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MEMSMTODARPADARPA
Piezoelectric MEMS Resonator Measurement and Characterization
April 6, 2004
Joung-Mo Kang, David Carter, Doug White, and Amy DuwelThe Charles Stark Draper Laboratory
MEMSMTODARPADARPA
Presentation Overview
1. Background and device models
2. Filter design
3. L-Bar measurements
4. Parasitic investigations
5. Conclusion
MEMSMTODARPADARPA
Device Overview and Goals
Desired: a high performance RF channel-select filter bank on a chip — 0.3-3 GHz frequencies — high selectivity high Q— compatible with silicon IC technologies— small size high density— low loss— device characteristics defined by lateral geometry
18 x 5.5 m bar with 3.5 m tethers10 x 5 m bar with 1 m tethers
MEMSMTODARPADARPA
Device Structure
resonator
Ctethers
Circuit Model
MEMSMTODARPADARPA
Longitudinal Resonance
Longitudinal Mode Shape• tethers placed at displacement node
• longitudinal displacement amplitude on the order of nm
• other types of mechanical resonances cancel out in charge at lower frequencies
MEMSMTODARPADARPA
Butterworth Van-Dyke Model
MEMSMTODARPADARPA
R C L
C0
wlC z
t0
28we
ltL
2
28
tc
lweC
28we
c
Q
tR
MEMSMTODARPADARPA
BVD Impedance Function
860 865 870 875 880 885 890 895 900 905 91010
2
104
106
108
Impe
danc
e M
agni
tude
(
)
860 865 870 875 880 885 890 895 900 905 910-90
-45
0
45
90
Impe
danc
e P
hase
(de
gree
s)
l = 5.5 m
w = 3.0 m
t = 0.5 m
Q = 10,000
L = 342 H
C = 0.096 fF
R = 189
C0 = 2.98 fF
MEMSMTODARPADARPA
Filter Design
• Review existing crystal filter topologies and assess performance metrics.
• Down-select a filter topology based on specifications set by RF group.
• Define fabrication requirements and tolerances to achieve desired performance with each topology
Primary Objectives:
MEMSMTODARPADARPA
Dual Resonator Ladder
VinVoutRL
RS
Zp
Zs
-35
-30
-25
-20
-15
-10
-5
Mag
nitu
de (
dB)
-35
-30
-25
-20
-15
-10
-5
Mag
nitu
de (
dB)
Dual Resonator Ladder Filter Response
740 760 780 800 820 840 860Frequency (MHz)
740 760 780 800 820 840 860Frequency (MHz)
-90
0
90
Pha
se (
degr
ees)
-90
0
90
Pha
se (
degr
ees)
MEMSMTODARPADARPA
Lattice Filter
Vin VoutR
R
Zb
Za
Zb
Za
Impedance of Za and Zb
ZaZb
Full filter response
wa wb
MEMSMTODARPADARPA
Lattice Filter
Lattice Filter Response
-30
-25
-20
-15
-10
-5
Mag
nitu
de (
dB)
-30
-25
-20
-15
-10
-5
Mag
nitu
de (
dB)
-270
-180
-90
0
90
Pha
se (
degr
ees)
-270
-180
-90
0
90
Pha
se (
degr
ees)
775 780 785 790 795 800 805 810 815 820 825 830Frequency (MHz)
775 780 785 790 795 800 805 810 815 820 825 830Frequency (MHz)
MEMSMTODARPADARPA
Simple Ladder Filter
Vin C12RL
RS
Z=sL+1/sC Z=sL+1/sC
Vout
102 103 104 105 106
-140
-120
-100
-80
-60
-40
-20
Frequency (MHz)
Magnitude (dB)
Simple Ladder Filter Response
-35
-30
-25
-20
-15
-10
-5
Mag
nitu
de (
dB)
-270
-180
-90
0
90
Pha
se (
degr
ees)
-35
-30
-25
-20
-15
-10
-5
Mag
nitu
de (
dB)
-270
-180
-90
0
90
Pha
se (
degr
ees)
798 799 800 801 802Frequency (MHz)
798 799 800 801 802Frequency (MHz)
Wideband Response
MEMSMTODARPADARPA
Simple Ladder Filter
797.5 798 798.5 799 799.5 800 800.5 801 801.5 802 802.5
-30
-20
-10
0
Filt
er T
rans
mis
sion
(dB
)
data1
data2
data3
797.5 798 798.5 799 799.5 800 800.5 801 801.5 802 802.5-270
-180
-90
0
90
Pha
se (
degr
ees)
no mismatch
0.1 %
0.3 %
Effect of bar length mismatch on filter characteristic
Nominal values:
l = 6.04 mw = 3.22 mt = 0.5 m
RS, RL = 1758 C12 = 113.2 fF
MEMSMTODARPADARPA
Vin
Vout
RS
RL
C12
Vin
RS
Vout
RL
C12
Mechanically Coupled Devices
MEMSMTODARPADARPA
Device Measurement
• Confirm successful operation of resonators and accuracy of the analytic model (f vs. l, spurious modes)
• Fit measurements to a discrete circuit model, adjust model if necessary, and extract resonator parameters (ie, determine resonator Q)
• Use resonator performance results and analysis of parasitics to guide process and design improvements
Primary Objectives:
MEMSMTODARPADARPA
Device Measurement
