HEAVY IONS SINGLE EVENT EFFECTS (SEE) TEST REPORT

Date: 04/04/2002Report Number: K2600A/BPage 1 of 22

HEAVY IONS SINGLE EVENT EFFECTS (SEE)TEST REPORT

Part Number: OP484

Generic: OP484

Date Code: 0019

Device Function: Precision Rail-to-Rail Op-Amp

Manufacturer: Analog Devices

Test Dates: Dec 12, 2001; Feb 21, 2002; and Mar 20, 2002

Responsible Engineers:

E. J. Normandy ([email protected])Raytheon Electronic Systems, El Segundo

S. V. Nguyen ([email protected])Raytheon Electronic Systems, El Segundo

Date: 04/04/2002Report Number: K2600A/BPage 2

TECHNICAL COMMENTARY

I. SUMMARYFive Analog Devices (AD) OP484 Precision Rail-to-Rail Input & Output Operational Amplifiers were

evaluated for Single-Event Transient (SET) and latch-up (SEL) tests. The SET and SEL testing with heavy ionswere conducted on December 12, 2001 for rail-to-rail application; On February 21, 2002 for single-supplyapplication; And on March 20, 2002 for both configurations at the Lawrence Berkeley National Laboratory (LBL)by Raytheon.

The test results are summarized as follows:

- Single-supply configuration: transient events were detected starting at LET = 7 MeV-cm2/mg.No latched-up was seen on any of the tested devices up to an effective LET = 120 MeV-cm2/mg under worst case application voltage (VS+= 13.5V) and temperature (TC= 100�C) invacuum.

- Rail-to-rail configuration: output voltages were extremely unstable at lower LET, all parts thatsubjected to the rail-to-rail test conditions became non-functional starting at Krypton (LET =30 MeV-cm2/mg) under normal operating temperature and in vacuum.

II. TECHNICAL DISCUSSION

1. Device Information1.1 General Device Process/Description

The OP484 is a quad single-supply, 4 MHz bandwidth amplifier featuring rail-to-rail input and outputs. Thedevice is guaranteed to operate from +3V to +26V (or �1.5V to �18V) and will function with a single supply as lowas+1.5V. Refer to Figure 1 for a simplified schematic diagram.

The OP484 is a bipolar with the substrate (die backside) is connected to V-. The die measures 80 mil x110 mil, and 12 mils thick.

1.2 Test Sample Description

Each of the samples supplied for the SEE testing was in a 14-pin plastic/epoxy Dual-in-Line package(DIP), industrial-temperature grade. Refer to Figure 2 for photographs of a device showing cavity, die, andmarkings.


FIGURE 1. OP484 simplified schematic diagram


Die Marking, Detail 1

Figure 2. OP484 Overall and marking photos on die

Overall Etched Device

Die, Full View

Die Marking, Detail 2


2. Electrical TestingThe samples were electrically tested to the SMD 5962-00517 specification at room ambient, prior to and

following the SEU and SEL testing. The devices were tested for Supply Current (ISY), Input Offset Voltage (VOS),Input Bias Current (IB), Input Offset Current (IOS), Large Signal Voltage Gain (AVO), Power Supply Rejection Ratio(PSRR), Common-mode Rejection Ratio (CMRR), Slew Rate (SR), and Output High (VOH).

Table I summarizes the results of the electrical testing.


Table I. Summary of Pre and Post SEE Electrical Test Data

Part Number: OP-484F Date code: T0019 Job#: K2600ATest Spec: 5962-00517 rev Lot: C11607 0Test Date: 18-DEC-01 Generic: OP-484 Ref: EMAILManufacturer: ANALOG DEVICES

Pre SEE Post SEE Min Limit Max Limit Delta Units

C 9001 T 1.0; + Supply Current (Vs=+/-15V) 4.425 4.426 0 8 0.001 mA232 T 1.0; + Supply Current (Vs=+/-15V) 4.127 6.765 0 8 2.638 mA235 T 1.0; + Supply Current (Vs=+/-15V) 4.171 5.715 0 8 1.544 mA

C 9001 T 2.0; - Supply Current (Vs=+/-15V) -4.426 -4.425 -8 0 0.001 mA232 T 2.0; - Supply Current (Vs=+/-15V) -4.126 -72.485 -8 0 -68.359 mA235 T 2.0; - Supply Current (Vs=+/-15V) -4.170 -80.701 -8 0 -76.531 mA

C 9001 T 3.0; + Supply Current (Vs=18V) 4.610 4.608 0 9 -0.002 mA232 T 3.0; + Supply Current (Vs=18V) 4.292 7.656 0 9 3.364 mA235 T 3.0; + Supply Current (Vs=18V) 4.336 6.281 0 9 1.945 mA

C 9001 T 4.0; - Supply Current (Vs=18V) -4.607 -4.607 -9 0 0.000 mA232 T 4.0; - Supply Current (Vs=18V) -4.290 -101.832 -9 0 -97.542 mA235 T 4.0; - Supply Current (Vs=18V) -4.333 -101.345 -9 0 -97.012 mA

C 9001 T 5.1; V Offset (Vs=15/-15V) -0.018 -0.019 -0.25 0.25 -0.001 mV232 T 5.1; V Offset (Vs=15/-15V) 0.043 Alarm -0.25 0.25 #VALUE! mV235 T 5.1; V Offset (Vs=15/-15V) -0.143 Alarm -0.25 0.25 #VALUE! mV

C 9001 T 5.2; V Offset (Vs=15/-15V) -0.123 -0.124 -0.25 0.25 -0.001 mV232 T 5.2; V Offset (Vs=15/-15V) 0.033 Alarm -0.25 0.25 #VALUE! mV235 T 5.2; V Offset (Vs=15/-15V) 0.032 6.240 -0.25 0.25 6.208 mV236 T 5.2; V Offset (Vs=15/-15V) -0.011 -0.012 -0.25 0.25 -0.001 mV

C 9001 T 5.3; V Offset (Vs=15/-15V) -0.026 -0.026 -0.25 0.25 0.000 mV232 T 5.3; V Offset (Vs=15/-15V) 0.011 2.899 -0.25 0.25 2.888 mV235 T 5.3; V Offset (Vs=15/-15V) -0.006 Alarm -0.25 0.25 #VALUE! mV

C 9001 T 5.4; V Offset (Vs=15/-15V) -0.120 -0.122 -0.25 0.25 -0.002 mV232 T 5.4; V Offset (Vs=15/-15V) 0.013 4.915 -0.25 0.25 4.902 mV235 T 5.4; V Offset (Vs=15/-15V) 0.017 2.323 -0.25 0.25 2.306 mV

C 9001 T 6.1; + I Bias (Vs=15/-15V) -127.243 -127.082 -350 350 0.161 nA232 T 6.1; + I Bias (Vs=15/-15V) -180.563 -28.775 -350 350 151.788 nA235 T 6.1; + I Bias (Vs=15/-15V) -176.387 -8.529 -350 350 167.858 nA

C 9001 T 6.2; + I Bias (Vs=15/-15V) -120.582 -120.445 -350 350 0.137 nA232 T 6.2; + I Bias (Vs=15/-15V) -164.159 0.420 -350 350 164.579 nA235 T 6.2; + I Bias (Vs=15/-15V) -171.732 136.734 -350 350 308.466 nA



