EXTRUDED INSULATION POWER CABLESRATED ABOVE 46 THROUGH 345 KV

StandardICEA S-108-720-2004

Published ByINSULATED CABLE ENGINEERS ASSOCIATION, Inc.

Post Office Box 1568Carrollton, Georgia 30112, U.S.A.

Approved by Insulated Cable Engineers Association, Inc.: June 7,2004Accepted by AEIC: Cable Engineering Committee: February 9,2004Approved by ANSI: May 12, 2005

© Copyright 2004 by the Insulated Cable Engineers Association, Inc. All rightsincluding translation into other languages, reserved under the Universal CopyrightConvention, the Berne Convention for the Protection of Literary and Artistic Works,and the international and Pan American Copyright Conventions.

This Standards Publication for Extruded Insulation Power Cables Rated above 46 to 345 kV (ICEA S-108-720) was developed by the Insulated Cable Engineers Association Inc. (ICEA).

ICEA standards are adopted in the pUblic interest and are designed to eliminate misunderstandingsbetween the manufacturer and the purchaser and to assist the purchaser in selecting and obtaining theproper product for his particular need. Existence of an ICEA standard does not in any respect preclude themanufacture or use of products not conforming to the standard. The user of this Standards Publication iscautioned to observe any health or safety regulations and rules relative to the manufacture and use of cablemade in conformity with this Standard.

Requests for interpretation of this Standard must be submitted in writing to the Insulated CableEngineers Association, Inc., P. O. Box 1568, Carrollton, Georgia 30112. An official written interpretation willbe provided. Suggestions for improvements gained in the use of this Standard will be welcomed by theAssociation.

The ICEA expresses thanks to the Association of Edison Illuminating Companies, Cable EngineeringCommittee for providing the basis for some of the material included herein through their participation in theUtility Power Cable Standards Technical Advisory Committee (UPCST AC), and to the Institute of Electricaland Electronics Engineers, Insulated Conductors Committee, Subcommittee A, Discussion Group A-14 forproviding user input to this Standard.

The members of the ICEA working group contributing to the writing of this Standard consisted of thefollowing:

E. BartolucciJ. CancelosiL. HiivalaR. Thrash

R. BristolP. CinquemaniA. PackE. Walcott

S. CampbellB. FlemingB. TempleN. Ware

Part 1 GENERAL 11.1 SCOPE 11.2 GENERAL IN FORMATION '" ............•........................................................ 11.3 INFORMATION TO BE SUPPLIED BY PURCHASER 1

1.3.1 Characteristics of Systems on which Cable is to be Used...................•...................................11.3.2 Description of Installation 21.3.3 Quantities and Description of Cable 2

1.4 INFORMATION TO BE SUPPLIED BY MANUFACTURER 21.5 DEFINITIONS AND SYMBOLS 2

Part 2 CONDUCTOR 62.0 GENERAL 62.1 PHYSICAL AND ELECTRICAL PROPERTIES 6

2.1.1 Copper Conductors 62.1.2 Aluminum Conductors , 62.1.3 Special Conductors ...................................................................................................•...............6

2.1.3.1 Segmental Conductors................................................................................•...............72.2 OPTIONAL SEALANT FOR STRANDED CONDUCTORS .....................................................•........... 72.3 CONDUCTOR SIZE UNITS 72.4 CONDUCTOR DC RESISTANCE 7

2.4.1 Direct Measurement of dc Resistance Per Unit Length 72.4.2 Calculation of de Resistance Per Unit Length 8

2.5 CONDUCTOR DIAM ETER 8

Part 3 CONDUCTOR SHIELD 143.1 MATERIAL 143.2 EXTRUDED SHIELD THICKNESS .......................................................................................•............. 143.3 PROTRUSIONS AND IRREGULARITIES 143.4 VOIDS 143.5 PHYSICAL REQUIREMENTS 153.6 ELECTRICAL REQUIREMENTS 15

3.6.1 Extruded Semiconducting Material 153.6.2 Extruded Nonconducting Material (For EPR InsulationOnly) .....................................•..........153.6.3 Semiconducting Tape ............................................•................................................................15

3.7 WAFER BOIL TEST •........ , 15

Part 4 INSULATION 164.1 MATERIAL ...........................................................................•................................................................ 164.2 INSULATION THICKNESS , 16

4.2.1 Selection of Proper Thickness 174.2.2 Insulation Eccentricity 18

4.3 INSULATION REQUIREMENTS ...................................................................................................•..... 184.3.1 Physical and Aging Requirements...........•..............................................................................184.3.2 Electrical Test Requirements 19

4.3.2.1 Partial-Dischargefor Discharge-Free Designs only 194.3.2.2 Voltage Tests 204.3.2.3 Insulation Resistance Test .....................................•..................................................204.3.2.4 Dielectric Constant and DissipationFactor ......•........................................................214.3.2.5 Discharge (Corona) Resistancefro Discharge-Resistant EPR Designs only 21

4.3.3 Voids, Ambers, Gels, Agglomeratesand Contaminants as Applicable 214.3.3.1 Crosslinked PolyethyleneInsulation(XLPE) 214.3.3.2 Ethylene PropyleneRubber (EPR) 21

4.3.4 Shrinkback· Crosslinked PolyethyleneInsulation(XLPE) Only 22

Part 5 EXTRUDED INSULATION SHIELD ............................•....................................................................... 235.1 MATERIAL 235.2 THICKNESS REQUIREMENTS ..•................................•...................................................................... 235.3 PROTRUSIONS AND IRREGULARITIES 235.4 SEMICONDUCTING TAPE 235.5 INSULATION SHIELD REQUIREMENTS 23

5.5.1 Removability.....................................................................................•.............'" 235.5.2 Voids 245.5.3 PhysicalRequirements '" 245.5.4 Electrical Requirements.....................................................................•....................................245.5.5 Wafer Boil Test. '" 24

Part 6 METALLIC SHIELDING 256.1 GENERAL 256.2 SHIELDS 25

6.2.1 HelicallyApplied Tape Shield......................................................•...........................................256.2.2 LongitudinallyApplied And Overlapped CorrugatedTape Shield 256.2.3 W ire Shield 256.2.4 Flat Strap Shield '" 26

6.3 SHEATHS 266.3.1 Lead Sheath 266.3.2 Smooth Aluminum Sheath 266.3.3 Continuously Corrugated Sheath , 26

6.4 RADIAL MOISTURE BARRIER ..................................................•.................................................... '" 276.5 OPTIONAL LONGITUDINAL WATER BLOCKING COMPONENTS ...................•.......................•... 27

Part 7 JACKET ....................................••.....................................................................•.................................... 287.1 MATERIAL ..............•............................................... '" 28

7.1.1 Polyethylene,Black 287.1.2 PolyvinylChloride ......................................................................••.........•..................................29

7.2 JACKET APPLICATION AND THiCKNESS .......................................•............................................... 307.2.1 Thickness of Jacket for Tape and Wire Shields......................•..............................................307.2.2 Thickness of Jacket for Sheaths............................•................................................................30

7.3 OPTIONAL SEMICONDUCTING COATING 307.4 JACKET IRREGULARITY INSPECTION 30

7.4.1 Jackets without Optional SemiconductingCoating 307.4.2 Jackets with Optional SemiconductingCoating 30

Part 8 CABLE IDENTIFICATION .................................................................•................................................. 338.1 CABLE IDENTIFICATION ................................................................................................................•.. 33

8.1.1 Optional Center Strand Identification.............••.......................................................................338.1.2 Optional Sequential Length Marking....................................................................................•..33

Part 9 PRODUcnON TESTS 349.1 TESTING ..................•.............•..........••.........................•....................................................................... 349.2 SAMPLING FREQUENCY .....................••............................•............................................................... 349.3 CONDUCTOR TEST METHODS .....•.................................................................................................. 34

9.3.1 Method for DC Resistance Determination 34

9.3.2 Cross-Sectional Area Determination 349.3.3 Diameter Determination .' 34

9.4 TEST SAMPLES AND SPECIMENS FOR PHYSICAL AND AGING TESTS 349.4.1 General 349.4.2 Measurement of Thickness 34

9.4.2.1 Micrometer Measurements 359.4.2.2 Optical Measuring Device Measurements 35

9.4.3 Number of Test Specimens 359.4.4 Size of Specimens ................................................................................................•.................359.4.5 Preparationof Specimens of Insulationand Jacket. 369.4.6 Specimen for Aging Test. 369.4.7 Calculation of Area of Test Specimens 369.4.8 Unaged Test Procedures 36

9.4.8.1 Test Temperature................•......................................................................•..............369.4.8.2 Type of Testing Machine 369.4.8.3 Tensile StrengthTest 369.4.8.4 ElongationTest 37

9.4.9 Aging Tests 379.4.9.1 Aging Test Specimens 379.4.9.2 Air Oven Test 379.4.9.3 Oil Immersion Test for PolyvinylChloride Jacket 37

9.4.10 Hot Creep Test 389.4.11 Solvent Extraction 389.4.12 Wafer BoilTest for Conductor and InsulationShields 38

9.4.12.1 Insulation Shield Hot Creep Properties 389.4.13 Amber, Agglomerate, Gel, Contaminant, Protrusion, Irregularityand Void Test 38

9.4.13.1 Sample Preparation 389.4.13.2 Examination 389.4.13.3 Resampling for Amber, Agglomerate, Gel, Contaminant,

Protrusion, IrregUlarityand Void Test 399.4.13.4 Protrusion and IrregularityMeasurement Procedure 39

9.4.14 PhysicalTests for SemiconductingMaterial Intendedfor Extrusion 409.4.14.1 Test Sample 409.4.14.2 Test Specimens 409.4.14.3 Elongation 40

9.4.15 Retests for Physical and Aging Properties and Thickness 409.5 DIMENSIONAL MEASUREMENTS OF THE METALLIC SHIELD 40

9.5.1 Tape Shield 409.5.2 Wire Shield 409.5.3 Sheath 419.5.4 Flat Straps 41

9.6 DIAMETER MEASUREMENT OF INSULATION AND INSULATION SHIELD 419.7 TESTS FOR JACKETS 41

9.7.1 Heat Shock 419.7.1.1 Preparationof Test Specimen 419.7.1.2 Winding of the Test Specimen on Mandrels 419.7.1.3 Heating and Examination 42

9.7.2 Heat Distortion................................................................•.......................................•................429.7.3 Cold Elongation 42

9.7.3.1 Test Temperature 429.7.3.2 Type of Testing Machine 429.7.3.3 ElongationTest. 42

9.8 VOlUM E RESiSTiViTY 43

9.8.1 Conductor Shield 439.8.2 Insulation Shield and Semiconducting Extruded Jacket Coating 439.8.3 Test Equipment , , 439.8.4 Test Procedure '" 44

9.9 SHRINKBACK TEST PROCEDURE 449.9.1 Sample Preparation 449.9.2 Test Procedure ..................................................................................................................•..... 449.9.3 PasslFaii Criteria and Procedure 44

9.10 RETESTS ON SAMPLES '" '" 449.11 AC VOLTAGE TEST 45

9.11.1 General 459.11.2 AC Voltage Test .........................................................................................•............................ 45

9.12 PARTIAL-DISCHARGE TEST PROCEDURE 459.13 METHOD FOR DETERMINING DIELECTRIC CONSTANT AND

DIELECTRIC STRENGTH OF EXTRUDED NONCONDUCTINGPOLYMERIC STRESS CONTROL LAYERS 45

9.14 WATER CONTENT 459.14.1 Water Under the Jacket 469.14.2 Water in the Conductor 469.14.3 Water Expulsion Procedure 469.14.4 Presence of Water Test 46

9.15 PRODUCTION TEST SAMPLING PLANS 47

Part 10 QUALIFICATION TESTS 5010.0 GENERAL , 5010.1 CABLE QUALIFICATION TESTS 50

10.1.1 Cable Design Qualification 5010.1.2 Cable Bending Procedure 53

10.1.2.1 Bending Diameter 5310.1.3 Thermal Cycling Procedure ...............................................................................................•.... 53

10.1.3.1 Thermal Cycles 5310.1.3.2 Voltage During Thermal Cycles 54

10.1.4 Hot Impulse Test Procedure 5410.1.5 AC Voltage Withstand Test Procedure 5410.1.6 Partial Discharge Test Procedure (For Discharge-Free Designs Only) 5410.1.7 Measurement of Dissipation Factor 5410.1.8 Dissection and Analysis of Test Specimens 54

10.2 JACKET MATERIAL QUALIFICATION TESTS .......................................................•.................... 5510.2.1 Polyethylene Jackets 55

10.2.1.1 Environmental Stress Cracking Test 5510.2.1.1.1 Test Specimen 5510.2.1.1.2 Test Procedure .....................................................................•............................. 55

10.2.1.2 Absorption Coefficient Test 5510.2.2 Semiconducting Extruded Jacket Coatings 55

10.2.2.1 Brittleness Temperature 5510.2.3 Polyvinyl Chloride ...............................................................................• ~ '" 55

10.2.3.1 Sunlight Resistance 5510.2.3.1.1 Test Samples .........................................................•............................................ 5510.2.3.1.2 Test Procedure 55

10.3 OTHER QUAUFICATION TESTS 5610.3.1 Insulation Resistance 5610.3.2 Accelerated Water Absorption Tests 5610.3.3 Resistance Stability Test ................................•................................................ , 56

10.3.4 BrittlenessTemperature for SemiconductingShields 5710.3.5 Discharge ResistanceTest for Discharge-ResistantEPR Designs only 57

10.3.5.1 Test Specimens 5710.3.5.2 Test Environment ........................•.................•..........'" ...............•..............................5710.3.5.3 Test Electrodes 57

Part 11 APPENDICES 58APPENDIX A NEMA, ICEA, IEEE, ASTM AND ANSI STANDARDS (Normative) 58

A1 NEMA PUBLICATIONS 58A2 ICEA PUBLICATIONS , 58A3 IEEE AND ANSI STANDARDS 58A4 ASTM STANDARDS 58

APPENDIX B EMERGENCY OVERLOADS (Normative) 61APPENDIX C PROCEDURE FOR DETERMININGTHICKNESS REQUIREMENTS

OF THE INSULATION SHIELD, LEAD SHEATH AND JACKET (Normative) .....63APPENDIX D CABLE COMPONENT FUNCTION(Informative) .............•....................................65

~~ 01 CONDUCTOR.............................................................................................•...........................65D1.1 Function .......•..........................................................................................................'" 6501.2 Material 65

02 CONDUCTOR SHIELD , 6502.1 Function 65

D2.1.1 Nonconducting..........................................•....................•....................................6502.1.2 Semiconducting..............•...................................................................................65

02.2 Voltage Stress 6503 INSULATION........................................•..................................................................................6604 INSULATION SHIELD 66

04.1 SemiconductingShield 67D4.2 Metallic Shield ,.67

05 JACKET 67APPENDIX E HANDLING AND INSTALLATION PARAMETERS (Informative) 69

E1 INSTALLATION TEMPERATURES...............................•.......................................................69E2 RECOMMENDED MINIMUM BENDING RADIUS 69E3 DRUM DIAMETERS OF REELS.....................................•......................................................69E4 MAXIMUM TENSION AND SIOEWALL BEARING PRESSURES 69E5 ELECTRICAL TESTS AFTER INSTALLATION....................................•........•......................•70

E5.1 Insulation 70E5.2 Jacket. 70

APPENDIX F TRADITIONAL INSULATION WALL THICKNESS (Informative) 71APPENDIX G ADDITIONAL SHIELD WIRE AND CONDUCTOR INFORMATION (Informative)72APPENDIX H ETHYLENE ALKENE COPOLYMER (EAM) (Informative) 75APPENDIX I SPECIFICATION FOR ALLOY LEAD SHEATHS (Informative) 76

11 PURPOSE 7612 MATERIAL 7613 REQUIREMENTS 76

Table 2·1 Weight Increment Factors 8Table 2·2 Nominal Direct Current Resistance In Ohms Per 1000 Feet at 25°C

of Concentric Lay Stranded and segmental Conductor 9Table 2-2 (Metric) Nominal Direct Current Resistance In Mllliohms Per Meter at 25°C

of Concentric Lay Stranded and Segmental Conductor 10

Table 2-3Table 2-3 (Metric)Table 2-4Table 2-5

Table 3-1Table 4-1Table 4-2

Table 4-3Table 4-4Table 4-5Table 4-6Table 4-7Table 4-8Table 5-1Table&-1Table 7-1Table 7-2Table 7-3Table 7-4Table 7-5Table 9-1Table 9-2Table 9-3Table 9-4Table 9-5Table 10-1Table 10-2Table 0-1Table E-1Table F-1

TableG-1TableG-2TableG-3Table 1-1

Nominal Diameters for Round Copper and Aluminum Conductors 11Nominal Diameters for Round Copper and Aluminum Conductors 12Nominal Diameters for Segmental Copper and Aluminum Conductors 13Factors for Determining Nominal Resistance of Stranded ConductorsPer 1000 Feet at 25 °C 13Extruded Conductor Shield Thickness 14Conductor Maximum Temperatures 16Conductor Sizes, Maximum Insulation Eccentricity, Insulation MaximumStress and Test Voltages 18Insulation Physical Requirements ............•...............................................................19Partial-Discharge Requirements 19Test Voltages for Partial-Discharge Measurements 20Impulse Values 20Dielectric Constant and Dissipation Factor ......................•.....................................21Shrinkback Test Requirements 22

.Insulation Shield Thickness 23Lead Sheath Thickness '" 26Polyethylene, Black 28Polyvinyl Chloride 29Semiconducting Extruded Coating 31Jacket Thickness and Test Voltage for Tape or Wire Shield Cables 31Jacket Thickness and Test Voltage for All Sheath Cables 32Test Specimens for Physical and Aging Tests 35Bending Requirements for Heat Shock Test.. 42Summary of Production Tests and sampling Frequency Requirements 47Plan E 49Plan F 49Generic Grouping of cable Components 51Accelerated Water Absorption Properties 56Jacket Functions , 67Recommended Minimum Bending Radius 69Traditional Insulation Thickness from AEIC CS7-93,Test Voltagesand Conductor Sizes 71Solid Copper Shield Wires ............•..........•.................................................................72Concentric Stranded Class B Aluminum and Copper Conductors 73Concentric Stranded Class C and 0 Aluminum and Copper Conductors 74Chemical ReqUirements for Alloy Lead Sheaths 76

Part 1GENERAL

This standard applies to materials, constructions, and testing of crosslinked polyethylene (XLPE) andethylene propylene rubber (EPR) insulated single conductor shielded power cables rated above 46 to 345 kVused for the transmission of electrical energy.

