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MMG3006NT1
1RF Device DataNXP Semiconductors
Heterojunction Bipolar TransistorTechnology (InGaP HBT)Broadband High Linearity AmplifierThe MMG3006NT1 is a general purpose amplifier that is internally input
prematched and designed for a broad range of Class A, small--signal, highlinearity, general purpose applications. It is suitable for applications withfrequencies from 400 to 2400 MHz such as cellular, PCS, WLL, PHS,VHF, UHF, UMTS and general small--signal RF.
Features Frequency: 400--2400 MHz P1dB: 33 dBm @ 900 MHz Small--signal gain: 17.5 dB @ 900 MHz Third order output intercept point: 49 dBm @ 900 MHz Single 5 V supply Internally input prematched to 50 ohms
400--2400 MHz, 17.5 dB33 dBm
InGaP HBT GPA
MMG3006NT1
QFN 4 4--16L
Table 1. Typical Performance (1)
Characteristic Symbol900MHz
1960MHz
2140MHz Unit
Small--Signal Gain(S21)
Gp 17.5 14 14 dB
Input Return Loss(S11)
IRL --8 --9 --12 dB
Output Return Loss(S22)
ORL --13 --14 --18 dB
Power Output @1dBCompression
P1db 33 33 33 dBm
Third Order OutputIntercept Point
OIP3 49 49 49 dBm
1. VDC = 5 Vdc, TA = 25C, 50 ohm system, application circuittuned for specified frequency.
Table 2. Maximum Ratings
Rating Symbol Value Unit
Supply Voltage VDC 6 V
Supply Current IDC 1400 mA
RF Input Power Pin 28 dBm
Storage Temperature Range Tstg --65 to +150 C
Junction Temperature TJ 175 C
Table 3. Thermal Characteristics
Characteristic Symbol Value (2) Unit
Thermal Resistance, Junction to CaseCase Temperature 89C, 5 Vdc, 850 mA, no RF applied
RJC 7.8 C/W
2. Refer to AN1955,Thermal Measurement Methodology of RF Power Amplifiers. Go to http://www.nxp.com/RF and search for AN1955.
Document Number: MMG3006NT1Rev. 6, 12/2017
NXP SemiconductorsTechnical Data
2008, 2010–2011, 2014, 2017 NXP B.V.
2RF Device Data
NXP Semiconductors
MMG3006NT1
Table 4. Electrical Characteristics (VDC = 5 Vdc, 900 MHz, TA = 25C, 50 ohm system, in NXP Application Circuit)
Characteristic Symbol Min Typ Max Unit
Small--Signal Gain (S21) Gp 16.5 17.5 — dB
Input Return Loss (S11) IRL — --8 — dB
Output Return Loss (S22) ORL — --13 — dB
Power Output @ 1dB Compression P1dB — 33 — dBm
Third Order Output Intercept Point OIP3 — 49 — dBm
Noise Figure NF — 6.6 — dB
Supply Current IDC 760 850 960 mA
Supply Voltage VDC — 5 — V
Table 5. Functional Pin Description
NamePin
Number Description
VBA 1 Bias voltage supply.
RFin 2, 3, 4 RF input for the power amplifier. This pin is DC--coupled andrequires a DC--blocking series capacitor.
RFout/VCC
9, 10,11, 12
RF output for the power amplifier. This pin is DC--coupledand requires a DC--blocking series capacitor.
VCC 16 Collector voltage supply.
GND BacksideCenterMetal
The center metal base of the QFN package provides bothDC and RF ground as well as heat sink contact for thepower amplifier.
Table 6. ESD Protection Characteristics
Test Conditions/Test Methodology Class
Human Body Model (per JESD 22--A114) 1C
Machine Model (per EIA/JESD 22--A115) A
Charge Device Model (per JESD 22--C101) IV
Table 7. Moisture Sensitivity Level
Test Methodology Rating Package Peak Temperature Unit
Per JESD 22--A113, IPC/JEDEC J--STD--020 1 260 C
Table 8. Ordering Information
Device Tape and Reel Information Package
MMG3006NT1 T1 Suffix = 1,000 Units, 12 mm Tape Width, 13--inch Reel QFN 4 4--16L
Figure 1. Pin Connections
(Top View)
VBA
VCC
RFout/VCC
RFin
5 6 7 8
16 15 14 13
1
2
3
4
12
11
10
9
RFout/VCC
RFout/VCC
RFout/VCC
RFin
RFin
N.C. N.C. N.C.