C 9001 T 7.1; - I Bias (Vs=15/-15V) -128.288 -128.185 -350 350 0.103 nA232 T 7.1; - I Bias (Vs=15/-15V) -185.313 30.425 -350 350 215.738 nA235 T 7.1; - I Bias (Vs=15/-15V) -175.857 6.754 -350 350 182.611 nA

C 9001 T 7.2; - I Bias (Vs=15/-15V) -121.315 -121.261 -350 350 0.054 nA232 T 7.2; - I Bias (Vs=15/-15V) -163.323 -0.014 -350 350 163.309 nA235 T 7.2; - I Bias (Vs=15/-15V) -168.272 -99.153 -350 350 69.119 nA

C 9001 T 7.3; - I Bias (Vs=15/-15V) -118.718 -118.611 -350 350 0.107 nA232 T 7.3; - I Bias (Vs=15/-15V) -172.357 -8.236 -350 350 164.121 nA235 T 7.3; - I Bias (Vs=15/-15V) -175.787 7.041 -350 350 182.828 nA

C 9001 T 7.4; - I Bias (Vs=15/-15V) -129.011 -128.852 -350 350 0.159 nA232 T 7.4; - I Bias (Vs=15/-15V) -164.487 -1.066 -350 350 163.421 nA235 T 7.4; - I Bias (Vs=15/-15V) -174.207 -21.766 -350 350 152.441 nA

C 9001 T 8.1; I Offset (Vs=15/-15V) 2.520 2.476 -50 50 -0.044 nA232 T 8.1; I Offset (Vs=15/-15V) 5.894 -30.708 -50 50 -36.602 nA235 T 8.1; I Offset (Vs=15/-15V) 0.900 -1.978 -50 50 -2.878 nA

C 9001 T 8.2; I Offset (Vs=15/-15V) 2.100 2.151 -50 50 0.051 nA232 T 8.2; I Offset (Vs=15/-15V) 0.236 -0.321 -50 50 -0.557 nA235 T 8.2; I Offset (Vs=15/-15V) -2.176 20.016 -50 50 22.192 nA

C 9001 T 8.3; I Offset (Vs=15/-15V) 1.499 1.492 -50 50 -0.007 nA232 T 8.3; I Offset (Vs=15/-15V) 2.339 -21.320 -50 50 -23.659 nA


Pre SEE Post SEE Min Limit Max Limit Delta Units235 T 8.3; I Offset (Vs=15/-15V) 2.164 -14.125 -50 50 -16.289 nA

C 9001 T 8.4; I Offset (Vs=15/-15V) -2.741 -2.775 -50 50 -0.034 nA232 T 8.4; I Offset (Vs=15/-15V) 1.935 -18.134 -50 50 -20.069 nA235 T 8.4; I Offset (Vs=15/-15V) 0.089 16.306 -50 50 16.217 nA

C 9001 T 9.1; Open Loop Gain (Vs=15V, RL=2K) 1371.86 1354.13 150 1.00E+12 -17.73 V/mV232 T 9.1; Open Loop Gain (Vs=15V, RL=2K) 929.74 463.44 150 1.00E+12 -466.30 V/mV235 T 9.1; Open Loop Gain (Vs=15V, RL=2K) 659.73 Alarm 150 1.00E+12 #VALUE! V/mV

C 9001 T 9.2; Open Loop Gain (Vs=15V, RL=2K) 3594.45 3393.40 150 1.00E+12 -201.05 V/mV232 T 9.2; Open Loop Gain (Vs=15V, RL=2K) 905.24 Alarm 150 1.00E+12 #VALUE! V/mV235 T 9.2; Open Loop Gain (Vs=15V, RL=2K) 1540.76 Alarm 150 1.00E+12 #VALUE! V/mV



C 9001 T 10.1; PSRR (Vs=+/-2V,+/-18V) 132.99 132.72 90 200 -0.27 dB232 T 10.1; PSRR (Vs=+/-2V,+/-18V) 125.70 115.22 90 200 -10.48 dB235 T 10.1; PSRR (Vs=+/-2V,+/-18V) 122.67 116.96 90 200 -5.71 dB



C 9001 T 10.4; PSRR (Vs=+/-2V,+/-18V) 120.40 120.45 90 200 0.05 dB232 T 10.4; PSRR (Vs=+/-2V,+/-18V) 125.45 81.67 90 200 -43.78 dB235 T 10.4; PSRR (Vs=+/-2V,+/-18V) 120.73 88.38 90 200 -32.35 dB

C 9001 T 11.1; CMRR2 (Vs=+/-15V,VCM=+/-15V) 103.05 103.04 80 200 -0.01 dB232 T 11.1; CMRR2 (Vs=+/-15V,VCM=+/-15V) 95.98 92.05 80 200 -3.93 dB235 T 11.1; CMRR2 (Vs=+/-15V,VCM=+/-15V) 103.64 Alarm 80 200 #VALUE! dB

C 9001 T 11.2; CMRR2 (Vs=+/-15V,VCM=+/-15V) 99.09 99.10 80 200 0.01 dB232 T 11.2; CMRR2 (Vs=+/-15V,VCM=+/-15V) 110.63 Alarm 80 200 #VALUE! dB235 T 11.2; CMRR2 (Vs=+/-15V,VCM=+/-15V) 91.38 Alarm 80 200 #VALUE! dB

C 9001 T 11.3; CMRR2 (Vs=+/-15V,VCM=+/-15V) 112.14 112.13 80 200 -0.01 dB232 T 11.3; CMRR2 (Vs=+/-15V,VCM=+/-15V) 118.42 Alarm 80 200 #VALUE! dB235 T 11.3; CMRR2 (Vs=+/-15V,VCM=+/-15V) 105.37 Alarm 80 200 #VALUE! dB

C 9001 T 11.4; CMRR2 (Vs=+/-15V,VCM=+/-15V) 96.26 96.25 80 200 -0.01 dB232 T 11.4; CMRR2 (Vs=+/-15V,VCM=+/-15V) 103.62 Alarm 80 200 #VALUE! dB235 T 11.4; CMRR2 (Vs=+/-15V,VCM=+/-15V) 102.64 Alarm 80 200 #VALUE! dB

C 9001 T 12.1; + Slew Rate (Vs=+/-15V) 4.83 4.84 2.4 20 0.01 V/uS232 T 12.1; + Slew Rate (Vs=+/-15V) 4.30 0.00 2.4 20 -4.30 V/uS235 T 12.1; + Slew Rate (Vs=+/-15V) 4.36 0.00 2.4 20 -4.36 V/uS

C 9001 T 12.2; + Slew Rate (Vs=+/-15V) 4.51 4.50 2.4 20 -0.01 V/uS232 T 12.2; + Slew Rate (Vs=+/-15V) 4.19 0.00 2.4 20 -4.19 V/uS235 T 12.2; + Slew Rate (Vs=+/-15V) 4.17 0.00 2.4 20 -4.17 V/uS



C 9001 T 13.1; - Slew Rate (Vs=+/-15V) -3.75 -3.74 -10 -2.4 0.01 V/uS232 T 13.1; - Slew Rate (Vs=+/-15V) -3.46 0.00 -10 -2.4 3.46 V/uS235 T 13.1; - Slew Rate (Vs=+/-15V) -3.50 0.00 -10 -2.4 3.50 V/uS

