance is calculated by applying Equation 5-1.

EQUATION 5-1:

After the high-side switch has turned on, the bootstrapcapacitor will continue to discharge due to leakagecurrents in the bootstrap capacitor, the IGBT/MOSFETgate-to-source and the driver (HS-pin-to-groundleakage).

Typical leakage currents for the bootstrap capacitorand IGBT/MOSFET are in the 100 nA range. TheMIC4609 HS-pin-to-driver leakage current is generallyhigher with typical values in the 1 µA range (or higherat high junction temperature and voltage). Theminimum value of bootstrap capacitor that prevents anexcessive drop in the gate drive voltage to thehigh-side switch is calculated as per Equation 5-2.

EQUATION 5-2:

Resistors RHB and RCB can be used to reduce the peakCB charge current or modify the high-sideIGBT/MOSFET turn-on time. This helps reduce noiseand EMI as well as ripple on the VDD pin.

The resistor in series with the HB pin, RHB, controls theturn-on time of the high-side switch by limiting thecharge current into the gate.

Adding a resistor in series with capacitor CB will reducethe peak charging current drawn through diode DBST. Ithas some effect on slowing down the high-side switchturn-on time, however, it is not as effective as resistorRHB since charging current also comes from VDD untilthe high-side switch starts to turn on and raise thevoltage on the HB node.

5.2 HS Node ClampA resistor/diode clamp between the switching node andthe HS pin is recommended to minimize large negativeglitches or pulses on the HS pin.

As shown in Figure 5-2, the high-side and low-sideIGBTs turn on and off to regulate motor speed. Duringthe on-time, when the high-side IGBT is conducting,current flows into the motor. After the high-side IGBTturns off, and before the low-side IGBT turns on, thereis a brief period of time (dead time) that prevents bothIGBTs from being ON at the same time. During thedead time, current from the motor flows through thediode in parallel with the low-side IGBT. Depending onthe diode characteristics (VF and turn-on time), themotor current and circuit parasitics, the initial negativevoltage on the switch node can be several volts ormore.

Even though the HS pin is rated for negative voltage, itis good practice to clamp the HS pin with a resistor anddiode to prevent excessive negative voltage fromdamaging the driver. Depending on the application and

AHS

AHB

AHO

VDD

CB

ALO

AHI

ALI

COM

VIN

RG

RG

RHS

DCLAMP

DBST

CVDD *RCB*RHB

* Optional Components

Levelshift

CBQGATEVHB-----------------

Where:QGATE = Total gate charge at VHBVHB = Voltage drop at the HB pin

Where:tON = Maximum ON-time of the high-side

switchVHB = Voltage drop at the HB pin

Idischarge = Total discharge current at the HB pin (capacitor, IGBT/MOSFET, and HB pin)

CBtON Idischarge

VHB-----------------------------------

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MIC4609

DS20005531A-page 24 2016 Microchip Technology Inc.

amount of negative voltage on the switch node, a 1Afast recovery diode and a minimum 10 resistor arerecommended. A higher current diode and/or largervalues of resistance can be used if necessary.

Adding a series resistor in the switch node limits thepeak high-side driver current, which affects theswitching speed of the high-side driver. The resistor, inseries with the HO pin, may be reduced to helpcompensate for the extra HS pin resistance.

FIGURE 5-2: Negative HS Pin Voltage.

5.3 Power Dissipation ConsiderationsPower dissipation in the driver can be separated intotwo areas:

• Gate driver dissipation• Quiescent current dissipation used to supply the

internal logic and control functions

5.3.1 GATE DRIVER POWER DISSIPATION

Power dissipation in the output driver stage is mainlycaused by charging and discharging thegate-to-emitter and gate-to-collector capacitance of theexternal IGBT. Figure 5-3 shows a simplified equivalentcircuit of the MIC4609 driving an externalhigh-side IGBT.

FIGURE 5-3: MIC4609 High-Side Driving an External IGBT.

5.3.2 DISSIPATION DURING THE EXTERNAL IGBT/MOSFET TURN-ON

Energy from capacitor CB is used to charge up the inputcapacitance of the IGBT (CGE and CGC). The energydelivered to the gate is dissipated in the three resistivecomponents, RON, RG and RG_INT. RG is the seriesresistor between the driver output and the IGBT. RG_INTis the gate resistance of the IGBT. RG_INT is usuallylisted in the IGBT or MOSFET specifications. The ESRof capacitor CB and the resistance of the connectingetch can be ignored since they are much less than RONand RG_INT.

The effective capacitances of CGE and CGC are difficultto calculate because they vary nonlinearly with IC, VGE,and VCE. Most power IGBT and MOSFETspecifications include a graph of total gate chargeversus VGE. Figure 5-4 shows a typical gate chargecurve for an arbitrary IGBT. The chart shows that for agate voltage of 12V, the IGBT requires 12 nC of charge.