N.C. N.C. N.C.N.C.
MMG3006NT1
3RF Device DataNXP Semiconductors
50 OHM TYPICAL CHARACTERISTICS
20
55
45
40
35
30
25
50
3515 20 25
Pout, OUTPUT POWER (dBm)
Figure 2. Third Order Output Intercept Pointversus Output Power and Supply Current
IP3,THIRDORDER
OUTPUTINTERCEPTPOINT(dBm
)
VDC = 5 Vdcf1 = 1829 MHzf2 = 1830 MHz
IDC = 850 mA720 mA
570 mA
NOTE: Supply current is varied under external resistor control. Peak poweris not reduced at any listed current. Similar results can be obtained for otherfrequency bands.
30 150103
106
120
Figure 3. MTTF versus Junction Temperature
104
125 130 135 140 145
TJ, JUNCTION TEMPERATURE (C)
NOTE: The MTTF is calculated with VDC = 5 Vdc, IDC = 850 mA
MTTF(YEARS) 105
4RF Device Data
NXP Semiconductors
MMG3006NT1
50 OHM APPLICATION CIRCUIT: 900 MHz
RFOUTPUT
Figure 4. 50 Ohm Test Circuit Schematic
Z1 0.140 x 0.028 MicrostripZ2, Z9, Z10 0.044 x 0.028 MicrostripZ3 0.169 x 0.028 MicrostripZ4 0.177 x 0.028 MicrostripZ5 0.026 x 0.053 Microstrip
Z6 0.026 x 0.089 MicrostripZ7 0.167 x 0.028 MicrostripZ8 0.178 x 0.028 MicrostripZ11 0.096 x 0.028 MicrostripPCB Isola FR408, 0.014, r = 3.7
RFINPUT
R1
L1
R3
VSUPPLY
16
DUT
Z6
C2
Z7
15 14
1
2
3
4
13
12
11
10
9
5 6 7 8
Current Mirror
C8
C1
Z1 Z2 Z3
C9
Z4
C3 C4
R2
C5 C6 C7
C10
Z8
C11
Z11Z5 Z10Z9
Table 9. 50 Ohm Test Circuit Component Designations and ValuesPart Description Part Number Manufacturer
C1, C2 15 pF Chip Capacitors ECUV1H150JCV Panasonic
C3, C6 0.01 F Chip Capacitors C0603C103J5RAC Kemet
C4, C7 0.1 F Chip Capacitors C0603C104J5RAC Kemet
C5 2.2 F Chip Capacitor T491A225K016AT Kemet
C8 6.8 pF Chip Capacitor 06035J6R8BS AVX
C9, C11 3.9 pF Chip Capacitors 06035J3R9BS AVX
C10 5.6 pF Chip Capacitor 06035J5R6BS AVX
L1 15 nH Chip Inductor 1008CS--150XJB Coilcraft
R1 100 , 1/4 W Chip Resistor ERJ8GEYJ101V Panasonic
R2, R3 0 , 1/10 W Chip Resistors CRCW06030000FKEA Vishay
MMG3006NT1
5RF Device DataNXP Semiconductors
50 OHM APPLICATION CIRCUIT: 900 MHz
Figure 5. 50 Ohm Test Circuit Component Layout
R2
MMG3006N Rev. 4
RFin RFout
VSUPPLYVBA
C3
C4
R1
C5
C6
C7
L1R3
C10 C11C9C8
C1
C2
6RF Device Data
NXP Semiconductors
MMG3006NT1
50 OHM TYPICAL CHARACTERISTICS: 900 MHz
10
20
840
f, FREQUENCY (MHz)
Figure 6. Small--Signal Gain (S21) versusFrequency
VDC = 5 Vdc
16
12Gp,SM
ALL--SIGNAL
GAIN(dB)
TC = --40C18
14
870 900 930 960
25C85C
--10
--5
f, FREQUENCY (MHz)
Figure 7. Input Return Loss (S11) versusFrequency
--9IRL,INPUTRETURNLOSS
(dB)
--7
--6
--8
VDC = 5 Vdc