C 9001 T 13.2; - Slew Rate (Vs=+/-15V) -3.71 -3.73 -10 -2.4 -0.02 V/uS232 T 13.2; - Slew Rate (Vs=+/-15V) -3.31 -48.02 -10 -2.4 -44.71 V/uS235 T 13.2; - Slew Rate (Vs=+/-15V) -3.35 -0.03 -10 -2.4 3.32 V/uS

C 9001 T 13.3; - Slew Rate (Vs=+/-15V) -3.72 -3.73 -10 -2.4 -0.01 V/uS232 T 13.3; - Slew Rate (Vs=+/-15V) -3.35 0.00 -10 -2.4 3.35 V/uS235 T 13.3; - Slew Rate (Vs=+/-15V) -3.39 0.00 -10 -2.4 3.39 V/uS

C 9001 T 13.4; - Slew Rate (Vs=+/-15V) -3.76 -3.77 -10 -2.4 -0.01 V/uS232 T 13.4; - Slew Rate (Vs=+/-15V) -3.48 0.00 -10 -2.4 3.48 V/uS235 T 13.4; - Slew Rate (Vs=+/-15V) -3.53 -0.17 -10 -2.4 3.36 V/uS

C 9001 T 14.1; + V OUT (Vs=+/-15V,RL=2K) 14.971 14.962 14.8 20 -0.009 V232 T 14.1; + V OUT (Vs=+/-15V,RL=2K) 14.977 Alarm 14.8 20 #VALUE! V235 T 14.1; + V OUT (Vs=+/-15V,RL=2K) 14.977 Alarm 14.8 20 #VALUE! V


Pre SEE Post SEE Min Limit Max Limit Delta UnitsC 9001 T 14.2; + V OUT (Vs=+/-15V,RL=2K) 14.977 14.968 14.8 20 -0.009 V

232 T 14.2; + V OUT (Vs=+/-15V,RL=2K) 14.983 Alarm 14.8 20 #VALUE! V235 T 14.2; + V OUT (Vs=+/-15V,RL=2K) 14.989 Alarm 14.8 20 #VALUE! V



C 9001 T 15.1; - V OUT (Vs=+/-15V,RL=2K) -15.101 -15.103 -20 -14.875 -0.002 V232 T 15.1; - V OUT (Vs=+/-15V,RL=2K) -15.099 -14.899 -20 -14.875 0.200 V235 T 15.1; - V OUT (Vs=+/-15V,RL=2K) -15.100 Alarm -20 -14.875 #VALUE! V

C 9001 T 15.2; - V OUT (Vs=+/-15V,RL=2K) -15.101 -15.100 -20 -14.875 0.001 V232 T 15.2; - V OUT (Vs=+/-15V,RL=2K) -15.095 -5.777 -20 -14.875 9.318 V235 T 15.2; - V OUT (Vs=+/-15V,RL=2K) -15.095 -13.600 -20 -14.875 1.495 V

C 9001 T 15.3; - V OUT (Vs=+/-15V,RL=2K) -15.101 -15.098 -20 -14.875 0.003 V232 T 15.3; - V OUT (Vs=+/-15V,RL=2K) -15.096 Alarm -20 -14.875 #VALUE! V235 T 15.3; - V OUT (Vs=+/-15V,RL=2K) -15.099 -5.840 -20 -14.875 9.259 V

C 9001 T 15.4; - V OUT (Vs=+/-15V,RL=2K) -15.101 -15.103 -20 -14.875 -0.002 V232 T 15.4; - V OUT (Vs=+/-15V,RL=2K) -15.101 Alarm -20 -14.875 #VALUE! V235 T 15.4; - V OUT (Vs=+/-15V,RL=2K) -15.101 -13.646 -20 -14.875 1.455 V


Part Number: OP-484F Datecode: T0019 Job#: K2600BTest Spec: 5962-00517 rev Lot: C11607 0Manufacturer: ANALOG DEVICES Generic: OP-484 Ref:

EMAIL

Test Dates: 14-Feb-02 1-Mar-02 1-Apr-02 SEE1-Pre SEE2-SEE1SN Pre SEE Post SEE1 Post SEE2 Min Limit Max Limit Delta Delta Units

C 9001 T 1.0; + Supply Current (Vs=+/-15V) 4.255 4.251 4.253 0 8 -0.004 0.002 mA31 T 1.0; + Supply Current (Vs=+/-15V) 3.647 3.650 5.122 0 8 0.003 1.472 mA81 T 1.0; + Supply Current (Vs=+/-15V) 4.378 4.261 4.225 0 8 -0.117 -0.036 mA99 T 1.0; + Supply Current (Vs=+/-15V) 4.234 4.120 6.280 0 8 -0.114 2.160 mA

C 9001 T 2.0; - Supply Current (Vs=+/-15V) -4.253 -4.251 -4.254 -8 0 0.002 -0.003 mA31 T 2.0; - Supply Current (Vs=+/-15V) -3.652 -3.649 -28.999 -8 0 0.003 -25.350 mA81 T 2.0; - Supply Current (Vs=+/-15V) -4.380 -4.260 -4.246 -8 0 0.120 0.014 mA99 T 2.0; - Supply Current (Vs=+/-15V) -4.237 -4.118 -27.234 -8 0 0.119 -23.116 mA

C 9001 T 3.0; + Supply Current (Vs=18V) 4.428 4.435 4.438 0 9 0.007 0.003 mA31 T 3.0; + Supply Current (Vs=18V) 3.805 3.813 5.316 0 9 0.008 1.503 mA81 T 3.0; + Supply Current (Vs=18V) 4.581 4.465 4.419 0 9 -0.116 -0.046 mA99 T 3.0; + Supply Current (Vs=18V) 4.399 4.283 6.344 0 9 -0.116 2.061 mA

C 9001 T 4.0; - Supply Current (Vs=18V) -4.426 -4.431 -4.435 -9 0 -0.005 -0.004 mA31 T 4.0; - Supply Current (Vs=18V) -3.808 -3.813 -100.396 -9 0 -0.005 -96.583 mA81 T 4.0; - Supply Current (Vs=18V) -4.580 -4.460 -4.444 -9 0 0.120 0.016 mA99 T 4.0; - Supply Current (Vs=18V) -4.394 -4.279 -82.134 -9 0 0.115 -77.855 mA

C 9001 T 5.1; V Offset (Vs=15/-15V) 0.011 0.008 0.003 -0.25 0.25 -0.003 -0.005 mV31 T 5.1; V Offset (Vs=15/-15V) 0.048 0.042 Alarm -0.25 0.25 -0.006 #VALUE! mV81 T 5.1; V Offset (Vs=15/-15V) -0.012 0.003 Alarm -0.25 0.25 0.015 #VALUE! mV99 T 5.1; V Offset (Vs=15/-15V) 0.043 0.032 Alarm -0.25 0.25 -0.011 #VALUE! mV

C 9001 T 5.2; V Offset (Vs=15/-15V) -0.067 -0.060 -0.062 -0.25 0.25 0.007 -0.002 mV31 T 5.2; V Offset (Vs=15/-15V) 0.031 0.036 6.067 -0.25 0.25 0.005 6.031 mV81 T 5.2; V Offset (Vs=15/-15V) 0.031 0.029 0.306 -0.25 0.25 -0.002 0.277 mV99 T 5.2; V Offset (Vs=15/-15V) 0.082 0.055 Alarm -0.25 0.25 -0.027 #VALUE! mV