This publication is arranged to allow for selection of individual components (such as conductors,insulation, semiconducting shields, metallic shields, jackets, etc.) as required for specific installation andservice conditions.

Part 2 - ConductorPart 3 - Conductor ShieldPart 4 - InsulationPart 5 - Extruded Insulation ShieldPart 6 - Metallic ShieldingPart 7 - Jacket

Each of these parts designates the materials, material characteristics, dimensions. and tests applicableto the particular component.

Part 8 covers identification of cables.Part 9 covers production test procedures applicable to cable component materials and to completed

cables.Part 10 covers qualification test procedures.Part 11 contains appendices of pertinent information.

U.S. customary units, except for temperature, are specified throughout this standard. ApproximateInternational System of Units (51) equivalents are included for information only.

When requesting proposals from cable manufacturers, the prospective purchaser should describe thecable desired by reference to pertinent provisions of these standards. To help avoid misunderstandings andpossible misapplication of the cable, the purchaser should also fumish the follOWing information:

a. Desired ampacity for normal and emergency operation.b. Frequency.c. Nominal phase to phase operating voltage.d. Maximum phase to phase operating voltage.d. Basic Impulse Voltage.e. Symmetrical and asymmetrical fault current and duration for conductor and metallic shield/sheath.f. Daily load factor.

a. Installation method and geometry, for example:1. In underground ducts.2. Direct buried in ground.3. In air and whether the effects of wind and/or solar radiation should bE!considered.4. In tunnel and whether there are special fire retardant features.5. Descriptions other than the foregoing.

b. Installation conditions.1. Ambient air temperature and/or ambient ground temperature at burial depth.2. Minimum temperature at which cable will be installed.3. Number of loaded cables in direct buried cable chase, duct bank or conduit system. If in cable

chase, describe cable spacing and burial depth. If in conduit, describe size (id and od) type ofconduit (metallic or nonmetallic), number of occupied and unoccupied conduits, whether enclosedor exposed, spacing between conduits and burial depth of conduits.

4. Method of bonding and grounding of metallic shield/sheath. .5. Wet or dry location.6. Thermal resistivity (rho) of soil, concrete and/or thermal backfill.-

a. Total cable length, inclUding any special test lengths, and specific shipping lengths if required.b. Nominal phase to phase voltage.c. Type of conductor - copper or aluminum, filled or unfilled strand.d. Size of conductors in circular mils. If conditions require other than standard stranding, a complete

description should be given.e. Type of insulation.1. Type of metallic shield/sheath.g. Type of jacket.h. Maximum allowable overall diameter, if limited by conduit inside diameter or other considerations.i. Method of cable identification.

When submitting proposals to the prospective purchaser, cable manufacturers shall describe the cableproposed to this standard. To help avoid misunderstandings, the manufacturer shall fumish at least thefollowing information:

a. Nominal insulation thickness.b. A complete description of the cable including dimensions and material description of each layer. This

information may be in the form of a drawing.c. Nominal phase to phase voltage.d. Normal conductor maximum operation temperature the cable was designed to meet.e. Emergency conductor maximum operation temperature the cable was designed to meet.1. Fault capacity as defined by customer parameters.g. The voltage stress at the conductor shieldlinsulation interface (maximum stress) and at the

insulationlinsulation shield interface (minimum stress).h. Maximum allowable pUlling tension and sidewall bearing pressure.i. Dielectric constant.

Cable CoreExtruder Run:

Discharge-FreeCable Design:

Discharge-ResistantCable Design:

EPR InsulatingCompound:

High DielectricConstant Compound:

A discernible area of compound constituents in ethylene propylene basedinsulation which is generally opaque and can be broken apart.

A localized area in crosslinked polyethylene insulation which is dissimilar incolor (ranging from bright yellow to dark red) from the surrounding insulation,which passes light and is not always readily removable from the insulationmatrix. This does not include clouds, swirls or flow patterns which are normallyassociated with the extrusion process.

The portion of a cable which includes the conductor, the conductor shield. theinsulation and the extruded insulation shield.

A continuous run of cable core with one conductor size, one conductor shieldcompound, one insulation compound and thickness, and one insulation shieldcompound.

A report containing the results of production tests or qualification tests whichdeclares that the cable shipped to a customer meets the applicablerequirements of this standard.

The ratio of the capacitance of a given configuration of electrodes with thematerial as a dielectric to the capacitance of the same electrode configurationwith a vacuum (or air for most practical purposes) as the dielectric.

A cable designed to eliminate electrical discharge in the insulation systemat normal operating voltage.

A cable design capable of withstanding electrical discharge in the insulationsystem at normal operating voltage.

The cotangent of the dielectric phase angle of a dielectric material or thetangent of the dielectric loss angle. It is often called tan <3.

A discernible region of compound constituents in ethylene propylene basedinsulation which is gelatinous, not readily removable from the insulation, andgenerally translucent.

An extruded compound used for the conductor shield which has a dielectricconstant typically between 8 and 200.

Jacket Extruder Run: A cable with a jacket which was applied in one continuous run with one jacketcompound and one jacket thickness.

Lot (Material): A quantity of material used in cable construction which is produced at the samelocation under the same manufacturing conditions during the same time period.

Maximum ConductorTemperatures:

NormalOperating:

EmergencyOverload:

ShortCircuit:

Partial DischargeLevel:

Room Temperature(AT):

The highest conductor temperature permissible for any part of the cableunder normal operating current load.

The highest conductor temperature permissible for any part of the cableduring emergency overload of specified time, magnitude, and frequency ofapplication.

The highest conductor temperature permissible for any part of the cableduring a circuit fault of specified time and magnitude.

The value by which a quantity is designated and often used in tables (taking intoaccount specified tolerances).

The maximum continuous or repetitious apparent charge transfer, measuredin picocoulombs, occurring at the test voltage.

A completed length of cable which has passed all test requirements. It mayormay not be cut into shorter lengths before it is supplied to the end usecustomer.

A localized area in crosslinked polyethylene insulation dissimilar to thesurrounding insulation which passes light and is not readily removable from theinsulation matrix. There are no requirements for translucents in this standard.

Any cavity in a compound, either within or at the interface with another extrudedlayer.

Installations under ground or in concrete slabs or masonry in direct contact withthe earth; in locations subject to saturation with water or other liquids and inunprotected locations exposed to weather.

Part 2CONDUCTOR

Conductors shall meet the requirements of the appropriate ASTM standards referenced in this standardexcept that resistance shall determine cross-sectional area as noted in 2.4 and diameters shall be inaccordance with 2.5. Requirements of a referenced ASTM standard shall be determined in accordance withthe procedure or method designated in the referenced ASTM standard unless otherwise specified in thisstandard.

The following technical information on typical conductors may be found in Appendix G:

a. Approximate diameters of individual wires in stranded conductors.b. Approximate conductor weights.

The conductors used in the cable shall be copper in accordance with 2.1.1 or aluminum in accordancewith 2.1.2, as applicable, except as noted in 2.0. Conductors shall be stranded. The outer layer of a strandedcopper conductor may be tin coated to assist with free stripping of the adjacent polymeric layer. There shallbe no water in stranded conductors in accordance with 9.14.

1. ASTM B 3 for soft or annealed uncoated copper.2. ASTM B 5 for electrical grade copper.3. ASTM B 8 for Class A, B, C, or 0 stranded copper conductors.4. ASTM B 33 for soft or annealed tin-eoated copper wire.5. ASTM B 496 for compact-round stranded copper conductors.6. ASTM B 784 for modified concentric lay stranded copper conductor.7. ASTM B 787 for 19 wire combination unilay-stranded copper conductors.8. ASTM B 835 for compact round stranded copper conductors using single input wire constructions.

1. ASTM B 230 for electrical grade aluminum 1350-H19.2. ASTM B 231 for Class A, B, C, or 0 stranded aluminum 1350 conductors.3. ASTM B 233 for electrical grade aluminum 1350 drawing stock.4. ASTM B 400 for compact-round stranded aluminum 1350 conductors.5. ASTM B 609 for electrical grade aluminum 1350 annealed and intermediate tempers.6. ASTM B 786 for 19 wire combination unilay-stranded aluminum 1350 conductors.7. ASTM B 800 for 8000 series aluminum alloy annealed and intermediate tempers.8. ASTM B 801 for 8000 series aluminum alloy wires, compact- round, compressed and concentric-lay

Class A,S, C and 0 stranded conductors.9. ASTM B 836 for compact round stranded aluminum conductors using single input wire

constructions.

Special conductors (segmental, etc.) shall be made up according to characteristics and details ofconstruction as agreed to by the manufacturer and purchaser. .

Each segment shall conform, as to the number of individual strand splices, to the requirements of ASTMB 8 or B 231 whichever is applicable.

Binder tapes when used, shall be nonmagnetic and shall have sufficient mechanical strength so that theycan be applied with tension adequate to minimize the displacement of the segments. Binder tapes shall beapplied substantially free of indents, creases, tears or wrinkles. Defects shall not be such that they protrudethrough the conductor shield.

The eccentricity of cabled segmental conductors shall be determined from measurement of bothmaximum callipered and circumference tape diameters taken at five locations spaceg approximately one foot(0.3 m) apart along the conductor. The average of the five maximum callipered diameters shall not exceedthe average of the five circumference tape diameters by more than 2 percent. At anyone location, themaximum callipered diameter shall not exceed the circumference tape diameter by more than 3 percent.

If required by the purchaser, a sealant designed as an impediment to longitudinal water penetration shallbe incorporated in the interstices of the stranded conductor. Compatibility with the conductor shield shall bedetermined in accordance with ICEA Publication T -32-645. LongitUdinal water penetration resistance shallbe determined in accordance with ICEA Publication T-31-610 and shall meet a minimum requirement of 5psig.

Conductor size shall be expressed by cross-sectional area in thousand circular mils (kcmil). The metricequivalents for all sizes are described in Table 2-3 (Metric).

The dc resistance per unit length of each conductor in a shipping length of completed cable shall notexceed the value 2% greater than the appropriate nominal value specified in Table 2-2. The de resistanceshall be determined in accordance with 2.4.1 or 2.4.2.

For conductor strandings or sizes not listed in Tables 2-2, the nominal direct current resistance per unitlength of a completed single conductor cable shall be calculated from the factors given in Table 2-5 using thefollowing formula:

Where:R = Conductor resistance in 0/1000 fl.t= Factor from Table 2·5A = Cross-sectional area of conductor in kcmil, determined in accordance with 9.3.2

Where the outer layer of a stranded copper conductor is coated, the direct current resistance of theresulting conductor shall not exceed the value specified for an uncoated conductor of the same size.

The de resistance per unit length shall be determined by dc resistance measurements made inaccordance with 9.3.1 to an accuracy of 2 percent or better. If measurements are made at a temperatureother than 25°C, the measured value shall be converted to resistance at 25 °C by using either of thefollowing:

1. The appropriate mUltiplying factor obtained from ICEA T-27-581/NEMA WC-53.2. A multiplying factor calculated using the applicable formula in ICEA T-27-581INEMA WC-53.

If verification is required for the direct-current resistance measurement made on an entire length ofcompleted cable, a sample at least 1 foot (0.3 m) long shall be cut from that reel length, and the direct-current resistance of each conductor shall be measured using a Kelvin-type Bridge or a potentiometer.

PR=K·-A

Where:R = Conductor resistance in 0/1000 ftK =Weight increment factor, as given in Table 2-1.p = volume resistivity in Q'cmil/ft, determined in accordance with ASTM B 193 using round wires (see

Table 2-5)A = Cross-sectional area of conductor in kcmil, determined in accordance with 9.3.2.

When the volume resistivity is expressed in nanoohm meters (nn·m) and area is expressed in squaremillimeters (mm2

) the resistance is expressed in milliohms per meter (mQ/m).

The conductor diameter shall be measured in accordance with 9.3.3. The diameter shall not differ fromthe nominal values shown in Table 2-3 by more than ± 2 percent.

Table 2-1Weight Increment Factors·

Conductor TypelSize Weight Factor (I<)

All Sizes 1

Concentric-lay Strand, Class A, B, C and 0250 - 2000 kcmil (127- 1013 mm2

) 1.02>2000 - 3000 kcmil (>1013 -1520 mm2) 1.03>3000 - 4000 kcmil (>1520 - 2027 mm2) 1.04

Combination Unilay Strand1.02All Sizes

Concentric-lay Strand 8000 Series Aluminum1.02All Sizes

Based on the method specified in either ASTM B 8, ASTM B 231, ASTM B 400, ASTM B 496, ASTM B 786, ASTM B 787,or ASTM B 801 as applicable.

Table 2-2Nominal Direct Current Resistance In Ohms Per 1000 Feet at 25°C

of Concentric Lay Stranded and Segmental ConductorConcentric Lay Stranded" Segmental

Conductor Aluminum CopperSize Copperkcmil Uncoated Coated Aluminum

ClassB,C,OClass B,C,O Class B ClassC Class 0 Uncoated

250 0.0707 0.0431 0.0448 0.0448 0.0448 .., ...300 0.0590 0.0360 0.0374 0.0374 0.0374 .., ...350 0.0505 0.0308 0.0320 0.0320 0.0320 .., ...400 0.0442 0.0269 0.02n 0.0280 0.0280 .., ...450 0.0393 0.0240 0.0246 0.0249 0.0249 .., ...500 0.0354 0.0216 0.0222 0.0224 0.0224 .., ...550 0.0321 0.0196 0.0204 0.0204 0.0204 ... '"600 0.0295 0.0180 0.0187 0.0187 0.0187 ... ...

650 0.0272 0.0166 0.0171 0.0172 0.0173 .., ...700 0.0253 0.0154 0.0159 0.0160 0.0160 .., ...750 0.0236 0.0144 0.0148 0.0149 0.0150 .., ...800 0.0221 0.0135 0.0139 0.0140 0.0140 ... ...900 0.0196 0.0120 0.0123 0.0126 0.0126 .., '"

1000 O.Q1n 0.0108 0.0111 0.0111 0.0112 O.Oln 0.01081100 0.0161 0.00981 0.0101 0.0102 0.0102 0.0161 0.009811200 0.0147 0.00899 0.00925 0.00934 0.00934 0.0147 0.008991250 0.0141 0.00863 0.00888 0.00897 0.00897 0.0141 0.008631300 0.0136 0.00830 0.00854 0.00861 0.00862 0.0136 0.00830

1400 0.0126 O.oonl 0.00793 0.00793 0.00801 0.0126 O.oonl1500 0.0118 0.00719 0.00740 0.00740 0.00747 0.0118 0.007191600 0.0111 0.00674 0.00694 0.00700 0.00700 0.0111 0.006741700 0.0104 0.00634 0.00653 0.00659 0.00659 0.0104 0.006341750 0.0101 0.00616 0.00634 0.00640 0.00640 0.0101 0.00616

1800 0.00982 0.00599 0.00616 0.00616 0.00622 0.00982 0.005991900 0.00931 0.00568 0.00584 0.00584 0.00589 0.00931 0.005682000 0.00885 0.00539 0.00555 0.00555 0.00560 0.00885 0.005392250 0.00794 0.00484 0.00498 ... ... 0.00794 0.004842500 0.00715 0.00436 0.00448 ... ... 0.00715 0.00436

2750 0.00650 0.00396 0.00408 ... ... 0.00650 0.003963000 0.00596 0.00363 0.00374 ... ... 0.00596 0.003633250 0.00555 0.00338 0.00348 ... ... 0.00555 0.003383500 0.00515 0.00314 0.00323 ." ... 0.00515 0.003143750 0.00481 0.00293 0.00302 ... ... 0.00481 0.002934000 0.00451 0.00275 0.00283 ... ... 0.00451 0.00275

Table 2·2 (Metric)Nominal Direct Current Resistance In Mllliohms Per Meter at 25°C

of Concentric laY Stranded and segmental ConductorConcentric Lay Stranded" segmental

Conductor SizeAluminum Copper

CopperUncoated Coated Aluminum

kcmil mm2 ClassB,C,DClassB,C,D ClassB C1assC Class 0 Uncoated

250 127 0.232 0.141 0.147 0.147 0.147 ... ..,300 152 0.194 0.118 0.123 0.123 0.123 '" ...350 177 0.166 0.101 0.105 0.105 0.105 ... ...400 203 0.145 0.0882 0.0909 0.0918 0.0918 ... ...450 228 0.129 0.0787 0.0807 0.0817 0.0817 ... ..,500 253 0.116 0.0708 0.0728 0.0735 0.0735 ... ...550 279 0.105 0.0643 0.0669 0.0669 0.0669 '" ...600 304 0.0968 0.0590 0.0613 0.0613 0.0613 ... ...650 329 0.0892 0.0544 0.0561 0.0564 0.0567 ... ...700 355 0.0830 0.0505 0.0522 0.0525 0.0525 '" ...750 380 0.0774 0.0472 0.0485 0.0489 0.0492 '" ...800 405 0.0725 0.0443 0.0456 0.0459 0.0459 ... ...900 456 0.0643 0.0394 0.0403 0.0413 0.0413 ... ...1000 507 0.0581 0.0354 0.0364 0.0364 0.0367 0.0581 0.03541100 557 0.0528 0.0322 0.0331 0.0335 0.0335 0.0528 0.03221200 608 0.0482 0.0295 0.0303 0.0306 0.0306 0.0482 0.02951250 633 0.0462 0.0283 0.0291 0.0294 0.0294 0.0462 0.02831300 659 0.0446 0.0272 0.0280 0.0282 0.0283 0.0446 0.0272

1400 709 0.0413 0.0253 0.0260 0.0260 0.0263 0.0413 0.02531500 760 0.0387 0.0236 0.0243 0.0243 0.0245 0.0387 0.02361600 811 0.0364 0.0221 0.0228 0.0230 0.0230 0.0364 0.02211700 861 0.0341 0.0208 0.0214 0.0216 0.0216 0.0341 0.02081750 887 0.0331 0.0202 0.0208 0.0210 0.0210 0.0331 0.0202

1800 912 0.0322 0.0196 0.0202 0.0202 0.0204 0.0322 0.01961900 963 0.0305 0.0186 0.0192 0.0192 0.0193 0.0305 0.01862000 1013 0.0290 0.0177 0.0182 0.0182 0.0184 0.0290 0.01772250 1140 0.0260 0.0159 0.0163 .., ... 0.0260 0.01592500 1266 0.0235 0.0143 0.0147 .., ... 0.0235 0.0143

2750 1393 0.0213 0.0130 0.0134 ... ... 0.0213 0.01303000 1520 0.0196 0.0119 0.0123 ... ... 0.0196 0.01193250 1647 0.0182 0.0111 0.0114 ... ... 0.0182 0.01113500 1773 0.0169 0.0103 0.0106 ... ... 0.0169 0.01033750 1990 0.0158 0.0096 0.0099 ... ... 0.0158 0.00964000 2027 0.0148 0.0090 0.0093 .., '" 0.0148 0.0090

Table 2-3Nominal Diameters for Round Copper and Aluminum Conductors

ConductorNominal Diameters (Inches)

Size

Concentric Lay StrandedCombination Unilaykcmil

Compact Compressed ClassB..