TC = --40C
25C85C
840 870 900 930 960
--25
--5
f, FREQUENCY (MHz)
Figure 8. Output Return Loss (S22) versusFrequency
ORL,OUTPUTRETURNLOSS
(dB)
--15
--10
--20
VDC = 5 Vdc
TC = --40C
25C85C
840 870 900 930 96020
40
30
25
f, FREQUENCY (MHz)
Figure 9. P1dB versus Frequency
P1dB,1dB
COMPRESSIONPOINT(dBm
)
35
840 870 900 930 960
VDC = 5 Vdc
TC = --40C
42
52
50
48
46
44
840 870 900 930 960
f, FREQUENCY (MHz)
Figure 10. Third Order Output InterceptPoint versus Frequency
IP3,THIRDORDER
OUTPUTINTERCEPTPOINT(dBm
)
VDC = 5 Vdc1 MHz Tone Spacing
TC = --40C 25C
85C
0
10
f, FREQUENCY (MHz)
Figure 11. Noise Figure versus Frequency
6
4
2
NF,NOISEFIGURE(dB)
840 870 900 930 960
VDC = 5 Vdc
TC = 85C
25C
--40C
8
85C
25C
MMG3006NT1
7RF Device DataNXP Semiconductors
50 OHM TYPICAL CHARACTERISTICS: 900 MHz
32
--55
--25
24
Pout, OUTPUT POWER (dBm)
Figure 12. IS--95 Adjacent Channel Power Ratioversus Output Power
--40
--45
--50
302826
ACPR,ADJACENTCHANNEL
POWER
RATIO(dBc)
TC = --40C25C
85C
32
--60
--35
24
Pout, OUTPUT POWER (dBm)
Figure 13. IS--95 Adjacent Channel Power Ratioversus Output Power
--40
--45
--50
302826
ACPR,ADJACENTCHANNEL
POWER
RATIO(dBc)
25C
VDC = 5 Vdc, f = 900 MHzSingle--Carrier IS--95, 9 Channel Forward750 kHz Measurement Offset30 kHz Measurement Bandwidth
VDC = 5 Vdc, f = 900 MHzSingle--Carrier IS--95, 9 Channel Forward885 kHz Measurement Offset30 kHz Measurement Bandwidth
--35
--30
--30
--55
TC = --40C
85C
8RF Device Data
NXP Semiconductors
MMG3006NT1
50 OHM APPLICATION CIRCUIT: 1960 MHz
RFOUTPUT
Figure 14. 50 Ohm Test Circuit Schematic
Z1, Z11 0.140 x 0.028 MicrostripZ2 0.268 x 0.028 MicrostripZ3 0.084 x 0.028 MicrostripZ4 0.038 x 0.028 MicrostripZ5 0.026 x 0.053 MicrostripZ6 0.026 x 0.089 Microstrip
Z7 0.041 x 0.028 MicrostripZ8 0.093 x 0.028 MicrostripZ9 0.033 x 0.028 MicrostripZ10 0.222 x 0.028 MicrostripPCB Isola FR408, 0.014, r = 3.7
RFINPUT
R1
L1
R3
VSUPPLY
16
DUT
Z6
C2
Z7
15 14
1
2
3
4
13
12
11
10
9
5 6 7 8
C8
C1
Z1 Z2 Z3
C9
Z4
C3 C4
R2
C5 C6 C7
C10
Z8
C11
Z9 Z10 Z11Z5Current Mirror
Table 10. 50 Ohm Test Circuit Component Designations and ValuesPart Description Part Number Manufacturer
C1, C2 15 pF Chip Capacitors ECUV1H150JCV Panasonic
C3, C6 0.01 F Chip Capacitors C0603C103J5RAC Kemet
C4, C7 0.1 F Chip Capacitors C0603C104J5RAC Kemet
C5 2.2 F Chip Capacitor T491A225K016AT Kemet
C8, C9 3.0 pF Chip Capacitors 06035J3R0BS AVX
C10 2.0 pF Chip Capacitor 06035J2R0BS AVX
C11 2.7 pF Chip Capacitor 06035J2R7BS AVX