C 9001 T 5.3; V Offset (Vs=15/-15V) 0.007 0.015 0.011 -0.25 0.25 0.008 -0.004 mV31 T 5.3; V Offset (Vs=15/-15V) -0.051 -0.042 Alarm -0.25 0.25 0.009 #VALUE! mV81 T 5.3; V Offset (Vs=15/-15V) -0.018 0.003 0.306 -0.25 0.25 0.021 0.303 mV99 T 5.3; V Offset (Vs=15/-15V) 0.011 0.009 0.306 -0.25 0.25 -0.002 0.297 mV

C 9001 T 5.4; V Offset (Vs=15/-15V) 0.053 0.060 0.058 -0.25 0.25 0.007 -0.002 mV31 T 5.4; V Offset (Vs=15/-15V) 0.033 0.028 Alarm -0.25 0.25 -0.005 #VALUE! mV81 T 5.4; V Offset (Vs=15/-15V) -0.047 -0.035 Alarm -0.25 0.25 0.012 #VALUE! mV99 T 5.4; V Offset (Vs=15/-15V) 0.031 0.003 Alarm -0.25 0.25 -0.028 #VALUE! mV

C 9001 T 6.1; + I Bias (Vs=15/-15V) -213.166 -214.483 -214.870 -350 350 -1.317 -0.387 nA31 T 6.1; + I Bias (Vs=15/-15V) -165.995 -167.188 -3.891 -350 350 -1.193 163.297 nA81 T 6.1; + I Bias (Vs=15/-15V) -211.492 -371.436 1.285 -350 350 -159.944 372.721 nA99 T 6.1; + I Bias (Vs=15/-15V) -172.424 -290.890 -10.869 -350 350 -118.466 280.021 nA

C 9001 T 6.2; + I Bias (Vs=15/-15V) -206.303 -207.748 -214.133 -350 350 -1.445 -6.385 nA31 T 6.2; + I Bias (Vs=15/-15V) -159.462 -160.572 10.096 -350 350 -1.110 170.668 nA81 T 6.2; + I Bias (Vs=15/-15V) -192.154 -340.847 -251.117 -350 350 -148.693 89.730 nA99 T 6.2; + I Bias (Vs=15/-15V) -172.669 -279.789 11.250 -350 350 -107.120 291.039 nA

C 9001 T 6.3; + I Bias (Vs=15/-15V) -225.948 -227.575 -229.595 -350 350 -1.627 -2.020 nA31 T 6.3; + I Bias (Vs=15/-15V) -154.588 -155.631 -11.644 -350 350 -1.043 143.987 nA81 T 6.3; + I Bias (Vs=15/-15V) -190.246 -330.537 -275.781 -350 350 -140.291 54.756 nA99 T 6.3; + I Bias (Vs=15/-15V) -174.890 -290.795 -193.431 -350 350 -115.905 97.364 nA

C 9001 T 6.4; + I Bias (Vs=15/-15V) -221.500 -222.821 -221.603 -350 350 -1.321 1.218 nA31 T 6.4; + I Bias (Vs=15/-15V) -162.692 -164.014 -6.305 -350 350 -1.322 157.709 nA81 T 6.4; + I Bias (Vs=15/-15V) -218.046 -376.208 -17.408 -350 350 -158.162 358.800 nA99 T 6.4; + I Bias (Vs=15/-15V) -174.738 -290.700 -9.879 -350 350 -115.962 280.821 nA

C 9001 T 7.1; - I Bias (Vs=15/-15V) -217.604 -218.711 -218.790 -350 350 -1.107 -0.079 nA31 T 7.1; - I Bias (Vs=15/-15V) -169.086 -169.775 -6.213 -350 350 -0.689 163.562 nA81 T 7.1; - I Bias (Vs=15/-15V) -216.670 -373.725 -6.062 -350 350 -157.055 367.663 nA99 T 7.1; - I Bias (Vs=15/-15V) -179.360 -318.122 11.965 -350 350 -138.762 330.087 nA

C 9001 T 7.2; - I Bias (Vs=15/-15V) -207.451 -208.545 -209.324 -350 350 -1.094 -0.779 nA31 T 7.2; - I Bias (Vs=15/-15V) -160.475 -161.159 -134.743 -350 350 -0.684 26.416 nA81 T 7.2; - I Bias (Vs=15/-15V) -195.595 -339.823 -252.862 -350 350 -144.228 86.961 nA99 T 7.2; - I Bias (Vs=15/-15V) -175.116 -284.538 -11.713 -350 350 -109.422 272.825 nA

C 9001 T 7.3; - I Bias (Vs=15/-15V) -223.766 -224.922 -226.119 -350 350 -1.156 -1.197 nA


Test Dates: 14-Feb-02 1-Mar-02 1-Apr-02 SEE1-Pre SEE2-SEE1SN Pre SEE Post SEE1 Post SEE2 Min Limit Max Limit Delta Delta Units31 T 7.3; - I Bias (Vs=15/-15V) -151.897 -152.417 7.734 -350 350 -0.520 160.151 nA81 T 7.3; - I Bias (Vs=15/-15V) -189.520 -339.517 -250.773 -350 350 -149.997 88.744 nA99 T 7.3; - I Bias (Vs=15/-15V) -173.338 -286.653 -161.315 -350 350 -113.315 125.338 nA

C 9001 T 7.4; - I Bias (Vs=15/-15V) -220.333 -221.341 -219.757 -350 350 -1.008 1.584 nA31 T 7.4; - I Bias (Vs=15/-15V) -161.914 -162.556 1.713 -350 350 -0.642 164.269 nA81 T 7.4; - I Bias (Vs=15/-15V) -213.980 -366.230 12.091 -350 350 -152.250 378.321 nA99 T 7.4; - I Bias (Vs=15/-15V) -185.139 -293.401 9.367 -350 350 -108.262 302.768 nA

C 9001 T 8.1; I Offset (Vs=15/-15V) 5.535 5.713 5.460 -50 50 0.178 -0.253 nA31 T 8.1; I Offset (Vs=15/-15V) 4.026 4.178 7.923 -50 50 0.152 3.745 nA81 T 8.1; I Offset (Vs=15/-15V) 5.853 3.834 11.419 -50 50 -2.019 7.585 nA99 T 8.1; I Offset (Vs=15/-15V) 7.437 28.704 -10.318 -50 50 21.267 -39.022 nA

C 9001 T 8.2; I Offset (Vs=15/-15V) 2.203 2.132 -3.131 -50 50 -0.071 -5.263 nA31 T 8.2; I Offset (Vs=15/-15V) 1.881 1.996 62.785 -50 50 0.115 60.789 nA81 T 8.2; I Offset (Vs=15/-15V) 4.215 0.324 3.518 -50 50 -3.891 3.194 nA99 T 8.2; I Offset (Vs=15/-15V) 2.959 5.733 11.590 -50 50 2.774 5.857 nA