ClassC Class D Unilay Compressed

250 0.520 0.558 0.575 0.576 0.576 0.554 0.542300 0.570 0.611 0.630 0.631 0.631 0.607 0.594350 0.616 0.661 0.681 0.681 0.682 0.656 0.641

400 0.659 0.706 0.728 0.729 0.729 0.701 0.685450 0.700 0.749 0.n2 0.n3 0.773 0.744 0.727500 0.736 0.789 0.813 0.814 0.815 0.784 0.766550 0.n5 0.829 0.855 0.855 0.855 ... 0.804600 0.813 0.866 0.893 0.893 0.893 ... 0.840

/) 0.845 0.901 0.929 0.930 0.930 0.874'"

,\JO 0.8n 0.935 0.964 0.965 0.965 ... 0.907750 0.908 0.968 0.998 0.999 0.998 ... 0.939800 0.938 1.000 1.031 1.032 1.032 ... 0.969900 0.999 1.061 1.094 1.093 1.095 ... 1.028

1000 1.060 1.117 1.152 1.153 1.153 ... 1.0841100 ... 1.173 1.209 1.210 1.211 ... 1.1371200 ... 1.225 1.263 1.264 1.264 ... 1.1871250 ... 1.251 1.289 1.290 1.290 ... 1.2121300 ... 1.276 1.315 1.316 1.316 ... 1.236

1400 ... 1.323 1.364 1.365 1.365 ... 1.2821500 ... 1.370 1.412 1.413 1.413

'" 1.3271600 ... 1.415 1.459 1.460 1.460 ... 1.3711700 ... 1.459 1.504 1.504 1.504 ... 1.4131750 ... 1.480 1.526 1.527 1.527 ... 1.434

1800 ... 1.502 1.548 1.548 1.549 ... 1.4541900 ... 1.542 1.590 1.590 1.591 ... 1.4942000 ... 1.583 1.632 1.632 1.632 '" 1.5332250 .., 1.678 1.730 1.731 1.731 ... ...2500 ... 1.769 1.824 1.824 1.824 ... .,.

-'"~. ,J ... 1.856 1.914 1.914 1.914 ... ...3000 ... 1.938 1.998 1.999 1.999 ... ...3250 .., 2.018 2.081 2.081 2.081 ... ...3500 .., 2.094 2.159 2.159 2.158 ... ...3750 ... 2.168 2.235 2.236 2.234 ... ...4000 .., 2.240 2.309 2.309 2.309 ... '"

• Diameters shown are for compact round. compact modified concentric and compact single input wire .•• Diameters shown are for concentric round and modified concentric.

Table 2·3 (Metric)Nominal Diameters for Round Copper and Aluminum Conductors

ConductorNominal Diameters (mm)

Size

kcmil Concentric Lay Strandedmm2 Combination Unilay

Compact Compressed Class a- ClassC ClassD Unilay Compressed

250 127 13.2 14.2 14.6 14.6 14.6 14.1 13.8300 152 14.5 15.5 16.0 16.0 16.0 15.4 15.1350 1n 15.6 16.8 17.3 17.3 17.3 16.7 16.3

400 203 16.7 17.9 18.5 18.5 18.5 17.8 17.4450 228 17.8 19.0 19.6 19.6 19.6 18.9 18.5500 253 18.7 20.0 20.7 20.7 20.7 19.9 19.5550 279 19.7 21.1 21.7 21.7 21.7 ... 20A600 304 20.7 22.0 22.7 22.7 22.7 ... 21.3

650 329 21.5 22.9 23.6 23.6 23.6 ... 22.2700 355 22.3 23.7 24.5 24.5 24.5 ... 23.0750 380 23.1 24.6 25.3 25.4 25.3 ... 23.9800 405 23.8 25.4 26.2 26.2 26.2 ... 24.6900 456 25.4 26.9 27.8 27.8 27.8 ... 26.1

1000 507 26.9 28.4 29.3 29.3 29.3 ... 27.51100 557 ... 29.8 30.7 30.7 30.8 ... 28.91200 608 ... 31.1 32.1 32.1 32.1 '" 30.11250 633 ... 31.8 32.7 32.8 32.8 '" 30.81300 659 '" 32.4 33.4 33.4 33.4 ... 31.4

1400 709 ... 33.6 34.6 34.7 34.7 '" 32.61500 760 ... 34.8 35.9 35.9 35.9 '" 33.71600 811 '" 35.9 37.1 37.1 37.1 '" 34.81700 861 ... 37.1 38.2 38.2 38.2 ... 35.91750 887 ... 37.6 38.8 38.8 38.8 ... 36.4

1800 912 ... 38.2 39.3 39.3 39.3 '" 36.91900 963 '" 39.2 40.4 40.4 40.4 '" 37.92000 1013 ... 40.2 41.5 41.5 41.5 ... 38.92250 1140 ... 42.6 43.9 44.0 44.0 '" ...2500 1266 '" 44.9 46.3 46.3 46.3 ... ...2750 1393 ... 47.1 48.6 48.6 48.6 ... '"3000 1520 ... 49.2 50.7 50.8 SO.8 ... ...3250 1647 ... 51.3 52.9 52.9 52.9 '" ...3500 1n3 ... 53.2 54.8 54.8 54.8 ... ...3750 1990 ... 55.1 56.8 56.8 56.7 '" '"

4000 2027 ... 56.9 58.6 58.6 58.6 ... ...• Diameters shown are for compact round. compact modified concentric and compact single input wire .•• Diameters shown are for concentric round and modified concentric.

opper an urn num on u ors

Conductor SizeSegmental Conductor Diameter

(Four segments)

kcmil mm2 Inches mm

1000 507 1.140101.152 29.0 to 29.31100 557 1.195 to 1.209 30.4 to 30.71200 608 1.235 to 1.263 31.4 to 32.11250 633 1.260 to 1.289 32.0 to 32.71300 659 1.285 to 1.315 32.6 to 33.4

1400 709 1.325 to 1.364 33.7 to 34.61500 760 1.375101.412 34.9 to 35.91600 811 1.420 10 1.459 36.1 to 37.11700 861 1.460 to 1.504 37.1 to 38.21750 887 1.480 to 1.526 37.6 to 38.8

1800 912 1.500 to 1.548 38.1 to 39.31900 963 1.530 to 1.590 38.9 to 40.42000 1013 1.570 10 1.632 39.9 to 41.52250 1140 1.665 to 1.730 42.3 to 43.92500 1266 1.740 to 1.824 44.2 to 46.3

2750 1393 1.830 to 1.913 46.5 to 48.63000 1520 1.910 to 1.998 48.5 to 50.73250 1647 1.985 to 2.080 50.4 to 52.83500 1773 2.085 to 2.159 53.01054.83750 1990 2.150 102.234 54.6 to 56.74000 2027 2.225 to 2.309 56.5 to 58.6

Table 2-4Nominal Diameters for SegmentalC dAi i C d ct

Factorst for Determining Nominal Resistance of Stranded Conductors Per 1000 Feet at 25 acDiameter of Individual Coated Copper Wires in Inches

All Sizes for Stranded Conductors

Conductor Size 0.460 Under 0.290 Under 0.103 Under 0.0201 Under 0.0111Aluminum

Uncoatedto 0.290, to 0.103, to 0.0201 , to 0.0111, to 0.0010,CopperInclusive Inclusive Inclusive Inclusive Inclusive

-Concentric Stranded250 - 2000 kcmil (127 -1013 mm2) 17692 10786 11045 11102 11217 11456 11580

> 2000·3000 kcmil (>1013 - 1520 mm2) 17865 10892 11153 11211 11327 11568 11694

> 3000 - 4000 kcmil (>1520 - 2027 mm2) 18309 10998 11261 11319 11437 11680 11807

Conductivity utilized61 100 97.66 97.16 96.16 94.16 93.15for above factors, Percent

• The factors given in Table 2-5 shall be based on the following:A. Resistivity1. A volume resistivity of 10.575 Q·cmiVft (0.017580 Q.mm2/m) at 25 °C for uncoated (bare) copper (100% conductivity).2. A 25 °C volume resistivity converted from the 20 °C values specified in ASTM B 33 for tin coated copper.3. A volume resistivity of 17.345 Q·cmiVft (0.028835 Q.mm2/m) at 25 °C for aluminum (61.0% conductivity).B. Increase in Resistance Due to Stranding1. The value of K (weight increment factor) given in Table 2-1.

Part 3CONDUCTOR SHIELD

The conductor shall be covered with an extruded thermosetting conductor shield material. Asemiconducting tape may be used between the conductor and the extruded shield in which case it shall notbe considered as part of the extruded shield thickness.

The extruded material shall be either semiconducting or nonconducting for ethylene propylene rubber(EPR) type insulation and semiconducting only for crosslinked polyethylene (XLPE) type insulation. Theextruded shield shall be compatible with all cable component materials with which it is in contact. Theallowable operating temperatures of the conductor shield shall be equal to or greater than those of theinsulation. The conductor shield shall be easily removable from the conductor and the outer surface of theextruded shield shall be bonded to the overlying insulation.

Table 3-1Extruded Conductor Shield Thickness

Extruded Shield ThicknessConductor Size,

Minimum Pointkcmil{mm2)

mils mm

250·550 16 0.41(127·279)

551 -1000 20 0.51(279·507)

1001 ·1500 24 0.61(507·760)

1501 and larger 30 0.76(761 and larger)

(See 9.4.13). The interface between the extruded conductor shield and the insulation shall be cylindricaland free from protrusions and irregularities that extend more than 3 mils (0.076 mm) into the insulation and 3mils (0.076 mm) into the extruded conductor shield.

(See 9.4.13). The interface between the extruded conductor shield and the insulation shall be free of anyvoids larger than 2 mils (0.051 mm) in its greatest dimension.

The crosslinked material(s) intended for extrusion as a conductor shield shall have an elongation of noless than 100 percent after air oven aging for 168 hours at 121°C ±1 °C for insulations rated 90°C (see9.4.14). It shall also meet brittleness requirements (see 10.3.4) at temperatures not warmer than ·25 °C.

(See 9.8.1). The volume resistivity of the extruded semiconducting conductor shield shall not exceed1000 ohm-meter at the maximum normal operating temperature and emergency operating temperature.

The extruded nonconducting conductor shield shall withstand a 2.0 kV de spark test and meet thefollowing requirements at room temperature, at the maximum normal operating temperature, and emergencyoperating temperature:

kV I mm = 6_0 _dielectric constant

If a semiconducting tape is used over the conductor, the dc resistance of the tape at room temperatureshall not exceed 10,000 ohms per unit square when determined in accordance with ASTM D 4496.

Part 4INSULATION

The insulation shall be one of the following materials meeting the dimensional, electrical, and physicalrequirements specified in this section:

. Crosslinked polyethylene (XLPE) with no mineral fillers

. Ethylene propylene rubber (EPR)

Crosslinked polyethylene is suitable for dry locations and wet locations with radial water barrier atvoltages above 46 up to and including 345 kV between phases.

Ethylene propylene rubber insulation has two classifications. Class I is for Discharge-Free andDischarge-Resistant designs. Class II is for Discharge-Free designs only. Ethylene propylene rubberinsulation is suitable for wet or dry locations at voltages above 46 up to and including 138 kV betweenphases.

Table 4-1Conductor Maximum Operation Temperatures

Insulation Materialt Rated Voltage Normal Emergency Short Circult**Operation Overload*

XLPEand Greater than 4690°C 105 to 130°C 250°CEPR Classes I, II through 138 kV

XLPE Greater than 13890°C 105°C 250°Cthrough 345 kV

'See Appendix B·'Conductor fault current may be determined in accordance with ICEA P-32-382.tether inSUlation materials composed of Ethylene and Alkene units, which are designated as EAM. may be available and canmeet the same physical and electrical requirements as the insulation materials descnbed in this standard. See Appendix Hand/or contact the manufacturer for further information.

The nominal insulation thicknesses shall be designed based on electrical stress. The electrical stress atthe conductor shall not exceed the values given in Table 4-2 or the stress qualified by the manufacturerwhichever is lower. The stress limits are based on rated voltage, given in Table 4-2. The manufacturer shallspecify the nominal wall to be supplied. The minimum point thickness shall be not less than 90 % of thespecified nominal wall thickness.

Where:Gmox = Maximum stress at the conductor shieldlinsulation interface (kVlmm)Vg = Nominal voltage to ground (kV)Rj = Nominal radius over the insulation (mm)

The nominal insulation thickness is calculated by using the lower value of the maximum voltage stress fromTable 4-2 for the appropriate voltage class or the maximum voltage stress qualified by the manufacturer.Maximum stress levels in Table 4-2 assume the actual operating voltage shall not exceed the rated voltage bymore than 5 percent during continuous operation or 10 percent during emergencies lasting not more than 15minutes.

Either the 15 minute, 30 minute or 60 minute ac test is required. The ac test levels for the appropriate ratedvoltage are to be used as the basis for ac testing should insulation stresses other than those in Table 4-2 beutilized.

r- All ac tests shall be conducted at room temperature and at power frequency (49-61 Hz). The waveform shallbe substantially sinusoidal. All ac voltages are rms values.

For other voltage ratings and conductor sizes, specific agreement between purchaser and manufacturer inthe selection of insulation maximum stress for each application is required. There may also be unusualinstallations and/or operating conditions where mechanical considerations dictate the use of a larger insulationthickness. When such conditions are anticipated, the purchaser should consult with the cable manufacturer todetermine the appropriate insulation thickness.

A threshold ac test limit of 27 kV/mm to 30 kV/mm should not be exceeded for some insulations (as specifiedby the manufacturer), in order to avoid any possible weakening of the insulation prior to delivery which might Jatercause a failure in service. The voltage maybe lowered, but with a correspondingly longer testing time in order toavoid too high stresses. However, the voltage level shall not be below 1.5 Vg and the duration not longer than 10hours.

Lower maximum stress may be required because of the type of cable joints and terminations or becauseof cable environment conditions. Consult cable manufacturer for further information. (see Appendix 04)

The cable insulation stress specified is for application where the system is provided with circuit protectionsuch that ground faults will be cleared as rapidly as possible, but in any case within one minute. While thesecables are applicable to installations which are on grounded systems, they may also be used on other cablesystems, provided the above clearing requirements are met in completely de-energizing the faulted section. Incommon with other electrical equipment, the use of cables is not recommended on systems where the ratio of thezero to positive sequence phase reactance of the system at the point of cable application lies between -1 and -40since excessively high voltages may be encountered in the case of ground faults.

Table 4-2Conductor Sizes, Maximum InSUlation Eccentricity, Insulation Maximum Stress and Test Voltages

Rated Maximum Insulation ac Test Voltage

Voltage,COnductor COnductor Insulation Maximum 60 Min. 30 Min. 15 Min. TestSize, Size, Eccentricity Stress Level

Test Test 3.0Vg

kV kcmll mm 2.0Vg 2.5Vg kV% kVlmm (V/mil)kV kV

69 250-4000 127-2027 12 6 (152) 80 100 120

115 750-4000 380-2027 12 8 (203) 135 160 200

120 750-4000 380-2027 12 8(203) 140 175 205

138 750-4000 380-2027 12 8 (203) 160 200 240

161 750-4000 380-2027 10 9(229) 185 230 280

230 100Q-4000 507-2027 10 11 (279) 265 330 NlA345 1000-4000 507-2027 10 16 (406) 400 NlA NlA

The eccentricity of the insulation layer shall not exceed the value given in Table 4-2 when calculated asshown below:

Tmax-Tmin X 100Tmax

Where '1max and nnin are maximum and minimum values measured around the same cable cross-section.

Table 4-3Insulation Physical Requirements

Insulation Type

Physical Requirements EPR ClassXLPE

I II

Unaged Requirements

Tensile Strength, MinimumPsi 1800 700 1200(MPa) (12.5) (4.8) (8.2)

Elongation at Rupture250 250

Minimum Percent

Aging RequirementsAfter Air Oven Aging for 168 hours

Aging Temperature, °c 121 121

Tensile Strength, Minimum Percentage75 75 80of Unaged Value

Elongation, Minimum75 75 80Percentage of Unaged Value

Hot Creep Test at 150 °C ±2 °C

*Elongation, Maximum Percent 175 50

*Set, Maximum Percent 10 5

"For XLPE Insulations if this value is exceeded, the Solvent Extraction Test (ASTM 02765) may be performed and will serveas a referee method to determine compliance (a maximum of 30 percent weight loss after 20 hour drying time).

(See 9.12). Each shipping length of completed cable shall be subjected to a partial discharge test. Thepartial discharge shall not exceed the values in Table 4-4. The test voltages for partial dischargemeasurements are listed in Table 4-5.

Table 4-4Partial-Discharge Requirements

___ v_tlV_g

_ra_ti_O 1_,O 1_,5 2._0__ 1pC - Limit 5 5 5.

Table 4-5Test Voltages for Parlial-Discharge Measurements

Cable Vohage Test Voltages (Vt) in kVRating Corresponding to VWg Ratio

kV 1.0 1.5 2.0

69 40 60 80

115 65 100 135

120 70 105 140

138 80 120 160

161 95 140 185

230 135 200 265

345 200 300 400

(See 9.11). Each shipping length of completed cable shall withstand, without failure, the ac test voltagesgiven in Table 4-2. The test voltage shall be selected from the table based on the rated voltage of the cable.

For purposes of this standard, the BIL value shall be in accordance with Table 4-6.

Table 4-6Impulse Values

Rated Voltage BILkV kV

69 350

115 550

120 550

138 650

161 750

230 1050

345 1300

(See 10.3.1). The insulated conductor shall have an insulation resistance not less than thatcorresponding to a constant (K) of 20,000 megohms-10oo ft at 15.6 cC.

The insulation shall meet the following maximum requirements for dielectric constant and dissipationfactor at room temperature when tested in accordance with ICEA T-27-581/NEMA WC-53.

Table 4-7Dielectric Constant and Dissipation Factor

Insulation TypeProperties

EPRXLPE Class I, II

Dielectric Constant 3.5 4.0

Dissipation Factor, Percent 0.1 1.5

(See 10.3.5) The insulation shall be verified as corona discharge resistant using a 21 kV 60 Hz voltageapplied for 250 hours. Neither a failure nor surface erosion visible with 15 times magnification shall occur.Partial discharge measurements are not required for DISCHARGE-RESISTANT cables.

1) Any void larger than 2 mils (0.051 mm) in its greatest dimension. The number of voids larger than 1mils (0.025 mm) shall not exceed 30 per cubic inch (1.8 per cm3) of insulation.

2) Any contaminant larger than 5 mils (0.127 mm) in its greatest dimension and no more than 10 percubic inch (0.6 per cm3) between 2 and 5 mils (0.051 and 0.127 mm).

2) Any contaminant, gel, or agglomerate larger than 10 mils (0.254 mm) in its greatest dimension. Adistinction between contaminants. gels, and agglomerates is not required.

(See 9.9). The conductor shall not protrude beyond the insulation (total of both ends) by more than theamounts shown in Table 4-8.

Table 4-8Shrlnkback Test Requirements

Oven Cycle Total Shrlnkback mils (mm) Action

1 o to 20 (0.51) Pass: Terminate Test> 20 (0.51) Record and Continue Cycling Test

2 o to 40 (1.02) Pass: Terminate Test> 40 (1.02) Record and Continue Cycling

3 o to 300 (7.62) Pass: Terminate Test> 300 (7.62) Fail: Terminate Test

Part 5EXTRUDED INSULATION SHIELD

The insulation shield shall be an extruded thermosetting semiconducting material compatible with allcable components with which it is in contact. The extruded shield shall be readily distinguishable from theinsulation and plainly identified as semiconducting.

The thickness requirements for the extruded insulation shield are as indicated in Table 5-1. Theminimum point thickness is applicable at aI/locations.r-

Table 5-1Insulation Shield Thickness

Calculated Minimum Insulation Shield ThicknessDiameter Over the Minimum Maximum

Insulation Point Pointinches(mm) mils mm mils mm

0-2.000 40 1.02 80 2.03(0 - 50.80)

2.001 and larger 40 1.02 100 2.54(SO.83 and larger)

(See 9.4.13). The interface between the extruded insulation shield and the insulation shall be cylindricaland free from protrusions and irregularities that extend more than 5 mils (0.127 mm) into the insulation and 5mils (0.127 mm) into the extruded insulation shield.

If a semiconducting tape is utilized over the extruded insulation shield, the de resistance of the tape atroom temperature shall not exceed 10,000 ohms per unit square when determined in accordance with ASTM04496.

(See 9.4.13). The interface between the extruded insulation shield and the insulation shall be free of anyvoids larger than 2 mils (0.05 mm) in its greatest dimension.

The material(s) intended for extrusion as an insulation shield shall have an elongation of no less than 100percent after air oven aging for 168 hours at 121°C ±1 °C for insulations rated 90 °C (see 9.4.14). It shallalso meet brittleness requirements (see 10.3.4) at temperatures not warmer than -25°C.

(See 9.8.2). The volume resistivity of the extruded insulation shield shall not exceed 500 ohm-meter atthe maximum normal operating temperature and at a temperature of 110°C for cables with an emergencyoverload temperature rating of 130 °C.

Part 6METALLIC SHIELDING

A nonmagnetic metallic shielding consisting of a shield, sheath or combination thereof shall be appliedover the nonmetallic semiconducting layer. The metal shield/sheath shall be electrically continuous and freeof burrs throughout each cable length. The metal shield/sheath shall be applied in such a manner thatelectrical continuity or contiguity will not be distorted or disrupted during normal installation bending. Themetal shield/sheath should be designed to withstand the specified fault current and duration duty of the cablesystem's protective relaying and fault interrupting devices (see 1.3.1.e).

A bedding layer such as semiconducting tapes may be used over the extruded insulation shield to insurecable core expansion without damage to the metallic shield or cable core. The bedding layer shall besemiconducting and meet the requirements of part 5.

Metallic shielding types indicated as a sheath in 6.3 below are considered to meet the requirement of aradial moisture barrier in 6.4. Metallic shielding types indicated as a shield in 6.2 below are not considered tomeet the requirements of a radial moisture barrier in 6.4 without additional sealing components.

Note: The purchaser is cautioned that a metallic shield/sheath meeting the specified minimumrequirements shown in 6.2 and 6.3 below does not necessarily have sufficient fault current withstandcapability for all system faults. Coordination is required with worst case protective relaying and circuitbreaker performance while considering the cases of a fault within the cable system and external to it.ICEA Publication P-45-482 may be used to determine metallic shield/sheath fault-clejlring capability.

A tin coated or uncoated copper tape shall be at least 0.0045 inches (0.11 mm) thick and appliedhelically in intimate contact with the underlying semiconducting layer. Other nonmagnetic metal tapes haVingequivalent conductance may be used upon agreement between the manufacturer and purchaser. Joints inthe tape shall be made electrically continuous by welding, soldering, or brazing. Butted tapes shall not bepermitted. Tape(s) shall be lapped by at least 10% of the tape width or may be gapped by a maximum of20% and a minimum of 5 % of the tape width. The direction of lay may be right-hand or left-hand.

A longitudinally applied corrugated tape shield shall be annealed copper. The minimum thickness of thecorrugated tape shield before corrugation shall be 0.0075 inches (0.19 mm). Joints in the tape shall be madeelectrically continuous by welding, soldering, or brazing. The width of the corrugated tape shield shall be suchthat after corrugation the edges shall overlap by not less than 0.375 inches (9.5 mm) when the tape islongitudinally formed over the insulated core. The corrugation shall be at right angles to the axis of the cable,shall coincide exactly at the overlap, and shall be in contact with the underlying semiconducting layer.

A wire shield shall consist of a serving of tin coated or uncoated copper wires applied helically orlongitudinally in intimate contact with the underlying semiconducting layer. The minimum wire size shall be 18AWG. The minimum number of wires shall be based on a maximum calculated spacing between wires of 0.5

inches (12.7 mm). The length of lay of the helically applied wire shield shall be not less than six times norgreater than ten times the. calculated minimum diameter over the wire shield. The direction of lay may beright-hand or left-hand.

A flat strap shield shall consist of a serving of tin coated or uncoated copper straps applied helically inintimate contact with the underlying semiconducting layer. The minimum thickness of flat straps shall be0.020 inches (0.51 mm) and the width of the strap shall not be less than three times the strap thickness. Theminimum number of flat straps shall be based on a maximum calculated spacing between straps of 0.5inches (12.7 mm). The length of lay of the flat strap shield shall be not less than six times nor greater thanten times the calculated minimum diameter over the flat strap shield. The direction of lay may be right-handor left-hand.

A sheath of lead alloy (see Appendix I) shall be tightly formed over the underlying semiconducting layer.The thickness of the lead sheath shall be in accordance with Table 6-1 except when a higher value isrequired in order to meet the fault current requirement.

Table 6-1Lead Sheath Thickness

Calculated MinimumDiameter Over the Lead Sheath Thickness

Underlying SemiconductingLayer

Minimum Point Maximum Point

InchesMils Mils(mm) mm mm

0-2.00085 2.16 135 3.43(0- 50.80)

2.001 - 3.000100 2.54 150 3.81(50.83 - 76.20)

3.001 and larger115 2.92 170 4.32(76.23 and larger)

The sheath shall be aluminum alloy 1060 or 1350 or other alloy having not less than 99.45 % aluminum.The aluminum sheath shall be tightly formed around the core of the cable. A smooth sheath shall beconstructed by using a flat metal tape that is longitudinally folded around the cable core and seam welded orby applying over the cable core a seamless sheath or tube. The manufacturer shall determine the alloyunless otherwise agreed upon between the manufacturer and the purchaser. The thickness of the aluminumsheath shall be at least 0.020 inches (0.51 mm).

6.3.3 CONTINUOUSLY CORRUGATED SHEATH

folded around the cable core, seam welded, and corrugated or by applying over the cable core a seamlesssheath or tube which is then corrugated. When metal sheath is formed from a flat metal tape, the tapes usedshall be aluminum, aluminum alloy having not less than 99.45 % aluminum or copper. When the metalsheath is formed by applying a seamless sheath or tube the metal shall be aluminum or an aluminum alloyhaving not less than 99.45 % aluminum. The thickness of the aluminum sheath shall be at least 0.032 inches(0.81 mm). The thickness of the copper sheath shall be at least 0.020 inches (0.51 mm).

Crosslinked polyethylene cables with insulations designed by maximum stress criteria that are intendedfor wet locations shall incorporate a radial moisture barrier. A radial moisture barrier is optional for ethylenepropylene rubber insulated cables. Also, a radial moisture barrier is optional for crosslinked polyethyleneinsulated cables intended for dry locations. Radial moisture barriers include metallic sheaths, bonded metallicfoil laminates, or other alternate designs as agreed upon between the purchaser and manufacturer. Whenrequested the manufacturer shall demonstrate the effectiveness of the radial moisture barrier.

With the approval of the purchaser, any component(s) designed as an impediment to longitudinal waterpenetration may be incorporated in the interstices and/or the interfaces of the metallic shield/sheath. If thecomponent is a tape and is applied under the metallic shield/sheath or between different metallicshield/sheath members for composite metallic shield/sheaths, it must be semiconducting and meet therequirements of 5.4. Longitudinal water penetration resistance shall be determined in accordance with ICEAPublication T-34-664 and shall meet a minimum requirement of 5 psig.

Part 7JACKET

The jacket shall consist of a nonconducting thermoplastic material. Jackets are required for allconstructions unless otherwise agreed upon between the purchaser and manufacturer. The jacket materialshall be compatible with all cable components it contacts. A thermosetting jacket or other jacket materialsmay be supplied upon consulting the manufacturer. When tested in accordance with Part 9, the jacket shallmeet the applicable requirements. There shall be no water between underlying layers and the jacket inaccordance with 9.14.

7.1.1 Polyethylene, Black

This jacket shall consist of a black, low density (LOPE), linear low density (LLOPE), medium density(MOPE) or high density (HOPE) polyethylene compound suitable for exposure to sunlight. The jacket shallmeet the following requirements. Jacket irregularity inspection test shall be performed in accordance with 7.4(See Tables 7·4 and 7-5).

Table 7·1Polyethylene, Black

Physical Requirements LDPEILLDPE MOPE HOPE

Unaged Requirements

Tensile Strength, Minimumpsi 1700 2300 2500(MPa) (11.7) (15.9) (17.2)

Elongation at Rupture 350 350 350Minimum Percent

Aging RequirementsAfter Air Oven Aging at 100 °C ±1 °C for 48 hours

Tensile Strength. Minimum Percentage of 75 75 75Unaged Value

Elongation, Minimum 75 75 75Percentage of Unaged Value

Heat Distortion, Maximum 30 percent at 100 °C ±1 °C 110 °C ±1 °C 110 °C±1 °C

Environmental Stress Cracking No Cracks* No Cracks** NoCracks**

Absorption Coefficient 320 320 320Minimum 1000(absorbance/meter)

Base Resin Density (D23c,glcm~*** 0.910 • 0.925 0.926 - 0.940 0.941 - 0.965

• Use condition A with a full strength solution of Igepal CQ-630 or equivalent, as defined in ASTM 0 1693 .

•• Use condition B with a full strength solution of 1gepal CD-630 or equivalent, as defined in ASTM 0 1693 .

••• In lieu of testing finished cable jackets, a certification by the manufacturer of the polyethylene compound that this requirement hasbeen complied with shall suffice.

This jacket shall consist of a black, polyvinyl chloride (PVC) compound suitable for exposure to sunlight.The jacket shall meet the following requirements. Jacket irregularity inspection test shall be performed inaccordance with 7.4 (See Tables 7-4 and 7-5).

Table 7-2Polyvinyl Chloride

Physical Requirements Values

Unaged Requirements

Tensile Strength, Minimumpsi 1500

(MPa) (10.3)

Elongation at Rupture 100Minimum Percent

Aging RequirementsAfter Air Oven Aging at100°C ±1 °C for 120 hours

Tensile Strength, Minimum Percentage of 85Unaged Value

Elongation, Minimum 60Percentage of Unaged Value

Aging RequirementsAfter Oil Immersion Test at70°C ± 1 °C for 4 hours

Tensile Strength, Minimum 80Percentage of Unaged Value

Elongation, Minimum 60Percentage of Unaged Value

Heat Distortion at 121°C ±1 °C 50Maximum Percent

Heat Shock at 121°C ±1 °C No Cracks

Cold Elongation at -35°C 20Minimum Percent

The jacket material shall be applied over the metallic shield/sheath or a separator tape which iscompatible with the other components of the cable. If a separator tape is applied over the metallicshield/sheath, the tape may be either nonconducting or semiconducting. Jacket thickness shall be as statedin 7.2.1 or 7.2.2.

The jacket thickness shall be measured over the outer most point of the metallic shield and shall meetthe thickness requirements in Table 7-4. The separator tape, if present, shall not be included as part of thejacket thickness.

The jacket thickness shall be measured over the outer most point of the metallic sheath and shall meetthe thickness requirements in Table 7-5. The separator tape, if present, shall not be included as part of thejacket thickness.

An optional semiconducting coating may be applied to the outer surface of nonconducting jackets to aidin performing integrity test of the jacket in the field after installation. This coating may be graphite or othersuitable material. If this coating is applied, the jacket shall be tested with a dc voltage in lieu of spark testing.

If an extruded semiconducting layer is utilized and the properties of that layer meet either types in Table7-3 then the thickness of the extruded semiconducting layer can be considered an integral part of the totaljacket thickness provided it does not exceed 20% of the total jacket thickness.

A jacket over the metallic shield/sheath without a semiconducting coating shall withstand an alternatingcurrent spark test voltage. The test voltage for a given thickness and type of jacket shall not be less thanindicated in Tables 7-4 and 7-5. The voltage shall be applied between an electrode at the outside surface ofthe jacket and the metallic shield. The metallic shield shall be connected to ground during the test. The sparktest shall be conducted in accordance with lCEA T-27-581/NEMA We-53.

The jacket shall withstand a de voltage of 200 V/mil (8 kV/mm) of the average value of the specifiedminimum point and maximum point thickness of the jacket in Tables 7-4 and 7-5 with a maximum of 25 kVbetween the metallic sheath or shield and the semiconducting outer coating for a period of one minute.

Table 7-3Semiconducting Extruded Jacket Coating

Physical Requirements Type I Type II

Unaged Requirements

Tensile Strength, Minimumpsi 1200 1500(MPa) (8.27) (10.3)

Elongation at Rupture 100 150Minimum Percent

Aging Requirements

After Air Oven Aging at 100 °C ±1 °C for 121°C ±1 °C for48 hours 168 hours

Tensile Strength, Minimum Percentage of 75 75Unaged Value

Elongation, Minimum 100 75Percentage

Heat Distortion, Maximum 25 percent at 90°C ±1 °C 121°C ±1 °C

Volume ResistivityAt 25 °C±5 °C 100 100Maximum ohm-meter

Brittleness Temperature -10 -15°C, not warmer than

Table 7-4Jacket Thickness and Test Voltages for Tape or Wire Shield Cables

Calculated Minimum Jacket Thickness AC Spark Test VoltageDiameter Over the Metallic for

Shield Minimum Point Maximum Point Nonconducting Jackets

Inches mils mm mils mm kV(mm)

0-2.500 100 2.54 150 3.81 10.0(0 - 63.50)

2.501 and larger 125 3.18 185 4.70 12.5(63.53 and larger)

acket hickness an est otaaesfor eta heathed es

Calculated Minimum Jacket Thickness AC Spark Test VoltageDiameter Over the Sheath for

Minimum Point Maximum Point Nonconducting JacketsInches(mm) mils mm mils mm kV

0-2.25070 1.78 105 2.67 7.0

(0-57.15)

2.251 - 3.00085 2.16 135 3.43 7.5

(57.18 -76.20)

3.001 and larger100 2.54 160 4.06 10.0

(76.23 and larger)

Table 7-5dT V I M IS

Part 8CABLE IDENTIFICATION

The outer jacket surface of the cable shall be sUitably marked throughout its length by indent print oremboss print to a depth not greater than 15 percent of its thickness or by surface printing, at regular intervalswith no more than 6 inches (152 mm) of unmarked space between cable identification, with the followinginformation:

Manufacturer's Identification or trade nameSize of ConductorConductor MaterialType of InsulationVoltage RatingNominallnsuJation ThicknessYear of Manufacture

When center strand identification is requested by the purchaser, the center strand of each conductorshall be indented with the manufacturer's name and year of manufacture. This information shall be markedat regular intervals with no more than 12 inches (305 mm) between repetitions.

When sequential length marking is requested by the purchaser, the information shall be marked atregUlar intervals of 2 feet (610 mm) or 1 meter.

Part 9PRODUCTION TESTS

AU cables shall undergo production tests at the factory to determine their compliance with therequirements given in Parts 2, 3, 4, 5, 6, and 7. When there is a conflict between the production testmethods given in Part 9 and publications of other organizations to which reference is made, the requirementsgiven in Part 9 shall apply.

The tests in Part 9 may not be applicable to all materials or cables. To determine which tests are to bemade, refer to the parts in this publication that set forth the requirements to be met by the particular materialor cable.

Sampling frequency shall be as indicated in Table 9-3 ·Summary of Production Tests and SamplingFrequency Requirements".

The measurement of thickness for components having no minimum removability tension requirementsshall be made with either a micrometer or an optical measuring device. For all other extruded components,the measurement of thickness shall be made only with an optical measuring device. The micrometer andoptical measuring device shall be capable of making measurements accurate to at least 0.001 inch (0.025mm). The nominal thickness of the insulation shall be taken as one-fourth of the sum of four measurementsmade around the circumference of the same cable cross section. One of the four measurements shall be atthe minimum thickness point and one shall be at the maximum thickness point. Two additionalmeasurements shall be made half way between the minimum and maximum measurements around thesample circumference.

When a micrometer measuring device is used, the component shall be removed and the minimum andmaximum thickness determined.

When an optical measuring device is used, the minimum and maximum thickness shall be determinedfrom a specimen cut perpendicular to the axis of the sample so as to expose the full cross-section.

Table 9-1Test Specimens for Physical and Aging Tests

Total Number ofTest Specimens

For determination of unaged properties

Tensile strength and ultimate elongation 3tPermanent set 3t

For accelerated aging tests 3tFor oil immersion 3tHeat shock 1

Heat distortion 3tCold Elongation 3tStripping 1

tOne test specimen out of three shall be tested and the other two specimens held in reserve, except that when only one sample isselected, then all three test specimens shall be tested and the average of the results reported.

The test specimens shall be prepared using either ASTM 0412 Die B, E, Cor D.Specimens from the insulation shall be cut rectangular in section with a cross-section not greater than

0.025 square inch (16 mm2). In extreme cases, it may be necessary to use a segmental specimen.

Specimens for tests on jacket compounds shall be taken from the completed cable and cut parallel to theaxis of the cable. The test specimen shall be a segment cut with a sharp knife or a shaped specimen cut outwith a die and shall have a cross-sectional area not greater than 0.025 square inch (16 mm2

) afterirregularities, corrugations, and wires have been removed.

The test specimen shall have no surface incisions and shall be as free as possible from otherimperfections. Where necessary, surface irregularities such as corrugations due to stranding shall beremoved so that the test specimen will be smooth and of uniform thickness. If a jacket specimen passes theminimum requirement with irregularities, then their removal is not required.

Specimens shall not be heated, immersed in water, nor subjected to any mechanical or chemicaltreatment not specifically described in this standard.

9.4.7.1 Where the total cross-section of the insulation is used, the area shall be taken as the differencebetween the area of the circle whose diameter is the average outside diameter of the insulation and the areaof the circle whose diameter is the average outside diameter of the conductor shield.

9.4.7.2 Where a slice cut from the insulation by a knife held tangent to the wire is used and when the cross-section of the slice is a segment of a circle, the area shall be calculated as that of the segment of a circlewhose diameter is that of the insulation. The height of the segment is the wall of insulation on the side fromwhich the slice is taken.

When the cross-section of the slice is not a segment of a circle, the area shall be calculated from a directmeasurement of the volume or from the specific gravity and the weight of a known length of the specimenhaving a uniform cross-section.

The values may be obtained from a table giving the areas of segments of a unit circle for the ratio of theheight of the segment to the diameter of the circle.

9.4.7.3 When the conductor is large and the insulation thin and when a portion of a sector of a circle has tobe taken, the area shall be calculated as the thickness times the width.

This applies either to a straight test piece or to one stamped out with a die and assumes thatcorrugations have been removed.

9.4.7.4 When the conductor is large and the insulation thick and when a portion of a sector of a circle has tobe taken, the area shall be calculated as the proportional part of the area of the total cross-section.

9.4.7.5 The dimensions of specimens to be aged shall be determined before the aging test.

9.4.8 Unaged Test Procedures

Physical tests shall be made at room temperature. The test specimens shall be kept at roomtemperature for not less than 30 minutes prior to the test.

The tensile strength test shall be made with specimens prepared in accordance with 9.4.3 and 9.4.4.The length of all of the specimens for the test shall be equal. Gauge marks shall be 2 inches (50.8 mm)

apart when using ASTM B or E Die size and 1 inch (25.4 mm) apart when using ASTM C or D Die sizeexcept that 1 inch (25.4 mm) gauge marks shall be used for polyethylene regardless of the die size.Specimens shall be placed in the jaws of the testing machine with a maximum distance between jaws of 4inches (101.6 mm) except 2.5 inches (63.5 mm) for polyethylene. The specimen shall be stretched at therate of 20 inches (508 mm) per minute jaw speed until it breaks.

The tensile and elongation determinations for compounds for which the compound manufacturer certifiesthat the base resin content is more than 50 percent by weight of high density polyethylene (having a densityof 0.926 g/cm3 or greater), or total base polyethylene resin content (having a density of 0.926 g/cm3 orgreater), shall be permitted to be tested at a jaw separation rate of 2 inches (51 mm) per minute as analtemate to 20 inches (508 mm) per minute.

Specimens shall break between the gauge marks to be a valid test. The tensile strength shall becalculated based on the area of the unstretched specimen. Specimen length, gauge mark distance, and jawspeed shall be recorded with the results.

Elongation at rupture shall be determined simultaneously with the test for tensile strength and on thesame specimen.

The elongation shall be taken as the distance between gauge marks at rupture less the original gaugelength of the test specimen. The percentage of elongation at rupture is the elongation in inches divided bythe original gauge length and multiplied by 100. Specimen length, gauge mark distance, and jaw speed shallbe reported with results.

Test specimens of similar size and shape shall be prepared from each sample selected, three for thedetermination of the initial or unaged properties, and three for each aging test required for the insulation orjacket being tested. Simultaneous aging of different compounds should be avoided. One specimen of eachthree shall be tested and the other two held as spares except that, where only one sample is selected, allthree specimens shall be tested and the average of the results reported.

Samples shall be cut from the insulation with a cross-section not greater than 0.025 square inch (16mm2

).

Die-cut specimens shall be smoothed before being subjected to the accelerated aging tests wherever thethickness of the specimen will be 90 mils (2.29 mm) or greater before smoothing.

The test specimens shall be suspended vertically in such a manner that they are not in contact with eachother or with the side of the oven.

The aged specimens shall have a rest period of not less than 16 hours nor more than 96 hours betweenthe completion of the aging tests and the determination of physical properties. Physical tests on both theaged and unaged specimens shall be made at approximately the same time.

The test specimens shall be heated at the required temperature for the specified period in an ovenhaving forced circulation of fresh air. The oven temperature shall be controlled to ±1 °C.

The test specimens shall be immersed in ASTM No.2 or IRM 902 oil, described in ASTM D 471, at 70°C ±1 °C for 4 hours. At the end of this time, the specimens shall be removed from the oil, blotted to removeexcess oil, and allowed to rest at room temperature for a period of 16 to 96 hours. The tensile strength andelongation of the specimens shall then be determined in accordance with 9.4.8 at the same time that the

The hot creep test shall be determined in accordance with ICEA Publication T-28-562. The sample shallbe taken from the inner 25 percent of the insulation.

Any outer covering and the conductor shall be removed. A representative annular cross sectioncontaining the extruded conductor shield and insulation shield, shall be cut from the cable. The resultingwafer shall be at least 25 mils (0.64 mm) thick. The wafer may be further separated into concentric rings bycareful separation of the shield from the insulation. This may include the use of a punch to separate theconductor shield or insulation shield from most of the insulation.

The resulting wafer(s) or rings shall then be immersed in boiling decahydronaphthalene with 1 percent byweight Antioxidant 2246 (or other reagents specified in ASTM D 2765, such as xylene) for 5 hours using theequipment specified in ASTM D 2765. (This solution may be reused for subsequent tests provided that itworks as effectively as a fresh solution). The wafer(s) shall then be removed from the solvent and examinedfor shieldlinsulation interface continuity with a minimum 15-power magnification.

Total or partial separation of the semiconducting shields from the insulation is permissible. Partial loss ofthe shields is also permissible provided each shield is a continuous ring. If the conductor shield dissolves orcracks such that it does not maintain a continuous ring, the cable lot shall be rejected. If the insulation shielddissolves or cracks such that it does not maintain a continuous ring, the cable lot shall either be rejected bythe manufacturer or a sample of insulation shield from the same lot shall be subjected to the requirements of9.4.12.1 as a referee test.

Hot creep and set properties shall be determined at 150 °C ±2 °C in accordance with ICEA T-28-562 withthe sample removed from the cable core. The degree of crosslin king shall be adequate to limit elongation toa maximum of 100 percent and set to a maximum of 5 percent.

Samples shall be prepared by cutting a suitable length of cable helically or in some other convenientmanner to produce 20 consecutive thin wafers consisting of the conductor shield, insulation and insulationshield. Wafers shall be approximately 25 mils (0.64 mm) thick. The cutting blade shall be sharp and shallproduce wafers with uniform thickness and with very smooth surfaces. The sample shall be kept clean andshall be handled carefully to prevent surface damage and contamination.

The wafers shall be examined with 15 power magnification for voids, contaminants, gels, agglomerates,and ambers, as applicable, in the insulation. They shall also be examined for voids and protrusions betweenthe insulation and the conductor and insulation shields and conductor shield irregularities. Unfilled insulationsshall be examined using transmitted light. An optical coupling agent such as mineral oil, glycerin or siliconeoil shall be used to enhance the observation of imperfections within the wafers. For EPR and extruded

shields, a reflected light method shall be used. For void count, as applicable, the volume of the insulationexamined shall be calculated using any convenient technique. The results of this examination shall berecorded as pass or fail in the production test report.

If after examination according to 9.4.13.2, the size and/or number (as applicable) of voids, contaminants,agglomerates, gels, ambers, irregularities or protrusions exceeds the specified limits, the lot shall be dividedinto shipping lengths. One sample shall be taken from the beginning and end of each shipping length. Forthe shipping length to pass, both samples shall meet the requirements of this section. If either of the twosamples from the shipping length fails, the shipping length shall be rejected.

To measure the size of protrusions and conductor shield irregularities in wafers examined in 9.4.13.2, thewafers shall be viewed in an optical comparator or similar device which displays the wafer so that a straightedge can be used to facilitate the measurement. Protrusion shall be measured as shown in Figure 9-1.Conductor shield irregularities shall be measured as shown in Figure 9-2. This procedure is used on cablewafers with the conductor, jacket and metallic shield removed.

Figure 9-1Procedure to Measure Protrusions

Protrusion ofinsulationinto shield

InsulationShield

ConductorShield

Protrusion ofshield intoinsuation

Figure 9-2Procedure to Measure Irregularities

InsulationShield

ConductorShield

One test sample shall be molded from each lot of semiconducting material intended for extrusion on thecable.

For each test, three test specimens, each approximately 6 inches (152 mm) long and not greater than0.025 square inch (16 mm2) in cross-section, shall be cut out of the test sample with a die. All three testspecimens shall be tested and the results averaged.

If any test specimen fails to meet the requirements of any test, either before or after aging, that test shallbe repeated on two additional specimens taken from the same sample. Failure of either of the additionalspecimens shall indicate failure of the sample to conform to this standard.

If the thickness of the insulation or of the jacket of any reel is found to be less than the specified value,that reel shall be considered as not conforming to this standard, and a thickness measurement on each ofthe remaining reels shall be made.

When ten or more samples are selected from any single lot, all reels shall be considered as notconforming to this standard if more than 10 percent of the samples fail to meet the requirements for physicaland aging properties and thickness. If 10 percent or less fail, each reel shall be tested and shall be judgedupon the results of such individual tests. Where the number of samples selected in any single lot is less thanten, all reels shall be considered as not conforming to this standard if more than 20 percent of the samplesfail. If 20 percent or less fail, each reel, or length shall be tested and shall be judged upon the results of suchindividual tests.

Metallic shielding tape shall be removed from no less than 6 inches (152 mm) of the insulated conductor,except for corrugated tape shields where measurements shall be made on tape prior to corrugating andapplication to cable core. Measurements shall be made with a micrometer readable to at least 0.0001 inch(0.002 mm) having a presser foot 0.25 inch (6.35 mm) ± 0.01 inch in diameter and exerting a total force of3.0 ± 0.1 ounces (85 :t 3 grams), the load being applied by means of a weight. Five readings shall be taken atdifferent points on the sample, and the average of these readings shall be taken as the thickness of the tape.

Metallic shielding wire shall be removed from no less than 6 inches (152 mm) of the insulated conductor.Measurements shall be made with a micrometer or other suitable instrument readable to at least 0.0001 inch(0.002 mm). The wires shall be measured at each end of the sample and near the middle of the sample.The average of the three measurements shall be taken as the diameter.

The thickness of the sheath shall be determined by measurements made with a micrometer caliperhaving a rounded anvil or an optical measuring device. The micrometer and optical measuring device shallbe capable of making measurements accurate to at least 0.001 inch (0.025 mm). The measurements shallbe made directly on the sheath removed from the cable.

Metallic shielding strap shall be removed from no less than 6 inches (152 mm) of the insulatedconductor. Measurements shall be made with a micrometer or other suitable instrument readable to at least0.0001 inch (0.002 mm). The straps shall be measured for width and thickness at each end of the sampleand near the middle of the sample. The average of the three measurements for each dimension shall betaken as the width and thickness.

Measurement of the diameter over the insulation and the insulation shield shall be made with a diametertape accurate to 0.01 inches (0.25 mm).

When there are questions regarding compliance to this standard, measurements shall be made with anoptical measuring device or with calipers with a resolution of 0.0005 inch (0.013 mm) and accurate to 0.001inch (0.025 mm). At any given cross-section, the maximum diameter, minimum diameter, and two additionaldiameters which bisect the two angles formed by the maximum and minimum diameters shall be measured.The diameter for the cross-section shall be the average of the four values. This average diameter value shallbe used to determine if the cable meets the minimum and maximum limits given in Appendix C. All diametermeasurements shall be made on cable samples that contain the conductor.

For jackets with a wall thickness not exceeding 200 mils (5.0 mm), each test specimen shall consist of astrip taken from the jacket, whose width shall be at least 1.5 times its thickness but not less than 160 mils(4.0 mm); the strip shall be cut in the direction of the axis of the cable.

For jackets with a wall thickness exceeding 200 mils (5.0 mm), each test specimen shall consist of a striptaken from the jacket, whose width shall be at least 1.5 times its thickness but not less than 160 mils (4.0mm) and then ground or cut (avoiding heating) on the outer surface, to a thickness between 160 mils (4.0mm) and 200 mils (5.0 mm). This thickness shall be measured on the thicker part of the strip, whose widthshall be at least 1.5 times the thickness.

Each test specimen shall be tightly wound and fixed at ambient temperature on a mandrel to form aclose helix. The diameter of the mandrel and the number of turns are given in Table 9·2.

Table 9-2Bending Requirements for Heat Shock Test

Thickness of Test Specimen Number of Diameter of Mandrel

Inches mm Adjacent Turns Inches (mm)

0·0.039 0-1 6 0.079 (2)

0.040 - 0.079 1.01 - 2 6 0.157 (4)

0.080 - 0.118 2.03 - 3 6 0.236 (6)

0.119 - 0.157 3.02 -4 4 0.315 (8)

0.158 - 0.200 4.01 - 5 2 0.394 (10)

Each test specimen, on its mandrel, shall be placed in an air oven pre-heated to a temperature of 121 °C±1 °C. The test specimen shall be maintained at the specified temperature for 1 hour. At the end of the testperiod, the sample shall be examined without magnification.

9.7.3 Cold Elongation

9.7.3.1 Test Temperature

Physical tests shall be made at -35 °C. Test samples shall be conditioned at the test temperaturefor 1 hour prior to performing the tensile pUll.

The testing machine shall be in accordance with ASTM D 412 and equipped with a cooling device orinstalled in a cooling chamber. The test area (grips, chamber, extensometer) shall be conditioned at the testtemperature for a minimum of 3 hours to ensure stability of the test environment. As an altemate, thesamples may be removed from a cold chamber and tested within 15 seconds on a testing machine at roomtemperature.

The number of elongation specimens shall be in accordance with 9.4.3. The length of all of thespecimens for the test shall be equal. The test specimens shall be prepared using an ASTM D 412 Die Dand the gauge marks shall be 1 inch (25.4 mm) apart. Specimens shall be taken from the completed cableand cut parallel to the axis of the cable. The test specimen shall be a segment cut with a sharp knife or ashaped specimen cut out with a die. The wall thickness of the specimen after irregularities, corrugations, andwires have been removed shall not exceed 80 mils (2.0 mm) and not less than 30 mils (0.76 mm).Specimens can be ground or cut to meet thickness requirements. Specimens shall be left at ambienttemperature after cutting or grinding for at least 16 hours before die cutting.

Specimens shall be placed in the jaws of the testing machine with a maximum distance between jaws of4 inches (101.6 mm) except 2.5 inches (63.5 mm) for polyethylene. The specimen shall be stretched at the

rate of 2 inches (51 mm) per minute jaw speed until it breaks.Specimens shall break between the gauge marks to be a valid test. The elongation shall be taken as the

distance between gauge marks at rupture less the original gauge length of the test specimen. Thepercentage of elongation at rupture is the elongation in inches divided by the original gauge length andmultiplied by 100. Specimen length, gauge mark distance, elongation measurement system, and jaw speedshall be reported with results.

The samples shall be cut in half longitudinally and the conductor removed. Four silver-painted electrodesshall be applied to the conductor shield. The two potential electrodes (inner) shall be at least 2 inches (50.8mm) apart. A current electrode shall be placed at least 1 inch (25.4 mm) beyond each potential electrode.When a high degree of accuracy is not required, this test may be made with only two electrodes spaced atleast 2 inches (50.8 mm) apart.

The volume resistivity shall be calculated as follows:

Where:p = Volume resistivity in ohm-meters.R = Measured resistance in ohms.D= Diameter over the conductor stress control layer in inches.d = Diameter over the conductor in inches.L= Distance between potential electrodes in inches.

Four annular-ring electrodes shall be applied to the surface of the insulation shield layer or extrudedjacket coating. The two potential electrodes (inner) shall be at least 2 inches (50.8 mm) apart. A currentelectrode shall be placed at least 1 inch (25.4 mm) beyond each potential electrode. When a high degree ofaccuracy is not required, this test may be made with only two electrodes spaced at least 2 inches (50.8 mm)apart.

The volume resistivity shall be calculated as follows:

Where:p = Volume resistivity in ohm-meters.R = Measured resistance in ohms.D = Diameter over the insulation shield or semiconducting extruded jacket coating layer in inches.d = Diameter over the insulation or over the nonconducting jacket in inches.L = Distance between potential electrodes in inches.

A suitable instrument (e.g., Wheatstone, Kelvin Bridge or Ohmmeter) or instruments (e.g., voltmeter andammeter) shall be utilized for determining resistance and provide a source of 60 Hz ac or de voltage. Theenergy released in the conducting component shall not exceed 100 milli-watts.

A convection-type forced-draft, circulating air oven, shall be utilized capable of maintaining any constant(± 1°C) temperature up to 140°C, e.g., Hot Pack Model 1204-14, Blue M Model OV-490. or Precision TypeA.

For the four-electrode method, connect the two outer electrodes (current) in series with the currentsource and an ammeter or the current leads of a bridge. Connect the two inner electrodes (potential) topotentiometer leads of a bridge or to a voltmeter. A de or 60 Hz ac source can be used.

For the two-electrode method, connect the electrodes to an ohmmeter.The resistance of the conducting component between the electrodes shall be determined at the specified

temperature.

Five samples, each 1.5 feet (0.45 m) are required for the test. A length of the specimen cable 17.5 feet(5.25 m) long shall be laid out and straightened. The sample shall be marked at a point 5.0 feet (1.5 m) fromone end and then marked at 1.5 foot (0.45 m) intervals for a distance of 7.5 feet (2.25 m). The cable shall becut using a fine tooth saw at the 1.5 foot (0.45 m) intervals marked on the sample. The two 5.0 foot (1.5 m)end pieces from the original cable length are to be discarded.

The five 1.5 foot (0.45 m) long cable samples shall be placed in a forced air convection oven at atemperature of 50°C ±1 °C for a period of 2 hours. After the 2 hour period, the samples shall be removedfrom the oven and allowed to cool for 2 hours at room temperature. The heating and cooling cycle shall beperformed three times, if required.

At the end of each cooling period. the samples shall be measured for shrinkback using a micrometer, orpreferably an optical measuring device. The selected measuring device shall have a minimum resolution of0.001 inch (0.025 mm).

One reading shall be made from each end of each sample between the end of the conductor and theedge of the conductor shield interface at the point of circumference of the conductor where shrinkback ismaximum.

The measured values shall be in accordance with Tables 4-8 of Part 4. Only the sample with the mostshrinkback of the five shall be considered using the total shrinkback of both ends.

Except for physical and aging propertiesand thickness tests

Except for Amber, Agglomerate. Gel.Contaminant. Protrusion. Irregularity and

If all of the samples pass the applicable tests described in 9.4 through 9.9 and 9.13, the lot of cable thatthey represent shall be considered as meeting the requirements of this standard.

If any sample fails to pass these tests, the length of cable from which the sample was taken shall beconsidered as not meeting the requirements of this standard and another sample shall be taken from each ofthe two other lengths of the cable in the lot of cable under test. If either of the second samples fails to passthe test, the lot of cable shall be considered as not meeting the requirements of this standard. If both suchsecond samples pass the test, the lot of cable (except the length represented by the first sample), shall beconsidered as meeting the requirements of this standard.

Failure of any sample shall not preclude resampling and retesting the length of cable from which theoriginal sample was taken.

These tests consist of voltage tests on each shipping length of cable. The voltage shall be appliedbetween the conductor and the metallic shield with the metallic shield grounded. The rate of increase fromthe initially applied voltage to the specified test voltage shall be approximately uniform and shall be not morethan 100 percent in 10 seconds nor less than 100 percent in 60 seconds.

This test shall be made with an alternating potential from a transformer and generator of ample capacitybut in no case less than 5 kVA. The frequency of the test voltage shall be nominally between 49 and 61 Hzand shall have a wave shape approximating a sine wave as closely as possible.

The initially applied ac test voltage shall be not greater than the rated ac voltage of the cable under test.

Partial-discharge test shall be performed in accordance with ICEA Publication T-24-380. Themanufacturer shall wait a minimum of 20 days after the insulation extrusion process before the tests areperformed. The 20 day waiting period may be reduced by mutual agreement between the purchaser andmanufacturer when effective de-gassing procedures are used.

9.13 METHOD FOR DETERMINING DIELECTRIC CONSTANT AND DIELECTRICSTRENGTH OF EXTRUDED NONCONDUCTING POLYMERIC STRESSCONTROL LAYERS

Determination of dielectric constant and dielectric strength shall be performed in accordance with ICEAT-27-581/NEMA We-53.

Each end of each shipping length shall be examined for water under the jacket (if the cable is jacketed)and for water in the conductor (if cable does not have a sealant and is stranded).

If the cable is jacketed, 6 inches (152 mm) of the jacket shall be removed and the area under the jacketshall be visually examined for the presence of water. If water is present, or there is an indication that it was incontact with water, effective steps shall be taken to assure that the water is removed or that the length ofcable containing water under the jacket is discarded.

If the cable has an unsealed, stranded conductor, 6 inches (152 mm) of the conductor shall be exposedon each end. The strands shall be individually separated and visually examined. If water is present, theconductor shall be subjected to 9.14.4.

A suitable method of expelling water from the strands shall be used until the cable passes the ,Presenceof Water Test. As soon as possible after the procedure, both ends of the cable shall be sealed to prevent theingress of water during shipment and storage.

Each length of cable to be tested shall be sealed at one end over the insulation shield using a rubber capfilled with anhydrous calcium sulphate granules. The rubber cap shall be fitted with a valve.

Dry nitrogen gas or dry air shall be applied at the other end until the pressure is 15 psi (100 kPa) gauge.The valve on the rubber cap shall then be opened sufficiently to hear a flow of gas.

After 15 minutes, a check of the change of color of the granules in the rubber cap shall be made.

If the color has not completely changed to pink after 15 minutes, it is an indication that a tolerable amountof moisture is present in the strands. In the case of complete change in color of all granules, the water shallbe expelled from the conductor per 9.14.3.

Table 9-3Summary of Production Tests and Sampling Frequency Requirements

TEST STANDARD TEST METHOD MINIMUMREFERENCE REFERENCE FREQUENCY

Conductor

dc Resistance Part 2 9.3.1 and ICEA T-27-581 100%

Diameter Part 2 ICEA T-27-581 PlanA

Manufacturer

Temper Part 2 ASTMcertification thatrequired values aremet

Non-Metallic Conductor Shield

Elongation After Aging Part 3 9.4.14 PlanH

Volume Resistivity Part 3 9.8.1 Plan H

Thickness Part 3 9.4.2 PlanE

Voids, Protrusions and Irregularities Part 3 9.4.13 PlanA

Wafer Boil Part 3 9.4.12 Plan B

Spark Test (Non-conducting LayerPart 3 ICEA T·27-581 100%Only)

Insulation

Unaged and Aged Tensile andPart 4 9.4.8 and 9.4.9 PlanCElongation

Hot Creep Part 4 ICEA T-28-562 PlanB

Voids and Contaminants Part 4 9.4.13 Plan A

Diameter AppendixC 9.6 Plan A

Shrinkback Test (XLPE Only) Part 4 9.9 PlanC

Thickness and Eccentricity Part 4 9.4.2 Plan E

Non-Metallic InsulatIon Shield

Elongation After Aging Part 5 9.4.14 PlanH

Volume Resistivity Part 5 9.8.2 PlanH

Thickness Part 5 9.4.2 PlanE

Voids and Protrusions Part 5 9.4.13 PlanA

Water Soil Part 5 9.4.12 Plan B

Diameter AppendixC 9.6 PlanA

Table 9-3Summary of Production Tests and Sampling Frequency Requirements (Continued)

TESTSTANDARD TEST METHOD MINIMUMREFERENCE REFERENCE FREQUENCY

Metallic Shields

Dimensional Measurements Part 6 9.5 PlanE

Jackets

Unaged and Aged Tensile andPart 7 9.4.8 and 9.4.9 Plan D

Elongation

Thickness Part 7 9.4.2 Plan E

Other Tests Applicable to Jacket Supplied

Heat Distortion Part 7 ICEA T-27·581 Plan H

Heat Shock Part 7 9.7.1 PlanH

Cold Bend Part 7 ICEA T-27-581 Plan F

Oil Immersion Part 7 9.4.9.3 PlanH

Volume Resistivity Part 7 9.8.2 PianO

Electrical Tests

ae Withstand Test Part 4 9.11 Plan G

Partlal Discharge Test Part 4 ICEA T·24-36O PlanG

Jacket Spark or Withstand Test Part 7 ICEA T-27-581 100%

Other Tests

Moisture in Conductor Part 2 9.14 PlanG

Moisture Under Jacket Part 7 9.14 PlanG

One sample from each end of a manufacturer's master length. One sample from the outer end of eachlength is sufficient if at least one sample is taken every 10,000 feet (3,000 m).

Three samples shall be taken per cable core extruder run. The samples shall be taken near thebeginning, near the middle and near the end of each extruder run. The middle sample shall be eliminated ifthe extruder run is to be shipped in one continuous length.

Table 9-4PlanE

Quantity of Shipping LengthsNumber of TestsPer Extruder Run

1 ·2 each shipping length

3 -19 2

10% of shipping lengths20 and greater (Fractions shall be rounded to the

next higher integer value)

Table 9-5PlanF

Jacket Extruder Run Length-feet Number of(meters) Samples

less than 1,000 (300) 0

1,000 to 25,000 (300 to 8,000) 1

each additional 25,000 (8,000) 1

One test per shipping length. For multiple conductor assemblies, each conductor of a shipping lengthshall be tested.

Part 10QUALIFICATION TESTS

Qualification tests included in this standard are intended to demonstrate the adequacy of designs,manufacturing and materials to be used in high quality cable with the desired performance characteristics.

It is intended that the product fumished under this standard shall consistently comply with all of thequalification test requirements.

The tests are divided into three categories. The first is Cable Qualification. The second is JacketMaterial Qualification. The third is Other Qualification Tests.

If requested by the purchaser, the manufacturer shall furnish the purchaser with a certified copy of thequalification tests that represent the cable being purchased.

If a cable design was qualified in accordance with AEIC CS7·93 or AEIC CS6-96 specification, then itdoes not need to be requalified under this standard. Additional qualification tests in 10.2 and 10.3 arerequired to be performed, as applicable, in accordance with this standard.

Qualification tests, as outlined in Flow Chart 10-1, shall be performed for each cable design. Sampleswith suitable conductor sizes (copper or aluminum) and designs shall be tested within a given voltage class.The cable design passing qualification tests qualifies that voltage level and below, provided that thecalculated electrical stresses at the conductor for the designs at lower voltage levels do not exceed theelectrical stresses at the conductor calculated for the design selected for qualification purposes.

Qualification of a cable design at one emergency operating temperature (105-130 °C), qualifies all similardesigns at the same or lower emergency operating temperatures.

Qualification tests shall be performed for each manufacturing plant and for any changes of thecompound compositions for the insulation, the conductor shield or the insulation shield. A qualifiedsemiconducting conductor shield can be used as an inSUlation shield without requalification.

Qualification tests consist of various electrical tests and conditioning procedures. Cable samples areconditioned by a cable Bending Procedure (10.1.2) and a Thermal Cycling Procedure (10.1.3). ElectricalTests include a Hot ImpUlse Test (10.1.4) and an ac Voltage Withstand Test (10.1.5). Partial Discharge(10.1.6), and Dissipation Factor (10.1.7) are also measured. A Sample Dissection and Analysis (10.1.8) isalso performed in accordance with Flow Chart 10-1. Samples for the Impulse Test and the ac VoltageWithstand Test may be preconditioned as a single long length in the Cable Bending Procedure (10.1.2) andthe Thermal Cycling Procedure (10.1.3). Additionally, the Resistance Stability Test 10.3.3 shall be performedon every shield material. The manufacturer has the option to perform all tests on one sample. In this casethe Hot ImpUlse test shall be performed after the Dissipation Factor (10.1.7) is measured and before theSample Dissection and Analysis (10.1.8)

The Insulation Resistance Test 10.3.1 and Accelerated Water Absorption Test 10.3.2 shall be performedon each insulation material. The Discharge Resistance Test 10.3.5 shall be performed on EPR Class Iintended for Discharge-Resistant designs. The Brittleness Test 10.3.4 shall be performed on every shieldmaterial. The results shall be on file with the manufacturer and are not required to be reported on the CableDesign Qualification Test report unless specifically requested.

If a cable design has been qualified, and the metallic shield or sheath, or the jacket generic type ischanged while the cable core design, materials and manufacturing plant remains unchanged, the cable maybe requalified by completing the Cable Bending Procedure (10.1.2), the Thermal Cycling Procedure (10.1.3)and the Sample Dissection and Analysis (10.1.8). The generic metallic shield, sheath or jacket types arespecified in Table 10-1. Tests on the identical materials or design are not necessary to demonstrate thedesired performance results. For jacket design changes only, the voltage during heat cycle (10.1.3.1) is notrequired.

Table 10-1Generic Groupings of Cable Components

Metallic Shield and Sheaths:

a) Helically Applied Tape

b) Longitudinally Applied and Overlapped Corrugated Tape

c) Wire

d) Flat Strap

e) Lead Sheath

f) Smooth Aluminum Sheath

g) Continuously Corrugated Sheath

Nonconducting Jackets:

a) PVC

b) Low, medium and linear low density polyethylene

c) High density polyethylene

FLOW CHART 10-1QUALIFICATION TESTS

The cable sample(s) shall be bent around a cylindrical fixture at least one complete turn (36Ql!). Thecable shall be unwound and the bend repeated in the opposite direction. The sample(s) shall be bent at roomtemperature. A total of three bending cycles (three forward bends and three reverse bends) are required.The portion of the cable that is to be used for terminations need not be bent.

2. 25(d+D) + 5% for cable designs with lead, corrugated sheaths, bonded smooth aluminum sheaths orlongitudinally applied bonded metallic foil laminates (overlapped or welded) or,

After the Cable Bending Procedure (10.1.2), the sample(s) shall be installed in a pipe with a ·U· bend(18Q!l bend) sized so that when the cable is lying on the bottom surface of the pipe, there will beapproximately 2 inches (51 mm) of clearance between the top surface of the cable and the inner surface ofthe pipe. The ·U" bend shall be located near the midpoint of the pipe. The diameter of the "U· bend isspecified in 10.1.2.1 of the Cable Bending Procedure. Alternately, the cable may be wrapped with insulatingmaterial provided that the cable is formed into a loop with a "un bend as described above. If thermalinsulation is used, the "U" bend must be supported during this test. The sample shall be heated by circulationof current so that the conductor is at the designated emergency operating temperature for the cable designbeing tested. The temperature profile, as required in 10.1.3.1, shall be reported as part of the test report.

If thermal insulation material is used, it shall have a uniform thermal resistance along the cable length. Itshall also yield a temperature gradient across the cable that is within five degrees of the temperaturegradient, which would be obtained by placing the cable in a plastic pipe. The thermal gradient is defined asthe temperature difference between the conductor and the outside surface of the cable jacket.

To insure that the thermal insulation and the plastic pipe yield a similar temperature gradient, it may benecessary to set up a "dummy" length of cable using a pipe and thermal insulation material to compare thethermal characteristics of each.

2. The conductor shall be maintained at the specified temperature for the last two hours of the heatingperiod.

3. The heating period shall be follOWed by a cooling period of not less than 16 hours at roomtemperature.

During the thermal cycling described in 10.1.3.1, the sample(s)shall be energized at 2.0 Vg•

10.1.4 Hot Impulse Test Procedure

A hot impulse test shall be made in accordance with IEEE Standard No. 82, "Test Procedure for ImpulseVoltage Tests on Insulated Conductors,· on one of the preconditioned samples of cable as shown in FlowChart. The cable sample shall have a minimum active length is 30 feet (9.2 m). Hot impulse tests shall bemade with the sample placed in a 15 foot (4.5 m) long polyethylene or PVC conduit. The conduit diametershall be such that when the cable is lying on the bottom of the conduit, there shall be a clearance ofapproximately 2 inches (51 mm) between the top of the cable and the inner surface of the conduit.

For hot impulse tests, the temperature of the conductor shall be equal to the rated emergency overloadtemperature of the cable +0/-5 DC. The temperature shall be achieved by circulating current in the conductor.The temperature at which the cables are qualified shall be reported.

Ten impulses of each polarity with magnitude equal to the BIL shown in Table 4-6 shall be applied. Thevoltage shall then be raised over the BIL values listed in steps of approximately 10% of BIL with threeimpulses of negative polarity applied at each step and continuing to cable breakdown outside the terminals.The test may be discontinued when the limits of the test equipment are reached provided that the sample haspassed the BIL value specified in Table 4·6.

If the test has been discontinued without a cable breakdown, the sample shall be subjected to an acwithstand test at 2.5 V9 for a duration of 15 minutes. This test is conducted to verify that the cable has notfailed on the last impulse.

Impulse breakdown sites shall be dissected and the results shall be recorded and reported in thequalification test report.

The second preconditioned cable sample will be given an ac voltage test. The cable sample shall have aminimum active length of 30 feet (9.2 m). The sample, at room temperature, shall withstand an ac voltage of2.5 Vg for 2 hours. The voltage applied to the sample shall be of power frequency (49-61 hz) and thewaveform shall be SUbstantially sinusoidal.

After completion of the ac Voltage Withstand Test, the cable sample shall pass a partial discharge testas described in 4.3.2.1 of this standard except that the upper limit of the applied voltage shall be limited to 2.0Vg• The cable sample may be re-terminated for this test.

After completion of the partial discharge test, the sample shall have the dissipation factor measured. Thesample shall be heated by circulating current to the specified emergency operation temperature +0/-5 DC inan enclosed conduit. The diameter of the conduit shall be as outlined in 10.1.4. Alternately, the sample maybe wrapped in thermal insulation material. The dissipation factor shall be measured at Vg while the cable is atthe temperature specified above. The dissipation factor shall meet the requirements of Part 4.

A dissection of the cable samples subjected to Tests 10.1.2, 10.1.3 and 10.1.5 through 10.1.7 shall be madeupon completion of the testing. The findings of the dissection, including a comparison with an unaged cablespecimen of the same cable design shall be included with the qualification test data for information only.

The following qualification tests are for specific types of jacketing materials and shall be performed oneach compound. The jacket material tests or certification from the material supplier can be used by all cableproducers who propose to use the material. The material qualification is valid until the compound ischanged.

Except as otherwise specified in 10.2.1.1.1 and 10.2.1.1.2, this test shall be made in accordance withASTM 0 1693.

Three test specimens approximately 1.5 inches (38.1 mm) long, 0.5 inch (12.7 mm) wide, and 0.125 inch(3.18 mm) thick from the sample shall be molded from material intended for extrusion. The temperature ofthe molded specimens shall be lowered at any suitable rate. A slit made with a razor blade, approximately0.75 inch (19.0 mm) long and from 0.020 to 0.025 inch (0.51 to 0.64 mm) deep, shall be centrally located onone of the 1.5 inch by 0.5 inch (38.1 mm by 12.7 mm) surfaces.

The specimens shall be bent with the slit on the outside and placed in a test tube 200 mm long and 32mm in outside diameter. The cracking agent (Igepal C0-630, made by the GAF Corporation, or itsequivalent) shall be added to completely cover the specimen. The test tube, suitably closed by means suchas foil-covered cork, shall be placed in an oven at 50 °C ±1 °C for 48 hours. At the end of this period, thespecimens shall be removed, allowed to cool to room temperature, and inspected for cracking.

The absorption coefficient of polyethylene jacket compound shall be determined in accordance withASTM 0 3349. Three test specimens shall be tested and the average of the results reported.

The test may be performed using either a carbon-arc or xenon-arc apparatus. For a carbon-arcapparatus, five samples shall be mounted vertically in the specimen drum of the carbon-are-radiation and

water-spray exposure equipment per ASTM G 153. For the xenon-arc apparatus, five samples shall bemounted, top and bottom, on a rack of the xenon-are-radiation and water-spray exposure equipment perASTM G 155. The test method shall also be in accordance with ASTM G 153 or ASTM G 155 respectivelyusing Cycle 1 exposure conditions. The exposure time shall be 720 hours. Five die-cut specimens shall beprepared and tested for tensile and elongation from (1) unaged section of the cable jacket and (2) theconditioned samples, one specimen from each sample. The respective averages shall be calculated from thefive tensile strength and elongation values obtained for the conditioned samples. These averages shall bedivided by the equivalent averages of the five tensile and elongation values obtained for the unagedspecimens. This provides the tensile and elongation ratios for the jacket. The jacket is not sunlight resistant ifan 80 percent or greater retention for either the tensile or elongation after the 720 hours of exposure is notmaintained.

Accelerated water absorption test shall be performed in accordance with ICEA T-27-581/NEMA WC-53.Cables intended for installation in dry locations or having a radial moisture barrier in accordance withparagraph 6.4 do not have to meet the Accelerated Water Absorption Test. The insulation shall meet thefollOWing requirements:

Table1~2Accelerated Water Absorption Properties

Accelerated Insulation TypeWater Absorption Properties XLPE EPR

(Electrical Method) Class I & II

Water Immersion Temperature, °C 75 75

Dielectric Constant after 24 hours, maximum 3.5 4.0

Increase in capacitance, maximum, percent1 to 14 days 3.0 3.57to 14 days 1.5 1.5

Stability Factor after 14 days, maximum* 1.0

Alternate to Stability Factor - Stability Factor 0.5difference,1 to 14 days, maximum*

This test shall be performed on a sample of the material(s) intended for extrusion in accordance withASTM 0 746 using a Type I or II Specimen.

Compound mixing qualification of the insulation used for discharge-resistant cable designs is required.Once per month a sample of each qualified insulation shall be obtained from each compound mixing line andsubjected to this test.

The test shall be performed in accordance with ASTM 0 2275 using the following standard specimensand conditions.

From each test sample, three test specimens, each having a minimum diameter of 4 inches (101.6 mm)and a thickness of 0.060 inch ± 0.004 inch (1.52 mm ± 0.10 mm), shall be molded and suitably cured. Theprepared specimens shall be held for a minimum of 72 hours at room temperature followed by 16 hoursminimum in the same environment as the electrical discharge test.

The discharge test shall be performed in an area provided with a controlled-draft flow of conditioned air tomaintain the required relative humidity and temperature and with suitable venting to remove ozone and othergasses.

The electrodes shall be of stainless steel Type 309 or 310, with a surface finish of 16 lJin (0.406 IJm).Each upper electrode, to which the test voltage is applied, shall be a cylindrical rod having a diameter of0.250 inch ± 0.010 inch (6.35 mm ± 0.254 mm) and a length adjusted to provide a contact weight of 30grams ± 3 grams when positioned vertically atop the center of the insulation specimen. The contacting endshall be flat except for edges rounded to a radius of 0.035 inch ± 0.005 inch (0.89 mm ±O.127 mm). Thelower electrode(s) shall be electrically grounded and may be either (1) a common plate under, and extendingat least 2 inches (50.8 mm) beyond, the array of upper electrodes or (2) individual flat discs of 1.25 inch(31.75 mm) minimum diameter, centered under each upper electrode.

Part 11APPENDICES

APPENDIX ANEMA, ICEA, IEEE, ASTM AND ANSI STANDARDS (Normative)

WC 261EEMAC 201(2000)

WC 53/1CEA T-27-581(2000)

Standard Test Methods for Extruded Dielectric Power, Control, Instrumentation& Portable Cables for Test

Guide for Establishing Stability of Volume Resistivity for Conducting PolymericComponents of Power Cables

Guide for Conducting a Longitudinal Water Penetration Resistance Test forSealed Conductor

Guide for Establishing Compatibility of Sealed Conductor Filler Compounds withConductor Stress Control Materials

Guide for Conducting Longitudinal Water Penetration Resistance Tests onLongitudinal Water Blocked Cables

IEEE Standard Test Procedure for Impulse Voltage Tests on InsulatedConductors

Tough-Pitch Electrolytic Copper Refinery Shapes, Specification for

Concentric-Lay Stranded Copper Conductors, Hard, Medium-Hard, or Soft, Specification for

Aluminum 1350 Round Wire, Annealed and Intermediate Tempers, for Electrical Purposes,Specification for

Modified Concentric-lay-Stranded Copper Conductor for Use in Insulated Electrical Cables,Specification for

19 Wire Combination Unilay-Stranded Aluminum 1350 Conductors for SubsequentInsulation, Specification for

19 Wire Combination Unilay-Stranded Copper Conductors for Subsequent Insulation,Specification for

8000 Series Aluminum Alloy Wire for Electrical Purposes - Annealed and IntermediateTempers, Specification for

Concentric-Lay-Stranded Conductors of 8000 Series Aluminum Alloy for SubsequentCovering or Insulation, Specification for

Vulcanized Rubber and Thermoplastic Rubbers and Thermoplastic Elastomers - Tension,Test Methods for

Voltage Endurance of Solid Insulating Materials Subjected to Partial Discharges (Corona) onthe Surface, Test Method For

Determination of Gel Content and Swell Ratio of Crosslinked Ethylene Plastics, TestMethods for

Absorption Coefficient of Ethylene Polymer Material Pigmented with Carbon Black, TestMethod for

Operating Enclosed Carbon Arc Light Apparatus for Exposure of Nonmetallic Materials,Practice for

Operating Enclosed Xenon Arc Light Apparatus for Exposure of Nonmetallic Materials,Practice for

t Copies may be obtained from Global Engineering Documents, 15 Inverness Way East, Englewood, CO80112, USA.

Copies may be obtained from the American Society for Testing and Materials. 100 Barr Harbor Drive,West Conshohocken, PA 19429-2959, USA.

APPENDIX BEMERGENCY OVERLOADS (Normative)

Operations at the emergency overload temperature shall not exceed 1500 hours cumulative during thelifetime of the cable. Overload temperatures are 105 to 130°C for cables rated up to and including 138 kVand 105°C for cables rated above 138 kV.

The following discussion is intended to point out some of the factors which should be taken intoconsideration when operating extruded power cables at conductor temperatures in excess of 105 llC. It is notintended to be a comprehensive discussion. The cable manufacturer should be contacted for specific detailsregarding the operation of cables at temperatures above 90 llC.

Extensive tests sponsored by the Electric Power Research Institute (EPRI) have shown that conductiveand insulating thermoset materials commonly used in the construction of extruded underground distributionpower cables are capable of operating satisfactorily at 13QllC or higher. However, some electric power utilitiesand testing facilities have determined from experience and from tests that the maximum conductortemperature of a composite power cable constructed with these materials may need to be less than 13QllCwhich has been used in the past.

This limitation is necessary because some metallic shield designs are known to cause operatingproblems when the cable core diameter is large. This problem is primarily the result of thermal expansion ofthe cable core which can be very significant at conductor temperatures as high as 130 llC. Some metallicshield designs and their effect on cable cores at elevated emergency operating temperatures are discussedbelow.

Concentrically applied wire shields can imbed in the insulation shield when the cable core expands.Conductive, cloth-type bedding tapes over the insulation shield and carefully chosen lay factors can beemployed to minimize this problem.

Helically applied copper tape shields may stretch and lose contact with the insulation shield. They canalso wrinkle and crack. Properly chosen conductive, cloth-type semiconducting bedding tapes can be used tominimize this problem.

Lead sheaths have a tendency to stretch and lose contact with the insulation shield. Semiconductingbedding tapes over the insulation shield may be needed to minimize this problem. Corrugated or smoothaluminum or copper sheaths are also available.

Concentrically applied flat strap shields can cause severe deformation of the cable core. They can alsocause torsional forces which may damage the conductor. Flat strap shields are not recommended for XLPEcables that may operate at conductor temperatures near 130 llC.

Longitudinally folded corrugated copper tape shields are capable of expanding and contracting with thecable core with little or no adverse effects.

Commonly used jacketing materials such as low density polyethylene (LOPE) and polyvinyl chloride(PVC) can become soft and deform when the cable conductor is operated at elevated temperatures.Cracking of LOPE jackets has also been observed. Careful jacket extrusion and cooling techniques or otherjacket compounds may be useful alternatives.

The metallic shield designs mentioned are often used in combination with each other. The ability of thesecombinations to withstand elevated emergency operating temperatures is very much a function of the specificcombination employed.

Joint and termination limitations, cable environmental conditions as well as metallic shield designs mayrequire the use of lower emergency operating temperatures. Consideration of mechanical constraints ofcable accessories and to the cable installation must be given when cables are to be operated at hightemperatures.

In summary, the ability of a transmission cable system to withstand emergency temperatures is acomplex function of all of the materials used in the cable design. In addition, there is a shortage of researchand field experience for high voltage extruded insulation transmission cables operating for long periods attemperatures greater than 90~. The information presented here is only intended to give the cable user abrief review of some of the variables that must be considered before operating a cable system at emergencytemperatures above 105 RC. The cable manufacturer should be consulted for verification of the emergencyoperating temperature of a given cable design.

APPENDIXCPROCEDURE FOR DETERMINING THICKNESS REQUIREMENTS OF THE

INSULATION SHIELD, LEAD SHEATH AND JACKET (Normative)

C1 Insulation shield, lead sheath (if applicable) and jacket thicknesses shall be determined by calculatingdiameters as follows. This procedure is not intended for determining cable diameters. All dimensions are inmils.

DI = Calculated diameter over insulationC = Applicable nominal conductor diameter from Part 2 (for segmental use smallest diameter)AI = Semiconducting tape adder, if applicable (Manufacturer to determine)Cs = Minimum point extruded conductor shield thickness from Part 3T = Nominal insulation thickness (Manufacturer to determine)

D), = Calculated diameter under metallic shieldingD[ = Calculated diameter over insulationA2 = Semiconducting bedding layer diameter adder, if applicable (Manufacturer to determine)

DB = Calculated diameter under jacketD), = Calculated diameter under metallic shieldingTs = Metallic shield thickness (Manufacturer to determine - Minimum point thickness for lead and

smooth aluminum sheath, wire diameter, corrugation height for corrugated sheaths and tapeshields, flat strap thickness, equivalent thickness for helically applied tape shield or forcombination shield/sheaths the combined thickness)

A3 = Bedding layer or separator tape diameter adder, if applicable (Manufacturer to determine)

1500 compact segmental conductor, conductor shield, 650 nominal insulation wall, insulation shield,bedding tape, lead sheath and a LLDPE jacket, 138 kV cable.

C = 1375 milsA] = 48 mils (Manufacturer determined)2xCs = 48 mils (Cs= 24 from Part 3)2xT = 1300 mils (T= 650 Manufacturer determined)D] = 2n1 mils

Based on the calculated diameter over the insulation of 2.n1 inches per Table 5·1 insulation shieldthicknesses shall be 40 mils minimum point and 100 mils maximum point.

= 2n1= 80= 128= 2979

milsmilsmils (Manufacturer determined)mils

Based on the calculated diameter over the insulation of 2.979 inches per Table 6-1 lead sheaththicknesses shall be 100 mils minimum point and 150 mils maximum point.

= 2979= 200= -2= 3179

milsmils (Ts = 100 from Part 6)mils (Manufacturer determined)mils

Based on the calculated diameter over the insulation of 3.179 inches per Table 7-5 jacket thicknessesshall be 100 mils minimum point and 150 mils maximum point.

APPENDIX DCABLE COMPONENT FUNCTION (Informative)

01.1 FunctionA wire or combination of wires designed for carrying an electric current. The current could be due to a

normal load, emergency load or from a short-circuit condition. During installation, the conductor typically is amechanical load-bearing component of a cable.

01.2 MaterialCopper and aluminum are the two most commonly used conductor materials. At least the following

properties are to be considered when selecting the material of the conductor:

• Tensile Strength• Conductivity• Density• Specific Heat• Flexibility• Elongation• Coefficient of Expansion• Corrosion resistance

A nonconducting or semiconducting element in direct contact with the conductor and in intimate contact withthe inner surface of the insulation that acts as a stress control layer.

Its function is to eliminate ionization at the conductor and provide uniform voltage stress at the innersurface of the insulating wall. The potential of this element is essentially the same as the conductor.

The voltage stress within a cable is highest at the conductor (or semiconducting conductor shield)according to the following equation:

Vs = Vg /(Rxln(~»Where:

Vs = Radial voltage stress in kV/mmVg = Voltage to ground in kVR = Distance from center of conductor in mmD = Diameter over the insulationd = Diameter over the conductor (or semiconducting conductor shield)

·Since D and d only appear in the ratio DId, their units of measure do not matter as long as they arethe same.

From this equation, the radial voltage stress increases as "R' approaches adZ' with the voltage stressreaching it's maximum when R = dI2 at the surface of the conductor or conductor shield. Decreasing thediameter ad' of the conductor increases the radial voltage stresses. Without a smooth cylindrical conductorshield around a stranded conductor (see Figure 0·1), the voltage stresses would be concentrated around theindividual conductor strands increasing the potential for insulation breakdown and future faults.

CONDUCTORCONDUCTORSIDELDING

Conductor ShieldingFigure 0·1

The next layer of material on the cable is the insulation. It is relied upon to electrically insulate theconductor from other conductors or conducting parts or from ground. The insulation material must becapable of withstanding the electrical stresses that will be distributed across it when the conductor isenergized. It also has to withstand the thermal and mechanical forces that occur during installation andoperation of the cable.

Insulation shields are applied over the insulation material. Insulation shields generally consist of aconductive non-metallic shield and a metallic shield. The purpose of an insulation shield is to confine theelectric field within the insulation and to symmetrically distribute voltage stresses in the cable insulation.Cables without insulation shields have electric fields that extend partially within the insulation and whateverexists between the insulation and ground. If the field is sufficiently intense, it will cause the air near the cableto ionize and form corona (Figure 0-2a) which can damage the cable insulation or it can cause the insulationitself to break down. Non-uniform distribution of the electric field causes increased radial stress in portions ofthe insulation (Figure D-2a). A shield applied over the insulation results in a symmetrically distributed radialstress, thus utilizing the insulation to its greatest efficiency (Figure D-2b). The stress at theinsulationlinsulation shield interface is an important parameter when selecting accessories. This stress canbe calculated with the following formula.

Where:Gmin = Voltage stress at the insulation/insulation shield interface in kV/mmVg = Voltage to ground in kVRj = Radius over the insulation in mmR, = Radius of the conductor shieldlinsulation interface in mm.

Semiconducting elements applied directly over and in intimate contact with the outer surface of theinsulation. When effectively grounded, its function is to confine the dielectric stress to the underlyinginsulation. Additionally, with discharge free designs, it eliminates ionization at the surface of the insulation.

A nonmagnetic, metallic material applied over the semiconducting shield. The purpose of the metallicshield is to serve as a current-carrying medium for charging and leakage currents and to provide a solidground plane. If the metallic shield is large enough, it can also be used to carry neutral currents, unbalancedphase currents and fault currents. The metallic shield can consist of wires, flat straps, tape, foils or a sheath.

SEMI-CONDUCTOR

HIGH STRESSCONCENTRATION

The jacket is a covering that provides the functions listed in Table D-1.The jacket can either benonconducting or semiconducting.

TABLE 0-1Jacket Function

Mechanical Jackets provide a certain amount of protection to the cable core fromProtection mechanical abuse such as abrasion, scoring and impact and sidewall

bearing pressures that occur during handling and installation.

Chemical Jackets can provide protection from certain chemicals that might beProtection detrimental to the cable core.

Ion Filtration Research has shown that many of the contaminants found in cableinsulations have migrated into the cable from the surrounding soil.Jackets, though not typically designed for this, do filter out some of theseions as moisture migrates into the cable. As a general rule, the ability ofthe jacket to filter ions will increase as the thickness of the jacket wallincreases.

Corrosion Experience has shown that the metallic shields of un-jacketed cables willResistance corrode in many types of soil. The application of a jacket can greatly

reduce this corrosion.

Moisture Moisture penetration is a major contributor to the deterioration of cableMigration insulation.Jackets can reduce the rate at which moisture migrates into the

cable core.

Electrical The jacket serves a very important electrical function in bonded cablesystems such as single-point bonding and cross bonding. To workproperly and avoid rapid corrosion phenomena, these bonding systemsrequire that the metallic shield of the cable and joint are electrically isolatedfrom earth ootential.

APPENDIX EHANDLING AND INSTALLATION PARAMETERS (Informative)

E1 INSTAllATION TEMPERATURES

All cable manufactured to this standard can be safely handled if not subjected to temperatures lower than·10 °C in the twenty four hour period preceding installation. For installation during colder temperaturescontact the cable manufacturer for cable suitability or recommended practices.

The limits shown in Table E-1 may not be suitable for conduit bends, sheaves, or other curved surfacesaround which the cable may be pulled under tension while being installed due to sidewall bearing pressurelimits of the cable. The minimum radius specified refers to the inner radius of the cable bend and not to theaxis of the cable.

Table E-1Recommended Minimum Bending Radius

Shield or Sheath Type Ratio of Bend Radiusto Cable 0.0.*

Helically Applied Flat Tape 20

Longitudinally Applied Corrugated Tape 20

Wires or Flat Straps Shields 18

Lead Sheath 16

Non Bonded Smooth Aluminum Sheath 40

Bonded Smooth Aluminum Sheath 20

Corrugated Sheath (copper or aluminum) 20

The manufacturer shall determine the minimum diameter of the drum of the reel. Information on reelconstruction and sizing may be found in NEMA Publication No. WC 26, Binational Wire and CablePackaging.

Consult the cable manufacturer for recommended maximum pulling tensions and maximum sidewallbearing pressures.

Tests on new installations are carried out when the installation of the cable and its accessories has beencompleted. By agreement between the manufacturer and the purchaser, an ac voltage at a frequencybetween 20 Hz and 300 Hz, in accordance with one of the following may be used:

E5.1.1 Test for 1 hour with a voltage of 1.4 Vg to 1.7 Vg I depending on practical operational conditions.

E5.1.2 Test for at least 24 hours with the normal operating voltage of the system.

If a semiconducting coating is applied over the jacket, the jacket maybe tested with a de voltage. A dcvoltage of 150 Vlmil (6 kVlmm) of the average value of the specified minimum point and maximum pointthickness of the jacket with a maximum of 24 kV between the metallic shield/sheath and the semiconductingouter coating shall be applied for one minute.

APPENDIX FTRADITIONAL INSULATION WALL THICKNESS (Informative)

Table F-1Traditional Insulation Thickness from AEIC CS7-93, Test Voltages and Conductor Sizes

Rated Circuit Minimum Average ac Test VoltageVoltage, Conductor Conductor

Phase-to-Phase Size, Size,Insulation Thickness 15 Min. Test 30 Min. Test

Voltage (kcmll) (mm2) Mils (mm)3.0Vg 2.5Vg

(kV) (kV) (kV)

69 500-2000 253-1013 650 (16.2) 120 100

115 750-3000 380-1520 800 (20.3) 200 160

138 750-3000 380-1520 850 (21.6) 240 200

I ••otes on Table F-1 :1. Either the 15 minute or the 30 minute ac test is required. Ac test levels for the appropriate rated voltage

are to be used as the basis for ac testing should insulation thickness other than those in Table F-1 beutilized. All ac tests shall be conducted at room temperature and at power frequency (49-61 Hz). Thewaveform shall be substantially sinusoidal. All ac voltages are rms values.

2. The actual operating voltage shall not exceed the rated circuit voltage by more than (a) 5 percent duringcontinuous operation or (b) 10 percent during emergencies lasting not more than 15 minutes.

3. The cable insulation thickness specified is for application where the system is provided with circuitprotection such that ground faults will be cleared as rapidly as possible, but in any case within oneminute. While these cables are applicable to installations which are on grounded systems, they may alsobe used on other cable systems, provided the above clearing requirements are met in completely de-energizing the faulted section.

4. For other voltage ratings and conductor sizes, specific agreement between purchaser and manufacturerin the selection of insulation thickness for each application is required. When the purchaser isconsidering conductor sizes or insulation wall thickness less than the values shown in Table F-1, theeffects of maximum voltage stresses should be evaluated.

5. There may be unusual installations and/or operating conditions where mechanical considerations dictatethe use of a larger insulation thickness. When such conditions are anticipated, the purchaser shouldconsult with the cable supplier to determine the appropriate insulation thickness.

6. It is recommended that the minimum size conductor be in accordance with Table F-1.7. AEIC CS7-93 did not include thicknesses for greater than 138 kV class cables.8. A radial moisture barrier is optional on cables with traditional insulation wall thicknesses as shown in

Table F-1.

APPENDIXGADDITIONAL SHIELD WIRE AND CONDUCTOR INFORMATION (Informative)

TableG-1Solid Copper Shield Wires

Approximate WeightConductor CopperSize,

AWGorkcmll Pounds per 1000 glmFeet

20 3.10 4.61

19 3.90 5.81

18 4.92 7.32

17 6.21 9.24

16 7.81 11.6

15 9.87 14.7

14 12.4 18.5

13 15.7 23.4

12 19.8 29.4

11 24.9 37.1

10 31.43 46.77

9 39.62 58.95

8 49.98 74.38

ICEA S-108-72G-2004 DATE: 7/15104

Table G-2Concentric Stranded Class B Aluminum and Copper Conductors

Approximate Diameter of Approximate WeightConductor Number of Each Strand Aluminum CopperSlze,AWGor Strandskcmll mils Pounds per glm Pounds per gImmm 1000 Feet 1000 Feet

250 37 82.2 2.09 235 349 n2 1150300 37 90.0 2.29 282 419 925 1380350 37 97.3 2.47 329 489 1080 1610400 37 104.0 2.64 376 559 1236 1840450 37 110.3 2.80 422 629 1390 2070500 37 116.2 2.95 469 699 1542 2300550 61 95.0 2.41 517 768 1700 2530600 61 99.2 2.52 563 838 1850 2760650 61 103.2 2.62 610 908 2006 2990700 61 107.1 2.72 657 978 2160 3220750 61 110.9 2.82 704 1050 2316 3450800 61 114.5 2.91 751 1120 2469 3680900 61 121.5 3.09 845 1260 2780 41401000 61 128.0 3.25 939 1400 3086 45901100 91 109.9 2.79 1032 1540 3394 50501200 91 114.8 2.92 1126 1680 3703 55101250 91 117.2 2.98 1173 1750 3859 57401300 91 119.5 3.04 1220 1820 4012 59701400 91 124.0 3.15 1313 1960 4320 64301500 91 128.4 3.26 1408 2100 4632 68901600 127 112.2 2.85 1501 2240 4936 73501700 127 115.7 2.94 1596 2370 5249 78101750 127 117.4 2.98 1643 2440 5403 80401800 127 119.1 3.02 1691 2510 5562 82701900 127 122.3 3.11 1783 2650 5865 87302000 127 125.5 3.19 1an 2790 6176 91902250 127 133.1 3.38 2132 3170 7015 104402500 127 140.3 3.56 2369 3530 n94 116002750 169 127.6 3.24 2607 3880 8579 12nO3000 169 133.2 3.38 2841 4230 9349 139103250 169 138.7 3.52 3111 4630 10235 152303500 169 143.9 3.66 3348 4980 11017 164003750 217 131.5 3.34 3590 5340 11813 175804000 217 135.8 3.45 3829 5700 12598 18750

ICEA S-108-720-2004 DATE: 7/15/04

TableG-3Concentric Stranded Class C and 0 Aluminum and Copper Conductors

ClassC Class DConductor Approximate Diameter of Each Approximate Diameter of Each

Size, AWGor Number of Strand Number of Strandkemll Strands Strands

mils mm mils mm

250 61 64.0 1.63 91 52.4 1.33300 61 70.1 1.78 91 27.4 1.46350 61 75.7 1.92 91 62.0 1.57400 61 81.0 2.06 91 66.3 1.68450 61 85.9 2.18 91 70.3 1.79500 61 90.5 2.30 91 74.1 1.88550 91 77.7 1.97 127 65.8 1.67600 91 81.2 2.06 127 68.7 1.74650 91 84.5 2.15 127 71.5 1.82700 91 87.7 2.23 127 74.2 1.88750 91 90.8 2.31 127 76.8 1.95800 91 93.8 2.38 127 79.4 2.02900 91 99.4 2.53 127 84.2 2.141000 91 104.8 2.66 127 88.7 2.251100 127 93.1 2.36 169 80.7 2.051200 127 97.2 2.47 169 84.3 2.141250 127 99.2 2.52 169 86.0 2.181300 127 101.2 2.57 169 87.7 2.231400 127 105.0 2.67 169 91.0 2.311500 127 108.7 2.76 169 94.2 2.391600 169 97.3 2.47 217 85.9 2.181700 169 100.3 2.55 217 88.5 2.251750 169 101.8 2.59 217 89.8 2.281800 169 103.2 2.62 217 91.1 2.311900 169 106.0 2.69 217 93.6 2.382000 169 108.8 2.76 217 96.0 2.442250 169 115.4 2.93 217 101.8 2.592500 169 121.6 3.09 217 107.3 2.732750 217 112.6 2.86 271 100.7 2.563000 217 117.6 2.99 271 105.2 2.673250 217 122.4 3.11 271 109.5 2.783500 217 127.0 3.23 271 113.6 2.893750 271 117.6 2.99 271 117.6 2.994000 271 121.5 3.09 271 121.5 3.09

NOTE: The weights 01Class C and Class 0 conductors are the same as for the equivalent Class B conductor (see Table G-2).

APPENDIXHETHYLENE ALKENE COPOLYMER (EAM) (Informative)

The purpose of this discussion is to familiarize the reader with the chemical designation, EAM. Cablemanufacturers may desire to supply a filled or unfilled EAM compound where specifications require athermoset material such as XLPE, TRXLPE or EPR.

Ethylene alkene copolymer (EAM) is the ASTM nomenclature (E-Ethylene, A-Alkene and M-repeatingCH2 unit of the saturated polymer backbone) for copolymers consisting of ethylene and an alkenecomonomer. The chemical nomenclature 'alkene', which includes ethylene, is defined by the InternationalUnion of Pure and Applied Chemistry (IUPAC) in its pUblication Nomenclature of Organic Chemistry asfollows:

"Alkenes are hydrocarbons with a carbon-carbon double bond. Specific alkenes are named as aderivative of the parent alkane, which is the saturated form, Le., no carbon-carbon double or triplebonds. Alkanes are named according to the number of carbon atoms in the chain. The first fourmembers of the alkane series (methane, ethane, propane, and butane) came into common usebefore any attempt was made to systematize nomenclature. Those with 5 and greater carbon atomsare derived from Greek numbers (penta, hexa, etc.)."

Continuing technological developments in the manufacture of polymers for wire and cable applicationshave resulted in the ability to polymerize (chemically join) ethylene with other monomers such as butene,hexene and octene rather than the conventional propylene. Polymers can be manufactured in variousways, as can any copolymer of ethylene and an alkene. These variations include the type ofpolymerization catalyst/co-catalyst, process conditions, molecular weight, ethylene/comonomer ratio, andethylene (or comonomer) distribution. The resultant polymers may provide improvements while complyingwith applicable requirements in ICEA standards.

As the industry progresses towards performance based standards, it is appropriate to consider a moregeneral material classification such as EAM, rather than create a series of ethylene based polymericdesignations, such as EO (Ethylene Octene), EH (Ethylene Hexene) or EB (Ethylene Butene).

APPENDIX ISPECIFICATION FOR ALLOY LEAD SHEATHS (Informative)

11 PURPOSE

The purpose of this appendix is to provide a definition for a number of alloy lead sheaths that havebeen used with insulated cables. It is not intended to be a comprehensive listing. Other alloy leadsheaths may be fumished if the composition is mutually agreed upon by the purchaser and themanufacturer.

This appendix defines refined lead in pig form for the 1/2C, E, F-3 and copper bearing arsenical alloylead sheaths as permitted by Part 6 of this standard.

The lead shall meet all requirements of ASTM B 29 except the chemical composition in percent byweight shall be in accordance with Table 1-1.

TABLE 1-1CHEMICAL REQUIREMENTS FOR ALLOY LEAD SHEATHS

ComDosition. Welaht %Alloy 1/2C Alloy E Alloy F-3 Copper Bearing

Type Element: (Sn-Cd) (Sn-Sb) (Sn-Bi-As) Arsenical AlloyAntimony max. 0.005 0.25 0.01 0.004(Sb) min. ... 0.15 ... ...Arsenic max. 0.005 0.005 0.20 0.21(As) min. ... ·.. 0.10 0.18Bismuth max. 0.05 0.05 0.15 0.025(Bn min. ... ... 0.05 ...Cadmium max. 0.09 0.02 ... ...(Cd) min. 0.06 ... ... ...Copper max. 0.06 0.06 0.01 0.08(Cu) min. ... ·.. ... 0.04Silver max. 0.005 0.005 ... 0.002(Ao) min. ... ... ... ...Tellurium max. 0.005 0.005 Nil ...(Te) min. ... .,. ." '"

Tin max. 0.22 0.45 0.15 0.18(Sn) min. 0.18 0.35 0.08 0.12Zinc max. 0.002 0.002 ... 0.001(Zn) min. ... ·.. '" ...Lead max. The The ... The(Pb) min. remainder remainder 99.40 remainderOther Elements max. 0.01 0.01 The ...

remainder

Note(s):Alloy 1/2C and Alloy E lead types are considered to be "soft" alloys. Alloy F-3 and Copper-BearingArsenical lead types are considered to be "hard" alloys. .