L1 15 nH Chip Inductor 1008CS--150XJB Coilcraft
R1 100 , 1/4 W Chip Resistor ERJ8GEYJ101V Panasonic
R2, R3 0 , 1/10 W Chip Resistors CRCW06030000FKEA Vishay
MMG3006NT1
9RF Device DataNXP Semiconductors
50 OHM APPLICATION CIRCUIT: 1960 MHz
Figure 15. 50 Ohm Test Circuit Component Layout
R2
MMG3006N Rev. 4
RFin RFout
VSUPPLYVBA
C3
C4
R1
C5
C6
C7
L1R3
C10 C11C9C8
C1
C2
10RF Device Data
NXP Semiconductors
MMG3006NT1
50 OHM TYPICAL CHARACTERISTICS: 1960 MHz
8
18
1900
f, FREQUENCY (MHz)
Figure 16. Small--Signal Gain (S21) versusFrequency
VDC = 5 Vdc
16
Gp,SM
ALL--SIGNAL
GAIN(dB)
TC = --40C
25C85C
14
1930 1960 1990 2020
--11
--6
f, FREQUENCY (MHz)
Figure 17. Input Return Loss (S11) versusFrequency
--10IRL,INPUTRETURNLOSS
(dB)
--9
VDC = 5 Vdc
TC = --40C
25C 85C
--25
--5
f, FREQUENCY (MHz)
Figure 18. Output Return Loss (S22) versusFrequency
ORL,OUTPUTRETURNLOSS
(dB)
--15
--10
--20
VDC = 5 Vdc
TC = --40C
25C85C
20
40
30
25
f, FREQUENCY (MHz)
Figure 19. P1dB versus Frequency
P1dB,1dB
COMPRESSIONPOINT(dBm
)
35
VDC = 5 Vdc
TC = --40C
25C85C
42
52
50
48
46
44
f, FREQUENCY (MHz)
Figure 20. Third Order Output InterceptPoint versus Frequency
IP3,THIRDORDER
OUTPUTINTERCEPTPOINT(dBm
)
VDC = 5 Vdc1 MHz Tone Spacing
TC = --40C
25C
85C
0
10
f, FREQUENCY (MHz)
Figure 21. Noise Figure versus Frequency
6
4
2
NF,NOISEFIGURE(dB)
VDC = 5 Vdc
TC = 85C
25C--40C
8
12
10
1900 1930 1960 1990 2020
--7
--8
1900 1930 1960 1990 2020 1900 1930 1960 1990 2020
1900 1930 1960 1990 2020 1900 1930 1960 1990 2020
MMG3006NT1
11RF Device DataNXP Semiconductors
50 OHM TYPICAL CHARACTERISTICS: 1960 MHz
--55
--30
24
Pout, OUTPUT POWER (dBm)
Figure 22. IS--95 Adjacent Channel Power Ratioversus Output Power
--40
--45
--50
2826
ACPR,ADJACENTCHANNEL
POWER
RATIO(dBc)
32
--70
--40
20
Pout, OUTPUT POWER (dBm)
Figure 23. IS--95 Adjacent Channel Power Ratioversus Output Power
--50
--60
--65
28262422
ACPR,ADJACENTCHANNEL
POWER
RATIO(dBc)
28
--65
--30
Pout, OUTPUT POWER (dBm)
Figure 24. Single--Carrier W--CDMA AdjacentChannel Power Ratio versus Output Power
--35
--40
--50
--60
26242220
VDC = 5 Vdc, f = 1960 MHzSingle--Carrier W--CDMA, 3.84 MHz Channel BandwidthInput Signal PAR = 8.5 dB @ 0.01% Probability (CCDF)
ACPR,ADJACENTCHANNEL
POWER
RATIO(dBc)
VDC = 5 Vdc, f = 1960 MHzSingle--Carrier IS--95, 9 Channel Forward750 kHz Measurement Offset30 kHz Measurement Bandwidth
VDC = 5 Vdc, f = 1960 MHzSingle--Carrier IS--95, 9 Channel Forward885 kHz Measurement Offset30 kHz Measurement Bandwidth