FIGURE 5-4: Typical Gate Charge vs. VGE.

AHS

AHB

AHO

VDD

CB

ALO

Levelshift

AHI

ALI

COM

VIN

CVDD

M

RG

RG

RHS

DCLAMP

DBST

VNEG

10W

AHS

AHB

AHO

ExternalIGBTVDD

CB

RG RG_INT

RON

ROFF

CGC

CGE

VIN

RHSDCLAMP

DBST

0

4

8

12

16

20

0 4 8 12 16

V GE,

Gat

e-to

-Em

itter

Vol

tage

(V

)

QG, Total Gate Charge (nC)

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2016 Microchip Technology Inc. DS20005531A-page 25

MIC4609The power dissipated by the resistive components ofthe gate drive circuit during turn-on is calculated asshown in Equation 5-3.

EQUATION 5-3:

The power dissipated by each of the internal gatedrivers (high-side or low-side) is equal to the ratio ofRON and ROFF to the external resistive losses in RGand RG_INT.

Letting RON = ROFF, the power dissipated in theindividual driver output in the IC is calculated as shownin Equation 5-4:

EQUATION 5-4:

The total power dissipated in the MIC4609, due toswitching, is equal to the sum of all six driverdissipations.

5.3.3 SUPPLY CURRENT POWER DISSIPATION

Power is dissipated in the MIC4609 even if nothing isbeing driven. The supply current is drawn by the biasfor the internal circuitry, the level shifting circuitry, andshoot-through current in the output drivers. The supplycurrent is proportional to the operating frequency andthe VDD and VHB voltages. Figures 2-9 and 2-10 showhow supply current varies with switching frequency andsupply voltage.

The power dissipated by the MIC4609 due to supplycurrent is calculated by applying Equation 5-5.

EQUATION 5-5:

5.3.4 TOTAL POWER DISSIPATION AND THERMAL CONSIDERATIONS

Total power dissipation in the MIC4609 is equal to thepower dissipation caused by driving the external IGBTsand the supply current. Equation 5-6 shows thisrelation.

EQUATION 5-6:

The die temperature can be calculated after the totalpower dissipation is determined as shown inEquation 5-7.

EQUATION 5-7:

Where:PDRIVER

(1) = Average drive circuit power due to switching

QG = Total gate charge at VGEVGE = Gate-to-emitter voltage on the

IGBTfS = Switching frequency of the gate

drive circuitD (2) = Operating duty cycle of the driver

outputNote 1: PDRIVER is the power dissipated by the

individual driver for one of the six gate drive outputs.

2: Operating duty cycle is the percentage of time that particular driver output is switching during one rotation of the motor.

PDRIVER QG VGE fS D=PDISS PDRIVER

RONRON RG RG_INT+ +-------------------------------------------------=

PDISS_SUPPLY VDD IDD V HB IHB=

PDISS_TOTAL PDISS_SUPPLY PDISS_DRIVERS+=

TJ TA PDISS_TOTAL JA+=

Where:TA = Maximum ambient temperature (°C)TJ = Junction temperature (°C)

PDISS_TOTAL = MIC4609 power dissipation (W)JA = Thermal resistance from

junction-to-ambient air (°C/W)

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5.3.5 OTHER TIMING CONSIDERATIONSMake sure the input signal pulse width is greater thanthe minimum specified pulse width. An input signal thatis less than the minimum pulse width may result in nooutput pulse or an output pulse whose width issignificantly less than the input.

The maximum duty cycle (ratio of high-side on-time toswitching period) is controlled by the minimum pulsewidth of the low side and by the time required for the CBcapacitors to charge during the off-time. Adequate timemust be allowed for the CB capacitor to charge upbefore the high-side driver is turned on.

5.4 Decoupling Capacitor SelectionDecoupling capacitors are required on the VDD pin tosupply the charge necessary to drive the externalIGBTs or MOSFETs and also to minimize the voltageripple on these pins. The VDD pin decoupling capacitorsupplies the transient current for all six drivers(three high-side and three low-side). The minimumrecommended VDD capacitance should be greater thanthe sum of all three CB capacitors with a minimum 1 µFceramic capacitor regardless of CB value.

Ceramic capacitors are recommended because of theirlow impedance and small size. Z5U-type ceramiccapacitor dielectrics should not be used due to thelarge change in capacitance over temperature andvoltage. Larger IGBTs/MOSFETs and low-switchingfrequencies may require larger capacitance values forproper operation. The voltage rating of the capacitorsdepends on the supply voltage, ambient temperatureand the voltage derating used for reliability.25V-rated X5R or X7R ceramic capacitors arerecommended for most applications. The minimumcapacitance value should be increased if low voltagecapacitors are used because even good qualitydielectric capacitors, such as X5R, will lose 40% to70% of their capacitance value at the rated voltage.