C 9001 T 8.3; I Offset (Vs=15/-15V) -0.986 -1.137 -1.861 -50 50 -0.151 -0.724 nA31 T 8.3; I Offset (Vs=15/-15V) -1.677 -1.832 -3.774 -50 50 -0.155 -1.942 nA81 T 8.3; I Offset (Vs=15/-15V) -0.171 10.064 -23.961 -50 50 10.235 -34.025 nA99 T 8.3; I Offset (Vs=15/-15V) -1.159 -2.785 -32.227 -50 50 -1.626 -29.442 nA

C 9001 T 8.4; I Offset (Vs=15/-15V) 0.010 -0.049 -0.236 -50 50 -0.059 -0.187 nA31 T 8.4; I Offset (Vs=15/-15V) 0.058 -0.027 19.193 -50 50 -0.085 19.220 nA81 T 8.4; I Offset (Vs=15/-15V) -3.432 -8.487 -3.678 -50 50 -5.055 4.809 nA99 T 8.4; I Offset (Vs=15/-15V) 10.723 3.965 -7.324 -50 50 -6.758 -11.289 nA

C 9001 T 9.1; Open Loop Gain (Vs=15V,RL=2K)

8492.36 11143.76 11997.36 150 1.00E+12 2651.40 853.60 V/mV

31 T 9.1; Open Loop Gain (Vs=15V,RL=2K)

613.09 631.52 Alarm 150 1.00E+12 18.43 #VALUE! V/mV


19517.79 363427.70 Alarm 150 1.00E+12 343909.91 #VALUE! V/mV


1460.59 3002.88 518.47 150 1.00E+12 1542.29 -2484.41 V/mV


7252.32 7489.54 8411.45 150 1.00E+12 237.22 921.91 V/mV


1143.66 1091.39 Alarm 150 1.00E+12 -52.27 #VALUE! V/mV


1225.09 979.59 429.54 150 1.00E+12 -245.50 -550.05 V/mV


1744.04 1133.30 Alarm 150 1.00E+12 -610.74 #VALUE! V/mV


223.96 223.60 227.31 150 1.00E+12 -0.36 3.71 V/mV


6359.67 8373.92 469.74 150 1.00E+12 2014.25 -7904.18 V/mV


1055.60 1128.69 3105.38 150 1.00E+12 73.09 1976.69 V/mV


1337.05 1148.71 Alarm 150 1.00E+12 -188.34 #VALUE! V/mV


191.85 194.40 194.50 150 1.00E+12 2.55 0.10 V/mV


419.46 435.84 Alarm 150 1.00E+12 16.38 #VALUE! V/mV


339.37 347.22 Alarm 150 1.00E+12 7.85 #VALUE! V/mV


14253.44 2496.67 Alarm 150 1.00E+12 -11756.77 #VALUE! V/mV

C 9001 T 10.1; PSRR (Vs=+/-2V,+/-18V) 138.65 138.73 138.73 90 200 0.08 0.00 dB31 T 10.1; PSRR (Vs=+/-2V,+/-18V) 115.88 116.16 116.34 90 200 0.28 0.18 dB81 T 10.1; PSRR (Vs=+/-2V,+/-18V) 116.73 115.58 141.06 90 200 -1.15 25.48 dB99 T 10.1; PSRR (Vs=+/-2V,+/-18V) 137.58 126.43 117.57 90 200 -11.15 -8.86 dB

C 9001 T 10.2; PSRR (Vs=+/-2V,+/-18V) 126.58 126.56 126.69 90 200 -0.02 0.13 dB31 T 10.2; PSRR (Vs=+/-2V,+/-18V) 131.36 131.15 75.82 90 200 -0.21 -55.33 dB81 T 10.2; PSRR (Vs=+/-2V,+/-18V) 132.57 132.27 107.59 90 200 -0.30 -24.68 dB99 T 10.2; PSRR (Vs=+/-2V,+/-18V) 144.16 129.67 Alarm 90 200 -14.49 #VALUE! dB

C 9001 T 10.3; PSRR (Vs=+/-2V,+/-18V) 121.74 121.86 121.81 90 200 0.12 -0.05 dB31 T 10.3; PSRR (Vs=+/-2V,+/-18V) 118.30 118.29 Alarm 90 200 -0.01 #VALUE! dB81 T 10.3; PSRR (Vs=+/-2V,+/-18V) 112.15 111.54 104.64 90 200 -0.61 -6.90 dB


Test Dates: 14-Feb-02 1-Mar-02 1-Apr-02 SEE1-Pre SEE2-SEE1SN Pre SEE Post SEE1 Post SEE2 Min Limit Max Limit Delta Delta Units99 T 10.3; PSRR (Vs=+/-2V,+/-18V) 154.85 141.57 100.25 90 200 -13.28 -41.32 dB

C 9001 T 10.4; PSRR (Vs=+/-2V,+/-18V) 121.45 121.49 122.06 90 200 0.04 0.57 dB31 T 10.4; PSRR (Vs=+/-2V,+/-18V) 126.40 127.33 Alarm 90 200 0.93 #VALUE! dB81 T 10.4; PSRR (Vs=+/-2V,+/-18V) 107.14 107.33 Alarm 90 200 0.19 #VALUE! dB99 T 10.4; PSRR (Vs=+/-2V,+/-18V) 137.20 127.19 Alarm 90 200 -10.01 #VALUE! dB

C 9001 T 11.1; CMRR2 (Vs=+/-15V,VCM=+/-15V)

97.48 97.58 97.62 80 200 0.10 0.04 dB

31 T 11.1; CMRR2 (Vs=+/-15V,VCM=+/-15V)

114.87 115.53 96.66 80 200 0.66 -18.87 dB

81 T 11.1; CMRR2 (Vs=+/-15V,VCM=+/-15V)

86.27 86.12 90.31 80 200 -0.15 4.19 dB

99 T 11.1; CMRR2 (Vs=+/-15V,VCM=+/-15V)

100.46 100.93 93.42 80 200 0.47 -7.51 dB

C 9001 T 11.2; CMRR2 (Vs=+/-15V,VCM=+/-15V)

93.92 93.96 94.01 80 200 0.04 0.05 dB

31 T 11.2; CMRR2 (Vs=+/-15V,VCM=+/-15V)

98.20 98.26 76.10 80 200 0.06 -22.16 dB

81 T 11.2; CMRR2 (Vs=+/-15V,VCM=+/-15V)

96.56 96.36 79.89 80 200 -0.20 -16.47 dB

99 T 11.2; CMRR2 (Vs=+/-15V,VCM=+/-15V)

101.26 100.81 Alarm 80 200 -0.45 #VALUE! dB

C 9001 T 11.3; CMRR2 (Vs=+/-15V,VCM=+/-15V)

104.12 104.13 104.15 80 200 0.01 0.02 dB

31 T 11.3; CMRR2 (Vs=+/-15V,VCM=+/-15V)

104.85 105.04 105.30 80 200 0.19 0.26 dB

81 T 11.3; CMRR2 (Vs=+/-15V,VCM=+/-15V)

83.65 83.77 79.36 80 200 0.12 -4.41 dB

99 T 11.3; CMRR2 (Vs=+/-15V,VCM=+/-15V)

111.29 112.81 94.50 80 200 1.52 -18.31 dB

C 9001 T 11.4; CMRR2 (Vs=+/-15V,VCM=+/-15V)