TC = --40C 25C
85C
TC = --40C
25C
85C
--30
--35
--45
--55
30
--55
--45
TC = --40C 25C
85C
--35
22 30 32
12RF Device Data
NXP Semiconductors
MMG3006NT1
50 OHM APPLICATION CIRCUIT: 2140 MHz
RFOUTPUT
Figure 25. 50 Ohm Test Circuit Schematic
Z1 0.096 x 0.028 MicrostripZ2 0.044 x 0.028 MicrostripZ3 0.352 x 0.028 MicrostripZ4 0.038 x 0.028 MicrostripZ5 0.026 x 0.053 MicrostripZ6 0.026 x 0.089 Microstrip
Z7 0.074 x 0.028 MicrostripZ8 0.093 x 0.028 MicrostripZ9 0.222 x 0.028 MicrostripZ10 0.140 x 0.028 MicrostripPCB Isola FR408, 0.014, r = 3.7
RFINPUT
R1
L1
R3
VSUPPLY
16
DUT
Z6
C2
Z7
15 14
1
2
3
4
13
12
11
10
9
5 6 7 8
Current Mirror
C8
C1
Z1 Z2 Z3
C9
Z4
C3 C4
R2
C5 C6 C7
C10
Z8 Z9 Z10Z5
Table 11. 50 Ohm Test Circuit Component Designations and ValuesPart Description Part Number Manufacturer
C1, C2 15 pF Chip Capacitors ECUV1H150JCV Panasonic
C3, C6 0.01 F Chip Capacitors C0603C103J5RAC Kemet
C4, C7 0.1 F Chip Capacitors C0603C104J5RAC Kemet
C5 2.2 F Chip Capacitor T491A225K016AT Kemet
C8 0.5 pF Chip Capacitor 06035J0R5BS AVX
C9 3.6 pF Chip Capacitor 06035J3R6BS AVX
C10 3.9 pF Chip Capacitor 06035J3R9BS AVX
L1 15 nH Chip Inductor 1008CS--150XJB Coilcraft
R1 100 , 1/4 W Chip Resistor ERJ8GEYJ101V Panasonic
R2, R3 0 , 1/10 W Chip Resistors CRCW06030000FKEA Vishay
MMG3006NT1
13RF Device DataNXP Semiconductors
50 OHM APPLICATION CIRCUIT: 2140 MHz
Figure 26. 50 Ohm Test Circuit Component Layout
R2
MMG3006N Rev. 4
RFin RFout
VSUPPLYVBA
C3
C4
R1
C5
C6
C7
L1R3
C10C9C8
C1C2
14RF Device Data
NXP Semiconductors
MMG3006NT1
50 OHM TYPICAL CHARACTERISTICS: 2140 MHz
8
18
2080
f, FREQUENCY (MHz)
Figure 27. Small--Signal Gain (S21) versusFrequency
VDC = 5 Vdc
16
Gp,SM
ALL--SIGNAL
GAIN(dB)
TC = --40C
25C85C
14
2110 2140 2170 2200
--35
--15
f, FREQUENCY (MHz)
Figure 28. Input Return Loss (S11) versusFrequency
IRL,INPUTRETURNLOSS
(dB)
--30
VDC = 5 Vdc
TC = --40C
25C
85C
--25
--5
f, FREQUENCY (MHz)
Figure 29. Output Return Loss (S22) versusFrequency
ORL,OUTPUTRETURNLOSS
(dB)
--15
--10
--20
VDC = 5 Vdc
TC = --40C
25C85C
20
40
30
25
f, FREQUENCY (MHz)
Figure 30. P1dB versus Frequency
P1dB,1dB
COMPRESSIONPOINT(dBm
)
35
VDC = 5 Vdc
TC = --40C
25C
85C
42
52
50
48
46
44
f, FREQUENCY (MHz)
Figure 31. Third Order Output InterceptPoint versus Frequency
IP3,THIRDORDER
OUTPUTINTERCEPTPOINT(dBm
)
VDC = 5 Vdc1 MHz Tone Spacing
TC = --40C
25C
85C
0
10
f, FREQUENCY (MHz)
Figure 32. Noise Figure versus Frequency
6
4
2
NF,NOISEFIGURE(dB)
VDC = 5 Vdc
TC = 85C
25C
--40C
8
12
10
--20
--25
2080 2110 2140 2170 2200
2080 2110 2140 2170 22002080 2110 2140 2170 2200
2080 2110 2140 2170 2200 2080 2110 2140 2170 2200
MMG3006NT1
15RF Device DataNXP Semiconductors
50 OHM TYPICAL CHARACTERISTICS: 2140 MHz
32
--55
--30
22
Pout, OUTPUT POWER (dBm)
Figure 33. IS--95 Adjacent Channel Power Ratioversus Output Power
--40
--45
--50
30282624
ACPR,ADJACENTCHANNEL
POWER
RATIO(dBc)
TC = --40C
25C
32
--70
--40
20
Pout, OUTPUT POWER (dBm)
Figure 34. IS--95 Adjacent Channel Power Ratioversus Output Power
--50
--60
--65
30262422
ACPR,ADJACENTCHANNEL
POWER
RATIO(dBc)
28
--65
--30
20
Pout, OUTPUT POWER (dBm)
Figure 35. Single--Carrier W--CDMA AdjacentChannel Power Ratio versus Output Power
--35
--40
--50
--60
262422
VDC = 5 Vdc, f = 2140 MHzSingle--Carrier W--CDMA, 3.84 MHz Channel BandwidthInput Signal PAR = 8.5 dB @ 0.01% Probability (CCDF)
ACPR,ADJACENTCHANNEL
POWER
RATIO(dBc)
VDC = 5 Vdc, f = 2140 MHzSingle--Carrier IS--95, 9 Channel Forward750 kHz Measurement Offset30 kHz Measurement Bandwidth
VDC = 5 Vdc, f = 2140 MHzSingle--Carrier IS--95, 9 Channel Forward885 kHz Measurement Offset30 kHz Measurement Bandwidth
--35
85C--55
--45
--35
--30
28
TC = --40C
25C 85C
--55
--45TC = --40C
25C 85C
16RF Device Data
NXP Semiconductors
MMG3006NT1
50 OHM TYPICAL CHARACTERISTICS
Table 12. Common Emitter S--Parameters (VDC = 5 Vdc, TA = 25C, 50 Ohm System)
fMHz
S11 S21 S12 S22
|S11| |S21| |S12| |S22|
250 0.821 --173.7 2.816 143.3 0.00597 --61.7 0.922 --179.0
300 0.841 --174.5 2.643 137.3 0.00514 --56.7 0.922 --178.9
350 0.860 --175.2 2.471 132.0 0.00455 --51.6 0.922 --179.1
400 0.872 --175.3 2.309 127.6 0.00435 --44.2 0.921 --180.0
450 0.889 --176.1 2.149 124.2 0.00371 --46.7 0.924 --179.4
500 0.900 --177.0 2.030 120.3 0.00331 --40.6 0.924 --179.6
550 0.909 --177.9 1.908 116.9 0.00306 --35.3 0.925 --179.4
600 0.917 --178.8 1.796 113.8 0.00286 --30.6 0.925 --179.4
650 0.924 --179.6 1.695 110.8 0.00269 --25.9 0.924 --179.6
700 0.930 179.6 1.605 108.2 0.00258 --20.7 0.923 --179.5
750 0.935 178.9 1.522 105.8 0.00248 --15.9 0.922 --179.6
800 0.939 178.2 1.448 103.4 0.00243 --11.1 0.921 --179.8
850 0.943 177.5 1.380 101.3 0.00240 --6.6 0.920 --179.9
900 0.946 176.9 1.320 99.2 0.00239 --2.2 0.919 180.0
950 0.949 176.3 1.266 97.2 0.00239 1.8 0.918 179.9
1000 0.951 175.7 1.216 95.2 0.00242 5.4 0.918 179.6
1050 0.953 175.2 1.172 93.4 0.00246 8.8 0.918 179.5
1100 0.954 174.6 1.133 91.5 0.00250 11.9 0.917 179.3
