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1 THE THIN FILM TECHNOLOGY Subtractive technology: The entire substrate is coated with several layers of material. The unwanted material is removed by a series of selective photoetching processes.

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  • *THE THIN FILM TECHNOLOGY

    Subtractive technology:

    The entire substrate is coated with several layers of material. The unwanted material is removed by a series of selective photoetching processes.

  • *Cross-Section of Thin Film MetallizationNiTaN

  • *Thin Film Circuit

  • *THIN FILM DEPOSITION TECHNOLOGIESVacuum DepositionSputtering - The material is deposited from a target by bombarding the target with charged gas ions in a plasmaEvaporation - The material is deposited by heating it until the vapor pressure is much greater than the surrounding mediumChemical DepositionElectroplating - A thin layer of material is deposited by one of the vacuum deposition processes and plated to thickness by plating in a solution of the material

  • *SPUTTERING

  • *SPUTTERING

    PROCESS SEQUENCESystem is pumped to a high vacuum ( 800 V) between target and substrate (substrate at ground)Potential may be RF or DC

  • *Basic Triode Sputtering SystemSubstrateTargetThickness Monitor

  • *Planetary Sputtering System

  • *Planetary Sputtering System: ChamberTargets (3)

  • *Planetary Sputtering System: Substrate Holding Fixture

  • *Lateral Sputtering SystemVacuumInterlockSputteringChamberControlPanel

  • *EVAPORATIONOccurs when vapor pressure of material exceeds the ambient pressure

    May occur from liquid state or solid state (sublimation)

    Evaporation must take place in a relatively high vacuum (

  • *Melting Points and PV = 10-2 torr Temperatures of Some Common Metals used in Thin Film Applications

    Temperature

    Melting Point

    (oC)

    Temperature at which

    PV = 10-2 torr

    (oC)

    Aluminum

    659

    1220

    Chromium

    1900

    1400

    Copper

    1084

    1260

    Germanium

    940

    1400

    Gold

    1063

    1400

    Iron

    1536

    1480

    Molybdenum

    2620

    2530

    Nickel

    1450

    1530

    Platinum

    1770

    2100

    Silver

    961

    1030

    Tantalum

    3000

    3060

    Tin

    232

    1250

    Titanium

    1700

    1750

    Tungsten

    3380

    3230

  • *Line-of-Sight Process

  • *DISADVANTAGES OF EVAPORATION

    1. It is difficult to evaporate alloys such as NiCr due to the difference between the 10-2 torr temperatures. The element with the lower temperature tends to evaporate somewhat faster, causing the composition of the evaporated film to be different than the composition of the alloy. To achieve a particular film composition, the composition of the melt must contain a higher portion of the material with the higher 10-2 torr temperature and the temperature of the melt must be tightly controlled. By contrast, the composition of a sputtered film is identical to that of the target.

    2. Evaporation is limited to the metals with lower melting points. Refractory metals and ceramics are virtually impossible to deposit by evaporation.

    3. Reactive deposition of nitrides and oxides is very difficult to control.

  • *ELECTROPLATING AND ELECTROLESS PLATINGElectroplatingThe part is connected to a negative potential (cathode) and an anode material (typically stainless steel) is connected to a positive potential.The anode and cathode are immersed in a suitable plating solution.Part must be electrically conductive (may require seed layer predeposited on the the substrate)Electroless platingPart is immersed in a plating solutionDifference in surface potentials generates EMF needed for platingRange of materials is limitedThickness is limitedVery economical for thin plating

  • *

    COMPARISON OF METAL DEPOSITION TECHNIQUES

    PROPERTY

    EVAPORATION

    SPUTTERING

    ELECTROLESS PLATING

    PLATING

    Deposition Rate

    High

    Medium

    Medium

    High

    Control of Deposition

    Sometimes difficult

    Repeatable, easy to control

    Excellent

    Excellent

    Coverage for complex shapes

    Poor

    (line of sight)

    good, but nonuniform thickness

    Excellent

    Excellent

    Step coverage

    Poor

    (line of sight

    Good

    Excellent

    Excellent

    Control of film stress

    Limited control

    High level of control

    Limited control

    Limited control

    Control of Microstructure

    Good level of control

    Good level of control

    Limited control

    Limited control

    Resistivity

    Approaches bulk

    Approaching bulk, but higher than evaporated

    Depends on bath purity and formulation

    Depends on bath purity and formulation

    Adhesion to substrate

    Good

    Excellent

    Good

    Good

    Chemical contamination

    < 10 ppm

    < 100 ppm

    Depends on bath purity and formulation

    Depends on bath purity and formulation

    Selectivity

    No

    No

    Possibly

    Yes

    Uniformity

    System geometry dependent (( 3%)

