Incremental Delay Change due to Crosstalk Noise

Lauren Hui Chen

Division of Physical AnalysisAvant! Corporation Fremont, CaliforniaUSA

Malgorzata Marek-Sadowska

Department of Electrical and Computer EngineeringUniversity of California Santa Barbara, California USA

Incremental Delay Change

ddV

ddV5.0

tV1

Victim

Incremental Delay Change

ddV

ddV5.0

tV1

Victim

tV2

Aggressor

peakH peakH

DT

peakt

Incremental Delay Change

ddpeakpeak VtVH 5.01

DTMax

peaktddV

ddV5.0

tV1

tV2

Aggressor

Victim

tV3

Agg.

Vic.

Agg.

Vic.

Temporal Correlation

Under-estimation

Over-estimation

Reality -- Skewed Overlap Existing Method -- Overlap

with skewed-overlap

without skewed-overlap with overlap

with overlap

Temporal Correlation v.s. Incremental Delay Change

Tp

T1 T2

Vp

Ta

Tr

Tm Ta+Tr

Vdd

dd

prdd

dd

prmp V

VTTT

VV

TTT Maximum delay change

dd

prmpm VV

TTTTT 2Intersect with right edge

11 TVV

TTTTVV

TTdd

prmp

dd

prm Intersect with left edge

New Temporal Correlation

tAL tAR

tVL tVR ARVLALVRVA ttttiftt

ddjpraVL

jaVL

jp

jAL

jraVL VVTttTttMaxttTTtt 010020 ,1

ddjpraVR

jaVR

jp

jAL

jraVR VVTttTttMaxttTTtt 010020 ,1

ddjpraVL

jaVL

jp

jAR

jraVL VVTttTttMaxttTTtt 010020 ,1

ddjpraVR

jaVR

jp

jAR

jraVR VVTttTttMaxttTTtt 010020 ,1

New Old

Model Validation

Norminal noise: VoxNorminaldelay: Vov

Change ofDelay: Td

ParameterVp

(volt)Tp

(ps)T1

(ps)T2

(ps)Ta

(ps)Tr

(ps) Sim. Ours

Error(%)

AverageError(%)

Circuit 1 0.65 151 118 142 69 196 44 48 9% 11%

Circuit 2 0.85 220 114 146 48 206 59 66 12% 13%

Circuit 3 0.72 110 147 107 77 181 14 16 14% 17%

Circuit 4 1.08 290 97 131 83 275 122 133 9% 14%