115.83 115.92 115.95 80 200 0.09 0.03 dB

31 T 11.4; CMRR2 (Vs=+/-15V,VCM=+/-15V)

97.79 98.07 76.82 80 200 0.28 -21.25 dB

81 T 11.4; CMRR2 (Vs=+/-15V,VCM=+/-15V)

83.14 83.08 79.50 80 200 -0.06 -3.58 dB

99 T 11.4; CMRR2 (Vs=+/-15V,VCM=+/-15V)

116.31 111.61 95.72 80 200 -4.70 -15.89 dB

C 9001 T 12.1; + Slew Rate (Vs=+/-15V) 4.46 4.41 4.42 2.4 20 -0.05 0.01 V/uS31 T 12.1; + Slew Rate (Vs=+/-15V) 4.13 4.02 0.00 2.4 20 -0.11 -4.02 V/uS81 T 12.1; + Slew Rate (Vs=+/-15V) 4.75 4.60 0.00 2.4 20 -0.15 -4.60 V/uS99 T 12.1; + Slew Rate (Vs=+/-15V) 4.37 4.23 0.00 2.4 20 -0.14 -4.23 V/uS

C 9001 T 12.2; + Slew Rate (Vs=+/-15V) 4.32 4.31 4.32 2.4 20 -0.01 0.01 V/uS31 T 12.2; + Slew Rate (Vs=+/-15V) 3.84 3.86 0.00 2.4 20 0.02 -3.86 V/uS81 T 12.2; + Slew Rate (Vs=+/-15V) 4.42 4.30 2.31 2.4 20 -0.12 -1.99 V/uS99 T 12.2; + Slew Rate (Vs=+/-15V) 4.18 4.17 0.00 2.4 20 -0.01 -4.17 V/uS

C 9001 T 12.3; + Slew Rate (Vs=+/-15V) 4.06 4.14 4.12 2.4 20 0.08 -0.02 V/uS31 T 12.3; + Slew Rate (Vs=+/-15V) 3.96 3.98 0.00 2.4 20 0.02 -3.98 V/uS81 T 12.3; + Slew Rate (Vs=+/-15V) 4.51 4.37 2.33 2.4 20 -0.14 -2.04 V/uS99 T 12.3; + Slew Rate (Vs=+/-15V) 4.19 4.18 0.00 2.4 20 -0.01 -4.18 V/uS

C 9001 T 12.4; + Slew Rate (Vs=+/-15V) 4.54 4.58 4.50 2.4 20 0.04 -0.08 V/uS31 T 12.4; + Slew Rate (Vs=+/-15V) 3.91 3.88 0.00 2.4 20 -0.03 -3.88 V/uS81 T 12.4; + Slew Rate (Vs=+/-15V) 4.74 4.63 0.00 2.4 20 -0.11 -4.63 V/uS99 T 12.4; + Slew Rate (Vs=+/-15V) 4.37 4.24 0.00 2.4 20 -0.13 -4.24 V/uS

C 9001 T 13.1; - Slew Rate (Vs=+/-15V) -3.65 -3.61 -3.59 -10 -2.4 0.04 0.02 V/uS31 T 13.1; - Slew Rate (Vs=+/-15V) -3.02 -3.05 0.00 -10 -2.4 -0.03 3.05 V/uS81 T 13.1; - Slew Rate (Vs=+/-15V) -3.74 -3.57 0.00 -10 -2.4 0.17 3.57 V/uS99 T 13.1; - Slew Rate (Vs=+/-15V) -3.48 -3.43 0.00 -10 -2.4 0.05 3.43 V/uS

C 9001 T 13.2; - Slew Rate (Vs=+/-15V) -3.41 -3.47 -3.45 -10 -2.4 -0.06 0.02 V/uS31 T 13.2; - Slew Rate (Vs=+/-15V) -3.14 -3.16 -0.16 -10 -2.4 -0.02 3.00 V/uS81 T 13.2; - Slew Rate (Vs=+/-15V) -3.58 -3.53 -2.41 -10 -2.4 0.05 1.12 V/uS99 T 13.2; - Slew Rate (Vs=+/-15V) -3.39 -3.27 -2.64 -10 -2.4 0.12 0.63 V/uS

C 9001 T 13.3; - Slew Rate (Vs=+/-15V) -3.37 -3.39 -3.41 -10 -2.4 -0.02 -0.02 V/uS31 T 13.3; - Slew Rate (Vs=+/-15V) -3.21 -3.22 0.00 -10 -2.4 -0.01 3.22 V/uS81 T 13.3; - Slew Rate (Vs=+/-15V) -3.63 -3.54 -2.44 -10 -2.4 0.09 1.10 V/uS99 T 13.3; - Slew Rate (Vs=+/-15V) -3.42 -3.30 -0.88 -10 -2.4 0.12 2.42 V/uS

C 9001 T 13.4; - Slew Rate (Vs=+/-15V) -3.62 -3.58 -3.60 -10 -2.4 0.04 -0.02 V/uS


Test Dates: 14-Feb-02 1-Mar-02 1-Apr-02 SEE1-Pre SEE2-SEE1SN Pre SEE Post SEE1 Post SEE2 Min Limit Max Limit Delta Delta Units31 T 13.4; - Slew Rate (Vs=+/-15V) -2.75 -2.77 0.00 -10 -2.4 -0.02 2.77 V/uS81 T 13.4; - Slew Rate (Vs=+/-15V) -3.71 -3.56 -5.05 -10 -2.4 0.15 -1.49 V/uS99 T 13.4; - Slew Rate (Vs=+/-15V) -3.54 -3.40 0.00 -10 -2.4 0.14 3.40 V/uS

C 9001 T 14.1; + V OUT (Vs=+/-15V,RL=2K) 14.981 14.969 14.967 14.8 20 -0.012 -0.002 V31 T 14.1; + V OUT (Vs=+/-15V,RL=2K) 14.993 14.982 Alarm 14.8 20 -0.011 #VALUE! V81 T 14.1; + V OUT (Vs=+/-15V,RL=2K) 14.981 14.976 Alarm 14.8 20 -0.005 #VALUE! V99 T 14.1; + V OUT (Vs=+/-15V,RL=2K) 14.981 14.976 Alarm 14.8 20 -0.005 #VALUE! V

C 9001 T 14.2; + V OUT (Vs=+/-15V,RL=2K) 14.993 14.977 14.979 14.8 20 -0.016 0.002 V31 T 14.2; + V OUT (Vs=+/-15V,RL=2K) 14.999 14.986 Alarm 14.8 20 -0.013 #VALUE! V81 T 14.2; + V OUT (Vs=+/-15V,RL=2K) 14.987 14.982 14.961 14.8 20 -0.005 -0.021 V99 T 14.2; + V OUT (Vs=+/-15V,RL=2K) 14.991 14.982 Alarm 14.8 20 -0.009 #VALUE! V

C 9001 T 14.3; + V OUT (Vs=+/-15V,RL=2K) 14.981 14.967 14.967 14.8 20 -0.014 0.000 V31 T 14.3; + V OUT (Vs=+/-15V,RL=2K) 14.993 14.976 Alarm 14.8 20 -0.017 #VALUE! V81 T 14.3; + V OUT (Vs=+/-15V,RL=2K) 14.975 14.970 14.949 14.8 20 -0.005 -0.021 V99 T 14.3; + V OUT (Vs=+/-15V,RL=2K) 14.981 14.973 6.992 14.8 20 -0.008 -7.981 V