Placement of the decoupling capacitors is critical. Thebypass capacitor for VDD should be placed as close aspossible between the VDD pin and the ground plane.The bypass capacitor (CB) for the HB supply pin mustbe located as close as possible between the HB andHS pins. The etch connections must be short, wide,and direct. The use of a ground plane to minimizeconnection impedance is recommended.

5.5 Grounding, Component Placement and Circuit Layout

Nanosecond switching speeds and high-peak currentsin and around the MIC4609 driver requires properplacement and trace routing of all components.Improper placement may cause degraded noiseimmunity, false switching, excessive ringing, or circuitlatch-up.

Figure 5-5 shows the critical current paths when thedriver outputs go high and turn on the external IGBTs.It also helps demonstrate the need for a low impedanceground plane. Charge needed to turn on the IGBTgates comes from the decoupling capacitors CVDD andCB. Current in the low-side gate driver flows from CVDDthrough the internal driver, into the IGBT gate, and outthe emitter. The return connection back to thedecoupling capacitor is made through the groundplane. Any inductance or resistance in the groundreturn path causes a voltage spike or ringing to appearon the emitter of the IGBT. This voltage works againstthe gate drive voltage and can either slow down or turnoff the IGBT during the period when it should be turnedon.

Current in the high-side driver is sourced fromcapacitor CB and flows into the HB pin and out the HOpin, into the gate of the high-side IGBT. The return pathfor the current is from the emitter of the IGBT and backto capacitor CB. The high-side circuit return pathusually does not have a low-impedance ground planeso the etch connections in this critical path should beshort and wide to minimize parasitic inductance. Aswith the low-side circuit, impedance between theIGBT emitter and the decoupling capacitor causesnegative voltage feedback that fights the turn-on of theIGBT.

It is important to note that capacitor CB must be placedclose to the HB and HS pins. This capacitor not onlyprovides the current for turn-on but it must also keepHB pin noise and ripple low for proper operation of thehigh-side drive circuitry.

FIGURE 5-5: Turn-On Current Paths.

xHS

xHB

xHO

VDD

CB

xHI

xLI

VSS

xLO

CVDD

GND plane

GNDplane

LOW-SIDE DRIVE TURN-ON CURRENT PATH

HIGH-SIDE DRIVE TURN-ON CURRENT PATH

VIN

HS Node

Levelshift

HS Node

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2016 Microchip Technology Inc. DS20005531A-page 27

MIC4609Figure 5-5 shows the critical current paths when thedriver outputs go low and turn off the external IGBTs.Short, low-impedance connections are importantduring turn-off for the same reasons given in theturn-on explanation. Current flowing through theinternal diode replenishes charge in the bootstrapcapacitor, CB.

FIGURE 5-6: Turn-Off Current Paths.It is highly recommended to use a ground plane tominimize parasitic inductance and impedance of thereturn paths. The MIC4609 is capable of greater than1A peak currents and any impedance between theMIC4609, the decoupling capacitors, and the externalIGBTs/MOSFETs will degrade the performance of thedriver.

xHS

xHB

xHO

VDD

CB

xHI

xLI

VSS

xLO

CVDD

GNDplane

GNDplane

VIN

HS Node

Levelshift

LOW-SIDE DRIVE TURN-OFF CURRENT PATH

HIGH-SIDE DRIVE TURN-OFF CURRENT PATH

HS Node

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6.0 PACKAGING INFORMATION

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MIC4609

APPENDIX A: REVISION HISTORY

Revision A (March 2016)• Original release of this document.

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NOTES:

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2016 Microchip Technology Inc. DS20005531A-page 31

MIC4609

PRODUCT IDENTIFICATION SYSTEMTo order or obtain information, e.g., on pricing or delivery, refer to the factory or the listed sales office.

Device: MIC4609: 600V 3-Phase MOSFET/IGBT Driver

Lead Finish: Y = Pb-Free with Industrial Temperature Grade

Package Code: WM = Plastic Small Outline, 7.52 mm Body, 28-Lead SOIC Wide Package

PART NO. X XX

Package CodeLead FinishDevice

Examples: a) MIC4609YWM-TR: 600V 3-Phase MOSFET/IGBT Driver,

7.52 mm body,28LD SOIC Wide package,Tape and Reel

–X (1)

Tape and Reel Option

Note 1: Tape and Reel identifier only appears in the catalog part number description. This identifier is used for ordering purposes and is not printed on the device package. Check with your Microchip Sales Office for package availability with the Tape and Reel option.