Device (GSG configuration)
5 m
3 m
~800 MHz resonator structure
C
Co
L R
RL
RS
MEMSMTODARPADARPA
First Round DevicesLongitudinal axis
AlN
contactcontact
C
Co
L R
RL
Rs
Cthru
S21
(dB
)
100
50
675 800 MHz 925
0
Cthru=0
Cthru=2pF
5 m Bar, Q=104
30
20
10
140 160 MHz 180
Cthru=2pF
25 m Bar, Q=103
S21
(dB
)
MEMSMTODARPADARPA
First Round L-Bar Resonance
-16
-15.9
-15.8
-15.7
-15.6
-15.5
69
70
71
72
73
146 150147 149148
Frequency (MHz)
Pha
se (
degr
ees)
S21
(dB
)
Cthru ~ 2 pF
MEMSMTODARPADARPA
Measurement Results
0.02 0.04 0.06 0.08 0.1 0.12 0.14 0.16 0.18 0.2
200
400
600
800
1 / m
Freq
uenc
y (M
Hz)
~ 3.8 GHz - m
12
E
=
-21
-20
-19
-18
-17
-16
-15
120 130 140 150 160
Frequency (MHz)
S21
(dB
)
30 m bar
25 m bar
Fundamental Length Resonances
Fundamental Width Resonances
-9
-8
-7
-6
600 700 800 900
Frequency (MHz)
MEMSMTODARPADARPA
Second Round L-Bar
-80
-70
-60
-50
-40S
21 M
agni
tude
(dB
)
100 200 300 400 500 600 700 800 900 100060
70
80
90
100
110
Pha
se (
degr
ees)
Frequency (MHz)
10 m x 5 m device showing length and width modes
MEMSMTODARPADARPA
Fit to ModelS21 data from 10m x 5m device
Parasitics modeled as port capacitance and resistance
BVD circuit parameters
•R= 35 k•L= 1 mH•C=0.047 fF•C0=12.7 fF •Q of ~125
MEMSMTODARPADARPA
Metal-Oxide-Silicon Structures
0 100 200 300 400 500 600 700 800 900 1000-100
-80
-60
-40
-20
0
S2
1 M
ag
nitu
de
(d
B)
0 100 200 300 400 500 600 700 800 900 1000-200
-100
0
100
200
Ph
ase
(d
eg
ree
s)
Frequency (MHz)
MEMSMTODARPADARPA
Glass Substrate
0 500 1000 1500 2000 2500 3000
-100
-80
-60
OP6 on Glass
S21
Mag
nitu
de (
dB)
0 500 1000 1500 2000 2500 30000
50
100
150
Pha
se (
degr
ees)
Frequency (MHz)
datasimulation
OP6 fit parameters:
- pure open to ground
- 1.43fF thru capacitance
MEMSMTODARPADARPA
Glass Substrate
OP1 fit parameters:
- pure open to ground
- 2.6fF thru capacitance0 500 1000 1500 2000 2500 3000
-100
-80
-60
OP1 on Glass
S21
Mag
nitu
de (
dB)
0 500 1000 1500 2000 2500 30000
50
100
150
Pha
se (
degr
ees)
Frequency (MHz)
datasimulation
MEMSMTODARPADARPA
Conclusions
• Filter designs will be implemented on upcoming mask layout. Mechanically coupled device will be used.
• An accurate model of parasitics is vital for obtaining useful device measurements.
• Ongoing work to define explanation for the 100 MHz resonance on silicon substrate, and the wideband phase noise
MEMSMTODARPADARPA
AcknowledgementsDraper Engineering
Amy Duwel, David Carter, Doug White
Draper FellowsPaul Calhoun, Luke Hohreiter
Draper Program ManagerJames Sitomer
Acknowledgements:Draper: Connie Cardoso, Mert Prince, Mark April,
Mark Mescher and Mathew VargheseMIT: Prof. Charles Sodini
DARPA: Contract # DAAH01-01-C-R204
MEMSMTODARPADARPA
S-parameters
2-port
network
Po
rt 1
Po
rt 2
V1+ V1
- V2- V2
+
jkVV
V
kj
i
i j
,0
S
MEMSMTODARPADARPA
Z-parameters
2-port
network
Po
rt 1
Po
rt 2
I1 I2 +
V1
-
+
V2
-
V1 = Z11I1 + Z12I2
V2 = Z21I1 + Z22I2
MEMSMTODARPADARPA
Two-port model
Zb
Zc Za
cba
cba11 ZZZ
ZZZZ
cba
ca12 ZZZ
ZZZ
cba
bac22 ZZZ
ZZZZ
1222a
Z-Z
ZZ
12b
Z
ZZ
1211c
Z-Z
ZZ Z = Z11Z22-Z12
2
MEMSMTODARPADARPA
Transformed Zb Impedance Data
1.5 2 2.5 310
0
101
102
103
Zb Magnitude and Phase
Impe
danc
e M
agni
tude
(
)
1.5 2 2.5 3-2
-1
0
1
2
Impe
danc
e P
hase
(ra
dian
s)
Frequency (GHz)
fs fp
|Zs|
|Zp|
LC
1π2
ss fw
0C
C1π2
spp wfw
RRCj1
RZ
0
s
sw
20
220
2
0
pRC
1
RC
RCj-1Z
pp
p
ww
w
MEMSMTODARPADARPA
BVD Model Fitting
0
10
20
30
40
50
60Zb Magnitude and Phase
Impedance Magnitude (dB)
1.5 2 2.5 3-2
-1
0
1
2
Impedance Phase (radians)
Frequency (GHz)
datadatamodel
R = 2.76 , L = 91.6 nH, C = 0.061 pF, C0 = 1.54 pF
MEMSMTODARPADARPA
Filter Design Constraints
• Q assumed to be a function of the process and static• Two degrees of freedom, l and w/t• Resonant frequency fixes l uniquely• For a given frequency, the other degree of freedom
controls the “impedance level”• C/C0 fixed by piezoelectric materials parameters
Constraints placed on equivalent circuit parameters bybar geometry: