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IBM Systems and Technology Group
5/24/2014 © 2014 IBM Corporation
System Scaling Opportunities for Future IT Systems
Jon A. Casey
IBM FellowIBM Systems and Technology Group
IBM Systems and Technology Group
© 2014 IBM Corporation2 5/24/20142
Data growth will drive the new IT model
Dimensions of data growth
Terabytes to
exabytes of
existing data
to process
Structured,
unstructured,
text, multimedia
Streaming data,
milliseconds to
seconds to
respond
Uncertainty
from inconsistency,
ambiguities, etc.
Variety
Volume Velocity
Veracity
Source: International Business Machines 2013
The Data is in the Cloud !
The Compute will move to the Data!
IBM Systems and Technology Group
© 2014 IBM Corporation3 5/24/2014
Changes in the compute model –memory centric computing
3 24 May 2014
Data lives on disk and tape
Move data to CPU as needed
Deep Storage Hierarchy
Data lives in persistent memory
Many CPU/GPU’s surround and use
Shallow/Flat Storage Hierarchy
Old Compute-centric Model New Data-centric Model
Massive Parallelism
Persistent Memory
Huge impact on hardware, systems software, and application design
Open Architecture, Software Defined Environment
Flash Phase Change
Manycore FPGA
input
output
von Neumann architecture Non von Neumann architecture
IBM Systems and Technology Group
© 2014 IBM Corporation4 5/24/2014
System Scale In
Memory
Switching
Storage
A new paradigm for cognitive systems for new workloads
Scale-In Through Silicon and Packaging Innovation
IBM Systems and Technology Group
© 2014 IBM Corporation5 5/24/2014
Will Silicon scaling and integration get us to the goal line?
IBM Systems and Technology Group
© 2014 IBM Corporation6 5/24/20146 24 May 2014
Scaling can and will continue to at
least the “7 nm” node
Economics will likely be
the key challenge to
continued Silicon scaling
0
0.2
0.4
0.6
0.8
1
1.2
050100
Litho node (nm)
Normalized cost (to
90nm)
Cost per transistor has begun to saturate
45 nm 32 nm 22 nm 14 nm 10 nm
Immersion
(ArFi)
2nd Generation
Immersion
3rd Gen ArFi
w/ Source Mask
Optimization
(SMO)
4th Gen ArFi w/
SMO & Double
Patterning
(DPL)
5th Gen ArFi
w/ Multilayer
Patterning or
EUV
IBM Systems and Technology Group
© 2014 IBM Corporation7 5/24/2014
Heterogeneous Integration and 3Di : “Volumetric Scaling”
� Requires co-development of Silicon and Packaging solutions
– Packaging is the key technology for volumetric scaling
• 2D and 3D technologies
• High performance I/O
• Optics
• CPI: Chip-Package Interaction
• Power and thermal management
� Provides lower cost solutions to enable system performance
– Si cost:performance metric is very challenged
� Allows for use of mixed semiconductor technologies
– Enables use of lower cost technologies for less performance sensitive functions
� Key Technologies
– CSP (chip scale packages)
– SIP (system in package)
– Interposers
• Si and other interposer materials
– 3Di
– Photonics
Controlled by Foundry
Controlled by OSATOptional
IBM Systems and Technology Group
© 2014 IBM Corporation8 5/24/2014
MCM, Interposer and 3D Technology for Heterogeneous Integration
Development
Low-Moderate
Mod. High
Down to ~5µµµµm
L/S
V. Good
Organic
Interposer
AvailableDevelopmentAvailableAvailableAvailableAvailability
Application
DependentTBDModerateModerateHighCost
ExcellentTailorableExcellentMod. HighV. GoodCTE Induced
Stress
Si LithographyDisplay LikeSi-Like
Lithography
Down to ~10µµµµm
L/S
Mechanically
defined
Feature
Dimensions
LossyExcellentLossyGoodAdequateDielectric
Properties
3DGlass InterposerSi InterposerOrganic MCMCeramic MCM
L/S = Lines and Spaces
IBM Systems and Technology Group
© 2014 IBM Corporation9 5/24/2014
Summary
� Silicon performance advancement becoming more challenging as scaling is becoming more costly
– Need to look beyond CMOS for cost effective technology solutions
� Integrated co-development of Silicon and packaging solutions required to achieve new technologies with superior cost:performance metrics
� Volumetric scaling will be critical to future performance enablement
– Tightly coupled modules and components
– CSP
– 3Di technology
– Interposer integration
– High performance I/O and optics