    Excellent

    (( 3%)

    Pattern sensitive

    Pattern sensitive

    Other advantages

    Best understood of all vacuum processes

    Most versatile

    Simple apparatus

    High aspect ratio attainable

  • *Mask Alignment and Exposure System

  • *Mask and Substrate

  • *AlignmentSplit Beams

  • *UV Exposure

  • *Etching

  • *THIN FILM MATERIALSTwo basic systemsNichrome/Nickel/GoldTantalum Nitride/Titanium-Tungsten/GoldResistor MaterialsNichromeTantalum NitrideBarrier MaterialsNickelTitanium/TungstenConductor MaterialsGoldCopperAluminum

  • *RESISTOR MATERIALS

    Also provide the adhesion to the substrateMust be a material that oxidizesForms as isolated islands, eventually joining at grain boundaries

  • *NichromeAlloy of nickel and chromium (Ni80/Cr20 is typical)Maximum sheet resistance: 400 /Properties highly dependent on annealing scheduleTCR
  • *Tantalum Nitride (TaN, Ta2N)Formed by reactively sputtering tantalum in the presence of nitrogenPassivated by heating in air at 400 oC for several minutesMore stable than nichromeMaximum sheet resistivity - 200 /TCR typically -70 to -120 ppmMay be improved by annealing in a vacuum for several hours or by sputtering in the presence of a trace of oxygen

    Tantalum Oxynitride Films (TaO2N)Formed by adding oxygen to the nitrogen and argonHigher sheet resistivityLower TCR

  • *Design of Thin Film Resistors

    The resistivity of thin films can be held to a close tolerance by controlling the deposition parameters, by the precision of the etching process, and by controlling the stabilization time.

    2.The designer is not limited to simple straight-line patterns. Right angle and meandering patterns are also available.

    3.Line widths down to 0.001" are possible, although 0.002" are more common. This necessitates special design techniques if laser trimming is required.

  • *4. Only a single sheet resistivity is available unless special deposition techniques are used. This necessitates resistors with extremely high or low aspect ratios if high or low values are required.

    5. No termination effects are present, and the sheet resistivity is not a function of the resistor size.

  • *Preliminary Information:

    1.Nominal value of resistor2.Tolerance3.Power dissipation

  • *1. Determine the minimum width from

    where:PD =Power dissipated by the resistors = Sheet resistivity of the film

    PR = Rated power of the resistor = 20 W/in2 for alumina at 25 oC = 40 W/in2 for beryllia at 25 oCR = Nominal value of the resistor

    The width obtained from the equation should be rounded up to the nearest standard width.

  • *

    2.Calculate the number of squares from

    The total effective length of the resistor is

    Resistors deviating from a straight-line path must have allowances made for the corners since the current density tends to increase in these areas. This effect is shown in the next slide assuming L1 > 4W.

  • *

  • *3. Make allowances for tighter tolerances by adding trim pads. The resistance increase capability necessary for precision trimming is shown in the table below.

    Tolerance

    Increase Capability

    1%

    25%

    5%

    20%

    10%

    15%

    15%

    8%

    20%

    0%

    Tolerance vs. Increase Capability

  • *GEOMETRY OF TRIM PADS

  • *

  • *BARRIER MATERIALS

    Nickel layer between nichrome and gold prevents chromium diffusion into the goldImproves wire bondability

    A layer of Ti90/W10 improves adhesion of gold

  • *THIN FILM CONDUCTOR MATERIALS

    PROPERTY

    ALUMINUM

    COPPER

    GOLD

    Resistivity

    2.66 ((-cm

    1.67 ((-cm

    2.35 ((-cm

    Adhesion

    Good

    Ti or Cr

    adhesion layer

    used

    Cr, TaN, or NiCr adhesion layer used

    Deposition

    Sputtering

    Sputtering and plating

    Sputtering and plating

    Corrosion

    Corrodes

    (H2O and Cl)

    Corrodes without barrier layers

    No

    Special Notes

    Easiest to process

    Reacts with polyamic acid -

    Requires barrier layer

    (Ni or Cr)

    More

    expensive

  • *Thin Film Resistor on Silicon

  • *Thin Film Microwave Circuit

  • *Thin Film Active Filter

  • *SUMMARYAdvantagesBetter line definitionSmaller line geometryHigher quality resistorsBetter high frequency performance

    DisadvantagesHigher costMultilayer capability is limitedSingle sheet resistivity

  • *HomeworkDesign the following thin film resistors:Use a film with a sheet resistivity of 200 /1. 50 , 5 %, 20 mw2. 1000 , 1 %, 100 mw3. 2 M , 1 %, 10 mwSelect the pattern, calculate the dimensions, and draw a sketch

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