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NOTES:

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2016 Microchip Technology Inc. DS20005531A-page 33

Information contained in this publication regarding deviceapplications and the like is provided only for your convenienceand may be superseded by updates. It is your responsibility toensure that your application meets with your specifications.MICROCHIP MAKES NO REPRESENTATIONS ORWARRANTIES OF ANY KIND WHETHER EXPRESS ORIMPLIED, WRITTEN OR ORAL, STATUTORY OROTHERWISE, RELATED TO THE INFORMATION,INCLUDING BUT NOT LIMITED TO ITS CONDITION,QUALITY, PERFORMANCE, MERCHANTABILITY ORFITNESS FOR PURPOSE. Microchip disclaims all liabilityarising from this information and its use. Use of Microchipdevices in life support and/or safety applications is entirely atthe buyer’s risk, and the buyer agrees to defend, indemnify andhold harmless Microchip from any and all damages, claims,suits, or expenses resulting from such use. No licenses areconveyed, implicitly or otherwise, under any Microchipintellectual property rights unless otherwise stated.

Trademarks

The Microchip name and logo, the Microchip logo, AnyRate, dsPIC, FlashFlex, flexPWR, Heldo, JukeBlox, KeeLoq, KeeLoq logo, Kleer, LANCheck, LINK MD, MediaLB, MOST, MOST logo, MPLAB, OptoLyzer, PIC, PICSTART, PIC32 logo, RightTouch, SpyNIC, SST, SST Logo, SuperFlash and UNI/O are registered trademarks of Microchip Technology Incorporated in the U.S.A. and other countries.

ClockWorks, The Embedded Control Solutions Company, ETHERSYNCH, Hyper Speed Control, HyperLight Load, IntelliMOS, mTouch, Precision Edge, and QUIET-WIRE are registered trademarks of Microchip Technology Incorporated in the U.S.A.

Analog-for-the-Digital Age, Any Capacitor, AnyIn, AnyOut, BodyCom, chipKIT, chipKIT logo, CodeGuard, dsPICDEM, dsPICDEM.net, Dynamic Average Matching, DAM, ECAN, EtherGREEN, In-Circuit Serial Programming, ICSP, Inter-Chip Connectivity, JitterBlocker, KleerNet, KleerNet logo, MiWi, motorBench, MPASM, MPF, MPLAB Certified logo, MPLIB, MPLINK, MultiTRAK, NetDetach, Omniscient Code Generation, PICDEM, PICDEM.net, PICkit, PICtail, PureSilicon, RightTouch logo, REAL ICE, Ripple Blocker, Serial Quad I/O, SQI, SuperSwitcher, SuperSwitcher II, Total Endurance, TSHARC, USBCheck, VariSense, ViewSpan, WiperLock, Wireless DNA, and ZENA are trademarks of Microchip Technology Incorporated in the U.S.A. and other countries.

SQTP is a service mark of Microchip Technology Incorporated in the U.S.A.

Silicon Storage Technology is a registered trademark of Microchip Technology Inc. in other countries.

GestIC is a registered trademarks of Microchip Technology Germany II GmbH & Co. KG, a subsidiary of Microchip Technology Inc., in other countries.

All other trademarks mentioned herein are property of their respective companies.

© 2016, Microchip Technology Incorporated, Printed in the U.S.A., All Rights Reserved.

ISBN: 978-1-5224-0438-5

Note the following details of the code protection feature on Microchip devices:• Microchip products meet the specification contained in their particular Microchip Data Sheet.

• Microchip believes that its family of products is one of the most secure families of its kind on the market today, when used in the intended manner and under normal conditions.

• There are dishonest and possibly illegal methods used to breach the code protection feature. All of these methods, to our knowledge, require using the Microchip products in a manner outside the operating specifications contained in Microchip’s Data Sheets. Most likely, the person doing so is engaged in theft of intellectual property.

• Microchip is willing to work with the customer who is concerned about the integrity of their code.

• Neither Microchip nor any other semiconductor manufacturer can guarantee the security of their code. Code protection does not mean that we are guaranteeing the product as “unbreakable.”

Code protection is constantly evolving. We at Microchip are committed to continuously improving the code protection features of ourproducts. Attempts to break Microchip’s code protection feature may be a violation of the Digital Millennium Copyright Act. If such actsallow unauthorized access to your software or other copyrighted work, you may have a right to sue for relief under that Act.

Microchip received ISO/TS-16949:2009 certification for its worldwide headquarters, design and wafer fabrication facilities in Chandler and Tempe, Arizona; Gresham, Oregon and design centers in California and India. The Company’s quality system processes and procedures are for its PIC® MCUs and dsPIC® DSCs, KEELOQ® code hopping devices, Serial EEPROMs, microperipherals, nonvolatile memory and analog products. In addition, Microchip’s quality system for the design and manufacture of development systems is ISO 9001:2000 certified.

QUALITY MANAGEMENT SYSTEM CERTIFIED BY DNV

== ISO/TS 16949 ==

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