C 9001 T 14.4; + V OUT (Vs=+/-15V,RL=2K) 14.975 14.957 14.956 14.8 20 -0.018 -0.001 V31 T 14.4; + V OUT (Vs=+/-15V,RL=2K) 14.999 14.982 Alarm 14.8 20 -0.017 #VALUE! V81 T 14.4; + V OUT (Vs=+/-15V,RL=2K) 14.969 14.969 Alarm 14.8 20 0.000 #VALUE! V99 T 14.4; + V OUT (Vs=+/-15V,RL=2K) 14.969 14.964 Alarm 14.8 20 -0.005 #VALUE! V

C 9001 T 15.1; - V OUT (Vs=+/-15V,RL=2K) -15.076 -15.102 -15.104 -20 -14.875 -0.026 -0.002 V31 T 15.1; - V OUT (Vs=+/-15V,RL=2K) -15.069 -15.090 Alarm -20 -14.875 -0.021 #VALUE! V81 T 15.1; - V OUT (Vs=+/-15V,RL=2K) -15.076 -15.102 -5.937 -20 -14.875 -0.026 9.165 V99 T 15.1; - V OUT (Vs=+/-15V,RL=2K) -15.064 -15.090 -14.905 -20 -14.875 -0.026 0.185 V

C 9001 T 15.2; - V OUT (Vs=+/-15V,RL=2K) -15.076 -15.102 -15.098 -20 -14.875 -0.026 0.004 V31 T 15.2; - V OUT (Vs=+/-15V,RL=2K) -15.070 -15.090 -14.637 -20 -14.875 -0.020 0.453 V81 T 15.2; - V OUT (Vs=+/-15V,RL=2K) -15.070 -15.100 -14.331 -20 -14.875 -0.030 0.769 V99 T 15.2; - V OUT (Vs=+/-15V,RL=2K) -15.064 -15.090 -6.673 -20 -14.875 -0.026 8.417 V

C 9001 T 15.3; - V OUT (Vs=+/-15V,RL=2K) -15.076 -15.102 -15.098 -20 -14.875 -0.026 0.004 V31 T 15.3; - V OUT (Vs=+/-15V,RL=2K) -15.070 -15.090 -14.989 -20 -14.875 -0.020 0.101 V81 T 15.3; - V OUT (Vs=+/-15V,RL=2K) -15.076 -15.102 -14.361 -20 -14.875 -0.026 0.741 V99 T 15.3; - V OUT (Vs=+/-15V,RL=2K) -15.064 -15.090 -6.074 -20 -14.875 -0.026 9.016 V

C 9001 T 15.4; - V OUT (Vs=+/-15V,RL=2K) -15.076 -15.102 -15.104 -20 -14.875 -0.026 -0.002 V31 T 15.4; - V OUT (Vs=+/-15V,RL=2K) -15.072 -15.094 -14.473 -20 -14.875 -0.022 0.621 V81 T 15.4; - V OUT (Vs=+/-15V,RL=2K) -15.076 -15.102 -14.178 -20 -14.875 -0.026 0.924 V99 T 15.4; - V OUT (Vs=+/-15V,RL=2K) -15.064 -15.090 -5.959 -20 -14.875 -0.026 9.131 V


3. Test circuit description and condition- Single-supply Configuration: Under the single-supply configuration as shown in Figure 3, two

devices (S/N 81 and 99) were characterized for both SET and SEL. For SET, a TektronixTDS640A Digitizing Oscilloscope was used to detect pulse amplitude changes and to capturevoltage transients. The triggering mode was set to detect transients with amplitude � 6.6V(�600mV above the normal DC output voltage of 6V), and � 8V (�2V above the normal DCoutput voltage of 6V). The devices drew typically 16mA @ VS+ = 12V at normal operatingtemperature (TC ~ 30�C). For SEL, the devices were characterized at worst case voltage (VS+= 13.5V) and temperature (TC= 100�C). Supply current was remotely controlled andmonitored for any sudden increase in case of a latch-up event.

FIGURE 3. Single-supply Configuration Test Circuit.


- Rail-to-Rail Configuration: At first, two devices (S/N 232 and 235) were characterized forlatch-up but were incorrectly biased during the test (the V+ /V- supplies were at +/-12.6Vinstead at +/-15V). However, the invalid bias condition did not seem to affect the operation ofthe devices until the devices were hit with heavy ions. The results of the subsequent SEL testwith the correct bias conditions validated the presumption. In the repeated SEL test, threedevices (S/N 31, 81, and 99) were characterized at both normal operating temperature (TC~38�C) and worst case temperature (TC~ 100�C). The devices drew typically 36mA @ VS+ =15.5V, and -9mA @ VS- = -15.5V. Both supplies were current limited to 1A.

FIGURE 4. Rail-to-rail Configuration Test Circuit.


4. The particle beamAll five devices were exposed to heavy ions using the Berkeley Lab�s 88-inch cyclotron. The aperture size

of the particle beam is approximately ten centimeters (4 inches) in diameter, the particle stream itself has anapproximate diameter of 7.5 cm (3 inches). The beam can be aimed with precision using a laser targetingsystem, allowing a single IC to be irradiated. The laser targeting technique was used for this evaluation.

Two separate ion cocktails were used to cover a wide range of LET from 3.4 MeV-cm2/mg (Ne) to 120MeV-cm2/mg (Bi). Table II lists the test ions with their associated energies, equivalent LET, and approximatepenetration range in Si for the 10 MeV/n and the 4.5 MeV/n cocktail beams.

Table II. List of test ions and characteristics

IONS ENERGY (MeV) ANGLE (�)EFFECTIVE

LET [MeV/(mg/cm2)]Range in Si

(�m)Ne 216 0 3.4 179Ne 216 47.2 5 179Ne 216 60.9 7 179Ar 400 0 9.9 129V+ 508 0 15 116Cu 652 0 22 108Kr 886 0 30 111Kr 886 41.4 40 111Kr 886 55.3 53 111Xe 1330 0 54 110Xe 1330 30 62.3 110Xe 1330 60 108 110Bi 950 0 95 50Bi 950 37.7 120 50


5. Test Results- Single Supply Configuration: Transients were detected at a LETTH = 7 MeV-cm2/mg for the 6.6V trigger

level, and at a LETTH = 53 MeV-cm2/mg for the 8V trigger level. Refer to Table III for summary of the cross-sectionvs. LET, Table IV for heavy-ions induced ionizing dose, Figure 5 and 6 for Weibull curve fit, and Figure 7 fornormal and typical SET waveforms.