1150 0.956 174.1 1.098 89.7 0.00255 14.1 0.917 179.0
1200 0.957 173.6 1.067 87.8 0.00261 16.7 0.916 178.8
1250 0.958 173.1 1.039 86.0 0.00268 18.6 0.915 178.6
1300 0.958 172.6 1.015 84.3 0.00275 19.9 0.915 178.3
1350 0.958 172.2 0.994 82.4 0.00282 21.4 0.914 177.9
1400 0.959 171.7 0.978 80.5 0.00292 22.6 0.913 177.6
1450 0.958 171.3 0.964 78.5 0.00299 23.5 0.913 177.3
1500 0.957 170.9 0.952 76.5 0.00306 23.9 0.912 177.1
1550 0.957 170.5 0.945 74.3 0.00316 24.2 0.912 176.7
1600 0.955 170.0 0.941 72.0 0.00324 24.3 0.911 176.5
1650 0.954 169.7 0.941 69.6 0.00332 23.7 0.910 176.2
1700 0.951 169.2 0.944 67.0 0.00340 23.3 0.909 175.8
1750 0.949 168.8 0.951 64.1 0.00348 22.3 0.907 175.5
1800 0.945 168.4 0.969 60.9 0.00360 21.0 0.906 175.2
1850 0.942 168.1 0.975 57.4 0.00361 19.4 0.905 175.0
1900 0.937 167.7 0.985 53.5 0.00364 16.9 0.903 174.6
1950 0.932 167.3 0.999 49.0 0.00363 14.0 0.902 174.4
2000 0.925 166.9 1.016 43.7 0.00357 9.9 0.901 174.1
2050 0.918 166.4 1.034 37.5 0.00346 5.4 0.902 173.8
2100 0.910 166.0 1.048 30.2 0.00322 --0.4 0.903 173.4
2150 0.904 165.6 1.053 21.7 0.00290 --6.9 0.905 173.2
2200 0.900 165.2 1.038 11.9 0.00242 --13.5 0.910 172.9
2250 0.902 164.9 0.995 1.2 0.00178 --19.1 0.916 172.5
2300 0.910 164.4 0.922 --10.0 0.00104 --18.2 0.925 172.2
2350 0.924 164.1 0.823 --20.9 0.000474 24.3 0.933 171.9
(continued)
MMG3006NT1
17RF Device DataNXP Semiconductors
50 OHM TYPICAL CHARACTERISTICS
Table 12. Common Emitter S--Parameters (VDC = 5 Vdc, TA = 25C, 50 Ohm System) (continued)
fMHz
S11 S21 S12 S22
|S11| |S21| |S12| |S22|
2400 0.938 163.7 0.711 --30.9 0.000864 82.0 0.938 171.7
2450 0.952 163.3 0.600 --39.7 0.00152 86.3 0.943 171.4
2500 0.963 162.9 0.498 --47.0 0.00207 84.0 0.945 171.1
2550 0.970 162.5 0.408 --53.1 0.00253 80.0 0.946 170.8
2600 0.976 162.1 0.332 --58.0 0.00287 76.4 0.947 170.4
2650 0.981 161.6 0.268 --61.9 0.00316 73.4 0.945 169.0
2700 0.983 161.2 0.215 --64.8 0.00340 71.2 0.944 168.3
2750 0.986 160.8 0.170 --66.7 0.00361 69.2 0.943 167.4
2800 0.988 160.5 0.132 --67.6 0.00382 67.5 0.941 166.5
2850 0.988 160.0 0.101 --66.9 0.00402 66.1 0.940 165.9
2900 0.989 159.6 0.075 --64.1 0.00418 64.8 0.939 165.1
2950 0.990 159.2 0.053 --57.4 0.00438 63.4 0.938 164.5
3000 0.990 158.8 0.037 --43.3 0.00455 62.3 0.937 163.9
18RF Device Data
NXP Semiconductors
MMG3006NT1
Figure 36. PCB Pad Layout for 16--Lead QFN 4 4
0.65
0.40
0.65
3.00 4.30
2.5 2.5 solder pad withthermal via structure. Alldimensions in mm.