Table III. Cross-section vs. LET

S/N TriggerLevel

LETMeV/(mg/cm2)

Fluence Error Cross-sectioncm2/device

Remarks1/

81 6.6V 3.4 (Ne @ 0�) 1.0E7 0 9.94E-881 6.6V 5 (Ne @ 47.2�) 1.0E7 0 1.46E-781 6.6V 7 (Ne @ 60.9�) 1.0E7 1 2.05E-781 6.6V 9.9 (Ar @ 0�) 1.0E7 3 2.98E-781 6.6V 15 (V @ 0�) 6.27E6 44 7.01E-681 6.6V 22 (Cu @ 0�) 6.79E6 279 4.10E-581 6.6V 30 (Kr @ 0�) 1.03E6 80 7.74E-581 6.6V 40 (Kr @ 41.4�) 1.06E6 239 3.02E-481 6.6V 53 (Kr @ 55.5�) 1.04E6 374 6.38E-481 6.6V 54 (Xe @ 0�) 5.55E5 1196 2.15E-381 6.6V 62.3 (Xe @ 30�) 9.02E4 179 2.29E-381 6.6V 108 (Xe @ 60�) 9.15E4 152 3.34E-381 8V 30 (Kr @ 0�) 1.02E7 0 9.75E-881 8V 53 (Kr @ 55.3�) 1.07E6 7 1.16E-581 8V 54 (Xe @ 0�) 3.91E5 20 5.11E-581 8V 62.3 (Xe @ 30�) 4.35E5 34 9.06E-581 8V 108 (Xe @ 60�) 1.39E5 13 1.86E-481 - 95 (Bi @ 0�) 1.00E7 - - Latch-up test @

VS+= 13.5V, TC= 100�C81 - 108 (Xe @ 60�) 1.04E6 - - Latch-up test @

VS+= 13.5V, TC= 100�C99 6.6V 9.9 (Ar @ 0�) 1.04E7 1 9.56E-899 6.6V 15 (V+ @ 0�) 1.00E6 13 1.29E-699 6.6V 22 (Cu @ 0�) 1.05E7 96 9.11E-699 6.6V 30 (Kr @ 0�) 1.16E6 53 4.54E-599 6.6V 40 (Kr @ 41.4�) 1.07E6 160 2.00E-499 6.6V 53 (Kr @ 55.5�) 5.83E5 171 5.18E-499 6.6V 54 (Xe @ 0�) 6.95E5 1868 2.64E-399 6.6V 62.3 (Xe @ 30�) 1.52E5 442 3.34E-399 6.6V 108 (Xe @ 60�) 1.08E5 33 6.11E-4 Transient Voltage = 12V,

~1�s duration99 8V 30 (Kr @ 0�) 1.47E5 0 6.82E-699 8V 54 (Xe @ 0�) 5.34E5 3 5.61E-699 8V 95 (Bi @ 0�) 4.35E5 3 6.90E-699 8V 120 (Bi @ 37.7�) 4.57E5 6 1.66E-599 - 54 (Xe @ 0�) 1.00E6 - - Latch-up test @

VS+= 13.5V, TC= 100�C


99 - 108 (Xe @ 60�) 1.00E6 - - Latch-up test @VS+= 13.5V, TC= 100�C

99 - 120 (Bi @ 37.7�) 2.00E6 - - Latch-up test @VS+= 13.5V, TC= 100�C

Note: 1/ TC = ~30�C unless otherwise noted.

Table IV. Heavy-ions induced ionizing dose (Single-supply Configuration)

S/N TID

81 ~42 KRad (Si)99 ~22 KRad (Si)

Figure 5. Weibull Curve Fit for the 6.6V Trigger Level (Single-supply Configuration)

0 20 40 60 80 100 1201 �10 7

1 �10 6

1 �10 5

1 �10 4

1 �10 3

0.01OP484 -- RES Heavy Ion Data

Linear Energy Transfer (MeV-cm2/mg)

Cro

ss-S

ectio

n (c

m2)

Summary

W 76.209MeV cm2

�

mg�

S 2.395�

Lo 6.65MeV cm2

�

mg�

�sat 3.373 10 3�

� cm2�


Figure 6. Weibull Curve Fit for the 8V Trigger Level (Single-supply Configuration)

20 40 60 80 100 1201 �10 8

1 �10 7

1 �10 6

1 �10 5

1 �10 4

1 �10 3 OP484 -- RES Heavy Ion Data

Linear Energy Transfer (MeV-cm2/mg)

Cro

ss-S

ectio

n (c

m2/

devi

ce)

Summary

W 49.651MeV cm2

�

mg�

S 2.276�

Lo 28.5MeV cm2

�

mg�

�sat 1.934 10 4�

� cm2�


Figure 7. Normal Output Waveform (Top Left), and Typical SET WaveformsFor Single-supply Configuration.


- Rail-to-Rail Configuration: All five devices (S/N 31, 81, 99, 232 and 235) became non-functional whenexposed to heavy ions with LET of between 30 MeV-cm2/mg (Kr) and 54 MeV-cm2/mg (Xe). A failure analysis wasperformed on S/N 232 and 235 but the test result was inconclusive, refer to FA02-003 dated January 23, 2002 fordetails. All the devices became non-functional (no detectable output voltage) rather quickly before any latch-upcurrent could be detected. Refer to Table V for summary of the rail-to-rail configuration test, and Figure 8 fortypical waveforms before, during and after a device became non-functional.

Heavy-ions induced ionizing dose is summarized in Table VI.

Table V. Cross-section vs. LET (Rail-to-Rail Configuration).

S/N LETMeV/(mg/cm2)

Fluence Error Cross-sectioncm2/device

Remarks

31 9.9 (Ar @ 0�) 1.0E7 - - TC =100�C31 30 (Kr @ 0�) 1.0E7 - - TC =100�C31 54 (Xe @ 0�) <1.0E6 - - Non-functional @ TC =100�C81 9.9 (Ar @ 0�) 1.0E7 - -81 30 (Kr @ 0�) 1.8E6 - - Non-functional @ TC = ~44�C99 9.9 (Ar @ 0�) 8.2E6 - - Non-functional @ TC =100�C232 30 (Kr @ 0�) 1.6E5 57 3.56E-4232 54 (Xe @ 0�) 3.58E3 - - Non-functional @ TC = ~44�C235 30 (Kr @ 0�) 1.05E5 50 4.75E-4235 54 (Xe @ 0�) 1.69E3 - - Non-functional @ TC = ~44�C

Table VI. Heavy-ions induced ionizing dose (Rail-to-Rail Configuration).

S/N TID

31 ~ 7 KRad (Si)81 ~ 2 KRad (Si)99 ~ 1 KRad (Si)232 ~ 1 KRad (Si)235 ~ 0.1 KRad (Si)


Figure 8. Normal Ouput Waveform (Top Left), Typical Transient Waveforms (Middles), and Typical Non-functional Waveform (Bottom Right) for Rail-to-Rail Configuration


III. CONCLUSION

The Analog Devices OP484 Precision Rail-to-Rail Input & Output Op-amps were tested for Single Event Transients and Latch-up with heavy ions in two different configurations - single supply and rail-to-rail. Thedevice performed well in the single-supply configuration with no latch-up up to a LET = 120 MeV-cm2/mg. Incontrast, all of the devices subjected to the SEE in the rail-to-rail configuration became non-functional starting at aLET = 30 MeV-cm2/mg. An internal failure analysis failed to identify the failures; However, the device wasbelieved to be caused by single event gate rupture as reported in one of the IEEE papers [1].

It's not recommended that the OP484 be used in the rail-to-rail configuration with similar input conditions forspaceflight.

Reference:[1] The Impact of Single Event Gate Rupture in Linear Devices - Gary K Lum, Hughes O'Donnell, and NicholasBouta. IEEE Transaction on Nuclear Science Vol 47, No 6, December 2000.

Documents

HEAVY IONS SINGLE EVENT EFFECTS (SEE) TEST REPORT