Figure 37. Product Marking
M06NWLYW
MMG3006NT1
19RF Device DataNXP Semiconductors
PACKAGE DIMENSIONS
20RF Device Data
NXP Semiconductors
MMG3006NT1
MMG3006NT1
21RF Device DataNXP Semiconductors
22RF Device Data
NXP Semiconductors
MMG3006NT1
PRODUCT DOCUMENTATION, SOFTWARE AND TOOLS
Refer to the following resources to aid your design process.
Application Notes AN1955: Thermal Measurement Methodology of RF Power Amplifiers
AN3100: General Purpose Amplifier Biasing
AN3778: PCB Layout Guidelines for PQFN/QFN Style Packages Requiring Thermal Vias for Heat Dissipation
Software .s2p File
Development Tools Printed Circuit Boards
For Software and Tools, do a Part Number search at http://www.nxp.com, and select the “Part Number” link. Go to Software& Tools on the part’s Product Summary page to download the respective tool.
FAILURE ANALYSIS
At this time, because of the physical characteristics of the part, failure analysis is limited to electrical signature analysis. Incases where NXP is contractually obligated to perform failure analysis (FA) services, full FA may be performed by thirdparty vendors with moderate success. For updates contact your local NXP Sales Office.
REVISION HISTORY
The following table summarizes revisions to this document.
Revision Date Description
0 Jan. 2008 Initial Release of Data Sheet
1 Mar. 2008 Corrected Table 7, Moisture Sensitivity Level Rating from 3 to 1, p. 3
Corrected S--Parameter table frequency column label to read “MHz” versus “GHz”, pp. 17, 18
2 Mar. 2008 Corrected Tape and Reel information from 330 mm to 12 mm, p. 1
Corrected Figs. 24, 35, Single--Carrier W--CDMA Adjacent Channel Power Ratio versus Output Powery--axis (ACPR) unit of measure to dBc, pp. 12, 16
3 May 2010 Added new Fig. 3, Third Order Output Intercept Point versus Output Power and Supply Current,p. 4
Added AN3778, PCB Layout Guidelines for PQFN/QFN Style Packages Requiring Thermal Vias for HeatDissipation, Application Notes, p. 23
Added .s2p File availability to Product Software, p. 23
4 Jan. 2011 Corrected temperature at which ThetaJC is measured from 25C to 89C and added “no RF applied” toThermal Characteristics table to indicate that thermal characterization is performed under DC test with noRF signal applied, p. 1
Removed IDC bias callout from Table 10, Common Source S--Parameters heading as bias is not acontrolled value, pp. 17--18
Added Printed Circuit Boards availability to Development Tools, p. 23
5 Sept. 2014 Table 2, Maximum Ratings: updated Junction Temperature from 150C to 175C to reflect recent testresults of the device, p. 1
Table 6, ESD Protection Characteristics, removed the word “Minimum” after the ESD class rating. ESDratings are characterized during new product development but are not 100% tested during production. ESDratings provided in the data sheet are intended to be used as a guideline when handling ESD sensitivedevices, p. 2
Removed Fig. 2, Collector Current versus Bias Voltage at Pin #1, p. 3
Added Fig. 38, Product Marking, p. 18
Added Failure Analysis information, p. 22
(continued)
MMG3006NT1
23RF Device DataNXP Semiconductors
REVISION HISTORY (cont.)
Revision Date Description
6 Dec. 2017 Fig. 37, Product Marking: updated to show location of Pin 1 on Product Marking and updated date code lineto reflect improved traceability information, p. 18
24RF Device Data
NXP Semiconductors
MMG3006NT1
How to Reach Us:
Home Page:nxp.com
Web Support:nxp.com/support
Document Number: MMG3006NT1Rev. 6, 12/2017
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